JP2015196781A - Polymerizable monomer, resin, resist composition, and production method of resist pattern - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a polymerizable monomer from which a resist pattern having a good mask error factor(MEF) can be produced, a resin containing a structural unit derived from the polymerizable monomer, and a resist composition comprising the resin.SOLUTION: The polymerizable monomer has a group represented by formula (I1). In the formula, Rrepresents H or a 1-24C hydrocarbon group; ring W represents a 3-36C alicyclic hydrocarbon ring, in which a methylene group included in the alicyclic hydrocarbon ring may be replaced by O, C, a carbonyl group or a sulfonyl group and H included in the alicyclic hydrocarbon ring may be replaced by a hydroxy group, a 1-12C alkyl group, a 1-12C alkoxy group, a 3-12C alicyclic hydrocarbon group, a 6-10C aromatic hydrocarbon group, or a combined group of the above groups.

Description

  The present invention relates to a polymerizable monomer, a resin having a structural unit derived from the polymerizable monomer, a resist composition containing the resin, and a method for producing a resist pattern.

Patent Document 1 describes a resin having the following structural unit.

JP 2006-257078 A

  In the resist composition containing the above resin, the mask error factor (MEF) of the resulting resist pattern may not always be satisfied.

［式（Ｉ１）中、
Ｒ¹は、水素原子又は炭素数１〜２４の炭化水素基を表し、該炭化水素基に含まれるメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよく、該炭化水素基に含まれる水素原子は、ハロゲン原子又はヒドロキシ基で置換されていてもよい。
環Ｗは、炭素数３〜３６の脂環式炭化水素環を表し、該脂環式炭化水素環に含まれるメチレン基は、酸素原子、硫黄原子、カルボニル基又はスルホニル基で置換されていてもよく、該脂環式炭化水素環に含まれる水素原子は、ヒドロキシ基、炭素数１〜１２のアルキル基、炭素数１〜１２のアルコキシ基、炭素数３〜１２の脂環式炭化水素基、炭素数６〜１０の芳香族炭化水素基又はこれらを組み合わせた基で置換されていてもよい。］
［２］ビニリデン基と、式（Ｉ１）で表される基とを有する［１］に記載の重合性モノマー。
［３］ビニル基、アクリロイル基及びメタアクリロイル基からなる群から選ばれる少なくとも１つの基と、式（Ｉ１）で表される基とを有する［１］又は［２］に記載の重合性モノマー。
［４］式（Ｉ１）で表される基を有する重合性モノマーが、式（Ｉ）で表される化合物である［１］〜［３］のいずれかに記載の重合性モノマー。

［式（Ｉ）中、
Ｒ¹及びＷは、上記と同じ意味を表す。
Ｒ²は、水素原子又はメチル基を表す。
Ｘ^１は、式（Ｘ^１−１）〜式（Ｘ^１−３）のいずれかで表される基を表す。

（式（Ｘ^１−１）〜式（Ｘ^１−３）中、＊はＡ^１との結合手を表す。）
Ａ¹は、単結合又は炭素数１〜２４の２価の飽和炭化水素基を表し、該飽和炭化水素基に含まれるメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよい。］
［５］環Ｗが、式（Ｗ−１）で表される環、式（Ｗ−２）で表される環又は式（Ｗ−３）で表される環である［１］〜［４］のいずれかに記載の重合性モノマー。

［式（Ｗ−１）、式（Ｗ−２）及び式（Ｗ−３）中、
環に含まれるメチレン基は酸素原子、硫黄原子、カルボニル基又はスルホニル基で置換されていてもよく、環に含まれる水素原子は、ヒドロキシ基、炭素数１〜１２のアルキル基、炭素数１〜１２のアルコキシ基、炭素数３〜１２の脂環式炭化水素基又は炭素数６〜１０の芳香族炭化水素基で置換されていてもよい。］
［６］Ｘ^１が、式（Ｘ^１−１）で表される基である［４］又は［５］に記載の重合性モノマー。
［７］Ａ^１が、単結合である［４］〜［６］のいずれかに記載の重合性モノマー。
［８］［１］〜［７］のいずれか記載の化合物に由来する構造単位を有する樹脂。
［９］酸不安定基を有するモノマーに由来する構造単位を、さらに有する［８］記載の樹脂。
［１０］［８］又は［９］に記載の樹脂と酸発生剤とを含有するレジスト組成物。
［１１］酸発生剤が、式（Ｂ１）で表される酸発生剤である［１０］記載のレジスト組成物。

［式（Ｂ１）中、
Ｑ^b1及びＱ^b2は、それぞれ独立に、フッ素原子又は炭素数１〜６のペルフルオロアルキル基を表す。
Ｌ^b1は、単結合又は置換基を有していてもよい炭素数１〜１７の２価の飽和炭化水素基を表し、該飽和炭化水素基に含まれるメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよい。
Ｙは、置換基を有していてもよい炭素数１〜１８のアルキル基又は置換基を有していてもよい炭素数３〜１８の脂環式炭化水素基を表し、該アルキル基及び該脂環式炭化水素基に含まれるメチレン基は、酸素原子、スルホニル基又はカルボニル基に置き換わっていてもよい。
Ｚｂ⁺は、有機カチオンを表す。］
［１２］酸発生剤から発生する酸よりも酸性度の弱い塩をさらに含有する［１０］又は［１１］に記載のレジスト組成物。
［１３］（１）［１０］〜［１２］のいずれかに記載のレジスト組成物を基板上に塗布する工程、
（２）塗布後の組成物を乾燥させて組成物層を形成する工程、
（３）組成物層に露光する工程、
（４）露光後の組成物層を加熱する工程、及び
（５）加熱後の組成物層を現像する工程、
を含むレジストパターンの製造方法。 The present invention includes the following inventions.
[1] A polymerizable monomer having a group represented by the formula (I1).

[In the formula (I1),
R ¹ represents a hydrogen atom or a hydrocarbon group having 1 to 24 carbon atoms, and the methylene group contained in the hydrocarbon group may be replaced by an oxygen atom or a carbonyl group, and hydrogen contained in the hydrocarbon group The atom may be substituted with a halogen atom or a hydroxy group.
Ring W represents an alicyclic hydrocarbon ring having 3 to 36 carbon atoms, and the methylene group contained in the alicyclic hydrocarbon ring may be substituted with an oxygen atom, a sulfur atom, a carbonyl group or a sulfonyl group. Well, the hydrogen atom contained in the alicyclic hydrocarbon ring is a hydroxy group, an alkyl group having 1 to 12 carbon atoms, an alkoxy group having 1 to 12 carbon atoms, an alicyclic hydrocarbon group having 3 to 12 carbon atoms, The aromatic hydrocarbon group having 6 to 10 carbon atoms or a combination thereof may be substituted. ]
[2] The polymerizable monomer according to [1], which has a vinylidene group and a group represented by the formula (I1).
[3] The polymerizable monomer according to [1] or [2], which has at least one group selected from the group consisting of a vinyl group, an acryloyl group, and a methacryloyl group, and a group represented by the formula (I1).
[4] The polymerizable monomer according to any one of [1] to [3], wherein the polymerizable monomer having a group represented by the formula (I1) is a compound represented by the formula (I).

[In the formula (I),
R ¹ and W represent the same meaning as described above.
R ² represents a hydrogen atom or a methyl group.
X ¹ represents a group represented by any one of formulas (X ¹ -1) to (X ¹ -3).

(In formula (X ¹ -1) to formula (X ¹ -3), * represents a bond with A ^1. )
A ¹ represents a single bond or a divalent saturated hydrocarbon group having 1 to 24 carbon atoms, and the methylene group contained in the saturated hydrocarbon group may be replaced with an oxygen atom or a carbonyl group. ]
[5] Ring W is a ring represented by formula (W-1), a ring represented by formula (W-2), or a ring represented by formula (W-3) [1] to [4] ] The polymerizable monomer in any one of.

[In Formula (W-1), Formula (W-2) and Formula (W-3),
The methylene group contained in the ring may be substituted with an oxygen atom, a sulfur atom, a carbonyl group or a sulfonyl group, and the hydrogen atom contained in the ring is a hydroxy group, an alkyl group having 1 to 12 carbon atoms, or 1 to 1 carbon atom. It may be substituted with a 12 alkoxy group, an alicyclic hydrocarbon group having 3 to 12 carbon atoms, or an aromatic hydrocarbon group having 6 to 10 carbon atoms. ]
[6] ^{X 1} is a polymerizable monomer according to which a group represented by the formula ^(X 1 -1) [4] or [5].
[7] The polymerizable monomer according to any one of [4] to [6], wherein A ¹ is a single bond.
[8] A resin having a structural unit derived from the compound according to any one of [1] to [7].
[9] The resin according to [8], further having a structural unit derived from a monomer having an acid labile group.
[10] A resist composition comprising the resin according to [8] or [9] and an acid generator.
[11] The resist composition according to [10], wherein the acid generator is an acid generator represented by the formula (B1).

[In the formula (B1),
Q ^b1 and Q ^b2 each independently represent a fluorine atom or a C 1-6 perfluoroalkyl group.
L ^b1 represents a C1-C17 divalent saturated hydrocarbon group which may have a single bond or a substituent, and the methylene group contained in the saturated hydrocarbon group is an oxygen atom or a carbonyl group. It may be replaced.
Y represents an alkyl group having 1 to 18 carbon atoms which may have a substituent or an alicyclic hydrocarbon group having 3 to 18 carbon atoms which may have a substituent. The methylene group contained in the alicyclic hydrocarbon group may be replaced with an oxygen atom, a sulfonyl group or a carbonyl group.
Zb ⁺ represents an organic cation. ]
[12] The resist composition according to [10] or [11], further containing a salt having a lower acidity than the acid generated from the acid generator.
[13] (1) A step of applying the resist composition according to any one of [10] to [12] on a substrate,
(2) The process of drying the composition after application | coating and forming a composition layer,
(3) a step of exposing the composition layer;
(4) a step of heating the composition layer after exposure, and (5) a step of developing the composition layer after heating,
A method for producing a resist pattern including:

  Provided are a polysynthetic monomer capable of producing a resist pattern having a good mask error factor (MEF), a resin containing a structural unit derived from the polysynthetic monomer, and a resist composition containing the resin.

In the present specification, "(meth) acrylic monomer" means at least one monomer having a "CH ₂ = CH-CO-" or _{"CH 2 = C (CH 3)} -CO- " structure of To do. Similarly, “(meth) acrylate” and “(meth) acrylic acid” mean “at least one of acrylate and methacrylate” and “at least one of acrylic acid and methacrylic acid”, respectively.
In this specification, the polysynthetic monomer means a monomer having at least one site where a polymerization reaction occurs (hereinafter sometimes referred to as a polymerizable group).
Examples of the polymerizable group include a group containing a vinylidene group, and a vinyl group, an acryloyl group, and a methacryloyl group are preferable.

［式（Ｉ１）中、
Ｒ¹は、水素原子又は炭素数１〜２４の炭化水素基を表し、該炭化水素基に含まれるメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよく、該炭化水素基に含まれる水素原子は、ハロゲン原子又はヒドロキシ基で置換されていてもよい。
環Ｗは、炭素数３〜３６の脂環式炭化水素環を表し、該脂環式炭化水素環に含まれるメチレン基は、酸素原子、硫黄原子、カルボニル基又はスルホニル基で置換されていてもよく、該脂環式炭化水素環に含まれる水素原子は、ヒドロキシ基、炭素数１〜１２のアルキル基、炭素数１〜１２のアルコキシ基、炭素数３〜１２の脂環式炭化水素基、炭素数６〜１０の芳香族炭化水素基又はこれらを組み合わせた基で置換されていてもよい。］ The present invention is a polymerizable monomer having at least one group represented by the formula (I1) (hereinafter sometimes referred to as monomer (I1)).

