JP2013105514A - Semiconductor memory, method for operating semiconductor memory, system, and method for manufacturing semiconductor memory - Google Patents

Abstract

PROBLEM TO BE SOLVED: To efficiently perform access to a semiconductor memory using a small number of command terminals.SOLUTION: A semiconductor memory MEM includes: a plurality of first selection sections SEL0 and SEL1 one of which is selected in response to a selection signal and is operated, and which receive a plurality of first command signals supplied to each of a plurality of first command terminals CMD0 and CMD1, and output the received first command signals; a plurality of holding sections HLD0, HLD1 and HLD2 which are connected to output of the first selection section and are more than the number of the first command terminals, at least one of which is connected commonly to the plurality of the first selection sections, and which hold the first command signal output from one of the first selection sections in response to a first synchronizing signal SYNC1 and output the held first command signal as a second command signal; an operation control section OPC for outputting an operation control signal CNT in response to the second command signal in response to a second synchronizing signal SYNC2 having a generating frequency lower than that of the first synchronizing signal; and a memory cell MC to be accessed in response to the operation control signal.

Description

  The present invention relates to a semiconductor memory and a system in which the semiconductor memory is mounted.

  Semiconductor memories tend to increase the number of terminals as the memory capacity increases. A semiconductor memory in which the number of terminals is reduced by supplying command signals and address signals using data terminals has been proposed (for example, see Patent Document 1). In addition, a semiconductor memory has been proposed in which the number of terminals is reduced by supplying command signals and address signals in a plurality of times in a time division manner (see, for example, Patent Document 2). Furthermore, in order to increase the bandwidth of the CPU that accesses the semiconductor memory, the operation command supply procedure necessary for the access operation is stored in advance corresponding to the macro instruction, and stored in response to the macro instruction. There has been proposed a semiconductor memory that sequentially executes operation commands in accordance with certain procedures (for example, see Patent Document 3).

Japanese Patent Laid-Open No. 10-74387 JP 2002-245778 A Japanese Patent Laid-Open No. 10-161868

  In general, the contents of operation commands such as a write command and a read command are identified by a logical combination of a plurality of bits of command signals. When the write operation and the read operation are executed alternately, the write command and the read command can be generated, for example, by repeatedly inverting the logic of one command signal. However, in the conventional semiconductor memory, the command signal is supplied to the semiconductor memory as a set for each operation command without considering the operation command previously supplied to the semiconductor memory. For this reason, in the semiconductor memory in which the number of command terminals is reduced, the supply efficiency of the operation command is lowered and the access efficiency of the semiconductor memory is lowered.

  An object of the present invention is to efficiently access a semiconductor memory using a small number of command terminals.

  In one embodiment of the present invention, the semiconductor memory is operated in response to a selection signal, receives a plurality of first command signals supplied to the plurality of first command terminals, and receives the received first command signal. Are connected to the outputs of the first selection unit, more than the number of the first command terminals, and at least one is commonly connected to a plurality of the first selection unit, A first command signal output from one is held in response to the first synchronization signal, a plurality of holding units that output the second command signal, and an operation control signal corresponding to the second command signal It has an operation control unit that outputs in response to a second synchronization signal that is generated less frequently than the synchronization signal, and a memory cell that is accessed according to the operation control signal.

  The semiconductor memory can be efficiently accessed using a small number of command terminals.

1 illustrates an example of a semiconductor memory in one embodiment. The example of the semiconductor memory in another embodiment is shown. The example of the semiconductor memory in another embodiment is shown. 4 illustrates an example of the clock control unit and the command control unit illustrated in FIG. 3. An example of the command input unit shown in FIG. 3 is shown. 6 shows an example of the latch circuit shown in FIG. 6 shows an example of command signal assignment by the command input unit shown in FIG. 4 shows an example of the command decoder shown in FIG. 9 shows an example of operation specifications of the command decoder shown in FIG. 4 shows an example of command transition of the semiconductor memory shown in FIG. 4 shows an example of a system in which the semiconductor memory shown in FIG. 3 is mounted. 4 shows an example of the operation of the semiconductor memory shown in FIG. The example of the semiconductor memory in another embodiment is shown. 14 illustrates an example of the clock control unit illustrated in FIG. 13. 14 illustrates an example of the command input unit illustrated in FIG. 14 illustrates an example of the address input unit illustrated in FIG. 14 illustrates an example of a data signal input circuit in the data input / output unit illustrated in FIG. 13. 14 illustrates an example of a data signal output circuit in the data input / output unit illustrated in FIG. 13. 14 shows an example of a system in which the semiconductor memory shown in FIG. 13 is mounted. 20 shows an example of the address command control unit shown in FIG. An example of the data control unit shown in FIG. 19 is shown. 14 shows an example of timing specifications necessary for command transition of the semiconductor memory shown in FIG. 14 shows an example of operation during the normal operation mode of the semiconductor memory shown in FIG. 14 shows another example of the operation during the normal operation mode of the semiconductor memory shown in FIG. 14 shows an example of a test system for testing the semiconductor memory shown in FIG. 14 shows an example of operation during the test mode of the semiconductor memory shown in FIG. The timing from the last write command shown in FIG. 26 to the precharge command is shown. 14 shows another example of the operation of the semiconductor memory shown in FIG. 13 during the test mode.

  Hereinafter, embodiments will be described with reference to the drawings. In the figure, the signal lines indicated by bold lines are composed of a plurality of lines. A part of the block to which the thick line is connected is composed of a plurality of circuits. The same reference numerals as the signal names are used for signal lines through which signals are transmitted. A signal with “Z” at the end indicates positive logic. A signal preceded by “/” indicates negative logic. Double square marks in the figure indicate external terminals. The external terminal is, for example, a pad on a semiconductor chip, a lead of a package in which the semiconductor chip is accommodated, or an external terminal of a semiconductor macro. For the signal supplied via the external terminal, the same symbol as the terminal name is used.

  FIG. 1 shows an example of a semiconductor memory MEM in one embodiment. For example, the semiconductor memory MEM is a DRAM (Dynamic Random Access Memory). FIG. 1 shows the minimum elements necessary to practice the invention. The semiconductor memory MEM includes selection units SEL0 and SEL1, holding units HLD0, HLD1, and HLD2, an operation control unit OPC, and memory cells MC. The selection units SEL0 and SEL1 are examples of the first selection unit.

  The selection unit SEL0 operates when the selection signal ISEL0 is at a valid level, and outputs command signals supplied to the command terminals CMD0 and CMD1 to the command signal lines CMDL0 and CMDL1, respectively. The selection unit SEL0 stops outputting the command signal when the selection signal ISEL0 is at an invalid level. The selection unit SEL1 operates when the selection signal ISEL1 is at a valid level, and outputs command signals supplied to the command terminals CMD0 and CMD1 to the command signal lines CMDL2 and CMDL1, respectively. The selection unit SEL1 stops outputting the command signal when the selection signal ISEL1 is at an invalid level. Note that the selection signals ISEL0 and ISEL1 are not set to valid levels at the same time.

  The holding units HLD0 to HLD2 hold the command signals output from the selection units SEL0 and SEL1 to the command signal lines CMDL0 to CMDL2, respectively, in response to the synchronization signal SYNC1, and output them as command signals ICMD0, ICMD1, and ICMD2. For example, the synchronization signal SYNC1 is a clock signal. Thus, the semiconductor memory MEM receives the command signals ICMD0 and ICMD1 at the command terminal CMD0, and receives the command signals ICMD1 and ICMD2 at the command terminal CMD1.

  The number of holding units HLD0 to HLD2 is larger than the number of command terminals CMD0 to CMD1, and the input of the holding unit HLD1 is commonly connected to the outputs of the selection units SEL0 and SEL1. Thereby, for example, the command signal CMD1 received at the command terminal CMD1 can be held in the holding unit HLD1 via either the selection unit SEL0 or SEL1.

  The operation control unit OPC outputs an operation control signal CNT corresponding to the command signals ICMD0 to ICMD2 held in the holding units HLD0 to HLD2 in response to the synchronization signal SYNC2. The memory cell MC is accessed according to the operation control signal CNT. For example, data is written to the memory cell MC or data is read from the memory cell MC in accordance with the operation control signal CNT.

  The synchronization signal SYNC2 is generated less frequently than the synchronization signal SYNC1. For example, the synchronization signal SYNC2 is a dedicated clock signal indicating the timing for operating the operation control unit OPC. The synchronization signal SYNC2 may be generated inside the semiconductor memory MEM in synchronization with the synchronization signal SYNC1 of an operation enable signal supplied via an external terminal for operating the operation control unit OPC. Alternatively, the synchronization signal SYNC2 is generated inside the semiconductor memory MEM in synchronization with the synchronization signal SYNC1 during the inactivation period of the mask signal supplied via the external terminal to prohibit the operation of the operation control unit OPC. May be. In these cases, only when operating the operation control unit OPC, the synchronization signal SYNC1 is supplied to the operation control unit OPC as the synchronization signal SYNC2.

  For example, the command signal ICMD1 whose logic level is frequently changed among the command signals ICMD0 to ICMD2 is transmitted to the holding unit HLD1 via the plurality of selectors SEL0 and SEL1. As a result, regardless of which of the selection signals ISEL0 and ISEL1 is set to an effective level, the logic of the command signal ICMD1 whose logic level is frequently changed can be held in the holding unit HLD1.

  Therefore, the command signals ICMD0 to ICMD2 necessary for accessing the memory cells MC can be aligned with the holding units HLD0 to HLD2 with the minimum number of cycles of the synchronization signal SYNC1. In other words, a minimum command signal for changing the logic held in the holding units HLD0 to HLD2 may be supplied to the semiconductor memory MEM. As a result, the synchronization signal SYNC2 for operating the operation control unit OPC can be generated with high frequency, and the memory cells MC can be accessed efficiently using a small number of command terminals CMD0 to CMD1. Furthermore, a semiconductor memory MEM with a small number of external terminals can be formed. On the other hand, when all command signals necessary for accessing the memory cell MC are supplied to the semiconductor memory MEM as a set, the command signals are sent to the command terminals CMD0 to CMD1 for each access in order to set the holding units HLD0 to HLD2. Needs to be supplied twice.

  FIG. 2 shows an example of a semiconductor memory MEM in another embodiment. The same elements as those described in the above-described embodiment are denoted by the same reference numerals, and detailed description thereof will be omitted. The semiconductor memory MEM has a selection unit USEL added to the semiconductor memory MEM illustrated in FIG. The selection unit USEL is an example of a second selection unit. The semiconductor memory MEM has a command terminal CMD2 that receives the command signal CMD2 and a test terminal TEN that receives the test signal TEN. Other configurations are the same as those of the semiconductor memory MEM shown in FIG. FIG. 2 also shows the minimum elements necessary for carrying out the invention.

  The selection unit USEL operates when the test signal TEN is at an invalid level, and outputs the command signals respectively supplied to the command terminals CMD0, CMD1, and CMD2 to the holding units HLD0 to HLD2 via the command signal lines CMDL0 to CMDL2. . The selection unit USEL stops outputting the command signals CMD0 to CMD2 when the test signal TEN is at a valid level. The number of command terminals CMD0 to CMD2 is equal to the number of holding units HLD0 to HLD2. Therefore, the selection unit USEL can supply the command signals supplied as a set to the holding units HLD0 to HLD2 at a time.

  For example, the test signal TEN is set to an effective level during a test mode for testing the semiconductor memory MEM, and is set to an invalid level during a normal mode in which the semiconductor memory MEM is accessed by the user system. One of the selection signals ISEL0 and ISEL1 is set to a valid level according to the type of the command signals CMD0 and CMD1 during the test mode, and is set to an invalid level during the normal mode. For example, the selection signals ISEL0 and ISEL1 are output from a test device or the like that tests the semiconductor memory MEM.

  The command signals CMD0 and CMD1 are supplied to the semiconductor memory MEM during the test mode and the normal mode, and the command signal CMD2 is supplied to the semiconductor memory MEM only during the normal mode. That is, in this embodiment, the semiconductor memory MEM is accessed using the command terminals CMD0 to CMD2 during the normal mode. The synchronization signal SYNC2 is generated less frequently than the synchronization signal SYNC1 during the test mode, and is generated in response to the synchronization signal SYNC1 during the normal mode. Thereby, the interface of the semiconductor memory MEM in the normal mode can be made the same as the interface of the existing semiconductor memory. The semiconductor memory MEM is accessed using the command terminals CMD0 and CMD1 during the test mode. As a result, the number of command terminals required for testing the semiconductor memory MEM can be reduced, and the memory cells MC can be efficiently accessed and tested using a small number of command terminals.

  As described above, also in this embodiment, the same effect as that of the above-described embodiment can be obtained. Furthermore, when testing the semiconductor memory MEM, the memory cells MC can be efficiently accessed using a small number of command terminals CMD0 to CMD1. Further, during the normal mode, the semiconductor memory MEM can be accessed using the existing interface.

  FIG. 3 shows an example of a semiconductor memory MEM in another embodiment. The same elements as those described in the above-described embodiment are denoted by the same reference numerals, and detailed description thereof will be omitted. For example, the semiconductor memory MEM is an SDRAM (Synchronous Dynamic Random Access Memory) that operates in synchronization with the clock signal CLK.

  The semiconductor memory MEM has a data input / output unit 10, an address input unit 12, a command input unit 14, a command control unit 16, a clock control unit 18, and a memory core 100. The memory core 100 includes an address selection unit 20, a mode register 22, a command decoder 24, a row address control unit 26, a row timing control unit 28, a column timing control unit 30, a column address control unit 32, a row control unit 34, and a column control unit. 36, a data control unit 38, a column switch unit 40, a sense amplifier unit 42, and a memory cell array 44.

