JP2013152748A - Circuit design apparatus and circuit design program - Google Patents

Abstract

PROBLEM TO BE SOLVED: To efficiently improve static noise by means of a GUI function.SOLUTION: All wiring having a wiring section to be a noise check target of wiring of interest specified are extracted as influencing wiring, and all the influencing wiring are displayed together with the wiring of interest on a display unit 30. Slack values of each of the wiring of interest and the influencing wiring are calculated on the basis of a delay value and a maximum allowable delay value of each wiring, and slack values calculated for each wiring are displayed corresponding to each wiring on the display unit 30.

Description

  This case relates to a circuit design apparatus and a circuit design program.

  In general, in layout hierarchical design as a physical design of an integrated circuit such as an LSI (Large Scale Integrated circuit), static noise check (parallel wiring length) is performed based on the wiring data at the time of cell placement and inter-cell wiring. Check) is executed. The static noise check is performed by executing a batch type program, and the operator corrects the wiring by referring to the check result. Here, the batch type program is used because the amount of wiring data to be handled is enormous in order to check all the nets in the integrated circuit to be designed as the wiring to be checked (Victim net). .

  At this time, the check result is taken into a CAD (Computer Aided Design) system having a GUI (Graphical User Interface) function, and the wiring pair of the check target wiring and the influence wiring is displayed, or the check target wiring is based on the check result. A technique is known in which the wiring pair is corrected and the wiring pair after the correction is rechecked.

JP-A-6-243197

  However, even if the wiring to be checked is corrected in the dark cloud according to the check result, an error often occurs after the correction because another wiring becomes an influence wiring. The occurrence of such errors has become a major problem in recent LSI designs with high density and high performance.

  For example, as shown in FIG. 20A, as a check result, a wiring pair in which a parallel wiring length noise error has occurred, a correction target wiring (Victim; attention wiring), and an influence wiring (Aggressor1) are displayed on the display unit. To do. At this time, the operator refers to the display unit to correct the correction target wiring by correcting the correction target wiring by increasing the adjacent interval between the correction target wiring and the influence wiring and shortening the parallel section length in order to avoid the parallel wiring length noise error. Do. Even if the error between the corrected wiring and the influence wiring is eliminated by this correction, as shown in FIG. 20B, other influence wiring (Aggressor2) in which no error has occurred before the correction is shown. ) May cause a parallel wiring length noise error. The operator repeats the wiring correction until such a parallel wiring length noise error does not occur at all.

  One of the purposes of this case is to make it possible to efficiently improve static noise by using a GUI function.

  The circuit design device of the present invention performs circuit design based on a noise check result, and includes a display unit, a display control unit that controls the display unit, a designation unit that designates a target wire, and the designation unit. An influence wiring extraction unit that extracts all wirings having a wiring section that is a noise check target of the designated wiring of interest as an influence wiring from a database that stores wiring results; and each of the attention wiring and the influence wiring A slack value calculating unit that calculates a slack value based on a delay value and a maximum allowable delay value of each wiring, and the display control unit is configured to extract the influence wiring extracted by the wiring of interest and the influence wiring extraction unit. Is displayed on the display unit.

  Further, the circuit design device of the present invention performs circuit design based on a noise check result, and includes a display unit, a display control unit that controls the display unit, a designation unit that designates a target wire, and the designation An influence wiring extraction unit that extracts all wirings having a wiring section that is a noise check target of the attention wiring specified by a unit as an influence wiring from a database that stores wiring results; and the attention wiring and the influence wiring The number of damaged / damaged wirings obtained from the noise check results for the number of damaged wirings for which each wiring is affected by noise and the number of damaged wirings for which each wiring is affected by noise. An acquisition unit, and the display control unit displays the attention wiring and the influence wiring extracted by the influence wiring extraction unit on the display unit. In the number of numbers and the perpetrators wiring of the victim lines, performs control to display on the display unit as a table corresponding to each line.

  Further, the circuit design device of the present invention performs circuit design based on a noise check result, and includes a display unit, a display control unit that controls the display unit, and a circuit design target based on the noise check result. A noise value distribution calculating unit that calculates a noise value distribution in the whole, and the display control unit performs control to display the noise value distribution in the entire circuit design target on the display unit.

  The circuit design program of the present invention causes a computer to function as a circuit design device that performs circuit design based on a noise check result, and includes the display control unit, the designation unit, the influence wiring extraction unit, and the slack value calculation unit described above. The computer is caused to function, and the display control unit displays the attention wiring and the influence wiring extracted by the influence wiring extraction unit on the display unit, and calculates the slack value calculated for each wiring. The computer is caused to function so as to perform control of display on the display unit in correspondence with wiring.

  In addition, the circuit design program of the present invention causes the computer to function as a circuit design device that performs circuit design based on the noise check result, and includes the above-described display control unit, designation unit, influence wiring extraction unit, and number of damaged / damaged wires. The computer is made to function as an acquisition unit, and the display control unit displays the attention wiring and the influence wiring extracted by the influence wiring extraction unit on the display unit, and the number of damaged wirings and the harm The computer is caused to function so as to perform control for displaying the number of wirings on the display unit as a table corresponding to each wiring.

  Furthermore, the circuit design program of the present invention performs circuit design based on a noise check result, and includes a display control unit that controls a display unit, and a noise value in the entire circuit design target based on the noise check result. The computer functions as a noise value distribution calculation unit that calculates a distribution, and the display control unit functions to control the display of the noise value distribution in the entire circuit design target on the display unit. Let

  In the disclosed technique, all wirings having a wiring section that is a noise check target of the designated attention wiring are extracted as influence wirings, and all the influence wirings are displayed together with the attention wiring on the display unit. That is, not only a wiring in which a noise error has occurred, but also a wiring that has no noise error but is close to the wiring of interest and has a wiring section that is a noise check target is extracted and displayed as an influence wiring.

  As a result, the operator can correct the wiring of the target wiring while referring to all the affected wirings having a wiring section that may influence the noise on the target wiring on the display unit. Therefore, the operator can correct the wiring while recognizing all the affected wirings that may cause a parallel wiring length noise error due to the wiring correction, and can efficiently improve the static noise by using the GUI function.

  Further, since the slack value is displayed for each wiring, the operator can immediately recognize the parallel wiring section in the influence wiring having the large slack value as the section where the wiring correction should be performed preferentially. Therefore, the operator can correct the wiring while recognizing information on where the attention wiring should be corrected, and can efficiently improve the static noise by using the GUI function.

  Furthermore, the number of damaged wirings and the number of damaged wirings are displayed as a table corresponding to each wiring, so the operator selects a wiring with a large number of damaged nets / damaged nets, and corrects the wiring for noise improvement for that wiring. The number of operations and rework can be reduced by preferentially performing.

  In addition, since the noise value distribution in the entire circuit design target is displayed, the operator can recognize an area having a high total noise value, and can efficiently improve static noise by using the GUI function.

It is a block diagram which shows the function structure of the circuit design apparatus of this embodiment. (A)-(C) are figures explaining the hierarchization form at the time of designing LSI. It is a figure which shows the model of a specific net path in order to explain static noise check (calculation / determination of one-to-one noise value). 3 is a flowchart for explaining an LSI design procedure by the circuit design apparatus shown in FIG. 1. (A) And (B) is a flowchart explaining operation | movement of the noise check part shown in FIG. 6 is a timing chart for specifically explaining error determination (determination of signal waveform final edge generation timing). It is a flowchart explaining the cell arrangement and wiring correction procedure accompanied by the display operation of the noise check result. It is a figure which shows the specific example of a display by 1st display mode. It is a figure which shows the specific example of a display by 2nd display mode. It is a figure which shows the specific example of a display by 3rd display mode. It is a figure which shows the specific example of a display by 4th display mode. It is a figure explaining the specific example of a display by the 5th display mode. It is a figure which shows the specific example of a display by 5th display mode. It is a figure which shows the specific example of a display by 5th display mode. It is a figure explaining the specific example of a display by the 6th display mode. It is a figure which shows the specific example of a display by 6th display mode. It is a figure which shows the specific example of a display by 6th display mode. It is a figure which shows the specific example of a display at the time of combining a 1st, 2nd, 4th, and 5th display mode. It is a figure which shows the specific example of a display after performing wiring correction based on the example of a display shown in FIG. (A) And (B) is a figure explaining the example of a wiring correction procedure.

Embodiments of the present invention will be described below with reference to the drawings.
[1] Configuration of the present embodiment First, a hierarchical configuration when LSI design is performed will be described with reference to FIGS.
As shown in FIGS. 2A and 2B, when LSI design is performed, the LSI chip 1 to be designed is, for example, a chip level that is the highest hierarchy, a sub-chip level that is the middle hierarchy, and the lowest It is hierarchized into three LSG (Layout Sub Group) levels. Then, cell placement / inter-cell wiring is performed at the sub-chip level or the lowest LSG level. In this embodiment, cell placement / inter-cell wiring is performed at the sub-chip level.

