JP2013032980A - Method for detecting missing parts - Google Patents

Method for detecting missing parts Download PDF

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JP2013032980A
JP2013032980A JP2011169326A JP2011169326A JP2013032980A JP 2013032980 A JP2013032980 A JP 2013032980A JP 2011169326 A JP2011169326 A JP 2011169326A JP 2011169326 A JP2011169326 A JP 2011169326A JP 2013032980 A JP2013032980 A JP 2013032980A
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camera
inspected
circuit element
circuit board
inspection method
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Seiji Yamashita
清司 山下
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Toyota Motor Corp
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Toyota Motor Corp
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Abstract

PROBLEM TO BE SOLVED: To provide a method for detecting missing parts capable of accurately detecting presence/absence of inspection objects on an inspection object surface such as whether or not an electronic component is mounted on a substrate.SOLUTION: A method for detecting missing parts inspects presence/absence of an inspection object 22 on an inspection object surface (an upper surface of a substrate 21) with luminance information captured by a camera 11. Either one of the surface of the inspection object 22 and the inspection object surface (the upper surface of the substrate 21) is configured to be a rugged surface 22b where reflected light 32 is less likely to enter the camera 11. Thereby, the presence/absence of the inspection object 22 produces a significant intensity difference in the luminance on an image captured by the camera 11.

Description

本発明は、被検査面における被検査対象物の存否、例えば基板上の電子部品の有無をカメラにより自動判定するための欠品検査方法に関するものである。   The present invention relates to a shortage inspection method for automatically determining the presence or absence of an object to be inspected on a surface to be inspected, for example, the presence or absence of an electronic component on a substrate by a camera.

従来から、電子回路基板の製造工程において、所定の基板上に電子部品が実装されているか否かを検査する方法にカメラを用いた検査方法がある。
従来のこの種の技術としては、特許文献1に記載のものがあった。
これは、図10(a),(b)に示すように、光源101による光が照射された、電子部品103が実装された基板104〔図10(a)〕と、実装されていない基板105〔図10(b)〕との輝度情報をカメラ102で各々取り込み、それらを比較して電子部品103の欠品を検査するというものである。
Conventionally, in an electronic circuit board manufacturing process, there is an inspection method using a camera as a method for inspecting whether or not an electronic component is mounted on a predetermined substrate.
There existed the thing of patent document 1 as this kind of conventional technology.
As shown in FIGS. 10 (a) and 10 (b), the substrate 104 (FIG. 10 (a)) on which the electronic component 103 is mounted and irradiated with the light from the light source 101 and the unmounted substrate 105 are mounted. Luminance information as shown in FIG. 10B is captured by the camera 102 and compared to inspect for missing parts of the electronic component 103.

特開平06−201603号公報Japanese Patent Laid-Open No. 06-201603

しかしながら上記従来技術では、得られた輝度情報において、電子部品103が実装された基板104と、実装されていない基板105との輝度差が小さく、電子部品103の欠品を検査できないことがある。   However, in the above-described conventional technology, in the obtained luminance information, there is a small difference in luminance between the board 104 on which the electronic component 103 is mounted and the board 105 on which the electronic component 103 is not mounted.

本発明の課題は、所定の基板上に電子部品が実装されているか否か等、被検査面における被検査対象物の存否を的確に検査できる欠品検査方法を提供することにある。   An object of the present invention is to provide a missing part inspection method capable of accurately inspecting the presence or absence of an object to be inspected on a surface to be inspected, such as whether or not an electronic component is mounted on a predetermined substrate.