  The memory core 100 corresponds to an SDRAM bank. In this embodiment, in order to simplify the description, an example in which the semiconductor memory MEM has one memory core 100 is shown. When a plurality of memory cores 100 (banks) are formed in the semiconductor memory MEM, the semiconductor memory MEM receives a bank address signal for selecting the memory core 100 to be accessed.

  During a write operation, data input / output unit 10 receives a data signal received at data terminal DQ in synchronization with write control signal WRZ, and outputs the received data signal to data bus DBZ. Data input / output unit 10 outputs a data signal received from data bus DBZ to data terminal DQ in synchronization with read control signal RDZ during a read operation. For example, the data terminal DQ is 16 bits (DQ15-DQ0).

  The address input unit 12 outputs an address signal received at the address terminal AD as an address signal ARZ. The semiconductor memory MEM employs an address multiplex type that receives the row address signal and the column address signal supplied to the address terminal AD in a time-sharing manner. For example, the address terminal AD is 12 bits (AD11-AD0), the row address signal is supplied to the semiconductor memory MEM using all the address terminals AD, and the column address signal is sent to the lower 8-bit address terminal AD. Used to be supplied to the semiconductor memory MEM.

  The command input unit 14 determines the type of command signal received at the command terminal CMD (CMD0, CMD1) according to the value of the selection signal ISEL, and two command signals CSRZ, RASRZ, CASRZ, WERZ according to the determination result. Is output. Here, the command signal CSRZ is a chip select signal, the command signal RASRZ is a row address strobe signal, the command signal CASRZ is a column address strobe signal, and the command signal WERZ is a write enable signal. An example of the command input unit 14 is shown in FIG.

  The command control unit 16 outputs the clock signal CLKIZ as the clock signal CLKPZ when the command mask signal CMIZ is inactivated to the low level. The command control unit 16 stops the output of the clock signal CLKPZ when the command mask signal CMIZ is activated to a high level. The clock signal CLKIZ is an example of a first synchronization signal, and the clock signal CLKPZ is an example of a second synchronization signal. An example of the command control unit 16 is shown in FIG.

  The clock controller 18 outputs the clock signal CLK as the clock signal CLKIZ when receiving the high level clock enable signal CKE, and outputs the clock signal CLKIZ when receiving the low level clock enable signal CKE. Stop. The semiconductor memory MEM may always generate the clock signal CLKIZ synchronized with the clock signal CLK without receiving the clock enable signal CKE. The clock control unit 18 outputs the command mask signal CM as the command mask signal CMIZ. An example of the clock control unit 18 is shown in FIG.

  The address selection unit 20 outputs the address signal ARZ as the row address signal RA when the command decoded by the command decoder 24 indicates an active command. The address selection unit 20 outputs the address signal ARZ as the column address signal CA when the command decoded by the command decoder 24 indicates a write command or a read command. The address selector 20 outputs the address signal ARZ as the mode setting signal MA when the command decoded by the command decoder 24 indicates a mode register setting command.

  The mode register 22 receives the mode setting signal MA in synchronization with the operation control signal MRSPZ, and sets the value of the built-in register according to the logic of the mode setting signal MA. For example, a burst length or the like is set in the mode register 22. The burst length indicates the number of data signals output from the data terminal DQ in response to one read command or the number of data signals input to the data terminal DQ in response to one write command. The operation control signal MRSPZ is output from the command decoder 24 when the command decoded by the command decoder 24 is a mode register setting command.

  The command decoder 24 decodes the command signals CSRZ, RASRZ, CASRZ, and WERZ from the command input unit 14, and clocks any one of the operation control signals MRSPZ, BSTPZ, ACTPZ, PREPZ, REFPZ, RDPZ, and WRPZ according to the decoding result. Output in synchronization with the signal CLKPZ. The operation control signal MRSPZ is generated when a mode register setting command is recognized. The operation control signal BSTPZ is generated when a burst stop command for stopping the burst operation is recognized. The operation control signal ACTPZ is generated when an active command for activating one of the word lines WL and executing an active operation for operating the sense amplifier is recognized. The operation control signal PREPZ is generated when a precharge command for executing a precharge operation for deactivating the activated memory cell array 44 is recognized. The operation control signal REFPZ is generated when a refresh command for executing a refresh operation is recognized. The operation control signal RDPZ is generated when a read command for executing a read operation is recognized. The operation control signal WRPZ is generated when a write command for executing a write operation is recognized. An example of the command decoder 24 is shown in FIG.

  The row address control unit 26 predecodes the row address signal RA to generate a predecode signal PRA, and outputs the generated predecode signal PRA to the row control unit 34. The row timing control unit 28 outputs a timing signal for executing the active operation to the row control unit 34 in response to the operation control signal ACTPZ. The row timing control unit 28 outputs a timing signal for executing the precharge operation to the row control unit 34 in response to the operation control signal PREPZ. The row timing control unit 28 outputs a timing signal for executing a refresh operation to the row control unit 34 in response to the operation control signal REFPZ.

  The column timing control unit 30 outputs a timing signal RDZ for executing a read operation to the data control unit 38 and the data input / output unit 10 in response to the operation control signal RDPZ. The column timing control unit 30 outputs a timing signal WRZ for executing a write operation to the data control unit 38 and the data input / output unit 10 in response to the operation control signal WRPZ. The column timing control unit 30 outputs a timing signal CLPZ for operating the column control unit 36 in response to the operation control signals RDPZ and WRPZ. For example, the column timing control unit 30 outputs a timing signal RDZ, WRZ or CLPZ having a number of pulses corresponding to the burst length. In the following, in order to make the invention easy to understand, a case where the burst length is “1” will be described.

  Column address control unit 32 predecodes column address signal CA to generate predecode signal PCA, and outputs the generated predecode signal PCA to column control unit 36. Column control unit 36 activates one of column selection signals CLZ indicated by the value of predecode signal PCA in synchronization with timing signal CLPZ from column timing control unit 30.

  The row control unit 34 activates one of the word lines WL indicated by the value of the predecode signal PRA in synchronization with one of the timing signals from the row timing control unit 28. The row control unit 34 outputs the sense amplifier activation signal SAE in synchronization with another one of the timing signals from the row timing control unit 28. Further, the row control unit 34 outputs a control signal for stopping the precharge of the bit lines BL and / BL in synchronization with another one of the timing signals from the row timing control unit 28.

  During a write operation, the data control unit 38 receives a write data signal supplied to the data bus DBZ in response to the timing signal WRZ, and outputs the received write data signal to the column switch unit 40 via the data bus DB. During the read operation, the data control unit 38 outputs a read data signal output from the memory cell array 44 via the data bus DB to the data bus DBZ in synchronization with the timing signal RDZ. The bus width of the data bus DB is larger than the bus width of the data bus DBZ. For example, when the maximum burst length is “8”, the bus width of the data bus DB is set to at least 8 times the bus width of the data bus DBZ.

  The timing signal WRZ supplied to the data control unit 38 is a signal obtained by delaying the timing signal WRZ supplied to the data input / output unit 10 by a predetermined time. The timing signal RDZ supplied to the data input / output unit 10 is a signal obtained by delaying the timing signal RDZ supplied to the data control unit 38 by a predetermined time. Thus, the write data signal can be transmitted in order from the data terminal DQ to the memory cell array 44, and the read data signal can be transmitted in order from the memory cell array 44 to the data terminal DQ.

  The column switch unit 40 includes a plurality of column switches that connect the data control unit 38 to either of the bit line pairs BL and / BL. A predetermined number of column switches are turned on for each column selection signal CLZ activated in accordance with the column address signal CA. The sense amplifier unit 42 has a plurality of sense amplifiers connected to the bit line pairs BL and / BL, respectively. Each sense amplifier is activated in synchronization with the sense amplifier activation signal SAE, and amplifies the voltage difference between the bit line pair BL and / BL.

  The memory cell array 44 includes a plurality of dynamic memory cells MC arranged in a matrix, a plurality of word lines WL connected to a column of the dynamic memory cells MC arranged in the horizontal direction in the figure, and a dynamic memory arranged in the vertical direction in the figure. A plurality of bit line pairs BL, / BL connected to the column of cells MC are provided. The dynamic memory cell MC has a capacitor for holding data as a charge, and a transfer transistor for connecting one end of the capacitor to the bit line BL (or / BL). The other end of the capacitor is connected to a reference voltage line. The reference voltage supplied to the reference voltage line is, for example, the same as the precharge voltage of the bit lines BL and / BL.

  FIG. 4 shows an example of the clock control unit 18 and the command control unit 16 shown in FIG. The clock control unit 18 has two input buffers IBUF and one input buffer IBUF2. The input buffer IBUF that receives the clock enable signal CKE outputs the clock enable signal CKE as the clock enable signal CKEIZ. The input buffer IBUF that receives the command mask signal CM outputs the command mask signal CM as the command mask signal CMIZ.

  The input buffer IBUF2 operates during a period in which the clock enable signal CKEIZ is activated to a high level, and outputs the clock signal CLK as the clock signal CLKIZ. The input buffer IBUF2 sets the clock signal CLKIZ to the low level while the clock enable signal CKEIZ is inactivated to the low level. The clock control unit 18 is an example of a first signal generation unit that generates the clock signal CLKIZ in synchronization with the clock signal CLK. The command control unit 16 includes timing change units TC1 and TC2, and an AND circuit AND that outputs the clock signal CLKIZ as the clock signal CLKPZ during the low level period of the command mask signal CMIZ.

  In this embodiment, the operation of the command decoder 24 can be controlled from outside the semiconductor memory MEM by generating or stopping the clock signal CLKPZ according to the logic of the command mask signal CM supplied from outside the semiconductor memory MEM. . In other words, the command decoder 24 can be operated from the outside of the semiconductor memory MEM when command signals are arranged in the latch unit LTU shown in FIG. As a result, when a part of the plurality of command signals necessary for recognizing the operation command is supplied to the semiconductor memory MEM, the command decoder 24 can be operated at the timing when the command signals are arranged in the latch unit LTU. . That is, even when command signals are not supplied to the semiconductor memory MEM as a set for each operation command, the semiconductor memory MEM can be accessed efficiently. Further, by generating the clock signal CLKPZ in synchronization with the clock signal CLKIZ, a conventional command decoder that operates in synchronization with the clock signal CLK can be used.

  The timing changing unit TC1 has a function of delaying the rising edge of the clock signal CLKIZ. As a result, a signal obtained by delaying the rising edge of the clock signal CLKIZ is output to the command decoder 24 as the clock signal CLKPZ.

  The timing changing unit TC2 has a function of delaying the falling edge of the command mask signal CMIZ. Thereby, it is possible to prevent the erroneous pulse of the clock signal CLKPZ from occurring when the falling edge of the command mask signal CMIZ appears earlier than the falling edge of the clock signal CLKIZ. The command control unit 16 generates the clock signal CLKPZ in synchronization with the clock signal CLKIZ when the command mask signal CM is at the invalid level, and stops generating the clock signal CLKPZ when the command mask signal CM is at the valid level. It is an example of a signal generation part.

  FIG. 5 shows an example of the command input unit 14 shown in FIG. The command input unit 14 includes five input buffers IBUF, a selector SEL (SEL0, SEL1, SEL2), and a latch unit LTU. The selector SEL is an example of a first selection unit.

  The five input buffers IBUF receive selection signals ISEL0-ISEL2 and command signals CMD0-CMD1, respectively, and output them as selection signals SELTZ (SELT0Z, SELT1Z, SELT2Z) and command signals CMDZ (CMD0Z, CMD1Z).

  Each selector SEL0-SEL2 has a pair of tri-state buffers TBUF that receive the command signals CMD0Z and CMD1Z, respectively. The tristate buffer TBUF of the selector SEL0 outputs the command signals CMD0Z and CMD1Z as the command signals RASZ and CASSZ, respectively, when the selection signal SELT0Z is at a high level. The tristate buffer TBUF of the selector SEL0 sets the output to a high impedance state when the selection signal SELT0Z is at a low level.

  The tristate buffer TBUF of the selector SEL1 outputs the command signals CMD0Z and CMD1Z as the command signals WESZ and CASSZ, respectively, when the selection signal SELT1Z is at a high level. The tristate buffer TBUF of the selector SEL1 sets the output to a high impedance state when the selection signal SELT1Z is at a low level. The tristate buffer TBUF of the selector SEL2 outputs the command signals CMD0Z and CMD1Z as the command signals WESZ and CSSZ, respectively, when the selection signal SELT2Z is at a high level. The tristate buffer TBUF of the selector SEL2 sets the output to a high impedance state when the selection signal SELT2Z is at a low level.

  Command signals WESZ, RASZ, CASZZ, and CSSZ correspond to the DRAM write enable signal / WE, row address strobe signal / RAS, column address strobe signal / CAS, and chip select signal / CS, respectively. That is, the write enable signal / WE or the row address strobe signal / RAS is supplied to the command terminal CMD0, and the column address strobe signal / CAS or the chip select signal / CS is supplied to the command terminal CMD1. Hereinafter, the chip select signal / CS, the row address strobe signal / RAS, the column address strobe signal / CAS, and the write enable signal / WE are also referred to as command signals / CS, / RAS, / CAS, / WE, respectively.

