JP2013121694A - Circuit member, head and device for ejecting liquid - Google Patents

Circuit member, head and device for ejecting liquid Download PDF

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JP2013121694A
JP2013121694A JP2011270987A JP2011270987A JP2013121694A JP 2013121694 A JP2013121694 A JP 2013121694A JP 2011270987 A JP2011270987 A JP 2011270987A JP 2011270987 A JP2011270987 A JP 2011270987A JP 2013121694 A JP2013121694 A JP 2013121694A
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wiring
inspection
electrode
flexible substrate
connection point
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Yukihiro Saga
行弘 佐賀
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SII Printek Inc
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2202/00Embodiments of or processes related to ink-jet or thermal heads
    • B41J2202/01Embodiments of or processes related to ink-jet heads
    • B41J2202/10Finger type piezoelectric elements

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  • Ink Jet (AREA)
  • Particle Formation And Scattering Control In Inkjet Printers (AREA)

Abstract

PROBLEM TO BE SOLVED: To allow easy inspection of a connection state between multiple electrodes 6 formed on a substrate 3 and multiple wires 8 formed on a flexible board 4.SOLUTION: In a circuit member, a base 3 having on a surface thereof n electrodes 6 arranged in a row and n electrode terminals 7 for inspection arranged in the vicinity thereof and a flexible board 4 having on a first surface thereof n electrodes 6 arranged in a row and n electrode terminals 7 for inspection arranged in the vicinity thereof are disposed opposite and joined to each other via an anisotropic conductive material 5, and n connection points in which the n electrode terminals 7 and n wire terminals 9 are joined and connected are connected in series from inspection wires H. The connection state is determined by applying a voltage to both end parts of the inspection wires H connected in series.

Description

本発明は基体とこの基体に接合されるフレキシブル基板からなる回路部材及びこれを用いた液体噴射ヘッド及び液体噴射装置に関する。   The present invention relates to a circuit member formed of a base and a flexible substrate bonded to the base, and a liquid ejecting head and a liquid ejecting apparatus using the circuit member.

近年、多くの電子機器において基体表面に形成した多数の電極とフレキシブル基板に形成した多数の配線とを異方性導電フィルムを介して電気的に接続している。最近では、電極間が狭ピッチであり、100本以上の多数の電極と多数の配線とを熱圧着により同時に接続する。しかし、電極間の狭ピッチ化及び電極の多数化に伴い、接続不良が発生する頻度が高くなってきている。そこで、電極と配線とを異方性導電フィルムを介して熱圧着した後に接続状態の良否判定を簡便に行うことができれば、他の部品を組み立てた後に接続状態の良否判定を行う場合よりも、接続不良による組立工数の無駄を防ぐことができる。   In recent years, in many electronic devices, a large number of electrodes formed on a substrate surface and a large number of wirings formed on a flexible substrate are electrically connected via an anisotropic conductive film. Recently, the pitch between the electrodes is narrow, and a large number of 100 or more electrodes and a large number of wirings are simultaneously connected by thermocompression bonding. However, with the narrowing of the pitch between electrodes and the increase in the number of electrodes, the frequency of occurrence of connection failures is increasing. Therefore, if it is possible to easily determine the quality of the connected state after thermocompression bonding the electrode and the wiring through the anisotropic conductive film, than when performing the quality determination of the connected state after assembling other parts, It is possible to prevent waste of assembly man-hours due to poor connection.

このような狭ピッチで多数の電極の接続を必要とするものにインクジェットヘッドが挙げられる。インクジェットヘッドは近年インクを吐出するノズルの狭ピッチ化、多数化が進み、インク滴を吐出させる圧力室に駆動信号を供給するための電極も狭ピッチ化、多数化が進んでいる。例えば電極ピッチが100μm〜50μmで、電極数が数100本以上を一括して同時に電気的に接続することも行われている。   An ink jet head is one that requires connection of a large number of electrodes at such a narrow pitch. In recent years, ink jet heads have been increasingly narrowed in pitch and nozzles for ejecting ink, and electrodes for supplying drive signals to pressure chambers for ejecting ink droplets have also been narrowed in pitch and number. For example, the electrode pitch is 100 μm to 50 μm, and several hundreds or more electrodes are collectively and electrically connected simultaneously.

図16及び図17は、特許文献1に記載されているインクジェットヘッドチップ126の一部の分解斜視図と断面模式図である。インクジェットヘッドチップ126は、多数の長溝145が並列して形成される圧電セラミックプレート144と、その上に接合されるインク室プレート155と、圧電セラミックプレート144の端部に接合され、ノズル開口152が形成されるノズルプレート151とから構成されている。各長溝145は側壁146により仕切られ、各側壁146の側面には駆動電極部150が形成される。各長溝145は前方平坦面144aと前方平坦面144aの後部から後方側に向かって漸次浅くなる傾斜面144bと、この傾斜面144bの後部から後方側に向かって伸びる後方平坦面144cから構成される。駆動電極部150はこの後方平坦面144cに延設されて、ワイヤ147に電気的に接続されている。   FIGS. 16 and 17 are an exploded perspective view and a schematic cross-sectional view of a part of the inkjet head chip 126 described in Patent Document 1. FIG. The inkjet head chip 126 is bonded to a piezoelectric ceramic plate 144 in which a number of long grooves 145 are formed in parallel, an ink chamber plate 155 bonded to the piezoelectric ceramic plate 144, and an end of the piezoelectric ceramic plate 144, and a nozzle opening 152 is formed. The nozzle plate 151 is formed. Each long groove 145 is partitioned by a side wall 146, and a drive electrode portion 150 is formed on a side surface of each side wall 146. Each long groove 145 includes a front flat surface 144a, an inclined surface 144b that gradually decreases from the rear portion of the front flat surface 144a toward the rear side, and a rear flat surface 144c that extends from the rear portion of the inclined surface 144b toward the rear side. . The drive electrode portion 150 extends on the rear flat surface 144 c and is electrically connected to the wire 147.

インクジェットヘッドチップ126は次のように駆動される。インク室プレート155の開口部156にインクを供給し、長溝145にインクを充填する。そして、ワイヤ147に与えられた駆動信号が側壁146の駆動電極部150に印加され、側壁146はせん断変形して長溝145の容積を変化させる。これにより、長溝145に充填されたインクは長溝145に連通するノズル開口152からインク滴として吐出される。   The inkjet head chip 126 is driven as follows. Ink is supplied to the opening 156 of the ink chamber plate 155 and the long groove 145 is filled with ink. Then, the drive signal given to the wire 147 is applied to the drive electrode portion 150 of the side wall 146, and the side wall 146 is sheared to change the volume of the long groove 145. Thereby, the ink filled in the long groove 145 is ejected as an ink droplet from the nozzle opening 152 communicating with the long groove 145.

ここで、ワイヤ147として、通常、フレキシブル基板上に形成した配線が使用される。圧電セラミックプレート144のノズルプレート151とは反対側の後方平坦面144cには各長溝145に設置される各駆動電極部150に電気的に接続する多数の電極端子が形成される。この電極端子は長溝145の数(又はその2倍の数)を有し、長溝145の配列ピッチ(又はその2倍の配列ピッチ)となる。この電極端子に同ピッチで同数の配線を備える基板、例えばフレキシブル基板を、異方性導電フィルムを介して接合し多数の電極端子と多数の配線とを同時に電気的に接続する。なお、インク室プレート155の端部には封止部148が設置され、長溝145に充填されたインクの漏洩を防ぐ。   Here, as the wire 147, a wiring formed on a flexible substrate is usually used. A large number of electrode terminals are formed on the rear flat surface 144c of the piezoelectric ceramic plate 144 opposite to the nozzle plate 151 to be electrically connected to the drive electrode portions 150 installed in the long grooves 145. This electrode terminal has the number of the long grooves 145 (or twice the number thereof) and becomes the arrangement pitch of the long grooves 145 (or twice the arrangement pitch thereof). A substrate provided with the same number of wirings at the same pitch on the electrode terminals, for example, a flexible substrate, is joined via an anisotropic conductive film, and a large number of electrode terminals and a large number of wirings are electrically connected simultaneously. A sealing portion 148 is installed at the end of the ink chamber plate 155 to prevent leakage of ink filled in the long groove 145.

更に、圧電セラミックプレート144には長溝145が形成される面とは反対側の底面に検出電極160が形成されている。この検出電極160を用いて上記電極端子とワイヤ147(フレキシブル基板の配線)との間の電気的接続の良否判定を行っている。即ち、側壁146に設置される駆動電極部150と検出電極160との間には、圧電セラミックプレート144の底部を挟むコンデンサが構成される。ワイヤ147を介して駆動電極部150に検査信号を与えたとき、その検査信号が駆動電極部150に正常に達したかどうかを検出電極160により検出する。接続状態検査用の専用の電圧検出回路を設け、各ワイヤ147(フレキシブル基板の各配線)に選択的に順次検査信号を与えて検出電極160に表れる信号を検出し、これを増幅して、ワイヤ147(フレキシブル基板の配線)と圧電セラミックプレート144上の電極端子との間の電気的接続の良否を判定する。   Further, a detection electrode 160 is formed on the bottom surface of the piezoelectric ceramic plate 144 opposite to the surface on which the long groove 145 is formed. The detection electrode 160 is used to determine whether or not the electrical connection between the electrode terminal and the wire 147 (wiring of the flexible substrate) is good. That is, a capacitor that sandwiches the bottom of the piezoelectric ceramic plate 144 is configured between the drive electrode unit 150 and the detection electrode 160 installed on the side wall 146. When an inspection signal is applied to the drive electrode unit 150 via the wire 147, the detection electrode 160 detects whether the inspection signal has reached the drive electrode unit 150 normally. A dedicated voltage detection circuit for connection state inspection is provided, and an inspection signal is selectively given sequentially to each wire 147 (each wiring of the flexible substrate) to detect a signal appearing on the detection electrode 160, and this is amplified, and the wire The quality of the electrical connection between 147 (wiring of the flexible substrate) and the electrode terminal on the piezoelectric ceramic plate 144 is determined.

特開2008−230222号公報JP 2008-230222 A

従来法ではフレキシブル基板を基体に接続して回路を完成させ、実際に駆動してフレキシブル基板の配線と基体の電極端子との間の電気的な接続状態を検査する。つまり、フレキシブル基板を接続した直後に接続状態のみを検査するのではなく、駆動回路や検出回路を接続し駆動可能な状態に組み立てた後に実際に順次駆動して接続状態を検査する。そのために、接続不良が発見されたときは、フレキシブル基板を接続した直後に検査可能な場合と比較して、完成品まで組み立てる組立工数が無駄になる。   In the conventional method, the circuit is completed by connecting the flexible substrate to the base, and the circuit is actually driven to inspect the electrical connection state between the wiring of the flexible substrate and the electrode terminal of the base. That is, not only the connection state is inspected immediately after the flexible substrate is connected, but the drive circuit and the detection circuit are connected and assembled into a drivable state, and then actually driven sequentially to inspect the connection state. Therefore, when a connection failure is found, the number of assembly steps for assembling a finished product is wasted compared to the case where inspection is possible immediately after connecting the flexible substrate.

また、上記特許文献1の判定方法では、接続状態の良否判定のための専用の電圧検出回路を形成しなければならない。更に、良否判定検査は、インクジェットヘッドチップ126を実際に液滴の吐出可能な状態まで組み立てた後に、駆動信号を検査信号に切り替えて検査を行う。従って、接続不良が発見されたときは、上記従来法と同様にフレキシブル基板を接続した直後に検査可能な場合と比較して吐出可能な状態まで組み立てた組立工数が無駄となる。   Further, in the determination method disclosed in Patent Document 1, a dedicated voltage detection circuit for determining whether the connection state is good or bad must be formed. Further, in the pass / fail judgment inspection, after the inkjet head chip 126 is actually assembled to a state where droplets can be ejected, the drive signal is switched to the inspection signal and the inspection is performed. Therefore, when a connection failure is found, the number of assembling steps assembled to a dischargeable state is wasted compared to the case where the inspection can be performed immediately after connecting the flexible substrate as in the conventional method.

