JP2014178126A - Integrated type non-contact probe - Google Patents

Abstract

PROBLEM TO BE SOLVED: To simultaneously measure a voltage and currents between a cable to be measured and the ground.SOLUTION: In an integrated type non-contact probe 1, a non-contact type voltage probe 11 and a non-contact type current probe 12 are arranged concentrically with a cable 2 to be measured as a center at the same position in a lengthwise direction of the cable 2 to be measured. The integrated type non-contact probe 1 includes: a semi-cylindrical first exterior part 13A for storing and holding a first non-contact type voltage probe portion 11A and a first non-contact type current probe portion 12A; a semi-cylindrical second exterior part 13B for storing and holding a second non-contact type voltage probe portion 11B and a second non-contact type current probe portion 12B; and a hinge 14 for connecting one linear marginal part of the first exterior part 13A to one linear marginal part of the second exterior part 13B.

Description

  The present invention relates to an integrated non-contact probe that can simultaneously measure voltage and current between a cable under measurement and the ground.

  Conventionally, the voltage between the cable to be measured and the ground can be measured by using a non-contact type voltage probe. If a non-contact type current probe is used, the current flowing through the cable to be measured can be measured.

“Capacitive voltage probe”, [online], NTT AT, [Search February 1, 2013], Internet <URL: http://www.ntt-at.co.jp/page.jsp?id=1793&content_id = 351>

  However, the separate use of the non-contact type voltage probe and the non-contact type current probe is not preferable in terms of operability, and improvement is desired.

  The present invention has been made in view of the above problems, and an object of the present invention is to provide an integrated non-contact probe capable of simultaneously measuring the voltage and current between the cable to be measured and the ground.

  In order to solve the above-mentioned problems, an integrated non-contact probe of the present invention surrounds a cable to be measured and surrounds the cable to be measured, a non-contact voltage probe that measures a voltage between the cable to be measured and the ground. And a non-contact type current probe that measures the current flowing through the cable to be measured, and the non-contact type voltage probe and the non-contact type current probe are at the same position in the length direction of the cable to be measured. It arrange | positions concentrically centering on the said to-be-measured cable, It is characterized by the above-mentioned.

  For example, the non-contact voltage probe is configured to measure the voltage between the conductive sponge and the ground by sandwiching the measured cable with a conductive sponge. For example, the non-contact type voltage probe is divided into a first non-contact type voltage probe portion and a second non-contact type voltage probe portion in the circumferential direction of the cable to be measured. A first non-contact type current probe portion and a second non-contact type current probe portion are divided in a peripheral direction of the cable to be measured, and the integrated non-contact probe includes the first non-contact type voltage probe portion and the first non-contact type voltage probe portion. A semi-cylindrical first exterior portion that receives and holds the first non-contact type current probe portion, the second non-contact type voltage probe portion, and the second non-contact type current probe portion. And holding a semi-cylindrical second exterior part, and a hinge connecting one linear edge part of the first exterior part and one linear edge part of the second exterior part.

  For example, each of the first non-contact type voltage probe portion and the second non-contact type voltage probe portion includes a semi-cylindrical conductive sponge, and the measured cable is connected between the flat portions of the respective conductive sponges. And the voltage between each of the conductive sponges and the ground is measured.

  According to the integrated non-contact probe of the present invention, the voltage and current between the cable to be measured and the ground can be measured simultaneously.

It is a figure which shows an example of a structure of the integrated non-contact probe which concerns on this Embodiment.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  FIG. 1 is a diagram illustrating an example of a configuration of an integrated non-contact probe according to the present embodiment according to the present embodiment, and FIG. 1A illustrates a state where the probe is attached to a cable to be measured. (B) shows the state before attachment and after removal.

  The integrated non-contact probe 1 is a so-called clamp type probe that does not cut and process the cable to be measured 2 and is a non-contact that surrounds the cable to be measured 2 and measures the voltage between the cable to be measured 2 and the ground. And a non-contact type current probe 12 that surrounds the cable to be measured 2 and measures a current flowing through the cable to be measured 2 (specifically, a conductor therein).

