JP2015012210A - Component holding mechanism, mounting circuit board and measuring apparatus - Google Patents

Component holding mechanism, mounting circuit board and measuring apparatus Download PDF

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JP2015012210A
JP2015012210A JP2013137728A JP2013137728A JP2015012210A JP 2015012210 A JP2015012210 A JP 2015012210A JP 2013137728 A JP2013137728 A JP 2013137728A JP 2013137728 A JP2013137728 A JP 2013137728A JP 2015012210 A JP2015012210 A JP 2015012210A
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substrate
resistor
holding mechanism
component holding
main body
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千明 山浦
Chiaki Yamaura
千明 山浦
元 依田
Hajime Yoda
元 依田
謙太郎 中島
Kentaro Nakajima
謙太郎 中島
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Hioki EE Corp
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Hioki EE Corp
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Abstract

PROBLEM TO BE SOLVED: To achieve thinning when superposing a plurality of mounting circuit boards.SOLUTION: A component holding mechanism including the holding parts 31a, 31b for holding the tip 21b of the body 21 of a resistor 2, and supports 32a, 32b for supporting the resistor 2 projecting from the lower surface 1b of a substrate 1 by inserting the bottom 21a side into the opening 13 of the substrate 1, and configured to hold the resistor 2. The support 32a, 32b is constituted to include a first member 51 stretched at the edge of the opening 13, a second member 52 coupled with the first member 51 so as to project from the lower surface 1b of the substrate 1, a third member 53 capable of fixing the terminal 22 by projecting from the tip of the second member 52 so as to form an L-shape along with the second member 52, a fourth member 54 projecting from the first member 51 in a direction opposite from the second member 52, and a fifth member 55 projecting from the tip of the fourth member 54 in the same direction as the third member 53 and to which the holding parts 31a, 31b are attached.

Description

本発明は、基板に実装された電子部品を保持する部品保持機構、その部品保持機構を備えた実装基板、およびその実装基板を備えた測定装置に関するものである。   The present invention relates to a component holding mechanism that holds an electronic component mounted on a substrate, a mounting substrate that includes the component holding mechanism, and a measurement apparatus that includes the mounting substrate.

高電圧を測定する電圧測定装置等に組み込まれる入力回路は、入力した高電圧を分圧するための高抵抗値の抵抗を備えて構成されている。この場合、高抵抗値の抵抗を備えたこの種の入力回路では、高周波帯域において周波数特性が低下する傾向がある。このため、例えば特開平4−276561号公報に開示されているように、コンデンサを抵抗に対して並列に接続することによって高周波帯域における周波数特性の低下を防止している。   An input circuit incorporated in a voltage measuring device or the like that measures a high voltage is configured to include a resistor having a high resistance value for dividing the input high voltage. In this case, in this type of input circuit having a high resistance value, the frequency characteristics tend to deteriorate in the high frequency band. For this reason, for example, as disclosed in Japanese Patent Application Laid-Open No. 4-276561, a capacitor is connected in parallel with a resistor to prevent a decrease in frequency characteristics in a high frequency band.

この場合、高電圧を入力するこの種の入力回路には、高電圧に耐え得る高耐圧のコンデンサを用いる必要があるが、市場に流通している高耐圧のコンデンサの種類が少なく所望の容量のコンデンサを探すのが困難であることに加えて、このようなコンデンサは一般的に高価である。このため、この種の入力回路では、任意の形状(大きさ)に加工した2枚の金属板を電極として用いると共に各金属板間の空気を誘電体とするコンデンサを組み込んだ構成を採用することがある。この構成を採用したときには、電極として用いる金属板の大きさや形状を任意に選択することができるため、コンデンサの容量を所望の容量に容易に規定することができる。   In this case, it is necessary to use a high-voltage capacitor that can withstand the high voltage for this type of input circuit that inputs a high voltage, but there are few types of high-voltage capacitors that are available in the market, and a desired capacitance. In addition to the difficulty of looking for capacitors, such capacitors are generally expensive. For this reason, this type of input circuit employs a configuration in which two metal plates processed into an arbitrary shape (size) are used as electrodes, and a capacitor in which air between the metal plates is a dielectric is incorporated. There is. When this configuration is adopted, the size and shape of the metal plate used as the electrode can be arbitrarily selected, so that the capacity of the capacitor can be easily defined to a desired capacity.

一方、図11に示すように、高抵抗値の抵抗(同図に示す抵抗300)は、一般的に、矩形の板状に形成されており、主面(面積が最も大きな面)が基板400に対して直角(または、ほぼ直角)をなす姿勢で基板400上に実装されて、基端部に配設されている端子(図示せず)を基板400に挿通させて固定される。この場合、金属板で形成したコンデンサを用いる上記の構成では、抵抗300の僅かな姿勢の変化によって抵抗300の内部に配設されている抵抗体と金属板との間の容量が変化して、入力回路の周波数特性が変化する。このため、出願人は、同図に示すように、基板400上に配置した固定部材500を用いて抵抗300を固定する部品保持機構を開発している。この部品保持機構の固定部材500は、樹脂を射出成形することによって形成されており、抵抗300を取り囲む4つの側壁を有して枠状に形成されると共に側壁に嵌合部501を有して、抵抗300の側部を嵌合部501に嵌合させることで抵抗を保持するように構成されている。   On the other hand, as shown in FIG. 11, the high-resistance resistor (resistor 300 shown in FIG. 11) is generally formed in a rectangular plate shape, and the main surface (surface having the largest area) is the substrate 400. It is mounted on the substrate 400 in a posture that makes a right angle (or almost a right angle) with respect to the terminal 400, and a terminal (not shown) disposed at the base end is inserted into the substrate 400 and fixed. In this case, in the above configuration using the capacitor formed of the metal plate, the capacitance between the resistor disposed inside the resistor 300 and the metal plate is changed by a slight change in the posture of the resistor 300, The frequency characteristics of the input circuit change. Therefore, the applicant has developed a component holding mechanism that fixes the resistor 300 using a fixing member 500 disposed on the substrate 400 as shown in FIG. The fixing member 500 of this component holding mechanism is formed by injection molding of resin, has a side wall that surrounds the resistor 300, is formed in a frame shape, and has a fitting portion 501 on the side wall. The resistor 300 is configured to hold the resistance by fitting the side portion of the resistor 300 to the fitting portion 501.

特開平4−276561号公報(第2頁、第1図)Japanese Patent Laid-Open No. 4-276561 (2nd page, FIG. 1)

ところが、出願人が開発している上記の部品保持機構には、改善すべき以下の課題がある。すなわち、この部品保持機構では、基板上に実装された抵抗を基板上に配置した固定部材で保持する構成となっている。一方、このような部品保持機構によって抵抗等の電子部品が保持されて構成された実装基板は、電圧測定装置等に複数を重ねるようにして配置されることが多く、電圧測定装置の小型化には、実装基板を複数重ねたときの厚みを少なく抑えること(薄形化)が不可欠となる。この場合、高抵抗値の抵抗は、比較的大型のため、このような抵抗を主面が基板に対して直角をなす姿勢で基板上に立設させて上記の部品保持機構で保持したときには、抵抗の高さが高くなる。このため、従来の部品保持機構には、この部品保持機構を用いて製造した実装基板を複数重ねたときの薄形化に対応することが困難であるという課題が存在し、その改善が望まれている。   However, the above-described component holding mechanism developed by the applicant has the following problems to be improved. In other words, the component holding mechanism is configured to hold the resistor mounted on the board with the fixing member disposed on the board. On the other hand, a mounting board configured such that electronic components such as resistors are held by such a component holding mechanism is often arranged so as to overlap a plurality of voltage measuring devices and the like, which reduces the size of the voltage measuring device. Therefore, it is indispensable to reduce the thickness when a plurality of mounting substrates are stacked (thinning). In this case, since the resistance having a high resistance value is relatively large, when such a resistance is erected on the substrate in a posture in which the main surface is perpendicular to the substrate and is held by the component holding mechanism, The height of resistance increases. For this reason, the conventional component holding mechanism has a problem that it is difficult to cope with the thinning when a plurality of mounting boards manufactured by using this component holding mechanism are stacked, and improvement thereof is desired. ing.

本発明は、かかる課題に鑑みてなされたものであり、実装基板を複数重ねたときの薄形化を実現し得る部品保持機構、実装基板および測定装置を提供することを主目的とする。   The present invention has been made in view of such a problem, and a main object of the present invention is to provide a component holding mechanism, a mounting board, and a measuring apparatus that can realize a reduction in thickness when a plurality of mounting boards are stacked.

