JP2011257235A - Measuring device and measuring method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To accurately detect the pole of a waveform.SOLUTION: In retrieval processing for retrieving the pole of the waveform for showing the change of a second parameter with respect to the change of a first parameter, first obtaining processing for repeatedly performing processing for obtaining a weighting value V set for a first specified pattern when a pattern categorized by the magnitude relation of the respective second parameters of three points (a first point P1, a second point P2, and a third point P3) in a point group comprising a plurality of points (Pa1 to Po1) on the waveform corresponds to the first specified pattern, as the weighting value V of the point being the first point, while changing the point being the first point is performed by a plurality of times in such a manner that the number of the other points held between two of the three points is made different, and pole determination processing for totalizing the weighting values V obtained in each first obtaining processing in each point, and determining the point satisfying a condition where the total value Vt is a first prescribed value or more as the pole in the point group.

Description

  The present invention relates to a measuring apparatus and a measuring method for executing search processing for searching for a pole of a waveform indicating a change in the second parameter with respect to a change in the first parameter in a coordinate plane constituted by the first parameter axis and the second parameter axis. It is about.

  As a measuring apparatus of this type, a common mode equivalent circuit constant measuring instrument (hereinafter also simply referred to as “measuring instrument”) disclosed in Japanese Patent Laid-Open No. 2005-62045 is known. This measuring device is a device that creates a common mode equivalent circuit for simulating design conditions calculation and propagation characteristic conditions in IT communication devices connected to a communication network, and includes an impedance measurement unit, an impedance storage unit, and an impedance minimum / It is configured with a maximum point search unit and the like. In this measuring instrument, the impedance measurement unit measures impedance in a predetermined frequency band, and the impedance storage unit stores the impedance measured by the impedance measurement unit. Also, the impedance minimum / maximum point search unit reads out the impedance from the impedance storage unit and searches for the extreme points (minimum point and maximum point) in the impedance change necessary when creating the common mode equivalent circuit.

  In this case, in this type of measuring apparatus, the following method is generally used when searching for poles. For example, as shown in FIG. 2, when the horizontal axis (x-axis) is the frequency and the vertical axis (y-axis) is the impedance, when searching for a pole in the waveform W1 indicating the change in impedance with respect to the change in frequency, the frequency is constant. The impedances at three points (for example, points Pa1 to Pc1 shown in the figure) on the waveform W1 that are different from each other are compared. At this time, the impedance at the center point (in this example, point Pb1) of the three points along the horizontal axis is higher than the impedance at the other two points (in this example, points Pa1 and Pc1). When it is larger, the point located in the center is set as the maximum point. Also, the impedance at the point (in this example, point Pj1) located at the center along the horizontal axis among the three points (for example, points Pi1 to Pk1 shown in the figure) is the other two points (in this example) When the impedance is smaller than the impedance at the points Pi1, Pk1), the point located at the center is set as the minimum point. That is, in this example, a point that decreases after the impedance increases with an increase in frequency is searched for as a maximum point, and a point that increases after the impedance decreases with an increase in frequency is searched for as a minimum point.

Japanese Patent Laying-Open No. 2005-62045 (page 7, FIG. 1)

  However, the above-described conventional measuring apparatus has the following problems to be improved. That is, in this measuring apparatus, for example, even when a measurement value changes due to noise superposition or a measurement error, the changed point may be searched as a maximum point or a minimum point. Specifically, as shown by a broken line in FIG. 2, when there is no noise superposition and no measurement error, there is only one point corresponding to the maximum point (only the point Pg1 in the figure) and the minimum point. Even if the waveform does not have a corresponding point, in reality there is noise superposition or measurement error, so there are different points (in this example, points Pb1, Pc1, Pj1, Pk1, Pm1, Pn1) is searched as a local maximum point or a local minimum point, and the search result may be different from the search result that should originally exist. As described above, the conventional measuring apparatus has a problem that it is difficult to accurately detect the extreme points in the presence of noise superposition or measurement error, and improvement of this point is desired.

  The present invention has been made in view of such a problem to be improved, and it is a main object of the present invention to provide a measuring apparatus and a measuring method capable of accurately detecting the extreme points of the waveform.

  In order to achieve the above object, the measuring apparatus according to claim 1 is directed to a change in the first parameter in a coordinate plane composed of a first parameter axis for the first parameter and a second parameter axis for the second parameter. A measurement apparatus including a processing unit that executes a search process for searching for a waveform extreme point indicating a change in a second parameter, wherein the processing unit is configured to determine the first parameter by a predetermined value in the search process. A first point that is one point in a point group composed of a plurality of points on the waveform having different values, and an origin side of the first parameter axis along the first parameter axis from the first point And a second point adjacent to each other across N points (N is an integer of 0 or more), and closer to the first parameter axis than the first point. Thus, the third point adjacent to the M point (M is an integer of 0 or more) located on the tip side of the first parameter axis is selected, and each of the second points at the three points is selected. When the pattern classified by the magnitude relation of the parameter corresponds to the first designated pattern designated in advance, the weight value set for the first designated pattern is obtained as the weight value of the point as the first point. The first acquisition process is repeatedly performed L (L is an integer of 2 or more) times with different at least one of N and M, and the first acquisition process is repeatedly performed while changing the point to be the first point. The weighting values acquired in the first acquisition process are summed for each point as the first point, and the total value is equal to or greater than the first specified value specified in advance. A satisfying the point of executing the determining pole determination process and the extreme point in the point group.

  According to a second aspect of the present invention, in the measurement apparatus according to the first aspect, the processing unit determines the point having the largest total value as a point satisfying the condition in the extreme point determination process.