上記課題を達成するために、請求項1に記載の発明は、被検査面における被検査対象物の存否をカメラで取り込んだ輝度情報によって検査する欠品検査方法であって、前記被検査対象物の表面と前記被検査面とのうち、いずれか一方の面をその面からの反射光が前記カメラに入射しにくい表面状態とし、他方の面をその面からの反射光が前記カメラに入射しやすい表面状態としたことを特徴とする。
請求項2に記載の発明は、請求項1に記載の欠品検査方法において、被検査対象物の表面を、その面からの反射光がカメラに入射しにくい表面状態としたことを特徴とする。
請求項3に記載の発明は、請求項1に記載の欠品検査方法において、被検査面を、その面からの反射光がカメラに入射しにくい表面状態としたことを特徴とする。
請求項4に記載の発明は、請求項1、2又は3に記載の欠品検査方法において、反射光がカメラに入射しにくい表面状態は凹凸面であることを特徴とする。
請求項5に記載の発明は、請求項1〜4のいずれかの請求項に記載の欠品検査方法において、被検査対象物は電子部品であることを特徴とする。
請求項6に記載の発明は、請求項1〜5のいずれかの請求項に記載の欠品検査方法において、被検査面は電子回路基板面であることを特徴とする。
請求項7に記載の発明は、請求項5又は6に記載の欠品検査方法において、電子部品は電子回路素子であることを特徴とする。
In order to achieve the above object, the invention described in claim 1 is a shortage inspection method for inspecting the presence / absence of an object to be inspected on a surface to be inspected by luminance information captured by a camera, wherein the object to be inspected is provided. One of the surface and the surface to be inspected is in a surface state in which reflected light from the surface is difficult to enter the camera, and the other surface is reflected from the surface into the camera. It is characterized by an easy surface condition.
According to a second aspect of the present invention, in the shortage inspection method according to the first aspect, the surface of the object to be inspected is in a surface state in which reflected light from the surface hardly enters the camera. .
According to a third aspect of the present invention, in the shortage inspection method according to the first aspect, the surface to be inspected is in a surface state in which reflected light from the surface hardly enters the camera.
According to a fourth aspect of the present invention, in the shortage inspection method according to the first, second, or third aspect, the surface state in which the reflected light is less likely to enter the camera is an uneven surface.
According to a fifth aspect of the present invention, in the shortage inspection method according to any one of the first to fourth aspects, the object to be inspected is an electronic component.
According to a sixth aspect of the present invention, in the shortage inspection method according to any one of the first to fifth aspects, the surface to be inspected is an electronic circuit board surface.
According to a seventh aspect of the present invention, in the shortage inspection method according to the fifth or sixth aspect, the electronic component is an electronic circuit element.

本発明によれば、被検査面における被検査対象物の存否をカメラで取り込んだ輝度情報によって検査する欠品検査方法であって、被検査対象物の表面と被検査面とを、それらの面相互間で反射光量に大きな相違が生じるような表面状態としたので、被検査面における被検査対象物の存否を的確に検査できるという効果を奏する。   According to the present invention, there is a shortage inspection method for inspecting presence / absence of an object to be inspected on a surface to be inspected by luminance information captured by a camera, and the surface of the object to be inspected and the surface to be inspected are those surfaces Since the surface states are such that there is a great difference in the amount of reflected light between them, there is an effect that the presence or absence of the object to be inspected on the surface to be inspected can be accurately inspected.