また、上記組立工数の無駄を省くために、フレキシブル基板の一方の端部をインクジェットヘッドチップ126に接合した後に、フレキシブル基板の他方の端部を実駆動用の回路基板に接続することに代えて、ノズル数分の電極が形成された検査用治具基板に押し当てて検査することができる。この場合は、フレキシブル基板の各電極に検査用治具基板から検査信号を印加して一ノズルずつ検査する。これにより、実駆動の回路基板を接続することなくフレキシブル基板とインクジェットヘッドチップ126との間の接続状態を検査することができる。しかし、フレキシブル基板の各電極と検査用治具基板の各電極とを顕微鏡等を使用して合わせる必要があり、位置合わせに時間がかかるとともに顕微鏡等を備えた電極位置合わせ治具や、一ノズルずつ検査信号を供給し検出するための専用検査装置が必要となり、検査工程が複雑で時間を要し、生産性が低くコスト高となることが避けられない。   In order to eliminate the waste of assembly man-hours, instead of connecting one end of the flexible board to the inkjet head chip 126 and then connecting the other end of the flexible board to the circuit board for actual driving. The inspection can be performed by pressing against an inspection jig substrate on which electrodes corresponding to the number of nozzles are formed. In this case, an inspection signal is applied to each electrode of the flexible substrate from the inspection jig substrate to inspect one nozzle at a time. As a result, the connection state between the flexible substrate and the inkjet head chip 126 can be inspected without connecting the actual drive circuit board. However, it is necessary to align each electrode of the flexible substrate and each electrode of the inspection jig substrate using a microscope or the like, and it takes time for alignment and an electrode alignment jig equipped with a microscope or the like, or one nozzle A dedicated inspection device for supplying and detecting inspection signals is required one by one, the inspection process is complicated and time consuming, and productivity is inevitably low and high cost.

また、従来のインクジェットヘッドでは、ドット抜けが発生した場合にゴミや充填不良(気泡)によるものか、電気的接続不良によるものかが装置側では判別できなかった。そこで、ドット抜けが発生した際にはインクを流して復帰を試みるがドット抜けの原因が電気的接続不良であった場合には復帰のためにインクを無駄に消費していた。   Further, in the case of a conventional ink jet head, when a missing dot occurs, the apparatus cannot determine whether it is due to dust or filling failure (bubbles) or due to poor electrical connection. Therefore, when a dot dropout occurs, an attempt is made to restore by flowing ink. However, if the cause of the dot dropout is a poor electrical connection, the ink is wasted for the return.

本発明は、多数の電極が形成される基体に多数の配線が形成されるフレキシブル基板を接合して多数の電気的接続部が構成される回路部材において、その電気的接続状態を簡便に検査できる構造を提供する。   INDUSTRIAL APPLICABILITY According to the present invention, in a circuit member in which a large number of electrical connection portions are formed by joining a flexible substrate on which a large number of wirings are formed to a base on which a large number of electrodes are formed, the electrical connection state can be easily inspected. Provide structure.

本発明の回路部材は、列状に配列するn(nは2以上の整数)本の電極と、各前記電極の近傍に設置される検査用のn個の電極端子とを表面に有する基体と、列状に配列するn本の配線と、各前記配線の近傍に設置される検査用のn個の配線端子とを第一面に有するフレキシブル基板と、を備え、n個の前記電極端子とn個の前記配線端子がそれぞれ接合して接続されるn個の接続点を並び順に数えてk(kは1以上、(n−1)以下の整数)番目の接続点を第k接続点として、第k接続点と第(k+1)接続点とを電気的に接続する第k検査用配線が前記基体又は前記フレキシブル基板のいずれか一方または両方に形成されることとした。   The circuit member of the present invention includes a substrate having n electrodes (n is an integer of 2 or more) arranged in a row and n electrode terminals for inspection installed in the vicinity of the electrodes on the surface. A flexible board having n wirings arranged in a row and n wiring terminals for inspection installed in the vicinity of each of the wirings on a first surface, and the n electrode terminals The n number of connection points to which the n number of wiring terminals are joined and connected are counted in order, and the kth connection point (k is an integer not less than 1 and not more than (n−1)) is defined as the kth connection point. The k-th inspection wiring that electrically connects the k-th connection point and the (k + 1) -th connection point is formed on one or both of the base body and the flexible substrate.

また、前記基体及び前記フレキシブル基板のうちの一方にkが偶数の前記第k検査用配線が形成され、他方にkが奇数の前記第k検査用配線が形成されることとした。   Further, the k-th inspection wiring with an even number k is formed on one of the base and the flexible substrate, and the k-th inspection wiring with an odd k is formed on the other.

また、前記基体に形成される前記第k検査用配線は、前記基体の端面に形成されることとした。   The k-th inspection wiring formed on the base is formed on the end surface of the base.

また、前記基体の表面のk番目の前記電極端子と(k+1)番目の前記電極端子との間に溝が形成され、前記第k検査用配線は前記溝の内表面に形成されることとした。   Further, a groove is formed between the kth electrode terminal and the (k + 1) th electrode terminal on the surface of the base, and the kth inspection wiring is formed on the inner surface of the groove. .

また、 前記電極端子は少なくともその一部が単一の前記電極により囲まれることとした。   The electrode terminal is at least partially surrounded by the single electrode.

また、 前記フレキシブル基板の前記第k検査用配線は前記第一面とは反対側の第二面に設置され、前記第k接続点及び前記第(k+1)接続点に接続する前記配線端子と前記第k検査用配線とは前記フレキシブル基板を貫通する貫通電極を介して電気的に接続されることとした。   Further, the k-th inspection wiring of the flexible substrate is installed on a second surface opposite to the first surface, and the wiring terminal connected to the k-th connection point and the (k + 1) -th connection point; The k-th inspection wiring is electrically connected through a through electrode penetrating the flexible substrate.

また、 前記第二面には前記基板に設置される前記第(k+1)検査用配線を跨ぐ付加配線が設置され、前記付加配線は前記フレキシブル基板を貫通する貫通電極を介して前記配線に接続されることとした。   Further, an additional wiring straddling the (k + 1) -th inspection wiring installed on the substrate is installed on the second surface, and the additional wiring is connected to the wiring via a through electrode penetrating the flexible substrate. I decided to do it.

また、各前記配線端子は、互いに分離する第一配線端子と第二配線端子を有し、前記第k接続点は、k番目の前記電極端子とk番目の前記第一配線端子とを電気的に接続する第k1接続点と、k番目の前記電極端子とk番目の前記第二配線端子とを電気的に接続する第k2接続点とを有し、kが奇数の前記第k検査用配線は、前記第k1接続点と前記第(k+1)1接続点とを電気的に接続し、kが偶数の前記第k検査用配線は、前記第k2接続点と前記第(k+1)2接続点とを電気的に接続することとした。   Each of the wiring terminals has a first wiring terminal and a second wiring terminal that are separated from each other, and the kth connection point electrically connects the kth electrode terminal and the kth first wiring terminal. The k-th inspection wiring having an odd number k and k-th connection point electrically connecting the k-th electrode terminal and the k-th second wiring terminal. Electrically connects the k1 connection point and the (k + 1) 1 connection point, and the k-th inspection wiring having an even number k is the k2 connection point and the (k + 1) 2 connection point. Are electrically connected to each other.

また、前記第k検査用配線は前記フレキシブル基板に形成されることとした。   The k-th inspection wiring is formed on the flexible substrate.

また、前記第k検査用配線は、前記第一面とは反対側の第二面に設置され、k番目及び(k+1)番目の前記配線端子と前記第k検査用配線とは前記フレキシブル基板を貫通する貫通電極を介して電気的に接続されることとした。   The k-th inspection wiring is installed on the second surface opposite to the first surface, and the k-th and (k + 1) -th wiring terminals and the k-th inspection wiring are formed on the flexible substrate. Electrical connection is made through a penetrating electrode that penetrates.

また、前記電極端子は少なくともその一部が単一の前記電極により囲まれていることとした。   The electrode terminal is at least partially surrounded by the single electrode.

また、前記基体と前記フレキシブル基板とは、n本の前記電極とn本の前記配線、及び、n個の前記電極端子とn個の前記配線端子とがそれぞれ異方性導電材料を介在させて対面して接合されることとした。   In addition, the base and the flexible substrate include n electrodes, n wires, and n electrode terminals and n wire terminals with an anisotropic conductive material interposed therebetween, respectively. It was decided to be joined facing each other.

本発明の液体噴射ヘッドは、上記いずれかに記載の回路部材を備え、前記フレキシブル基板は駆動回路により生成された駆動信号をn個の前記配線を介してn個の前記電極に供給し、前記基体は液体吐出用の圧力室を備え、n個の前記電極を介して前記圧力室に前記駆動信号が供給されることとした。   The liquid ejecting head according to the aspect of the invention includes any one of the circuit members described above, and the flexible substrate supplies a driving signal generated by a driving circuit to the n electrodes through the n wires. The substrate is provided with a pressure chamber for discharging liquid, and the driving signal is supplied to the pressure chamber via the n electrodes.

本発明の液体噴射装置は、上記液体噴射ヘッドと、前記液体噴射ヘッドを往復移動させる移動機構と、前記液体噴射ヘッドに液体を供給する液体供給管と、前記液体供給管に前記液体を供給する液体タンクと、を備えることとした。
液体噴射ヘッド。
The liquid ejecting apparatus according to the aspect of the invention includes the liquid ejecting head, a moving mechanism that reciprocates the liquid ejecting head, a liquid supply pipe that supplies the liquid to the liquid ejecting head, and the liquid that is supplied to the liquid supply pipe. And a liquid tank.
Liquid jet head.

本発明の回路部材は、列状に配列するn(nは2以上の整数)本の電極と、各電極の近傍に設置される検査用のn個の電極端子とを表面に有する基体と、列状に配列するn本の配線と、各配線の近傍に設置される検査用のn個の配線端子とを第一面に有するフレキシブル基板と、を備える。そして、n個の電極端子とn個の配線端子とがそれぞれ接合して接続されるn個の接続点を並び順に数えてk(kは1以上、(n−1)以下の整数)番目の接続点を第k接続点として、第k接続点と第(k+1)接続点とを電気的に接続する第k検査用配線が基体又はフレキシブル基板のいずれか一方または両方に形成される。   The circuit member of the present invention comprises a substrate having n (n is an integer of 2 or more) electrodes arranged in a row and n electrode terminals for inspection installed in the vicinity of each electrode on the surface, And a flexible substrate having n wirings arranged in a row and n wiring terminals for inspection installed in the vicinity of each wiring on the first surface. The n number of connection points where the n electrode terminals and the n wiring terminals are joined and connected to each other are counted in order, kth (k is an integer not less than 1 and not more than (n−1)) th. With the connection point as the kth connection point, the kth inspection wiring for electrically connecting the kth connection point and the (k + 1) th connection point is formed on one or both of the base and the flexible substrate.

この構成により、第1接続点に接続する検査用配線と第n接続点に接続する検査用配線との間の電気的な接続状態を検査すれば、n本の電極とn本の配線との間の各接続を一括して検査したことになるので、接続状態の検査が極めて簡便となる。   With this configuration, if the electrical connection state between the inspection wiring connected to the first connection point and the inspection wiring connected to the nth connection point is inspected, the n electrodes and the n wirings Since each connection between them is inspected at once, the inspection of the connection state becomes very simple.

本発明の第一実施形態に係る回路部材の説明図である。It is explanatory drawing of the circuit member which concerns on 1st embodiment of this invention. 本発明の第一実施形態に係る回路部材の部分平面図である。It is a partial top view of the circuit member concerning a first embodiment of the present invention. 本発明の第一実施形態に係る回路部材の部分AAの縦断面模式図である。It is a longitudinal cross-sectional schematic diagram of part AA of the circuit member which concerns on 1st embodiment of this invention. 本発明の第二実施形態に係る回路部材の説明図である。It is explanatory drawing of the circuit member which concerns on 2nd embodiment of this invention. 本発明の第二実施形態に係る回路部材の部分平面図である。It is a fragmentary top view of the circuit member which concerns on 2nd embodiment of this invention. 本発明の第二実施形態に係る回路部材の部分BBの縦断面模式図である。It is a longitudinal cross-sectional schematic diagram of the part BB of the circuit member which concerns on 2nd embodiment of this invention. 本発明の第三実施形態に係る回路部材の基体とフレキシブル基板とを接合する前の部分平面図である。It is a partial top view before joining the base | substrate and flexible substrate of the circuit member which concerns on 3rd embodiment of this invention. 本発明の第三実施形態に係る回路部材の部分平面図である。It is a fragmentary top view of the circuit member which concerns on 3rd embodiment of this invention. 本発明の第三実施形態に係る回路部材の部分CCの縦断面模式図である。It is a longitudinal cross-sectional schematic diagram of the part CC of the circuit member which concerns on 3rd embodiment of this invention. 本発明の第四実施形態に係る回路部材の基体とフレキシブル基板とを接合する前の部分平面図である。It is a partial top view before joining the base | substrate and flexible substrate of the circuit member which concerns on 4th embodiment of this invention. 本発明の第四実施形態に係る回路部材の部分平面図である。It is a fragmentary top view of the circuit member which concerns on 4th embodiment of this invention. 本発明の第四実施形態に係る回路部材の部分DDの縦断面模式図である。It is a longitudinal cross-sectional schematic diagram of the part DD of the circuit member which concerns on 4th embodiment of this invention. 本発明の回路部材を構成するフレキシブル基板の平面図である。It is a top view of the flexible substrate which comprises the circuit member of this invention. 本発明の第五実施形態に係る液体噴射ヘッドの模式的な斜視図である。FIG. 9 is a schematic perspective view of a liquid jet head according to a fifth embodiment of the present invention. 本発明の第六実施形態に係る液体噴射装置の模式的な斜視図である。FIG. 10 is a schematic perspective view of a liquid ejecting apparatus according to a sixth embodiment of the present invention. 従来公知のインクジェットヘッドチップの一部の分解斜視図である。It is a disassembled perspective view of a part of conventionally well-known inkjet head chip. 従来公知のインクジェットヘッドチップの断面模式図である。It is a cross-sectional schematic diagram of a conventionally well-known inkjet head chip.

