JP2015059756A - Hardness-testing machine - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a hardness-testing machine capable of setting a test position easily in a shorter time when testing a plurality of test pieces.SOLUTION: A hardness-testing machine stores a test pattern being information on a plurality of test positions set for one test piece 100. The test pattern is copied to an image of another test piece 100, and a plurality of test positions are simultaneously set to another test piece 100 by vertically and horizontally moving and/or rotating the test pattern copied in response to a position and a direction of the test piece 100 in a circular region of a specimen that is a resin-molded test piece 100.

Description

  The present invention relates to a hardness tester that measures the hardness of a test piece.

  The hardness tester places the test piece and positions the test piece on the XY plane, an indenter for forming a depression on the surface of the test piece, and presses the indenter against the test piece at the test position. A load mechanism for applying a test force to the indenter, an objective lens for observing a depression formed on the surface of the test piece, and a turret for switching one of the objective lens and the indenter to face the test position. It has. And the magnitude | size of the hollow formed in the surface of a test piece is measured, and it has the structure which calculates | requires the hardness of a test piece based on the hollow size (refer patent document 1).

  Thus, in the hardness tester, the load axis of the load system that applies test force to the test piece and the optical axis of the optical system for observing the depression formed in the test piece are coaxial, and the test piece is On the other hand, the structure which switches a load system and an optical system by moving an indenter and an objective lens is employ | adopted.

  When performing a Vickers hardness test in such a hardness tester, first, the test piece placed on the stage is observed with a low-magnification objective lens, and the test position for detecting the shape of the test piece and pressing the indenter is determined. Yes. Then, after performing the operation of pressing the indenter to the determined test position, the dent measurement is performed by observing the dent formed on the surface of the test piece with an objective lens having a magnification suitable for measuring the size of the dent. Running.

  Further, in the hardness tester described in Patent Document 1, even when a test is performed on a plurality of test pieces having the same or similar shape, for each test piece, the test position is set and the test is executed. Indentation measurement is performed.

  In addition, as a hardness tester capable of executing and measuring a plurality of test pieces continuously, a loading table provided with a sample fixing base for fixing a plurality of test pieces is mounted on a camera by a belt conveyor type transfer unit. It is proposed that the test position is set for each of all the test pieces and then the test is continuously executed for a plurality of test pieces by transporting them to the measuring unit within the visual field of (See Patent Document 2).

Japanese Patent Laid-Open No. 9-15128 JP-A-10-142133

  However, in the hardness tester described in Patent Document 2, the setting of the test position for each test piece includes the coordinates of the test position at which the dent is first formed, the direction in which the continuous dent is formed, the distance between the dents, Information such as the number of test positions forming the indentation must be set individually for each specimen. For this reason, it takes a long time to set the test position before the test is executed.

  The present invention has been made to solve the above-described problem. A hardness tester capable of easily setting a test position in a shorter time when testing a plurality of test pieces. The purpose is to provide.

  The invention according to claim 1 is a hardness tester for continuously testing a plurality of test pieces, and a fixture having a plurality of sample fixing portions each holding one or more test pieces. XY stage for moving the sample fixed to the fixture in the XY direction, an elevating mechanism for moving the XY stage in the Z direction, an indenter for forming a recess on the surface of the test piece, A load mechanism for applying a test force to the indenter by pressing the indenter against the surface of each test piece at a test position, and a plurality of shapes for observing the shape of the test piece and the depression formed on the surface of the test piece in the sample An objective lens, a switching member that supports the indenter and the objective lens, and moves either the indenter or the objective lens to a position facing the sample, and the objective lens And a test position setting means for setting a plurality of test positions on the test piece, and storing a plurality of test positions set by the test position setting means as a test pattern. The storage device further includes a storage unit, and when the plurality of test pieces in the sample placed on the stage have at least a part of the same shape, the test position setting unit is set for the same shape part first. A test pattern is read from the storage unit and applied to the same shape portion of another test piece to set a test position.

  According to a second aspect of the present invention, in the first aspect of the invention, the test position setting means recognizes the sample for each position fixed to the fixture, and sets a plurality of samples set as the first sample. The test pattern which is the test position is stored in the storage unit, and then the test pattern set in the first sample read from the storage unit is applied to another sample to set the test position.