本発明の第1実施形態に係る欠品検査方法の説明図である。It is explanatory drawing of the missing item inspection method which concerns on 1st Embodiment of this invention. 同上第1実施形態における回路素子実装時の検査の様子を示す図で、(a)は側面図、(b)は回路基板、回路素子部分の上面図である。It is a figure which shows the mode of the test | inspection at the time of the circuit element mounting in 1st Embodiment same as the above, (a) is a side view, (b) is a top view of a circuit board and a circuit element part. 同上第1実施形態における回路素子非実装時(欠品時)の検査の様子を示す図で、(a)は側面図、(b)は回路基板部分の上面図である。It is a figure which shows the mode of the test | inspection at the time of the circuit element non-mounting (at the time of a missing item) in 1st Embodiment same as the above, (a) is a side view, (b) is a top view of a circuit board part. 本発明の第2実施形態に係る欠品検査方法の説明図である。It is explanatory drawing of the missing item inspection method which concerns on 2nd Embodiment of this invention. 同上第2実施形態における回路素子実装時の検査の様子を示す図で、(a)は側面図、(b)は回路基板、回路素子部分の上面図である。It is a figure which shows the mode of the test | inspection at the time of circuit element mounting in 2nd Embodiment same as the above, (a) is a side view, (b) is a top view of a circuit board and a circuit element part. 同上第2実施形態における回路素子非実装時(欠品時)の検査の様子を示す図で、(a)は側面図、(b)は回路基板部分の上面図である。It is a figure which shows the mode of the test | inspection at the time of the circuit element non-mounting (at the time of a missing item) in 2nd Embodiment same as the above, (a) is a side view, (b) is a top view of a circuit board part. 本発明の第3実施形態に係る欠品検査方法の要部説明図である。It is principal part explanatory drawing of the missing item inspection method which concerns on 3rd Embodiment of this invention. 本発明の第4実施形態に係る欠品検査方法の要部説明図である。It is principal part explanatory drawing of the missing item inspection method which concerns on 4th Embodiment of this invention. 本発明の第5実施形態に係る欠品検査方法の要部説明図である。It is principal part explanatory drawing of the missing item inspection method which concerns on 5th Embodiment of this invention. 従来技術の説明図で、(a)は電子部品実装時、(b)は電子部品非実装時(欠品時)を示す図である。It is explanatory drawing of a prior art, (a) is a figure which shows the time of electronic component mounting, (b) is the time of electronic component non-mounting (at the time of a missing item).

以下、本発明の実施の形態を図面に基づき説明する。なお、各図間において、同一符号は同一又は相当部分を示す。
図1は、本発明の第1実施形態に係る欠品検査方法の説明図である。
この図1において、11はCCDカメラ等のカメラ、12はLED等からなる光源である。光源12は、図示例ではカメラ11を中心にこれを取り巻くように複数のLEDを配置してなる環状の光源であるが、複数のLEDを線上に配列したものを1〜複数列配置して光源12としてもよい。光源12としての機能を果たせるならば、1つのLEDを配置したものであってもよい。LED以外のランプを光源12として用いてもよい。
Hereinafter, embodiments of the present invention will be described with reference to the drawings. In addition, the same code | symbol shows the same or an equivalent part between each figure.
FIG. 1 is an explanatory diagram of a missing item inspection method according to the first embodiment of the present invention.
In FIG. 1, reference numeral 11 denotes a camera such as a CCD camera, and reference numeral 12 denotes a light source composed of an LED or the like. The light source 12 is an annular light source in which a plurality of LEDs are arranged around the camera 11 in the illustrated example. However, the light source 12 is arranged by arranging a plurality of LEDs on a line in one to a plurality of rows. It may be 12. As long as the function as the light source 12 can be achieved, one LED may be arranged. A lamp other than an LED may be used as the light source 12.