[In the formula (I1),
R ¹ represents a hydrogen atom or a hydrocarbon group having 1 to 24 carbon atoms, and the methylene group contained in the hydrocarbon group may be replaced by an oxygen atom or a carbonyl group, and hydrogen contained in the hydrocarbon group The atom may be substituted with a halogen atom or a hydroxy group.
Ring W represents an alicyclic hydrocarbon ring having 3 to 36 carbon atoms, and the methylene group contained in the alicyclic hydrocarbon ring may be substituted with an oxygen atom, a sulfur atom, a carbonyl group or a sulfonyl group. Well, the hydrogen atom contained in the alicyclic hydrocarbon ring is a hydroxy group, an alkyl group having 1 to 12 carbon atoms, an alkoxy group having 1 to 12 carbon atoms, an alicyclic hydrocarbon group having 3 to 12 carbon atoms, The aromatic hydrocarbon group having 6 to 10 carbon atoms or a combination thereof may be substituted. ]

Examples of the hydrocarbon group include an alkyl group, an alicyclic hydrocarbon group, an aromatic hydrocarbon group, and a group formed by a combination thereof.
Examples of the alkyl group include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, sec-butyl group, tert-butyl group, n-pentyl group, n-hexyl group, n-heptyl group, 2 -Ethylhexyl group, n-octyl group, n-nonyl group, n-decyl group, n-undecyl group and n-dodecyl group are mentioned. Preferably, it is a C1-C12 alkyl group, More preferably, it is a C1-C6 alkyl group.
The alicyclic hydrocarbon group may be either monocyclic or polycyclic, and the monocyclic alicyclic hydrocarbon group includes a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, and a methylcyclohexyl group. And cycloalkyl groups such as dimethylcyclohexyl group, cycloheptyl group, cyclooctyl group, cycloheptyl group and cyclodecyl group. Examples of the polycyclic alicyclic hydrocarbon group include decahydronaphthyl group, adamantyl group, 2-alkyladamantan-2-yl group, 1- (adamantan-1-yl) alkane-1-yl group, norbornyl group, Examples thereof include a methylnorbornyl group and an isobornyl group. Preferably it is a C3-C12 alicyclic hydrocarbon group.
Examples of the aromatic hydrocarbon group include a phenyl group, a tosyl group, a naphthyl group, a biphenyl group, a xylyl group, and an anthracenyl group. An aromatic hydrocarbon group having 6 to 18 carbon atoms is preferable, and a phenyl group or a naphthyl group is more preferable.
As a group formed by combining, an aralkyl group is mentioned, for example, A benzyl group, a phenethyl group, etc. are mentioned.
Examples of those in which the methylene group contained in the aliphatic hydrocarbon group is replaced with an oxygen atom or a carbonyl group include an alkoxy group, an acyl group, and an acyloxy group.

R ¹ includes an alkyl group having 1 to 12 carbon atoms, an alicyclic hydrocarbon group having 3 to 12 carbon atoms, and a group formed by a combination thereof (provided that the alkyl group and the alicyclic hydrocarbon group). The methylene group contained in may be replaced with an oxygen atom or a carbonyl group.) Is preferable, and an alkyl group having 1 to 12 carbon atoms is more preferable.
Examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom. Preferred is a fluorine atom.

［式（Ｗ−１）〜式（Ｗ−１１）で表される環中、
環に含まれるメチレン基は酸素原子、硫黄原子、カルボニル基又はスルホニル基で置換されていてもよく、環に含まれる水素原子は、ヒドロキシ基、炭素数１〜１２のアルキル基、炭素数１〜１２のアルコキシ基、炭素数３〜１２の脂環式炭化水素基又は炭素数６〜１０の芳香族炭化水素基で置換されていてもよい。＊は、結合手を表す。］ Examples of the alicyclic hydrocarbon ring having 3 to 36 carbon atoms in the ring W include rings represented by formulas (W-1) to (W-11), and alicyclic carbonization having 3 to 18 carbon atoms. A hydrogen ring is preferable, and among them, a ring represented by the formula (W-1), a ring represented by the formula (W-2) or a ring represented by the formula (W-3) is preferable.

[In the ring represented by Formula (W-1) to Formula (W-11),
The methylene group contained in the ring may be substituted with an oxygen atom, a sulfur atom, a carbonyl group or a sulfonyl group, and the hydrogen atom contained in the ring is a hydroxy group, an alkyl group having 1 to 12 carbon atoms, or 1 to 1 carbon atom. It may be substituted with a 12 alkoxy group, an alicyclic hydrocarbon group having 3 to 12 carbon atoms, or an aromatic hydrocarbon group having 6 to 10 carbon atoms. * Represents a bond. ]

式（Ｗ−１）〜式（Ｗ−１１）における炭素数６〜１０の芳香族炭化水素基としては、フェニル基、ナフチル基が挙げられる。 Examples of the alkyl group having 1 to 12 carbon atoms that the alicyclic hydrocarbon group having 3 to 36 carbon atoms may have include a methyl group, an ethyl group, an n-propyl group, an isopropyl group, an n-butyl group, sec -Butyl group, tert-butyl group, n-pentyl group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group, n-undecyl group, n-dodecyl group and 2 -An ethylhexyl group is mentioned.
Examples of the alkoxy group having 1 to 12 carbon atoms that the alicyclic hydrocarbon group having 3 to 36 carbon atoms may have include a methoxy group, an ethoxy group, an n-propoxy group, an n-butoxy group, and n-pentyloxy. Group, n-hexyloxy group, n-octyloxy group, 2-ethylhexyloxy group, n-nonyloxy group, n-decyloxy group, n-undecyloxy group and n-dodecyloxy group.
Examples of the alicyclic hydrocarbon group having 3 to 12 carbon atoms that the alicyclic hydrocarbon group having 3 to 36 carbon atoms may have include the following groups.

Examples of the aromatic hydrocarbon group having 6 to 10 carbon atoms in Formula (W-1) to Formula (W-11) include a phenyl group and a naphthyl group.

Examples of the group represented by the formula (I1) include the following structures. * In the following structure represents a bond.

［式（Ｉ）中、
Ｒ¹及びＷは、上記と同じ意味を表す。
Ｒ²は、水素原子又はメチル基を表す。
Ｘ^１は、式（Ｘ^１−１）〜式（Ｘ^１−３）のいずれかで表される基を表す。

（式（Ｘ^１−１）〜式（Ｘ^１−３）中、＊はＡ^１との結合手を表す。）
Ａ¹は、単結合又は炭素数１〜２４の２価の飽和炭化水素基を表し、該飽和炭化水素基に含まれるメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよい。］ The monomer (I1) may have a plurality of groups represented by the formula (I1). When the monomer (I1) has a plurality of groups represented by the formula (I1), the plurality of groups represented by the formula (I1) may be different from each other.
The monomer (I1) is preferably a monomer having at least one group selected from the group consisting of a vinyl group, an acryloyl group and a methacryloyl group, and a group represented by the formula (I1). It is more preferable that it is a compound represented by these.

[In the formula (I),
R ¹ and W represent the same meaning as described above.
R ² represents a hydrogen atom or a methyl group.
X ¹ represents a group represented by any one of formulas (X ¹ -1) to (X ¹ -3).

(In formula (X ¹ -1) to formula (X ¹ -3), * represents a bond with A ^1. )
A ¹ represents a single bond or a divalent saturated hydrocarbon group having 1 to 24 carbon atoms, and the methylene group contained in the saturated hydrocarbon group may be replaced with an oxygen atom or a carbonyl group. ]

Examples of the divalent saturated hydrocarbon group represented by A ¹ include alkanediyl groups, monocyclic or polycyclic divalent alicyclic saturated hydrocarbon groups, and two or more of these groups. May be combined.
Specifically, methylene group, ethylene group, propane-1,3-diyl group, butane-1,4-diyl group, pentane-1,5-diyl group, hexane-1,6-diyl group, heptane-1 , 7-diyl group, octane-1,8-diyl group, nonane-1,9-diyl group, decane-1,10-diyl group, undecane-1,11-diyl group, dodecane-1,12-diyl group , Tridecane-1,13-diyl group, tetradecane-1,14-diyl group, pentadecane-1,15-diyl group, hexadecane-1,16-diyl group and heptadecane-1,17-diyl group Alkanediyl group;
Ethane-1,1-diyl group, propane-1,1-diyl group, propane-1,2-diyl group, propane-2,2-diyl group, pentane-2,4-diyl group, 2-methylpropane- Branched alkanediyl groups such as 1,3-diyl group, 2-methylpropane-1,2-diyl group, pentane-1,4-diyl group, 2-methylbutane-1,4-diyl group;
Monocyclic 2 which is a cycloalkanediyl group such as cyclobutane-1,3-diyl group, cyclopentane-1,3-diyl group, cyclohexane-1,4-diyl group, cyclooctane-1,5-diyl group Valent alicyclic saturated hydrocarbon group;
Polycyclic divalent alicyclic saturated hydrocarbon such as norbornane-1,4-diyl group, norbornane-2,5-diyl group, adamantane-1,5-diyl group, adamantane-2,6-diyl group, etc. Groups and the like.

（式（ａ−ｇ１）中、
ｓは０〜２の整数を表す。
Ａ^１０は、炭素数１〜５の脂肪族炭化水素基を表す。
Ａ^１１は、単結合又は炭素数１〜５の脂肪族炭化水素基を表す。
ｓが２のとき、複数存在するＡ^１０は、互いに同一であるか相異なる。
Ｘ^１０は、酸素原子、カルボニル基、カルボニルオキシ基又はオキシカルボニル基を表す。
ｓが２のとき、複数存在するＸ^１０は、互いに同一であるか相異なる。） Examples of the group in which the methylene group contained in the divalent saturated hydrocarbon group represented by A ¹ is replaced by an oxygen atom or a carbonyl group include a group represented by the formula (a-g1).

(In the formula (a-g1),
s represents the integer of 0-2.
A ¹⁰ represents an aliphatic hydrocarbon group having 1 to 5 carbon atoms.
A ¹¹ represents a single bond or an aliphatic hydrocarbon group having 1 to 5 carbon atoms.
When s is 2, a plurality of A ¹⁰ are the same or different from each other.
X ¹⁰ represents an oxygen atom, a carbonyl group, a carbonyloxy group or an oxycarbonyl group.
When s is 2, a plurality of X ¹⁰ are the same or different from each other. )

In the formula (a-g1), the aliphatic hydrocarbon group represented by A ¹⁰ and A ¹¹ is a divalent aliphatic hydrocarbon group, and an alkanediyl group is preferable. The alkanediyl group may be linear or branched, for example, methylene group, ethylene group, 1,2-propanediyl group, 1,3-propanediyl group, 1,4-butanediyl group. 1,5-pentanediyl group, 1,3-pentanediyl group and the like, preferably methylene group and ethylene group.

等が挙げられる。 Specific examples of the group represented by the formula (a-g1) (hereinafter sometimes referred to as “group (a-g1)”) are shown below. In each specific example, * represents a bond. As the group (a-g1) in which s is 1 or 2 and has an oxygen atom,

Etc.

等が挙げられる。 As the group (a-g1) having a carbonyl group,

Etc.

等が挙げられる。 As the group (a-g1) having a carbonyloxy group,

Etc.

等が挙げられる。 As the group having an oxycarbonyl group (a-g1),

Etc.

A ¹ is preferably a single bond or a group (a-g1), and more preferably a single bond.

  Examples of the compound represented by the formula (I) include the following.

（式中、Ｒ^１及びＷは、上記と同じ意味を表す。）
塩基触媒としては、ピリジン等が挙げられる。
溶媒としては、ジメチルエーテル等が挙げられる。 <Method for Producing Monomer (I1)>
A method for producing the monomer (I1) will be described.
The compound having a group represented by the formula (I1) is obtained by combining a compound having a group represented by the formula (Ia) and a compound represented by the formula (Ib) in a solvent under a base catalyst. It can be produced by reacting.

(Wherein R ¹ and W represent the same meaning as described above.)
Examples of the base catalyst include pyridine.
Examples of the solvent include dimethyl ether.

式（Ｉ−ｂ）で表される化合物としては、下記式で表される塩等が挙げられ、市場より容易に入手することができる。

Examples of the compound represented by the formula (Ia) include compounds represented by the following formula, and can be easily obtained from the market.

Examples of the compound represented by the formula (Ib) include salts represented by the following formula, and can be easily obtained from the market.

<Resin (A)>
The present invention relates to a resin having a structural unit derived from a polymerizable monomer having a group represented by the formula (I1) (hereinafter sometimes referred to as “structural unit (I1)”) (hereinafter sometimes referred to as “resin (A)”. ").

The content of the structural unit (I1) contained in the resin (A) is usually 1 to 100 mol%, preferably 1 to 50 mol%, more preferably 1 to 30 mol based on all structural units of the resin (A). It is mol%, More preferably, it is 2-20 mol%, Most preferably, it is 3-10 mol%.
The resin (A) of the present invention contains a structural unit having an acid labile group (hereinafter sometimes referred to as “structural unit (a1)”) in addition to the structural unit (I1). The resin (A) may contain a structural unit having no acid labile group (hereinafter sometimes referred to as “structural unit (s)”).
The acid labile group as used herein refers to a group having a leaving group, which is removed by contact with an acid and the structural unit is converted into a hydrophilic group (for example, a hydroxy group or a carboxy group). means.
The resin (A) has a structural unit having an acid labile group (hereinafter sometimes referred to as “structural unit (a1)”). The resin (A) preferably further contains a structural unit other than the structural unit (a1). Examples of the structural unit other than the structural unit (a1) include a structural unit having no acid labile group (hereinafter sometimes referred to as “structural unit (s)”).

