JP2014029515A - Resist composition and method for producing resist pattern - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a resist composition from which a resist pattern with excellent DOF (depth of focus, focus margin) can be produced.SOLUTION: The resist composition comprises a resin having a structural unit expressed by formula (I) and an acid generator expressed by formula (II). In the formulae, Arepresents a single bond,-A-O-,-A-CO-O-, or the like, wherein * represents a hand bonding to -O-; Arepresents an alkanediyl group; Xrepresents an alkanediyl group which may be substituted with a hydroxy group or the like and in which a methylene group constituting the alkanediyl group may be replaced by an oxygen atom or a carbonyl group; Rrepresents a hydrocarbon group which may be substituted with a fluorine atom or a hydroxy group and in which a methylene group included in the hydrocarbon group may be replaced by an oxygen atom or a carbonyl group; and Zrepresents an organic cation.

Description

  The present invention relates to a resist composition, a method for producing a resist pattern using the resist composition, and the like.

また、レジスト組成物から、フォトリソグラフィによりレジストパターンを形成する際、アルカリ現像液で現像するとポジ型レジストパターンが得られ、有機溶剤で現像するとネガ型レジストパターンが得られることが知られている（非特許文献１）。 Patent Document 1 describes a resist composition comprising a resin comprising a structural unit represented by formula (a1-1-1) and a structural unit represented by formula (M), and triphenylsulfonium triflate. ing.

Further, it is known that when a resist pattern is formed from a resist composition by photolithography, a positive resist pattern is obtained when developed with an alkaline developer, and a negative resist pattern is obtained when developed with an organic solvent ( Non-patent document 1).

JP 2000-122294 A

Published by Techno Times Inc. Monthly Display '11 June p. 31

  An object of the present invention is to provide a resist composition capable of producing a resist pattern having an excellent focus margin (DOF).

［式（Ｉ）中、
Ｒ¹は、ハロゲン原子を有してもよい炭素数１〜６のアルキル基、水素原子又はハロゲン原子を表す。
Ａ¹は、単結合、^＊−Ａ²−Ｏ−、^＊−Ａ²−ＣＯ−Ｏ−、^＊−Ａ²−ＣＯ−Ｏ−Ａ³−ＣＯ−Ｏ−又は^＊−Ａ²−Ｏ−ＣＯ−Ａ³−Ｏ−を表す。
＊は−Ｏ−との結合手を表す。
Ａ²及びＡ³は、それぞれ独立に、炭素数１〜６のアルカンジイル基を表す。］

［式（ＩＩ）中、
Ｘ²は、炭素数１〜６のアルカンジイル基を表し、該アルカンジイル基に含まれる水素原子は、ヒドロキシ基又は−ＯＲ⁵で置換されていてもよく、該アルカンジイル基を構成するメチレン基は、酸素原子又はカルボニル基で置き換わっていてもよい。
Ｒ⁴及びＲ⁵は、それぞれ独立に、炭素数１〜２４の炭化水素基を表し、該炭化水素基に含まれる水素原子は、フッ素原子又はヒドロキシ基で置換されていてもよく、該炭化水素基に含まれるメチレン基は、酸素原子又はカルボニル基で置き換わっていてもよい。
Ｚ⁺は、有機カチオンを表す。］
〔２〕式（ＩＩ）で表される酸発生剤が式（ＩＩＡ）で表される酸発生剤である〔１〕記載のレジストパターンの製造方法。

［式（ＩＩＡ）中、Ｘ²及びＺ⁺は、上記と同じ意味を表す。
Ｒ⁶は、炭素数１〜１７の炭化水素基を表し、該炭化水素基に含まれる水素原子は、フッ素原子又はヒドロキシ基で置換されていてもよく、該炭化水素基を構成するメチレン基は、酸素原子又はカルボニル基で置き換わっていてもよい。
Ｒ⁷は、炭素数１〜６のアルキル基を表す。
Ｒ⁸は、炭素数１〜６のフッ素化アルキル基を表す。
ただし、Ｒ⁶、Ｒ⁷及びＲ⁸の合計炭素数は、２０以下である。］
〔３〕さらに溶剤を含有する〔１〕又は〔２〕記載のレジスト組成物。
〔４〕（１）上記〔１〕〜〔３〕のいずれか記載のレジスト組成物を基板上に塗布する工程、
（２）塗布後の組成物を乾燥させて組成物層を形成する工程、
（３）組成物層を露光する工程、
（４）露光後の組成物層を加熱する工程及び
（５）加熱後の組成物層を現像する工程を含むレジストパターンの製造方法。 The present invention includes the following inventions.
[1] A resist composition comprising a resin having a structural unit represented by formula (I) and an acid generator represented by formula (II).

[In the formula (I),
R ¹ represents an alkyl group having 1 to 6 carbon atoms which may have a halogen atom, a hydrogen atom or a halogen atom.
A ¹ is a single bond, ^* —A ² —O—, ^* —A ² —CO—O—, ^* —A ² —CO—O—A ³ —CO—O—, or ^* —A ² —O—CO. -A ³ represents a -O-.
* Represents a bond with -O-.
A ² and A ³ each independently represents an alkanediyl group having 1 to 6 carbon atoms. ]

[In the formula (II),
X ² represents an alkanediyl group having 1 to 6 carbon atoms, and a hydrogen atom contained in the alkanediyl group may be substituted with a hydroxy group or —OR ⁵ , and a methylene group constituting the alkanediyl group May be replaced by an oxygen atom or a carbonyl group.
R ⁴ and R ⁵ each independently represent a hydrocarbon group having 1 to 24 carbon atoms, and the hydrogen atom contained in the hydrocarbon group may be substituted with a fluorine atom or a hydroxy group, The methylene group contained in the group may be replaced with an oxygen atom or a carbonyl group.
Z ⁺ represents an organic cation. ]
[2] The method for producing a resist pattern according to [1], wherein the acid generator represented by the formula (II) is an acid generator represented by the formula (IIA).

[In formula (IIA), X ² and Z ⁺ represent the same meaning as described above.
R ⁶ represents a hydrocarbon group having 1 to 17 carbon atoms, the hydrogen atom contained in the hydrocarbon group may be substituted with a fluorine atom or a hydroxy group, and the methylene group constituting the hydrocarbon group is May be replaced by an oxygen atom or a carbonyl group.
R ⁷ represents an alkyl group having 1 to 6 carbon atoms.
R ⁸ represents a fluorinated alkyl group having 1 to 6 carbon atoms.
However, the total carbon number of R ⁶ , R ⁷ and R ⁸ is 20 or less. ]
[3] The resist composition according to [1] or [2], further containing a solvent.
[4] (1) A step of applying the resist composition according to any one of [1] to [3] on a substrate,
(2) The process of drying the composition after application | coating and forming a composition layer,
(3) a step of exposing the composition layer,
(4) A method for producing a resist pattern, comprising: a step of heating the composition layer after exposure; and (5) a step of developing the composition layer after heating.

  According to the resist composition of the present invention, a resist pattern can be produced with an excellent focus margin.

In the present specification, "(meth) acrylic monomer" means at least one monomer having a "CH ₂ = CH-CO-" or _{"CH 2 = C (CH 3)} -CO- " structure of To do. Similarly, “(meth) acrylate” and “(meth) acrylic acid” mean “at least one of acrylate and methacrylate” and “at least one of acrylic acid and methacrylic acid”, respectively.

<Resist composition>
The resist composition of the present invention comprises:
Resin (hereinafter sometimes referred to as “resin (A)”), and
It contains an acid generator represented by the formula (II) (hereinafter sometimes referred to as “acid generator (II)”).
The resist composition of the present invention preferably further contains a solvent (E).
The resist composition of the present invention preferably further contains a basic compound (C).

<Resin (A)>
The resin (A) includes a structural unit represented by the formula (I) (hereinafter sometimes referred to as “structural unit (I)”).
The resin (A) preferably further contains a structural unit having an acid labile group (hereinafter sometimes referred to as “structural unit (a)”), and a structural unit having no acid labile group (hereinafter “structural unit”). (S) "may be included).
In the present specification, the “acid labile group” is a group having a leaving group and forming a hydrophilic group (for example, a hydroxy group or a carboxy group) by leaving the leaving group by contact with an acid. Means.

［式（Ｉ）中、
Ｒ¹は、ハロゲン原子を有してもよい炭素数１〜６のアルキル基、水素原子又はハロゲン原子を表す。
Ａ¹は、単結合、^＊−Ａ²−Ｏ−、^＊−Ａ²−ＣＯ−Ｏ−、^＊−Ａ²−ＣＯ−Ｏ−Ａ³−ＣＯ−Ｏ−又は^＊−Ａ²−Ｏ−ＣＯ−Ａ³−Ｏ−を表す。
＊は−Ｏ−との結合手を表す。
Ａ²及びＡ³は、それぞれ独立に、炭素数１〜６のアルカンジイル基を表す。］ <Structural unit (I)>
The structural unit (I) is shown below.

[In the formula (I),
R ¹ represents an alkyl group having 1 to 6 carbon atoms which may have a halogen atom, a hydrogen atom or a halogen atom.
A ¹ is a single bond, ^* —A ² —O—, ^* —A ² —CO—O—, ^* —A ² —CO—O—A ³ —CO—O—, or ^* —A ² —O—CO. -A ³ represents a -O-.
* Represents a bond with -O-.
A ² and A ³ each independently represents an alkanediyl group having 1 to 6 carbon atoms. ]

Examples of the halogen atom for R ¹ include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
Examples of the alkyl group for R ¹ include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, sec-butyl group, tert-butyl group, n-pentyl group, and n-hexyl group. , Preferably it is a C1-C4 alkyl group, More preferably, it is a methyl group or an ethyl group.
Examples of the alkyl group having a halogen atom for R ¹ include trifluoromethyl group, perfluoroethyl group, perfluoropropyl group, perfluoroisopropyl group, perfluorobutyl group, perfluorosec-butyl group, perfluorotert-butyl group, perfluoropentyl group, perfluoro group. Examples include a hexyl group, a trichloromethyl group, a tribromomethyl group, and a triiodomethyl group.
R ¹ is preferably a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, more preferably a hydrogen atom, a methyl group or an ethyl group, and still more preferably a hydrogen atom or a methyl group.

Examples of the alkanediyl group of A ² and A ³ include a methylene group, an ethylene group, a propane-1,3-diyl group, a propane-1,2-diyl group, a butane-1,4-diyl group, and a pentane-1,5. -Diyl group and hexane-1,6-diyl group, butane-1,3-diyl group, 2-methylpropane-1,3-diyl group, 2-methylpropane-1,2-diyl group, pentane-1, 4-diyl group, 2-methylbutane-1,4-diyl group, etc. are mentioned.
A ¹ is preferably a single bond or ^* -A ² —CO—O—, and more preferably a single bond, —CH ₂ —CO—O— or —C ₂ H ₄ —CO—O—. .

Examples of the structural unit (I) include the following.

In the above structural unit, a structural unit in which the methyl group corresponding to R ¹ is replaced by a hydrogen atom can also be given as a specific example of the structural unit (I).

［式（Ｉ’）中、Ｒ¹及びＡ¹は上記と同じ意味を表す。］ The structural unit (I) is derived from a compound represented by the formula (I ′) (hereinafter sometimes referred to as “compound (I ′)”).

[In formula (I ′), R ¹ and A ¹ represent the same meaning as described above. ]

［式中、Ｒ¹は上記と同じ意味を表す。］ Compound (I ′) [compound represented by formula (I′-1)] in which A ¹ is * —CH ₂ —CO—O— (* represents a bond to —CO—O—) The compound represented by the formula (I′-1-a) and the compound represented by the formula (I′-1-b) can be produced in a solvent. Examples of the solvent used for the reaction include methylene chloride, tetrahydrofuran and acetonitrile.

[Wherein R ¹ represents the same meaning as described above. ]

［式中、Ｒ¹は上記と同じ意味を表す。］
この反応は、塩化メチレン、テトラヒドロフラン及びアセトニトリル等の溶媒の存在下で行うことが好ましい。また、この反応には、ジシクロヘキシルカルボジイミド等の縮合剤を用いてもよい。 The compound represented by the formula (I′-1-a) is obtained by reacting the compound represented by the formula (I′-1-c) with the compound represented by the formula (I′-1-d). Can be manufactured.

[Wherein R ¹ represents the same meaning as described above. ]
This reaction is preferably carried out in the presence of a solvent such as methylene chloride, tetrahydrofuran and acetonitrile. In this reaction, a condensing agent such as dicyclohexylcarbodiimide may be used.

式（Ｉ’−１−ｃ）で表される化合物として、所望する化合物（Ｉ’）に対応したＡ¹及びＲ¹を有する化合物を用いれば、目的の化合物（Ｉ’）を得ることができる。 Examples of the compound represented by the formula (I′-1-c) include the following compounds. The compounds represented by formula (I′-1-c) and formula (I′-1-d) are easily available from the market.

If a compound having A ¹ and R ¹ corresponding to the desired compound (I ′) is used as the compound represented by the formula (I′-1-c), the target compound (I ′) can be obtained. .

Examples of compound (I ′) include the following.

In the above compounds, compounds in which the methyl group corresponding to R ¹ is replaced with a hydrogen atom can also be mentioned as specific examples of the compound (I ′).

  The resin (A) is preferably a copolymer of the compound (I ′) and a monomer that leads to the structural unit (a) and / or a monomer that leads to the structural unit (s).

［式（１）中、Ｒ^a1、Ｒ^a2及びＲ^a3は、それぞれ独立に、炭素数１〜８のアルキル基、炭素数３〜２０の脂環式炭化水素基又はこれらを組合わせた基を表すか、Ｒ^a1及びＲ^a2は互いに結合して炭素数２〜２０の２価の炭化水素基を形成する。＊は結合手を表す。］

［式（２）中、Ｒ^ａ1’及びＲ^ａ2’は、それぞれ独立に、水素原子又は炭素数１〜１２の炭化水素基を表し、Ｒ^ａ3’は、炭素数１〜２０の炭化水素基を表すか、Ｒ^ａ2’及びＲ^ａ3’は互いに結合して炭素数２〜２０の２価の炭化水素基を形成し、該炭化水素基及び該２価の炭化水素基を構成する−ＣＨ_２−は、−Ｏ―又は―Ｓ−で置き換わってもよい。 <Structural unit (a)>
As described above, the structural unit (a) is a group having a leaving group and forming a hydrophilic group (for example, a hydroxy group or a carboxy group) by leaving the leaving group by contact with an acid. A structural unit having an “acid-labile group”.
Examples of the acid labile group include a group represented by the formula (1) and a group represented by the formula (2).

