JP2015021952A5 - - Google Patents

Download PDF

Info

Publication number
JP2015021952A5
JP2015021952A5 JP2013153092A JP2013153092A JP2015021952A5 JP 2015021952 A5 JP2015021952 A5 JP 2015021952A5 JP 2013153092 A JP2013153092 A JP 2013153092A JP 2013153092 A JP2013153092 A JP 2013153092A JP 2015021952 A5 JP2015021952 A5 JP 2015021952A5
Authority
JP
Japan
Prior art keywords
curve
coordinate system
measurement
sample
calibration curve
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2013153092A
Other languages
Japanese (ja)
Other versions
JP2015021952A (en
JP6104746B2 (en
Filing date
Publication date
Application filed filed Critical
Priority to JP2013153092A priority Critical patent/JP6104746B2/en
Priority claimed from JP2013153092A external-priority patent/JP6104746B2/en
Publication of JP2015021952A publication Critical patent/JP2015021952A/en
Publication of JP2015021952A5 publication Critical patent/JP2015021952A5/ja
Application granted granted Critical
Publication of JP6104746B2 publication Critical patent/JP6104746B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Description

上記目的を達成するために、本発明は、分析対象の試料を収容した試料容器と、試料の分析に用いる試薬を収容した試薬容器と、前記試料と試薬とを混合した反応液を収容反応する反応容器と、前記試料容器から前記反応容器に試料を分注する試料分注機構と、前記試薬容器から前記反応容器に試薬を分注する試薬分注機構と、散乱光測定用の光源から前記反応容器に収容された反応液に照射された光の散乱光量を測定する散乱光測定機構と、前記反応容器に収容された反応液の吸光度を測定する吸光度測定機構と、予め用意した成分が既知の基準試料に係る反応液の前記散乱光測定機構による測定結果から散乱光量検量線を演算する散乱光量検量線演算部と、前記基準試料に係る反応液の前記吸光度測定機構による測定結果から吸光度検量線を演算する吸光度検量線演算部と、予め定めた演算基準値に基づいて前記散乱光量検量線及び前記吸光度検量線の検量線上に求めた演算基準点を用いて、一方の検量線の座標系を他方の検量線の座標系に変換する座標系変換式を演算する変換式演算部と、前記座標系変換式を用いて一方の検量線の座標系を他方の検量線の座標系に変換する座標系変換部と、前記演算基準点を含む範囲であって、前記座標系変換式により変換された座標系における一方の検量線と他方の検量線とが重複しているかどうかを判定するために予め定めた重複条件を満たすような範囲を算出する重複範囲演算部と、前記重複範囲演算部により算出された重複範囲に基づいて、前記散乱光測定機構により測定を行う測定範囲と、前記吸光度測定機構により測定を行う測定範囲とを算出する測定範囲演算部とを備えたものとする。 In order to achieve the above object, the present invention accommodates and reacts a sample container containing a sample to be analyzed, a reagent container containing a reagent used for analyzing the sample, and a reaction liquid obtained by mixing the sample and the reagent. A reaction container, a sample dispensing mechanism for dispensing a sample from the sample container to the reaction container, a reagent dispensing mechanism for dispensing a reagent from the reagent container to the reaction container, and a light source for scattered light measurement Scattered light measurement mechanism for measuring the amount of light scattered on the reaction liquid contained in the reaction vessel, absorbance measurement mechanism for measuring the absorbance of the reaction liquid contained in the reaction vessel, and components prepared in advance are known Scattering light quantity calibration curve calculation unit for calculating the scattered light quantity calibration curve from the measurement result of the reaction liquid related to the reference sample by the scattered light measurement mechanism, and absorbance calibration from the measurement result of the reaction liquid related to the reference sample by the absorbance measurement mechanism And the absorbance calibration curve calculating unit for calculating a, by using an arithmetic reference points determined on a calibration curve of the amount of scattered light calibration curve and the absorbance calibration curve based on a predetermined operational reference value, the coordinate system of one of the calibration curve A conversion formula calculation unit that calculates a coordinate system conversion formula that converts to the coordinate system of the other calibration curve, and coordinates that convert the coordinate system of one calibration curve to the coordinate system of the other calibration curve using the coordinate system conversion formula In order to determine in advance whether or not one calibration curve and the other calibration curve in the coordinate system converted by the coordinate system conversion formula overlap with the system conversion unit and the calculation reference point. An overlapping range calculation unit that calculates a range that satisfies a predetermined overlapping condition, a measurement range that is measured by the scattered light measurement mechanism based on the overlapping range calculated by the overlapping range calculation unit, and the absorbance measurement mechanism Measure with And that a measurement range calculating unit for calculating a constant range.

