JP2013145315A5 - - Google Patents
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- JP2013145315A5 JP2013145315A5 JP2012005664A JP2012005664A JP2013145315A5 JP 2013145315 A5 JP2013145315 A5 JP 2013145315A5 JP 2012005664 A JP2012005664 A JP 2012005664A JP 2012005664 A JP2012005664 A JP 2012005664A JP 2013145315 A5 JP2013145315 A5 JP 2013145315A5
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- 238000003384 imaging method Methods 0.000 claims description 16
- 238000005070 sampling Methods 0.000 claims description 14
- 210000001747 Pupil Anatomy 0.000 claims description 11
- 238000011156 evaluation Methods 0.000 claims description 7
- 230000000875 corresponding Effects 0.000 claims description 3
- 230000003287 optical Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 claims 1
Description
上述の目的を達成するため、本発明による撮像装置は、複数の画素を有する撮像素子と、複数の画素の各々に入射する光束を、撮影光学系の特定の瞳領域を通過する光束に制限する瞳分割手段と、複数の画素の値を、仮想の撮像面の位置および画素に光束が入射する角度に応じて並び替え、異なる瞳領域を通過した光束が入射する画素の値を加算することにより得られる画素から画像を再構成する像生成手段と、再構成された画像から合焦位置を探索するための評価値を得る取得手段と、を有し、像生成手段により複数の仮想の撮像面の位置に対応した複数の画像を再構成し、複数の再構成された画像から取得手段によって得られる評価値を用いて合焦位置を探索する撮像装置であって第1のサンプリング間隔で合焦位置を探索した後、当該探索に基づき、第1のサンプリング間隔より狭い第2のサンプリング間隔で合焦位置の探索を行うことを特徴とする。 In order to achieve the above object, an imaging apparatus according to the present invention limits an image sensor having a plurality of pixels and a light beam incident on each of the plurality of pixels to a light beam that passes through a specific pupil region of the imaging optical system. By rearranging the pupil division means and the values of the plurality of pixels according to the position of the virtual imaging surface and the angle at which the light beam enters the pixel, and adding the values of the pixels on which the light beam that has passed through different pupil regions is incident Image generating means for reconstructing an image from the obtained pixels, and acquisition means for obtaining an evaluation value for searching for a focus position from the reconstructed image, and a plurality of virtual imaging surfaces by the image generating means the first sampling interval a plurality of images corresponding to the position of the reconstructed, IMAGING dEVICE you search for the focus position with criticism value that is obtained by the acquisition means from a plurality of reconstructed images After searching for the in-focus position with Based on search, and performs a search of the focus position in the narrow second sampling interval than the first sampling interval.
次に、図5および図6を用いて粗微調動作の有用性について述べる。図5は横軸にフォーカスレンズ位置、縦軸にAF評価値をとった図である。縦軸のAF評価値が高いほど、フォーカスレンズが合焦位置に近いことを示す。図5のように粗微調(粗調により第1のサンプリング間隔で大まかなピークを探索した後、ピーク近傍で第1のサンプリング間隔より狭い第2のサンプリング間隔で微調を行う)の動作を行う場合には、微調よりも粗調時に画素間引き率を高くする。また、AF評価値を求めるフォーカスレンズ位置の間隔は、粗調時で10〜25FΔ(F:Fナンバー、Δ:20μm程度)、微調時では1〜5FΔ程度が望ましい。そうすることで、高速かつ精度の良いコントラストAFを行うことができる。これを本実施形態の再構成面の位置を変化させることで行うAF処理に対応させると、図5の横軸のフォーカスレンズの位置は再構成面の位置に対応する。 Next, the usefulness of the coarse / fine adjustment operation will be described with reference to FIGS. 5 and 6. FIG. 5 shows the focus lens position on the horizontal axis and the AF evaluation value on the vertical axis. The higher the AF evaluation value on the vertical axis, the closer the focus lens is to the in-focus position. (After exploring a rough peak in the first sampling interval by the rough adjustment, the fine-tuning a narrow second sampling interval than the first sampling interval near the peak) crude fine adjustment as shown in Fig. 5 when performing the operation of In other words, the pixel thinning rate is increased during coarse adjustment than fine adjustment. Further, the focus lens position interval for obtaining the AF evaluation value is desirably 10 to 25 FΔ (F: F number, Δ: about 20 μm) at the time of coarse adjustment, and about 1 to 5 FΔ at the time of fine adjustment. By doing so, high-speed and accurate contrast AF can be performed. If this is made to correspond to the AF processing performed by changing the position of the reconstruction surface of the present embodiment, the position of the focus lens on the horizontal axis in FIG. 5 corresponds to the position of the reconstruction surface.