  Accordingly, the command input unit 14 can receive four types of command signals / CS, / RAS, / CAS, / WE using the two command terminals CMD0 and CMD1. The combination of command signals (/ RAS and / CAS, / WE and / CAS, / WE and / CS) received at the command terminals CMD0 and CMD1 varies depending on the selection signals ISEL0 to ISEL2 to be activated.

  The latch unit LTU has four latch circuits LTC that latch the command signals WESZ, RASSZ, CASSZ, CSSZ in synchronization with the clock signal CLKIZ and output the latched signals as command signals WERZ, RASRZ, CASRZ, CSRZ, respectively. ing. The latch circuit LTC is an example of a holding unit.

  FIG. 6 shows an example of the latch circuit LTC shown in FIG. Since the four latch circuits LTC are the same circuit, the latch LTC receiving the command signal CSSZ will be described here. The latch LTC has a first latch LT1 and a second latch LT2. The first latch LT1 holds the logic of the command signal CSSZ and outputs the held logic to the second latch LT2. The second latch LT2 latches the logic of the command signal CSSZ output from the first latch LT1 in synchronization with the rising edge of the clock signal CLKIZ, and outputs the latched logic as the command signal CSRZ.

  The first latch LT1 can prevent the command signal line CSSZ from entering the floating state even when the TBUF of the selector SEL2 shown in FIG. 5 is turned off and the supply of the command signal CSSZ from the selector SEL2 is stopped. For example, when the selectors SEL0 and SEL1 are sequentially selected, the selector SEL2 cannot output the command signal CSSZ. Also in this case, the logic of the command signal CSSZ previously output from the selector SEL2 can be held by the first latch LT1. As a result, even when the number of latch circuits LTC is larger than the number of command terminals CMD0 to CMD1, the logic of the command signals WESZ, RASZ, CASSZ, CSSZ can be arranged in order in the latch unit LTU to access the memory cell MC.

  FIG. 7 shows an example of command signal allocation by the command input unit 14 shown in FIG. When the selection signal ISEL0 is activated to the high level H and the selection signals ISEL1 and ISEL2 are deactivated to the low level, the selector SEL0 shown in FIG. 5 operates. At this time, the command input unit 14 recognizes the signals respectively supplied to the command terminals CMD0 to CMD1 as the command signals / RAS and / CAS. When the selection signal ISEL1 is activated to the high level H and the selection signals ISEL0 and ISEL2 are activated to the low level, the selector SEL1 shown in FIG. 5 operates. At this time, the command input unit 14 recognizes the signals supplied to the command terminals CMD as the command signals / WE and / CAS. When the selection signal ISEL2 is activated to the high level H and the selection signals ISEL0 and ISEL1 are activated to the low level, the selector SEL2 shown in FIG. 5 operates. At this time, the command input unit 14 recognizes the signals supplied to the command terminals CMD0 to CMD1 as the command signals / WE and / CS, respectively.

  As shown in FIG. 7, the command input unit 14 recognizes the signal supplied to the command terminal CMD1 as the command signal / CAS when the selection signals ISEL0 and ISEL1 are at the high level. The command signal / CAS is a signal that is supplied most frequently to the semiconductor memory MEM, as shown in FIG. In other words, the logic of the command signal / CAS is changed most frequently when the semiconductor memory MEM is operated. By assigning a command signal having a high change frequency to the plurality of selectors ISEL0 and ISEL1, the command signal can be efficiently supplied to the semiconductor memory MEM even when the number of command terminals CMD is small.

  FIG. 8 shows an example of the command decoder 24 shown in FIG. The command decoder 24 includes a decoding unit DEC that outputs operation control signals MRSPZ, REFPZ, PREPZ, ACTPZ, WRPZ, RDPZ, and BSTPZ, respectively, according to the logic of command signals CSRZ, RASRZ, CASRZ, and WERZ. The command decoder 24 is an example of an operation control unit that outputs operation control signals MRSPZ, REFPZ, PREPZ, ACTPZ, WRPZ, RDPZ, BSTPZ in response to a clock signal CLKPZ.

  Each decoding unit DEC has two two-input NAND gates and a three-input NOR gate that receives the output of the two-input NAND gate and the inverted signal of the clock signal CLKPZ. Each decoding unit DEC activates an operation control signal (any one of MRSPZ, REFPZ, PREPZ, ACTPZ, WRPZ, RDPZ, and BSTPZ) to a high level during the high level period of the clock signal CLKPZ according to the decoding result.

  When the command signal CSRZ is at a low level and the command signals RASRZ, CASRZ, and WERZ are at a high level, at each of the decode units DEC, at least one of the two-input NAND gates outputs a high level. Therefore, all three-input NOR gates output a low level, and the semiconductor memory MEM enters an idle state that maintains the state of the previous clock cycle. The command for setting the semiconductor memory MEM to the idle state is referred to as a nop command NOP (No Operation) as shown in FIG.

  The clock signal CLKPZ for operating the command decoder 24 is generated only when the command mask signal CM supplied to the semiconductor memory MEM via the external terminal CM is at a low level. That is, the operation / non-operation of the command decoder 24 can be controlled from the outside of the semiconductor memory MEM by the command mask signal CM regardless of the logic of the command signal CMD and the clock signal CLK. Therefore, the command decoder 24 can be operated in any clock cycle in which commands are arranged in the latch unit LTU shown in FIG. As a result, the semiconductor memory MEM can be operated efficiently, and malfunction of the semiconductor memory MEM can be prevented.

  As described in FIG. 4, the rising edge of the clock signal CLKPZ is later than the rising edge of the clock signal CLKIZ. For this reason, the command decoder 24 reliably uses the clock signal CLKPZ to confirm the command signals CSRZ, RASRZ, CASRZ, and the command signals CSRZ, RASRZ, CASRZ, and WERZ supplied in synchronization with the clock signal CLKIZ. WERZ can be decoded. Therefore, it is possible to prevent a hazard from occurring in the operation control signals MRSPZ, REFPZ, PREPZ, ACTPZ, WRPZ, RDPZ, and BSTPZ, and to prevent the command decoder 24 from malfunctioning.

  The clock signal CLKPZ may be supplied not to the command decoder 24 but to the row timing control unit 28 and the column timing control unit 30 in order to determine an operating clock cycle. In this case, the row timing control unit 28 and the column timing control unit 30 operate as an operation control unit that outputs an operation control signal for accessing the memory cell MC in response to the clock signal CLKPZ.

  FIG. 9 shows an example of operation specifications of the command decoder 24 shown in FIG. The command decoder 24 operates according to the logical values shown in FIG. The function of each command is the same as that of a general SDRAM. As described above, the command signals CSRZ, RASRZ, CASRZ, and WERZ are the chip select signal / CS, the row address strobe signal / RAS, the column address strobe signal / CAS, and the write enable signal / WE supplied to the command terminals CMD0 to CMD1. It is.

  For example, the command decoder 24 recognizes the mode register setting command MRS when the command signals CSRZ, RASRZ, CASRZ, and WERZ are all at the low level L, and activates the operation control signal MRSPZ to the high level in synchronization with the clock signal CLKPZ. . The mode register 22 is set according to the mode register setting command MRS. The command decoder 24 recognizes the refresh command REF when the command signals CSRZ, RASRZ, CASRZ are at the low level L and the command signal WERZ is at the high level H, and activates the operation control signal REFPZ to the high level in synchronization with the clock signal CLKPZ. Turn into. In response to the refresh command REF, the refresh operation of the memory cell MC is executed.

  Similarly, the command decoder 24 recognizes the precharge command PRE, the active command ACT, the write command WR, the read command RD, and the burst stop command BST according to the logic of the command signals CSRZ, RASRZ, CASRZ, and WERZ. In response to the precharge command PRE, the word line WL is deactivated, the sense amplifier stops operating, and a precharge operation for setting the bit lines BL and / BL to the precharge voltage is executed. In response to the active command ACT, the precharge operation is stopped, the word line WL is activated, and the sense amplifier starts operating. In response to the write command WR, a write operation for writing data to the memory cell MC is executed. A read operation for reading data from the memory cell MC is executed in response to the read command RD. The burst operation is stopped in response to the burst stop command BST. The command decoder 24 recognizes the knock command NOP when the command signal CSRZ is at the low level L and the command signals RASRZ, CASRZ, and WERZ are at the high level H.

  FIG. 10 shows an example of command transition of the semiconductor memory MEM shown in FIG. FIG. 10 shows a state transition according to the logic of the command signals / RAS, / CAS, / WE when the command signal CSRZ (/ CS) is activated to the low level. The command signals / RAS, / CAS, / WE are signals supplied to the command terminals CMD0 to CMD1, and are the command signals RASRZ, CASRZ, and WERZ shown in FIG. Note that an ellipse in FIG. 10 indicates a state or operation that transitions when a command signal is supplied. For example, symbol ACT indicates an active state or active operation, and symbol PRE indicates a precharge state or precharge operation.

  A thick solid line indicates that three command signals / RAS, / CAS, / WE need to be changed for state transition, and that two command signals need to be supplied to the command terminals CMD0 to CMD1. Show. The thin solid line indicates that two command signals need to be changed for the state transition, and the state transition is possible by supplying the command signal to the command terminals CMD0 to CMD1 once. A thin broken line indicates that one command signal needs to be changed for the state transition. Thus, in order to change the state of the semiconductor memory MEM, it is not necessary to change the logic levels of all command signals / CS, / RAS, / CAS, / WE every time.

  All the transitions by the thin solid line are performed by changes in the command signals / RAS and / CAS by the selector SEL0 shown in FIG. 5, changes in the command signals / CAS and / WE by the selector SEL1, or changes in the command signal / WE by the selector SEL2. Is called. For example, by using the selector SEL0, the transition from the active state ACT to the read state RD and the transition from the write state WR to the precharge state PRE can be executed in one clock cycle. Similarly, by using the selector SEL2, a transition from the precharge state PRE to the refresh state REF, a transition from the read state RD to the burst stop state BST, and a transition from the mode register setting state MRS to the active state ACT are performed by one clock. Can be executed in a cycle.

  The command input unit 14 has two selectors SEL0 and SEL1 for receiving a command signal / CAS having the highest logic change frequency. By supplying the command signal / CAS to the latch unit LTU using one of the two selectors SEL0 and SEL1, supply of the command signal to the command terminals CMD0 to CMD1 when the change of the two command signals is necessary Can be done once. As a result, many commands can be supplied to the semiconductor memory MEM in one clock cycle, and the memory cells MC can be efficiently accessed using a small number of command terminals CMD0 to CMD1.

  The transition of the state where the command signal / CAS is not used is only between the active state ACT and the precharge state PRE, between the precharge state PRE and the burst stop state, and between the write state WR and the read state RD. These state transitions need only change the command signal / WE or the command signal / RAS.

  On the other hand, for example, instead of assigning the command signal shown in FIG. 7, consider a case where the command terminal CMD1 receives the command signal / CAS only when the selection signal ISEL0 is at a high level (in the selector SEL1, Command signal / CAS not received). In this case, command signals / WE and / CAS cannot be received simultaneously at command terminals CMD0 to CMD1. Therefore, the transition from the precharge state PRE to the refresh state REF, the transition from the read state RD to the burst stop state BST, and the transition from the mode register setting state MRS to the active state ACT shown in FIG. 10 requires two clock cycles. become. That is, it is necessary to sequentially receive the command signals / CAS and / WE by sequentially setting the selection signals ISEL0 and ISEL1 to the high level.

  Similarly, instead of assigning the command signal shown in FIG. 7, consider the case where the command terminal / CMD1 is assigned to receive the command signal / CAS only when the selection signal ISEL1 is at the high level (in the selector SEL0, the command signal / CAS is assigned). Not received). In this case, command signals / RAS and / CAS cannot be received simultaneously at command terminals CMD0 to CMD1. Therefore, the transition from the write state WR to the precharge state PRE and the transition from the active state ACT to the read state RD shown in FIG. 10 require two clock cycles. That is, it is necessary to sequentially receive the command signals / RAS and / CAS by sequentially setting the selection signals ISEL0 and ISEL1 to the high level.

  FIG. 11 shows an example of a system SYS on which the semiconductor memory MEM shown in FIG. 3 is mounted. The system SYS (user system) constitutes at least a part of a microcomputer system such as a portable device. The system SYS has a system-on-chip SoC in which a plurality of macros are integrated on a silicon substrate. Alternatively, the system SYS has a multi-chip package MCP in which a plurality of chips are stacked on a package substrate. Alternatively, the system SYS has a system-in-package SiP in which a plurality of chips are mounted on a package substrate such as a lead frame. Furthermore, the system SYS may be formed in the form of chip-on-chip CoC or package-on-package PoP.

  For example, the system SYS includes a central processing unit (CPU), a read only memory (ROM), a peripheral circuit I / O, a memory controller MCNT, and a semiconductor memory MEM. The CPU, ROM, peripheral circuit I / O, and memory controller MCNT are connected to each other by a system bus SBUS. The semiconductor memory MEM is connected to the system bus SBUS via the memory controller MCNT.

  The CPU accesses the ROM, the peripheral circuit I / O, and the semiconductor memory MEM and controls the operation of the entire system. The CPU outputs a control signal and a data signal to the memory controller MCNT in order to cause the semiconductor memory MEM to perform a write operation and a read operation. The memory controller MCNT decodes a control signal from the CPU, and according to the decoding result, a clock enable signal CKE, a clock signal CLK, a command mask signal CM, a selection signal ISEL (ISEL0-ISEL2), a command signal CMD, an address signal AD, Write data signal DQ is output to semiconductor memory MEM, or read data signal DQ is received from semiconductor memory MEM. The minimum configuration of the system SYS is a memory controller MCNT and a semiconductor memory MEM.

  FIG. 12 shows an example of the operation of the semiconductor memory MEM shown in FIG. FIG. 12 shows the operation when the burst length is set to “1”. In this example, after the write operation is executed twice, the read operation is executed twice. The clock enable signal CKE is set to a high level. The clock enable signal CKE, clock signal CLK, command mask signal CM, selection signals SEL0-2, command signals CMD0-CMD1, address signal AD, and data signal DQ are output from the memory controller MCNT shown in FIG.

  In the waveform, “H” indicates a high level and “L” indicates a low level. The numbers shown in the waveforms of the selection signals ISEL0-2 indicate the numbers of the selection signals ISEL that are activated to a high level. Other selection signals ISEL are deactivated to a low level. In the waveforms of the command signals CMD0 to CMD1, an upward arrow indicates a high level, a downward arrow indicates a low level, and a command signal indicated by parentheses indicates an arbitrary logic level.

  First, the semiconductor memory MEM receives a high level command mask signal CM, a high level selection signal ISEL2, a high level command signal CMD0, and a low level command signal CMD1 in synchronization with the first clock signal CLK. The command input unit 14 shown in FIG. 5 operates the selector SEL2 in response to the high level selection signal ISEL2. The two tristate buffers TBUF of the selector SEL2 output a high level signal received at the command terminal CMD0 as the command signal WESZ, and output a low level signal received at the command terminal CMD1 as the command signal CSSZ. That is, the command input unit 14 recognizes the high level write enable signal / WE and the low level chip select signal / CS.

  The latch unit LTU latches the high-level command signal WESZ and the low-level command signal CSSZ in synchronization with the rising edge of the clock signal CLKIZ, and outputs them as the high-level command signal WERZ and the low-level command signal CSRZ (FIG. 12). (A), (b)). The command control unit 16 shown in FIG. 4 receives the high level command mask signal CMIZ, and maintains the clock signal CLKPZ at the low level (FIG. 12C). For this reason, the decoder DEC of the command decoder 24 shown in FIG. 8 does not operate.

  Next, the semiconductor memory MEM receives a low level command mask signal CM, a high level selection signal ISEL0, a low level command signal CMD0, and a high level command signal CMD1 in synchronization with the second clock signal CLK. The semiconductor memory MEM receives a row address signal RA at the address terminal AD. The command input unit 14 operates the selector SEL0 in response to the high level selection signal ISEL0, outputs the low level signal received at the command terminal CMD0 as the command signal RASSZ, and outputs the high level signal received at the command terminal CMD1 as a command. Output as signal CASZ. That is, the command input unit 14 recognizes the low level row address strobe signal / RAS and the high level column address strobe signal / CAS.

  The latch unit LTU latches the low-level command signal RASSZ and the high-level command signal CASZZ in synchronization with the clock signal CLKIZ, and outputs them as the low-level command signal RASSRZ and the high-level command signal CASRZ (FIG. 12 (d)). (E)). The latch unit LTU maintains the high-level command signal WERZ and the low-level command signal CSRZ in accordance with the holding value of the first latch LT1 shown in FIG.

  The command control unit 16 receives the low level command mask signal CMIZ and outputs the clock signal CLKPZ (FIG. 12 (f)). As a result, the command decoder 24 operates, the operation control signal ACTPZ is activated according to the logic of the command signals CSRZ, RASRZ, CASRZ, and WERZ, and the active operation ACT is executed (FIG. 12 (g)). In other words, the active command ACT is supplied to the semiconductor memory MEM in two clock cycles using the two command terminals CMD0 to CMD1. Since the clock signal CLKPZ is generated when the command signals CSRZ, RASRZ, CASRZ, and WERZ are aligned with the latch circuit LTC, the frequency of generation of the clock signal CLKPZ is lower than the frequency of generation of the clock signal CLKIZ.

  In the active operation, the precharge operation of the bit line pair BL, / BL is stopped, the word line WL indicated by the row address signal RA is activated, and the sense amplifier operates. The sense amplifier differentially amplifies and latches data read from the memory cell MC to one of the bit line pair BL, / BL by activating the word line WL. The selection signals ISEL2 and ISEL0 to be activated are switched between the first clock cycle and the second clock cycle, and the logic of the command signals CMD0 to CMD1 is switched between the first clock cycle and the second clock cycle. Also good.

  Next, the semiconductor memory MEM receives a high level command mask signal CM, a high level selection signal ISEL1, and a low level command signal CMD0 in synchronization with the third clock signal CLK. The command signal CMD1 is set to either a high level or a low level. The command input unit 14 operates the selector SEL1 according to the high level selection signal ISEL1, and sets the command signal WERZ to the low level according to the low level signal received at the command terminal CMD0. That is, the command input unit 14 recognizes the low level write enable signal / WE. In the third clock cycle, since the command mask signal CM is at a high level, the clock signal CLKPZ is not output, and the decoder DEC of the command decoder 24 does not operate.

  Next, the semiconductor memory MEM receives the low-level command mask signal CM, the high-level selection signal ISEL0, the high-level command signal CMD0, and the low-level command signal CMD1 in synchronization with the fourth clock signal CLK. Further, the semiconductor memory MEM receives a column address signal CA at an address terminal AD and a write data signal WRD at a data terminal DQ. The command input unit 14 operates the selector SEL0 according to the high-level selection signal ISEL0, outputs the high-level signal received at the command terminal CMD0 as the command signal RASRZ, and the low-level signal received at the command terminal CMD1 as the command The signal CASRZ is output (FIG. 12 (h, i)).

  The command control unit 16 receives the low level command mask signal CMIZ and outputs the clock signal CLKPZ (FIG. 12 (j)). As a result, the command decoder 24 operates, the operation control signal WRPZ is activated according to the logic of the command signals CSRZ, RASRZ, CASRZ, and WERZ, and the write operation is executed (FIG. 12 (k)). In other words, the write command WR is supplied to the semiconductor memory MEM in two clock cycles using the two command terminals CMD0 to CMD1.

  In the write operation, the column switch corresponding to the column address signal CA is turned on to select the bit line pair BL, / BL, and the write data signal WRD is transmitted to the selected bit line pair BL, / BL. The sense amplifier corresponding to the selected bit line pair BL, / BL latches the write data signal WRD. Then, the write data signal WRD is written into the memory cell MC through one of the bit line pair BL, / BL. The selection signals ISEL1 and ISEL0 to be activated are switched between the third clock cycle and the fourth clock cycle, and the logic of the command signals CMD0 to CMD1 is switched between the third clock cycle and the fourth clock cycle. Also good.

  In the fifth clock cycle, the same signal as in the fourth clock cycle is supplied to the semiconductor memory MEM, and the write operation is executed. That is, the second and subsequent write commands WR can be supplied to the semiconductor memory MEM in one clock cycle. Thus, in this embodiment, even when the same command is supplied according to the logic of the command signal held in the latch unit LTU shown in FIG. Thereby, a command can be supplied to the semiconductor memory MEM with the minimum number of clock cycles.

  Next, the semiconductor memory MEM receives the low level command mask signal CM, the high level selection signal ISEL0, the low level command signal CMD0, and the high level command signal CMD1 in synchronization with the sixth clock signal CLK. The command input unit 14 operates the selector SEL0, outputs a low level signal received at the command terminal CMD0 as the command signal RASRZ, and outputs a high level signal received at the command terminal CMD1 as the command signal CASRZ (FIG. 12 ( l, m)). Then, the command decoder 24 operates in response to the clock signal CLKPZ output from the command control unit 16, the operation control signal PREPZ is activated, and the precharge operation is executed (FIG. 12 (n)). The precharge command PRE after the write operation is supplied to the semiconductor memory MEM in one clock cycle. In the precharge operation, the word line WL is deactivated, the sense amplifier stops operating, and the bit line pair BL, / BL is reset to the precharge voltage.

  Next, in the seventh clock cycle, the active command ACT is supplied to the semiconductor memory MEM. However, the latch unit LTU sets the command signals CSRZ, RASRZ, CASRZ to low level, low level, and high level by the precharge operation. Therefore, in order to execute the active operation, the command signal WERZ may be set to a high level, and the active command ACT can be supplied to the semiconductor memory MEM in one clock cycle (FIG. 12 (o)).

  Next, the semiconductor memory MEM receives the low-level command mask signal CM, the high-level selection signal ISEL0, the high-level command signal CMD0, and the low-level command signal CMD1 in synchronization with the eighth clock signal CLK. The semiconductor memory MEM receives a column address signal CA at the address terminal AD. The command input unit 14 operates the selector SEL0, outputs a high level signal received at the command terminal CMD0 as the command signal RASRZ, and outputs a low level signal received at the command terminal CMD1 as the command signal CASRZ (FIG. 12 ( p, q)). The command decoder 24 operates in response to the clock signal CLKPZ output from the command control unit 16, the operation control signal RDPZ is activated, and the read operation is executed (FIG. 12 (r)). That is, the read command RD is supplied to the semiconductor memory MEM in one clock cycle. In the read operation, the column switch corresponding to the column address signal CA is turned on, the bit line pair BL, / BL is selected, 16 bits of the data read from the memory cell MC and latched by the sense amplifier are stored. Read data signal RDD is read to data bus DB. For example, the read data signal RDD is output from the data terminal DQ in synchronization with the next clock cycle of the read command RD (FIG. 12 (s)).

  In the ninth clock cycle, the same signal as that in the eighth clock cycle is supplied to the semiconductor memory MEM, and a read operation is performed. That is, the second and subsequent read commands RD are also supplied to the semiconductor memory MEM in one clock cycle.

  After the read operation RD, the latch unit LTU shown in FIG. 5 holds the low level command signal CSRZ, the high level RASRZ, the low level CASRZ, and the high level WERZ. For this reason, in order to recognize the precharge command PRE, it is necessary to invert the logic of the command signals RASRZ, CASRZ, and WERZ, and the supply of the precharge command PRE after the read operation RD requires two clock cycles. .

  Therefore, in the tenth clock cycle, the low level command signal CMD0 and the low level command signal CMD1 are supplied to the semiconductor memory MEM together with the high level selection signal ISEL0. In the eleventh clock cycle, the low level command signal CMD0 and the high level command signal CMD1 are supplied to the semiconductor memory MEM together with the high level selection signal ISEL2. The selection signals ISEL2 and ISEL0 to be activated are switched between the 10th clock cycle and the 11th clock cycle, and the logic of the command signals CMD0 to CMD1 is switched between the 10th clock cycle and the 11th clock cycle. Also good.

  As described above, also in this embodiment, the same effect as that of the above-described embodiment can be obtained. Further, when command signals are arranged in the latch unit LTU, the command decoder 24 is operated from the outside of the semiconductor memory MEM by the command mask signal CM, so that the semiconductor memory MEM can be efficiently manufactured even when the number of command terminals CMD is small. Accessible. In particular, by changing the number of command signals supplied to the command terminal CMD according to the logic of the command signal already held in the latch unit LTU, the semiconductor circuit can be obtained with a minimum number of clock cycles even when the number of command terminals CMD is small. The memory MEM can be operated.

  By supplying the command signal / CAS having a high change frequency to the latch unit LTU using one of the two selectors SEL0 and SEL1, the command signal can be efficiently transmitted even when the number of command terminals CMD is small. Can be supplied to MEM.

  FIG. 13 shows an example of a semiconductor memory MEM in another embodiment. The same elements as those described in the above-described embodiment are denoted by the same reference numerals, and detailed description thereof will be omitted. The semiconductor memory MEM includes a data input / output unit 10A, an address input unit 12A, an address input unit 12, an address input unit 12, a command input unit 14, a clock control unit 18, and an address selection unit 20 shown in FIG. It has a command input unit 14A, a clock control unit 18A, and an address selection unit 20A. Further, the semiconductor memory MEM has command terminals CMD (CMD0 to CMD3), which are more numerous than those in FIG. 3, and a test terminal TEN. Other configurations of the semiconductor memory MEM are the same as those in FIG.

  The data input / output unit 10A outputs data signals received at all the data terminals DQ15 to DQ0 to the data bus DBZ during the normal mode in which the test signal TENIZ is inactivated to the low level (write operation). Data input / output unit 10A outputs a data signal received from data bus DBZ to all data terminals DQ15-DQ0 during a normal mode (read operation).

  The data input / output unit 10A receives data signals received at some predetermined data terminals DQ7 to DQ0 during the test mode in which the test signal TENIZ is activated to a high level according to the logic of the selection signal SELTZ. The data is output to a predetermined bit group of the data bus DBZ (write operation). During the test mode, data input / output unit 10A outputs a predetermined bit group of data bus DBZ received according to the logic of selection signal SELTZ to some predetermined data terminals DQ7 to DQ0 (read operation). . An example of the data input / output unit 10A is shown in FIGS.

  The address input unit 12A outputs data signals received at all the address terminals AD11 to AD0 as the address signal ARZ during the normal mode. However, the column address signals used in the write operation and the read operation are a part of bit groups AD7 to AD0 of the address signal ARZ. The address input unit 12A receives an address signal received by some predetermined address terminals AD3-AD0 during the test mode in accordance with a predetermined bit group (AD11-AD8, AD7-AD4 or AD3-AD0). An example of the address input unit 12A is shown in FIG.

  The command input unit 14A latches the command signals / RAS, / CAS, / WE, / CS received at all the command terminals CMD0 to CMD3 in synchronization with the clock signal CLKIZ during the normal mode. The command input unit 14A determines the types of command signals received at some command terminals CMD0 to CMD1 according to the logic of the selection signal ISEL during the test mode. The command input unit 14A latches the determined command signal in synchronization with the clock signal CLKIZ. The command input unit 14A outputs the latched signals as command signals RASRZ, CASRZ, WERZ, and CSRZ during the normal mode and the test mode. The operation of the command input unit 14A during the test mode is the same as the operation of the command input unit 14 of FIG.

  The clock control unit 18A inactivates the command mask signal CMIZ to the low level regardless of the logic of the command mask signal CM during the period when the test signal TEN is at the low level (in the normal mode). The clock control unit 18A outputs a clock signal CLKIZ that is synchronized with the clock signal CLK when the clock enable signal CKE is at a high level in the normal mode. The clock control unit 18A stops outputting the clock signal CLKIZ when the clock enable signal CKE is at a low level during the normal mode.

  The clock control unit 18A outputs the command mask signal CM as the command mask signal CMIZ while the test signal TEN is at a high level (during the test mode). The clock control unit 18A outputs the clock signal CLK as the clock signal CLKIZ regardless of the logic of the clock enable signal CKE during the test mode.

  The address selection unit 20A outputs the address signal ARZ supplied from the address input unit 12A as the row address signal RA, the column address signal CA, or the mode setting signal MA in response to the clock signal CLKPZ. For this purpose, the address selection unit 20A has a latch circuit that holds the address signal ARZ.

  FIG. 14 shows an example of the clock control unit 18A shown in FIG. The clock control unit 18A has an input buffer IBUF2 instead of the input buffer IBUF that receives the command mask signal CM, and the clock enable signal CKEIZ is supplied to the input buffer IBUF2 that receives the clock signal CLK via the OR gate OR. Further, the clock control unit 18A has an input buffer IBUF that receives the test signal TEN and outputs the received signal as the test signal TENIZ. The other configuration of the clock control unit 18A is the same as that of the clock control unit 18 shown in FIG.

  The test signals TEN and TENIZ are set to a low level during a normal mode in which the memory cell MC is accessed by the user system, and set to a high level during a test mode for testing the semiconductor memory MEM. For example, the user system is a logic circuit LOGIC shown in FIG. The input buffer IBUF2 that receives the clock signal CLK operates in response to the high-level enable signal INENZ while the clock enable signal CKEIZ or the test signal TENIZ is activated to the high level, and the clock signal CLK is used as the clock signal CLKIZ. Output. The input buffer IBUF2 that receives the clock signal CLK sets the clock signal CLKIZ to the low level while the enable signal INENZ is inactivated to the low level.

  The input buffer IBUF2 that receives the command mask signal CM operates during a period in which the test signal TENIZ is activated to a high level, and outputs the command mask signal CM as the command mask signal CMIZ. The input buffer IBUF2 that receives the command mask signal CM deactivates the command mask signal CMIZ to low level while the test signal TENIZ is deactivated to low level. That is, the command mask signal CMIZ is generated only during the test mode.

  FIG. 15 shows an example of the command input unit 14A shown in FIG. The command input unit 14A is formed by adding an input buffer IBUF, a selector USEL, and a test control circuit TC that receive the command signals CMD2-CMD3 to the command input unit 14 shown in FIG. The selector USEL is an example of a second selection unit.

  The test control circuit TC inverts the logic of the test signal TENIZ and outputs it as the selection signal SELNZ. That is, the selection signal SELNZ is activated to a high level during the normal mode and deactivated to a low level during the test mode. The test control circuit TC outputs the selection signal ISELIZ (ISELI0Z-ISELI2Z) as the selection signal SELTZ (SELLT0Z-SELT2Z) when the test signal TENIZ is activated to a high level. Thereby, one of the selectors SEL0 to SEL2 selectively operates during the test mode. The test control circuit TC sets all the selection signals SELT0Z-SELT2Z to the low level when the test signal TENIZ is inactivated to the low level. Thereby, the operations of the selectors SEL0 to SEL2 are prohibited during the normal mode.

  The selector USEL has a tristate buffer TBUF that receives command signals WEIZ, RASIZ, CASIZ, and CSIZ. The tri-state buffer TBUF of the selector USEL outputs the command signals WESZ, RASZ, CASSZ, CSSZ when the selection signal SELNZ is at a high level (during the normal mode). The tristate buffer TBUF of the selector USEL sets the output to a high impedance state when the selection signal SELNZ is at a low level (during the test mode).

  The command input unit 14A supplies the command signals / RAS, / CAS, / WE, / CS received at the command terminals CMD0 to CMD3 during the normal mode to the four latch circuits LTC of the latch unit LTU via the selector USEL, respectively. To do. Command terminals CMD0 to CMD1 are examples of first command terminals, and command terminals CMD2 to CMD3 are examples of second command terminals. The command input unit 14A supplies a command signal received at the command terminals CMD0 to CMD1 to the two latch circuits LTC through one of the selectors SEL0 to SEL2 that operates according to the selection signal SELT0Z to SELT2Z during the test mode. . The number of latch circuits LTC is equal to the number of command terminals CMD0 to CMD3.

  FIG. 16 shows an example of the address input unit 12A shown in FIG. The address input unit 12A includes an input buffer IBUF, selectors AUSEL, ASEL (ASEL0, ASEL1, ASEL2), and a latch unit ALTU. Input buffers IBUF are respectively formed corresponding to address terminals AD11-AD0, receive address signals AD11-AD0, and output address signals AI11Z-AI10Z.

  The selector AUSEL has a tristate buffer TBUF that receives the address signals AI11Z-AI0Z. The tristate buffer TBUF of the selector AUSEL outputs the address signals AI11Z-AI0Z as the address signals AS11Z-AS0Z when the selection signal SELNZ is at the high level (during the normal mode). The tristate buffer TBUF of the selector AUSEL sets the output to a high impedance state when the selection signal SELNZ is at a low level (during the test mode).

  Each selector ASEL0-ASEL2 has a tristate buffer TBUF which receives address signals AI3Z-AI0Z, respectively. The tristate buffer TBUF of the selector ASEL0 outputs the address signal AI3Z-AI0Z as the address signal AS3Z-AS0Z when the selection signal SELT0Z is at a high level. The tristate buffer TBUF of the selector ASEL0 sets the output to a high impedance state when the selection signal SELT0Z is at a low level.

  The tristate buffer TBUF of the selector ASEL1 outputs the address signals AI3Z-AI0Z as the address signals AS7Z-AS4Z when the selection signal SELT1Z is at a high level. The tristate buffer TBUF of the selector ASEL1 sets the output to a high impedance state when the selection signal SELT1Z is at a low level. The tristate buffer TBUF of the selector ASEL2 outputs the address signal AI3Z-AI0Z as the address signal AS11Z-AS8Z when the selection signal SELT2Z is at a high level. The tristate buffer TBUF of the selector ASEL2 sets the output to a high impedance state when the selection signal SELT2Z is at a low level.

  The latch unit ALTU includes a latch circuit LTC that latches the address signal AS11Z-AS0Z in synchronization with the clock signal CLKIZ and outputs the latched signal as the address signal AR11Z-AR0Z.

  FIG. 17 shows an example of an input circuit for the data signal DQ in the data input / output unit 10A shown in FIG. The data input / output unit 10A includes an input buffer IBUF that receives write data signals DQ15 to DQ0, selectors DIESEL, DISEL (DISEL0, DISEL1), and a latch unit DLTU. Input buffers IBUF are respectively formed corresponding to data terminals DQ15-DQ0, receive write data signals DQ15-DQ0, and output input data signals DII15Z-DII0Z.

  The selector DIESEL has a tristate buffer TBUF that receives the input data signals DII15Z-DII0Z. The tristate buffer TBUF of the selector DIESEL outputs the input data signals DII15Z-DII0Z as the input data signals DIS15Z-DIS0Z when the selection signal SELNZ is at the high level (during the normal mode). The tristate buffer TBUF of the selector DIESEL sets the output to a high impedance state when the selection signal SELNZ is at a low level (during the test mode).

  Each selector DISEL0 to DISEL1 has a tristate buffer TBUF that receives input data signals DII7Z to DII0Z. The tristate buffer TBUF of the selector DISEL0 outputs the input data signals DII7Z-DII0Z as the input data signals DIS7Z-DIS0Z when the selection signal SELT0Z is at the high level. The tristate buffer TBUF of the selector DUSEL0 sets the output to a high impedance state when the selection signal SELT0Z is at a low level.

  The tristate buffer TBUF of the selector DISEL1 outputs the input data signals DII7Z-DII0Z as the input data signals DIS15Z-DIS8Z when the selection signal SELT1Z is at a high level. The tristate buffer TBUF of the selector DISEL1 sets the output to a high impedance state when the selection signal SELT1Z is at a low level.

  The latch unit DLTU includes a latch circuit TLTC that latches the input data signal DIS15Z-DIS0Z in synchronization with the clock signal CLKIDZ and outputs the latched signal to the data bus DBZ (DB15Z-DB0Z). The latch circuit TLTC latches the input data signals DIS15Z-DIS0Z and outputs the data bus DBZ when the write clock signal CLKIDZ is at a high level, and sets the output to a high impedance state when the clock signal CLKIDZ is at a low level. The clock signal CLKIDZ is generated in synchronization with the clock signal CLKIZ during a period in which the write control signal WRZ is at a high level, and is set to a low level in a period in which the write control signal WRZ is at a low level.

  Note that the selector DIESEL may be operated according to the selection signal SELNZ only when the write control signal WRZ is activated. The selectors DISEL0 and DISEL1 may be operated according to the selection signals SELT0Z and SELT1Z only when the write control signal WRZ is activated. By including the logic of the write control signal WRZ in the control of the selectors DISESEL, SELT0Z, and SELT1Z, the selectors DIESEL, SELT0Z, and SELT1Z are minimized, and the power consumption can be reduced.

  Further, by simultaneously setting the selection signals SELT0Z and SELT1Z to the high level, the data signals received at the data terminals DQ7 to DQ0 are supplied not only to the input data signals DIS7Z to DIS0Z but also to the latch unit DLTU as the input data signals DIS15Z to DIS8Z. it can. Thus, a so-called data compression test can be performed in which data signals received at each data terminal DQ are simultaneously written in a plurality of memory cells MC.

  FIG. 18 shows an example of the output circuit of the data signal DQ in the data input / output unit 10A shown in FIG. The data input / output unit 10A includes selectors DOUSEL, DOSEL (DOSEL0, DOSEL1), OR circuits OR2, OR3, and an output buffer TOBUF.

  The selector DOUSEL has AND circuits AND that receive read data signals supplied from the data buses DB15Z-DB0Z. The AND circuit AND outputs a read data signal as output data signals DON15Z-DON0Z when the selection signal SELNZ is at a high level (in the normal mode). The AND circuit AND sets the output to the low level when the selection signal SELNZ is at the low level (during the test mode).

  Each selector DOSEL0-DOSEL1 has an AND circuit AND that receives a read data signal supplied from the data buses DB15Z-DB0Z. The AND circuit AND of the selector DOSEL0 outputs a read data signal supplied from the data buses DB15Z-DB8Z to the OR circuit OR3 when the selection signal SELT0Z is at a high level. The AND circuit AND of the selector DOSEL0 sets the output to the low level when the selection signal SELT0Z is at the low level. The AND circuit AND of the selector DOSEL1 outputs a read data signal supplied from the data buses DB7Z-DB0Z to the OR circuit OR3 when the selection signal SELT1Z is at a high level. The AND circuit AND of the selector DOSEL1 sets the output to the low level when the selection signal SELT0Z is at the low level.

  The OR circuit OR2 outputs the output data signals DON15Z-DON8Z as output data signals DOI15Z-DOI8Z. The OR circuit OR2 is inserted to match the output timing of the output data signals DON15Z-DON8Z with the output timing of the output data signals DON7Z-DON0Z output via the OR circuit OR3. The OR circuit OR3 outputs the output data signal DON7Z-DON0Z, the output signal from the AND circuit AND of the selector DOSEL0, or the output signal from the AND circuit AND of the selector DOSEL1 as output data signals DOI7Z-DOI0Z.

  The output buffer TOBUF outputs the output data signals DOI15Z-DOI0Z to the data terminals DQ (DQ15-DQ0) during the high level period of the read clock signal CLKODZ. The output buffer TOBUF sets the output to a high impedance state during the low level period of the clock signal CLKODZ. The read clock signal CLKODZ is generated in synchronization with the clock signal CLKIZ during a period when the read control signal RDZ is at a high level, and is set at a low level when the read control signal RDZ is at a low level.

  FIG. 19 shows an example of a system SYS on which the semiconductor memory MEM shown in FIG. 13 is mounted. The system SYS (user system) constitutes at least a part of a microcomputer system such as a portable device. The system SYS has a system-on-chip SoC in which a plurality of macros are integrated on a silicon substrate. Alternatively, the system SYS may be formed in the form of a multi-chip package MCP, a system-in-package SiP, a chip-on-chip CoC, or a package-on-package PoP.

  The system SYS has a logic circuit LOGIC, a memory controller MCNT, and a semiconductor memory MEM. For example, the logic circuit LOGIC is a user system designed by a user. The clock signal LCLK, the clock enable signal LCKE, the command signal LCMD, and the address signal LAD for accessing the semiconductor memory MEM are controlled by the address command control of the memory controller MCNT. To the part ACTCNT. Further, the logic circuit LOGIC receives the read data signal LDO from the semiconductor memory MEM via the data control unit DTCNT of the memory controller MCNT, and outputs the write data signal LDI to the semiconductor memory MEM via the data control unit DTCNT.