［式（１）中、Ｒ^a1〜Ｒ^a3は、それぞれ独立に、炭素数１〜８のアルキル基、炭素数３〜２０の脂環式炭化水素基又はこれらを組合わせた基を表すか、Ｒ^a1及びＲ^a2は互いに結合して炭素数２〜２０の２価の炭化水素基を形成する。
ｎａは、０又は１を表す。
＊は結合手を表す。］

［式（２）中、Ｒ^a1’及びＲ^a2’は、それぞれ独立に、水素原子又は炭素数１〜１２の炭化水素基を表し、Ｒ^a3’は、炭素数１〜２０の炭化水素基を表すか、Ｒ^a2’及びＲ^a3’は互いに結合して炭素数２〜２０の２価の炭化水素基を形成し、該炭化水素基及び該２価の炭化水素基に含まれる−ＣＨ_２−は、−Ｏ−又は−Ｓ−で置き換わってもよい。
Ｘは、酸素原子又は硫黄原子を表す。
＊は結合手を表す。］ <Structural unit (a1)>
The structural unit (a1) is derived from a monomer having an acid labile group (hereinafter sometimes referred to as “monomer (a1)”).
The “acid labile group” has a leaving group, and the leaving group is eliminated by contact with an acid, and the structural unit is converted into a structural unit having a hydrophilic group (for example, a hydroxy group or a carboxy group). Means a group. In the resin (A), a group represented by the formula (1) and / or a group represented by the formula (2) is preferable.

[In Formula (1), R ^<a1 > -R < ^a3 > respectively independently represents a C1-C8 alkyl group, a C3-C20 alicyclic hydrocarbon group, or the group which combined these, R ^a1 and R ^a2 are bonded to each other to form a divalent hydrocarbon group having 2 to 20 carbon atoms.
na represents 0 or 1.
* Represents a bond. ]

[In Formula (2), R ^{a1 ′} and R ^{a2 ′} each independently represent a hydrogen atom or a hydrocarbon group having 1 to 12 carbon atoms, and R ^{a3 ′} represents a hydrocarbon group having 1 to 20 carbon atoms. R ^{a2 ′} and R ^{a3 ′} are bonded to each other to form a divalent hydrocarbon group having 2 to 20 carbon atoms, and —CH ₂ — contained in the hydrocarbon group and the divalent hydrocarbon group. May be replaced by -O- or -S-.
X represents an oxygen atom or a sulfur atom.
* Represents a bond. ]

アルキル基と脂環式炭化水素基とを組合わせた基としては、メチルシクロヘキシル基、ジメチルシクロへキシル基、メチルノルボルニル基、シクロヘキシルメチル基、アダマンチルメチル基、ノルボルニルエチル基等が挙げられる。
ｎａは、好ましくは０である。 ^Examples of the alkyl group represented by R ^{a1 to} R ^a3 include a methyl group, an ethyl group, a propyl group, an n-butyl group, an n-pentyl group, an n-hexyl group, an n-heptyl group, and an n-octyl group.
The alicyclic hydrocarbon group for R ^{a1 to} R ^a3 may be monocyclic or polycyclic. Examples of the monocyclic alicyclic hydrocarbon group include cycloalkyl groups such as a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, and a cyclooctyl group. Examples of the polycyclic alicyclic hydrocarbon group include a decahydronaphthyl group, an adamantyl group, a norbornyl group, and the following group (* represents a bond). The alicyclic hydrocarbon group of R ^{a1 to} R ^a3 preferably has 3 to 16 carbon atoms.

Examples of the group in which an alkyl group and an alicyclic hydrocarbon group are combined include a methylcyclohexyl group, a dimethylcyclohexyl group, a methylnorbornyl group, a cyclohexylmethyl group, an adamantylmethyl group, and a norbornylethyl group. It is done.
na is preferably 0.

Examples of —C (R ^a1 ) (R ^a2 ) (R ^a3 ) in the case where R ^a1 and R ^a2 are bonded to each other to form a divalent hydrocarbon group include the following groups. The divalent hydrocarbon group preferably has 3 to 12 carbon atoms. * Represents a bond with -O-.

Examples of the group represented by the formula (1) include a 1,1-dialkylalkoxycarbonyl group (a group in which R ^{a1 to} R ^a3 are alkyl groups in the formula (1), preferably a tert-butoxycarbonyl group), 2- An alkyladamantan-2-yloxycarbonyl group (in the formula (1), R ^a1 , R ^a2 and a carbon atom to which they are bonded form an adamantyl group, and R ^a3 is an alkyl group) and 1- (adamantane- 1-yl) -1-alkylalkoxycarbonyl group (in the formula (1), R ^a1 and R ^a2 are alkyl groups, and R ^a3 is an adamantyl group).

Examples of the hydrocarbon group of R ^{a1 ′ to} R ^{a3 ′} include an alkyl group, an alicyclic hydrocarbon group, an aromatic hydrocarbon group, and a group formed by combining these.
Examples of the alkyl group and alicyclic hydrocarbon group are the same as those described above.
Aromatic hydrocarbon groups include phenyl, naphthyl, anthryl, p-methylphenyl, p-tert-butylphenyl, p-adamantylphenyl, tolyl, xylyl, cumenyl, mesityl, biphenyl Groups, phenanthryl groups, 2,6-diethylphenyl groups, aryl groups such as 2-methyl-6-ethylphenyl, and the like.
Examples of the divalent hydrocarbon group formed by combining R ^{a2 ′} and R ^{a3 ′} include groups in which one hydrogen atom has been removed from the hydrocarbon groups of R ^{a1 ′ to} R ^{a3 ′} .
At least one of R ^{a1 ′} and R ^{a2 ′} is preferably a hydrogen atom.

Specific examples of the group represented by the formula (2) include the following groups. * Represents a bond.

  The monomer (a1) is preferably a monomer having an acid labile group and an ethylenically unsaturated bond, more preferably a (meth) acrylic monomer having an acid labile group.

  Among the (meth) acrylic monomers having an acid labile group, those having an alicyclic hydrocarbon group having 5 to 20 carbon atoms are preferable. If the resin (A) having a structural unit derived from the monomer (a1) having a bulky structure such as an alicyclic hydrocarbon group is used in the resist composition, the resolution of the resist pattern can be improved.

  As a structural unit derived from a (meth) acrylic monomer having a group represented by the formula (1), a structural unit represented by the formula (a1-0) is preferably represented by the formula (a1-1). The structural unit represented by a structural unit or a formula (a1-2) is mentioned. These may be used alone or in combination of two or more. In this specification, the structural unit represented by formula (a1-0), the structural unit represented by formula (a1-1), and the structural unit represented by formula (a1-2) are each represented by structural unit (a1). -0), structural unit (a1-1) and structural unit (a1-2), a monomer for deriving structural unit (a1-0), a monomer for deriving structural unit (a1-1), and a structural unit (a1- The monomer that induces 2) may be referred to as monomer (a1-0), monomer (a1-1), and monomer (a1-2), respectively.

［式（ａ１−０）中、
Ｌ^a01は、酸素原子又は^＊−Ｏ−（ＣＨ₂）_k01−ＣＯ−Ｏ−を表し、ｋ０１は１〜７の整数を表し、＊はカルボニル基との結合手を表す。
Ｒ^a01は、それぞれ独立に、水素原子又はメチル基を表す。
Ｒ^a02、Ｒ^a03及びＲ^a04は、それぞれ独立に、炭素数１〜８のアルキル基、炭素数３〜１８の脂環式炭化水素基又はこれらを組合わせた基を表す。］

[In the formula (a1-0),
L ^a01 represents an oxygen atom or ^* —O— (CH ₂ ) _k01 —CO—O—, k01 represents an integer of 1 to 7, and * represents a bond to a carbonyl group.
R ^a01 independently represents a hydrogen atom or a methyl group.
R ^a02 , R ^a03 and R ^a04 each independently ^represent an alkyl group having 1 to 8 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or a group obtained by combining these. ]

［式（ａ１−１）及び式（ａ１−２）中、
Ｌ^a1及びＬ^a2は、それぞれ独立に、−Ｏ−又は^＊−Ｏ−（ＣＨ₂）_k1−ＣＯ−Ｏ−を表し、ｋ１は１〜７の整数を表し、＊は−ＣＯ−との結合手を表す。
Ｒ^a4及びＲ^a5は、それぞれ独立に、水素原子又はメチル基を表す。
Ｒ^a6及びＲ^a7は、それぞれ独立に、炭素数１〜８のアルキル基、炭素数３〜１８の脂環式炭化水素基又はこれらを組合わせることにより形成される基を表す。
ｍ１は０〜１４の整数を表す。
ｎ１は０〜１０の整数を表す。
ｎ１’は０〜３の整数を表す。］

[In Formula (a1-1) and Formula (a1-2),
L ^a1 and L ^a2 each independently represent —O— or ^* —O— (CH ₂ ) _k1 —CO—O—, k1 represents an integer of 1 to 7, and * represents a bond to —CO—. Represents a hand.
R ^a4 and R ^a5 each independently represent a hydrogen atom or a methyl group.
R ^a6 and R ^a7 each independently represent an alkyl group having 1 to 8 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or a group formed by combining these.
m1 represents the integer of 0-14.
n1 represents an integer of 0 to 10.
n1 ′ represents an integer of 0 to 3. ]

L ^a02 is preferably an oxygen atom or ^* —O— (CH ₂ ) _k01 —CO—O—, and more preferably an oxygen atom. k01 is preferably an integer of 1 to 4, more preferably 1.
Examples of the alkyl group of R ^a02 , R ^a03, and R ^a04 , the alicyclic hydrocarbon group, and the group obtained by combining these include the same groups as those described for R ^{a1 to} R ^a3 in formula (1).
The alkyl group for R ^a02 , R ^a03 and R ^a04 preferably has 6 or less carbon atoms.
The alicyclic hydrocarbon group ^{represented by} R ^a02 , R ^a03 and R ^a04 preferably has 8 or less carbon atoms, more preferably 6 or less.
The group combining the alkyl group and the alicyclic hydrocarbon group preferably has a total carbon number of 18 or less, combining the alkyl group and the alicyclic hydrocarbon group. Examples of such a group include a methylcyclohexyl group, a dimethylcyclohexyl group, and a methylnorbornyl group.
R ^a02 and R ^a03 are preferably an alkyl group having 1 to 6 carbon atoms, more preferably a methyl group or an ethyl group.
R ^a04 is preferably an alkyl group having 1 to 6 carbon atoms or an alicyclic hydrocarbon group having 5 to 12 carbon atoms, and more preferably a methyl group, an ethyl group, a cyclohexyl group, or an adamantyl group.

L ^a1 and L ^a2 are preferably —O— or ^* —O— (CH ₂ ) _{k1 ′} —CO—O—, more preferably —O—. k1 ′ is an integer of 1 to 4, preferably 1.
R ^a4 and R ^a5 are preferably methyl groups.
^Examples of the alkyl group for R ^a6 and R ^a7 include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, sec-butyl group, tert-butyl group, n-pentyl group, n-hexyl group, Examples include n-heptyl group, 2-ethylhexyl group, n-octyl group and the like.
The alicyclic hydrocarbon group for R ^a6 and R ^a7 may be either monocyclic or polycyclic, and the monocyclic alicyclic hydrocarbon group includes a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, Examples thereof include cycloalkyl groups such as a cyclohexyl group, a methylcyclohexyl group, a dimethylcyclohexyl group, a cycloheptyl group, a cyclooctyl group, a cycloheptyl group, and a cyclodecyl group. Examples of the polycyclic alicyclic hydrocarbon group include decahydronaphthyl group, adamantyl group, 2-alkyladamantan-2-yl group, 1- (adamantan-1-yl) alkane-1-yl group, and norbornyl. Group, methylnorbornyl group, isobornyl group and the like.
Examples of the group formed by combining the alkyl group of R ^a6 and R ^a7 and the alicyclic hydrocarbon group include an aralkyl group, and examples thereof include a benzyl group and a phenethyl group.
The alkyl group for R ^a6 and R ^a7 preferably has 6 or less carbon atoms.
The alicyclic hydrocarbon group of R ^a6 and R ^a7 preferably has 8 or less carbon atoms, more preferably 6 or less.
m1 is preferably an integer of 0 to 3, more preferably 0 or 1.
n1 is preferably an integer of 0 to 3, more preferably 0 or 1.
n1 ′ is preferably 0 or 1.

As the monomer (a1-0), a monomer represented by any one of the formulas (a1-0-1) to (a1-1-12) is preferable, and the formula (a1-0-1) to the formula (a1- The monomer represented by any one of 1-10) is more preferable.

In the above structural unit, a structural unit in which a methyl group corresponding to R ^a01 is replaced with a hydrogen atom can also be given as a specific example of the structural unit (a1-0).

As a monomer (a1-1), the monomer described in Unexamined-Japanese-Patent No. 2010-204646 is mentioned. Among these, a monomer represented by any one of formula (a1-1-1) to formula (a1-1-8) is preferable, and any one of formula (a1-1-1) to formula (a1-1-4) is preferable. The monomer represented by is more preferable.

