JP2015025762A - Pole retrieval device and pole retrieval method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To prevent deterioration of processing efficiency of retrieval processing for retrieving a pole and to improve accuracy of the retrieval processing.SOLUTION: Acquisition processing for repeating processing in which plural strip regions are set within a coordinate plane, and a weighting value Vw1 is set to each respective strip region, and a weighting value Vw2 set to a designation pattern corresponding to a pattern of relationship of magnitude of a second parameter on three points on a waveform (first to third points P1, P2, P3) is acquired as the weighting value Vw2 on the first point, is performed a plurality of times while changing the number of other points sandwiched among three points. Then a total value Vt of acquired weighting values Vw2 in the respective acquisition processing is calculated, and the weighting value Vw1 set to the strip region where the point belongs to is multiplied by the total value Vt for calculating a correction value Vc. The point satisfying a condition that the correction value Vc is larger than a prescribed value is determined as a pole in a point group.

Description

  The present invention relates to a pole search device and a pole for executing a search process for searching for a pole of a waveform indicating a change in the second parameter with respect to a change in the first parameter in a coordinate plane constituted by the first parameter axis and the second parameter axis. It relates to the search method.

  As this type of device, a waveform display device disclosed by the applicant in Japanese Patent Application Laid-Open No. 2011-257235 is known. The waveform display device is configured to be able to display a waveform indicating a change in impedance with respect to a change in frequency in a coordinate plane (XY plane) constituted by a frequency axis (X axis) and an impedance axis (Y axis). It is configured to be able to search for extreme points (maximum points and minimum points) in the waveform. In this case, the waveform display device searches for the pole as follows.

  First, a point group composed of a plurality of points whose frequencies on the waveform are different from each other by a predetermined value is specified. Next, the first acquisition process (first acquisition process) is executed. In this acquisition process, one point of each point constituting the point group is selected as a first point, a point adjacent to the origin side of the frequency axis from the first point is selected as a second point, A point adjacent to the tip side of the frequency axis from the first point is selected as a third point. Subsequently, when the pattern classified by the magnitude relationship of the impedances at the three selected points corresponds to a predetermined first designated pattern, the weight value set for the first designated pattern is set to the first point. Is obtained as a weighting value. Next, the process of acquiring the weighting value is repeated for all combinations of selecting the first point to the third point from the point group while changing the first point to the third point.

  Subsequently, the second acquisition process is executed. In this second acquisition process, a point that is located closer to the origin of the frequency axis than the first point and that is adjacent to the first point across one point is selected as the second point P2, and more than the first point. A process of acquiring the above-described weighting value by selecting a point adjacent to the first point with one point sandwiched between the front ends of the frequency axis is performed. Next, the third acquisition process is executed. In this third acquisition process, a point that is located closer to the origin of the frequency axis than the first point and that is adjacent to the first point across the two points is selected as the second point, and the frequency is higher than the first point. A process of acquiring the above-described weighting value is performed by selecting a point that is located on the tip side of the axis and is adjacent to the first point across the two points as the third point. Subsequently, extreme point determination processing is executed. In this extreme point determination process, a total value obtained by summing the weighting values acquired in the first to third acquisition processes for each point is calculated, and points satisfying the condition that the total value is equal to or greater than the first specified value and the largest Are determined to be extreme points in the point group.

  In this waveform display device, since the pole is determined as described above, even if there is a sudden impedance change due to noise superposition or the like, it is sandwiched between the first point, the second point, and the third point. If the acquisition process is performed multiple times with different numbers of points, the determination result that the sudden impedance change corresponds to the first specified pattern indicating the extreme point is diluted (the effect of the sudden impedance change) It is possible to detect a point to be searched as a pole as a pole.

JP2011-257235A (pages 8-12 and 1-4)

  However, the conventional waveform display device described above has the following problems to be improved. A search process for searching for the extreme points of the point group Cp1 composed of twelve points Pa to Pl defined on the waveform W1 indicated by a solid line in FIG. 2 is assumed using this waveform display device. In this search process, as shown in FIG. 7, the acquisition process is executed three times, the weight value Vw is acquired for each first point using the first designated patterns F1 to F9 shown in FIG. When the values Vw are summed for each point and a point satisfying the condition that the total value Vt is 8 or more and the largest as the first specified value is searched for, the point to be searched as the extreme point is the point Pb (FIG. 2). In this case, the point Pi is searched as a pole point, even though the point Pi is located at the end of the point group Cp1 shown in FIG. Thus, in the conventional waveform display device described above, when the waveform W1 having a pole at the end of the point group Cp1 is selected as a search target, a point different from the point to be searched for as a pole is searched for as a pole. In order to further improve the accuracy of searching for extreme points, improvement of this point is desired. In this case, by increasing the number of points P so that a plurality of points P are provided on the end side further than the point Pb (the frequency value between the points is specified to be small), the point Pb is changed to the extreme point. A configuration in which the search is performed is also conceivable. However, with this configuration, there arises a new problem that the processing efficiency of search processing is reduced.

  The present invention has been made in view of such problems to be improved, and provides a pole search device and a pole search method that can improve the accuracy of search processing while preventing a decrease in processing efficiency of search processing for searching for extreme points. The main purpose is to do.

  In order to achieve the above object, the pole retrieval apparatus according to claim 1 is adapted to cope with a change in the first parameter in a coordinate plane constituted by the first parameter axis for the first parameter and the second parameter axis for the second parameter. A pole search device including the processing unit that executes a search process for searching for a pole of a waveform indicating a change in the second parameter, wherein a plurality of band-like regions parallel to the first parameter axis are included in the coordinate plane. It is configured to be settable and is configured to be able to set a first weighting value indicating the weight of the weight for each of the belt-like regions, and the processing unit has different values of the first parameter in the search processing A first point that is one of the points in a group of points formed by a plurality of points on the waveform, and the first path that is more than the first point. Another one that is different from the first point in the group of points adjacent to each other with N (N is an integer of 0 or more) points positioned on the origin side of the first parameter axis along the meter axis A second point that is one of the two points, and M (M is an integer of 0 or more) points positioned on the tip side of the first parameter axis along the first parameter axis from the first point. A third point that is another point different from the first point in the adjacent point group is selected and classified according to the magnitude relationship of each of the second parameters at the three points. A second weighting value indicating the weight of the weight set for the designated pattern when the designated pattern corresponds to the designated pattern designated in advance. The acquisition process of repeatedly acquiring the second weighting value of the point as the first point while changing the point that is the first point is performed by changing at least one of the N and the M and changing the L (L is (2 or more integer) times, and calculates the total value for each of the points with the second weight value acquired in the L times of acquisition processing as the first point, and the band-like region to which the point belongs A process of increasing or decreasing the total value according to the first weight value set for is performed, and a condition that the weight indicated by the total value after the process is equal to or greater than a predetermined weight is satisfied An extreme point determination process for determining the point as the extreme point in the point group is executed.