(1−7.3)変換式演算部
コンピュータ18は、予め定めた演算基準値に基づいて散乱光量検量線及び吸光度検量線の検量線上に求めた演算基準点を用いて、一方の検量線の座標系を他方の検量線の座標系に変換する座標系変換式を演算する変換式演算部としての機能を有している。
(1-7.3) Conversion Formula Calculation Unit The computer 18 uses the calculation reference point obtained on the calibration curve of the scattered light amount calibration curve and the absorbance calibration curve based on a predetermined calculation reference value, and calculates one calibration curve. It has a function as a conversion formula calculation unit that calculates a coordinate system conversion formula for converting the coordinate system to the coordinate system of the other calibration curve.

(1−7.9)曲線用変換式演算部
コンピュータ18は、予め定めた曲線用演算基準値に基づいて散乱光量曲線及び吸光度曲線の曲線上に求めた曲線用演算基準点を用いて、一方の曲線の座標系を他方の曲線の座標系に変換する曲線用座標系変換式を演算する曲線用変換式演算部としての機能を有している。
(1-7.9) Curve Conversion Expression Calculation Unit The computer 18 uses a curve calculation reference point obtained on the scattered light amount curve and the absorbance curve based on a predetermined curve calculation reference value. It has a function as a curve conversion equation calculation unit for calculating a curve coordinate system conversion equation for converting the coordinate system of the curve into the coordinate system of the other curve.

(2−3.1)変換式演算処理
変換式演算処理は、予め定めた濃度に関する演算基準値a2(図7参照)に基づいて散乱光量検量線104及び吸光度検量線105の検量線上に求めた演算基準点P1,P2(図4、図5参照)を用いて、一方の検量線(例えば、散乱光量検量線104)の座標系を他方の検量線(例えば、吸光度検量線105)の座標系に変換する座標系変換式を演算する処理である。演算基準点P1,P2は、後述する重複範囲(相関範囲)内となるような点を予め実験的・経験的に求めたものであり、メモリ11に記憶されている。
(2-3.1) Conversion Formula Calculation Processing The conversion formula calculation processing was obtained on the calibration curves of the scattered light amount calibration curve 104 and the absorbance calibration curve 105 based on the calculation reference value a2 (see FIG. 7) relating to a predetermined concentration. Using the calculation reference points P1 and P2 (see FIGS. 4 and 5), the coordinate system of one calibration curve (for example, the scattered light amount calibration curve 104) is changed to the coordinate system of the other calibration curve (for example, the absorbance calibration curve 105). This is a process of calculating a coordinate system conversion expression to be converted into. The calculation reference points P1 and P2 are obtained in advance experimentally and empirically as points that fall within the overlapping range (correlation range) described later, and are stored in the memory 11.

座標系変換式としては種々の関数が挙げられるが、例えば、各濃度における変換後の値をY、元の値をX、係数をA,Bとする(式1)
Y=AX+B ・・・・(式1)
を座標系変換式として用いる場合が考えられる。このときの係数A,Bは、濃度に関する演算基準値に基づいて各検量線上に求めた演算基準点を用いて算出される。
The coordinate system conversion formula includes various functions. For example, the converted value at each density is Y, the original value is X, and the coefficients are A and B (Formula 1).
Y = AX + B (Formula 1)
Can be used as a coordinate system conversion formula. Coefficients A and B at this time are calculated using calculation reference points obtained on each calibration curve based on calculation reference values related to concentration.

