JP2013205324A - Head space sample introduction device - Google Patents

Head space sample introduction device Download PDF

Info

Publication number
JP2013205324A
JP2013205324A JP2012076443A JP2012076443A JP2013205324A JP 2013205324 A JP2013205324 A JP 2013205324A JP 2012076443 A JP2012076443 A JP 2012076443A JP 2012076443 A JP2012076443 A JP 2012076443A JP 2013205324 A JP2013205324 A JP 2013205324A
Authority
JP
Japan
Prior art keywords
needle
cleaning
sample
cleaning fluid
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2012076443A
Other languages
Japanese (ja)
Inventor
Akira Aono
晃 青野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2012076443A priority Critical patent/JP2013205324A/en
Publication of JP2013205324A publication Critical patent/JP2013205324A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Sampling And Sample Adjustment (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a head space sample introduction device that can avoid lengthening of cycle time of analysis, clean internal and external surfaces of a needle reliably, and perform analysis accurately in a short time even for analysis of a highly concentrated sample.SOLUTION: A head space sample introduction device includes a cleaning mechanism that cleans internal and external surfaces of a needle 1 for collecting sample gas. The cleaning mechanism includes: a cleaning passage formation member (elevation member 3a) for tightly inserting the tip end of the needle 1 thereinto by a predetermined length by moving towards the needle 1; cleaning fluid supply means (a cleaning fluid supply source 36, a passage 35 and a stop valve SV3) for pressurizing and supplying a cleaning fluid in the cleaning passage formation member to allow the same to flow into the needle 1; and a discharging passage (a passage 20, a six-way valve 21, a measuring pipe 23, a passage 24, a stop valve SV1 and a discharge passage 27) for discharging cleaning fluid. The cleaning mechanism is allowed to operate every time a sample container is replaced.

Description

本発明は、ガスクロマトグラフ等のガス分析装置に試料ガスを導入するための導入装置に関し、更に詳しくは、ヘッドスペース試料導入装置に関する。   The present invention relates to an introduction device for introducing a sample gas into a gas analyzer such as a gas chromatograph, and more particularly to a headspace sample introduction device.

ガスクロマトグラフィにおける分析法の一つにヘッドスペース分析法がある。このヘッドスペース分析法では、液体または固体試料をセプタム蓋付きの試料容器に上部に空間を残した状態で封入し、その状態で前処理として所定温度で所定時間保持した後、試料容器の上部空間の気体(試料ガス)を採取してガスクロマトグラフに導入する。この分析法は、例えば食品中の香料の測定や水中の揮発性有機化合物の測定など、比較的低沸点の成分の測定に適している。   One analysis method in gas chromatography is headspace analysis. In this headspace analysis method, a liquid or solid sample is sealed in a sample container with a septum lid while leaving a space in the upper part. Gas (sample gas) is collected and introduced into a gas chromatograph. This analysis method is suitable for the measurement of components having a relatively low boiling point, such as measurement of flavors in foods and measurement of volatile organic compounds in water.

以上のヘッドスペース分析法を自動的に行うヘッドスペース試料導入装置は、ヘッドスペースオートサンプラとも称され、複数の試料容器を順次試料ガス採取位置に移動させ、その試料ガス採取位置にてニードルを試料容器内に突き刺して上部空間の気体を採取する構成が多用されている。   The headspace sample introduction device that automatically performs the above headspace analysis method is also referred to as a headspace autosampler, which sequentially moves a plurality of sample containers to a sample gas sampling position, and samples the needle at the sample gas sampling position. The structure which stabs in a container and extract | collects the gas of upper space is used abundantly.

図3(A)〜(D)に従来のヘッドスペースガス導入装置における試料ガス採取位置の構成並びにガス採取手順を模式的に例示する。
試料ガス採取位置には細管状のニードル51が配置されており、このニードル51は、ガスクロマトグラフのカラムに通じるループ状の計量管を含む流路にバルブを介して連通するようになっている。試料容器52は、設定された温度で設定された時間だけ加熱された後、そのニードル51の下方に配置された昇降機構53の昇降部材53a上に位置決めされる(図3(A))。
3A to 3D schematically illustrate the configuration of the sample gas sampling position and the gas sampling procedure in the conventional headspace gas introduction device.
A thin tubular needle 51 is arranged at the sample gas sampling position, and this needle 51 communicates with a flow path including a loop-shaped metering tube communicating with a column of the gas chromatograph through a valve. The sample container 52 is heated for a set time at a set temperature, and then positioned on the lifting member 53a of the lifting mechanism 53 disposed below the needle 51 (FIG. 3A).

