JP2015157632A - Method for detecting abnormality of high-pressure probe device and inner surface of tire - Google Patents

Abstract

PROBLEM TO BE SOLVED: To detect abnormalities in a tire testing device and on a surface of a tire.SOLUTION: A high-pressure probe having a conductive spring electrode is arranged adjacent to a part of a surface of a tire so that the conductive spring electrode is compressed to s surface of the tire. A relative motion is given between the high-pressure probe and the surface of the tire. Discharge is generated at a place of an abnormality on the surface of the tire between the high-pressure probe and a reference electrode. A device and a method are constituted so as to determine an exact azimuth angle and an exact position in a radial direction of the discharge on the tire. The conductive spring electrode can have sufficient length for securing contact with a given point on the surface of the tire at speed on the tire surface, which increases in a charge cycle to the high-pressure probe.

Description

  The present invention relates generally to tire testing, and more specifically to tire surface abnormality detection.

  Tire repair operations, such as tire retrending operations, are generally used to extend the useful life of a tire. Typical tire retrending operations include removing the already worn tread from the tire and joining a new tread in place. Tires may be retreaded or repaired one or more times as a cheaper alternative to buying new tires, providing particular advantages for large operations such as trucking, bus transportation and commercial aviation.

  In general, some levels of tire non-destructive testing (NDT) are performed prior to repair to determine if it is appropriate to perform a repair operation. Appearance inspection methods can be used to verify completeness and subsequently the feasibility of retreading and / or repairing the tire casing relative to the retread. For example, the inner and outer surfaces of a tire are visually inspected by an operator using special lighting to crack, crack, tear, bulge, sink, burrow, wear, abrasion powder, bubbles, blister, separation, And can be inspected for defects such as other defects. However, visual inspection methods are subjective and inconsistent and may require extensive training. Furthermore, it is difficult to maintain specialized knowledge due to heavy switching of operators.

  A high voltage discharge (HVD) test can be performed instead of a visual inspection or can be a capture of a visual inspection. The HVD test can be used to identify anomalies in the tire inner liner that penetrate the insulating material of the inner liner. In an HVD tester, the tread portion of the tire is usually placed between a pair of electrodes across which a high voltage potential is generated. The voltage applied across the electrode will cause a discharge at the defect site in the tire. For example, US Pat. No. 6,050,136, which is incorporated herein by reference in its entirety, discloses an HVD tester that utilizes electrical discharge to detect defects in the tire inner liner.

  On conventional HVD testers, the probe assembly typically includes a series of wire loops and small chains positioned to suspend the interior of the tire in a manner that distributes high pressure on a bead-by-bead basis on the interior surface of the tire. . A correction width probe must be selected for the tire size. A ground path for discharge in anomalies is provided by the tread contacting the metal drive roller. As the probe crosses the anomaly, the discharge moves to the metal drive roller through the tread at the anomalous location.

  Conventional HVD test machines have several disadvantages. For example, conventional HVD testers typically require manual selection of probe size to accommodate various tire sizes. For example, three different probe sizes may be provided to cover the range of retreadable truck tires. Once the probe size is selected, the probe must be semi-manually attached to the inner surface of the tire, making the HVD tester susceptible to improper placement.

  In addition, the normal HVD probe covers the entire inner surface of the tire for each bead, so when an abnormality is detected, the exact radial (radial) position where the abnormality is located is unknown. Normally, the tire stops rotating when a discharge is detected. This provides an anomalous azimuth location. However, in order to obtain an accurate radial position of the anomaly, the operator would normally hold the manual button down to mark the tire with carbon deposits or visually place the corona discharge. Is repeated.

  Furthermore, the detection function of a normal HVD tester depends on many variables. For example, wire curvature, chain condition, tread thickness, rotational speed, and tread chemical composition affect the detection capabilities of the HVD tester. Significant variability can result in slight fist changes on the tire surface, chain depression or improper trimming, or wire degradation or improper positioning. For example, a slight fist up change on the inner surface of the tire may cause the HVD probe to temporarily leave the inner liner surface, causing the HVD probe to miss an abnormality on the tire surface.

  Further, due to the characteristics of the charge and discharge cycle of the high voltage power source used to pressurize the HVD probe, the anomaly detection is when the voltage is at a level sufficient to discharge the high voltage charge through the anomaly Depends on the probe being very close to the anomaly. The configuration of the probe chain and wire with respect to the tire detects the surface area of the probe in contact with the tire. The tire surface rotates at a low enough speed to ensure that the probe is fully charged when the surface area of the probe contacts a given point on the tire surface to detect the presence of an anomaly It must be.

  Therefore, there is a need for an automated HVD testing solution for tires that overcomes the above disadvantages. The solution can reduce the need for operator interaction to determine the exact and exact location of the tire surface anomaly. High pressure probes that are less susceptible to variations, such as fist up changes on the tire surface and improper positioning of the high pressure probe, should be particularly beneficial. High pressure probes that can be used with increased tire rotation speed and that reliably contact a given point on the surface of the tire when the high pressure probe is charged to a voltage level sufficient to be discharged through the anomaly are also particularly Must be beneficial.