本発明の回路部材は、基体とこの基体に異方性導電材料を介在して接合されるフレキシブル基板とから構成される。基体は、その表面に列状に配列するn(nは2以上の整数)本の電極と、各電極の近傍に設置される検査用のn個の電極端子とを有する。フレキシブル基板は、その第一面に列状に配列するn本の配線と、各配線の近傍に設置される検査用のn個の配線端子とを有する。更に、n個の電極端子とn個の配線端子が接合して接続されるn個の接続点を並び順に数えてk(kは1以上、(n−1)以下の整数)番目を第k接続点とすると、第k接続点と第(k+1)接続点とを電気的に接続する第k検査用配線が基体又はフレキシブル基板のいずれか一方又は両方に形成される。   The circuit member of the present invention includes a base and a flexible substrate joined to the base via an anisotropic conductive material. The base body has n (n is an integer of 2 or more) electrodes arranged in a row on the surface, and n electrode terminals for inspection installed in the vicinity of each electrode. The flexible substrate has n wirings arranged in a row on the first surface, and n wiring terminals for inspection installed in the vicinity of each wiring. Further, n connection points where n electrode terminals and n wiring terminals are joined and connected are counted in order, and the k-th (k is an integer not less than 1 and not more than (n−1)) is k-th. As a connection point, a k-th inspection wiring that electrically connects the k-th connection point and the (k + 1) -th connection point is formed on one or both of the base body and the flexible substrate.

基体に形成した電極とフレキシブル基板に形成した配線とを例えば異方性導電材料を介在させて電気的に接続するとき、基体表面からフレキシブル基板が部分的に剥がれる、或いは接合不良によって接続不良が発生する場合がある。この部分的な剥がれや接合不良は、通常、電極幅よりも狭い微小領域より電極幅よりも広い領域で発生する。従って、電気的に接続しようとする電極や配線のすぐ近傍にモニター用の電極端子や配線端子を形成し、この電極端子と配線端子間の接続状態を検査することにより、基体の電極とフレキシブル基板の配線との間の電気的接続をモニターすることができる。電極や配線に検査用の電極端子や配線端子が接近するほどモニター精度が高くなるので、電極や配線のピッチや幅が狭くなるほどモニター精度は向上する。   When the electrode formed on the substrate and the wiring formed on the flexible substrate are electrically connected through, for example, an anisotropic conductive material, the flexible substrate is partially peeled from the substrate surface, or a connection failure occurs due to a bonding failure. There is a case. This partial peeling or poor bonding usually occurs in a region wider than the electrode width than a minute region narrower than the electrode width. Therefore, by forming an electrode terminal or wiring terminal for monitoring in the immediate vicinity of the electrode or wiring to be electrically connected and inspecting the connection state between the electrode terminal and the wiring terminal, the base electrode and the flexible substrate The electrical connection between the wires can be monitored. Since the monitoring accuracy increases as the inspection electrode terminal or wiring terminal approaches the electrode or wiring, the monitoring accuracy improves as the pitch or width of the electrode or wiring decreases.

本発明は、接続しようとする電極と配線のすぐ近傍に検査用の電極端子と配線端子を形成し、この電極端子と配線端子との接続点を検査用配線により直列接続する。この直列接続する複数の検査用配線の両端に電圧を印加して接続状態を検出する。複数の接続点のうち一か所でも不良接続点が存在すれば、直列接続する検査用配線の両端は断線状態となるので接続不良と判定することができる。従って、n本の電極とn本の配線との間の各接続を一括して検査したことになるので、接続状態の検査が極めて簡便となる。以下、図面を用いて本発明を詳細に説明する。   In the present invention, an inspection electrode terminal and a wiring terminal are formed in the immediate vicinity of an electrode to be connected and a wiring, and a connection point between the electrode terminal and the wiring terminal is connected in series by the inspection wiring. A voltage is applied to both ends of the plurality of inspection wirings connected in series to detect the connection state. If there is a defective connection point at one of the plurality of connection points, both ends of the inspection wiring connected in series are disconnected, so that it can be determined that the connection is defective. Therefore, since each connection between the n electrodes and the n wires is inspected at a time, the inspection of the connection state becomes extremely simple. Hereinafter, the present invention will be described in detail with reference to the drawings.

(第一実施形態)
図1〜図3は本発明の第一実施形態に係る回路部材1を説明するための図である。図1(a)は基体3とフレキシブル基板4を接合する前の部分平面図であり、図1(b)は基体3の模式的な斜視図である。図2は基体3とフレキシブル基板4とを異方性導電材料5を介して接合した部分平面図であり、図3が部分AAを矢印の方向から見る縦断面模式図である。
(First embodiment)
1-3 is a figure for demonstrating the circuit member 1 which concerns on 1st embodiment of this invention. FIG. 1A is a partial plan view before joining the base 3 and the flexible substrate 4, and FIG. 1B is a schematic perspective view of the base 3. FIG. 2 is a partial plan view in which the base body 3 and the flexible substrate 4 are joined via the anisotropic conductive material 5, and FIG. 3 is a schematic longitudinal sectional view of the portion AA seen from the direction of the arrow.

並び順に数えてk番目の電極6を電極6kと表し、電極6kの近傍に設置される電極端子7を電極端子7kと表す。図1(a)に示すように、基体3は、その表面に列状に配列する複数の電極6k〜6k+5と、電極6k〜6k+5の各近傍に設置される検査用の複数の電極端子7k〜7k+5と、電極端子7k+1と電極端子7k+2を電気的に接続する第(k+1)検査用配線Hk+1、電極端子7k+3と電極端子7k+4を電気的に接続する第(k+3)検査用配線Hk+3とを有する。図1(b)に示すように、電極端子7k+1と電極端子7k+2とは基体3の端面に形成した検査用配線Hk+1を介して電気的に接続される。同様に、電極端子7k+3と電極端子7k+4とは基体3の端面に形成した検査用配線Hk+3により電気的に接続される。その他の電極端子7k+5、7k+6、検査用配線Hk+5・・・も同様に接続される。 The k-th electrode 6 counted in the arrangement order is represented as an electrode 6 k , and the electrode terminal 7 installed in the vicinity of the electrode 6 k is represented as an electrode terminal 7 k . As shown in FIG. 1 (a), the substrate 3, test a plurality of electrodes 6 k ~6 k + 5 to be arranged in rows on the surface, it is installed in each vicinity of the electrode 6 k ~6 k + 5 A plurality of electrode terminals 7 k to 7 k + 5, and (k + 1) -th inspection wiring H k + 1 electrically connecting the electrode terminal 7 k + 1 and the electrode terminal 7 k + 2 and the electrode terminal 7 k And (k + 3) -th inspection wiring H k + 3 that electrically connects +3 and the electrode terminal 7 k + 4 . As shown in FIG. 1B, the electrode terminal 7 k + 1 and the electrode terminal 7 k + 2 are electrically connected via an inspection wiring H k + 1 formed on the end face of the base 3. Similarly, the electrode terminal 7 k + 3 and the electrode terminal 7 k + 4 are electrically connected by an inspection wiring H k + 3 formed on the end face of the base 3. The other electrode terminals 7 k + 5 , 7 k + 6 , inspection wiring H k + 5 ... Are connected in the same manner.

並び順に数えてk番目の配線8を配線8kと記し、配線8kの近傍に設置される配線端子9を配線端子9kと記す。フレキシブル基板4は、基体3と接合される紙面に向かって奥側の第一面F1に列状に配列する複数の配線8k+1〜8k+5と、配線8k+1〜8k+5の各近傍に設置される検査用の複数の配線端子9k〜9k+5を有する。紙面下方の第一面F1(図3を参照)に形成される導電パターンを実線で表す。各配線8k〜8k+5は基体3に接合したときに各電極6k〜6k+5と重なるように電極6k〜6k+5と同じピッチで配列する。同様に各配線端子9k〜9k+5は基体3に接合したときに各電極端子7k〜7k+5と重なるように同じピッチで配列する。各配線端子9k〜9k+5はフレキシブル基板4の下辺端部よりも上辺側に形成され、各配線8k+1〜8k+5は2つの配線端子の間を通すように折れ曲がった形を有する。 K-th marked wiring 8 and the wiring 8 k counted in sorted, mark the wiring terminals 9 installed in the vicinity of the wiring 8 k and the wiring terminal 9 k. The flexible substrate 4 includes a plurality of wires 8 k + 1 ~8 k + 5 to be arranged in rows on the first surface F1 of the inner side toward the paper surface to be bonded with the substrate 3, the wiring 8 k + 1 ~8 k A plurality of inspection wiring terminals 9 k to 9 k + 5 are provided near each of +5 . The conductive pattern formed on the first surface F1 (see FIG. 3) below the paper surface is represented by a solid line. The wirings 8 k to 8 k + 5 are arranged at the same pitch as the electrodes 6 k to 6 k + 5 so as to overlap the electrodes 6 k to 6 k + 5 when bonded to the base 3. Similarly, the wiring terminals 9 k to 9 k + 5 are arranged at the same pitch so as to overlap the electrode terminals 7 k to 7 k + 5 when bonded to the base 3. Each of the wiring terminals 9 k to 9 k + 5 is formed on the upper side of the lower edge of the flexible substrate 4, and each of the wirings 8 k + 1 to 8 k + 5 is bent so as to pass between the two wiring terminals. Has a shape.

フレキシブル基板4は、破線で示すように紙面上方の第二面F2(図3を参照)に第一面F1の配線8k+1を跨ぐように形成される第k検査用配線Hkを有する。第k検査用配線Hkは第一面F1に設置される配線端子9k及び配線端子9k+1と貫通電極12(図3を参照)を介して電気的に接続される。フレキシブル基板4は、同様にその第二面F2に第一面F1の配線8k+3を跨ぐように形成される第(k+2)検査用配線Hk+2を有し、第(k+2)検査用配線Hk+2は図示しない貫通電極12(図3を参照)を介して配線端子9k+2及び配線端子9k+3と電気的に接続される。その他の検査用配線Hk+4、配線端子9k+4、配線端子9k+5・・・も同様に形成される。 The flexible substrate 4 has a k-th inspection wiring H k formed so as to straddle the wiring 8 k + 1 on the first surface F1 on the second surface F2 (see FIG. 3) above the paper surface as indicated by a broken line. . The k-th inspection wiring H k is electrically connected to the wiring terminal 9 k and the wiring terminal 9 k + 1 installed on the first surface F1 through the through electrode 12 (see FIG. 3). Similarly, the flexible substrate 4 has the (k + 2) inspection wiring H k + 2 formed on the second surface F2 so as to straddle the wiring 8 k + 3 of the first surface F1, and the (k + 2) inspection. The wiring H k + 2 is electrically connected to the wiring terminal 9 k + 2 and the wiring terminal 9 k + 3 through a through electrode 12 (see FIG. 3) (not shown). Other inspection wiring lines H k + 4 , wiring terminals 9 k + 4 , wiring terminals 9 k + 5 ... Are formed in the same manner.

