JP2014235131A - Simple device for testing strength for withstanding electromagnetic interference wave - Google Patents

Simple device for testing strength for withstanding electromagnetic interference wave Download PDF

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JP2014235131A
JP2014235131A JP2013118214A JP2013118214A JP2014235131A JP 2014235131 A JP2014235131 A JP 2014235131A JP 2013118214 A JP2013118214 A JP 2013118214A JP 2013118214 A JP2013118214 A JP 2013118214A JP 2014235131 A JP2014235131 A JP 2014235131A
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electromagnetic interference
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interference wave
frequency
antenna
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篤 長尾
Atsushi Nagao
篤 長尾
佳春 秋山
Yoshiharu Akiyama
佳春 秋山
伸 菅野
Shin Sugano
伸 菅野
雄一郎 奥川
Yuichiro Okugawa
雄一郎 奥川
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Nippon Telegraph and Telephone Corp
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Abstract

PROBLEM TO BE SOLVED: To provide a simple device and a method for testing the strength for withstanding an electromagnetic interference wave capable of greatly shortening the time spent for immunity test.SOLUTION: The present invention comprises: a receiving antenna 101 for receiving an electromagnetic interference wave radiated from an electronic apparatus; a receiving unit 102 for receiving from the receiving antenna; a signal processing unit 103 for converting the time waveform of the received electromagnetic interference wave into a frequency spectrum and calculating an electric field intensity level; a storage unit 104 for storing the electromagnetic interference wave converted into the frequency spectrum; an arithmetic unit 105 for calculating, when electromagnetic interference waves each converted into a plurality of frequency spectra are accumulated in the storage unit, a difference between the electromagnetic interference waves; a comparison unit 106 for comparing the electric field intensity level with a threshold and extracting a frequency corresponding to the electric field intensity level exceeding the threshold; a display unit 108 for displaying the extracted frequency; a transmission unit 110 for generating a radio wave on the basis of a frequency, an application level, and an application time set by an application condition control unit 109; and a transmission antenna 111.

Description

本発明は装置の電磁妨害波に対する耐性を評価するイミュニティ試験に関する。   The present invention relates to an immunity test for evaluating a device's resistance to electromagnetic interference.

通信サービスの進展、電子機器の利用環境の変化に伴い、電子機器では、他の装置に対して電磁妨害波(エミッション)の影響を与えないこと、および他の装置や外部からの電磁妨害波の影響を受けない電磁妨害波耐力(イミュニティ)の両立が求められている。   With the progress of communication services and changes in the usage environment of electronic devices, electronic devices should not affect other devices with electromagnetic interference (emissions), and other devices or external electromagnetic interference There is a need for both immunity to electromagnetic interference that is not affected.

電子機器から漏れ出る電磁妨害波の評価は、スペクトラム・アナライザ等の測定器を用いて電磁妨害波のレベルを観察することにより行われる。また、電磁妨害波耐力試験(イミュニティ試験)は、電子機器の電磁妨害波に対する耐性評価を行うため、電子機器に装置が受ける電磁妨害波を模擬した電磁波を印加し、その際の装置の振舞いを観察することにより行われる(特許文献1参照)。   The evaluation of the electromagnetic interference wave leaking from the electronic device is performed by observing the level of the electromagnetic interference wave using a measuring instrument such as a spectrum analyzer. In addition, the electromagnetic interference immunity test (immunity test) applies an electromagnetic wave simulating the electromagnetic interference received by the device to the electronic device in order to evaluate the resistance to the electromagnetic interference of the electronic device. This is done by observing (see Patent Document 1).