  Aspects and advantages of the present invention are set forth in part in the following description, or may be obvious from the description, or may be learned through practice of the invention.

  One exemplary embodiment of the present disclosure is directed to a tire inspection device. The tire inspection apparatus includes a high pressure probe that serves to be positioned adjacent to the surface of the tire. The apparatus further includes a reference electrode and a tire rotation device that serves to impart relative motion between the tire surface and the high pressure probe. The tire inspection apparatus further includes a detection circuit that serves to detect one or more discharges between the high voltage probe and the reference electrode. The high pressure probe includes a conductive spring electrode configured to be pressed against the surface of the tire during the tire inspection process. In certain embodiments, the high pressure probe can include a plurality of adjacent spring electrodes. Each of the plurality of spring electrodes can be configured to be pressed against a portion of the surface of the tire during the tire inspection process.

  In a variation of this exemplary embodiment, the conductive spring electrode has a length sufficient to maintain contact with points on the surface of the tire during the charging cycle relative to the high pressure probe. For example, in certain embodiments, the conductive spring electrode can have a length of about 50 mm.

  In another variation of this exemplary embodiment, the tire inspection apparatus includes a high pressure probe mounted on the tire surface such that the conductive spring electrode is compressed at a first radial position relative to the tire surface. And a high pressure probe positioning device that serves to position adjacent to the substrate. The high pressure probe positioning device may further be configured to adjust the high pressure probe from a first radial position to a second radial position. The second radial position can be directly adjacent to the first radial position.

  In yet another variation of this exemplary embodiment, the reference electrode of the tire inspection device can be positioned adjacent to the tread portion of the tire. In a further variation of this exemplary embodiment, the reference electrode can be positioned adjacent to the tire bead.

  Furthermore, in a further variation of this exemplary embodiment, the tire inspection apparatus further includes a detection circuit that serves to provide a signal representative of the azimuth and radial position of one or more discharges on the surface of the tire. . A signal representative of one or more discharges can be used to determine the exact location of one or more anomalies on the tire surface.

  Another exemplary embodiment of the present disclosure is directed to a tire inspection method. The tire inspection method includes positioning a high pressure probe adjacent to a tire surface. The high pressure probe has a conductive spring electrode configured to be pressed against the surface of the tire. The method includes pressurizing the high pressure probe, imparting relative motion between the high pressure probe and the tire surface, and detecting the presence of one or more anomalies on the tire surface. And detecting one or more discharges between the reference electrode and the reference electrode.

  In a variation of this exemplary embodiment, imparting relative motion between the high pressure probe and the surface of the tire can include rotating the surface of the tire around the high pressure probe with a tire rotation device. In another variation of this exemplary embodiment, the method can further include adjusting the radial position of the high pressure probe. For example, in certain embodiments, providing relative motion between the high pressure probe and the tire surface causes the conductive spring electrode to be compressed at a first radial position relative to the tire surface. Positioning the high-pressure probe, rotating the surface of the tire around the surface of the high-pressure probe by at least one revolution, and the conductive spring electrode being pressed against the tire surface at a second radial position. As such, positioning the high pressure probe and rotating the surface of the tire around the surface of the high pressure probe by at least one revolution may be included. The first radial position can be directly adjacent to or immediately adjacent to the second radial position.

  In a further variation of this exemplary embodiment, the tire inspection method may include monitoring one or more discharge locations on the surface of the tire. The location of the one or more discharges may indicate the presence of one or more anomalies on the tire surface.

  Furthermore, in a further variation of this exemplary embodiment, the method can include positioning the reference electrode adjacent to the tread portion of the tire. Further, in a further variation of this exemplary embodiment, the method can include positioning the reference electrode adjacent to the bead portion of the tire.

  A further exemplary embodiment of the present disclosure is directed to a high pressure probe for use in a tire inspection apparatus. The high pressure probe includes an insulating casing, a spacing roller, a high pressure connection point, and a conductive spring electrode. The conductive spring electrode is adapted to be pressed against a portion of the tire surface when the spacing roller contacts the tire surface.

  In a variation of this exemplary embodiment, the conductive spring electrode has a length sufficient to maintain contact with a point on the surface of the tire during the charging cycle relative to the high pressure probe. For example, in certain embodiments, the conductive spring electrode has a length of about 50 mm.

  These and other features, aspects and advantages of the present invention will become better understood with reference to the following description and appended claims. The accompanying drawings are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description serve to explain the principles of the invention.

  The complete and practicable disclosure of the present invention, including its best mode for those skilled in the art, is described herein with reference to the accompanying drawings.

