JP2014106169A5 - - Google Patents
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- JP2014106169A5 JP2014106169A5 JP2012260490A JP2012260490A JP2014106169A5 JP 2014106169 A5 JP2014106169 A5 JP 2014106169A5 JP 2012260490 A JP2012260490 A JP 2012260490A JP 2012260490 A JP2012260490 A JP 2012260490A JP 2014106169 A5 JP2014106169 A5 JP 2014106169A5
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- JP
- Japan
- Prior art keywords
- pair
- potentiometer
- measured
- potential difference
- measurement light
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- 238000005259 measurement Methods 0.000 claims 13
- 239000002184 metal Substances 0.000 claims 10
- 230000003287 optical Effects 0.000 claims 9
- 238000001514 detection method Methods 0.000 claims 4
- 239000004020 conductor Substances 0.000 claims 3
- 230000000694 effects Effects 0.000 claims 2
- 230000005684 electric field Effects 0.000 claims 2
- 239000003365 glass fiber Substances 0.000 claims 2
- 230000000051 modifying Effects 0.000 claims 2
- 230000001360 synchronised Effects 0.000 claims 1
Claims (10)
対向する第1および第2の表面を有する光学結晶であって、該第1および第2の表面が光学研磨された光学結晶と、
前記光学結晶の第1または第2の表面の端部の近傍に配置される、該表面上に密着被覆される第1および第2の透明電極であって、計測光が入射および出射される第1および第2の透明電極と、
光学結晶の第1および第2の表面のうち前記第1および第2の透明電極以外の表面上に密着被覆される、反射ミラーとして機能する第1および第2の金属電極であって、電位差を計測すべき一対の被測定端子に接続される第1および第2の金属電極と、を備えており、
前記第2透明電極から出射される計測光の強度に基づいて、前記一対の被測定端子の間の電位差を算出可能とすることを特徴とする、電位差計。 A potentiometer for measuring a potential difference using an electro-optic effect,
An optical crystal having first and second opposing surfaces, wherein the first and second surfaces are optically polished;
First and second transparent electrodes disposed in the vicinity of the end of the first or second surface of the optical crystal and closely coated on the surface, and in which measurement light is incident and emitted. First and second transparent electrodes;
First and second metal electrodes functioning as reflection mirrors, which are closely coated on surfaces of the first and second surfaces of the optical crystal other than the first and second transparent electrodes, and having a potential difference First and second metal electrodes connected to a pair of terminals to be measured to be measured,
A potentiometer, wherein a potential difference between the pair of terminals to be measured can be calculated based on the intensity of measurement light emitted from the second transparent electrode.
前記発振器が、入射された前記計測光を前記一方の金属電極において変調させると共に、前記ロック・イン・アンプに参照信号を供給するように構成され、
前記ロック・イン・アップが、変調および出射された前記計測光の電気信号について、前記参照信号を用いて同期検波を行うように構成されることを特徴とする、電位差測定装置。 9. The potentiometer according to claim 8, wherein the potentiometer is coupled to an oscillator and a lock-in amplifier, and the oscillator includes one of the first and second metal electrodes and the lock-in amplifier. Coupled to the amplifier,
The oscillator is configured to modulate the incident measurement light at the one metal electrode and supply a reference signal to the lock-in amplifier;
The potential difference measuring device, wherein the lock-in-up is configured to perform synchronous detection using the reference signal with respect to the electrical signal of the measurement light modulated and emitted.
