JP2013234965A - Testing device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a testing device which can prevent the loss of test data even during the malfunction of a controller and the interruption of a test due to the removal of an external memory.SOLUTION: A testing device 10 includes: a testing device body 12 conducting a test; a controller 32 which sets and implements test conditions and collects test data for the testing device body 12; and an internal memory storing the test data collected by the controller 32. The test data accumulated in the internal memory are periodically transferred to an external memory 42.

Description

  The present invention can be applied to various materials such as fatigue tests, durability tests, and characteristic tests performed on materials such as metal materials, resin materials, and composite materials, machine parts such as automobile parts, and finished products. The present invention relates to a test apparatus for testing.

  Conventionally, as test equipment, for example, materials such as metal materials, resin materials, composite materials, and machine parts such as automobile parts (such as drive parts and undercarriage metal parts, rubber parts, shock absorbers) Material testing equipment for conducting material tests, vibration tests, fatigue tests, characteristic tests, etc. for finished products such as finished automobiles and for civil engineering-related structures (such as bridge girders, bridges and seismic isolation rubber for buildings) There are various test devices such as vibration test devices and fatigue test devices.

  Hereinafter, in the present specification, the term “test apparatus” is used to include a test apparatus for performing these various tests.

  By the way, as such a conventional test apparatus, a test apparatus as disclosed in Patent Document 1 (International Publication WO2007 / 141855) has been proposed.

  That is, as shown in FIG. 6, in this test apparatus 100, a test apparatus main body 102 for performing a test, setting of test conditions and the like, collection of test data, etc. are performed for the test apparatus main body 102. And a control device 104. For storing test data, for example, an external memory 106 such as a USB is always attached to the test apparatus 100 during the test. Further, the test data is stored (stored) in the external memory 106 attached to the test apparatus 100 at any time during the test.

  After the test is completed and the test data is stored in the external memory 106, the external memory 106 is detached from the test apparatus 100, and the external memory 106 is attached to a separately prepared external analysis personal computer (PC) 108. The external analysis personal computer 108 is configured to analyze the test.

  As a conventional test apparatus, a test apparatus as disclosed in Patent Document 2 (Japanese Patent Laid-Open No. 2006-118964) has also been proposed.

  That is, as shown in FIG. 7, in this test apparatus 200, a test apparatus main body 202 for performing a test, setting of test conditions and the like, collection of test data, etc. are performed for the test apparatus main body 202. Control device 204 and an internal memory 206 that is provided in the test device 200 and stores test data.

  During the test, the test data is stored in the internal memory 206. After the test is completed, the test apparatus 200 is attached with an external memory 208 such as a USB, and the test data stored in the internal memory 206 is stored. Copying to the external memory 208 is performed.

  After the test data is copied to the external memory 208, the external memory 208 is removed from the test apparatus 200, and the external memory 208 is attached to a separately prepared external analysis personal computer (PC) 210. The system is configured to analyze the test.

International Publication WO2007 / 141855 JP 2006-118964 A

  However, in the conventional test apparatus 100 as disclosed in Patent Document 1, test data is stored in the external memory 106 attached to the test apparatus 100 at any time during the test as shown in FIG. Is configured to do.

  Therefore, if the external memory 106 is inadvertently removed from the test apparatus 100 during the test, the test data cannot be stored in the external memory 106, the test data cannot be measured, and the test cannot be performed normally. The test will be interrupted.

  On the other hand, in the conventional test apparatus 200 as disclosed in Patent Document 2, as shown in FIG. 7, the test data stored in the internal memory 206 is neglected to be copied to the external memory 208 (data backup). In such a case, the stored test data stored in the internal memory 206 may be lost due to a failure of the test apparatus 200 (control apparatus 204).

  Therefore, in order to avoid this, it is necessary to regularly back up test data to the outside of the test apparatus 200 (in the external memory 208), which complicates the operation procedure of the test apparatus 200. That is, each time test data is analyzed by the external analysis personal computer 210, it is necessary to perform data copy processing for copying the test data stored in the internal memory 206 to the external memory 208, which requires complicated work. there were.

