JP2015508922A5 - - Google Patents

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Publication number
JP2015508922A5
JP2015508922A5 JP2014555856A JP2014555856A JP2015508922A5 JP 2015508922 A5 JP2015508922 A5 JP 2015508922A5 JP 2014555856 A JP2014555856 A JP 2014555856A JP 2014555856 A JP2014555856 A JP 2014555856A JP 2015508922 A5 JP2015508922 A5 JP 2015508922A5
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JP
Japan
Prior art keywords
electric field
biometric
value
sensors
tft array
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Application number
JP2014555856A
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English (en)
Japanese (ja)
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JP6133904B2 (ja
JP2015508922A (ja
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Priority claimed from PCT/US2013/024973 external-priority patent/WO2013119697A1/en
Publication of JP2015508922A publication Critical patent/JP2015508922A/ja
Publication of JP2015508922A5 publication Critical patent/JP2015508922A5/ja
Application granted granted Critical
Publication of JP6133904B2 publication Critical patent/JP6133904B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2014555856A 2012-02-06 2013-02-06 電界デバイスを使用するシステムおよび方法 Expired - Fee Related JP6133904B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261595322P 2012-02-06 2012-02-06
US61/595,322 2012-02-06
PCT/US2013/024973 WO2013119697A1 (en) 2012-02-06 2013-02-06 System and method of using an electric field device

Publications (3)

Publication Number Publication Date
JP2015508922A JP2015508922A (ja) 2015-03-23
JP2015508922A5 true JP2015508922A5 (enExample) 2016-03-10
JP6133904B2 JP6133904B2 (ja) 2017-05-24

Family

ID=48902352

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014555856A Expired - Fee Related JP6133904B2 (ja) 2012-02-06 2013-02-06 電界デバイスを使用するシステムおよび方法

Country Status (8)

Country Link
US (2) US9619689B2 (enExample)
EP (1) EP2812851A4 (enExample)
JP (1) JP6133904B2 (enExample)
KR (1) KR20140119099A (enExample)
CN (1) CN104380312B (enExample)
IN (1) IN2014MN01393A (enExample)
TW (1) TW201351302A (enExample)
WO (1) WO2013119697A1 (enExample)

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CN104380312B (zh) 2012-02-06 2018-07-10 高通股份有限公司 使用电场装置的系统及方法
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