前記電位差計が、光学結晶の対向面にそれぞれ設けられ、電圧が印加される一対の金属電極であって、光学研磨された対向する一対の前記対向面の表面上に密着被覆されて反射ミラーとして機能する金属電極と、前記光学結晶の表面端部の近傍に配置して、表面上に密着被覆される一対の透明電極と、前記一対の金属電極間の電位差を算出する算出手段とを備えており、前記電位差測定方法が、
前記金属電極に電圧を印加して前記金属電極間に電界を形成するステップと、
前記一対の透明電極の一方を通じて計測光を入射するステップであって、前記光学結晶の表面に対し所与の角度をつけて前記計測光を入射するステップと、
前記反射ミラーにより、前記計測光を前記光学結晶内で多重反射させるステップと、
前記多重反射された計測光を前記一対の透明電極の他方を通じて出射するステップと、
前記出射された計測光が有する出射強度に基づいて、前記一対の金属電極間の電位差を算出するステップと、を含む電位差測定方法。 A potential difference measuring method using a potentiometer utilizing an electro-optic effect,
The potentiometers are a pair of metal electrodes provided on opposite surfaces of the optical crystal, respectively, to which a voltage is applied. A functioning metal electrode; a pair of transparent electrodes disposed in the vicinity of a surface end of the optical crystal and closely coated on the surface; and a calculating means for calculating a potential difference between the pair of metal electrodes. The potential difference measuring method is
Applying a voltage to the metal electrodes to form an electric field between the metal electrodes;
Injecting measurement light through one of the pair of transparent electrodes, and entering the measurement light at a given angle with respect to the surface of the optical crystal;
Multiple reflection of the measurement light within the optical crystal by the reflection mirror;
Emitting the multiple reflected measurement light through the other of the pair of transparent electrodes;
Calculating a potential difference between the pair of metal electrodes based on an emission intensity of the emitted measurement light.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012260490A JP6108521B2 (en) | 2012-11-29 | 2012-11-29 | Potentiometer and potential difference measuring method for potentiometric measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012260490A JP6108521B2 (en) | 2012-11-29 | 2012-11-29 | Potentiometer and potential difference measuring method for potentiometric measurement |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2014106169A JP2014106169A (en) | 2014-06-09 |
JP2014106169A5 true JP2014106169A5 (en) | 2015-11-12 |
JP6108521B2 JP6108521B2 (en) | 2017-04-05 |
Family
ID=51027776
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012260490A Active JP6108521B2 (en) | 2012-11-29 | 2012-11-29 | Potentiometer and potential difference measuring method for potentiometric measurement |
Country Status (1)
Country | Link |
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JP (1) | JP6108521B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104049134A (en) * | 2014-06-24 | 2014-09-17 | 国家电网公司 | Optical VFTO measurement system based on Pockels effect |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57161661A (en) * | 1981-03-31 | 1982-10-05 | Yutaka Ono | Measuring device by use of optical fiber |
JPH0668511B2 (en) * | 1986-08-20 | 1994-08-31 | 中部電力株式会社 | Insulator for voltage detection |
JPH0695113B2 (en) * | 1987-06-10 | 1994-11-24 | 浜松ホトニクス株式会社 | Voltage detector |
JPH05126863A (en) * | 1991-11-01 | 1993-05-21 | Furukawa Electric Co Ltd:The | Photoelectric device for measuring voltage |
JP3235301B2 (en) * | 1993-11-18 | 2001-12-04 | 住友金属鉱山株式会社 | Light voltage sensor |
JPH0836000A (en) * | 1994-05-16 | 1996-02-06 | Ricoh Co Ltd | Method for measuring surface potential, method for measuring surface potential and surface shape, device for measuring surface potential, and device for measuring surface potential and surface shape |
JPH08146051A (en) * | 1994-11-21 | 1996-06-07 | Nec Corp | Eo probe |
JPH08233881A (en) * | 1995-02-27 | 1996-09-13 | Tokin Corp | System for detecting surge waveform |
JP2964467B2 (en) * | 1996-04-08 | 1999-10-18 | ヘルツ工業株式会社 | Multiple reflection element |
JPH10132864A (en) * | 1996-11-01 | 1998-05-22 | Toyo Commun Equip Co Ltd | Photo voltage sensor |
JP2000258465A (en) * | 1999-03-09 | 2000-09-22 | Hitachi Ltd | Photovoltage sensor |
JP2003149139A (en) * | 2001-11-07 | 2003-05-21 | Mitsubishi Electric Corp | Streaming electrification field evaluation system |
-
2012
- 2012-11-29 JP JP2012260490A patent/JP6108521B2/en active Active
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