1 is a block diagram of an exemplary tire inspection system, according to an exemplary embodiment of the present disclosure. FIG. 1 is a perspective view of an exemplary tire testing apparatus, according to an exemplary embodiment of the present disclosure. FIG. 2 is a perspective view of an exemplary high pressure probe, according to an exemplary embodiment of the present disclosure. FIG. FIG. 6 is a perspective view of an exemplary high pressure probe, according to another exemplary embodiment of the present disclosure. 2 is a graphical representation of an exemplary charge cycle for a high voltage probe, according to an exemplary embodiment of the present disclosure. 5 is a flow diagram of exemplary method steps, according to an exemplary embodiment of the present disclosure. FIG. 3 illustrates a high pressure probe maintained at a first radial position on the surface of a tire, according to an exemplary embodiment of the present disclosure. FIG. 3 illustrates a high pressure probe maintained at a second radial position on the surface of a tire, according to an exemplary embodiment of the present disclosure. FIG. 4 illustrates a high pressure probe maintained at a third radial position on the surface of a tire, according to an exemplary embodiment of the present disclosure. FIG. 6 illustrates an exemplary reference electrode that can be used in accordance with an alternative embodiment of the present disclosure.

  For the purpose of illustrating the invention, reference will now be made in detail to embodiments and aspects of the invention, one or more examples of which are illustrated in the accompanying drawings. Each example is provided by way of explanation of the invention, not as a limitation of the invention. Indeed, it will be apparent to those skilled in the art that various modifications and variations can be made to the present invention from the teachings disclosed herein without departing from the scope and spirit of the invention. Will. For example, features shown or described as part of one embodiment can be used with another embodiment to yield yet another embodiment. Accordingly, the present invention is intended to embrace such modifications and variations as fall within the scope of the appended claims and their equivalents.

  In general, the present disclosure is directed to HVD testing for abnormalities on the surface of a tire. In certain embodiments, the high pressure probe having a conductive spring electrode is maintained against the tire surface such that the conductive spring electrode is pressed against the tire surface. The conductive spring electrode is voltage pressurized and relative motion is provided between the tire surface and the high pressure probe. Due to the presence of an anomaly penetrating the insulating material on the tire surface, a discharge is generated between the conductive spring electrode and the reference electrode.

  High pressure probes according to embodiments of the present disclosure provide various advantages over HVD testers known to those skilled in the art. For example, a high pressure probe can be automatically provided across the tire surface from bead to bead, reducing errors caused by improper positioning of the high pressure probe. In addition, high pressure probes can be used to test multiple different size tires without having to use different size high pressure probes.

  As another example, embodiments of the present disclosure can provide an accurate indication of abnormal azimuth and radial position on the tire surface. For example, a high pressure probe can first be placed adjacent to the tire surface at a particular radial position. When the tire rotates around the high voltage probe, a discharge may occur at an abnormal location between the high voltage probe and the reference electrode. Since the high-pressure probe is arranged at a specific radial direction and azimuth angle position when a discharge occurs, the location of the abnormal radial direction and azimuth angle can be easily determined.

  As yet another example, when a conductive spring electrode is pressed against the tire surface, the tire test system is less susceptible to errors caused by fist up or height changes on the inner surface of the tire. For example, if the conductive spring electrode crosses or passes through a small fist change on the tire surface, the elasticity of the conductive spring electrode will maintain the surface of the conductive spring electrode relative to the tire surface. Become. In this manner, the conductive spring electrode reduces errors in abnormality detection due to slight fist changes on the tire surface.

  As yet another example, the conductive spring electrode is specifically sized to improve the anomaly detection function. For example, the width of the spring electrode is preferably configured such that each successive positioning of the high pressure probe relative to the tire surface does not miss any anomalies. In addition, the length of the conductive spring electrode ensures that an electrode charged to a voltage level sufficient to discharge through the anomaly is applied to the entire tire surface at an increased tire rotational speed. It can be configured as follows. In this manner, embodiments of the present disclosure provide a more beneficial and automated high-pressure discharge test with reduced dependence on variables such as rotational speed, changes in lift on the tire surface, and improper positioning of the high-pressure probe. I will provide a.

  Referring now to FIG. 1, a schematic external view of an exemplary tire test system 100 will be described in accordance with an exemplary embodiment of the present disclosure. An HVD test technique is used to determine the presence of one or more surface anomalies in the tire 102 using the tire test system 100 and to determine whether the tire 102 can be repaired or retreaded. The tire 102 can be executed. As used herein, the term “anomaly” can refer to any anomaly on the surface of the tire, including defects in the tire such as cracks, cracks, tears, erosion, wear, penetration, and other defects. it can.

  The tire test system 100 can include a high voltage probe 110, a detection circuit 120, a tire rotation device 130, and a reference electrode 170. The high pressure source 112 can provide high pressure energy to the high pressure probe 110, such as about 37.5 kV to about 50 kVDC voltage energy. The high pressure source 112 can be any source configured to provide high pressure energy to the high pressure probe 110. For example, in certain embodiments, the high voltage source 112 can include a TEI MicroFS-D unit that utilizes a charge / discharge cycle to generate 50 kVDC with a high voltage probe. One skilled in the art will appreciate that any high pressure source can be used without departing from the scope of the present disclosure using the present disclosure provided herein.

  The high pressure probe 110 can be maintained against the surface of the tire 102 using a high pressure probe positioning device. The high pressure probe positioning device can be controlled by the controller 150 to automatically position the high pressure probe 110 relative to the surface of the tire 102. The tire rotation device 130 can be controlled by the controller 150 to impart relative motion between the high pressure probe 110 and the surface of the tire 102. For example, the tire rotation device 130 can be used to rotate the inner surface of the tire on the high pressure probe 110. As the high voltage probe 110 crosses or passes through an anomaly penetrating the inner surface of the tire, a discharge occurs between the high voltage probe 110 and the reference electrode 170. The location of the discharge provides an indication of the location of the anomaly on the inner surface of the tire 102.