図1は、被検査面であるプリント基板等の電子回路基板(以下、回路基板と略記する。)21の上面に、被検査対象物である電子部品、ここではIC、LSI等の電子回路素子(以下、回路素子と略記する。)22が実装されている状態を示している。
図示例において回路素子22は、その端子部22aが回路基板21上面の素子取付け部21a上に形成された半田部21bに半田付けされることにより実装される。
カメラ11及び光源12は、回路素子22の取付け領域を含む回路基板21の上面及び実装される回路素子22の上面に光31を照射可能に、回路基板21の上方側に配設されている。
この第1実施形態において、回路素子22の上面は、光源12からの光(入射光31)の反射光32〔図2(a)参照〕がカメラ11に入射しにくい表面状態、図示例では凹凸面22bとされている。なお回路基板21上面は、通常の回路基板面(平坦面)のままであり、光源12からの光31の反射光32〔図3(a)参照〕がカメラ11に入射しやすい表面状態となっている。
1 shows an electronic circuit board (hereinafter abbreviated as a circuit board) 21 such as a printed circuit board, which is a surface to be inspected. (Hereinafter, abbreviated as a circuit element.) 22 shows a mounted state.
In the illustrated example, the circuit element 22 is mounted by soldering its terminal portion 22 a to a solder portion 21 b formed on the element mounting portion 21 a on the upper surface of the circuit board 21.
The camera 11 and the light source 12 are arranged on the upper side of the circuit board 21 so that the upper surface of the circuit board 21 including the mounting area of the circuit element 22 and the upper surface of the circuit element 22 to be mounted can be irradiated with light 31.
In the first embodiment, the upper surface of the circuit element 22 is a surface state in which the reflected light 32 (see FIG. 2A) of the light (incident light 31) from the light source 12 is difficult to enter the camera 11; It is set as the surface 22b. Note that the upper surface of the circuit board 21 remains a normal circuit board surface (flat surface), and is in a surface state in which the reflected light 32 of the light 31 from the light source 12 (see FIG. 3A) easily enters the camera 11. ing.

図1に示す構成において、光源12を点灯すると、そこからの光31は回路基板21方向に直進する〔図1、図2(a)参照〕。
いま、図2(a),(b)に示すように、回路基板21に回路素子22が実装されていると、回路素子22の上面が凹凸面22bとされているので、回路素子22上面への入射光31は乱反射する。
すなわち、入射光31は180°方向転換するのではなく、図2(a)中の破線で示すように側方に反射する。したがって、カメラ11に入射する反射光32の量は減少し、カメラ11で取り込まれる反射光量も減少して、その撮像画像の輝度は低くなる。
In the configuration shown in FIG. 1, when the light source 12 is turned on, the light 31 therefrom travels straight in the direction of the circuit board 21 (see FIGS. 1 and 2A).
Now, as shown in FIGS. 2A and 2B, when the circuit element 22 is mounted on the circuit board 21, the upper surface of the circuit element 22 is an uneven surface 22 b. Incident light 31 is irregularly reflected.
That is, the incident light 31 does not change its direction by 180 °, but reflects to the side as shown by the broken line in FIG. Therefore, the amount of reflected light 32 incident on the camera 11 is reduced, the amount of reflected light captured by the camera 11 is also reduced, and the brightness of the captured image is lowered.

一方、図3(a),(b)に示すように、回路基板21に回路素子22が実装されていない場合には、回路素子22上面への入射光31は乱反射せずに正反射する。
すなわち、図3(a)中の破線で示すように、入射光31はほぼ180°方向転換して反射光32となり、カメラ11に入射する反射光32の量はあまり減少しない。したがって、カメラ11に取り込まれる反射光量もあまり減少せず、カメラ11の撮像画像の輝度は、回路基板21に回路素子22が実装されている場合〔図2(a)参照〕に比べて著しく高い。
On the other hand, as shown in FIGS. 3A and 3B, when the circuit element 22 is not mounted on the circuit board 21, the incident light 31 on the upper surface of the circuit element 22 is regularly reflected without being irregularly reflected.
That is, as indicated by a broken line in FIG. 3A, the incident light 31 is turned by approximately 180 ° to become reflected light 32, and the amount of the reflected light 32 incident on the camera 11 does not decrease so much. Therefore, the amount of reflected light captured by the camera 11 does not decrease so much, and the brightness of the captured image of the camera 11 is significantly higher than when the circuit element 22 is mounted on the circuit board 21 (see FIG. 2A). .

