JP2015099080A - Socket for electrical component - Google Patents

Abstract

PROBLEM TO BE SOLVED: To insulate an adjacent probe pin assembled into a frame body by making the arrangement of probe pins have narrow pitches, and to prevent slip-off of the probe pin.SOLUTION: A socket for electrial component includes a frame body having a storage part of an electrical component 3 connected to a wiring board P, and a plurality of probe pins 2 inserted into a plurality of insertion holes 6h of a support plate 6 provided at a lower part of the storage part, where upper end parts 12 are brought into press-contact with terminals 11 of the electrical component, and lower end parts 8 are brought into press-contact with a connection pad of the wiring board to connect the terminals 11 and the connection pad. Protrusion parts 9a, 9b are formed in the plurality of probe pins at positions shifted vertically by a predetermined distance D in the axial direction of the probe pins (2a, 2b) adjacent to each other, step parts 10 engaged with the protrusion parts within the thickness of the support plate are formed in the adjacent insertion holes 6h, 6h' of the support plate at positions shifted vertically by a predetermined distance D, the insertion holes of the support plate insulate the protrusion parts of the adjacent probe pins to prevent slip-off by the protrusions of the probe pins.

Description

  The present invention relates to an electrical component socket used for performance testing of an electrical component such as an IC package, and more specifically, adjacent probe pins that can be arranged with a narrow pitch and can be incorporated into a socket frame. And a socket for an electrical component that can prevent the probe pin from coming off.

  In recent years, with the high integration of IC packages and the like to be tested, it is required to narrow the pitch of a plurality of probe pins that electrically connect the terminals of the electrical components and the connection pads of the wiring board in the electrical component socket. For example, there is a demand to arrange probe pins with a pitch of 0.4 mm or less and to make the probe pins as large as possible in a limited space in order to obtain a high load and a long life.

  As a conventional socket for this type of electrical component, there are a frame having an electrical component accommodating portion electrically connected to a wiring board, and a plurality of support plates provided below the accommodating portion in the frame. A plurality of probe pins that are respectively inserted into the insertion holes, and whose upper ends are pressed into contact with the terminals of the electrical component, and whose lower ends are pressed into contact with the connection pads of the wiring board to electrically connect the terminals and the connection pads; Have been proposed (see, for example, Patent Document 1).

  In the socket for electrical parts of the prior art described in Patent Document 1, since the flange portion of the probe pin supported by the insulating support protrudes to the flange portion side of the adjacent probe pin, the tip side cylindrical portions of the adjacent probe pins are Cannot be placed close together. For this reason, the probe pins could not be brought close to a certain pitch or less.

  On the other hand, in the electrical component socket proposed in Patent Document 1, the flange portion of the probe pin extends outward from a part of the side surface of the tip side cylindrical portion when viewed from the axial direction of the probe pin, Since the two probe pins do not extend outward from the portion excluding the part, the two probe pins are arranged so that the portions of the side surface of the tip side cylindrical portion that do not extend outward when viewed from the axial direction face each other. Yes.

JP 2012-149927 A

  However, in the electrical component socket proposed in Patent Document 1, the arrangement of the probe pins can be narrowed as compared with the prior art. However, the flange portion of the probe pin is from the axial direction of the probe pin. As seen, it had to be formed in a special shape so as to extend outward from a part of the side surface of the cylindrical portion on the front end side but not to extend outward from a portion excluding the part. Such a special shape is not easy to manufacture, and since the flange portions are combined in a specific direction, the assembly workability cannot be said to be good.

  Accordingly, the problem to be solved by the present invention that addresses such problems is that the probe pin arrangement can be narrowed, and adjacent probe pins incorporated in the frame of the socket are insulated and the probe is arranged. An object of the present invention is to provide a socket for an electrical component that can prevent a pin from being detached and improve the manufacturing and assembly workability.