[In the formula (1), R ^a1 , R ^a2 and R ^a3 each independently represents an alkyl group having 1 to 8 carbon atoms, an alicyclic hydrocarbon group having 3 to 20 carbon atoms, or a group obtained by combining them. R ^a1 and R ^a2 are bonded to each other to form a divalent hydrocarbon group having 2 to 20 carbon atoms. * Represents a bond. ]

[In Formula (2), R ^{a1 ′} and R ^{a2 ′} each independently represent a hydrogen atom or a hydrocarbon group having 1 to 12 carbon atoms, and R ^{a3 ′} represents a hydrocarbon group having 1 to 20 carbon atoms. R ^{a2 ′} and R ^{a3 ′} are bonded to each other to form a divalent hydrocarbon group having 2 to 20 carbon atoms, and —CH ₂ — constituting the hydrocarbon group and the divalent hydrocarbon group. May be replaced by -O- or -S-.

アルキル基と脂環式炭化水素基とを組合わせた基としては、例えば、メチルシクロヘキシル基、ジメチルシクロへキシル基、メチルノルボルニル基等が挙げられる。 ^Examples of the alkyl group represented by R ^a1 , R ^a2 and R ^a3 include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, and an octyl group.
The alicyclic hydrocarbon group represented by R ^a1 , R ^a2 and R ^a3 may be monocyclic or polycyclic. Examples of the monocyclic alicyclic hydrocarbon group include cycloalkyl groups such as a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, and a cyclooctyl group. Examples of the polycyclic alicyclic hydrocarbon group include decahydronaphthyl group, adamantyl group, norbornyl group, and the following groups (* represents a bond). The alicyclic hydrocarbon group represented by R ^a1 , R ^a2 and R ^a3 preferably has 3 to 16 carbon atoms.

Examples of the group obtained by combining an alkyl group and an alicyclic hydrocarbon group include a methylcyclohexyl group, a dimethylcyclohexyl group, and a methylnorbornyl group.

Examples of —C (R ^a1 ) (R ^a2 ) (R ^a3 ) in the case where R ^a1 and R ^a2 are bonded to each other to form a divalent hydrocarbon group include the following groups. The divalent hydrocarbon group preferably has 3 to 12 carbon atoms. In each formula, R ^a3 has the same meaning as described above, and * represents a bond to —O—.

Examples of the group represented by the formula (1) include a 1,1-dialkylalkoxycarbonyl group (a group in which R ^a1 , R ^a2 and R ^a3 are alkyl groups in the formula (1), preferably tert-butoxycarbonyl). Group), 2-alkyladamantan-2-yloxycarbonyl group (in the formula (1), R ^a1 , R ^a2 and the carbon atom to which they are bonded form an adamantyl group, and R ^a3 is an alkyl group) and 1- (adamantan-1-yl) -1-alkylalkoxycarbonyl group (in the formula (1), R ^a1 and R ^a2 are alkyl groups, and R ^a3 is an adamantyl group).

Examples of the hydrocarbon group represented by R ^{a1 ′} , R ^{a2 ′} and R ^{a3 ′} include an alkyl group, an alicyclic hydrocarbon group, an aromatic hydrocarbon group, and a group obtained by combining these.
Examples of the alkyl group and alicyclic hydrocarbon group are the same as those described above.
Aromatic hydrocarbon groups include phenyl, naphthyl, anthryl, p-methylphenyl, p-tert-butylphenyl, p-adamantylphenyl, tolyl, xylyl, cumenyl, mesityl, biphenyl Groups, phenanthryl groups, 2,6-diethylphenyl groups, aryl groups such as 2-methyl-6-ethylphenyl, and the like.
Examples of the divalent hydrocarbon group formed by combining R ^{a2 ′} and R ^{a3 ′} include groups in which one hydrogen atom has been removed from the hydrocarbon groups of R ^{a1 ′ to} R ^{a3 ′} .
At least one of R ^{a1 ′} and R ^{a2 ′} is preferably a hydrogen atom.

Specific examples of the group represented by the formula (2) include the following groups. * Represents a bond.

  The monomer for deriving the structural unit (a) is preferably a monomer having an acid labile group and an ethylenically unsaturated bond, and more preferably a (meth) acrylic monomer having an acid labile group.

  Among the (meth) acrylic monomers having an acid labile group, those having an alicyclic hydrocarbon group having 5 to 20 carbon atoms are preferable. If a resin having a structural unit (a) having a bulky structure such as an alicyclic hydrocarbon group is used in the resist composition, the resolution of the resist pattern can be improved.

  As a structural unit derived from a (meth) acrylic monomer having a group represented by formula (1), preferably a structural unit represented by formula (a1-1) or a structure represented by formula (a1-2) Units are listed. These may be used alone or in combination of two or more. In this specification, the structural unit represented by the formula (a1-1) and the structural unit represented by the formula (a1-2) are represented by the structural unit (a1-1) and the structural unit (a1-2), respectively. The monomer that derives the structural unit (a1-1) and the monomer that derives the structural unit (a1-2) may be referred to as a monomer (a1-1) and a monomer (a1-2), respectively.

［式（ａ１−１）及び式（ａ１−２）中、
Ｌ^a1及びＬ^a2は、それぞれ独立に、−Ｏ−又は^＊−Ｏ−（ＣＨ₂）_k1−ＣＯ−Ｏ−を表し、ｋ１は１〜７の整数を表し、＊は−ＣＯ−との結合手を表す。
Ｒ^a4及びＲ^a5は、それぞれ独立に、水素原子又はメチル基を表す。
Ｒ^a6及びＲ^a7は、それぞれ独立に、炭素数１〜８のアルキル基、炭素数３〜１８の脂環式炭化水素基又はこれらを組合わせた基を表す。
ｍ１は０〜１４の整数を表す。
ｎ１は０〜１０の整数を表す。
ｎ１’は０〜３の整数を表す。］

[In Formula (a1-1) and Formula (a1-2),
L ^a1 and L ^a2 each independently represent —O— or ^* —O— (CH ₂ ) _k1 —CO—O—, k1 represents an integer of 1 to 7, and * represents a bond to —CO—. Represents a hand.
R ^a4 and R ^a5 each independently represent a hydrogen atom or a methyl group.
R ^a6 and R ^a7 each independently represent an alkyl group having 1 to 8 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or a group obtained by combining these.
m1 represents the integer of 0-14.
n1 represents an integer of 0 to 10.
n1 ′ represents an integer of 0 to 3. ]

L ^a1 and L ^a2 are preferably —O— or ^* —O— (CH ₂ ) _k1 —CO—O—, more preferably —O—. k1 is preferably an integer of 1 to 4, more preferably 1.
R ^a4 and R ^a5 are preferably methyl groups.
Examples of the alkyl group of R ^a6 and R ^a7 , the alicyclic hydrocarbon group, and the group obtained by combining these include the same groups as the groups represented by R ^a1 , R ^a2, and R ^a3 in formula (1). .
The alkyl group for R ^a6 and R ^a7 preferably has 6 or less carbon atoms.
The alicyclic hydrocarbon group of R ^a6 and R ^a7 preferably has 8 or less carbon atoms, more preferably 6 or less.
m1 is preferably an integer of 0 to 3, more preferably 0 or 1.
n1 is preferably an integer of 0 to 3, more preferably 0 or 1.
n1 ′ is preferably 0 or 1.

As a monomer (a1-1), the monomer described in Unexamined-Japanese-Patent No. 2010-204646 is mentioned. Among these, a monomer represented by any one of formula (a1-1-1) to formula (a1-1-8) is preferable, and any one of formula (a1-1-1) to formula (a1-1-4) is preferable. The monomer represented by is more preferable.

Examples of the monomer (a1-2) include 1-ethylcyclopentan-1-yl (meth) acrylate, 1-ethylcyclohexane-1-yl (meth) acrylate, and 1-ethylcycloheptan-1-yl (meth). Acrylate, 1-methylcyclopentan-1-yl (meth) acrylate, 1-methylcyclohexane-1-yl (meth) acrylate, 1-isopropylcyclopentan-1-yl (meth) acrylate, 1-isopropylcyclohexane-1- And yl (meth) acrylate. Monomers represented by the formula (a1-2-1) to the formula (a1-2-12) are preferred, and the formula (a1-2-3) to the formula (a1-2-4) or the formula (a1-2-9) The monomer represented by formula (a1-2-10) is more preferable, and the monomer represented by formula (a1-2-3) or formula (a1-2-9) is more preferable.

  When the resin (A) contains the structural unit (a1-1) and / or the structural unit (a1-2), the total content thereof is usually 10 to 95 mol with respect to all the structural units of the resin (A). %, Preferably 15 to 90 mol%, more preferably 20 to 85 mol%.

［式（ａ１−５）中、
Ｒ³¹は、ハロゲン原子を有してもよい炭素数１〜６のアルキル基、水素原子又はハロゲン原子を表す。
Ｚ^a1は、単結合又は＊−［ＣＨ₂］_k4−ＣＯ−Ｌ^a54−を表す。ここで、ｋ４は１〜４の整数を表す。＊は、Ｌ^a51との結合手を表す。
Ｌ^a51、Ｌ^a52、Ｌ^a53及びＬ^a54は、それぞれ独立に、−Ｏ−又は−Ｓ−を表す。
ｓ１は、１〜３の整数を表す。
ｓ１’は、０〜３の整数を表す。］ As a structural unit derived from a (meth) acrylic monomer having a group represented by the formula (2), a structural unit represented by the formula (a1-5) (hereinafter referred to as “structural unit (a1-5)”) There are).

[In the formula (a1-5),
R ³¹ represents an alkyl group having 1 to 6 carbon atoms which may have a halogen atom, a hydrogen atom or a halogen atom.
Z ^a1 represents a single bond or * — [CH ₂ ] _k4 —CO—L ^a54 —. Here, k4 represents an integer of 1 to 4. * Represents a bond with L ^a51 .
L ^a51 , L ^a52 , L ^a53 and L ^a54 each independently represent —O— or —S—.
s1 represents an integer of 1 to 3.
s1 ′ represents an integer of 0 to 3. ]

In formula (a1-5), R ³¹ is preferably a hydrogen atom, a methyl group, or a trifluoromethyl group.
L ^a51 is preferably an oxygen atom.
One of L ^a52 and L ^a53 is preferably an oxygen atom and the other is a sulfur atom.
s1 is preferably 1.
s1 ′ is preferably an integer of 0 to 2.
Z ^a1 is preferably a single bond or * —CH ₂ —CO—O—.

Examples of the monomer that leads to the structural unit (a1-5) include the following monomers.

  When resin (A) has a structural unit (a1-5), the content rate is preferable 1-50 mol% with respect to all the structural units of resin (A), and 3-45 mol% is more preferable. 5 to 40 mol% is more preferable.

<Structural unit (s)>
The monomer for deriving the “structural unit (s)” which is a structural unit having no acid labile group is not particularly limited as long as it is a monomer having no acid labile group, and a known monomer in the resist field can be used. .
As the structural unit (s), a structural unit having a hydroxy group or a lactone ring and having no acid labile group is preferable. A structure having a hydroxy group and having no acid labile group (hereinafter sometimes referred to as “structural unit (a2)”) and / or a lactone ring and having no acid labile group If a resin having a unit (hereinafter sometimes referred to as “structural unit (a3)”) is used for the resist composition, the resolution of the resist pattern and the adhesion to the substrate can be improved.

<Structural unit (a2)>
The hydroxy group contained in the structural unit (a2) may be an alcoholic hydroxy group or a phenolic hydroxy group.
When the resist composition is applied to KrF excimer laser exposure (248 nm), high energy beam exposure such as electron beam or EUV (extreme ultraviolet light), the structural unit (a2) having a phenolic hydroxy group as the structural unit (a2) ) Is preferably used. When applied to ArF excimer laser exposure (193 nm) or the like, the structural unit (a2) is preferably a structural unit (a2) having an alcoholic hydroxy group, and more preferably a structural unit (a2-1). As the structural unit (a2), one type may be contained alone, or two or more types may be used in combination.

［式（ａ２−１）中、
Ｌ^a3は、−Ｏ−又は^＊−Ｏ−（ＣＨ₂）_k2−ＣＯ−Ｏ−を表し、
ｋ２は１〜７の整数を表す。＊は−ＣＯ−との結合手を表す。
Ｒ^a14は、水素原子又はメチル基を表す。
Ｒ^a15及びＲ^a16は、それぞれ独立に、水素原子、メチル基又はヒドロキシ基を表す。
ｏ１は、０〜１０の整数を表す。］ Examples of the structural unit (a2) having an alcoholic hydroxy group include a structural unit represented by the formula (a2-1) (hereinafter sometimes referred to as “structural unit (a2-1)”).

[In the formula (a2-1),
L ^a3 represents —O— or ^* —O— (CH ₂ ) _k2 —CO—O—,
k2 represents an integer of 1 to 7. * Represents a bond with -CO-.
R ^a14 represents a hydrogen atom or a methyl group.
R ^a15 and R ^a16 each independently represent a hydrogen atom, a methyl group or a hydroxy group.
o1 represents an integer of 0 to 10. ]

In the formula (a2-1), L ^a3 is preferably, -O -, - O- (CH 2) f1 -CO-O- and is (wherein f1 is an integer from 1 to 4), more preferably Is —O—.
R ^a14 is preferably a methyl group.
R ^a15 is preferably a hydrogen atom.
R ^a16 is preferably a hydrogen atom or a hydroxy group.
o1 is preferably an integer of 0 to 3, more preferably 0 or 1.

As a monomer which introduce | transduces structural unit (a2-1), the monomer described in Unexamined-Japanese-Patent No. 2010-204646 is mentioned, for example. A monomer represented by any one of formula (a2-1-1) to formula (a2-1-6) is preferable, and represented by any one of formula (a2-1-1) to formula (a2-1-4). The monomer represented by Formula (a2-1-1) or Formula (a2-1-3) is more preferable.

  When resin (A) contains structural unit (a2-1), the content rate is 3 to 45 mol% normally with respect to all the structural units of resin (A), Preferably it is 1 to 40 mol%. More preferably, it is 1-35 mol%, More preferably, it is 2-20 mol%.

<Structural unit (a3)>
The lactone ring contained in the structural unit (a3) may be, for example, a monocycle such as a β-propiolactone ring, γ-butyrolactone ring, or δ-valerolactone ring, and a bridged ring including these monocyclic lactone ring structures. But you can. Among these lactone rings, a γ-butyrolactone ring or a bridged ring containing a γ-butyrolactone ring structure is preferable.