  In view of such a current situation, the present invention can prevent the loss of test data even when the control device fails, can prevent the interruption of the test due to the removal of the external memory, and It is an object of the present invention to provide a test apparatus that can be easily and quickly operated even when analyzing test data on an analysis personal computer, and that has little influence on the test due to insufficient operating speed of an external memory.

The present invention was invented in order to achieve the problems and objects in the prior art as described above.
A test apparatus main body for performing the test;
A control device for performing setting, execution, collection of test data, etc. for the test apparatus main body,
A test device comprising an internal memory for storing test data collected by the control device,
The test data stored in the internal memory is configured to be periodically transferred to the external memory.

  With this configuration, the test data of the test apparatus main body collected by the control apparatus is stored in the internal memory during the test. Then, the test data stored in the internal memory is periodically transferred to the external memory.

  Therefore, even when the control device fails, the test data stored in the internal memory before the control device fails is already transferred to the external memory, and it is possible to prevent the test data from being lost. .

  Further, since the test data of the test apparatus main body collected by the control apparatus is stored in the internal memory during the test, it is possible to prevent the test from being interrupted due to the removal of the external memory.

  In addition, since test data stored in the internal memory is automatically transferred to the external memory periodically, it is necessary to back up the test data to the external memory outside the test equipment on a regular basis. In addition, the operation is easy and quick even when analyzing test data on an external analysis computer.

  In addition, test data collected by the control device is stored in the internal memory during the test, and the test data stored in the internal memory is automatically transferred to the external memory periodically. Therefore, there is little influence on the test due to insufficient operating speed of external memory.

  The test apparatus according to the present invention is characterized in that the test data stored in the internal memory is transferred to the external memory after a predetermined time has elapsed.

  With this configuration, test data stored in the internal memory is transferred to the external memory after a lapse of a certain amount of time, so even if the control device fails, the test data is stored in the internal memory before the control device fails. The accumulated test data has already been transferred to the external memory, and it is possible to prevent the data loss of the test data, and there is little influence on the test due to insufficient operation speed of the external memory.

  The test apparatus of the present invention is configured such that the test data stored in the internal memory is transferred to an external memory after a certain amount of test data is stored in the internal memory. And

  With this configuration, test data stored in the internal memory is transferred to the external memory after a certain amount of test data is stored in the internal memory. The test data stored in the internal memory before the failure of the device has already been transferred to the external memory, and it is possible to prevent the data loss of the test data. There are few.

  The test apparatus according to the present invention is characterized in that the test data stored in the internal memory is transferred to the external memory after the test is completed.

  With this configuration, the test data stored in the internal memory is transferred to the external memory after the test is completed. Therefore, the data transfer is performed at the timing when the device is stopped, which is not expected for processing. Even if it takes a long time, the test will not be affected.

In addition, the test apparatus of the present invention is
A test apparatus main body for performing the test;
A control device for performing setting, execution, collection of test data, etc. for the test apparatus main body,
A test device comprising an internal memory for storing test data collected by the control device,
The test data stored in the internal memory is configured to be always transferred to the external memory.

  With this configuration, the test data of the test apparatus main body collected by the control apparatus is stored in the internal memory during the test. The test data stored in the internal memory is always transferred to the external memory.

  Therefore, even when the control device fails, the test data stored in the internal memory before the control device fails is already transferred to the external memory, and it is possible to prevent the test data from being lost. .

  Further, since the test data of the test apparatus main body collected by the control apparatus is stored in the internal memory during the test, it is possible to prevent the test from being interrupted due to the removal of the external memory.

  In addition, since test data stored in the internal memory is automatically transferred to the external memory at all times, there is no need to regularly back up the test data to the external memory outside the test equipment as in the past. Operation is easy and quick even when analyzing test data on an external analysis computer.

  The test data collected by the control device is stored in the internal memory during the test, and the test data stored in the internal memory is always automatically transferred to the external memory. There is little influence on the test due to insufficient operating speed of external memory.

  The test apparatus of the present invention is characterized in that the external memory is an external memory connectable to the test apparatus.