As the monomer (a1-2), 1-methylcyclopentan-1-yl (meth) acrylate, 1-ethylcyclopentan-1-yl (meth) acrylate, 1-methylcyclohexane-1-yl (meth) acrylate, 1-ethylcyclohexane-1-yl (meth) acrylate, 1-ethylcycloheptan-1-yl (meth) acrylate, 1-ethylcyclooctane-1-yl (meth) acrylate, 1-isopropylcyclopentan-1-yl (Meth) acrylate, 1-isopropylcyclohexane-1-yl (meth) acrylate, etc. are mentioned. A monomer represented by any one of the formulas (a1-2-1) to (a1-2-12) is preferable, and the formula (a1-2-3), the formula (a1-2-4), the formula (a1- The monomer represented by 2-9) or formula (a1-2-10) is more preferred, and the monomer represented by formula (a1-2-3) or formula (a1-2-9) is more preferred.

  When the resin (A) includes the structural unit (a1-0) and / or the structural unit (a1-1) and / or the structural unit (a1-2), the total content thereof is the total structure of the resin (A). It is 10-95 mol% normally with respect to a unit, Preferably it is 15-90 mol%, More preferably, it is 20-85 mol%.

式（ａ１−３）中、
Ｒ^a9は、ヒドロキシ基を有していてもよい炭素数１〜３の脂肪族炭化水素基、カルボキシ基、シアノ基、水素原子又は−ＣＯＯＲ^a13を表す。
Ｒ^a13は、炭素数１〜８の脂肪族炭化水素基、炭素数３〜２０の脂環式炭化水素基、又はこれらを組み合わせることにより形成される基を表し、該脂肪族炭化水素基及び該脂環式炭化水素基に含まれる水素原子は、ヒドロキシ基で置換されていてもよく、該脂肪族炭化水素基及び該脂環式炭化水素基に含まれる−ＣＨ_２−は、−Ｏ−−又は−ＣＯ−に置き換わっていてもよい。
Ｒ^a10、Ｒ^a11及びＲ^a12は、それぞれ独立に、炭素数１〜８のアルキル基、炭素数３〜２０の脂環式炭化水素基又はこれらを組合わせることにより形成される基を表すか、Ｒ^a10及びＲ^a11は互いに結合して、それらが結合する炭素原子とともに炭素数２〜２０の２価の炭化水素基を形成する。 Furthermore, examples of the structural unit (a1) having the group (1) include a structural unit represented by the formula (a1-3). The structural unit represented by the formula (a1-3) may be referred to as a structural unit (a1-3). Moreover, the monomer which derives the structural unit (a1-3) may be referred to as a monomer (a1-3).

In formula (a1-3),
R ^a9 represents an aliphatic hydrocarbon group having 1 to 3 carbon atoms which may have a hydroxy group, a carboxy group, a cyano group, a hydrogen atom, or —COOR ^a13 .
R ^a13 represents an aliphatic hydrocarbon group having 1 to 8 carbon atoms, an alicyclic hydrocarbon group having 3 to 20 carbon atoms, or a group formed by a combination thereof, the aliphatic hydrocarbon group and the The hydrogen atom contained in the alicyclic hydrocarbon group may be substituted with a hydroxy group, and —CH ₂ — contained in the aliphatic hydrocarbon group and the alicyclic hydrocarbon group is —O——. Alternatively, it may be replaced by -CO-.
R ^a10 , R ^a11 and R ^a12 each independently represent an alkyl group having 1 to 8 carbon atoms, an alicyclic hydrocarbon group having 3 to 20 carbon atoms, or a group formed by combining these, R ^a10 and R ^a11 are bonded to each other to form a divalent hydrocarbon group having 2 to 20 carbon atoms together with the carbon atom to which they are bonded.

Here, -COOR ^a13 includes, for example, a group in which a carbonyl group is bonded to an alkoxy group such as a methoxycarbonyl group and an ethoxycarbonyl group.

Examples of the aliphatic hydrocarbon group which may have a hydroxy group of R ^a9 include a methyl group, an ethyl group, a propyl group, a hydroxymethyl group and a 2-hydroxyethyl group.
^Examples of the aliphatic hydrocarbon group having 1 to 8 carbon atoms represented by R ^a13 include a methyl group, an ethyl group, and a propyl group.
^Examples of the alicyclic hydrocarbon group having 3 to 20 carbon atoms represented by R ^a13 include a cyclopentyl group, a cyclopropyl group, an adamantyl group, an adamantylmethyl group, a 1-adamantyl-1-methylethyl group, and 2-oxo-oxolane-3- Yl group and 2-oxo-oxolan-4-yl group.
^Examples of the alkyl group represented by R ^{a10 to} R ^a12 include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, sec-butyl group, tert-butyl group, n-pentyl group, n-hexyl group, Examples include n-heptyl group, 2-ethylhexyl group, n-octyl group and the like.
The alicyclic hydrocarbon group for R ^{a10 to} R ^a12 may be monocyclic or polycyclic, and examples of the monocyclic alicyclic hydrocarbon group include a cyclopropyl group, a cyclobutyl group, and cyclopentyl. And cycloalkyl groups such as a group, a cyclohexyl group, a methylcyclohexyl group, a dimethylcyclohexyl group, a cycloheptyl group, a cyclooctyl group, a cycloheptyl group, and a cyclodecyl group. Examples of the polycyclic alicyclic hydrocarbon group include decahydronaphthyl group, adamantyl group, 2-alkyladamantan-2-yl group, 1- (adamantan-1-yl) alkane-1-yl group, and norbornyl. Group, methylnorbornyl group, isobornyl group and the like.
-C (R ^a10 ) (R ^a11 ) (R ^a12 ) in the case where R ^a10 and R ^a11 are bonded to each other to form a divalent hydrocarbon group together with the carbon atom to which they are bonded, Groups are preferred.

  Specific examples of the monomer (a1-3) include 5-norbornene-2-carboxylic acid-tert-butyl, 5-norbornene-2-carboxylic acid 1-cyclohexyl-1-methylethyl, and 5-norbornene-2-carboxylic acid. Acid 1-methylcyclohexyl, 5-norbornene-2-carboxylic acid 2-methyl-2-adamantyl, 5-norbornene-2-carboxylic acid 2-ethyl-2-adamantyl, 5-norbornene-2-carboxylic acid 1- (4 -Methylcyclohexyl) -1-methylethyl, 5-norbornene-2-carboxylic acid 1- (4-hydroxycyclohexyl) -1-methylethyl, 5-norbornene-2-carboxylic acid 1-methyl-1- (4-oxo (Cyclohexyl) ethyl and 1- (1-adamantyl) -1-methyl 5-norbornene-2-carboxylate Chill, and the like.

  Since the resin (A) containing the structural unit (a1-3) includes a sterically bulky structural unit, the resist composition of the present invention containing such a resin (A) is more expensive. A resist pattern can be obtained with resolution. Further, since a rigid norbornane ring is introduced into the main chain, the resulting resist pattern tends to be excellent in dry etching resistance.

  When the resin (A) contains the structural unit (a1-3), the content thereof is preferably 10 to 95 mol%, more preferably 15 to 90 mol%, based on all the structural units of the resin (A). 20-85 mol% is more preferable.

［式（ａ１−４）中、
Ｒ^a32は、水素原子、ハロゲン原子、又は、ハロゲン原子を有してもよい炭素数１〜６のアルキル基を表す。
Ｒ^a33は、ハロゲン原子、ヒドロキシ基、炭素数１〜６のアルキル基、炭素数１〜６のアルコキシ基、炭素数２〜４のアシル基、炭素数２〜４のアシルオキシ基、アクリロイルオキシ基又はメタクリロイルオキシ基を表す。
ｌａは０〜４の整数を表す。ｌａが２以上である場合、複数のＲ^a33は互いに同一であっても異なってもよい。
Ｒ^a34及びＲ^a35はそれぞれ独立に、水素原子又は炭素数１〜１２の炭化水素基を表し、Ｒ^a36は、炭素数１〜２０の炭化水素基を表すか、Ｒ^a35及びＲ^a36は互いに結合して炭素数２〜２０の２価の炭化水素基を形成し、該炭化水素基及び該２価の炭化水素基に含まれる−ＣＨ_２−は、−Ｏ−又は−Ｓ−で置き換わってもよい。］ As the structural unit (a1) having a group represented by the group (2), a structural unit represented by the formula (a1-4) (hereinafter sometimes referred to as “structural unit (a1-4)”). Can be mentioned.

[In the formula (a1-4),
R ^a32 represents a hydrogen atom, a halogen atom, or an alkyl group having 1 to 6 carbon atoms which may have a halogen atom.
R ^a33 is a halogen atom, a hydroxy group, an alkyl group having 1 to 6 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an acyl group having 2 to 4 carbon atoms, an acyloxy group having 2 to 4 carbon atoms, an acryloyloxy group, or Represents a methacryloyloxy group.
la represents an integer of 0 to 4. When la is 2 or more, the plurality of R ^a33 may be the same as or different from each other.
R ^a34 and R ^a35 each independently represent a hydrogen atom or a hydrocarbon group having 1 to 12 carbon atoms, R ^a36 may represent a hydrocarbon group having 1 to 20 carbon atoms, R ^a35 and R ^a36 are bonded to each other To form a divalent hydrocarbon group having 2 to 20 carbon atoms, and —CH ₂ — contained in the hydrocarbon group and the divalent hydrocarbon group may be replaced by —O— or —S—. Good. ]

^Examples of the alkyl group for R ^a32 and R ^a33 include a methyl group, an ethyl group, a propyl group, an isopropyl group, a butyl group, a pentyl group, and a hexyl group. The alkyl group is preferably an alkyl group having 1 to 4 carbon atoms, more preferably a methyl group or an ethyl group, and further preferably a methyl group.
Examples of the halogen atom for R ^a32 and R ^a33 include a fluorine atom, a chlorine atom, and a bromine atom.
The R ^a34 and R ^a35, include the same groups as R ¹⁴ and R ¹⁵ of formula (2).
R ^a36 is an alkyl group having 1 to 18 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, an aromatic hydrocarbon group having 6 to 18 carbon atoms, or a group formed by combining these. Can be mentioned.

In formula (a1-2), R ^a32 is preferably a hydrogen atom.
R ^a33 is preferably an alkoxy group having 1 to 4 carbon atoms, more preferably a methoxy group or an ethoxy group, and further preferably a methoxy group.
la is preferably 0 or 1, more preferably 0.
R ^a34 is preferably a hydrogen atom.
R ^a35 is preferably a hydrocarbon group having 1 to 12 carbon atoms, more preferably a methyl group or an ethyl group.
The hydrocarbon group for ^Ra36 is preferably an alkyl group having 1 to 18 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, an aromatic hydrocarbon group having 6 to 18 carbon atoms, or a combination thereof. And more preferably an alkyl group having 1 to 18 carbon atoms, an alicyclic aliphatic hydrocarbon group having 3 to 18 carbon atoms, or an aralkyl group having 7 to 18 carbon atoms. The alkyl group and the alicyclic hydrocarbon group in R ^a36 are preferably unsubstituted. When the aromatic hydrocarbon group in R ^a36 has a substituent, the substituent is preferably an aryloxy group having 6 to 10 carbon atoms.

Examples of the monomer for deriving the structural unit monomer (a1-4) include monomers described in JP2010-204646A. Especially, the monomer respectively represented by Formula (a1-4-1)-Formula (a1-4-7) is preferable, and each is represented by Formula (a1-4-1)-Formula (a1-4-5). Monomers are more preferred.

  When resin (A) has a structural unit (a1-4), the content rate is preferable with respect to all the structural units of resin (A), and 10-95 mol% is preferable, and 15-90 mol% is more preferable. 20 to 85 mol% is more preferable.

式（ａ１−５）中、
Ｒ^a8は、ハロゲン原子を有してもよい炭素数１〜６のアルキル基、水素原子又はハロゲン原子を表す。
Ｚ^ａ１は、単結合又は＊−（ＣＨ₂）_h3−ＣＯ−Ｌ⁵⁴−を表し、ｈ３は１〜４の整数を表し、＊は、Ｌ⁵¹との結合手を表す。
Ｌ⁵¹、Ｌ⁵²、Ｌ⁵³及びＬ⁵⁴は、それぞれ独立に、−Ｏ−又は−Ｓ−を表す。
ｓ１は、１〜３の整数を表す。
ｓ１’は、０〜３の整数を表す。 Examples of the structural unit having an acid labile group include a structural unit represented by the formula (a1-5) (hereinafter sometimes referred to as “structural unit (a1-5)”).

In formula (a1-5),
R ^a8 represents a C 1-6 alkyl group optionally having a halogen atom, a hydrogen atom, or a halogen atom.
Z ^a1 represents a single bond or * — (CH ₂ ) _h3 —CO—L ⁵⁴ —, h3 represents an integer of 1 to 4, and * represents a bond to L ⁵¹ .
L ⁵¹ , L ⁵² , L ⁵³ and L ⁵⁴ each independently represent —O— or —S—.
s1 represents an integer of 1 to 3.
s1 ′ represents an integer of 0 to 3.

In formula (a1-5), R ^a8 is preferably a hydrogen atom, a methyl group or a trifluoromethyl group.
L ⁵¹ is preferably an oxygen atom.
One of L ⁵² and L ⁵³ is preferably —O— and the other is —S—.
s1 is preferably 1.
s1 ′ is preferably an integer of 0 to 2.
Z ^a1 is preferably a single bond or * —CH ₂ —CO—O—.