上記目的を達成すべく請求項1記載の部品保持機構は、本体部と当該本体部の底部側に配設された端子とを有して基板に実装される電子部品を保持する部品保持機構であって、前記本体部の先端部を挟持する挟持部と、前記基板に形成された開口部に前記底部側が挿通されて当該底部側が当該基板の下面から突出した状態の前記電子部品を支持すると共に前記挟持部を支持する支持部とを備え、前記支持部は、前記基板の上面における前記開口部の縁部に架け渡された第1部材と、前記基板の前記下面から突出するように前記第1部材に連結された第2部材と、当該第2部材の先端部から突出して当該第2部材と共にL字状をなすように当該第2部材に連結されて前記端子を固定可能な第3部材と、前記第1部材から前記第2部材とは逆向きに突出するように当該第1部材に連結された第4部材と、当該第4部材の先端部から前記第3部材と同じ向きに突出するように当該第4部材に連結されて前記挟持部が取り付けられる第5部材とを備えて構成されている。   In order to achieve the above object, a component holding mechanism according to claim 1 is a component holding mechanism that has a main body portion and a terminal disposed on the bottom side of the main body portion and holds an electronic component mounted on a substrate. And supporting the electronic component in a state in which the bottom side is inserted into an opening formed in the substrate and the bottom side protrudes from the lower surface of the substrate, and holds the tip portion of the main body. A support portion that supports the sandwiching portion, and the support portion includes a first member that spans an edge of the opening on the upper surface of the substrate, and the first member that protrudes from the lower surface of the substrate. A second member connected to one member, and a third member capable of fixing the terminal by being connected to the second member so as to project from the tip of the second member and form an L shape with the second member And the first member is opposite to the second member A fourth member connected to the first member so as to protrude, and the clamping portion attached to the fourth member so as to protrude in the same direction as the third member from the tip of the fourth member. And a fifth member.

また、請求項2記載の部品保持機構は、請求項1記載の部品保持機構において、導電性を有する材料でそれぞれ形成された一対の前記挟持部を備え、前記各挟持部のいずれか一方は、前記電子部品の前記端子が接続される高電位および低電位のいずれか一方の電位に接続され、前記各挟持部の他方は、前記高電位および前記低電位の他方の電位に接続されている。   The component holding mechanism according to claim 2 is the component holding mechanism according to claim 1, further comprising a pair of the clamping portions each formed of a conductive material, and any one of the clamping portions includes: The electronic component is connected to one of a high potential and a low potential to which the terminal is connected, and the other of the sandwiching portions is connected to the other of the high potential and the low potential.

また、請求項3記載の部品保持機構は、請求項1または2記載の部品保持機構において、前記支持部は、導電性を有する材料で形成されている。   The component holding mechanism according to claim 3 is the component holding mechanism according to claim 1 or 2, wherein the support portion is made of a conductive material.

また、請求項4記載の部品保持機構は、請求項1から3のいずれかに記載の部品保持機構において、前記挟持部は、前記電子部品としての抵抗の前記本体部における抵抗体が形成されている部位を除く部位だけを挟持する。   According to a fourth aspect of the present invention, there is provided the component holding mechanism according to any one of the first to third aspects, wherein the holding portion is formed with a resistor in the body portion of the resistor as the electronic component. Clamp only the part excluding the part.

また、請求項5記載の実装基板は、請求項1から3のいずれかに記載の部品保持機構と、前記開口部が形成された前記基板と、当該基板に実装された前記電子部品とを備えている。   A mounting board according to a fifth aspect includes the component holding mechanism according to any one of the first to third aspects, the board on which the opening is formed, and the electronic component mounted on the board. ing.

また、請求項6記載の実装基板は、請求項4記載の部品保持機構と、前記開口部が形成された前記基板と、当該基板に実装された前記電子部品としての前記抵抗とを備え、前記抵抗は、前記挟持部によって挟持される挟持領域に対応する部位を除く部位にのみ抵抗体が配設されている。   A mounting board according to claim 6 includes the component holding mechanism according to claim 4, the board in which the opening is formed, and the resistor as the electronic component mounted on the board, As for the resistance, a resistor is disposed only in a portion excluding a portion corresponding to a holding region held by the holding portion.

また、請求項7記載の測定装置は、請求項5または6記載の実装基板を備えて、被測定量を測定する。   According to a seventh aspect of the present invention, a measuring apparatus includes the mounting substrate according to the fifth or sixth aspect, and measures a measured amount.

請求項1記載の部品保持機構、請求項5記載の実装基板、および請求項7記載の測定装置では、基板の開口部の縁部に架け渡された第1部材と、基板の下面から突出する第2部材と、第2部材と共にL字状をなすように第2部材の先端部から突出して電子部品の端子を固定可能な第3部材と、第1部材から第2部材とは逆向きに突出する第4部材と、第4部材の先端部から第3部材と同じ向きに突出して挟持部が取り付けられる第5部材とを備えて支持部が構成されている。このため、この部品保持機構、実装基板および測定装置によれば、本体部の底部側が開口部に挿通されて、底部側が基板の下面から突出した状態で電子部品を確実に保持することができる。この結果、この部品保持機構および実装基板では、基板の上面に本体部を立設させて電子部品を固定する構成と比較して、上面から本体部の先端部までの高さを十分に低く抑えることができる。したがって、この部品保持機構、実装基板および測定装置によれば、例えば、この部品保持機構を用いた複数の実装基板を上下に重ねたときの基板同士の間隔を狭めることができる結果、実装基板を複数重ねたときの薄形化を確実に実現することができる。また、この部品保持機構、実装基板および測定装置によれば、支持部によって支持された挟持部が本体部の先端部を挟持することにより、電子部品の側部を支持する固定部材で電子部品を保持する構成とは異なり、使用する抵抗の種類が変更となって抵抗の大きさ(横幅)が変更になったとしても、その抵抗の横幅の長さに関わらず電子部品を確実に保持することができる。   In the component holding mechanism according to claim 1, the mounting substrate according to claim 5, and the measuring device according to claim 7, the first member that spans the edge of the opening of the substrate and the lower surface of the substrate protrude. The second member, the third member that protrudes from the tip of the second member so as to form an L shape together with the second member, and the terminal of the electronic component can be fixed, and the first member to the second member are in opposite directions The support portion is configured by including a fourth member that protrudes and a fifth member that protrudes from the tip of the fourth member in the same direction as the third member and to which the clamping portion is attached. For this reason, according to the component holding mechanism, the mounting substrate, and the measuring apparatus, the electronic component can be reliably held in a state where the bottom side of the main body is inserted into the opening and the bottom side protrudes from the lower surface of the substrate. As a result, in the component holding mechanism and the mounting substrate, the height from the upper surface to the tip of the main body is sufficiently low as compared with the configuration in which the main body is erected on the upper surface of the substrate and the electronic component is fixed. be able to. Therefore, according to the component holding mechanism, the mounting substrate, and the measuring apparatus, for example, the interval between the substrates when a plurality of mounting substrates using the component holding mechanism are stacked one above the other can be reduced. Thinning when a plurality of layers are stacked can be realized with certainty. In addition, according to the component holding mechanism, the mounting substrate, and the measuring device, the holding portion supported by the support portion holds the tip portion of the main body portion, whereby the electronic component is held by the fixing member that supports the side portion of the electronic component. Unlike the holding configuration, even if the type of resistor used is changed and the size (width) of the resistor is changed, the electronic component is securely held regardless of the width of the resistor. Can do.

また、請求項2記載の部品保持機構、請求項5記載の実装基板、および請求項7記載の測定装置によれば、導電性を有する材料で形成した一対の挟持部の一方を電子部品の端子が接続される高電位および低電位のいずれか一方の電位に接続し、各挟持部の他方を高電位および低電位の他方の電位に接続することにより、各挟持部を、これらの間に存在する絶縁材料(電子部品の本体部を構成する絶縁材料)と共に、電子部品に並列に接続されたコンデンサとして機能させることができ、また、各挟持部を電子部品の抵抗体と容量結合させることができる。つまり、この部品保持機構および実装基板では、電子部品を保持するための挟持部を周波数特性の調整用のコンデンサの電極として機能させることができる。したがって、この部品保持機構、実装基板および測定装置によれば、周波数特性調整用のコンデンサの電極として機能させる専用の金属板を不要とすることができると共に、このような専用の金属板を固定する固定部材を不要とすることができるため、製造コストを十分に低減することができる。また、コンデンサの電極として機能させる金属板を固定部材に嵌合させて保持する従来の構成では、固定部材を作り直さない限り金属板の大きさや形状を変更することが困難であるのに対して、このような固定部材を必要としないこの部品保持機構および実装基板では、挟持部の大きさを変更する際の制約が少ないため、挟持部の大きさを任意に変更して周波数特性の調整を容易に行うことができる。また、導電性を有する材料としての高伝熱性の材料(例えば、真鍮)を用いて挟持部を形成することで、挟持部を放熱板として機能させることができるため、電子部品が発する熱を効率的に放熱させることができる。   Moreover, according to the component holding mechanism according to claim 2, the mounting substrate according to claim 5, and the measuring device according to claim 7, one of the pair of sandwiching portions formed of a conductive material is used as a terminal of an electronic component. By connecting one of the high and low potentials to each other, and connecting the other of the holding parts to the other of the high and low potentials, each holding part is present between them. It can be made to function as a capacitor connected in parallel to the electronic component together with the insulating material (insulating material constituting the main body portion of the electronic component), and each clamping portion can be capacitively coupled to the resistor of the electronic component it can. That is, in the component holding mechanism and the mounting board, the holding portion for holding the electronic component can function as an electrode of a capacitor for adjusting frequency characteristics. Therefore, according to the component holding mechanism, the mounting board, and the measuring apparatus, it is possible to eliminate the need for a dedicated metal plate that functions as an electrode of the frequency characteristic adjusting capacitor, and to fix such a dedicated metal plate. Since the fixing member can be omitted, the manufacturing cost can be sufficiently reduced. In addition, in the conventional configuration in which the metal plate that functions as the electrode of the capacitor is fitted and held in the fixing member, it is difficult to change the size and shape of the metal plate unless the fixing member is remade. In this component holding mechanism and mounting board that do not require such a fixing member, there are few restrictions when changing the size of the clamping part, and therefore the frequency characteristic can be easily adjusted by arbitrarily changing the size of the clamping part. Can be done. In addition, by forming the sandwiching portion using a highly heat-conductive material (for example, brass) as a conductive material, the sandwiching portion can function as a heat sink, so that the heat generated by the electronic component is efficiently Heat can be released.