  In FIG. 2A, reference numeral 1a denotes a sub chip, 1b denotes an LSG, 1c denotes an external input / output area (External I / O area), 1d denotes a custom macro, and 1e denotes a standard cell in the sub chip 1a or LSG 1b. The custom macro 1d is a macro cell that is larger in size than the standard cell 1e, and is a large cell such as a primitive RAM, ROM, or RF.

  Such a custom macro 1d is handled in the same manner as the standard cell 1e, and is arranged together with the standard cell 1e in the subchip 1a or LSG 1b as shown in FIG. Then, wires & vias 1g are arranged between the arranged custom macro 1d, standard cell 1e, and module pin 1f.

  FIG. 1 is a block diagram showing a functional configuration of a circuit design device 10 according to the present embodiment that is designed for an LSI chip 1 as shown in FIGS. 2A to 2C, for example. As shown in FIG. 1, the circuit design device 10 of this embodiment includes an HDL database 11, a cell library 12, a logic / placement / wiring database 13, an information creation unit 20, a display unit 30, a layout correction unit 40, and a timing check. Part 50 and noise check part 60.

The HDL database 11 stores design information about a circuit design object described in HDL (Hardware Description Language) such as Verilog and VHDL which are hardware technical languages.
The cell library 12 stores various information related to the custom macro 1d and the standard cell 1e that are necessary for circuit design, static timing analysis, static noise check, and the like.

The logic / placement / wiring database (design database) 13 is a logic synthesis result (see step S12 in FIG. 4) obtained based on design information, various information related to cells, and the cell placement result / sub-chip for each subchip 1a. The inter-cell wiring result (see step S16 in FIG. 4) is stored. Further, the logic / placement / wiring database 13 stores the placement result / wiring result (see step S20 in FIG. 4) of the entire circuit design object obtained by performing wiring on the chip after the design of each sub-chip is completed.
The databases 11 and 13 and the library 12 described above are configured by a storage device such as a hard disk.

  The information creation unit 20 creates placement information and wiring information necessary for the check by the timing check unit 50 and the noise check unit 60 based on the placement result / wiring result stored in the logic / placement / wiring database 13. Here, the placement information is information related to the macro 1d and the cell 1e after placement, and this placement information includes the placement position (coordinate information), instance name, rotation / inversion information, etc., for the macro 1d and cell 1e after placement. It is included. Further, the wiring information is information related to wiring between the macro 1d and the cell 1e after placement, and this wiring information includes wiring position information, passing via position information, wiring layer information, and the like.

  The display unit 30 is controlled in display state by display information creation units 54 and 67 to be described later, and displays the display information created by these display information creation units 54 and 67. As will be described later, the display unit 30 displays a one-to-one checklist or a one-to-two checklist obtained by the noise check unit 60. Further, the display unit 30 displays the timing analysis result obtained by the timing check unit 50 in an ATW (Arrival Timing Window) as described later. Further, the display unit 30 performs display in first to sixth display modes to be described later with reference to FIGS. The display unit 30 is configured by a display device such as a CRT (Cathode Ray Tube) or an LCD (Liquid Crystal Display).

  The layout correction unit 40 includes an input operation device such as a keyboard and a mouse operated by an operator who refers to the display unit 30, and an interface between the input operation device and the processing unit. The layout correction unit 40 functions as a specification unit that specifies a correction target wiring (target wiring / target net) by an operator's operation after a noise check (when a noise error occurs). In addition, the layout correction unit 40 corrects the wiring information such as the correction target wiring and the cell / macro arrangement information related to the correction target wiring according to the operation of the operator. Then, the layout correction unit 40 inputs the corrected wiring information and arrangement information to the timing check unit 50, the noise check unit 60, and the logic / placement / wiring database 13. Furthermore, the layout correction unit 40 also functions to select a display state on the display unit 30 from first to sixth display modes to be described later with reference to FIGS.

The timing check unit 50 performs static timing analysis, and checks whether there is a timing problem (an error such as a signal delay / racing). The timing check unit 50 includes a check data creation unit 51, a timing calculation unit 52, a delay value / slack value calculation unit 53, and a display information creation unit 54.
The check data creation unit 51 creates timing check data based on the placement information and the wiring information from the information creation unit 20.

The timing calculation unit 52 calculates a signal propagation timing in each wiring by performing a delay simulation by static timing analysis based on the result of the cell arrangement and the inter-cell wiring (the timing check data), and obtains a timing chart. .
The delay value / slack value calculation unit 53 calculates a delay value of each wiring and calculates a slack value that is a timing margin of the driver of each wiring. Here, the slack value is a timing margin obtained from the result of the delay simulation, and is calculated from the path arrival time with respect to the cycle time. This slack value is given to the driver terminal of each path (wiring). Such a slack value is calculated as a difference between the maximum allowable delay value set for each wiring and the delay value calculated for each wiring.

Note that the maximum allowable delay value for each wiring is held in the database 13. Further, the timing chart, slack value, delay value, and the like obtained in the timing check unit 50 are stored in the database 13.
Here, the timing chart is displayed as an ATW on the display unit 30 as a delay simulation result by the timing check unit 50. Further, the timing chart information acquired so as to perform display in the ATW is used for timing determination in an error determination unit 66 described later.

  The display information creation unit (display control unit) 54 creates display information based on the calculation results by the timing calculation unit 52 and the delay value / slack value calculation unit 53, and displays the display information on the display unit 30. Control the display state of. Thereby, the timing chart (ATW), slack value, delay value, and the like obtained by the timing check unit 50 are notified to the operator by the display unit 30.

  The noise check unit 60 performs a static noise check (parallel wiring length check) on the results of cell placement and inter-cell wiring. The noise check unit 60 includes a check data creation unit 61, a one-to-one noise value calculation unit 62, a one-to-one noise value determination unit 63, a one-to-two noise value calculation unit 64, a one-to-two noise value determination unit 65, an error A determination unit 66 and a display information creation unit 67 are included.

The check data creation unit 61 creates static noise check data based on the placement information and the wiring information from the information creation unit 20.
The one-to-one noise value calculation unit 62 calculates, as a one-to-one noise value Nv11, the degree to which one influence wiring (aggressor) adjacent to and parallel to the check target wiring places noise on the signal of the check target wiring (victim). To do. The one-to-one noise value Nv11 is calculated by, for example, the following equation (1).

Nv11 = Σ {Ln × Ka × f (C, L)} (1)
However, Nv11 is a one-to-one noise value (1: 1 noise value; victim: aggressor), and Ln is a line where a specific net (aggressor net) runs parallel to the adjacent area of the victim net (check target wiring). Length (parallel section length / parallel length; see, for example, FIG. 3). Ka is a check coefficient for the victim net and the aggressor net, and f (C, L) is a relaxation function with the distance L and the capacity C as parameters.

  The one-to-one noise value determination unit 63 determines whether or not the one-to-one noise value Nv11 calculated by the one-to-one noise value calculation unit 62 exceeds the limit value Lx1 for one-to-one noise. The limit value Lx1 is determined by the combination of the victim net and the aggressor net. When the one-to-one noise value Nv11 is equal to or less than the limit value Lx1 (Nv11 ≦ Lx1), the one-to-one noise value determination unit 63 determines that no noise error has occurred in the check target wiring. On the other hand, if the one-to-one noise value Nv11 exceeds the limit value Lx1 (Nv11> Lx1), the one-to-one noise value determination unit 63 determines that the check target wiring has a noise error. Information (error net data) regarding the check target wiring determined in this way is output as an error list. Here, the error list may be stored in the database 13 or the like.

  Here, the influence wiring (aggressor) to be subjected to noise check of the wiring to be checked (victim) is extracted as follows, for example. That is, a wiring having a wiring section parallel to the check target wiring with a space within a predetermined interval is extracted as an influence wiring. More specifically, for example, when the parallel interval between the wiring pattern of the wiring to be checked and the wiring pattern of the wiring section is within 8 grids, the wiring having such a wiring section is extracted as the influence wiring.

  For example, in FIG. 3, a wiring having wiring sections 93 a and 93 b that are close to and parallel to the check target wiring (victim) 83 over the distances L1 and L2, respectively, is handled as an influence wiring (aggressor) 93. The degree to which the wiring sections 93a and 93b in the affected wiring 93 add noise to the signal of the check target wiring 83 is calculated as a one-to-one noise value Nv11 and compared with the limit value Lx1. In the model shown in FIG. 5, the check target wiring 83 is included in the check target wiring net (victim net) 80 and connects the driver terminal 81 a of the driver cell 81 and the receiver terminal 82 a of the receiver cell 82. The influence wiring 93 is included in the influence wiring net (aggressor net) 90 and connects the driver terminal 91 a of the driver cell 91 and the receiver terminal 92 a of the receiver cell 92. The cells 81, 82, 91 and 92 are standard cells or custom macros.

