JP2014055832A - Light-intensifying element and method for manufacturing the same - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a light-intensifying element capable of suppressing reduction in light enhancing effect while having the sufficient protective function of an enhanced electromagnetic field formation layer by a protective layer, and moreover, having a small degree of dispersion in light enhancing effect and a method for manufacturing the same.SOLUTION: The light-intensifying element is formed by including a substrate and an enhanced electromagnetic field formation layer by multiple metallic fine particles formed on a surface of the substrate, and each of the metallic fine particles in the enhanced electromagnetic field formation layer is dispersed by being independent from each other, and a protective layer having a columnar structure oriented in the thickness direction relative to the metallic fine particles is formed on a surface of the enhanced electromagnetic field formation layer including a surface portion of the substrate exposed between adjacent metallic fine particles. The protective layer in the light enhancement element can be formed by orienting the columnar structure in the thickness direction relative to the metallic fine particles by the evaporation method on the surface of the enhanced electromagnetic field formation layer including the surface portion of the exposed substrate exposed between adjacent metallic fine particles.

Description

  The present invention relates to a light enhancement element using localized surface plasmons of metal fine particles and a method for manufacturing the same.

Raman spectroscopy, which obtains a spectrum of Raman scattered light by dispersing Raman scattered light obtained by irradiating an analysis object with light of a single wavelength (laser light), is used for identification of substances. However, the Raman scattered light obtained from the analysis object is usually difficult to detect with high sensitivity because the signal is weak. On the other hand, single-wavelength laser light is not necessary for identification of substances using the fluorescence of the analyte, and its detection sensitivity is orders of magnitude higher than that of Raman spectroscopy, but far more than 1 femtomole level in absolute quantity. In order to realize a fluorescence analysis of a trace amount component lower than 1 nm, it is desired to further increase the current detection sensitivity by several orders of magnitude.
In recent years, using the localized surface plasmon of metal nanoparticles, the analyte to be adsorbed on the surface of the metal nanoparticles is irradiated with laser light, etc., and the Raman scattered light and fluorescence generated thereby are dramatically increased. Research on surface-enhanced Raman scattering (SERS) and surface-enhanced fluorescence (SEF), which are detected by enhancement, is underway.

For example, Patent Literature 1 discloses a fluorescence enhancement element that is formed independently of each other and is provided with a large number of flat metal particles having a cross-sectional particle size of 100 to 800 nm and a thickness of 30 to 50 nm on a substrate. Yes.
Further, for example, in Patent Document 2, a substrate, a plasmon resonance mirror formed on the substrate, a spacer layer made of a dielectric formed on the plasmon resonance mirror, and a nanoparticle layer formed on the spacer layer And an optical sensor comprising a protective coating layer formed on the nanoparticle layer. It is described that this protective coating layer is formed of a dielectric material such as silicon oxide and has a thickness of less than 5 nm.

JP 2007-139540 A Special table 2007-538264 gazette

Thus, in the light enhancement element using the localized surface plasmon by the metal fine particles, in order to suppress a chemical reaction from being caused by direct contact of the specimen or the solvent containing the specimen with the metal fine particles, the above Patent Document 2 is used. As described in the above, a protective layer is formed.
In general, the mechanical fineness of the metal fine particle layer supported on the substrate in the absence of chemical bonds with the substrate is very small, and it can be easily removed from the substrate simply by wiping with a soft paper or cloth. Therefore, the role of the protective layer is important to prevent this.
However, when the thickness of the protective layer is increased, there is a problem that the distance between the specimen and the surface of the metal fine particles becomes longer, and the degree of light enhancement becomes extremely low.

The present invention has been made based on the circumstances as described above, and its purpose is to sufficiently suppress a decrease in light enhancement effect while having a sufficient protection function of the enhanced electromagnetic field forming layer by the protective layer. An object of the present invention is to provide a light enhancement element that can be used.
Another object of the present invention is to provide a method for producing a light enhancement element capable of reliably obtaining such a light enhancement element.