  In the integrated non-contact probe 1, the non-contact voltage probe 11 and the non-contact current probe 12 are concentrically centered on the measured cable 2 at the same position in the length direction of the measured cable 2. Be placed.

  The non-contact type voltage probe 11 is divided into a first non-contact type voltage probe portion 11A and a second non-contact type voltage probe portion 11B in the peripheral direction of the cable 2 to be measured.

  The non-contact type current probe 12 is divided into a first non-contact type current probe portion 12A and a second non-contact type current probe portion 12B in the peripheral direction of the cable to be measured 2.

  The integrated non-contact probe 1 further includes a semi-cylindrical first exterior portion 13A that houses and holds the first non-contact voltage probe portion 11A and the first non-contact current probe portion 12A, Second non-contact type voltage probe portion 11B and second non-contact type current probe portion 12B are accommodated and held in a semi-cylindrical second exterior portion 13B, and one linear edge portion in the first exterior portion 13A And a hinge 14 that connects one linear edge in the second exterior part 13B, and a stopper that stops the other linear edge in the first exterior part 13A and the other linear edge in the second exterior part 13B. And a tool 15. Note that a spring or the like may be used for the hinge 14 and the stopper 15 may be unnecessary.

(Detailed configuration of the non-contact voltage probe 11)
The first non-contact voltage probe portion 11A and the second non-contact voltage probe portion 11B are each made of a semi-cylindrical and conductive material such as a sponge (hereinafter referred to as a conductive sponge). 111, a curved metal plate 112 covering the curved portion of the conductive sponge 111, and an insulating sheet 113 covering the flat portion of the conductive sponge 111.

(Detailed configuration of the non-contact type current probe 12)
Each of the first non-contact type current probe portion 12A and the second non-contact type current probe portion 12B has a configuration in which a winding 122 is wound around a core material 121.

(Attaching the integrated non-contact probe 1 to the cable to be measured 2)
As described above, the integrated non-contact probe 1 has two parts that can be opened and closed with the hinge 14 as an axis, and can be easily attached to the cable to be measured 2 by sandwiching and closing the cable to be measured 2 in an open state. Can be attached. That is, it is possible to prepare for measurement of both voltage and current in one operation.

  At that time, the flat portions of the conductive sponge 111 sandwich the cable to be measured 2 via the insulating sheet 113. That is, the conductive sponge 111 is depressed by the measured cable 2 and the position of the measured cable 2 is fixed by the repulsive force. Accordingly, the positions of the non-contact type voltage probe 11 and the non-contact type current probe 12 are fixed at concentric positions with the measured cable 2 as the center.

(Voltage measurement with non-contact voltage probe 11)
For the non-contact voltage probe 11, a voltage between the metal plate 112 and the ground, that is, a voltage (noise voltage) between the conductive sponge 111 and the ground is measured. At this time, since the position of the non-contact voltage probe 11 is fixed at a concentric position as described above, even if the cable under measurement 2 moves and changes its position, the measurement value hardly changes. That is, variation can be reduced.

  Further, the metal plate 112 can reduce external noise and obtain an accurate measurement value.

(Current measurement by the non-contact type current probe 12)
Further, according to the integrated non-contact probe 1, not only the voltage but also the current can be measured simultaneously.

  That is, for the non-contact type current probe 12, the current (noise current) flowing through the winding 122 is measured. At this time, as described above, the position of the non-contact type current probe 12 is fixed at a concentric position, so that even if the cable to be measured 2 moves and changes its position, the measurement value hardly changes. That is, variation can be reduced.

(Removal of the integrated non-contact probe 1 from the cable to be measured 2)
The integrated non-contact probe 1 can be easily removed by opening two parts that can be opened and closed with a hinge 14 as an axis and separating the hinge 14 from the cable to be measured 2. In other words, both voltage and current measurement equipment can be withdrawn in a single operation.

