JP2013517466A5 - - Google Patents

Download PDF

Info

Publication number
JP2013517466A5
JP2013517466A5 JP2012548474A JP2012548474A JP2013517466A5 JP 2013517466 A5 JP2013517466 A5 JP 2013517466A5 JP 2012548474 A JP2012548474 A JP 2012548474A JP 2012548474 A JP2012548474 A JP 2012548474A JP 2013517466 A5 JP2013517466 A5 JP 2013517466A5
Authority
JP
Japan
Prior art keywords
radiation
standard
data set
calibration
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2012548474A
Other languages
English (en)
Japanese (ja)
Other versions
JP5671059B2 (ja
JP2013517466A (ja
Filing date
Publication date
Priority claimed from GBGB1000446.3A external-priority patent/GB201000446D0/en
Priority claimed from GBGB1014220.6A external-priority patent/GB201014220D0/en
Application filed filed Critical
Priority claimed from PCT/GB2011/050021 external-priority patent/WO2011086366A2/en
Publication of JP2013517466A publication Critical patent/JP2013517466A/ja
Publication of JP2013517466A5 publication Critical patent/JP2013517466A5/ja
Application granted granted Critical
Publication of JP5671059B2 publication Critical patent/JP5671059B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2012548474A 2010-01-12 2011-01-10 データセットの校正 Active JP5671059B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB1000446.3 2010-01-12
GBGB1000446.3A GB201000446D0 (en) 2010-01-12 2010-01-12 Calibration of radiation scanning apparatus
GB1014220.6 2010-08-26
GBGB1014220.6A GB201014220D0 (en) 2010-08-26 2010-08-26 Calibration of dataset
PCT/GB2011/050021 WO2011086366A2 (en) 2010-01-12 2011-01-10 Calibration of dataset

Publications (3)

Publication Number Publication Date
JP2013517466A JP2013517466A (ja) 2013-05-16
JP2013517466A5 true JP2013517466A5 (https=) 2014-01-16
JP5671059B2 JP5671059B2 (ja) 2015-02-18

Family

ID=44304728

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012548474A Active JP5671059B2 (ja) 2010-01-12 2011-01-10 データセットの校正

Country Status (4)

Country Link
US (1) US9188550B2 (https=)
EP (1) EP2524208B1 (https=)
JP (1) JP5671059B2 (https=)
WO (1) WO2011086366A2 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201310924D0 (en) * 2013-06-19 2013-07-31 Johnson Matthey Plc Radiation source container
CN105203569B (zh) * 2014-06-09 2018-06-12 北京君和信达科技有限公司 双能辐射系统和提高双能辐射系统材料识别能力的方法
JP6861990B2 (ja) * 2017-03-14 2021-04-21 株式会社イシダ Ｘ線検査装置
CA3178580A1 (en) * 2020-05-14 2021-11-18 Eric FITERMAN Creating imagery for al model training in security screening
US12493003B2 (en) 2023-07-13 2025-12-09 General Electric Company Detector with focally aligned pixels

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62240846A (ja) * 1986-04-14 1987-10-21 Seiko Instr & Electronics Ltd 螢光ｘ線測定装置の校正方法
US4864842A (en) * 1988-07-29 1989-09-12 Troxler Electronic Laboratories, Inc. Method and system for transferring calibration data between calibrated measurement instruments
FR2705786B1 (fr) * 1993-05-28 1995-08-25 Schlumberger Ind Sa Procédé et dispositif pour la reconnaissance de matériaux déterminés dans la composition d'un objet.
JP3609034B2 (ja) * 2001-03-16 2005-01-12 イオン加速器株式会社 元素分析方法及び特性解析プログラム
US6999164B2 (en) * 2001-04-26 2006-02-14 Tokyo Electron Limited Measurement system cluster
WO2002097403A1 (en) * 2001-05-25 2002-12-05 Analytica Of Branford, Inc. Multiple detection systems
AU2003214929B2 (en) * 2002-01-31 2006-07-13 The Johns Hopkins University X-ray source and method for producing selectable x-ray wavelength
JP2007524438A (ja) * 2003-03-25 2007-08-30 イメージング セラピューティクス，インコーポレーテッド 放射線画像処理技術における補償の方法
US7355709B1 (en) * 2004-02-23 2008-04-08 Kla-Tencor Technologies Corp. Methods and systems for optical and non-optical measurements of a substrate
JP2006153498A (ja) * 2004-11-25 2006-06-15 Konica Minolta Sensing Inc 標準面試料および光学特性測定システム
JP4127698B2 (ja) * 2005-04-25 2008-07-30 アンリツ産機システム株式会社 Ｘ線検査装置
WO2008142446A2 (en) 2007-05-17 2008-11-27 Durham Scientific Crystals Ltd Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands
US7693261B2 (en) * 2007-05-17 2010-04-06 Durham Scientific Crystals Limited Method and apparatus for inspection of materials
GB0716045D0 (en) 2007-08-17 2007-09-26 Durham Scient Crystals Ltd Method and apparatus for inspection of materials
WO2009024818A1 (en) 2007-08-17 2009-02-26 Durham Scientific Crystals Limited Method and apparatus for identification and detection of liquids
JP5559206B2 (ja) 2009-01-27 2014-07-23 クロメック リミテッド 物体走査プロトコル

Similar Documents

Publication Publication Date Title
Menu et al. The structure of disks around intermediate-mass young stars from mid-infrared interferometry-Evidence for a population of group II disks with gaps
JP2013517466A5 (https=)
JP2007003532A5 (https=)
WO2008142446A3 (en) Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands
US20200173938A1 (en) Quantitative phase analysis device, quantitative phase analysis method, and non-transitory computer-readable storage medium storing quantitative phase analysis program
WO2004086011A1 (ja) テラヘルツ波分光計測によるターゲット判別方法及び装置
JP5981543B2 (ja) 物質の検出および／または分類
Jones et al. Neural network-based classification of X-ray fluorescence spectra of artists’ pigments: an approach leveraging a synthetic dataset created using the fundamental parameters method
JP2012528319A5 (https=)
Dhakal et al. Detection of azo dyes in curry powder using a 1064-nm dispersive point-scan Raman system
Hocquet et al. Elemental 2D imaging of paintings with a mobile EDXRF system
JP2015501928A5 (https=)
Barcellos Lins et al. Testing the accuracy of the calculation of gold leaf thickness by MC simulations and MA-XRF scanning
Slenkamp et al. Investigating vibrational anharmonic couplings in cyanide-bridged transition metal mixed valence complexes using two-dimensional infrared spectroscopy
Klisińska‐Kopacz Non‐destructive characterization of 17th century painted silk banner by the combined use of Raman and XRF portable systems
Blagorodnova et al. GS-TEC: the Gaia spectrophotometry transient events classifier
Mundo et al. Long-term hard X-ray variability properties of Swift-BAT blazars
JP2014527166A (ja) 物体の放射線検査方法
JP5671059B2 (ja) データセットの校正
Tan et al. The hybrid A/B type ν12 band of trans-ethylene-1, 2-d2 by high-resolution Fourier transform infrared spectroscopy
JP2008536144A (ja) 混合物をスペクトル分析する方法および装置
CN104990877A (zh) 一种基于多光谱成像技术的虾贝类去壳水产品辐照剂量的检测方法
Wróbel et al. New approaches for correction of interlayer absorption effects in X-ray fluorescence imaging of paintings
Pierer et al. Inline quality monitoring of reverse extruded aluminum parts with cathodic dip-paint coating (KTL)
Flaud et al. High resolution analysis of the ethylene-1-13C spectrum in the 8.4–14.3-μm region