Claims (5)
前記複数の画素の各々に入射する光束を、撮影光学系の特定の瞳領域を通過する光束に制限する瞳分割手段と、
前記複数の画素の値を、仮想の撮像面の位置および画素に光束が入射する角度に応じて並び替え、異なる瞳領域を通過した光束が入射する画素の値を加算することにより得られる画素から画像を再構成する像生成手段と、
前記再構成された画像から合焦位置を探索するための評価値を得る取得手段と、を有し、
前記像生成手段により複数の仮想の撮像面の位置に対応した複数の画像を再構成し、該複数の再構成された画像から前記取得手段によって得られる前記評価値を用いて合焦位置を探索する撮像装置であって、
前記撮像装置は、第1のサンプリング間隔で合焦位置を探索した後、当該探索に基づき、前記第1のサンプリング間隔より狭い第2のサンプリング間隔で前記合焦位置の探索を行うことを特徴とする撮像装置。 An imaging device having a plurality of pixels;
Pupil dividing means for limiting a light beam incident on each of the plurality of pixels to a light beam passing through a specific pupil region of the photographing optical system;
The value of said plurality of pixels, e exchange sequence according to the angle of the light beam on the position and the pixel of the imaging surface of the virtual enters, pixels obtained by light beams passing through different pupil regions adds the value of the pixel to be incident Image generating means for reconstructing an image from
Obtaining means for searching for an in-focus position from the reconstructed image,
Reconstructs a plurality of images corresponding to the position of the imaging surface of the plurality of virtual by pre Symbol image generating means, a focus position by using the evaluation value obtained by the plurality of reconstructed the acquisition means from the image a to that imaging device search,
The imaging device searches for a focus position at a second sampling interval narrower than the first sampling interval based on the search after searching for a focus position at a first sampling interval. An imaging device .
前記複数の画素の各々に入射する光束を、撮影光学系の特定の瞳領域を通過する光束に制限する瞳分割手段と、を有する撮像装置の制御方法であって、
前記複数の画素の値を、仮想の撮像面の位置および画素に光束が入射する角度に応じて並び替え、異なる瞳領域を通過した光束が入射する画素の値を加算することにより得られる画素から画像を再構成する像生成工程と、
前記再構成された画像から合焦位置を探索するための評価値を得る取得工程と、
前記像生成工程により複数の仮想の撮像面の位置に対応した複数の画像を再構成し、該複数の再構成された画像から前記取得工程によって得られる評価値を用いて合焦位置を探索する制御工程とを有し、
前記制御工程では、第1のサンプリング間隔で合焦位置を探索した後、当該探索に基づき、前記第1のサンプリング間隔より狭い第2のサンプリング間隔で前記合焦位置の探索を行うことを特徴とする撮像装置の制御方法。 An imaging device having a plurality of pixels;
A pupil division unit that restricts a light beam incident on each of the plurality of pixels to a light beam that passes through a specific pupil region of the imaging optical system,
The value of said plurality of pixels, e exchange sequence according to the angle of the light beam on the position and the pixel of the imaging surface of the virtual enters, pixels obtained by light beams passing through different pupil regions adds the value of the pixel to be incident An image generation process for reconstructing an image from
Obtaining an evaluation value for searching for a focus position from the reconstructed image; and
Reconstructs a plurality of images corresponding to the position of the imaging surface of the plurality of virtual by pre Symbol image generating step, search for the focus position by using the evaluation values obtained by the obtaining step from the plurality of reconstructed images and a control step of possess,
In the control step, after searching for an in-focus position at a first sampling interval, the in-focus position is searched for at a second sampling interval narrower than the first sampling interval based on the search. Control method for imaging apparatus.
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