  During the normal mode, the address command control unit ACTCNT sends the clock signal LCLK, the clock enable signal LCKE, the command signal LCMD, and the address signal LAD to the clock terminal CLK, clock enable terminal CKE, command terminal CMD, and address terminal AD of the semiconductor memory MEM. Output each. The address command control unit ACTCNT receives signals received at the command mask terminal TCM, the clock terminal TCLK, the clock enable terminal TCKE, the command terminal TCMD, and the address terminal TAD during the test mode, in the command mask terminal CM, the clock terminal CLK, Output to the clock enable terminal CKE, the command terminal CMD, and the address terminal AD, respectively.

  The address command control unit ACTCNT outputs signals received at the test terminal TTEN and the selection terminal TISEL to the test terminal TEN and the selection terminal ISEL of the semiconductor memory MEM during the normal mode and the test mode, respectively. Further, the address command control unit ACTCNT generates an output enable LOE and outputs it to the data control unit DTCNT. The address command control unit ACTCNT is an example of a first control unit and a second control unit.

  During the normal mode, the data control unit DTCNT outputs the read data DQ from the semiconductor memory MEM as a read data signal LDO to the logic circuit LOGIC, and the write data signal LDI from the logic circuit LOGIC to the data terminal DQ of the semiconductor memory MEM. Output. During the test mode, the data control unit DTCNT outputs the read data signal DQ from the semiconductor memory MEM to the output data terminal TDQ, and outputs the write data signal received at the output data terminal TDQ to the data terminal DQ of the semiconductor memory MEM. The data control unit DTCNT is an example of a third control unit.

  FIG. 20 shows an example of the address command control unit ACTCNT shown in FIG. The address command control unit ACTCNT includes an address conversion unit ACNV, a command conversion unit CCNV, AND circuit units LAND and TAND, and an OR circuit unit ORU.

  The address conversion unit ACNV generates a row address signal and a column address signal for accessing the semiconductor memory MEM in response to the address signal LAD from the logic circuit LOGIC, and sequentially outputs the generated signals to the AND circuit unit LAND. The command conversion unit CCNV converts the command signal LCMD from the logic circuit LOGIC into a command signal (for example, / CS, / RAS, / CAS, / WE) that can be identified by the semiconductor memory MEM, and performs an AND operation on the converted command signal. Output to the circuit unit LAND. In addition, when the command signal LCMD indicates a read command, the command conversion unit CCNV generates an output enable signal LOE in accordance with the output of read data from the semiconductor memory MEM, and outputs the output enable signal LOE to the data control unit DTCNT.

  The AND circuit unit LAND becomes effective during the normal mode (TTEN, TEN = low level), and transmits a signal from the logic circuit LOGIC to the OR circuit unit ORU. The AND circuit unit LAND becomes invalid during the test mode (TTEN, TEN = high level), and outputs a low level.

  The AND circuit unit TAND becomes effective during the test mode, and transmits signals received at the test terminals TAD, TCMD, TCKE, TCLK, and TCM to the OR circuit unit ORU. A test address signal, a command signal, a clock enable signal, a clock signal, and a command mask signal are supplied to the test terminals TAD, TCMD, TCKE, TCLK, and TCM, respectively. The AND circuit unit TAND becomes invalid during the normal mode and outputs a low level.

  Test terminal TTEN receives a test signal. For example, the test terminal TTEN is connected to a low level voltage line such as the ground line VSS via a resistor (pull down). Thereby, in the system SYS shown in FIG. 19, the test signal TEN can always be set to the low level when the test terminal TTEN is in the open state. As a result, it is possible to prevent the test mode from being entered when the system SYS operates, and to prevent malfunction of the system SYS. Note that the test terminal TTEN may be connected to the ground line VSS or the like outside the system SYS shown in FIG. Further, the test terminals TAD, TCMD, TCKE, TCLK, TCM, and TISEL may be pulled down similarly to the test terminal TTEN.

  The OR circuit unit ORU outputs the output of the AND circuit unit LAND to the terminals AD, CMD, CKE, and CLK of the semiconductor memory MEM during the normal mode. The OR circuit unit ORU outputs the output of the AND circuit unit TAND to the terminals AD, CMD, CKE, CLK, and CM of the semiconductor memory MEM during the test mode.

  FIG. 21 shows an example of the data control unit DTCNT shown in FIG. The data control unit DTCNT includes data output circuits LDOC and TDOC, a data input circuit DIC, and a switching circuit SWCNT.

  The switching circuit SWCNT outputs the write data signal LDI to the input circuit DIC through the data line DTIN during the normal mode in which the test signal TEN is set to the low level. During the normal mode, the switching circuit SWCNT sets the control signal CNT3 to high level and sets the control signal CNT2 to low level while the output enable signal LOE is activated to high level.

  The switching circuit SWCNT outputs a write data signal received at the data terminal TDQ via the data line DTIN to the input circuit DIC during the test mode in which the test signal TEN is set to the high level. During the test mode, the switching circuit SWCNT sets the control signal CNT1 to high level and sets the control signal CNT2 to low level while the output enable signal TOE is activated to high level.

  The data output circuit LDOC operates during a period when the control signal CNT3 is at a high level, and outputs a read data signal supplied from the semiconductor memory MEM via the data terminal DQ as a read data signal LDO. The data output circuit TDOC operates during a period when the control signal CNT3 is at a high level, and outputs a read data signal supplied from the semiconductor memory MEM via the data terminal DQ to the data terminal TDQ as a read data signal.

  The data input circuit DIC operates when the control signal CNT2 is set to a low level, and outputs a write data signal supplied to the data line DTIN to the data terminal DQ. The data input circuit DIC stops operating when the control signal CNT2 is set to a high level, and sets the output terminal to a high impedance state.

  FIG. 22 shows an example of timing specifications necessary for command transition of the semiconductor memory MEM shown in FIG. The meaning of the arrow is the same as in FIG. The timing specification is necessary for reliably inputting or outputting a signal to the semiconductor memory MEM, or is necessary for operating the memory core 100 without malfunctioning.

  “1CLK” in FIG. 22 indicates that one clock cycle is necessary for the state transition. The code of the timing specification shown in FIG. 25 is the same as the code of the timing specification of a general SDRAM. For example, the timing specification tRCD is the minimum time required from the active command ACT to the write command WR or the read command RD. The timing specification tDPL is the minimum time required from the last write data input to the precharge command PRE.

  FIG. 23 shows an example of the operation of the semiconductor memory MEM shown in FIG. 13 during the normal mode. Detailed descriptions of the same operations as those in FIG. 12 are omitted. FIG. 23 shows the operation when the burst length is set to “1”. In this example, after the write operation is executed four times and the precharge operation is executed, an active command is supplied.

  In the normal mode, the semiconductor memory MEM receives command signals / RAS, / CAS, / WE, / CS at all command terminals CMD0 to CMD3 shown in FIGS. During the normal mode, the selectors USEL, AUSEL, and DIESEL shown in FIGS. 15, 16, and 17 are valid. Thus, each of the command signals / RAS, / CAS, / WE, / CS, the address signal AD11-0, and the write data signal DQ15-0 can be supplied to the semiconductor memory MEM at a time. Therefore, the semiconductor memory MEM operates with the same timing specifications as a general SDRAM. The address signal AD is supplied to the semiconductor memory MEM at a time for each row address signal RA and column address signal CAD.

  The clock enable signal CKE, the clock signal CLK, the command signals CMD0 to CMD3, the address signal AD, and the data signal DQ are output from the logic circuit LOGIC shown in FIG. The test signal TEN is set to a low level, and the clock enable signal CKE is set to a high level. Since the test signal TEN is at the low level, the AND circuit unit TAND shown in FIG. 20 fixes the command mask signal CM at the low level L, and the test control circuit TC shown in FIG. 15 selects the selection signal SELT0-2Z (SEL0TZ-SELT2Z). ) Is fixed at the low level L (FIG. 23A). As a result, the operations of the selectors SEL0 to SEL2 are prohibited.

  Since the clock enable signal CKE is set to the high level, the clock control unit 18A shown in FIG. 14 fixes the enable signal INENZ to the high level and outputs the clock signal CLKIZ in synchronization with the clock signal CLK (FIG. 23 (b)). The command control unit 16 shown in FIG. 4 receives the low level command mask signal CMIZ, and outputs the clock signal CLKPZ in synchronization with the clock signal CLKIZ (FIG. 23C). That is, during the normal mode, the frequency of generation of the clock signal CLKPZ is equal to the frequency of generation of the clock signal CLKIZ. For this reason, the command decoder 24 shown in FIG. 8 outputs a command signal for each cycle of the clock signal CLK.

  First, the semiconductor memory MEM receives the active command ACT and the row address signal RA in synchronization with the first clock signal CLK (FIG. 23 (d)). The semiconductor memory MEM activates the operation control signal ACTPZ according to the active command ACT in order to execute the active operation (FIG. 23 (e)).

  Thereafter, in order to satisfy the timing specification tRCD shown in FIG. 22, the NOP command NOP is supplied in the second and third clock cycles (FIG. 23 (f)). It should be noted that the number of insertions of the NOP command NOP increases when the frequency of the clock signal CLK is high and decreases when the frequency of the clock signal CLK is low.

  Next, the semiconductor memory MEM receives the write command WR, the column address signal CA, and the 16-bit write data signal WRD in synchronization with the fourth clock signal CLK (FIG. 23 (g)). The semiconductor memory MEM activates the operation control signal WRPZ according to the write command WR in order to operate the column control unit 36 according to the column address signal CA and write the write data into the memory cell MC (FIG. 23 (h) )). Then, a write operation is executed. Thereafter, the write command WR is continuously supplied in the fifth to seventh clock cycles, and the write operation is continuously executed (FIG. 23 (i)).

  Next, in order to satisfy the timing specification tDPL, a knock command NOP is inserted before the precharge command PRE (FIG. 23 (j)). Then, the semiconductor memory MEM receives the precharge command PRE in synchronization with the ninth clock signal CLK, and activates the operation control signal PREPZ in order to execute the precharge operation (FIG. 23 (k)). Next, in order to satisfy the timing specification tRP, two knock commands NOP are inserted before the active command ACT (FIG. 23 (l)). The semiconductor memory MEM receives the active command ACT and the row address signal RA in synchronization with the twelfth clock signal CLK (FIG. 23 (m)).

  FIG. 24 shows another example of the operation of the semiconductor memory MEM shown in FIG. 13 during the normal mode. Detailed descriptions of the same operations as those in FIGS. 12 and 23 are omitted. FIG. 24 shows the operation when the burst length is set to “1”. In this example, after the read operation is executed four times and the precharge operation is executed, an active command is supplied. The first to third clock cycles are the same as in FIG.

  The semiconductor memory MEM receives the read command RD and the column address signal CA in synchronization with the fourth clock signal CLK (FIG. 24A). The semiconductor memory MEM activates the operation control signal RDPZ according to the read command RD to operate the column control unit 36 according to the column address signal CA and read the read data RDD from the memory cell MC (FIG. 24 ( b)). Then, a read operation is performed, and 15-bit read data RDD is output to the data terminals DQ15 to DQ0. Thereafter, the read command RD is continuously supplied in the fifth to seventh clock cycles, and the read operation is continuously executed (FIG. 24C).

  Next, the semiconductor memory MEM receives the precharge command PRE in synchronization with the eighth clock signal CLK, and activates the operation control signal PREPZ in order to execute the precharge operation (FIG. 24 (d)). As shown in FIG. 22, the precharge command PRE can be supplied in the next clock cycle of the read command RD. Next, in order to satisfy the timing specification tRP, two knock commands NOP are inserted before the active command ACT (FIG. 24 (e)). The semiconductor memory MEM receives the active command ACT and the row address signal RA in synchronization with the eleventh clock signal CLK (FIG. 24 (f)).

  FIG. 25 shows an example of a test system TSYS that tests the semiconductor memory MEM shown in FIG. The test system TSYS is used in the manufacturing process of the semiconductor memory MEM (system chip SYS). That is, the semiconductor memory MEM (system chip SYS) is manufactured by performing a test described later.

  First, a plurality of system chips SYS are formed on a semiconductor wafer WAF by a semiconductor manufacturing process. The semiconductor memory MEM in the system chip SYS is tested by a tester TEST such as an LSI tester before being cut out from the wafer WAF. The tester TEST supplies not only the control signal but also the power supply voltage VDD and the ground voltage VSS.

  The system chip SYS is connected to the tester TEST via the probe PRB of the probe card and the memory controller MCNT, for example. In FIG. 25, one system chip SYS is connected to the tester TEST, but a plurality of system chips SYS may be connected to the tester TEST at a time. The number of system chips SYS connected to the tester TEST at a time depends on the number of terminals of the tester TEST and the number of terminals of the semiconductor memory MEM.

  The tester TEST supplies a clock enable signal TCKE, a clock signal TCLK, a command mask signal TCM, a test signal TTEN, a selection signal TISEL, an output enable signal TOE, a command signal TCMD, an address signal TAD, and a write data signal TDQ to the semiconductor memory MEM. The read data signal TDQ is received from the semiconductor memory MEM. The tester TEST sets the semiconductor memory MEM to the test mode by activating the test signal TTEN to a high level.