  The structural unit (a3) is preferably a structural unit represented by the formula (a3-1), the formula (a3-2), or the formula (a3-3). These 1 type may be contained independently and 2 or more types may be contained.

［式（ａ３−１）中、
Ｌ^a4は、酸素原子又は^＊−Ｏ−（ＣＨ₂）_k3−ＣＯ−Ｏ−（ｋ３は１〜７の整数を表す。）で表される基を表す。＊はカルボニル基との結合手を表す。
Ｒ^a18は、水素原子又はメチル基を表す。
Ｒ^a21は炭素数１〜４の脂肪族炭化水素基を表す。
ｐ１は０〜５の整数を表す。ｐ１が２以上のとき、複数のＲ^a21は互いに同一又は相異なる。
式（ａ３−２）中、
Ｌ^a5は、酸素原子又は^＊−Ｏ−（ＣＨ₂）_k3−ＣＯ−Ｏ−（ｋ３は１〜７の整数を表す。）で表される基を表す。＊はカルボニル基との結合手を表す。
Ｒ^a19は、水素原子又はメチル基を表す。
Ｒ^a22は、カルボキシ基、シアノ基又は炭素数１〜４の脂肪族炭化水素基を表す。
ｑ１は、０〜３の整数を表す。ｑ１が２以上のとき、複数のＲ^a22は互いに同一又は相異なる。
式（ａ３−３）中、
Ｌ^a6は、酸素原子又は^＊−Ｏ−（ＣＨ₂）_k3−ＣＯ−Ｏ−（ｋ３は１〜７の整数を表す。）で表される基を表す。＊はカルボニル基との結合手を表す。
Ｒ^a20は、水素原子又はメチル基を表す。
Ｒ^a23は、カルボキシ基、シアノ基又は炭素数１〜４の脂肪族炭化水素基を表す。
ｒ１は、０〜３の整数を表す。ｒ１が２以上のとき、複数のＲ^a23は互いに同一又は相異なる。］

[In the formula (a3-1),
L ^a4 represents an oxygen atom or a group represented by ^* —O— (CH ₂ ) _k3 —CO—O— (k3 represents an integer of 1 to 7). * Represents a bond with a carbonyl group.
R ^a18 represents a hydrogen atom or a methyl group.
R ^a21 represents an aliphatic hydrocarbon group having 1 to 4 carbon atoms.
p1 represents an integer of 0 to 5. When p1 is 2 or more, the plurality of R ^a21 are the same or different from each other.
In formula (a3-2),
L ^a5 represents an oxygen atom or a group represented by ^* —O— (CH ₂ ) _k3 —CO—O— (k3 represents an integer of 1 to 7). * Represents a bond with a carbonyl group.
R ^a19 represents a hydrogen atom or a methyl group.
R ^a22 represents a carboxy group, a cyano group, or an aliphatic hydrocarbon group having 1 to 4 carbon atoms.
q1 represents an integer of 0 to 3. When q1 is 2 or more, the plurality of R ^a22 are the same or different from each other.
In formula (a3-3),
L ^a6 represents an oxygen atom or a group represented by ^* —O— (CH ₂ ) _k3 —CO—O— (k3 represents an integer of 1 to 7). * Represents a bond with a carbonyl group.
R ^a20 represents a hydrogen atom or a methyl group.
R ^a23 represents a carboxy group, a cyano group, or an aliphatic hydrocarbon group having 1 to 4 carbon atoms.
r1 represents an integer of 0 to 3. When r1 is 2 or more, the plurality of R ^a23 are the same or different from each other. ]

In Formula (a3-1), Formula (a3-2), and Formula (a3-3), L ^a4 , L ^a5, and L ^a6 are each independently preferably an oxygen atom or an integer of k3 of 1 to 4. A group represented by * —O— (CH ₂ ) _k3 —CO—O—, more preferably an oxygen atom and * —O—CH ₂ —CO—O—, still more preferably an oxygen atom.
R ^a18 , R ^a19 , R ^a20 and R ^a21 are preferably methyl groups.
R ^a22 and R ^a23 are each independently preferably a carboxy group, a cyano group or a methyl group.
p1, q1 and r1 are each independently preferably an integer of 0 to 2, more preferably 0 or 1.

  Examples of the monomer that leads to the structural unit (a3) include monomers described in JP 2010-204646 A. Formula (a3-1-1) to Formula (a3-1-4), Formula (a3-2-1) to Formula (a3-2-4), and Formula (a3-3-1) to Formula (a3-3) -4) is preferred, and the monomers represented by formula (a3-1-1) to formula (a3-1-2) and formula (a3-2-3) to formula (a3-2-4) are preferred. The monomer represented by either is more preferable, and the monomer represented by the formula (a3-1-1) or the formula (a3-2-3) is more preferable.

  When the resin (A) includes the structural unit (a3), the content is usually 5 to 70 mol%, preferably 10 to 65 mol%, based on all the structural units of the resin (A). More preferably, it is 10-60 mol%.

The content of the structural unit (I) in the resin (A) is preferably 1 to 80 mol%, more preferably 2 to 75 mol%, still more preferably based on the total structural units of the resin (A). It is 3-70 mol%, Most preferably, it is 5-65 mol%.
The resin (A) having the structural unit (I) at such a content rate is manufactured by adjusting the molar amount of the compound (I ′) used relative to the total molar amount of all monomers used in the production of the resin (A). Can do.

When the resin (A) is a resin composed only of the structural unit (I) and the structural unit (a), these contents are respectively relative to all structural units of the resin (A)
Structural unit (I); 1 to 80 mol%
Structural unit (a); 20 to 99 mol% is preferred,
Structural unit (I); 2-75 mol%
Structural unit (a); 25 to 98 mol% is more preferred,
Structural unit (I); 3-70 mol%
Structural unit (a); 30 to 97 mol% is more preferable.

When the resin (A) is a resin composed of the structural unit (I), the structural unit (a), and the structural unit (s), these content rates are respectively based on the total structural units of the resin (A).
Structural unit (I); 1 to 80 mol%
Structural unit (a); 17-96 mol%
Structural unit (s); 3-82 mol% is preferable,
Structural unit (I); 2-75 mol%
Structural unit (a); 20-93 mol%
Structural unit (s); 5-78 mol% is more preferable,
Structural unit (I); 5-65 mol%
Structural unit (a); 30 to 90 mol%
The structural unit (s); 5 to 65 mol% is more preferable.

  The resin (A) preferably contains 15 mol% or more of structural units derived from the monomer having an adamantyl group (particularly the structural unit (a1-1)) with respect to the total structural units (a). When the content of the structural unit having an adamantyl group is large, the dry etching resistance of the resist pattern is improved.

The resin (A) is preferably a resin composed of the structural unit (I), the structural unit (a), and the structural unit (s).
The structural unit (a) is preferably at least one of the structural unit (a1-1) and the structural unit (a1-2) (preferably the structural unit having a cyclohexyl group or a cyclopentyl group), more preferably the structural unit (a1- 1).
The structural unit (s) is preferably at least one of the structural unit (a2) and the structural unit (a3). The structural unit (a2) is preferably the structural unit (a2-1). The structural unit (a3) is preferably at least one of the structural unit (a3-1) and the structural unit (a3-2).

Each structural unit constituting the resin (A) may be used alone or in combination of two or more, and is produced by a known polymerization method (for example, radical polymerization method) using a monomer that derives these structural units. can do.
The weight average molecular weight of the resin (A) is preferably 2,500 or more (more preferably 3,000 or more, more preferably 4,000 or more), 50,000 or less (more preferably 30,000 or less, and further preferably 15,000 or less).

<Resin other than resin (A)>
The resist composition of the present invention is selected from resins other than the above-described resin (A), for example, the above-described structural unit (a), structural unit (s), and structural units derived from known monomers used in the field. A resin having at least one selected from the above may be contained.
When the resist composition of this invention contains resin other than resin (A), the content rate is 0.1-50 mass% normally with respect to the total amount of resin contained in the resist composition of this invention. , Preferably it is 0.5-30 mass%, More preferably, it is 1-20 mass%.

  In the resist composition of the present invention, the total resin content is preferably 80% by mass or more and 99.9% by mass or less in the solid content of the resist composition. In the present specification, the “solid content in the composition” means the total of resist composition components excluding the solvent (E) described later. The solid content in the composition and the resin content relative thereto can be measured, for example, by a known analytical means such as liquid chromatography or gas chromatography.

［式（ＩＩ）中、
Ｘ²は、炭素数１〜６のアルカンジイル基を表し、該アルカンジイル基に含まれる水素原子は、ヒドロキシ基又は−ＯＲ⁵で置換されていてもよく、該アルカンジイル基を構成するメチレン基は、酸素原子又はカルボニル基で置き換わっていてもよい。
Ｒ⁴及びＲ⁵は、それぞれ独立に、炭素数１〜２４の炭化水素基を表し、該炭化水素基に含まれる水素原子は、フッ素原子又はヒドロキシ基で置換されていてもよく、該炭化水素基を構成するメチレン基は、酸素原子又はカルボニル基で置き換わっていてもよい。
Ｚ⁺は、有機カチオンを表す。］ <Acid generator (II)>
The acid generator (II) is represented by the formula (II).

[In the formula (II),
X ² represents an alkanediyl group having 1 to 6 carbon atoms, and a hydrogen atom contained in the alkanediyl group may be substituted with a hydroxy group or —OR ⁵ , and a methylene group constituting the alkanediyl group May be replaced by an oxygen atom or a carbonyl group.
R ⁴ and R ⁵ each independently represent a hydrocarbon group having 1 to 24 carbon atoms, and the hydrogen atom contained in the hydrocarbon group may be substituted with a fluorine atom or a hydroxy group, The methylene group constituting the group may be replaced with an oxygen atom or a carbonyl group.
Z ⁺ represents an organic cation. ]

Examples of the alkanediyl group of X ² include a methylene group, an ethylene group, a propane-1,3-diyl group, a propane-1,2-diyl group, a butane-1,4-diyl group, and a pentane-1,5-diyl group. Hexane-1,6-diyl group, ethane-1,1-diyl group, propane-1,1-diyl group, propane-2,2-diyl group, butane-1,3-diyl group, 2-methylpropane -1,3-diyl group, 2-methylpropane-1,2-diyl group, pentane-1,4-diyl group, 2-methylbutane-1,4-diyl group and the like.
Of these, a methylene group is preferable.

Examples of the group in which one or more methylene groups contained in the alkanediyl group are replaced with an oxygen atom or a carbonyl group include the following divalent groups. * Represents a bond with CF ₂ .

Examples of the group in which the hydrogen atom contained in the alkanediyl group is substituted with a hydroxy group or —OR ⁵ and one or more methylene groups contained in the alkanediyl group are replaced with oxygen atoms include the following groups: . * Represents a bond with CF ₂ .

The hydrocarbon group for R ⁴ and R ⁵ may be either saturated or unsaturated, for example, a linear or branched alkyl group or alkenyl group, a monocyclic or polycyclic alicyclic hydrocarbon group , Aromatic hydrocarbon groups and the like, and a combination of two or more of these groups may be used.
Examples of the linear alkyl group include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, and a hexyl group.
Examples of the branched alkyl group include an isopropyl group, a sec-butyl group, and a tert-butyl group.
Examples of the linear or branched alkenyl group include a vinyl group and an α-methylvinyl group.
Examples of the monocyclic alicyclic hydrocarbon group include a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, and a cyclooctyl group.
Examples of the polycyclic alicyclic hydrocarbon group include a norbornyl group and an adamantyl group.
Examples of the aromatic hydrocarbon group include phenyl group, naphthyl group, p-methylphenyl group, p-tert-butylphenyl group, p-adamantylphenyl group, tolyl group, xylyl group, 2,6-diethylphenyl group, 2- And methyl-6-ethylphenyl.

［式（ＩＩＡ）中、Ｘ²及びＺ⁺は、上記と同じ意味を表す。
Ｒ⁶は、炭素数１〜１７の炭化水素基を表し、該炭化水素基に含まれる水素原子は、フッ素原子又はヒドロキシ基で置換されていてもよく、該炭化水素基を構成するメチレン基は、酸素原子又はカルボニル基で置き換わっていてもよい。
Ｒ⁷は、炭素数１〜６のアルキル基を表す。
Ｒ⁸は、炭素数１〜６のフッ素化アルキル基を表す。
ただし、Ｒ⁶、Ｒ⁷及びＲ⁸の合計炭素数は、２０以下である。］ The acid generator (II) is preferably an acid generator represented by the formula (IIA).

[In formula (IIA), X ² and Z ⁺ represent the same meaning as described above.
R ⁶ represents a hydrocarbon group having 1 to 17 carbon atoms, the hydrogen atom contained in the hydrocarbon group may be substituted with a fluorine atom or a hydroxy group, and the methylene group constituting the hydrocarbon group is May be replaced by an oxygen atom or a carbonyl group.
R ⁷ represents an alkyl group having 1 to 6 carbon atoms.
R ⁸ represents a fluorinated alkyl group having 1 to 6 carbon atoms.
However, the total carbon number of R ⁶ , R ⁷ and R ⁸ is 20 or less. ]

Ｒ⁷のアルキル基としては、メチル基、エチル基、プロピル基、ブチル基等が挙げられる。
Ｒ⁸のフッ素化アルキル基としては、トリフルオロメチル基、パーフルオロエチル基、１，１，２，２−テトラフルオロエチル基、パーフルオロブチル基、１，１，２，２，３，３，４，４−オクタフルオロブチル基等が挙げられ、好ましくはトリフルオロメチル基である。 Examples of the hydrocarbon group for R ⁶ include the same groups as those for R ⁴ , and an alicyclic hydrocarbon group is preferable.
Examples of the group in which the methylene group constituting the hydrocarbon group is replaced with an oxygen atom or a carbonyl group include the following. * Represents a bond.

Examples of the alkyl group for R ⁷ include a methyl group, an ethyl group, a propyl group, and a butyl group.
As the fluorinated alkyl group for R ⁸ , a trifluoromethyl group, a perfluoroethyl group, a 1,1,2,2-tetrafluoroethyl group, a perfluorobutyl group, 1,1,2,2,3,3, Examples include 4,4-octafluorobutyl group, and a trifluoromethyl group is preferable.

Examples of the acid generator (II) include the following salts.