(2−6.3)曲線用変換式演算処理
曲線用変換式演算処理は、散乱光量曲線及び吸光度曲線に対して、検量線に対する変換式演算処理と同様の処理を行うものである。すなわち、曲線用変換式演算処理は、予め定めた曲線用演算基準値に基づいて散乱光量曲線及び吸光度曲線の曲線上に求めた曲線用演算基準点を用いて、一方の曲線(例えば、散乱光量曲線)の座標系を他方の曲線(例えば、吸光度曲線)の座標系に変換する曲線用座標系変換式を演算する処理である。曲線用演算基準点は、予め実験的・経験的に求めたものであり、メモリ11に記憶されている。
(2-6.3) Curve Conversion Formula Calculation Processing The curve conversion formula calculation processing performs the same processing as the conversion formula calculation processing for the calibration curve on the scattered light amount curve and the absorbance curve. That is, the curve conversion formula calculation process uses one curve (for example, the scattered light amount) using the curve calculation reference point obtained on the curve of the scattered light amount curve and the absorbance curve based on a predetermined curve calculation reference value. This is a process of calculating a curve coordinate system conversion formula for converting a coordinate system of a curve into a coordinate system of the other curve (for example, an absorbance curve). The curve calculation reference point is obtained in advance experimentally and empirically and is stored in the memory 11.

これに対し本願発明は、予め定めた演算基準値に基づいて散乱光量検量線及び吸光度検量線の検量線上に求めた演算基準点を用いて、一方の検量線の座標系を他方の検量線の座標系に変換する座標系変換式を演算し、この座標系変換式を用いて一方の検量線の座標系を他方の検量線の座標系に変換し、演算基準点を含む範囲であって、座標系変換式により変換された座標系における一方の検量線と他方の検量線とが重複しているかどうかを判定するために予め定めた重複条件を満たすような範囲を算出し、算出された重複範囲に基づいて、散乱光測定機構により測定を行う測定範囲と、吸光度測定機構により測定を行う測定範囲とを算出するように構成したので、ように構成したので、試料における検出対象成分の濃度に対して、より精度の高い分析結果を得られる分析方法を容易に判断することができる。 On the other hand, the present invention uses the calculation reference point obtained on the calibration curve of the scattered light amount calibration curve and the absorbance calibration curve based on the predetermined calculation reference value, and the coordinate system of one calibration curve is set to the other calibration curve. A coordinate system conversion formula to be converted into the coordinate system is calculated, and using this coordinate system conversion formula, the coordinate system of one calibration curve is converted to the coordinate system of the other calibration curve, and a range including a calculation reference point, In order to determine whether one calibration curve and the other calibration curve in the coordinate system converted by the coordinate system conversion formula overlap, a range that satisfies a predetermined overlap condition is calculated, and the calculated overlap Based on the range, it is configured to calculate the measurement range for measurement by the scattered light measurement mechanism and the measurement range for measurement by the absorbance measurement mechanism. On the other hand, more accurate Analytical methods resulting gastric analysis can be easily determined.

Claims (6)