試料容器52はその頂部がシリコンゴム等の柔軟性部材からなるセプタム52aによって封止されており、昇降機構53の駆動により昇降部材53aが上昇することで、試料容器52頂部のセプタム52aにニードル51が突き刺さり、ニードル51の先端部分が試料容器52の上部空間内に挿入された状態となる(図3(B))。この状態で装置流路内のバルブ群の駆動により、ニードル51を通じて加圧用のガスが試料容器52内に導入され、容器内の圧力が大気圧よりも高くなるように加圧されて、再度バルブ群の駆動によって、試料容器52の上部空間の試料ガスがニードル51を通じて採取される。   The top of the sample container 52 is sealed with a septum 52a made of a flexible member such as silicon rubber, and the elevating member 53a is raised by driving the elevating mechanism 53, so that the needle 51 is attached to the septum 52a at the top of the sample container 52. And the tip of the needle 51 is inserted into the upper space of the sample container 52 (FIG. 3B). In this state, by driving a valve group in the apparatus flow path, a gas for pressurization is introduced into the sample container 52 through the needle 51, the pressure in the container is increased to be higher than the atmospheric pressure, and the valve is again operated. The sample gas in the upper space of the sample container 52 is collected through the needle 51 by driving the group.

試料ガスの採取後、昇降機構53の昇降部材53aが元の位置に下降し(図3(C))、試料容器52を昇降部材53a上から除去した状態で、装置流路を通じてニードル51内に洗浄用のガスが流され、ニードル51内の試料ガスが洗い流される(図3(D))。なお、洗浄用のガスとしては、前記した加圧用のガスと同じガスが用いられ、殊にヘリウムガスなどが採用されることが多い(例えば特許文献1参照)。   After the sample gas is collected, the elevating member 53a of the elevating mechanism 53 is lowered to the original position (FIG. 3C), and the sample container 52 is removed from the elevating member 53a, and enters the needle 51 through the apparatus channel. The cleaning gas is flowed, and the sample gas in the needle 51 is washed away (FIG. 3D). As the cleaning gas, the same gas as the pressurizing gas described above is used, and in particular, helium gas is often used (see, for example, Patent Document 1).

以上の動作を繰り返すことにより、複数の試料容器52が順次試料ガス採取位置に搬送され、順次分析に供される。   By repeating the above operation, the plurality of sample containers 52 are sequentially transported to the sample gas sampling position and are sequentially subjected to analysis.

特開2012−018095号公報JP 2012-018095 A

ところで、ヘッドスペース試料導入装置は、上述のようにニードルを試料容器の上部空間内に突き刺して試料ガスを採取し、次の試料容器が試料ガス採取位置に搬送されるまでの間に、ニードルの内面を含む試料採取用流路の内部を洗浄用ガスを用いて洗浄するのであるが、高濃度の試料の採取に際しては、ニードルはその内面ばかりでなく表面(外面)にも試料成分が付着するため、次の試料の測定までにその付着成分を除去できず、次の測定結果に影響を及ぼす場合があるという問題があった。   By the way, the headspace sample introduction device collects the sample gas by piercing the needle into the upper space of the sample container as described above, and the needle is introduced until the next sample container is transported to the sample gas collection position. The inside of the sampling channel including the inner surface is cleaned using a cleaning gas, but when collecting a high-concentration sample, the sample adheres not only to the inner surface but also to the surface (outer surface) of the needle. For this reason, there is a problem in that the adhering component cannot be removed by the next measurement of the sample, which may affect the next measurement result.

この問題の対策として、従来の試料導入装置においては、ニードルの表面を洗浄するために水を上部まで満たした試料容器を用意し、その試料容器を昇降機構にセットして前述した試料導入操作を行う必要があり、その操作分だけ分析のサイクルタイムが長くなるという問題があった。   As a countermeasure against this problem, in a conventional sample introduction apparatus, a sample container filled with water is prepared to clean the surface of the needle, and the sample container is set in an elevating mechanism to perform the above-described sample introduction operation. There is a problem that the cycle time of analysis becomes longer by the amount of operation.

本発明はこのような実情に鑑みてなされたもので、特に分析のサイクルタイムを長くすることなく、ニードルの内面並びに表面を確実に洗浄することができ、もって高濃度の試料の分析に際しても短時間で正確な分析を行うことのできるヘッドスペース試料導入装置の提供をその課題としている。   The present invention has been made in view of such a situation, and can particularly clean the inner surface and the surface of the needle without prolonging the cycle time of the analysis, so that it is short even when analyzing a high-concentration sample. An object of the present invention is to provide a headspace sample introduction device that can perform accurate analysis in time.

