JP2014120966A - Piezoelectric component - Google Patents

Piezoelectric component Download PDF

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JP2014120966A
JP2014120966A JP2012275354A JP2012275354A JP2014120966A JP 2014120966 A JP2014120966 A JP 2014120966A JP 2012275354 A JP2012275354 A JP 2012275354A JP 2012275354 A JP2012275354 A JP 2012275354A JP 2014120966 A JP2014120966 A JP 2014120966A
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idt
cover layer
layer
piezoelectric
rewiring
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Toshimasa Tsuda
稔正 津田
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Nihon Dempa Kogyo Co Ltd
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Nihon Dempa Kogyo Co Ltd
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Priority to JP2012275354A priority Critical patent/JP2014120966A/en
Priority to US14/079,640 priority patent/US9264016B2/en
Priority to TW102141370A priority patent/TW201419596A/en
Priority to CN201310566415.0A priority patent/CN103824932A/en
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Abstract

PROBLEM TO BE SOLVED: To provide a piezoelectric component such as a SAW (surface acoustic wave) device which has a sufficient elastic modulus and molding durability to ensure an operational space of an IDT (interdigital transducer), and which is improved in flexibility with respect to a mounting position of a terminal on a mounting board by a customer and flexibility of interactive connections for integrating devices (other components) of the same or different types into a composite device.SOLUTION: The piezoelectric component includes a piezoelectric substrate 1, an IDT 2 comprising an interdigital electrode part 2a formed on a major surface of the piezoelectric substrate and an input/output electrode wiring part 2b, a rib 7 made of a resin material disposed in a periphery of the IDT, and a cover layer 8 made of a resin material for forming an operational space of the IDT by being set on the rib 7. The resin 8a constituting the cover layer is a thermosetting photosensitive resin, which includes fine chips 8b of white mica as a filler. A plurality of rewiring layers 20 electrically connected to the input/output electrode wiring part 2b of the IDT is disposed on the cover layer; and each rewiring layer is configured to allow an external terminal to be set as desired at a position corresponding to a position of a terminal pad of a device to be mounted.

Description

本発明は、例えば携帯電話機等の移動通信機器に使用される、SAWデュプレクサ、SAWフィルタに用いられる弾性表面波デバイス(SAWデバイス)及び圧電薄膜フィルタ等の圧電部品に関する。   The present invention relates to a piezoelectric component such as a SAW duplexer, a surface acoustic wave device (SAW device) used in a SAW filter, and a piezoelectric thin film filter, which are used in mobile communication devices such as mobile phones.

例えば、携帯電話機などの電子機器に搭載される圧電部品の一つであるSAWデバイスでは、そのSAW素子チップを構成する櫛歯電極部(IDT電極部)の周囲に所定の中空部(動作空間)を確保することが必要である。   For example, in a SAW device that is one of piezoelectric components mounted on an electronic device such as a mobile phone, a predetermined hollow portion (operation space) around the comb electrode portion (IDT electrode portion) constituting the SAW element chip. It is necessary to secure

従来、SAWデバイスの小型化を図るため、そのSAW素子チップを金(Au)バンプあるいは半田バンプを用いて、配線基板にフリップチップボンディング(フェースダウンボンディング)し、樹脂等でSAW素子チップ全体を樹脂封止して、SAWデバイスの小型パッケージ・デバイスを構成している(特許文献1参照)。   Conventionally, in order to reduce the size of a SAW device, the SAW element chip is flip-chip bonded (face-down bonding) to a wiring board using gold (Au) bumps or solder bumps, and the entire SAW element chip is made of resin by resin or the like. The SAW device is sealed to form a small package device (see Patent Document 1).

さらに、この種の電子機器に搭載されるSAWデバイスに要求される小型化・低背化を図るため、櫛歯電極部(IDT電極部)の周囲に所定の中空部(動作空間)を形成し、この動作空間を保持したまま、多数の櫛歯電極を形成したマザー基板(集合圧電基板:ウェハ)全体を樹脂で封止し、外部端子(外部接続電極)を形成した後、所定のマーキングに沿ってダイシングにより個々のSAWデバイスに分割してなる超小型化されたチップサイズ・パッケージSAWデバイスが提案されている(特許文献2参照)。   Furthermore, in order to reduce the size and height required for SAW devices mounted on this type of electronic equipment, a predetermined hollow portion (operation space) is formed around the comb electrode portion (IDT electrode portion). While maintaining this operation space, the entire mother substrate (collective piezoelectric substrate: wafer) on which a large number of comb-shaped electrodes are formed is sealed with resin, and external terminals (external connection electrodes) are formed. An ultra-miniaturized chip size package SAW device has been proposed which is divided into individual SAW devices by dicing along (see Patent Document 2).

IDTの動作空間を樹脂材料のカバー層で構成したものがある。このようなSAWデバイスをモールド樹脂でモールドする際に、そのモールド時の高温でカバー層が反りを起したり、潰れが生じたりして動作空間が破壊されるおそれがある。これを回避するため、IDTの周囲を囲むように樹脂材料からなる支持層(リブ)を設け、その上にカバー層(動作空間の天上層を構成)を配置することで、IDTの動作空間を確保するようにしたものが特許文献3に開示されている。   There is one in which the operating space of the IDT is constituted by a cover layer made of a resin material. When such a SAW device is molded with a molding resin, the cover layer may be warped or crushed at a high temperature during molding, and the operating space may be destroyed. In order to avoid this, a support layer (rib) made of a resin material is provided so as to surround the IDT, and a cover layer (which constitutes the top layer of the operation space) is disposed on the support layer (rib). What is ensured is disclosed in Patent Document 3.

また、IDTの動作空間を上記したものと同様の樹脂材料からなるリブとカバー層で形成し、カバー層の外面に設けた外部端子と入出力電極・配線を電気的に接続するため、IDTの入出力電極・配線に再配線層を形成し、カバー層に貫通させた電極柱を介して外部端子と再配線層を接続したものが特許文献4に記載されている。外部端子には、その後の工程で実装基板との電気的接続を行うための半田ボール等の導電接続部材が形成される。   In addition, the IDT operating space is formed of ribs and cover layers made of the same resin material as described above, and the external terminals provided on the outer surface of the cover layer are electrically connected to the input / output electrodes / wirings. Patent Document 4 discloses a method in which a rewiring layer is formed on input / output electrodes / wirings, and an external terminal and a rewiring layer are connected via an electrode column penetrating a cover layer. The external terminal is formed with a conductive connection member such as a solder ball for electrical connection with the mounting substrate in a subsequent process.