基体3の表面やフレキシブル基板4の第一面及び第二面に形成する導電パターンは金属等の導電体をスパッタリング法、蒸着法、或いはメッキ法等により成膜し、これをフォトリソグラフィ及びエッチング法等によりパターニングして形成することができる。   Conductive patterns to be formed on the surface of the substrate 3 and the first and second surfaces of the flexible substrate 4 are formed by depositing a conductive material such as metal by sputtering, vapor deposition, plating, or the like, and using this as photolithography and etching. It can be formed by patterning, etc.

図2及び図3に示すように、基体3の上面にフレキシブル基板4を、異方性導電材料5を介して接合する。その結果、各電極6k〜6k+5と各配線8k〜8k+5とは異方性導電材料5を介してそれぞれ電気的に接続する。また、各電極端子7k〜7k+3と各配線端子9k〜9k+3とは異方性導電材料5を介してそれぞれ電気的に接続し、電極端子7kと配線端子9kの接続点を第k接続点Skとして、並び順に第k接続点Sk〜第(k+3)接続点Sk+3・・・が形成される。検査用配線は、フレキシブル基板4に形成される第k検査用配線Hk、基体3に形成される第(k+1)検査用配線Hk+1、フレキシブル基板4に形成される第(k+2)検査用配線Hk+2、基体3に形成される第(k+3)検査用配線Hk+3、フレキシブル基板4に形成される第(k+4)検査用配線Hk+4・・・が直列に接続されることになる。 As shown in FIGS. 2 and 3, the flexible substrate 4 is bonded to the upper surface of the base 3 via an anisotropic conductive material 5. As a result, the electrodes 6 k to 6 k + 5 and the wirings 8 k to 8 k + 5 are electrically connected to each other through the anisotropic conductive material 5. The electrode terminals 7 k to 7 k + 3 and the wiring terminals 9 k to 9 k + 3 are electrically connected to each other through the anisotropic conductive material 5, and the electrode terminals 7 k and the wiring terminals 9 k are connected. the connection point as a k connecting point S k, the k connection point to the sorted S k ~ the (k + 3) connecting point S k + 3 · · · are formed. The inspection wiring is the k-th inspection wiring Hk formed on the flexible substrate 4, the (k + 1) -th inspection wiring H k + 1 formed on the base 3, and the (k + 2) -th inspection wiring formed on the flexible substrate 4. The wiring H k + 2 , the (k + 3) inspection wiring H k + 3 formed on the base 3, the (k + 4) inspection wiring H k + 4 ... Formed on the flexible substrate 4 are connected in series. Will be.

その結果、第k検査用配線Hkと第(k+4)検査用配線Hk+4の間の電気的な接続状態を検査することにより、電極6k+1〜6k+4と配線8k+1〜8k+4とのそれぞれの電気的接続状態を判定することができる。第k検査用配線Hkと第(k+4)検査用配線Hk+4の間が断線状態であれば、電極6k+1〜6k+4と配線8k+1〜8k+4のそれぞれの接続においていずれかの箇所に電気的な接続不良が存在していると判定することができる。例えば100本以上(k>100)の電極6を形成した基体3と、同じく100本以上の配線8を形成したフレキシブル基板4とを接合する場合でも、両端部の検査用配線の電気的な接続状態を検査することにより、100個所以上の全ての接続点の電気的接続の良否を1回の検査で判定することができる。 As a result, the electrodes 6 k + 1 to 6 k + 4 and the wiring 8 k are inspected by checking the electrical connection state between the k-th inspection wiring H k and the (k + 4) inspection wiring H k + 4. The respective electrical connection states of +1 to 8 k + 4 can be determined. If the k-th inspection wiring H k and the (k + 4) inspection wiring H k + 4 are disconnected, the electrodes 6 k + 1 to 6 k + 4 and the wirings 8 k + 1 to 8 k + 4 are connected. It can be determined that there is an electrical connection failure at any location in each connection. For example, even when the base 3 on which 100 or more (k> 100) electrodes 6 are formed and the flexible substrate 4 on which 100 or more wirings 8 are formed are joined, the electrical connection of the inspection wirings at both ends is performed. By inspecting the state, it is possible to determine the quality of the electrical connection at all 100 or more connection points by a single inspection.

以上のとおり、本第一実施形態では、基体3及びフレキシブル基板4のうちの一方にkが偶数(奇数)の第k検査用配線Hkが形成される場合は、他方にkが奇数(偶数)の第k検査用配線Hkが形成される。そして、基体3の端面に第(k+1)検査用配線Hk+1、第(k+3)検査用配線Hk+3、・・・を形成したので、基体3とフレキシブル基板4とを異方性導電材料5を介して接合しても、配線8k+2、配線8k+4・・・と電気的に接続することがない。また、フレキシブル基板4の第k検査用配線Hkは第一面F1とは反対側の第二面F2に設置し、第一面F1に形成される配線端子9k及び配線端子9k+1と貫通電極12を介して接続したので、電気的に接続しないで配線8k+1を跨ぐことができる。その他の第(k+2)検査用配線Hk+2、配線端子9k+2、配線端子9k+3、と第(k+4)検査用配線Hk+4、配線端子9k+4、配線端子9k+5・・も同様である。 As described above, in the first embodiment, when the k-th inspection wiring H k with k being an even number (odd number) is formed on one of the base 3 and the flexible substrate 4, k is an odd number (even number) on the other side. ) K-th inspection wiring H k is formed. Since the (k + 1) -th inspection wiring H k + 1 , the (k + 3) inspection wiring H k + 3 ,... Are formed on the end face of the base 3, the base 3 and the flexible substrate 4 are anisotropic. Even if they are joined through the conductive material 5, they are not electrically connected to the wirings 8 k + 2 , 8 k + 4 . The k-th inspection wiring H k of the flexible substrate 4 is installed on the second surface F2 opposite to the first surface F1, and the wiring terminals 9 k and 9 k + 1 formed on the first surface F1. Since the connection is made through the through electrode 12, the wiring 8 k + 1 can be straddled without being electrically connected. Other (k + 2) inspection wiring H k + 2 , wiring terminal 9 k + 2 , wiring terminal 9 k + 3 , and (k + 4) inspection wiring H k + 4 , wiring terminal 9 k + 4 , wiring terminal The same applies to 9 k + 5 .

(第二実施形態)
図4〜図6は、本発明の第二実施形態に係る回路部材1を説明するための図である。図4(a)は基体3とフレキシブル基板4を接合する前の部分平面図であり、図4(b)は基体3の模式的な斜視図である。図5は基体3とフレキシブル基板4とを異方性導電材料5を介して接合した部分平面図であり、図6は部分BBを矢印の方向から見る縦断面模式図である。第一実施形態と異なる部分は、基体3の表面に溝Mk+1、Mk+3、Mk+5・・・形成され、この溝Mk+1、Mk+3、Mk+5・・・の内表面、ここでは各両側面と底面に第(k+1)検査用配線Hk+1、第(k+3)検査用配線Hk+3、第(k+5)検査用配線Hk+5・・・がそれぞれ形成されていることと、基体3の電極端子7k、7k+1、7k+2・・・は少なくともその半周囲をそれぞれ電極6k、6k+1、6k+2・・により囲まれている点である。その他の基本的な構成は第一実施形態の構成と同様である。
(Second embodiment)
4-6 is a figure for demonstrating the circuit member 1 which concerns on 2nd embodiment of this invention. FIG. 4A is a partial plan view before the base 3 and the flexible substrate 4 are joined, and FIG. 4B is a schematic perspective view of the base 3. FIG. 5 is a partial plan view in which the base 3 and the flexible substrate 4 are joined via the anisotropic conductive material 5, and FIG. 6 is a schematic longitudinal sectional view of the portion BB as seen from the direction of the arrow. The portions different from the first embodiment are formed on the surface of the substrate 3 with grooves M k + 1 , M k + 3 , M k + 5 ..., And the grooves M k + 1 , M k + 3 , M k +. ... ( 5 + 1) inspection wiring H k + 1 , (k + 3) inspection wiring H k + 3 , (k + 5) inspection wiring H k + 5 ... Are formed, and the electrode terminals 7 k , 7 k + 1 , 7 k + 2 ... Of the substrate 3 have electrodes 6 k , 6 k + 1 , 6. It is a point surrounded by k + 2 ... Other basic configurations are the same as those of the first embodiment.

図4(a)に示すように、基体3は、その表面に列状に配列する複数の電極6k〜6k+5と、電極6k〜6k+5の各近傍に設置される検査用の電極端子7k〜7k+5を有する。各電極端子7k〜7k+5はそれぞれが近接する電極6k〜6k+5に半周囲以上を囲まれている。図4(b)に示すように、電極6k+1と電極6k+2の間、電極6k+3と電極6k+4の間、電極6k+5と電極6k+6の間には、それぞれ溝Mk+1、Mk+3、Mk+5の溝が形成されている。これらの溝Mk+1、Mk+3、Mk+5の両側面及び底面にそれぞれ第(k+1)検査用配線Hk+1、第(k+3)検査用配線Hk+3,第(k+5)検査用配線Hk+5が形成され、電極端子7k+1と電極端子7k+2、電極端子7k+3と電極端子7k+4、及び、電極端子7k+5と電極端子7k+6とがそれぞれ電気的に接続される。 As shown in FIG. 4A, the base 3 is inspected in the vicinity of a plurality of electrodes 6 k to 6 k + 5 and electrodes 6 k to 6 k + 5 arranged in a line on the surface. Electrode terminals 7 k to 7 k + 5 . Each of the electrode terminals 7 k to 7 k + 5 is surrounded by more than half of the circumference by the electrodes 6 k to 6 k + 5 that are adjacent to each other. As shown in FIG. 4B, between the electrode 6 k + 1 and the electrode 6 k + 2 , between the electrode 6 k + 3 and the electrode 6 k + 4 , and between the electrode 6 k + 5 and the electrode 6 k + 6 . Between them, grooves M k + 1 , M k + 3 , M k + 5 are formed, respectively. These grooves M k + 1, M k + 3, M k + respectively on both side and bottom surfaces of 5 the (k + 1) inspection wire H k + 1, the (k + 3) test wiring H k + 3, the ( k + 5) Inspection wiring H k + 5 is formed, and electrode terminal 7 k + 1 and electrode terminal 7 k + 2 , electrode terminal 7 k + 3 and electrode terminal 7 k + 4 , and electrode terminal 7 k + 5 and The electrode terminals 7 k + 6 are electrically connected to each other.

フレキシブル基板4の基本的な構成は第一実施形態と同様である。フレキシブル基板4の各配線端子9k〜9k+5は、基体3の各電極端子7k〜7k+5とほぼ同じ大きさの円形の形状を有している。フレキシブル基板4の各配線8k〜8k+5は基体3に接合したときに各電極6k〜6k+5と重なるように電極6k〜6k+5と同じピッチで配列する。同様に各配線端子9k〜9k+5は基体3に接合したときに各電極端子7k〜7k+5と重なるようにほぼ同じ形状で同じピッチで配列する。各配線端子9k〜9k+5はフレキシブル基板4の下辺端部よりも上辺側に形成され、各配線8k+1〜8k+5は2つの配線端子の間を通すように折れ曲がった形を有する。 The basic configuration of the flexible substrate 4 is the same as that of the first embodiment. The wiring terminals 9 k to 9 k + 5 of the flexible substrate 4 have a circular shape having substantially the same size as the electrode terminals 7 k to 7 k + 5 of the base 3. The wirings 8 k to 8 k + 5 of the flexible substrate 4 are arranged at the same pitch as the electrodes 6 k to 6 k + 5 so as to overlap the electrodes 6 k to 6 k + 5 when bonded to the base 3. Similarly, the wiring terminals 9 k to 9 k + 5 are arranged in substantially the same shape and at the same pitch so as to overlap the electrode terminals 7 k to 7 k + 5 when bonded to the base 3. Each of the wiring terminals 9 k to 9 k + 5 is formed on the upper side of the lower edge of the flexible substrate 4, and each of the wirings 8 k + 1 to 8 k + 5 is bent so as to pass between the two wiring terminals. Has a shape.