  The one-to-two noise value calculation unit 64 performs two influence wirings (aggressor1, The degree to which noise is applied by aggressor2) is calculated as a one-to-two noise value Nv12. This one-to-two noise value Nv12 is calculated by, for example, the following equation (2).

Nv12 = (Nv11a + Nv11b) × Kc (2)
However, Nv11a is a one-to-one noise value (1: 1 noise value) between the check target wiring (victim) and one influence wiring (aggressor1) calculated by the one-to-one noise value calculation unit 62 according to the above equation (1). ; Victim: aggressor1). Nv11b is calculated by the one-to-one noise value calculation unit 62 according to the above equation (1), and the one-to-one noise value (1: 1 noise value; victim) between the wiring to be checked (victim) and the other influence wiring (aggressor2) : aggressor2). Kc is a check coefficient for the victim net and the aggressor net.

  The one-to-two noise value determination unit 65 determines whether or not the one-to-two noise value Nv12 calculated by the one-to-two noise value calculation unit 64 exceeds the limit value Lx2. The limit value Lx2 is determined by the combination of the victim net and the aggressor net. When the one-to-two noise value Nv12 is equal to or less than the limit value Lx2 (Nv12 ≦ Lx2), the one-to-two noise value determination unit 65 determines that no noise error has occurred in the check target wiring. On the other hand, when the one-to-two noise value determination unit 65 has a one-to-two noise value Nv12 exceeding the limit value Lx2 (Nv12> Lx2), it is likely that a noise error has occurred in the wiring to be checked. Treat as candidate wiring.

  The error determination unit 66 reads the timing chart information (ATW data) obtained by the timing calculation unit 52 from the database 13. Then, based on the timing chart information, the error determination unit 66 determines the final edge generation timing of the signal waveform in the check target wiring determined to satisfy Nv12> Lx2, and the final edge generation timing of the signal waveform in the two affected wirings. Compare According to the comparison result, the error determination unit 66 determines a noise error of each check target wiring (error candidate wiring). At this time, as specifically described with reference to FIG. 6, the error determination unit 66 synthesizes the signal waveforms of the two influence wirings (aggressors 1 and 2), and combines the synthesized signal waveforms (the logic of the two signal waveforms). Sum) final edge generation timing is compared with the generation timing of the final edge of the signal waveform in the wiring to be checked (victim).

  Here, if the final signal change of the composite signal waveform in the affected wiring occurs after the final signal change in the check target wiring, the check target wiring is affected by the signal change due to the noise generated in the check target wiring. The signal is likely to be unstable. However, at timings other than those described above, it has been found that the signal of the check target wiring does not become unstable even if the noise value in the check target wiring exceeds the limit value.

  Therefore, when the generation timing of the final edge of the composite signal waveform is later than the generation timing of the final edge of the signal waveform in the check target wiring, the error determination unit 66 generates a noise error in the check target wiring (error candidate wiring). Judge that it is. Then, information (error net data) regarding the check target wiring is output as an error list and stored in the database 13 or the like. On the other hand, if it is determined that the final edge generation timing of the composite signal waveform is before the final edge generation timing of the signal waveform of the check target wiring, the check target wiring is in timing even if Nv12 exceeds Lx2. Therefore, it is determined that there is no problem and is removed from the error candidate wiring.

The display information creation unit 67 includes a display control unit 671, an influence wiring extraction unit 672, a noise value distribution calculation unit 673, and a damage / damaged wiring number acquisition unit 674.
The display control unit 671 generates display information based on a check result (including an error list) by the noise check unit 60 and controls the display state of the display unit 30 so that the display information is displayed on the display unit 30. Thereby, the check result in the noise check unit 60 is notified to the operator by the display unit 30.

  The influence wiring extraction unit 672 is used when a first display mode to be described later is selected, and all the wirings having a wiring section that is a noise check target of the attention wiring designated by the operator from the layout correction unit 40 are affected. Is extracted from the database 13. For example, all the wirings having wiring sections that are parallel to each other with a space within a predetermined interval from the wiring of interest are extracted as influence wirings. Hereinafter, this wiring section may be referred to as a parallel wiring section. More specifically, for example, when the parallel interval between the wiring pattern of the target wiring and the wiring pattern of the wiring section is within 8 grids, the wiring having such a wiring section is extracted as the influence wiring.

  The noise value distribution calculation unit 673 is used when selecting a third display mode to be described later. Based on the noise check result of the noise check unit 60, for example, the noise value calculated by the one-to-one noise value calculation unit 62, The noise value distribution in the entire circuit design target (the entire chip 1) is calculated. For example, as shown in FIG. 10, the noise value distribution calculation unit 673 sums up the noise values calculated in each area obtained by dividing the entire circuit design target (the entire chip 1) into a matrix. Calculate the value.

  The damage / damaged wire number acquisition unit 674 is used when selecting the fifth and sixth display modes described later. The damage / damaged wiring number acquisition unit 674 calculates the number of damaged wirings (number of damaged nets) and the number of harmful wirings (number of harmed nets) for each of the attention wiring specified by the operator and the affected wiring extracted by the affected wiring extracting unit 672. ) Based on the noise check result. Here, the damaged wiring (damaged net) is a wiring (net) where each wiring is affected by noise, and the harmful wiring (harmful net) is a wiring (net) where each wiring is affected by noise. At this time, the damage / damaged wiring number acquisition unit 674 also acquires the wiring name (net name) of the damaged wiring / harmful wiring as well as the number of damaged wiring / harmful wiring.

Here, the one-to-one noise value calculation unit 62 and the one-to-one noise value determination unit 63 described above are also used when a second display mode to be described later is selected in addition to the static noise check.
When the second display mode is selected, the one-to-one noise value calculation unit 62 selects the section noise value Ln × Ka × f (C, L) indicating the degree to which each parallel wiring section puts noise on the target wiring in each affected wiring. Is calculated (see equation (1) above). The one-to-one noise value calculation unit 62 calculates the sum Σ {Ln × Ka × f (C, L)} of the section noise values Ln × Ka × f (C, L) calculated for each parallel wiring section. Calculated as the overall noise value Nv11 of the affected wiring (see the above equation (1)). In addition, when the second display mode is selected, the one-to-one noise value calculation unit 62 is not operated, and the one-to-one noise value calculation unit 62 calculates and stores for each wiring at the time of static noise check. Ka x f (C, L)
And the overall noise value Nv11 may be read out and used.

Further, when the second display mode is selected, the one-to-one noise value determination unit 63 performs the entire noise value Nv11 calculated by the one-to-one noise value calculation unit 62 or the section noise value Ln × Ka × f (C, L). And performs functions as an overall noise value determination unit and a section noise determination unit. Here, the overall noise value determination unit determines whether or not the overall noise value Nv11 calculated for each affected wiring by the one-to-one noise value calculation unit 62 exceeds the first limit value Lx1. The section noise value determination unit then sets each section noise value Ln × Ka × f (C, L) to the second limit value for the influence wiring determined that the overall noise value Nv11 exceeds the first limit value Lx1. It is determined whether or not K * Nv11 is exceeded. However, K is a positive coefficient of 0 <K <1.

Furthermore, the delay value / slack value calculation unit 53 described above is used not only during static timing analysis (timing check) but also when a fourth display mode to be described later is selected.
When the fourth display mode is selected, the delay value / slack value calculation unit 53 sets the slack value of each wiring of the attention wiring extracted by the attention wiring and the influence wiring extraction unit 672 specified by the operator, the delay value of each wiring, and the maximum allowable value. Calculate based on the delay value. Specifically, for each wiring, the difference between the delay value calculated by the delay value / slack value calculation unit 53 and the maximum allowable delay value read from the database 13 or the like is calculated as the slack value. . When the fourth display mode is selected, the delay value / slack value calculation unit 53 does not operate, and the delay value / slack value calculated and stored for each wiring by the delay value / slack value calculation unit 53 during static timing analysis is stored. You may read and use.

  Here, when the noise check unit 60 determines that a noise error has occurred, the display control unit 671 changes the display state of the display unit 30 so that reference information for correcting the wiring of the operator is displayed on the display unit 30. Control. The reference information is, for example, information based on various wiring information, a check result by the noise check unit 60, and the like (including an error list). At this time, the display control unit 671 displays various pieces of wiring information on the display unit 30 in a display mode selected from first to sixth display modes to be described later based on the check result by the noise check unit 60 and the like. The display state of the display unit 30 is controlled.

  When the first display mode is selected, the display control unit 671 controls the display unit 30 to display the attention wiring designated by the operator and the influence wiring extracted by the influence wiring extraction unit 672. A specific display example in the first display mode will be described later with reference to FIG.