図11は、動作空間を樹脂材料からなるカバー層で形成した従来のSAWデバイスの一例を単純化して示す模式断面図である。このSAWデバイス100は、圧電板1の一方の面(主面)にIDT2が形成されている。ここでは、IDT2が櫛歯電極部2aとこの櫛歯電極部2aに信号を入出力する入出力電極・配線部2bとで構成したものとして示してある。IDT2の動作空間21は、樹脂材料からなるカバー層8で形成されている。   FIG. 11 is a schematic cross-sectional view schematically showing an example of a conventional SAW device in which an operation space is formed by a cover layer made of a resin material. In this SAW device 100, IDT 2 is formed on one surface (main surface) of the piezoelectric plate 1. Here, the IDT 2 is shown as comprising a comb-tooth electrode portion 2a and an input / output electrode / wiring portion 2b for inputting / outputting signals to / from the comb-tooth electrode portion 2a. The operation space 21 of the IDT 2 is formed by a cover layer 8 made of a resin material.

図11に示したSAWデバイス100では、入出力電極・配線2bに重畳させて再配線層20が形成されている。この再配線層20上で、IDT2を周囲から囲むように樹脂材料のリブ7が形成されており、このリブ7の上に橋絡して上記カバー層8が設けられている。カバー層8の表面には、適用する電子機器に実装するための外部端子(実装端子)26が設けられており、この外部端子26に半田ボール23などの導電接続部材が設置される。外部端子26は、カバー層8とリブ7を貫通して設けた電極柱22で再配線層20に電気的に接続されている。   In the SAW device 100 shown in FIG. 11, the rewiring layer 20 is formed so as to overlap the input / output electrode / wiring 2b. On the rewiring layer 20, a rib 7 made of a resin material is formed so as to surround the IDT 2 from the periphery, and the cover layer 8 is provided on the rib 7 by bridging. On the surface of the cover layer 8, an external terminal (mounting terminal) 26 for mounting on an applied electronic device is provided, and a conductive connection member such as a solder ball 23 is installed on the external terminal 26. The external terminal 26 is electrically connected to the rewiring layer 20 by an electrode column 22 provided through the cover layer 8 and the rib 7.

特開2004−147220号公報JP 2004-147220 A 特開2006−246112号公報JP 2006-246112 A WO2006/134928号公報WO2006 / 134928 特開2010−10812号公報JP 2010-10812 A

従来のSAWデバイスでは、図11で説明したように、その構造上、再配線層20がIDT2の外側に形成される。これにより、外部端子26の位置もデバイスの外周付近に限定されるため、複合化デバイスへの適用や顧客メーカーの適用機器の実装基板に形成された接続パッド等に対する端子位置に自由度が少ない。また、外部端子26への半田ボール23等の導電接続部材の形成は、動作空間を形成するカバー層8の設置後、当該カバー層の上面の限定された位置にある外部端子26に直接形成しているため、リフロー処理時における溶融半田などの熱がカバー層8の撓みを招き、動作空間に歪みを与えるおそれがあった。   In the conventional SAW device, as described with reference to FIG. 11, the rewiring layer 20 is formed outside the IDT 2 due to its structure. Thereby, since the position of the external terminal 26 is also limited to the vicinity of the outer periphery of the device, the degree of freedom is small in the terminal position with respect to the connection pad or the like formed on the mounting board of the application device of the customer manufacturer or the application device of the customer manufacturer. In addition, the formation of the conductive connection member such as the solder ball 23 on the external terminal 26 is performed directly on the external terminal 26 at a limited position on the upper surface of the cover layer after the cover layer 8 forming the operation space is installed. Therefore, heat such as molten solder during the reflow process may cause the cover layer 8 to bend and cause distortion in the operation space.

本発明の目的は、上記従来技術に鑑みて、IDTの動作空間を確保するための十分な弾性率と耐モールド性を具備し、顧客の実装基板等への実装端子位置に対する自由度、同種又は異種のデバイス(他の部品)を一体化して複合化デバイスとする際の相互接続の自由度を向上させたSAWデバイスなどの圧電部品とを提供することにある。   The object of the present invention is to provide a sufficient elastic modulus and mold resistance for securing the IDT operating space in view of the above prior art, the degree of freedom with respect to the mounting terminal position on the mounting board of the customer, An object of the present invention is to provide a piezoelectric component such as a SAW device in which the degree of freedom of interconnection is improved when different devices (other components) are integrated into a composite device.

上記目的を達成するため、本発明は、圧電基板と、前記圧電基板の主面に形成した櫛歯電極部と入出力電極・配線部と、前記IDTの周囲に設けた樹脂材料のリブと、前記リブの上に設置して前記IDTの動作空間を形成する樹脂材料のカバー層を具備する圧電部品であって、
前記カバー層を構成する樹脂は、熱硬化性感光性樹脂であり、この熱硬化性感光性樹脂にフィラーとして白色マイカの微細片を含有させてなり、
前記カバー層の上に、前記IDTの入出力電極・配線と電気的に接続した複数の再配線層を有し、
前記再配線層のそれぞれは、当該再配線層上の任意の位置に実装機器の端子パッドの位置に応じた位置に外部端子を任意に設置可能とした。
In order to achieve the above object, the present invention provides a piezoelectric substrate, comb-shaped electrode portions and input / output electrodes / wiring portions formed on the main surface of the piezoelectric substrate, a rib of resin material provided around the IDT, A piezoelectric component comprising a cover layer of a resin material that is installed on the rib to form an operation space of the IDT,
The resin constituting the cover layer is a thermosetting photosensitive resin, and the thermosetting photosensitive resin contains fine pieces of white mica as a filler.
A plurality of rewiring layers electrically connected to the input / output electrodes / wirings of the IDT are provided on the cover layer,
In each of the rewiring layers, an external terminal can be arbitrarily installed at a position corresponding to the position of the terminal pad of the mounting device at an arbitrary position on the rewiring layer.