したがって、回路基板21に回路素子22が実装されている場合と実装されていない場合におけるカメラ11の撮像画像の輝度を予め測定しておくことによって、回路基板21に回路素子22が実装されているか否かが的確に検査できる。
具体的には、カメラ11の撮像画像の輝度が著しく高ければ回路基板21に回路素子22が実装されてなく、上記の撮像画像の輝度が低ければ回路基板21に回路素子22が実装されていると、的確に検査できる。したがって、撮像画像の輝度値にしきい値を設定する等によって精度の高い検査の自動化が容易に実現できる。
Therefore, whether the circuit element 22 is mounted on the circuit board 21 by measuring in advance the luminance of the captured image of the camera 11 when the circuit element 22 is mounted on the circuit board 21 and when the circuit element 22 is not mounted. It is possible to accurately check whether or not.
Specifically, the circuit element 22 is not mounted on the circuit board 21 if the brightness of the captured image of the camera 11 is extremely high, and the circuit element 22 is mounted on the circuit board 21 if the brightness of the captured image is low. It can be accurately inspected. Therefore, it is possible to easily realize high-precision inspection automation by setting a threshold value for the luminance value of the captured image.

図4は、本発明の第2実施形態に係る欠品検査方法の説明図である。
この第2実施形態においては、回路素子22の上面は通常の回路素子上面(平坦面)のままであり、光源12からの光(入射光31)の反射光32がカメラ11に入射しやすい表面状態となっている。一方、回路基板21の上面の回路素子22の実装面は、光源12からの光31の反射光32〔図6(a)参照〕がカメラ11に入射しにくい表面状態、図示例では凹凸面21cとされている。
FIG. 4 is an explanatory diagram of a missing item inspection method according to the second embodiment of the present invention.
In the second embodiment, the upper surface of the circuit element 22 remains a normal upper surface (flat surface) of the circuit element, and the surface on which the reflected light 32 of the light (incident light 31) from the light source 12 is likely to enter the camera 11. It is in a state. On the other hand, the mounting surface of the circuit element 22 on the upper surface of the circuit board 21 is a surface state in which the reflected light 32 of the light 31 from the light source 12 [see FIG. It is said that.

図4に示す構成において、光源12を点灯すると、そこからの光31は回路基板21方向に直進する〔図4、図5(a)参照〕。
いま、図5(a),(b)に示すように、回路基板21に回路素子22が実装されていると、回路素子22の上面が平坦面であるので、回路素子22上面への入射光31は乱反射せずに正反射する。
すなわち、図5(a)中の破線で示すように、入射光31はほぼ180°方向転換して反射光32となり、カメラ11に入射する反射光32の量はあまり減少しない。したがって、カメラ11に取り込まれる反射光量もあまり減少せず、カメラ11の撮像画像の輝度は、回路基板21に回路素子22が実装されていない場合〔図6(a)参照〕に比べて著しく高い。
In the configuration shown in FIG. 4, when the light source 12 is turned on, the light 31 therefrom travels straight in the direction of the circuit board 21 (see FIGS. 4 and 5A).
As shown in FIGS. 5A and 5B, when the circuit element 22 is mounted on the circuit board 21, the upper surface of the circuit element 22 is flat. 31 reflects regularly without irregular reflection.
That is, as indicated by a broken line in FIG. 5A, the incident light 31 is turned by approximately 180 ° to become reflected light 32, and the amount of the reflected light 32 incident on the camera 11 does not decrease so much. Accordingly, the amount of reflected light captured by the camera 11 does not decrease so much, and the brightness of the captured image of the camera 11 is significantly higher than when the circuit element 22 is not mounted on the circuit board 21 (see FIG. 6A). .

一方、図6(a),(b)に示すように、回路基板21に回路素子22が実装されていない場合には、回路基板21上面への入射光31は乱反射する。
すなわち、入射光31は180°方向転換するのではなく、図6(a)中の破線で示すように側方に反射する。したがって、カメラ11に入射する反射光32の量は減少し、カメラ11で取り込まれる反射光量も減少して、カメラ11の撮像画像の輝度は回路基板21に回路素子22が実装されている場合〔図5(a)参照〕に比べて低くなる。
On the other hand, as shown in FIGS. 6A and 6B, when the circuit element 22 is not mounted on the circuit board 21, the incident light 31 on the upper surface of the circuit board 21 is irregularly reflected.
That is, the incident light 31 does not change its direction by 180 °, but reflects to the side as shown by the broken line in FIG. Therefore, the amount of the reflected light 32 incident on the camera 11 is reduced, the amount of reflected light captured by the camera 11 is also reduced, and the brightness of the captured image of the camera 11 is obtained when the circuit element 22 is mounted on the circuit board 21 [ Compared to FIG. 5 (a)].