When the second display mode is selected, in addition to the display in the first display mode, the display control unit 671 uses the one-to-one noise value determination unit 63 to set the section noise value Ln × Ka × f (C, L) to the second limit value. Control is performed so that the parallel wiring section determined to exceed K * Nv11 is highlighted on the display unit 30 as a priority correction location for noise improvement. At this time, the display control unit 671 determines a wiring section in which the section noise value Ln × Ka × f (C, L) is determined to be equal to or less than the second limit value K * Nv11 by the one-to-one noise value determination unit 63. The display unit 30 performs highlighting control as a noise improvement correction candidate location. In addition, the display control unit 671 displays the parallel wiring section in the affected wiring, in which the overall noise value Nv11 is determined to be equal to or less than the first limit value Lx1 by the one-to-one noise value determination unit 63, as a noise improvement correction candidate portion. Control for highlighting in the unit 30 is performed. A specific display example in the second display mode will be described later with reference to FIG.

  When the third display mode is selected, the display control unit 671 controls the display unit 30 to display the noise value distribution in the entire circuit design target (chip 1 as a whole) calculated by the noise value distribution calculation unit 673. This noise value distribution is displayed on the display unit 30 in a window different from the window for displaying in the first, second, fourth to sixth display modes. A specific display example in the third display mode will be described later with reference to FIG.

  When the fourth display mode is selected, the display control unit 671 displays the slack value calculated for each wiring by the delay value / slack value calculating unit 53 in addition to the display in the first display mode, corresponding to each wiring. The display is controlled by the unit 30. At this time, the display control unit 671 performs control to display an arrow indicating the signal propagation direction of each wiring on the display unit 30 in a display state corresponding to the slack value calculated for each wiring. Do. The display control unit 671 controls the display unit 30 to display the delay value and the maximum allowable delay value of each wiring corresponding to each wiring. A specific display example in the fourth display mode will be described later with reference to FIG.

  When the fifth display mode is selected, the display control unit 671 displays the number of damaged wires (damaged nets) / damaged wires (damaged nets) acquired by the damaged / damaged wire number acquiring unit 674 in addition to the display in the second display mode. Is displayed on the display unit 30 as a table corresponding to each wiring. At that time, the display control unit 671 performs control to display the wiring name (net name) of the damaged wiring / damaging wiring in the table. A specific display example in the fifth display mode will be described later with reference to FIGS.

  When the sixth display mode is selected, the display control unit 671 performs control for highlighting information on each wiring in accordance with the slack value of each wiring in the table displayed in the fifth display mode. A specific display example in the sixth display mode will be described later with reference to FIGS.

The display in the first, second, fourth to sixth display modes described above may be performed in the same window displayed on the display unit 30, or may be performed in different windows. The table display in the fifth and sixth display modes may be performed in separate windows.
In addition, the functions of the information creation unit 20, part of the layout correction unit 40, the timing check unit 50, and the noise check unit 60 described above are executed by a processing unit such as a CPU (Central Processing Unit) that executes a predetermined circuit design program. Is realized.

[2] Operation and Effect of Present Embodiment [2-1] LSI Design Procedure by Circuit Design Device 10 Next, the operation of the circuit design device 10 configured as described above will be described with reference to FIGS. To do.
An LSI design procedure by the circuit design device 10 shown in FIG. 1 will be described according to the flowchart shown in FIG. 4 (steps S11 to S24).

  First, RTL (Register Transfer Level) design is performed (step S11), logic synthesis is performed (step S12), and floor planning and hierarchical division (here, division from chip 1 to subchip 1a) are performed (step S13). . At this time, the timing check unit 50 performs delay simulation based on static timing analysis based on the logical length between cells (step S14). As a result of the static timing analysis based on the logical length, if there is a timing problem (for example, an error such as signal delay / racing), the process returns to step S13, and floorplanning and hierarchy division are performed again. On the other hand, if there is no problem in timing, design is performed for each sub-chip 1a divided into layers (step S15).

  In designing each sub-chip 1a, placement of standard cells 1e and custom macros (large cells) 1d and inter-cell wiring are performed according to the floor plan result in step S13 (step S16). Then, the timing check unit 50 performs delay simulation by static timing analysis based on the placement result of the standard cell 1e and the custom macro (large cell) 1d and the wiring result between these cells 1e and 1d (step S17). As a result, a timing chart (ATW data) of signal propagation in each wiring is acquired, and the slack value of the driver of each wiring is calculated, and these timing chart and slack value are stored in the database 13 or the like.

  As a result of the static timing analysis, if there is a timing problem (for example, an error such as signal delay / racing), the process returns to step S16, and cell placement and inter-cell wiring are performed again. On the other hand, if there is no timing problem, the noise check unit 60 performs a static noise check on the results of cell placement and inter-cell wiring (step S18). The static noise check procedure, that is, the operation of the noise check unit 60 shown in FIG. 1 will be described later with reference to FIGS. 5 (A) and 5 (B).

  When an error list is obtained as a result of the static noise check (that is, when a noise error has occurred; Y route in step S19), the process returns to step S16, and cell placement and inter-cell wiring are performed again. At this time, as reference information for the operator to correct the cell arrangement / inter-cell wiring, various wiring information, information based on a check result by the noise check unit 60 (including an error list), and the like are displayed on the display unit 30. The cell placement / wiring correction procedure with the display operation will be described later with reference to FIG. The first to sixth display modes related to the display operation will be described later with reference to FIGS.

  Such processing in steps S16 to S19 is performed for each sub chip 1a. If it is determined that no error has occurred with respect to the noise value by performing cell arrangement and inter-cell wiring for all the sub-chips 1a, the combined chip 1 combines the design results (cell arrangement and inter-cell wiring results) of all the sub-chips 1a. The upper wiring is performed (step S20). Then, the timing check unit 50 performs delay simulation based on static timing analysis based on the wiring result on the chip 1 (step S21). As a result, a timing chart (ATW data) of signal propagation in each wiring is acquired, and the slack value of the driver of each wiring is calculated, and these timing chart and slack value are stored in the database 13 or the like.

  As a result of the static timing analysis, if there is a timing problem (for example, an error such as signal delay / racing), the process returns to step S15 and the design in each sub-chip 1a is performed again, or the chip 1 The upper wiring (step S20) is performed again. On the other hand, if there is no timing problem, the noise check unit 60 performs a static noise check on the wiring result on the chip 1 in the same manner as step S18 described above (step S22). The static noise check procedure, that is, the operation of the noise check unit 60 shown in FIG. 1 will be described later with reference to FIGS. 5 (A) and 5 (B).

  If an error list is obtained as a result of the static noise check (that is, if a noise error has occurred; the Y route in step S23), the process returns to step S15 and the design in each subchip 1a is performed again, or Wiring on the chip 1 (step S20) is performed again. Also at this time, as reference information for the operator to correct the cell placement / inter-cell wiring, information based on various wiring information, check results by the noise check unit 60 (including an error list), and the like is displayed on the display unit 30. Is done. The operation related to the display will be described later with reference to FIGS.

Processes similar to those described above (steps S15 to S23) are repeatedly executed until N is determined in step S23. If no noise error occurs (N route in step S23), the manufacturing data of the LSI chip 1 is created according to the design result of the entire chip 1 (results of cell placement and inter-cell wiring) (step S24). The design of the chip 1 is finished.
[2-2] Operation of the noise check unit 60

Next, the operation of the noise check unit 60 in steps S18 and S22 of FIG. 4 will be described according to the flowcharts (steps S30, S40, and S31 to S39) shown in FIGS. 5A and 5B.
When cell placement and inter-cell wiring are performed and static timing analysis and determination of the analysis result are performed (steps S16, S17 or S20, S21 in FIG. 4), the noise check unit 60 is activated. Thereby, as shown in FIG. 5A, the noise check process shown in FIG. 5B is executed for each check target wiring net (victim net) (step S30), and the error list acquired by the process is displayed. Is output (step S50).

Next, the process executed in step S30 in FIG. 5A, that is, the noise check process shown in FIG. 5B will be described.
An influence wiring net (aggressor net) that can affect one check target wiring net (victim net) is extracted by filtering from the inter-cell wiring result (step S31). Thereafter, the one-to-one noise value calculation unit 62 calculates the one-to-one noise value Nv11 of each influence wiring (aggressor) with respect to the check target wiring (victim) according to the above equation (1). Then, the one-to-one noise value determination unit 63 determines whether or not the one-to-one noise value Nv11 calculated by the one-to-one noise value calculation unit 62 exceeds the limit value Lx1 (step S32).

  If Nv11 exceeds Lx1, it is determined that a noise error has occurred in the wiring to be checked (Y route in step S33), and the error net data is stored as an error list (one-to-one noise value check result). The data is output and stored in the database 13 or the like (step S34).

  On the other hand, if Nv11 is Lx1 or less, it is determined that no noise error has occurred in the wiring to be checked (victim) (N route in step S33), and the processing of the noise check unit 60 proceeds to step S35. . In this step S35, the check target wiring (victim) determined by Nv11 ≦ Lx1 by the one-to-two noise value calculation unit 64 and two influence wirings (aggressor1, 2) that can affect the check target wiring The one-to-two noise value Nv12 is calculated according to the above equation (2). Then, the one-to-two noise value determination unit 65 determines whether or not the one-to-two noise value Nv12 calculated by the one-to-two noise value calculation unit 64 exceeds the limit value Lx2.