分析対象の試料を収容した試料容器と、
試料の分析に用いる試薬を収容した試薬容器と、
前記試料と試薬とを混合した反応液を収容反応する反応容器と、
前記試料容器から前記反応容器に試料を分注する試料分注機構と、
前記試薬容器から前記反応容器に試薬を分注する試薬分注機構と、
散乱光測定用の光源から前記反応容器に収容された反応液に照射された光の散乱光量を測定する散乱光測定機構と、
前記反応容器に収容された反応液の吸光度を測定する吸光度測定機構と、
予め用意した成分が既知の基準試料に係る反応液の前記散乱光測定機構による測定結果から散乱光量検量線を演算する散乱光量検量線演算部と、
前記基準試料に係る反応液の前記吸光度測定機構による測定結果から吸光度検量線を演算する吸光度検量線演算部と、
予め定めた演算基準値に基づいて前記散乱光量検量線及び前記吸光度検量線の検量線上に求めた演算基準点を用いて、一方の検量線の座標系を他方の検量線の座標系に変換する座標系変換式を演算する変換式演算部と、
前記座標系変換式を用いて一方の検量線の座標系を他方の検量線の座標系に変換する座標系変換部と、
前記演算基準点を含む範囲であって、前記座標系変換式により変換された座標系における一方の検量線と他方の検量線とが重複しているかどうかを判定するために予め定めた重複条件を満たすような範囲を算出する重複範囲演算部と、
前記重複範囲演算部により算出された重複範囲に基づいて、前記散乱光測定機構により測定を行う測定範囲と、前記吸光度測定機構により測定を行う測定範囲とを算出する測定範囲演算部と
を備えたことを特徴とする自動分析装置。
A sample container containing a sample to be analyzed;
A reagent container containing a reagent used for analyzing the sample;
A reaction container for containing and reacting a reaction liquid in which the sample and the reagent are mixed;
A sample dispensing mechanism for dispensing a sample from the sample container to the reaction container;
A reagent dispensing mechanism for dispensing a reagent from the reagent container to the reaction container;
A scattered light measurement mechanism for measuring the amount of light scattered from the light source for scattered light measurement to the reaction solution contained in the reaction vessel;
An absorbance measurement mechanism for measuring the absorbance of the reaction solution contained in the reaction vessel;
A scattered light amount calibration curve calculation unit that calculates a scattered light amount calibration curve from a measurement result by the scattered light measurement mechanism of a reaction liquid related to a reference sample whose components prepared in advance are known;
An absorbance calibration curve calculation unit for calculating an absorbance calibration curve from a measurement result of the absorbance measurement mechanism of the reaction solution related to the reference sample;
Using the calculation reference point obtained on the calibration curve of the scattered light amount calibration curve and the absorbance calibration curve based on a predetermined calculation reference value, the coordinate system of one calibration curve is converted to the coordinate system of the other calibration curve. A conversion expression calculation unit for calculating a coordinate system conversion expression;
A coordinate system conversion unit that converts the coordinate system of one calibration curve into the coordinate system of the other calibration curve using the coordinate system conversion formula;
A predetermined overlapping condition for determining whether one calibration curve and the other calibration curve in the coordinate system converted by the coordinate system conversion formula are in a range including the calculation reference point. An overlapping range calculation unit for calculating a range to satisfy,
Based on the overlap range calculated by the overlap range calculation unit, the measurement range calculation unit for calculating the measurement range to be measured by the scattered light measurement mechanism and the measurement range to be measured by the absorbance measurement mechanism An automatic analyzer characterized by that.
請求項1記載の自動分析装置において、
前記分析対象の試料に係る反応液の前記散乱光測定機構による測定結果から、前記反応液の反応過程における散乱光量の変化を示す散乱光曲線を演算する散乱光量曲線演算部と、
前記分析対象の試料に係る反応液の前記吸光度測定機構による測定結果から、前記反応液の反応過程における吸光度の変化を示す吸光度曲線を演算する吸光度曲線演算部と、
予め定めた曲線用演算基準値に基づいて前記散乱光量曲線及び前記吸光度曲線の曲線上に求めた曲線用演算基準点を用いて、一方の曲線の座標系を他方の曲線の座標系に変換する曲線用座標系変換式を演算する曲線用変換式演算部と、
前記曲線用座標系変換式を用いて一方の曲線の座標系を他方の曲線の座標系に変換する曲線用座標系変換部と、
前記曲線用座標系変換式により変換された座標系における一方の曲線と他方の曲線との重複状態に基づいて、前記試料の測定結果の異常を判定する第1異常判定部と
を備えたことを特徴とする自動分析装置。
The automatic analyzer according to claim 1, wherein
From the measurement result by the scattered light measuring mechanism of the reaction solution according to the sample of the analysis target, and the amount of scattered light curve calculating unit for calculating a scattering light amount curve showing the change amount of scattered light in the reaction process of the reaction solution,
An absorbance curve calculation unit that calculates an absorbance curve indicating a change in absorbance in the reaction process of the reaction solution from a measurement result of the absorbance measurement mechanism of the reaction solution related to the sample to be analyzed;
Using the curve calculation reference point obtained on the curve of the scattered light amount curve and the absorbance curve based on a predetermined curve calculation reference value, the coordinate system of one curve is converted to the coordinate system of the other curve. A curve conversion equation calculation unit for calculating a curve coordinate system conversion equation;
A curve coordinate system conversion unit that converts the coordinate system of one curve into the coordinate system of the other curve using the curve coordinate system conversion formula;
A first abnormality determining unit that determines abnormality of the measurement result of the sample based on an overlapping state of one curve and the other curve in the coordinate system converted by the curve coordinate system conversion formula; A featured automatic analyzer.
請求項2記載の自動分析装置において、
前記変換式演算部により演算された座標系変換式と、曲線用変換式演算部曲線により演算された曲線用座標系変換式の係数の比較結果に基づいて、前記試料の測定結果の異常を判定する第2異常判定部を備えたことを特徴とする自動分析装置。
The automatic analyzer according to claim 2,