The light enhancement element of the present invention is a light enhancement element comprising a substrate and an enhanced electromagnetic field forming layer formed of a large number of metal fine particles formed on the surface of the substrate.
Each of the metal fine particles in the enhanced electromagnetic field forming layer is dispersed independently of each other,
A protective layer is formed on the surface of the enhanced electromagnetic field forming layer including the surface portion of the substrate exposed between adjacent metal fine particles, and the protective layer is formed in the thickness direction in relation to the metal fine particles. It has an oriented columnar structure.

In the light enhancement element of the present invention, the metal fine particles are silver fine particles,
It is preferable that the thickness of the protective layer is 50 nm or more.

The method for producing a light enhancement element of the present invention is a method for producing the above-described light enhancement element,
Metal fine particles are formed on the surface of the enhanced electromagnetic field forming layer including the surface portion of the substrate exposed between adjacent metal fine particles by a method selected from the group consisting of RF sputtering deposition, electron beam deposition, and ECR sputtering deposition. And a step of forming a protective layer having a columnar structure oriented in the thickness direction.

According to the light enhancement element of the present invention, since the protective layer has a columnar structure, it is possible to effectively use localized surface plasmons due to metal fine particles even when the thickness of the protective layer is increased. Therefore, it is possible to suppress a decrease in the light enhancement effect and to obtain high reproducibility for the light enhancement effect.
Further, since the thickness of the protective layer can be increased, for example, the enhanced electromagnetic field forming layer (metal fine particles) is sufficient for a specific analyte such as a solution containing a large amount of halogen ions (for example, a concentration of 0.1 M or more). Protection function can be obtained.

  According to the method for producing a light enhancement element of the present invention, a light enhancement element that exhibits the above-described effects can be obtained with certainty.

It is a schematic diagram which shows the outline of a structure in an example of the light enhancement element of this invention. In an Example, it is explanatory drawing which shows the outline of a structure of the measurement system constructed | assembled in order to perform a Raman scattered light measurement and a fluorescence measurement. It is a graph which shows the relationship between the thickness of a protective layer, and the fluorescence enhancement factor measured using rhodamine 6G as a sample about each of the light enhancement element which concerns on this invention, and the light enhancement element for a comparison. It is a graph which shows the relationship between the thickness of a protective layer, and the fluorescence enhancement factor measured using the fuchsin as a sample about each of the light enhancement element which concerns on this invention, and the light enhancement element for a comparison. It is a graph which shows the transmission absorption spectrum of the sample measured about the optical enhancement element produced in Reference Example 1. It is a graph which shows the transmission absorption spectrum of the sample measured about the optical enhancement element produced in Reference Example 2. It is a graph which shows the transmission absorption spectrum of the sample measured about the optical enhancement element produced in Reference Example 3.

Hereinafter, embodiments of the present invention will be described in detail.
FIG. 1 is a schematic diagram showing an outline of a configuration in an example of the light enhancement element of the present invention.
The light enhancement element 10 is, for example, a device that enhances Raman scattered light by excitation light irradiation with respect to a Raman active chemical species, or a device that enhances light emission (for example, fluorescence) by excitation light irradiation with respect to a luminescent chemical species, For example, a flat substrate 20 and an enhanced electromagnetic field forming layer 30 made of a large number of metal fine particles 31 formed on the surface of the substrate 20 are provided.

  The material of the board | substrate 20 is not specifically limited, For example, glass, ceramics, resin, a metal etc. can be illustrated. As will be described later, when heat treatment (for example, heating at 100 ° C. or higher) is performed in the manufacturing process of the light enhancement element 10, it is preferable to have heat resistance such as glass or polyimide resin.

  The enhanced electromagnetic field forming layer 30 is composed of, for example, a large number of metal fine particles 31 that are not stacked. In this example, each metal fine particle 31 is dispersed (scattered) in an independent state on the surface of the substrate 20. )doing. The enhanced electromagnetic field forming layer 30 may have a configuration in which the metal fine particles 31 are randomly arranged two-dimensionally, or may have a configuration in which the metal fine particles 31 are regularly arranged.

  As the metal fine particles 31 constituting the enhanced electromagnetic field forming layer 30, for example, silver can be suitably used, but any metal that can be excited by irradiation with excitation light to excite surface plasmons, such as gold and aluminum, can be used. May be used.