また、請求項3記載の部品保持機構、請求項5記載の実装基板、および請求項7記載の測定装置によれば、導電性を有する材料で支持部を形成したことにより、配線を用いることなく電子部品の各端子を支持部を介して被接続部に接続させると共に、配線を用いることなく電子部品の各端子が接続される電位に挟持部を接続させることができるため、実装基板の構成を簡略化することができる。   Further, according to the component holding mechanism according to claim 3, the mounting substrate according to claim 5, and the measuring device according to claim 7, the support portion is formed of a conductive material, so that no wiring is used. Since each terminal of the electronic component can be connected to the connected portion via the support portion, and the holding portion can be connected to a potential to which each terminal of the electronic component is connected without using wiring, the configuration of the mounting substrate It can be simplified.

また、請求項4記載の部品保持機構、請求項6記載の実装基板、および請求項7記載の測定装置によれば、挟持部が、電子部品としての抵抗の本体部における抵抗体が形成されている部位を除く部位だけを挟持することにより、抵抗体が形成されている部位を挟持する構成と比較して、挟持部と抵抗体との間の浮遊容量を小さくすることができる。このため、この部品保持機構、実装基板および測定装置によれば、例えば、測定対象信号の被測定量を測定する際の高周波帯域における振幅の低下を防止することができる結果、広帯域での測定を可能とすることができる。   According to the component holding mechanism according to claim 4, the mounting substrate according to claim 6, and the measuring device according to claim 7, the sandwiching portion is formed as a resistor in the main body portion of the resistor as an electronic component. By sandwiching only the portion excluding the portion where the resistor is present, the stray capacitance between the sandwiching portion and the resistor can be reduced as compared with the configuration in which the portion where the resistor is formed is sandwiched. Therefore, according to the component holding mechanism, the mounting board, and the measuring device, for example, it is possible to prevent a decrease in amplitude in the high frequency band when measuring the measured amount of the measurement target signal. Can be possible.

また、請求項6記載の実装基板、および請求項7記載の測定装置によれば、挟持部によって挟持される挟持領域に対応する部位を除く部位にのみ抵抗体を配設した電子部品としての抵抗を用いることにより、確実に挟持可能な適切な大きさの挟持領域を確保することで、抵抗を確実に保持しつつ被測定量の広帯域での測定を可能とすることができる。   Further, according to the mounting board according to claim 6 and the measuring apparatus according to claim 7, the resistance as an electronic component in which the resistor is disposed only in a portion excluding the portion corresponding to the sandwiching region sandwiched by the sandwiching portion. By using this, it is possible to ensure a holding area of an appropriate size that can be securely held, and to measure the measured amount in a wide band while reliably holding the resistance.

電圧測定装置10および実装基板100の構成を示す斜視図である。2 is a perspective view illustrating configurations of a voltage measuring device 10 and a mounting substrate 100. FIG. 部品保持機構3およびシールド板4を分解した状態の実装基板100の斜視図である。It is a perspective view of the mounting substrate 100 in a state where the component holding mechanism 3 and the shield plate 4 are disassembled. 部品保持機構3の構成を示す斜視図である。3 is a perspective view showing a configuration of a component holding mechanism 3. FIG. 図1におけるX面断面図である。FIG. 2 is a cross-sectional view taken along the X plane in FIG. 抵抗2を含んで構成される電圧測定回路の回路図である。FIG. 3 is a circuit diagram of a voltage measurement circuit including a resistor 2. 部品保持機構3による抵抗2の保持状態を説明する説明図である。It is explanatory drawing explaining the holding | maintenance state of the resistance 2 by the components holding mechanism 3. FIG. 実装基板100の製造方法を説明する第1の説明図である。FIG. 5 is a first explanatory view illustrating the method for manufacturing the mounting substrate 100. 実装基板100の製造方法を説明する第2の説明図である。FIG. 10 is a second explanatory diagram explaining the method for manufacturing the mounting substrate 100. 実装基板100の製造方法を説明する第3の説明図である。FIG. 10 is a third explanatory diagram explaining the method of manufacturing the mounting substrate 100. 実装基板100の使用形態を説明する説明図である。It is explanatory drawing explaining the usage pattern of the mounting substrate. 従来の部品保持機構の構成を示す斜視図である。It is a perspective view which shows the structure of the conventional component holding mechanism.

以下、部品保持機構、実装基板および測定装置の実施の形態について、添付図面を参照して説明する。   Hereinafter, embodiments of a component holding mechanism, a mounting board, and a measuring device will be described with reference to the accompanying drawings.

最初に、図1に示す電圧測定装置10の構成について説明する。電圧測定装置10は、測定装置の一例であって、実装基板100を備えて電圧(被測定量の一例)を測定可能に構成されている。実装基板100は、実装基板の一例であって、図1,2に示すように、基板1、抵抗2(電子部品の一例)、部品保持機構3およびシールド板4を備えて構成されている。なお、実装基板100は、上記の各部品の他に各種の電子部品や機構部品などを備えているが、発明の理解を容易とするため、図2では、これらの部品を除く他の部品の図示を省略している。   First, the configuration of the voltage measuring device 10 shown in FIG. 1 will be described. The voltage measuring device 10 is an example of a measuring device, and includes a mounting substrate 100 so that a voltage (an example of a measured amount) can be measured. The mounting substrate 100 is an example of a mounting substrate, and includes a substrate 1, a resistor 2 (an example of an electronic component), a component holding mechanism 3, and a shield plate 4, as shown in FIGS. The mounting substrate 100 includes various electronic components and mechanical components in addition to the above-described components. However, in order to facilitate understanding of the invention, FIG. 2 shows other components other than these components. The illustration is omitted.

基板1は、図1,2に示すように、抵抗2や図外の各種の電子部品、部品保持機構3およびシールド板4を実装(取り付け)可能に構成されている。なお、図1,2では、基板1の一部のみを図示している。具体的には、基板1には、図2,4に示すように、抵抗2における後述する本体部21の底部21a側を挿通させて、底部21a側を基板1の下面1bから下方に突出させるための開口部13が形成されている。この場合、開口部13は、長辺が抵抗2の本体部21の長さよりも長く、短辺が部品保持機構3における後述する支持部32a,32b(以下、区別しないときには「支持部32」ともいう)を構成する第2部材52および第3部材53の幅よりも長い長方形状に形成されている。   As shown in FIGS. 1 and 2, the substrate 1 is configured so that a resistor 2 and various electronic components (not shown), a component holding mechanism 3 and a shield plate 4 can be mounted (attached). 1 and 2, only a part of the substrate 1 is shown. Specifically, as shown in FIGS. 2 and 4, the substrate 1 is inserted through a bottom 21 a side of a main body 21 (described later) in the resistor 2, and the bottom 21 a is protruded downward from the lower surface 1 b of the substrate 1. An opening 13 is formed. In this case, the opening 13 has a longer side longer than the length of the main body 21 of the resistor 2, and a shorter side with support parts 32 a and 32 b (to be described later) in the component holding mechanism 3 (hereinafter referred to as “support part 32” when not distinguished). Are formed in a rectangular shape that is longer than the width of the second member 52 and the third member 53.

また、基板1には、図2〜4に示すように、支持部32を構成する後述する第1部材51の下端部に設けられている固定用の爪61を挿通させる挿通孔12bが形成されている。また、基板1には、シールド板4を構成する後述する側壁71a〜71d(以下、区別しないときには「側壁71」ともいう)の基端部に設けられている固定用の爪81を挿通させる挿通孔12cが形成されている。   In addition, as shown in FIGS. 2 to 4, the substrate 1 is formed with an insertion hole 12 b through which a fixing claw 61 provided at a lower end portion of a first member 51 (described later) constituting the support portion 32 is inserted. ing. Further, the board 1 is inserted through a fixing claw 81 provided at a base end portion of side walls 71a to 71d (to be referred to as “side wall 71” hereinafter when not distinguished) constituting the shield plate 4. A hole 12c is formed.

また、基板1には、図2に示すように、複数の導体パターン11が形成されている。なお、同図では、一部の導体パターン11のみを図示している。この場合、これらの導体パターン11には、第1部材51の基端部や側壁71の基端部などが接続される。   In addition, as shown in FIG. 2, a plurality of conductor patterns 11 are formed on the substrate 1. In the figure, only a part of the conductor pattern 11 is shown. In this case, the base end portion of the first member 51 and the base end portion of the side wall 71 are connected to these conductor patterns 11.