  According to a third aspect of the present invention, in the first or second aspect of the invention, the test position setting unit is configured to display an image of a test pattern read from the storage unit on a sample displayed on the display unit. A test pattern transfer means for transferring the image on the image, and a test pattern transferred by the transfer means and displayed on the display portion so as to be superimposed on the image of the test pattern are aligned in the direction associated with the shape of the test piece. Moving means for rotating and / or moving up, down, left and right.

  According to a fourth aspect of the present invention, in the invention according to any one of the first to third aspects, the fixing member is provided with four fixing portions in two rows and two columns.

  According to the first aspect of the present invention, when the plurality of test pieces in the sample placed on the stage have at least a part of the same shape, the test position setting unit firstly Since the set test pattern is read from the storage unit and applied to the same shape part of another test piece to set the test position, each test piece when performing a test continuously on a plurality of test pieces The test position can be set easily and in a short time.

  According to the second aspect of the present invention, since the information on the test position of the test piece can be registered for each sample holding the test piece in the storage unit, when the test is continuously performed on a plurality of test pieces having the same shape. In addition, it is possible to set a plurality of test positions on each test piece faster.

  According to the third aspect of the invention, the image of the test pattern set in advance is transferred onto the image of the test piece displayed on the display unit, and the image is correlated with the shape of the test piece while viewing the image. Since the test pattern can be rotated and / or moved up, down, left and right so that the directions are aligned, a plurality of test positions can be set together more easily.

  According to the fourth aspect of the invention, since the fixture is provided with four fixing portions in 2 rows and 2 columns, each sample can be easily fixed to the fixture.

It is a schematic diagram of the hardness testing machine concerning this invention. 3 is a perspective view showing a state in which a fixture 70 is disposed on an XY stage 12. FIG. 3 is a plan view of a fixture 70. FIG. 4 is a right side view of the fixing tool 70. FIG. It is a schematic diagram of the raising / lowering mechanism which raises / lowers the XY stage. FIG. 3 is an explanatory diagram showing the arrangement of objective lenses and the like supported by a turret 20. 2 is a schematic diagram of a load mechanism for applying a test force to the indenter 19 and the indenter 21 and an optical system for observing a depression formed in the test piece 100. FIG. FIG. 5 is a schematic diagram for explaining a state in which a depression is formed in a test piece 100 by an indenter 21. 3 is a plan view showing a recess formed in a test piece 100. FIG. It is a block diagram which shows the main control systems of the hardness tester based on this invention. 2 is a block diagram showing a main functional configuration in a computer 50. FIG. 7 is a plan view showing a state in which a sample 10 is fixed to each fixing portion 75 of the fixing tool 70. FIG. It is a schematic diagram explaining the setting of a test position. It is a flowchart explaining the procedure which sets a test position.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a schematic diagram of a hardness tester according to the present invention. FIG. 2 is a perspective view showing a state in which the fixture 70 is disposed on the XY stage 12. 3 is a plan view of the fixture 70, and FIG. 4 is a right side view thereof. In FIG. 4, the sample 10 is indicated by a virtual line. FIG. 5 is a schematic diagram of an elevating mechanism that elevates and lowers the XY stage 12.

  This hardness tester includes a table 11 and an XY stage 12 on which a fixture 70 that is placed on the table 11 and holds the sample 10 holding the test piece 100 is disposed. The XY stage 12 moves the sample 10 in the X direction (left-right direction in FIG. 1) and the Y direction (direction perpendicular to the paper surface in FIG. 1), and positions the test piece 100 held by the sample 10 on the XY plane. Is to do. The XY stage 12 is provided with a motor 13 for horizontally moving the XY stage 12 in the X direction and a motor 14 for moving the XY stage 12 in the Y direction.

  When a test is performed on a test piece 100 having a small size, a sample 10 is obtained by resin-molding the test piece 100 by a method that does not affect the hardness of the test piece 100, and the surface is polished by a polishing method suitable for the characteristics of the material. The surface to be inspected. In this hardness tester, as shown in FIGS. 2 and 3, an XY stage 12 includes a fixture 70 in which four fixing portions 75 are formed according to the outer shape of a cylindrical sample 10 in which a test piece 100 is resin-molded. It is fixed on the top with bolts.