  In this way, the external memory is an external memory that can be connected to a test device such as a USB memory. Therefore, even when analyzing test data with an external analysis personal computer, the external memory can be removed from the test device for external analysis. Test data can be analyzed on a personal computer, and operation is simple and quick.

  The test apparatus of the present invention is characterized in that the external memory is an external memory that can be connected to the test apparatus via a LAN cable.

  In this way, if the external memory is an external memory that can be connected to the test equipment via a LAN cable, the test data stored in the internal memory can be automatically transferred to the external memory simply by connecting the LAN cable. Therefore, the connection operation is simple, the test data can be prevented from being lost, and the influence on the test due to the lack of operation speed of the external memory is small.

In addition, the test apparatus of the present invention is
The control device and the internal memory are provided in a test control device,
The test apparatus main body and the test control apparatus are connected to each other.

  Thus, the control device and the internal memory may be provided in a test control device such as a control personal computer, and the test device main body and the test control device may be connected.

  In this case, it is convenient to perform various tests by changing the type of the test apparatus main body and connecting it to the test control apparatus.

  The test apparatus according to the present invention is characterized in that the test apparatus main body, the control apparatus, and the internal memory are integrally provided in the test apparatus.

  With this configuration, the test apparatus main body, the control apparatus, and the internal memory are integrated into a test apparatus, which is convenient because it is not necessary to perform wiring or the like.

  According to the present invention, test data of the test apparatus main body collected by the control apparatus is stored in the internal memory during the test. Then, the test data stored in the internal memory is transferred to the external memory regularly or constantly.

  Therefore, even when the control device fails, the test data stored in the internal memory before the control device fails is already transferred to the external memory, and it is possible to prevent the test data from being lost. .

  Further, since the test data of the test apparatus main body collected by the control apparatus is stored in the internal memory during the test, it is possible to prevent the test from being interrupted due to the removal of the external memory.

  In addition, the test data stored in the internal memory is automatically transferred to the external memory periodically or at all times, so that the test data is regularly backed up to the external memory outside the test equipment as before. There is no need to do this, and even when analyzing test data using an external analysis computer, the operation is simple and quick.

  In addition, the test data of the test equipment collected by the control device is stored in the internal memory during the test, and the test data stored in the internal memory is automatically and regularly stored in the external memory. Since the data is transferred, there is little impact on the test due to insufficient operating speed of the external memory.

FIG. 1 is a schematic view showing an embodiment in which the test apparatus of the present invention is applied to a fatigue test apparatus that performs a fatigue test as an example of a test. FIG. 2 is a front view for explaining a use state of the test apparatus main body of FIG. FIG. 3 is a flowchart showing a method for periodically transferring data to an external memory. FIG. 4 is a flowchart showing a method of transferring data to the external memory after the test is completed. FIG. 5 is a flowchart showing a method for constantly transferring data to an external memory. FIG. 6 is a schematic view showing a conventional test apparatus. FIG. 7 is a schematic view showing a conventional test apparatus.

  Hereinafter, embodiments (examples) of the present invention will be described in more detail with reference to the drawings.

  FIG. 1 is a schematic view showing an embodiment in which the test apparatus of the present invention is applied to a fatigue test apparatus for performing a fatigue test as an example of a test, and FIG. 2 is a front view illustrating a use state of the test apparatus main body of FIG. FIG. 3, FIG. 3 is a flowchart showing a method for periodically transferring data to an external memory, FIG. 4 is a flowchart showing a method for transferring data to the external memory after completion of the test, and FIG. 5 is a method for constantly transferring data to the external memory. It is a flowchart which shows.

  In FIG. 1, the code | symbol 10 has shown the test apparatus of this invention on the whole.

  As shown in FIGS. 1 to 2, the test apparatus 10 of the present invention includes a test apparatus main body 12 for performing a test. In this embodiment, the test apparatus main body 12 includes a fatigue test apparatus that performs a fatigue test as an example of a test.