  When testing the semiconductor memory MEM, first, the tester TEST sets the test signal TTEN to the low level, outputs the clock signal TCLK, the command signal TCMD, the address signal TAD, and the write data signal TDQ to the semiconductor memory MEM, and the command mask signal TCM is set to an invalid level and test data TDQ is written to the semiconductor memory MEM. Next, the tester TEST outputs the clock signal TCLK, the command signal TCMD, and the address signal TAD to the semiconductor memory MEM, sets the command mask signal TCM to an invalid level, and receives the read data TDQ read from the semiconductor memory MEM. Then, the tester TEST determines the quality of the semiconductor memory MEM by comparing the received read data TDQ with an expected value.

  Note that when the semiconductor memory MEM is manufactured with a single chip, the tester TEST may be used to directly test the semiconductor memory chip MEM. In this case, the tester TEST does not output the output enable signal TOE, and the probe PRB of the tester TEST is directly connected to the terminal of the semiconductor memory MEM.

  FIG. 26 shows an example of the operation of the semiconductor memory MEM shown in FIG. 13 during the test mode. Detailed descriptions of the same operations as those in FIGS. 12 and 23 are omitted. The operation of FIG. 26 is performed when the tester TEST shown in FIG. 25 outputs a signal to the semiconductor memory MEM via the memory controller MCNT (FIG. 19). FIG. 26 shows the operation when the burst length is set to “1”. In this example, after the write operation is executed four times and the precharge operation is executed, an active command is supplied.

  In this embodiment, as shown in FIG. 16, the semiconductor memory MEM receives the 12-bit address signals AD11-AD0 in order using the 4-bit address terminals AD3-AD0 during the test mode. Therefore, the active command ACT that requires the 12-bit row address signals RA11Z-RA0Z is executed in three clock cycles while sequentially changing the selection signals ISEL2-ISEL0 activated to the high level (FIG. 26 (a)). . Similarly to FIG. 12, the numbers shown in the waveforms of the selection signals ISEL0-2 indicate the numbers of the selection signals ISEL that are activated to the high level. In FIG. 26, the value of the row address signal RA required for the active command ACT is indicated by a symbol “A” for each of the 4 bits RA11-8, RA7-4, and RA3-0 (FIG. 26B).

  The latch unit ALTU shown in FIG. 16 latches the row address signal RA by 4 bits every clock cycle in response to the selection signals ISEL2-ISEL0 activated to the high level, and the address signals AR11Z-AR8Z, AR7Z-AR4Z. , AR3Z-AR0Z are output (FIG. 26 (c)). The symbol “x” indicates that the value of the address signal is not determined.

  The low level of the chip select signal / CS for recognizing the active command ACT is supplied in the first clock cycle (FIG. 26 (d)). Similarly, the high level of the write enable signal / WE is supplied in the second clock cycle (FIG. 26 (e)). The low level of the row address strobe signal / RAS and the high level of the column address strobe signal / CAS are supplied in the third clock cycle (FIG. 26 (f)). The semiconductor memory MEM receives the low level command mask signal CM in the third clock cycle, activates the clock signal CLKPZ, and activates the operation control signal ACTPZ (FIG. 26 (g, h)). . The address selection unit 20A shown in FIG. 13 outputs the address signals AR11Z-AR0Z as the row address signals RA11-RA0 in response to the clock signal CLKPZ (FIG. 26 (i)). Then, the semiconductor memory MEM performs an active operation.

  Next, the first write command WR is supplied using the fourth to sixth clock cycles (FIG. 26 (j)). In FIG. 26, the value of the column address signal CA required for each of the four write commands WR is indicated by “0”, “1”, “2”, “3” for each of the 4 bits CA8-CA4 and CA3-CA0.

  In the fourth clock cycle in which the selection signal ISEL2 is activated to a high level, the upper 4 bits corresponding to the address signals AD11 to AD8 are supplied to the semiconductor memory MEM. However, the column address signal CA required together with the write command WR is the lower 8 bits CA7 to CA0. Therefore, the address signals AD3-AD0 supplied to the semiconductor memory MEM in the fourth clock cycle are held in advance in the latch unit ALTU as the row address signals RA11-RA8 used in the next active command ACT, and the address signal AR11Z -Output as AR8Z (FIG. 26 (k)). The value of the row address signal RA required for the next active command ACT is indicated by a symbol “B” for each of the 4 bits RA11-8, RA7-4, and RA3-0.

  The fifth clock cycle is the same as the fourth clock cycle shown in FIG. 12 except that the upper bits CA7 to CA4 of the column address signal CA and the upper bits W15 to W8 of the write data are supplied to the semiconductor memory MEM. It is. In the fifth clock cycle, the latch unit ALTU latches the address signals AD3-AD0 as the upper bits CA7-CA4 of the column address signal and outputs them as the address signals AR7Z-AR4Z (FIG. 26 (l)). The latch unit DLTU shown in FIG. 17 latches the data signals DQ7 to DQ0 as the upper write data signals W15 to W8 when the selection signal ISEL1 is at the high level, and outputs them to the data buses DB15Z to DB8Z (FIG. 26 (m )).

  The sixth clock cycle is the same as the fifth clock cycle shown in FIG. 12 except that the lower bits CA3-CA0 of the column address signal CA and the lower bits W7-W0 of the write data are supplied to the semiconductor memory MEM. It is. In the sixth clock cycle, the latch unit ALTU latches the address signal AD3-AD0 as the lower bits CA3-CA0 of the column address signal and outputs it as the address signals AR3Z-AR0Z (FIG. 26 (n)). The latch unit DLTU latches the data signals DQ7-DQ0 as the lower write data signals W7-W0 when the selection signal ISEL0 is at the high level, and outputs them to the data buses DB7Z-DB0Z (FIG. 26 (o)).

  Upon receiving the low-level command mask signal CM in the sixth clock cycle, the clock signal CLKPZ is activated and the operation control signal WRPZ is activated as in FIG. 12 (FIG. 26 (p, q)). The address selection unit 20A shown in FIG. 13 outputs the address signals AR7Z-AR0Z as the column address signals CA7-CA0 in response to the clock signal CLKPZ (FIG. 26 (r)). Then, the semiconductor memory MEM performs the first write operation WR.

  In the second write operation WR, only the lower column address signals CA3-CA0 and the lower write data signals W7-W0 are changed. Therefore, in the seventh clock cycle, the selection signal ISEL0 is activated to a high level, and the write operation can be executed in one clock cycle. The operations of the latch unit ALTU and the latch unit DLTU are the same as in the sixth clock cycle. Thus, in the test mode, only the address that needs to be changed is changed, and only the data that needs to be changed is changed. Thereby, even when the number of command terminals CMD is small, the clock cycle required for the write operation can be minimized, and the semiconductor memory MEM can be efficiently tested. That is, the test time of the semiconductor memory MEM can be shortened.

  In the third write operation WR, only the upper column address signals CA7 to CA4 and the upper write data signals W15 to W8 are changed. Therefore, in the eighth clock cycle, the selection signal ISEL1 is activated to a high level, and the write operation can be executed in one clock cycle. The operations of the latch unit ALTU and the latch unit DLTU are the same as in the sixth clock cycle.

  In the fourth write operation WR, only the lower column address signals CA3Z-CA0Z and the lower write data signals W7-W0 are changed. For this reason, the write operation WR is executed in the same manner as in the seventh clock cycle.

  Next, the semiconductor memory MEM receives a precharge command in synchronization with the tenth clock signal CLK and executes a precharge operation PRE. The tenth clock cycle is the same as the sixth clock cycle shown in FIG. 12 except that the row address signals RA3-RA0 used in the next active command ACT are received in advance (FIG. 26 (s)). In the tenth clock cycle, the latch unit ALTU latches the address signals AD3-AD0 as the lower bits RA3-RA0 of the row address signal and outputs them as the address signals AR3Z-AR0Z ((t) in FIG. 26).

  Next, the semiconductor memory MEM receives the active command in synchronization with the eleventh clock signal CLK and executes the active operation ACT. The eleventh clock cycle is the same as the seventh clock cycle shown in FIG. 12 except that row address signals RA7 to RA4 are received (FIG. 26 (u)). As described above, in this embodiment, a part of the row addresses RA11 to RA0 necessary for the active operation ACT can be held in the latch unit ALTU in advance. Thus, an active command can be received in one clock cycle in a test mode in which address signals AD11-AD0 are received bit by bit.

  FIG. 27 shows the timing from the last write command WR shown in FIG. 26 to the precharge command PRE. The cell voltage indicates the voltage at the connection node between the transfer transistor and the capacitor of the memory cell MC. In a normal memory cell MC, as shown by the solid line, the cell voltage rises to a predetermined voltage V1 (for example, a high-level power supply voltage of the sense amplifier) until the word line WL is deactivated to a low level. Charge is held in the memory cell MC. On the other hand, for example, in the memory cell MC having poor write characteristics, the cell voltage does not reach the predetermined voltage V1 when the word line WL is deactivated as shown by the broken line. For this reason, sufficient charges are not held in the memory cells MC, and the data holding characteristics deteriorate. A memory cell MC having poor data characteristics can be determined to be defective by performing a pause test or the like for reading data held in the memory cell MC without inserting a refresh operation for a predetermined period.

  The word line WL and the alternate long and short dash line of the cell voltage indicate waveforms when the precharge command PRE is supplied after two clock cycles from the write command WR. In this case, since the cell voltage of the memory cell MC having poor write characteristics rises to the predetermined voltage V1, no defect can be detected.

  As shown in FIG. 7, the semiconductor memory MEM can simultaneously recognize the row address strobe signal / RAS and the column address strobe signal / CAS when the selection signal ISEL0 is activated to a high level. Therefore, the precharge command PRE can be supplied in the next clock cycle of the write command WR, and the timing specification tDPL from the write command WR (final write data) to the precharge command PRE is set to one clock cycle (minimum clock cycle). Can be set. Therefore, by executing the read operation after the write operation shown in FIG. 26, it is possible to detect a defect in the memory cell MC having poor write characteristics.

  FIG. 28 shows another example of the operation of the semiconductor memory MEM shown in FIG. 13 during the test mode. Detailed description of the same operations as those in FIGS. 12, 23 and 26 will be omitted. The operation of FIG. 28 is performed by the tester TEST shown in FIG. 25 outputting a signal to the semiconductor memory MEM via the memory controller MCNT (FIG. 19). FIG. 28 shows the operation when the burst length is set to “1”. In this example, the read operation is executed twice, and after the precharge operation is executed, an active command is supplied. The first to third clock cycles are the same as in FIG.

  The first read command RD is supplied using the fourth to sixth clock cycles. (FIG. 28 (a)). The input value of the address signal of the first read operation is the same as the fourth to sixth clock cycles shown in FIG. That is, the address signals AD3-AD0 supplied to the semiconductor memory MEM in the fourth clock cycle are held in advance in the latch unit ALTU as the row address signals RA11-RA8 of the next active command ACT, and are used as the address signals AR11Z-AR8Z. It is output (FIG. 28 (b)).

  In the read operation RD, the read data W15-W8, W7-W0 are sequentially output to the data terminals DQ7-DQ0 in synchronization with the next two clock cycles that have received the read command RD (FIG. 28 (c, d)). . Therefore, in the next two clock cycles that have received the read command RD, it is necessary to activate the selection signals ISEL1 and ISEL0 to high level in this order or in reverse order. Further, the read data signal is read in two portions using the data terminals DQ7 to DQ0. Therefore, the minimum cycle of the read operation when the read operation is continuously executed is 2 clock cycles (FIG. 28 (e)).

  When the precharge operation PRE is executed after the read operation RD, it is necessary to invert the logics of the three command signals / RAS, / CAS, / WE as shown in FIG. For this reason, the precharge command PRE is supplied to the semiconductor memory MEM in two clock cycles (FIG. 28 (f)). The precharge operation PRE in the 10th clock cycle and the active operation ACT in the 11th clock cycle are the same as those shown in FIG. 26 except that the values of the column address signals CA7 to CA0 held in the address selector 20 are different. The same as the 11th and 11th clock cycles.

  For example, in the active command ACT in the eleventh clock cycle, only the column address signals CA7 to CA4 are changed (FIG. 28 (g)). For this reason, the active command ACT can be supplied to the semiconductor memory MEM in one clock cycle. Further, only the column address signals CA3 to CA0 are changed in the read command RD of the 12th clock cycle (FIG. 28 (h)). For this reason, the read command RD can be supplied to the semiconductor memory MEM in one clock cycle. For example, the timing specification tRCD shown in FIG. 22 can be evaluated in the 12th clock cycle. Since the circuit operation of the semiconductor memory MEM that determines the timing specification tRCD is common to the write operation and the read operation, the evaluation of the timing specification tRCD during the write operation can be indirectly performed by evaluating the timing specification tRCD during the read operation. .

  As described above, also in this embodiment, the same effect as that of the above-described embodiment can be obtained. Further, by operating the selectors SEL0 to SEL2 during the test mode and operating the selector USEL during the normal mode, the semiconductor memory MEM can be efficiently tested using a small number of command terminals CMD during the test mode. Furthermore, the semiconductor memory MEM can be operated with the same interface specifications as the general-purpose memory during the normal mode.

  By changing only the address that needs to be changed and changing only the data that needs to be changed, the clock cycle required for the write operation can be minimized even when the number of command terminals CMD is small. Therefore, the semiconductor memory MEM can be efficiently tested, and the test time of the semiconductor memory MEM can be shortened.

  The above-described embodiments may be applied to other semiconductor memories such as SRAM (Static Random Access Memory), flash memory, ferroelectric memory, and MRAM (Magnetic Random Access Memory) instead of DRAM and SDRAM. The above-described embodiments may be applied to a clock asynchronous semiconductor memory.