  The fixture 70 includes an upper plate member 71 provided with four holes, a lower plate member 72 provided with bolt holes 74 for fixing the fixture 70 on the XY stage 12, and a lower plate member 72. And a column member 73 that connects the upper plate member 71 and a holding screw portion 76 that supports the sample 10 from below according to the height of the sample 10. Each fixing portion 75 includes a hole portion of the upper plate member 71 and a holding screw portion 76 disposed on the lower plate member 72.

  The presser screw part 76 is moved up and down by rotating the presser screw part 76 and meshing action between the male screw on the presser screw part 76 side and the female screw part formed on the lower plate member 72 side. The upper plate member 71 is provided with a through hole having a diameter slightly smaller than the outer diameter of the sample 10, and a counterbore process having a diameter slightly larger than the outer diameter of the sample 10 is performed from the lower surface side of the through hole. A fixing claw portion 78 for fixing the surface to be inspected to the upper plate member 71 with the turret 20 side facing is formed. The fixing claw portion 78 only needs to have a width and thickness that can be fixed to a predetermined position of the upper plate member 71 without the sample 10 being pulled out with respect to the force of pressing the sample 10 from below by the holding screw portion 76. Depending on the shape, the shape and size of the hole are appropriately changed.

  When the sample 10 is fixed to each fixing part 75 of the fixing tool 70, the sample 10 is pressed from the side into the space between the upper plate member 71 and the lower plate member 72 defined by the length of the column member 73. Insert over part 76. Thereafter, the holding screw portion 76 that supports the sample 10 is rotated and raised, whereby the edge of the upper end portion of the sample 10 is brought into contact with the fixing claw portion 78 to fix the sample 10 on the XY stage 12. (See FIG. 4). When the sample 10 is inserted into the space between the upper plate member 71 and the lower plate member 72 from the side surface onto the holding screw portion 76 as in the fixture 70, the fixing portion 75 has two rows and two columns. 4 (2 × 2 = 4) is provided on the fixture 70 without any hindrance to the operator's operation with respect to any holding screw 76. it can. That is, the operator can access each fixing portion 75 from the three surfaces of the front surface, the right side surface, and the left side surface of the fixing tool 70. Further, in the form in which four fixing portions 75 are arranged in two rows and two columns, the four samples 10 are placed in the same field of view by the lowest magnification objective lens (object lens 22 described later) supported by the turret 20. It is also possible to store images.

  The number and arrangement of the fixing portions 75 provided in the fixing tool 70 are not limited to 2 × 2 = 4 shown in this embodiment. That is, any configuration is possible as long as the sample 10 can be mounted from the outside of the fixture 70. For example, the number of the fixing portions 75 in the fixture 70 may be 3 × 2 = 6.

  Further, the XY stage 12 is configured to move in the vertical direction (Z direction) by the action of the lifting mechanism shown in FIG. That is, the support portion 51 that supports the XY stage 12 is supported by the elevating member 52 having a rack 53 formed on the side surface thereof. The rack 53 in the elevating member 52 meshes with a pinion 54 that rotates by driving of the motor 15. For this reason, the XY stage 12 moves up and down by driving the motor 15.

  The hardness tester also supports an eyepiece 16 for visually observing the test piece 100, a camera 17 for photographing the test piece 100, an indenter 21 and objective lenses 23 and 24, and the like. And a turret 20. The turret 20 rotates around an axis that faces the vertical direction by operating the knob 26 or by driving a motor 30 described later. The hardness tester includes a touch panel type liquid crystal display unit 59 that also functions as an input unit and a display unit.

  FIG. 6 is an explanatory diagram showing the arrangement of the objective lenses and the like supported by the turret 20.

  The turret 20 includes indenters 19 and 21 which are pushed into the test piece 100 placed on the XY stage 12, a 2x objective lens 22, a 5x objective lens 23, a 40x objective lens 24 and a 50x objective lens 24. An objective lens 25 is provided. The indenters 19 and 21 and the objective lenses 22, 23, 24, and 25 are arranged on a circle around the rotation center C of the turret 20. Note that the magnification and the number of the objective lenses 22, 23, 24, and 25 are not limited thereto.