抵抗2は、例えば、図5に示すように、電圧測定回路内に配置される高抵抗値(一例として、数MΩ程度)の抵抗であって、図4,6に示すように、本体部21と、本体部21の底部21aに配設された複数(この例では2本)端子22とを備えて構成されている。本体部21は、互いに対向する各主面Sa(面積が最も大きな面)が長方形をなす板状に形成されて、内部に抵抗体23が配設されて構成されている。また、抵抗2は、各主面Saが基板1の表面に対して、例えば、直角(または、ほぼ直角)な状態で基板1に対して本体部21が立設され、かつ主面Saの長辺が基板1の表面に対して平行となる横長の姿勢(以下、この姿勢を「実装姿勢」ともいう)で部品保持機構3を介して(部品保持機構3によって保持された状態で)基板1に実装される。また、抵抗2は、基板1に形成されている開口部13に本体部21の底部21a側が挿通されて、底部21a側が基板1の下面1bから下方に突出する状態で基板1に実装される。   The resistor 2 is, for example, a resistor having a high resistance value (as an example, about several MΩ) arranged in the voltage measuring circuit as shown in FIG. 5, and as shown in FIGS. And a plurality (two in this example) of terminals 22 disposed on the bottom 21 a of the main body 21. The main body 21 is formed in a plate shape in which main surfaces Sa (surfaces having the largest area) facing each other form a rectangle, and a resistor 23 is disposed therein. In addition, the resistor 2 has a main body 21 erected with respect to the substrate 1 in a state where each main surface Sa is at a right angle (or almost at a right angle) with respect to the surface of the substrate 1 and the length of the main surface Sa. Substrate 1 via component holding mechanism 3 (in a state of being held by component holding mechanism 3) in a horizontally long posture in which the side is parallel to the surface of substrate 1 (hereinafter, this posture is also referred to as “mounting posture”). To be implemented. The resistor 2 is mounted on the substrate 1 such that the bottom 21 a side of the main body 21 is inserted into the opening 13 formed in the substrate 1 and the bottom 21 a protrudes downward from the lower surface 1 b of the substrate 1.

また、抵抗2の各端子22は、支持部32を構成する後述する第3部材53にそれぞれ接続され、各支持部32を介して基板1の導体パターン11に接続(固定)される。この場合、図5に示すように、一方の端子22は、支持部32および導体パターン11を介して被測定信号を入力するHi側の入力端子に接続され、他方の端子22は、支持部32および導体パターン11を介して演算増幅器の非反転入力側に接続される。   Each terminal 22 of the resistor 2 is connected to a later-described third member 53 constituting the support portion 32 and connected (fixed) to the conductor pattern 11 of the substrate 1 through each support portion 32. In this case, as shown in FIG. 5, one terminal 22 is connected to a Hi-side input terminal for inputting a signal under measurement via the support portion 32 and the conductor pattern 11, and the other terminal 22 is connected to the support portion 32. And connected to the non-inverting input side of the operational amplifier via the conductor pattern 11.

また、抵抗2は、図6に示すように、各主面Saにおける後述する挟持部31によって挟持される領域(以下「挟持領域Sb」ともいう:同図参照)を除く部位にのみ抵抗体23が配設されている。つまり、この抵抗2では、同図に示すように、抵抗体23が底部21a側に偏在するように配設されて、先端部21b側(底部21a側とは逆側)に抵抗体23が配設されていない部位が設けられている。   Further, as shown in FIG. 6, the resistor 2 is provided only in a portion excluding a region (hereinafter also referred to as “clamping region Sb”: see the same figure) sandwiched by a clamping unit 31 described later on each main surface Sa. Is arranged. That is, in this resistor 2, as shown in the figure, the resistor 23 is arranged so as to be unevenly distributed on the bottom 21a side, and the resistor 23 is arranged on the tip 21b side (the side opposite to the bottom 21a side). The part which is not provided is provided.

部品保持機構3は、抵抗2を上記した実装姿勢で保持して(実装姿勢を維持して)基板1に実装するための機構であって、図2〜4に示すように、挟持部31a,31b(以下、区別しないときには「挟持部31」ともいう)および2つの支持部32a,32bを備えて構成されている。   The component holding mechanism 3 is a mechanism for holding the resistor 2 in the mounting posture described above (maintaining the mounting posture) and mounting it on the substrate 1, as shown in FIGS. 31 b (hereinafter also referred to as “clamping portion 31” when not distinguished) and two support portions 32 a and 32 b are provided.

挟持部31は、図3に示すように、2枚の挟持片41を備えて構成され、支持部32を構成する後述する第5部材55に固定されて、支持部32によって支持されている。また、挟持部31は、導電性を有する高伝熱性の材料(例えば、真鍮)で形成されている。   As shown in FIG. 3, the sandwiching portion 31 includes two sandwiching pieces 41, is fixed to a later-described fifth member 55 that constitutes the support portion 32, and is supported by the support portion 32. Moreover, the clamping part 31 is formed with the highly heat-conductive material (for example, brass) which has electroconductivity.

この挟持部31は、図4,6に示すように、抵抗2の各主面Saにおける先端部21b側の挟持領域Sbに各挟持片41が当接して本体部21の先端部21b側を挟持可能に構成されている。この場合、上記したように、抵抗2の本体部21には、挟持領域Sbを除く部位にのみ抵抗体23が形成されている。このため、挟持部31は、本体部21における抵抗体23が形成されている部位を除く部位だけを挟持する。   As shown in FIGS. 4 and 6, the sandwiching portion 31 sandwiches the distal end portion 21 b side of the main body portion 21 with the sandwiching pieces 41 coming into contact with the sandwiching region Sb on the distal end portion 21 b side of each main surface Sa of the resistor 2. It is configured to be possible. In this case, as described above, the main body 21 of the resistor 2 is formed with the resistor 23 only in the portion excluding the sandwiching region Sb. For this reason, the clamping part 31 clamps only the site | part except the site | part in which the resistor 23 in the main-body part 21 is formed.

支持部32a,32bは、基板1に形成された開口部13に底部21a側が挿通されて底部21a部側が基板1の下面1bから下向き(基板1の上面1aから下面1bに向かう向きで下面1bから離間する方向)に突出した状態の抵抗2を支持すると共に挟持部31を支持可能に構成されている。具体的には、支持部32a,32bは、図3に示すように、第1部材51、第2部材52、第3部材53、第4部材54および第5部材55をそれぞれ備えて構成されている。   The support portions 32a and 32b are inserted into the opening 13 formed in the substrate 1 on the bottom 21a side so that the bottom 21a portion faces downward from the lower surface 1b of the substrate 1 (from the lower surface 1b toward the lower surface 1b toward the lower surface 1b of the substrate 1). It is configured to be able to support the sandwiching portion 31 while supporting the resistor 2 in a state of protruding in the separating direction. Specifically, as shown in FIG. 3, the support portions 32 a and 32 b include a first member 51, a second member 52, a third member 53, a fourth member 54, and a fifth member 55, respectively. Yes.

また、支持部32は、導電性を有する高伝熱性の材料(例えば、真鍮)で形成されている。また、この支持部32では、一例として、1枚の板材(真鍮板)に対する打ち抜き加工および折り曲げ加工を行うことによって各部材51〜55が一体に形成されている。   Moreover, the support part 32 is formed with the highly heat-conductive material (for example, brass) which has electroconductivity. Moreover, in this support part 32, each member 51-55 is integrally formed by performing the punching process and bending process with respect to one board | plate material (brass board) as an example.

第1部材51は、図3,4に示すように、長方形の板状に形成されて、基板1の上面1aにおける開口部13の縁部に架け渡されている。また、第1部材51の下端部には、固定用の爪61が形成されており、基板1に形成されている挿通孔12bに爪61を挿通させることによって第1部材51が基板1に取り付けられる。また、支持部32aの第1部材51の基端部は、基板1に形成されている導体パターン11に接続され、この導体パターン11を介して被測定信号を入力するHi側の入力端子(高電位)に接続される。また、支持部32bの第1部材51の基端部は、基板1に形成されている導体パターン11に接続され、この導体パターン11を介して演算増幅器の非反転入力側(低電位)に接続される。   As shown in FIGS. 3 and 4, the first member 51 is formed in a rectangular plate shape and spans the edge of the opening 13 in the upper surface 1 a of the substrate 1. A fixing claw 61 is formed at the lower end of the first member 51, and the first member 51 is attached to the substrate 1 by inserting the claw 61 through the insertion hole 12 b formed in the substrate 1. It is done. Further, the base end portion of the first member 51 of the support portion 32 a is connected to the conductor pattern 11 formed on the substrate 1, and a Hi-side input terminal (high height) for inputting a signal to be measured through the conductor pattern 11. Potential). Further, the base end portion of the first member 51 of the support portion 32b is connected to the conductor pattern 11 formed on the substrate 1, and is connected to the non-inverting input side (low potential) of the operational amplifier via this conductor pattern 11. Is done.

第2部材52は、図3,4,6に示すように、長方形の板状に形成されて、基板1の下面1bから下向きに突出するように第1部材51に連結されている。第3部材53は、長方形の板状に形成されて、第2部材52に対して直角をなす方向に沿って第2部材52の先端部から突出するように(つまり、第2部材52と共にL字状をなすように)第2部材52に連結されている。また、第3部材53には、抵抗2の端子22を挿通させて固定可能な挿通孔62、および第3部材53の先端部と挿通孔62とを結ぶスリット63が形成されている。この場合、支持部32a,32bの各第3部材53には抵抗2の端子22が1本ずつ挿通されて固定される。   As shown in FIGS. 3, 4, and 6, the second member 52 is formed in a rectangular plate shape, and is connected to the first member 51 so as to protrude downward from the lower surface 1 b of the substrate 1. The third member 53 is formed in a rectangular plate shape, and protrudes from the distal end portion of the second member 52 along a direction perpendicular to the second member 52 (that is, L together with the second member 52). It is connected to the second member 52 (in the form of a letter). Further, the third member 53 is formed with an insertion hole 62 through which the terminal 22 of the resistor 2 can be inserted and fixed, and a slit 63 connecting the distal end portion of the third member 53 and the insertion hole 62. In this case, one terminal 22 of the resistor 2 is inserted and fixed to each third member 53 of the support portions 32a and 32b.