  The detection circuit 120 can be used to detect the presence of a discharge between the high voltage probe 110 and the reference electrode 170. Various detection circuits 120 for detecting discharge are known. Any known detection circuit 120 for detecting a discharge between the high voltage probe 110 and the reference electrode 170 can be used without departing from the scope of the present disclosure. For example, in certain embodiments, the detection circuit can include components available from TEI. The detection circuit 120 can include various electronic devices to monitor the voltage and / or voltage frequency at the high voltage probe 110. A change in voltage and / or frequency at the high voltage probe 110 can indicate the presence of a discharge. The detection circuit 120 can be coupled to an azimuth and radial feedback circuit that provides a position feedback signal indicating the exact azimuth and radial position of the discharge. In this manner, the detection circuit 120 can provide the computing system 140 with data related to the occurrence of the discharge and the exact location.

  In addition to using the computing system 140 to control various aspects of the system 100 through the controller 150, the information received from the detection circuit 120 during the tire inspection process can also be stored and analyzed. Specifically, the computing system 140 is configured to receive input data including data from the detection circuit 120 and provide a valid output such as data to the user or a signal for processing the controller 150. One or more processors 142 may also be included. For example, in certain embodiments, the processor (s) 142 can use the data received from the detection circuit 120 to generate a graphical representation of the tire surface, such as a two-dimensional map or other suitable graphical representation.

  Various memory / media elements 144 include, but are not limited to, volatile memory (eg, random access memory (RAM, such as DRAM, SRAM) and non-volatile memory (eg, ROM, flash, hard drive, magnetic tape, CD-ROM, DVD-ROM, etc.) or a single piece of one or more types of computer readable media, such as any combination of any other memory devices including diskettes, drives, other magnetic based storage media, optical recording media 1 shows three separate memory / media elements 144a, 144b and 144c, the content shown in such a device is actually a single memory. / May be stored in a media element or in multiple elements. Rayuru such variations contemplated and other variations, using the disclosure provided herein, those skilled in the art will recognize.

  The computing / processing device of FIG. 1 accesses the software instructions stored in one or more memory / media elements (eg, memory / media element 144b) and rendered in a computer-readable form as desired. It may be adapted to function as a special purpose machine that provides functionality. As the software is used, any suitable programming, script, or other type of language, or combination of languages may be used to suggest the teachings contained herein. In other embodiments, the methods disclosed herein may alternatively be implemented by wiring logic or other circuitry, including but not limited to special purpose circuitry.

  Each software instruction stored in memory / media element 144b may also be accessible by processor (s) 142 using other memory / media elements (eg, memory / media elements 144a, 144c). Store data that affects For example, the memory / media element 144a may include input data corresponding to the occurrence and location of the discharge obtained from the detection circuit 120, as well as, but not limited to, high pressure probe parameters, detection circuit parameters, tire rotation parameters, and other suitable Control parameters such as control parameters, tire radius, tire width, tire maximum mass, tire pressure, tire radial stiffness, tire tangential stiffness, tire bending stiffness, tire tensile stiffness, tread location, general tire data Any predetermined parameter can be included, such as tire parameters. Such predetermined parameters may be pre-programmed into the memory / media element 144a or provided therein with storage when entered by the user accessing the input device 146 as input data.

  Input device 146 may correspond to one or more peripheral devices configured to operate as a user interface with image processing system 140. Exemplary input devices may include, but are not limited to, keyboards, touch screen monitors, microphones, mice and other suitable input devices.

  The second memory element 144b operates on the input data stored in the memory / media element 144a to provide new output data (eg, anomaly identification and location) for storage in the third memory / media element 144c. May include computer-executable software instructions that are read and executable by the processor (s) 142. The selected portion of output data may then be provided to one or more peripheral output devices 148.

  The output data 148 may correspond to a display device, such as a monitor, screen, or other visual display device, a printer, and the like. Another special type of output device may correspond to the process controller 150. In one embodiment, the process controller 150 assists in the overall tire manufacturing process by adjusting the operating parameters of the high pressure probe 110, the high pressure probe positioning device, the tire rotation device 130, and other process parameters.

  With reference to FIG. 2, an exemplary arrangement of tire 102, tire rotation device 130, and high pressure probe 110 will be discussed in detail. As shown, the tire rotation device 130 includes one or more rollers 132. The bead portion of the tire 102 sits on one or more rollers 132. The roller 132 is configured to impart motion to the tire 102 by, for example, continuously rotating the inner surface of the tire 102 on the high-pressure probe 110. The tire 102 is placed on top of the high pressure probe 110 so that the high pressure probe 110 can test the inner surface of the tire 102 for anomalies.