したがって、回路基板21に回路素子22が実装されている場合と実装されていない場合におけるカメラ11の撮像画像の輝度を予め測定しておくことによって、回路基板21に回路素子22が実装されているか否かが的確に検査できる。
具体的には、カメラ11の撮像画像の輝度が著しく高ければ回路基板21に回路素子22が実装されていて、上記の撮像画像の輝度が低ければ回路基板21に回路素子22が実装されていないと、的確に検査できる。したがって、撮像画像の輝度値にしきい値を設定する等によって精度の高い検査の自動化が容易に実現できる。
Therefore, whether the circuit element 22 is mounted on the circuit board 21 by measuring in advance the luminance of the captured image of the camera 11 when the circuit element 22 is mounted on the circuit board 21 and when the circuit element 22 is not mounted. It is possible to accurately check whether or not.
Specifically, the circuit element 22 is mounted on the circuit board 21 if the brightness of the captured image of the camera 11 is extremely high, and the circuit element 22 is not mounted on the circuit board 21 if the brightness of the captured image is low. It can be accurately inspected. Therefore, it is possible to easily realize high-precision inspection automation by setting a threshold value for the luminance value of the captured image.

なお、上述した第1、第2実施形態いずれの場合も、図2、図3あるいは図5、図6に示すように、回路基板21上面からカメラ11及び光源12までの高さが欠品検査中、一定であると、回路基板21上面の回路素子22の有無によって光源12からの光の反射面位置に回路素子22高さ寸法分の高低差が生じる。しかし、回路基板21上面からカメラ11及び光源12までの高さ寸法に対する回路基板21の高さ寸法は、実際には図1、図4に模式的に示した程、大きくはない。したがって、回路基板21上面の回路素子22の有無によって、上記撮像画像の輝度に高低差を生じさせることは可能である。また、輝度の高低差がより大きくなるように、カメラ11及び光源12の高さ位置、光源12の明るさ、凹凸面21c,22bの形態等が調整、設定される。   In both the first and second embodiments described above, the height from the upper surface of the circuit board 21 to the camera 11 and the light source 12 is inspected as shown in FIG. 2, FIG. 3 or FIG. On the other hand, if it is constant, a height difference corresponding to the height of the circuit element 22 occurs at the position of the reflection surface of the light from the light source 12 depending on the presence or absence of the circuit element 22 on the upper surface of the circuit board 21. However, the height dimension of the circuit board 21 with respect to the height dimension from the upper surface of the circuit board 21 to the camera 11 and the light source 12 is actually not as large as schematically shown in FIGS. Therefore, it is possible to cause a difference in the brightness of the captured image depending on the presence or absence of the circuit element 22 on the upper surface of the circuit board 21. Further, the height position of the camera 11 and the light source 12, the brightness of the light source 12, the form of the concave and convex surfaces 21c and 22b, and the like are adjusted and set so that the difference in height of the luminance becomes larger.

上述した第1、第2実施形態によれば、回路素子22又は回路基板21の上面を、光源12からの光31の反射光32がカメラ11に入射しにくい凹凸面22b又は21cとした。その一方で、回路基板21又は回路素子22の上面を、光源12からの光31の反射光32がカメラ11に入射しやすい平坦面とした。
したがって、カメラ11の撮像画像の輝度の高低差(輝度差)を大きくすることができ、これにより、回路基板21に回路素子22が実装されているか否かを的確に検査できる。またこれにより、精度の高い検査の自動化が容易に実現できる。
特に、第1、第2実施形態によれば、従来のカメラ11(画像)を用いた検査では欠品検査が困難であった色彩の回路素子22についても、つまり回路素子22(光31受光面)の色彩を問わずに、欠品検査が可能になるという大なる効果がある。
According to the first and second embodiments described above, the upper surface of the circuit element 22 or the circuit board 21 is the uneven surface 22b or 21c where the reflected light 32 of the light 31 from the light source 12 is difficult to enter the camera 11. On the other hand, the upper surface of the circuit board 21 or the circuit element 22 is a flat surface on which the reflected light 32 of the light 31 from the light source 12 easily enters the camera 11.
Therefore, the difference in brightness (brightness difference) of the captured image of the camera 11 can be increased, and thereby whether or not the circuit element 22 is mounted on the circuit board 21 can be accurately inspected. This also makes it possible to easily realize highly accurate inspection automation.
In particular, according to the first and second embodiments, the circuit element 22 (color 31 light-receiving surface) of the color circuit element 22 that has been difficult to inspect for a shortage by the conventional inspection using the camera 11 (image). ), Which has the great effect of being able to inspect missing items regardless of the color.

なお、上述した第1実施形態では、回路素子22の凹凸面22bを断面二等辺三角形が連続する形態としたが、この形態のみに限定されることはない。要するに、図2(a)に示すように、光源12からの光31の反射光32がカメラ11に入射しにくい表面状態にされていればよい。
したがって、例えば図7に示すように、回路素子22の凹凸面22bを断面直角三角形が連続する形態としてもよく、あるいは図8に示すように、回路素子22の上面全体を1つの傾斜面22cとして形成してもよい。
In the first embodiment described above, the concave and convex surface 22b of the circuit element 22 is configured to have a continuous isosceles triangle, but the present invention is not limited to this configuration. In short, as shown in FIG. 2A, the surface state may be such that the reflected light 32 of the light 31 from the light source 12 is difficult to enter the camera 11.
Therefore, for example, as shown in FIG. 7, the concave and convex surface 22b of the circuit element 22 may have a configuration in which right-angled triangles are continuous, or the entire upper surface of the circuit element 22 is formed as one inclined surface 22c as shown in FIG. It may be formed.

更に、図9に示すように、回路素子22の凹凸面22bは第1実施形態(図1)と同様であるが、この凹凸面22bに丁度嵌り合う凸凹面91aを下面に有し、上面が平坦面91bとされたアダプタ91を回路素子22の凹凸面22b上に被着形成するようにしてもよい。この場合、アダプタ91は、例えば透明なエポキシ系樹脂等、透光性合成樹脂で形成され、また、このアダプタ91を上記凹凸面22b上に被着するための接着材も透光性を有する接着材が用いられる。
このようなアダプタ91を用いれば、回路素子22に凹凸面22bを有していても、回路素子22のロボットによる搬送が、アダプタ91の平坦面91bを真空吸着することによって可能となり、本検査前の表面実装時における回路素子(被検査対象物)22の搬送が容易になる。
本発明欠品検査方法は、その原理を用いて設備の調整時、定期校正時に、キャリブレーションを行う際にも用いることができる。
Furthermore, as shown in FIG. 9, the concave / convex surface 22b of the circuit element 22 is the same as that of the first embodiment (FIG. 1), but the lower surface has a concave / convex surface 91a that just fits the concave / convex surface 22b. The adapter 91 having the flat surface 91b may be deposited on the uneven surface 22b of the circuit element 22. In this case, the adapter 91 is formed of a light-transmitting synthetic resin such as a transparent epoxy resin, and an adhesive for attaching the adapter 91 onto the uneven surface 22b is also a light-transmitting adhesive. A material is used.
If such an adapter 91 is used, even if the circuit element 22 has the concavo-convex surface 22b, the circuit element 22 can be transported by the robot by vacuum-sucking the flat surface 91b of the adapter 91 before the main inspection. The circuit element (object to be inspected) 22 can be easily transported during surface mounting.
The shortage inspection method of the present invention can also be used when performing calibration at the time of equipment adjustment and periodic calibration using the principle.