特開2011−234189号公報JP 2011-234189 A

通信機器の電磁妨害波による誤動作を防ぐため、イミュニティ試験法(IEC61000-4-3)が定められている。従来のイミュニティ試験法では数多くの電子機器に対して周波数を推移させ、何度もイミュニティ試験を行うため、多大な時間と稼働が必要である。さらに、80〜1000MHzまで1%ステップで試験を実施することから、妨害波に対する耐力レベルが低いため妨害波の影響を受けやすいにも関わらず、イミュニティ試験が実施されていない周波数も存在する。   The immunity test method (IEC61000-4-3) has been established to prevent malfunctions caused by electromagnetic interference in communication equipment. In the conventional immunity test method, the frequency is changed for many electronic devices, and the immunity test is performed many times. Furthermore, since the test is performed in steps of 1% from 80 to 1000 MHz, there is a frequency where the immunity test is not performed even though it is easily affected by the interference wave because the tolerance level against the interference wave is low.

そのため、誤動作の発生する周波数をある程度予測することが必要である。また、近年の電子機器の高周波化に伴い、80〜1000MHzより高い周波数においてもイミュニティ試験が必要であり、広帯域での電磁妨害波耐力試験実施のため、試験にかかる時間の短縮が必要である。   Therefore, it is necessary to predict to some extent the frequency at which malfunction occurs. Further, with the recent increase in the frequency of electronic devices, immunity tests are required even at frequencies higher than 80 to 1000 MHz, and the time required for the tests needs to be shortened in order to perform an electromagnetic interference wave tolerance test in a wide band.

本発明は上記事情に鑑みてなされたものであり、本発明の目的は、イミュニティ試験と比較して短時間で実施できるエミッション試験の結果を用いることで、イミュニティ試験にかかる時間を大幅に短縮することにある。   The present invention has been made in view of the above circumstances, and an object of the present invention is to significantly reduce the time required for the immunity test by using the result of the emission test that can be performed in a short time compared to the immunity test. There is.

上記目的を達成するために、第1の発明に係る電磁妨害波耐力簡易試験装置は、電子機器から放射される電磁妨害波を受信する受信アンテナと、受信アンテナに接続され、受信アンテナが受信した電磁妨害波を受信アンテナから受信する受信部と、受信部に接続され、受信した電磁妨害波の時間波形を周波数スペクトルに変換し、電界強度レベルを算出する信号処理部と、信号処理部に接続され、周波数スペクトルに変換された電磁妨害波を一時的に蓄積する記憶部であって、複数の周波数スペクトルに変換された電磁妨害波を蓄積する機能を有する、記憶部と、記憶部に接続され、記憶部に複数の数スペクトルに変換された電磁妨害波が蓄積されていた場合に、複数の数スペクトルに変換された電磁妨害波の差分をとる演算部と、演算部に接続され、差分と予め設定した閾値との電界強度レベルを比較し、閾値を上回る電界強度レベルに対応した周波数の抽出を行う比較部と、比較部に接続され、抽出した周波数を表示する表示部と、比較部に接続され、抽出した周波数を設定周波数とし、印加レベル、印加時間をさらに設定する印加条件制御部と、印加条件制御部に接続され、設定された設定周波数と、印加レベルと、印加時間とに基づき無線電波を生成する送信部と、送信部に接続され、送信部で生成された無線電波を放射する送信アンテナとからなることを特徴とする。   In order to achieve the above object, an electromagnetic interference wave proof test apparatus according to a first aspect of the present invention is a reception antenna that receives an electromagnetic interference wave radiated from an electronic device, and is connected to the reception antenna and received by the reception antenna. Connected to the signal processing unit that receives the electromagnetic interference wave from the receiving antenna, the signal processing unit that is connected to the reception unit, converts the time waveform of the received electromagnetic interference wave into a frequency spectrum, and calculates the electric field strength level A storage unit for temporarily accumulating electromagnetic interference waves converted to a frequency spectrum, the storage unit having a function of accumulating electromagnetic interference waves converted to a plurality of frequency spectra, and connected to the storage unit In the case where electromagnetic interference waves converted into a plurality of number spectra are stored in the storage unit, a calculation unit that takes a difference between the electromagnetic interference waves converted into a plurality of number spectra, and a calculation unit A comparison unit that compares the field strength level between the difference and a preset threshold value and extracts a frequency corresponding to the field strength level that exceeds the threshold value, and a display unit that is connected to the comparison unit and displays the extracted frequency And an application condition control unit that is connected to the comparison unit and sets the extracted frequency as a set frequency, and further sets an application level and an application time, and is connected to the application condition control unit and is set to a set frequency and an application level. The transmitter includes a transmitter that generates radio waves based on the application time, and a transmission antenna that is connected to the transmitter and radiates radio waves generated by the transmitter.