上記の課題を解決するため、本発明のヘッドスペース試料導入装置は、柔軟性部材からなる封止部材により頂部が封止された試料容器内の上部空間に、上記封止部材を貫通してニードルを挿入し、上記上部空間の試料ガスを採取して分析装置に送出するとともに、そのガスの採取および送出動作を試料容器を順次入れ替えて実行するヘッドスペース試料導入装置において、上記ニードルの表面と内面を流体により洗浄する洗浄機構を有し、その洗浄機構は、上記ニードルに向けて移動することにより当該ニードルの先端を所定寸法だけ密に嵌め込む洗浄用流路形成部材と、その洗浄用流路形成部材に対して洗浄用流体を加圧供給して上記ニードル内に流入させる洗浄用流体供給手段と、その洗浄用流体を排出する排出用流路を備えてなり、この洗浄機構は、一つの試料容器からの試料ガスの採取および送出の完了後に自動的に動作するように構成されていることによって特徴づけられる(請求項1)。   In order to solve the above-described problems, the head space sample introduction device of the present invention penetrates the sealing member into the upper space in the sample container whose top is sealed by a sealing member made of a flexible member, and passes through the needle. In the head space sample introduction device, the sample gas in the upper space is collected and sent to the analyzer, and the sampling and sending operation of the gas is executed by sequentially replacing the sample containers. A cleaning mechanism that cleans the needle with a fluid, and the cleaning mechanism moves toward the needle so that the tip of the needle is closely fitted by a predetermined dimension, and the cleaning channel The cleaning member is provided with a cleaning fluid supply means for pressurizing and supplying a cleaning fluid to the forming member and flowing into the needle, and a discharge channel for discharging the cleaning fluid. Cleaning mechanism is characterized by being configured to operate automatically after the completion of the collection and delivery of the sample gas from one sample container (claim 1).

ここで、本発明においては、上記ニードルの下方に、試料容器を搭載し、昇降機構により昇降する昇降部材が配置され、その昇降部材には洗浄用流体の流路が形成され、かつ、その上端面には、当該昇降部材の上昇により上記ニードルが密に嵌まり込んで上記流路内に入り込むシール機構が設けられているとともに、上記流路に洗浄用流体を加圧供給して上記ニードル内に流入させる洗浄用流体供給手段と、ニードル内に流入した洗浄用流体を排出する排出用流路を備えている構成(請求項2)を好適に採用することができる。   Here, in the present invention, a sample container is mounted below the needle, and an elevating member that is moved up and down by an elevating mechanism is disposed. A flow path for a cleaning fluid is formed on the elevating member, The end surface is provided with a seal mechanism in which the needle is tightly fitted by the ascending / descending member and enters the flow path, and a cleaning fluid is pressurized and supplied to the flow path. A configuration (Claim 2) including a cleaning fluid supply unit that flows into the needle and a discharge channel that discharges the cleaning fluid that flows into the needle can be suitably employed.

本発明は、ニードルの内面および表面を同時に洗浄する洗浄機構を設け、その洗浄機構を、一つの試料容器から試料ガスを採取した後、次の試料容器からの試料ガスを採取するまでの間に自動的に動作させることで、課題を解決するものである。   The present invention provides a cleaning mechanism for simultaneously cleaning the inner surface and the surface of the needle, and the cleaning mechanism is used to collect sample gas from one sample container and then collect sample gas from the next sample container. The problem is solved by operating automatically.

すなわち、ニードルの先端を所定寸法だけ密に嵌め込んで洗浄用流体をニードル内に供給することにより、ニードルは内面とともに先端所定寸法の表面とが一度に洗浄される。この洗浄動作を一つの試料容器から試料ガスを採取し終えた時点で実行することで、特に洗浄のために分析時間を延長することなく、ニードルの内面と表面の洗浄を行うことができる。   That is, when the tip of the needle is closely fitted by a predetermined size and the cleaning fluid is supplied into the needle, the needle is cleaned together with the inner surface together with the surface of the tip of the predetermined size. By executing this cleaning operation when sample gas has been collected from one sample container, the inner surface and the surface of the needle can be cleaned without extending the analysis time especially for cleaning.

また、請求項2に係る発明は、試料ガス採取位置に試料容器の昇降機構を備えた装置に適用可能な構成であり、試料容器を載せて昇降する昇降部材を、ニードルが嵌まり込んだ状態で洗浄用流体を加圧供給するための部材として共用させるものである。すなわち、昇降部材に洗浄用流体の流路を設けるとともに、この昇降部材の頂部には、当該昇降部材が上昇したときにニードルが密に嵌まり込むシール機構を設け、この昇降部材を介してニードル内に洗浄用流体を供給する。これにより、ニードルの内面と表面を一度に洗浄することができ、しかもニードル洗浄のための特別の部材や移動機構を必要としないという利点がある。   Further, the invention according to claim 2 is a configuration applicable to an apparatus including a sample container lifting mechanism at a sample gas sampling position, in which a needle is fitted into a lifting member that moves up and down by placing a sample container. It is used as a member for supplying the cleaning fluid under pressure. That is, a flow path for the cleaning fluid is provided in the elevating member, and a seal mechanism in which the needle is closely fitted when the elevating member is raised is provided at the top of the elevating member. A cleaning fluid is supplied inside. Thereby, the inner surface and the surface of the needle can be cleaned at a time, and there is an advantage that a special member and a moving mechanism for cleaning the needle are not required.

