JP2013543254A5 - - Google Patents

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Publication number
JP2013543254A5
JP2013543254A5 JP2013529091A JP2013529091A JP2013543254A5 JP 2013543254 A5 JP2013543254 A5 JP 2013543254A5 JP 2013529091 A JP2013529091 A JP 2013529091A JP 2013529091 A JP2013529091 A JP 2013529091A JP 2013543254 A5 JP2013543254 A5 JP 2013543254A5
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JP
Japan
Prior art keywords
base plate
lithography system
vacuum chamber
bottom wall
lithography
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2013529091A
Other languages
Japanese (ja)
Other versions
JP2013543254A (en
Filing date
Publication date
Priority claimed from NL2005374A external-priority patent/NL2005374C2/en
Application filed filed Critical
Publication of JP2013543254A publication Critical patent/JP2013543254A/en
Publication of JP2013543254A5 publication Critical patent/JP2013543254A5/ja
Withdrawn legal-status Critical Current

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Claims (14)

剛性又はソリッドベースプレート上面上に配置されるリソグラフィシステムであって、
前記ベースプレートは、基礎上にリソグラフィシステムを配置するためにこのベースプレートに取着された少なくとも1つの支柱を有し、
前記少なくとも1つの支柱は、前記基礎に面する前記ベースプレートの側に配置され、
前記ベースプレートには、リソグラフィシステムの真空チャンバの下側に機器を装着するためのカットアウト又は開口が設けられているリソグラフィシステム。
A lithography system disposed on a top surface of a rigid or solid base plate,
The base plate has at least one column attached to the base plate for positioning the lithography system on a foundation;
The at least one strut is disposed on the side of the base plate facing the foundation;
A lithography system, wherein the base plate is provided with a cut-out or opening for mounting equipment under the vacuum chamber of the lithography system.
前記機器は、カメラのような、リソグラフィシステムの測定機器を含む請求項1のリソグラフィシステム。   The lithographic system of claim 1, wherein the apparatus comprises a lithographic system measurement apparatus, such as a camera. 中心線、即ち光軸を有する投影カラムをさらに有し、
前記測定システムは、前記投影カラムの中心線、即ち光軸とほぼアライメントされて配置されている請求項のリソグラフィシステム。
A projection column having a center line, i.e. an optical axis,
The lithographic system of claim 2 , wherein the measurement system is positioned substantially aligned with a centerline of the projection column, i.e., the optical axis.
このリソグラフィシステムは、ターゲット位置決め装置を有し、
前記機器は、リソグラフィシステムの前記ターゲット位置決め装置を駆動させるモータを有する請求項のリソグラフィシステム。
The lithography system has a target positioning device,
The equipment, lithography system of claim 1 having a motor for driving the target positioning device of the lithography system.
前記機器は、前記ベースプレートを通って、好ましくは前記ベースプレートを超えて延びている請求項1ないしのいずれか1のリソグラフィシステム。 The device, through the base plate, preferably any one of a lithography system 4 claims 1 extends beyond the base plate. このリソグラフィシステムは、真空チャンバを有し、
リソグラフィシステムに面する前記機器の一側面は、前記真空チャンバの内部に配置されている請求項1ないしのいずれか1のリソグラフィシステム。
The lithography system has a vacuum chamber,
One side of the device, any one of a lithography system of the claims 1 are disposed inside the vacuum chamber 4 facing the lithography system.
前記ベースプレート及び前記支柱は、アルミニウムでできており、好ましくは、前記ベースプレート及び前記支柱は、一体部品として形成されている請求項1ないしのいずれか1のリソグラフィシステム。 Said base plate and said post is made of aluminum, preferably, the base plate and the strut claims 1 to 4 or 1 lithography system is formed as an integral part. 前記ベースプレートと前記支柱との少なくとも一方がモノリシック構造を形成している請求項1ないしのいずれか1のリソグラフィシステム。 Any one of a lithography system 4 to at least one of said base plate and said strut claims 1 to form a monolithic structure. 前記ベースプレートは、自己保持ベースプレートである請求項1ないしのいずれか1のリソグラフィシステム。 The base plate is any one of a lithography system of claims 1, which is a self-holding base plate 4. 前記ベースプレートは、前記基礎に着脱可能に配置されている請求項1ないしのいずれか1のリソグラフィシステム。 The base plate is any one of a lithography system of claims 1 to 4 is removably disposed in said base. 前記ベースプレートには、3つの支柱が設けられている請求項1ないしのいずれか1のリソグラフィシステム。 Wherein the base plate, claims 1 three struts are provided any of the preceding lithography system. 請求項1ないし11のいずれか1のリソグラフィシステムで使用するベースプレート。 A base plate for use in any one of a lithography system of claims 1 to 11. 前記リソグラフィシステムは、底壁を有する真空チャンバを有し、
前記ベースプレートは、少なくとも、前記真空チャンバの前記底壁の一部である請求項12のベースプレート。
The lithography system has a vacuum chamber having a bottom wall;
The base plate of claim 12 , wherein the base plate is at least part of the bottom wall of the vacuum chamber.
前記リソグラフィシステムは、底壁を有する真空チャンバを有し、
前記ベースプレートは、前記真空チャンバの前記底壁である請求項12のベースプレート。
The lithography system has a vacuum chamber having a bottom wall;
The base plate of claim 12 , wherein the base plate is the bottom wall of the vacuum chamber.
JP2013529091A 2010-09-20 2011-09-20 Lithography system placed on a foundation and method for placing a lithography system on a foundation Withdrawn JP2013543254A (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US38469010P 2010-09-20 2010-09-20
NL2005374A NL2005374C2 (en) 2010-09-20 2010-09-20 Method for arranging a lithography system on a foundation, and lithography system arranged on said foundation.
US61/384,690 2010-09-20
NL2005374 2010-09-20
PCT/NL2011/050630 WO2012039606A1 (en) 2010-09-20 2011-09-20 Lithography system arranged on a foundation, and method for arranging a lithography system on said foundation