図5及び図6に示すように、基体3の上面にフレキシブル基板4を、異方性導電材料5を介して接合する。その結果、各電極6k〜6k+5と各配線8k〜8k+5のそれぞれが異方性導電材料5を介して電気的に接続する。また、各電極端子7k〜7k+5と各配線端子9k〜9k+5のそれぞれが異方性導電材料5を介して電気的に接続し、並び順に第k接続点Sk〜第(k+5)接続点Sk+5が形成される。検査用配線は、フレキシブル基板4に形成される第k検査用配線Hk、基体3に形成される第(k+1)検査用配線Hk+1、フレキシブル基板4に形成される第(k+2)検査用配線Hk+2、基体3に形成される第(k+3)検査用配線Hk+3、フレキシブル基板4に形成される第(k+4)検査用配線Hk+4が直列に接続されることになる。 As shown in FIGS. 5 and 6, the flexible substrate 4 is bonded to the upper surface of the base 3 via an anisotropic conductive material 5. As a result, each of the electrodes 6 k to 6 k + 5 and each of the wirings 8 k to 8 k + 5 are electrically connected via the anisotropic conductive material 5. In addition, each of the electrode terminals 7 k to 7 k + 5 and each of the wiring terminals 9 k to 9 k + 5 are electrically connected via the anisotropic conductive material 5, and the k-th connection point S k to A (k + 5) th connection point S k + 5 is formed. The inspection wiring is the k-th inspection wiring H k formed on the flexible substrate 4, the (k + 1) -th inspection wiring H k + 1 formed on the base 3, and the (k + 2) -th inspection formed on the flexible substrate 4. Wiring line H k + 2 , (k + 3) inspection line H k + 3 formed on base 3, and (k + 4) inspection line H k + 4 formed on flexible substrate 4 are connected in series. become.

その結果、第k検査用配線Hkと第(k+5)検査用配線Hk+5の間の電気的な接続状態を検査することにより、電極6k+1〜6k+5と配線8k+1〜8k+5のそれぞれの電気的接続状態を確認することができる。第k検査用配線Hkと第(k+5)検査用配線Hk+5の間が断線状態であれば、電極6k+1〜6k+5と配線8k+1〜8k+5のそれぞれの接続においていずれかの箇所に電気的な接続不良が存在していると判定することができる。 As a result, the electrodes 6 k + 1 to 6 k + 5 and the wiring 8 k + are inspected by inspecting the electrical connection state between the k-th inspection wiring Hk and the (k + 5) inspection wiring H k + 5. Each electrical connection state of 1 to 8 k + 5 can be confirmed. If the k-th inspection wiring H k and the (k + 5) inspection wiring H k + 5 are disconnected, the electrodes 6 k + 1 to 6 k + 5 and the wirings 8 k + 1 to 8 k + 5 are connected. It can be determined that there is an electrical connection failure at any location in each connection.

本第二実施形態においては各電極端子7k〜7k+5が各電極6k〜6k+5のそれぞれにより少なくとも一部(図5においては略半周囲)が囲まれているので、電極6と配線8との間の断線状態を検出するモニターとして検査精度が向上する。 In the second embodiment, each of the electrode terminals 7 k to 7 k + 5 is at least partially surrounded by each of the electrodes 6 k to 6 k + 5 (substantially half the circumference in FIG. 5). The inspection accuracy is improved as a monitor for detecting a disconnection state between 6 and the wiring 8.

なお、各溝Mk+1、溝Mk+3、溝Mk+5・・・を電極6と平行して長く形成しているが、本発明はこれに限定されず第(k+1)検査用配線Hk+1、第(k+3)検査用配線Hk+3、第(k+5)検査用配線Hk+5・・・が形成できるだけの幅があればよい。また、圧電体基板の表面に多数の溝を形成し、この多数の溝を圧力室として駆動する液体噴射用のヘッドチップを構成する場合は、外部から駆動信号を入力するための電極端子を形成する領域までこれらの溝を延設し、この延設部に上記検査用配線を形成することができる。 In addition, although each groove | channel Mk + 1 , groove | channel Mk + 3 , groove | channel Mk + 5 ... is formed in parallel with the electrode 6, this invention is not limited to this, The (k + 1) test | inspection is carried out. The wiring H k + 1 , the (k + 3) inspection wiring H k + 3 , the (k + 5) inspection wiring H k + 5 ... In addition, when a large number of grooves are formed on the surface of the piezoelectric substrate, and a head chip for liquid ejection that drives the large number of grooves as pressure chambers is formed, electrode terminals for inputting drive signals from outside are formed. These grooves can be extended to the region to be formed, and the inspection wiring can be formed in the extended portion.

(第三実施形態)
図7〜図9は、本発明の第三実施形態に係る回路部材1を説明するための図である。図7は基体3とフレキシブル基板4を接合する前の部分平面図であり、図8は基体3とフレキシブル基板4とを異方性導電材料5を介して接合した部分平面図であり、図9は部分CCを矢印の方向から見る縦断面模式図である。
(Third embodiment)
7-9 is a figure for demonstrating the circuit member 1 which concerns on 3rd embodiment of this invention. 7 is a partial plan view before the base 3 and the flexible substrate 4 are joined, and FIG. 8 is a partial plan view of the base 3 and the flexible substrate 4 joined via the anisotropic conductive material 5. FIG. 4 is a schematic longitudinal sectional view of a portion CC viewed from the direction of an arrow.

第一実施形態と異なる部分は、基体3に形成する第(k+1)検査用配線Hk+1や第(k+3)検査用配線Hk+3が基体3の端部近傍の表面上に設置される点である。更に、フレキシブル基板4の配線8k+2が基体3の第(k+1)検査用配線Hk+1を跨ぐ領域や、配線8k+4が第(k+3)検査用配線Hk+3を跨ぐ領域にそれぞれ付加配線10k+2、10k+4を設置し、第(k+1)検査用配線Hk+1と配線8k+2とを、また第(k+3)検査用配線Hk+3と配線8k+4とを電気的に分離した点である。 The difference from the first embodiment is that the (k + 1) -th inspection wiring H k + 1 and the (k + 3) inspection wiring H k + 3 formed on the base 3 are installed on the surface near the end of the base 3. It is a point. Further, a region where the wiring 8 k + 2 of the flexible substrate 4 straddles the (k + 1) -th inspection wiring H k + 1 of the base 3 and a wiring 8 k + 4 straddles the (k + 3) -th inspection wiring H k + 3 . The additional wirings 10 k + 2 and 10 k + 4 are respectively installed in the regions, the (k + 1) -th inspection wiring H k + 1 and the wiring 8 k + 2 and the (k + 3) -th inspection wiring H k + 3. And the wiring 8 k + 4 are electrically separated.

基体3は、その表面に、列状に配列する複数の電極6k〜6k+5と、電極6k〜6k+5の各近傍に設置される検査用の複数の電極端子7k〜7k+5と、電極端子7k+1と電極端子7k+2を電気的に接続する検査用配線Hk+1、電極端子7k+3と電極端子7k+4とを電気的に接続する検査用配線Hk+3、電極端子7k+5と図示しない電極端子7k+6とを電気的に接続する検査用配線Hk+5、・・・を有する。 The substrate 3 has, on its surface, a plurality of electrodes 6 k to 6 k + 5 arranged in rows and a plurality of electrode terminals 7 k to 7 k for inspection installed in the vicinity of the electrodes 6 k to 6 k + 5. 7 k + 5 , the inspection wiring H k + 1 that electrically connects the electrode terminal 7 k + 1 and the electrode terminal 7 k + 2 , and the electrode terminal 7 k + 3 and the electrode terminal 7 k + 4 are electrically connected Inspection wiring H k + 3 to be connected to electrode electrode 7 k + 5 and inspection wiring H k + 5 to electrically connect electrode terminal 7 k + 6 ( not shown).

フレキシブル基板4は、基体3と接合される紙面下方の第一面F1に列状に配列する複数の配線8k〜8k+5と、配線8k+1〜8k+5の各近傍に設置される検査用の複数の配線端子9k〜9k+5を有する。各配線8k〜8k+5は基体3に接合したときに各電極6k〜6k+5と重なるように電極6k〜6k+5と同じピッチで配列する。同様に各配線端子9k〜9k+5は基体3に接合したときに各電極端子7k〜7k+5と重なるように同じピッチで配列する。各配線端子9k〜9k+5はフレキシブル基板4の下辺端部よりも上辺側に形成される。各配線8k、8k+2、8k+4は2つの配線端子の間を通すように折れ曲がった形を有する。 The flexible substrate 4 is arranged in the vicinity of each of the plurality of wirings 8 k to 8 k + 5 and the wirings 8 k + 1 to 8 k + 5 arranged in a row on the first surface F1 below the paper surface joined to the base 3. A plurality of inspection wiring terminals 9 k to 9 k + 5 are provided. The wirings 8 k to 8 k + 5 are arranged at the same pitch as the electrodes 6 k to 6 k + 5 so as to overlap the electrodes 6 k to 6 k + 5 when bonded to the base 3. Similarly, the wiring terminals 9 k to 9 k + 5 are arranged at the same pitch so as to overlap the electrode terminals 7 k to 7 k + 5 when bonded to the base 3. Each of the wiring terminals 9 k to 9 k + 5 is formed on the upper side with respect to the lower side end portion of the flexible substrate 4. Each wiring 8 k , 8 k + 2 , 8 k + 4 has a bent shape so as to pass between two wiring terminals.

フレキシブル基板4は、第二面F2に破線で示すように第一面F1の配線8k+1を跨ぐように第k検査用配線Hkを有する。第k検査用配線Hkは第一面F1に設置される配線端子9k及び配線端子9k+1と貫通電極12を介して電気的に接続される。フレキシブル基板4は、同様にその第二面F2に第一面F1の配線8k+3を跨ぐように形成される第(k+2)検査用配線Hk+2を有し、第(k+2)検査用配線Hk+2は貫通電極12を介して配線端子9k+2及び配線端子9k+3と電気的に接続される。第(k+4)検査用配線Hk+4・・・も同様に形成される。 The flexible substrate 4 has a first k inspection wiring line H k so as to straddle the wire 8k + 1 of the first surface F1 as indicated by a broken line in the second surface F2. The k-th inspection wiring H k is electrically connected to the wiring terminal 9 k and the wiring terminal 9 k + 1 installed on the first surface F 1 through the through electrode 12. Similarly, the flexible substrate 4 has the (k + 2) inspection wiring H k + 2 formed on the second surface F2 so as to straddle the wiring 8 k + 3 of the first surface F1, and the (k + 2) inspection. The wiring H k + 2 is electrically connected to the wiring terminal 9 k + 2 and the wiring terminal 9 k + 3 through the through electrode 12. The (k + 4) -th inspection wiring H k + 4 ... Is formed in the same manner.

更に、配線8k+2は基体3に形成される第(k+1)検査用配線Hk+1と交差する領域の第一面F1からは除去され、これに代えて第二面F2に付加配線10k+2が形成される。この付加配線10k+2はその両端において図示しない貫通電極を介して配線8k+2と電気的に接続される。同様に、配線8k+4は基体3に形成される第(k+3)検査用配線Hk+3と交差する領域の第一面F1からは除去され、これに代えて第二面F2に付加配線10k+4が形成される。この付加配線10k+4はその両端において図示しない貫通電極を介して配線8k+4に電気的に接続される。そのほかの構成は第一実施形態と同様なので、説明を省略する。 Further, the wiring 8 k + 2 is removed from the first surface F1 in the region intersecting with the (k + 1) -th inspection wiring H k + 1 formed on the base 3, and instead, an additional wiring is formed on the second surface F2. 10 k + 2 is formed. The additional wiring 10 k + 2 is electrically connected to the wiring 8 k + 2 via through electrodes (not shown) at both ends thereof. Similarly, the wiring 8 k + 4 is removed from the first surface F1 in the region intersecting with the (k + 3) inspection wiring H k + 3 formed on the base 3, and is added to the second surface F2 instead. Wiring 10 k + 4 is formed. The additional wiring 10 k + 4 is electrically connected to the wiring 8 k + 4 via through electrodes (not shown) at both ends thereof. Since other configurations are the same as those of the first embodiment, description thereof is omitted.

基体3の表面やフレキシブル基板4の第一面及び第二面に形成する導電パターンは金属等の導電体をスパッタリング法、蒸着法、或いはメッキ法等により成膜し、これをフォトリソグラフィ及びエッチング法等によりパターニングして形成することができる。特に、基体3のいずれの導電体も基体3の表面に形成される。そのため、導電体の成膜やパターニングが容易となる。   Conductive patterns to be formed on the surface of the substrate 3 and the first and second surfaces of the flexible substrate 4 are formed by depositing a conductive material such as metal by sputtering, vapor deposition, plating, or the like, and using this as photolithography and etching. It can be formed by patterning, etc. In particular, any conductor of the substrate 3 is formed on the surface of the substrate 3. This facilitates the formation and patterning of the conductor.