  The pole search device according to claim 2 is the pole search device according to claim 1, wherein the processing unit includes a maximum point in which the second parameter in the point group is a maximum point and the first point in the point group. A minimum point having two minimum parameters, a first line segment passing through the maximum point and parallel to the first parameter axis, and a second line segment passing through the minimum point and parallel to the first parameter axis; When the divided region in the coordinate plane partitioned by is divided into a plurality of regions to set a divided region as the band-like region and search for the maximum point as the extreme point, the divided region closer to the first line segment When the first weighting value is set to be heavy and the minimum point as the extreme point is searched, the first weighting is heavier as the divided region is closer to the second line segment. To set the value.

  A pole searching device according to claim 3 is the pole searching device according to claim 1 or 2, wherein a plurality of types of the designated patterns are provided, and the second weights having different sizes with respect to each of the designated patterns. A value is set, and when the pattern classified by the magnitude relationship of the second parameter corresponds to any of the specified patterns, the processing unit sets the second set for the corresponding specified pattern. Is obtained as the second weight value of the point.

  According to a fourth aspect of the present invention, the pole search device according to any one of the first to third aspects is configured such that at least one of the M and the N can be arbitrarily set.

  Further, the pole search device according to claim 5 is configured such that the L can be arbitrarily set in the pole search device according to any one of claims 1 to 4.

  According to a sixth aspect of the present invention, there is provided the pole search method according to the second parameter with respect to the change of the first parameter in a coordinate plane formed by the first parameter axis for the first parameter and the second parameter axis for the second parameter. A search process for searching for the extreme points of a waveform indicating a change in a plurality of strip regions parallel to the first parameter axis are set in the coordinate plane in the search process, and In a state where the first weighting value indicating the weight of the weight is set for each band-shaped region, one of the points in the point group constituted by a plurality of points on the waveform having different values of the first parameter A first point, which is a point, and N located on the origin side of the first parameter axis along the first parameter axis from the first point N is an integer greater than or equal to 0) A second point that is another point different from the first point in the group of points adjacent to each other across the point, and the first point than the first point Another one that is different from the first point in the group of points adjacent to each other with the M (M is an integer of 0 or more) points positioned on the tip side of the first parameter axis along the parameter axis When the pattern classified by the magnitude relation of each said 2nd parameter in the said 3 point corresponds to the designated pattern designated beforehand while selecting the 3rd point which is the said three points A process of acquiring a second weighting value indicating the weight of the set weight as the second weighting value of the point, which is the first point. In the acquisition process of L times, the acquisition process that is repeatedly performed while changing the point that is the first point is executed L (L is an integer of 2 or more) times with at least one of N and M different. A total value obtained by adding the obtained second weighting values as the first points for each of the points is calculated, and according to the first weighting values set for the band-like region to which the points belong A pole determination process for executing the process of increasing or decreasing the total value and determining the point satisfying the condition that the weight indicated by the total value after the process is equal to or greater than a predetermined weight as the pole in the point group Run.

  In the extreme point search device according to claim 1 and the extreme point search method according to claim 6, a plurality of strip regions are set in the coordinate plane, and first weight values indicating the weight of each strip region are set. Set and execute a process of increasing or decreasing the total value of the second weight values at each point according to the first weight value set for the band-like region to which the point belongs, and is indicated by the total value after the process Points that satisfy the condition that the weight is equal to or greater than a predetermined weight are determined as extreme points in the point group. For this reason, in this extreme point search device, for example, a point that should be searched as a local maximum point by setting a first weighting value having a larger value for a belt-like region having a larger second parameter value among a plurality of belt-like regions. Even when the point exists at the end of the point group, when the value of the second parameter of the point is large, the weight indicated by the total value after the processing of the point satisfies the condition that the weight is equal to or more than a predetermined weight. This makes it possible to determine the point as a maximum point with high accuracy. In addition, for example, by setting a first weighting value having a larger value for a band-shaped area having a smaller second parameter value among a plurality of band-shaped areas, a point to be searched for as a local minimum point is set at the end of the point group. Even if it exists, when the value of the second parameter of the point is small, the weight indicated by the total value after processing of the point can satisfy the condition that the weight is not less than a predetermined weight. A point can be determined as a minimum point with high accuracy. In addition, in this extreme point search device and extreme point search method, it is possible to search for extreme points (maximum points and local maximum points) with high accuracy without increasing the number of points, so the efficiency of search processing decreases due to an increase in the number of points. Can be reliably prevented. Therefore, according to the extreme point search device and the extreme point search method, it is possible to sufficiently improve the accuracy of the search process while reliably preventing a decrease in the processing efficiency of the search process.

  In the extreme point searching apparatus according to the second aspect, the processing unit divides the divided area into a plurality of areas to set divided areas as a plurality of band-like areas, and sets a first weight value for each divided area. That is, in this extreme point searching apparatus, setting of the divided areas and setting of the first weighting value can be automated. For this reason, the efficiency of the search process can be sufficiently improved as compared with the configuration in which the setting of the divided regions and the setting of the first weighting value are performed manually.

  In the extreme point searching apparatus according to the third aspect, a plurality of types of designated patterns are provided, and second weight values having different sizes are set for the designated patterns. In this case, for example, in a configuration in which only one designated pattern is designated, the second weighting value is obtained only when the magnitude relationship pattern of the second parameters at the three points is slightly different from the one designated pattern. It may not be acquired and may not be searched as a pole. On the other hand, in this extreme point searching apparatus, by providing a plurality of types of designated patterns, it is possible to make it correspond to any of the designated patterns. As a result, such points can be determined as extreme points.