本発明によれば、試料ガスを採取するためのニードルの先端所定寸法を洗浄用流路に密に嵌め込んだ状態で、その洗浄用流路に洗浄用流体を加圧供給することにより、ニードルの内面と表面を一度に洗浄し、その動作を一つの試料容器から試料ガスの採取を終えるごとに実行するので、高濃度の試料の測定に際しても、ニードルに付着した前の試料の成分がその試料の採取直後に確実に除去された状態で次に試料の測定に移行することができ、しかも、従来の試料容器に水を満たして試料採取動作を行うことでニードルの洗浄を行う場合のように洗浄動作が分析のサイクルタイムを長くすることがなく、全体としての分析時間を短くすることができる。   According to the present invention, by supplying a cleaning fluid under pressure to the cleaning flow channel in a state where a predetermined dimension of the tip of the needle for collecting the sample gas is closely fitted in the cleaning flow channel, The inner surface and the surface of the sample are cleaned at once, and the operation is performed every time sampling of the sample gas from one sample container is completed, so even when measuring a high concentration sample, the components of the sample before adhering to the needle The sample can be transferred to the next measurement after it has been removed immediately after the sample is collected, and the needle is washed by filling the sample container with water and performing the sample collection operation. In addition, the cleaning operation does not increase the cycle time of the analysis, and the analysis time as a whole can be shortened.

また、請求項2に係る発明のように、試料容器をニードルに対して昇降させる昇降機構の昇降部材に洗浄用流路を形成し、その昇降部材の上昇によりニードルを洗浄用流路に密に嵌め込んで洗浄用流体を加圧供給する構成を採用することにより、流路形成部材を別途設ける必要がなく、洗浄機構の追加に伴う装置構成の複雑化を避けることができる。   Further, as in the invention according to claim 2, the cleaning channel is formed in the lifting member of the lifting mechanism that lifts and lowers the sample container with respect to the needle, and the needle is tightly connected to the cleaning channel by the lifting member. By adopting a configuration in which the cleaning fluid is pressurized and supplied, it is not necessary to separately provide a flow path forming member, and it is possible to avoid complication of the apparatus configuration due to the addition of the cleaning mechanism.

本発明の実施形態における試料ガス採取位置の構成と、その動作手順を表す模式図。The schematic diagram showing the structure of the sample gas sampling position in embodiment of this invention, and its operation | movement procedure. 本発明の実施形態におけるヘッドスペース試料導入装置の流路構成と、六方バルブの内部流路位置の切り替え後の状態を示す図。The figure which shows the state after switching of the flow-path structure of the head space sample introduction apparatus in embodiment of this invention, and the internal flow-path position of a six-way valve. 従来のヘッドスペース試料導入装置における試料ガス採取位置の構成と、その動作手順を表す模式図。The schematic diagram showing the structure of the sample gas sampling position in the conventional head space sample introduction apparatus, and its operation | movement procedure.

以下、図面を参照しつつ本発明の実施の形態について説明する。図1(A)〜(E)は本発明の実施の形態における試料ガス採取位置の模式的構成図と、その動作手順を表す図であり、図2(A)はヘッドスペース試料導入装置全体の流路構成図であり、同図(B)はその六方バルブ21の内部流路の位置を切り替えた後の状態を示す図である。   Hereinafter, embodiments of the present invention will be described with reference to the drawings. 1A to 1E are a schematic configuration diagram of a sample gas sampling position and an operation procedure thereof in the embodiment of the present invention, and FIG. 2A is a diagram of the entire headspace sample introduction apparatus. It is a flow-path block diagram, The figure (B) is a figure which shows the state after switching the position of the internal flow path of the six-way valve 21. FIG.

まず、図2を参照して本発明の実施の形態のヘッドスペース試料導入装置の流路構成について述べる。
図2において1は細管状のニードルであり、このニードル1の細管は流路20を介して六方バルブ21のポートaに接続されている。六方バルブ21のポートbは流路22を介してループ状の計量管23一端に連通し、その計量管23の他端は流路24を介して六方バルブ21のポートeに接続されている。また、六方バルブ21のポートfは分岐管25、26を経てストップバルブSV1に連通し、このストップバルブSV1は排気流路27に連通している。また、同じくポートfは分岐管25を介してストップバルブSV2にも繋がっており、このストップバルブSV2は圧力調整装置29に繋がる加圧流路30に連通している。六方バルブ21のポートcは流路31を介してガスクロマトグラフのカラム32に連通しているとともに、ポートdは流路33を通じて流量調整装置34に連通し、この流量調整装置34を通じてキャリアガス源(図示略)に連通している。また、図2では一部を省略しているが、以下に示す昇降部材3a内に形成された洗浄用流路3cに連通する流路35が設けられており、この流路35はストップバルブSV3を介して洗浄用流体供給源36に連通している。
First, the flow path configuration of the head space sample introduction device according to the embodiment of the present invention will be described with reference to FIG.
In FIG. 2, reference numeral 1 denotes a thin tubular needle, and the thin tube of the needle 1 is connected to a port a of the hexagonal valve 21 through a flow path 20. The port b of the hexagonal valve 21 communicates with one end of a loop-shaped measuring tube 23 via a flow path 22, and the other end of the measuring pipe 23 is connected to the port e of the hexagonal valve 21 via a flow path 24. Further, the port f of the hexagonal valve 21 communicates with the stop valve SV1 through the branch pipes 25 and 26, and the stop valve SV1 communicates with the exhaust passage 27. Similarly, the port f is also connected to the stop valve SV2 via the branch pipe 25, and the stop valve SV2 is connected to the pressurizing flow path 30 connected to the pressure adjusting device 29. The port c of the hexagonal valve 21 communicates with the gas chromatograph column 32 via the flow path 31, and the port d communicates with the flow rate adjustment device 34 via the flow path 33, and the carrier gas source ( (Not shown). Further, although a part is omitted in FIG. 2, a flow path 35 communicating with a cleaning flow path 3c formed in the elevating member 3a shown below is provided, and this flow path 35 is a stop valve SV3. To the cleaning fluid supply source 36.