11:カメラ、12:光源、21:電子回路基板(被検査面)、21c,22b:凹凸面、22:電子回路素子(被検査対象物)、31:光源からの光(入射光)、32:反射光。   11: camera, 12: light source, 21: electronic circuit board (surface to be inspected), 21c, 22b: uneven surface, 22: electronic circuit element (object to be inspected), 31: light from light source (incident light), 32 :reflected light.

Claims (7)

被検査面における被検査対象物の存否をカメラで取り込んだ輝度情報によって検査する欠品検査方法であって、
前記被検査対象物の表面と前記被検査面とのうち、いずれか一方の面をその面からの反射光が前記カメラに入射しにくい表面状態とし、他方の面をその面からの反射光が前記カメラに入射しやすい表面状態としたことを特徴とする欠品検査方法。
A shortage inspection method for inspecting presence or absence of an inspection target object on a surface to be inspected by luminance information captured by a camera,
Of the surface of the object to be inspected and the surface to be inspected, either one of the surfaces is in a surface state in which reflected light from that surface is difficult to enter the camera, and the other surface is reflected from the surface. A missing item inspection method, wherein the surface state is easy to be incident on the camera.
請求項1に記載の欠品検査方法において、被検査対象物の表面を、その面からの反射光がカメラに入射しにくい表面状態としたことを特徴とする欠品検査方法。   2. The shortage inspection method according to claim 1, wherein the surface of the object to be inspected is in a surface state in which reflected light from the surface hardly enters the camera. 請求項1に記載の欠品検査方法において、被検査面を、その面からの反射光がカメラに入射しにくい表面状態としたことを特徴とする欠品検査方法。   2. The missing item inspection method according to claim 1, wherein a surface to be inspected is in a surface state in which reflected light from the surface is difficult to enter the camera. 請求項1、2又は3に記載の欠品検査方法において、反射光がカメラに入射しにくい表面状態は凹凸面であることを特徴とする欠品検査方法。   4. The missing item inspection method according to claim 1, wherein the surface state in which the reflected light is difficult to enter the camera is an uneven surface. 請求項1〜4のいずれかの請求項に記載の欠品検査方法において、被検査対象物は電子部品であることを特徴とする欠品検査方法。   5. The shortage inspection method according to claim 1, wherein the object to be inspected is an electronic component. 請求項1〜5のいずれかの請求項に記載の欠品検査方法において、被検査面は電子回路基板面であることを特徴とする欠品検査方法。   6. The missing item inspection method according to claim 1, wherein the surface to be inspected is an electronic circuit board surface. 請求項5又は6に記載の欠品検査方法において、電子部品は電子回路素子であることを特徴とする欠品検査方法。   7. The shortage inspection method according to claim 5, wherein the electronic component is an electronic circuit element.
JP2011169326A 2011-08-02 2011-08-02 Method for detecting missing parts Pending JP2013032980A (en)

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04194701A (en) * 1990-11-28 1992-07-14 Hitachi Ltd Picture image inputting method and apparatus and appearance inspecting instrument
JPH06201603A (en) * 1993-01-08 1994-07-22 Matsushita Electric Ind Co Ltd Method for generating inspection data in missing inspection of electronic component and method for detecting missing of the component

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04194701A (en) * 1990-11-28 1992-07-14 Hitachi Ltd Picture image inputting method and apparatus and appearance inspecting instrument
JPH06201603A (en) * 1993-01-08 1994-07-22 Matsushita Electric Ind Co Ltd Method for generating inspection data in missing inspection of electronic component and method for detecting missing of the component

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