また、第2の発明に係る電磁妨害波耐力簡易試験装置は、第1の発明に係る電磁妨害波耐力簡易試験装置であって、受信アンテナと送信アンテナが、送信、受信の両方が可能である同一のアンテナであり、同一のアンテナと、受信部および送信部に接続され、同一のアンテナの、受信用アンテナである場合と送信用アンテナである場合との間の切替を行う送受信切替部をさらに有することを特徴とする。   The electromagnetic interference wave resistance simple test apparatus according to the second invention is the electromagnetic interference wave resistance simple test apparatus according to the first invention, wherein the reception antenna and the transmission antenna can both transmit and receive. A transmission / reception switching unit that is the same antenna, is connected to the same antenna, the reception unit and the transmission unit, and switches between the reception antenna and the transmission antenna of the same antenna; It is characterized by having.

また、第3の発明に係る電子機器の電磁妨害波耐力試験を行う方法は、電子機器停止時の電磁妨害波を測定するステップと、測定した電子機器停止時の電磁妨害波を周波数スペクトルに変換するステップと、電子機器停止時の周波数スペクトルを記憶部に記憶させるステップと、記憶部に複数の周波数スペクトルが記憶されているかを判定するステップと、複数の周波数スペクトルが記憶されていないと判定されたとき、電子機器動作時の電磁妨害波を測定するステップと、測定した電子機器動作時の電磁妨害波を周波数スペクトルに変換するステップと、電子機器動作時の周波数スペクトルを記憶部に記憶させるステップと、電子機器停止時の周波数スペクトルと電子機器動作時の周波数スペクトルとの差分をとるステップと、差分を、あらかじめ設定した閾値と比較するステップと、差分が閾値よりも小さいとき、電磁妨害波耐力試験を終了するステップと、差分が閾値以上のとき、差分が閾値以上である周波数を抽出するステップと、電磁妨害波印加時間および電磁妨害波印加レベルを設定するステップと、抽出した周波数と、設定した電磁妨害波印加時間と、設定した電磁妨害波印加レベルとを有する妨害波を電子機器に向けて印加するステップとを備えたことを特徴とする。   According to a third aspect of the present invention, there is provided a method for performing an electromagnetic interference proof test of an electronic device, the step of measuring the electromagnetic interference when the electronic device is stopped, and converting the measured electromagnetic interference when the electronic device is stopped into a frequency spectrum. Determining, storing the frequency spectrum when the electronic device is stopped in the storage unit, determining whether a plurality of frequency spectra are stored in the storage unit, and determining that the plurality of frequency spectra are not stored. Measuring the electromagnetic interference wave when the electronic device is operating, converting the measured electromagnetic interference wave when the electronic device is operating into a frequency spectrum, and storing the frequency spectrum when the electronic device is operating in the storage unit And calculating the difference between the frequency spectrum when the electronic device is stopped and the frequency spectrum when the electronic device is operating. A step of comparing with the threshold set in advance, a step of terminating the electromagnetic interference proof test when the difference is smaller than the threshold, and a step of extracting a frequency at which the difference is greater than or equal to the threshold when the difference is greater than or equal to the threshold; A step of setting an electromagnetic interference wave application time and an electromagnetic interference wave application level, an interference wave having an extracted frequency, a set electromagnetic interference wave application time, and a set electromagnetic interference wave application level is applied to an electronic device. And a step of performing.