  As discussed in more detail below, the high pressure probe positioning device 160 is used to position the high pressure probe 110 adjacent to a first radial position on the inner surface of the tire 102. The tire rotation device 132 rotates the tire 102 on the high-pressure probe 110 by at least one rotation of the tire. The high pressure probe positioning device 160 can then be used to position the high pressure probe 110 adjacent to a second radial position on the inner surface of the tire 102. Next, the tire rotation device 130 rotates the tire 102 on the high-pressure probe by at least one rotation of the tire. The process is repeated for each bead of tire 102 until the entire inner surface is tested for abnormalities.

  The reference electrode 170 is disposed adjacent to the tread portion 104 of the tire 102. The reference electrode 170 includes a conductive roller that rotates along the tread portion 104 of the tire 102 as the tire 102 rotates within the tire rotation device 130. Reference electrode 170 is coupled to a reference electrode such as a ground potential. When the high voltage probe 110 crosses the abnormality on the inner surface of the tire 102, a discharge is generated between the high voltage probe 110 and the reference electrode 170 through the tread portion 104.

  FIG. 3 provides a perspective view of an exemplary high pressure probe 110 that can be used in accordance with exemplary aspects of the present disclosure. The high pressure probe 110 includes a high pressure connection point 115 for connecting the high pressure probe 110 to a high pressure energy source. Any suitable connection to a high pressure energy source can be used without departing from the scope of the present disclosure. For example, the high voltage connection point 115 can be adapted to receive a flexible high voltage cable shielded from a high pressure source.

  The high pressure probe 110 further includes an insulating casing 114, a spacing roller 116, and a conductive spring electrode 118. The insulating casing 114 can be composed of any material that sufficiently insulates high pressure energy, such as, for example, about 50 kVDC. An insulating casing 114 is used to insulate the various components of the high pressure probe 110 and other components of the tire testing apparatus from the energized conductive spring electrode 118.

  The conductive spring electrode 118 is used to apply high pressure energy to the inner surface of the tire. The conductive spring electrode 118 has a shape and configuration adapted to be pressed against the tire surface as the spacing roller 116 maintains contact with the tire surface. When the conductive spring electrode 118 is squeezed, the elasticity of the conductive spring electrode 118 causes the conductive spring electrode 118 to remain on the tire surface even when the conductive spring electrode 118 crosses a slight fist or bump on the tire surface. Maintain contact with. In this manner, the tire testing device is less susceptible to errors caused by slight lift or altitude changes on the tire surface and provides more accurate detection of abnormalities.

  The conductive spring electrode 118 can be composed of any suitable conductive material. For example, in certain embodiments, the conductive spring electrode 118 is comprised of steel. However, other suitable conductors such as aluminum, copper, gold, etc. can be used to configure the conductive spring electrode 118 as desired.

  As shown, the conductive spring electrode 118 has a width W. Unlike the high voltage probe known in the art, only the conductive spring electrode 118 contacts a limited portion of the tire surface equal to the width W of the conductive spring electrode 118. As discussed in detail below, due to its limited width W, the conductive spring electrode 118 is maintained adjacent to a particular radial position on the tire surface during the tire inspection process. By maintaining the conductive spring electrode 118 at a specific radial position on the surface of the tire, the exact radial position of the discharge from the conductive spring electrode 118 can be determined. Preferably, the width W of the conductive spring electrode 118 should be set so that each successive positioning of the high pressure probe 110 by high pressure probe positioning during the automatic tire inspection process does not miss any part of the tire surface. is there.

  The conductive spring electrode 118 has a specific length L. In certain embodiments, the conductive spring electrode 118 has a length L that is sufficient to maintain contact with a given point on the tire surface during full charge with respect to the high voltage probe 110. Specifically, the high pressure probe source used to pressurize the high pressure probe 110 can utilize a charge / discharge cycle to generate a high voltage at the conductive spring electrode 118. For example, in certain embodiments, charge / discharge cycles can occur about 40 times per second. Since the discharge is almost instantaneous, the time to recharge the probe can take up to about 25 milliseconds. To ensure that the conductive spring electrode 118 is at a voltage sufficient to discharge through the abnormality as it passes through a point on the tire surface, the conductive spring electrode 118 is charged for 25 milliseconds. It is desirable to maintain adjacent to a given point on the tire surface throughout the cycle. This can be accomplished by rotating the tire at a low speed sufficient to allow the conductive spring electrode 118 to recharge to a high voltage before completely passing through a point on the tire surface. However, it is often desirable to increase the rotational speed during the tire inspection process in order to provide faster automated testing of the tire. Therefore, reducing tire speed is not always a feasible solution.

  In order to allow a higher rotational speed, the conductive spring electrode 118 is fully discharged to a voltage level sufficient to discharge through the anomaly before completely passing a given point on the tire surface. It has a length L sufficient to allow recharging. For example, FIG. 5 shows a graphical representation of a recharge cycle for an exemplary high voltage probe. As shown, it takes about 25 milliseconds to fully recharge the high pressure probe. FIG. 5 shows that a conductive spring electrode 118 having a length L of about 50 mm at a linear tire surface speed of 2 m / s for the high pressure probe is applied to the tire surface during a 25 ms charge cycle for the high pressure probe. It is further shown that it is sufficient to maintain contact with the given point above. Increasing the accuracy of anomaly detection by ensuring that the high voltage probe 110 is fully charged to a voltage sufficient to discharge through the anomaly as it passes a given point on the tire surface Is done.