  When Nv12 is Lx2 or less, it is determined that no noise error has occurred in the check target wiring (victim) (N route in step S36), and the noise check unit 60 ends the processing for the check target wiring. On the other hand, if Nv12 exceeds Lx2 (Y route in step S36), the wiring to be checked (victim) is treated as an error candidate wiring that is highly likely to cause a noise error.

  When the error candidate wiring is obtained, the timing chart information (ATW data) obtained by the timing check unit 50 (timing calculation unit 52) is read from the database 13. Then, based on the timing chart information, the error determination unit 66 determines the final edge generation timing of the signal waveform in the check target wiring determined by the one-to-two noise value determination unit 65 as Nv12> Lx2, and the two influence wirings. Is compared with the last edge generation timing of the signal waveform. The noise error of the check target wiring is determined according to the comparison result (step S37).

  More specifically, the error determination unit 66 can obtain signal waveforms in the influence wiring (aggressor1, 2) and the check target wiring (victim) as, for example, a timing chart (ATW data) as shown in FIG. it can. Therefore, in the noise check unit 60, first, as shown in FIG. 6, the signal waveforms in the two influence wirings (aggressor 1, 2) are synthesized to obtain a logical sum of these signal waveforms. Whether the final edge generation timing of the composite signal waveform is later than the final edge generation timing of the signal waveform in the check target wiring (victim) (NG region in FIG. 6) or earlier (OK region in FIG. 6). ) Are compared / determined.

  As a result of the comparison of the final edge generation timing, when the generation timing of the final edge of the combined signal waveform is later than the generation timing of the final edge of the signal waveform in the check target wiring (NG area in FIG. 6), the error determination unit 66 It is determined that a noise error has occurred in the check target wiring (Y route in step S38). Then, the error net data is output as an error list (1 to 2 noise value check result) and stored in a database or the like (step S39). On the other hand, when the final edge generation timing of the composite signal waveform is before the generation timing of the final edge of the signal waveform in the check target wiring (OK region in FIG. 6), Nv12 of the check target wiring exceeds Lx2. It is determined that there is no problem in timing (N route in step S38). Then, the check target wiring is removed from the error candidate wiring, and the noise check unit 60 ends the processing for the check target wiring.

  By using such a noise check unit 60, the final edge generation timing is checked in step S37 based on the timing chart information of signal propagation in each wiring acquired for ATW. Then, according to the check result, it is determined whether or not the noise error of the error candidate wiring has a problem in timing, and only the wiring having a problem in timing is extracted.

  By performing correction (re-cell placement / inter-re-cell wiring) only for the wiring extracted in this way, the amount of correction corresponding to noise errors is reduced, so the effort required for correcting error avoidance is greatly increased. Reduced to In addition, the degree of freedom in layout design is greatly improved, the burden on DA (Design Automation) is greatly reduced, and optimal cell placement and inter-cell wiring can be realized. Note that the final edge generation timing check similar to that in step S37 may be performed on the check target wiring that has been determined as Y in step S33.

[2-3] Cell Placement / Wiring Correction Procedure with Noise Check Result Display Operation Next, according to the flowchart (steps S51 to S56) shown in FIG. explain. That is, it is determined by the noise check unit 60 that a noise error has occurred (N route of steps S19 / S23), and the processing procedure when performing wiring correction again in steps S16 / S20 will be described.

  When the noise check unit 60 determines that a noise error has occurred and returns to step S16 / S20, the display unit 30 reads and displays the error list from the database 13 or the like as shown in FIG. (Step S51). This error list is saved in steps S34 and S39 in FIG. 5B, and is a 1: 1 check list (1 to 1 noise value check result) and 1: 2 check list (1 to 2 noise value check result). ).

  The operator who refers to this error list designates the target wiring (Victim) of the wiring to be corrected by the layout correcting unit (designating unit) 40 (step S52). When the wiring of interest is designated, display in the predetermined display mode is performed on the display unit 30 (step S53). At this time, the predetermined display mode may be one or more display modes set in advance as a default from the first to sixth display modes. Further, the predetermined display mode may be one or more display modes selected by the operator from the first to sixth display modes together with the designation of the target wiring by the layout correction unit 40.

As a result, various reference information effective when the operator corrects the wiring of the target wiring is displayed on the display unit 30, and the operator who refers to the reference information operates the layout correction unit 40 to perform cell placement. The correction and the attention wiring are corrected (from the Y route of step S54 to step S55). When correction related to the designated wiring of interest is completed or not corrected (N route of step S54), and when other wiring of interest is designated and wiring correction is performed (Y route of step S56) Returning to step S52, similar processing is performed. On the other hand, when the correction related to the designated wiring of interest is completed or not corrected (N route in step S54), and other wirings of interest are designated and no wiring correction is performed (N in step S56). Route) shifts to the process of step S17 or S21 of FIG.

[2-4] Description of Display Mode Each of the first to sixth display modes will be described below.
[2-4-1] First Display Mode FIG. 8 is a diagram showing a specific display example in the first display mode.
When the first display mode is selected, all the wirings having the parallel wiring section that is the noise check target of the wiring of interest designated by the operator from the layout correction unit 40 by the influence wiring extraction unit 672 are selected as influence wirings from the database 13. Extracted. At this time, as described above, when the interval between the edge of the wiring pattern of the target wiring and the edge of the wiring pattern of the parallel wiring section is within 8 grids, the wiring having such a parallel wiring section is extracted as the influence wiring. The

  Then, the attention wiring designated by the operator and the influence wiring extracted by the influence wiring extraction unit 672 are displayed on the display unit 30 by the display control unit 671 as shown in FIG. In the display example shown in FIG. 8, the attention wiring (correction target wiring) designated by the operator is indicated by a solid line Victim, and all four influence wirings having a parallel wiring section to be subjected to noise check are indicated by a dotted line Aggressor 1-4. ing. Here, the influence wiring (net) displayed in the first display mode has a wiring section that is subject to noise check in the adjacent relationship with the target wiring, and a wiring section that actually generates a noise error in the target wiring. Not only having.

  As a result, not only the wiring in which the noise error has occurred, but also the wiring that has no noise error but is close to the wiring of interest and has a wiring section that is subject to noise check is extracted and displayed as an influence wiring. . In other words, the operator can correct the wiring of the target wiring on the display unit 30 while referring to all the affected wirings having parallel wiring sections that may affect the target wiring in noise. Therefore, the operator can correct the wiring while recognizing all the affected wirings that may cause a parallel wiring length noise error due to the wiring correction, and can efficiently improve the static noise by using the GUI function.

[2-4-2] Second Display Mode FIG. 9 is a diagram showing a specific display example in the second display mode.
When the second display mode is selected, the display control unit 671 performs the following display in addition to the display in the first display mode.
That is, in each affected wiring extracted / displayed in the first display mode, the one-to-one noise value calculation unit 62 uses the section noise value Ln × Ka × f ( C, L) is calculated. Here, in the display examples shown in FIGS. 8 and 9, there is only one parallel wiring section in each of the influence wiring Aggressor 1-3, and there are two parallel wiring sections in the influence wiring Aggressor 4.

  Further, the sum Σ {Ln × Ka × f (C, L)} of the section noise values Ln × Ka × f (C, L) calculated for each parallel wiring section by the one-to-one noise value calculation unit 62 is obtained. It is calculated as the overall noise value Nv11 of the affected wiring. In the display examples shown in FIGS. 8 and 9, since there is only one parallel wiring section in each of the affected wiring Aggressor 1-3, the entire noise value Nv11 of these affected wiring Aggressor 1-3 is one. This is the section noise value itself of the parallel wiring section. Further, since there are two parallel wiring sections in the influence wiring Aggressor 4, the overall noise value Nv11 of the influence wiring Aggressor 4 is the sum of the section noise values of the two parallel wiring sections. As the section noise value Ln × Ka × f (C, L) and the total noise value Nv11, those calculated and stored at the time of static noise check may be read from the database 13 or the like.

  Thereafter, the one-to-one noise value determination unit 63 determines whether or not the overall noise value Nv11 calculated for each affected wiring by the one-to-one noise value calculation unit 62 exceeds the first limit value Lx1. Then, for the affected wiring for which the overall noise value Nv11 is determined to exceed the first limit value Lx1 by the one-to-one noise value determination unit 63, each section noise value Ln × Ka × f (C, L) is the first. 2. It is determined whether or not the limit value K * Nv11 (0 <K <1) is exceeded.