また、第4の発明に係る電子機器の電磁妨害波耐力試験を行う方法は、第3の発明に係る電子機器の電磁妨害波耐力試験を行う方法であって、電磁妨害波を測定するステップの前に、電磁妨害波を測定し、かつ妨害波を印加するアンテナを、電磁妨害波を測定するように機能を切り替えるステップと、妨害波を電子機器に向けて印加するステップのあとに、アンテナを、妨害波を印加するように機能を切り替えるステップとをさらに備えたことを特徴とする   A method for performing an electromagnetic interference immunity test of an electronic device according to a fourth invention is a method of performing an electromagnetic interference proof test of an electronic device according to the third invention, comprising the step of measuring an electromagnetic interference wave. Before the step of measuring the electromagnetic interference and applying the interference to the antenna, the step of switching the function to measure the electromagnetic interference and the step of applying the interference toward the electronic device And a step of switching the function so as to apply a disturbing wave.

本発明の第1の実施形態にかかる電磁妨害波耐力簡易試験装置の概略校正を示すブロック図である。It is a block diagram which shows schematic calibration of the electromagnetic interference wave proof strength simple test apparatus concerning the 1st Embodiment of this invention. 本発明の電磁妨害波耐力簡易試験装置の動作を示すフローチャートである。It is a flowchart which shows operation | movement of the electromagnetic interference wave proof test apparatus of this invention. 本発明の第2の実施形態にかかる電磁妨害波耐力簡易試験装置の概略校正を示すブロック図である。It is a block diagram which shows schematic calibration of the electromagnetic interference wave proof strength simple test apparatus concerning the 2nd Embodiment of this invention.

電子機器内部の基盤、ケーブル等の電子部品のうち、電磁妨害波を放射する部分は、アンテナの可逆性により、電磁妨害波を受信する部分となりうる。このため、電磁妨害波の放射が発生する周波数においては、イミュニティレベルが弱いと考えられる。この考えに基き、本発明による電磁妨害波簡易試験装置および電磁妨害波耐力試験を行う方法を提供する。   Of the electronic components such as the board inside the electronic device and the cable, the portion that radiates electromagnetic interference can be a portion that receives the electromagnetic interference due to the reversibility of the antenna. For this reason, it is considered that the immunity level is weak at the frequency at which electromagnetic interference waves are emitted. Based on this idea, an electromagnetic interference simple test apparatus and a method for performing an electromagnetic interference tolerance test according to the present invention are provided.

以下、図面に基づいて本発明による電磁妨害波簡易試験装置について説明する。   Hereinafter, an electromagnetic interference simple test apparatus according to the present invention will be described with reference to the drawings.

<第1の実施形態>
図1は本発明の第1の実施形態が適用された電磁妨害波耐力簡易試験装置の概略構成図を示している。本実施形態の電磁妨害波耐力簡易試験装置は、電子機器の放射妨害波の測定結果を用いることで、その電子機器のイミュニティ試験を短時間で行うことができる。図示する電磁妨害波耐力簡易試験装置は、受信アンテナ101と、受信部102と、処理部103と、記憶部104と、演算部105と、比較部106と、閾値設定部107と、表示部108と、印加条件制御部109と、送信部110と送信アンテナ111と、を有する。
<First Embodiment>
FIG. 1 shows a schematic configuration diagram of a simple electromagnetic interference wave resistance test apparatus to which the first embodiment of the present invention is applied. The electromagnetic interference wave resistance simple test apparatus of the present embodiment can perform an immunity test of an electronic device in a short time by using the measurement result of the radiation interference wave of the electronic device. The electromagnetic interference wave proof test apparatus shown in the figure includes a receiving antenna 101, a receiving unit 102, a processing unit 103, a storage unit 104, a calculation unit 105, a comparison unit 106, a threshold setting unit 107, and a display unit 108. And an application condition control unit 109, a transmission unit 110, and a transmission antenna 111.

