JP2015190868A5 - - Google Patents

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Publication number
JP2015190868A5
JP2015190868A5 JP2014068561A JP2014068561A JP2015190868A5 JP 2015190868 A5 JP2015190868 A5 JP 2015190868A5 JP 2014068561 A JP2014068561 A JP 2014068561A JP 2014068561 A JP2014068561 A JP 2014068561A JP 2015190868 A5 JP2015190868 A5 JP 2015190868A5
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JP
Japan
Prior art keywords
ray
goniometer
measuring device
detector array
drive mechanism
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JP2014068561A
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Japanese (ja)
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JP6256152B2 (en
JP2015190868A (en
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Publication of JP2015190868A5 publication Critical patent/JP2015190868A5/ja
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Claims (2)

前記Ｘ線測定装置がゴニオメータを備えたＸ線回折装置であり、前記Ｘ線検出器アレイには前記ゴニオメータの回転中心を中心として回転するための回転駆動機構が設けられており、
前記揺動機構は前記回転駆動機構が兼用される請求項１又は請求項２に記載のＸ線測定装置。 The X-ray measuring device is an X-ray diffractometer provided with a goniometer, and the X-ray detector array is provided with a rotation drive mechanism for rotating around the rotation center of the goniometer,
The X-ray measurement apparatus according to claim 1, wherein the swing mechanism is also used as the rotation drive mechanism. 前記Ｘ線測定装置が分光素子により波長分散された蛍光Ｘ線のＸ線信号を、前記Ｘ線検出器アレイで検出する蛍光Ｘ線分析装置である請求項１又は請求項２に記載のＸ線測定装置。 3. The X-ray analysis apparatus according to claim 1, wherein the X-ray measurement apparatus is an X-ray fluorescence analysis apparatus that detects, with the X-ray detector array, an X-ray signal of fluorescent X-rays wavelength-dispersed by a spectroscopic element. Measuring device.
JP2014068561A 2014-03-28 2014-03-28 X-ray measuring device Active JP6256152B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014068561A JP6256152B2 (en) 2014-03-28 2014-03-28 X-ray measuring device

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Application Number Priority Date Filing Date Title
JP2014068561A JP6256152B2 (en) 2014-03-28 2014-03-28 X-ray measuring device

Publications (3)

Publication Number Publication Date
JP2015190868A JP2015190868A (en) 2015-11-02
JP2015190868A5 true JP2015190868A5 (en) 2016-08-25
JP6256152B2 JP6256152B2 (en) 2018-01-10

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017067516A (en) 2015-09-29 2017-04-06 株式会社ミツトヨ Signal processing device for measurement apparatus
DE102016014213A1 (en) 2015-12-08 2017-07-06 Shimadzu Corporation X-RAY SPECTROSCOPIC ANALYSIS DEVICE AND ELEMENTARY ANALYSIS METHOD
JP2019211209A (en) * 2018-05-31 2019-12-12 国立研究開発法人物質・材料研究機構 Measurement method of diffracted x-ray intensity by one-dimensional or two-dimensional detector

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5698641A (en) * 1980-01-09 1981-08-08 Rigaku Denki Kk X-ray diffraction device
JPS59186481A (en) * 1983-04-08 1984-10-23 Citizen Watch Co Ltd Image pickup device
JPH0678913A (en) * 1992-09-03 1994-03-22 Toshiba Corp Ct scanner
JP2003156565A (en) * 2001-11-20 2003-05-30 Canon Inc Imaging device using photoelectric converter
JP5492173B2 (en) * 2011-11-11 2014-05-14 株式会社リガク Diffraction X-ray detection method and X-ray diffraction apparatus
GB2496484B (en) * 2011-11-11 2016-04-06 Rigaku Denki Co Ltd X-Ray intensity correction method and x-ray diffractometer
JP5695589B2 (en) * 2012-03-02 2015-04-08 株式会社リガク X-ray intensity correction method and X-ray diffraction apparatus

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