JP2014236422A5 - - Google Patents
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- JP2014236422A5 JP2014236422A5 JP2013117891A JP2013117891A JP2014236422A5 JP 2014236422 A5 JP2014236422 A5 JP 2014236422A5 JP 2013117891 A JP2013117891 A JP 2013117891A JP 2013117891 A JP2013117891 A JP 2013117891A JP 2014236422 A5 JP2014236422 A5 JP 2014236422A5
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- solid
- imaging device
- state imaging
- reset
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- 238000003384 imaging method Methods 0.000 claims 18
- 238000006243 chemical reaction Methods 0.000 claims 9
- 238000009825 accumulation Methods 0.000 claims 8
- 230000000875 corresponding Effects 0.000 claims 2
- 230000002596 correlated Effects 0.000 claims 1
- 230000001681 protective Effects 0.000 claims 1
- 238000005070 sampling Methods 0.000 claims 1
Claims (19)
前記蓄積部に蓄積された信号電荷を排出し、該排出後、電荷蓄積期間経過時において前記蓄積部に蓄積された信号電荷を取得し、かつ該信号電荷の取得後に前記蓄積部をリセットして該蓄積部のリセットレベルを取得する電荷蓄積読出動作を行順次に行うものであり、
各行の前記排出の前に、前記蓄積部から予備的な電荷の排出を行う予備排出を行い、かつn行目(nは自然数)の前記排出とn+1行目の前記予備排出とを同時に行うものであり、
前記画素部の列毎に、前記蓄積部が基準電位となるようにフィードバック制御を行うフィードバック制御回路が設けられ、前記排出の際に前記フィードバック制御を行うものであることを特徴とする固体撮像素子。 A photoelectric conversion unit that generates a signal charge corresponding to the amount of incident light, a storage unit that stores the signal charge generated in the photoelectric conversion unit, and an output that outputs a voltage corresponding to the signal charge stored in the storage unit and a circuit, a pixel portion which the input node and is electrically connected between the photoelectric conversion unit and the accumulation unit and the output circuit is arrayed two-dimensionally,
The discharges the signal charges accumulated in the accumulation unit, exhaust Dego, resetting the accumulation unit the signal charges accumulated in the accumulation section obtained at the time elapsed charge accumulation period, and after the acquisition of the signal charge are those lines sequentially performing charge storage read operation to retrieve the reset level of the accumulating product portion and,
Before the discharge of each row, performs the蓄perform preliminary discharge to perform discharge of preliminary charge from a product unit, and the n-th (n is a natural number) the discharge and (n + 1) th row of the preliminary discharge at the same time the Is,
For each column of the pixel unit, the feedback control circuit for feedback control is provided so as to accumulate unit becomes the reference potential, the solid-state image, characterized in that it performs the feedback control when the discharge element.
該行選択回路が、前記排出の際には導通し、前記予備排出の際には非導通となるものである請求項1または2記載の固体撮像素子。 The pixel portion includes a row selection circuit connected between the output circuit and a signal line from which the signal charge and a reset level are output.
3. The solid-state imaging device according to claim 1, wherein the row selection circuit is turned on during the discharge and is turned off during the preliminary discharge.
該行選択回路が、前記リセットの際には導通し、前記読み出し予備リセットの際には非導通となるものである請求項6または7記載の固体撮像素子。 The pixel portion includes a row selection circuit connected between the output circuit and a signal line from which the signal charge and a reset level are output.
8. The solid-state imaging device according to claim 6, wherein the row selection circuit is turned on during the resetting and is turned off during the read preliminary resetting.
前記排出を行うためのパルス信号を出力する排出用シフトレジスタと、
前記信号電荷の取得および前記読み出し予備リセットを行うためのパルス信号を出力する信号レベル取得・読み出し予備排出用シフトレジスタと、
前記リセットを行うためのパルス信号を出力する読み出しリセット用シフトレジスタと、
前記リセットレベルの取得をためのパルス信号を出力するリセットレベル取得用シフトレジスタとを備えた請求項6から10いずれか1項記載の固体撮像素子。 A preliminary discharge shift register that outputs a pulse signal for performing the preliminary discharge;
A discharge shift register that outputs a pulse signal for performing the discharge;
A signal level acquisition / reading preliminary discharge shift register that outputs a pulse signal for acquiring the signal charge and performing the reading preliminary reset, and
A read reset shift register that outputs a pulse signal for performing the reset;
The solid-state imaging device according to claim 6, further comprising: a reset level acquisition shift register that outputs a pulse signal for acquiring the reset level.