本発明では、前記カバー層を構成する熱硬化性感光性樹脂は、発ガス性が低いポリイミド樹脂を好適とする熱硬化性感光性樹脂材料であり、この熱硬化性感光性樹脂材料に含有した前記白色マイカの微細片の含有量を40重量%乃至60重量%とする。   In this invention, the thermosetting photosensitive resin which comprises the said cover layer is a thermosetting photosensitive resin material which uses the polyimide resin with low gas generating property suitably, It contained in this thermosetting photosensitive resin material The content of the fine pieces of the white mica is 40% by weight to 60% by weight.

また、前記カバー層の端縁は、前記圧電基板の端縁から後退した位置にあり、前記圧電基板の前記カバー層の端縁の後退で露呈した上面に前記IDTの入出力電極・配線と電気的に接続した再配線層に接続した金属電極層を有し、
前記再配線層は、前記カバー層上に延在して電気的に接続するように構成する。
In addition, the edge of the cover layer is in a position retreated from the edge of the piezoelectric substrate, and the IDT input / output electrodes / wirings and electrical surfaces are exposed on the upper surface exposed by the retreat of the edge of the cover layer of the piezoelectric substrate. Having a metal electrode layer connected to the rewiring layer connected
The rewiring layer extends on the cover layer and is electrically connected.

前記IDTの入出力電極・配線の上に、前記圧電基板の主面の外周に延在する金属電極層を有し、
前記再配線層は、前記リブと前記カバー層を貫通する電極柱で前記金属電極層と電気的に接続するように構成することができる。
A metal electrode layer extending on the outer periphery of the main surface of the piezoelectric substrate on the input / output electrodes / wirings of the IDT,
The redistribution layer may be configured to be electrically connected to the metal electrode layer by an electrode column penetrating the rib and the cover layer.

カバー層の上面は電極形成を制限する構造物がないため、自由な形状と大きさで再配線層を設けることができる。このため、顧客電子機器等の実装基板にある端子パッドなどの位置に対応して実装のための半田ボールや半田バンプなどの電気的接続部材を任意に配置でき、顧客先での実装端子の設計裕度の向上に資する。   Since there is no structure that restricts electrode formation on the upper surface of the cover layer, the rewiring layer can be provided in any shape and size. For this reason, electrical connection members such as solder balls and solder bumps for mounting can be arbitrarily arranged according to the position of the terminal pads on the mounting board of customer electronic equipment, etc., and the mounting terminal design at the customer site Contributes to improved margins.

また、IDTの動作空間を形成するカバー層を熱硬化性感光性樹脂に透光性の白色マイカの微細片を40重量%乃至60重量%の範囲で含有させたことで、光効果プロセスでの樹脂の効率的硬化処理が実現でき、弾性率が格段に向上し、IDTの動作空間が部品のモールド工程等での加熱、加圧に起因するダメージを抑制できる。   Further, the cover layer forming the IDT operating space is contained in the thermosetting photosensitive resin in the range of 40 wt% to 60 wt% of translucent white mica fine pieces. Efficient curing treatment of the resin can be realized, the elastic modulus can be remarkably improved, and the IDT operating space can suppress damage due to heating and pressurization in the molding process of the component.

本発明の圧電部品の実施例1であるSAWデバイスの説明図である。It is explanatory drawing of the SAW device which is Example 1 of the piezoelectric component of this invention. 図1(a)を矢印A方向から見た平面図である。It is the top view which looked at Fig.1 (a) from the arrow A direction. カバー層を構成する樹脂としてのポリイミド樹脂に混入するフィラー(微小マイカ片)の量(重量パーセント:wt%)の適量を説明する図である。It is a figure explaining the appropriate quantity of the quantity (weight percent: wt%) of the filler (micro mica piece) mixed in the polyimide resin as resin which comprises a cover layer. 本発明の圧電部品の実施例2であるSAWデバイスを説明する模式断面である。It is a schematic cross section explaining the SAW device which is Example 2 of the piezoelectric component of the present invention. 図4を矢印A方向から見た平面図である。It is the top view which looked at FIG. 4 from the arrow A direction. 本発明に係るSAWデバイスを実装基板に実装するための導電接続部材、あるいは他のデバイスとの複合化のための導電性接続部材の配置例の説明図である。It is explanatory drawing of the example of arrangement | positioning of the conductive connection member for mounting the SAW device which concerns on this invention to a mounting substrate, or a composite with another device. 本発明に係るSAWデバイスを実装基板に実装するための導電接続部材、あるいは他のデバイスとの集積のための導電性接続部材の配置例の説明図である。It is explanatory drawing of the example of arrangement | positioning of the conductive connection member for mounting the SAW device which concerns on this invention to a mounting substrate, or the conductive connection member for integration with another device. 本発明に係るSAWデバイスを実装基板に実装するための導電接続部材、あるいは他のデバイスとの集積のための導電性接続部材の配置例の説明図である。It is explanatory drawing of the example of arrangement | positioning of the conductive connection member for mounting the SAW device which concerns on this invention to a mounting substrate, or the conductive connection member for integration with another device. 、本発明に係るSAWデバイスを他のデバイスと集積して複合部品とする一例を説明する模式図である。FIG. 3 is a schematic diagram for explaining an example in which a SAW device according to the present invention is integrated with another device to form a composite part. 本発明に係るSAWデバイスを他のデバイスと共に適用機器の回路基板に実装する一例を説明する模式図である。It is a schematic diagram explaining an example which mounts the SAW device which concerns on this invention on the circuit board of an applicable apparatus with another device. 動作空間を樹脂材料からなるカバー層で形成した従来のSAWデバイスの一例を単純化して示す模式断面図である。It is a schematic cross-sectional view showing a simplified example of a conventional SAW device in which an operation space is formed by a cover layer made of a resin material.