Examples of Z ⁺ include organic onium cations such as organic sulfonium cations, organic iodonium cations, organic ammonium cations, benzothiazolium cations, and organic phosphonium cations. Among these, an organic sulfonium cation and an organic iodonium cation are preferable, an arylsulfonium cation is more preferable, and a cation represented by any one of the formulas (b2-1) to (b2-4) [hereinafter, depending on the formula number Sometimes referred to as “cation (b2-1)”. ] Is more preferable.

In formula (b2-1) to formula (b2-4),
Each of R ^{b4 to} R ^b6 independently represents an aliphatic hydrocarbon group having 1 to 30 carbon atoms, an alicyclic hydrocarbon group having 3 to 36 carbon atoms, or an aromatic hydrocarbon group having 6 to 36 carbon atoms; , R ^b4 and R ^b5 together form a ring containing a sulfur atom. The hydrogen atom contained in the aliphatic hydrocarbon group is a hydroxy group, an alkoxy group having 1 to 12 carbon atoms, an alicyclic saturated hydrocarbon group having 3 to 12 carbon atoms, or an aromatic hydrocarbon group having 6 to 18 carbon atoms. The hydrogen atom contained in the alicyclic hydrocarbon group is substituted with a halogen atom, an alkyl group having 1 to 18 carbon atoms, an acyl group having 2 to 4 carbon atoms, or a glycidyloxy group. The hydrogen atom contained in the aromatic hydrocarbon group may be substituted with a halogen atom, a hydroxy group or an alkoxy group having 1 to 12 carbon atoms.
R ^b7 and R ^b8 each independently represent a hydroxy group, an aliphatic hydrocarbon group having 1 to 12 carbon atoms, or an alkoxy group having 1 to 12 carbon atoms.
m2 and n2 each independently represent an integer of 0 to 5. When m2 is 2 or more, the plurality of R ^b7 are the same or different from each other, and when n2 is 2 or more, the plurality of R ^b8 are the same or different from each other.
R ^b9 and R ^b10 each independently represent an aliphatic hydrocarbon group having 1 to 30 carbon atoms or an alicyclic hydrocarbon group having 3 to 36 carbon atoms, or R ^b9 and R ^b10 are combined together. Together with the sulfur atom to which they are attached, forms a 3- to 12-membered ring (preferably a 3- to 7-membered ring). —CH ₂ — constituting the ring may be replaced with —O—, —SO— or —CO—.
R ^b11 represents a hydrogen atom, an aliphatic hydrocarbon group having 1 to 30 carbon atoms, an alicyclic hydrocarbon group having 3 to 36 carbon atoms, or an aromatic hydrocarbon group having 6 to 36 carbon atoms.
R ^b12 represents an aliphatic hydrocarbon group having 1 to 30 carbon atoms, an alicyclic hydrocarbon group having 3 to 36 carbon atoms, or an aromatic hydrocarbon group having 6 to 36 carbon atoms. The hydrogen atom contained in the aliphatic hydrocarbon group may be substituted with an aromatic hydrocarbon group having 6 to 18 carbon atoms, and the hydrogen atom contained in the aromatic hydrocarbon group has 1 to 12 carbon atoms. Or an alkoxycarbonyloxy group having 1 to 12 carbon atoms.
R ^b11 and R ^b12 may form a 3- to 12-membered ring (preferably a 3- to 7-membered ring) together with —CH—CO— to which they are bonded. —CH ₂ — constituting the ring may be replaced with —O—, —SO— or —CO—.
R ^{b13 to} R ^b18 each independently represent a hydroxy group, an aliphatic hydrocarbon group having 1 to 12 carbon atoms, or an alkoxy group having 1 to 12 carbon atoms.
L ^b24 represents -S- or -O-.
o2, p2, s2, and t2 each independently represents an integer of 0 to 5.
q2 and r2 each independently represents an integer of 0 to 4.
u2 represents 0 or 1.
When o2 is 2 or more, the plurality of R ^b13 are the same or different from each other. When p2 is 2 or more, the plurality of R ^b14 are the same or different from each other. When q2 is 2 or more, the plurality of R ^b15 are the same. Alternatively, when r2 is 2 or more, a plurality of R ^b16 are the same or different from each other, when s2 is 2 or more, a plurality of R ^b17 are the same or different from each other, and when t2 is 2 or more, a plurality of R ^{b16 b18} are the same or different from each other.

R ^b4 and R ^b5 may together form a 3- to 12-membered ring (preferably a 3- to 7-membered ring) with the sulfur atom to which they are bonded.

特に、Ｒ^b9〜Ｒ^b11の脂環式炭化水素基は、好ましくは炭素数４〜１２である。 Examples of the aliphatic hydrocarbon group include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, sec-butyl group, tert-butyl group, pentyl group, hexyl group, octyl group and 2- An ethylhexyl group is mentioned. In particular, the aliphatic hydrocarbon group represented by R ^{b9 to} R ^b12 preferably has 1 to 12 carbon atoms.
Examples of the aliphatic hydrocarbon group in which a hydrogen atom is substituted with an alicyclic hydrocarbon group include a 1- (adamantan-1-yl) alkane-1-yl group.
The alicyclic hydrocarbon group may be monocyclic or polycyclic, and the hydrogen atom contained in the alicyclic hydrocarbon group may be substituted with an alkyl group. In this case, the carbon number of the alicyclic hydrocarbon group is 20 or less including the carbon number of the alkyl group. Examples of the monocyclic alicyclic hydrocarbon group include cycloalkyl groups such as a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, a cyclooctyl group, and a cyclodecyl group. Examples of the polycyclic alicyclic hydrocarbon group include decahydronaphthyl group, adamantyl group, norbornyl group, and the following groups.

In particular, the alicyclic hydrocarbon group of R ^{b9 to} R ^b11 preferably has 4 to 12 carbon atoms.

  Examples of the alicyclic hydrocarbon group in which a hydrogen atom is substituted with an alkyl group include a methylcyclohexyl group, a dimethylcyclohexyl group, a 2-alkyladamantan-2-yl group, a methylnorbornyl group, and an isobornyl group. Can be mentioned.

Examples of the aromatic hydrocarbon group include phenyl group, tolyl group, xylyl group, cumenyl group, mesityl group, 4-ethylphenyl group, 4-tert-butylphenyl group, 4-cyclohexylphenyl group, 4-adamantyl group. Substituted or unsubstituted phenyl groups such as phenyl group, 2,6-diethylphenyl group, 2-methyl-6-ethylphenyl group; biphenylyl group, naphthyl group, phenanthryl group and the like.
As an aromatic hydrocarbon group by which the hydrogen atom was substituted by the alkoxy group, 4-methoxyphenyl group etc. are mentioned, for example.
Examples of the alkyl group in which a hydrogen atom is substituted with an aromatic hydrocarbon group, that is, an aralkyl group, include a benzyl group, a phenethyl group, a phenylpropyl group, a trityl group, a naphthylmethyl group, and a naphthylethyl group.
In addition, when an alkyl group or an alicyclic hydrocarbon group is contained in an aromatic hydrocarbon group, a C1-C12 alkyl group and a C3-C18 alicyclic hydrocarbon group are preferable.

Examples of the alkoxy group include methoxy group, ethoxy group, propoxy group, butoxy group, pentyloxy group, hexyloxy group, heptyloxy group, octyloxy group, decyloxy group and dodecyloxy group.
Examples of the acyl group include an acetyl group, a propionyl group, and a butyryl group.
Examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom and an iodine atom.
Examples of the alkylcarbonyloxy group include methylcarbonyloxy group, ethylcarbonyloxy group, n-propylcarbonyloxy group, isopropylcarbonyloxy group, n-butylcarbonyloxy group, sec-butylcarbonyloxy group, tert-butylcarbonyloxy group. Group, pentylcarbonyloxy group, hexylcarbonyloxy group, octylcarbonyloxy group, 2-ethylhexylcarbonyloxy group and the like.

The ring containing a sulfur atom which may be formed by combining R ^b4 and R ^b5 is any of monocyclic, polycyclic, aromatic, non-aromatic, saturated and unsaturated rings. As long as it contains one or more sulfur atoms, it may further contain one or more oxygen atoms. As the ring, a ring having 3 to 18 carbon atoms is preferable, and a ring having 4 to 18 carbon atoms is more preferable.

Examples of the ring formed together with the sulfur atom to which R ^b9 and R ^b10 are bonded include, for example, a thiolane-1-ium ring (tetrahydrothiophenium ring), a thian-1-ium ring, and a 1,4-oxathian-4-ium. A ring etc. are mentioned.
Examples of the ring formed with —CH—CO— in which R ^b11 and R ^b12 are bonded include an oxocycloheptane ring, an oxocyclohexane ring, an oxonorbornane ring, and an oxoadamantane ring.

Examples of the cation (b2-1) include the following cations.

Examples of the cation (b2-2) include the following cations.

Examples of the cation (b2-3) include the following cations.

  The acid generator (II) is a combination of the above anion and the above cation. These can be arbitrarily combined, and among them, the salt represented by the following is preferable.

［式中、Ｘ²、Ｒ⁴及びＺ⁺は、上記と同じ意味を表す。］ The salt (II) can be obtained, for example, by reacting a salt represented by the formula (II-0-1) with a compound represented by the formula (II-0-2) in a solvent. Examples of the solvent include chloroform.

[Wherein, X ² , R ⁴ and Z ⁺ represent the same meaning as described above. ]

Examples of the salt represented by the formula (II-0-1) include salts represented by the following.

［式中、Ｒ⁴は、上記と同じ意味を表す。］
式（ＩＩ−０−３）で表される化合物としては、例えば、以下で表される化合物等が挙げられる。

The compound represented by the formula (II-0-2) is obtained by reacting a salt represented by the formula (II-0-3) and a compound represented by the formula (II-0-4) in a solvent. Can be obtained.
Examples of the solvent include chloroform.

[Wherein R ⁴ represents the same meaning as described above. ]
Examples of the compound represented by the formula (II-0-3) include compounds represented by the following.

［式中、Ｘ²、Ｒ⁶、Ｒ⁷、Ｒ⁸及びＺ⁺は、上記と同じ意味を表す。］ The salt represented by the formula (IIA) can be obtained, for example, by reacting the salt represented by the formula (IIA-1) with the compound represented by the formula (IIA-2) in a solvent. Examples of the solvent include chloroform.

[Wherein, X ² , R ⁶ , R ⁷ , R ⁸ and Z ⁺ represent the same meaning as described above. ]

［式中、Ｘ²、Ｒ⁷、Ｒ⁸及びＺ⁺は、上記と同じ意味を表す。］
式（ＩＩＡ−３）で表される塩は、例えば、以下で表される塩等が挙げられる。

式（ＩＩＡ−４）で表される化合物としては、トリフルオロピルビン酸エチル等が挙げられる。 The salt represented by the formula (IIA-1) is obtained by reacting the salt represented by the formula (IIA-3) with the compound represented by the formula (IIA-4) in a solvent in the presence of an acid catalyst. Can be manufactured. Examples of the solvent include dimethylformamide. Examples of the acid catalyst include p-toluenesulfonic acid.

[Wherein, X ² , R ⁷ , R ⁸ and Z ⁺ represent the same meaning as described above. ]
Examples of the salt represented by the formula (IIA-3) include salts represented by the following.

Examples of the compound represented by the formula (IIA-4) include ethyl trifluoropyruvate.

［式中、Ｒ⁶は、上記と同じ意味を表す。］
式（ＩＩＡ−５）で表される化合物としては、例えば、以下で表される化合物等が挙げられる。

The compound represented by the formula (IIA-2) can be obtained by reacting the salt represented by the formula (IIA-5) and the compound represented by the formula (IIA-6) in a solvent. .
Examples of the solvent include chloroform.

[Wherein R ⁶ represents the same meaning as described above. ]
Examples of the compound represented by the formula (IIA-5) include compounds represented by the following.

  The salt (II) may be used alone or in combination of two or more.

<Acid generator other than salt (II)>
The resist composition may contain an acid generator other than the acid generator (II) described above (hereinafter sometimes referred to as “acid generator (B)”).
The acid generator (B) may be either nonionic or ionic. Nonionic acid generators include organic halides, sulfonate esters (for example, 2-nitrobenzyl ester, aromatic sulfonate, oxime sulfonate, N-sulfonyloxyimide, N-sulfonyloxyimide, sulfonyloxyketone, diazonaphthoquinone 4). -Sulfonate), sulfones (for example, disulfone, ketosulfone, sulfonyldiazomethane) and the like. Examples of the ionic acid generator include onium salts containing onium cations (for example, diazonium salts, phosphonium salts, sulfonium salts, iodonium salts) and the like. Examples of the anion of the onium salt include a sulfonate anion, a sulfonylimide anion, and a sulfonylmethide anion.

  Examples of the acid generator (B) include JP-A 63-26653, JP-A 55-164824, JP-A 62-69263, JP-A 63-146038, JP-A 63-163452, JP-A-62-153853, JP-A-63-146029, US Pat. No. 3,779,778, US Pat. No. 3,849,137, German Patent No. 3914407, European Patent No. 126,712 The compound which generate | occur | produces an acid by the radiation as described in etc. can be used.

  The acid generator (B) is preferably a fluorine-containing acid generator, more preferably a salt represented by the formula (B1) (hereinafter sometimes referred to as “salt (B1)”).

［式（Ｂ１）中、
Ｑ^b1及びＱ^b2は、それぞれ独立に、フッ素原子又は炭素数１〜６のペルフルオロアルキル基を表す。
Ｌ^b1は、炭素数１〜２４の飽和炭化水素基を表し、該飽和炭化水素基に含まれる水素原子は、フッ素原子又はヒドロキシ基に置き換わっていてもよく、該飽和炭化水素基を構成するメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよい。
Ｙは、水素原子、フッ素原子、置換基を有していてもよい炭素数３〜１８の脂環式炭化水素基を表し、該脂環式炭化水素基を構成するメチレン基は、酸素原子、スルホニル基又はカルボニル基に置き換わっていてもよい。
Ｚ１⁺は、有機カチオンを表す。］

[In the formula (B1),
Q ^b1 and Q ^b2 each independently represent a fluorine atom or a C 1-6 perfluoroalkyl group.
L ^b1 represents a saturated hydrocarbon group having 1 to 24 carbon atoms, and the hydrogen atom contained in the saturated hydrocarbon group may be replaced by a fluorine atom or a hydroxy group, and methylene constituting the saturated hydrocarbon group The group may be replaced by an oxygen atom or a carbonyl group.
Y represents a hydrogen atom, a fluorine atom, or an optionally substituted alicyclic hydrocarbon group having 3 to 18 carbon atoms, and the methylene group constituting the alicyclic hydrocarbon group is an oxygen atom, A sulfonyl group or a carbonyl group may be substituted.
Z1 ⁺ represents an organic cation. ]

Examples of the perfluoroalkyl group for Q ^b1 and Q ^b2 include a trifluoromethyl group, a perfluoroethyl group, a perfluoropropyl group, a perfluoroisopropyl group, a perfluorobutyl group, a perfluoro sec-butyl group, a perfluorotert-butyl group, a perfluoropentyl group, A perfluorohexyl group etc. are mentioned.
Q ^b1 and Q ^b2 are each independently preferably a trifluoromethyl group or a fluorine atom, more preferably a fluorine atom.