Publications (2)

Publication Number Publication Date
JP2013543254A JP2013543254A (en) 2013-11-28
JP2013543254A5 true JP2013543254A5 (en) 2014-11-13

Family

ID=43920813

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013529091A Withdrawn JP2013543254A (en) 2010-09-20 2011-09-20 Lithography system placed on a foundation and method for placing a lithography system on a foundation

Country Status (6)

Country Link
EP (1) EP2619629A1 (en)
JP (1) JP2013543254A (en)
KR (1) KR20130132769A (en)
NL (1) NL2005374C2 (en)
TW (1) TW201217915A (en)
WO (1) WO2012039606A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6817621B2 (en) * 2016-10-25 2021-01-20 株式会社マルテー大塚 Road studs and how to repair road studs
US10048599B2 (en) 2016-12-30 2018-08-14 Mapper Lithography Ip B.V. Adjustment assembly and substrate exposure system comprising such an adjustment assembly
JP7022134B2 (en) 2016-12-30 2022-02-17 エーエスエムエル ネザーランズ ビー.ブイ. Board exposure system with adjustment assembly and adjustment assembly
TWI794964B (en) * 2021-09-09 2023-03-01 協崑股份有限公司 High precision base of extreme ultraviolet lithography (euv) and implementation thereof

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4805000A (en) * 1986-01-17 1989-02-14 Matsushita Electric Industrial Co., Ltd. Exposure apparatus
KR100250152B1 (en) * 1997-11-15 2000-03-15 유무성 Exposing apparatus
EP1143492A4 (en) * 1998-09-03 2004-06-02 Nikon Corp Exposure apparatus and exposure method, and device and method for producing the same
AU6365499A (en) * 1998-10-28 2000-05-15 Nikon Corporation Stage device, exposure system, method of device manufacture, and device
JP2001148341A (en) * 1999-11-19 2001-05-29 Nikon Corp Aligner
JP2004063653A (en) * 2002-07-26 2004-02-26 Nikon Corp Vibration isolator, stage apparatus, and aligner
TWI307526B (en) * 2002-08-06 2009-03-11 Nikon Corp Supporting device and the mamufacturing method thereof, stage device and exposure device
US20040149881A1 (en) * 2003-01-31 2004-08-05 Allen David S Adjustable support structure for air conditioner and the like
US7460208B2 (en) * 2005-02-18 2008-12-02 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP2009164307A (en) * 2007-12-28 2009-07-23 Canon Inc Supporting structure, exposing equipment, method of forming supporting structure, and method of manufacturing device
US8739383B2 (en) * 2009-04-20 2014-06-03 Nikon Corporation Method and apparatus for aligning mirror blocks of a multi-element mirror assembly

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