なお、第二実施形態において基体3に溝Mk+1、Mk+3、Mk+5を形成し、各溝Mk+1、溝Mk+3、溝Mk+5の両側面及び底面に第(k+1)検査用配線Hk+1、第(k+1)検査用配線Hk+3、第(k+5)検査用配線Hk+5をそれぞれ形成したが、これに代えて、第(k+1)検査用配線Hk+1〜第(k+5)検査用配線Hk+5を基体3の表面に形成し、フレキシブル基板4の第一面F1の対応領域の配線8k〜8k+4を除去し、第二面F2に付加配線10k〜10k+4を形成し、その両端を、貫通電極を介して配線8k〜8k+4のそれぞれに電気的に接続するように構成してもよい。 In the second embodiment, grooves M k + 1 , M k + 3 , M k + 5 are formed in the base 3 , and both side surfaces of each groove M k + 1 , groove M k + 3 , and groove M k + 5 are formed. In addition, the (k + 1) -th inspection wiring H k + 1 , the (k + 1) -th inspection wiring H k + 3 , and the (k + 5) -th inspection wiring H k + 5 are formed on the bottom surface. (K + 1) inspection wiring H k + 1 to (k + 5) inspection wiring H k + 5 are formed on the surface of the base 3, and wirings 8 k to 8 k + corresponding to the first surface F1 of the flexible substrate 4 are formed. 4 is removed, additional wirings 10 k to 10 k + 4 are formed on the second surface F2, and both ends thereof are electrically connected to the wirings 8 k to 8 k + 4 through the through electrodes. It may be configured.

(第四実施形態)
図10〜図12は本発明の第四実施形態に係る回路部材1を説明するための図である。図10は基体3とフレキシブル基板4を接合する前の部分平面図で得あり、図11(a)は基体3とフレキシブル基板4とを異方性導電材料5を介して接合した部分平面図であり、図11(b)は第k接続点Sk〜第(k+2)接続点Sk+2の接続状態を拡大した部分拡大図であり、図12が部分DDの一点鎖線に沿った縦断面模式図である。
(Fourth embodiment)
FIGS. 10-12 is a figure for demonstrating the circuit member 1 which concerns on 4th embodiment of this invention. FIG. 10 is a partial plan view before the base 3 and the flexible substrate 4 are joined, and FIG. 11A is a partial plan view in which the base 3 and the flexible substrate 4 are joined via the anisotropic conductive material 5. FIG. 11B is a partially enlarged view in which the connection state of the k-th connection point S k to the (k + 2) -th connection point S k + 2 is enlarged, and FIG. 12 is a longitudinal section taken along the dashed line of the part DD. It is a schematic diagram.

本第四実施形態では、フレキシブル基板4に形成する配線端子9は互いに分離する第一配線端子9aと第二配線端子9bを有する。第k接続点Skは、並び順に数えてk番目の電極端子7kとk番目の第一配線端子9akとを電気的に接続する第k1接続点Sk1と、k番目の電極端子7kとk番目の第二配線端子9bkとを電気的に接続する第k2接続点Sk2とを有する。そして、kが奇数の第k検査用配線Hkは、第k1接続点Sk1と第(k+1)1接続点S(k+1)1とを電気的に接続し、kが偶数の第k検査用配線Hkは、第k2接続点Sk2と第(k+1)接続点S(k+1)2とを電気的に接続する。以下、図10〜図12を参照して具体的に説明する。 In the fourth embodiment, the wiring terminals 9 formed on the flexible substrate 4 have a first wiring terminal 9a and a second wiring terminal 9b that are separated from each other. The k-th connection point S k is a k-th connection point S k1 that electrically connects the k-th electrode terminal 7 k and the k-th first wiring terminal 9 ak in the order of arrangement, and the k-th electrode terminal 7. and k and k-th second wiring terminal 9b k having a first k2 connecting point S k2 electrically connected. Then, k is wiring the k test odd H k is the a first k1 connecting point S k1 second (k + 1) 1 connection point S (k + 1) 1 and electrically connected, k is an even number k-th The inspection wiring H k electrically connects the k2 connection point S k2 and the (k + 1) th connection point S (k + 1) 2 . Hereinafter, a specific description will be given with reference to FIGS.

図10に示すように、基体3は、その表面に列状に配列する電極6k〜6k+5と、電極6k〜6k+5のそれぞれに対応し、単一の電極によりそれぞれが囲まれる電極端子7k〜7k+5を有する。フレキシブル基板4は、基体3と接合される紙面に向かって奥側の第一面F1(第一面F1に形成される導電パターンを実線で表す。)に列状に配列する複数の配線8k〜8k+5と、配線8k〜8k+5の各近傍に設置される検査用の複数の配線端子9k〜9k+5を有する。配線端子9kは互いに分離する第一配線端子9akと第二配線端子9bkとを有し、配線端子9k+1は互いに分離する第一配線端子9ak+1と第二配線端子9bk+1とを有し、以下同様である。各配線8k〜8k+5は基体3に接合したときに各電極6k〜6k+5と重なるように電極6k〜6k+5と同じピッチで配列する。同様に各配線端子9k〜9k+5は基体3に接合したときに各電極端子7k〜7k+5と重なるように同じピッチで配列する。各配線端子9k〜9k+5はフレキシブル基板4の下辺端部よりも上辺側に形成され、各配線8k+1〜8k+5は2つの配線端子の間を通すように折れ曲がった形を有する。 As shown in FIG. 10, the base 3 corresponds to each of the electrodes 6 k to 6 k + 5 and the electrodes 6 k to 6 k + 5 arranged in a line on the surface, and each of the bases 3 is formed by a single electrode. It has electrode terminals 7 k to 7 k + 5 surrounded. The flexible substrate 4 has a plurality of wirings 8 k arranged in a row on the first surface F1 (the conductive pattern formed on the first surface F1 is represented by a solid line) on the back side toward the paper surface joined to the base 3. To 8 k + 5 and a plurality of inspection wiring terminals 9 k to 9 k + 5 installed in the vicinity of the wirings 8 k to 8 k + 5 . First wiring terminals 9a k and and a second wire terminal 9b k, the first wiring terminal 9a k + 1 and the second wiring terminal 9b wiring terminals 9 k + 1 is to be separated from each other wiring terminals 9 k is to be separated from each other k + 1, and so on. The wirings 8 k to 8 k + 5 are arranged at the same pitch as the electrodes 6 k to 6 k + 5 so as to overlap the electrodes 6 k to 6 k + 5 when bonded to the base 3. Similarly, the wiring terminals 9 k to 9 k + 5 are arranged at the same pitch so as to overlap the electrode terminals 7 k to 7 k + 5 when bonded to the base 3. Each of the wiring terminals 9 k to 9 k + 5 is formed on the upper side of the lower edge of the flexible substrate 4, and each of the wirings 8 k + 1 to 8 k + 5 is bent so as to pass between the two wiring terminals. Has a shape.

フレキシブル基板4は、紙面上方の第二面F2に破線で示すように第k検査用配線Hk〜第(k+4)検査用配線Hk+4を有する。第k検査用配線Hkは第一面F1に形成した配線8k+1を跨ぐように形成され、図示しない貫通電極12を介して第一面F1に形成した第一配線端子9akと第一配線端子9a(k+1)とを電気的に接続する。第(k+1)検査用配線Hk+1は第一面F1に形成した配線8k+2を跨ぐように形成され、図示しない貫通電極12を介して第一面F1に形成した第二配線端子9bk+1と第二配線端子9bk+2とを電気的に接続する。その他の第(k+2)検査用配線Hk+2、第(k+3)検査用配線Hk+3・・・も同様に形成される。 The flexible substrate 4 includes a k-th inspection wiring H k to a (k + 4) inspection wiring H k + 4 as indicated by a broken line on the second surface F2 above the paper surface. The first k inspection wiring line H k is formed so as to straddle the wire 8 k + 1 formed on the first surface F1, a first wiring terminals 9a k formed on the first surface F1 via the through electrode 12 (not shown) first One wiring terminal 9a (k + 1) is electrically connected. The (k + 1) -th inspection wiring H k + 1 is formed so as to straddle the wiring 8 k + 2 formed on the first surface F1, and is formed on the first surface F1 via the through electrode 12 (not shown). 9b k + 1 and the second wiring terminal 9b k + 2 are electrically connected. The other (k + 2) inspection wiring H k + 2 , (k + 3) inspection wiring H k + 3 ... Are formed in the same manner.

図11及び図12に示すように、基体3の上面にフレキシブル基板4を、異方性導電材料5を介して接合する。その結果、各電極6k〜6k+5と各配線8k〜8k+5のそれぞれが異方性導電材料5を介して電気的に接続する。また、各電極端子7k〜7k+5と各配線端子9k〜9k+5のそれぞれが異方性導電材料5を介して電気的に接続し、並び順に第k接続点Sk〜第(k+5)接続点Sk+5が形成される。 As shown in FIGS. 11 and 12, the flexible substrate 4 is bonded to the upper surface of the base 3 via an anisotropic conductive material 5. As a result, each of the electrodes 6 k to 6 k + 5 and each of the wirings 8 k to 8 k + 5 are electrically connected via the anisotropic conductive material 5. In addition, each of the electrode terminals 7 k to 7 k + 5 and each of the wiring terminals 9 k to 9 k + 5 are electrically connected via the anisotropic conductive material 5, and the k-th connection point S k to A (k + 5) th connection point S k + 5 is formed.

ここで、並び順がk番目の配線端子9kは互いに分離する第一配線端子9akと第二配線端子9bkを有する。更に、図11(b)に示すように、並び順がk番目の第k接続点Skは、第一配線端子9akと電極端子7kとが電気的に接続する第k1接続点Sk1と、第二配線端子9bkと電極端子7kとが電気的に接続する第k2接続点Sk2とを有する。並び順が(k+1)番目、(k+2)番目・・・の配線端子9k+1、接続点Sk+1・・・も同様の構成を有する。 Here, the k-th wiring terminal 9 k in the arrangement order has a first wiring terminal 9 ak and a second wiring terminal 9 b k that are separated from each other. Furthermore, as shown in FIG. 11B, the k-th connection point S k in the arrangement order is the k1 connection point S k1 where the first wiring terminal 9 ak and the electrode terminal 7 k are electrically connected. And the second wiring terminal 9b k and the electrode terminal 7 k have a k2 connection point S k2 that is electrically connected. The (k + 1) -th, (k + 2) -th... Wiring terminal 9 k + 1 , connection point S k + 1 .

フレキシブル基板4の第二面F2に形成した第k検査用配線Hkは、両端部の貫通電極12を介して第k1接続点Sk1と第(k+1)1接続点S(k+1)1とを電気的に接続する。第(k+1)検査用配線Hk+1は、両端部の貫通電極12を介して第(k+1)2接続点S(k+1)2と第(k+2)2接続点S(k+2)2とを電気的に接続する。その他の第(k+3)検査用配線Hk+3、第(k+4)検査用配線Hk+4・・・も同様に構成される。従って、kが偶数(奇数)の第k検査用配線Hkは、第k1接続点Sk1と第(k+1)1接続点S(k+1)1とを電気的に接続し、kが奇数(偶数)の第k検査用配線Hkは、第k2接続点Sk2と第(k+1)2接続点S(k+1)2とを電気的に接続することになる。 The k-th inspection wiring H k formed on the second surface F2 of the flexible substrate 4 is connected to the k1 connection point S k1 and the (k + 1) 1 connection point S (k + 1) 1 through the through-electrodes 12 at both ends. And electrically connect. The (k + 1) -th inspection wiring H k + 1 is connected to the (k + 1) -second connection point S (k + 1) 2 and the (k + 2) -second connection point S (k + 2) via the through electrodes 12 at both ends. 2 is electrically connected. The other (k + 3) inspection wiring H k + 3 , (k + 4) inspection wiring H k + 4 . Accordingly, the k-th inspection wiring Hk with k being an even number (odd number) electrically connects the k1 connection point S k1 and the (k + 1) th connection point S (k + 1) 1, and k is an odd number ( The (even) k-th inspection wiring H k electrically connects the k2 connection point S k2 and the (k + 1) 2 connection point S (k + 1) 2 .