  As the shape of the metal fine particles 31, for example, those having shape anisotropy such as a flat spherical shape and a flat plate shape can be suitably used. Here, it is desirable that all of the metal fine particles 31 have a uniform size and shape, but there may be some variation in size and shape.

Further, the particle diameter of the metal fine particles 31 is preferably a size equal to or smaller than the wavelength of the excitation light. Here, in the present specification, the “particle diameter” refers to a projected area circle equivalent diameter obtained by microscopy. Specifically, it is obtained as follows. That is, in a scanning microscope in which a line segment having a length of 2 μm is observed to be expanded to a length of 6 cm (magnification 30K times) in an arbitrarily selected region on the surface of the light enhancement element 10 (enhanced electromagnetic field forming layer 30). Using a visual field region (for example, 1.5 μm × 2 μm) as an imaging region, a secondary electron image of the region in the light enhancement element 10 is obtained, and for each of the metal fine particles having a brightness index (256 steps) of about 100 or more, a metal The diameter of a perfect circle having the same area as that of the fine particles 31 is acquired as the particle size of the metal fine particles 31.
The particle size of the metal fine particles 31 is, for example, in the range of 5 to 300 nm, and the thickness is, for example, in the range of 5 to 70 nm.

The density of the metal fine particles (metal nanoparticles) 31 in the enhanced electromagnetic field forming layer 30 is preferably 10 ⁸ to ¹⁰ 10 particles / cm ² , for example.

  A method of forming such an enhanced electromagnetic field forming layer 30 is not particularly limited, but for example, a method of applying a dispersion liquid in which metal nanoparticles are dispersed in an appropriate solvent by a spin coating method and heating, A dipping and heating method, a vacuum vapor deposition method, a sputter vapor deposition method, or the like can be suitably used.

Thus, in the light enhancement element 10 described above, a columnar structure is formed on the surface of the enhanced electromagnetic field forming layer 30 (metal fine particles 31) including the surface portion of the substrate 20 exposed between the adjacent metal fine particles 31. A protective layer 40 is formed.
The protective layer 40 is configured such that the columnar structure 41 is oriented in the thickness direction starting from the metal fine particle 31 in relation to each metal fine particle 31 constituting the enhanced electromagnetic field forming layer 30. Note that the columnar structure 41 does not correspond to the individual metal fine particles 31.

  Examples of the material constituting the protective layer 40 include silicon oxide, titanium oxide, cerium oxide, boron oxide, phosphorus oxide, magnesium oxide, calcium oxide, aluminum oxide, gallium oxide, and germanium oxide.

The average thickness of the protective layer 40 is preferably, for example, 50 to 250 nm. In particular, since the thickness of the protective layer 40 is 85 nm or more, even when a solution containing a large amount of halogen ions (eg, Cl ⁻ ) such as physiological saline is to be analyzed, sufficient resistance ( Protection function). On the other hand, if the thickness of the protective layer 40 is less than 50 nm, sufficient resistance cannot be obtained and the light enhancement effect is reduced. In addition, even when the thickness of the protective layer 40 exceeds 250 nm, the light enhancement effect is reduced by a further increase in the thickness of the protective layer, although gradually.
The average width of each columnar structure 41 is, for example, the same size as the particle size of the metal fine particles 31.

The light enhancement element 10 can be manufactured as follows.
That is, first, a metal nanoparticle film is formed on the surface of the substrate 20, and the graininess is changed by heat-treating the film, whereby an enhanced electromagnetic field forming layer is formed by the metal fine particles 31 having a particle diameter within a predetermined range. 30 (enhanced electromagnetic field forming layer forming step). Here, the particle diameter of the metal fine particles 31 to be formed can be adjusted by appropriately changing the heat treatment conditions. The method for forming the metal nanoparticle film on the surface of the substrate 15 is not particularly limited. For example, a dispersion in which metal nanoparticles are dispersed in an appropriate solvent is applied by spin coating and heated. A method of heating, a method of dipping and heating, or a physical vapor deposition method such as vacuum vapor deposition or sputtering can be suitably used.

