JP2013181914A5 - - Google Patents

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Publication number
JP2013181914A5
JP2013181914A5 JP2012047247A JP2012047247A JP2013181914A5 JP 2013181914 A5 JP2013181914 A5 JP 2013181914A5 JP 2012047247 A JP2012047247 A JP 2012047247A JP 2012047247 A JP2012047247 A JP 2012047247A JP 2013181914 A5 JP2013181914 A5 JP 2013181914A5
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JP
Japan
Prior art keywords
rays
wall
enter
kumaco
kumakov
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JP2012047247A
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Japanese (ja)
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JP5695589B2 (en
JP2013181914A (en
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Priority to JP2012047247A priority Critical patent/JP5695589B2/en
Priority claimed from JP2012047247A external-priority patent/JP5695589B2/en
Priority to GB1219021.1A priority patent/GB2496484B/en
Priority to US13/662,082 priority patent/US9086367B2/en
Priority to DE102012220235A priority patent/DE102012220235A1/en
Publication of JP2013181914A publication Critical patent/JP2013181914A/en
Publication of JP2013181914A5 publication Critical patent/JP2013181914A5/ja
Application granted granted Critical
Publication of JP5695589B2 publication Critical patent/JP5695589B2/en
Expired - Fee Related legal-status Critical Current
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従来、広い範囲に出射したX線を集光できるクマコフレンズが知られている。クマコフレンズはポリキャピラリを集積したハニカム構造を有し、ガラス管を束ねて繰り返し引き延ばして作られ、微細で平行な孔が無数に開いている。このような微細な孔にX線が入射した場合、小さい角度で入ってきたX線は壁で全反射し通過するが、それ以外は壁に吸収される。これを利用してX線の軌道をキャピラリに沿って曲げることにより、レンズを構成することができる。 Conventionally, Kumakov lenses that can collect X-rays emitted in a wide range are known. Kumaco Friends have a honeycomb structure in which polycapillaries are integrated, are made by bundling glass tubes and stretching them repeatedly, and have numerous fine parallel holes. When X-rays enter such a fine hole, X-rays that enter at a small angle are totally reflected by the wall and pass through, but the rest are absorbed by the wall. By utilizing this, the lens can be constructed by bending the X-ray trajectory along the capillary.

JP2012047247A 2011-11-11 2012-03-02 X-ray intensity correction method and X-ray diffraction apparatus Expired - Fee Related JP5695589B2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2012047247A JP5695589B2 (en) 2012-03-02 2012-03-02 X-ray intensity correction method and X-ray diffraction apparatus
GB1219021.1A GB2496484B (en) 2011-11-11 2012-10-23 X-Ray intensity correction method and x-ray diffractometer
US13/662,082 US9086367B2 (en) 2011-11-11 2012-10-26 X-ray intensity correction method and X-ray diffractometer
DE102012220235A DE102012220235A1 (en) 2011-11-11 2012-11-07 X-ray intensity correction method and X-ray diffractometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012047247A JP5695589B2 (en) 2012-03-02 2012-03-02 X-ray intensity correction method and X-ray diffraction apparatus

Publications (3)

Publication Number Publication Date
JP2013181914A JP2013181914A (en) 2013-09-12
JP2013181914A5 true JP2013181914A5 (en) 2014-05-15
JP5695589B2 JP5695589B2 (en) 2015-04-08

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Family Applications (1)

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JP2012047247A Expired - Fee Related JP5695589B2 (en) 2011-11-11 2012-03-02 X-ray intensity correction method and X-ray diffraction apparatus

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JP (1) JP5695589B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6256152B2 (en) * 2014-03-28 2018-01-10 株式会社島津製作所 X-ray measuring device
JP6351740B2 (en) * 2014-10-14 2018-07-04 株式会社リガク X-ray thin film inspection equipment

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2242748C1 (en) * 2003-08-19 2004-12-20 Общество с ограниченной ответственностью "Институт рентгеновской оптики" Detecting assembly for x-ray diffraction measurements
JP2007017258A (en) * 2005-07-07 2007-01-25 Rigaku Corp Composite analyzer and composite analyzing method
JP4871060B2 (en) * 2006-08-03 2012-02-08 トヨタ自動車株式会社 Analysis equipment
JP5788153B2 (en) * 2010-07-28 2015-09-30 株式会社リガク X-ray diffraction method and portable X-ray diffractometer using the same

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