  In order to solve the above-described problems, an electrical component socket according to the present invention is provided at a lower portion of a housing having an electrical component housing portion electrically connected to a wiring board, and the frame body. Inserted into the plurality of insertion holes of the support plate, and the upper end is pressed against the terminal of the electrical component, and the lower end is pressed against the connection pad of the wiring board to electrically connect the terminal and the connection pad. A plurality of probe pins having a plurality of probe pins, wherein the plurality of probe pins are adjacent to each other by forming a protrusion at a position shifted by a predetermined distance vertically in the axial direction of adjacent ones of the plurality of probe pins. In the insertion hole, a stepped portion that engages with the protruding portion of the probe pin is formed at a position shifted vertically by a predetermined distance within the thickness of the support plate, and is adjacent to the insertion hole of the support plate. Insulate the projections of Robupin is for the retained by the projections of the probe pin.

  Moreover, the said support plate is good also as what arrange | positioned the adjacent insertion hole formed in the position which shifted | deviated the said step part up and down predetermined distance alternately right and left or front and back in the plane direction.

  Furthermore, the support plate may be configured such that adjacent insertion holes formed at positions where the stepped portions are vertically shifted by a predetermined distance are arranged in a staggered pattern in the plane direction.

  Furthermore, the plurality of probe pins are configured such that at least one of the end connected to the terminal of the electrical component or the end connected to the connection pad of the wiring board is extendable. It may be a thing.

  According to the electrical component socket according to the present invention, the plurality of probe pins are formed with protrusions at positions shifted vertically by a predetermined distance in the axial direction of adjacent ones, and the insertion holes adjacent to the support plate By forming the stepped portion that engages with the protruding portion of the probe pin within the thickness of the supporting plate at a position shifted vertically by a predetermined distance, the protruding portion of the adjacent probe pin is insulated by the insertion hole of the supporting plate. The protrusion of the probe pin can prevent it from coming off. Therefore, the pitch of the probe pins can be narrowed, the adjacent probe pins incorporated in the frame of the socket can be insulated and the probe pins can be prevented from coming off. In addition, since the protruding portion of the probe pin and the stepped portion of the insertion hole of the support plate do not have a special shape or specific direction, manufacturing and assembly workability can be improved.

It is a top view which shows embodiment of the socket for electrical components by this invention. It is the sectional view on the AA line of FIG. It is a principal part expanded sectional view which shows the incorporating structure of the some probe pin inserted in the some insertion hole of the support plate in the frame of the said socket for electrical components. It is explanatory drawing seen from the bottom face which shows the example of arrangement | positioning of the some insertion hole formed in the said support plate. It is explanatory drawing seen from the bottom face which shows the other example of arrangement | positioning of the some insertion hole formed in the said support plate. It is a principal part expanded sectional view which shows the relationship between the insertion hole of a support plate at the time of mounting the said electrical component socket on a wiring board, and accommodating an electrical component in the accommodating part, and the projection part of a probe pin.

Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings.
FIG. 1 is a plan view showing an embodiment of an electrical component socket according to the present invention, and FIG. 2 is a cross-sectional view taken along line AA of FIG. This electrical component socket is used for performance testing of electrical components such as IC packages, and has a frame 1 and probe pins 2.

  The frame 1 is a member that houses, for example, the IC package 3 as an electrical component to be tested, and is arranged on the wiring board P as shown in FIG. As shown in FIGS. 1 and 2, the frame 1 is formed in a rectangular block shape with an insulating material. For example, the housing portion 4 of the IC package 3 is formed in the center of the upper surface thereof. The accommodating portion 4 is configured to fix and accommodate the IC package 3 electrically connected to the wiring board P shown in FIG. 2, and the four corner portions of the IC package 3 are positioned by corner guides or the like.

  In the frame 1, a floating plate 5, a support plate 6, and a bottom plate 7 are provided below the housing portion 4 as shown in FIG. 2. The floating plate 5 accommodates the IC package 3 on its upper surface and supports the upper end portion of the probe pin 2 described later. The floating plate 5 is made of a flat plate formed of an insulating material and is directed upward by a coil spring (not shown). It can be moved up and down. The support plate 6 supports the intermediate portion of the probe pin 2 so as to be movable up and down, and is made of a plate material that is also formed of a flat plate with an insulating material, and is fixed at a position slightly below the floating plate 5. Yes. The bottom plate 7 supports the lower end portion of the probe pin 2, is made of a plate material that is also formed of a flat plate with an insulating material, and is fixed at a position slightly below the support plate 6.