  As described above, the test apparatus 10 of the present invention can be used as a test apparatus for materials such as metal materials, resin materials, and composite materials, as well as automobile parts (metal parts and rubber parts for driving systems and suspensions). , Shock absorbers, etc.), finished products such as finished automobiles, and civil engineering related structures (such as bridge girders, bridges and seismic isolation rubber for buildings), material tests, vibration tests, The present invention can be applied to various test apparatuses such as a material test apparatus, a vibration test apparatus, and a fatigue test apparatus for performing a fatigue test and a characteristic test.

  As shown in FIG. 1, the test apparatus main body 12 includes a gantry frame 14, and an actuator 16 composed of a cylinder is provided below the gantry frame 14. The actuator 16 includes a piston 18 for mounting the test piece A and a displacement detector 20 for detecting displacement.

  Further, an upper frame 28 is provided above the gantry frame 14, and a guide rod 22 is provided between the upper frame 28 and the gantry frame 14 in the upper frame 28.

  A ball screw 24 is provided between the lower side of the guide rod 22 and the upper frame 28, and a cross head 26 that is movable up and down with respect to the piston 18 by the ball screw 24 is provided. The crosshead 26 is provided with a load detector 30 so as to face the piston 18.

  As shown in FIG. 1, the test apparatus 10 of the present invention is connected to the test apparatus main body 12 for setting test conditions and the like, collecting test data, and the like for the test apparatus main body 12. And a control device 32 functioning as a test control device.

  In this embodiment, the control device 32 includes a CRT 34 for displaying a setting screen for test conditions and the like, test data, a control device main body 36, a keyboard 38, and a mouse 40. Therefore, the control device 32 has an internal memory composed of, for example, a hard disk. An operation personal computer may be connected to the control device main body 36.

  The displacement detector 20 of the actuator 16 of the test apparatus main body 12 and the control apparatus main body 36 are connected, and the load detector 30 of the test apparatus main body 12 and the control apparatus main body 36 are connected.

  Further, as shown in FIG. 1, in the test apparatus 10 of this embodiment, an external memory 42 such as a USB memory can be connected to the control device main body 36 of the control device 32.

  On the other hand, the test apparatus 10 of the present invention is provided with an actuator drive source 44 connected to the control device main body 36 of the control device 32 and connected to the actuator 16 of the test device main body 12.

  In the test apparatus 10 of the present invention configured as described above, the test is performed as follows.

  That is, as shown in FIG. 2, the test piece A is placed on the upper surface of the piston 18, and the crosshead 26 is lowered with respect to the piston 18 by the ball screw 24 by a driving mechanism (not shown). The test piece A is sandwiched between the upper surface and the lower surface of the cross head 26.

  Then, based on a program stored in advance in the control device 32, setting of test conditions and the like, execution, and collection of test data are performed.

  That is, as shown in FIG. 1, the actuator drive source 44 connected to the control device 32 is driven under a predetermined condition by the control of the control device 32. As a result, the actuator 16 connected to the actuator drive source 44 is driven under a predetermined condition to give a constant vibration to the test piece A.

  The displacement of the test piece A is detected by the displacement detector 20 provided in the actuator 16, and the displacement data of the test piece A is input to the control device main body 36 of the control device 32. On the other hand, the load applied to the test piece A is detected by the load detector 30 provided in the cross head 26, and the load data applied to the test piece A is input to the control device main body 36 of the control device 32. Yes.

  Further, based on these test data, based on the program of the control device main body 36 of the control device 32, a feedback command signal is output from the control device 32 to the actuator drive source 44, and the actuator drive source 44 is set under a predetermined condition. It is designed to drive.

  By the way, in the test apparatus 10 of the present invention, the test data collected in this way is stored (stored) in an internal memory provided in the control apparatus 32, for example, composed of a hard disk. .

  The test data stored in the internal memory is periodically transferred to an external memory 42 such as a USB memory connected to the control device main body 36 of the control device 32 and automatically stored. It has become so.

  With this configuration, the test data of the test apparatus main body 12 collected by the control device 32 is stored in the internal memory of the control device 32 during the test. Then, the test data stored in the internal memory is periodically transferred to the external memory 42.