  According to a fourth aspect of the present invention, at least one of M and N can be arbitrarily set. For this reason, according to this extreme point search device, for example, by setting at least one of M and N to a large value and increasing the number of other points sandwiched between three points, noise superposition and measurement The influence of the sudden change in the second parameter due to the error can be further reduced. In addition, for example, by setting at least one of M and N to a small value and reducing the number of other points sandwiched between the three points, a change in the second parameter that is somewhat small can be determined as a pole point. be able to.

  In addition, the pole search device according to claim 5 is configured such that L can be arbitrarily set. For this reason, according to this extreme point search device, for example, by setting L to a large value and setting the number of acquisition processes many times, the influence of the sudden second parameter change due to noise superposition or measurement error can be reduced. Further, the number of points can be further reduced, and the accuracy of search processing for searching for extreme points can be further improved. Also, for example, by setting L to a small value and setting the number of acquisition processes to be small, it is possible to determine a change in the second parameter that is small to some extent as an extreme point, and to sufficiently increase the processing time of the search process. Can be shortened.

1 is a configuration diagram showing a configuration of a waveform display device 1. FIG. It is a display waveform figure of waveform W1. It is the 1st explanatory view explaining search processing. It is a pattern figure which shows the content of the designated patterns F1-F9. It is a display waveform figure of waveform W2. It is the 2nd explanatory view explaining search processing. It is explanatory drawing explaining the search process by the conventional waveform display apparatus.

  Hereinafter, embodiments of a pole searching device and a pole searching method will be described with reference to the accompanying drawings.

  First, the configuration of the waveform display device 1 will be described with reference to the drawings. A waveform display device 1 shown in FIG. 1 is an example of a pole search device, and includes a measurement unit 11, a display unit 12, an operation unit 13, a processing unit 14, and a storage unit 15, and performs measurement according to a pole search method described later. Various processes such as a process, a display process, and a search process can be executed.

  The measurement unit 11 executes measurement processing according to the control of the processing unit 14, and measures the impedance (resistance: corresponding to the second parameter) of the measurement target while changing the frequency of the measurement signal (corresponding to the first parameter). To output measurement data Dw.

  For example, the display unit 12 includes a liquid crystal panel, and executes display processing according to control of the processing unit 14 to display various images. Specifically, as shown in FIGS. 2 and 5, the display unit 12 has waveforms W1 and W2 (hereinafter, also referred to as “waveform W” when not distinguished) and waveform W extreme points (maximum points and minimum points). Character information Iv indicating the frequency and impedance is displayed. In this case, the waveform W shown in each figure is a waveform based on the measurement data Dw output from the measurement unit 11, and includes the frequency axis Ax (corresponding to the first parameter axis, in this example, the X axis) and the impedance axis Ay. A change in impedance with respect to a change in frequency in a coordinate plane B (XY plane) corresponding to the second parameter axis (Y axis in this example) is shown. 2 and 5, the waveform W based on the actually measured measurement data Dw is shown by a solid line, and the ideal waveform W without a sudden impedance change due to noise superposition or measurement error is shown by a broken line. Yes.

  The operation unit 13 includes a mode switching key, a recording start key, a recording end key, a waveform display key, a search start key, a numeric input key, and the like, and outputs an operation signal So when these are operated. In this case, the numeric input key is a value of L (hereinafter also simply referred to as “L”) as the number of times the processing unit 14 executes an acquisition process in a search process described later, or a first point P1 described later in the acquisition process. The “M” value (hereinafter also simply referred to as “M”) and the “N” value (hereinafter also simply referred to as “N”) used when selecting the second point P2 and the third point P3 are input. Used when.

  The processing unit 14 controls each part of the waveform display device 1 according to the operation signal So output from the operation unit 13. In addition, the processing unit 14 performs a search process to be described later to search for extreme points (maximum points and minimum points) in the waveform W, and causes the display unit 12 to display character information Iv indicating the frequency and impedance at the searched extreme points. .

  The storage unit 15 stores various data according to the control of the processing unit 14. Specifically, the storage unit 15 stores the measurement data Dw output from the measurement unit 11. Further, the storage unit 15 stores data indicating “L”, “M”, and “N” set by the operation on the operation unit 13.

  The storage unit 15 also stores pattern data Dp used in the search process executed by the processing unit 14. In this case, the pattern data Dp has a plurality of points (for example, points Pa to Pl shown in FIG. 2 and FIG. 5) on the waveform W having different frequencies (as an example, spaced apart at the same interval along the frequency axis Ax). Points Pm to Px shown below: patterns (hereinafter referred to as “points P” when not distinguished) are classified according to the magnitude relationship of the impedances at the three points P in the point group Cp1, Cp2 (hereinafter referred to as “points P”). (Also referred to as “impedance change pattern”), a plurality of types (for example, nine types) of designated patterns F1 to F9 (see FIG. 4; hereinafter, designated patterns F1 to F9 are not distinguished from each other). Data) is included. Further, the pattern data Dp includes a weighting value Vw2 (corresponding to a second weighting value indicating the weight of the weight, and a numerical value of 1 to 3 shown in the figure) set for each of the designated patterns F1 to F9. Contains data to show. In this example, the larger the numerical value of the weighting value Vw2, the heavier the weight.