  The measuring device according to claim 3 is the measuring device according to claim 1 or 2, wherein a plurality of types of the first designated patterns are provided, and the weighting values having different sizes with respect to the first designated patterns. Is set, and the processing unit is set for the corresponding first designated pattern when the pattern classified by the magnitude relationship of the second parameter corresponds to any of the first designated patterns. The weighting value is acquired as the weighting value of the point with the first point.

  The measuring device according to claim 4 is the measuring device according to any one of claims 1 to 3, wherein the processing unit includes a fourth point that is one point in the point of the waveform, and the fourth point. From the fourth point, a fifth point that is located closer to the origin side of the first parameter axis than the point and sandwiching Q (Q is an integer of 0 or more) points, and adjacent to the fourth point Is also selected along the first parameter axis with the sixth point adjacent to the P parameter (P is an integer greater than or equal to 0) located on the tip side of the first parameter axis, and the three The weight set for the second designated pattern when the pattern classified by the magnitude relationship of each of the second parameters at the point corresponds to the second designated pattern designated in advance Is obtained by repeatedly performing the process of obtaining the weighting value of the fourth point while changing the fourth point, by changing at least one of Q and P, and O (O is an integer of 2 or more) The weight value acquired in the second acquisition process of O times is summed up for each point as the fourth point, and the points where the total value is equal to or greater than a second specified value that is defined in advance are continuous. Specifying the aggregate to be accumulated, summing up the total value of all the points constituting the aggregate, and when the cumulative value is equal to or greater than a predetermined third predetermined value, the aggregate as the point group Perform search processing.

  A measuring apparatus according to claim 5 is configured such that at least one of M and N can be arbitrarily set in the measuring apparatus according to any one of claims 1 to 4.

  A measuring apparatus according to a sixth aspect is configured such that the L can be arbitrarily set in the measuring apparatus according to any one of the first to fifth aspects.

  A measuring apparatus according to a seventh aspect is configured such that at least one of the P and the Q can be arbitrarily set in the measuring apparatus according to any one of the fourth to sixth aspects.

  Further, a measuring apparatus according to an eighth aspect is configured such that the O can be arbitrarily set in the measuring apparatus according to any one of the fourth to seventh aspects.

  According to a ninth aspect of the present invention, there is provided the measurement method according to the second parameter with respect to the change of the first parameter in a coordinate plane constituted by the first parameter axis for the first parameter and the second parameter axis for the second parameter. A measurement method for executing a search process for searching for the extreme points of a waveform indicating a change, wherein the search process includes a plurality of points on the waveform having different values of the first parameter by predetermined values. A first point which is one point in the point group, and N (N is an integer of 0 or more) located on the origin side of the first parameter axis along the first parameter axis from the first point. And a second point adjacent to each other with respect to the point, and located closer to the tip of the first parameter axis along the first parameter axis than the first point. A pattern that is classified according to the magnitude relationship of each of the second parameters at the three points is selected in advance while selecting M (M is an integer of 0 or more) adjacent third points. The process of obtaining the weight value of the point with the weight value set for the first specified pattern as the first point when the first specified pattern is met is changed for the point to be the first point. The first acquisition process repeatedly performed is executed L (L is an integer of 2 or more) times with at least one of N and M different, and the weight value acquired in the L first acquisition processes is The points are summed for each point as the first point, and the points satisfying the condition that the total value is equal to or more than the first prescribed value defined in advance are the points. Executing the determining pole determination process and the pole at.

  In the measuring apparatus according to claim 1 and the measuring method according to claim 9, patterns classified according to the magnitude relationship of each second parameter at three points (first point to third point) of the waveform are designated in advance. The first acquisition process that repeats the process of acquiring the weighting value set for the first specified pattern when the first specified pattern is satisfied while changing the three points is performed between the three points. The number of other points sandwiched (N and M) is varied L times, and the first point satisfying the condition that the total weight value acquired in each first acquisition process satisfies the first specified value or more is defined as the extreme point. The pole determination process for determining is executed. For this reason, in this measurement apparatus and measurement method, for example, in the first acquisition process of one of L times of the first acquisition process, the sudden change pattern of the second parameter becomes the first designated pattern indicating the extreme point. Even if it is determined to be applicable, it may be determined that it does not correspond to the first designated pattern indicating the extreme point in the other first acquisition processing. Therefore, according to the measurement apparatus and the measurement method, the determination result that the pattern of the sudden change in the second parameter corresponds to the first designated pattern indicating the extreme point is diluted by executing the first acquisition process L times. (That is, the determination result of whether or not it corresponds to the first designated pattern indicating the extreme point is averaged), and as a result, the influence of the sudden second parameter change due to noise superposition or measurement error is reduced. Only points that should be searched for as extreme points can be accurately detected as extreme points.

  Moreover, according to the measuring apparatus of Claim 2, each point which comprises a point group by determining the point with the largest total value of the weighting value acquired in L 1st acquisition processes as the extreme point in a point group. Among them, only the point corresponding to the top of the convex portion in the waveform can be detected as the maximum point, and only the point corresponding to the bottom of the concave portion in the waveform can be detected as the minimum point.

  In the measuring apparatus according to the third aspect, a plurality of types of first designated patterns are provided, and weight values having different sizes are set for the first designated patterns. In this case, for example, in a configuration in which only one first designated pattern is designated, the magnitude relationship pattern of each second parameter at three points is slightly different from that one designated pattern. In some cases, the weighting value cannot be acquired and is not detected as a pole. On the other hand, in this measuring apparatus, by providing a plurality of types of the first designated pattern, it is possible to make it correspond to any of the first designated patterns. As a result, such a point can be determined as the extreme point.