Based on the comparison result of the coefficients of the coordinate system conversion equation calculated by the conversion equation calculation unit and the curve coordinate conversion equation calculated by the curve, an abnormality in the measurement result of the sample is determined. An automatic analyzer comprising a second abnormality determination unit.
請求項2記載の自動分析装置において、
前記曲線用座標系変換式により変換された座標系における一方の曲線と他方の曲線とが重複しているかどうかを判定するために予め定めた曲線重複条件を満たすような範囲を算出する曲線重複範囲演算部を備え、
測定範囲演算部は、前記曲線重複範囲演算部により算出された重複範囲に基づいて、前記散乱光測定機構により測定を行う測定範囲と、前記吸光度測定機構により測定を行う測定範囲とを再算出する
ことを特徴とする自動分析装置。
The automatic analyzer according to claim 2,
Curve overlap range for calculating a range that satisfies a predetermined curve overlap condition in order to determine whether one curve and the other curve in the coordinate system converted by the curve coordinate system conversion formula overlap. With an arithmetic unit,
The measurement range calculation unit recalculates the measurement range in which measurement is performed by the scattered light measurement mechanism and the measurement range in which measurement is performed by the absorbance measurement mechanism, based on the overlap range calculated by the curve overlap range calculation unit. An automatic analyzer characterized by that.
請求項2〜4の何れか1項記載の自動分析装置において、
前記曲線用座標系変換式を用いて変換された座標系における一方の曲線と他方の曲線とを重複して表示する表示装置と、
前記演算基準値又は前記曲線用演算基準値を再設定する基準値再設定手段と、
前記散乱光測定機構及び前記吸光度測定機構による測定結果、及び、前記基準値再設定手段で再設定された各基準値を用いた前記測定範囲の再計算の実施をオペレータが指示することができる再計算指示手段と
を備えたことを特徴とする自動分析装置。
The automatic analyzer according to any one of claims 2 to 4,
A display device for displaying one curve and the other curve in the coordinate system converted using the curve coordinate system conversion formula,
Reference value resetting means for resetting the calculation reference value or the calculation reference value for the curve;
An operator can instruct execution of recalculation of the measurement range using the measurement results obtained by the scattered light measurement mechanism and the absorbance measurement mechanism, and the reference values reset by the reference value resetting means. An automatic analyzer characterized by comprising a calculation instruction means.
分析対象の試料を収容した試料容器と、
試料の分析に用いる試薬を収容した試薬容器と、
前記試料と試薬とを混合した反応液を収容反応する反応容器と、
前記試料容器から前記反応容器に試料を分注する試料分注機構と、
前記試薬容器から前記反応容器に試薬を分注する試薬分注機構と、
散乱光測定用の光源から前記反応容器に収容された反応液に照射された光の散乱光量を測定する散乱光測定機構と、
前記反応容器に収容された反応液の吸光度を測定する吸光度測定機構と
を備えた自動分析装置の分析方法であって、
予め用意した成分が既知の基準試料に係る反応液の前記散乱光測定機構による測定結果から散乱光量検量線を演算する手順と、
前記基準試料に係る反応液の前記吸光度測定機構による測定結果から吸光度検量線を演算する手順と、
予め定めた演算基準値に基づいて前記散乱光量検量線及び前記吸光度検量線の検量線上に求めた演算基準点を用いて、一方の検量線の座標系を他方の検量線の座標系に変換する座標系変換式を演算する手順と、
前記座標系変換式を用いて一方の検量線の座標系を他方の検量線の座標系に変換し、
前記演算基準点を含む範囲であって、前記座標系変換式により変換された座標系における一方の検量線と他方の検量線とが重複しているかどうかを判定するために予め定めた重複条件を満たすような範囲を算出する手順と、
算出された重複範囲に基づいて、前記散乱光測定機構により測定を行う測定範囲と、前記吸光度測定機構により測定を行う測定範囲とを算出する手順と
を備えたことを特徴とする自動分析装置の分析方法。
A sample container containing a sample to be analyzed;
A reagent container containing a reagent used for analyzing the sample;
A reaction container for containing and reacting a reaction liquid in which the sample and the reagent are mixed;
A sample dispensing mechanism for dispensing a sample from the sample container to the reaction container;
A reagent dispensing mechanism for dispensing a reagent from the reagent container to the reaction container;
A scattered light measurement mechanism for measuring the amount of light scattered from the light source for scattered light measurement to the reaction solution contained in the reaction vessel;
An analysis method of an automatic analyzer equipped with an absorbance measurement mechanism for measuring the absorbance of the reaction solution accommodated in the reaction vessel,
A procedure for calculating a scattered light amount calibration curve from a measurement result by the scattered light measurement mechanism of a reaction liquid relating to a reference sample whose components prepared in advance are known;
A procedure for calculating an absorbance calibration curve from the measurement result of the absorbance measurement mechanism of the reaction solution according to the reference sample;
Using the calculation reference point obtained on the calibration curve of the scattered light amount calibration curve and the absorbance calibration curve based on a predetermined calculation reference value, the coordinate system of one calibration curve is converted to the coordinate system of the other calibration curve. The procedure for calculating the coordinate system conversion formula,
Using the coordinate system conversion formula, convert the coordinate system of one calibration curve to the coordinate system of the other calibration curve,
A predetermined overlapping condition for determining whether one calibration curve and the other calibration curve in the coordinate system converted by the coordinate system conversion formula are in a range including the calculation reference point. A procedure to calculate a range to satisfy,
An automatic analyzer comprising a procedure for calculating a measurement range for measurement by the scattered light measurement mechanism and a measurement range for measurement by the absorbance measurement mechanism based on the calculated overlapping range Analysis method.
JP2013153092A 2013-07-23 2013-07-23 Automatic analyzer and analysis method Active JP6104746B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013153092A JP6104746B2 (en) 2013-07-23 2013-07-23 Automatic analyzer and analysis method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013153092A JP6104746B2 (en) 2013-07-23 2013-07-23 Automatic analyzer and analysis method

