JP2013057622A - Test lead storage structure with cap and measuring instrument - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a measuring instrument including a test lead with a cap for making work for cap attachment/detachment very simple and eliminating the need for performing artificial cap attachment/detachment operation, and a test lead storage structure with a cap.SOLUTION: A collar-shaped part to be held 54 is formed on a cap 50 detachable from a tip of a test lead 3; a measuring instrument body 2 is provided with a holding part 60 for detachably holding the part to be held 54 of the cap 50; the holding part 60 of the measuring instrument body 2 holds the part to be held 54 of the cap 50 with the cap 50 attached to the tip of the test lead 3; (a) only the test lead 3 is taken out of the measuring instrument body 2 in pull-out operation of the test lead 3 in one direction with respect to the measuring instrument body 2; and (b) the test lead 3 is taken out of the measuring instrument body 2 with the cap 50 attached in pull-out operation of the test lead 3 in another direction with respect to the measuring instrument body 2.

Description

  The present invention generally relates to a measuring instrument for measuring voltages such as a handy DMM (digital multimeter), a handy clamp, and a megger capable of measuring various measurement categories, and in particular, various measurement categories can be measured. The present invention relates to a measuring instrument having a test lead with a cap and a storage structure for a test lead with a cap in such a measuring instrument.

  FIG. 7 shows an overall configuration of a conventional measuring apparatus 1A such as a handy DMM capable of measuring various measurement categories, for example, a voltage of CAT II (category II) and CAT III (category III) or higher. The measuring instrument 1A includes a meter body 2 and a pair of plus and minus test leads 3 (3A, 3B) connected to the meter body 2. The meter body 2 is provided with a measurement changeover switch 4 and a digital display unit 5.

  The positive and negative test leads 3 (3A, 3B) have the same shape and structure, and are provided with an insulating grip 31 having a substantially cylindrical shape as shown in FIG. The tip 32 is provided with a probe 32 protruding from the end surface 31a1 by a predetermined length (L1). The probe 32 is a metal elongated bar, and is electrically connected to the lead wire 33 inside the insulating grip 31. The lead wire 33 is pulled out from the rear end portion 31 b of the grip 31, and the end portion is electrically connected to the meter main body 2.

  When using the meter 1A, the user turns the measurement changeover switch 4 provided in the meter body 2, which is a rotary switch in this example, and sets the measurement object.

  Here, in the case of measuring the voltage, from the point of safety, according to the place where the voltage is measured, that is, a so-called measurement place where the voltage to be measured is a low voltage such as a 100V outlet, for example. However, in CATII (category II) voltage measurement, the probe tip metal part 32 can be brought into contact with the metal part in the outlet at the measurement location at the time of measurement. There is no constraint on the protrusion length (L1).

  On the other hand, in the voltage measurement where the voltage to be measured is a high voltage of, for example, a distribution board of 200 V, that is, the measurement location is CAT III (category III) or higher, the probe 32 which is the probe tip metal part is measured at the measurement location. It is required to have a structure that is difficult to contact other metal parts. Therefore, the protruding length (L1) of the probe 32 from the grip tip surface 32a1 is 4 mm or less.

  Therefore, as described in Patent Document 1, for example, the probe is movably arranged in the grip, and the amount of protrusion of the probe from the grip is adjusted according to the use state by the chuck sleeve provided at the tip of the grip. And fixing to the grip is also conceivable.

  However, the structure of Patent Document 1 has a large overall structure and requires adjustment of the protruding amount of the probe by the chuck sleeve for each measurement, which is problematic in terms of operability.

  In order to solve such a problem, at present, as shown in FIGS. 7 and 8 (b), the removable caps 50 (50A, 50B) are respectively attached to the tips of the test leads 3 (3A, 3B). ) Are provided separately, and at the time of voltage measurement of CATIII (category III) or higher, the cap 50 (50A, 50B) is fitted to the tip end portion 31a of the test lead, that is, the tip end region 31a of the grip 31, and the test lead 3 (3A 3B) is used as a unit.