In this case, the middle point in each of the designated patterns F1 to F9 shown in FIG. 4 corresponds to the first point P1, which is one point P in the point group Cp1, and the left point in each of the designated patterns F1 to F9 is It corresponds to the second point P2 located on the origin side of the frequency axis Ax with respect to the first point P1, and the right point in each of the designated patterns F1 to F9 is located on the tip side of the frequency axis Ax with respect to the first point P1. This corresponds to the third point P3 (hereinafter, when the first to third points P1, P2, P3 are collectively referred to as "points P1, P2, P3"). Further, assuming that the impedances at the points P1, P2, and P3 are Z1, Z2, and Z3, the magnitude relationship between Z1, Z2, and Z3 is defined as follows in each of the designated patterns F1 to F9.
Designated pattern F1: Z2 <Z1 <Z3
Designated pattern F2: Z2 <Z1 = Z3
Designated pattern F3: Z2 <Z1> Z3
Designated pattern F4: Z2 = Z1 <Z3
Designated pattern F5: Z2 = Z1 = Z3
Designated pattern F6: Z2 = Z1> Z3
Designated pattern F7: Z2> Z1 <Z3
Designated pattern F8: Z2> Z1 = Z3
Designated pattern F9: Z2>Z1> Z3

  Note that the designated patterns F1, F3, F7, and F9 include both cases where the difference between Z2 and Z1 and the difference between Z1 and Z3 are equal and different. The designated pattern F3 is used when determining that the point P determined as the extreme point is a maximum point, and the specified pattern F7 is used when determining that the point P determined as the extreme point is a minimum point. It is done. That is, the designated pattern F3 is designated as the designated pattern F indicating the maximum point, and the specified pattern F7 is specified as the specified pattern F indicating the minimum point.

  Next, the pole searching method using the waveform display device 1 and the operation of the waveform display device 1 at that time will be described with reference to the drawings.

  First, when measuring the impedance to be measured using the waveform display device 1, the mode switching key of the operation unit 13 is operated to switch the waveform display device 1 to the measurement mode, and then the measurement start key of the operation unit 13 is pressed. Manipulate. At this time, the processing unit 14 controls the measurement unit 11 according to the operation signal So output from the operation unit 13 and causes the measurement unit 11 to perform measurement processing. In this measurement process, the measurement unit 11 supplies the electrical signal to the measurement object while changing the frequency of the electrical signal, measures the impedance associated therewith, and indicates measurement data indicating the measured impedance value for each frequency. Dw is output.

  Further, the processing unit 14 causes the storage unit 15 to store the measurement data Dw output from the measurement unit 11. Subsequently, when the measurement is ended, the measurement end key of the operation unit 13 is operated. In response to this, the processing unit 14 controls the measurement unit 11 to end the measurement process.

  Next, when displaying the waveform W1 based on the measurement data Dw stored in the storage unit 15, the mode switching key of the operation unit 13 is operated to switch the waveform display device 1 to the waveform display mode. At this time, the processing unit 14 reads the measurement data Dw stored in the storage unit 15 in accordance with the operation signal So output from the operation unit 13. Next, the processing unit 14 controls the display unit 12 to execute display processing, and displays a waveform W1 based on the read measurement data Dw as shown in FIG. In this case, the waveform W1 indicates a change in impedance with respect to a change in frequency in the coordinate plane B constituted by the frequency axis Ax and the impedance axis Ay, as shown in FIG.

  Next, when searching for the maximum point as the extreme point in the waveform W1 displayed on the display unit 12, the mode switching key of the operation unit 13 is operated to switch the waveform display device 1 to the setting mode. Next, the number input key of the operation unit 13 is operated to set (input) L (L is an integer of 2 or more) as the number of times to cause the processing unit 14 to execute an acquisition process described later. In this example, it is assumed that L is set to “3”. Subsequently, the number input keys of the operation unit 13 are operated to set (input) N and M. Here, N corresponds to the number of points P (points P other than the first point P1 and the second point P2) existing between the first point P1 and the second point P2 in the direction along the frequency axis Ax. Value, which can be set to an integer greater than or equal to zero. M is a value corresponding to the number of points P (points P other than the first point P1 and the third point P3) existing between the first point P1 and the third point P3 in the direction along the frequency axis Ax. Thus, it can be set to an integer of 0 or more.

  In this case, at least one of N and M is set to a different value every time the acquisition process is executed (in this example, the first to third times). In this example, N and M are set to “0” for the first acquisition process, and both N and M are set to “1” different from “0” for the second acquisition process. It is assumed that both N and M are set to “2” which is different from “0” and “1”. In addition, the processing unit 14 stores data indicating the set L, M, and N in the storage unit 15.

  Next, the search start key for instructing the inspection of the maximum point in the operation unit 13 is operated. At this time, the processing unit 14 executes search processing according to the operation signal So output from the operation unit 13. In this search process, the processing unit 14 is based on the measurement data Dw and has a plurality of points P having different frequencies on the waveform W1 displayed on the display unit 12 (for example, along the frequency axis Ax as shown in FIG. 2). A point group Cp1 composed of points Pa to Pl) separated at the same interval is specified.

  Subsequently, the processing unit 14 reads the pattern data Dp from the storage unit 15 and reads data indicating L, M, and N from the storage unit 15. Next, the processing unit 14 executes a first acquisition process. In this first acquisition process, the processing unit 14 selects, for example, a point Pb shown in FIG. 2 as one point P among the points P constituting the point group Cp1, and uses this point Pb as the first point P1. And Subsequently, the processing unit 14 is located closer to the origin side (left side in the figure) of the frequency axis Ax along the frequency axis Ax than the first point P1, and does not sandwich another point P (that is, N pieces of points). An adjacent point Pa is selected (with 0 points P as an example in between), and this point Pa is set as the second point P2. Next, the processing unit 14 is located on the distal end side (right side in the figure) of the frequency axis Ax along the frequency axis Ax with respect to the first point P1, and does not sandwich another point P (that is, M examples) Next, an adjacent point Pc is selected (with the zero point P therebetween), and this point Pc is set as the third point P3 (see the column “Pb” in the “first acquisition process” in FIG. 3).

  Subsequently, the processing unit 14 determines that the impedance change patterns of the three points Pa to Pc (points P1, P2, and P3) selected as described above are among the nine designation patterns F1 to F9 illustrated in FIG. In addition to determining whether or not any of the designated patterns F, the weighting value Vw2 set for the designated pattern F is acquired as the weighting value Vw2 of the first point P1. In this case, since the impedance change pattern of the points Pa to Pc corresponds to the designated pattern F3 shown in FIG. 4, the processing unit 14 sets the weighting value Vw2 of “3” set for the designated pattern F3 to the first value. It is acquired as the weighting value Vw2 of the point Pb that is set to 1 point P1 (see the column “Pb” in “First acquisition process” in FIG. 3).

  Next, the processing unit 14 changes the points P to be selected as the points P1, P2, and P3 in the process of acquiring the weighting value Vw2 without changing M and N (specifically, the first 1 point P1 is repeated while changing from Pc to Pk (see the column “First acquisition process” in FIG. 3), and the first acquisition process is terminated.

  Subsequently, the processing unit 14 executes a second acquisition process. In the second acquisition process, the processing unit 14 is located closer to the origin of the frequency axis Ax than the first point P1 and is adjacent to the first point P1 with one point P as an example of N in between. A point P (that is, adjacent every other point) is selected as the second point P2, and one point P as an example of M is sandwiched between the first point P1 and the tip side of the frequency axis Ax. Then, the point P adjacent to the first point P1 (that is, adjacent to every other point) is selected as the third point P3, and the above-described weighting value Vw2 is obtained.

  Next, when the second acquisition process ends, the processing unit 14 executes the third acquisition process. In this case, the processing unit 14 is located on the origin side of the frequency axis Ax with respect to the first point P1 and is adjacent to the first point P1 across two points P as an example of N (that is, two points). A point P adjacent to each other) is selected as the second point P2, and the first point P1 is located on the tip side of the frequency axis Ax with respect to the first point P1 and sandwiches two M points P as an example. Is selected as the third point P3, and the same process as the first acquisition process described above is performed (the “third acquisition process” in FIG. 3). Column).

  Subsequently, the processing unit 14 executes an area setting process. In this region setting process, the processing unit 14 has a point P (maximum point) having the maximum impedance (second parameter) in the point group Cp1 and a point P (minimum point) having the minimum impedance (second parameter) in the point group Cp1. ). In this case, the processing unit 14 specifies the point Pb (see FIG. 2) as the maximum point and specifies the point Pl (see FIG. 2) as the minimum point.

  Next, as shown in FIG. 2, the processing unit 14 passes through the point Pb as the maximum point and is parallel to the frequency axis Ax through the first line segment Lf1 parallel to the frequency axis Ax and the point Pl as the minimum point. Band-shaped divided areas C1 to C4 (corresponding to the band-shaped areas) obtained by dividing the partition area E1 in the coordinate plane B partitioned by the second line segment Ls1 into four (a plurality of examples). Region C ”) is set.

  Subsequently, the processing unit 14 sets a weighting value Vw1 (corresponding to a first weighting value indicating the weight of the weight) used in a pole determination process described later for each of the divided regions C1 to C4. In this case, when searching for the maximum point as the extreme point, the processing unit 14 sets the first weighting value having a larger value for the divided region C divided region closer to the first line segment Lf1. As an example, as shown in FIG. 2, the processing unit 14 sets weight values Vw1 of “1”, “2”, “4”, and “8” for the divided areas C1, C2, C3, and C4, respectively. . In this case, in this example, the larger the numerical value of the weighting value Vw1, the heavier the weight. That is, when searching for the maximum point as the extreme point, the processing unit 14 sets the weighting value Vw1 indicating that the weight of the divided region C closer to the first line segment Lf1 is heavier.

  Subsequently, the processing unit 14 performs a pole determination process. In this extreme point determination process, the processing unit 14 calculates a total value Vt obtained by summing the weighting value Vw2 acquired in the acquisition process 3 (an example of L) from the first time to the third time for each point P. (See FIG. 3). Subsequently, the processing unit 14 calculates the correction value Vc by specifying the divided area C to which each point P belongs and multiplying the total value Vt by the weight value Vw1 set for the divided area C (the total value Vt). Execution of processing to increase / decrease: see the figure). In this case, as described above, the larger the numerical value of the weighting value Vw2, the heavier the weight is. Therefore, the total value Vt obtained by adding up the weighting values Vw2 also indicates that the larger the numerical value, the heavier the weight. Further, as described above, the larger the numerical value of the weighting value Vw1, the heavier is the weight. Therefore, the correction value Vc calculated by multiplying the total value Vt by the weighting value Vw1 also increases as the numerical value increases. It is heavy.

  Next, the processing unit 14 has a point P that satisfies the condition that the correction value Vc (the total value after the process for increasing or decreasing the total value Vt) is equal to or greater than the specified value Vr (for example, “20”) indicating a predetermined weight. (In this example, the point Pb) is determined to be the extreme point (either the maximum point or the minimum point) in the point group Cp1. In this case, the larger the specified value Vr, the heavier the weight. Further, as described above, the larger the value of the correction value Vc, the heavier the weight. That is, the processing unit 14 determines that the point Pb that satisfies the condition that the weight indicated by the correction value Vc is equal to or more than a predetermined weight indicated by the specified value Vr is a pole in the point group Cp1. In addition, the processing unit 14 performs each point P1, in the acquisition process at least once (in this example, once) among the three acquisition processes in which the point Pb determined to be a pole is the first point P1. Since it is determined that the impedance change pattern of P2 and P3 corresponds to the designated pattern F3 indicating the maximum point, the point Pb is determined as the maximum point. Note that the value of the specified value Vr can be arbitrarily set according to the waveform W to be searched. In this case, the specified value Vr can be stored in the storage unit 15 in advance, or can be input by operating the operation unit 13.

  Subsequently, the processing unit 14 controls the display unit 12 to display the cursor line Cl passing through the point Pb determined as the maximum point as shown in FIG. 2, and also indicates the frequency and impedance at the point Pb. Information Iv is displayed.

  In this case, when the extreme point is searched for the waveform W1 shown in FIG. 2 by the conventional configuration and method for executing the extreme point determination process based on the total value Vt that is not corrected by the weighting value Vw1, as shown in FIG. When the point Pb to be searched for as a local maximum exists at the end of the point group Cp1, the total value Vt of the points Pb does not become larger than the total value Vt of the other points P. Therefore, the point Pb is a local maximum. Instead of being determined as a point, another point P (in this example, point Pi in the example of FIG. 7) is determined as a local maximum point.