  As shown in FIG. 3, each of the floating plate 5, the support plate 6, and the bottom plate 7 has a plurality of circular insertion holes 5 h, 6 h, 7 h penetrating in the vertical direction. And probe pin 2 is inserted in these insertion holes 5h, 6h, and 7h in the up-and-down direction, respectively. In FIG. 3, in the floating plate 5, the support plate 6 and the bottom plate 7 made of a flat plate material, only the portion where each one of the probe pins 2 is inserted in the place where the insertion holes 5h, 6h and 7h are adjacent to each other. The probe plate 2 is actually inserted into the floating plate 5, the support plate 6, and the bottom plate 7 having a planar expansion in the lateral direction.

  The probe pins 2 inserted into the plurality of insertion holes 5h, 6h, and 7h of the floating plate 5, the support plate 6 and the bottom plate 7 are in pressure contact with the terminals of the IC package 3 and connected to the wiring board P. The lower end of the pad is pressed against the pad to electrically connect the terminal of the IC package 3 and the connection pad of the wiring board P, and is formed in a so-called surface pressure contact type. In FIG. 3, the plunger 8 at least at the lower end of the probe pin 2 is configured to be extendable and contractable by a built-in conductive spring. Note that the probe pin 2 is not limited to one that expands and contracts only at the lower end portion, and may be one that expands and contracts at both upper and lower ends.

  Here, in the present invention, the plurality of probe pins 2 are formed with protrusions at positions shifted by a predetermined distance in the axial direction of those adjacent to each other, and in the insertion holes 6h adjacent to the support plate 6, Within the thickness of the support plate 6, the stepped portion that engages with the protruding portion of the probe pin 2 is formed at a position that is vertically shifted by a predetermined distance.

  That is, in the two adjacent probe pins 2 and 2 shown in FIG. 3, a ring-shaped protrusion that prevents the first probe pin 2 a on the left side from coming off from the support plate 6 is provided in the middle in the axial direction. A portion 9a is formed. The protrusion 9a hits the lower end edge of the insertion hole 6h of the support plate 6 and serves to prevent the first probe pin 2a from coming off. A ring-shaped protrusion 9b is formed at a position shifted by a predetermined distance D upward from the protrusion 9a of the first probe pin 2a at the axial intermediate portion of the second probe pin 2b on the right side. Yes. The protrusion 9b serves to stop the second probe pin 2b from coming out of the support plate 6 in the same manner.

  In the support plate 6 shown in FIG. 3, the right insertion hole 6 h ′ into which the second probe pin 2 b is inserted among the adjacent insertion holes 6 h, 6 h is inserted into the insertion hole 6 h ′ within the thickness of the support plate 6. A step portion 10 is formed at a position shifted by a predetermined distance D from the lower end of the upper portion. The step portion 10 is engaged with the projection portion 9b of the second probe pin 2b to prevent the second probe pin 2b from coming off. The step portion 10 is formed by a member of the support plate 6 between the adjacent insertion holes 6h, 6h ′, and a large-diameter hole (a large-diameter hole) into which the protruding portion 9b can enter the thick portion from the lower surface side. ) Is formed at a depth of a predetermined distance D, and the step portion 10 is a boundary portion between the insertion hole 6h ′ and the large-diameter hole. In this case, the depth of the large-diameter hole formed in the lower half portion of the insertion hole 6h ′ into which the second probe pin 2b is inserted is that the protrusion 9a of the first probe pin 2a and the second probe pin It becomes equal to the predetermined distance D which the protrusion part 9b of 2b shifted | deviated up and down.

  Thereby, in FIG. 2, a large number of probe pins 2 supported below the accommodating portion 4 of the frame 1 are connected to the adjacent first probe pins 2a and second probe pins 2b as shown in FIG. However, the lower end portion thereof is supported by the bottom plate 7, the upper end portion thereof is supported by the floating plate 5, and the intermediate portion thereof is supported by the support plate 6 so as to be held so as to move up and down as a whole. Then, in the neutral state of the probe pin 2, the projection 9a of the first probe pin 2a hits the lower end edge of the insertion hole 6h on the left side of the support plate 6 so that the first probe pin 2a is prevented from coming off, and the second probe The protrusion 9b of the pin 2b engages with the step 10 of the right insertion hole 6h ′, so that the second probe pin 2b is prevented from coming off. In this case, the lower end edge of the left insertion hole 6h is a stepped portion that engages with the protrusion 9a of the first probe pin 2a. Thus, the first probe pin 2a and the second probe pin 2b are supported by one step by providing the step portion 10 only in the insertion hole 6h ′ without providing the step portion 10 in the insertion hole 6h. The plate 6 can be used for positioning.