図2(A)における六方バルブ21は、同図に示すロード位置と、図2(B)に示すインジェクト位置とに切り替わるように動作する。   The six-way valve 21 in FIG. 2A operates so as to switch between the load position shown in FIG. 2 and the injection position shown in FIG.

図2のニードル1の下方が試料ガス採取位置であり、このニードル1の下方に、所定温度で所定時間保持された試料容器が配置された状態で、試料ガスの採取動作が実行される。なお、図示は省略するが、この試料ガス採取位置にも試料容器の保温機構が設けられており、試料容器の保温は継続される。   A sample gas collection position is below the needle 1 in FIG. 2, and a sample gas collection operation is performed below the needle 1 with a sample container held at a predetermined temperature for a predetermined time. In addition, although illustration is abbreviate | omitted, the heat retention mechanism of the sample container is also provided in this sample gas collection position, and the heat retention of the sample container is continued.

次に、図1を参照して、試料ガス採取位置における装置構成を説明する。試料ガス採取位置には、例えばラックピニオン機構からなる昇降機構3が設けられており、この昇降機構3は、試料容器2を搭載して昇降する昇降部材3aと、その昇降部材3aの側面に形成されたラック(図示略)に噛み合うピニオンギア3bを主体として構成されている。試料ガスを採取すべき試料容器2は、順次昇降部材3aの上に載せられ、試料ガスの採取に供される。   Next, referring to FIG. 1, the apparatus configuration at the sample gas sampling position will be described. An elevating mechanism 3 made of, for example, a rack and pinion mechanism is provided at the sample gas collection position, and this elevating mechanism 3 is formed on an elevating member 3a for elevating and lowering the sample container 2 and on a side surface of the elevating member 3a. A pinion gear 3b that meshes with a rack (not shown) is mainly used. The sample container 2 from which the sample gas is to be collected is sequentially placed on the elevating member 3a and used for collecting the sample gas.

昇降部材3aには、その中心線に沿うように洗浄用流路3cが形成されており、この洗浄用流路3cは昇降部材3aを上下に貫通するように形成され、その下端側は前記した流路35に連通し、ストップバルブSV3を介して洗浄用流体供給源に繋がれている。洗浄用流路3cの上端側は昇降部材3aの上端面に向けて開口しており、その開口部分には耐熱Oリング3dが装着されている。   The elevating member 3a is formed with a cleaning channel 3c along the center line thereof, and the cleaning channel 3c is formed so as to penetrate the elevating member 3a up and down, and the lower end side thereof is described above. It communicates with the flow path 35 and is connected to a cleaning fluid supply source via a stop valve SV3. The upper end side of the cleaning channel 3c opens toward the upper end surface of the elevating member 3a, and a heat-resistant O-ring 3d is attached to the opening.

試料容器2は従来のものと同様であり、容器本体の頂部にシリコンゴム等の柔軟性部材からなるセプタム2aが被せられることによって、気密に封止される構造となっている。   The sample container 2 is the same as the conventional one, and has a structure that is hermetically sealed by covering the top of the container body with a septum 2a made of a flexible member such as silicon rubber.

以上の構成からなる本発明の実施の形態の動作について図1(A)〜(E)を参照しつつ説明する。   The operation of the embodiment of the present invention having the above configuration will be described with reference to FIGS.

まず、一定温度で一定時間保温された試料容器2は、その上部空間に揮発した試料成分を含む試料ガスを採取すべく、図1(A)に示すように試料ガス採取位置の昇降部材3a上に置かれる。このとき、六方バルブ21は図2(A)のロード位置で、ストップバルブSV1、SV2およびSV3はともに閉である。   First, the sample container 2 kept at a constant temperature for a certain period of time is placed on the elevating member 3a at the sample gas collection position as shown in FIG. 1A in order to collect the sample gas containing the sample components volatilized in the upper space. Placed in. At this time, the six-way valve 21 is at the load position shown in FIG. 2A, and the stop valves SV1, SV2, and SV3 are all closed.