  On the other hand, in this waveform display device 1, the divided region C closer to the first line segment Lf1 among the plurality of divided regions C set in the coordinate plane B (that is, the divided region C having a larger impedance value). A larger value of the weighting value Vw1 is set, and the point P that satisfies the condition that the correction value Vc obtained by multiplying the weighting value Vw1 by the total value Vt is equal to or greater than the specified value Vr is determined as the local maximum point. For this reason, in the waveform display device 1, even when the point Pb to be searched for as the maximum point exists at the end of the point group Cp1, the correction is performed when the impedance (second parameter) of the point Pb is large. The value Vc becomes equal to or greater than the specified value Vr, and this point Pb (point P to be searched for as a maximum point) is determined as the maximum point.

  Further, in this waveform display device 1, it is not necessary to increase the number of points P so that a plurality of points P are provided on the end side (the origin side of the frequency axis Ax) further than the point Pb. It is possible to prevent a decrease in the efficiency of search processing due to an increase in. That is, in the waveform display device 1, it is possible to improve the accuracy of searching for extreme points while preventing a decrease in search processing efficiency.

  In the waveform display device 1, noise is superimposed or measured by setting a large number of other points P sandwiched between the points P1, P2 and P3 or by setting a large number of acquisition processes. Minimize the effect of sudden impedance changes due to errors, set the number of other points P sandwiched between the points P1, P2, and P3, or set the number of acquisition processes to a minimum. Thus, it is possible to determine even a small change in impedance as a pole.

  Next, an example of searching for a local minimum point as an extreme point in the waveform W2 shown in FIG. 5 will be described. In this case, when the search start key for instructing the inspection of the minimum point in the operation unit 13 is operated, the processing unit 14 executes the search process, and the point group Cp2 configured by the points Pm to Px on the waveform W2. (Hereinafter, it is also referred to as “point group Cp” when not distinguished from the above point group Cp1), and then the above-described acquisition process is executed 3 times (an example of L) with N and M different.

  Next, the processing unit 14 executes an area setting process. In this case, the processing unit 14 specifies the point Px (see FIG. 5) as the point P (maximum point) having the maximum impedance (second parameter) in the point group Cp2, and also determines the impedance (second parameter) in the point group Cp2. ) Is specified as a point Pn (see the same figure) as a point P (minimum point) having the minimum.

  Subsequently, as shown in FIG. 5, the processing unit 14 passes through the point Px as the maximum point and is parallel to the frequency axis Ax through the first line segment Lf2 parallel to the frequency axis Ax and the point Pn as the minimum point. The divided area E2 in the coordinate plane B divided by the second line segment Ls2 is divided into four (a plurality of examples) of band-shaped divided areas C5 to C8 (corresponding to the band-shaped areas, and when not distinguished, “divided areas C ”).

  Subsequently, the processing unit 14 sets a weighting value Vw1 for each of the divided regions C5 to C8. In this case, when searching for the minimum point as the extreme point, the processing unit 14 sets the first weighting value having a larger value for the divided region C closer to the second line segment Ls2. As an example, as illustrated in FIG. 5, the processing unit 14 sets weight values Vw1 of “8”, “4”, “2”, and “1” for the divided regions C5, C6, C7, and C8, respectively. . In this case, in this example, the larger the numerical value of the weighting value Vw1, the heavier the weight. That is, when searching for the minimum point as the extreme point, the processing unit 14 sets the weighting value Vw1 indicating that the weight of the divided region C closer to the second line segment Ls2 is heavier.

  Subsequently, the processing unit 14 executes the extreme point determination process to calculate the total value Vt for each point P (see FIG. 6), specifies the divided area C to which each point P belongs, and sets the divided area C as the divided area C. The correction value Vc is calculated by multiplying the total value Vt by the weighting value Vw1 set for it (execution of the process for increasing or decreasing the total value Vt: see the figure).

  Next, the processing unit 14 sets the point P (in this example, the point Pn) that satisfies the condition that the correction value Vc (the total value after the process for increasing or decreasing the total value Vt) is equal to or greater than the specified value Vr (“20” as an example). ) Is determined to be the extreme point (either the maximum point or the minimum point) in the point group Cp2. Further, the processing unit 14 is configured to acquire each point P1, in the acquisition process at least once (in this example, once) among the three acquisition processes in which the point Pn determined to be a pole is the first point P1. Since it is determined that the impedance change pattern of P2 and P3 corresponds to the designated pattern F7 indicating the minimum point, the point Pn is determined as the minimum point.

  Subsequently, the processing unit 14 controls the display unit 12 to display the cursor line Cl passing through the point Pn determined as the minimum point as shown in FIG. 5, and the characters indicating the frequency and impedance at the point Pn. Information Iv is displayed.

  In this example, as described above, among the plurality of divided regions C set in the coordinate plane B, the divided region C closer to the second line segment Ls2 (that is, the divided region C having a smaller impedance value) is larger. The value weighting value Vw1 is determined, and the extreme point determination process is executed based on the correction value Vc obtained by multiplying the total value Vt by the weighting value Vw1. For this reason, in the waveform display device 1, even when the point Pn to be searched for as the minimum point exists at the end of the point group Cp2, if the value of the impedance (second parameter) of the point Pn is small, the correction is performed. The value Vc becomes equal to or greater than the specified value Vr, and this point Pn (point P to be searched for as a minimum point) is determined as a minimum point. Also in this example, since it is not necessary to increase the number of points P so that a plurality of points P are provided on the end side of the point Pn, the efficiency of search processing due to the increase in the number of points P is prevented. It is possible.