受信アンテナ101は測定対象の電子機器動作時や電子機器停止時の電磁妨害波を受信する。処理部103は、フーリエ変換を行うことで、受信した電磁妨害波の時間波形を周波数スペクトラムに変換し、電界強度レベルを算出する。記憶部104は、複数の信号処理結果を一時保存する。演算部105では、記憶部104で蓄積した電子機器動作時の電磁妨害波と電子機器停止時の電磁妨害波のデータの差分を取ることで、電波暗室を使用せずに電子機器から発生する電磁妨害波そのものを測定する。比較部106では、電磁妨害波の電界強度が設定した閾値よりも高い場合に、対応する周波数を抽出する。印加条件制御部109では、電子機器の電磁妨害波耐力試験を行う際の周波数ごとの電磁妨害波の印加時間、印加レベルを設定する。送信部110および送信アンテナ111により、電子機器に、印加条件制御部109において設定した電磁妨害波の印加時間、印加レベル、および比較部106において抽出した周波数の電磁妨害波を印加する。   The receiving antenna 101 receives an electromagnetic interference wave when the electronic device to be measured is operating or when the electronic device is stopped. The processing unit 103 converts the time waveform of the received electromagnetic interference wave into a frequency spectrum by performing Fourier transform, and calculates the electric field intensity level. The storage unit 104 temporarily stores a plurality of signal processing results. The computing unit 105 obtains a difference between the electromagnetic interference wave stored when the electronic device is operating and the electromagnetic interference wave stored when the electronic device is stopped, and the electromagnetic wave generated from the electronic device without using the anechoic chamber. Measure the interference wave itself. The comparison unit 106 extracts a corresponding frequency when the electric field strength of the electromagnetic interference wave is higher than a set threshold value. The application condition control unit 109 sets an electromagnetic interference wave application time and an application level for each frequency when performing an electromagnetic interference wave tolerance test of an electronic device. The transmission unit 110 and the transmission antenna 111 apply to the electronic device an electromagnetic interference wave having an application time, an application level, and a frequency extracted by the comparison unit 106 set in the application condition control unit 109.

図2は本発明の電磁妨害波耐力簡易試験装置の動作を示すフローチャートである。まず、受信アンテナ101、受信部102を用いて電子機器停止時の電磁妨害波を測定する(S1)。測定した時間波形をフーリエ変換等を用いて周波数スペクトルに変換し、変換後のデータを記憶部104へと蓄積する(S2)。記憶部104に2つ以上のデータが蓄積されていなければ(S3:NO)、もう一度受信アンテナ101、受信部102を用いて電子機器動作時の電磁妨害波を測定する。同様に電子機器動作時の時間波形を周波数スペクトルに変換した後、データを記憶部104に蓄積し(S3:YES)、電子機器動作時のデータと電子機器停止時のデータの差分をとる(S4)。そして、演算後のデータの電界強度が、設定した閾値を超えていなければ(S5:NO)対応する周波数の電磁妨害波耐力試験は実施不要となる(S7)。一方で、演算後のデータの電界強度が設定した閾値を超えている場合(S5:YES)には、対応する周波数を抽出し、印加条件制御部109において、電磁妨害波印加時間および印加レベルを設定し、送信アンテナ111を用いて電子機器へと妨害波を印加することで電磁妨害波耐力試験を行う(S6)。   FIG. 2 is a flowchart showing the operation of the electromagnetic interference wave proof test apparatus of the present invention. First, the electromagnetic interference wave when the electronic device is stopped is measured using the receiving antenna 101 and the receiving unit 102 (S1). The measured time waveform is converted into a frequency spectrum using Fourier transform or the like, and the converted data is stored in the storage unit 104 (S2). If two or more pieces of data are not stored in the storage unit 104 (S3: NO), the electromagnetic interference wave during operation of the electronic device is measured again using the receiving antenna 101 and the receiving unit 102. Similarly, after the time waveform when the electronic device is operating is converted into a frequency spectrum, the data is stored in the storage unit 104 (S3: YES), and the difference between the data when the electronic device is operating and the data when the electronic device is stopped is obtained (S4). ). If the electric field strength of the data after the calculation does not exceed the set threshold value (S5: NO), it is not necessary to perform the electromagnetic interference wave proof test for the corresponding frequency (S7). On the other hand, when the electric field strength of the data after the calculation exceeds the set threshold value (S5: YES), the corresponding frequency is extracted, and the application condition control unit 109 sets the electromagnetic interference wave application time and the application level. The electromagnetic interference wave tolerance test is performed by setting and applying the interference wave to the electronic device using the transmission antenna 111 (S6).