  Referring to FIG. 1 again, this material testing machine includes a display unit 55 such as a liquid crystal monitor for displaying an image of the surface of the test piece 100, and a keyboard that functions as an input means for inputting various data. 57, a mouse 58, and a computer 50 including a main body 56. The computer 50 includes a storage device such as a ROM and a RAM and a CPU that executes logical operations in a main body 56.

  FIG. 7 is a schematic diagram of a load mechanism for applying a test force to the indenter 19 and the indenter 21 and an optical system for observing a recess formed in the test piece 100. FIG. 7 shows a cross section at the position indicated by the alternate long and short dash line in FIG.

  The hardness tester includes a load mechanism that applies a test force to the indenters 19 and 21 to push the tips of the indenters 19 and 21 into the test piece 100, and a fixture 70 on the XY stage 12. And an optical system for illuminating the placed test piece 100 and observing the indentation.

  As shown in FIG. 7, the turret 20 has a shaft cylinder 27 connected to a rotating shaft 28 via a bearing 29. The turret 20 can be adjusted in the vertical direction by operating a knob 26 or by driving a motor 30 described later. It rotates about the rotating shaft 28 that faces it. FIG. 7 shows a case where a test force is applied to the indenter 21 through the load transmission shaft 36 by the rotation of the turret 20, that is, a case where the indenter 21 is disposed at a position facing the test piece 100. When a test force is applied to the indenter 19, the indenter 19 is disposed at the position of the indenter 21 shown in FIG.

  The load mechanism includes a lever 32 that can swing around a shaft 31 that faces in the horizontal direction. A hollow pressing portion 35 is disposed at one end of the lever 32. The pressing portion 35 is configured to press a contact portion 37 attached to an end portion of the load transmission shaft 36 connected to the indenter 21 as the lever 32 swings. A permanent magnet 33 is attached to the other end of the lever 32. An electromagnetic coil 34 is disposed outside the permanent magnet 33. The permanent magnet 33 and the electromagnetic coil 34 constitute a voice coil motor. This voice coil motor serves as an electromagnetic load mechanism, and controls the test force applied to the test piece 100 by the indenter 21 disposed at the tip of the load transmission shaft 36 by controlling the current flowing through the electromagnetic coil 34. Is possible.

  In this embodiment, the test force at this time is, for example, 2 kgf, 1 kgf, 0.5 kgf, 0.3 kgf, 0.2 kgf, 0.1 kgf, 0.05 kgf, 0.025 kgf, 0.01 kgf, It can be changed in stages.

  The load transmission shaft 36 is supported by a robust structure in which upper and lower leaf springs 61 are fixed to a shaft cylinder 27 of the turret 20 via a support member 62, and can be moved up and down according to a test force applied by a load mechanism. It has become. A differential transformer type displacement detector 60 for detecting the amount of movement of the load transmission shaft 36 is connected to the load transmission shaft 36. The displacement detector 60 is connected to the shaft cylinder 27 of the turret 20 through a support member 63, and moves in synchronization with the load transmission shaft 36 by the rotation of the turret 20. The displacement detector 60 is used for detecting the surface of the test piece 100. That is, the amount of movement when the indenter 21 is lowered with an extremely small force is always detected, and it is determined that the indenter 21 has come into contact with the surface of the test piece 100 when the movement of the indenter 21 is stopped.

  The optical system includes an LED light source 41, a light tube 42 that guides light from the LED light source 41 in the horizontal direction, and light guided by the light tube 42 to illuminate the sample 10 from above into the hollow portion of the pressing portion 35. A half mirror 43 that guides the reflected light from the surface of the sample 10 to the camera 17 side and a half that divides the reflected light from the surface of the sample 10 that has passed through the half mirror 43 into the eyepiece 16 and the camera 17. And a mirror 44. When the objective lens 22 is disposed at the position of the load transmission shaft 36 in FIG. 4, that is, at the observation position of the depression formed in the test piece 100 held by the sample 10, the objective lens 22 is removed from the surface of the sample 10 and the test piece 100. The reflected light is incident on the eyepiece 16 and the camera 17 through the hollow portion of the pressing portion 35, the objective lens 22, and the half mirrors 43 and 44. Accordingly, an enlarged image of the test piece 100 can be observed with the eyepiece 16, and an enlarged image taken by the camera 17 can be displayed on the display unit 55 in the computer 50. The case where the other objective lenses 23, 24, and 25 are disposed at the observation position of the indentation is the same as the case of using the objective lens 22.