As a monomer which introduce | transduces structural unit (a1-5), the monomer described in Unexamined-Japanese-Patent No. 2010-61117 is mentioned, for example. Among these, monomers represented by formulas (a1-5-1) to (a1-5-4) are preferable, and monomers represented by formula (a1-5-1) or formula (a1-5-2) are preferable. Is more preferable.

  When resin (A) has a structural unit (a1-5), the content rate is preferable 1-50 mol% with respect to all the structural units of resin (A), and 3-45 mol% is more preferable. 5 to 40 mol% is more preferable.

The structural unit (a) having an acid labile group in the resin (A) includes the structural unit (a1-0), the structural unit (a1-1), the structural unit (a1-2), and the structural unit (a1-5). ) Is preferably at least one selected from the group consisting of, and more preferably at least two, a combination of structural unit (a1-1) and structural unit (a1-2), structural unit (a1-1) and structural unit ( a1-5), a structural unit (a1-1) and a structural unit (a1-0), a structural unit (a1-2) and a structural unit (a1-0), and a structural unit (a1-5) And a combination of the structural unit (a1-0), a structural unit (a1-0), a combination of the structural unit (a1-1) and the structural unit (a1-2), a structural unit (a1-0), and a structural unit (a1- 1) and structural unit (a1-5) More preferably a combination, the combination of the structural units (a1-1) and the structural unit (a1-2), more preferably a combination of structural units (a1-1) and the structural unit (a1-5).

<Structural unit without acid labile group>
The structural unit (s) is derived from a monomer having no acid labile group (hereinafter sometimes referred to as “monomer (s)”). As the monomer for deriving the structural unit (s) (hereinafter sometimes referred to as “monomer (s)”), a monomer having no acid labile group known in the resist field can be used.
As the structural unit (s), a structural unit having a hydroxy group or a lactone ring and having no acid labile group is preferable. A structure having a hydroxy group and having no acid labile group (hereinafter sometimes referred to as “structural unit (a2)”) and / or a lactone ring and having no acid labile group If a resin having a unit (hereinafter sometimes referred to as “structural unit (a3)”) is used in the resist composition of the present invention, the resolution of the resist pattern and the adhesion to the substrate can be improved.

<Structural unit (a2)>
The hydroxy group contained in the structural unit (a2) may be an alcoholic hydroxy group or a phenolic hydroxy group.
When a resist pattern is produced from the resist composition of the present invention, when a high energy beam such as a KrF excimer laser (248 nm), an electron beam or EUV (ultra-ultraviolet light) is used as an exposure light source, the structural unit (a2) It is preferable to use the structural unit (a2) having a phenolic hydroxy group. When an ArF excimer laser (193 nm) or the like is used, the structural unit (a2) having an alcoholic hydroxy group is preferable as the structural unit (a2), and the structural unit (a2-1) is more preferable. As a structural unit (a2), 1 type may be included independently and 2 or more types may be included.

中でも、式（ａ２−０−１）又は式（ａ２−０−２）で表されるものがより好ましい。
構造単位（ａ２−０）を誘導するモノマーとしては、例えば、特開２０１０−２０４６３４号公報に記載されているモノマーが挙げられる。 Examples of the structural unit (a2) having a phenolic hydroxy group include the structural units represented below.

Especially, what is represented by a formula (a2-0-1) or a formula (a2-0-2) is more preferable.
Examples of the monomer that derives the structural unit (a2-0) include monomers described in JP 2010-204634 A.

  The resin (A) containing the structural unit (a2) having a phenolic hydroxy group is obtained by using a monomer in which the phenolic hydroxy group of the monomer for deriving the structural unit (a2) having a phenolic hydroxy group is protected with a protective group. It can be produced by conducting a polymerization reaction and then deprotecting. However, when the deprotection treatment is performed, the acid labile group of the structural unit (a1) needs to be not significantly impaired. Examples of such protecting groups include acetyl groups.

  When the resin (A) has a structural unit (a2) having a phenolic hydroxy group, the content is preferably from 5 to 95 mol%, more preferably from 10 to 80 mol, based on all structural units of the resin (A). % Is more preferable, and 15 to 80 mol% is more preferable.

式（ａ２−１−１）〜式（ａ２−１−４）のいずれかで表される構造単位が好ましく、式式（ａ２−１−１）又は式（ａ２−１−３）で表される構造単位がより好ましい。
アルコール性ヒドロキシ基を有する構造単位（ａ２）を誘導するモノマーとしては、例えば、特開２０１０−２０４６４６号公報に記載されたモノマーが挙げられる。 Examples of the structural unit (a2) having an alcoholic hydroxy group include the following structural units.

A structural unit represented by any one of formula (a2-1-1) to formula (a2-1-4) is preferable, and is represented by formula (a2-1-1) or formula (a2-1-3). The structural unit is more preferable.
Examples of the monomer for deriving the structural unit (a2) having an alcoholic hydroxy group include monomers described in JP2010-204646A.

  When the resin (A) contains a structural unit (a2) having an alcoholic hydroxy group, the content is usually 1 to 45 mol%, preferably 1 to 45 mol% with respect to all the structural units of the resin (A). It is 40 mol%, More preferably, it is 1-35 mol%, More preferably, it is 2-20 mol%.

<Structural unit (a3)>
The lactone ring of the structural unit (a3) may be a monocycle such as a β-propiolactone ring, γ-butyrolactone ring, or δ-valerolactone ring, or a condensed ring of a monocyclic lactone ring and another ring. But you can. Preferably, a γ-butyrolactone ring or a bridged ring containing a γ-butyrolactone ring structure is used. The structural unit (a3) may contain one kind alone or two or more kinds. Examples of the structural unit (a3) include the following structural units.

  As monomers for deriving the structural unit (a3), monomers described in JP 2010-204646 A, monomers described in JP 2000-122294 A, monomers described in JP 2012-41274 A are listed. Can be mentioned. As the structural unit (a3), the formula (a3-1-1) to the formula (a3-1-6), the formula (a3-2-1) to the formula (a3-2-4), and the formula (a3-3) 1) to a structural unit represented by any one of the formula (a3-3-4) and the formula (a3-4-1) to the formula (a3-4-6), the formula (a3-1-1), The structural unit represented by any one of the formula (a3-1-2) and the formula (a3-2-3) to the formula (a3-2-4) is more preferable, and the formula (a3-1-1) or the formula ( The structural unit represented by a3-2-3) is more preferable.

  When the resin (A) includes the structural unit (a3), the content is usually 5 to 70 mol%, preferably 10 to 65 mol%, based on all the structural units of the resin (A). More preferably, it is 10-60 mol%.

<Other structural units (t)>
As the structural unit (t), in addition to the structural unit (a2) and the structural unit (a3), a structural unit having a halogen atom (hereinafter sometimes referred to as “structural unit (a4)”) and a non-leaving hydrocarbon group. And a structural unit (s) (hereinafter sometimes referred to as “structural unit (a5)”).

The halogen atom in the structural unit (a4) is preferably a fluorine atom. Examples of the structural unit (a4) include the following structural units. The structural units described below are mentioned.

  When the resin (A) has a structural unit (a4), the content is preferably 1 to 20 mol%, more preferably 2 to 15 mol%, based on all structural units of the resin (A). More preferably, it is 10 mol%.

<Structural unit (a5)>
Examples of the non-leaving hydrocarbon group that the structural unit (a5) has include a linear, branched, or cyclic hydrocarbon group. Especially, it is preferable that a structural unit (a5) is an alicyclic hydrocarbon group. Examples of the structural unit (a5) include the following structural units.

  In the above structural unit, a structural unit in which a methyl group is replaced with a hydrogen atom can also be given as a specific example of the structural unit (a5).

  The resin (A) may have a structural unit other than the above-described structural unit, and examples of the structural unit include structural units well known in the art.

The resin (A) is preferably a resin comprising the structural unit (I1), the structural unit (a1) and the structural unit (s), that is, the monomer (I1), the monomer (a1) and the monomer (s). It is a polymer.
The structural unit (a1) is preferably at least one of the structural unit (a1-1) and the structural unit (a1-2) (preferably the structural unit having a cyclohexyl group or a cyclopentyl group), more preferably the structural unit (a1- 1).
The structural unit (s) is preferably at least one of the structural unit (a2) and the structural unit (a3). The structural unit (a2) is preferably a structural unit represented by the formula (a2-1). The structural unit (a3) is preferably at least one of a structural unit represented by the formula (a3-1) and a structural unit represented by the formula (a3-2).

  The resin (A) may contain a structural unit derived from a monomer having an adamantyl group (particularly the structural unit (a1-1)) in an amount of 15 mol% or more based on the content of the structural unit (a1). preferable. When the content of the structural unit having an adamantyl group is increased, the dry etching resistance of the resist pattern is improved.

Each structural unit constituting the resin (A) may be used alone or in combination of two or more, and is produced by a known polymerization method (for example, radical polymerization method) using a monomer that derives these structural units. can do. The content rate of each structural unit which resin (A) has can be adjusted with the usage-amount of the monomer used for superposition | polymerization.
The weight average molecular weight of the resin (A) is preferably 2,000 or more (more preferably 2,500 or more, more preferably 3,000 or more), 50,000 or less (more preferably 30,000 or less, further preferably 15,000 or less).

<Resin other than resin (A)>
The resist composition of the present invention may contain a resin other than the resin (A). Examples of such a resin include a resin having an acid labile group and a resin consisting only of the structural unit (s).

As the resin other than the resin (A), a resin containing the structural unit (a4) (however, the structural unit (a1) is not included; hereinafter may be referred to as “resin (X)”) is preferable. In the resin (X), the content of the structural unit (a4) is preferably 80 mol% or more, more preferably 85 mol% or more, and still more preferably 90 mol% or more with respect to all the structural units of the resin (X). .
Examples of the structural unit that the resin (X) may further include a structural unit derived from the structural unit (a2), the structural unit (a3), and other known monomers.
The weight average molecular weight of the resin (X) is preferably 8,000 or more (more preferably 10,000 or more) and 80,000 or less (more preferably 60,000 or less). The means for measuring the weight average molecular weight of the resin (X) is the same as that for the resin (A).
When the resist composition contains the resin (X), the content thereof is preferably 1 to 60 parts by mass, more preferably 3 to 50 parts by mass with respect to 100 parts by mass of the resin (A). Preferably it is 5-40 mass parts, Most preferably, it is 7-30 mass parts.

  As for the total content rate of resin other than resin (A) and resin (A), 80 to 99 mass% is preferable with respect to solid content of a resist composition. In the present specification, the “solid content of the resist composition” means the total of components excluding the solvent (E) described later from the total amount of the resist composition. The solid content of the resist composition and the resin content relative thereto can be measured by a known analysis means such as liquid chromatography or gas chromatography.

<Resist composition>
The resist composition of the present invention contains the above-described resin (A) and an acid generator. Furthermore, it is preferable to contain a basic compound (C) or a solvent (E), and it is more preferable to contain both a basic compound (C) and a solvent (E).

<Acid generator>
The acid generator is classified into a nonionic type and an ionic type, and any of the acid generators (B) of the resist composition of the present invention may be used. Nonionic acid generators include organic halides, sulfonate esters (for example, 2-nitrobenzyl ester, aromatic sulfonate, oxime sulfonate, N-sulfonyloxyimide, N-sulfonyloxyimide, sulfonyloxyketone, diazonaphthoquinone 4). -Sulfonates), sulfones (e.g. disulfone, ketosulfone, sulfonyldiazomethane) and the like. The ionic acid generator is typically an onium salt containing an onium cation (for example, diazonium salt, phosphonium salt, sulfonium salt, iodonium salt). Examples of the anion of the onium salt include a sulfonate anion, a sulfonylimide anion, and a sulfonylmethide anion.

  As the acid generator (B), JP-A-63-26653, JP-A-55-164824, JP-A-62-69263, JP-A-63-146038, JP-A-63-163452, Kaisho 62-153853, JP 63-146029, U.S. Pat. No. 3,779,778, U.S. Pat. No. 3,849,137, German Patent 3914407, European Patent 126,712 The compound which generate | occur | produces an acid by the radiation as described in etc. can be used. Moreover, you may use the compound manufactured by the well-known method.

  Examples of the acid generator (B) include organic sulfonates, preferably a fluorine-containing acid generator, more preferably an acid generator (hereinafter referred to as “acid generator (B1) represented by the formula (B1)”. ) ”.

