JP2015054812A - Burning tool and method for producing the same - Google Patents

Burning tool and method for producing the same Download PDF

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JP2015054812A
JP2015054812A JP2013191169A JP2013191169A JP2015054812A JP 2015054812 A JP2015054812 A JP 2015054812A JP 2013191169 A JP2013191169 A JP 2013191169A JP 2013191169 A JP2013191169 A JP 2013191169A JP 2015054812 A JP2015054812 A JP 2015054812A
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film
fired
firing
firing jig
film part
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JP5995809B2 (en
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峻 有馬
Shun Arima
峻 有馬
打田 龍彦
Tatsuhiko Uchida
龍彦 打田
中島 邦彦
Kunihiko Nakajima
邦彦 中島
敬高 齊藤
Noritaka Saito
敬高 齊藤
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Mitsui Mining and Smelting Co Ltd
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Mitsui Mining and Smelting Co Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a burning tool that can prevent adhesion of a burned object in burning by lowering wettability in a membrane part formed so as to cover a substrate part, and a method for producing the burning tool.SOLUTION: The burning tool according to an aspect of an embodiment is configured to comprise the substrate part and the membrane part. The substrate part has a placing surface on which a burned object is placed. The membrane part covers the placing surface of the substrate part and is configured to include a rare earth oxide.

Description

開示の実施形態は、焼成治具および焼成治具の製造方法に関する。   The embodiment of the disclosure relates to a firing jig and a method for manufacturing the firing jig.

従来、例えば積層セラミックコンデンサなどの電子部品を製造する過程には、電子部品を焼成する工程が含まれる。かかる焼成工程では、被焼成物である電子部品を焼成治具に載せて、窯炉内で焼成するようにしている。   Conventionally, a process of manufacturing an electronic component such as a multilayer ceramic capacitor includes a step of firing the electronic component. In such a firing process, an electronic component that is an object to be fired is placed on a firing jig and fired in a kiln.

上記した焼成治具においては、焼成時に被焼成物と反応してしまうのを防止するため、難反応性の膜部で被覆し、膜部の上に被焼成物を載せるようにした技術が提案されている(例えば特許文献1参照)。   In the firing jig described above, in order to prevent reaction with the object to be fired during firing, a technique has been proposed in which the object to be fired is placed on the film part and covered with a hardly reactive film part. (For example, refer to Patent Document 1).

特開平11−263671号公報JP-A-11-263671

しかしながら、上記した電子部品にあっては、焼成時、例えば電子部品の外部電極に含まれるガラス成分が溶融し、溶融したガラス成分が電子部品と焼成治具との間に侵入することがある。   However, in the above-described electronic component, at the time of firing, for example, a glass component contained in an external electrode of the electronic component may be melted, and the melted glass component may enter between the electronic component and the firing jig.

このような場合、膜部の濡れ性が比較的高いと、ガラス成分が膜部の上に広がり、被焼成物と焼成治具の膜部とを付着させてしまうことがある。上記した付着が生じると、焼成後に被焼成物を焼成治具から降ろす際、膜部が被焼成物側にくっ付いて、焼成治具から剥離してしまうおそれがあった。   In such a case, if the wettability of the film part is relatively high, the glass component may spread on the film part and cause the object to be fired and the film part of the firing jig to adhere. When the above-described adhesion occurs, when the object to be fired is lowered from the firing jig after firing, the film part may stick to the object to be fired and peel from the firing jig.

実施形態の一態様は、上記に鑑みてなされたものであって、膜部の濡れ性を低下させることで、焼成時に被焼成物と付着し難くすることができる焼成治具および焼成治具の製造方法を提供することを目的とする。   One aspect of the embodiment has been made in view of the above, and is a firing jig and a firing jig that can be made difficult to adhere to a fired object during firing by reducing the wettability of the film part. An object is to provide a manufacturing method.

実施形態の一態様に係る焼成治具は、基材部と、膜部とを備える。基材部は、被焼成物が載置される載置面を有する。膜部は、前記基材部の前記載置面を被覆するとともに、希土類酸化物を含む。   A firing jig according to an aspect of the embodiment includes a base material portion and a film portion. The base material portion has a placement surface on which the object to be fired is placed. The film part covers the mounting surface of the base part and includes a rare earth oxide.

実施形態の一態様によれば、膜部の濡れ性を低下させることで、焼成時に被焼成物と付着し難くすることができる。   According to one aspect of the embodiment, by reducing the wettability of the film part, it is possible to make it difficult to adhere to an object to be fired during firing.

図1は、実施形態に係る焼成治具を示す模式斜視図である。FIG. 1 is a schematic perspective view showing a firing jig according to the embodiment. 図2Aは、図1に示すセッターおよび被焼成物の模式正面図である。FIG. 2A is a schematic front view of the setter and the object to be fired shown in FIG. 図2Bは、図2Aに示すセッターおよび被焼成物の模式平面図である。FIG. 2B is a schematic plan view of the setter and the object to be fired shown in FIG. 2A. 図3は、図2BのIII−III線拡大模式断面図である。FIG. 3 is an enlarged schematic cross-sectional view taken along line III-III in FIG. 2B. 図4は、膜部を基材部に形成する処理手順を示すフローチャートである。FIG. 4 is a flowchart showing a processing procedure for forming the film part on the base material part. 図5は、実施形態に係る焼成治具のセッターの変形例を示す、セッターの模式平面図である。FIG. 5 is a schematic plan view of a setter showing a modification of the setter of the firing jig according to the embodiment. 図6は、実施形態に係る焼成治具のセッターのさらなる変形例を示す、セッターの模式平面図である。FIG. 6 is a schematic plan view of a setter showing a further modification of the setter of the firing jig according to the embodiment.

以下、添付図面を参照して、本願の開示する焼成治具および焼成治具の製造方法の実施形態を詳細に説明する。なお、以下に示す実施形態によりこの発明が限定されるものではない。   Hereinafter, embodiments of a firing jig and a method of manufacturing a firing jig disclosed in the present application will be described in detail with reference to the accompanying drawings. In addition, this invention is not limited by embodiment shown below.

図1は、実施形態に係る焼成治具を示す模式斜視図である。なお、以下においては、説明を分かり易くするために、互いに直交するX軸方向、Y軸方向およびZ軸方向を規定し、Z軸正方向を鉛直上向き方向とする。   FIG. 1 is a schematic perspective view showing a firing jig according to the embodiment. In the following description, for easy understanding, an X-axis direction, a Y-axis direction, and a Z-axis direction that are orthogonal to each other are defined, and the positive Z-axis direction is defined as a vertically upward direction.