  FIG. 4 illustrates an alternative embodiment of a high pressure probe 400 that can be used in accordance with the present disclosure. Similar to the high pressure probe 110 of FIG. 3, the high pressure probe 400 of FIG. 4 includes a high pressure connection point 405 for connecting the high pressure probe 400 to a high pressure energy source. The high pressure probe 400 further includes an insulating casing 410 and a spacing roller 420. However, in place of the high voltage probe 110 of FIG. 3, the high voltage probe 400 includes a plurality of adjacent conductive spring electrodes 432, 434, 436, and 438. Although four conductive spring electrodes 432, 434, 436, and 438 are shown in FIG. 4, more or fewer conductive spring electrodes can be used as desired. Each of the plurality of conductive spring electrodes 432, 434, 436, and 438 is configured to be pressed against a portion of the tire surface during the tire inspection process. By using a plurality of conductive spring electrodes 432, 434, 436, and 438, the high pressure probe 400 causes a larger portion of the tire surface to pass as each passes through the tire surface continuously around the high pressure probe 400. Can be scanned. With this approach, less tire rotation is required to scan the entire tire surface and tire inspection times are faster.

  Referring now to FIG. 6, an automatic tire test method 600 for inspecting the tire surface for anomalies will now be discussed. At 602, method 600 includes placing a high pressure probe adjacent to a tire surface. For example, as discussed in more detail below, the high pressure probe positioning device can position the high pressure probe such that the conductive spring electrode on the high pressure probe is pressed against the surface of the tire. At 604, the method 600 includes pressurizing the high pressure probe at high pressure. For example, the high pressure source can provide a high pressure to the high pressure probe, such as about 37.5 kV to about 50 kVDC.

  Once the high pressure probe is pressurized, the method 600 includes applying relative motion between the tire surface and the high pressure probe, as shown at 606. This can be done either by rotating the tire surface around the high pressure probe or by rotating the high pressure probe around the tire surface. A tire rotation device such as the tire rotation device 130 of FIG. 2 can be used to rotate the inner surface of the tire around the high pressure probe. At 608, the method 600 includes adjusting the radial position of the high pressure probe on the tire surface. This can be accomplished in an automated process using a high pressure probe positioning device, as discussed in more detail with reference to FIGS.

  In certain embodiments, the radial position of the high pressure probe is adjusted after one revolution of the tire around the high pressure probe. For example, the method 600 can include positioning the high pressure probe such that the conductive spring electrode is compressed at a first radial position relative to the surface of the tire. The method 600 then rotates the tire surface at least one revolution around the high pressure probe. The method 600 then positions the high pressure probe such that the conductive spring electrode is pressed against the tire surface at a second radial position. Preferably, the second radial position is directly adjacent to or immediately adjacent to the first radial position. The method 600 rotates the tire surface around the high pressure probe again for at least one revolution. In this manner, the entire inner surface of the tire can be scanned from bead to bead using a high pressure probe.

  At 610, method 600 includes detecting a discharge between a high voltage probe and a reference electrode at an abnormal location. As discussed above, a discharge is generated between the high pressure probe and the reference electrode as the high pressure probe pressurized at high pressure crosses or passes through the anomaly penetrating the tire liner. The high pressure probe scans a specific radial position as the tire rotates azimuthally around the high pressure probe, so that the exact radial and azimuthal location of the discharge can be easily determined.

  Once a discharge is detected, an electrical signal representative of the location and occurrence of the discharge can be provided to the computing device for analysis. For example, in certain embodiments, data can be collected at each radial position on the tire surface for a fixed number of azimuth points. The data can include the radial position of the high pressure probe, the azimuthal position of the high pressure probe relative to the tire surface, and the binary state of the defect detection signal. The collected data can then be used to generate a graphical representation of the tire surface, for example in the form of a two-dimensional map or other suitable graphical representation, for visualization and analysis by the operator.

  The operation of the exemplary automatic tire testing apparatus 700 will be discussed in detail with reference to FIGS. The tire test apparatus 700 includes a high pressure probe positioning device 710 configured to position the high pressure probe 720 adjacent to the inner surface of the tire 702. The high pressure probe 720 can include a conductive spring electrode adapted to be pressed against the surface of the tire. The high pressure probe positioning device 710 is configured to move the high pressure probe 720 along the transverse axis 712, the extension axis 714, and about the rotation axis 716.

  In FIG. 7, the tire rotation device positioning device 710 has a high pressure probe 720 disposed at a first radial position on the surface of the tire 702. The tire rotation device may rotate the inner surface of the tire 702 around the high pressure probe 720 at least one turn after the high pressure probe positioning device 710 positions the high pressure probe 720 adjacent to the inner surface of the tire 702. it can. If a discharge is detected from the high voltage probe 720, signals indicating the occurrence of the discharge and the radial and azimuthal location of the high voltage probe 710 can be sent to the computing device. For example, a signal indicating a discharge generated at the first radial position shown in FIG. 7 can be transmitted to the computing device.