  Therefore, even when the control device 32 fails, the test data stored in the internal memory before the control device 32 fails has been transferred to the external memory 42, and data loss of the test data can be prevented. Is possible.

  Further, since the test data of the test apparatus main body 12 collected by the control device 32 is stored in the internal memory during the test, it is possible to prevent the test from being interrupted due to the removal of the external memory 42.

  Further, since the test data stored in the internal memory is automatically transferred to the external memory 42 periodically, the test data is periodically backed up to the external memory outside the test apparatus 10 as in the past. It is not necessary and can be operated easily and quickly even when analyzing test data on an external analysis PC.

  The test data of the test apparatus main body 12 collected by the control device 32 is stored in the internal memory during the test, and the test data stored in the internal memory is automatically stored in the external memory 42 periodically. Since the data is transferred, the influence on the test due to insufficient operation speed of the external memory 42 is small.

As a method of automatically transferring the test data stored in the internal memory to the external memory 42 periodically, the following method is specifically performed.
(1) Method of regularly transferring data to external memory (1-1) Method of periodically transferring data to external memory

  As shown in the flowchart of FIG. 3, first, the test is started in step S1, and in step S2, it is determined whether or not a predetermined period has elapsed after the previous test data is stored (copied) in the external memory 42. Is done.

  In step S2, if a predetermined period has elapsed after copying the previous test data to the external memory 42, the process proceeds to step S4. In step S4, the external memory 42 is attached to the control device 32. It is determined whether or not. If the external memory 42 is attached to the control device 32 in step S4, the process proceeds to step S5. In step S5, the test data up to the present time stored in the internal memory of the control device 32 is stored in the external memory 42. Saved (copied).

  In step S5, the test data up to the present time stored in the internal memory of the control device 32 is stored in the external memory 42. Then, the process proceeds to step S6. In step S6, it is determined whether or not the test is completed. If the test has been completed, a test end process is executed in step S7.

  On the other hand, in step S6, it is determined whether or not the test is finished. If the test is not finished, the process returns to step S2 again, and the previous test data is stored (copied) in the external memory 42. It is determined whether or not a certain period has elapsed, and the above steps are repeated.

  If the external memory 42 is not attached to the control device 32 in step S4, the process proceeds to step S5, and in step S5, it is determined whether or not the test is completed.

  Further, in step S2, after the previous test data is copied to the external memory 42, if a certain period has not elapsed, the process proceeds to step S3, and the previous test data is stored in the external memory 42 in step S3. Thereafter, for the test data stored in the internal memory, it is determined whether or not a certain amount of test data has been stored in the internal memory.

  If it is determined in step S3 that a certain amount of test data has been stored in the internal memory, the process proceeds to step S4, and in step S4, it is determined whether or not the external memory 42 is attached to the control device 32. Thus, the same steps as described above are repeated.

  On the other hand, if it is determined in step S3 that the test data stored in the internal memory after the previous test data is stored in the external memory 42, a certain amount of test data is not stored in the internal memory, Proceeding to step S5, it is determined in step S5 whether or not the test has been completed.

  With this configuration, after copying the previous test data to the external memory 42 in step S2, it is determined whether or not a certain period has elapsed, and if the certain period has elapsed, the internal memory The test data stored in the data is transferred to the external memory 42 after a predetermined time has elapsed.

  Therefore, even when the control device 32 fails, the test data stored in the internal memory before the control device 32 fails has been transferred to the external memory 42, and data loss of the test data can be prevented. This is possible, and the influence on the test due to insufficient operation speed of the external memory 42 is small.

  In step S3, when it is determined that a certain amount of test data is accumulated in the internal memory, and it is determined that a certain amount of test data is accumulated in the internal memory, the test data accumulated in the internal memory is constant. After the amount of test data is accumulated in the internal memory, the data is transferred to the external memory 42.

  Therefore, even when the control device 32 fails, the test data stored in the internal memory before the control device 32 fails has been transferred to the external memory 42, and data loss of the test data can be prevented. This is possible, and the influence on the test due to insufficient operation speed of the external memory 42 is small.