図1に示すように、焼成治具1は、基台10と、セッター20とを備える(いずれも後述)。そして、焼成治具1のセッター20の上には、被焼成物30が載置されている。   As shown in FIG. 1, the firing jig 1 includes a base 10 and a setter 20 (both will be described later). Then, the object to be fired 30 is placed on the setter 20 of the firing jig 1.

被焼成物30は、例えば積層セラミックコンデンサなどの電子部品である。すなわち、上記した焼成治具1は、電子部品用の焼成治具である。なお、上記では、被焼成物30を積層セラミックコンデンサとしたが、これは例示であって限定されるものではない。すなわち、被焼成物30は、例えばチップインダクタや半導体基板など、焼成が行われる電子部品であればどのような種類のものであってもよい。   The object to be fired 30 is an electronic component such as a multilayer ceramic capacitor. That is, the above-described firing jig 1 is a firing jig for electronic parts. In addition, although the to-be-fired material 30 was made into the multilayer ceramic capacitor in the above, this is an illustration and is not limited. That is, the object to be fired 30 may be of any type as long as it is an electronic component to be fired, such as a chip inductor or a semiconductor substrate.

焼成治具1は、セッター20に被焼成物30が載置された状態で、図示しない窯炉内に配置され、被焼成物30を焼成する焼成工程が行われる。   The firing jig 1 is placed in a kiln (not shown) in a state where the firing object 30 is placed on the setter 20, and a firing process for firing the firing object 30 is performed.

ところで、焼成治具においては、例えば被焼成物が載せられるセッターを難反応性の膜部で被覆することで、焼成時に被焼成物と反応するのを防止するようにしている。しかしながら、被焼成物たる電子部品にあっては、焼成時、例えば電子部品の外部電極に含まれるガラス成分が溶融し、溶融したガラス成分が電子部品と焼成治具との間に侵入することがある。このような場合、膜部の濡れ性が比較的高いと、ガラス成分が膜部の上に広がり、被焼成物と焼成治具の膜部とを付着させてしまうことがあった。   By the way, in the firing jig, for example, a setter on which the material to be fired is covered with a non-reactive film part to prevent reaction with the material to be fired during firing. However, in an electronic component that is an object to be fired, during firing, for example, a glass component contained in an external electrode of the electronic component may melt, and the melted glass component may enter between the electronic component and the firing jig. is there. In such a case, if the wettability of the film part is relatively high, the glass component spreads on the film part, and the object to be fired and the film part of the firing jig may adhere to each other.

そこで、本実施形態に係る焼成治具1にあっては、膜部の濡れ性を低下させることで、焼成時に被焼成物30と付着し難くすることができる構成とした。以下、その焼成治具1について詳しく説明する。   Therefore, the firing jig 1 according to the present embodiment has a configuration in which the wettability of the film portion is reduced so that it is difficult to adhere to the firing object 30 during firing. Hereinafter, the firing jig 1 will be described in detail.

焼成治具1の基台10は、プレート部11と、支持部12とを備える。プレート部11は、上面にセッター20を載せることが可能な形状、具体的に例えば略平板状で、かつ平面視略矩形状とされる。   The base 10 of the firing jig 1 includes a plate portion 11 and a support portion 12. The plate portion 11 has a shape capable of placing the setter 20 on the upper surface, specifically, for example, a substantially flat plate shape and a substantially rectangular shape in plan view.

支持部12は、複数個(例えば4個。図1では1個見えず)あり、プレート部11の下面側の適宜位置に形成される。具体的に支持部12は、プレート部11の下面の四隅部分からZ軸の負方向に向けて突出するように形成され、プレート部11を支持する。   There are a plurality of support parts 12 (for example, four, one is not visible in FIG. 1), and they are formed at appropriate positions on the lower surface side of the plate part 11. Specifically, the support part 12 is formed so as to protrude in the negative direction of the Z axis from the four corners of the lower surface of the plate part 11, and supports the plate part 11.

上記のように構成されたプレート部11および支持部12は、耐火物で一体成型される。具体的には、粉状または粘土状の耐火物を図示しない金型に流し込んで加圧する、いわゆるプレス成型によって、プレート部11および支持部12が一体に形成された基台10が完成する。耐火物は、例えばアルミナ、ムライト、ジルコニア等であり、比較的高温(例えば1500℃以上)に耐えることが可能で、かつ通気性を有する素材とされる。   The plate part 11 and the support part 12 configured as described above are integrally formed of a refractory material. Specifically, the base 10 in which the plate portion 11 and the support portion 12 are integrally formed is completed by so-called press molding in which a powdery or clay-like refractory is poured into a mold (not shown) and pressed. The refractory is, for example, alumina, mullite, zirconia, or the like, and is a material that can withstand relatively high temperatures (for example, 1500 ° C. or more) and has air permeability.

なお、基台10は、図1に示す形状に限定されるものではない。すなわち、基台10は、例えばさや(匣鉢)やラックなどであってもよく、要はセッター20を載せることが可能な形状であればよい。さらに、基台10とセッター20とは、別体である必要はなく、一体化するように構成してもよい。   The base 10 is not limited to the shape shown in FIG. That is, the base 10 may be, for example, a sheath (a mortar) or a rack, and may be any shape as long as the setter 20 can be placed thereon. Furthermore, the base 10 and the setter 20 do not need to be separate bodies, and may be configured to be integrated.

図2Aは、図1に示すセッター20および被焼成物30を、Y軸の負側から見たときの模式正面図であり、図2Bは、図2Aに示すセッター20および被焼成物30の模式平面図である。   2A is a schematic front view of the setter 20 and the object to be fired 30 shown in FIG. 1 when viewed from the negative side of the Y axis, and FIG. 2B is a pattern of the setter 20 and the object to be fired 30 shown in FIG. 2A. It is a top view.

図2Aに示すように、セッター20は、基材部21と、膜部22とを備える。なお、図2Aにおいては、理解の便宜のため、膜部22をZ軸方向に誇張して模式的に示した。また、図2Bでは、基材部21において膜部22が形成される部位を斜線で示した。   As shown in FIG. 2A, the setter 20 includes a base material part 21 and a film part 22. In FIG. 2A, for convenience of understanding, the film portion 22 is schematically shown exaggerated in the Z-axis direction. Moreover, in FIG. 2B, the site | part in which the film | membrane part 22 is formed in the base material part 21 was shown with the oblique line.

基材部21は、図2A,2Bによく示すように、平面視において略矩形状に形成されるとともに、Z軸方向における厚さが比較的薄い、薄板状とされる。このように、基材部21が薄板状とされることで、基材部21、ひいては焼成治具1自体を軽量化させることができる。   As shown well in FIGS. 2A and 2B, the base material portion 21 is formed in a substantially rectangular shape in plan view, and has a thin plate shape with a relatively small thickness in the Z-axis direction. Thus, the base material part 21 and the baking jig | tool 1 itself can be reduced in weight because the base material part 21 is made into thin plate shape.