第4部材54は、図3に示すように、長方形の板状に形成されて、第1部材51から上方(第2部材52とは逆向き)に突出するように第1部材51に連結されている。第5部材55は、図3,6に示すように、長方形の板状に形成されて、第4部材54に対して直角をなす方向に沿って(第3部材53と平行でかつ第3部材53と同じ向きに)第4部材54の先端部から突出するように第4部材54に連結されている。また、支持部32aの第5部材55には、挟持部31aが取り付けられ、支持部32bの第5部材55には、挟持部31bが取り付けられている。   As shown in FIG. 3, the fourth member 54 is formed in a rectangular plate shape, and is connected to the first member 51 so as to protrude upward from the first member 51 (opposite to the second member 52). ing. The fifth member 55 is formed in a rectangular plate shape as shown in FIGS. 3 and 6, along a direction perpendicular to the fourth member 54 (parallel to the third member 53 and the third member). The fourth member 54 is connected to the fourth member 54 so as to protrude from the tip of the fourth member 54 (in the same direction as 53). Further, the sandwiching portion 31a is attached to the fifth member 55 of the support portion 32a, and the sandwiching portion 31b is attached to the fifth member 55 of the support portion 32b.

この部品保持機構3では、図6に示すように、抵抗2を保持した状態において、各支持部32における各々の第3部材53の先端部同士、および各々の第5部材55の先端部同士が互いに対向して、かつ抵抗2の本体部21の主面Saを正面視したときに各部材51〜55が本体部21の外側に位置するように配置される。   In this component holding mechanism 3, as shown in FIG. 6, the tip portions of the third members 53 and the tip portions of the fifth members 55 in the support portions 32 are in a state where the resistance 2 is held. The members 51 to 55 are arranged so as to be opposed to each other and located outside the main body 21 when the main surface Sa of the main body 21 of the resistor 2 is viewed from the front.

また、この部品保持機構3では、挟持部31aの第5部材55に取り付けられている挟持部31aが支持部32aを介して抵抗2における一方の端子22に接続され、挟持部31bの第5部材55に取り付けられている挟持部31bが支持部32bを介して抵抗2における他方の端子22に接続される。このため、この部品保持機構3では、図5に示すように、挟持部31a,31bが、これらの間に存在する絶縁材料(抵抗2の本体部21を構成する絶縁材料)と共に、抵抗2に並列に接続されたコンデンサとして機能する。また、図6に示すように、各挟持部31a,31bが抵抗2の抵抗体23と容量結合する。   Moreover, in this component holding mechanism 3, the clamping part 31a attached to the fifth member 55 of the clamping part 31a is connected to one terminal 22 in the resistor 2 via the support part 32a, and the fifth member of the clamping part 31b. The clamping part 31b attached to 55 is connected to the other terminal 22 in the resistor 2 via the support part 32b. For this reason, in this component holding mechanism 3, as shown in FIG. 5, the sandwiching portions 31 a and 31 b are connected to the resistor 2 together with the insulating material existing between them (the insulating material constituting the main body portion 21 of the resistor 2). Functions as a capacitor connected in parallel. Further, as shown in FIG. 6, each sandwiching portion 31 a, 31 b is capacitively coupled to the resistor 23 of the resistor 2.

シールド板4は、図2に示すように、導電性を有する材料(例えば、真鍮)でそれぞれ形成された側壁71a〜71dおよび天板72を備えて構成されている。この場合、各側壁71は、一体に形成されている。また、各側壁71は、図2,4に示すように、実装状態の抵抗2および部品保持機構3を取り囲むようにして、基板1に立設(取り付け)可能に構成されている。この場合、各側壁71の基端部には、固定用の爪81が形成されており、基板1に形成されている挿通孔12cに爪81を挿通させることによって各側壁71が基板1に取り付けられる。また、各側壁71は、基板1に形成されている基準電位用の導体パターン11に基端部が接続され、この導体パターン11を介して基準電位に接続される。さらに、図2に示すように、側壁71b,71dの先端部には、先端部の一部を内側に折り曲げて構成した折り曲げ部が設けられ、この折り曲げ部には、ねじ孔が形成されている。   As illustrated in FIG. 2, the shield plate 4 includes side walls 71 a to 71 d and a top plate 72 each formed of a conductive material (for example, brass). In this case, the side walls 71 are integrally formed. Further, as shown in FIGS. 2 and 4, each side wall 71 is configured to be able to stand (attach) to the substrate 1 so as to surround the mounted resistance 2 and the component holding mechanism 3. In this case, a fixing claw 81 is formed at the base end portion of each side wall 71, and each side wall 71 is attached to the substrate 1 by inserting the claw 81 through the insertion hole 12 c formed in the substrate 1. It is done. Each side wall 71 has a base end connected to a reference potential conductor pattern 11 formed on the substrate 1 and is connected to the reference potential via the conductor pattern 11. Further, as shown in FIG. 2, the distal ends of the side walls 71b and 71d are provided with a bent portion formed by bending a part of the distal end portion inward, and a screw hole is formed in the bent portion. .

天板72は、図2に示すように、矩形に形成されて、図4に示すように、各側壁71の先端部側に配設されて、ねじ止めによって各側壁71(側壁71b,71dの先端部に設けられている折り曲げ部)に固定されて、各側壁71と電気的に接続されている。   The top plate 72 is formed in a rectangular shape as shown in FIG. 2 and is disposed on the tip end side of each side wall 71 as shown in FIG. 4 and is screwed to each side wall 71 (the side walls 71b and 71d). It is fixed to the bent portion provided at the front end portion and is electrically connected to each side wall 71.

次に、実装基板100の製造方法について、抵抗2、部品保持機構3およびシールド板4を基板1に実装する(取り付ける)方法を中心に図面を参照して説明する。   Next, a method for manufacturing the mounting substrate 100 will be described with reference to the drawings, focusing on a method for mounting (attaching) the resistor 2, the component holding mechanism 3 and the shield plate 4 to the substrate 1.

まず、抵抗2を部品保持機構3に保持させる。具体的には、図7に示すように、部品保持機構3の挟持部31a,31bを構成する2枚の挟持片41間の隙間に、抵抗2における本体部21の先端部21bを嵌め込んで、挟持部31a,31bによって先端部21bを挟持させる。次いで、図8に示すように、部品保持機構3の支持部32a,32bで本体部21の両側部を挟み込むように、支持部32a,32bを構成する第1部材51,52,54を本体部21の両側部に近接させる。   First, the resistor 2 is held by the component holding mechanism 3. Specifically, as shown in FIG. 7, the tip 21 b of the main body 21 in the resistor 2 is fitted into the gap between the two clamping pieces 41 that constitute the clamping parts 31 a and 31 b of the component holding mechanism 3. The tip 21b is clamped by the clamping parts 31a and 31b. Next, as shown in FIG. 8, the first members 51, 52, and 54 constituting the support portions 32 a, 32 b are inserted into the main body portion so that both side portions of the main body portion 21 are sandwiched between the support portions 32 a, 32 b of the component holding mechanism 3. It is made to adjoin to both sides of 21.

また、この際に、本体部21の底部21aに配設されている2本の端子22を支持部32a,32bを構成する第3部材53に形成されているスリット63に嵌め込んで挿通孔62に挿通させる。次いで、抵抗2の端子22を半田付けによって第3部材53に固定する。これにより、図4,6に示すように、部品保持機構3によって抵抗2が保持される。   At this time, the two terminals 22 arranged on the bottom 21a of the main body 21 are fitted into the slits 63 formed in the third member 53 constituting the support portions 32a and 32b, and the insertion hole 62 is inserted. To be inserted. Next, the terminal 22 of the resistor 2 is fixed to the third member 53 by soldering. Thereby, as shown in FIGS. 4 and 6, the resistor 2 is held by the component holding mechanism 3.

この場合、抵抗2が部品保持機構3によって保持された状態では、図4,6に示すように、抵抗2における本体部21の底部21aが支持部32を構成する第1部材51の下端部よりも下方に位置している。   In this case, in the state where the resistor 2 is held by the component holding mechanism 3, the bottom 21 a of the main body 21 in the resistor 2 is lower than the lower end of the first member 51 constituting the support portion 32, as shown in FIGS. Is also located below.