  As described above, according to the integrated non-contact probe 1 according to the present embodiment, the non-contact voltage probe 11 and the non-contact current probe 12 are placed at the same position in the length direction of the cable 2 to be measured. Since the cables to be measured 2 are arranged concentrically around the cable 2 to be measured, the voltage and current between the cable to be measured 2 and the ground can be simultaneously measured without contact.

  In addition, since the two parts can be opened and closed with the hinge 14 as an axis, the integrated non-contact probe 1 can be easily attached to and detached from the cable 2 to be measured.

  Further, each of the first non-contact voltage probe portion 11A and the second non-contact voltage probe portion 11B includes a semi-cylindrical conductive sponge 111, and the measured cable 2 is connected to the planar portion of each conductive sponge 111. By sandwiching them, the positions of the non-contact voltage probe 11 and the non-contact current probe 12 can be fixed at concentric positions, and variations in measured values can be reduced.

  The integrated non-contact probe of the present invention is not limited to the above configuration. For example, when the non-contact voltage probe 1 is arranged on the inner side, the cable to be measured 2 is sandwiched between the conductive sponges and the conductive sponge is used. What is necessary is just to comprise so that the voltage between earth and ground may be measured. The conductive sponge is not divided into two as described above. For example, the non-contact voltage probe 1 can be fixed at a concentric position by winding and sandwiching the cable to be measured 2.

  Further, the insulating sheet 113 is not an essential element. For example, if it is known that the cable to be measured 2 is not damaged, it may not be used.

  Further, the metal plate 112 is not an essential element. For example, if it is known that there is no external noise, the metal plate 112 may not be used.

  In the integrated non-contact probe 1, the non-contact voltage probe 11 is set on the inner side and the non-contact type current probe 12 is set on the outer side. At that time, instead of the conductive sponge 111, an insulator or the like may be used, and the outside thereof may be covered with a metal, and the potential between the metal and the ground may be measured.

DESCRIPTION OF SYMBOLS 1 ... Integrated non-contact probe 2 ... Cable to be measured 11 ... Non-contact voltage probe 11A ... 1st non-contact type voltage probe part 11B ... 2nd non-contact type voltage probe part 12 ... Non-contact type current probe 12A ... 1st non-contact type current probe part 12B ... 2nd non-contact type current probe part 13A ... 1st exterior part 13B ... 2nd exterior part 14 ... Hinge 15 ... Stopper 111 ... Conductive sponge 112 ... Metal plate 113 ... Insulating sheet 121 ... Core material 122 ... Winding

Claims (4)

A non-contact type voltage probe that surrounds the cable to be measured and measures a voltage between the cable to be measured and the ground; and a non-contact type current probe that surrounds the cable to be measured and measures a current flowing through the cable to be measured. ,
The non-contact type voltage probe and the non-contact type current probe are arranged concentrically around the measured cable at the same position in the length direction of the measured cable. Non-contact probe.   2. The non-contact type non-contact type probe according to claim 1, wherein the non-contact type voltage probe is configured to sandwich the cable to be measured with a conductive sponge and measure a voltage between the conductive sponge and the ground. probe. The non-contact type voltage probe is divided into a first non-contact type voltage probe portion and a second non-contact type voltage probe portion in the circumferential direction of the cable to be measured,
The non-contact type current probe is divided into a first non-contact type current probe part and a second non-contact type current probe part in the circumferential direction of the cable to be measured,
The integrated non-contact probe is:
A semi-cylindrical first exterior portion that houses and holds the first non-contact voltage probe portion and the first non-contact current probe portion;
A semi-cylindrical second exterior portion that houses and holds the second non-contact voltage probe portion and the second non-contact current probe portion;
2. The integrated non-contact probe according to claim 1, further comprising: a hinge connecting one linear edge of the first exterior part and one linear edge of the second exterior part. Each of the first non-contact voltage probe portion and the second non-contact voltage probe portion includes a semi-cylindrical conductive sponge,
4. The integrated non-contact probe according to claim 3, wherein the cable to be measured is sandwiched between flat portions of the conductive sponges, and the voltage between the conductive sponges and the ground is measured. .

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