次に、図1(B)に示すように、昇降機構3を駆動して昇降部材3aを上昇させる。これにより、試料容器2の頂部のセプタム2aにニードル1が突き刺さり、ニードル1の先端所定寸法が試料容器2の上部空間内に挿入された状態となる。このとき、六方バルブ21は図2(A)のロード位置を保ち、その状態でストップバルブSV2を開くことにより、圧力調整装置29から圧力ガスが加圧流路30を通って計量管23を経てニードル1内に流入し、試料容器2内を加圧する。次いでストップバルブSV2を閉じ、ストップバルブSV1を開くことにより、試料容器2内の試料ガスは計量管23を通って排気流路27に流れる。その後、ストップバルブSV1を閉じ、六方バルブ21を図2(B)のインジェクト位置に切り替えることで、計量管21内の試料ガスは圧力調整装置29から供給されるガスによってガスクロマトグラフのカラム32に導入され、これによって試料ガスの採取を完了する。   Next, as shown in FIG. 1B, the elevating mechanism 3 is driven to raise the elevating member 3a. As a result, the needle 1 pierces the septum 2 a at the top of the sample container 2, and a predetermined tip end of the needle 1 is inserted into the upper space of the sample container 2. At this time, the hexagonal valve 21 maintains the load position shown in FIG. 2A and opens the stop valve SV2 in this state, so that the pressure gas from the pressure adjusting device 29 passes through the pressurizing passage 30 and the needle through the metering pipe 23. 1 flows into the sample container 2 and pressurizes the sample container 2. Next, the stop valve SV2 is closed and the stop valve SV1 is opened, whereby the sample gas in the sample container 2 flows into the exhaust passage 27 through the measuring tube 23. Thereafter, the stop valve SV1 is closed and the hexagonal valve 21 is switched to the injection position shown in FIG. 2B, so that the sample gas in the measuring tube 21 is supplied to the column 32 of the gas chromatograph by the gas supplied from the pressure adjusting device 29. This completes the sampling of the sample gas.

試料ガスの採取完了後、図1(C)に示すように昇降機構3を駆動して昇降部材3aを下降させた後、図1(D)に示すように、試料容器2を昇降部材3aの上から除去(返却)するとともに、図2の流路構成においては六方バルブ21を元のロード位置に切り替える。   After the sampling of the sample gas is completed, the lifting mechanism 3 is driven as shown in FIG. 1C to lower the lifting member 3a, and then the sample container 2 is moved to the lifting member 3a as shown in FIG. 1D. While removing (returning) from above, the six-way valve 21 is switched to the original load position in the flow path configuration of FIG.

次に、昇降機構3を駆動して、昇降部材3aを上昇させる。この上昇量は、試料ガス採取時の上昇量よりも大きく、図1(E)に示すように、ニードル1の先端所定寸法が昇降部材3aに形成された洗浄用流路3c内に嵌まり込む状態まで上昇させる。このとき、ニードル1の外周面が、昇降部材3aの頂部に設けられた耐熱Oリング3dの内側に密着した状態となり、洗浄用流路3cの上端開口部分はニードル1と耐熱Oリング3dによって封止された状態となる。   Next, the elevating mechanism 3 is driven to raise the elevating member 3a. This rising amount is larger than the rising amount at the time of sampling the sample gas, and as shown in FIG. 1 (E), the predetermined dimension of the tip of the needle 1 is fitted into the cleaning channel 3c formed in the lifting member 3a. Raise to state. At this time, the outer peripheral surface of the needle 1 is in close contact with the inside of the heat-resistant O-ring 3d provided at the top of the elevating member 3a, and the upper end opening of the cleaning channel 3c is sealed by the needle 1 and the heat-resistant O-ring 3d. It will be stopped.

その状態でストップバルブSV3を開くとともに、ストップバルブSV1を開く。これにより、洗浄用流体供給源36からストップバルブSV1、洗浄用流路35を介して昇降部材3a内の洗浄用流路3cに洗浄用流体が加圧供給され、その洗浄用流体がニードル1の先端からその内部に流入し、その洗浄用流体流路20、六方バルブ21のポートa、同じくポートb流路22、計量管23、流路24、分期間25、26を介して排気流路27から排出される。   In this state, the stop valve SV3 is opened and the stop valve SV1 is opened. As a result, the cleaning fluid is pressurized and supplied from the cleaning fluid supply source 36 to the cleaning flow path 3c in the elevating member 3a via the stop valve SV1 and the cleaning flow path 35. It flows into the inside from the tip, and the exhaust fluid flow path 20, the port a of the hexagonal valve 21, the port b flow path 22, the measuring pipe 23, the flow path 24, and the minute periods 25 and 26, and the exhaust flow path 27 Discharged from.