以下、本発明の圧電部品、及びその製造方法をSAWデバイスの実施例について図面を参照して詳細に説明する。   Hereinafter, embodiments of a piezoelectric component and a manufacturing method thereof according to the present invention will be described in detail with reference to the drawings.

図1は、本発明の圧電部品の実施例1であるSAWデバイスの説明図で、図1の(a)は模式断面を、同(b)図1(a)のカバーを拡大して示す模式断面図である。図2は、図1(a)を矢印A方向から見た平面図である。SAWデバイス100の主要部は、図1(a)に示されたように、圧電基板1の一方の面(主面)にIDT電極2を形成してなる。IDT電極2は、櫛歯電極部2aと、この櫛歯電極部2aに信号を入出力すると共に部品外部への電気的接続を行うための入出力電極・配線部2bで構成される。なお、図1のIDT構造は説明を簡単にするためIDTは一つのみとしてあるが、2あるいはそれ以上のIDTを複合的に形成したものであっても本実施例に含まれる。後述の他の実施例でも同様である。圧電基板1は、タンタル酸リチウム(LiTaO)で構成したが、この外に、ニオブ酸リチウム(LiNbO)、水晶なども用いられる。 FIG. 1 is an explanatory view of a SAW device that is a first embodiment of a piezoelectric component according to the present invention. FIG. 1 (a) is a schematic cross-sectional view, and FIG. 1 (b) is an enlarged view of the cover of FIG. It is sectional drawing. FIG. 2 is a plan view of FIG. 1A viewed from the direction of arrow A. FIG. The main part of the SAW device 100 is formed by forming the IDT electrode 2 on one surface (main surface) of the piezoelectric substrate 1 as shown in FIG. The IDT electrode 2 includes a comb electrode part 2a and an input / output electrode / wiring part 2b for inputting / outputting signals to / from the comb electrode part 2a and for electrical connection to the outside of the component. The IDT structure in FIG. 1 has only one IDT for the sake of simplicity of explanation, but a configuration in which two or more IDTs are formed in a composite manner is also included in this embodiment. The same applies to other embodiments described later. The piezoelectric substrate 1 is made of lithium tantalate (LiTaO 3 ), but in addition to this, lithium niobate (LiNbO 3 ), crystal, or the like is also used.

IDT電極2は、圧電基板1の主面にアルミニウム(Al)薄膜を蒸着し、これをホトリソグラフィー手法(以下、単にホトリソと称する)でパターニングして形成される。IDT電極2の入出力電極・配線部2bの上から圧電板1の外縁にかけて、アルミニウムを好適とする金属電極層6が形成されている。入出力電極・配線部2bの上かつ金属電極層6の上にはIDT2の櫛歯電極部2aを周回してリブ7が設けられている。このリブ7は樹脂からなり、カバー層8を支えてIDT2の櫛歯電極部2aの動作空間21を確保する。   The IDT electrode 2 is formed by depositing an aluminum (Al) thin film on the main surface of the piezoelectric substrate 1 and patterning the thin film by a photolithography technique (hereinafter simply referred to as photolithography). A metal electrode layer 6 made of aluminum is formed from the input / output electrode / wiring portion 2 b of the IDT electrode 2 to the outer edge of the piezoelectric plate 1. On the input / output electrode / wiring part 2b and on the metal electrode layer 6, ribs 7 are provided around the comb electrode part 2a of the IDT 2. The rib 7 is made of resin, and supports the cover layer 8 to secure the operation space 21 of the comb electrode portion 2a of the IDT 2.

なお、IDT電極2の材料は、上記のアルミニウムに限らず、Cu、Au、Cr、Ru、Ni、Mg、Ti、W、V、Mo、Ag、In、Snの何れかを主成分とする金属材料、またはこれらの材料と酸素、窒素、珪素、との化合物、あるいはこれらの金属の合金、金属間化合物の単層膜または多層膜で構成できる。   The material of the IDT electrode 2 is not limited to the above-mentioned aluminum, but is a metal mainly containing any one of Cu, Au, Cr, Ru, Ni, Mg, Ti, W, V, Mo, Ag, In, and Sn. A single layer film or a multilayer film of a material, a compound of these materials and oxygen, nitrogen, silicon, or an alloy of these metals or an intermetallic compound can be used.

本実施例のカバー層8は、図1の(b)に示したように、感光剤、硬化補助剤等を添加した熱硬化性のポリイミドに8aに白色マイカの微細片8bをフィラーとして混入したフィルム形状の部材である。この白色マイカの微細片8bは透光性であり、ウェハ段階でのフィルム貼付後のパターニングにおけるホトリソ工程で露光光(紫外光等)がフィルムの厚み方向にも十分に到達させる効果を有する。なお、以下では、白色マイカの微細片をマイカフィラー又は単にフィラーとも称する)を混入する。このフィラーは紫外線等の露光光を遮ることなく樹脂フィルム内を透過させるため、精度のよいテンティング処理が可能となる。カバー層8に用いる樹脂は、上記したポリイミドに限るものではなく、熱硬化性で発ガスが少ないものであればよい。   In the cover layer 8 of this example, as shown in FIG. 1B, a white mica fine piece 8b was mixed as a filler into a thermosetting polyimide to which a photosensitizer, a curing auxiliary agent and the like were added. It is a film-shaped member. The white mica fine pieces 8b are translucent, and have an effect that exposure light (ultraviolet light or the like) sufficiently reaches the thickness direction of the film in the photolithography process in the patterning after film attachment at the wafer stage. In the following, white mica fine pieces are also referred to as mica filler or simply filler). Since this filler transmits the inside of the resin film without blocking exposure light such as ultraviolet rays, a precise tenting process can be performed. The resin used for the cover layer 8 is not limited to the above-described polyimide, and may be any resin that is thermosetting and generates little gas.