  At this time, the protrusion 9a and the protrusion 9b of the adjacent first probe pin 2a and the second probe pin 2b are insulated by the member between the insertion holes 6h and 6h 'of the support plate 6. Here, the protruding portion 9a and the protruding portion 9b are formed at positions shifted vertically by a predetermined distance D, and the step portion 10 that engages with the protruding portion 9b of the second probe pin 2b is inserted. Since it is formed closer to the first probe pin 2a side within the width of the member between the holes 6h and 6h ', the adjacent first probe pin 2a and the first The pitch with the 2 probe pins 2b becomes narrow. Accordingly, the pitch of the probe pins 2 can be reduced as a whole.

  FIG. 4 is an explanatory view seen from the bottom showing an arrangement example of the plurality of insertion holes 6 h and 6 h ′ formed in the support plate 6. In this embodiment, the left insertion holes 6h and the right insertion holes 6h 'shown in FIG. 3 are alternately arranged on the left and right in the plane direction. A step 10 is formed at the outer edge of the right insertion hole 6h '. In a state where the insertion holes 6h and 6h 'are alternately arranged on the left and right, a plurality of rows arranged in the left and right direction are arranged in the front and rear.

  The arrangement of the plurality of insertion holes 6h, 6h 'formed in the support plate 6 is not limited to that shown in FIG. 4, but may be arranged as shown in FIG. In this embodiment, the left insertion holes 6h and the right insertion holes 6h 'shown in FIG. 3 are arranged in a staggered pattern in the plane direction. That is, in the first line, the left insertion hole 6h and the right insertion hole 6h ′ are alternately arranged on the left and right, and in the second line, the position of the left insertion hole 6h and the right insertion hole 6h ′ is 1. The insertion holes 6h 'are positioned in the first row of insertion holes 6h, the insertion holes 6h are positioned in the first row of insertion holes 6h', and are alternately arranged on the left and right sides. In the third row, the left insertion holes 6h and the right insertion holes 6h ′ are alternately arranged on the left and right in the same arrangement as the first row. In this case, the insertion hole 6h ′ having the step 10 formed on the outer edge portion is not located in the same column between adjacent rows, so that the row and row are compared with the case of FIG. It is possible to arrange them in between. Therefore, the pitch of the probe pins 2 can be further narrowed.

  Next, the use and operation of the thus configured electrical component socket will be described with reference to FIGS. First, as shown in FIG. 2, the electrical component socket is disposed on the wiring board P. At this time, as shown in FIG. 6A, the lower surface of the bottom plate 7 provided below the housing portion 4 of the frame 1 is placed on the upper surface of the wiring board P, and the lower end of the probe pin 2 shown in FIG. The plunger 8 is pressed against a connection pad (not shown) of the wiring board P and contracts.

  In this state, as shown in FIG. 2, the IC package 3 to be tested is accommodated in the accommodating portion 4 of the frame 1 as indicated by the arrow B. At this time, the IC package 3 is held by suction or the like with a mechanical device such as a robot arm, transported to the electrical component socket, and accommodated in the accommodating portion 4. Then, as shown in FIG. 6A, the IC package 3 is accommodated on the upper surface of the floating plate 5 provided in the accommodating portion 4, and the IC package 3 is inserted into the insertion hole of the probe pin 2 formed on the floating plate 5. The terminal 11 enters. The terminals 11 are spherical terminals called bumps, and are arranged in a grid pattern (grid pattern) on the lower surface of the IC package 3 and protrude downward. In FIG. 6A, the protrusion 9a of the first probe pin 2a hits the lower end edge of the insertion hole 6h on the left side of the support plate 6 so that the first probe pin 2a is stopped and prevented from coming off. The protrusion 9b of the probe pin 2b engages with the step 10 of the right insertion hole 6h ', and the second probe pin 2b is stopped and prevented from coming off.