  As described above, in the waveform display device 1 and the pole search method, a plurality of divided regions C are set in the coordinate plane B, the weight value Vw1 is set for each divided region C, and the divided region to which the point P belongs. The correction value Vc is calculated by multiplying the total value Vt of each point P by the weighting value Vw1 set for C, and the correction value Vc (after the process of increasing or decreasing the total value Vt according to the weighting value Vw1) is calculated. The point P that satisfies the condition that the total value) is equal to or greater than the specified value Vr is determined as the extreme point in the point group Cp. For this reason, in the waveform display device 1 and the pole search method, for example, by setting the weighting value Vw1 having a larger value for the divided region C having a larger impedance (second parameter) value among the plurality of divided regions C, Even when the point P to be searched for as a local maximum exists at the end of the point group Cp, when the value of the impedance (second parameter) of the point P is large, the correction value Vc of the point P is set to the specified value Vr. As described above, the point P can be determined as a maximum point with high accuracy. Further, for example, by setting the weighting value Vw1 having a larger value in the divided region C having a smaller impedance (second parameter) value among the plurality of divided regions C, the point P to be searched for as the minimum point is the point group. Even when it exists at the end of Cp, when the value of the impedance (second parameter) of the point P is small, the correction value Vc of the point P is set to a specified value Vr or more and the point P is set as a minimum point. The accuracy can be determined. Further, in the waveform display device 1 and the pole search method, it is possible to search for extreme points (local maximum points and local maximum points) with high accuracy without increasing the number of points P. Therefore, the search processing by increasing the number of points P is possible. It is possible to reliably prevent a decrease in efficiency. Therefore, according to the waveform display device 1 and the pole search method, it is possible to sufficiently improve the accuracy of the search process while reliably preventing a decrease in the processing efficiency of the search process.

  In the waveform display device 1, the processing unit 14 divides the divided areas E1 and E2 into a plurality of division areas C and sets a weight value Vw1 for each division area C. That is, in the waveform display device 1, the setting of the divided region C and the setting of the weight value Vw1 can be automated. For this reason, the efficiency of the search process can be sufficiently improved as compared with the configuration in which the setting of the divided region C (band-like region) and the setting of the weighting value Vw1 are performed manually.

  In the waveform display device 1 and the pole search method, a plurality of types of designated patterns F are provided, and weight values Vw2 having different sizes are set for the designated patterns F. In this case, for example, in a configuration in which only one designated pattern F is designated, the weight value Vw2 is obtained only when the magnitude relationship of the second parameters at the three points P is slightly different from the one designated pattern F. May not be acquired and may not be searched as a pole. On the other hand, in the waveform display device 1 and the pole searching method, by providing a plurality of types of the designated patterns F, it is possible to correspond to any of the designated patterns F. As a result, such a point P is determined as a pole. can do.

  The waveform display device 1 is configured so that at least one of M and N can be arbitrarily set. For this reason, according to this waveform display device 1, for example, by setting at least one of M and N to a large value and increasing the number of other points P sandwiched between the three points P, noise can be reduced. It is possible to further reduce the influence of sudden impedance changes due to superposition and measurement errors. In addition, for example, by setting at least one of M and N to a small value and reducing the number of other points P sandwiched between the three points P, it is possible to determine a small change in impedance as an extreme point. be able to.

  The waveform display device 1 is configured such that L can be set arbitrarily. For this reason, according to this waveform display device 1, for example, by setting L to a large value and setting the number of acquisition processes many times, the influence of sudden impedance change due to noise superposition or measurement error can be further increased. In addition to being able to reduce the number, it is possible to further improve the accuracy of search processing for searching for extreme points. Further, for example, by setting L to a small value and setting the number of acquisition processes to be small, it is possible to determine a small change in impedance as an extreme point, and sufficiently shorten the search processing time. be able to.

  The pole search device and the pole search method are not limited to the above configuration and method. For example, the processing unit 14 executes the region setting process to set the divided regions C and set the weighting value Vw1 for each divided region C. However, the setting of the divided regions C and the setting of the weighting value Vw1 are performed. A configuration and a method arbitrarily performed by a user by an operation using the operation unit 13 can also be adopted.

  In the above configuration and method, N is set to “0”, “1”, and “2”, and M is set to “0”, “1”, and “2”. , Can be set to any integer greater than or equal to zero. In the above configuration and method, N and M can be set to different values. Specifically, in the above configuration and method, both N and M in the second acquisition process are set to “1”, but instead of this, N in the second acquisition process is set to “2”, for example. For example, M can be set to “1”. In the above configuration and method, both N and M are changed every time the number of acquisition processes is different (every time the number of acquisition processes is repeated). A configuration and method in which one of M is not changed (that is, at least one of N and M is changed) may be employed.

  Further, in the above configuration and method, L as the number of times to execute the acquisition process is set to “3”, but L can be set to an arbitrary integer of 2 or more (that is, the acquisition process is performed). It can be executed any number of times more than once). Further, instead of the configuration and method for setting L, M, and N by operating the operation unit 13, a configuration and method for setting a part or all of L, M, and N in advance may be employed.

  Further, the example in which nine designated patterns F are designated has been described above. However, the designated pattern F may be one of the nine designated patterns F described above, or the nine designated patterns F. Any plural number of them may be used. It is also possible to designate a designated pattern F that is different from the nine designated patterns F described above. Specifically, the above-mentioned designated patterns F1, F3, F7, and F9 include both the case where the difference between Z2 and Z1 and the difference between Z1 and Z3 are equal and different, but the above-described designated patterns F1, In F3, F7, and F9, the designated pattern F in which the difference between Z2 and Z1 is equal to the difference in Z1 and Z3, and in the above-described designated patterns F1, F3, F7, and F9, the difference between Z2 and Z1 and the difference between Z1 and Z3 Different designation patterns F can be designated.

  Moreover, although it described above about the example by which the numerical value of 1-3 is set to each designation | designated pattern F1-F9, the value set to designation | designated pattern F1-F9 can be changed arbitrarily. In this case, the value may include a decimal or a fraction (not necessarily an integer), or may be a value smaller than 0 (a negative value).