マイカフィラーの物理形状は鱗片状の薄片であり、感光性熱硬化性樹脂への混入では、このマイカフィラーの面が感光性熱硬化性樹脂フィルムの平面方向に略一致するように、かつ、近接する複数のフィラーが当該フィルムの厚み方向に互いに重畳して平面方向にも順次重畳配置するようにすることで、カバー層の機械的強度を向上させることができる。なお、感光性熱硬化性樹脂に混入するフィラーは白色マイカ片に限るものではなく、これと同等の透光性をもち、かつ感光性熱硬化性樹脂に機械的強度を付与できるものであれば、それを使用できる。   The physical shape of the mica filler is a scaly flake. The mechanical strength of the cover layer can be improved by the plurality of fillers overlapping each other in the thickness direction of the film and sequentially overlapping in the plane direction. In addition, the filler mixed in the photosensitive thermosetting resin is not limited to white mica pieces, as long as it has the same translucency and can give mechanical strength to the photosensitive thermosetting resin. You can use it.

フィラーの混入量が少ないと機械的強度、特に撓み抑制効果が低下して空隙保持が困難になり、混入量が過大になると脆弱性が増加し、割れやすくなる。たとえば、圧電板は水晶やLiTaOで構成される。例えば、LiTaOの圧電板を用いた場合、その熱膨張率にカバー層の熱膨張率を近似させることで熱歪によるカバー層の剥離や空隙の破壊を回避する。そのためには10GPa以上の耐圧とすることが要求される。 When the amount of filler mixed is small, the mechanical strength, in particular, the effect of suppressing deflection is lowered, making it difficult to maintain voids. When the amount of mixed filler is excessive, brittleness increases and cracking easily occurs. For example, the piezoelectric plate is made of quartz or LiTaO 3 . For example, when a LiTaO 3 piezoelectric plate is used, the thermal expansion coefficient of the cover layer is approximated to the thermal expansion coefficient to avoid peeling of the cover layer and void destruction due to thermal strain. For this purpose, a breakdown voltage of 10 GPa or more is required.

図3は、カバー層を構成する樹脂としてのポリイミド樹脂に混入するフィラー(微小マイカ片)の量(重量パーセント:wt%)の適量を説明する図であり、横軸に微小マイカ片の混入量(wt%)を、縦軸にカバー層の強度(GPa)を取って示す。この種のデバイスを樹脂モールドする際には高い圧力が印加される。例えばトランスファーモールドでは5乃至15GPa程度となる。このことから、カバー層の強度は10GPaを下回らないことが必要とされる。   FIG. 3 is a diagram for explaining an appropriate amount of filler (micro mica pieces) mixed in polyimide resin as a resin constituting the cover layer (weight percent: wt%), and the horizontal axis shows the amount of micro mica pieces mixed (Wt%) is indicated by taking the strength (GPa) of the cover layer on the vertical axis. When this type of device is resin-molded, a high pressure is applied. For example, in the transfer mold, it is about 5 to 15 GPa. For this reason, the strength of the cover layer is required not to be lower than 10 GPa.

また、前記したように、混入量が過大になると脆性が増し、耐衝撃性は低下する。本願の発明者は、実験により図3に示したような関係を見出した。この関係を基にして、実験的に得られた混入量(重量パーセント:wt%)とこのフィラーの混入した樹脂と耐圧力との関係から、リブ間距離(リブ7で両端支持された間の距離)が5〜10μm、カバー層8の厚み25〜35μmとしたとき、白色マイカ片の混入量は40乃至60wt%、好ましくは45乃至55wt%とする。   Further, as described above, when the mixing amount becomes excessive, brittleness increases and impact resistance decreases. The inventor of the present application found a relationship as shown in FIG. 3 through an experiment. Based on this relationship, the distance between ribs (between both ends supported by ribs 7) was calculated from the relationship between the experimentally obtained mixing amount (weight percent: wt%), the resin mixed with this filler, and the pressure resistance. When the distance) is 5 to 10 μm and the thickness of the cover layer 8 is 25 to 35 μm, the amount of white mica pieces mixed is 40 to 60 wt%, preferably 45 to 55 wt%.

このSAWデバイス100は、ウェハから分離した後、樹脂モールドされる。なお、ここでは、モールド樹脂は図示を省略してある(以下の説明でも同様)。図2に示されるように、平面輪郭が略矩形であり、その動作空間21を形成するカバー層8の端縁は、前記圧電基板1の端縁からデバイスの内方に後退した位置にあり、前記圧電基板の前記カバー層の端縁の後退で露呈した上面に前記IDT2の入出力電極・配線2bと電気的に接続した金属電極層6を有する。圧電板1の表面(デバイスの上面、詳しくは金属電極層の上)からカバー層8の上面にかけて再配線層20(本実施例では、20a,20b,20c,20dの四個)が設けられている。デバイスの上面には、他に電極などがなく、比較的フラットな面であるため、この面に再配線層20が十分な広さと任意の形状で形成される。したがって、後述するように、このデバイスを他の基板に実装する際、あるいは複合デバイスとして他のデバイスに複合化する場合、実装あるいは集積のために再配線層20の上に形成する半田ボールあるいは半田バンプなどの導電接続部材の形成位置に大きな自由度が確保される。   The SAW device 100 is resin-molded after being separated from the wafer. Here, illustration of the mold resin is omitted (the same applies to the following description). As shown in FIG. 2, the planar outline is substantially rectangular, and the edge of the cover layer 8 forming the operation space 21 is in a position retracted inward of the device from the edge of the piezoelectric substrate 1, A metal electrode layer 6 electrically connected to the input / output electrode / wiring 2b of the IDT 2 is provided on the upper surface of the piezoelectric substrate exposed by retreating the edge of the cover layer. A rewiring layer 20 (four in this embodiment, 20a, 20b, 20c, and 20d) is provided from the surface of the piezoelectric plate 1 (the upper surface of the device, specifically, on the metal electrode layer) to the upper surface of the cover layer 8. Yes. Since there is no other electrode on the upper surface of the device and it is a relatively flat surface, the rewiring layer 20 is formed on this surface with a sufficient width and an arbitrary shape. Therefore, as will be described later, when this device is mounted on another substrate or when it is combined with another device as a composite device, a solder ball or solder formed on the rewiring layer 20 for mounting or integration A large degree of freedom is secured in the formation position of the conductive connection member such as the bump.