前記第2の電極が、全ての前記画素部について共通の電極であることを特徴とする請求項1から12いずれか1項記載の固体撮像素子。 The pixel unit includes a first electrode partitioned in pixel units and a second electrode provided to face the pixel electrode with the photoelectric conversion unit interposed therebetween,
13. The solid-state imaging device according to claim 1, wherein the second electrode is a common electrode for all the pixel portions.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013117891A JP6134979B2 (en) | 2013-06-04 | 2013-06-04 | Solid-state imaging device and imaging apparatus |
PCT/JP2014/002873 WO2014196176A1 (en) | 2013-06-04 | 2014-05-30 | Solid-state imaging element and imaging apparatus |
KR1020157035513A KR101760200B1 (en) | 2013-06-04 | 2014-05-30 | Solid-state imaging element and imaging apparatus |
TW103119302A TWI611696B (en) | 2013-06-04 | 2014-06-04 | Solid-state imaging sensing device and image sensing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013117891A JP6134979B2 (en) | 2013-06-04 | 2013-06-04 | Solid-state imaging device and imaging apparatus |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2014236422A JP2014236422A (en) | 2014-12-15 |
JP2014236422A5 true JP2014236422A5 (en) | 2016-01-21 |
JP6134979B2 JP6134979B2 (en) | 2017-05-31 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013117891A Active JP6134979B2 (en) | 2013-06-04 | 2013-06-04 | Solid-state imaging device and imaging apparatus |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6134979B2 (en) |
KR (1) | KR101760200B1 (en) |
TW (1) | TWI611696B (en) |
WO (1) | WO2014196176A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6323813B2 (en) * | 2014-12-26 | 2018-05-16 | パナソニックIpマネジメント株式会社 | Imaging device |
CN105744183B (en) * | 2014-12-26 | 2020-08-11 | 松下知识产权经营株式会社 | Image pickup apparatus |
US10324213B2 (en) | 2016-08-30 | 2019-06-18 | Intel Corporation | Capacitive proximity sensing |
KR20180060308A (en) | 2016-11-28 | 2018-06-07 | 삼성전자주식회사 | Image sensor |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5471515A (en) * | 1994-01-28 | 1995-11-28 | California Institute Of Technology | Active pixel sensor with intra-pixel charge transfer |
US5461425A (en) * | 1994-02-15 | 1995-10-24 | Stanford University | CMOS image sensor with pixel level A/D conversion |
US5631704A (en) * | 1994-10-14 | 1997-05-20 | Lucent Technologies, Inc. | Active pixel sensor and imaging system having differential mode |
US5892540A (en) * | 1996-06-13 | 1999-04-06 | Rockwell International Corporation | Low noise amplifier for passive pixel CMOS imager |
US6222175B1 (en) * | 1998-03-10 | 2001-04-24 | Photobit Corporation | Charge-domain analog readout for an image sensor |
US6493030B1 (en) * | 1998-04-08 | 2002-12-10 | Pictos Technologies, Inc. | Low-noise active pixel sensor for imaging arrays with global reset |
JP4444371B1 (en) | 2009-09-01 | 2010-03-31 | 富士フイルム株式会社 | Imaging device and imaging apparatus |
JP5714982B2 (en) * | 2011-02-01 | 2015-05-07 | 浜松ホトニクス株式会社 | Control method of solid-state image sensor |
CN103444167B (en) | 2011-04-08 | 2017-09-29 | 松下知识产权经营株式会社 | The driving method of solid camera head |
JP6124217B2 (en) * | 2011-04-28 | 2017-05-10 | パナソニックIpマネジメント株式会社 | Solid-state imaging device and camera system using the same |
JP5935286B2 (en) * | 2011-10-19 | 2016-06-15 | ソニー株式会社 | Imaging apparatus and imaging display system |
-
2013
- 2013-06-04 JP JP2013117891A patent/JP6134979B2/en active Active
-
2014
- 2014-05-30 WO PCT/JP2014/002873 patent/WO2014196176A1/en active Application Filing
- 2014-05-30 KR KR1020157035513A patent/KR101760200B1/en active IP Right Grant
- 2014-06-04 TW TW103119302A patent/TWI611696B/en active
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