  Normally, when not in use, the cap 50 (50A, 50B) is detachably stored in the storage section provided in the storage outer box 100 of the measuring instrument 1 together with the test leads 3 (3A, 3B) as shown in FIG. It has been.

  The cap 50 is formed of the same insulating material as that of the grip 31, and the size and shape of the cap 50 is the length of protrusion of the probe 32 from the cap 50 (with the cap 50 attached to the test lead tip 31a ( L2) is made to be 4 mm or less.

As described above, the measuring instrument having a structure in which the cap 50 currently used is separately provided is as follows.
(1) There is no need to replace the test lead itself even if the measurement target category is different.
(2) Only the work of attaching / detaching the cap to / from the tip of the test lead is sufficient.
(3) Therefore, it does not complicate the structure of the measuring device or increase the price significantly.
It has the following advantages.

Japanese Utility Model Publication No. 6-45898

However, when attention is paid to the attaching / detaching operation of the cap 50 to the tip portion of the test lead in the measuring device having the structure shown in FIGS. 7, 8 </ b> A, and 8 </ b> B, when measuring a voltage of CAT III (category III) or higher, Work is required.
STEP 1: The test lead 3 is removed from the storage part of the measuring instrument outer box 100.
STEP 2: Remove the cap 50 from the storage unit.
STEP 3: A cap 50 is attached to the test lead 3.
STEP 4: Measure.
STEP 5: Remove the cap 50 from the test lead 3.
STEP 6: The cap 50 is housed in the housing portion of the measuring instrument outer box 100.
STEP 7: The test lead 3 is stored in the storage unit of the measuring instrument outer box 100.

  On the other hand, at the time of voltage measurement of CAT II (category II), the above STEPs 2, 3, and 5, 6 are omitted, and the total is 3 STEP.

  As described above, when measuring a voltage of CAT III (category III) or higher with a measuring instrument having the structure shown in FIGS. 7, 8A, and 8B, many work procedures are required for attaching and detaching the cap. The simplification of the operation is eagerly desired.

  SUMMARY OF THE INVENTION An object of the present invention is to provide a measuring instrument having a test lead with a cap in which the work for attaching and detaching a cap becomes extremely simple and eliminates the need to perform the cap attaching / detaching operation manually, and a test lead storage structure with a cap in such a measuring instrument Is to provide.

The above object is achieved by the test lead storage structure with cap and the measuring instrument according to the present invention. In summary, according to one aspect of the present invention, a test lead with a cap in a measuring instrument capable of voltage measurement with different categories to be measured by attaching / detaching a cap to / from a test lead connected to the measuring instrument body. A storage structure,
A hook-shaped held portion is formed on the cap that can be attached to and detached from the tip portion of the test lead, and the measuring instrument body is provided with a holding portion that holds the held portion of the cap in a removable manner.
With the cap attached to the tip of the test lead, the held portion of the cap portion is held by the holding portion of the measuring instrument body,
The holding part is
(A) In the pull-out operation in one direction with respect to the measuring instrument main body of the test lead, by holding the cap, only the test lead is taken out from the measuring instrument main body,
(B) In the pulling-out operation of the test lead in the other direction different from the one direction with respect to the measurement device main body, the test lead does not hold the cap, and the test lead is mounted with the cap in the measurement. Taken out from the device itself,
A capped test lead storage structure is provided.

According to an embodiment of the present invention, the test lead includes an elongated grip and a probe protruding from the tip of the grip,
The cap has a support portion that fits into a distal end portion of the elongated grip, and a probe covering portion in which a through hole through which the probe of the grip passes is formed, and the support portion has the hook shape A held part is formed.

  According to another embodiment of the present invention, the holding portions are arranged spaced apart from each other by a predetermined gap (g) along the axial direction of the capped test lead, and are fixed to the measuring instrument body. The hook-shaped held portion is detachably held in the gap (g).

  According to another embodiment of the present invention, the first and second holders are made of resin or metal, the shape perpendicular to the axial direction of the capped test lead is an annular shape, and the capped test is further performed. A part is cut off along the axial direction of the lead to form an opening for mounting the capped test lead.