  FIG. 8 is an explanatory view schematically showing how the indenter 21 forms a recess in the test piece 100, and FIG. 9 is a plan view showing the recess formed in the test piece 100.

  Of the indenters 19 and 21, the indenter 21 is for executing a Vickers hardness test as a hardness test, and the tip thereof has a quadrangular pyramid shape. As shown in FIG. 8, the indenter 21 is pushed into the surface of the test piece 100 by a depth h by the action of the load mechanism shown in FIG. Then, the test force is released, and the turret 20 shown in FIG. 1 is rotated to move the objective lens having a desired magnification to a position facing the test piece 100. The diagonal length d [d = (dx + dy) / 2] of the dent is measured from the image of the dent formed on the surface of the test piece 100 obtained through the objective lens and the camera 17 (see FIG. 9). The Vickers hardness is proportional to the value obtained by dividing the test force by the surface area of the indentation assuming that the bottom surface is square and the apex angle is the same pyramid as the indenter 21. Then, the Vickers hardness is calculated from the surface area of the dent and the test force obtained from the diagonal length d (mm: millimeter) of the dent.

  Here, when the test force is F (N: Newton), the Vickers hardness HV is expressed by the following formula (1).

HV = 0.1891 (F / d ² ) (1)
Of the indenters 19 and 21, the other indenter 19 is, for example, a rhombus pyramid indenter used in a Knoop hardness test.

  FIG. 10 is a block diagram showing a main control system of the hardness tester according to the present invention.

  This hardness tester includes a control unit 80 that controls the entire apparatus. The control unit 80 includes the above-described camera 17, liquid crystal display unit 59, LED light source 41, displacement detector 60, electromagnetic coil 34, computer 50, motor 30 for rotating the turret 20, and the XY stage 12 as X, Y, It is connected to motors 13, 14, and 15 for moving in the Z direction. Further, the control unit 80 is connected to a storage unit 81 that stores various information for operating the hardness tester.

  FIG. 11 is a block diagram showing the main functional configuration of the computer 50. As shown in FIG.

  The computer 50 includes in the main body 56 a test position setting unit 85 for setting a test position on the test piece 100 and a storage unit 89 for storing test patterns representing a plurality of set test positions. Further, the test position setting unit 85 selects a desired setting pattern when setting the test position on the test piece 100 using a setting pattern in which a plurality of test positions are patterned according to a predetermined condition. 86, when applying a test pattern previously set by combining a plurality of setting patterns to the test piece 100 to another test piece 100, an image of the test pattern from the storage unit 89 temporarily storing the test pattern Is transferred and transferred onto the image of the test piece 100 and moving means 88 for moving the image of the transferred test pattern so that the directions associated with the shape of the test piece 100 are aligned.

  Next, the test position setting operation when a hardness test is performed using the hardness tester having the above-described configuration will be described. FIG. 12 is a plan view showing a state in which the sample 10 is fixed to each fixing portion 75 of the fixing tool 70. FIG. 13 is a schematic diagram for explaining the setting of the test position. In FIG. 13, only a partial region of the test piece 100 (a gear tip portion to be described later) is extracted and illustrated in a simplified manner. FIG. 14 is a flowchart for explaining the procedure for setting the test position.

  When the test is performed on the test piece 100 having a small size, the sample 10 that is resin-molded by a method that does not affect the hardness of the test piece 100 is fixed to each fixing portion 75 of the fixture 70 so as not to be displaced during the test. Thus, it is placed on the XY stage 12. As shown in FIG. 12, in this embodiment, when the samples 10 each holding a steel test piece 100 having the same shape as a part of a gear are fixed to the fixing portion 75 and the test is continuously performed. The operation for setting the test position will be described.