Next, a columnar structure (columnar crystal) is formed on the surface of the enhanced electromagnetic field forming layer 30 (metal fine particles 31) including the surface portion of the substrate 20 exposed between the adjacent metal fine particles 31 by the vapor deposition method, starting from the metal fine particles 31. The protective layer 40 having a columnar structure is formed by growing 41 in the thickness direction, and thus the light enhancement element 10 can be obtained. Here, the thickness of the protective layer 40 to be formed can be adjusted by appropriately changing the growth conditions and time. The growth rate of the columnar structure 41 is, for example, 8.5 [nm / min], and the time is, for example, 2 to 60 [min].
As a method for forming the protective layer 40, a method selected from the group consisting of an RF sputtering deposition method, an electron beam deposition method, and an ECR sputtering deposition method can be suitably used.

Thus, according to the light enhancement element 10 configured as described above, even if the thickness of the protective layer 40 is increased because the protective layer 40 has a columnar structure, the localized surface plasmon by the metal fine particles 31 is obtained. Can be effectively utilized, so that a decrease in the light enhancement effect can be suppressed.
Further, since the thickness of the protective layer 40 can be increased to, for example, 100 nm or more, the enhanced electromagnetic field forming layer 30 (metal fine particles 31) for a specific analysis target such as a solution containing a large amount of halogen ions (eg, Cl ⁻ ). ) Sufficient protection function (resistance) can be obtained.

[Production Example 1 of Light Enhancement Element]
According to the configuration shown in FIG. 1, eight types of light enhancement elements (10) according to the present invention, each having a different protective layer thickness, were produced as follows.
A glass slide having a size of several centimeters is used as the substrate (20), and a silver film for forming metal fine particles is formed on the surface of the glass slide by depositing silver to a thickness of about 10 nm. The graininess was changed by heat treatment on a hot plate for several minutes to form a silver fine particle monolayer film composed of a large number of silver fine particles (31) as an enhanced electromagnetic field forming layer (30). The particle diameter of the silver fine particles in the obtained silver fine particle monolayer film is in the range of 50 to 150 nm, the thickness is about 20 nm on average, and the density of the silver fine particles is about 5 × 10 ⁹ particles / cm ² . is there.
Next, using an RF sputtering apparatus “RFS-200 type” (manufactured by Ulvac), sputtering is performed under the following conditions using silicon oxide (SiO ₂ ) as a target, thereby exposing the surface of the substrate exposed between adjacent silver fine particles. A protective layer (40) having a columnar structure was formed on the surface of the enhanced electromagnetic field forming layer including the portion. The thickness of the protective layer was adjusted by appropriately changing the time.

<Sputtering conditions>
-Distance from the target to the surface of the enhanced electromagnetic field forming layer: 45 mm
・ Atmosphere: Ar; 3.0 Pa (during discharge)
・ Discharge output: 100W
・ RF frequency: 13.6MHz
-Columnar structure growth rate: 8.5 nm / min

[Production Example 2 of Light Enhancement Element]
The thickness of each protective layer was the same as that in Production Example 1 of the light enhancement element, except that the protective layer was formed by spin coating instead of RF sputtering in Production Example 1 of the light enhancement element. Six types of comparative light enhancement elements having different values were prepared.