以上の動作により、ニードル1の内面と上記した計量管23等を含む各流路の内部が洗浄用流体により洗浄されると同時に、ニードル1の表面についても、洗浄用流路3c内で加圧された洗浄用流体に曝されて洗浄される。したがって、ニードル1の内面および表面は、ともに試料ガスの採取直後に洗浄されることになる。その間、既に採取した試料ガスの分析が行われているため、次の試料容器が試料ガス採取位置に搬送されるまでの間にニードル1の内面および表面の洗浄が完了した状態となり、この洗浄に伴うサイクルタイムの延長は要しない。   With the above operation, the inner surface of the needle 1 and the inside of each flow path including the above-described measuring tube 23 and the like are cleaned with the cleaning fluid, and at the same time, the surface of the needle 1 is pressurized in the cleaning flow path 3c. The exposed cleaning fluid is exposed to cleaning. Therefore, both the inner surface and the surface of the needle 1 are cleaned immediately after sampling the sample gas. In the meantime, since the collected sample gas has been analyzed, the cleaning of the inner surface and the surface of the needle 1 is completed before the next sample container is transported to the sample gas sampling position. The accompanying cycle time is not extended.

ここで、洗浄用流体については特に限定されることはなく、気体および液体のいずれであってもよく、気体とする場合には例えばヘリウムガス等、また、液体とする場合には例えば純水等を用いることができる。   Here, the cleaning fluid is not particularly limited and may be either a gas or a liquid. For example, helium gas is used for the gas, and pure water is used for the liquid. Can be used.

また、以上の実施の形態においては、昇降機構3の昇降部材3aに洗浄用流路3cを形成してそこにニードル1を挿入する例を示したが、本発明はその構成に限定されず、昇降部材3aとは別に洗浄用流路の形成部材を設け、その洗浄用流路の形成部材をニードルの先端が嵌まり込むように移動させる機構を別途設けてもよい。ただし、洗浄用流路の形成部材を昇降機構3の昇降部材3aと共用させて、昇降機構3の駆動により洗浄用流路3c内にニードル1を挿入する上記した実施の形態の構成の採用により、装置構成を簡素化することができるという利点がある。   Moreover, in the above embodiment, although the example which forms the flow path 3c for washing | cleaning in the raising / lowering member 3a of the raising / lowering mechanism 3 and inserts the needle 1 there was shown, this invention is not limited to the structure, A cleaning flow path forming member may be provided separately from the elevating member 3a, and a mechanism for moving the cleaning flow path forming member so that the tip of the needle is fitted may be separately provided. However, by adopting the configuration of the above-described embodiment in which the cleaning channel forming member is shared with the lifting member 3 a of the lifting mechanism 3 and the needle 1 is inserted into the cleaning channel 3 c by driving the lifting mechanism 3. There is an advantage that the apparatus configuration can be simplified.

1 ニードル
2 試料容器
2a セプタム
3 昇降機構
3a 昇降部材
3b ピニオンギア
3c 洗浄用流路
3d 耐熱Oリング
20、22,24,31,33 流路
21 六方バルブ
23 計量管
25,26 分岐管
27 排気流路
29 圧力調整装置
32 カラム
34 流量調整装置
35 洗浄用流路
SV1,SV2,SV3 ストップバルブ
DESCRIPTION OF SYMBOLS 1 Needle 2 Sample container 2a Septum 3 Elevating mechanism 3a Elevating member 3b Pinion gear 3c Cleaning flow path 3d Heat-resistant O-ring 20, 22, 24, 31, 33 Flow path 21 Hexagonal valve 23 Measuring pipe 25, 26 Branch pipe 27 Exhaust flow Channel 29 Pressure regulator 32 Column 34 Flow rate regulator 35 Cleaning channel SV1, SV2, SV3 Stop valve

Claims (2)