基材部21は、基台10と同様、耐火物をプレス成型することによって製作される。基材部21用の耐火物としては、基台10と同じく、例えばアルミナ、ムライト、ジルコニア等が用いられ、比較的高温(例えば1500℃以上)に耐えることが可能で、かつ通気性を有する素材とされる。   The base material part 21 is manufactured by press-molding a refractory like the base 10. As the refractory for the base material portion 21, for example, alumina, mullite, zirconia, etc. are used as in the base 10, and can withstand relatively high temperatures (for example, 1500 ° C. or higher) and have air permeability. It is said.

このように、基台10のプレート部11およびセッター20の基材部21を、通気性を有する耐火材で製作することで、焼成工程において、窯炉内の熱風が基台10およびセッター20を通って被焼成物30の下面側にも到達する。これにより、被焼成物30の焼成を効率良く行うことができる。また、基台10およびセッター20が通気性を有することで、脱バインダーのときに、被焼成物30からバインダーを効率良く除去することができる。   Thus, the plate part 11 of the base 10 and the base material part 21 of the setter 20 are manufactured with a fire-resistant material having air permeability, so that the hot air in the kiln causes the base 10 and the setter 20 to flow in the firing step. It also reaches the lower surface side of the object to be fired 30. Thereby, baking of the to-be-fired material 30 can be performed efficiently. In addition, since the base 10 and the setter 20 have air permeability, the binder can be efficiently removed from the object to be fired 30 when the binder is removed.

上記の如く構成された基材部21にあっては、Z軸方向における上面21aに、被焼成物30が載置される。以下、基材部21において、被焼成物30が載置される上面21aを「載置面21a」という。   In the base material portion 21 configured as described above, the object to be fired 30 is placed on the upper surface 21a in the Z-axis direction. Hereinafter, in the base material portion 21, the upper surface 21 a on which the object to be fired 30 is placed is referred to as “placement surface 21 a”.

膜部22は、基材部21の載置面21aの全面を被覆するように形成され、Z軸方向の厚さが例えば50〜500μmとされる。具体的に例えば、膜部の厚さが50μm未満で比較的薄いと、濡れ性に及ぼす影響が十分ではなく、逆に500μmよりも厚いと、膜内での亀裂や膜部の基材部に対する剥離が生じるおそれがある。以上の理由から、膜部22の厚さは、上記した50〜500μmが好ましい。   The film part 22 is formed so as to cover the entire surface of the mounting surface 21a of the base part 21, and the thickness in the Z-axis direction is, for example, 50 to 500 μm. Specifically, for example, if the thickness of the film portion is less than 50 μm and is relatively thin, the effect on wettability is not sufficient, and conversely if it is thicker than 500 μm, it is against cracks in the film and the substrate portion of the film portion. Peeling may occur. For the above reasons, the thickness of the film part 22 is preferably 50 to 500 μm as described above.

また、膜部22は、被焼成物30と接する接触面22aが平滑化されている。具体的に膜部22は、接触面22aの表面粗さRaが例えば5μm未満とされる。膜部22の接触面22aを、上記の如く表面粗さRaが5μm未満の平滑な面とすることで、膜部22の濡れ性が低下し、よって焼成時に被焼成物30と焼成治具1のセッター20とを付着し難くすることができる。なお、表面粗さRaは、JIS B0601:2013に記載された「算術平均粗さRa」として測定される値である。   Further, the film portion 22 has a smooth contact surface 22 a that contacts the object to be fired 30. Specifically, the film portion 22 has a surface roughness Ra of the contact surface 22a of, for example, less than 5 μm. By making the contact surface 22a of the film portion 22 a smooth surface having a surface roughness Ra of less than 5 μm as described above, the wettability of the film portion 22 is lowered, and thus the object to be fired 30 and the firing jig 1 are fired during firing. The setter 20 can be made difficult to adhere. The surface roughness Ra is a value measured as “arithmetic average roughness Ra” described in JIS B0601: 2013.

これについて、図3を参照しつつ説明する。図3は、図2BのIII−III線拡大模式断面図である。なお、セッター20の膜部22と被焼成物30との離間距離は数μm程度の極小であるが、理解し易くするため、図3においては、セッター20と被焼成物30との間隔をZ軸方向に誇張して模式的に示した。また、後述する被焼成物30から溶融するガラス成分Gについても模式的に示した。   This will be described with reference to FIG. FIG. 3 is an enlarged schematic cross-sectional view taken along line III-III in FIG. 2B. In addition, although the separation distance between the film part 22 of the setter 20 and the object to be fired 30 is a minimum of about several μm, in FIG. 3, the distance between the setter 20 and the object to be fired 30 is Z It is schematically shown exaggerated in the axial direction. In addition, a glass component G that melts from an object to be fired 30 described later is also schematically shown.

先ず被焼成物30について説明すると、被焼成物30は、上述したように積層セラミックコンデンサであり、セラミック誘電体層31と、内部電極層32と、外部電極33とを備える。セラミック誘電体層31および内部電極層32は、交互に積層されるように配置されてコンデンサ素子本体を構成する。   First, the firing object 30 will be described. The firing object 30 is a multilayer ceramic capacitor as described above, and includes a ceramic dielectric layer 31, an internal electrode layer 32, and an external electrode 33. The ceramic dielectric layers 31 and the internal electrode layers 32 are arranged so as to be alternately stacked to constitute a capacitor element body.

外部電極33は、コンデンサ素子本体のX軸方向における両側面に配置される(図3では、両側面の外部電極33のうち、一方のみを示す)。そして、外部電極33は、内部電極層32と電気的に接続されて、コンデンサ回路が構成されることとなる。   The external electrodes 33 are arranged on both side surfaces in the X-axis direction of the capacitor element body (in FIG. 3, only one of the external electrodes 33 on both side surfaces is shown). The external electrode 33 is electrically connected to the internal electrode layer 32 to form a capacitor circuit.

上記した外部電極33は、AgとPdとを含む合金またはCu,Niなどの金属成分と、カルシア(CaO)やシリカ(SiO)、アルミナ(Al)、酸化亜鉛(ZnO)、酸化ホウ素(B)などのガラス成分とを含んでいる。そのため、被焼成物30は、焼結工程時に加熱されると、外部電極33のガラス成分が溶融し、そのガラス成分が外部電極33の表面に現れ、被焼成物30とセッター20との間に侵入する。なお、図3においては、外部電極33から溶融したガラス成分を符号Gで示している。 The external electrode 33 includes an alloy containing Ag and Pd or a metal component such as Cu and Ni, calcia (CaO), silica (SiO 2 ), alumina (Al 2 O 3 ), zinc oxide (ZnO), oxide And glass components such as boron (B 2 O 3 ). Therefore, when the object to be fired 30 is heated during the sintering process, the glass component of the external electrode 33 is melted, and the glass component appears on the surface of the external electrode 33, so that the object to be fired 30 and the setter 20 are interposed. invade. In FIG. 3, the glass component melted from the external electrode 33 is indicated by a symbol G.