[Example 1]
For each of the light enhancement element according to the present invention and the comparative light enhancement element, a dilute ethanol solution of rhodamine 6G (Rh6G: emission quantum yield of about 1) dye at 3000 rotations on the surface of the protective layer in the light enhancement element. The dye molecules were supported on the surface of the protective layer by spin coating. Here, the relationship between the density of the dye molecules carried on the surface of the light enhancement element and the dye concentration of the solution used for spin coating is as follows. When the concentration of rhodamine 6G is 1 μM, the amount of dye molecules carried is 3 ×. 10 ¹¹ pieces / cm ² .
Then, the fluorescence (fluorescence intensity) emitted from the sample (dye molecule) by excitation light irradiation was measured by the measurement system having the configuration shown in FIG. The results are shown in FIG. In FIG. 3, the vertical axis indicates the increase in intensity [unit: times]. In addition, the result of the light enhancement element according to the present invention is indicated by a solid line (filled quadrangular plot), and the result of the comparative light enhancement element is indicated by a two-dot chain line (open square plot). Increased strength (times) indicates how many times the measured value is obtained with respect to the measured value when the sample is set on the surface of the slide glass having no enhancement effect by the same method. In FIG. 2, reference numeral 50 denotes a green diode laser (wavelength 532 nm) having an output of less than 1 mW used as an excitation light source in fluorescence measurement, and is not condensed through the filter 51 (energy density is about 30 mW / cm ² ). Alternatively, the light enhancement element 10 is irradiated as anti-condensation (defocused, energy density of about 10 mW / cm ² or less) excitation light. Excitation light from the excitation light source 50 is incident on the light enhancement element 10 at an incident angle of 45 °, and collects fluorescence scattered in the 90 ° angle direction by the dye molecules carried on the light enhancement element 10. The light lens 52 focused the light through the filter 53 on the light receiving head 54 of the electronically cooled diode array detector 55.

[Example 2]
In Example 1, fuchsin (emission quantum yield of less than about 0.01) was used as a sample and supported on the surface of the protective layer in the light enhancement element at a density of 3 × 10 ¹² pieces / cm ^2. Fluorescence (fluorescence intensity) was measured by the same method. The results are shown in FIG. In FIG. 4, the vertical axis indicates the increase in intensity [unit: times]. In addition, the result of the light enhancement element according to the present invention is indicated by a solid line (filled quadrangular plot), and the result of the comparative light enhancement element is indicated by a two-dot chain line (open square plot).

As a result of the above, according to the light enhancement element according to the present invention, a substantially constant fluorescence enhancement rate is maintained until the film thickness of the protective layer is about 200 nm or more, regardless of the light emission property of the dye itself. It was confirmed that even if the thickness of the protective layer is increased, it is possible to suppress a decrease in the light enhancement effect.
The Raman scattering intensity of rhodamine 6G dye was measured as a function of the thickness of the protective film in the same arrangement as in FIG. 2 except that a He—Ne laser (wavelength 632.8 nm) with an output of less than 1 mW was used as the excitation light source. As a result, even if the thickness of the protective layer exceeds 200 nm, the magnitude of the enhancement is the same as the signal obtained under the condition that the dye molecule is directly adsorbed on the surface of the silver fine particles (usually the condition where the SERS signal is maximized). A Raman signal (intensity increased about 105 times) was obtained. On the other hand, in the comparative light enhancement element, the Raman scattering intensity drastically decreased when the thickness of the protective film was several nm or less, and the Raman signal completely disappeared under the condition where the thickness of the protective film was 10 nm or more.
One reason why such long distance enhancement occurs is assumed as follows. That is, the protective layer formed by vapor deposition has a different film formation state on the surface of the silver fine particles and on the surface portion of the substrate exposed between the adjacent silver fine particles, so that the columnar structure deposited on the surface of the silver fine particles It is considered that a grain boundary is generated between the columnar structures deposited on the surface portion of the substrate, and the grain boundary reaches the surface of the light enhancement element. Therefore, even when the thickness of the protective layer is increased, it is assumed that the electric field (localized surface plasmon) generated in the silver fine particles is easily transmitted to the surface of the protective layer.

[Reference Example 1]
In the same manner as in Production Example 1 of the light enhancement element, a test light enhancement element having a protective layer thickness of 25 nm was produced.
The test light enhancement element is placed in a saline solution (2 wt% / v, a high concentration corresponding to a molar concentration of about 0.3 M) that is twice the concentration of physiological saline (0.9 wt% / v) for 15 minutes. Soak. Thereafter, the sample was sufficiently rinsed and dried with pure water, the sample was supported on each test light enhancement element, and a transmission absorption spectrum was measured. The results are shown in FIG. In FIG. 5-A, a curve indicated by a broken line relates to the test light enhancement element before being immersed in the saline. The curve indicated by the solid line relates to the test light enhancement element after being immersed in saline.