  The parallel wiring section determined by the display control unit 671 that the one-to-one noise value determination unit 63 determines that the section noise value Ln × Ka × f (C, L) exceeds the second limit value K * Nv11 is As shown in FIG. 9, it is highlighted on the display unit 30 as a priority correction location for noise improvement. At this time, the wiring section in which the display control unit 671 determines that the section noise value Ln × Ka × f (C, L) is equal to or less than the second limit value K * Nv11 by the one-to-one noise value determination unit 63 is As shown in FIG. 9, it is highlighted on the display unit 30 as a correction candidate location for noise improvement. In addition, the parallel wiring section in the influence wiring in which the display control unit 671 determines that the overall noise value Nv11 is equal to or less than the first limit value Lx1 by the one-to-one noise value determination unit 63 is displayed as a noise improvement correction candidate portion. Part 30 is highlighted. Here, the priority correction portion is a portion having a higher correction priority than the correction candidate portion, and display that is emphasized over the correction candidate portion is performed by performing luminance adjustment or color change. In the display example shown in FIG. 9, one of the two parallel wiring sections in the influence wiring Aggressor 4 is a priority correction position, and the other is a correction candidate position.

Here, the determination criteria for the priority correction location and the correction candidate location described above are summarized as follows.
Nv11> Lx1 (when Victim and Aggressor are related to noise error)
Correction candidate location: Section noise = Ln × Ka × f (C, L) ≦ Κ * Nv11
Priority correction location: Section noise = Ln × Ka × f (C, L)> Κ * Nv11
Nv11 ≦ Lx1 (when Victim and Aggressor are not related to noise error)
Candidate points for correction: Each adjacent section

  As a result, the parallel wiring section that greatly affects the attention wiring is highlighted as the priority correction location, and the parallel wiring that affects the attention wiring is not as high as the priority correction location. The section is highlighted as a candidate for correction. In other words, the operator can recognize the location where the wiring should be corrected with the target wiring on the display unit 30 as the priority correction location and the correction candidate location, and further recognize the section with the higher correction priority as the priority correction location. can do. Therefore, the operator can correct the wiring while recognizing information on where the attention wiring should be corrected, and can efficiently improve the static noise by using the GUI function.

[2-4-3] Third Display Mode FIG. 10 is a diagram showing a specific display example in the third display mode.
When the third display mode is selected, the entire circuit design target (the entire chip 1 is based on the noise value obtained by the noise check unit 60 (for example, the calculation result by the one-to-one noise value calculation unit 62) by the noise value distribution calculation unit 673. ) Is calculated. Then, the display control unit 671 displays the noise value distribution in the entire circuit design target (chip 1 as a whole) calculated by the noise value distribution calculation unit 673 on the display unit 30.

  The noise value distribution display is performed as shown in FIG. 10, for example. In the display example (upper right side) shown in FIG. 10, the entire circuit design object (the entire chip 1) is divided into 14 × 12 areas in a matrix. Then, by performing luminance adjustment and color change in each area, display in a plurality of levels (five levels in FIG. 10) corresponding to the total noise value calculated in each area is performed. At this time, an area with a larger noise value is displayed more emphasized. The noise value distribution display is displayed in a window different from the window for displaying the first, second, fourth to sixth display modes on the display unit 30.

  Areas with a high total noise value are considered to generate a lot of heat or have a high possibility of malfunction. By displaying the noise value distribution in the entire circuit design target (the entire chip 1) as shown in FIG. The operator can immediately recognize such an area on the display unit 30. The operator recognizes and selects such an area, can correct the wiring while referring to the display in other display modes (first, second, fourth to sixth display modes), and uses the GUI function. Static noise can be improved efficiently.

  When the operator clicks a specific cell in the noise distribution display state shown in FIG. 10, the contents of the specific cell are displayed in the other display modes (first, second, fourth to sixth displays) from the third display mode. It is also possible to provide a configuration for shifting to a state of displaying in (mode). As a result, the operator shifts from the third display mode to a more detailed display mode in the area, can immediately perform processing such as wiring correction of the target wiring, and can perform wiring correction more efficiently.

[2-4-4] Fourth Display Mode FIG. 11 is a diagram showing a specific display example in the fourth display mode.
When the fourth display mode is selected, the display control unit 671 performs the following display in addition to the display in the first display mode.

  That is, the slack values of the target wiring and the influence wiring extracted and displayed in the first display mode are calculated by the delay value / slack value calculation unit 53 based on the delay value and the maximum allowable delay value of each wiring. . Specifically, for each wiring, the difference between the delay value calculated by the delay value / slack value calculation unit 53 and the maximum allowable delay value read from the database 13 or the like is calculated as the slack value. . As the slack value, a value calculated and stored at the time of static timing analysis may be read from the database 13 or the like and used.

  Then, in addition to the display in the first display mode by the display control unit 671, as shown in FIG. 11, the slack value calculated for each wiring by the delay value / slack value calculating unit 53 becomes the delay value of each wiring and It is displayed on the display unit 30 together with the maximum allowable delay value. Also, as shown in FIG. 11, an arrow indicating the signal propagation direction (timing direction) of each wiring is displayed on the display unit 30 along each wiring in a display state corresponding to the slack value calculated for each wiring. Is done. At this time, by adjusting the brightness of each arrow or changing the color, display in a plurality of levels (three levels in FIG. 11) corresponding to the magnitude (timing margin) of the slack value of each wiring is performed. In addition, in FIG. 11, the step display of the arrow is shown by changing the line type (dotted line, broken line, and alternate long and short dash line) of the arrow.

  As a result, the slack value, the delay value, and the maximum allowable delay value (MAX value) are displayed for each wiring, and the arrow indicating the signal propagation direction of each wiring is displayed in a display state (color-coded display) corresponding to the timing margin. Is displayed. In other words, the operator can recognize at a glance the wiring with a large slack value (the wiring with sufficient timing) on the display unit 30 according to the display state. The operator refers to the slack value, the delay value, and the maximum allowable delay value displayed on the display unit 30 so that the parallel wiring section in the influence wiring having a large slack value is a section to be preferentially corrected. It can be recognized immediately. Therefore, the operator can correct the wiring while recognizing information on where the attention wiring should be corrected, and can efficiently improve the static noise by using the GUI function.

[2-4-5] Fifth Display Mode FIG. 12 is a diagram illustrating a specific display example according to the fifth display mode, and FIGS. 13 and 14 are diagrams illustrating a specific display example according to the fifth display mode. .
When the fifth display mode is selected, the display control unit 671 performs the following display in addition to the display in the second display mode shown in FIG. 12, for example.

  That is, for each of the target wiring and the affected wiring displayed in the second display mode, the number of damaged wirings and the number of damaged wirings are respectively obtained as the number of damaged nets and the number of damaged nets by the damaged / damaged wiring number acquisition unit 674. Acquired based on the noise check result. At this time, the wiring name (net name) of the damaged wiring / harmful wiring is acquired together with the number of damaged wiring / harmful wiring. In the display examples shown in FIGS. 12 to 17, the net name (wiring name) of the target wiring is V, and the net names (wiring names) of the four affected wirings are A1 to A4, respectively.

  Then, in addition to the display in the second display mode shown in FIG. 12 by the display control unit 671, the number of damaged wiring (damaged nets) / harmful wiring (harmful nets) acquired by the damaged / damaged wiring number acquiring unit 674 is The ghost table shown in FIG. 13 is displayed on the display unit 30 in a state corresponding to each wiring. At that time, the wiring name (net name) of the damaged wiring / damaging wiring is also displayed in the table. This table may be displayed in a display window in the second display mode shown in FIG. 12, or may be displayed in a window different from the display window in the second display mode shown in FIG.

  By referring to the table shown in FIG. 13, it can be seen that the operator-specified wiring V is affected by noise from the wirings A1, A2, A3, and A4 and affects the wirings A1, A2, and A3. In the table shown in FIG. 13, it can be seen that the affected wirings A1 and A3 are both affected by noise from the wiring V and affect the wiring V. Similarly, it can be seen that the affected wiring A2 is affected by noise from the wiring V and affects the wiring V and other. Here, the wiring other affected by the wiring A3 is a wiring that is not displayed in the display example of FIG. 12 and is adjacent to the wiring A3. Then, it can be seen that the influence wiring A4 does not receive the influence of noise from other wirings but influences the noise on the wiring V. Here, depending on the signal strength in each wiring, noise may be affected by other wiring, but the noise may not be affected by other wiring, and the number of damaged nets and the number of harming nets do not necessarily match.

  An operator who refers to such a table selects a wiring with a large number of damaged nets / damaged nets, and prioritizes wiring correction for noise improvement with respect to the wiring, thereby reducing the number of operations and rework. Can do. For example, the operator who refers to the table shown in FIG. 13 first selects the wiring V and corrects the wiring V. At this time, when the operator corrects the wiring V as indicated by the broken line in FIG. 12, the damage / damaged wiring number acquisition unit 674 again determines the number of damaged nets and the number of harmed nets, The name is acquired, and the table shown in FIG. 13 is rewritten and displayed as shown in FIG.