なお、金属電極層6、再配線層20は、Al、Pt、Au、Cu、W、Mo、Tiなどの薄膜で形成される。膜厚は、0.1乃至0.5μm程度である。   The metal electrode layer 6 and the rewiring layer 20 are formed of a thin film such as Al, Pt, Au, Cu, W, Mo, and Ti. The film thickness is about 0.1 to 0.5 μm.

図4は、本発明の圧電部品の実施例2であるSAWデバイスを説明する模式断面である。図5は、図4を矢印A方向から見た平面図で、デバイスの上面からみた平面輪郭は前記実施例1と同様の略矩形であるが、カバー層8による段差はない。以下では、主として実施例1に係るSAWデバイスと異なる構成について説明する。この実施例でも、モールド樹脂は図示を省略してある。   FIG. 4 is a schematic cross-sectional view illustrating a SAW device that is Embodiment 2 of the piezoelectric component of the present invention. FIG. 5 is a plan view of FIG. 4 as viewed from the direction of arrow A, and the planar contour viewed from the upper surface of the device is substantially rectangular as in the first embodiment, but there is no step due to the cover layer 8. Hereinafter, a configuration different from the SAW device according to the first embodiment will be mainly described. Also in this embodiment, illustration of the mold resin is omitted.

実施例2のSAWデバイス200は、実施例1と同様に、入出力電極・配線部2bの上かつ金属電極層6の上にIDT2の櫛歯電極部2aを周回してリブ7が設けられている。このリブ7の上で、圧電板1の主面外周の全域にカバー層8がテンティングで形成されている。そして、金属電極層6とカバー層8を貫通して電極柱22が形成されている。この電極柱22は、金属電極層6に接続して情報に延び、上端面がカバー層8の上面に露呈されている。再配線層20は、カバー層8の上、かつ前記図5に示したような形状と配置に、アルミニウム膜の蒸着とホトリソ等でパターニングして形成されている。   In the SAW device 200 of the second embodiment, the rib 7 is provided around the comb electrode portion 2a of the IDT 2 on the input / output electrode / wiring portion 2b and on the metal electrode layer 6 as in the first embodiment. Yes. On the rib 7, a cover layer 8 is formed by tenting over the entire outer periphery of the main surface of the piezoelectric plate 1. An electrode column 22 is formed through the metal electrode layer 6 and the cover layer 8. The electrode column 22 is connected to the metal electrode layer 6 and extends to information, and the upper end surface is exposed on the upper surface of the cover layer 8. The rewiring layer 20 is formed on the cover layer 8 and in the shape and arrangement as shown in FIG. 5 by patterning by vapor deposition of aluminum film and photolithography.

本実施例の電極柱22は、Cuの電界メッキで形成される。この電極柱の端面にはNi及びAuの無電界メッキが施されるが、図示は省略してある。このNi及びAuの無電界メッキを施すことで、Cuの電極柱22の酸化防止と実装の際の半田付け性が良好となる。なお、Ni及びAuの無電界メッキに代えて、Auのみ、Ni、Pd及びAuの無電界メッキとすることもできる。   The electrode column 22 of this embodiment is formed by Cu electroplating. Electroless plating of Ni and Au is performed on the end face of the electrode column, but the illustration is omitted. By applying the electroless plating of Ni and Au, the oxidation prevention of the Cu electrode column 22 and the solderability during mounting are improved. Instead of electroless plating of Ni and Au, electroless plating of only Ni, Ni, Pd, and Au can be performed.

実施例2に係るSAWデバイス200も、当該デバイスの上面には、他に電極などがなく、比較的フラットな面であるため、この面に再配線層20が十分な広さと任意の形状で形成される。したがって、後述するように、このデバイスを他の基板に実装する際、あるいは複合デバイスとして他のデバイスに集積する場合、実装あるいは集積のために再配線層20の上に形成する半田ボールあるいは半田バンプなどの導電接続部材の形成位置に大きな自由度が確保される。   Since the SAW device 200 according to the second embodiment is also a relatively flat surface without any other electrodes on the upper surface of the device, the rewiring layer 20 is formed in a sufficiently wide and arbitrary shape on this surface. Is done. Therefore, as will be described later, when this device is mounted on another substrate or integrated as a composite device on another device, a solder ball or solder bump formed on the rewiring layer 20 for mounting or integration. A great degree of freedom is secured in the formation position of the conductive connection member.

図6は、本発明に係るSAWデバイスを実装基板に実装するための導電接続部材、あるいは他のデバイスとの複合化のための導電性接続部材の配置例の説明図である。ここでは、前記図1で説明した実施例1に係るSAWデバイス100について、実装基板に実装するための導電性接続部材として半田ボール23を用いた例を説明する。再配線層20がカバー層8の表面で広がりをもって配置されているので、半田ボール23は実装相手の配線基板あるいはデバイスの端子電極や接続パッドに対応させた位置に設けることができる。図6は四個の半田ボール23a,23b,23c,23dが実装基板の端子パッドの位置対応で、デバイスの上面上で整列することなく設けられている状態を示す。実装基板等の端子パッドの配列によっては、四個の半田ボール23a,23b,23c,23dを直交する二方向に整列させて設けることもあることは言うまでもない。   FIG. 6 is an explanatory view of an arrangement example of the conductive connection member for mounting the SAW device according to the present invention on the mounting substrate, or the conductive connection member for compounding with other devices. Here, an example in which the solder ball 23 is used as the conductive connection member for mounting the SAW device 100 according to the first embodiment described in FIG. 1 on the mounting board will be described. Since the rewiring layer 20 is arranged so as to spread on the surface of the cover layer 8, the solder ball 23 can be provided at a position corresponding to the wiring board or device terminal electrode or connection pad of the mounting partner. FIG. 6 shows a state in which four solder balls 23a, 23b, 23c, and 23d are provided without being aligned on the upper surface of the device, corresponding to the positions of the terminal pads of the mounting board. It goes without saying that the four solder balls 23a, 23b, 23c, and 23d may be arranged in two orthogonal directions depending on the arrangement of terminal pads such as a mounting board.