Examples of the saturated hydrocarbon group for L ^b1 include an aliphatic saturated hydrocarbon group such as a linear alkanediyl group, a branched alkanediyl group, and a monocyclic or polycyclic alicyclic saturated hydrocarbon group, A combination of two or more of these groups may be used.
Specifically, methylene group, ethylene group, propane-1,3-diyl group, propane-1,2-diyl group, butane-1,4-diyl group, pentane-1,5-diyl group, hexane-1 , 6-diyl group, heptane-1,7-diyl group, octane-1,8-diyl group, nonane-1,9-diyl group, decane-1,10-diyl group, undecane-1,11-diyl group , Dodecane-1,12-diyl group, tridecane-1,13-diyl group, tetradecane-1,14-diyl group, pentadecane-1,15-diyl group, hexadecane-1,16-diyl group, heptadecane-1, Linear alkanediyl groups such as 17-diyl group, ethane-1,1-diyl group, propane-1,1-diyl group and propane-2,2-diyl group;
Butane-1,3-diyl group, 2-methylpropane-1,3-diyl group, 2-methylpropane-1,2-diyl group, pentane-1,4-diyl group, 2-methylbutane-1,4- Branched alkanediyl groups such as diyl groups;
Monocyclic 2 which is a cycloalkanediyl group such as cyclobutane-1,3-diyl group, cyclopentane-1,3-diyl group, cyclohexane-1,4-diyl group, cyclooctane-1,5-diyl group Valent alicyclic saturated hydrocarbon group;
Polycyclic divalent alicyclic saturated hydrocarbon such as norbornane-1,4-diyl group, norbornane-2,5-diyl group, adamantane-1,5-diyl group, adamantane-2,6-diyl group, etc. Groups and the like.

Examples of the group in which the methylene group constituting the saturated hydrocarbon group of L ^b1 is replaced by an oxygen atom or a carbonyl group include groups represented by any of formulas (b1-1) to (b1-7). It is done. In addition, Formula (b1-1)-Formula (b1-7) have described the right and left according to Formula (B1), and among two bonds represented by *, C (Q ^b1 ) binds to (Q ^b2 )-, and binds to -Y on the right. The same applies to specific examples of the following formulas (b1-1) to (b1-7).

式（ｂ１−１）〜式（ｂ１−７）中、
Ｌ^b2は、単結合又は炭素数１〜２２の２価の飽和炭化水素基を表す。
Ｌ^b3は、単結合又は炭素数１〜１９の２価の飽和炭化水素基を表す。
Ｌ^b4は、炭素数１〜２０の２価の飽和炭化水素基を表す。但しＬ^b3及びＬ^b4の炭素数上限は２０である。
Ｌ^b5は、単結合又は炭素数１〜２２の２価の飽和炭化水素基を表す。
Ｌ^b6は、炭素数１〜２２の２価の飽和炭化水素基を表す。但しＬ^b5及びＬ^b6の合計炭素数の上限は２２である。
Ｌ^b7は、単結合又は炭素数１〜２２の２価の飽和炭化水素基を表す。
Ｌ^b8は、炭素数１〜２３の２価の飽和炭化水素基を表す。但しＬ^b7及びＬ^b8の合計炭素数の上限は２３である。
Ｌ^b9は、単結合又は炭素数１〜１９の２価の飽和炭化水素基を表す。
Ｌ^b10は、炭素数１〜２１の２価の飽和炭化水素基を表す。但しＬ^b9及びＬ^b10の合計炭素数の上限は２１である。
Ｌ^b11及びＬ^b12は、単結合又は炭素数１〜１８の２価の飽和炭化水素基を表す。
Ｌ^b13は、炭素数１〜１９の２価の飽和炭化水素基を表す。但しＬ^b11、Ｌ^b12及びＬ^b13の合計炭素数の上限は１９である。
Ｌ^b14及びＬ^b15は、それぞれ独立に、単結合又は炭素数１〜２０の２価の飽和炭化水素基を表す。
Ｌ^b16は、炭素数１〜２１の２価の飽和炭化水素基を表す。但しＬ^b14、Ｌ^b15及びＬ^b16の合計炭素数の上限は２１である。

In formula (b1-1) to formula (b1-7),
L ^b2 represents a single bond or a divalent saturated hydrocarbon group having 1 to 22 carbon atoms.
L ^b3 represents a single bond or a divalent saturated hydrocarbon group having 1 to 19 carbon atoms.
L ^b4 represents a divalent saturated hydrocarbon group having 1 to 20 carbon atoms. However, the upper limit of the carbon number of L ^b3 and L ^b4 is 20.
L ^b5 represents a single bond or a divalent saturated hydrocarbon group having 1 to 22 carbon atoms.
L ^b6 represents a divalent saturated hydrocarbon group having 1 to 22 carbon atoms. However, the upper limit of the total carbon number of L ^b5 and L ^b6 is 22.
L ^b7 represents a single bond or a divalent saturated hydrocarbon group having 1 to 22 carbon atoms.
L ^b8 represents a divalent saturated hydrocarbon group having 1 to 23 carbon atoms. However, the upper limit of the total carbon number of L ^b7 and L ^b8 is 23.
L ^b9 represents a single bond or a divalent saturated hydrocarbon group having 1 to 19 carbon atoms.
L ^b10 represents a divalent saturated hydrocarbon group having 1 to 21 carbon atoms. However, the upper limit of the total carbon number of L ^b9 and L ^b10 is 21.
L ^b11 and L ^b12 represent a single bond or a divalent saturated hydrocarbon group having 1 to 18 carbon atoms.
L ^b13 represents a divalent saturated hydrocarbon group having 1 to 19 carbon atoms. However, the upper limit of the total carbon number of L ^b11 , L ^b12 and L ^b13 is 19.
L ^b14 and L ^b15 each independently represent a single bond or a divalent saturated hydrocarbon group having 1 to 20 carbon atoms.
L ^b16 represents a divalent saturated hydrocarbon group having 1 to 21 carbon atoms. However, the upper limit of the total carbon number of L ^b14 , L ^b15 and L ^b16 is 21.

Among them, L ^b1 is preferably any one of formula (b1-1) to formula (b1-4), more preferably formula (b1-1) or formula (b1-2), and still more preferably formula (b1-1). And particularly preferably a divalent group represented by the formula (b1-1) in which L ^b2 is a single bond or —CH ₂ —.

Examples of the divalent group represented by the formula (b1-1) include the following.

Examples of the divalent group represented by the formula (b1-2) include the following.

Examples of the divalent group represented by the formula (b1-3) include the following.

Examples of the divalent group represented by the formula (b1-4) include the following.

Examples of the divalent group represented by the formula (b1-5) include the following.

Examples of the divalent group represented by the formula (b1-6) include the following.

Examples of the divalent group represented by the formula (b1-7) include the following.

Specific examples when the hydrogen atom contained in the saturated hydrocarbon group of L ^b1 is substituted with a fluorine atom or a hydroxy group include the following.

Examples of the alicyclic hydrocarbon group represented by Y include groups represented by formulas (Y1) to (Y26).

  Especially, it is preferably a group represented by any one of formulas (Y1) to (Y19), more preferably represented by formula (Y11), formula (Y14), formula (Y15) or formula (Y19). And more preferably a group represented by formula (Y11) or formula (Y14).

Examples of the substituent for the alicyclic hydrocarbon group in Y include a halogen atom, a hydroxy group, an oxo group, an alkyl group having 1 to 12 carbon atoms, a hydroxy group-containing alkyl group having 1 to 12 carbon atoms, and 3 to 3 carbon atoms. 16 alicyclic hydrocarbon groups, alkoxy groups having 1 to 12 carbon atoms, aromatic hydrocarbon groups having 6 to 18 carbon atoms, aralkyl groups having 7 to 21 carbon atoms, acyl groups having 2 to 4 carbon atoms, glycidyloxy Group or — (CH ₂ ) _j2 —O—CO—R ^b1 group (wherein R ^b1 is an alkyl group having 1 to 16 carbon atoms, an alicyclic hydrocarbon group having 3 to 16 carbon atoms, or 6 to 6 carbon atoms). 18 represents an aromatic hydrocarbon group, and j2 represents an integer of 0 to 4.

Examples of the halogen atom include fluorine, chlorine, bromine and iodine atoms.
Examples of the hydroxy group-containing alkyl group include a hydroxymethyl group and a hydroxyethyl group.
Examples of the alkoxy group include methoxy group, ethoxy group, propoxy group, butoxy group, pentyloxy group, hexyloxy group, heptyloxy group, octyloxy group, decyloxy group and dodecyloxy group.
Examples of the aromatic hydrocarbon group include phenyl group, naphthyl group, anthryl group, p-methylphenyl group, p-tert-butylphenyl group, p-adamantylphenyl group; tolyl group, xylyl group, cumenyl group, mesityl group. , Aryl groups such as biphenyl group, phenanthryl group, 2,6-diethylphenyl group, 2-methyl-6-ethylphenyl, and the like.
Examples of the aralkyl group include benzyl group, phenethyl group, phenylpropyl group, naphthylmethyl group, and naphthylethyl group.
Examples of the acyl group include an acetyl group, a propionyl group, and a butyryl group.

Examples of Y include the following.

  Y is preferably an alicyclic hydrocarbon group having 3 to 18 carbon atoms which may have a substituent, more preferably a substituent (for example, an oxo group, a hydroxy group, etc.). A good adamantyl group, more preferably an adamantyl group, a hydroxyadamantyl group or an oxoadamantyl group.

The sulfonate anion in the salt (B1) is preferably an anion represented by the formula (b1-1-1) to the formula (b1-1-9). In the following formulas, the definitions of the symbols have the same meaning as described above, and R ^b2 and R ^b3 each independently represent an alkyl group having 1 to 4 carbon atoms (preferably a methyl group).
Specific examples of the sulfonate anion in the salt (B1) include anions described in JP 2010-204646 A.

Examples of the organic cation (Z1 ⁺ ) contained in the salt (B1) include an organic onium cation such as an organic sulfonium cation, an organic iodonium cation, an organic ammonium cation, a benzothiazolium cation, and an organic phosphonium cation. It is an organic sulfonium cation or an organic iodonium cation, more preferably an arylsulfonium cation, and still more preferably the same as the cation represented by any one of the formulas (b2-1) to (b2-4) described above. Is.

  Examples of the salt (B1) include salts represented by formulas (B1-1) to (B1-20), respectively. Among them, those containing an arylsulfonium cation are preferable. Formula (B1-1), Formula (B1-2), Formula (B1-3), Formula (B1-6), Formula (B1-7), Formula (B1-11) ), Formula (B1-12), Formula (B1-13), Formula (B1-14), Formula (B1-18), Formula (B1-19), or Formula (B1-20). More preferred are salts.

When the resist composition contains only the acid generator (II) as the acid generator, the content of the acid generator (II) is preferably 1 part by mass or more with respect to 100 parts by mass of the resin (A) ( More preferably 3 parts by mass or more), preferably 30 parts by mass or less (more preferably 25 parts by mass or less).
When the resist composition contains the acid generator (II) and the acid generator (B), the total content of the acid generator (II) and the acid generator (B) is 100 masses of the resin (A). The amount is preferably 1 part by mass or more (more preferably 3 parts by mass or more), preferably 40 parts by mass or less (more preferably 35 parts by mass or less).
The content ratio (mass ratio) between the acid generator (II) and the acid generator (B) is, for example, 5:95 to 95: 5, preferably 10:90 to 90:10, and more preferably 15: 85-85: 15.

<Solvent (E)>
The content of the solvent (E) is, for example, 90% by mass or more in the resist composition, preferably 92% by mass or more, more preferably 94% by mass or more, for example 99.9% by mass or less, preferably 99% by mass or less. It is. The content rate of a solvent (E) can be measured by well-known analysis means, such as a liquid chromatography or a gas chromatography, for example.

  Examples of the solvent (E) include glycol ether esters such as ethyl cellosolve acetate, methyl cellosolve acetate and propylene glycol monomethyl ether acetate; glycol ethers such as propylene glycol monomethyl ether; ethyl lactate, butyl acetate, amyl acetate and And esters such as ethyl pyruvate; ketones such as acetone, methyl isobutyl ketone, 2-heptanone and cyclohexanone; cyclic esters such as γ-butyrolactone; A solvent may contain individually by 1 type and may contain 2 or more types.

<Basic compound (C)>
The basic compound (C) is preferably a basic nitrogen-containing organic compound, and examples thereof include amines and ammonium salts. Examples of amines include aliphatic amines and aromatic amines. Aliphatic amines include primary amines, secondary amines and tertiary amines. The basic compound (C) is preferably a compound represented by any one of the formulas (C1) to (C8) and (C1-1), more preferably represented by the formula (C1-1). The compound which is made is mentioned.