続いて、部品保持機構3によって保持された状態の抵抗2を基板1に実装する(取り付ける)。具体的には、図9に示すように、基板1に形成されている開口部13に各支持部32の第2部材52および第3部材53を挿入して部品保持機構3を押し下げる。この際に、各支持部32における第1部材51の基端部に形成されている爪61を、基板1に形成されている挿通孔12bに挿通させる。これにより、基板1の上面1aにおける開口部13の縁部に第1部材51が架け渡された状態で、第1部材51が基板1に固定される。また、この際に、第1部材51の基端部が、基板1に形成されている導体パターン11に接続され、導体パターン11を介して支持部32aが被測定信号を入力するHi側の入力端子(高電位)に接続され、導体パターン11を介して支持部32bが演算増幅器の非反転入力側(低電位)に接続される。以上により、抵抗2および部品保持機構3の実装(取り付け)が完了する。   Subsequently, the resistor 2 held by the component holding mechanism 3 is mounted on (attached to) the substrate 1. Specifically, as shown in FIG. 9, the second member 52 and the third member 53 of each support portion 32 are inserted into the opening 13 formed in the substrate 1 to push down the component holding mechanism 3. At this time, the claw 61 formed at the base end portion of the first member 51 in each support portion 32 is inserted into the insertion hole 12 b formed in the substrate 1. Accordingly, the first member 51 is fixed to the substrate 1 in a state where the first member 51 is bridged over the edge of the opening 13 on the upper surface 1 a of the substrate 1. At this time, the proximal end portion of the first member 51 is connected to the conductor pattern 11 formed on the substrate 1, and the support portion 32 a inputs the signal under measurement via the conductor pattern 11. The support 32b is connected to the terminal (high potential) and the non-inverting input side (low potential) of the operational amplifier via the conductor pattern 11. Thus, mounting (attachment) of the resistor 2 and the component holding mechanism 3 is completed.

この場合、上記したように、挟持部31が抵抗2を挟持しているため、抵抗2の移動が防止されて、抵抗2が実装姿勢(本体部21が基板1に立設した姿勢(この例では、各主面Saが基板1の表面に対して直角(または、ほぼ直角)をなす姿勢))に維持される。また、この実装基板100では、図6に示すように、抵抗2の各主面Saにおける挟持部31によって挟持される挟持領域Sbに対応する部位を除く部位にのみ抵抗体23が配設されているため、抵抗2を挟持している挟持部31(挟持片41)と抵抗体23とが十分に離間している。このため、この実装基板100では、被測定信号によって抵抗2が絶縁破壊を引き起こす事態が確実に防止される。   In this case, as described above, since the clamping part 31 holds the resistor 2, the movement of the resistor 2 is prevented, and the resistor 2 is mounted (an attitude in which the main body part 21 stands on the substrate 1 (this example Then, each main surface Sa is maintained at a right angle (or a substantially right angle) with respect to the surface of the substrate 1)). Further, in the mounting substrate 100, as shown in FIG. 6, the resistor 23 is disposed only in a portion excluding a portion corresponding to the sandwiching region Sb sandwiched by the sandwiching portion 31 in each main surface Sa of the resistor 2. Therefore, the sandwiching portion 31 (the sandwiching piece 41) that sandwiches the resistor 2 and the resistor 23 are sufficiently separated from each other. For this reason, in this mounting substrate 100, the situation in which the resistor 2 causes dielectric breakdown due to the signal under measurement is reliably prevented.

また、この部品保持機構3では、図6,9に示すように、基板1に形成されている開口部13に抵抗2の本体部21の底部21a側が挿通されて、底部21a側が基板1の下面1bから下方に突出した状態で抵抗2を支持することが可能となっている。このため、この部品保持機構3では、基板1の上面1aに本体部21を立設させて抵抗2を固定する構成と比較して、抵抗2の底部21a側が基板1の下面1bから突出している分、上面1aから本体部21の先端部21bまでの高さを低く抑えることが可能となっている。   In the component holding mechanism 3, as shown in FIGS. 6 and 9, the bottom 21 a side of the body portion 21 of the resistor 2 is inserted into the opening 13 formed in the substrate 1, and the bottom 21 a side is the lower surface of the substrate 1. The resistor 2 can be supported in a state of protruding downward from 1b. For this reason, in this component holding mechanism 3, the bottom 21 a side of the resistor 2 protrudes from the lower surface 1 b of the substrate 1, as compared with a configuration in which the main body 21 is erected on the upper surface 1 a of the substrate 1 and the resistor 2 is fixed. Thus, the height from the upper surface 1a to the tip end portion 21b of the main body portion 21 can be kept low.

一方、この部品保持機構3では、抵抗2の一方の端子22が接続される高電位に挟持部31aが支持部32aを介して接続され、抵抗2の他方の端子22が接続される低電位に挟持部31bが支持部32bを介して接続されている。このため、この部品保持機構3では、図5に示すように、挟持部31a,31bが、これらの間に存在する絶縁材料(抵抗2の本体部21を構成する絶縁材料)と共に、抵抗2に並列に接続されたコンデンサとして機能する。また、図6に示すように、各挟持部31a,31bが抵抗2の抵抗体23と容量結合する。   On the other hand, in this component holding mechanism 3, the clamping portion 31a is connected to the high potential to which one terminal 22 of the resistor 2 is connected via the support portion 32a, and the low potential to which the other terminal 22 of the resistor 2 is connected. The clamping part 31b is connected via the support part 32b. For this reason, in this component holding mechanism 3, as shown in FIG. 5, the sandwiching portions 31 a and 31 b are connected to the resistor 2 together with the insulating material existing between them (the insulating material constituting the main body portion 21 of the resistor 2). Functions as a capacitor connected in parallel. Further, as shown in FIG. 6, each sandwiching portion 31 a, 31 b is capacitively coupled to the resistor 23 of the resistor 2.

続いて、シールド板4を基板1に取り付ける。具体的には、まず、部品保持機構3を取り囲むようにして側壁71a〜71dを基板1に取り付ける。この場合、各側壁71の基端部に形成されている爪81を基板1に形成されている挿通孔12cに挿通させ、次いで、基板1の裏面側で爪81の先端部を半田付けする。これにより、各側壁71が基板1に固定される。また、各側壁71の基端部が基板1に形成されている導体パターン11に接続される。   Subsequently, the shield plate 4 is attached to the substrate 1. Specifically, first, the side walls 71 a to 71 d are attached to the substrate 1 so as to surround the component holding mechanism 3. In this case, the claw 81 formed at the base end portion of each side wall 71 is inserted into the insertion hole 12 c formed in the substrate 1, and then the tip end portion of the claw 81 is soldered on the back surface side of the substrate 1. Thereby, each side wall 71 is fixed to the substrate 1. Further, the base end portion of each side wall 71 is connected to the conductor pattern 11 formed on the substrate 1.

続いて、各側壁71の先端部に天板72を載置する。次いで、図4に示すように、ねじ止めによって各側壁71の先端部(側壁71b,71dの先端部に設けられている折り曲げ部)に固定する。以上により、シールド板4の取り付けが完了する。次いで、他の電子部品や機構部品の実装(取り付け)を行い、実装基板100を完成させる。   Subsequently, the top plate 72 is placed on the tip of each side wall 71. Then, as shown in FIG. 4, it fixes to the front-end | tip part (the bending part provided in the front-end | tip part of the side walls 71b and 71d) of each side wall 71 by screwing. Thus, the attachment of the shield plate 4 is completed. Next, other electronic components and mechanical components are mounted (attached) to complete the mounting substrate 100.

ここで、この実装基板100では、部品保持機構3を用いて抵抗2を基板1に実装したことで、上記したように、抵抗2の底部21a側が基板1の下面1bから突出している分、基板1の上面1aから本体部21の先端部21bまでの高さが低く抑えられている。このため、部品保持機構3を取り囲むシールド板4の上面1aからの高さも低く抑えられている。この結果、例えば、この実装基板100を上下に複数重ねて測定機器等に収容する際に、図10の左図に示すように、下に位置する実装基板100におけるシールド板4と、上に位置する実装基板100における抵抗2の端子22とが接触しないように重ねることで、同図の右図に示す従来の実装基板500(基板1の上面1aに抵抗2の本体部21を立設させる実装基板)を同様に重ねるのと比較して、上下2枚の実装基板100における基板1同士の間隔を狭めることが可能なため、全体の高さH(厚み)を低く抑えること(つまり、薄形化)が可能となっている。   Here, in the mounting substrate 100, the resistance 2 is mounted on the substrate 1 using the component holding mechanism 3, and thus the bottom 21a side of the resistance 2 protrudes from the lower surface 1b of the substrate 1 as described above. The height from the upper surface 1a of the main body 21 to the distal end portion 21b of the main body 21 is kept low. For this reason, the height from the upper surface 1a of the shield plate 4 surrounding the component holding mechanism 3 is also kept low. As a result, for example, when a plurality of the mounting boards 100 are vertically stacked and accommodated in a measuring device or the like, as shown in the left diagram of FIG. The mounting substrate 100 is overlapped so that it does not come into contact with the terminal 2 of the resistor 2, so that the conventional mounting substrate 500 shown in the right diagram of FIG. Since the distance between the substrates 1 in the two upper and lower mounting substrates 100 can be reduced as compared with the case where the substrates are similarly stacked, the overall height H (thickness) is kept low (that is, the thin type). Is possible.