ここで、膜部22は、上記したように、接触面22aの表面粗さRaが例えば5μm未満となるように平滑化されることから、膜部22の濡れ性が低下し、よってガラス成分Gは、図3に示す如く略球体状になり、膜部22との接触面積が減少する、言い換えれば、膜部22と点接触する。ガラス成分Gと膜部22との接触面積が減少することで、焼成時に被焼成物30とセッター20の膜部22とを付着し難くすることができる。   Here, as described above, since the film portion 22 is smoothed so that the surface roughness Ra of the contact surface 22a is less than 5 μm, for example, the wettability of the film portion 22 is reduced, and thus the glass component G 3 has a substantially spherical shape as shown in FIG. 3, and the contact area with the film part 22 decreases, in other words, the film part 22 makes point contact. By reducing the contact area between the glass component G and the film part 22, it is possible to make it difficult to adhere the article 30 to be fired and the film part 22 of the setter 20 during firing.

なお、膜部22において、表面粗さRaが例えば5μm以上で平滑化されない場合、膜部22の濡れ性が比較的高くなる。したがって、ガラス成分Gは、図3に想像線で示すように、膜部22の接触面22a上に広がり、膜部22との接触面積が増大することとなる、言い換えれば、膜部22と面接触することとなる。接触面積が増大すると、被焼成物30と膜部22とが付着し易くなり、結果として焼成後に被焼成物30を焼成治具1から降ろす際、膜部22が被焼成物30側にくっ付いて、焼成治具1から剥離してしまう。   In addition, in the film | membrane part 22, when surface roughness Ra is 5 micrometers or more, for example, the wettability of the film | membrane part 22 becomes comparatively high. Therefore, as shown by an imaginary line in FIG. 3, the glass component G spreads on the contact surface 22a of the film part 22 and increases the contact area with the film part 22, in other words, the film part 22 and the surface. It will come into contact. When the contact area increases, the object 30 and the film part 22 are likely to adhere to each other. As a result, when the object 30 is lowered from the baking jig 1 after baking, the film part 22 sticks to the object 30 side. And peeled off from the firing jig 1.

本実施形態に係る焼成治具1にあっては、上記したように、焼成時に被焼成物30と膜部22とを付着し難くしたことから、膜部22が被焼成物30側にくっ付いて、焼成治具1から剥離することもない。   In the firing jig 1 according to the present embodiment, as described above, since the object to be fired 30 and the film part 22 are difficult to adhere at the time of firing, the film part 22 sticks to the object to be fired 30 side. Thus, it does not peel off from the firing jig 1.

膜部22の説明を続けると、膜部22は、希土類酸化物を含むように構成される。膜部22に含まれる希土類酸化物としては、例えば酸化イットリウム(Y)を用いることができる。 Continuing the description of the film part 22, the film part 22 is configured to include a rare earth oxide. As the rare earth oxide contained in the film part 22, for example, yttrium oxide (Y 2 O 3 ) can be used.

希土類酸化物は、化学的に安定しているため、ガラス成分Gに対して溶解度が小さく、焼成時に被焼成物30と反応し難い、いわゆる難反応性を有する。したがって、膜部22が希土類酸化物を含むように構成することで、焼成時に膜部22が被焼成物30と反応し難くすることができる。また、膜部22にあっては、ガラス成分Gに対する溶解度が小さいことから、ガラス成分Gと濡れ難くすることができる。   Since the rare earth oxide is chemically stable, it has a low solubility with respect to the glass component G, and is difficult to react with the material to be fired 30 during firing, so-called hardly reactive. Therefore, by configuring the film part 22 to include a rare earth oxide, the film part 22 can be made difficult to react with the object to be fired 30 during firing. Moreover, in the film | membrane part 22, since the solubility with respect to the glass component G is small, it can make it difficult to get wet with the glass component G. FIG.

なお、上記では、希土類酸化物として酸化イットリウムを挙げたが、これは例示であって限定されるものではなく、例えば酸化ランタン(La)、酸化セリウム(CeO)、酸化ネオジウム(Nd)、酸化イッテルビウム(Yb)、酸化ルテチウム(Lu)、酸化サマリウム(Sm)など、その他の希土類元素の酸化物であってもよい。 In the above description, yttrium oxide is used as the rare earth oxide. However, this is merely an example and is not limited. For example, lanthanum oxide (La 2 O 3 ), cerium oxide (CeO 2 ), neodymium oxide (Nd) 2 O 3 ), ytterbium oxide (Yb 2 O 3 ), lutetium oxide (Lu 2 O 3 ), samarium oxide (Sm 2 O 3 ), and other rare earth element oxides.

また、膜部22は、上記した希土類酸化物の含有量が10重量%以上であり、好ましくは30重量%以上、より好ましくは100重量%とされる。なお、膜部22においては、希土類酸化物の含有量が10重量%以上で100重量%未満の場合、希土類酸化物以外に、ジルコニア(ZrO)が含まれることとなる。 The film portion 22 has a rare earth oxide content of 10% by weight or more, preferably 30% by weight or more, and more preferably 100% by weight. In the film part 22, when the rare earth oxide content is 10 wt% or more and less than 100 wt%, zirconia (ZrO 2 ) is included in addition to the rare earth oxide.

希土類酸化物は比較的高価な素材であるが、膜部22においては、希土類酸化物の含有量を例えば10重量%とすれば、コストを抑えつつ、被焼成物30と反応し難い性質を有するように構成することができる。   Although the rare earth oxide is a relatively expensive material, the film portion 22 has a property that, when the content of the rare earth oxide is, for example, 10% by weight, it is difficult to react with the object to be fired 30 while suppressing cost. It can be constituted as follows.

また、膜部22においては、希土類酸化物の含有量を10重量%から増加するように構成してもよく、その場合、含有量の増加に伴って被焼成物30との難反応性を向上させることができる。すなわち、膜部22における希土類酸化物の含有量を例えば30重量%以上とすれば、コストを抑制しながらも膜部22の難反応性を向上させることができ、さらに、希土類酸化物の含有量を例えば100重量%とすれば、膜部22の難反応性をより一層向上させることができる。   In addition, the film part 22 may be configured so that the content of the rare earth oxide is increased from 10% by weight. In this case, the difficulty of reacting with the object to be fired 30 is improved as the content increases. Can be made. That is, if the content of the rare earth oxide in the film part 22 is, for example, 30% by weight or more, it is possible to improve the difficult reactivity of the film part 22 while suppressing the cost. If, for example, 100% by weight, the difficulty of the film part 22 can be further improved.

なお、図示は省略するが、希土類酸化物の含有量が例えば10重量%の膜部の上に、希土類酸化物の含有量が例えば100重量%の膜部を薄く形成して、多層の膜部にしてもよく、この場合は、コストの抑制と難反応性の向上とを両立させることができる。   Although not shown in the drawing, a multilayered film part is formed by thinly forming a film part having a rare earth oxide content of, for example, 100% by weight on a film part having a rare earth oxide content of, for example, 10% by weight. In this case, it is possible to achieve both cost reduction and poor reactivity improvement.

また、膜部22は、気孔率が17%以上の多孔質となるように形成され、より詳しくは気孔率が17%以上で、かつ40%以下、より好ましくは気孔率が20%以上で、かつ30%以下の多孔質となるように形成される。   The membrane portion 22 is formed so as to be porous with a porosity of 17% or more, more specifically, the porosity is 17% or more and 40% or less, more preferably the porosity is 20% or more. And it forms so that it may become 30% or less porous.

このように、膜部22を気孔率が17%以上の多孔質とすることで、焼結時における膜部22の熱膨張量を低減でき、温度変化による寸法変化を抑制することができる。これにより、基材部21と膜部22との間の熱膨張差を低減させることができ、よって例えば焼結時に膜部22に亀裂が生じて、膜部22が基材部21から剥離するなどの不具合が生じるのを防止することができる。   Thus, by making the membrane portion 22 porous with a porosity of 17% or more, the amount of thermal expansion of the membrane portion 22 during sintering can be reduced, and dimensional changes due to temperature changes can be suppressed. Thereby, the thermal expansion difference between the base material part 21 and the film part 22 can be reduced, and thus, for example, the film part 22 is cracked during sintering, and the film part 22 peels from the base material part 21. It is possible to prevent the occurrence of problems such as.

次いで、上記した膜部22を基材部21に形成する処理について説明する。図4は、膜部22を基材部21に形成する処理手順を示すフローチャートである。   Next, a process for forming the above film part 22 on the base material part 21 will be described. FIG. 4 is a flowchart showing a processing procedure for forming the film part 22 on the base material part 21.

先ず、基材部21を図示しない成膜装置にセットし、成膜処理を行う(ステップS1)。成膜処理では、基材部21の載置面21aを膜部22で被覆する処理が行われる。具体的に膜部22は、溶射法によって成膜される溶射膜であり、詳しくは例えばプラズマ溶射によって加熱した溶射材、すなわち希土類酸化物等を吹き付けることによって成膜される。なお、この成膜処理において、膜部22は気孔率が17%以上の多孔質となるように形成される。   First, the base material part 21 is set in a film forming apparatus (not shown) and a film forming process is performed (step S1). In the film forming process, a process of covering the placement surface 21 a of the base material part 21 with the film part 22 is performed. Specifically, the film portion 22 is a sprayed film formed by a thermal spraying method, and specifically, for example, is formed by spraying a sprayed material heated by plasma spraying, that is, a rare earth oxide or the like. In this film forming process, the film part 22 is formed to be porous with a porosity of 17% or more.

上記したように、溶射法を用いることで、基材部21に膜部22を容易に成膜することができる。なお、上記では、膜部22を溶射法で成膜するようにしたが、これに限定されるものではなく、例えばCVD(Chemical Vapor Deposition)法やPVD(Physical Vapor Deposition)法など、その他の成膜手法を用いてもよい。また、膜部22の基材部21に対する密着性を向上させるため、成膜処理の前に、基材部21を予めブラスト処理して、基材部21の表面を粗くしておいてもよい。   As described above, the film portion 22 can be easily formed on the base material portion 21 by using the thermal spraying method. In the above description, the film portion 22 is formed by the thermal spraying method. However, the present invention is not limited to this. For example, other components such as a CVD (Chemical Vapor Deposition) method and a PVD (Physical Vapor Deposition) method are used. A membrane technique may be used. Further, in order to improve the adhesion of the film part 22 to the base material part 21, the base material part 21 may be blasted in advance before the film forming process to roughen the surface of the base material part 21. .

次いで、ステップS1で成膜された膜部22に対して、研磨処理を行う(ステップS2)。研磨処理では、膜部22の表面粗さRaが5μm未満となるまで、膜部22の接触面22aを研磨する処理が行われる。これにより、表面粗さRaが5μm未満の膜部22が基材部21に形成されることとなる。   Next, a polishing process is performed on the film part 22 formed in step S1 (step S2). In the polishing process, a process of polishing the contact surface 22a of the film part 22 is performed until the surface roughness Ra of the film part 22 is less than 5 μm. As a result, the film portion 22 having a surface roughness Ra of less than 5 μm is formed on the base material portion 21.

なお、上記した研磨処理では、例えばベルトサンダー、ディスクグラインダーやストレートグラインダーなどの研磨機を用いて研磨作業が行われるが、これに限定されるものではなく、例えばサンドペーパーなどを用いて手作業で研磨してもよい。   In the above-described polishing treatment, for example, a polishing operation is performed using a polishing machine such as a belt sander, a disk grinder, or a straight grinder, but the present invention is not limited to this, and for example, manually using a sandpaper or the like. You may grind | polish.

次に、本実施形態の検証例を示す。なお、かかる検証は、焼成治具1および被焼成物30に対して以下の熱サイクル試験を実行することで行われた。   Next, a verification example of this embodiment is shown. In addition, this verification was performed by performing the following thermal cycle tests with respect to the baking jig 1 and the to-be-baked object 30. FIG.

先ず、被焼成物30たる電子部品を焼成治具1のセッター20に置き、900度の環境下にする。具体的に例えば、環境温度を1.5時間かけて900度まで昇温させ、その後900度が0.5時間維持される。次いで、環境温度を0.5時間かけて昇温前の温度まで降温させる。   First, an electronic component as the object to be fired 30 is placed on the setter 20 of the firing jig 1 and placed in an environment of 900 degrees. Specifically, for example, the environmental temperature is raised to 900 degrees over 1.5 hours, and then 900 degrees is maintained for 0.5 hours. Next, the environmental temperature is lowered to the temperature before the temperature increase over 0.5 hours.

上記した一連の昇温、温度維持、降温の処理を1サイクルとして、この1サイクルを50回繰り返す。そして、被焼成物30を焼成治具1(具体的にはセッター20)から降ろし、被焼成物30と焼成治具1との付着の有無、膜部22の基材部21に対する剥離の有無、膜部22の亀裂の有無を確認する。上記した熱サイクル試験によって得られた、検証結果を下記の表1に示す。   The above-described series of temperature increase, temperature maintenance, and temperature decrease processes are regarded as one cycle, and this one cycle is repeated 50 times. And the to-be-fired object 30 is dropped from the firing jig 1 (specifically, the setter 20), the presence or absence of adhesion between the to-be-fired object 30 and the firing jig 1, the presence or absence of peeling of the film part 22 from the base material part 21, The presence or absence of a crack in the film part 22 is confirmed. The verification results obtained by the thermal cycle test described above are shown in Table 1 below.

なお、表1においては、付着等の現象が全く無く特に良好なものを◎とし、付着等が無く良好なものを○、付着等が僅かに確認されたものを△、付着等が多く確認されたものを×として4段階で評価した。なお、上記した4段階評価のうち、◎および○を、焼成治具としての規準を満たしている評価とする。   In Table 1, ◎ indicates that there is no phenomenon such as adhesion and is particularly good, ◯ indicates that there is no adhesion and is good, △ indicates that adhesion is slightly confirmed, △ indicates that there is a lot of adhesion, etc. The evaluation was made in 4 grades. Of the four-step evaluation described above, ◎ and ○ are evaluations that satisfy the criteria for a firing jig.

Figure 2015054812
Figure 2015054812

上記の表1の「実施形態1」に示すように、膜部22において、表面粗さRaが4μm、希土類酸化物の含有量が100重量%、気孔率が30%、厚さが100μmである場合、被焼成物30と焼成治具1との付着、膜部22の基材部21に対する剥離、膜部22の亀裂はいずれも見られず、大変良好な結果を得た。   As shown in “Embodiment 1” of Table 1 above, the film portion 22 has a surface roughness Ra of 4 μm, a rare earth oxide content of 100 wt%, a porosity of 30%, and a thickness of 100 μm. In this case, adhesion between the object to be fired 30 and the firing jig 1, peeling of the film part 22 from the base material part 21, and cracking of the film part 22 were not observed, and very good results were obtained.

表1の「実施形態2」では、表面粗さRaが4μm、希土類酸化物の含有量が100重量%、気孔率が17%、厚さが100μmである膜部22について検証した。この場合であっても、被焼成物30と焼成治具1との付着、膜部22の基材部21に対する剥離、膜部22の亀裂はいずれも見られず、良好であった。   In “Embodiment 2” of Table 1, the film portion 22 having a surface roughness Ra of 4 μm, a rare earth oxide content of 100 wt%, a porosity of 17%, and a thickness of 100 μm was verified. Even in this case, the adhesion between the object to be fired 30 and the firing jig 1, the peeling of the film part 22 from the base material part 21, and the crack of the film part 22 were all not good, and were good.

表1の「実施形態3,4」では、「実施形態1」で100重量%だった希土類酸化物の含有量を、10重量%または30重量%に変えて検証した。いずれの場合であっても、被焼成物と焼成治具との付着、膜部の剥離および亀裂は見られず、良好であった。なお、「実施形態3,4」および「比較例4」において、膜部が希土類酸化物以外に含有するその他の成分は、ジルコニア(ZrO)である。 In “Embodiments 3 and 4” in Table 1, the content of the rare earth oxide, which was 100 wt% in “Embodiment 1”, was changed to 10 wt% or 30 wt% and verified. In any case, adhesion between the object to be fired and the firing jig, peeling of the film part, and cracks were not observed, and it was good. In “Embodiments 3 and 4” and “Comparative Example 4”, the other component contained in the film portion other than the rare earth oxide is zirconia (ZrO 2 ).

これに対し、表1の「比較例1」に示すように、膜部において、表面粗さRaが8μm、希土類酸化物の含有量が100重量%、気孔率が32%、厚さが100μmである場合、膜部の剥離や亀裂は見られなかったが、被焼成物と焼成治具との付着が確認された。   On the other hand, as shown in “Comparative Example 1” in Table 1, the film portion had a surface roughness Ra of 8 μm, a rare earth oxide content of 100% by weight, a porosity of 32%, and a thickness of 100 μm. In some cases, peeling or cracking of the film part was not observed, but adhesion between the object to be fired and the firing jig was confirmed.

また、「比較例2」に示すように、「比較例1」で8μmだった表面粗さRaを5μmに変えた場合であっても、同様に、膜部の剥離や亀裂は見られなかったが、被焼成物と焼成治具との付着が確認された。   Further, as shown in “Comparative Example 2”, even when the surface roughness Ra, which was 8 μm in “Comparative Example 1”, was changed to 5 μm, similarly, no peeling or cracking of the film part was observed. However, adhesion between the object to be fired and the firing jig was confirmed.

これは、膜部において、表面粗さRaが5μm以上で平滑化されていないため、膜部の濡れ性が比較的高くなり、被焼成物から溶融したガラス成分によって被焼成物が膜部に付着したものと考えられる。   This is because the film portion has a surface roughness Ra of 5 μm or more and is not smoothed, so that the wettability of the film portion becomes relatively high, and the fired product adheres to the film portion by the glass component melted from the fired product. It is thought that.

また、表1の「比較例3」に示すように、膜部において、表面粗さRaが7μm、希土類酸化物の含有量が100重量%、気孔率が15%、厚さが600μmである場合、被焼成物と焼成治具との付着、膜部の剥離および亀裂の全てが見られ、特に膜部の剥離および亀裂が多く確認された。   Further, as shown in “Comparative Example 3” in Table 1, in the film portion, the surface roughness Ra is 7 μm, the rare earth oxide content is 100 wt%, the porosity is 15%, and the thickness is 600 μm. In addition, adhesion between the object to be fired and the firing jig, peeling of the film part and cracks were all observed, and in particular, many peeling and cracking of the film part were confirmed.

被焼成物が膜部に付着してしまうのは、上述した通り、膜部において、表面粗さRaが5μm以上で平滑化されず、かつ膜部の厚さが500μmを超えるためと考えられる。また、比較例3では、気孔率が17%未満であるため、基材部と膜部との間に比較的大きな熱膨張差が生じ、よって焼結時に膜部に亀裂が生じて、膜部が基材部から剥離したものと考えられる。   The reason why the object to be fired adheres to the film part is considered to be that, as described above, the film part is not smoothed with a surface roughness Ra of 5 μm or more, and the thickness of the film part exceeds 500 μm. Further, in Comparative Example 3, since the porosity is less than 17%, a relatively large difference in thermal expansion occurs between the base material portion and the film portion. Is considered to have peeled from the base material.

また、表1の「比較例4」に示すように、膜部において、表面粗さRaが5μm、希土類酸化物の含有量が5重量%、気孔率が30%、厚さが45μmである場合、膜部の剥離や亀裂は見られなかったが、被焼成物と焼成治具との付着が多く確認された。   Further, as shown in “Comparative Example 4” in Table 1, in the film portion, the surface roughness Ra is 5 μm, the rare earth oxide content is 5 wt%, the porosity is 30%, and the thickness is 45 μm. Although peeling and cracking of the film part were not observed, much adhesion between the object to be fired and the firing jig was confirmed.