  First, the turret 20 is rotated, the low-magnification objective lens 22 is moved to a position facing the sample 10, and an image acquired via the objective lens 22 is displayed on the display unit 55, and at the same time by the personal computer 50. The shape of the test piece 100 is read (step S1). In this embodiment, since one specimen 100 having the same shape is held in the sample 10, the shape of the specimen 100 is divided into groups 1 to 4 for each region unit of the fixing portion 75. Divided group recognition is performed (step S2). That is, information on the shape and arrangement of the test piece 100 in the circular area of each sample 10 formed on the upper plate member 71 shown in FIG. For each group 1-4, the circular area of the sample 10 in the upper right of the page is group 2, the circular area of the sample 10 in the lower left of the page is group 3, and the circular area of the sample 10 in the lower right of the page is group 4. Remember me.

  Such group recognition sets a management unit of information such as a plurality of test positions associated with the arrangement and shape of the test piece 100 in the sample 10. In this embodiment, each region of the circular shape of each sample 10 formed on the upper plate member 71, in other words, is grouped for each sample 10 to form one information management unit on the screen of the display unit 55. Of the plurality of test positions shown, a range to be stored as one test pattern is defined in advance. Further, in this embodiment, one group is substantially the entire sample 10, but the group is not limited to the entire sample and may be set as a part of the sample. Note that the test pattern can handle a plurality of test positions shown on the screen of the display unit 55 as one operation target while maintaining the positional relationship between the test positions.

  Next, the operator pushes the indenter 21 into one test piece 100 displayed on the display unit 55 using the keyboard 57 and the mouse 58 to set a test position where the hardness is to be measured. In this embodiment, the sample 10 arranged at the upper left in FIG. 12 is recognized as group 1 (first group), and first, the test position of the test piece 100 of this group 1 is set (step S3). At this time, the image processing function held as a function in the main body 56 of the personal computer 50 is used to enlarge and display the image of the test piece 100 of the sample 10 arranged at the upper left in FIG. In addition, the stage 12 is moved, and the turret 20 is rotated to move the objective lens 23 to a position facing the surface of the test piece 100 of the sample 10 arranged at the upper left in FIG. The acquired image of the surface of the test piece 100 may be displayed on the display unit 55.

  The setting of the test position for the test piece 100 of group 1 is executed according to the following procedure. FIG. 13A shows a state in which a test position is set in a partial region of the test piece 100 of group 1. The gears are quenched to ensure wear resistance of the tooth surfaces meshing with each other. Test conditions such as the test position and the test force corresponding to the test position vary depending on the position in the test piece 100 according to the hardened layer depth by quenching. Therefore, a setting pattern in which a plurality of test positions is patterned is stored in advance in a storage device (for example, ROM) of the personal computer 50 or the storage unit 81 connected to the control unit 80. A plurality of test positions can be set on the test piece 100 by the operator selecting a desired setting pattern via the input means. A plurality of setting patterns are prepared in accordance with the material and shape of the test piece 100, and application of the setting pattern to the test piece 100 receives an input of a selection signal using an operator's mouse 58 or the like for the desired setting pattern. Thus, it is realized by executing a program that sets a position that satisfies the conditions defined in the test standard, such as the distance from the edge of the test piece 100 and the distance between the center of the indentations, as the test position.

  In FIG. 13 (a), a setting pattern for setting a plurality of test positions along the outer edge (edge) of the test piece 100 in order to measure the hardness of the cured layer, as indicated by white circles, An example is shown in which a setting pattern for setting a plurality of test positions in a direction perpendicular to the outer edge (edge) of the test piece 100 is applied in order to measure the hardness of the test piece 100 that has not been quenched. . Note that after applying the setting pattern, it is possible to delete and / or add test positions one by one, for example, by the operator specifying the position on the image displayed on the display unit 55 with the mouse 58. Thereafter, all the test positions set in the test piece 100 of group 1 are stored in the storage unit 89 in the main body 56 of the personal computer 50 as a test pattern of group 1 (step S4).

  Conventionally, in the case where a plurality of test pieces 100 on which the plurality of test pieces 100 are placed on the XY stage 12 are continuously tested, an operation for applying a setting pattern to each test piece 100 or an operator's display is performed. The operation of designating the position on the image displayed on the section 55 with the mouse 58 has been repeatedly performed for all the test pieces 100.

  On the other hand, in the material testing machine to which the present invention is applied, all test positions set by applying a plurality of different setting patterns to one test piece 100 are stored as test patterns in the main body 56 of the personal computer 50. Store in the unit 89. And when setting the test position of the other test piece 100, the stored test pattern is read and applied, so that the test position can be set to the other test piece 100 at a time. In this embodiment, the test pattern of group 1 is applied to other groups 2 to 4 to shorten the time required for setting the test position for the test pieces 100 of groups 2 to 4.

  FIGS. 13B and 13C show a state in which a test pattern at a test position set on one test piece 100 is applied to another test piece 100. As shown in FIG. 12, even if a test is performed on a plurality of test pieces 100 having the same shape, not all the test pieces 100 are held at the same position of the sample 10 when resin molding is performed. Even when the sample 10 is fixed to 75, the direction of the shape of the test piece 100 cannot be the same for all the samples 10. For this reason, as shown in FIG. 13 (b), after copying the test pattern of FIG. 13 (a), it is rotated with respect to the direction of the shape of the test piece 100 as shown in FIG. 13 (c). Thus, each test position is set at a desired position.

  As described above, the test patterns, which are information on the plurality of test positions set on the test piece 100 of the group 1, are read from the storage unit 89 and transferred onto the image of the sample 10 of the group 2 (step S6). Then, the test pattern copied in accordance with the position and orientation of the test piece 100 in the circular region of the sample 10 of the group 2 is moved up and down, left and right (XY direction in the image plane displayed on the display unit 55) and / Or rotate (step S7). As a result, a plurality of test positions are collectively set on the test piece 100 of group 2. Then, the coordinates of each test position converted by moving the test pattern of group 1 are stored in the storage unit 89 in the main body 56 of the computer 50 as the test position set in group 2 (step S8). Further, the coordinates of the plurality of test positions are converted into a coordinate system associated with the movement of the XY stage in the group 2, stored in the storage unit 81 via the control unit 80, and later when the test is executed. This is used to calculate the movement amount of the XY stage 12.

  Similarly, for the test pieces 100 of group 3 and group 4, a plurality of test positions are collectively set by transferring and moving an image of the test pattern of group 1 onto an image of another group. That is, when setting a test position for another group to which the test pattern of group 1 as the first group can be applied (step S5), steps S6 to S8 described above are repeated. When the application of the test pattern to all the groups is finished, the setting of the test position on the other test piece 100 using the previous test pattern is finished.

  In the above-described embodiment, the test piece 100 held by the sample 10 is described as having the same shape. However, in the present invention, the test position is set to the test piece 100. It is not something. That is, if at least a part of each test piece 100 has the same shape, a plurality of test positions can be easily set using the test pattern described with reference to FIG. is there. That is, a plurality of test positions previously set for the same shape portion may be stored as a test pattern and applied to the same shape portion of another test piece 100. In this case, the mutual positional relationship of a plurality of test positions in the area on the screen of the display unit 55 defined by the operator using the mouse 58 or the like is fixed to be one operation target (object). And stored as a test pattern. Therefore, as shown in FIG. 13, the image of the test pattern moves while maintaining the positional relationship between the individual test positions.

  In the above-described embodiment, an example in which the sample 10 holding the test piece 100 having the same shape is fixed to the four fixing portions 75 is shown. However, the sample 10 holding the test piece 100 having the same shape is at least If two pieces are arranged on the fixture 70, the test position setting time can be shortened compared to the conventional case by applying the test pattern of the group set and stored in advance to other groups. For example, when two types of two samples 10 holding test pieces 100 having different shapes are arranged in four fixing portions 75, the procedure of steps S1 to S8 described with reference to FIG. What is necessary is just to perform every 10 types.

  When the setting of all the test positions of all the test pieces 100 placed on the XY stage 12 is completed, the tests are sequentially performed on all the test pieces 100. At this time, the control unit 80 drives the motor 30 to rotate the turret 20 to place the indenter 21 so as to face the surface of the test piece 100 and also to drive the motor 13 and the motor 14 to set the test position and the indenter. The XY stage 12 is moved so that the axis of the load shaft 21 coincides. When the movement of the XY stage 12 is completed, the controller 80 presses the indenter 21 against the surface of the test piece 100 with a predetermined test force by controlling the load mechanism.