このように、この部品保持機構3、実装基板100および電圧測定装置10では、基板1の開口部13の縁部に架け渡された第1部材51と、基板1の下面1bから突出する第2部材52と、第2部材52と共にL字状をなすように第2部材52の先端部から突出して端子22を固定可能な第3部材53と、第1部材51から第2部材52とは逆向きに突出する第4部材54と、第4部材54の先端部から第3部材53と同じ向きに突出して挟持部31が取り付けられる第5部材55とを備えて支持部32が構成されている。このため、この部品保持機構3、実装基板100および電圧測定装置10によれば、本体部21の底部21a側が開口部13に挿通されて、底部21a側が基板1の下面1bから下方に突出した状態で抵抗2を確実に保持することができる。この結果、この部品保持機構3および実装基板100では、基板1の上面1aに本体部21を立設させて抵抗2を固定する構成と比較して、上面1aから本体部21の先端部21bまでの高さを十分に低く抑えることができる。したがって、この部品保持機構3、実装基板100および電圧測定装置10によれば、例えば、この部品保持機構3を用いた複数の実装基板100を上下に重ねたときの基板1同士の間隔を狭めることができる結果、実装基板を複数重ねたときの薄形化を確実に実現することができる。また、この部品保持機構3、実装基板100および電圧測定装置10によれば、支持部32によって支持された挟持部31が本体部21の先端部21bを挟持することにより、抵抗2の側部を支持する固定部材で抵抗2を保持する構成とは異なり、使用する抵抗の種類が変更となって抵抗の大きさ(横幅)が変更になったとしても、その抵抗の横幅の長さに関わらず抵抗2を確実に保持することができる。   As described above, in the component holding mechanism 3, the mounting substrate 100, and the voltage measuring device 10, the first member 51 spanned on the edge of the opening 13 of the substrate 1 and the second member protruding from the lower surface 1 b of the substrate 1. The member 52, the third member 53 that protrudes from the tip of the second member 52 so as to form an L shape together with the second member 52, and can fix the terminal 22, and the first member 51 to the second member 52 are opposite to each other. The support portion 32 includes a fourth member 54 that protrudes in the direction and a fifth member 55 that protrudes from the front end portion of the fourth member 54 in the same direction as the third member 53 and to which the clamping portion 31 is attached. . For this reason, according to the component holding mechanism 3, the mounting substrate 100, and the voltage measuring device 10, the bottom 21 a side of the main body 21 is inserted into the opening 13, and the bottom 21 a side protrudes downward from the lower surface 1 b of the substrate 1. Thus, the resistor 2 can be reliably held. As a result, in the component holding mechanism 3 and the mounting substrate 100, compared to the configuration in which the main body 21 is erected on the upper surface 1a of the substrate 1 and the resistor 2 is fixed, the upper surface 1a to the tip 21b of the main body 21 Can be kept sufficiently low. Therefore, according to the component holding mechanism 3, the mounting substrate 100, and the voltage measuring apparatus 10, for example, the interval between the substrates 1 when the plurality of mounting substrates 100 using the component holding mechanism 3 are vertically stacked is reduced. As a result, it is possible to reliably realize thinning when a plurality of mounting substrates are stacked. In addition, according to the component holding mechanism 3, the mounting substrate 100, and the voltage measuring device 10, the holding portion 31 supported by the support portion 32 holds the tip portion 21 b of the main body portion 21. Unlike the configuration in which the resistor 2 is held by the supporting fixing member, even if the type of resistor used is changed and the size of the resistor (width) is changed, regardless of the length of the width of the resistor. The resistor 2 can be reliably held.

また、この部品保持機構3、実装基板100および電圧測定装置10によれば、導電性を有する材料で形成した一対の挟持部31の一方を抵抗2の端子22が接続される高電位および低電位のいずれか一方の電位に接続し、各挟持部31の他方を高電位および低電位の他方の電位に接続することにより、各挟持部31を、これらの間に存在する絶縁材料(抵抗2の本体部21を構成する絶縁材料)と共に、抵抗2に並列に接続されたコンデンサとして機能させることができ、また、各挟持部31を抵抗2の抵抗体23と容量結合させることができる。つまり、この部品保持機構3および実装基板100では、抵抗2を保持するための挟持部31を周波数特性の調整用のコンデンサの電極として機能させることができる。したがって、この部品保持機構3、実装基板100および電圧測定装置10によれば、周波数特性調整用のコンデンサの電極として機能させる専用の金属板を不要とすることができると共に、このような専用の金属板を固定する固定部材を不要とすることができるため、製造コストを十分に低減することができる。また、コンデンサの電極として機能させる金属板を固定部材に嵌合させて保持する従来の構成では、固定部材を作り直さない限り金属板の大きさや形状を変更することが困難であるのに対して、このような固定部材を必要としないこの部品保持機構3および実装基板100では、挟持部31(挟持片41)の大きさを変更する際の制約が少ないため、挟持部31の大きさを任意に変更して周波数特性の調整を容易に行うことができる。また、導電性を有する材料としての高伝熱性の材料(例えば、真鍮)を用いて挟持部31を形成することで、挟持部31を放熱板として機能させることができるため、抵抗2が発する熱を効率的に放熱させることができる。   Further, according to the component holding mechanism 3, the mounting substrate 100, and the voltage measuring device 10, a high potential and a low potential to which the terminal 22 of the resistor 2 is connected to one of the pair of sandwiching portions 31 formed of a conductive material. Are connected to one of the potentials, and the other of the sandwiching portions 31 is connected to the other potential of the high potential and the low potential. It can function as a capacitor connected in parallel to the resistor 2 together with the insulating material constituting the main body portion 21, and each clamping portion 31 can be capacitively coupled to the resistor 23 of the resistor 2. That is, in the component holding mechanism 3 and the mounting substrate 100, the holding portion 31 for holding the resistor 2 can function as an electrode of a capacitor for adjusting frequency characteristics. Therefore, according to the component holding mechanism 3, the mounting substrate 100, and the voltage measuring device 10, it is possible to eliminate the need for a dedicated metal plate that functions as an electrode of a capacitor for adjusting frequency characteristics, and to use such a dedicated metal. Since the fixing member for fixing the plate can be eliminated, the manufacturing cost can be sufficiently reduced. In addition, in the conventional configuration in which the metal plate that functions as the electrode of the capacitor is fitted and held in the fixing member, it is difficult to change the size and shape of the metal plate unless the fixing member is remade. In the component holding mechanism 3 and the mounting substrate 100 that do not require such a fixing member, since there are few restrictions when changing the size of the clamping portion 31 (the clamping piece 41), the size of the clamping portion 31 can be arbitrarily set. The frequency characteristics can be easily adjusted by changing the frequency characteristics. Moreover, since the clamping part 31 can be functioned as a heat sink by forming the clamping part 31 using the highly heat-conductive material (for example, brass) as a conductive material, the heat generated by the resistor 2 Can be efficiently dissipated.

また、この部品保持機構3、実装基板100および電圧測定装置10によれば、導電性を有する材料で支持部32を形成したことにより、配線を用いることなく抵抗2の各端子22を支持部32を介して被接続部(上記の例では、Hi側の入力端子(高電位)および演算増幅器の非反転入力側(低電位))に接続させると共に、配線を用いることなく抵抗2の各端子22が接続される電位に挟持部31を接続させることができるため、実装基板100の構成を簡略化することができる。   Further, according to the component holding mechanism 3, the mounting substrate 100, and the voltage measuring device 10, the support portion 32 is formed of a conductive material. Are connected to the connected portion (in the above example, the input terminal on the Hi side (high potential) and the non-inverting input side (low potential) of the operational amplifier), and each terminal 22 of the resistor 2 without using wiring. Since the sandwiching portion 31 can be connected to the potential to which is connected, the configuration of the mounting substrate 100 can be simplified.

また、この部品保持機構3、実装基板100および電圧測定装置10によれば、挟持部31が、本体部21における抵抗体23が形成されている部位を除く部位だけを挟持することにより、抵抗体23が形成されている部位を挟持する構成と比較して、挟持部31と抵抗体23との間の浮遊容量を小さくすることができる。このため、この部品保持機構3、実装基板100および電圧測定装置10によれば、測定対象信号の被測定量を測定する際の高周波帯域における振幅の低下を防止することができる結果、広帯域での測定を可能とすることができる。   In addition, according to the component holding mechanism 3, the mounting substrate 100, and the voltage measuring device 10, the clamping unit 31 clamps only the part excluding the part where the resistor 23 is formed in the main body 21, so that the resistor The stray capacitance between the sandwiching portion 31 and the resistor 23 can be reduced as compared with the configuration in which the portion where the 23 is formed is sandwiched. For this reason, according to the component holding mechanism 3, the mounting substrate 100, and the voltage measuring device 10, it is possible to prevent a decrease in amplitude in the high frequency band when measuring the measured amount of the measurement target signal. Measurement can be possible.

また、この実装基板100および電圧測定装置10によれば、各主面Saにおける挟持部31によって挟持される挟持領域Sbに対応する部位を除く部位にのみ抵抗体23を配設した電子部品としての抵抗2を用いることにより、確実に挟持可能な適切な大きさの挟持領域Sbを確保することで、抵抗2を確実に保持しつつ被測定量の広帯域での測定を可能とすることができる。   Further, according to the mounting substrate 100 and the voltage measuring device 10, as an electronic component in which the resistor 23 is disposed only in a portion excluding a portion corresponding to the sandwiching region Sb sandwiched by the sandwiching portion 31 in each main surface Sa. By using the resistor 2, it is possible to ensure a holding area Sb of an appropriate size that can be securely held, and to measure the measured amount in a wide band while reliably holding the resistor 2.