［式（Ｂ１）中、
Ｑ^b1及びＱ^b2は、それぞれ独立に、フッ素原子又は炭素数１〜６のペルフルオロアルキル基を表す。
Ｌ^b1は、単結合又は置換基を有していてもよい炭素数１〜１７の２価の飽和炭化水素基を表し、該飽和炭化水素基に含まれるメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよい。
Ｙは、置換基を有していてもよい炭素数１〜１８のアルキル基又は置換基を有していてもよい炭素数３〜１８の脂環式炭化水素基を表し、該アルキル基及び該脂環式炭化水素基に含まれるメチレン基は、酸素原子、スルホニル基又はカルボニル基に置き換わっていてもよい。
Ｚｂ⁺は、有機カチオンを表す。］

[In the formula (B1),
Q ^b1 and Q ^b2 each independently represent a fluorine atom or a C 1-6 perfluoroalkyl group.
L ^b1 represents a C1-C17 divalent saturated hydrocarbon group which may have a single bond or a substituent, and the methylene group contained in the saturated hydrocarbon group is an oxygen atom or a carbonyl group. It may be replaced.
Y represents an alkyl group having 1 to 18 carbon atoms which may have a substituent or an alicyclic hydrocarbon group having 3 to 18 carbon atoms which may have a substituent. The methylene group contained in the alicyclic hydrocarbon group may be replaced with an oxygen atom, a sulfonyl group or a carbonyl group.
Zb ⁺ represents an organic cation. ]

Examples of the perfluoroalkyl group for Q ^b1 and Q ^b2 include a trifluoromethyl group, a perfluoroethyl group, a perfluoropropyl group, a perfluoroisopropyl group, a perfluorobutyl group, a perfluoro sec-butyl group, a perfluorotert-butyl group, a perfluoropentyl group, A perfluorohexyl group etc. are mentioned.
Q ^b1 and Q ^b2 are each independently preferably a trifluoromethyl group or a fluorine atom, more preferably a fluorine atom.

Examples of the divalent saturated hydrocarbon group represented by L ^b1 include alkanediyl groups, monocyclic or polycyclic divalent alicyclic saturated hydrocarbon groups, and two or more of these groups. A group similar to the divalent group represented by L ¹ described above may be used.

Examples of the acid generator (B1) include acid generators described in JP2013-68914A, JP2013-3155A, and JP2013-11905A. Specifically, a salt represented by any one of formulas (B1-1) to (B1-24) can be given. Among them, those containing an arylsulfonium cation are preferable. Formula (B1-1), Formula (B1-2), Formula (B1-3), Formula (B1-6), Formula (B1-7), Formula (B1-11) ), Formula (B1-12), Formula (B1-13), Formula (B1-14), Formula (B1-20), Formula (B1-21), Formula (B1-23), and Formula (B1-24) Or a salt represented by any of the above.

<Resist composition>
The resist composition of the present invention contains a resin having an acid labile group (hereinafter sometimes referred to as “resin (A)”) and an acid generator.
The resist composition preferably contains a basic compound (hereinafter sometimes referred to as “basic compound (C)”), and preferably contains a solvent (hereinafter sometimes referred to as “solvent (D)”). .
The basic compound (C) can be used as a quencher in the resist composition.
The content of the acid generator is preferably 1.5% by mass or more (more preferably 3% by mass or more), preferably 40% by mass or less (more preferably 35% by mass or less) with respect to the resin (A). is there.

  <Resin (A)>

<Solvent (E)>
The content of the solvent (E) is usually 90% by mass or more in the resist composition, preferably 92% by mass or more, more preferably 94% by mass or more, for example, 99.9% by mass or less, preferably 99% by mass. It is as follows. The content rate of a solvent (E) can be measured by well-known analysis means, such as a liquid chromatography or a gas chromatography, for example.

  Examples of the solvent (E) include glycol ether esters such as ethyl cellosolve acetate, methyl cellosolve acetate and propylene glycol monomethyl ether acetate; glycol ethers such as propylene glycol monomethyl ether; ethyl lactate, butyl acetate, amyl acetate and ethyl pyruvate Esters such as acetone, methyl isobutyl ketone, ketones such as 2-heptanone and cyclohexanone; cyclic esters such as γ-butyrolactone; and the like. One kind of the solvent (E) may be contained alone, or two or more kinds may be contained.

<Basic compound (C)>
Examples of the basic compound (C) include salts having weaker acidity than basic nitrogen-containing organic compounds or acids generated from the acid generator (B).
Examples of the basic nitrogen-containing organic compound include amines and ammonium salts. Examples of amines include aliphatic amines and aromatic amines. Aliphatic amines include primary amines, secondary amines and tertiary amines.

  As the basic compound (C), 1-naphthylamine, 2-naphthylamine, aniline, diisopropylaniline, 2-, 3- or 4-methylaniline, 4-nitroaniline, N-methylaniline, N, N-dimethylaniline, Diphenylamine, hexylamine, heptylamine, octylamine, nonylamine, decylamine, dibutylamine, dipentylamine, dihexylamine, diheptylamine, dioctylamine, dinonylamine, didecylamine, triethylamine, trimethylamine, tripropylamine, tributylamine, tripentylamine, Trihexylamine, triheptylamine, trioctylamine, trinonylamine, tridecylamine, methyldibutylamine, methyldipentylamine, methyldihexyl Amine, methyldicyclohexylamine, methyldiheptylamine, methyldioctylamine, methyldinonylamine, methyldidecylamine, ethyldibutylamine, ethyldipentylamine, ethyldihexylamine, ethyldiheptylamine, ethyldioctylamine, ethyldinonylamine , Ethyldidecylamine, dicyclohexylmethylamine, tris [2- (2-methoxyethoxy) ethyl] amine, triisopropanolamine, ethylenediamine, tetramethylenediamine, hexamethylenediamine, 4,4′-diamino-1,2-diphenyl Ethane, 4,4′-diamino-3,3′-dimethyldiphenylmethane, 4,4′-diamino-3,3′-diethyldiphenylmethane, 2,2′-methylenebisaniline, imida , 4-methylimidazole, pyridine, 4-methylpyridine, 1,2-di (2-pyridyl) ethane, 1,2-di (4-pyridyl) ethane, 1,2-di (2-pyridyl) ethene 1,2-di (4-pyridyl) ethene, 1,3-di (4-pyridyl) propane, 1,2-di (4-pyridyloxy) ethane, di (2-pyridyl) ketone, 4,4 ′ -Dipyridyl sulfide, 4,4'-dipyridyl disulfide, 2,2'-dipyridylamine, 2,2'-dipycolylamine, bipyridine and the like, preferably diisopropylaniline, particularly preferably 2,6- Diisopropylaniline is mentioned.

  As ammonium salts, tetramethylammonium hydroxide, tetraisopropylammonium hydroxide, tetrabutylammonium hydroxide, tetrahexylammonium hydroxide, tetraoctylammonium hydroxide, phenyltrimethylammonium hydroxide, 3- (trifluoromethyl) phenyltrimethyl Ammonium hydroxide, tetra-n-butylammonium salicylate, choline and the like can be mentioned.

The acidity in a salt having a weaker acidity than the acid generated from the acid generator (B) is represented by an acid dissociation constant (pKa). The salt having a lower acidity than the acid generated from the acid generator (B) is a salt in which the acid dissociation constant of the acid generated from the salt is usually -3 <pKa, preferably -1 <pKa <7. A salt, more preferably a salt of 0 <pKa <5.
Examples of the salt having a lower acidity than the acid generated from the acid generator (B) include a salt represented by the following formula, a weak acid inner salt represented by the formula (D), and JP 2012-229206 A: Examples thereof include salts described in JP 2012-6908 A, JP 2012-72109 A, JP 2011-39502 A, and JP 2011-191745 A. Preferably, it is a weak acid salt represented by the formula (D).

［式（Ｄ）中、
Ｒ^Ｄ１及びＲ^Ｄ２は、それぞれ独立に、炭素数１〜１２の１価の炭化水素基、炭素数１〜６のアルコキシ基、炭素数２〜７のアシル基、炭素数２〜７のアシルオキシ基、炭素数２〜７のアルコキシカルボニル基、ニトロ基又はハロゲン原子を表す。
ｍ’及びｎ’は、それぞれ独立に、０〜４の整数を表し、ｍ’が２以上の場合、複数のＲ^Ｄ１は同一又は相異なり、ｎ’が２以上の場合、複数のＲ^Ｄ２は同一又は相異なる。］ <Weak acid inner salt (D)>
The weak acid inner salt (D) is a compound represented by the formula (D).

[In the formula (D),
R ^D1 and R ^D2 are each independently a monovalent hydrocarbon group having 1 to 12 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an acyl group having 2 to 7 carbon atoms, or an acyloxy group having 2 to 7 carbon atoms. Represents an alkoxycarbonyl group having 2 to 7 carbon atoms, a nitro group, or a halogen atom.
m ′ and n ′ each independently represents an integer of 0 to 4, and when m ′ is 2 or more, the plurality of R ^D1 are the same or different, and when n ′ is 2 or more, the plurality of R ^D2 are Same or different. ]

In the compound represented by the formula (D), the hydrocarbon groups of R ^D1 and R ^D2 are a monovalent aliphatic hydrocarbon group, a monovalent alicyclic hydrocarbon group, and a monovalent aromatic hydrocarbon. And groups formed by combining these groups.
Examples of the monovalent aliphatic hydrocarbon group include alkyl groups such as methyl group, ethyl group, propyl group, isopropyl group, butyl group, isobutyl group, t-butyl group, pentyl group, hexyl group, and nonyl group.
The monovalent alicyclic hydrocarbon group may be monocyclic or polycyclic, and may be either saturated or unsaturated. Examples thereof include cycloalkyl groups such as cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl group, cyclononyl group, and cyclododecyl group, norbornyl group, adamantyl group, and the like.
Examples of the monovalent aromatic hydrocarbon group include phenyl group, 1-naphthyl group, 2-naphthyl group, 2-methylphenyl group, 3-methylphenyl group, 4-methylphenyl group, 4-ethylphenyl group, 4- Propylphenyl group, 4-isopropylphenyl group, 4-butylphenyl group, 4-t-butylphenyl group, 4-hexylphenyl group, 4-cyclohexylphenyl group, anthryl group, p-adamantylphenyl group, tolyl group, xylyl group , Aryl groups such as cumenyl group, mesityl group, biphenyl group, phenanthryl group, 2,6-diethylphenyl group, 2-methyl-6-ethylphenyl, and the like.
Examples of the group formed by combining these include an alkyl-cycloalkyl group, a cycloalkyl-alkyl group, an aralkyl group (for example, phenylmethyl group, 1-phenylethyl group, 2-phenylethyl group, 1-phenyl-1 -Propyl group, 1-phenyl-2-propyl group, 2-phenyl-2-propyl group, 3-phenyl-1-propyl group, 4-phenyl-1-butyl group, 5-phenyl-1-pentyl group, 6 -Phenyl-1-hexyl group, etc.).

Examples of the alkoxy group include a methoxy group and an ethoxy group.
Examples of the acyl group include an acetyl group, a propanoyl group, a benzoyl group, and a cyclohexanecarbonyl group.
Examples of the acyloxy group include a group in which an oxy group (—O—) is bonded to the acyl group.
Examples of the alkoxycarbonyl group include a group in which a carbonyl group (—CO—) is bonded to the above alkoxy group.
Examples of the halogen atom include a fluorine atom, a chlorine atom, and a bromine atom.

In the formula (D), R ^D1 and R ^D2 are each independently an alkyl group having 1 to 8 carbon atoms, a cycloalkyl group having 3 to 10 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, or 2 to 2 carbon atoms. Preferred are an acyl group having 4 carbon atoms, an acyloxy group having 2 to 4 carbon atoms, an alkoxycarbonyl group having 2 to 4 carbon atoms, a nitro group, or a halogen atom.
m ′ and n ′ are each independently preferably an integer of 0 to 2, and more preferably 0. When m ′ is 2 or more, the plurality of R ^D1 are the same or different, and when n ′ is 2 or more, the plurality of R ^D2 are the same or different.

Examples of the compound (D) include the following compounds.

  Compound (D) can be produced by the method described in “Tetrahedron Vol. 45, No. 19, p6281-6296”. Moreover, the compound (D) can use the compound marketed.

  The content of the basic compound (C) is preferably 0.01 to 5% by mass and more preferably 0.01 to 3% by mass in the solid content of the resist composition.

<Other ingredients>
The resist composition of the present invention may contain components other than the above components (hereinafter sometimes referred to as “other components (F)”) as necessary. The other component (F) is not particularly limited, and additives known in the resist field, such as sensitizers, dissolution inhibitors, surfactants, stabilizers, dyes, and the like can be used.

<Preparation of resist composition>
The resist composition of the present invention comprises a resin (A) and an acid generator of the present invention, and a resin other than the resin (A) used as necessary, a solvent (D), a basic compound (C) and other It can be prepared by mixing component (F). The mixing order is arbitrary and is not particularly limited. The temperature at the time of mixing can select an appropriate temperature from 10-40 degreeC according to the kind etc. of resin, the solubility with respect to solvent (D), such as resin. An appropriate mixing time can be selected from 0.5 to 24 hours depending on the mixing temperature. The mixing means is not particularly limited, and stirring and mixing can be used.
After mixing each component, it is preferable to filter using a filter having a pore size of about 0.003 to 0.2 μm.