［式（Ｃ１）中、Ｒ^c1、Ｒ^c2及びＲ^c3は、それぞれ独立に、水素原子、炭素数１〜６のアルキル基、炭素数５〜１０の脂環式炭化水素基又は炭素数６〜１０の芳香族炭化水素基を表し、該アルキル基及び該脂環式炭化水素基に含まれる水素原子は、ヒドロキシ基、アミノ基又は炭素数１〜６のアルコキシ基で置換されていてもよく、該芳香族炭化水素基に含まれる水素原子は、炭素数１〜６のアルキル基、炭素数１〜６のアルコキシ基、炭素数５〜１０の脂環式炭化水素又は炭素数６〜１０の芳香族炭化水素基で置換されていてもよい。］

[In formula (C1), R ^c1 , R ^c2 and R ^c3 each independently represent a hydrogen atom, an alkyl group having 1 to 6 carbon atoms, an alicyclic hydrocarbon group having 5 to 10 carbon atoms, or 6 to 6 carbon atoms. 10 represents an aromatic hydrocarbon group, and the hydrogen atom contained in the alkyl group and the alicyclic hydrocarbon group may be substituted with a hydroxy group, an amino group or an alkoxy group having 1 to 6 carbon atoms, The hydrogen atom contained in the aromatic hydrocarbon group is an alkyl group having 1 to 6 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an alicyclic hydrocarbon having 5 to 10 carbon atoms, or an aromatic group having 6 to 10 carbon atoms. It may be substituted with a group hydrocarbon group. ]

［式（Ｃ１−１）中、Ｒ^c2及びＲ^c3は、上記と同じ意味を表す。
Ｒ^c4は、炭素数１〜６のアルキル基、炭素数１〜６のアルコキシ基、炭素数５〜１０の脂環式炭化水素又は炭素数６〜１０の芳香族炭化水素基を表す。
ｍ３は０〜３の整数を表し、ｍ３が２以上のとき、複数のＲ^c4は互いに同一又は相異なる。］

[In Formula (C1-1), R ^c2 and R ^c3 represent the same meaning as described above.
R ^c4 represents an alkyl group having 1 to 6 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an alicyclic hydrocarbon having 5 to 10 carbon atoms, or an aromatic hydrocarbon group having 6 to 10 carbon atoms.
m3 represents an integer of 0 to 3, and when m3 is 2 or more, the plurality of R ^c4 are the same or different from each other. ]

［式（Ｃ２）、式（Ｃ３）及び式（Ｃ４）中、Ｒ^c5、Ｒ^c6、Ｒ^c7及びＲ^c8は、それぞれ独立に、Ｒ^c1と同じ意味を表す。
Ｒ^c9は、炭素数１〜６のアルキル基、炭素数３〜６の脂環式炭化水素基又は炭素数２〜６のアルカノイル基を表す。
ｎ３は０〜８の整数を表し、ｎ３が２以上のとき、複数のＲ^c9は互いに同一又は相異なる。］

[In Formula (C2), Formula (C3) and Formula (C4), R ^c5 , R ^c6 , R ^c7 and R ^c8 each independently represent the same meaning as R ^c1 .
R ^c9 represents an alkyl group having 1 to 6 carbon atoms, an alicyclic hydrocarbon group having 3 to 6 carbon atoms, or an alkanoyl group having 2 to 6 carbon atoms.
n3 represents an integer of 0 to 8, and when n3 is 2 or more, the plurality of R ^c9 are the same or different from each other. ]

［式（Ｃ５）及び式（Ｃ６）中、Ｒ^c10、Ｒ^c11、Ｒ^c12、Ｒ^c13及びＲ^c16は、それぞれ独立に、Ｒ^c1と同じ意味を表す。
Ｒ^c14、Ｒ^c15及びＲ^c17は、それぞれ独立に、Ｒ^c4と同じ意味を表す。
ｏ３及びｐ３は、それぞれ独立に０〜３の整数を表し、ｏ３が２以上であるとき、複数のＲ^c14は互いに同一又は相異なり、ｐ３が２以上であるとき、複数のＲ^c15は互いに同一又は相異なる。
Ｌ^c1は、炭素数１〜６のアルカンジイル基、−ＣＯ−、−Ｃ（＝ＮＨ）−、−Ｓ−又はこれらを組合せた２価の基を表す。］

[In Formula (C5) and Formula (C6), R ^c10 , R ^c11 , R ^c12 , R ^c13 and R ^c16 each independently represent the same meaning as R ^c1 .
R ^c14 , R ^c15 and R ^c17 each independently represent the same meaning as R ^c4 .
o3 and p3 each independently represent an integer of 0 to 3, and when o3 is 2 or more, the plurality of R ^c14 are the same or different from each other, and when p3 is 2 or more, the plurality of R ^c15 are the same as each other Or different.
L ^c1 represents an alkanediyl group having 1 to 6 carbon atoms, —CO—, —C (═NH) —, —S—, or a divalent group obtained by combining these. ]

［式（Ｃ７）及び式（Ｃ８）中、Ｒ^c18、Ｒ^c19及びＲ^c20は、それぞれ独立に、Ｒ^c4と同じ意味を表す。
ｑ３、ｒ３及びｓ３は、それぞれ独立に０〜３の整数を表し、ｑ３が２以上であるとき、複数のＲ^c18は互いに同一又は相異なり、ｒ３が２以上であるとき、複数のＲ^c19は互いに同一又は相異なり、ｓ３が２以上であるとき、複数のＲ^c20は互いに同一又は相異なる。
Ｌ^c2は、単結合又は炭素数１〜６のアルカンジイル基、−ＣＯ−、−Ｃ（＝ＮＨ）−、−Ｓ−又はこれらを組合せた２価の基を表す。］

Wherein (C7) and formula ^{(C8), R c18, R} c19 and R ^c20 in each occurrence independently represent the same meaning as R ^c4.
q3, r3 and s3 each independently represent an integer of 0 to 3, and when q3 is 2 or more, the plurality of R ^c18 are the same or different from each other, and when r3 is 2 or more, the plurality of R ^c19 are When the same or different from each other and s3 is 2 or more, the plurality of R ^c20 are the same or different from each other.
L ^c2 represents a single bond or an alkanediyl group having 1 to 6 carbon atoms, —CO—, —C (═NH) —, —S—, or a divalent group obtained by combining these. ]

In formula (C1) to formula (C8) and formula (C1-1), the alkyl group, alicyclic hydrocarbon group, aromatic hydrocarbon group, alkoxy group, alkanediyl group are the same as those described above. Is mentioned.
Examples of the alkanoyl group include acetyl group, 2-methylacetyl group, 2,2-dimethylacetyl group, propionyl group, butyryl group, isobutyryl group, pentanoyl group, and 2,2-dimethylpropionyl group.

  Examples of the compound represented by the formula (C1) include 1-naphthylamine, 2-naphthylamine, aniline, diisopropylaniline, 2-, 3- or 4-methylaniline, 4-nitroaniline, N-methylaniline, N, N- Dimethylaniline, diphenylamine, hexylamine, heptylamine, octylamine, nonylamine, decylamine, dibutylamine, dipentylamine, dihexylamine, diheptylamine, dioctylamine, dinonylamine, didecylamine, triethylamine, trimethylamine, tripropylamine, tributylamine, tri Pentylamine, trihexylamine, triheptylamine, trioctylamine, trinonylamine, tridecylamine, methyldibutylamine, methyldipentylamine, methyl Hexylamine, methyldicyclohexylamine, methyldiheptylamine, methyldioctylamine, methyldinonylamine, methyldidecylamine, ethyldibutylamine, ethyldipentylamine, ethyldihexylamine, ethyldiheptylamine, ethyldioctylamine, ethyldinonyl Amine, ethyldidecylamine, dicyclohexylmethylamine, tris [2- (2-methoxyethoxy) ethyl] amine, triisopropanolamine, ethylenediamine, tetramethylenediamine, hexamethylenediamine, 4,4′-diamino-1,2- Examples include diphenylethane, 4,4′-diamino-3,3′-dimethyldiphenylmethane, 4,4′-diamino-3,3′-diethyldiphenylmethane, and preferably diisopropyl. Piruanirin. Particularly preferred include 2,6-diisopropylaniline.

Examples of the compound represented by the formula (C2) include piperazine.
Examples of the compound represented by the formula (C3) include morpholine.
Examples of the compound represented by the formula (C4) include piperidine and hindered amine compounds having a piperidine skeleton described in JP-A No. 11-52575.
Examples of the compound represented by the formula (C5) include 2,2′-methylenebisaniline.
Examples of the compound represented by the formula (C6) include imidazole and 4-methylimidazole.
Examples of the compound represented by the formula (C7) include pyridine and 4-methylpyridine.
Examples of the compound represented by the formula (C8) include 1,2-di (2-pyridyl) ethane, 1,2-di (4-pyridyl) ethane, 1,2-di (2-pyridyl) ethene, 1, 2-di (4-pyridyl) ethene, 1,3-di (4-pyridyl) propane, 1,2-di (4-pyridyloxy) ethane, di (2-pyridyl) ketone, 4,4′-dipyridyl sulfide 4,4′-dipyridyl disulfide, 2,2′-dipyridylamine, 2,2′-dipiconylamine, bipyridine and the like.

  As ammonium salts, tetramethylammonium hydroxide, tetraisopropylammonium hydroxide, tetrabutylammonium hydroxide, tetrahexylammonium hydroxide, tetraoctylammonium hydroxide, phenyltrimethylammonium hydroxide, 3- (trifluoromethyl) phenyltrimethyl Ammonium hydroxide, tetra-n-butylammonium salicylate, choline and the like can be mentioned.

  The content of the basic compound (C) is preferably about 0.01 to 5% by mass, more preferably about 0.01 to 3% by mass, and particularly preferably in the solid content of the resist composition. It is about 0.01-1 mass%.

<Other components (hereinafter sometimes referred to as “other components (F)”)>
The resist composition may contain other components (F) as necessary. The other component (F) is not particularly limited, and additives known in the resist field, such as sensitizers, dissolution inhibitors, surfactants, stabilizers, dyes and the like can be used.

<Preparation of resist composition>
The resist composition includes a resin (A) and an acid generator (II), and a solvent (E), an acid generator (B), a basic compound (C) and other components (F) used as necessary. Can be prepared by mixing. The mixing order is arbitrary and is not particularly limited. The temperature at the time of mixing can select the suitable temperature range from the range of 10-40 degreeC according to the solubility with respect to the solvent (E), such as a kind, etc. of resin. An appropriate mixing time can be selected from 0.5 to 24 hours depending on the mixing temperature. The mixing means is not particularly limited, and stirring and mixing can be used.
After mixing each component, it is preferable to filter using a filter having a pore size of about 0.003 to 0.2 μm.

<Method for producing resist pattern>
The method for producing a resist pattern of the present invention comprises:
(1) The process of apply | coating the resist composition of this invention on a board | substrate,
(2) The process of drying the composition after application | coating and forming a composition layer,
(3) a step of exposing the composition layer,
(4) The process of heating the composition layer after exposure, (5) The process of developing the composition layer after a heating is included.

  Application of the resist composition onto the substrate can be performed by a commonly used apparatus such as a spin coater. Examples of the substrate include an inorganic substrate such as a silicon wafer. Before applying the resist composition, the substrate may be washed or an antireflection film or the like may be formed.

The composition layer is formed by drying the composition after application. Drying is performed, for example, by evaporating the solvent using a heating device such as a hot plate (so-called pre-baking), or using a decompression device. The heating temperature is preferably 50 to 200 ° C., for example, and the heating time is preferably 10 to 180 seconds, for example. The pressure during drying under reduced pressure is preferably about 1 to 1.0 × 10 ⁵ Pa.

The obtained composition layer is usually exposed using an exposure machine. The exposure machine may be an immersion exposure machine. At this time, exposure is usually performed through a mask corresponding to a required pattern. Exposure light sources include those that emit laser light in the ultraviolet region such as KrF excimer laser (wavelength 248 nm), ArF excimer laser (wavelength 193 nm), F ₂ excimer laser (wavelength 157 nm), solid-state laser light source (YAG or semiconductor laser) Etc.) using various types of laser light such as those that convert the wavelength of laser light from the laser to emit harmonic laser light in the far ultraviolet region or vacuum ultraviolet region, those that irradiate an electron beam or extreme ultraviolet light (EUV), etc. it can.

  The composition layer after exposure is subjected to heat treatment (so-called post-exposure baking) in order to promote the deprotection group reaction of the resin (A). As heating temperature, it is about 50-200 degreeC normally, Preferably it is about 70-150 degreeC.

  The heated composition layer is usually developed using a developer using a developing device. Examples of the developing method include a dipping method, a paddle method, a spray method, and a dynamic dispensing method. The development temperature is preferably 5 to 60 ° C., and the development time is preferably 5 to 300 seconds.

When producing a positive resist pattern from the resist composition of the present invention, an alkaline developer is used as the developer. The alkaline developer may be various alkaline aqueous solutions used in this field. Examples thereof include an aqueous solution of tetramethylammonium hydroxide and (2-hydroxyethyl) trimethylammonium hydroxide (commonly called choline). The alkali developer may contain a surfactant.
It is preferable to wash the resist pattern with ultrapure water after development, and then remove the water remaining on the substrate and the pattern.

In the case of producing a negative resist pattern from the resist composition of the present invention, a developer containing an organic solvent as a developer (hereinafter sometimes referred to as “organic developer”) is used.
Organic solvents contained in the organic developer include ketone solvents such as 2-hexanone and 2-heptanone; glycol ether ester solvents such as propylene glycol monomethyl ether acetate; ester solvents such as butyl acetate; glycols such as propylene glycol monomethyl ether Examples include ether solvents; amide solvents such as N, N-dimethylacetamide; aromatic hydrocarbon solvents such as anisole.
In the organic developer, the content of the organic solvent is preferably 90% by mass or more and 100% by mass or less, more preferably 95% by mass or more and 100% by mass or less, and still more preferably only the organic solvent.
Among them, the organic developer is preferably a developer containing butyl acetate and / or 2-heptanone. In the organic developer, the total content of butyl acetate and 2-heptanone is preferably 50% by mass to 100% by mass, more preferably 90% by mass to 100% by mass, and substantially butyl acetate and / or 2 -More preferred is heptanone alone.
The organic developer may contain a surfactant. The organic developer may contain a trace amount of water.
At the time of development, the development may be stopped by substituting a solvent of a different type from the organic developer.

It is preferable to wash the developed resist pattern with a rinse solution. The rinsing liquid is not particularly limited as long as it does not dissolve the resist pattern, and a solution containing a general organic solvent can be used, and an alcohol solvent or an ester solvent is preferable.
After the cleaning, it is preferable to remove the rinse solution remaining on the substrate and the pattern.

<Application>
The resist composition of the present invention is a resist composition for KrF excimer laser exposure, a resist composition for ArF excimer laser exposure, a resist composition for electron beam (EB) exposure, or a resist composition for EUV exposure, particularly a liquid. It is suitable as a resist composition for immersion exposure and useful for fine processing of semiconductors.