Publications (3)

Publication Number Publication Date
JP2015021952A JP2015021952A (en) 2015-02-02
JP2015021952A5 true JP2015021952A5 (en) 2016-04-21
JP6104746B2 JP6104746B2 (en) 2017-03-29

Family

ID=52486505

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013153092A Active JP6104746B2 (en) 2013-07-23 2013-07-23 Automatic analyzer and analysis method

Country Status (1)

Country Link
JP (1) JP6104746B2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6657016B2 (en) * 2016-05-27 2020-03-04 株式会社日立ハイテクノロジーズ Automatic analyzer
CN113281284A (en) * 2016-07-19 2021-08-20 株式会社日立高新技术 Automatic analysis device and automatic analysis method
US11237179B2 (en) 2017-10-31 2022-02-01 Canon Medical Systems Corporation Calibration curve generating method and automatic analyzing apparatus
JP6812577B2 (en) * 2017-12-26 2021-01-13 株式会社日立ハイテク Automatic analyzer and automatic analysis method
CN111323393A (en) * 2020-04-07 2020-06-23 宁波普瑞柏生物技术股份有限公司 Measurement method combining scattering turbidimetry and transmission turbidimetry
CN116685843A (en) * 2020-12-22 2023-09-01 株式会社日立高新技术 Automatic analysis device and analysis method