  After one rotation of the tire at the first radial position, the tire rotation positioning device 710 can move the high-pressure probe 720 to the second radial position. Preferably, the second radial position is directly adjacent to the first radial position to ensure that the high pressure probe 720 scans the entire inner surface of the tire 702. FIG. 8 shows the high pressure probe 720 in an exemplary second radial position on the inner surface of the tire. The second radial position shown in FIG. 8 is not located directly adjacent to the first radial position in FIG. 7 and is shown in the crown of the tire 702 for the purposes discussed only. Several radial positions are located between the first radial position in FIG. 7 and the second radial position in FIG. 8 depending on the width of the conductive spring electrode used in the high voltage probe. It will be appreciated by those skilled in the art using the disclosure provided herein.

  Once the high pressure probe 720 is positioned at the second radial position, as shown in FIG. 8, the tire rotation device can rotate the tire around the high pressure probe 720 again. If a discharge is detected between the high voltage probe 720 and the reference electrode, a signal indicating the occurrence of a discharge at the second radial position can be transmitted to the computing device.

  After at least one rotation of the tire at the second radial position, the high pressure probe positioning device 710 can move the high pressure probe 720 to the third radial position, as shown in FIG. The third radial position shown in FIG. 9 is not located directly adjacent to the second radial position in FIG. 8 and is shown in the bead portion of the tire 702 for the purposes discussed only. Several radial positions are located between the second radial position in FIG. 8 and the third radial position in FIG. 9 depending on the width of the conductive spring electrode used in the high voltage probe 720. It will be appreciated by those skilled in the art using the disclosure provided herein.

  Once the high pressure probe 720 is positioned in the third radial position, as shown in FIG. 9, the tire rotation device can rotate the tire around the high pressure probe 720 again. If a discharge is detected between the high voltage probe 720 and the reference electrode, a signal indicating the occurrence of a discharge at the third radial position can be sent to the computing device. In this manner, the automatic tire testing apparatus 700 can scan the entire inner surface of the tire 702 and determine the exact azimuth and radial location of any anomalies detected during the automatic tire inspection process.

  FIG. 10 illustrates an alternative reference electrode 175 that can be used in accordance with embodiments of the present disclosure. In place of the reference electrode 170 of FIG. 2, the reference electrode 175 of FIG. 10 is maintained adjacent to the bead portion 106 of the tire 102. The reference electrode 175 includes a conductive spring material that is maintained adjacent to the bead portion 106 of the tire 102 as the tire 102 rotates about the high pressure probe. The discharge between the high voltage probe and the reference electrode 175 does not move through the tread portion 104 of the tire 102. Rather, the discharge will travel from the high pressure probe through one or more carcass plies of the tire 102 to the bead portion 106 of the tire 102. By providing the reference electrode 175 at the bead portion 106 of the tire 102, the discharge is not affected by any variation in tread thickness or chemical composition. Thereby, the number of false detections can be reduced, and the accuracy in detecting abnormality of the tire surface is increased. In addition, providing the reference electrode 175 to the bead portion 106 of the tire 102 can provide for reducing the voltage applied to the high voltage probe from about 50 kV to about 37.5 kV.

  Although the present subject matter has been described in detail in connection with specific exemplary embodiments and methods thereof, those having ordinary skill in the art will appreciate alternatives, variations, and equivalents of these embodiments upon achieving the foregoing understanding. It will be understood that it can be easily figured out. Accordingly, the scope of the present disclosure is intended to be illustrative rather than limiting, and the present subject disclosure is intended to make such modifications, variations and / or variations of the present subject matter readily apparent to those skilled in the art. It does not exclude the inclusion of additional forms.

Embodiments of the present invention are described below.
(Embodiment 1) A high-pressure probe configured to be positioned adjacent to a surface of a tire;
A reference electrode;
A tire rotating device that serves to impart relative motion between the surface of the tire and the high pressure probe;
A detection circuit operative to detect one or more discharges between the high voltage probe and the reference electrode;
The high pressure probe includes a conductive spring electrode configured to be pressed against the surface of the tire during a tire inspection process.
(Embodiment 2) In embodiment 1, the conductive spring electrode has a length sufficient for the high voltage probe to maintain contact with a point on the surface of the tire during a charging cycle. The tire inspection apparatus described.
(Embodiment 3) The tire inspection apparatus according to embodiment 2, wherein the length of the conductive spring electrode is about 50 mm.
(Embodiment 4) The apparatus functions to dispose the high-pressure probe adjacent to the tire surface so that the conductive spring electrode is pressed against the surface of the tire at a first radial position. The tire inspection apparatus according to embodiment 1, further comprising a high-pressure probe positioning device.
(Embodiment 5) The high-pressure probe positioning device adjusts the high-pressure probe from the first radial position on the surface of the tire to a second radial position on the surface of the tire. The tire inspection device according to embodiment 4, which is configured.
(Embodiment 6) The high-voltage probe includes a plurality of adjacent conductive spring electrodes, and each of the plurality of conductive spring electrodes is pressed against a part of the surface of the tire during a tire inspection process. The tire inspection device according to embodiment 1, which is configured as described above.
(Embodiment 7) The tire inspection apparatus according to embodiment 1, wherein the reference electrode includes a conductive roller positioned adjacent to a tread portion of the tire.
(Embodiment 8) The tire inspection apparatus according to embodiment 1, wherein the reference electrode is positioned adjacent to a bead portion of the tire.
Embodiment 9 The embodiment further includes a detection circuit operative to provide a signal representative of the azimuth and radial position of the one or more discharges on the surface of the tire. The tire inspection apparatus described.