以上説明した本実施形態の電磁妨害波耐力簡易試験装置では、電子機器から発生する電磁妨害波の電界強度の高い周波数のみについて電磁妨害波耐力試験を行うことで、通常の試験と比べ、大幅な時間短縮が可能である。また、通常の試験では80〜1000MHzまで1%ステップで放射妨害波を印加するため、電磁妨害波耐力について確認できていない周波数が多く存在する。しかし、本実施形態の電磁妨害波耐力簡易試験装置では、電磁妨害波の発生する周波数、すなわち80〜1000MHzに限らず電磁妨害波を測定した全ての周波数について試験を行うため、電磁妨害波の影響を受けやすい周波数について的を絞った電磁妨害波耐力試験を行うことができる。   In the electromagnetic interference proof strength simple test apparatus of the present embodiment described above, the electromagnetic interference immunity test is performed only on the frequency where the electric field strength of the electromagnetic interference generated from the electronic device is high. Time can be shortened. In addition, since a radiation interference wave is applied in a 1% step from 80 to 1000 MHz in a normal test, there are many frequencies that have not been confirmed for electromagnetic interference wave resistance. However, in the electromagnetic interference wave resistance simple test apparatus of the present embodiment, the test is performed not only on the frequency at which the electromagnetic interference wave is generated, that is, not only 80 to 1000 MHz but also the electromagnetic interference wave is measured. It is possible to carry out targeted electromagnetic interference immunity tests for frequencies that are susceptible to exposure.

さらに、電子機器動作時と電子機器停止時の差分データを取ることで、通常は電波暗室を用いて行う測定を、電波暗室を使用せず、簡易に低コストで試験を行うことが可能である。   Furthermore, by taking the difference data between when the electronic device is operating and when the electronic device is stopped, it is possible to perform tests that are normally performed using an anechoic chamber without using the anechoic chamber and at a low cost. .

<第2の実施形態>
図3は本発明の第2の実施形態が適用された電磁妨害波耐力簡易試験装置の概略構成図である。本実施形態の電磁妨害波耐力簡易装置は、受信アンテナおよび送信アンテナを1つのアンテナで実現している。
<Second Embodiment>
FIG. 3 is a schematic block diagram of an electromagnetic interference wave proof test apparatus to which the second embodiment of the present invention is applied. In the electromagnetic interference wave proof simple apparatus of the present embodiment, the reception antenna and the transmission antenna are realized by one antenna.

図示する電磁妨害波耐力簡易試験装置では、アンテナに送受信切替部113を取付けることで、1つの送受信アンテナ112で受信および送信を可能としている。   In the illustrated electromagnetic interference wave resistance simple test apparatus, a transmission / reception switching unit 113 is attached to an antenna, whereby reception and transmission can be performed by one transmission / reception antenna 112.

101 受信アンテナ
102 受信部
103 処理部
104 記憶部
105 演算部
106 比較部
107 閾値設定部
108 表示部
109 印加条件制御部
110 送信部
111 送信アンテナ
112 送受信アンテナ
113 送受信切替部
101 reception antenna 102 reception unit 103 processing unit 104 storage unit 105 calculation unit 106 comparison unit 107 threshold setting unit 108 display unit 109 application condition control unit 110 transmission unit 111 transmission antenna 112 transmission / reception antenna 113 transmission / reception switching unit

Claims (4)

電磁妨害波耐力簡易試験装置であって、
電子機器から放射される電磁妨害波を受信する受信アンテナと、
前記受信アンテナに接続され、前記受信アンテナが受信した前記電磁妨害波を前記受信アンテナから受信する受信部と、
前記受信部に接続され、前記受信した前記電磁妨害波の時間波形を周波数スペクトルに変換し、電界強度レベルを算出する信号処理部と、
前記信号処理部に接続され、周波数スペクトルに変換された前記電磁妨害波を一時的に蓄積する記憶部であって、複数の前記周波数スペクトルに変換された前記電磁妨害波を蓄積する機能を有する、記憶部と、
前記記憶部に接続され、前記記憶部に前記複数の前記数スペクトルに変換された前記電磁妨害波が蓄積されていた場合に、前記複数の前記数スペクトルに変換された前記電磁妨害波の差分をとる演算部と、
前記演算部に接続され、前記差分と予め設定した閾値との電界強度レベルを比較し、前記閾値を上回る電界強度レベルに対応した周波数の抽出を行う比較部と、
前記比較部に接続され、抽出した前記周波数を表示する表示部と、
前記比較部に接続され、前記抽出した前記周波数を設定周波数とし、印加レベル、印加時間をさらに設定する印加条件制御部と、
前記印加条件制御部に接続され、設定された設定周波数と、印加レベルと、印加時間とに基づき無線電波を生成する送信部と、
前記送信部に接続され、前記送信部で生成された前記無線電波を放射する送信アンテナと
からなることを特徴とする電磁妨害波耐力簡易試験装置。
Electromagnetic interference wave resistance simple test device,
A receiving antenna for receiving electromagnetic interference radiated from an electronic device;
A receiving unit connected to the receiving antenna and receiving the electromagnetic interference wave received by the receiving antenna from the receiving antenna;
A signal processing unit that is connected to the receiving unit, converts a time waveform of the received electromagnetic interference wave into a frequency spectrum, and calculates a field strength level;
A storage unit that is connected to the signal processing unit and temporarily stores the electromagnetic interference wave converted into a frequency spectrum, and has a function of storing the electromagnetic interference wave converted into a plurality of the frequency spectrums. A storage unit;
When the electromagnetic interference wave converted to the plurality of the number spectrums is stored in the storage unit and connected to the storage unit, the difference between the plurality of the electromagnetic interference waves converted to the number spectrums is calculated. An arithmetic unit to take,
A comparison unit that is connected to the calculation unit, compares a field intensity level between the difference and a preset threshold value, and extracts a frequency corresponding to the field intensity level exceeding the threshold value;
A display unit connected to the comparison unit and displaying the extracted frequency;
An application condition control unit connected to the comparison unit, setting the extracted frequency as a set frequency, and further setting an application level and an application time;
A transmitter that is connected to the application condition controller and generates a radio wave based on a set frequency, an application level, and an application time;
An electromagnetic interference wave proof test apparatus characterized by comprising: a transmitting antenna that is connected to the transmitting unit and radiates the radio wave generated by the transmitting unit.
前記受信アンテナと前記送信アンテナが、送信、受信の両方が可能である同一のアンテナであり、前記同一のアンテナと、前記受信部および前記送信部に接続され、前記同一のアンテナの、受信用アンテナである場合と送信用アンテナである場合との間の切替を行う送受信切替部をさらに有することを特徴とする請求項1に記載の電磁妨害波耐力簡易試験装置。   The reception antenna and the transmission antenna are the same antenna capable of both transmission and reception, and are connected to the same antenna, the reception unit and the transmission unit, and are the reception antennas of the same antenna. The electromagnetic interference wave resistance simple test apparatus according to claim 1, further comprising a transmission / reception switching unit configured to switch between the case of being a transmission antenna and the case of being a transmission antenna. 電子機器の電磁妨害波耐力試験を行う方法であって、
電子機器停止時の電磁妨害波を測定するステップと、
測定した前記電子機器停止時の電磁妨害波を周波数スペクトルに変換するステップと、
前記電子機器停止時の前記周波数スペクトルを記憶部に記憶させるステップと、
前記記憶部に複数の前記周波数スペクトルが記憶されているかを判定するステップと、
前記複数の前記周波数スペクトルが記憶されていないと判定されたとき、電子機器動作時の電磁妨害波を測定するステップと、
測定した前記電子機器動作時の電磁妨害波を周波数スペクトルに変換するステップと、
前記電子機器動作時の前記周波数スペクトルを記憶部に記憶させるステップと、
前記電子機器停止時の前記周波数スペクトルと前記電子機器動作時の前記周波数スペクトルとの差分をとるステップと、
前記差分を、あらかじめ設定した閾値と比較するステップと、
前記差分が前記閾値よりも小さいとき、電磁妨害波耐力試験を終了するステップと、
前記差分が前記閾値以上のとき、前記差分が前記閾値以上である周波数を抽出するステップと、
電磁妨害波印加時間および電磁妨害波印加レベルを設定するステップと、
前記抽出した周波数と、設定した前記電磁妨害波印加時間と、設定した前記電磁妨害波印加レベルとを有する妨害波を前記電子機器に向けて印加するステップと
を備えたことを特徴とする電磁妨害波耐力試験を行う方法。
A method for conducting an electromagnetic interference immunity test of electronic equipment,
Measuring electromagnetic interference when the electronic equipment is stopped;
Converting the measured electromagnetic interference wave when the electronic device is stopped into a frequency spectrum;
Storing the frequency spectrum when the electronic device is stopped in a storage unit;
Determining whether a plurality of the frequency spectra are stored in the storage unit;
When it is determined that the plurality of frequency spectra are not stored, measuring electromagnetic interference waves during operation of the electronic device; and
Converting the measured electromagnetic interference wave during operation of the electronic device into a frequency spectrum;
Storing the frequency spectrum during operation of the electronic device in a storage unit;
Taking the difference between the frequency spectrum when the electronic device is stopped and the frequency spectrum when the electronic device is operating;
Comparing the difference with a preset threshold;
When the difference is less than the threshold, terminating the electromagnetic interference immunity test;
Extracting the frequency at which the difference is greater than or equal to the threshold when the difference is greater than or equal to the threshold;
Setting the electromagnetic interference wave application time and electromagnetic interference wave application level;
Applying the interference wave having the extracted frequency, the set electromagnetic interference wave application time, and the set electromagnetic interference wave application level toward the electronic device. A method of conducting a wave strength test.
電磁妨害波を測定するステップの前に、前記電磁妨害波を測定し、かつ前記妨害波を印加するアンテナを、前記電磁妨害波を測定するように機能を切り替えるステップと、
妨害波を前記電子機器に向けて印加するステップのあとに、前記アンテナを、前記妨害波を印加するように機能を切り替えるステップと
をさらに備えたことを特徴とする請求項3に記載の電磁妨害波耐力試験を行う方法。
Before the step of measuring electromagnetic interference, measuring the electromagnetic interference and switching the function of the antenna to which the interference is applied to measure the electromagnetic interference;
The electromagnetic interference according to claim 3, further comprising a step of switching the function of the antenna so as to apply the interference wave after the step of applying the interference wave toward the electronic device. A method of conducting a wave strength test.
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