  In this embodiment, after copying the previous test data to the external memory 42 in step S2, it is determined whether or not a certain period has elapsed. In step S3, a certain amount of test data is stored in the internal memory. Although it is configured to determine that the data has been stored in the memory, the order of determination in steps S2 and S3 may be reversed, or only determination of either step S2 or step S3 may be performed. is there.

Further, as shown in FIG. 3, when it is determined in step S4 that the external memory 42 is not attached to the control device 32, as shown in step S8, the user is prompted to connect the external memory 42 to the control device 32. For example, a warning may be displayed by voice, a display lamp, or both so that 42 is attached.
(1-2) Method of transferring data to external memory after completion of test

  The test data is stored in an internal memory provided in the control device 32, for example, composed of a hard disk. Then, as shown in the flowchart of FIG. 4, first, in step S9, a test end process is executed.

  In step S9, after the test end process is executed, the process proceeds to step S10. In step S10, it is determined whether or not the external memory 42 is attached to the control device 32.

  If the external memory 42 is attached to the control device 32 in step S10, the process proceeds to step S11. In step S11, the test data up to the present time stored in the internal memory of the control device 32 is stored in the external memory 42. Saved (copied). Thereafter, in step S14, a test end process is executed.

  On the other hand, if it is determined in step S10 that the external memory 42 is not attached to the control device 32, as shown in step S12, the user may attach the external memory 42 to the control device 32, for example, , Warnings and / or indicator lamps are displayed.

  Thereafter, the process proceeds to step S13, in which it is determined whether or not the user has canceled the copy. If the user cancels the copy in step S13, the process proceeds to step S14, and a test end process is executed.

  On the other hand, if the user does not cancel the copy in step S13, the process proceeds to step S10 again, and the above steps are repeated.

  With this configuration, the test data stored in the internal memory is transferred to the external memory 42 after the test is completed. Therefore, the data transfer is performed at the timing when the apparatus is stopped, and the processing is assumed. There is no effect on the test even if it takes outside time.

In the above embodiment, the method of automatically transferring the test data stored in the internal memory to the external memory 42 has been described. However, the test data stored in the internal memory is as follows. It may be configured such that data is always transferred to an external memory.
(2) Method of always transferring data to external memory

  As shown in the flowchart of FIG. 5, first, a test is started in step S <b> 15, and the test data is stored in an internal memory provided in the control device 32, for example, composed of a hard disk.

  In step S16, it is determined whether or not the external memory 42 is attached to the control device 32.

  If the external memory 42 is attached to the control device 32 in step S16, the process proceeds to step S17. In step S17, the test data up to the present time stored in the internal memory of the control device 32 is stored in the external memory 42. Saved (copied).

  Thereafter, in step S18, it is determined whether or not the test has ended. If it is determined in step S18 that the test has ended, end test end processing is executed in step S19. .

  On the other hand, if it is determined in step S16 that the external memory 42 is not attached to the control device 32, as shown in step S20, the user may attach the external memory 42 to the control device 32, for example, , Warnings and / or indicator lamps are displayed.

  If it is determined in step S18 that the test has not ended, the process proceeds again to step S16. In step S16, it is determined whether or not the external memory 42 is attached to the control device 32. The same steps are repeated.

  With this configuration, the test data of the test apparatus main body 12 collected by the control device 32 is stored in the internal memory during the test. Then, the test data stored in the internal memory is always transferred to the external memory 42.

  Therefore, even when the control device 32 fails, the test data stored in the internal memory before the control device 32 fails has been transferred to the external memory 42, and data loss of the test data can be prevented. Is possible.

  Further, since the test data of the test apparatus main body collected by the control device 32 is stored in the internal memory during the test, it is possible to prevent the test from being interrupted due to the removal of the external memory 42.

  Further, since test data stored in the internal memory is automatically transferred to the external memory 42 at all times, there is no need to regularly back up the test data to the external memory outside the test apparatus as in the prior art. Even when analyzing test data with an external analysis PC, the operation is simple and quick.