  Next, in FIG. 6A, the IC package 3 is pushed in as indicated by an arrow C by a robot arm or the like. Then, the floating plate 5 accommodating the IC package 3 descends against the urging force of a coil spring or the like, and comes into contact with the upper surface of the support plate 6 and stops as shown in FIG. At this time, the terminal 11 on the lower surface of the IC package 3 is pressed against the biting portion 12 formed at the upper ends of the first probe pin 2a and the second probe pin 2b, and the terminal 11 and the biting portion 12 bite. Connected with attached. In this case, the first probe pin 2a and the second probe pin 2b are lowered by the pressing of the terminal 11 on the lower surface of the IC package 3, but the lowered amount and the large diameter on the insertion hole 6h 'side shown in FIG. And the depth D of the second probe pin 2b does not escape from the insertion hole 6h ′ side of the support plate 6. As a result, the upper end portion of the probe pin 2 is pressed into contact with the terminal 11 of the IC package 3 and the lower end portion of the probe pin 2 is pressed into contact with the connection pad of the wiring board P, so that the terminal 11 and the wiring board P of the IC package 3 are pressed. The connection pads can be electrically connected.

  In this state, the IC package 3 is pushed into the electrical component socket with a robot arm or the like for 20 to 30 seconds, for example, and a predetermined test is performed. When the test is completed, the IC package 3 is pulled out with the robot arm or the like to the storage position. Convey and finish a series of test operations. As a result, the adjacent probe pins 2 and 2 incorporated in the frame 1 of the electrical component socket can be insulated, and the probe pins 2 and 2 can be prevented from coming off, and a predetermined test can be performed on the electrical components. .

  In the description of FIGS. 3 and 6, the probe pin 2 is manufactured by a cutting die in which a ring-shaped protrusion is formed by cutting a hollow rod-shaped shaft member. However, the present invention is not limited to this. Further, it may be manufactured by a press die in which a dot-like projection is formed on a flat plate material by punching and wound into a hollow shape.

DESCRIPTION OF SYMBOLS 1 ... Frame 2 ... Probe pin 2a ... 1st probe pin 2b ... 2nd probe pin 3 ... IC package (electric component)
4 ... Accommodating part 5 ... Floating plate 6 ... Support plate 6h, 6h '... Insertion hole of support plate 7 ... Bottom plate 8 ... Plunger (lower end of probe pin)
9a: Projection part of the first probe pin 9b ... Projection part of the second probe pin 10 ... Step part 11 ... Terminal of the IC package 12 ... Chamfered part (upper end part of the probe pin)
P ... Wiring board D ... Predetermined distance

Claims (4)

A frame having a housing part for electrical components to be electrically connected to the wiring board;
The frame body is inserted into each of a plurality of insertion holes of a support plate provided below the housing portion, and the upper end portion is pressed against the terminal of the electrical component, and the lower end portion is connected to the connection pad of the wiring board. A plurality of probe pins that are press-contacted to electrically connect the terminals and connection pads;
A socket for an electrical component having
Protrusions are formed in the plurality of probe pins adjacent to each other at positions shifted by a predetermined distance in the axial direction, and the insertion holes adjacent to the support plate have the protrusions within the thickness of the support plate. Form a step that engages with the protrusion of the probe pin at a position shifted up and down by a predetermined distance,
An electrical component socket characterized in that a projection portion of an adjacent probe pin is insulated by an insertion hole of the support plate, and is prevented from being detached by the projection portion of the probe pin.   2. The electrical component according to claim 1, wherein the support plate has adjacent insertion holes formed at positions shifted from each other by a predetermined distance in the vertical direction alternately arranged in the plane direction on the left and right or front and rear sides. Socket.   2. The electrical component according to claim 1, wherein the support plate has adjacent insertion holes formed at positions shifted by a predetermined distance in the vertical direction in a staggered pattern in a planar direction. socket.   The plurality of probe pins are configured such that at least one of the end connected to the terminal of the electrical component or the end connected to the connection pad of the wiring board is extendable. The socket for an electrical component according to any one of claims 1 to 3, wherein the socket is an electrical component.