  Further, in the above example, for each numerical value of the weighting values Vw1 and Vw2, the total value Vt, the correction value Vc, and the specified value Vr, setting and processing of numerical values is based on the premise that “the larger the numerical value indicates that the weight is heavier”. However, for some or all of these values Vw1, Vw2, Vt, Vc, and Vr, numerical values are set and processed on the premise that “the smaller the value, the heavier the weight is”. Configurations and methods can also be employed. Specifically, for example, when the search process for the waveform W1 shown in FIG. 2 is performed, the weighting values Vw1 of 1, 2, 4, and 8 shown in FIG. Instead, a negative numerical value (a numerical value of −1, −2, −4, −8) with “−” added to each numerical value is set as the weighting value Vw1. When the correction value Vc is calculated in this way, the numerical value of each correction value Vc shown in FIG. 3 is −1 to −24. In addition, the above-mentioned specified value Vr is set to “−20” instead of “20”, and the point P that satisfies the condition that the correction value Vc is equal to or less than “−20” that is the specified value Vr (that is, depending on the correction value Vc). By causing the processing unit 14 to execute the extreme point determination process that the point P) that satisfies the condition that the displayed weight is equal to or greater than the predetermined weight indicated by the specified value Vr is the extreme point in the point group Cp1, the above example In the same manner, the point Pb shown in FIG. 2 can be determined (searched) as the extreme point in the point group Cp1.

  Further, the example in which the frequency axis Ax is the first parameter axis and the impedance axis Ay is the second parameter axis has been described above, but the configuration and method in which the time axis is the first parameter axis, the voltage value, the current value, and the power value Further, the present invention can be applied to a configuration and a method in which a parameter axis having a second parameter of various physical quantities such as a resistance value and a temperature and various chemical quantities such as an atomic weight and a molecular weight is the second parameter axis.

DESCRIPTION OF SYMBOLS 1 Measuring apparatus 12 Display part 14 Processing part Ax Frequency axis Ay Impedance axis B Coordinate plane C1-C8 Division area Cp1, Cp2 Point group E1, E2 Partition area F1-F9 Designation pattern Lf1, Lf2 1st line segment Ls1, Ls2 2nd Line segment P1 1st point P2 2nd point P3 3rd point Pa to Px point Vc Correction value Vr Specified value Vt Total value Vw1, Vw2 Weighted value W1, W2 Waveform

Claims (6)

Retrieval processing for searching for a pole of a waveform indicating a change in the second parameter with respect to a change in the first parameter in a coordinate plane constituted by the first parameter axis for the first parameter and the second parameter axis for the second parameter A pole search device comprising the processing unit for executing
A plurality of strip regions parallel to the first parameter axis are configured to be set in the coordinate plane, and a first weight value indicating the weight of each of the strip regions is configured to be set.
In the search process, the processing unit includes a first point that is one point in a group of points formed by a plurality of points on the waveform having different values of the first parameter, and the first point Different from the first point in the point group adjacent to the N parameter (N is an integer of 0 or more) located on the origin side of the first parameter axis along the first parameter axis A second point, which is another one of the points, and M (M is an integer of 0 or more) pieces located on the tip side of the first parameter axis along the first parameter axis from the first point. While selecting the third point that is another one of the points different from the first point in the group of points adjacent to each other with the point in between, the three points When the pattern classified by the magnitude relationship of each of the second parameters corresponds to a designated pattern designated in advance, a second weight value indicating the weight of the weight set for the designated pattern is set to the first weight. The process of acquiring the point as the second weighting value of the point as a point is repeatedly performed while changing the point that is the first point, and at least one of the N and the M is different, and L (L is (Integer of 2 or more)
The second weighted value acquired in the L times of acquisition processing is used as the first point to calculate a total value for each of the points, and the first value set for the band-like region to which the point belongs A process of increasing or decreasing the total value according to a weighting value of 1 is executed, and the points in the point group satisfying a condition that a weight indicated by the total value after the processing satisfies a predetermined weight or more are determined. A pole search device that executes a pole determination process for determining that The processing unit identifies a maximum point where the second parameter in the point group is the maximum point and a minimum point where the second parameter in the point group is minimum,
A partitioned region in the coordinate plane defined by a first line segment parallel to the first parameter axis passing through the maximum point and a second line segment parallel to the first parameter axis passing through the minimum point; Dividing into a plurality of areas and setting a divided area as the band-like area,
When searching for a local maximum point as the extreme point, set the first weight value that is heavier in the divided region closer to the first line segment,
2. The extreme point search apparatus according to claim 1, wherein when searching for a local minimum point as the extreme point, the first weighting value that is heavier in the divided region closer to the second line segment is set. A plurality of types of the designated patterns are provided, and the second weight values having different sizes are set for the designated patterns.
When the pattern classified by the magnitude relation of the second parameter corresponds to any of the specified patterns, the processing unit uses the second weight value set for the corresponding specified pattern as the second weight value. The extreme point search apparatus according to claim 1, wherein the pole is acquired as the second weight value of the point as the first point.   The pole search device according to any one of claims 1 to 3, wherein at least one of the M and the N can be arbitrarily set.   The pole search device according to any one of claims 1 to 4, wherein the L can be arbitrarily set. Retrieval processing for searching for a pole of a waveform indicating a change in the second parameter with respect to a change in the first parameter in a coordinate plane constituted by the first parameter axis for the first parameter and the second parameter axis for the second parameter A pole search method for executing
In the search process, a plurality of strip regions parallel to the first parameter axis are set in the coordinate plane, and a first weight value indicating the weight of each of the strip regions is set. Then, a first point that is one of the points in the point group constituted by a plurality of points on the waveform having different values of the first parameter, and along the first parameter axis from the first point. Another one of the points different from the first point in the point group adjacent to the N point (N is an integer of 0 or more) located on the origin side of the first parameter axis A second point, and M (M is an integer equal to or greater than 0) M points positioned on the distal end side of the first parameter axis along the first parameter axis from the first point. And selecting a third point that is another one of the points different from the first point in the adjacent point group, and classifying according to the magnitude relationship of each of the second parameters at the three points. When a pattern corresponds to a designated pattern designated in advance, a second weighting value indicating the weight of the weight set for the designated pattern is acquired as the second weighting value of the point as the first point. An acquisition process of repeatedly performing the process while changing the point that is the first point is executed L (L is an integer of 2 or more) times with at least one of N and M different,
The second weighted value acquired in the L times of acquisition processing is used as the first point to calculate a total value for each of the points, and the first value set for the band-like region to which the point belongs A process of increasing or decreasing the total value according to a weighting value of 1 is executed, and the points in the point group satisfying a condition that a weight indicated by the total value after the processing satisfies a predetermined weight or more are determined. The extreme point search method for executing the extreme point determination process.

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