  Further, the test data of the test apparatus main body 12 collected by the control device 32 is stored in the internal memory during the test, and the test data stored in the internal memory is always automatically transferred to the external memory 42. Therefore, there is little influence on the test due to an insufficient operation speed of the external memory 42.

  The preferred embodiment of the present invention has been described above, but the present invention is not limited to this. For example, in the above embodiment, the external memory 42 can be connected to the control device main body 36 of the control device 32. For example, the external memory 42 such as a USB memory is used. However, the external memory may be an external memory such as a hard disk or a personal computer that can be connected to the test apparatus 10 via a LAN cable.

  In this way, if the external memory is an external memory that can be connected to the test equipment via a LAN cable, the test data stored in the internal memory can be automatically transferred to the external memory simply by connecting the LAN cable. Therefore, the connection operation is simple, the test data can be prevented from being lost, and the influence on the test due to the lack of operation speed of the external memory is small.

  In this embodiment, the control device 32 and the internal memory are provided in one test control device, and the test device main body 12 and the control device 32 which is a test control device are connected. This makes it convenient to perform various tests by changing the type of the test apparatus main body 12 and connecting it to the test control apparatus (control apparatus 32).

  However, the test apparatus main body 12, the control apparatus 32, and the internal memory may be integrally provided in the test apparatus 10 as surrounded by a frame indicated by a one-dot chain line in FIG.

  With this configuration, the test apparatus main body 12, the control apparatus 32, and the internal memory are the integrated test apparatus 10, which is convenient because it is not necessary to perform wiring or the like.

  Further, in the present invention, the test apparatus 10 may be the test apparatus 10 including the test apparatus main body 12, the control device 32, the internal memory, and the actuator drive source 44, and so on. Various changes can be made without departing from the scope.

The present invention can be applied to various materials such as fatigue tests, durability tests, and characteristic tests performed on materials such as metal materials, resin materials, and composite materials, machine parts such as automobile parts, and finished products. It can be applied to a test apparatus for testing.

DESCRIPTION OF SYMBOLS 10 Test apparatus 12 Test apparatus main body 14 Mounting frame 16 Actuator 18 Piston 20 Displacement detector 22 Guide rod 24 Ball screw 26 Crosshead 28 Upper frame 30 Load detector 32 Controller 34 CRT
36 Control device body 38 Keyboard 40 Mouse 42 External memory 44 Actuator drive source 100 Test device 102 Test device body 104 Control device 106 External memory 108 External analysis personal computer 200 Test device 202 Test device body 204 Control device 206 Internal memory 208 External memory 210 PC A for external analysis Test piece

Claims (9)

A test apparatus main body for performing the test;
A control device for performing setting, execution, collection of test data, etc. for the test apparatus main body,
A test device comprising an internal memory for storing test data collected by the control device,
A test apparatus configured to periodically transfer test data stored in the internal memory to an external memory.   The test apparatus according to claim 1, wherein the test data stored in the internal memory is configured to be transferred to an external memory after a predetermined time has elapsed.   3. The test data stored in the internal memory is configured to be transferred to an external memory after a predetermined amount of test data is stored in the internal memory. The test apparatus according to the above.   The test apparatus according to claim 1, wherein the test data stored in the internal memory is configured to be transferred to an external memory after the test is completed. A test apparatus main body for performing the test;
A control device for performing setting, execution, collection of test data, etc. for the test apparatus main body,
A test device comprising an internal memory for storing test data collected by the control device,
A test apparatus configured to always transfer test data stored in the internal memory to an external memory.   The test apparatus according to claim 1, wherein the external memory is an external memory connectable to a test apparatus.   The test apparatus according to claim 6, wherein the external memory is an external memory connectable to the test apparatus via a LAN cable. The control device and the internal memory are provided in a test control device,
The test apparatus according to claim 1, wherein the test apparatus main body and the test control apparatus are connected.   The test apparatus according to claim 1, wherein the test apparatus main body, the control apparatus, and the internal memory are integrally provided in the test apparatus.

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