これは、膜部において、表面粗さRaが5μm以上で平滑化されず、かつ希土類酸化物の含有量が10重量%未満であり、さらに膜部の厚さが50μm未満であるため、膜部の濡れ性が比較例1〜3の膜部よりも高くなり、ガラス成分が膜部上に広範に広がって、被焼成物が膜部に付着したものと考えられる。   This is because the film portion has a surface roughness Ra of 5 μm or more and is not smoothed, the rare earth oxide content is less than 10 wt%, and the thickness of the film portion is less than 50 μm. It is considered that the wettability is higher than that of the film parts of Comparative Examples 1 to 3, the glass component spreads widely on the film part, and the fired product adheres to the film part.

上述してきたように、本実施形態に係る焼成治具1は、基材部21と、膜部22とを備える。基材部21は、被焼成物30が載置される載置面21aを有する。膜部22は、基材部21の載置面21aを被覆するとともに、表面粗さRaが5μm未満で、希土類酸化物を含む。これにより、焼成治具1において、膜部22の濡れ性を低下させることで、焼成時に被焼成物30と付着し難くすることができる。   As described above, the firing jig 1 according to this embodiment includes the base material portion 21 and the film portion 22. The base material portion 21 has a placement surface 21a on which the object to be fired 30 is placed. The film part 22 covers the mounting surface 21a of the base material part 21, has a surface roughness Ra of less than 5 μm, and contains a rare earth oxide. Thereby, in the baking jig | tool 1, it can make it difficult to adhere to the to-be-fired material 30 at the time of baking by reducing the wettability of the film | membrane part 22. FIG.

図5は、実施形態に係る焼成治具1のセッター20の変形例を示す、セッター20の模式平面図である。図5においては、基材部21の載置面21aにおいて被焼成物30が載置される部位を破線Aで囲んで示した。また、以下においては、破線Aで囲まれた部位Aを「載置部位A」という。   FIG. 5 is a schematic plan view of the setter 20 showing a modification of the setter 20 of the firing jig 1 according to the embodiment. In FIG. 5, a portion where the object to be fired 30 is placed on the placement surface 21 a of the base material portion 21 is surrounded by a broken line A. In the following, the part A surrounded by the broken line A is referred to as “mounting part A”.

実施形態に係る焼成治具1では、膜部22が基材部21の載置面21aの全面を被覆するようにしたが、図5に示す例では、膜部22は、載置部位Aのみを被覆するように形成される。すなわち、載置面21aにおいて、載置部位A以外の部位Bには、膜部22が形成されないようにする。   In the firing jig 1 according to the embodiment, the film portion 22 covers the entire surface of the mounting surface 21a of the base material portion 21. However, in the example shown in FIG. It is formed so that it may coat | cover. That is, on the placement surface 21a, the film portion 22 is not formed in the part B other than the placement part A.

これにより、基材部21の載置面21aにおける膜部22の面積が減少することから、膜部22用の溶射材、すなわち希土類酸化物の量を減少でき、コストを抑制することができる。さらに、膜部22は、研磨処理において研磨されるが、その研磨する面積も少なくすることができ、膜部22の形成に要する時間を短縮することができる。   Thereby, since the area of the film | membrane part 22 in the mounting surface 21a of the base material part 21 reduces, the quantity of the thermal spray material for the film | membrane parts 22, ie, a rare earth oxide, can be reduced, and cost can be suppressed. Furthermore, although the film | membrane part 22 is grind | polished in a grinding | polishing process, the area to grind | polish can also be reduced and the time required for formation of the film | membrane part 22 can be shortened.

なお、図5では、載置面21aにおける載置部位Aを、平面視において被焼成物30の全てを含むような大きさに設定したが、これに限定されるものではない。図6は、実施形態に係る焼成治具1のセッター20のさらなる変形例を示す、セッター20の模式平面図である。   In FIG. 5, the placement site A on the placement surface 21 a is set to a size that includes all of the objects to be fired 30 in a plan view, but is not limited thereto. FIG. 6 is a schematic plan view of the setter 20 showing a further modification of the setter 20 of the firing jig 1 according to the embodiment.

図6に示すように、載置される被焼成物30が複数ある場合、被焼成物30ごとに載置部位A1,A2を設定するようにしてもよい。この場合、載置部位A1、A2のみを膜部22で被覆することとなる。これにより、載置面21aにおける膜部22の面積および研磨する面積をより一層減少させることができ、よってコストを抑制できるとともに、膜部22の形成に要する時間を短縮することができる。   As shown in FIG. 6, when there are a plurality of objects to be fired 30 to be placed, the placement parts A <b> 1 and A <b> 2 may be set for each of the objects to be fired 30. In this case, only the placement parts A1 and A2 are covered with the film part 22. Thereby, the area of the film part 22 and the area to be polished on the mounting surface 21a can be further reduced, so that the cost can be suppressed and the time required for forming the film part 22 can be shortened.

また、上記では、載置面21aにおける載置部位Aや載置部位A1,A2のみを膜部22で被覆するようにしたが、変形例はこれに限定されるものではない。すなわち、例えば膜部22が載置面21aの全面を被覆するようにし、載置部位Aや載置部位A1,A2のみを研磨するようにしてもよい。   In the above description, only the placement site A and the placement sites A1 and A2 on the placement surface 21a are covered with the film part 22, but the modification is not limited thereto. That is, for example, the film part 22 may cover the entire surface of the mounting surface 21a, and only the mounting part A and the mounting parts A1 and A2 may be polished.

このように、膜部22は、載置面21aにおいて被焼成物30が載置される部位A,A1,A2の表面粗さRaが5μm未満となるように形成される一方、被焼成物30が載置されない部位(図5,6において符号Bで示す)の表面粗さRaが5μm以上となるように形成されるようにしてもよい。   As described above, the film portion 22 is formed so that the surface roughness Ra of the portions A, A1, and A2 where the object 30 is placed on the placement surface 21a is less than 5 μm. May be formed so that the surface roughness Ra of the portion (indicated by reference numeral B in FIGS. 5 and 6) where no is placed is 5 μm or more.

膜部22を上記の如く構成した場合であっても、膜部22において研磨する面積を少なくすることができ、膜部22の形成に要する時間を短縮することができる。   Even when the film part 22 is configured as described above, the area to be polished in the film part 22 can be reduced, and the time required for forming the film part 22 can be shortened.