The present invention will be described more specifically with reference to examples. In the examples, “%” and “parts” representing the content or amount used are based on mass unless otherwise specified.
The structure of the compound was confirmed by MASS (LC: Agilent 1100 type, MASS: Agilent LC / MSD type or LC / MSD TOF type).
The weight average molecular weight is a value determined by gel permeation chromatography under the following conditions.
Apparatus: HLC-8120GPC type (manufactured by Tosoh Corporation)
Column: TSKgel Multipore HXL-M x 3 + guardcolumn (manufactured by Tosoh Corporation)
Eluent: Tetrahydrofuran Flow rate: 1.0 mL / min
Detector: RI detector Column temperature: 40 ° C
Injection volume: 100 μl
Molecular weight standard: Standard polystyrene (manufactured by Tosoh Corporation)

式（Ｉ−２−１）で表される化合物３３．４８部、ジシクロヘキシルカルボジイミド２３．９３部及び塩化メチレン４０部を、反応器に仕込み、混合した。得られた混合物を０℃程度まで冷却した後、式（Ｉ−２−２）で表される化合物１８．８３部を加え、０℃程度のまま、１時間攪拌した。２３℃まで昇温し、さらに３０分間攪拌した。不溶物をろ過して除去し、得られたろ液を濃縮して、式（Ｉ−２−３）で表される化合物４４．２８部を得た。 Synthesis Example 1 (Synthesis of monomer (I-2))

33.48 parts of a compound represented by the formula (I-2-1), 23.93 parts of dicyclohexylcarbodiimide and 40 parts of methylene chloride were charged into a reactor and mixed. After cooling the obtained mixture to about 0 ° C., 18.83 parts of the compound represented by the formula (I-2-2) was added, and the mixture was stirred for about 1 hour while maintaining about 0 ° C. The temperature was raised to 23 ° C., and the mixture was further stirred for 30 minutes. Insoluble matter was removed by filtration, and the obtained filtrate was concentrated to obtain 44.28 parts of a compound represented by the formula (I-2-3).

得られた式（Ｉ−２−３）で表される化合物１９．４２部、式（Ｉ−２−４）で表される化合物１８．２２部及びアセトニトリル２００部を、反応器に仕込み、混合した。得られた混合物を５０℃で３時間攪拌した。得られた混合物を濃縮し、クロロホルム３００部及びイオン交換水１５０部を加えた後、分液操作により、有機層を回収した。回収された有機層をイオン交換水１５０部で水洗し、有機層を濃縮した。濃縮物を、カラム分取（カラム分取条件 固定相：メルク社製シリカゲル６０−２００メッシュ 展開溶媒：酢酸エチル）することにより、式（Ｉ−２）で表される化合物１２．８９部を得た。
ＭＳ（質量分析）：３０８．１（分子イオンピーク）

The reactor was charged with 19.42 parts of the compound represented by the formula (I-2-3), 18.22 parts of the compound represented by the formula (I-2-4), and 200 parts of acetonitrile. did. The resulting mixture was stirred at 50 ° C. for 3 hours. The obtained mixture was concentrated, 300 parts of chloroform and 150 parts of ion-exchanged water were added, and then the organic layer was recovered by a liquid separation operation. The recovered organic layer was washed with 150 parts of ion exchange water, and the organic layer was concentrated. The concentrate is subjected to column fractionation (column fractionation conditions stationary phase: silica gel 60-200 mesh manufactured by Merck & Co., Ltd. developing solvent: ethyl acetate) to obtain 12.89 parts of a compound represented by the formula (I-2). It was.
MS (mass spectrometry): 308.1 (molecular ion peak)

式（Ｉ−１−１）で表される化合物４．４８部、Ｎ−メチルピロリジン７．３２部、メチルイソブチルケトン３０．０部を反応器に仕込み、攪拌下、メタクリロイルクロリド５．１２部を添加し、６０℃で２４時間攪拌した。その後、反応混合物にイオン交換水３０部、メチルイソブチルケトン３０部を添加、攪拌後、分液して水層を除去した。分液後の有機層にイオン交換水を加え、攪拌・静置・分液といった水洗操作を７回行った。回収された有機層を濃縮後、カラム分取（固定床：メルク製シリカゲル６０−２００メッシュ、展開溶媒：酢酸エチル単独）することにより、式（Ｉ−１）で表される化合物３．２４部を得た。
ＭＡＳＳ：２５０．１ Synthesis Example 2 (Synthesis of Monomer (I-1))

4.48 parts of a compound represented by the formula (I-1-1), 7.32 parts of N-methylpyrrolidine, and 30.0 parts of methyl isobutyl ketone were charged into a reactor, and 5.12 parts of methacryloyl chloride was added with stirring. The mixture was added and stirred at 60 ° C. for 24 hours. Thereafter, 30 parts of ion-exchanged water and 30 parts of methyl isobutyl ketone were added to the reaction mixture, and after stirring, liquid separation was performed to remove the aqueous layer. Ion exchanged water was added to the organic layer after the separation, and water washing operations such as stirring, standing, and separation were performed 7 times. The collected organic layer is concentrated, and then fractionated by a column (fixed bed: 60-200 mesh of Merck silica gel, developing solvent: ethyl acetate alone) to give 3.24 parts of the compound represented by the formula (I-1). Got.
MASS: 250.1

メタクリル酸２．２２部及びメチルイソブチルケトン３０部を反応器に仕込み、２３℃で３０分間攪拌した後、炭酸カリウム１．９６部及びヨウ化カリウム０．５９部を添加し、８０℃に昇温した。攪拌下、得られた混合物に、式（Ｉ−６−１）で表される化合物５．６７部を添加し、８０℃で４時間攪拌した。その後、反応マスにイオン交換水３０部、メチルイソブチルケトン３０部を添加、攪拌後、分液して水層を除去した。分液後の有機層にイオン交換水を加え、攪拌・静置・分液といった水洗操作を５回行った。回収された有機層を濃縮後、カラム分取（固定床：メルク製シリカゲル６０−２００メッシュ、展開溶媒：酢酸エチル単独）することにより、式（Ｉ−６）で表される化合物４．４５部を得た。
ＭＡＳＳ：２８０．１ Synthesis Example 3 (Synthesis of Monomer (I-6))

A reactor was charged with 2.22 parts of methacrylic acid and 30 parts of methyl isobutyl ketone, stirred at 23 ° C. for 30 minutes, 1.96 parts of potassium carbonate and 0.59 parts of potassium iodide were added, and the temperature was raised to 80 ° C. did. Under stirring, 5.67 parts of the compound represented by the formula (I-6-1) was added to the obtained mixture, and the mixture was stirred at 80 ° C. for 4 hours. Thereafter, 30 parts of ion-exchanged water and 30 parts of methyl isobutyl ketone were added to the reaction mass, and after stirring, liquid separation was performed to remove the aqueous layer. Ion exchanged water was added to the organic layer after the separation, and water washing operations such as stirring, standing, and separation were performed 5 times. The collected organic layer is concentrated and then subjected to column fractionation (fixed bed: Merck silica gel 60-200 mesh, developing solvent: ethyl acetate alone), whereby 4.45 parts of the compound represented by the formula (I-6) Got.
MASS: 280.1

式（ＩＩ１−ａ）で表される塩を、特開２００８−７４０９号公報に記載された方法で合成した。式（ＩＩ１−ａ）で表される塩１０．００部、ジメチルホルミアミド５０．００部、式（ＩＩ１−ｂ）で表される化合物４．１８部及びｐ−トルエンスルホン酸０．７０部を仕込み、１００℃で２時間攪拌した。得られた反応液に、クロロホルム２００部及びイオン交換水５０部を仕込み、３０分間攪拌し、分液した。この水洗操作を３回繰り返した。回収された有機層を濃縮し、濃縮物をカラム（メルク シリカゲル６０−２００メッシュ 展開溶媒：クロロホルム／メタノール＝５／１）分取することにより、式（ＩＩ１−ｃ）で表される塩２．４３部を得た。 Synthesis Example 4: [Synthesis of salt represented by formula (II-1)]

A salt represented by the formula (II1-a) was synthesized by the method described in JP-A-2008-7409. 10.00 parts of salt represented by formula (II1-a), 50.00 parts of dimethylformamide, 4.18 parts of compound represented by formula (II1-b) and 0.70 parts of p-toluenesulfonic acid And stirred at 100 ° C. for 2 hours. To the obtained reaction solution, 200 parts of chloroform and 50 parts of ion-exchanged water were added, stirred for 30 minutes, and separated. This washing operation was repeated three times. The collected organic layer is concentrated, and the concentrate is fractionated in a column (Merck silica gel 60-200 mesh developing solvent: chloroform / methanol = 5/1) to give a salt represented by the formula (II1-c) 2. 43 parts were obtained.

式（ＩＩ１−ｄ）で表される化合物０．６３部及びクロロホルム１０部を仕込み、２３℃で３０分間攪拌し、式（ＩＩ１−ｅ）で表される化合物０．５５部を仕込み、６０℃で１時間攪拌した。得られた反応物を２３℃まで冷却し、ろ過することにより、式（ＩＩ１−ｆ）で表される化合物を含む溶液を得た。式（ＩＩ１−ｆ）で表される化合物を含む溶液に、式（ＩＩ１−ｃ）で表される塩２．１０部を仕込み、６０℃で６時間攪拌した。得られた反応物に、クロロホルム５０部及びイオン交換水２０部を仕込み、攪拌、分液を行った。水洗を５回行った。得られた有機層を濃縮し、得られた濃縮物をアセトニトリル２０部に溶解し、濃縮した。得られた濃縮物に、ｔｅｒｔ−ブチルメチルエーテル３０部を加えて攪拌し、上澄液を除去した。得られた残渣をアセトニトリルに溶解し、濃縮することにより、式（ＩＩ−１）で表される塩１．６９部を得た。

0.63 parts of the compound represented by the formula (II1-d) and 10 parts of chloroform were charged, stirred at 23 ° C. for 30 minutes, 0.55 parts of the compound represented by the formula (II1-e) were charged, and 60 ° C. For 1 hour. The obtained reaction product was cooled to 23 ° C. and filtered to obtain a solution containing a compound represented by the formula (II1-f). A solution containing the compound represented by the formula (II1-f) was charged with 2.10 parts of the salt represented by the formula (II1-c) and stirred at 60 ° C. for 6 hours. To the obtained reaction product, 50 parts of chloroform and 20 parts of ion-exchanged water were charged, stirred and separated. Water washing was performed 5 times. The obtained organic layer was concentrated, and the resulting concentrate was dissolved in 20 parts of acetonitrile and concentrated. To the obtained concentrate, 30 parts of tert-butyl methyl ether was added and stirred, and the supernatant was removed. The obtained residue was dissolved in acetonitrile and concentrated to obtain 1.69 parts of the salt represented by the formula (II-1).

MS (ESI (+) Spectrum): M ⁺ 263.1
MS (ESI (-) Spectrum): M ^- 573.1

式（Ｂ１−５−ａ）で表される塩５０．４９部及びクロロホルム２５２．４４部を反応器に仕込み、２３℃で３０分間攪拌した後、式（Ｂ１−５−ｂ）で表される化合物１６．２７部を滴下し、２３℃で１時間攪拌することにより、式（Ｂ１−５−ｃ）で表される塩を含む溶液を得た。得られた式（Ｂ１−５−ｃ）で表される塩を含む溶液に、式（Ｂ１−５−ｄ）で表される塩４８．８０部及びイオン交換水８４．１５部を添加し、２３℃で１２時間攪拌した。得られた反応液が２層に分離していたので、クロロホルム層を分液して取り出し、更に、該クロロホルム層にイオン交換水８４．１５部を添加し、水洗した。この操作を５回繰り返した。得られたクロロホルム層に、活性炭３．８８部を添加攪拌した後、ろ過した。回収されたろ液を濃縮し、得られた残渣に、アセトニトリル１２５．８７部を添加攪拌後、濃縮した。得られた残渣に、アセトニトリル２０．６２部及びｔｅｒｔ−ブチルメチルエーテル３０９．３０部を加えて２３℃で３０分間攪拌した後、上澄み液を除去した後、濃縮した。得られた残渣に、ｎ−ヘプタン２００部を添加、２３℃で３０分間攪拌した後、ろ過することにより、式（Ｂ１−５）で表される塩６１．５４部を得た。
ＭＡＳＳ（ＥＳＩ（＋）Ｓｐｅｃｔｒｕｍ）：Ｍ⁺ ３７５．２
ＭＡＳＳ（ＥＳＩ（−）Ｓｐｅｃｔｒｕｍ）：Ｍ^- ３３９．１ Synthesis Example 5: Synthesis of salt represented by formula (B1-5)

50.49 parts of the salt represented by the formula (B1-5-a) and 252.44 parts of chloroform are charged into a reactor, stirred at 23 ° C. for 30 minutes, and then represented by the formula (B1-5-b). 16.27 parts of the compound was added dropwise and stirred at 23 ° C. for 1 hour to obtain a solution containing a salt represented by the formula (B1-5-c). To the obtained solution containing the salt represented by the formula (B1-5-c), 48.80 parts of the salt represented by the formula (B1-5-d) and 84.15 parts of ion-exchanged water are added, The mixture was stirred at 23 ° C. for 12 hours. Since the resulting reaction solution was separated into two layers, the chloroform layer was separated and removed, and 84.15 parts of ion-exchanged water was further added to the chloroform layer and washed with water. This operation was repeated 5 times. To the obtained chloroform layer, 3.88 parts of activated carbon was added and stirred, followed by filtration. The collected filtrate was concentrated, 125.87 parts of acetonitrile was added to the resulting residue, and the mixture was stirred and concentrated. To the obtained residue, 20.62 parts of acetonitrile and 309.30 parts of tert-butyl methyl ether were added and stirred at 23 ° C. for 30 minutes, and then the supernatant was removed and concentrated. To the obtained residue, 200 parts of n-heptane was added, stirred at 23 ° C. for 30 minutes, and then filtered to obtain 61.54 parts of a salt represented by the formula (B1-5).
MASS (ESI (+) Spectrum): M ⁺ 375.2
MASS (ESI (−) Spectrum): M ⁻ 339.1

以下、これらのモノマーをその式番号に応じて、「モノマー（ａ１−１−３）」等という。 Synthesis of Resin (A) Compounds (monomers) used in the synthesis of resin (A) are shown below.

Hereinafter, these monomers are referred to as “monomer (a1-1-3)” or the like according to the formula number.

Synthesis Example 6 [Synthesis of Resin A1]
As the monomer, the monomer (a1-1-2), the monomer (a1-2-3), the monomer (a2-1-1), the monomer (a3-1-1) and the monomer (I-2) The ratio [monomer (a1-1-2): monomer (a1-2-3): monomer (a2-1-1): monomer (a3-1-1): monomer (I-2)] is 32: 7: It mixed so that it might become 8:43:10, and 1.5 mass times dioxane of the total monomer amount was added, and it was set as the solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was dissolved again in dioxane, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by two reprecipitation operations of filtering the resin, and a weight average molecular weight of 7.6. A × 10 ³ resin A1 (copolymer) was obtained in a yield of 80%. This resin A1 has the following structural units.

