JP2014153352A - 環境監視用のリサイクリング高圧チャンバー付のディジタル回路 - Google Patents

環境監視用のリサイクリング高圧チャンバー付のディジタル回路 Download PDF

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Publication number
JP2014153352A
JP2014153352A JP2013191283A JP2013191283A JP2014153352A JP 2014153352 A JP2014153352 A JP 2014153352A JP 2013191283 A JP2013191283 A JP 2013191283A JP 2013191283 A JP2013191283 A JP 2013191283A JP 2014153352 A JP2014153352 A JP 2014153352A
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Japan
Prior art keywords
digital circuit
pressure chamber
diode
current
recycling high
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JP2013191283A
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English (en)
Japanese (ja)
Inventor
Hsun-Hua Tseng
曾訓華
Tin-Yu Liau
廖廷有
Jinn-Yih Wu
呉進益
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Institute of Nuclear Energy Research
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Institute of Nuclear Energy Research
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Publication of JP2014153352A publication Critical patent/JP2014153352A/ja
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  • Measurement Of Radiation (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP2013191283A 2013-02-06 2013-09-17 環境監視用のリサイクリング高圧チャンバー付のディジタル回路 Pending JP2014153352A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW102104696 2013-02-06
TW102104696A TWI493313B (zh) 2013-02-06 2013-02-06 再生高壓游離腔數位環境監測電路

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JP2014153352A true JP2014153352A (ja) 2014-08-25

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JP2013191283A Pending JP2014153352A (ja) 2013-02-06 2013-09-17 環境監視用のリサイクリング高圧チャンバー付のディジタル回路

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JP (1) JP2014153352A (zh)
TW (1) TWI493313B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016114446A (ja) * 2014-12-15 2016-06-23 三菱電機株式会社 放射線測定装置
EP3447481A1 (en) * 2017-08-21 2019-02-27 ams AG Method for operating a gas sensor arrangement and gas sensor arrangement

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4415237A (en) * 1981-09-01 1983-11-15 The United States Of America As Represented By The Department Of Energy Radiation dosimeter
US6380790B1 (en) * 2000-02-11 2002-04-30 President And Fellows Of Harvard College Integrator topplogy for continuous integration
US6592817B1 (en) * 2000-03-31 2003-07-15 Applied Materials, Inc. Monitoring an effluent from a chamber
US7411198B1 (en) * 2006-05-31 2008-08-12 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Integrator circuitry for single channel radiation detector
US7812661B2 (en) * 2007-09-24 2010-10-12 Mediatek Inc. Electronic system capable of compensating process, voltage and temperature effects
KR20100025249A (ko) * 2008-08-27 2010-03-09 (주)쎄미시스코 공정챔버의 리크 검출 방법

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016114446A (ja) * 2014-12-15 2016-06-23 三菱電機株式会社 放射線測定装置
EP3447481A1 (en) * 2017-08-21 2019-02-27 ams AG Method for operating a gas sensor arrangement and gas sensor arrangement
WO2019037960A1 (en) * 2017-08-21 2019-02-28 Ams Ag METHOD OF USING GAS SENSOR ASSEMBLY, AND GAS SENSOR ASSEMBLY
US11448609B2 (en) 2017-08-21 2022-09-20 Sciosense B.V. Method for operating a gas sensor arrangement and gas sensor arrangement

Also Published As

Publication number Publication date
TWI493313B (zh) 2015-07-21
TW201432287A (zh) 2014-08-16

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