さらに、載置部位A,A1,A2のZ軸方向における高さを、載置されない部位Bよりも被焼成物30側へ高くするようにしてもよい。これにより、研磨すべき載置部位A,A1,A2が他の部位Bに比べて高くなることから、載置部位A,A1,A2を容易に研磨することができる。   Furthermore, you may make it make the height in the Z-axis direction of mounting site | part A, A1, A2 higher to the to-be-baked material 30 side than the site | part B which is not mounted. Thereby, since the mounting parts A, A1, and A2 to be polished are higher than the other parts B, the mounting parts A, A1, and A2 can be easily polished.

また、図示は省略するが、載置面21aに格子状の溝を設けるようにしてもよい。具体的には、例えばX軸方向に対して平行なM本(Mは1以上の整数)の溝と、Y軸方向に対して平行なN本(Nは1以上の整数)の溝を設け、溝で囲まれた部位のみを研磨処理するように構成してもよい。このように構成した場合であっても、膜部22において研磨する面積を少なくすることができ、膜部22の形成に要する時間を短縮することができる。   Although not shown, a lattice-like groove may be provided on the mounting surface 21a. Specifically, for example, M grooves (M is an integer of 1 or more) parallel to the X-axis direction and N grooves (N is an integer of 1 or more) parallel to the Y-axis direction are provided. Alternatively, only the part surrounded by the groove may be polished. Even in this case, the area to be polished in the film part 22 can be reduced, and the time required for forming the film part 22 can be shortened.

なお、上記では、セッター20側に膜部22を形成するように構成したが、これに限定されるものではない。すなわち、例えば仮にセッター20を用いず、基台10のプレート部11に被焼成物30を直接載置する場合、プレート部11の上面に膜部22を形成するようにしてもよい。   In the above description, the film portion 22 is formed on the setter 20 side. However, the present invention is not limited to this. That is, for example, when the object to be fired 30 is directly placed on the plate part 11 of the base 10 without using the setter 20, the film part 22 may be formed on the upper surface of the plate part 11.

また、図1では、一つの焼成治具1を示したが、これに限定されるものではなく、例えば焼成治具1を複数段積み重ね、複数段の焼成治具1に載置された多数の被焼成物30を一度に焼成するようにしてもよい。   In addition, in FIG. 1, one firing jig 1 is shown. However, the present invention is not limited to this. For example, a plurality of firing jigs 1 are stacked and placed on the firing jig 1 in a plurality of stages. The object 30 may be fired at once.

さらなる効果や変形例は、当業者によって容易に導き出すことができる。このため、本発明のより広範な態様は、以上のように表しかつ記述した特定の詳細および代表的な実施形態に限定されるものではない。したがって、添付の特許請求の範囲およびその均等物によって定義される総括的な発明の概念の精神または範囲から逸脱することなく、様々な変更が可能である。   Further effects and modifications can be easily derived by those skilled in the art. Thus, the broader aspects of the present invention are not limited to the specific details and representative embodiments shown and described above. Accordingly, various modifications can be made without departing from the spirit or scope of the general inventive concept as defined by the appended claims and their equivalents.

1 焼成治具
10 基台
11 プレート部
12 支持部
20 セッター
21 基材部
21a (基材部の)載置面
22 膜部
30 被焼成物
31 セラミック誘電体層
32 内部電極層
33 外部電極
A,A1,A2 載置部位
G ガラス成分
DESCRIPTION OF SYMBOLS 1 Firing jig | tool 10 Base 11 Plate part 12 Support part 20 Setter 21 Base material part 21a (Base material part) mounting surface 22 Film | membrane part 30 To-be-fired object 31 Ceramic dielectric layer 32 Internal electrode layer 33 External electrode A, A1, A2 Placement G Glass component

Claims (7)

被焼成物が載置される載置面を有する基材部と、
前記基材部の前記載置面を被覆するとともに、希土類酸化物を含む膜部と
を備えることを特徴とする焼成治具。
A base material portion having a placement surface on which the object to be fired is placed;
A firing jig comprising: a film portion including a rare earth oxide while covering the mounting surface of the base material portion.
前記膜部は、
表面粗さRaが5μm未満であること
を特徴とする請求項1に記載の焼成治具。
The membrane part is
The firing jig according to claim 1, wherein the surface roughness Ra is less than 5 μm.
前記膜部は、
気孔率が17%以上であること
を特徴とする請求項1または2に記載の焼成治具。
The membrane part is
The firing jig according to claim 1 or 2, wherein the porosity is 17% or more.
前記膜部は、
前記希土類酸化物の含有量が10重量%以上であること
を特徴とする請求項1〜3のいずれか一つに記載の焼成治具。
The membrane part is
The firing jig according to any one of claims 1 to 3, wherein the rare earth oxide content is 10 wt% or more.
前記膜部は、
前記載置面において前記被焼成物が載置される部位のみを被覆するように形成されること
を特徴とする請求項1〜4のいずれか一つに記載の焼成治具。
The membrane part is
The firing jig according to any one of claims 1 to 4, wherein the firing jig is formed so as to cover only a portion where the firing object is placed on the placement surface.
前記膜部は、
前記載置面において前記被焼成物が載置される部位の表面粗さRaが5μm未満となるように形成される一方、前記被焼成物が載置されない部位の表面粗さRaが5μm以上となるように形成されること
を特徴とする請求項1〜4のいずれか一つに記載の焼成治具。
The membrane part is
While the surface roughness Ra of the portion on which the object to be fired is placed is less than 5 μm on the placement surface, the surface roughness Ra of the part on which the material to be fired is not placed is 5 μm or more. It forms so that it may become. The baking jig | tool as described in any one of Claims 1-4 characterized by the above-mentioned.
基材部において被焼成物が載置される載置面を、希土類酸化物を含む膜部で被覆する工程と、
前記膜部において表面粗さRaが5μm未満となるようにする工程と
を含むことを特徴とする焼成治具の製造方法。
A step of coating a mounting surface on which a material to be fired is mounted in a base material portion with a film portion containing a rare earth oxide;
And a step of making the surface roughness Ra less than 5 μm in the film part.
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JP2019163877A (en) * 2018-03-19 2019-09-26 日本碍子株式会社 Firing setter
WO2020166565A1 (en) * 2019-02-14 2020-08-20 日本碍子株式会社 Calcination jig

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Publication number Priority date Publication date Assignee Title
JPH05270925A (en) * 1992-03-23 1993-10-19 Ngk Insulators Ltd Refractory material for ceramic burning
JP2000178069A (en) * 1998-12-11 2000-06-27 Shin Etsu Chem Co Ltd Sintering jig
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Publication number Priority date Publication date Assignee Title
JP2019163877A (en) * 2018-03-19 2019-09-26 日本碍子株式会社 Firing setter
WO2020166565A1 (en) * 2019-02-14 2020-08-20 日本碍子株式会社 Calcination jig

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