  Here, in the table after the wiring correction as shown in FIG. 12 (FIG. 14), the target wiring V is affected by noise from the wirings A2 and A3, and may affect the wirings A2 and A3. I understand. In addition, it can be seen that the influence wirings A1 and A4 are not affected by noise from other wirings and do not affect the other wirings by noise. The influence wirings A2 and A3 are not different from the state in the table shown in FIG. The operator who refers to the table shown in FIG. 14 next performs wiring correction for the affected wiring A2 or A3.

[2-4-6] Sixth Display Mode FIG. 15 is a diagram illustrating a specific display example according to the sixth display mode, and FIGS. 16 and 17 are diagrams illustrating specific display examples according to the sixth display mode. .
When the sixth display mode is selected, the display control 671 performs the following display in addition to the display in the second display mode shown in FIG. 15 and the table display shown in FIG. 16, for example. 15 shows a wiring state after the wiring correction of the target wiring V in the display example shown in FIG. 12, and FIG. 16 shows a table (FIG. 14) after the wiring correction shown in FIG. ) Shows a state in which display is performed in the sixth display mode.

  When the sixth display mode is selected, the slack value of each wiring is acquired as in the fourth display mode, and the display control unit 671 assigns each wiring in the table displayed in the fifth display mode, as shown in FIG. Such information is highlighted according to the slack value of each wiring. Similarly to the fourth display mode, as shown in FIG. 15, the slack value, the delay value, and the maximum allowable delay value are displayed on the display unit 30 for the wirings A2 and A3 to be corrected, and the signal propagation direction (timing direction) ) Is also displayed on the display unit 30 along each wiring in a display state corresponding to the slack value.

  At this time, the slack value of the wiring A2 is 5 (MAX value 400), the slack value of the wiring A3 is 140 (MAX value 400), the wiring A2 has almost no timing margin, and the wiring 3 has a timing margin. is there. Therefore, it is assumed that the correction of the wiring A2 is severe in terms of delay, and in the table shown in FIG. 16, it is clearly shown that the information related to the wiring A2 is shaded and the correction priority of the wiring A2 is low to the operator. Is done. At this time, in place of the halftone display, information relating to the wiring A2 is arranged below the table, and information relating to the wiring having a high correction priority (information relating to the wiring A3 here) is arranged in the table information. May be. Further, stepwise highlighting according to the modification priority (slack value) may be performed by performing luminance adjustment or color change.

  The operator who refers to such a table can reduce the number of operations and the number of rework by selecting the wiring A3 having a high correction priority and preferentially performing the wiring correction for noise improvement on the wiring. For example, the operator who refers to the table shown in FIG. 16 first selects the wiring A3 and corrects the wiring A3. At this time, if the operator corrects the wiring V as indicated by the broken line in FIG. 15, the damage / damaged wiring number acquisition unit 674 again determines the number of damaged nets, the number of harmed nets, The name is acquired, and the table shown in FIG. 16 is rewritten and displayed as shown in FIG.

  Here, in the table (FIG. 17) after the wiring correction as shown in FIG. 15, it can be seen that the wiring of interest V is affected by noise from the wiring A2 and affects the wiring A2. In addition, it can be seen that all of the affected wirings A1, A3, and A4 are not affected by noise from other wirings and do not affect other wirings. The influence wiring A2 is not different from the state in the table shown in FIG. The operator who refers to the table shown in FIG. 17 next designates the influence wiring A3 as the attention wiring, and performs the wiring correction for the influence wiring A3.

[2-4-7] Other Display Modes The first to sixth display modes described above may be displayed by each mode alone, or may be displayed by combining a plurality of modes. For example, FIG. 18 is a diagram showing a specific display example when the first, second, fourth, and fifth display modes are combined, and FIG. 19 is after wiring correction is performed based on the display example shown in FIG. It is a figure which shows the specific example of a display. The display mode combinations are not limited to the display examples shown in FIGS. 18 and 19, and various combinations are possible.

[3] Others The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the spirit of the present invention.
For example, in the above-described second embodiment, the case where the noise error is determined by combining the one-to-one noise value and the one-to-two noise value has been described, but the present invention is not limited to this, and the one-to-one noise value The noise error may be determined by combining one noise value and one to m (m is a natural number of 3 or more) noise value, or at least one kind of noise value may be selected. The noise error may be determined by combining 1 to m (m is a natural number of 3 or more) noise values.

Further, the functions (all or a part of the functions) as the timing check unit 50 and the noise check unit 60 described above are performed by a computer (including a CPU, an information processing apparatus, and various terminals) by a predetermined application program (circuit design program). It is realized by executing.
The program is, for example, a flexible disk, CD (CD-ROM, CD-R, CD-RW, etc.), DVD (DVD-ROM, DVD-RAM, DVD-R, DVD-RW, DVD + R, DVD + RW, Blu-ray disc, etc.) And the like recorded in a computer-readable recording medium. In this case, the computer reads the program from the recording medium, transfers it to the internal storage device or the external storage device, and uses it.

  Here, the computer is a concept including hardware and an OS (operating system), and means hardware operating under the control of the OS. Further, when the OS is unnecessary and the hardware is operated by the application program alone, the hardware itself corresponds to the computer. The hardware includes at least a microprocessor such as a CPU and means for reading a computer program recorded on a recording medium. The circuit design program includes program code for causing the computer as described above to realize the functions as the timing check unit 50 and the noise check unit 60. Also, some of the functions may be realized by the OS instead of the application program.

[4] Supplementary Notes The following supplementary notes are further disclosed regarding the embodiment including the above-described embodiment.
(Appendix 1)
A circuit design device for designing a circuit based on a noise check result,
A display unit;
A display control unit for controlling the display unit;
A designating part for designating the wiring of interest;
An influence wiring extraction unit that extracts all wirings having a wiring section that is a noise check target of the wiring of interest designated by the designation unit, as influence wirings, from a database that stores wiring results;
The circuit design apparatus, wherein the display control unit controls the display unit to display the attention wiring and the influence wiring extracted by the influence wiring extraction unit.

(Appendix 2)
The circuit design device according to appendix 1, wherein the wiring section in each influence wiring is a section whose distance from the wiring of interest is within a predetermined interval.

(Appendix 3)
In each affected wiring, the section noise value indicating the degree of noise placed on the target wiring by the wiring section is calculated, and the sum of the section noise values calculated for each wiring section is used as the total noise value of the affected wiring. A noise value calculation unit for calculating,
An overall noise value determination unit for determining whether or not the overall noise value exceeds a first limit value;
A section noise value determination unit that determines whether or not the section noise value exceeds a second limit value for the influence wiring determined that the overall noise value exceeds the first limit value;
The display control unit performs control to highlight a wiring section determined to have the section noise value exceeding the second limit value on the display section as a priority correction portion for noise improvement. The circuit design device according to appendix 1 or appendix 2.

(Appendix 4)
The display control unit performs control to highlight the wiring section determined to have the section noise value equal to or less than the second limit value on the display section as a noise improvement correction candidate location. The circuit design device according to appendix 3.

(Appendix 5)
The display control unit performs control to highlight the wiring section in the influence wiring determined that the overall noise value is equal to or less than the first limit value as a noise improvement correction candidate portion on the display unit. The circuit design device according to appendix 3 or appendix 4, which is characterized.

(Appendix 6)
The circuit design device according to any one of appendices 3 to 5, wherein the second limit value is a value obtained by multiplying the first limit value by a positive value less than 1 as a coefficient. .

(Appendix 7)
Based on the noise check result, a noise value distribution calculating unit that calculates a noise value distribution in the entire circuit design target,
The circuit design device according to any one of appendix 3 to appendix 6, wherein the display control unit performs control to display the noise value distribution in the entire circuit design target on the display unit.

(Appendix 8)
A slack value calculation unit for calculating the slack values of the wiring of interest and the influence wiring based on the delay value and the maximum allowable delay value of each wiring;
The display control unit performs control to display the slack value calculated for each wiring on the display unit corresponding to each wiring, according to any one of appendix 1 to appendix 7, The circuit design apparatus described.

(Appendix 9)
The display control unit performs control to display an arrow indicating the signal propagation direction of each wiring in the display state corresponding to each wiring in a display state corresponding to the slack value calculated for each wiring. The circuit design device according to appendix 8, characterized by:

    (Additional remark 10) The said display control part performs control which displays the said delay value and the said maximum permissible delay value of each wiring on the said display part corresponding to each wiring, Additional remark 8 or Additional remark 9 characterized by the above-mentioned. The circuit design device described in 1.

(Appendix 11)
For each of the noted wiring and the affected wiring, the number of damaged wirings, each of which is a wiring affected by noise, and the number of harmful wirings, each of which is a wiring affected by noise, are obtained as a result of the noise check. It has a damage / harmful wiring number acquisition section acquired from
The display control unit performs control to display the number of the damaged wirings and the number of the harmful wirings on the display unit as a table in association with each wiring. The circuit design apparatus according to the item.

(Appendix 12)
The circuit design apparatus according to appendix 11, wherein the display control unit performs control to display a wiring name of the damaged wiring and a wiring name of the harmful wiring in the table.