図7は、本発明に係るSAWデバイスを実装基板に実装するための導電接続部材、あるいは他のデバイスとの集積のための導電性接続部材の配置例の説明図である。ここでは、前記図4で説明した実施例2に係るSAWデバイス200について、実装基板に実装するための導電性接続部材として半田ボールを用いた例を説明する。実施例1と同様に、再配線層20がカバー層8の表面で広がりをもって配置されているので、半田ボール23は実装相手の配線基板あるいはデバイスの端子電極や接続パッドに対応させた位置に設けることができる。図7は四個の半田ボール23a,23b,23c,23dが実装基板の端子パッドの位置対応で、整列することなく設けられている状態を示す。実装基板等の端子パッドの配列によっては、四個の半田ボール23a,23b,23c,23dを直交する二方向に整列させて設けることもあることは言うまでもない。   FIG. 7 is an explanatory view of an arrangement example of the conductive connection member for mounting the SAW device according to the present invention on the mounting substrate, or the conductive connection member for integration with other devices. Here, an example in which a solder ball is used as a conductive connection member for mounting the SAW device 200 according to the second embodiment described with reference to FIG. 4 on a mounting board will be described. Similar to the first embodiment, since the rewiring layer 20 is arranged so as to spread on the surface of the cover layer 8, the solder balls 23 are provided at positions corresponding to the terminal electrodes and connection pads of the wiring board to be mounted or the device. be able to. FIG. 7 shows a state in which four solder balls 23a, 23b, 23c, and 23d are provided without being aligned in correspondence with the positions of the terminal pads of the mounting board. It goes without saying that the four solder balls 23a, 23b, 23c, and 23d may be arranged in two orthogonal directions depending on the arrangement of terminal pads such as a mounting board.

図8は、本発明に係るSAWデバイスを実装基板に実装するための導電接続部材、あるいは他のデバイスとの集積のための導電性接続部材の配置例の説明図である。ここでは、前記図1で説明した実施例1に係るSAWデバイス100について、実装基板に実装するための導電性接続部材として半田ボールを用いた例を説明する。この実装例は、本願発明に係るSAWデバイスであっても、従来のデバイスと同様の実装ができることを説明する。半田ボール23(23a,23b,23c,23d)をデバイスの上面の四隅に従来のデバイスと同様の固定された位置に設けた場合を示す。   FIG. 8 is an explanatory diagram of an arrangement example of the conductive connection member for mounting the SAW device according to the present invention on the mounting substrate, or the conductive connection member for integration with other devices. Here, an example in which a solder ball is used as a conductive connection member for mounting the SAW device 100 according to the first embodiment described in FIG. 1 on a mounting board will be described. This mounting example explains that even a SAW device according to the present invention can be mounted in the same manner as a conventional device. The case where the solder balls 23 (23a, 23b, 23c, 23d) are provided at the four fixed corners of the upper surface of the device at the same fixed positions as in the conventional device is shown.

図9は、本発明に係るSAWデバイスを他のデバイスと集積して複合部品とする一例を説明する模式図である。ここでは、前記図1で説明した実施例1に係るSAWデバイス100を他の部品300に集積する例を示す。他の部品300は圧電部品あるいは圧電部品以外の複合化可能なディスクリート部品である。他の部品の一方の面(同図の上面)には、SAWデバイス100の外部端子の配置を考慮しない端子パッド302を有している。また、他の部品300の他方の面(同図の下面)には、図示しない実装基板の実装端子(パッド)に接続する実装端子303が設けられている。   FIG. 9 is a schematic diagram illustrating an example in which the SAW device according to the present invention is integrated with other devices to form a composite part. Here, an example in which the SAW device 100 according to the first embodiment described with reference to FIG. The other parts 300 are piezoelectric parts or discrete parts other than piezoelectric parts that can be combined. A terminal pad 302 that does not consider the arrangement of the external terminals of the SAW device 100 is provided on one surface of the other component (the upper surface in the figure). In addition, a mounting terminal 303 connected to a mounting terminal (pad) of a mounting board (not shown) is provided on the other surface (the lower surface in the figure) of the other component 300.

このような他の部品300にSAWデバイス100を複合化する場合、当該SAWデバイス100の再配線層20に他の部品300の端子パッド302と対向する位置に半田ボール23、あるいはバンプ(半田バンプ等)25を配置して位置づけし、両者を仮固定する。この状態応対でリフロー処理することで両者は一体に接合され、複合化した部品となる。このように、本発明に係るSAWデバイス100は複合化する他の部品300の端子パッド302の配置に応じた任意の位置で接続することができる。   When the SAW device 100 is combined with such another component 300, the solder ball 23 or bump (solder bump or the like) is disposed on the rewiring layer 20 of the SAW device 100 at a position facing the terminal pad 302 of the other component 300. ) 25 is placed and positioned, and both are temporarily fixed. By performing the reflow process in this state response, the two are joined together and become a composite part. Thus, the SAW device 100 according to the present invention can be connected at an arbitrary position according to the arrangement of the terminal pads 302 of the other components 300 to be combined.

図10は、本発明に係るSAWデバイスを他のデバイスと共に適用機器の回路基板に実装する一例を説明する模式図である。ここでは、図1で説明した本発明に係るSAWデバイス100、および図4で説明した本発明に係るSAWデバイス200を適用機器の回路基板301に実装する一例を説明する。回路基板301の一方の面(同図の上面)には配線パターンと共に、複数の端子パッド302が形成されている。なお、回路基板301には、この他に、図示しない他の部品も搭載される。   FIG. 10 is a schematic diagram for explaining an example in which the SAW device according to the present invention is mounted together with other devices on a circuit board of an applied device. Here, an example will be described in which the SAW device 100 according to the present invention described with reference to FIG. 1 and the SAW device 200 according to the present invention described with reference to FIG. 4 are mounted on a circuit board 301 of an applied device. A plurality of terminal pads 302 are formed along with a wiring pattern on one surface of the circuit board 301 (upper surface in the figure). In addition to this, other components (not shown) are also mounted on the circuit board 301.