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60154161A (en) * 1984-01-24 1985-08-13 Shimadzu Corp Formation of calibration curve used for immunoreaction measurement
JPS61247376A (en) * 1985-04-26 1986-11-04 Hitachi Ltd Automated analyzer
JPH06331630A (en) * 1993-05-25 1994-12-02 Daikin Ind Ltd Method for judging calibration result and method for dealing with calibration result
DE19948587A1 (en) * 1999-10-08 2001-04-12 Dade Behring Marburg Gmbh Spectrophotometric and nephelometric detection unit
JP3694449B2 (en) * 1999-10-28 2005-09-14 松下電器産業株式会社 Solution concentration measuring method and solution concentration measuring apparatus
JP2001249134A (en) * 1999-12-28 2001-09-14 Matsushita Electric Ind Co Ltd Reagent for measuring protein concentration, method for measuring protein concentration using it, and urinalysis
JP4287753B2 (en) * 2004-01-19 2009-07-01 株式会社日立ハイテクノロジーズ Analysis equipment
JP2008122333A (en) * 2006-11-15 2008-05-29 Toshiba Corp Automatic analyzer and method for same
JP5037439B2 (en) * 2008-06-23 2012-09-26 株式会社堀場製作所 Analysis equipment
JP2010032505A (en) * 2008-06-30 2010-02-12 Arkray Inc Detection method of target substance, detection reagent used for the same, and uses thereof
JP5599219B2 (en) * 2010-04-20 2014-10-01 株式会社日立ハイテクノロジーズ Automatic analyzer and automatic analysis method
JP5786188B2 (en) * 2010-06-08 2015-09-30 株式会社シノテスト Reagent for measuring C-reactive protein in sample, measuring method, and method for expanding measuring range
JP2012242122A (en) * 2011-05-16 2012-12-10 Hitachi High-Technologies Corp Automatic analysis device and automatic analysis program
JP5860643B2 (en) * 2011-09-08 2016-02-16 株式会社日立ハイテクノロジーズ Automatic analyzer
JP5740264B2 (en) * 2011-09-20 2015-06-24 株式会社日立ハイテクノロジーズ Automatic analyzer and analysis method

Similar Documents

Publication Publication Date Title
JP2015021952A5 (en)
CN102216784A (en) Automatic analysis device
JP2012242122A5 (en)
US20130132022A1 (en) Automatic analyzer and automatic analysis method
KR101205098B1 (en) Apparatus and method for performing neutralization titration using led color sensor
US9766183B2 (en) Automatic titrator
JP6174411B2 (en) Water quality analyzer and water quality analysis method
JP2015021952A (en) Automatic analysis device and analysis method
JP7380480B2 (en) Hydrogen flame ionization detection method and device for samples containing oxygen
CN107101956A (en) Water base sample fluid measurement and analysis
JP2005189245A5 (en)
JP5860643B2 (en) Automatic analyzer
JP2012042313A5 (en)
JP4941453B2 (en) Odor measuring device
JP6112025B2 (en) Data processing device for particle size distribution measurement, particle size distribution measuring device equipped with the same, data processing method for particle size distribution measurement, and data processing program for particle size distribution measurement
JP5519569B2 (en) X-ray fluorescence analyzer and method
Woosley et al. Re-evaluation of carbonic acid dissociation constants across conditions and the implications for ocean acidification
CN110595932A (en) Device and method for measuring weight concentration of ore pulp
KR101961282B1 (en) Measuring apparatus using sensor
US9746485B2 (en) Automatic blood coagulation analysis device
JP4847713B2 (en) Dimethyl ether measuring apparatus and method
JP6477449B2 (en) Analysis apparatus and analysis method
JP6211806B2 (en) Automatic analyzer
JP2017072548A (en) Flow rate measurement system and adsorption amount measurement system
Faas et al. Collecting Data to Determine the Ca2+-Binding Properties of DM-Nitrophen and Proteins