The invention described in the above embodiments is organized and disclosed as an appendix.
(Appendix 1)
A plurality of first selection units that operate in response to a selection signal, receive a plurality of first command signals respectively supplied to a plurality of first command terminals, and output the received first command signals; ,
Connected to the output of the first selection unit, more than the number of the first command terminals, at least one is commonly connected to a plurality of the first selection unit, and output from one of the first selection units A plurality of holding units that hold the first command signal in response to the first synchronization signal and output the first command signal as a second command signal;
An operation control unit that outputs an operation control signal corresponding to the second command signal in response to a second synchronization signal that is less frequently generated than the first synchronization signal;
A memory cell accessed in response to the operation control signal;
A semiconductor memory comprising:
(Appendix 2)
It operates during a normal mode in which the memory cell is accessed by a user system, receives the first command signal supplied to the first command terminal and the second command terminal, respectively, and holds the received first command signal A second selection unit for outputting to the unit,
The sum of the number of the first command terminals and the number of the second command terminals is equal to the number of the holding units,
The second synchronization signal is generated less frequently than the first synchronization signal during a test mode for testing the memory cell, and is generated in response to the first synchronization signal during the normal mode,
The semiconductor memory according to appendix 1, wherein the first selection unit operates in response to the selection signal supplied during the test mode.
(Appendix 3)
A first signal generation unit for generating the first synchronization signal in synchronization with a clock signal;
The second synchronization signal is generated in synchronization with the first synchronization signal when the mask signal supplied via the external terminal is at an invalid level, and the second synchronization signal is generated when the mask signal is at an effective level. The semiconductor memory according to Supplementary Note 1 or Supplementary Note 2, further comprising: a second signal generation unit that stops the operation.
(Appendix 4)
The operation control unit includes a command decoder for decoding the second command signal,
The command decoder outputs the operation control signal according to a decoding result in response to the second synchronization signal, and prohibits the output of the operation control signal when the second synchronization signal is not generated. The semiconductor memory according to any one of Appendix 1 to Appendix 3.
(Appendix 5)
Selecting one of a plurality of first selection units according to a selection signal, and outputting a plurality of first command signals respectively supplied to the plurality of first command terminals via the selected first selection unit;
One of the first selection units is connected to a plurality of holding units connected to the output of the first selection unit and more than the number of the first command terminals and at least one of which is commonly connected to a plurality of the first selection units. The first command signal output from one is held in response to the first synchronization signal, and is output as the second command signal,
Outputting an operation control signal corresponding to the second command signal in response to a second synchronization signal that is less frequently generated than the first synchronization signal;
A method for operating a semiconductor memory, comprising: accessing a memory cell in accordance with the operation control signal.
(Appendix 6)
The first selection unit operates in a normal mode in which the memory cell is accessed by a user system, receives the first command signal supplied to the first command terminal and the second command terminal, respectively, and receives the first command signal. A command signal is output to the holding unit,
The sum of the number of the first command terminals and the number of the second command terminals is equal to the number of the holding units,
The second synchronization signal is generated less frequently during the test mode for testing the memory cell than the first synchronization signal, and is generated in response to the first synchronization signal during the normal mode;
6. The method of operating a semiconductor memory according to appendix 5, wherein the first selection unit operates upon receiving the selection signal supplied during the test mode.
(Appendix 7)
Generating the first synchronization signal in synchronization with a clock signal;
The second synchronization signal is generated in synchronization with the first synchronization signal when the mask signal supplied via the external terminal is at an invalid level, and the second synchronization signal is generated when the mask signal is at an effective level. The method of operating a semiconductor memory according to appendix 5 or appendix 6, wherein:
(Appendix 8)
In response to the second synchronization signal, the operation control signal corresponding to a decoding result is output from a command decoder that decodes the second command signal, and the command decoder outputs the operation control signal when the second synchronization signal is not generated. The operation method of the semiconductor memory according to any one of appendix 5 to appendix 7, wherein output of the operation control signal is prohibited.
(Appendix 9)
The semiconductor memory according to appendix 1,
A controller for accessing the semiconductor memory,
The controller is
Outputting the selection signal, the first command signal, and the first synchronization signal to cause the holding unit to hold the second command signal;
A system for outputting a signal for generating the second synchronization signal in order to output the operation control signal from the operation control unit in response to the second command signal held in the holding unit; .
(Appendix 10)
The semiconductor memory is
It operates during a normal mode in which the memory cell is accessed by a logic circuit provided in the system, and receives and receives the first command signal supplied from the logic circuit to the first command terminal and the second command terminal, respectively. A second selection unit that outputs the first command signal to the holding unit;
The sum of the number of the first command terminals and the number of the second command terminals is equal to the number of the holding units,
The second synchronization signal is generated less frequently than the first synchronization signal during a test mode for testing the memory cell, and is generated in response to the first synchronization signal during the normal mode,
The system according to claim 9, wherein the first selection unit operates in response to the selection signal supplied during the test mode.
(Appendix 11)
The controller is
The clock signal and the first command signal output from the logic circuit are output to the semiconductor memory during the normal mode, and the clock signal and the first command signal received at a test terminal are output during the test mode. A first control unit for outputting to the semiconductor memory;
A second control unit that outputs an address signal output from the logic circuit to the semiconductor memory during the normal mode, and outputs the address signal received at a test terminal to the semiconductor memory during the test mode;
A write data signal output from the logic circuit is output to the semiconductor memory during the normal mode, a read data signal output from the semiconductor memory is output to the logic circuit, and a test terminal is output during the test mode. A third control unit that outputs the write data signal received at the semiconductor memory and outputs the read data signal output from the semiconductor memory to a test terminal;
The semiconductor memory is
A first signal generation unit for generating the first synchronization signal in synchronization with a clock signal;
The signal for generating the second synchronization signal, and generating the second synchronization signal in synchronization with the first synchronization signal when a mask signal supplied via an external terminal is at an invalid level, The system according to claim 10, further comprising: a second signal generation unit that stops generating the second synchronization signal when the mask signal is at an effective level.
(Appendix 12)
A method for manufacturing the semiconductor memory mounted in the system according to appendix 11, wherein the controller and the semiconductor memory are set to the test mode,
Outputting the clock signal, the first command signal, the address signal, and the write data signal to the test terminal, setting the mask signal to an invalid level, and writing test data to the semiconductor memory;
Outputting the clock signal, the first command signal, and the address signal to the test terminal, setting the mask signal to an invalid level, and receiving the read data read from the semiconductor memory via the test terminal;
A method of manufacturing a semiconductor memory, comprising: judging whether the semiconductor memory is good or bad by comparing the received read data with an expected value.

  From the above detailed description, features and advantages of the embodiments will become apparent. This is intended to cover the features and advantages of the embodiments described above without departing from the spirit and scope of the claims. Further, any person having ordinary knowledge in the technical field should be able to easily come up with any improvements and modifications, and there is no intention to limit the scope of the embodiments having the invention to those described above. It is also possible to rely on suitable improvements and equivalents within the scope disclosed in.

  10, 10A, data input / output section; 12, 12A, address input section, 14, 14A, command input section, 16 ... command control section, 18, 18A, clock control section, 20, 20A, address selection section, 22 ... mode Register: 24: Command decoder; 26: Row address control unit: 28: Row timing control unit: 30: Column timing control unit: 32: Column address control unit: 34: Row control unit: 36: Column control unit: 38: Data Control unit: 40, column switch unit, 42, sense amplifier unit, 44, memory cell array, 100, memory core, ACTCNT, address command control unit, CLK, CLKIZ, CLKPZ, clock signal, CM, command mask terminal, CMD0 to CMD3 Command terminal; CNT Operation control signal; DTCNT Data control HLD0 to HLD2 holding unit; LOGIC logic circuit; MC memory cell; MCNT memory controller; MEM semiconductor memory; OPC operation control unit; SEL0-SEL2 selection unit; Test terminal; TEST ... Tester; TSYS ... Test system; USEL ... Selection unit

Claims (10)

A plurality of first selection units that operate in response to a selection signal, receive a plurality of first command signals respectively supplied to a plurality of first command terminals, and output the received first command signals; ,
Connected to the output of the first selection unit, more than the number of the first command terminals, at least one is commonly connected to a plurality of the first selection unit, and output from one of the first selection units A plurality of holding units that hold the first command signal in response to the first synchronization signal and output the first command signal as a second command signal;
An operation control unit that outputs an operation control signal corresponding to the second command signal in response to a second synchronization signal that is less frequently generated than the first synchronization signal;
A memory cell accessed in response to the operation control signal;
A semiconductor memory comprising: It operates during a normal mode in which the memory cell is accessed by a user system, receives the first command signal supplied to the first command terminal and the second command terminal, respectively, and holds the received first command signal A second selection unit for outputting to the unit,
The sum of the number of the first command terminals and the number of the second command terminals is equal to the number of the holding units,
The second synchronization signal is generated less frequently than the first synchronization signal during a test mode for testing the memory cell, and is generated in response to the first synchronization signal during the normal mode,
The semiconductor memory according to claim 1, wherein the first selection unit operates in response to the selection signal supplied during the test mode. A first signal generation unit for generating the first synchronization signal in synchronization with a clock signal;
The second synchronization signal is generated in synchronization with the first synchronization signal when the mask signal supplied via the external terminal is at an invalid level, and the second synchronization signal is generated when the mask signal is at an effective level. The semiconductor memory according to claim 1, further comprising: a second signal generation unit that stops the operation. The operation control unit includes a command decoder for decoding the second command signal,
The command decoder outputs the operation control signal according to a decoding result in response to the second synchronization signal, and prohibits the output of the operation control signal when the second synchronization signal is not generated. The semiconductor memory according to any one of claims 1 to 3. Selecting one of a plurality of first selection units according to a selection signal, and outputting a plurality of first command signals respectively supplied to the plurality of first command terminals via the selected first selection unit;
One of the first selection units is connected to a plurality of holding units connected to the output of the first selection unit and more than the number of the first command terminals and at least one of which is commonly connected to a plurality of the first selection units. The first command signal output from one is held in response to the first synchronization signal, and is output as the second command signal,
Outputting an operation control signal corresponding to the second command signal in response to a second synchronization signal that is less frequently generated than the first synchronization signal;
A method for operating a semiconductor memory, comprising: accessing a memory cell in accordance with the operation control signal. The first selection unit operates in a normal mode in which the memory cell is accessed by a user system, receives the first command signal supplied to the first command terminal and the second command terminal, respectively, and receives the first command signal. A command signal is output to the holding unit,
The sum of the number of the first command terminals and the number of the second command terminals is equal to the number of the holding units,
The second synchronization signal is generated less frequently during the test mode for testing the memory cell than the first synchronization signal, and is generated in response to the first synchronization signal during the normal mode;
The method of operating a semiconductor memory according to claim 5, wherein the first selection unit operates in response to the selection signal supplied during the test mode. A semiconductor memory according to claim 1;
A controller for accessing the semiconductor memory,
The controller is
Outputting the selection signal, the first command signal, and the first synchronization signal to cause the holding unit to hold the second command signal;
A system for outputting a signal for generating the second synchronization signal in order to output the operation control signal from the operation control unit in response to the second command signal held in the holding unit; . The semiconductor memory is
It operates during a normal mode in which the memory cell is accessed by a logic circuit provided in the system, and receives and receives the first command signal supplied from the logic circuit to the first command terminal and the second command terminal, respectively. A second selection unit that outputs the first command signal to the holding unit;
The sum of the number of the first command terminals and the number of the second command terminals is equal to the number of the holding units,
The second synchronization signal is generated less frequently than the first synchronization signal during a test mode for testing the memory cell, and is generated in response to the first synchronization signal during the normal mode,
The system according to claim 7, wherein the first selection unit operates in response to the selection signal supplied during the test mode. The controller is
The clock signal and the first command signal output from the logic circuit are output to the semiconductor memory during the normal mode, and the clock signal and the first command signal received at a test terminal are output during the test mode. A first control unit for outputting to the semiconductor memory;
A second control unit that outputs an address signal output from the logic circuit to the semiconductor memory during the normal mode, and outputs the address signal received at a test terminal to the semiconductor memory during the test mode;
A write data signal output from the logic circuit is output to the semiconductor memory during the normal mode, a read data signal output from the semiconductor memory is output to the logic circuit, and a test terminal is output during the test mode. A third control unit that outputs the write data signal received at the semiconductor memory and outputs the read data signal output from the semiconductor memory to a test terminal;
The semiconductor memory is
A first signal generation unit for generating the first synchronization signal in synchronization with a clock signal;
The signal for generating the second synchronization signal, and generating the second synchronization signal in synchronization with the first synchronization signal when a mask signal supplied via an external terminal is at an invalid level, The system according to claim 8, further comprising: a second signal generation unit that stops generating the second synchronization signal when a mask signal is at an effective level. A method for manufacturing the semiconductor memory mounted in the system according to claim 9, wherein the controller and the semiconductor memory are set to the test mode,
Outputting the clock signal, the first command signal, the address signal, and the write data signal to the test terminal, setting the mask signal to an invalid level, and writing test data to the semiconductor memory;
Outputting the clock signal, the first command signal, and the address signal to the test terminal, setting the mask signal to an invalid level, and receiving the read data read from the semiconductor memory via the test terminal;
A method of manufacturing a semiconductor memory, comprising: judging whether the semiconductor memory is good or bad by comparing the received read data with an expected value.

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