その結果、検査用配線はすべてフレキシブル基板4に形成され、第k検査用配線Hk、第(k+1)検査用配線Hk+1、第(k+2)検査用配線Hk+2、第(k+3)検査用配線Hk+3、第(k+4)検査用配線Hk+4・・・のように直列に接続される。従って、第k検査用配線Hkと第(k+4)検査用配線Hk+4の間の電気的な接続状態を検査することにより、電極6k+1〜6k+4と配線8k+1〜8k+4のそれぞれの電気的接続状態を判断することができる。 As a result, all the inspection wirings are formed on the flexible substrate 4, and the kth inspection wiring Hk , the (k + 1) th inspection wiring Hk + 1 , the (k + 2) th inspection wiring Hk + 2 , and the (k + 3) th. ) The inspection wiring H k + 3 and the (k + 4) th inspection wiring H k + 4 ... Are connected in series. Therefore, the electrodes 6 k + 1 to 6 k + 4 and the wiring 8 k + are inspected by checking the electrical connection state between the k-th inspection wiring H k and the (k + 4) inspection wiring H k + 4. Each electrical connection state of 1 to 8 k + 4 can be determined.

本実施形態では、検査する接続点が検査すべき電極により囲まれているので、基体3の電極6とフレキシブル基板4の配線8の電気的接続状態のモニター精度が向上する。また、基体3の端面に形成した導電膜をパターニングする、或いは基体3に溝を形成し、その内壁や底面に形成した電極をパターニングする等の複雑な工程を要することなく容易に形成することができる。なお、本実施形態では各電極端子7が単一の電極6により完全に囲まれるように形成したが、本発明はこれに限定されず、電極端子7を各電極6の近傍に設置してもよいし、各電極端子7が単一の電極6によりその一部が囲まれるようにしても本発明の効果を奏することができる。   In this embodiment, since the connection point to be inspected is surrounded by the electrode to be inspected, the monitoring accuracy of the electrical connection state between the electrode 6 of the base 3 and the wiring 8 of the flexible substrate 4 is improved. Further, the conductive film formed on the end face of the substrate 3 can be easily formed without requiring a complicated process such as patterning the conductive film formed on the end surface or forming a groove on the substrate 3 and patterning the electrode formed on the inner wall or bottom surface thereof. it can. In the present embodiment, each electrode terminal 7 is formed so as to be completely surrounded by a single electrode 6, but the present invention is not limited to this, and the electrode terminal 7 may be installed in the vicinity of each electrode 6. In addition, even if each electrode terminal 7 is partially surrounded by the single electrode 6, the effect of the present invention can be obtained.

以上の各実施形態において、並び順がk=1と並び順がk=nの端部の電極構成は、並び順がk=1の手前の0番目の第0検査用配線H0、及び並び順がk=nの次の(n+1)番目の第(n+1)検査用配線Hn+1を検査用の引出電極とすることができる。この第0検査用配線H0と第(n+1)検査用配線Hn+1との間の電気的接続状態を検査することにより、全ての電極6と配線8の間の接続状態を1回の検査により判断することができる。 In each of the above embodiments, the electrode configuration at the end where the arrangement order is k = 1 and the arrangement order is k = n is the 0th 0th inspection wiring H 0 before the arrangement order is k = 1, and the arrangement. The next (n + 1) -th (n + 1) -th inspection wiring H n + 1 in the order of k = n can be used as an extraction electrode for inspection. By inspecting the electrical connection state between the 0th inspection wiring H 0 and the (n + 1) th inspection wiring H n + 1 , the connection state between all the electrodes 6 and the wirings 8 can be changed once. It can be judged by inspection.

なお、配線端子9を、例えば図14に示す回路基板14と電気的に接続する構成を詳細に説明する。配線端子9を回路基板14と電気的に接続する場合は、回路基板14と接続するフレキシブル基板4の端部まで配線端子9を延長し引き出す構成が好ましい。配線8と回路基板14の端子とを電気的に接続する際に、同様の手段で同時に配線端子9と回路基板14の端子とを電気的に接続することができるためである。また、配線端子9を延長し引き出す構成は、図13(a)に示すようにフレキシブル基板4の配線8を配列する方向の両端において、それぞれ引き出す構成でもかまわないし、図13(b)に示すように配列方向の一端に配線端子9を引き出す構成でもかまわない。なお、この場合において、延長した配線端子9が配線8を跨ぐ必要がある場合は、検査用配線Hを用いて第一面F1から第二面F2に引き上げればよい。さらに、第二面F2から配線8が設けられている第一面F1に配線端子9を延長するには、スルーホールを用いることが可能である。この構成によって、上述した配線8と回路基板14の端子とを電気的に接続する際に、同様の手段で同時に配線端子9と回路基板14の端子とを電気的に接続することができる。   In addition, the structure which electrically connects the wiring terminal 9 with the circuit board 14 shown, for example in FIG. 14 is demonstrated in detail. When the wiring terminal 9 is electrically connected to the circuit board 14, it is preferable to extend the wiring terminal 9 to the end of the flexible board 4 connected to the circuit board 14. This is because when the wiring 8 and the terminal of the circuit board 14 are electrically connected, the wiring terminal 9 and the terminal of the circuit board 14 can be electrically connected simultaneously by the same means. Further, as shown in FIG. 13A, the wiring terminal 9 may be extended and pulled out at both ends in the direction in which the wiring 8 of the flexible substrate 4 is arranged as shown in FIG. Alternatively, the wiring terminal 9 may be drawn out to one end in the arrangement direction. In this case, if the extended wiring terminal 9 needs to straddle the wiring 8, it may be pulled up from the first surface F1 to the second surface F2 using the inspection wiring H. Furthermore, in order to extend the wiring terminal 9 from the second surface F2 to the first surface F1 where the wiring 8 is provided, a through hole can be used. With this configuration, when the wiring 8 and the terminal of the circuit board 14 are electrically connected, the wiring terminal 9 and the terminal of the circuit board 14 can be simultaneously electrically connected by the same means.

なお、配線端子9は回路基板14と接続しなければならないわけではない。例えばフレキシブル基板4上に配線端子9が延長されて電気的に接続される2,3mm程度の所定範囲のランド部を設けることも可能である。このランド部に、プローブの先端を接触させることによって、通電状態を確認し、フレキシブル基板4が基体3から剥がれていないかどうかを確認することができる。また、回路基板14を用いる場合でも、プローブを用いる場合でも、検査電圧は3〜5[V]程度の所定電圧でかまわない。   The wiring terminal 9 does not have to be connected to the circuit board 14. For example, it is also possible to provide a land portion having a predetermined range of about 2 to 3 mm on which the wiring terminal 9 is extended and electrically connected on the flexible substrate 4. By bringing the tip of the probe into contact with the land portion, it is possible to confirm the energized state and confirm whether the flexible substrate 4 has been peeled off from the base 3. Whether the circuit board 14 or the probe is used, the inspection voltage may be a predetermined voltage of about 3 to 5 [V].

(第五実施形態)
図14は、本発明の第五実施形態に係る液体噴射ヘッド2の模式的な斜視図である。液体噴射ヘッド2は、圧電体材料から成る基体3と、その上に接合され、図示しない液体供給室を有するカバープレート15と、基体3の端部表面に一方の端部が接合されるフレキシブル基板4と、フレキシブル基板4の他方の端部が接合される回路基板14とを備える。基体3とカバープレート15によりヘッドチップが構成され、図面左側の端面に接合される図示しないノズルプレートに形成した図示しないノズル孔から液体を吐出する。回路基板14にはヘッドチップ駆動用の駆動信号を生成するドライバーIC13が搭載され、生成される駆動信号は、フレキシブル基板4を介して基体3に供給される。
(Fifth embodiment)
FIG. 14 is a schematic perspective view of the liquid jet head 2 according to the fifth embodiment of the present invention. The liquid ejecting head 2 includes a base 3 made of a piezoelectric material, a cover plate 15 having a liquid supply chamber (not shown) bonded thereto, and a flexible substrate having one end bonded to the end surface of the base 3. 4 and a circuit board 14 to which the other end of the flexible board 4 is joined. A head chip is constituted by the substrate 3 and the cover plate 15, and liquid is discharged from a nozzle hole (not shown) formed in a nozzle plate (not shown) joined to the end face on the left side of the drawing. A driver IC 13 that generates a drive signal for driving the head chip is mounted on the circuit board 14, and the generated drive signal is supplied to the base 3 through the flexible substrate 4.

ここで、基体3とフレキシブル基板4との間の電気的接続を第一実施形態〜第四実施形態のいずれかの構成を適用する。また、フレキシブル基板4と回路基板14との間の電気的接続にも第一実施形態〜第四実施形態のいずれかの構成を適用することができる。その結果、圧電体基板から成る基体3にフレキシブル基板4を接合した直後に、例えば第0検査用配線H0と第(n+1)検査用配線Hn+1との間の電気的接続状態を検査すれば、基体3上のn本の電極とフレキシブル基板4上のn本の配線との間の各接続を一括して検査したことになる。従って接続状態の検査が極めて簡単となる。 Here, the configuration of any of the first to fourth embodiments is applied to the electrical connection between the base 3 and the flexible substrate 4. In addition, any of the configurations of the first to fourth embodiments can be applied to the electrical connection between the flexible substrate 4 and the circuit substrate 14. As a result, immediately after the flexible substrate 4 is joined to the base 3 made of a piezoelectric substrate, for example, the electrical connection state between the 0th inspection wiring H 0 and the (n + 1) th inspection wiring H n + 1 is inspected. In this case, each connection between the n electrodes on the substrate 3 and the n wirings on the flexible substrate 4 is collectively checked. Accordingly, the inspection of the connection state is extremely simple.

なお、この種の液体噴射ヘッド2では、電極及び配線の配列ピッチが100μm〜20μmであり、電極数が100本以上となる。また、検査用の第0検査用配線H0と第(n+1)検査用配線Hn+1を制御回路等に接続し、接続状態を制御回路等により検査するように構成することができる。また、基体3に図16に示す複数の溝が後方端まで延在するように形成され、この溝を区画する側壁の後方端上面に駆動信号を入力する電極が形成される場合は、本発明の第二実施形態の構成を適用することができる。 In this type of liquid jet head 2, the arrangement pitch of electrodes and wiring is 100 μm to 20 μm, and the number of electrodes is 100 or more. Further, the 0th inspection wiring H 0 and the (n + 1) th inspection wiring H n + 1 for inspection can be connected to a control circuit or the like, and the connection state can be inspected by the control circuit or the like. 16 is formed so that the plurality of grooves shown in FIG. 16 extend to the rear end, and an electrode for inputting a drive signal is formed on the upper surface of the rear end of the side wall defining the groove. The configuration of the second embodiment can be applied.

(第六実施形態)
図15は本発明の第六実施形態に係る液体噴射装置30の模式的な斜視図である。液体噴射装置30は、液体噴射ヘッド2、2’を往復移動させる移動機構40と、液体噴射ヘッド2、2’に液体を供給する流路部35、35’と、流路部35、35’に液体を供給する液体ポンプ33、33’及び液体タンク34、34’を備えている。各液体噴射ヘッド2、2’は複数の吐出溝を備え、各吐出溝に連通するノズルから液滴を吐出する。各液体噴射ヘッド2、2’は第五実施形態において説明したものを使用する。
(Sixth embodiment)
FIG. 15 is a schematic perspective view of a liquid ejecting apparatus 30 according to the sixth embodiment of the present invention. The liquid ejecting apparatus 30 includes a moving mechanism 40 that reciprocates the liquid ejecting heads 2 and 2 ′, flow path portions 35 and 35 ′ that supply liquid to the liquid ejecting heads 2 and 2 ′, and flow path portions 35 and 35 ′. Liquid pumps 33 and 33 ′ for supplying liquid and liquid tanks 34 and 34 ′ are provided. Each liquid ejecting head 2, 2 ′ includes a plurality of ejection grooves, and ejects liquid droplets from nozzles communicating with the ejection grooves. The liquid ejecting heads 2 and 2 ′ are the same as those described in the fifth embodiment.

液体噴射装置30は、紙等の被記録媒体44を主走査方向に搬送する一対の搬送手段41、42と、被記録媒体44に液体を吐出する液体噴射ヘッド2、2’と、液体噴射ヘッド2、2’を載置するキャリッジユニット43と、液体タンク34、34’に貯留した液体を流路部35、35’に押圧して供給する液体ポンプ33、33’と、液体噴射ヘッド2、2’を主走査方向と直交する副走査方向に走査する移動機構40を備えている。図示しない制御部は液体噴射ヘッド2、2’、移動機構40、搬送手段41、42を制御して駆動する。   The liquid ejecting apparatus 30 includes a pair of conveying units 41 and 42 that convey a recording medium 44 such as paper in the main scanning direction, liquid ejecting heads 2 and 2 ′ that eject liquid onto the recording medium 44, and a liquid ejecting head. 2, 2 ′, a carriage unit 43, liquid pumps 33, 33 ′ for supplying the liquid stored in the liquid tanks 34, 34 ′ to the flow path sections 35, 35 ′, and the liquid ejecting head 2, A moving mechanism 40 that scans 2 ′ in the sub-scanning direction orthogonal to the main scanning direction is provided. A control unit (not shown) controls and drives the liquid ejecting heads 2, 2 ′, the moving mechanism 40, and the conveying means 41, 42.