(Appendix 13)
12. The circuit design apparatus according to appendix 11, wherein the display control unit performs control to highlight information related to each wiring in accordance with a slack value of each wiring in the table.

(Appendix 14)
A circuit design device for designing a circuit based on a noise check result,
A display unit;
A display control unit for controlling the display unit;
Based on the noise check result, a noise value distribution calculating unit that calculates a noise value distribution in the entire circuit design target,
The circuit design apparatus, wherein the display control unit controls the display unit to display the noise value distribution in the entire circuit design target.

(Appendix 15)
A circuit design program that causes a computer to function as a circuit design device that performs circuit design based on a noise check result,
A display control unit for controlling the display unit,
A designating part for designating the wiring of interest; and
While causing the computer to function as an influence wiring extraction unit that extracts all wirings having a wiring section that is a noise check target of the wiring of interest specified by the specification unit as influence wirings, from a database that stores wiring results ,
The display control unit causes the computer to function so as to control the display unit to display the attention wiring and the influence wiring extracted by the influence wiring extraction unit. .

(Appendix 16)
In each affected wiring, the section noise value indicating the degree of noise placed on the target wiring by the wiring section is calculated, and the sum of the section noise values calculated for each wiring section is used as the total noise value of the affected wiring. A noise value calculator for calculating,
An overall noise value determination unit for determining whether or not the overall noise value exceeds a first limit value; and
The section noise value determination unit that determines whether or not the section noise value exceeds the second limit value for the influence wiring determined that the overall noise value exceeds the first limit value. The display control unit controls the display unit to highlight the wiring section determined to have the section noise value exceeding the second limit value as a priority correction location for noise improvement. The circuit design program according to appendix 15, wherein the computer is caused to function.

(Appendix 17)
The display control unit controls the computer to perform highlighting on the display unit as a noise candidate correction candidate portion for a wiring section in which the section noise value is determined to be equal to or less than the second limit value. The circuit design program according to appendix 16, wherein the program is made to function.

(Appendix 18)
While causing the computer to function as a noise value distribution calculation unit that calculates a noise value distribution in the entire circuit design target based on the interval noise value or the overall noise value calculated by the noise value calculation unit,
The circuit design according to appendix 16 or appendix 17, wherein the display control unit causes the computer to function so as to perform control for displaying the noise value distribution in the entire circuit design target on the display unit. program.

(Appendix 19)
While causing the computer to function as a slack value calculation unit that calculates the slack values of the wiring of interest and the influence wiring based on the delay value and the maximum allowable delay value of each wiring,
The display control unit causes the computer to function so as to perform control to display the slack value calculated for each wiring on the display unit in association with each wiring. The circuit design program according to any one of appendix 18.

(Appendix 20)
For each of the noted wiring and the affected wiring, the number of damaged wirings, each of which is a wiring affected by noise, and the number of harmful wirings, each of which is a wiring affected by noise, are obtained as a result of the noise check. As the damage / harmful wiring number acquisition unit acquired from
The display control unit causes the computer to function so as to perform control to display the number of the damaged wirings and the number of the harmful wirings on the display unit as a table corresponding to each wiring. The circuit design program according to any one of 15 to appendix 19.

1 LSI chip 1a Sub chip 1b LSG
1c External I / O area
1d Custom macro (large cell)
1e Standard cell 1f Module pin 1g Wire & via (inter-cell wiring)
1h terminal 1i internal wiring 10 circuit design device 11 HDL database 12 cell library 13 logic / placement / wiring database (design database) 20 information creation unit 30 display unit 40 layout correction unit (designation unit)
DESCRIPTION OF SYMBOLS 50 Timing check part 51 Check data preparation part 52 Timing calculation part 53 Delay value / slack value calculation part 54 Display information preparation part (display control part)
60 noise check unit 61 check data creation unit 62 one-to-one noise value calculation unit 63 one-to-one noise value determination unit (overall noise value determination unit, section noise value determination unit)
64 1-to-2 noise value calculation unit 65 1-to-2 noise value determination unit 66 error determination unit 67 display information creation unit 671 display control unit 672 influence wiring extraction unit 673 noise value distribution calculation unit 674 damage / harmful wiring number acquisition unit 80 check Target wiring net (victim net)
81 Driver cell 81a Driver terminal 82 Receiver cell 82a Receiver terminal 83 Check target wiring (victim)
90 Influence wiring net (aggressor net)
91 driver cell 91a driver terminal 92 receiver cell 92a receiver terminal 93 influence wiring (aggressor)
93a, 93b Wiring section subject to noise check

Claims (10)

A circuit design device for designing a circuit based on a noise check result,
A display unit;
A display control unit for controlling the display unit;
A designating part for designating the wiring of interest;
An influence wiring extraction unit that extracts all wirings having a wiring section that is a noise check target of the wiring of interest specified by the specification unit as an influence wiring, from a database that stores wiring results;
A slack value calculating unit that calculates the slack values of the wiring of interest and the affected wiring based on the delay value and the maximum allowable delay value of each wiring;
The display control unit displays the attention wiring and the influence wiring extracted by the influence wiring extraction unit on the display unit, and associates the slack value calculated for each wiring with each wiring. A circuit design apparatus for performing display control on the display unit.   The display control unit performs control to display an arrow indicating the signal propagation direction of each wiring in the display state corresponding to each wiring in a display state corresponding to the slack value calculated for each wiring. The circuit design device according to claim 1, wherein:   3. The display control unit according to claim 1, wherein the display control unit performs control to display the delay value and the maximum allowable delay value of each wiring on the display unit corresponding to each wiring. 4. Circuit design equipment. A circuit design device for designing a circuit based on a noise check result,
A display unit;
A display control unit for controlling the display unit;
A designating part for designating the wiring of interest;
An influence wiring extraction unit that extracts all wirings having a wiring section that is a noise check target of the wiring of interest specified by the specification unit as an influence wiring, from a database that stores wiring results;
For each of the noted wiring and the affected wiring, the number of damaged wirings, each of which is a wiring affected by noise, and the number of harmful wirings, each of which is a wiring affected by noise, are obtained as a result of the noise check. A damage / harmful wiring number acquisition section acquired from
The display control unit displays the target wiring and the affected wiring extracted by the affected wiring extraction unit on the display unit, and associates the number of damaged wirings and the number of harmful wirings with each wiring. A circuit design apparatus that performs control to display on the display unit as a table.   The circuit design device according to claim 4, wherein the display control unit performs control to display a wiring name of the damaged wiring and a wiring name of the harmful wiring in the table.   The circuit design apparatus according to claim 4, wherein the display control unit performs control to highlight information related to each wiring in the table according to a slack value of each wiring. A circuit design device for designing a circuit based on a noise check result,
A display unit;
A display control unit for controlling the display unit;
A noise value distribution calculating unit that calculates a noise value distribution in the entire circuit design object based on the noise check result;
The circuit design apparatus, wherein the display control unit controls the display unit to display the noise value distribution in the entire circuit design target. A circuit design program that causes a computer to function as a circuit design device that performs circuit design based on a noise check result,
A display control unit for controlling the display unit,
A designation part that designates the wiring of interest,
An influence wiring extraction unit that extracts all wirings having a wiring section that is a noise check target of the wiring of interest specified by the specification unit as an influence wiring from a database that stores wiring results; and
Causing the computer to function as a slack value calculation unit that calculates the slack values of the wiring of interest and the influence wiring based on the delay value and the maximum allowable delay value of each wiring;
The display control unit displays the attention wiring and the influence wiring extracted by the influence wiring extraction unit on the display unit, and associates the slack value calculated for each wiring with each wiring. A circuit design program for causing the computer to function so as to perform display control on the display unit. A circuit design program that causes a computer to function as a circuit design device that performs circuit design based on a noise check result,
A display control unit for controlling the display unit,
A designation part that designates the wiring of interest,
An influence wiring extraction unit that extracts all wirings having a wiring section that is a noise check target of the wiring of interest specified by the specification unit as an influence wiring from a database that stores wiring results; and
For each of the noted wiring and the affected wiring, the number of damaged wirings, each of which is a wiring affected by noise, and the number of harmful wirings, each of which is a wiring affected by noise, are obtained as a result of the noise check. As the damage / harmful wiring number acquisition unit acquired from
The display control unit displays the target wiring and the affected wiring extracted by the affected wiring extraction unit on the display unit, and associates the number of damaged wirings and the number of harmful wirings with each wiring. A circuit design program for causing the computer to function so as to perform control of display on the display unit as a table. A circuit design program that causes a computer to function as a circuit design device that performs circuit design based on a noise check result,
A display control unit for controlling the display unit, and
Based on the noise check result, while causing the computer to function as a noise value distribution calculation unit that calculates a noise value distribution in the entire circuit design target,
The circuit design program for causing the computer to function so that the display control unit performs control to display the noise value distribution in the entire circuit design object on the display unit.

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