Synthesis Example 7 [Synthesis of Resin A2]
As the monomer, the monomer (a1-1-3), the monomer (a1-2-9), the monomer (a2-1-3), the monomer (a3-2-3) and the monomer (I-2) The ratio [monomer (a1-1-3): monomer (a1-2-9): monomer (a2-1-3): monomer (a3-2-3): monomer (I-2)] is 45:14: It mixed so that it might become 2.5: 22.5: 16, and 1.5 mass times dioxane of the total monomer amount was added, and it was set as the solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 73 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was dissolved again in dioxane, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by two reprecipitation operations of filtering the resin, and a weight average molecular weight of 8.8. A × 10 ³ resin A2 (copolymer) was obtained with a yield of 71%. This resin A2 has the following structural units.

Synthesis Example 8 [Synthesis of Resin A3]
As monomers, monomer (a1-1-3), monomer (a1-2-9), monomer (a2-1-3), monomer (a3-2-3), monomer (a3-1-1) and monomer ( I-2) and its molar ratio [monomer (a1-1-3): monomer (a1-2-9): monomer (a2-1-3): monomer (a3-2-3): monomer (a3 -1-1): monomer (I-2)] is 45: 14: 2.5: 17.5: 5: 16, and 1.5 mass times dioxane of the total monomer amount is added. It was set as the solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was dissolved again in dioxane, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by two reprecipitation operations of filtering the resin, and a weight average molecular weight of 8.3. A × 10 ³ resin A3 (copolymer) was obtained in a yield of 69%. This resin A3 has the following structural units.

Synthesis Example 9 [Synthesis of Resin A4]
As the monomer, the monomer (a1-1-3), the monomer (a1-5-1), the monomer (a2-1-3), the monomer (a3-2-3) and the monomer (I-2) The ratio [monomer (a1-1-3): monomer (a1-5-1): monomer (a2-1-3): monomer (a3-2-3): monomer (I-2)] is 45:14: It mixed so that it might become 2.5: 22.5: 16, and the propylene glycol monomethyl ether acetate of 1.5 mass times the total monomer amount was added, and it was set as the solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in propylene glycol monomethyl ether acetate, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by reprecipitation operation of filtering the resin twice. Resin A4 (copolymer) having a molecular weight of 8.3 × 10 ³ was obtained in a yield of 63%. This resin A4 has the following structural units.

Synthesis Example 10 [Synthesis of Resin A5]
As the monomer, the monomer (a1-1-2), the monomer (a1-5-1), the monomer (a2-1-1), the monomer (a3-1-1) and the monomer (I-2) The ratio [monomer (a1-1-2): monomer (a1-5-1): monomer (a2-1-1): monomer (a3-1-1): monomer (I-2)] is 32: 7: It mixed so that it might become 8:43:10, and the propylene glycol monomethyl ether acetate of 1.5 mass times of the total monomer amount was added, and it was set as the solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in propylene glycol monomethyl ether acetate, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by reprecipitation operation of filtering the resin twice. Resin A5 (copolymer) having a molecular weight of 7.8 × 10 ³ was obtained in a yield of 80%. This resin A5 has the following structural units.

Synthesis Example 11 [Synthesis of Resin A6]
As the monomer, monomer (a1-1-3), monomer (a1-5-1), monomer (a2-1-3), monomer (a3-2-3) and monomer (I-1) were used, The ratio [monomer (a1-1-3): monomer (a1-5-1): monomer (a2-1-3): monomer (a3-2-3): monomer (I-1)] is 45:14: It mixed so that it might become 2.5: 22.5: 16, and the propylene glycol monomethyl ether acetate of 1.5 mass times the total monomer amount was added, and it was set as the solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in propylene glycol monomethyl ether acetate, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by reprecipitation operation of filtering the resin twice. Resin A6 (copolymer) having a molecular weight of 8.0 × 10 ³ was obtained in a yield of 63%. This resin A6 has the following structural units.

Synthesis Example 12 [Synthesis of Resin A7]
As the monomer, the monomer (a1-1-2), the monomer (a1-5-1), the monomer (a2-1-1), the monomer (a3-1-1) and the monomer (I-1) The ratio [monomer (a1-1-2): monomer (a1-5-1): monomer (a2-1-1): monomer (a3-1-1): monomer (I-1)] is 32: 7: It mixed so that it might become 8:43:10, and the propylene glycol monomethyl ether acetate of 1.5 mass times of the total monomer amount was added, and it was set as the solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in propylene glycol monomethyl ether acetate, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by reprecipitation operation of filtering the resin twice. Resin A7 (copolymer) having a molecular weight of 7.8 × 10 ³ was obtained in a yield of 78%. This resin A7 has the following structural units.

Synthesis Example 13 [Synthesis of Resin A8]
As the monomer, the monomer (a1-1-3), the monomer (a1-5-1), the monomer (a2-1-3), the monomer (a3-2-3) and the monomer (I-6) The ratio [monomer (a1-1-3): monomer (a1-5-1): monomer (a2-1-3): monomer (a3-2-3): monomer (I-6)] is 45:14: It mixed so that it might become 2.5: 22.5: 16, and the propylene glycol monomethyl ether acetate of 1.5 mass times the total monomer amount was added, and it was set as the solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in propylene glycol monomethyl ether acetate, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by reprecipitation operation of filtering the resin twice. Resin A8 (copolymer) having a molecular weight of 7.7 × 10 ³ was obtained in a yield of 60%. This resin A8 has the following structural units.

Synthesis Example 14 [Synthesis of Resin A9]
As a monomer, a monomer (a1-1-2), a monomer (a1-5-1), a monomer (a2-1-1), a monomer (a3-1-1) and a monomer (I-6) The ratio [monomer (a1-1-2): monomer (a1-5-1): monomer (a2-1-1): monomer (a3-1-1): monomer (I-6)] is 32: 7: It mixed so that it might become 8:43:10, and the propylene glycol monomethyl ether acetate of 1.5 mass times of the total monomer amount was added, and it was set as the solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in propylene glycol monomethyl ether acetate, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by reprecipitation operation of filtering the resin twice. Resin A9 (copolymer) having a molecular weight of 8.0 × 10 ³ was obtained in a yield of 80%. This resin A9 has the following structural units.

Synthesis Example 15 [Synthesis of Resin X1]
Monomer (a1-1-1) and monomer (M) are used as monomers and mixed so that the molar ratio [monomer (a1-1-1): monomer (M)] is 40:60. An amount of 1.5 mass times dioxane was added to prepare a solution. To this solution, azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added in an amount of 1.4 mol% and 4.2 mol%, respectively, based on the total monomer amount, and these were added at 70 ° C. Heated for about 5 hours. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was dissolved again in dioxane, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, and the reprecipitation operation of filtering the resin was performed twice, and the weight average molecular weight was 5.0. A × 10 ³ resin X1 (copolymer) was obtained in a yield of 92%. This resin H1 has the following structural units.

Examples 1-8 and Comparative Example 1
<Preparation of resist composition>
Each of the components shown below was dissolved in a solvent in parts by mass shown in Table 1, and further filtered through a fluororesin filter having a pore size of 0.2 μm to prepare a resist composition.

Ｂ１−３：特開２０１０−１５２３４１号公報の実施例に従って合成

Ｂ１−５：

Ｂ２：トリフェニルスルホニウム トリフレート（ＴＰＳ−１０５ ミドリ化学（株）製） <Resin>
Resins A1 to A9 and X1 synthesized in the above synthesis example
<Acid generator>
II1: Salt represented by formula (II-1) II2: Central Glass Co., Ltd.

B1-3: synthesized according to the example of JP 2010-152341 A

B1-5:

B2: Triphenylsulfonium triflate (manufactured by TPS-105 Midori Chemical Co., Ltd.)

<Basic compound: Quencher>
C1: 2,6-diisopropylaniline (manufactured by Tokyo Chemical Industry Co., Ltd.)

<Solvent>
Propylene glycol monomethyl ether acetate 265 parts Propylene glycol monomethyl ether 20 parts 2-heptanone 20 parts γ-butyrolactone 3.5 parts

<Manufacture of negative resist pattern>
An organic antireflective coating composition [ARC-29; manufactured by Nissan Chemical Industries, Ltd.] was applied onto a 12-inch silicon wafer, and baked under the conditions of 205 ° C. and 60 seconds, whereby an organic layer having a thickness of 78 nm was obtained. An antireflection film was formed. Next, the resist composition was spin-coated on the organic antireflection film so that the film thickness of the composition layer after drying (pre-baking) was 85 nm. The silicon wafer coated with the resist composition was pre-baked on a direct hot plate at a temperature described in the “PB” column of Table 2 for 60 seconds to form a composition layer on the silicon wafer. An ArF excimer laser stepper for immersion exposure [XT: 1900 Gi; manufactured by ASML, NA = 1.35, Dipole 0.900 / 0.700 Y-pol.] Is applied to the composition layer formed on the silicon wafer. Illumination], using a mask for forming a trench pattern (pitch 120 nm / trench 40 nm), the exposure was changed stepwise to perform exposure. Note that ultrapure water was used as the immersion medium. After the exposure, post-exposure baking was performed for 60 seconds on the hot plate at the temperature described in the “PEB” column of Table 2. Next, a negative resist pattern was manufactured by developing the heated composition layer using a butyl acetate (manufactured by Tokyo Chemical Industry Co., Ltd.) as a developing solution by a dynamic dispensing method at 23 ° C. for 20 seconds. .

  In the obtained resist pattern, the exposure amount at which the line width of the trench pattern was 40 nm was defined as effective sensitivity.

<Focus margin evaluation (DOF)>
A negative resist pattern was manufactured in the same manner as described above except that the exposure was performed while changing the focus stepwise in terms of effective sensitivity. In the obtained resist pattern, the focus range in which the width of the trench pattern is 40 nm ± 5% (38 to 42 nm) was defined as DOF (nm). The results are shown in Table 2.

Examples 9 to 16 and Comparative Example 2
Except that the developer was changed from n-butyl acetate to 2-heptanone (manufactured by Kyowa Hakko Co., Ltd.), the same operation as above was performed to produce a negative resist pattern, and the same evaluation as in Example 1 was performed. went. The results are shown in Table 3.

  From the above results, it can be seen that the resist composition of the present invention can produce a resist pattern with excellent DOF.

<Preparation of resist composition>
Each of the components shown below was dissolved in the following solvent in the parts by mass shown in Table 4 and further filtered through a fluororesin filter having a pore size of 0.2 μm to prepare a resist composition.

Examples 17 to 20 and Comparative Example 3
<Manufacture of resist pattern>
An organic antireflective coating composition (ARC-29; manufactured by Nissan Chemical Co., Ltd.) is applied to a silicon wafer and baked at 205 ° C. for 60 seconds to form an organic antireflective coating having a thickness of 78 nm. Formed. Next, the above resist composition was spin-coated on this organic antireflection film so that the film thickness after drying was 85 nm. The silicon wafer coated with the resist composition was pre-baked on a direct hot plate for 60 seconds at the temperature described in the “PB” column of Table 4 to form a resist composition layer. A contact hole pattern (hole pitch) is formed on a silicon wafer on which a resist composition layer has been formed using an ArF excimer stepper for immersion exposure (XT: 1900 Gi; manufactured by ASML, NA = 1.35, 3/4 Annular XY polarized light). Using a mask for forming (100 nm / hole diameter 70 nm), the exposure amount was changed stepwise to perform exposure. Note that ultrapure water was used as the immersion medium.
After the exposure, the silicon wafer was post-exposure baked on a hot plate for 60 seconds at the temperature described in the “PEB” column of Table 4. Next, this silicon wafer was subjected to paddle development for 60 seconds with a 2.38% tetramethylammonium hydroxide aqueous solution.

  From each resist composition layer, an exposure amount at which the hole diameter of a pattern formed with a mask having a hole diameter of 70 nm was 55 nm was defined as effective sensitivity.

<Focus margin evaluation (DOF)>
In the effective sensitivity, when the focus is shaken, a range (52.5 to 57.7 nm) in which the line width is 55 nm ± 5% is defined as DOF. The results are shown in Table 5.

  From the above results, it can be seen that the resist composition of the present invention can produce a resist pattern with excellent DOF.

  The resist composition of the present invention can produce a resist pattern with good DOF.

Claims (4)

A resist composition comprising a resin having a structural unit represented by formula (I) and an acid generator represented by formula (II).

[In the formula (I),
R ¹ represents an alkyl group having 1 to 6 carbon atoms which may have a halogen atom, a hydrogen atom or a halogen atom.
A ¹ is a single bond, ^* —A ² —O—, ^* —A ² —CO—O—, ^* —A ² —CO—O—A ³ —CO—O—, or ^* —A ² —O—CO. -A ³ represents a -O-.
* Represents a bond with -O-.
A ² and A ³ each independently represents an alkanediyl group having 1 to 6 carbon atoms. ]

[In the formula (II),
X ² represents an alkanediyl group having 1 to 6 carbon atoms, and a hydrogen atom contained in the alkanediyl group may be substituted with a hydroxy group or —OR ⁵ , and a methylene group constituting the alkanediyl group May be replaced by an oxygen atom or a carbonyl group.
R ⁴ and R ⁵ each independently represent a hydrocarbon group having 1 to 24 carbon atoms, and the hydrogen atom contained in the hydrocarbon group may be substituted with a fluorine atom or a hydroxy group, The methylene group contained in the group may be replaced with an oxygen atom or a carbonyl group.
Z ⁺ represents an organic cation. ] The method for producing a resist pattern according to claim 1, wherein the acid generator represented by the formula (II) is an acid generator represented by the formula (IIA).

[In formula (IIA), X ² and Z ⁺ represent the same meaning as described above.
R ⁶ represents a hydrocarbon group having 1 to 17 carbon atoms, the hydrogen atom contained in the hydrocarbon group may be substituted with a fluorine atom or a hydroxy group, and the methylene group constituting the hydrocarbon group is May be replaced by an oxygen atom or a carbonyl group.
R ⁷ represents an alkyl group having 1 to 6 carbon atoms.
R ⁸ represents a fluorinated alkyl group having 1 to 6 carbon atoms.
However, the total carbon number of R ⁶ , R ⁷ and R ⁸ is 20 or less. ]   Furthermore, the resist composition of Claim 1 or 2 containing a solvent. (1) The process of apply | coating the resist composition as described in any one of Claims 1-3 on a board | substrate,
(2) The process of drying the composition after application | coating and forming a composition layer,
(3) a step of exposing the composition layer,
(4) a step of heating the composition layer after exposure, and (5) a step of developing the composition layer after heating,
A method for producing a resist pattern including: