JP2013145919A - Thin film deposition apparatus cleaning method, thin film deposition method, thin film deposition apparatus and program - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a thin film deposition apparatus cleaning method which can efficiently clean a thin film deposition apparatus.SOLUTION: A thin film deposition apparatus cleaning method comprises performing a cleaning process of supplying a cleaning gas containing a hydrogen fluoride to a reaction tube 2 to remove attached substances attached to the inside of the apparatus. In the cleaning process, a temperature in the reaction tube 2 is set at a temperature different from a temperature in the reaction tube 2 for depositing thin films on a semiconductor wafer W. The cleaning method further comprises performing an oxidation process of supplying oxygen radicals to the reaction tube 2 to oxidize a silicon fluoride attached to the inside of the apparatus; and subsequently, performing an oxide removal process of supplying a cleaning gas containing a hydrogen fluoride to the reaction tube 2 to remove the oxidized silicon fluoride. The oxidation process and the oxide removal process are repeated a plurality of times. By doing this, a thin film deposition apparatus 1 is efficiently cleaned.

Description

  The present invention relates to a thin film forming apparatus cleaning method, thin film forming method, thin film forming apparatus, and program.

  In the manufacturing process of a semiconductor device, a thin film forming process for forming a thin film on a target object, for example, a semiconductor wafer by a process such as CVD (Chemical Vapor Deposition) is widely performed. In such a thin film forming process, for example, a reaction product is generated by a film forming gas in a reaction tube of the thin film forming apparatus, and the reaction product is deposited on the surface of the semiconductor wafer, thereby forming a thin film on the surface of the semiconductor wafer. Is done.

  By the way, the reaction product generated by the thin film forming process is deposited (attached) not only on the surface of the semiconductor wafer but also inside the thin film forming apparatus such as the inner wall of the reaction tube and various jigs. If the thin film forming process is continued in a state in which such deposits are adhered in the thin film forming apparatus, stress is generated due to the difference in thermal expansion coefficient between quartz constituting the reaction tube and the deposits. This stress breaks quartz and deposits into particles, reducing productivity.

  For this reason, a thin film is formed by supplying a halogen acid gas such as hydrogen fluoride as a cleaning gas into the reaction tube to remove (dry etching) reaction products adhering to the thin film forming apparatus such as the inner wall of the reaction tube. An apparatus cleaning method has been proposed (for example, Patent Document 1).

Further, when the thin film forming apparatus is cleaned using hydrogen fluoride as the cleaning gas, various silicofluorides as by-products are generated. Among the silicofluorides, in particular, for molecules having 6 or more fluorine atoms (hexafluorosilicic acid: H ₂ SiF ₆ , ammonium silicofluoride: (NH ₄ ) ₂ SiF _6, etc.), the pressure in the reaction tube is 133 Pa (1 Torr). If the pressure is not higher than 100 ° C., it will adhere to the inner wall of the reaction tube. For this reason, in the cleaning of the thin film forming apparatus using hydrogen fluoride, the pressure in the reaction tube is heated to 100 ° C. or higher under a reduced pressure of 133 Pa (1 Torr), or after the thin film forming apparatus is cleaned, the pressure is 133 Pa (1 Torr). Silica fluoride adhering to the inner wall of the reaction tube is removed by heating to 100 ° C. or higher under reduced pressure.

JP-A-3-293726

  By the way, in forming a thin film by a thin film forming apparatus or cleaning a thin film forming apparatus, it is required to set the temperature of a reaction tube to a low temperature, for example, a normal temperature. For this reason, when the thin film forming apparatus is cleaned at room temperature using hydrogen fluoride as the cleaning gas, the reaction tube is heated to 100 ° C. or higher in order to remove silicofluoride adhering to the inner wall of the reaction tube. Silica fluoride is removed, and the reaction tube is returned to room temperature to form a thin film.

  However, it takes time to lower the temperature inside the reaction tube to room temperature after heating to 100 ° C. or higher. For this reason, a method for efficiently cleaning a thin film forming apparatus is required.

  Furthermore, in a thin film forming apparatus that forms and cleans a thin film at room temperature, a heating unit such as a heater may not be provided, and it is necessary to attach a heating unit in order to remove silicofluoride adhering to the reaction tube. There is a problem that it takes time and effort.

  The present invention has been made in view of the above problems, and an object of the present invention is to provide a thin film forming apparatus cleaning method and the like that can efficiently clean the thin film forming apparatus.

In order to achieve the above object, a thin film forming apparatus cleaning method according to the first aspect of the present invention comprises:
A cleaning method for a thin film forming apparatus for removing deposits attached to the inside of a thin film forming apparatus for supplying a processing gas to a target object accommodated in a reaction chamber to form a thin film on the target object,
A cleaning step of supplying a cleaning gas containing hydrogen fluoride to the reaction chamber to remove deposits adhering to the inside of the apparatus;
A removal step of removing silicofluoride adhering to the inside of the apparatus by the cleaning step,
In the removing step, an oxidizing gas is supplied to the reaction chamber to oxidize silicofluoride adhering to the inside of the apparatus by the cleaning step, and a cleaning gas containing hydrogen fluoride is supplied to the reaction chamber to An oxide removal step for removing oxidized silicofluoride, and repeating the oxidation step and the oxide removal step a plurality of times,
In the cleaning step, the temperature in the reaction chamber is set to a temperature different from the temperature in the reaction chamber for forming a thin film on the object to be processed.

A thin film forming method according to a second aspect of the present invention includes:
A thin film forming step of forming a thin film on the object to be processed;
A cleaning step of cleaning the thin film forming apparatus by the thin film forming apparatus cleaning method according to the first aspect of the present invention;
It is characterized by comprising.

A thin film forming apparatus according to a third aspect of the present invention is:
A thin film forming apparatus for supplying a processing gas to a target object accommodated in a reaction chamber to form a thin film on the target object, and removing deposits adhered to the inside of the apparatus by forming the thin film. ,
Cleaning means for supplying a cleaning gas containing hydrogen fluoride to the reaction chamber to remove deposits attached to the inside of the apparatus;
Removing means for removing silicofluoride adhering to the inside of the apparatus by washing by the washing means;
Control means for controlling each part of the apparatus,
The removing means supplies an oxidizing gas to the reaction chamber and oxidizes silicofluoride adhering to the inside of the apparatus by cleaning by the cleaning means, and supplies a cleaning gas containing hydrogen fluoride to the reaction chamber. An oxide removing means for removing the oxidized silicofluoride,
The control means includes
After controlling the oxidation means to oxidize the silicofluoride adhering to the inside of the apparatus, the oxide removal means is controlled to repeat the process of removing the oxidized silicofluoride a plurality of times,
The temperature in the reaction chamber when removing the deposits adhered to the inside of the apparatus by the cleaning means is set to a temperature different from the temperature in the reaction chamber for forming a thin film on the object to be processed.

The program according to the fourth aspect of the present invention is:
A processing gas is supplied to the object to be processed contained in the reaction chamber to form a thin film on the object to be processed, and the thin film is formed to function as a thin film forming apparatus for removing deposits attached to the inside of the apparatus. A program for
Computer
A cleaning means for supplying a cleaning gas containing hydrogen fluoride to the reaction chamber to remove deposits adhering to the inside of the apparatus;
An oxidizing means for supplying an oxidizing gas to the reaction chamber and oxidizing the silicofluoride adhering to the inside of the apparatus by the cleaning means;
An oxide removing means for removing the oxidized silicofluoride by supplying a cleaning gas containing hydrogen fluoride to the reaction chamber;
Control means for controlling the oxidation means to oxidize silicofluoride adhering to the inside of the apparatus, and then controlling the oxide removal means to repeat the process of removing the oxidized silicofluoride a plurality of times,
Function as
The control means sets the temperature in the reaction chamber when removing the adhering matter adhering to the inside of the apparatus by the cleaning means to a temperature different from the temperature in the reaction chamber for forming a thin film on the object to be processed. It is characterized by.

  According to the present invention, the thin film forming apparatus can be efficiently cleaned.

It is a figure which shows the thin film forming apparatus of embodiment of this invention. It is a figure which shows the cross-sectional structure of the thin film forming apparatus of FIG. It is a figure which shows the structure of the control part of FIG. It is a figure explaining the formation method of a silicon oxide film. It is a figure which shows the time which the conventional method requires, and the time which the removal step of this Embodiment requires.

  Hereinafter, a cleaning method, a thin film forming method, a thin film forming apparatus, and a program for a thin film forming apparatus according to an embodiment of the present invention will be described. In the present embodiment, the present invention will be described by taking a batch type vertical thin film forming apparatus as an example of the thin film forming apparatus. In the present embodiment, the present invention will be described by taking as an example the case where a silicon oxide film is formed using an MLD (Molecular Layer Deposition) method. FIG. 1 shows a configuration of a thin film forming apparatus according to the present embodiment. FIG. 2 shows a cross-sectional configuration of the thin film forming apparatus of the present embodiment.

  As shown in FIG. 1, the thin film forming apparatus 1 includes a reaction tube 2 having a ceiling and a substantially cylindrical shape whose longitudinal direction is directed in the vertical direction. The reaction tube 2 is made of, for example, quartz.

  On one side of the reaction tube 2, an exhaust part 3 for exhausting the gas in the reaction tube 2 is arranged. The exhaust part 3 is formed so as to extend upward along the reaction tube 2, and communicates with the reaction tube 2 through an opening provided on a side wall of the reaction tube 2 (not shown). The upper end of the exhaust part 3 is connected to an exhaust port 4 arranged at the upper part of the reaction tube 2. An exhaust pipe (not shown) is connected to the exhaust port 4, and a pressure adjustment mechanism such as a valve (not shown) and a vacuum pump 127 described later is provided on the exhaust pipe. By this pressure adjusting mechanism, the gas in the reaction tube 2 is exhausted to the exhaust tube through the opening, the exhaust part 3 and the exhaust port 4, and the inside of the reaction tube 2 is controlled to a desired pressure (degree of vacuum).

  A lid 5 is disposed below the reaction tube 2. The lid 5 is made of, for example, quartz. The lid 5 is configured to be movable up and down by a boat elevator 128 described later. When the lid 5 is raised by the boat elevator 128, the lower side (furnace port portion) of the reaction tube 2 is closed, and when the lid 5 is lowered by the boat elevator 128, the lower side (furnace port portion) of the reaction tube 2. Is opened.

  A wafer boat 6 is placed on the lid 5. The wafer boat 6 is made of, for example, quartz. The wafer boat 6 is configured to accommodate a plurality of semiconductor wafers W at predetermined intervals in the vertical direction.

Processing gas supply pipes 8 and 9 for supplying a processing gas into the reaction tube 2 are inserted in side surfaces near the lower end of the reaction tube 2. In the present embodiment, since a silicon oxide film is formed on the semiconductor wafer W, a source gas, an oxidizing gas, a cleaning gas, a dilution gas, or the like is used as a processing gas. The source gas is a gas that adsorbs the source (Si) to the semiconductor wafer W, and diisopropylaminosilane (DIPAS) is used. The source gas is used in an adsorption step described later. The oxidizing gas is a gas that oxidizes the adsorbed source (Si), and oxygen (O ₂ ) is used in this example. The oxidizing gas is used in an oxidation step described later. The cleaning gas is a gas for removing the silicon oxide film and the like attached to the inside of the apparatus, and a gas containing hydrogen fluoride (HF) is used. The cleaning gas is used in an oxide removal process in a cleaning step and a removal step described later. The dilution gas is a gas for diluting the processing gas, and nitrogen (N ₂ ) is used in this example.

Of these process gases, an oxidizing gas is supplied into the reaction tube 2 via the process gas supply pipe 8. The processing gas supply pipe 8 is inserted into a plasma generator 10 which will be described later. For this reason, the oxidizing gas supplied from the processing gas supply pipe 8 is plasma-excited (activated). The source gas, the cleaning gas, and the dilution gas are supplied into the reaction tube 2 through the processing gas supply tube 9. A purge gas (for example, nitrogen (N ₂ )) is also supplied into the reaction tube 2 through the processing gas supply tube 9. The purge gas may be separately supplied into the reaction tube 2 via a purge gas supply tube. The processing gas supply pipe 9 is disposed on the inner wall of the reaction pipe 2 as shown in FIG. For this reason, the source gas, the cleaning gas, the dilution gas, and the purge gas supplied from the processing gas supply pipe 9 are not plasma-excited (activated). For example, a dispersion injector is used as the processing gas supply pipe 9.

  Each processing gas supply pipe 8, 9 is provided with a supply hole at a predetermined interval in the vertical direction, and the processing gas is supplied into the reaction tube 2 from the supply hole. For this reason, as shown by the arrows in FIG. 1, the processing gas is supplied into the reaction tube 2 from a plurality of locations in the vertical direction. The processing gas supply pipes 8 and 9 are connected to a processing gas supply source (not shown) via a mass flow controller (MFC) 125 described later. In FIG. 1, only a processing gas supply pipe 8 (a processing gas supply pipe for supplying an oxidizing gas in the present embodiment) for supplying a processing gas for performing a plasma processing described later is illustrated. In FIG. 2, a processing gas supply pipe 8 that supplies an oxidizing gas and a processing gas supply pipe 9 that supplies a processing gas that does not perform plasma processing, which will be described later (in this embodiment, a process for supplying a source gas and a purge gas). Gas supply pipe).

On the other side of the reaction tube 2, that is, on the opposite side of one side of the reaction tube 2 where the exhaust unit 3 is disposed, a plasma generation unit 10 is provided. The plasma generation unit 10 includes a pair of electrodes 11 and the like. A processing gas supply pipe 8 is inserted between the pair of electrodes 11. The pair of electrodes 11 is connected to a high-frequency power source, a matching unit, etc. (not shown). Then, high-frequency power is applied between the pair of electrodes 11 from a high-frequency power source through a matching unit, thereby plasma-exciting (activating) the processing gas supplied between the pair of electrodes 11, for example, oxygen radical (O ₂ ^* ) is generated. Oxygen radicals (O ₂ ^* ) and the like generated in this way are supplied from the plasma generator 10 into the reaction tube 2.

  In the reaction tube 2, a plurality of temperature sensors 122 that measure the temperature in the reaction tube 2, for example, a thermocouple and a pressure gauge 123 that measures the pressure in the reaction tube 2 are arranged. .

  Further, the thin film forming apparatus 1 includes a control unit 100 that controls each part of the apparatus. FIG. 3 shows the configuration of the control unit 100. As shown in FIG. 3, the control unit 100 includes an operation panel 121, a temperature sensor (group) 122, a pressure gauge (group) 123, an MFC 125, a valve control unit 126, a vacuum pump 127, a boat elevator 128, and a plasma control unit 129. Etc. are connected.

  The operation panel 121 includes a display screen and operation buttons, transmits an operation instruction of the operator to the control unit 100, and displays various information from the control unit 100 on the display screen.

The temperature sensor (group) 122 measures the temperature of each part such as the inside of the reaction tube 2 and the exhaust pipe, and notifies the control unit 100 of the measured value.
The pressure gauge (group) 123 measures the pressure of each part such as the inside of the reaction tube 2 and the exhaust pipe, and notifies the control unit 100 of the measured value.

  The MFC 125 is arranged in each pipe such as the processing gas supply pipes 8 and 9 and controls the flow rate of the gas flowing through each pipe to the amount instructed by the control unit 100 and measures the flow rate of the actually flowed gas. , Notify the control unit 100.

The valve control unit 126 is arranged in each pipe, and controls the opening degree of the valve arranged in each pipe to a value instructed by the control unit 100.
The vacuum pump 127 is connected to the exhaust pipe and exhausts the gas in the reaction tube 2.

  The boat elevator 128 raises the lid 5 to load the wafer boat 6 (semiconductor wafer W) into the reaction tube 2 and lowers the lid 5 to react the wafer boat 6 (semiconductor wafer W). Unload from within tube 2.

The plasma control unit 129 is for controlling the plasma generation unit 10. In response to an instruction from the control unit 100, the plasma control unit 129 controls the plasma generation unit 10 and is supplied into the plasma generation unit 10. Oxygen is activated to generate oxygen radicals (O ₂ ^* ) and the like.

  The control unit 100 includes a recipe storage unit 111, a ROM 112, a RAM 113, an I / O port 114, a CPU 115, and a bus 116 that interconnects them.

  The recipe storage unit 111 stores a setup recipe and a plurality of process recipes. At the beginning of the production of the thin film forming apparatus 1, only the setup recipe is stored. The setup recipe is executed when a thermal model or the like corresponding to each processing apparatus is generated. The process recipe is a recipe prepared for each heat treatment (process) actually performed by the user. Each process from loading of the semiconductor wafer W to the reaction tube 2 until unloading of the processed semiconductor wafer W is performed. The temperature change, the pressure change in the reaction tube 2, the start and stop timings and supply amount of the processing gas are defined.

The ROM 112 is a recording medium that includes an EEPROM, a flash memory, a hard disk, and the like, and stores an operation program of the CPU 115 and the like.
The RAM 113 functions as a work area for the CPU 115.

  The I / O port 114 is connected to the operation panel 121, temperature sensor 122, pressure gauge 123, MFC 125, valve control unit 126, vacuum pump 127, boat elevator 128, plasma control unit 129, etc., and inputs / outputs data and signals. Control.

A CPU (Central Processing Unit) 115 constitutes the center of the control unit 100 and executes a control program stored in the ROM 112. Further, the CPU 115 controls the operation of the thin film forming apparatus 1 in accordance with a recipe (process recipe) stored in the recipe storage unit 111 in accordance with an instruction from the operation panel 121. That is, the CPU 115 causes the temperature sensor (group) 122, the pressure gauge (group) 123, the MFC 125, and the like to measure the temperature, pressure, flow rate, and the like of each part in the reaction tube 2 and the exhaust tube, and based on the measurement data, Control signals and the like are output to the MFC 125, the valve control unit 126, the vacuum pump 127, and the like, and the above-described units are controlled to follow the process recipe.
The bus 116 transmits information between the units.

  Next, a silicon oxide film forming method (thin film forming method) including a method for forming a silicon oxide film and a method for cleaning the thin film forming apparatus 1 using the thin film forming apparatus 1 configured as described above will be described. . FIG. 4 is a diagram showing a recipe (time sequence) for explaining a method of forming a silicon oxide film.

In the formation of the silicon oxide film of the present embodiment, a silicon oxide film is formed on the semiconductor wafer W at room temperature (for example, 30 ° C.) by an MLD (Molecular Layer Deposition) method. In the formation of the silicon oxide film, as shown in FIG. 4, an adsorption step for adsorbing a silicon-containing substance containing silicon (Si) (hereinafter referred to as “silicon or Si”) on the surface of the semiconductor wafer W; Oxidation steps for oxidizing the formed Si, and these steps represent one cycle of the MLD method. Further, as shown in FIG. 4, in this embodiment, DIPAS as a source gas, oxygen as oxidizing gas _(O 2), and using nitrogen _{(N 2)} as a diluent gas. A desired silicon oxide film is formed on the semiconductor wafer W by executing (repeating) the cycle shown in the recipe of FIG.

Further, in the cleaning method of the thin film forming apparatus 1 of the present embodiment, the cleaning step of cleaning the silicon oxide film adhering to the inside of the thin film forming apparatus 1 with hydrogen fluoride (HF) at room temperature (for example, 30 ° C.). And a removal step of removing silicofluoride which is a by-product adhering to the inside of the apparatus by the cleaning step. The removal step includes an oxidation process for oxidizing the silicofluoride using an oxidizing gas, and an oxide removal process for removing the oxidized silicofluoride with HF, and these processes constitute one cycle. Further, as shown in FIG. 4, in this embodiment, oxygen (O ₂ ) is used as the oxidizing gas. By executing (repeating) the cycle shown in the recipe of FIG. 4 a plurality of times, for example, 10 cycles, silicic fluoride adhering to the inside of the apparatus is removed.

  In the following description, the operation of each part constituting the thin film forming apparatus 1 is controlled by the control unit 100 (CPU 115). Further, as described above, the control unit 100 (CPU 115) uses the MFC 125 (process gas supply pipes 8 and 9), the valve control unit 126, the vacuum pump, etc. 127, by controlling the plasma control unit 129 (plasma generation unit 10) and the like, the conditions are set according to the recipe shown in FIG.

  First, a semiconductor wafer W as an object to be processed is accommodated (loaded) in the reaction tube 2. Specifically, a predetermined amount of nitrogen is supplied into the reaction tube 2 and the wafer boat 6 containing the semiconductor wafer W is placed on the lid 5. Then, the lid 5 is raised by the boat elevator 128, and the semiconductor wafer W (wafer boat 6) is loaded into the reaction tube 2.

  Next, an adsorption step for adsorbing Si on the surface of the semiconductor wafer W is executed. The adsorption step is a process of supplying a source gas to the semiconductor wafer W and adsorbing Si on the surface thereof. In the present embodiment, Si is adsorbed to the semiconductor wafer W by supplying DIPAS to the semiconductor wafer W.

  In the adsorption step, first, the inside of the reaction tube 2 is brought to a predetermined temperature, for example, room temperature (for example, 30 ° C.) as shown in FIG. In this example, since the inside of the reaction tube 2 is set to room temperature, the inside of the reaction tube 2 is not heated. In addition, a predetermined amount of nitrogen is supplied from the processing gas supply pipe 9 into the reaction tube 2, and the gas in the reaction tube 2 is discharged, so that the reaction tube 2 has a predetermined pressure, for example, as shown in FIG. And 66.5 Pa (0.5 Torr). Then, a predetermined amount of DIPAS is supplied from the processing gas supply pipe 9, for example, 0.3 slm as shown in FIG. 4 (d) and a predetermined amount of nitrogen into the reaction tube 2 as shown in FIG. 4 (c). Supply (flow process). When DIPAS is supplied into the reaction tube 2, the supplied DIPAS reacts with the surface of the semiconductor wafer W, and Si is adsorbed on the surface of the semiconductor wafer W.

  Here, in the method for forming the silicon oxide film, it is preferable not to change the temperature in the reaction tube 2 in view of the film forming sequence. For this reason, in the present embodiment, as described later, the temperature in the reaction tube 2 is not changed even in the oxidation step, and is set to room temperature (30 ° C.).

  The temperature in the reaction tube 2 is preferably -32 ° C to 100 ° C. This is because if the temperature in the reaction tube 2 is lower than −32 ° C., the source gas DIPAS may not be supplied. This is because the lower limit temperature at which a practical vapor pressure considering pressure loss of the processing gas supply pipe 9 and the MFC 125 is obtained from a DIPAS processing gas supply source (not shown) is −32 ° C., and −32 ° C. is the DIPAS supply limit. This is because it is considered. Further, when the temperature in the reaction tube 2 is higher than 100 ° C., the feature (function) of the present invention that efficiently cleans the thin film forming apparatus cannot be exhibited. The temperature in the reaction tube 2 is more preferably room temperature (for example, 25 ° C. to 35 ° C.) to 80 ° C., further preferably room temperature to 60 ° C., and most preferably room temperature.

  The supply amount of DIPAS is preferably 10 sccm to 10 slm. This is because if it is less than 10 sccm, sufficient DIPAS may not be supplied to the surface of the semiconductor wafer W, and if it is more than 10 slm, DIPAS that does not contribute to the reaction may increase. The supply amount of DIPAS is more preferably 0.05 slm to 3 slm. This is because the reaction between the surface of the semiconductor wafer W and DIPAS is promoted by setting it in such a range.

  The pressure in the reaction tube 2 is preferably 0.133 Pa (0.001 Torr) to 13.3 kPa (100 Torr). This is because the reaction between the surface of the semiconductor wafer W and DIPAS can be promoted by setting the pressure within this range.

  In addition, since monovalent aminosilane called DIPAS is used for the source gas, nitrogen (N) is less likely to be contained in the adsorbed material adsorbed in the adsorption process as compared with the case where 2 to 4 valent aminosilane is used. A high-quality silicon oxide film can be formed. In addition, structural failure is unlikely to occur during Si adsorption, and adsorption of other molecules is unlikely to be hindered, so that the adsorption rate does not slow down and productivity does not decrease. Furthermore, since DIPAS is used as the source gas, it has excellent thermal stability and facilitates flow rate control. Moreover, the conventional source supply system apparatus can be used, and it has versatility.

  When the flow process of the adsorption step is performed for 1 to 3 seconds (sec), for example, for 2 seconds as shown in FIG. 4 (h), when a predetermined amount of Si is adsorbed on the surface of the semiconductor wafer W, the processing gas supply pipe The supply of DIPAS and nitrogen from 9 is stopped. Then, the gas in the reaction tube 2 is discharged, and for example, a predetermined amount of nitrogen is supplied from the processing gas supply tube 9 into the reaction tube 2 to discharge the gas in the reaction tube 2 to the outside of the reaction tube 2 (purge). , Vacuum process).

  Subsequently, an oxidation step for oxidizing the surface of the semiconductor wafer W is performed. The oxidation step is a process of oxidizing the adsorbed Si by supplying an oxidizing gas onto the semiconductor wafer W on which Si is adsorbed. In the present embodiment, Si adsorbed by supplying oxygen (oxygen radicals) onto the semiconductor wafer W is oxidized.

In the oxidation step, the inside of the reaction tube 2 is set to a predetermined temperature, for example, room temperature (30 ° C.) as shown in FIG. In addition, a predetermined amount of nitrogen is supplied from the processing gas supply pipe 9 into the reaction tube 2, and the gas in the reaction tube 2 is discharged, so that the reaction tube 2 has a predetermined pressure, for example, as shown in FIG. And 66.5 Pa (0.5 Torr). Then, for example, 500 W is applied between the electrodes 11 from a high-frequency power source (not shown) via a matching unit as shown in FIG. Further, a predetermined amount of oxygen, for example, 1 slm is supplied from the processing gas supply pipe 8 between the pair of electrodes 11 (inside the plasma generator 10) as shown in FIG. Oxygen supplied between the pair of electrodes 11 is plasma-excited (activated) to generate oxygen radicals (O ^* ). The oxygen radicals generated in this way are supplied from the plasma generation unit 10 into the reaction tube 2. Further, as shown in FIG. 4C, a predetermined amount of nitrogen as a dilution gas is supplied from the processing gas supply pipe 9 into the reaction pipe 2 (flow process). When oxygen radicals are supplied into the reaction tube 2, Si adsorbed on the semiconductor wafer W is oxidized, and a silicon oxide film is formed on the semiconductor wafer W.

  Here, the supply amount of oxygen is preferably 0.1 sccm to 10 slm. This is because, within this range, plasma can be generated without problems and oxygen radicals sufficient to form a silicon oxide film can be supplied. More preferably, the supply amount of oxygen is 0.5 slm to 5 slm. This is because the plasma can be generated stably by setting it in such a range.

  The RF power is preferably 10 W to 1500 W. This is because if it is less than 10 W, oxygen radicals are hardly generated, and if it exceeds 1500 W, the quartz wall constituting the plasma generation unit 10 may be damaged. The RF power is more preferably 50 W to 500 W. This is because, within this range, oxygen radicals can be generated efficiently.

  The pressure in the reaction tube 2 is preferably 0.133 Pa (0.001 Torr) to 13.3 kPa (100 Torr). By setting the pressure in such a range, oxygen radicals are likely to be generated, and the mean free path of oxygen radicals in the space where the semiconductor wafer W is placed increases. The pressure in the reaction tube 2 is more preferably 25 Pa (0.2 Torr) to 400 Pa (3 Torr). This is because the pressure in the reaction tube 2 can be easily controlled by setting the pressure within this range.

  The pressure in the plasma generating unit 10 is preferably 0.133 Pa (0.001 Torr) to 13.3 kPa (100 Torr), and more preferably 70 Pa (0.53 Torr) to 400 Pa (3 Torr). This is because by setting the pressure within such a range, plasma can be generated without problems and oxygen radicals sufficient to form a silicon oxide film can be supplied.

  The flow process of the oxidation step is performed for 5 to 30 seconds, for example, for 8 seconds as shown in FIG. 4 (h), and when a desired silicon oxide film is formed on the semiconductor wafer W, the processing gas supply pipe 8 Then, the supply of oxygen is stopped and the application of high-frequency power from a high-frequency power source (not shown) is stopped. Further, the supply of nitrogen from the processing gas supply pipe 9 is stopped. Then, the gas in the reaction tube 2 is discharged, and a predetermined amount of nitrogen is supplied from the processing gas supply tube 9 into the reaction tube 2 to react the gas in the reaction tube 2 as shown in FIG. Drain out of the tube 2 (purge, vacuum process).

  As a result, one cycle of the MLD method including the adsorption step and the oxidation step is completed.

  Subsequently, one cycle of the MLD method starting from the adsorption step is started again. Then, this cycle is repeated a predetermined number of times. As a result, DIPAS is supplied to the surface of the semiconductor wafer W to adsorb Si, and the adsorbed Si is oxidized to further form a silicon oxide film. As a result, a silicon oxide film having a desired thickness is formed on the semiconductor wafer W.

  When a silicon oxide film having a desired thickness is formed on the semiconductor wafer W, the semiconductor wafer W is unloaded. Specifically, a predetermined amount of nitrogen is supplied into the reaction tube 2 from the processing gas supply tube 9 to return the pressure in the reaction tube 2 to normal pressure. Then, the semiconductor wafer W is unloaded by lowering the lid 5 by the boat elevator 128.

  When the film formation process as described above is performed a plurality of times, reaction products (attachments) such as a silicon oxide film generated by the film formation process are not only on the surface of the semiconductor wafer W but also on the inner wall of the reaction tube 2 or the like. Are also deposited (attached). For this reason, after performing the film forming process a predetermined number of times, a cleaning process (a cleaning method of the thin film forming apparatus 1) is executed.

  First, the inside of the reaction tube 2 is set to a predetermined temperature, for example, room temperature (30 ° C.) as shown in FIG. Further, a predetermined amount of nitrogen is supplied into the reaction tube 2 from the processing gas supply tube 9. Next, an empty wafer boat 6 in which no semiconductor wafer W is accommodated is placed on the lid 5, the lid 5 is raised by the boat elevator 128, and the empty wafer boat 6 is loaded into the reaction tube 2. .

  Next, a cleaning step is performed in which the deposits adhered to the inside of the thin film forming apparatus 1 are cleaned with a cleaning gas containing hydrogen fluoride (HF).

  First, as shown in FIG. 4 (c), a predetermined amount of nitrogen is supplied into the reaction tube 2 from the processing gas supply tube 9, and the gas in the reaction tube 2 is discharged. For example, as shown in FIG. 4B, it is set to 5320 Pa (40 Torr). Next, a predetermined amount of cleaning gas is supplied into the reaction tube 2 from the processing gas supply tube 9. In this example, for example, as shown in FIG. 4G, 1 slm of hydrogen fluoride is supplied, and a predetermined amount of nitrogen is supplied as shown in FIG. 4C (flow process). When the cleaning gas is supplied into the reaction tube 2, the supplied hydrogen fluoride reacts with the adhering matter adhering to the inside of the apparatus, and the adhering matter is removed. However, silicofluoride which is a by-product of this reaction adheres to the inside of the apparatus such as the reaction tube 2.

  Here, the supply amount of hydrogen fluoride is preferably 10 sccm to 10 slm. This is because if it is less than 10 sccm, there is a possibility that sufficient hydrogen fluoride will not be supplied to the deposits adhering to the inside of the apparatus, and if it is more than 10 slm, there is a risk that hydrogen fluoride that does not contribute to the reaction will increase. The supply amount of hydrogen fluoride is more preferably 0.05 slm to 3 slm. This is because the reaction between the deposit and hydrogen fluoride is promoted by setting the amount within this range.

  The pressure in the reaction tube 2 is preferably 0.133 Pa (0.001 Torr) to 101.3 kPa (760 Torr). This is because the reaction between the deposit and hydrogen fluoride is promoted by setting the pressure within this range.

  When the flow process of the cleaning step is performed for a predetermined time and the deposits are removed, the supply of hydrogen fluoride and nitrogen from the processing gas supply pipe 9 is stopped. Then, the gas in the reaction tube 2 is discharged, and for example, a predetermined amount of nitrogen is supplied from the processing gas supply tube 9 into the reaction tube 2 to discharge the gas in the reaction tube 2 to the outside of the reaction tube 2 (purge). , Vacuum process).

  Subsequently, a removal step for removing silicofluoride, which is a by-product attached to the inside of the apparatus by the cleaning step, is executed. First, an oxidation process for oxidizing silicofluoride using an oxidizing gas is performed.

In the oxidation step, a predetermined amount of nitrogen is supplied into the reaction tube 2 from the processing gas supply tube 9, and the gas in the reaction tube 2 is discharged, so that the reaction tube 2 is kept at a predetermined pressure, for example, FIG. As shown, it is set to 66.5 Pa (0.5 Torr). Then, for example, 500 W is applied between the electrodes 11 from a high-frequency power source (not shown) via a matching unit as shown in FIG. Further, a predetermined amount of oxygen, for example, 1 slm is supplied from the processing gas supply pipe 8 between the pair of electrodes 11 (inside the plasma generator 10) as shown in FIG. Oxygen supplied between the pair of electrodes 11 is plasma-excited (activated) to generate oxygen radicals (O ^* ). The oxygen radicals generated in this way are supplied from the plasma generation unit 10 into the reaction tube 2. Further, as shown in FIG. 4C, a predetermined amount of nitrogen as a dilution gas is supplied from the processing gas supply pipe 9 into the reaction pipe 2 (flow process). When oxygen radicals are supplied into the reaction tube 2, the silicofluoride adhering to the inside of the apparatus is oxidized.

  The supply amount of oxygen is preferably 0.1 sccm to 10 slm. This is because, within this range, plasma can be generated without problems and oxygen radicals sufficient to oxidize the silicofluoride adhering to the inside of the apparatus can be supplied. More preferably, the supply amount of oxygen is 0.5 slm to 5 slm. This is because the plasma can be generated stably by setting it in such a range.

  The RF power is preferably 10 W to 1500 W. This is because if it is less than 10 W, oxygen radicals are hardly generated, and if it exceeds 1500 W, the quartz wall constituting the plasma generation unit 10 may be damaged. The RF power is more preferably 50 W to 500 W. This is because, within this range, oxygen radicals can be generated efficiently.

  The pressure in the reaction tube 2 is preferably 0.133 Pa (0.001 Torr) to 13.3 kPa (100 Torr). This is because oxygen radicals are easily generated when the pressure is within this range. The pressure in the reaction tube 2 is more preferably 25 Pa (0.2 Torr) to 400 Pa (3 Torr). This is because the pressure in the reaction tube 2 can be easily controlled by setting the pressure within this range.

  The pressure in the plasma generating unit 10 is preferably 0.133 Pa (0.001 Torr) to 13.3 kPa (100 Torr), and more preferably 70 Pa (0.53 Torr) to 400 Pa (3 Torr). By setting the pressure within such a range, plasma can be generated without problems and oxygen radicals sufficient to oxidize the silicofluoride adhering to the inside of the apparatus can be supplied.

  For example, as shown in FIG. 4 (h), the oxidation process of the removal step is performed for 300 seconds (5 minutes). When the silicofluoride adhering to the inside of the apparatus is oxidized, oxygen is supplied from the processing gas supply pipe 8 to the oxygen gas. And the application of high frequency power from a high frequency power source (not shown) is stopped. Further, the supply of nitrogen from the processing gas supply pipe 9 is stopped.

  Subsequently, an oxide removal step is performed in which the silicofluoride oxidized in the oxidation step is removed with hydrogen fluoride.

  First, as shown in FIG. 4 (c), a predetermined amount of nitrogen is supplied into the reaction tube 2 from the processing gas supply tube 9, and the gas in the reaction tube 2 is discharged. For example, as shown in FIG. 4B, it is set to 5320 Pa (40 Torr). Next, a predetermined amount of cleaning gas is supplied into the reaction tube 2 from the processing gas supply tube 9. In this example, for example, as shown in FIG. 4 (g), 1 slm of hydrogen fluoride is supplied, and a predetermined amount of nitrogen is supplied as shown in FIG. 4 (c).

  The supply amount of hydrogen fluoride is preferably 10 sccm to 10 slm. This is because if it is less than 10 sccm, there is a possibility that sufficient hydrogen fluoride will not be supplied to the silicofluoride oxidized in the oxidation step, and if it is more than 10 slm, there is a possibility that hydrogen fluoride that does not contribute to the reaction will increase. The supply amount of hydrogen fluoride is more preferably 0.05 slm to 3 slm. This is because the reaction between the oxidized silicofluoride and hydrogen fluoride is promoted by setting the amount within this range.

  The pressure in the reaction tube 2 is preferably 0.133 Pa (0.001 Torr) to 101.3 kPa (760 Torr). This is because the reaction between the oxidized silicofluoride and hydrogen fluoride is promoted by setting the pressure within this range.

  When the cleaning gas is supplied into the reaction tube 2, the silicofluoride oxidized in the oxidation step and hydrogen fluoride react to remove the oxidized silicofluoride. Even in the oxide removal process, silicofluoride adheres to the inside of the reaction tube 2 or the like, but the amount of the adhering silicofluoride is smaller than the amount of silicofluoride adhering in the cleaning step.

  For example, as shown in FIG. 4 (h), the oxide removal process of the removal step is performed for 300 seconds (5 minutes), and when the oxidized silicofluoride is removed, the process gas supply pipe 9 Stop supply of hydrogen fluoride and nitrogen. Thereby, one cycle of the removal step including the oxidation step and the oxide removal step is completed.

  Subsequently, the next cycle starting from the oxidation step is started again. Then, this cycle is repeated a predetermined number of times, for example, 10 times. Thereby, the silicofluoride adhering to the inside of the apparatus is removed, and the removal step is completed.

  After the thin film forming apparatus 1 is cleaned by the cleaning method as described above, the wafer boat 6 containing the semiconductor wafers W is placed on the lid body 5 lowered by the boat elevator 128, whereby the semiconductor wafer W is mounted. Then, the film forming process for forming the silicon oxide film can be performed again.

  Next, whether or not deposits attached to the inside of the thin film forming apparatus 1 can be removed by executing the film forming process and the cleaning process using the thin film forming apparatus 1 as described above. Was confirmed. Specifically, a silicon oxide film is formed on the semiconductor wafer W by the film forming process shown in FIG. 4, and a reaction product such as 1 μm silicon oxide is deposited on the wall surface of the reaction tube 2. The reaction tube 2 was washed by the washing treatment, and the surface state of the wall surface of the reaction tube 2 after the washing treatment was confirmed by a photograph taken with a scanning electron microscope (SEM). As a result, it was confirmed that the reaction product deposited on the wall surface of the reaction tube 2 was removed.

  Also, the time required to remove the silicofluoride by heating the interior of the conventional reaction tube to 100 ° C. or higher and return the reaction tube to room temperature again is compared with the time required for the cleaning step of the present embodiment. Then, it was confirmed whether or not the thin film forming apparatus can be efficiently cleaned. FIG. 5 is a diagram showing the time required for the conventional method and the time required for the removal step of the present embodiment.

  As shown in FIG. 5, it was confirmed that the conventional step that took 150 minutes can be made 100 minutes by using the removal step of the present invention, and that the time can be shortened by 50 minutes. For this reason, it has confirmed that this invention can wash | clean a thin film forming apparatus efficiently.

  As described above, according to the present embodiment, the thin film forming apparatus can be efficiently cleaned by executing the removal step including the oxidation step and the oxide removal step in the cleaning process.

  Moreover, according to this Embodiment, since the film-forming process and the washing | cleaning process are performed at room temperature, the thin film forming apparatus 1 in which heating parts, such as a heater, are not provided can be used. Even if the thin film forming apparatus 1 without the heating unit is used, it is not necessary to attach the heating unit in order to remove the silicofluoride adhering to the reaction tube 2 and the like, and the thin film forming apparatus is efficiently cleaned. can do.

  Further, according to the present embodiment, since DIPAS is used as the source gas, the adsorption rate is not slowed down, and the productivity is not lowered. Furthermore, it is excellent in thermal stability and the flow rate can be easily controlled. In addition, a conventional source supply type apparatus can be used, and it has versatility.

  In addition, this invention is not restricted to said embodiment, A various deformation | transformation and application are possible. Hereinafter, other embodiments applicable to the present invention will be described.

In the above embodiment, the present invention has been described by taking oxygen as an oxidizing gas as an example. However, for example, ozone (O ₃ ), water vapor (H ₂ O), or the like may be used. For example, when ozone is used as the oxidizing gas, the temperature in the reaction tube 2 is −32 ° C. to 100 ° C., the pressure is 655 Pa (5 Torr), oxygen (O ₂ ) is 10 slm, and ozone is about 250 g / Nm ^3. It is preferable to do.

  In the above embodiment, the present invention has been described by taking as an example the case of using the thin film forming apparatus 1 that is not provided with a heating unit such as a heater, but the thin film forming apparatus provided with the heating unit such as a heater or the like A thin film forming apparatus provided with a cooling unit may be used.

  In the above embodiment, the present invention has been described by taking as an example the case where oxygen radicals are generated by plasma. However, the present invention only needs to be able to activate an oxidizing gas. For example, a catalyst, UV, Magnetic force or the like may be used.

In the above embodiment, the present invention has been described by taking the case of forming a silicon oxide film on the semiconductor wafer W as an example. However, the thin film formed according to the present invention is not limited to the silicon oxide film. A nitride film may be used. In this case, for example, a silicon nitride film is formed on the semiconductor wafer W by repeating a cycle consisting of an adsorption step for adsorbing Si using DIPAS and a nitriding step for nitriding the adsorbed Si using a nitriding gas. Can be formed. Examples of the nitriding gas include ammonia (NH ₃ ), dinitrogen monoxide (N ₂ O), nitrogen monoxide (NO), nitrogen (N ₂ ), and the like.

  In the above embodiment, the present invention has been described by taking the case where the purge and vacuum processes are performed after the flow process of the adsorption step and the oxidation step as an example. However, for example, the vacuum process for exhausting the gas in the reaction tube 2 without purging May be implemented.

  In the above embodiment, the present invention has been described by taking as an example the case where the oxidation step and the oxide removal step are executed for 10 cycles. However, the number of cycles may be reduced, for example, 5 cycles or 7 cycles. Also, the number of cycles may be increased, such as 12 cycles or 14 cycles. Also in this case, the thin film forming apparatus can be efficiently cleaned by adjusting, for example, the flow rate of hydrogen fluoride according to the number of cycles.

  In the above embodiment, the present invention has been described by taking as an example the case where nitrogen as a dilution gas is supplied when supplying a processing gas such as hydrogen fluoride, but it is not necessary to supply nitrogen when supplying the processing gas. However, it is preferable to include a dilution gas because it is easy to set the processing time by including nitrogen as a dilution gas. The diluent gas is preferably an inert gas, and in addition to nitrogen, for example, helium (He), neon (Ne), argon (Ar), krypton (Kr), and xenon (Xe) can be applied.

  In the above embodiment, the present invention is described by taking as an example the case where the processing gas supply pipe 8 for supplying the processing gas for performing the plasma processing and the processing gas supply pipe 9 for supplying the processing gas for which the plasma processing is not performed are provided. However, for example, a processing gas supply pipe may be provided for each type of processing gas. Further, a plurality of processing gas supply pipes 8 and 9 may be inserted in the side surface near the lower end of the reaction tube 2 so that the same gas is supplied from the plurality. In this case, the processing gas is supplied into the reaction tube 2 from the plurality of processing gas supply pipes 8 and 9, and the processing gas can be supplied more uniformly into the reaction tube 2.

  In the present embodiment, the present invention has been described by taking the case of a single-pipe structure batch processing apparatus as an example of the thin film forming apparatus 1. For example, the reaction tube 2 is composed of an inner tube and an outer tube. The present invention can also be applied to a batch type vertical processing apparatus having a heavy pipe structure. Further, the present invention can be applied to a batch type horizontal processing apparatus or a single wafer processing apparatus. Further, the object to be processed is not limited to the semiconductor wafer W, and may be a glass substrate for LCD, for example.

  The control unit 100 according to the embodiment of the present invention can be realized using a normal computer system, not a dedicated system. For example, the control unit 100 that executes the above-described processing is configured by installing the program from a recording medium (such as a flexible disk or a CD-ROM) that stores the program for executing the above-described processing in a general-purpose computer. be able to.

  The means for supplying these programs is arbitrary. In addition to being able to be supplied via a predetermined recording medium as described above, for example, it may be supplied via a communication line, a communication network, a communication system, or the like. In this case, for example, the program may be posted on a bulletin board (BBS) of a communication network and provided by superimposing it on a carrier wave via the network. Then, the above-described processing can be executed by starting the program thus provided and executing it in the same manner as other application programs under the control of the OS.

  The present invention is useful for forming a high-quality thin film at a low temperature.

DESCRIPTION OF SYMBOLS 1 Thin film formation apparatus 2 Reaction tube 3 Exhaust part 4 Exhaust port 5 Cover body 6 Wafer boat 8, 9 Process gas supply pipe 10 Plasma generation part 11 Electrode 100 Control part 111 Recipe memory | storage part 112 ROM
113 RAM
114 I / O port 115 CPU
116 Bus 121 Operation panel 122 Temperature sensor 123 Pressure gauge 125 MFC
126 Valve control unit 127 Vacuum pump 128 Boat elevator 129 Plasma control unit W Semiconductor wafer

Claims (4)

A cleaning method for a thin film forming apparatus for removing deposits attached to the inside of a thin film forming apparatus for supplying a processing gas to a target object accommodated in a reaction chamber to form a thin film on the target object,
A cleaning step of supplying a cleaning gas containing hydrogen fluoride to the reaction chamber to remove deposits adhering to the inside of the apparatus;
A removal step of removing silicofluoride adhering to the inside of the apparatus by the cleaning step,
In the removing step, an oxidizing gas is supplied to the reaction chamber to oxidize silicofluoride adhering to the inside of the apparatus by the cleaning step, and a cleaning gas containing hydrogen fluoride is supplied to the reaction chamber to An oxide removal step for removing oxidized silicofluoride, and repeating the oxidation step and the oxide removal step a plurality of times,
In the cleaning step, the temperature in the reaction chamber is set to a temperature different from the temperature in the reaction chamber for forming a thin film on the object to be processed. A thin film forming step of forming a thin film on the object to be processed;
A cleaning step of cleaning the thin film forming apparatus by the thin film forming apparatus cleaning method according to claim 1;
A thin film forming method characterized by comprising: A thin film forming apparatus for supplying a processing gas to a target object accommodated in a reaction chamber to form a thin film on the target object, and removing deposits adhered to the inside of the apparatus by forming the thin film. ,
Cleaning means for supplying a cleaning gas containing hydrogen fluoride to the reaction chamber to remove deposits attached to the inside of the apparatus;
Removing means for removing silicofluoride adhering to the inside of the apparatus by washing by the washing means;
Control means for controlling each part of the apparatus,
The removing means supplies an oxidizing gas to the reaction chamber and oxidizes silicofluoride adhering to the inside of the apparatus by cleaning by the cleaning means, and supplies a cleaning gas containing hydrogen fluoride to the reaction chamber. An oxide removing means for removing the oxidized silicofluoride,
The control means includes
After controlling the oxidation means to oxidize the silicofluoride adhering to the inside of the apparatus, the oxide removal means is controlled to repeat the process of removing the oxidized silicofluoride a plurality of times,
A thin film characterized in that the temperature in the reaction chamber when removing the deposits adhered to the inside of the apparatus by the cleaning means is set to a temperature different from the temperature in the reaction chamber for forming a thin film on the object to be processed. Forming equipment. A processing gas is supplied to the object to be processed contained in the reaction chamber to form a thin film on the object to be processed, and the thin film is formed to function as a thin film forming apparatus for removing deposits attached to the inside of the apparatus. A program for
Computer
A cleaning means for supplying a cleaning gas containing hydrogen fluoride to the reaction chamber to remove deposits adhering to the inside of the apparatus;
An oxidizing means for supplying an oxidizing gas to the reaction chamber and oxidizing the silicofluoride adhering to the inside of the apparatus by the cleaning means;
An oxide removing means for removing the oxidized silicofluoride by supplying a cleaning gas containing hydrogen fluoride to the reaction chamber;
Control means for controlling the oxidation means to oxidize silicofluoride adhering to the inside of the apparatus, and then controlling the oxide removal means to repeat the process of removing the oxidized silicofluoride a plurality of times,
Function as
The control means sets the temperature in the reaction chamber when removing the adhering matter adhering to the inside of the apparatus by the cleaning means to a temperature different from the temperature in the reaction chamber for forming a thin film on the object to be processed. A program characterized by

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