  Further, in the measurement apparatus according to claim 4, patterns classified according to the magnitude relationship of each second parameter at three points (fourth point to sixth point) are designated in advance for each point on the waveform. The second acquisition process is performed between the three points by repeatedly performing the process of acquiring the weighting value set for the second specified pattern when it corresponds to the second specified pattern while changing the three points. A set of points that are executed O times with different numbers of other points (Q and P) sandwiched between them, and the points where the total value of the weight values acquired in the second acquisition process O times is equal to or greater than the second specified value are continuous. When the cumulative value obtained by accumulating the total value of all points in the aggregate is equal to or greater than the third specified value, the aggregate is searched for as a point group (first acquisition process) And pole determination process) is executed. For this reason, according to this measuring apparatus, when searching for a pole point in a waveform having a plurality of uneven portions, each uneven portion can be specified as a point group. You can search.

  Further, the measuring apparatus according to claim 5 is configured to be able to arbitrarily set at least one of M and N. For this reason, according to this measurement apparatus, for example, by setting at least one of M and N to a large value and increasing the number of other points sandwiched between the three points, noise superimposition and measurement error It is possible to further reduce the influence of the sudden change in the second parameter due to. In addition, for example, by setting at least one of M and N to a small value and reducing the number of other points sandwiched between the three points, a change in the second parameter that is somewhat small can be determined as a pole point. be able to.

  In addition, the measuring apparatus according to claim 6 is configured such that L can be arbitrarily set. For this reason, according to this measurement apparatus, for example, by setting L to a large value and setting the number of times of the first acquisition process to be large, the influence of the sudden second parameter change due to noise superposition or measurement error is achieved. Can be further reduced, and the accuracy of search processing for searching for extreme points can be further improved. Further, for example, by setting L to a small value and setting the number of times of the first acquisition process to be small, it is possible to determine a change in the second parameter that is somewhat small as an extreme point, and to reduce the processing time of the search process. It can be made sufficiently short.

  Further, the measuring device according to claim 7 is configured so that at least one of P and Q can be arbitrarily set. For this reason, according to this measuring apparatus, by setting at least one of P and Q to a large value, a search is performed for a point where the second parameter has suddenly changed due to noise superposition or measurement error (first processing). It is possible to prevent them from being included in the point group that is the target of the acquisition process and the pole determination process. Further, for example, by setting at least one of P and Q to a small value, the point where the second parameter has changed to some extent can be included in the point group to be searched.

  Further, the measuring apparatus according to claim 8 is configured such that O can be arbitrarily set. For this reason, according to this measuring apparatus, for example, by setting O to a large value, a search is performed for a point in a portion where the second parameter has suddenly changed due to noise superposition or measurement error (first acquisition processing and It is possible to prevent them from being included in the point group to be subjected to the pole determination process), and it is possible to sufficiently improve the accuracy of the process for specifying the point group. Also, for example, by setting O to a small value, the point where the second parameter has changed to a certain extent can be included in the point group to be searched, and the process of specifying the point group Time can be shortened sufficiently.

2 is a block diagram showing a configuration of a waveform display device 1. FIG. It is the display waveform figure which displayed the waveform W1 on the display part 12. FIG. It is a pattern diagram which shows the content of the 1st designation | designated pattern F1-F9. It is the 1st explanatory view explaining the 1st acquisition processing and pole decision processing. It is the display waveform figure which displayed the waveform W2 on the display part 12. FIG. It is the 2nd explanatory view explaining the 1st acquisition processing and pole decision processing. It is the display waveform figure which displayed the waveform W3 on the display part 12. FIG.

  Hereinafter, embodiments of a measurement apparatus and a measurement method will be described with reference to the accompanying drawings.

  First, the configuration of the waveform display device 1 will be described with reference to the drawings. The waveform display device 1 shown in FIG. 1 is an example of a measurement device, and includes a measurement unit 11, a display unit 12, an operation unit 13, a control unit 14, and a recording unit 15, and can execute processing according to the measurement method. It is configured.

  The measurement unit 11 controls the physical quantity (corresponding to the second parameter, for example, impedance) of the measurement target object when the electric signal is supplied to the measurement target object according to the control of the control unit 14. The measurement data Dw is output while measuring while changing (corresponding to one parameter).

  For example, the display unit 12 is configured by a liquid crystal panel, and the waveforms W1, W2, and W3 shown in FIGS. 2, 5, and 7 (hereinafter, the waveforms W1, W2, and W3 are not distinguished in accordance with the control of the control unit 14). "Waveform W") is displayed. Further, the display unit 12 displays character information Iv indicating the frequency and impedance at the extreme points (maximum point and minimum point) of the waveform W <b> 1 under the control of the control unit 14.

  The operation unit 13 includes a mode switching key, a recording start key, a recording end key, a waveform display key, a search start key, and “L”, “M”, “N”, “O”, “P”, and “Q” described later. ”Is input and an operation signal So is output when these are operated.

  The control unit 14 performs control on various units constituting the waveform display device 1 and various processes according to the operation signal So output from the operation unit 13. Specifically, the control unit 14 controls the impedance measurement (measurement process) by the measurement unit 11 and records the measurement data Dw in the recording unit 15 and reads out the measurement data Dw from the recording unit 15. .

  Further, the control unit 14 corresponds to the frequency axis Ax (corresponding to the first parameter axis, in this example, the X axis) and the impedance axis Ay (corresponding to the second parameter axis) based on the measurement data Dw output from the measurement unit 11. In this example, the display unit 12 displays a waveform W indicating a change in impedance with respect to a change in frequency in a coordinate plane (XY plane) composed of the Y axis).

  In addition, the control unit 14 executes a search process described later to search for extreme points (maximum points and minimum points) in the waveform W, and causes the display unit 12 to display character information Iv indicating the frequency and impedance at the searched extreme points. .

  The recording unit 15 records the measurement data Dw output from the measurement unit 11 under the control of the control unit 14. The recording unit 15 records data indicating “L”, “M”, “N”, “O”, “P”, and “Q”, which will be described later, set by an operation on the operation unit 13.

  Further, the recording unit 15 stores pattern data Dp used in search processing executed by the control unit 14. In this case, the pattern data Dp has a plurality of points (for example, points Pa1 to Pa1 shown in FIG. 2) on the waveform W whose frequencies are different by a predetermined value (that is, separated at the same interval along the frequency axis Ax). Po1: Hereinafter, a plurality of types (as an example) designated in advance as patterns classified according to the magnitude relationship of the impedances at the three points P in the point group Cp constituted by the point group Cp configured by “point P” when not distinguished from each other. Nine types of first designated patterns F1 to F9 (see FIG. 3; hereinafter, also referred to as “first designated pattern F” when the first designated patterns F1 to F9 are not distinguished) are included. The pattern data Dp includes data indicating the weighting value V (see the same figure) set for each of the first designated patterns F1 to F9.

In this case, the middle point, the left point, and the right point in each of the first designated patterns F1 to F9 shown in FIG. 3 correspond to a first point P1, a second point P2, and a third point P3, which will be described later. Further, assuming that the impedances at the first point P1, the second point P2, and the third point P3 are Z1, Z2, and Z3, respectively, in each of the first designated patterns F1 to F9, the magnitude relationship of Z1, Z2, and Z3 is as follows. It is prescribed as follows.
First designated pattern F1: Z2 <Z1 <Z3
First designated pattern F2: Z2 <Z1 = Z3
First designated pattern F3: Z2 <Z1> Z3
First designated pattern F4: Z2 = Z1 <Z3
First designated pattern F5: Z2 = Z1 = Z3
First designated pattern F6: Z2 = Z1> Z3
First designated pattern F7: Z2> Z1 <Z3
First designated pattern F8: Z2> Z1 = Z3
First designated pattern F9: Z2>Z1> Z3
The first designated patterns F1, F3, F7, and F9 include both cases where the difference between Z2 and Z1 and the difference between Z1 and Z3 are equal and different. The first designated pattern F3 is used to determine that the point P determined as the extreme point is a maximum point, and the first specified pattern F7 indicates whether the point P determined as the extreme point is a minimum point. Used when discriminating. That is, the first specified pattern F3 is specified as the first specified pattern F indicating the maximum point, and the first specified pattern F7 is specified as the first specified pattern F indicating the minimum point.

  Next, the measurement method using the waveform display device 1 and the operation of the waveform display device 1 at that time will be described with reference to the drawings.

  First, after operating the mode switching key of the operation unit 13 to switch the waveform display device 1 to the measurement mode, the measurement start key of the operation unit 13 is operated. At this time, the control unit 14 causes the measurement unit 11 to perform measurement processing according to the operation signal So output from the operation unit 13. In this measurement process, the measurement unit 11 supplies the electric signal to the measurement object while changing the frequency of the electric signal, and measures the impedance of the measurement object at this time. Moreover, the measurement part 11 outputs the measurement data Dw which shows the impedance for every frequency.

  Next, the control unit 14 causes the recording unit 15 to record the measurement data Dw output from the measurement unit 11. Subsequently, when the measurement is ended, the measurement end key of the operation unit 13 is operated. In response to this, the control unit 14 controls the measurement unit 11 to stop the measurement process and also controls the recording unit 15 to end the recording of the measurement data Dw.

  Next, the waveform W1 based on the measurement data Dw recorded in the recording unit 15 is displayed. Specifically, the mode display key of the operation unit 13 is operated to switch the waveform display device 1 to the waveform display mode. At this time, the control unit 14 reads part or all of the measurement data Dw recorded in the recording unit 15 in accordance with the operation signal So output from the operation unit 13. Next, the control unit 14 controls the display unit 12 to display a waveform W1 based on the read measurement data Dw as shown in FIG. In this case, the waveform W1 indicates a change in impedance with respect to a change in frequency in a coordinate plane constituted by the frequency axis Ax and the impedance axis Ay, as shown in FIG.

  Next, when searching for a pole in the waveform W1 displayed on the display unit 12, the mode switching key of the operation unit 13 is operated to switch the waveform display device 1 to the setting mode. Next, the number key of the operation unit 13 is operated to set L (L is an integer of 2 or more) as the number of times to cause the control unit 14 to execute a first acquisition process described later. In this example, it is assumed that L is set to “3”. Subsequently, the numeric keys of the operation unit 13 are operated to input N (N is an integer of 0 or more) and M (M is an integer of 0 or more) described later. In this case, at least one of N and M is set to a different value every time the first acquisition process is executed (in this example, the first to third times). In this example, N and M are set to “0” for the first acquisition process for the first time, N and M are set to “1” for the first acquisition process for the second time, and the first acquisition for the third time. Assume that N and M are set to “2” for processing. Further, the control unit 14 causes the recording unit 15 to record data indicating the set L, M, and N.

  Next, the search start key of the operation unit 13 is operated. At this time, the control unit 14 executes search processing according to the operation signal So output from the operation unit 13. In this search process, the control unit 14 has a plurality of points P (for example, a point Pa1 shown in FIG. 2) whose frequencies on the waveform W displayed on the display unit 12 are different from each other by a predetermined value based on the measurement data Dw. A point group Cp composed of ~ Po1) is specified.

  Subsequently, the control unit 14 reads the pattern data Dp from the recording unit 15 and reads data indicating L, M, and N from the recording unit 15. Next, the control unit 14 executes a first acquisition process for the first time. In the first acquisition process, the control unit 14 selects one point P (for example, the point Pb1 shown in FIG. 2) among the points P constituting the point group Cp, and selects the point Pb1 as the first point P1. And Subsequently, the control unit 14 is located on the origin side (left side in the figure) of the frequency axis Ax along the frequency axis Ax with respect to the first point P1, and does not sandwich another point P (that is, N pieces of points). An adjacent point Pa1 is selected (with 0 points P as an example in between), and this point Pa1 is set as the second point P2. Next, the control unit 14 is located on the front end side (right side in the figure) of the frequency axis Ax along the frequency axis Ax with respect to the first point P1, and does not sandwich another point P (that is, M examples) Next, the adjacent point Pc1 is selected (with the zero point P between) as the third point P3 (see the column “Pb1” in the “first” column in FIG. 4).

  Subsequently, the control unit 14 determines which of the nine first designated patterns F1 to F9 shown in FIG. 3 is a pattern classified according to the magnitude relationship of the impedances at the three points Pa1 to Pc1 selected as described above. And if any of the first designated patterns F corresponds, the weight value V set for the first designated pattern F is set as the weight value V of the first point P1. get. In this case, as shown in FIG. 2, since the pattern classified according to the magnitude relationship of the impedances at the points Pa1 to Pc1 corresponds to the first designated pattern F3 shown in FIG. 3, the control unit 14 uses the first designated pattern F3. Is obtained as the weighting value V of the point Pb1 set as the first point P1 (see the column “Pb1” in the “first” column in FIG. 4).

  Next, the control unit 14 changes the point P to be selected as the first point P1 to the third point P3 in the point group Cp while changing the process of acquiring the weighting value V without changing M and N. To the first point P1 to the third point P3 are repeated for all combinations (see the “first” column in FIG. 4), and the first first acquisition process is terminated.

  Subsequently, the control unit 14 executes a first acquisition process for the second time. In the second first acquisition process, the control unit 14 is located closer to the origin point of the frequency axis Ax than the first point P1 and sandwiches one point P as an example of N to the first point P1. Adjacent (that is, every other adjacent point P) is selected as the second point P2, and one point P as an example of M is located on the tip side of the frequency axis Ax with respect to the first point P1. A point P adjacent to the first point P1 (that is, adjacent to every other point) is selected as the third point P3, and the same process as the first acquisition process described above is performed (FIG. 4). (Refer to the “second time” column).

  Next, when the second first acquisition process is completed, the control unit 14 executes the third first acquisition process. In this case, the control unit 14 is located closer to the origin of the frequency axis Ax than the first point P1 and is adjacent to the first point P1 with two N points P as an example sandwiched therebetween (that is, two points). A point P adjacent to each other) is selected as the second point P2, and the first point P1 is located on the tip side of the frequency axis Ax with respect to the first point P1 and sandwiches two M points P as an example. 4 is selected as the third point P3, and the same process as the first acquisition process described above is performed ("third" column in FIG. 4). reference).

  Subsequently, the control unit 14 executes a pole determination process. In this extreme point determination process, the control unit 14 calculates a total value Vt obtained by summing the weight values V acquired in the first acquisition process 3 (an example of L) from the first to the third time for each point P. Calculate (see FIG. 4). Next, the control unit 14 selects a point P (in this example, the point Pg1) that satisfies the condition that the total value Vt is equal to or greater than the first specified value (for example, “8” or greater) and is the largest as the extreme point in the point group Cp. Is determined. Here, in the first acquisition process, the control unit 14 corresponds to the first designated pattern F3 in which the pattern classified by the magnitude relationship of the impedances at the three points P with the point Pg1 as the first point P1 indicates the maximum point. Then, it is determined (see the row “Pg1” in the figure). In this case, when the control unit 14 determines that the pattern corresponds to the first designated pattern F3 indicating the maximum point in one or more first acquisition processes in the L first acquisition processes, the point determined as the extreme point Let P (in this example, point Pg1) be a local maximum point. Subsequently, the control unit 14 controls the display unit 12 to display the cursor line Cl indicating that the point Pg1 is the extreme point through the point Pg1 determined as the extreme point as shown in FIG. Character information Iv indicating the frequency and impedance at the point Pg1 is displayed.

  In this case, using a conventional measuring device that searches for a pole based only on the pattern of impedance magnitude relationships at three adjacent points P without sandwiching another point P, the pole of the waveform W1 shown in FIG. In addition to the point Pg1 that should be searched for as an extreme point, the points Pb1, Pc1, Pj1, Pk1, Pm1, and Pn1 that are likely to have changed measurement values due to noise superposition and measurement errors are also included. As a result, the detection result may be inaccurate. On the other hand, in this waveform display device 1, the first acquisition process in which the process of acquiring the weight value V is repeatedly performed while changing the three points P is performed for the other points P sandwiched between the three points P. The process is executed a plurality of times with different numbers (that is, with different intervals between the three points P). Therefore, in the waveform display device 1, for example, it is determined that the sudden impedance change pattern corresponds to the first designated pattern F indicating the extreme point in one first acquisition process among the plurality of first acquisition processes. Even if it is done, it may be determined that it does not correspond to the first designated pattern F indicating the extreme point in the other first acquisition process. Therefore, in this waveform display device 1, the determination result that the sudden impedance change pattern corresponds to the first designated pattern F indicating the extreme point is diluted by executing the first acquisition process a plurality of times (that is, the extreme point). As a result, the influence of a sudden impedance change due to noise superposition or measurement error is reduced, and is originally searched as a pole. Only the point Pg1 to be detected can be accurately detected as a pole point. Further, in this waveform display device 1, by setting a large number of other points P sandwiched between the three points P or by setting a large number of times of the first acquisition process, noise superimposition and measurement errors are set. By minimizing the impact of sudden impedance changes due to, setting the number of other points P sandwiched between the three points P, or setting the number of first acquisition processes to be small, It is possible to determine even a small change in impedance as a pole.

  Next, for example, in the state where the waveform W2 shown in FIG. 5 is displayed on the display unit 12, when searching for the extreme point in the displayed waveform W2, the search start key of the operation unit 13 is operated to control the control unit 14. To execute the search process. At this time, the control unit 14 specifies the point group Cp composed of the points Pa2 to Po2 on the displayed waveform W2, and then performs the above-described first acquisition process by changing N and M to 3 ( An example of L)

  Subsequently, the control unit 14 executes the above-described extreme point determination process, and calculates a total value Vt obtained by summing the weight values V acquired in the first acquisition process three times for each point P (see FIG. 6). . In this case, as shown in the figure, since the total value Vt of the points Pg2 is the largest, this point Pg2 is determined as the extreme point in the point group Cp. Here, in the first acquisition process, the control unit 14 corresponds to the first designated pattern F7 in which the pattern classified by the magnitude relationship of the impedances at the three points P with the point Pg2 as the first point P1 indicates the minimum point. Then, it is determined (see the row “Pg1” in the figure). In this case, when the control unit 14 determines that the pattern corresponds to the first designated pattern F7 indicating the minimum point in one or more first acquisition processes in the L first acquisition processes, the point determined as the extreme point Let P (point Pg1 in this example) be the minimum point. Next, the control unit 14 controls the display unit 12 to display a cursor line Cl indicating that the point Pg2 is the extreme point through the point Pg2 determined as the extreme point, as shown in FIG. 5, and the point Pg2 Character information Iv indicating the frequency and impedance at is displayed. Also in this example, since the process of acquiring the weight value V is executed a plurality of times with different numbers of other points P sandwiched between the three points P, sudden impedance due to noise superposition or measurement error As a result of preventing the change from being determined as a pole, the pole in the waveform W2 is accurately detected.

  As described above, in the waveform display device 1 and the measurement method, patterns classified according to the magnitude relationship of the respective second parameters at the three points P (the first point P1 to the third point P3) on the waveform W are designated in advance. The first acquisition process in which the process of acquiring the weighting value V set for the first specified pattern F when the first specified pattern F is satisfied is repeated while changing the three points P. The first is performed a plurality of times with different numbers of other points P sandwiched between the two points P, and the first condition that satisfies the condition that the total value Vt of the weight values V acquired in each first acquisition process is equal to or greater than the first specified value. An extreme point determination process for determining the point P1 as an extreme point is executed. Therefore, according to the waveform display device 1 and the measurement method, for example, the first designated pattern in which the sudden impedance change pattern indicates the extreme point in one first acquisition process among the plurality of first acquisition processes. Even if it is determined that it corresponds to F, it may be determined that it does not correspond to the first designated pattern F indicating the extreme point in another first acquisition process. Therefore, according to the waveform display device 1 and the measurement method, the determination result that the sudden impedance change pattern corresponds to the first designated pattern F indicating the extreme point is diluted by executing the first acquisition process a plurality of times. (That is, the determination result of whether or not it corresponds to the first designated pattern F indicating the extreme point is averaged), and as a result, the influence of sudden impedance change due to noise superposition or measurement error is reduced, Only the point P that should be searched for as an extreme point can be accurately detected as an extreme point.

  Further, according to the waveform display device 1 and the measurement method, the point group having the largest total value Vt of the weighted values V acquired in the L first acquisition processes is determined as the extreme point in the point group Cp. Among the points P constituting Cp, only the point P corresponding to the top of the convex portion in the waveform W can be detected as the maximum point, and only the point P corresponding to the bottom of the concave portion in the waveform W can be detected as the minimum point. .

  In the waveform display device 1, a plurality of types of first designated patterns F are provided, and weight values V having different sizes are set for the first designated patterns F. In this case, for example, in the configuration in which only one first designated pattern F is designated, the pattern of the magnitude relationship of each second parameter at the three points P is slightly different from the one first designated pattern F. The weight value V cannot be acquired and may not be detected as a pole. On the other hand, in the waveform display device 1, by providing a plurality of types of the first designated pattern F, it is possible to make it correspond to any of the first designated patterns F. As a result, such a point P is determined as a pole. can do.

  The waveform display device 1 is configured so that at least one of M and N can be arbitrarily set. For this reason, according to this waveform display device 1, for example, by setting at least one of M and N to a large value and increasing the number of other points P sandwiched between the three points P, noise can be reduced. It is possible to further reduce the influence of sudden impedance changes due to superposition and measurement errors. In addition, for example, by setting at least one of M and N to a small value and reducing the number of other points P sandwiched between the three points P, it is possible to determine a small change in impedance as an extreme point. be able to.

  The waveform display device 1 is configured such that L can be set arbitrarily. For this reason, according to this waveform display device 1, for example, by setting L to a large value and setting the number of times of the first acquisition process to be large, the influence of sudden impedance changes due to noise superposition or measurement errors is achieved. Can be further reduced, and the accuracy of search processing for searching for extreme points can be further improved. In addition, for example, by setting L to a small value and setting the number of times of the first acquisition process to be small, it is possible to determine a small change in impedance as an extreme point, and to sufficiently increase the processing time of the search process. Can be shortened.

  In addition, as shown in FIG. 7, a state in which a waveform W <b> 3 having a plurality of uneven portions A <b> 1 to A <b> 4 having a minimum point and a maximum point (hereinafter also referred to as “uneven portion A” when not distinguished) is displayed on the display unit 12. In the above, the above-described search processing can be executed on the waveform W3. At this time, only one point P in any one of the uneven portions A1 to A4 is searched as a maximum point, and only one point P in any one uneven portion A is a minimum point. Will be searched as. When it is desired to separately search the poles in each of the uneven portions A1 to A4 of the waveform W3, the control unit 14 is caused to execute the following process.

  First, the control unit 14 executes a second acquisition process similar to the first acquisition process described above for all the points P in the waveform W3 displayed on the display unit 12. In the second acquisition process, the first point P1, the second point P2, and the third point P3 in the first acquisition process described above are set as the fourth point, the fifth point, and the sixth point, respectively, and N is Q (Q is 0). The process of acquiring the weight value V is performed with M as P (P is an integer of 0 or more), the first designated pattern as the second designated pattern. In addition, the control unit 14 executes this second acquisition process O (O is an integer of 2 or more) times. In this case, Q, P, and O can be arbitrarily set by an operation on the operation unit 13.

  Subsequently, the control unit 14 calculates the total value Vt by summing up the weight values V acquired in the second acquisition process O times for each fourth point P4. Next, the control unit 14 specifies an aggregate of the fourth points P4 in which the fourth points P4 having the total value Vt equal to or greater than the second predetermined value (for example, “3” is not particularly limited, but not limited). To do. Subsequently, the control unit 14 accumulates the total value Vt of all the fourth points P4 constituting the aggregate, and the accumulated value Vs is a third predetermined value (not particularly limited, for example, “20 ]) At the above time, the aggregate is specified as the point group Cp. By performing this process, the plurality of uneven portions A in the waveform W3 are specified as the point group Cp. Next, the control unit 14 performs the above-described search process (first acquisition process and extreme point determination process) for the identified point group Cp. Thereby, the extreme points in each of the plurality of uneven portions A specified as the point group Cp in the waveform W3 are separately searched.

  Thus, according to this configuration, the second acquisition process for each point P on the waveform W is executed O times with Q and P changed, and the weighting acquired in the O second acquisition process is performed. A cumulative value obtained by identifying a set of fourth points P4 in which the fourth points P4 having a total value Vt of the values V equal to or greater than the second specified value are continuous, and accumulating the total values Vt of all the fourth points P4 in the set. When Vs is greater than or equal to the second specified value, the search is performed using the aggregate as a point group Cp (first acquisition process and pole determination process), so that the poles in the waveform W3 in which a plurality of uneven portions A exist are obtained. In the search, since each uneven portion A can be specified as the point group Cp, the extreme points in each uneven portion A can be searched separately.

  In addition, according to this configuration, since at least one of P and Q can be arbitrarily set, for example, by setting at least one of P and Q to a large value, it is suddenly caused by noise superposition or measurement error. In particular, the point P where the impedance has changed can be prevented from being included in the point group Cp that is the target of the search process (first acquisition process and pole determination process). Further, for example, by setting at least one of P and Q to a small value, the point P where the impedance has changed to a certain extent can be included in the point group Cp to be searched.

  Further, according to this configuration, since O can be arbitrarily set, for example, by setting O to a large value, the point P where the impedance suddenly changes due to noise superposition or measurement error. Can be excluded from the point group Cp targeted for the search process (first acquisition process and pole determination process), and the accuracy of the process of specifying the point group Cp can be sufficiently improved. Further, for example, by setting O to a small value, the point P where the impedance has changed to a certain extent can be included in the point group Cp to be searched, and the process of specifying the point group Cp The processing time can be shortened sufficiently.

  In the above configuration and method, N is set to “0”, “1”, and “2”, and M is set to “0”, “1”, and “2”. , Can be set to any integer greater than or equal to zero. In the above configuration and method, N and M can be set to different values. In addition, L as the number of times to execute the first acquisition process is set to “3”, but L can be set to any integer equal to or greater than 2 (that is, the first acquisition process is performed twice or more). Can be run any number of times). Also, instead of the configuration and method for setting L, M, N, O, P, and Q by operating the operation unit 13, some or all of L, M, N, O, P, and Q are set in advance. It is also possible to adopt a configuration and a method to be set.

  In addition, the example in which nine first specified patterns F are specified has been described above, but the first specified pattern F may be one of the nine first specified patterns F described above, It may be an arbitrary plural number among the nine first designated patterns F. Also, it is possible to designate a first designated pattern F different from the nine first designated patterns F described above. Specifically, the above-described first designated patterns F1, F3, F7, and F9 include both cases where the difference between Z2 and Z1 and the difference between Z1 and Z3 are the same and different. In the designated patterns F1, F3, F7, and F9, the first designated pattern F in which the difference between Z2 and Z1 is equal to the difference between Z1 and Z3, and the difference between Z2 and Z1 in the first designated patterns F1, F3, F7, and F9 described above. And a first designated pattern F having a difference between Z1 and Z3 can be designated.

  Further, the example in which the first point P1 having the largest total value Vt is determined as the extreme point has been described above. However, the configuration and method for determining the first point P1 having the total value Vt equal to or greater than a predetermined value as the extreme point are adopted. You can also.

  Further, a physical quantity (in the above example, as a second parameter for a change in frequency as a first parameter in a coordinate plane composed of a frequency axis Ax as a first parameter axis and an impedance axis Ay as a second parameter axis. Although the example applied when detecting the extreme point of the waveform W indicating the change in impedance) has been described above, it shows changes in various physical quantities such as the voltage value, current value, power value, resistance value, and temperature as the second parameter. Of course, it can be applied when detecting the extreme points of the waveform. Further, in the coordinate plane constituted by the time axis as the first parameter axis and the second parameter axis, various physical quantities such as a voltage value, a current value, a power value, a resistance value, impedance, and temperature are used as the second parameter. Of course, the second parameter can be applied when detecting the extreme point of the waveform indicating the change over time.

DESCRIPTION OF SYMBOLS 1 Waveform display apparatus 14 Control part Ax Frequency axis Ay Impedance axis Cp1, Cp2 Point group F1-F9 1st designation | designated pattern P1 1st point P2 2nd point P3 3rd point Pa1-Po1, Pa2-Po2 point V Weighting value Vt Total Value Vs Cumulative value W1-W3 Waveform

Claims (9)

Retrieval processing for searching for a pole of a waveform indicating a change in the second parameter with respect to a change in the first parameter in a coordinate plane constituted by the first parameter axis for the first parameter and the second parameter axis for the second parameter A measuring device including a processing unit for executing
In the search process, the processing unit includes:
A first point that is one point in a point group composed of a plurality of points on the waveform having different values of the first parameter by predetermined values, and the first parameter axis than the first point A second point that is adjacent to N (N is an integer greater than or equal to 0) points located on the origin side of the first parameter axis along the first parameter axis, and along the first parameter axis from the first point. And selecting a third point adjacent to the M point (M is an integer of 0 or more) located on the tip side of the first parameter axis, and each of the second parameters at the three points. When the pattern classified by the magnitude relationship of the two corresponds to the first designated pattern designated in advance, the weight value set for the first designated pattern is set as the first point. L (L is an integer greater than or equal to 2) by performing a first acquisition process in which the process of acquiring the weight value of the point is repeated while changing the point that is the first point, with at least one of N and M different ) Run and
The weight values acquired in the first acquisition process of L times are totaled for each point as the first point, and the points satisfying the condition that the total value is equal to or more than a first specified value defined in advance are A measuring device that performs a pole determination process for determining the above-mentioned pole in a point group.   The measurement apparatus according to claim 1, wherein the processing unit determines the point having the largest total value as a point satisfying the condition in the pole determination processing. A plurality of types of the first designated patterns are provided, and the weight values having different sizes are set for the first designated patterns.
When the pattern classified according to the magnitude relationship of the second parameter corresponds to any of the first specified patterns, the processing unit calculates the weight value set for the corresponding first specified pattern. The measurement apparatus according to claim 1, wherein the measurement apparatus acquires the weight value of the point as the first point. The processing unit is located at the origin point of the first parameter axis along the first parameter axis with respect to a fourth point that is one point at the point of the waveform and Q (Q Is an integer greater than or equal to 0) adjacent fifth points, and P (P is 0) located on the tip side of the first parameter axis along the first parameter axis with respect to the fourth point. The above-mentioned integers) are selected on the sixth point adjacent to each other with the number of points in between, and a pattern classified by the magnitude relationship of each of the second parameters at the three points is designated as a second designated pattern designated in advance. The process of acquiring the weighting value set for the second designated pattern as the weighting value of the fourth point when applicable is repeated while changing the fourth point. A second acquisition processing performed by return by varying at least one of said Q and said P performs O (O is an integer of 2 or more) times,
The weight value acquired in the second acquisition process of O times is totaled for each point as the fourth point, and an aggregate of the points in which the total value is equal to or greater than a predetermined second predetermined value is obtained. The total value of all the points constituting the aggregate is specified and the search processing is executed with the aggregate as the point group when the cumulative value is equal to or greater than a predetermined third predetermined value. The measuring apparatus according to any one of claims 1 to 3.   The measurement apparatus according to claim 1, wherein at least one of the M and the N can be arbitrarily set.   The measuring apparatus according to claim 1, wherein L is configured to be arbitrarily settable.   The measuring apparatus according to claim 4, wherein at least one of P and Q can be arbitrarily set.   The measuring apparatus according to claim 4, wherein the O is configured to be arbitrarily settable. Retrieval processing for searching for a pole of a waveform indicating a change in the second parameter with respect to a change in the first parameter in a coordinate plane constituted by the first parameter axis for the first parameter and the second parameter axis for the second parameter A measurement method for performing
In the search process,
A first point that is one point in a point group composed of a plurality of points on the waveform having different values of the first parameter by predetermined values, and the first parameter axis than the first point A second point that is adjacent to N (N is an integer greater than or equal to 0) points located on the origin side of the first parameter axis along the first parameter axis, and along the first parameter axis from the first point. And selecting a third point adjacent to the M point (M is an integer of 0 or more) located on the tip side of the first parameter axis, and each of the second parameters at the three points. When the pattern classified by the magnitude relationship of the two corresponds to the first designated pattern designated in advance, the weight value set for the first designated pattern is set as the first point. L (L is an integer greater than or equal to 2) by performing a first acquisition process in which the process of acquiring the weight value of the point is repeated while changing the point that is the first point, with at least one of N and M different ) Run and
The weight values acquired in the first acquisition process of L times are totaled for each point as the first point, and the points satisfying the condition that the total value is equal to or more than a first specified value defined in advance are A measurement method for executing an extreme point determination process for determining an extreme point in a point group.

Images