[Reference Example 2]
A plurality of test light enhancement elements having a protective layer thickness of 85 nm were produced in the same manner as in Production Example 1 of the light enhancement element.
With respect to these test light enhancement elements, the transmission absorption spectrum of the sample was measured by the same method as in Reference Example 1 except that the immersion time in the saline solution was appropriately changed. The results are shown in FIG. In FIG. 5-B, a curve indicated by a broken line relates to the test light enhancement element before being immersed in saline. Moreover, the curve shown with a continuous line concerns on the test light enhancement element after being immersed in salt solution, and a numerical value shows immersion time.

[Reference Example 3]
A plurality of test light enhancement elements having a protective layer thickness of 130 nm were produced in the same manner as in Production Example 1 of the light enhancement element.
With respect to these test light enhancement elements, the transmission absorption spectrum of the sample was measured by the same method as in Reference Example 1 except that the immersion time in the saline solution was appropriately changed. The results are shown in FIG. In FIG. 5-C, the curve indicated by the broken line relates to the test light enhancement element before being immersed in the saline. Moreover, the curve shown with a continuous line concerns on the test light enhancement element after being immersed in salt solution, and a numerical value shows immersion time.

From the above results, in order to reliably prevent corrosion of the silver fine particle monolayer film as the enhanced electromagnetic field forming layer due to, for example, high-concentration halide ions contained in physiological saline, the thickness of the protective layer is about 85 nm. It was confirmed that it was necessary to do so. In addition, it was confirmed that the mechanical strength to such an extent that the protective layer is not peeled off even when the protective layer is rubbed with a finger or paper can be obtained, for example, by setting the thickness of the protective layer to about 30 nm or more.
On the other hand, when the thickness of the protective layer was less than 85 nm (Reference Example 1), the transmission absorption spectrum showed a change in color tone (blue shift) that could be clearly identified with the naked eye. This is presumably because the color tone of the sample changes to yellow as the size of the silver fine particles decreases due to corrosion.
In addition, when the same test was done about the optical enhancement element whose thickness of a protective layer is 15 nm or less, the transmission absorption spectrum after being immersed in salt solution was unobtainable. This is considered to be because all the silver fine particles (enhanced electromagnetic field forming layer) were peeled off from the substrate during rinsing because the protective action by the protective layer was extremely insufficient.

As mentioned above, although embodiment of this invention was described, this invention is not limited to said embodiment, A various change can be added.
For example, the light enhancement element according to the present invention may be configured to have a multilayer structure further including a highly reflective layer and a dielectric layer. In such a structure, a highly reflective layer and a dielectric layer are formed in this order on the surface of the substrate, and an enhanced electromagnetic field forming layer is formed on the surface of the dielectric layer.

DESCRIPTION OF SYMBOLS 10 Light enhancement element 20 Substrate 30 Enhanced electromagnetic field forming layer 31 Metal fine particle 40 Protective layer 41 Columnar structure 50 Excitation light source 51 Filter 52 Condensing lens 53 Filter 54 Light receiving head 55 Electronically cooled diode array detector

Claims (3)

In a light enhancement element comprising a substrate and an enhanced electromagnetic field forming layer formed of a large number of metal fine particles formed on the surface of the substrate,
Each of the metal fine particles in the enhanced electromagnetic field forming layer is dispersed independently of each other,
A protective layer is formed on the surface of the enhanced electromagnetic field forming layer including the surface portion of the substrate exposed between adjacent metal fine particles, and the protective layer is formed in the thickness direction in relation to the metal fine particles. An optical enhancement element having an oriented columnar structure. The metal fine particles are silver fine particles,
The light enhancement element according to claim 1, wherein the protective layer has a thickness of 50 nm or more. A method for producing the light enhancement element according to claim 1 or 2,
Metal fine particles are formed on the surface of the enhanced electromagnetic field forming layer including the surface portion of the substrate exposed between adjacent metal fine particles by a method selected from the group consisting of RF sputtering deposition, electron beam deposition, and ECR sputtering deposition. A method for producing a light enhancement element comprising the step of forming a protective layer having a columnar structure oriented in the thickness direction in relation to the above.

Images