  When the formation of the depression on the surface of the test piece 100 is finished, the control unit 80 drives the motor 30 in order to switch the field of view of the image displayed on the display unit 55 to a field of view suitable for the measurement of the depression. Then, the objective lens 24 is moved to a position facing the surface of the test piece 100 by rotating the turret 20. As shown in FIG. 9, the control unit 80 measures the diagonal length d of the indentation using the image obtained via the objective lens 24, and calculates the Vickers hardness.

  As described above, in the hardness tester according to the present invention, when a plurality of test positions are set on a plurality of test pieces 100 having at least a part of the same shape and a test is continuously performed, When a plurality of test positions set in a shape portion common to the other test pieces 100 are stored as test patterns and the test positions are set in the other test pieces 100, the test patterns are read and applied. The operation of setting a plurality of test positions for a plurality of test pieces 100 is facilitated. For this reason, in the hardness tester according to the present invention, it is not necessary to spend a lot of time for setting the test position, and from the setting of the test position to the start of the test when testing a plurality of test pieces 100. Time can be greatly reduced.

DESCRIPTION OF SYMBOLS 10 Sample 11 Table 12 XY stage 13 Motor 14 Motor 15 Motor 16 Eyepiece 17 Camera 18 Display part 19 Indenter 20 Turret 21 Indenter 22 Objective lens 23 Objective lens 24 Objective lens 25 Objective lens 26 Knob 27 Shaft cylinder 28 Rotating shaft 29 Bearing 30 Motor 31 shaft 32 lever 33 permanent magnet 34 electromagnetic coil 35 pressing portion 36 load transmission shaft 38 screw 41 LED light source 42 light tube 43 half mirror 44 half mirror 50 computer 53 rack 54 pinion 55 display portion 56 main body 57 keyboard 58 mouse 59 liquid crystal display Unit 60 Displacement detector 61 Plate spring 62 Support member 63 Support member 70 Fixing tool 71 Upper plate member 72 Lower plate member 73 Column member 74 Bolt hole 75 Fixing portion 76 Holding screw portion 78 Fixing Claw part 85 Test position setting means 86 Setting pattern selection means 87 Transfer means 88 Moving means 89 Storage part 100 Test piece

Claims (4)

A hardness tester for continuously testing a plurality of test pieces,
An XY stage in which a fixture having a plurality of sample fixing portions each holding one or more test pieces is provided, and the sample fixed to the fixture is moved in the XY direction;
An elevating mechanism for moving the XY stage in the Z direction;
An indenter for forming a depression on the surface of the test piece;
A load mechanism for applying a test force to the indenter by pressing the indenter against the surface of each test piece at a test position;
A plurality of objective lenses for observing the shape of the test piece in the sample and the depression formed on the surface of the test piece;
A switching member that supports the indenter and the objective lens, and moves either the indenter or the objective lens to a position facing the sample;
A display unit for displaying an image acquired through the objective lens;
Test position setting means for setting a plurality of test positions on the test piece;
With
A storage unit for storing a plurality of test positions set by the test position setting means as a test pattern;
When the plurality of test pieces in the sample placed on the stage have the same shape at least in part, the test position setting means stores a test pattern previously set for the same shape portion in the storage unit The hardness tester is characterized in that the test position is set by reading from the test piece and applying it to the same shape part of another test piece. The hardness tester according to claim 1,
The test position setting means recognizes the sample for each position fixed to the fixing tool, stores a test pattern that is a plurality of test positions set in the first sample in the storage unit, and the like. A hardness tester that sets the test position by applying the test pattern set to the first sample read from the storage unit to the sample. In the hardness tester according to claim 1 or 2,
The test position setting means includes
A test pattern transfer means for transferring an image of a test pattern read from the storage unit onto an image of a sample displayed on the display unit;
The test pattern transferred by the transfer means and displayed superimposed on the sample image displayed on the display unit is rotated and / or moved vertically and horizontally so that the direction associated with the shape of the test piece is aligned. Transportation means;
Hardness tester equipped with. In the hardness tester according to any one of claims 1 to 3,
A hardness tester in which the fixing device is provided with four fixing portions in two rows and two columns.

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