回路基板301に設けた端子パッド302は本発明に係るSAWデバイス100、200の外部端子の配置を考慮したものではない。このような回路基板301に対し、SAWデバイス100、200は、その再配線層20と回路基板301に設けた端子パッド302との間に、当該端子パッド302の位置と対向する適宜の位置に半田ボール23、あるいは半田バンプ25を配置して接続する。これにより、適用機器を製作する顧客側での回路設計における自由度が広がり、効率のよい回路設計が可能となる。   The terminal pads 302 provided on the circuit board 301 do not consider the arrangement of the external terminals of the SAW devices 100 and 200 according to the present invention. With respect to such a circuit board 301, the SAW devices 100 and 200 are soldered between the rewiring layer 20 and the terminal pads 302 provided on the circuit board 301 at appropriate positions facing the positions of the terminal pads 302. Balls 23 or solder bumps 25 are arranged and connected. As a result, the degree of freedom in circuit design on the customer side that manufactures the applicable device is expanded, and efficient circuit design becomes possible.

本発明は、極めて高い耐衝撃性、高信頼性が要求されるSAWデバイス、圧電薄膜フィルタ、FBAR(エフバー;Film Bulk Acoustic Resonator)、MEMS(メムス;Micro Electro Mechanical Systems)等の圧電素子・部品及びそれらの製造に広く利用できる。また、所謂フィルタバンク、複数フィルタモジュールなどにも適用でき、あるいは一個の部品に動作特性の異なる圧電素子を複数搭載するものにも適用できる。   The present invention relates to SAW devices, piezoelectric thin film filters, FBAR (Film Bulk Acoustic Resonator), MEMS (Micro Electro Mechanical Systems), and other piezoelectric elements and components that require extremely high impact resistance and high reliability, and Widely available for their manufacture. Further, the present invention can be applied to a so-called filter bank, a plurality of filter modules, etc., or can be applied to one in which a plurality of piezoelectric elements having different operation characteristics are mounted on one component.

1・・圧電板(LiTaO)、2・・IDT、2a・・櫛歯電極部、2b・・入出力電極・配線部、6・・金属電極層、7・・リブ、8・・カバー層(天井層)、8a・・樹脂、8b・・フィラー(微小マイカ片)、20・・再配線層、21・・空隙(動作空間、中空構造、キャビティー)、22・・電極柱、23・・半田ボール、25・・半田バンプ、100,200・・圧電部品(SAWデバイス)、300・・他の部品、301・・回路基板、302・・端子パッド。 1 .. Piezoelectric plate (LiTaO 3 ), 2.. IDT, 2 a .. Comb electrode part, 2 b .. I / O electrode and wiring part, 6 .. Metal electrode layer, 7 .. Rib, 8. (Ceiling layer), 8a..resin, 8b..filler (micro mica piece), 20..redistribution layer, 21..void (operating space, hollow structure, cavity), 22 .... electrode column, 23. Solder balls 25 Solder bumps 100, 200 Piezoelectric parts (SAW devices) 300 Other parts 301 Circuit boards 302 Pads

Claims (4)

圧電基板と、前記圧電基板の主面に形成した櫛歯電極部と入出力電極・配線部からなるIDTと、前記IDTの周囲に設けた樹脂材料のリブと、前記リブの上に設置して前記IDTの動作空間を形成する樹脂材料のカバー層を具備する圧電部品であって、
前記カバー層に熱硬化性感光性樹脂に白色マイカの微細片からなるフィラーを含有してなり、
前記カバー層の上に、前記IDTの入出力電極・配線と電気的に接続した複数の再配線層を有し、
前記再配線層のそれぞれは、当該再配線層上の任意の位置に外部端子を設置可能としたことを特徴とする圧電部品。
A piezoelectric substrate, an IDT formed of comb-shaped electrode portions and input / output electrodes / wiring portions formed on the main surface of the piezoelectric substrate, a rib of resin material provided around the IDT, and the rib placed on the rib A piezoelectric component including a cover layer of a resin material that forms an operation space of the IDT,
The cover layer contains a filler made of fine pieces of white mica in a thermosetting photosensitive resin,
A plurality of rewiring layers electrically connected to the input / output electrodes / wirings of the IDT are provided on the cover layer,
Each of the rewiring layers can be provided with an external terminal at an arbitrary position on the rewiring layer.
請求項1において、
前記カバー層を構成する熱硬化性感光性樹脂は、ポリイミド樹脂を好適とする樹脂材料に感光剤、硬化剤などを添加したものであり、前記白色マイカの微細片の含有量は40重量%乃至60重量%であることを特徴とする圧電部品。
In claim 1,
The thermosetting photosensitive resin constituting the cover layer is obtained by adding a photosensitive agent, a curing agent, or the like to a resin material suitable for polyimide resin, and the content of fine pieces of the white mica is 40% by weight or more. A piezoelectric component characterized by being 60% by weight.
請求項1又は2において、
前記カバー層の端縁は、前記圧電基板の端縁から後退した位置にあり、前記圧電基板の前記カバー層の端縁の後退で露呈した上面に前記IDTの入出力電極・配線と電気的に接続した再配線層に接続した金属電極層を有し、
前記再配線層は、前記カバー層上に延在して電気的に接続していることを特徴とする圧電部品。
In claim 1 or 2,
The edge of the cover layer is located at a position retreated from the edge of the piezoelectric substrate, and is electrically connected to the input / output electrodes / wirings of the IDT on the upper surface exposed by the retreat of the edge of the cover layer of the piezoelectric substrate. Having a metal electrode layer connected to the connected rewiring layer;
The piezoelectric component, wherein the rewiring layer extends on the cover layer and is electrically connected.
請求項1において、
前記IDTの入出力電極・配線の上に、前記圧電基板の主面の外周に延在する金属電極層を有し、
前記再配線層は、前記リブと前記カバー層を貫通する電極柱で前記金属電極層と電気的に接続していることを特徴とする圧電部品。
In claim 1,
A metal electrode layer extending on the outer periphery of the main surface of the piezoelectric substrate on the input / output electrodes / wirings of the IDT,
The piezoelectric component, wherein the rewiring layer is electrically connected to the metal electrode layer through an electrode column penetrating the rib and the cover layer.
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