柔軟性部材からなる封止部材により頂部が封止された試料容器内の上部空間に、上記封止部材を貫通してニードルを挿入し、上記上部空間の試料ガスを採取して分析装置に送出するとともに、そのガスの採取および送出動作を試料容器を順次入れ替えて実行するヘッドスペース試料導入装置において、
上記ニードルの表面と内面を流体により洗浄する洗浄機構を有し、その洗浄機構は、上記ニードルに向けて移動することにより当該ニードルの先端を所定寸法だけ密に嵌め込む洗浄用流路形成部材と、その洗浄用流路形成部材に対して洗浄用流体を加圧供給して上記ニードル内に流入させる洗浄用流体供給手段と、その洗浄用流体を排出する排出用流路を備えてなり、この洗浄機構は、一つの試料容器からの試料ガスの採取および送出の完了後に自動的に動作するように構成されていることを特徴とするヘッドスペース試料導入装置。
A needle is inserted through the sealing member into the upper space in the sample container whose top is sealed by a sealing member made of a flexible member, and the sample gas in the upper space is collected and sent to the analyzer. In addition, in the headspace sample introduction apparatus that performs the sampling and delivery operation of the gas by sequentially exchanging the sample containers,
A cleaning mechanism for cleaning a surface and an inner surface of the needle with a fluid, and the cleaning mechanism includes a cleaning flow path forming member that fits the tip of the needle densely by a predetermined dimension by moving toward the needle. A cleaning fluid supply means for pressurizing and supplying a cleaning fluid to the cleaning channel forming member and flowing into the needle, and a discharge channel for discharging the cleaning fluid. The head space sample introduction device, wherein the cleaning mechanism is configured to automatically operate after completion of collection and delivery of the sample gas from one sample container.
上記ニードルの下方に、試料容器を搭載し、昇降機構により昇降する昇降部材が配置され、その昇降部材には洗浄用流体の流路が形成され、かつ、その上端には、当該昇降部材の上昇により上記ニードルが密に嵌まり込んで上記流路内に入り込むシール機構が設けられているとともに、上記流路に洗浄用流体を加圧供給して上記ニードル内に流入させる洗浄用流体供給手段と、ニードル内に流入した洗浄用流体を排出する排出用流路を備えていることを特徴とする請求項1に記載のヘッドスペース試料導入装置。 An elevating member mounted with a sample container and elevating and lowering by an elevating mechanism is disposed below the needle. A flow path for a cleaning fluid is formed in the elevating member, and the elevating member is raised at the upper end. And a cleaning fluid supply means for pressurizing and supplying a cleaning fluid to the flow path and flowing into the needle. The headspace sample introduction device according to claim 1, further comprising a discharge channel for discharging the cleaning fluid that has flowed into the needle.
JP2012076443A 2012-03-29 2012-03-29 Head space sample introduction device Pending JP2013205324A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012076443A JP2013205324A (en) 2012-03-29 2012-03-29 Head space sample introduction device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012076443A JP2013205324A (en) 2012-03-29 2012-03-29 Head space sample introduction device

Publications (1)

Publication Number Publication Date
JP2013205324A true JP2013205324A (en) 2013-10-07

Family

ID=49524533

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012076443A Pending JP2013205324A (en) 2012-03-29 2012-03-29 Head space sample introduction device

Country Status (1)

Country Link
JP (1) JP2013205324A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113396324A (en) * 2019-02-12 2021-09-14 曾田香料株式会社 Method for evaluating volatile component and apparatus for the same
CN115060830A (en) * 2022-07-05 2022-09-16 云南大理天新包装材料有限公司 Method for detecting VOCs solvent residues of paper

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113396324A (en) * 2019-02-12 2021-09-14 曾田香料株式会社 Method for evaluating volatile component and apparatus for the same
CN113396324B (en) * 2019-02-12 2024-04-16 曾田香料株式会社 Method for evaluating volatile component and device for the method
CN115060830A (en) * 2022-07-05 2022-09-16 云南大理天新包装材料有限公司 Method for detecting VOCs solvent residues of paper

Similar Documents

Publication Publication Date Title
CN102634448B (en) Biological sampling swab
JP5182257B2 (en) Total organic carbon measuring device
KR101497641B1 (en) Apparatus for analyte sampling, method of analyte sampling and analyte sampling analysis system
EP2668988B1 (en) Channel bubble reduction device, channel bubble reduction program, channel bubble reduction method, liquid provision device and chromatography device
CN110243974A (en) Gas chromatographic detection device and gas-chromatography detection system
JP2016114456A (en) Headspace autosampler and gas analysis system using the same
JP2013205324A (en) Head space sample introduction device
CN202558865U (en) Biology sampling swab
CN106345142B (en) A kind of solid-phase extraction device
WO2014005463A1 (en) Sampling needle automatic washing apparatus and method therefor
CN107063771B (en) Dialysis machine water inlet sampler
KR920015127A (en) Groundwater Sampling and Inspection Apparatus and Method
WO2017113625A1 (en) Multi-channel headspace extracting needle
JP2020173253A (en) Method for measuring content of oxygen in head space in container
CN103454362B (en) Online chromatographic reduced-pressure sample injection method
JP5841684B1 (en) BOD analyzer
CN102632057B (en) Cleaning device for capillary tube of automatic sampler and cleaning method
CN202506637U (en) Capillary tube cleaning device for automatic sample feeding device
CN108487906A (en) A kind of well mouth of oil well hydrogen sulfide enclosed sampling and detection device and method
CN203443940U (en) Online chromatogram decompression sampling device
CN203101325U (en) Measuring and cleaning device suitable for detection of trace elements
CN208026508U (en) A kind of medical test sampler
JP6609108B2 (en) Liquid sample injection method
CN107044918B (en) Stool sampling and checking device
JP6710951B2 (en) Water quality analyzer