JP2015230279A5 - - Google Patents

Download PDF

Info

Publication number
JP2015230279A5
JP2015230279A5 JP2014117730A JP2014117730A JP2015230279A5 JP 2015230279 A5 JP2015230279 A5 JP 2015230279A5 JP 2014117730 A JP2014117730 A JP 2014117730A JP 2014117730 A JP2014117730 A JP 2014117730A JP 2015230279 A5 JP2015230279 A5 JP 2015230279A5
Authority
JP
Japan
Prior art keywords
control system
previously described
advances
executes
starts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2014117730A
Other languages
Japanese (ja)
Other versions
JP6180372B2 (en
JP2015230279A (en
Filing date
Publication date
Application filed filed Critical
Priority to JP2014117730A priority Critical patent/JP6180372B2/en
Priority claimed from JP2014117730A external-priority patent/JP6180372B2/en
Priority to DE102015108721.9A priority patent/DE102015108721B4/en
Publication of JP2015230279A publication Critical patent/JP2015230279A/en
Publication of JP2015230279A5 publication Critical patent/JP2015230279A5/ja
Application granted granted Critical
Publication of JP6180372B2 publication Critical patent/JP6180372B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Description

Ｓ２０８において、制御系５Ａは、先に説明した（ｅ）電流波形解析動作を実行する。
Ｓ２０９において、制御系５Ａは、先に説明した（ｆ）短絡耐量測定動作を開始する。具体的には、制御系５Ａは、ステップＳ２１０に処理を進める。
In S208, the control system 5A executes the previously described (e) current waveform analysis operation.
In S209, control system 5A starts the previously described (f) a short circuit resistance measuring operation. Specifically, control system 5A advances the process to step S210.

JP2014117730A 2014-06-06 2014-06-06 Semiconductor element inspection method and inspection apparatus Active JP6180372B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014117730A JP6180372B2 (en) 2014-06-06 2014-06-06 Semiconductor element inspection method and inspection apparatus
DE102015108721.9A DE102015108721B4 (en) 2014-06-06 2015-06-02 Examination method and examination device for a semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014117730A JP6180372B2 (en) 2014-06-06 2014-06-06 Semiconductor element inspection method and inspection apparatus

Publications (3)

Publication Number Publication Date
JP2015230279A JP2015230279A (en) 2015-12-21
JP2015230279A5 true JP2015230279A5 (en) 2016-11-24
JP6180372B2 JP6180372B2 (en) 2017-08-16

Family

ID=54549025

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014117730A Active JP6180372B2 (en) 2014-06-06 2014-06-06 Semiconductor element inspection method and inspection apparatus

Country Status (2)

Country Link
JP (1) JP6180372B2 (en)
DE (1) DE102015108721B4 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102469942B1 (en) * 2016-04-19 2022-11-22 엘에스일렉트릭(주) Apparatus for determining parameter when estimating temperature of switching element in inverter

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5764179A (en) * 1980-10-06 1982-04-19 Mitsubishi Electric Corp Testing method for semiconductor device
JP2005345247A (en) * 2004-06-02 2005-12-15 Toyota Motor Corp Method for evaluating semiconductor element
JP5045325B2 (en) 2007-09-14 2012-10-10 トヨタ自動車株式会社 Transistor inspection method and inspection apparatus
JP5258810B2 (en) 2010-02-17 2013-08-07 三菱電機株式会社 Semiconductor device testing equipment
US9759763B2 (en) * 2011-07-28 2017-09-12 Integrated Technology Corporation Damage reduction method and apparatus for destructive testing of power semiconductors

Similar Documents

Publication Publication Date Title
JP2016515397A5 (en)
DK3198742T3 (en) Network node, user device, and methods therein to enable the user device to determine an encoder codebook
JP2017519346A5 (en)
DK3230281T3 (en) 1,3-THIAZOL-2-YL-SUBSTITUTED BENZAMIDES
JP2016522122A5 (en)
JP2014237817A5 (en)
MX2016000463A (en) Application control method and device.
EP3245474A4 (en) Structural health monitoring employing physics models
JP2016037652A5 (en)
FI20170083A (en) Redundancy in the process control system
JP2016034354A5 (en)
JP2016540360A5 (en) Substrate processing system and substrate processing method
BR112017005076A2 (en) electric steering apparatus.
IT201600124927A1 (en) Electric derailleur for bicycle
JP2016200526A5 (en)
JP2013251736A5 (en)
JP2015210343A5 (en)
EP3139552A4 (en) Virtual shortest path tree establishment and processing method, and path computation element
FR3017715B1 (en) DETECTION OF A DEFECT, PARTICULARLY TRANSIENT, IN AN ELECTRICAL NETWORK.
JP2015230279A5 (en)
JP2015525489A5 (en)
EP3211585A4 (en) Population estimation device, program, and population estimation method
DE102016102705A8 (en) Electric device, in particular heater
JP2012048323A5 (en) Information processing apparatus, information processing method, and program
DE112015004719A5 (en) Electric heater