(Embodiment 10) Positioning a high pressure probe adjacent to a surface of a tire, the high pressure probe comprising a conductive spring electrode configured to be pressed against the surface of the tire, A positioning step;
Pressurizing the high pressure probe;
Providing relative motion between the high pressure probe and the surface of the tire;
Detecting one or more discharges between the high voltage probe and a reference electrode to detect the presence of one or more anomalies on the surface of the tire;
Including a tire inspection method.
Embodiment 11 The method according to Embodiment 10, wherein the step of imparting relative motion between the high pressure probe and the surface of the tire comprises rotating the surface of the tire around the high pressure probe with a tire rotating device. The tire inspection method described.
(Embodiment 12) The tire inspection method according to embodiment 10, wherein the method further includes a step of adjusting a radial position of the high-pressure probe.
(Embodiment 13) The step of imparting a relative motion between the high-pressure probe and the surface of the tire includes:
Positioning the high-pressure probe such that the conductive spring electrode is pressed against the surface of the tire at a first radial position;
Rotating the surface of the tire with a tire rotation device for at least one revolution around the surface of the high pressure probe;
Positioning the high pressure probe such that the conductive spring electrode is pressed against the surface of the tire at a second radial position directly adjacent to the first radial position;
The tire inspection method according to claim 10, comprising rotating the surface of the tire with the tire rotating device at least one rotation around the surface of the high-pressure probe.
(Embodiment 14) Embodiment 10 wherein the conductive spring electrode has a length sufficient to maintain contact with a point on the surface of the tire during a charging cycle relative to the high pressure probe. The tire inspection method described.
(Embodiment 15) The tire inspection method according to embodiment 10, wherein the method includes the step of monitoring the location of the one or more discharges.
(Embodiment 16) The tire inspection method according to embodiment 10, wherein the method includes a step of positioning the reference electrode adjacent to a tread portion of the tire.
(Embodiment 17) The tire inspection method according to embodiment 10, wherein the method includes a step of positioning the reference electrode adjacent to a bead portion of the tire.

(Embodiment 18) A high pressure probe for use in a tire inspection apparatus,
An insulation casing;
A spacing roller;
A high pressure connection point;
A conductive spring electrode configured to be pressed against a portion of the tire surface when the spacing roller contacts the tire surface;
High pressure probe with.
Embodiment 19 The embodiment of the embodiment 18, wherein the conductive spring electrode has a length sufficient to maintain contact with a point on the surface of the tire during a charging cycle relative to the high pressure probe. The high-pressure probe described.
Embodiment 20 The high-pressure probe according to embodiment 18, wherein the conductive spring electrode has a length of about 50 mm.

Claims (10)

A high pressure probe configured to be positioned adjacent to the surface of the tire;
A reference electrode;
A tire rotating device that serves to impart relative motion between the surface of the tire and the high pressure probe;
A detection circuit operative to detect one or more discharges between the high voltage probe and the reference electrode;
The high pressure probe includes a conductive spring electrode configured to be pressed against the surface of the tire during a tire inspection process, the conductive spring electrode being a limited portion of the surface of the tire A tire inspection device having a limited width that contacts only.   The tire inspection apparatus of claim 1, wherein the conductive spring electrode has a length sufficient to maintain contact with a point on the surface of the tire during a charging cycle relative to the high voltage probe. .   The tire inspection apparatus according to claim 2, wherein the length of the conductive spring electrode is about 50 mm.   The apparatus serves to position the high pressure probe adjacent to the tire surface such that the conductive spring electrode is pressed against the tire surface at a first radial position. The tire inspection apparatus according to claim 1, further comprising a positioning device.   The high pressure probe positioning device is configured to adjust the high pressure probe from the first radial position on the surface of the tire to a second radial position on the surface of the tire. Item 5. The tire inspection apparatus according to Item 4.   The high pressure probe includes a plurality of adjacent conductive spring electrodes, each of the plurality of conductive spring electrodes configured to be pressed against a portion of the surface of the tire during a tire inspection process. The tire inspection device according to claim 1.   The tire inspection apparatus according to claim 1, wherein the reference electrode includes a conductive roller positioned adjacent to a tread portion of the tire.   The tire inspection apparatus according to claim 1, wherein the reference electrode is positioned adjacent to a bead portion of the tire.   The tire inspection apparatus of claim 1, further comprising a detection circuit that serves to provide a signal representative of the azimuth and radial position of the one or more discharges on the surface of the tire. .   The said electroconductive spring electrode has elasticity which makes the said electroconductive spring electrode maintain a contact with the surface of the said tire, when the said electroconductive spring electrode passes on the protrusion of the surface of the said tire. Tire inspection equipment.