<Method for producing resist pattern>
The method for producing a resist pattern of the present invention comprises:
(1) The process of apply | coating the resist composition of this invention on a board | substrate,
(2) The process of drying the composition after application | coating and forming a composition layer,
(3) a step of exposing the composition layer;
(4) a step of heating the composition layer after exposure, and (5) a step of developing the composition layer after heating.

  The resist composition can be applied onto the substrate by a commonly used apparatus such as a spin coater. Examples of the substrate include an inorganic substrate such as a silicon wafer. Before applying the resist composition, the substrate may be washed, or an antireflection film or the like may be formed on the substrate.

By drying the composition after coating, the solvent is removed and a composition layer is formed. Drying is performed, for example, by evaporating the solvent using a heating device such as a hot plate (so-called pre-baking), or using a decompression device. The heating temperature is preferably 50 to 200 ° C., and the heating time is preferably 10 to 180 seconds. The pressure during drying under reduced pressure is preferably about 1 to 1.0 × 10 ⁵ Pa.

The obtained composition layer is usually exposed using an exposure machine. The exposure machine may be an immersion exposure machine. Exposure light sources include those that emit laser light in the ultraviolet region such as KrF excimer laser (wavelength 248 nm), ArF excimer laser (wavelength 193 nm), F ₂ excimer laser (wavelength 157 nm), solid-state laser light source (YAG or semiconductor laser) Etc.) Using various lasers such as those that convert wavelength of laser light from the laser and emit harmonic laser light in the far-ultraviolet region or vacuum ultraviolet region, those that irradiate electron beams or extreme ultraviolet light (EUV), etc. Can do. In this specification, the irradiation of these radiations may be collectively referred to as “exposure”. At the time of exposure, exposure is usually performed through a mask corresponding to a required pattern. When the exposure light source is an electron beam, exposure may be performed by direct drawing without using a mask.

  The composition layer after exposure is subjected to heat treatment (so-called post-exposure baking) in order to promote the deprotection reaction in the acid labile group. The heating temperature is usually about 50 to 200 ° C, preferably about 70 to 150 ° C.

  The heated composition layer is usually developed using a developer using a developing device. Examples of the developing method include a dipping method, a paddle method, a spray method, and a dynamic dispensing method. The development temperature is preferably 5 to 60 ° C., for example, and the development time is preferably 5 to 300 seconds, for example. A positive resist pattern or a negative resist pattern can be produced by selecting the type of developer as follows.

When producing a positive resist pattern from the resist composition of the present invention, an alkaline developer is used as the developer. The alkaline developer may be various alkaline aqueous solutions used in this field. Examples thereof include an aqueous solution of tetramethylammonium hydroxide and (2-hydroxyethyl) trimethylammonium hydroxide (commonly called choline). The alkali developer may contain a surfactant.
It is preferable to wash the resist pattern with ultrapure water after development, and then remove the water remaining on the substrate and the pattern.

In the case of producing a negative resist pattern from the resist composition of the present invention, a developer containing an organic solvent as a developer (hereinafter sometimes referred to as “organic developer”) is used.
Organic solvents contained in the organic developer include ketone solvents such as 2-hexanone and 2-heptanone; glycol ether ester solvents such as propylene glycol monomethyl ether acetate; ester solvents such as butyl acetate; glycols such as propylene glycol monomethyl ether Examples include ether solvents; amide solvents such as N, N-dimethylacetamide; aromatic hydrocarbon solvents such as anisole.
In the organic developer, the content of the organic solvent is preferably 90% by mass or more and 100% by mass or less, more preferably 95% by mass or more and 100% by mass or less, and still more preferably only the organic solvent.
Among them, the organic developer is preferably a developer containing butyl acetate and / or 2-heptanone. In the organic developer, the total content of butyl acetate and 2-heptanone is preferably 50% by mass to 100% by mass, more preferably 90% by mass to 100% by mass, and substantially butyl acetate and / or 2 -More preferred is heptanone alone.
The organic developer may contain a surfactant. The organic developer may contain a trace amount of water.
At the time of development, the development may be stopped by substituting a solvent of a different type from the organic developer.

It is preferable to wash the developed resist pattern with a rinse solution. The rinsing liquid is not particularly limited as long as it does not dissolve the resist pattern, and a solution containing a general organic solvent can be used, and an alcohol solvent or an ester solvent is preferable.
After the cleaning, it is preferable to remove the rinse solution remaining on the substrate and the pattern.

<Application>
The resist composition of the present invention includes a resist composition for KrF excimer laser exposure, a resist composition for ArF excimer laser exposure, a resist composition for electron beam (EB) exposure, or a resist composition for EUV exposure, particularly an electron. It is suitable as a resist composition for line (EB) exposure or a resist composition for EUV exposure, and is useful for fine processing of semiconductors.

The present invention will be described more specifically with reference to examples. In the examples, “%” and “parts” representing the content or amount used are based on mass unless otherwise specified.
The weight average molecular weight is a value determined by gel permeation chromatography. The analysis conditions for gel permeation chromatography are as follows.
Column: TSKgel Multipore HXL-M x 3 + guardcolumn (manufactured by Tosoh Corporation)
Eluent: Tetrahydrofuran Flow rate: 1.0 mL / min
Detector: RI detector Column temperature: 40 ° C
Injection volume: 100 μl
Molecular weight standard: Standard polystyrene (manufactured by Tosoh Corporation)

  The structure of the compound was confirmed by measuring the molecular peak using mass spectrometry (LC is model 1100 manufactured by Agilent, and MASS is LC / MSD manufactured by Agilent). In the following examples, the value of this molecular peak is indicated by “MASS”.

Example 1: Synthesis of compound represented by formula (I-1)

  2.50 parts of the compound represented by the formula (I-1-a), 1.07 part of the compound represented by the formula (I-1-b) and 1.75 parts of dimethyl ether were charged and stirred at 23 ° C. for 30 minutes. did. Thereafter, 0.84 part of pyridine was added and stirred at 23 ° C. for 3 hours. To the obtained reaction product, 25 parts of ethyl acetate was added and stirred, and then 16 parts of 5% oxalic acid aqueous solution was added and stirred at 23 ° C. for 30 minutes. Then, it left still and liquid-separated. To the collected organic layer, 4.5 parts of a 10% aqueous potassium carbonate solution was added, and the mixture was stirred at 23 ° C. for 30 minutes. Then, it left still and liquid-separated. The recovered organic layer was charged with 7.5 parts of ion exchange water, stirred at 23 ° C. for 30 minutes, and separated to recover the organic layer. This washing operation was performed 4 times. The obtained organic layer was concentrated to obtain 10.06 parts of a compound represented by the formula (I-1).

MASS: 263.2

式（Ｂ１−５−ａ）で表される塩５０．４９部及びクロロホルム２５２．４４部を反応器に仕込み、２３℃で３０分間攪拌した後、式（Ｂ１−５−ｂ）で表される化合物１６．２７部を滴下し、２３℃で１時間攪拌することにより、式（Ｂ１−５−ｃ）で表される塩を含む溶液を得た。得られた式（Ｂ１−５−ｃ）で表される塩を含む溶液に、式（Ｂ１−５−ｄ）で表される塩４８．８０部及びイオン交換水８４．１５部を添加し、２３℃で１２時間攪拌した。得られた反応液が２層に分離していたので、クロロホルム層を分液して取り出し、更に、該クロロホルム層にイオン交換水８４．１５部を添加し、水洗した。この操作を５回繰り返した。得られたクロロホルム層に、活性炭３．８８部を添加攪拌し、ろ過した。回収されたろ液を濃縮し、得られた残渣に、アセトニトリル１２５．８７部を添加攪拌し、濃縮した。得られた残渣に、アセトニトリル２０．６２部及びｔｅｒｔ−ブチルメチルエーテル３０９．３０部を加えて２３℃で３０分間攪拌し、上澄み液を除去し、濃縮した。得られた残渣に、ｎ−ヘプタン２００部を添加、２３℃で３０分間攪拌し、ろ過することにより、式（Ｂ１−５）で表される塩６１．５４部を得た。 Synthesis Example 1: Synthesis of salt represented by formula (B1-5)

50.49 parts of the salt represented by the formula (B1-5-a) and 252.44 parts of chloroform are charged into a reactor, stirred at 23 ° C. for 30 minutes, and then represented by the formula (B1-5-b). 16.27 parts of the compound was added dropwise and stirred at 23 ° C. for 1 hour to obtain a solution containing a salt represented by the formula (B1-5-c). To the obtained solution containing the salt represented by the formula (B1-5-c), 48.80 parts of the salt represented by the formula (B1-5-d) and 84.15 parts of ion-exchanged water are added, The mixture was stirred at 23 ° C. for 12 hours. Since the resulting reaction solution was separated into two layers, the chloroform layer was separated and removed, and 84.15 parts of ion-exchanged water was further added to the chloroform layer and washed with water. This operation was repeated 5 times. To the obtained chloroform layer, 3.88 parts of activated carbon was added and stirred, followed by filtration. The collected filtrate was concentrated, and 125.87 parts of acetonitrile was added to the resulting residue, and the mixture was stirred and concentrated. To the obtained residue, 20.62 parts of acetonitrile and 309.30 parts of tert-butyl methyl ether were added and stirred at 23 ° C. for 30 minutes, and the supernatant was removed and concentrated. To the obtained residue, 200 parts of n-heptane was added, stirred at 23 ° C. for 30 minutes, and filtered to obtain 61.54 parts of the salt represented by the formula (B1-5).

MASS (ESI (+) Spectrum): M ⁺ 375.2
MASS (ESI (−) Spectrum): M ^- 339.1

Synthesis Example 2 [Synthesis of salt represented by formula (B1-21)]

  30.00 parts of a compound represented by the formula (B1-21-b) obtained by the method described in JP-A-2008-209917, and a salt 35.50 represented by the formula (B1-21-a). Part, 100 parts of chloroform, and 50 parts of ion-exchanged water were stirred at 23 ° C. for 15 hours. Since the obtained reaction solution was separated into two layers, the chloroform layer was separated and taken out, and 30 parts of ion-exchanged water was further added to the chloroform layer and washed with water. This operation was repeated 5 times. The chloroform layer was concentrated, 100 parts of tert-butyl methyl ether was added to the resulting residue, and the mixture was stirred at 23 ° C. for 30 minutes, and then filtered to obtain the salt 48 represented by the formula (B1-21-c). .57 parts were obtained.

式（Ｂ１−２１−ｃ）で表される塩２０．００部、式（Ｂ１−２１−ｄ）で表される化合物２．８４部及びモノクロロベンゼン２５０部を仕込み、２３℃で３０分間攪拌した。得られた混合液に、二安息香酸銅（ＩＩ）０．２１部を添加した後、更に、１００℃で１時間攪拌した。得られた反応溶液を濃縮した後、得られた残渣に、クロロホルム２００部及びイオン交換水５０部を加えて２３℃で３０分間攪拌した後、分液して有機層を取り出した。回収された有機層にイオン交換水５０部を加えて２３℃で３０分間攪拌した後、分液して有機層を取り出した。この水洗操作を５回繰り返した。得られた有機層を濃縮した後、得られた残渣に、アセトニトリル５３．５１部に溶解し、濃縮した後、ｔｅｒｔ−ブチルメチルエーテル１１３．０５部を加えて攪拌した後、ろ過することにより、式（Ｂ１−２１）で表される塩１０．４７部を得た。

20.00 parts of a salt represented by the formula (B1-21-c), 2.84 parts of a compound represented by the formula (B1-21-d) and 250 parts of monochlorobenzene were charged and stirred at 23 ° C. for 30 minutes. . After adding 0.21 part of copper (II) dibenzoate to the obtained liquid mixture, it stirred at 100 degreeC for further 1 hour. After concentrating the obtained reaction solution, 200 parts of chloroform and 50 parts of ion-exchanged water were added to the obtained residue and stirred at 23 ° C. for 30 minutes, followed by liquid separation to take out an organic layer. 50 parts of ion-exchanged water was added to the collected organic layer and stirred at 23 ° C. for 30 minutes, followed by liquid separation to take out the organic layer. This washing operation was repeated 5 times. After concentrating the obtained organic layer, the residue obtained was dissolved in 53.51 parts of acetonitrile, concentrated, 113.05 parts of tert-butyl methyl ether was added and stirred, and then filtered. 10.47 parts of the salt represented by the formula (B1-21) were obtained.

MASS (ESI (+) Spectrum): M ⁺ 237.1
MASS (ESI (−) Spectrum): M ^- 339.1

Synthesis Example 3 [Synthesis of Salt Represented by Formula (B1-22)]

  11.26 parts of a salt represented by the formula (B1-22-a), 10.00 parts of a compound represented by the formula (B1-22-b), 50 parts of chloroform and 25 parts of ion-exchanged water were charged at 23 ° C. For 15 hours. Since the obtained reaction liquid was separated into two layers, the chloroform layer was separated and taken out, and further 15 parts of ion-exchanged water was added to the chloroform layer and washed with water. This operation was repeated 5 times. The chloroform layer was concentrated, 50 parts of tert-butyl methyl ether was added to the resulting residue, the mixture was stirred at 23 ° C. for 30 minutes, and then filtered to obtain the salt 11 represented by the formula (B1-22-c). .75 parts were obtained.