一対の搬送手段41、42は副走査方向に延び、ローラ面を接触しながら回転するグリッドローラとピンチローラを備えている。図示しないモータによりグリッドローラとピンチローラを軸周りに移転させてローラ間に挟み込んだ被記録媒体44を主走査方向に搬送する。移動機構40は、副走査方向に延びた一対のガイドレール36、37と、一対のガイドレール36、37に沿って摺動可能なキャリッジユニット43と、キャリッジユニット43を連結し副走査方向に移動させる無端ベルト38と、この無端ベルト38を図示しないプーリを介して周回させるモータ39を備えている。   The pair of conveying means 41 and 42 includes a grid roller and a pinch roller that extend in the sub-scanning direction and rotate while contacting the roller surface. A grid roller and a pinch roller are moved around the axis by a motor (not shown), and the recording medium 44 sandwiched between the rollers is conveyed in the main scanning direction. The moving mechanism 40 couples a pair of guide rails 36 and 37 extending in the sub-scanning direction, a carriage unit 43 slidable along the pair of guide rails 36 and 37, and the carriage unit 43 to move in the sub-scanning direction. An endless belt 38 is provided, and a motor 39 that rotates the endless belt 38 via a pulley (not shown) is provided.

キャリッジユニット43は、複数の液体噴射ヘッド2、2’を載置し、例えばイエロー、マゼンタ、シアン、ブラックの4種類の液滴を吐出する。液体タンク34、34’は対応する色の液体を貯留し、液体ポンプ33、33’、流路部35、35’を介して液体噴射ヘッド2、2’に供給する。各液体噴射ヘッド2、2’は駆動信号に応じて各色の液滴を吐出する。液体噴射ヘッド20、20’から液体を吐出させるタイミング、キャリッジユニット43を駆動するモータ39の回転及び被記録媒体44の搬送速度を制御することにより、被記録媒体44上に任意のパターンを記録することできる。   The carriage unit 43 mounts a plurality of liquid jet heads 2, 2 ′, and discharges four types of liquid droplets, for example, yellow, magenta, cyan, and black. The liquid tanks 34 and 34 'store liquids of corresponding colors and supply them to the liquid jet heads 2 and 2' via the liquid pumps 33 and 33 'and the flow path portions 35 and 35'. Each liquid ejecting head 2, 2 ′ ejects droplets of each color according to the drive signal. An arbitrary pattern is recorded on the recording medium 44 by controlling the timing of ejecting the liquid from the liquid ejecting heads 20 and 20 ′, the rotation of the motor 39 that drives the carriage unit 43, and the conveyance speed of the recording medium 44. I can.

本発明の液体噴射装置30によれば、液体噴射ヘッド2を構成する基体3とフレキシブル基板4との間の電気的接続状態を液体噴射装置30側で検出できるので早期に接続不良を発見することができ、無駄なクリーニングをする必要がないのでインクを無駄に消費することがなく交換の目安にできるメリットがある。   According to the liquid ejecting apparatus 30 of the present invention, since the electrical connection state between the base 3 constituting the liquid ejecting head 2 and the flexible substrate 4 can be detected on the liquid ejecting apparatus 30 side, a connection failure is discovered early. Since there is no need to perform unnecessary cleaning, there is a merit that ink can be used without wasteful consumption and can be used as a guide for replacement.

1 回路部材
2 液体噴射ヘッド
3 基体
4 フレキシブル基板
5 異方性導電材料
6 電極
7 電極端子
8 配線
9 配線端子
10 付加配線
12 貫通電極
S 接続点
H 検査用配線
M 溝
F1 第一面、F2 第二面
DESCRIPTION OF SYMBOLS 1 Circuit member 2 Liquid ejecting head 3 Base | substrate 4 Flexible board 5 Anisotropic conductive material 6 Electrode 7 Electrode terminal 8 Wiring 9 Wiring terminal 10 Additional wiring 12 Through electrode S Connection point H Inspection wiring M Groove F1 1st surface, F2 1st Dihedral

Claims (14)

列状に配列するn(nは2以上の整数)本の電極と、各前記電極の近傍に設置される検査用のn個の電極端子とを表面に有する基体と、
列状に配列するn本の配線と、各前記配線の近傍に設置される検査用のn個の配線端子とを第一面に有するフレキシブル基板と、を備え、
n個の前記電極端子とn個の前記配線端子がそれぞれ接合して接続されるn個の接続点を並び順に数えてk(kは1以上、(n−1)以下の整数)番目の接続点を第k接続点として、第k接続点と第(k+1)接続点とを電気的に接続する第k検査用配線が前記基体又は前記フレキシブル基板のいずれか一方または両方に形成されている回路部材。
A substrate having n electrodes (n is an integer of 2 or more) arranged in a row and n electrode terminals for inspection installed in the vicinity of each of the electrodes on the surface;
A flexible substrate having n wirings arranged in a row and n wiring terminals for inspection installed in the vicinity of each of the wirings on the first surface;
The k connection (k is an integer of 1 or more and (n-1) or less) in the order of n connection points where the n electrode terminals and the n wiring terminals are joined and connected. A circuit in which a k-th inspection wiring for electrically connecting the k-th connection point and the (k + 1) -th connection point is formed on one or both of the base and the flexible substrate, with the point being the k-th connection point. Element.
前記基体及び前記フレキシブル基板のうちの一方にkが偶数の前記第k検査用配線が形成され、他方にkが奇数の前記第k検査用配線が形成される請求項1に記載の回路部材。   The circuit member according to claim 1, wherein the k-th inspection wiring with an even number k is formed on one of the base and the flexible substrate, and the k-th inspection wiring with an odd k is formed on the other. 前記基体に形成される前記第k検査用配線は、前記基体の端面に形成される請求項2に記載の回路部材。   The circuit member according to claim 2, wherein the k-th inspection wiring formed on the base is formed on an end surface of the base. 前記基体の表面のk番目の前記電極端子と(k+1)番目の前記電極端子との間に溝が形成され、前記第k検査用配線は前記溝の内表面に形成される請求項2に記載の回路部材。   3. The groove is formed between the kth electrode terminal and the (k + 1) th electrode terminal on the surface of the base, and the kth inspection wiring is formed on the inner surface of the groove. Circuit members. 前記電極端子は少なくともその一部が単一の前記電極により囲まれている請求項2〜4のいずれか一項に記載の回路部材。   The circuit member according to any one of claims 2 to 4, wherein at least a part of the electrode terminal is surrounded by the single electrode. 前記フレキシブル基板の前記第k検査用配線は前記第一面とは反対側の第二面に設置され、前記第k接続点及び前記第(k+1)接続点に接続する前記配線端子と前記第k検査用配線とは前記フレキシブル基板を貫通する貫通電極を介して電気的に接続される請求項2〜5のいずれか一項に記載の回路部材。   The k-th inspection wiring of the flexible substrate is installed on a second surface opposite to the first surface, and the wiring terminal connected to the k-th connection point and the (k + 1) -th connection point and the k-th connection point. The circuit member according to claim 2, wherein the circuit member is electrically connected to the inspection wiring through a through electrode penetrating the flexible substrate. 前記第二面には前記基板に設置される前記第(k+1)検査用配線を跨ぐ付加配線が設置され、前記付加配線は前記フレキシブル基板を貫通する貫通電極を介して前記配線に接続される請求項6に記載の回路部材。   An additional wiring straddling the (k + 1) -th inspection wiring disposed on the substrate is disposed on the second surface, and the additional wiring is connected to the wiring via a through electrode penetrating the flexible substrate. Item 7. The circuit member according to Item 6. 各前記配線端子は、互いに分離する第一配線端子と第二配線端子を有し、
前記第k接続点は、k番目の前記電極端子とk番目の前記第一配線端子とを電気的に接続する第k1接続点と、k番目の前記電極端子とk番目の前記第二配線端子とを電気的に接続する第k2接続点とを有し、
kが奇数の前記第k検査用配線は、前記第k1接続点と第(k+1)1接続点とを電気的に接続し、kが偶数の前記第k検査用配線は、前記第k2接続点と第(k+1)2接続点とを電気的に接続する請求項1に記載の回路部材。
Each of the wiring terminals has a first wiring terminal and a second wiring terminal that are separated from each other,
The k-th connection point is a k-th connection point that electrically connects the k-th electrode terminal and the k-th first wiring terminal, and the k-th electrode terminal and the k-th second wiring terminal. And k2 connection point for electrically connecting
The k-th inspection wiring having an odd k electrically connects the k1 connection point and the (k + 1) 1 connection point, and the k-th inspection wiring having an even k is the k2 connection point. The circuit member according to claim 1, wherein the first and second (k + 1) second connection points are electrically connected.
前記第k検査用配線は前記フレキシブル基板に形成される請求項8に記載の回路部材。   The circuit member according to claim 8, wherein the k-th inspection wiring is formed on the flexible substrate. 前記第k検査用配線は、前記第一面とは反対側の第二面に設置され、
k番目及び(k+1)番目の前記配線端子と前記第k検査用配線とは前記フレキシブル基板を貫通する貫通電極を介して電気的に接続される請求項8又は9に記載の回路部材。
The k-th inspection wiring is installed on the second surface opposite to the first surface,
10. The circuit member according to claim 8, wherein the k-th and (k + 1) -th wiring terminals and the k-th inspection wiring are electrically connected through a through electrode penetrating the flexible substrate.
前記電極端子は少なくともその一部が単一の前記電極により囲まれている請求項8〜10のいずれか一項に記載の回路部材。   The circuit member according to claim 8, wherein at least a part of the electrode terminal is surrounded by the single electrode. 前記基体と前記フレキシブル基板とは、n本の前記電極とn本の前記配線、及び、n個の前記電極端子とn個の前記配線端子とがそれぞれ異方性導電材料を介在させて対面して接合される請求項1〜11のいずれか一項に記載の回路部材。   The base and the flexible substrate face each other with n electrodes, n wires, and n electrode terminals and n wire terminals with an anisotropic conductive material interposed therebetween. The circuit member according to claim 1, wherein the circuit members are joined together. 請求項1に記載の回路部材を備え、
前記フレキシブル基板は駆動回路により生成された駆動信号をn個の前記配線を介してn個の前記電極に供給し、
前記基体は液体吐出用の圧力室を備え、n個の前記電極を介して前記圧力室に前記駆動信号が供給される液体噴射ヘッド。
A circuit member according to claim 1,
The flexible substrate supplies a drive signal generated by a drive circuit to the n electrodes via the n wires,
The liquid ejecting head, wherein the base includes a pressure chamber for discharging liquid, and the driving signal is supplied to the pressure chamber via the n electrodes.
請求項13に記載の液体噴射ヘッドと、
前記液体噴射ヘッドを往復移動させる移動機構と、
前記液体噴射ヘッドに液体を供給する液体供給管と、
前記液体供給管に前記液体を供給する液体タンクと、を備える液体噴射装置。
A liquid ejecting head according to claim 13;
A moving mechanism for reciprocating the liquid jet head;
A liquid supply pipe for supplying a liquid to the liquid ejecting head;
And a liquid tank that supplies the liquid to the liquid supply pipe.
JP2011270987A 2011-12-12 2011-12-12 Circuit member, head and device for ejecting liquid Pending JP2013121694A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017087599A (en) * 2015-11-12 2017-05-25 キヤノン株式会社 Liquid discharge head, liquid discharge device and inspection method
JP2018103613A (en) * 2016-12-22 2018-07-05 セイコーエプソン株式会社 Head unit, liquid discharge device, and manufacturing method for head unit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017087599A (en) * 2015-11-12 2017-05-25 キヤノン株式会社 Liquid discharge head, liquid discharge device and inspection method
JP2018103613A (en) * 2016-12-22 2018-07-05 セイコーエプソン株式会社 Head unit, liquid discharge device, and manufacturing method for head unit
JP7006100B2 (en) 2016-12-22 2022-01-24 セイコーエプソン株式会社 Manufacturing method of head unit, liquid discharge device and head unit

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