  According to another embodiment of the present invention, the holding portion is formed so as to protrude perpendicularly to the measuring device main body, and forms a pair that is arranged in parallel with each other at a predetermined interval. There are two holders, a groove is formed on the opposing surfaces of the first and second holders, and the hook-like held portion is detachably held in the grooves formed on the opposing surfaces of the first and second holders. Is done.

According to another aspect of the present invention, in a measuring instrument capable of voltage measurement with different categories of measurement objects by attaching and detaching a cap to a test lead connected to the measuring instrument body,
A storage structure for detachably storing a test lead with a cap in a state in which the cap is attached to the test lead is detachably stored in the measurement device main body, and the storage structure has any one of the above-described configurations. A measuring instrument characterized by having a test lead storage structure with a cap is provided.

  According to the present invention, the work for attaching and detaching the cap becomes extremely simple, and it is possible to eliminate the need to perform the cap attaching and detaching operation artificially.

FIG. 1A is a diagram showing an overall configuration of a measuring instrument having a test lead with a cap configured according to the present invention, and FIG. 1B is a portion of a test lead storage structure with a cap according to the present invention. FIG. 1C is an enlarged view, and FIG. 1C is a perspective view of a holding unit that holds a test lead with a cap. It is a front view of a cap and a test lead. FIG. 3A is a partially enlarged view of another embodiment of a test lead storage structure with a cap according to the present invention, and FIG. 3B shows another embodiment of a holding portion for holding a test lead with a cap. FIG. FIGS. 4A and 4B are diagrams for explaining how to use a test lead with a cap. FIG. 4A shows a state where the test lead is housed in the apparatus main body, and FIG. 4B shows a state where only the test lead is removed. Yes. FIGS. 5A and 5B are diagrams illustrating a usage mode of a test lead with a cap. FIG. 5A shows a state where the test lead is housed in an apparatus main body, and FIG. 5B shows a state where a test lead with a cap is removed. ing. It is a figure which shows the whole structure of the measuring device provided with the test lead with a cap explaining the other Example of the test lead storage structure with a cap concerning this invention. It is a figure which shows the whole structure of the conventional measuring instrument. FIGS. 8A and 8B are diagrams illustrating a usage state of a conventional test lead with a cap, FIG. 8A is a front view of the test lead, and FIG. 8B is a partial cross-sectional front view of the test lead with a cap. .

  Hereinafter, a measuring device provided with a test lead with a cap according to the present invention and a test lead storage structure with a cap in such a measuring device will be described in more detail with reference to the drawings.

Example 1
(Overall configuration of measuring equipment)
FIG. 1 shows an embodiment of a measuring instrument equipped with a capped test lead constructed according to the present invention and a capped test lead storage structure.

  The overall configuration of the measuring instrument including the capped test lead is the same as that of the conventional measuring instrument 1A described with reference to FIGS. 7, 8A, and 8B.

  That is, as shown in FIG. 1, the measuring device 1 includes a meter body 2 and a plus / minus pair of test leads 3 (3A, 3B) connected to the meter body 2. The meter body 2 is provided with a measurement changeover switch 4 and a digital display unit 5.

  The plus and minus test leads 3A and 3B have the same shape and structure, and have the same configuration as the conventional test lead 3 (3A and 3B) shown in FIG. That is, referring to FIG. 2, also in the present embodiment, the test lead 3 includes an insulating elongated grip 31 whose outer cross section is formed in a substantially cylindrical shape extending in a substantially circular axial direction. Of course, the grip 31 can also have a polygonal cross section. The grip 31 normally has a diameter (d31) of about 6 mm and an overall length (L3) of about 90 mm. The tip 32 of the grip 31 is provided with a probe 32 protruding from the end surface 31a1 by a predetermined length (L1) (L1 = about 10 mm). The probe 32 is a metal elongated bar having a diameter of about 2 mm, and is electrically connected to the lead wire 33 inside the insulating grip 31. A lead wire 33 is drawn out from the rear end portion 31 b of the grip 31, and the end portion of the lead wire 33 is electrically connected to the meter body 2. Conventionally, the grip 31 has a diameter (d34) formed of a ring-shaped convex portion protruding in an annular shape at a position adjacent to the probe 32 at the tip (distance L34 = about 10 mm from the tip surface 31a1), about 8 mm. A barrier 34 having a thickness (t34) of about 1 mm is formed. The barrier 34 has an anti-slip function that prevents the user's finger from coming into contact with the sliding probe 32 during use.

  Also in this embodiment, as shown in FIG. 2, caps 50 (50A, 50B) provided separately are detachably attached to the tip portions 31a of the test leads 3 (3A, 3B), respectively. It is said that.

  That is, when measuring a voltage of CAT III (category III) or higher, the cap 50 (50A, 50B) is fitted to the tip end portion 31a of the test lead, that is, the tip end region 31a of the grip 31, and used as a unit with the grip 31.

  The cap 50 has the same configuration as the conventional one, and includes a cylindrical support portion 51 having an inner hole 51a fitted to the grip tip portion 31a, and a through hole 52a through which the probe 32 protruding from the grip tip portion 31a passes. The probe covering portion 52 that has been formed and the connecting portion 53 that connects the support portion 51 and the probe covering portion 52 are provided. The outer diameter (d50) of the support portion 51 is substantially the same as the outer diameter (d34) of the barrier 34.

  However, according to the present embodiment, as will be described in detail later, the cylindrical support portion 51 has a ring shape protruding in an annular shape at the end of the cylindrical support portion 51 opposite to the probe covering portion 52. A barrier 54 composed of convex portions is formed. As will be described in detail later, the barrier 54 functions as a held portion for holding the cap 50 in the holding portion 60 provided in the apparatus main body 2 and the finger of the user at the time of measurement using the cap 50. It has a non-slip function for preventing the contact with the sliding probe 32. Usually, the total length (L50) of the cap 50 is about 16 mm, the diameter (d54) of the barrier 54 of the cap 50 is 8 to 12 mm, and the thickness (t54) is 1 to 2 mm.

  Next, a test lead storage structure with a cap that characterizes the present invention will be described.

(Test lead storage structure with cap)
As shown in FIG. 1 (a), the measuring device 1 of the present invention is different from the conventional measuring device 1A shown in FIG. 7 in the storage structure of the test leads 3 (3A, 3B) and the cap 50 (50A, 50B). to differ greatly.

  That is, in the conventional measuring instrument 1A, it is individually housed in the housing provided in the outer box 100 that houses the measuring instrument body 2, but according to the present invention, the test lead 3 (3A, 3B) and the cap 50 (50A, 50B) is detachably accommodated in a holding portion 60 (60A, 60B) provided on the side surface of the measuring instrument main body 2 in a state of being integrally attached.

  More specifically, according to the present embodiment, as shown in FIG. 1A, a pair of plus and minus test leads 3 (3A, 3B) to which caps 50 (50A, 50B) are respectively attached are separated, for example, The positive test lead 3A, to which the cap 50A is integrally attached, is provided on the right side surface of the main body 2, and the negative test lead 3B, to which the cap 50B is integrally attached, is provided on the left side surface of the main body 2, and the holding portion 60 (60A 60B) is detachably attached and stored.

  Since the holding portions 60A and 60B of the capped test lead have the same structure, the holding portion 60A provided on the right side surface of the main body 2 will be described.

  In this embodiment, as shown in FIGS. 1B and 1C, the holding portion 60A is a holding portion, that is, a first holding portion for holding the hook-like barrier portion 54 formed on the cap 50A from above and below. 1 and second holders 61 and 62, and are integrally attached to the apparatus main body 2. In this embodiment, the holders 61 and 62 are made of resin or metal, and members having widths H1 and H2 and thicknesses T1 and T2 are formed into a ring shape, for example, a substantially circular shape, and a part of the circumference is an axis. The openings P1 and P2 having widths W1 and W2 are formed by cutting in the direction. That is, the holders 61 and 62 form a C-shaped elastic holding member.

  Also, the C-shaped holders 61 and 62 are separated from each other by a predetermined distance (g) so as to form a gap suitable for holding the bowl-shaped barrier portion (held portion) 54 of the cap 50A from above and below. Are arranged. That is, the distance (g) is the same as or slightly smaller than the thickness (t54) of the bowl-shaped barrier portion, and the bowl-shaped barrier portion 54 can be freely inserted into and removed from the gap (g) by a slight pressing force. Is preferred.

  Further, in the present embodiment, the holders 61 and 62 are adapted to the support portion 51 and the cylindrical portion 31a at the inner periphery so that the support portion 51 of the cap 50A and the tip cylindrical portion 31a of the test lead 3A can be held. It is a shape dimension. Therefore, when the test lead 3A with cap is stored in the main body 2, the support portion 51 of the cap 50A and the columnar tip portion 31a of the test lead 3A are brought into contact with the openings P1 and P2 of the holders 61 and 62, Further, when the holders 61 and 62 are pressed toward the side of the main body, the openings P1 and P2 of the holders 61 and 62 are elastically expanded to receive the support portion 51 of the cap 50A and the tip portion 31a of the test lead 3A, and then elastically. Thus, the support portion 51 of the cap 50A and the tip portion 31a of the test lead 3A can be held.

  At this time, the ring-shaped barrier portion of the cap 50 </ b> A, that is, the flange portion 54 is inserted and installed in the separation portion (g) between the holders 61 and 62. Therefore, in the cap 50 </ b> A, the support portion 51 is held by the holder 61, and the flange portion 54 is held by the holders 61 and 62. In the present embodiment, the tip end portion 31 a of the test lead 3 A, that is, the tip cylindrical region between the ring-shaped barrier portion 34 and the flange portion 54 of the cap 50 A is simultaneously held by the holder 62. This state is shown in FIG.

(Modified Example 1)
In the above embodiment, the holders 61 and 62 are described as holding the support portion 51 of the cap 50A and the tip portion 31a of the test lead 3A together with the flange portion 54 of the cap 50A. However, the present invention is not limited to this. .

  That is, as shown in FIG. 3A, the barrier portion 54 formed on the cap 50A is not formed on the end surface portion of the cap support portion 51, but the cap support portion 51 is further moved toward the barrier portion 34 of the test lead 31. The holders 61 and 62 may sandwich the barrier portion 54 of the cap 50 </ b> A and hold the both-side support portion regions 51 of the barrier portion 54.

  Also in the configuration of this modified embodiment, the test lead 3A itself has its tip portion 31a and the probe portion 32 resiliently fitted and attached to the cap 50A, so that the test lead 3A itself will not fall out of the cap 50A when stored in the main body. Absent.

(Modified Example 2)
FIG. 3B shows another embodiment of the holding unit 60 (60A, 60B). Since the holding units 60A and 60B have the same configuration, only the holding unit 60A is shown in FIG.

  That is, in the second modified embodiment, the holding portion 60A is configured by first and second holders 61 and 62 that are formed so as to protrude perpendicularly from the side surface of the measuring instrument body 2 and are arranged in parallel to each other. The holders 61 and 62 are made of, for example, resin or metal. In this example, the holders 61 and 62 are rectangular plate members having a width H0, a length W0, and a thickness T0. However, the present invention is not limited to this. Usually, the width H0 is 8 mm, the length W0 is 8 mm, and the thickness T0 is about 2 mm.

  Further, in the holders 61 and 62, a groove 63 is formed on the inner surfaces facing each other toward the device body. The groove width (g0) is the same as or slightly smaller than the thickness (t54) of the bowl-shaped barrier portion 54, and the holder inner surface interval (w1) and the maximum groove interval (w2) are respectively The outer diameter (d50) and the diameter (d54) of the flange 54 are substantially the same. Accordingly, the bowl-shaped barrier portion 54 can be inserted into and removed from the groove portion 63 with a slight pressing force.

  As described above, the holding portion 60 (60A, 60B) provided in the measuring instrument main body 2 has a structure that can detachably and elastically hold the bowl-shaped barrier portion 54 of the cap 50 (50A, 50B). If it exists, it is not limited to the said structure, Various structures are possible.

  Next, the usage mode of the test lead with a cap in the measuring instrument having the test lead storage structure of Example 1 described with reference to FIGS. 1 and 2 will be described.

  Since the holding portions 60A and 60B of the capped test lead have the same structure, the holding portion 60A provided on the right side surface of the main body 2 will be described.

(Usage of test lead with cap)
According to the measuring instrument 1 of the present embodiment, as shown in FIG. 1A, the measuring lead 3 (3A, 3B) and the cap 50 (50A, 50B) are integrally attached to the measuring instrument. It is stored in the side surface of the main body 2 by the holding portion 60 (60A, 60B).

  First, a description will be given of a case where the voltage to be measured is a low voltage such as a 100 V outlet, that is, the voltage measurement is performed at a so-called measurement location CAT II (category II). In this case, measurement with the test leads 3A and 3B is possible, and it is not necessary to attach the caps 50A and 50B to the test lead tip 31a.

  Therefore, as shown in FIG. 4A, the test lead 3A that is detachably attached to the side surface of the measuring instrument body 2 by the holding portion 60A is shown in FIG. Pull downward in the direction of arrow B. Since the flange portion 54 of the cap 50A is held between the holders 61 and 62, only the test lead 3A is pulled downward by a pulling operation in one direction with respect to the test lead 3A. The cap 50A is held by the holding portion 60A (see FIG. 4B).

  When the measurement is completed, the test lead 31A can be housed by inserting it from below as shown in FIG. 4 (b) so that the tip 31a fits into the cap support portion cylindrical hole 51a. At this time, since the cap itself is held by the holding portion 60A, it is easy to attach the test lead 3A to the cap 50A from below.

As described above, the following work is required when measuring the voltage of CAT II (category II).
STEP 1: The test lead 3A is removed from the holding part 60A of the measuring device 1. At this time, the test lead 3A is taken out without a cap by a pulling operation in the direction 1 (the direction of the arrow B which is the axial direction of the test lead 3A).
STEP 2: Measure.
STEP 3: The test lead 3A is stored in the holding unit 60A of the measuring device. At this time, it is attached from the direction opposite to direction 1 (arrow B direction). The test lead 3A is easily stored in the measuring device storage portion by the holding portion 60A and the cap 50A.

  Next, a description will be given of a case where the voltage to be measured is a high voltage, for example, a 200 V distribution board, and so-called voltage measurement is performed at a so-called measurement location of CAT III (category III) or higher. In this case, measurement with the test lead 3A is impossible, and the cap 50A must be attached to the tip of the test lead.

  Accordingly, as shown in FIG. 5A, the test lead 3A that is detachably attached to the side surface of the measuring instrument body 2 by the holding portion 60A is replaced with the test lead 3A shown in FIG. ) Is pulled in the direction of the arrow C in the right direction perpendicular to the B direction which is the axial direction of the test lead 3A in this embodiment, which is different from the B direction (FIG. 4A).

  The cap 50 </ b> A and the test lead 3 </ b> A are pulled out from the openings P <b> 1 and P <b> 2 of the holders 61 and 62. That is, the capped test lead 3A is separated from the main body 2 and removed. Therefore, the user can immediately move to the measurement work.

The following work is required when measuring voltages above CAT III (Category III).
STEP 1: The test lead 3A is removed from the holding unit 60A of the measuring device 2. At this time, it is taken out in a state with a cap by an extraction operation in a direction 2 different from the direction 1.
STEP 2: Measure.
STEP 3: The test lead 3A with a cap is stored in the holding unit 60A of the measuring device 2. At this time, by attaching from the direction opposite to direction 2, the attachment with the cap is possible.

  Thus, according to the present invention, the operation of 3 STEP is sufficient regardless of the difference in measurement category. In the conventional example, as described above, 7 STEP is required when measuring a voltage of CAT III (category III) or higher. In the present invention, the work for attaching and detaching the cap becomes extremely simple, and it is possible to eliminate the need to perform the cap attaching and detaching operation artificially.

Of course, also in the present invention, the measurement instrument having a structure in which the cap 50 used conventionally is separately provided has the following advantages:
(1) Even if the measurement target category is different, that is, there is no need to replace the test lead itself due to a difference in measured voltage.
(2) Only the work of attaching / detaching the cap to / from the tip of the test lead is sufficient.
(3) Therefore, the structure of the measuring device is not complicated, and the price is not significantly increased.
There are also advantages such as.

Example 2
FIG. 6 shows another embodiment of the test lead storage structure with a cap according to the present invention. In the first embodiment, the test leads 3 (3A, 3B) with caps forming a plus / minus pair are individually stored, for example, on the side surface of the measuring instrument 1 by the holder 60 (60A, 60B). did.

  According to the present embodiment, as shown in FIG. 6, two test leads with caps that make a pair can be housed together in, for example, the holding portion 60 provided on the side surface or the like of the measuring device 1. Of course, in this case, the holders 61 and 62 of the holding unit 60 protrude from the side surface of the measuring device and are sized to accommodate the two caps 50 (50A and 50B).

  In the present embodiment, it is obvious that the same effect as in the first embodiment can be achieved.

DESCRIPTION OF SYMBOLS 1 Measuring apparatus 2 Apparatus main body 3 (3A, 3B) Test lead 4 Switch 5 Display part 31 Grip 31a Grip tip part 32 Probe 33 Lead wire 34 Barrier part 50 (50A, 50B) Cap 51 Support part 52 Probe cover part 54 Barrier part (saddle part, held part)
60 (60A, 60B) Holding part 61, 62 Holder

Claims (6)

A storage structure for a test lead with a cap in a measuring instrument capable of voltage measurement with different categories of measurement objects by attaching and detaching the cap to the test lead connected to the measuring instrument body,
A hook-shaped held portion is formed on the cap that can be attached to and detached from the tip portion of the test lead, and the measuring instrument body is provided with a holding portion that holds the held portion of the cap in a removable manner.
With the cap attached to the tip of the test lead, the held portion of the cap is held by the holding portion of the measuring instrument body,
The holding part is
(A) In the pull-out operation in one direction with respect to the measuring instrument main body of the test lead, by holding the cap, only the test lead is taken out from the measuring instrument main body,
(B) In the pulling-out operation of the test lead in the other direction different from the one direction with respect to the measurement device main body, the test lead does not hold the cap, and the test lead is mounted with the cap in the measurement. Taken out from the device itself,
Storage structure for test leads with caps. The test lead has an elongated grip and a probe protruding from the tip of the grip,
The cap includes a support portion that fits into a tip end portion of the grip, and a probe covering portion in which a through hole through which the probe of the grip passes is formed. Forming a holding part,
The storage structure for a test lead with a cap according to claim 1.   The holding portion includes first and second holders that are spaced apart from each other by a predetermined gap (g) along the axial direction of the capped test lead, and are attached to the measuring instrument body, The storage structure for a test lead with a cap according to claim 2, wherein the hook-shaped held portion is detachably held in the gap (g).   The first and second holders are made of resin or metal, the shape orthogonal to the axial direction of the capped test lead is a ring shape, and a part is further along the axial direction of the capped test lead 4. The storage structure for a capped test lead according to claim 3, wherein the storage structure is formed by cutting and forming an opening for mounting the capped test lead.   The holding portion includes first and second holders that are formed to protrude perpendicularly to the measuring device main body and that are paired in parallel with each other at a predetermined interval. 3. A groove is formed on an opposing surface of the second holder, and the hook-shaped held portion is detachably held in the groove formed on the opposing surfaces of the first and second holders. Storage structure for test leads with caps as described. In a measuring instrument that can measure voltage with different categories of measurement objects by attaching and detaching the cap to the test lead connected to the measuring instrument body,
A storage structure for detachably storing a test lead with a cap in a state in which the cap is attached to the test lead in the measurement device main body, the storage structure being any one of claims 1 to 5. A measuring instrument comprising the test lead storage structure with a cap according to the item.

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