なお、部品保持機構、実装基板および電圧測定装置10の構成は、上記の構成に限定されない。例えば、支持部32を介して抵抗2が接続される電位に挟持部31を接続させて、挟持部31をコンデンサの電極として機能させる例について上記したが、配線を用いて挟持部31を上記の電位に接続する構成を採用することもできる。また、コンデンサ用の専用の電極を挟持部31とは別に設けて、挟持部31を各電位に接続しない構成、つまり挟持部31の機能を抵抗2を保持する機能だけに限定した構成を採用することもできる。この場合、この構成では、挟持部31および支持部32を非導電性材料で形成することもできる。   Note that the configurations of the component holding mechanism, the mounting substrate, and the voltage measuring device 10 are not limited to the above configurations. For example, the example in which the clamping unit 31 is connected to the potential to which the resistor 2 is connected via the support unit 32 and the clamping unit 31 functions as an electrode of the capacitor has been described above. It is also possible to adopt a configuration that connects to a potential. Further, a configuration in which a capacitor-dedicated electrode is provided separately from the clamping unit 31 and the clamping unit 31 is not connected to each potential, that is, a configuration in which the function of the clamping unit 31 is limited only to the function of holding the resistor 2 is employed. You can also. In this case, in this configuration, the sandwiching portion 31 and the support portion 32 can be formed of a nonconductive material.

また、2つの挟持部31を備えた例について上記したが、1つまたは3つ以上の挟持部31を備えた構成を採用することもできる。また、2つの支持部32を備えた例について上記したが、1つの支持部で1または複数の挟持部31を支持する構成を採用することもできる。具体的には、例えば、上記した2つの支持部32の各第5部材55同士および各第3部材53同士をそれぞれ延長して繋げることで、正面視が矩形の枠状をなす1つの支持部を採用することができる。   Moreover, although the example provided with the 2 clamping parts 31 was mentioned above, the structure provided with the 1 or 3 or more clamping parts 31 is also employable. Moreover, although the example provided with the two support parts 32 was mentioned above, the structure which supports the 1 or several clamping part 31 with one support part is also employable. Specifically, for example, one support portion that has a rectangular frame shape when viewed from the front by extending and connecting the fifth members 55 and the third members 53 of the two support portions 32 described above. Can be adopted.

また、本体部21の主面Saが長方形をなす板状に形成された抵抗2を保持する部品保持機構3に適用した例について上記したが、本体部の主面が円形や楕円形をなす板状に形成された抵抗を保持する部品保持機構に適用することもできる。また、本体部が円筒状に形成された抵抗を保持する部品保持機構に適用することもできる。さらに、抵抗2以外の他の電子部品(例えば、コンデンサやコイルなど)を保持する部品保持機構に適用することができるのは勿論である。   Moreover, although it described above about the example applied to the component holding mechanism 3 which hold | maintains the resistance 2 formed in the plate shape in which main surface Sa of the main-body part 21 makes | forms a rectangle, the main surface of a main-body part forms circular or an ellipse. It can also be applied to a component holding mechanism that holds a resistance formed in a shape. Further, the present invention can be applied to a component holding mechanism in which a main body portion holds a resistance formed in a cylindrical shape. Furthermore, it is needless to say that the present invention can be applied to a component holding mechanism that holds an electronic component other than the resistor 2 (for example, a capacitor or a coil).

また、被測定量としての電圧を測定する測定装置の一例としての電圧測定装置10に適用した例について上記したが、電流、電力、抵抗、回転数および温度などの物理量や、原子量および分子量などの化学量を被測定量として測定する各種の測定装置に適用することができ、この場合においても、上記した各効果を実現することができる。   Further, the example applied to the voltage measuring device 10 as an example of a measuring device that measures a voltage as a measured amount has been described above. However, physical quantities such as current, power, resistance, rotation speed, and temperature, atomic weight, molecular weight, and the like The present invention can be applied to various measuring devices that measure a chemical amount as a measurement amount, and even in this case, the above-described effects can be realized.

1 基板
1a 上面
1b 下面
2 抵抗
3 部品保持機構
10 電圧測定装置
13 開口部
21 本体部
21a 底部
21b 先端部
22 端子
23 抵抗体
31a,31b 挟持部
32a,32b 支持部
51 第1部材
52 第2部材
53 第3部材
54 第4部材
55 第5部材
100 実装基板
Sa 主面
Sb 挟持領域
DESCRIPTION OF SYMBOLS 1 Board | substrate 1a Upper surface 1b Lower surface 2 Resistance 3 Component holding mechanism 10 Voltage measuring device 13 Opening part 21 Main body part 21a Bottom part 21b Tip part 22 Terminal 23 Resistor 31a, 31b Holding part 32a, 32b Support part 51 1st member 52 2nd member 53 3rd member 54 4th member 55 5th member 100 Mounting board Sa Main surface Sb Clamping area

Claims (7)

本体部と当該本体部の底部側に配設された端子とを有して基板に実装される電子部品を保持する部品保持機構であって、
前記本体部の先端部を挟持する挟持部と、前記基板に形成された開口部に前記底部側が挿通されて当該底部側が当該基板の下面から突出した状態の前記電子部品を支持すると共に前記挟持部を支持する支持部とを備え、
前記支持部は、前記基板の上面における前記開口部の縁部に架け渡された第1部材と、前記基板の前記下面から突出するように前記第1部材に連結された第2部材と、当該第2部材の先端部から突出して当該第2部材と共にL字状をなすように当該第2部材に連結されて前記端子を固定可能な第3部材と、前記第1部材から前記第2部材とは逆向きに突出するように当該第1部材に連結された第4部材と、当該第4部材の先端部から前記第3部材と同じ向きに突出するように当該第4部材に連結されて前記挟持部が取り付けられる第5部材とを備えて構成されている部品保持機構。
A component holding mechanism for holding an electronic component mounted on a substrate having a main body and a terminal disposed on the bottom side of the main body,
A holding part that holds the tip of the main body part; and the holding part that supports the electronic component in a state in which the bottom side is inserted into an opening formed in the substrate and the bottom side protrudes from the lower surface of the substrate. And a support part for supporting
The support portion includes a first member that spans an edge of the opening on the upper surface of the substrate, a second member that is coupled to the first member so as to protrude from the lower surface of the substrate, and A third member that is connected to the second member so as to project from the tip of the second member and form an L-shape together with the second member, and the terminal can be fixed to the second member; Is connected to the fourth member so that it protrudes in the same direction as the third member from the tip of the fourth member, and is connected to the fourth member so as to protrude in the opposite direction. A component holding mechanism configured to include a fifth member to which the clamping unit is attached.
導電性を有する材料でそれぞれ形成された一対の前記挟持部を備え、
前記各挟持部のいずれか一方は、前記電子部品の前記端子が接続される高電位および低電位のいずれか一方の電位に接続され、前記各挟持部の他方は、前記高電位および前記低電位の他方の電位に接続されている請求項1記載の部品保持機構。
A pair of the holding portions each formed of a conductive material;
Either one of the sandwiching portions is connected to one of a high potential and a low potential to which the terminal of the electronic component is connected, and the other of the sandwiching portions is the high potential and the low potential. The component holding mechanism according to claim 1, wherein the component holding mechanism is connected to the other potential.
前記支持部は、導電性を有する材料で形成されている請求項1または2記載の部品保持機構。   The component holding mechanism according to claim 1, wherein the support portion is formed of a conductive material. 前記挟持部は、前記電子部品としての抵抗の前記本体部における抵抗体が形成されている部位を除く部位だけを挟持する請求項1から3のいずれかに記載の部品保持機構。   The component holding mechanism according to any one of claims 1 to 3, wherein the clamping unit clamps only a portion of the main body portion of the resistor as the electronic component except a portion where a resistor is formed. 請求項1から3のいずれかに記載の部品保持機構と、前記開口部が形成された前記基板と、当該基板に実装された前記電子部品とを備えている実装基板。   A mounting substrate comprising: the component holding mechanism according to claim 1; the substrate on which the opening is formed; and the electronic component mounted on the substrate. 請求項4記載の部品保持機構と、前記開口部が形成された前記基板と、当該基板に実装された前記電子部品としての前記抵抗とを備え、
前記抵抗は、前記挟持部によって挟持される挟持領域に対応する部位を除く部位にのみ抵抗体が配設されている実装基板。
The component holding mechanism according to claim 4, the substrate on which the opening is formed, and the resistor as the electronic component mounted on the substrate,
The mounting substrate in which the resistor is disposed only in a portion excluding a portion corresponding to a holding region held by the holding portion.
請求項5または6記載の実装基板を備えて、被測定量を測定する測定装置。   A measuring apparatus comprising the mounting substrate according to claim 5 and measuring a measured amount.
JP2013137728A 2013-07-01 2013-07-01 Component holding mechanism, mounting circuit board and measuring apparatus Pending JP2015012210A (en)

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JP2020027906A (en) * 2018-08-15 2020-02-20 横河電機株式会社 Board mounting structure, mounting board, and voltage measurement unit
CN110839317A (en) * 2018-08-15 2020-02-25 横河电机株式会社 Substrate mounting structure, mounting substrate, and voltage measuring unit
CN110839317B (en) * 2018-08-15 2023-06-13 横河电机株式会社 Substrate mounting structure, mounting substrate, and voltage measuring unit

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