JP2013181914A5 - - Google Patents
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- JP2013181914A5 JP2013181914A5 JP2012047247A JP2012047247A JP2013181914A5 JP 2013181914 A5 JP2013181914 A5 JP 2013181914A5 JP 2012047247 A JP2012047247 A JP 2012047247A JP 2012047247 A JP2012047247 A JP 2012047247A JP 2013181914 A5 JP2013181914 A5 JP 2013181914A5
- Authority
- JP
- Japan
- Prior art keywords
- rays
- wall
- enter
- kumaco
- kumakov
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Description
従来、広い範囲に出射したX線を集光できるクマコフレンズが知られている。クマコフレンズはポリキャピラリを集積したハニカム構造を有し、ガラス管を束ねて繰り返し引き延ばして作られ、微細で平行な孔が無数に開いている。このような微細な孔にX線が入射した場合、小さい角度で入ってきたX線は壁で全反射し通過するが、それ以外は壁に吸収される。これを利用してX線の軌道をキャピラリに沿って曲げることにより、レンズを構成することができる。 Conventionally, Kumakov lenses that can collect X-rays emitted in a wide range are known. Kumaco Friends have a honeycomb structure in which polycapillaries are integrated, are made by bundling glass tubes and stretching them repeatedly, and have numerous fine parallel holes. When X-rays enter such a fine hole, X-rays that enter at a small angle are totally reflected by the wall and pass through, but the rest are absorbed by the wall. By utilizing this, the lens can be constructed by bending the X-ray trajectory along the capillary.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012047247A JP5695589B2 (en) | 2012-03-02 | 2012-03-02 | X-ray intensity correction method and X-ray diffraction apparatus |
GB1219021.1A GB2496484B (en) | 2011-11-11 | 2012-10-23 | X-Ray intensity correction method and x-ray diffractometer |
US13/662,082 US9086367B2 (en) | 2011-11-11 | 2012-10-26 | X-ray intensity correction method and X-ray diffractometer |
DE102012220235A DE102012220235A1 (en) | 2011-11-11 | 2012-11-07 | X-ray intensity correction method and X-ray diffractometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012047247A JP5695589B2 (en) | 2012-03-02 | 2012-03-02 | X-ray intensity correction method and X-ray diffraction apparatus |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2013181914A JP2013181914A (en) | 2013-09-12 |
JP2013181914A5 true JP2013181914A5 (en) | 2014-05-15 |
JP5695589B2 JP5695589B2 (en) | 2015-04-08 |
Family
ID=49272646
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012047247A Expired - Fee Related JP5695589B2 (en) | 2011-11-11 | 2012-03-02 | X-ray intensity correction method and X-ray diffraction apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP5695589B2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6256152B2 (en) * | 2014-03-28 | 2018-01-10 | 株式会社島津製作所 | X-ray measuring device |
JP6351740B2 (en) * | 2014-10-14 | 2018-07-04 | 株式会社リガク | X-ray thin film inspection equipment |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2242748C1 (en) * | 2003-08-19 | 2004-12-20 | Общество с ограниченной ответственностью "Институт рентгеновской оптики" | Detecting assembly for x-ray diffraction measurements |
JP2007017258A (en) * | 2005-07-07 | 2007-01-25 | Rigaku Corp | Composite analyzer and composite analyzing method |
JP4871060B2 (en) * | 2006-08-03 | 2012-02-08 | トヨタ自動車株式会社 | Analysis equipment |
JP5788153B2 (en) * | 2010-07-28 | 2015-09-30 | 株式会社リガク | X-ray diffraction method and portable X-ray diffractometer using the same |
-
2012
- 2012-03-02 JP JP2012047247A patent/JP5695589B2/en not_active Expired - Fee Related
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