JP2012238588A - フーリエ反復位相回復法 - Google Patents
フーリエ反復位相回復法 Download PDFInfo
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- JP2012238588A JP2012238588A JP2012099896A JP2012099896A JP2012238588A JP 2012238588 A JP2012238588 A JP 2012238588A JP 2012099896 A JP2012099896 A JP 2012099896A JP 2012099896 A JP2012099896 A JP 2012099896A JP 2012238588 A JP2012238588 A JP 2012238588A
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Abstract
【解決手段】フーリエ反復位相回復法の基本アルゴリズムによって得られる複数の計算結果をもとに、フーリエ空間の振幅に対して平均操作を行い、得られた振幅平均を新たな振幅とし、この新たな振幅をもとにして前記基本アルゴリズムを適用し、位相を求める。
【選択図】図6
Description
10 電子回折顕微鏡
100 入射系
110 電子源
120 平行照射用レンズ系
200 試料系
210 サポート用スリット
212、332 孔
220 試料
300 検出系
310 対物レンズ
320 コース検出器
330 ファイン検出器
400 計算機系
410 コンピュータ
500 真空筐体
Claims (3)
- フーリエ反復位相回復法の基本アルゴリズムによって得られる複数の計算結果をもとに、フーリエ空間の振幅に対して平均操作を行い、得られた振幅平均を新たな振幅とし、この新たな振幅をもとにして前記基本アルゴリズムを適用し、位相を求める、
フーリエ反復位相回復法。 - 前記平均操作は、振幅の二乗平均である、請求項1記載のフーリエ反復位相回復法。
- 前記平均操作は、振幅の絶対値の平均である、請求項1記載のフーリエ反復位相回復法。
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104501781A (zh) * | 2014-11-18 | 2015-04-08 | 中国科学院大学 | 基于已知先验信息约束的叠层成像技术 |
JP2015091087A (ja) * | 2013-11-07 | 2015-05-11 | 三菱電機株式会社 | パッケージ内部電圧波形測定装置、内部電圧波形演算装置、パッケージ内部電圧波形測定システム、内部電圧波形演算方法および内部電圧波形演算プログラム |
CN109472842A (zh) * | 2018-12-17 | 2019-03-15 | 长沙理工大学 | 一种无透镜成像的相位恢复图像再现方法 |
WO2021095419A1 (ja) * | 2019-11-15 | 2021-05-20 | 富士フイルム株式会社 | 情報処理装置、情報処理装置の作動方法、情報処理装置の作動プログラム |
CN113376448A (zh) * | 2021-04-29 | 2021-09-10 | 北京邮电大学 | 一种用于紧缩场测试中静区相位恢复的方法及装置 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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US20180189934A1 (en) * | 2015-06-25 | 2018-07-05 | David C. Hyland | System and Method of Reducing Noise Using Phase Retrieval |
Citations (2)
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WO2005114693A1 (ja) * | 2004-05-20 | 2005-12-01 | National University Corporation Hokkaido University | 電子顕微方法およびそれを用いた電子顕微鏡 |
WO2005114568A1 (ja) * | 2004-05-24 | 2005-12-01 | National University Corporation Hokkaido University | 画像再構成方法 |
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Patent Citations (2)
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WO2005114693A1 (ja) * | 2004-05-20 | 2005-12-01 | National University Corporation Hokkaido University | 電子顕微方法およびそれを用いた電子顕微鏡 |
WO2005114568A1 (ja) * | 2004-05-24 | 2005-12-01 | National University Corporation Hokkaido University | 画像再構成方法 |
Non-Patent Citations (1)
Title |
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JPN6016007557; Y. Kamura and S. Komatsu: 'Phase Retrieval Microscope for Quantitative Imaging of a Weak Phase Object' Jpn. J. Phys. 37, 1998, 6018-6019 * |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015091087A (ja) * | 2013-11-07 | 2015-05-11 | 三菱電機株式会社 | パッケージ内部電圧波形測定装置、内部電圧波形演算装置、パッケージ内部電圧波形測定システム、内部電圧波形演算方法および内部電圧波形演算プログラム |
CN104501781A (zh) * | 2014-11-18 | 2015-04-08 | 中国科学院大学 | 基于已知先验信息约束的叠层成像技术 |
CN109472842A (zh) * | 2018-12-17 | 2019-03-15 | 长沙理工大学 | 一种无透镜成像的相位恢复图像再现方法 |
WO2021095419A1 (ja) * | 2019-11-15 | 2021-05-20 | 富士フイルム株式会社 | 情報処理装置、情報処理装置の作動方法、情報処理装置の作動プログラム |
CN113376448A (zh) * | 2021-04-29 | 2021-09-10 | 北京邮电大学 | 一种用于紧缩场测试中静区相位恢复的方法及装置 |
CN113376448B (zh) * | 2021-04-29 | 2023-02-28 | 北京邮电大学 | 一种用于紧缩场测试中静区相位恢复的方法及装置 |
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