式（Ｂ１−２２−ｃ）で表される塩１１．７１部、式（Ｂ１−２２−ｄ）で表される化合物１．７０部及びモノクロロベンゼン４６．８４部を仕込み、２３℃で３０分間攪拌した。得られた混合液に、二安息香酸銅（ＩＩ）０．１２部を添加した後、更に、１００℃で３０分間攪拌した。得られた反応溶液を濃縮した後、得られた残渣に、クロロホルム５０部及びイオン交換水１２．５０部を加えて２３℃で３０分間攪拌した後、分液して有機層を取り出した。回収された有機層にイオン交換水１２．５０部を加えて２３℃で３０分間攪拌した後、分液して有機層を取り出した。この水洗操作を８回繰り返した。得られた有機層を濃縮した後、得られた残渣に、ｔｅｒｔ−ブチルメチルエーテル５０部を加えて攪拌した後、ろ過することにより、式（Ｂ１−２２）で表される塩６．８４部を得た。

11.71 parts of a salt represented by the formula (B1-22-c), 1.70 parts of a compound represented by the formula (B1-22-d) and 46.84 parts of monochlorobenzene were charged, and the mixture was charged at 23 ° C. for 30 minutes. Stir. After adding 0.12 part of copper (II) dibenzoate to the obtained liquid mixture, it stirred at 100 degreeC for 30 minutes further. After concentrating the obtained reaction solution, 50 parts of chloroform and 12.50 parts of ion-exchanged water were added to the obtained residue and stirred at 23 ° C. for 30 minutes, followed by liquid separation to take out an organic layer. 12.50 parts of ion-exchanged water was added to the collected organic layer and stirred at 23 ° C. for 30 minutes, followed by liquid separation to take out the organic layer. This washing operation was repeated 8 times. After concentration of the obtained organic layer, 50 parts of tert-butyl methyl ether was added to the obtained residue, stirred, and then filtered to obtain 6.84 parts of the salt represented by the formula (B1-22). Got.

MASS (ESI (+) Spectrum): M ⁺ 237.1
MASS (ESI (-) Spectrum): M ^- 323.0

Synthesis of Resin The compound (monomer) used for the synthesis of the resin (A) is shown below. Hereinafter, these compounds are referred to as “monomer (a1-1-2)” or the like according to the formula number.

Example 2 [Synthesis of Resin A1]
As the monomer, monomer (a1-1-3), monomer (a1-2-9), monomer (a2-1-3), monomer (a3-4-2) and monomer (I-1) were used, The ratio [monomer (a1-1-3): monomer (a1-2-9): monomer (a2-1-3): monomer (a3-4-2): monomer (I-1)] is 45:14: 2.5: 35.5: 3 was mixed, and 1.5 mass times propylene glycol monomethyl ether acetate of the total monomer amount was added to obtain a solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in propylene glycol monomethyl ether acetate, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by reprecipitation operation of filtering the resin twice. Resin A1 (copolymer) having a molecular weight of 7.9 × 10 ³ was obtained in a yield of 58%. This resin A1 has the following structural units.

Example 3 [Synthesis of Resin A2]
As the monomer, monomer (a1-1-2), monomer (a2-1-1), monomer (a3-1-1) and monomer (I-1) were used, and the molar ratio [monomer (a1-1-2) ): Monomer (a2-1-1): monomer (a3-1-1): monomer (I-1)] is mixed so as to be 50: 22: 25: 3. A mass-fold amount of propylene glycol monomethyl ether acetate was added to prepare a solution. To the obtained mixture, azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) were added as initiators in proportions of 1 mol% and 3 mol%, respectively, with respect to the total number of moles of all monomers. These were heated at 75 ° C. for about 5 hours. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in propylene glycol monomethyl ether acetate, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by reprecipitation operation of filtering the resin twice. Resin A2 having a molecular weight of 8.4 × 10 ³ was obtained in a yield of 72%. This resin A2 has the following structural units.

Synthesis Example 4 [Synthesis of Resin AX1]
As the monomer, monomer (a1-1-2), monomer (a2-1-1) and monomer (a3-1-1) were used, and the molar ratio [monomer (a1-1-2): monomer (a2-1) -1): monomer (a3-1-1))] was mixed at 50:25:25, and 1.5 mass times propylene glycol monomethyl ether acetate of the total monomer amount was added to obtain a solution. To the obtained mixture, azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) were added as initiators in proportions of 1 mol% and 3 mol%, respectively, with respect to the total number of moles of all monomers. These were heated at 75 ° C. for about 5 hours. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in propylene glycol monomethyl ether acetate, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by reprecipitation operation of filtering the resin twice. Resin AX1 having a molecular weight of 9.1 × 10 ³ was obtained in a yield of 66%. This resin AX1 has the following structural units.

Synthesis Example 5 [Synthesis of Resin X1]
Monomer (a4-1-7) was used as a monomer, and 1.5 mass times dioxane of the total monomer amount was added to prepare a solution. Azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the solution in an amount of 0.7 mol% and 2.1 mol%, respectively, with respect to the total monomer amount, and these were added at 75 ° C. Heated for about 5 hours. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered.
The resin thus obtained was dissolved again in dioxane, and the solution obtained by pouring the solution into a methanol / water mixed solvent was precipitated twice, and the resin was filtered twice to perform the reprecipitation operation twice. 8 × 10 ⁴ of resin X1 was obtained with a yield of 77%. This resin X1 has the following structural units.

<Preparation of resist composition>
As shown in Table 1, the following components were mixed, and the resulting mixture was filtered through a fluororesin filter having a pore size of 0.2 μm to prepare a resist composition.

Ｂ１−５：式（Ｂ１−５）で表される塩
Ｂ１−２１：式（Ｂ１−２１）で表される塩
Ｂ１−２２：式（Ｂ１−２２）で表される塩 <Resin>
A1-A2, AX1, X1: Resin A1-Resin A2, Resin AX1, Resin X1
<Acid generator>
B1-X: synthesized according to the example of JP-A-2006-257078

B1-5: salt represented by formula (B1-5) B1-21: salt represented by formula (B1-21) B1-22: salt represented by formula (B1-22)

<Quencher>
C1: 2,6-diisopropylaniline D1:

<Solvent>
Propylene glycol monomethyl ether acetate 265 parts Propylene glycol monomethyl ether 20 parts 2-heptanone 20 parts γ-butyrolactone 3.5 parts

<Immersion exposure evaluation of resist composition>
An organic antireflection film having a thickness of 780 mm is formed by applying a composition for organic antireflection film (ARC-29; manufactured by Nissan Chemical Co., Ltd.) to a silicon wafer and baking it at 205 ° C. for 60 seconds. Formed. Subsequently, the resist composition was spin-coated on the organic antireflection film so that the film thickness after drying (pre-baking) was 85 nm. The silicon wafer coated with the resist composition was pre-baked on a direct hot plate at a temperature described in the “PB” column of Table 1 for 60 seconds to form a resist film. ArF excimer stepper for immersion exposure (XT: 1900Gi; manufactured by ASML, NA = 1.35, 3/4 Annular XY polarized light) on a silicon wafer on which a resist film is formed, and a contact hole pattern (hole pitch 100 nm / Using a mask for forming a hole diameter of 70 nm, exposure was performed while changing the exposure amount stepwise. Note that ultrapure water was used as the immersion medium.
After the exposure, the silicon wafer was post-exposure baked on a hot plate at a temperature described in the “PEB” column of Table 1 for 60 seconds. Next, this silicon wafer was subjected to paddle development for 60 seconds with a 2.38% tetramethylammonium hydroxide aqueous solution to obtain a resist pattern.

  In each resist film, an exposure amount at which the hole diameter of a pattern formed with a mask having a hole diameter of 70 nm was 55 nm was defined as effective sensitivity.

Mask error factor (MEF) evaluation: In the effective sensitivity, masks with hole diameters of 72 nm, 71 nm, 70 nm, 69 nm, and 68 nm were used, respectively, and patterns were formed. The mask size is plotted on the horizontal axis, and the line width of the line pattern formed using each mask pattern is plotted on the vertical axis. The slope of the straight line
2.9 or less
○ over 2.9 and under 3.2
X over 3.2
Judged as.
The mask error factor (MEF) results obtained as described above are expressed by the above-mentioned level evaluation and are summarized in Table 2. The numbers in parentheses indicate the slope of the straight line. The numbers in parentheses indicate the slope of the straight line.

  According to the resist composition containing a resin having a structural unit derived from the polymerizable monomer of the present invention, a resist pattern can be obtained with a good mask error factor (MEF).

Claims (13)

A polymerizable monomer having a group represented by formula (I1).

[In the formula (I1),
R ¹ represents a hydrogen atom or a hydrocarbon group having 1 to 24 carbon atoms, and the methylene group contained in the hydrocarbon group may be replaced by an oxygen atom or a carbonyl group, and hydrogen contained in the hydrocarbon group The atom may be substituted with a halogen atom or a hydroxy group.
Ring W represents an alicyclic hydrocarbon ring having 3 to 36 carbon atoms, and the methylene group contained in the alicyclic hydrocarbon ring may be substituted with an oxygen atom, a sulfur atom, a carbonyl group or a sulfonyl group. Well, the hydrogen atom contained in the alicyclic hydrocarbon ring is a hydroxy group, an alkyl group having 1 to 12 carbon atoms, an alkoxy group having 1 to 12 carbon atoms, an alicyclic hydrocarbon group having 3 to 12 carbon atoms, The aromatic hydrocarbon group having 6 to 10 carbon atoms or a combination thereof may be substituted. ]   The polymerizable monomer according to claim 1, comprising a vinylidene group and a group represented by formula (I1).   The polymerizable monomer according to claim 1 or 2, comprising at least one group selected from the group consisting of a vinyl group, an acryloyl group, and a methacryloyl group, and a group represented by the formula (I1). The polymerizable monomer according to claim 1, wherein the polymerizable monomer having a group represented by the formula (I1) is a compound represented by the formula (I).

[In the formula (I),
R ¹ and W represent the same meaning as described above.
R ² represents a hydrogen atom or a methyl group.
X ¹ represents a group represented by any one of formulas (X ¹ -1) to (X ¹ -3).

(In formula (X ¹ -1) to formula (X ¹ -3), * represents a bond with A ^1. )
A ¹ represents a single bond or a divalent saturated hydrocarbon group having 1 to 24 carbon atoms, and the methylene group contained in the saturated hydrocarbon group may be replaced with an oxygen atom or a carbonyl group. ] The ring W is a ring represented by the formula (W-1), a ring represented by the formula (W-2), or a ring represented by the formula (W-3). The polymerizable monomer as described.

[In Formula (W-1), Formula (W-2) and Formula (W-3),
The methylene group contained in the ring may be substituted with an oxygen atom, a sulfur atom, a carbonyl group or a sulfonyl group, and the hydrogen atom contained in the ring is a hydroxy group, an alkyl group having 1 to 12 carbon atoms, or 1 to 1 carbon atom. It may be substituted with a 12 alkoxy group, an alicyclic hydrocarbon group having 3 to 12 carbon atoms, or an aromatic hydrocarbon group having 6 to 10 carbon atoms. ] X ¹ is a polymerizable monomer according to claim 4 or 5, a group represented by the formula ^(X 1 -1). A ¹ is a polymerizable monomer according to any one of claims 4 to 6 is a single bond.   Resin which has a structural unit derived from the compound in any one of Claims 1-7.   The resin according to claim 8, further comprising a structural unit derived from a monomer having an acid labile group.   A resist composition comprising the resin according to claim 8 or 9 and an acid generator. The resist composition according to claim 10, wherein the acid generator is an acid generator represented by the formula (B1).

[In the formula (B1),
Q ^b1 and Q ^b2 each independently represent a fluorine atom or a C 1-6 perfluoroalkyl group.
L ^b1 represents a C1-C17 divalent saturated hydrocarbon group which may have a single bond or a substituent, and the methylene group contained in the saturated hydrocarbon group is an oxygen atom or a carbonyl group. It may be replaced.
Y represents an alkyl group having 1 to 18 carbon atoms which may have a substituent or an alicyclic hydrocarbon group having 3 to 18 carbon atoms which may have a substituent. The methylene group contained in the alicyclic hydrocarbon group may be replaced with an oxygen atom, a sulfonyl group or a carbonyl group.
Zb ⁺ represents an organic cation. ]   The resist composition according to claim 10 or 11, further comprising a salt having a lower acidity than the acid generated from the acid generator. (1) The process of apply | coating the resist composition in any one of Claims 10-12 on a board | substrate,
(2) The process of drying the composition after application | coating and forming a composition layer,
(3) a step of exposing the composition layer;
(4) a step of heating the composition layer after exposure, and (5) a step of developing the composition layer after heating,
A method for producing a resist pattern including: