JP2012223842A - Nano/micro projection body and method for producing the same - Google Patents

Nano/micro projection body and method for producing the same Download PDF

Info

Publication number
JP2012223842A
JP2012223842A JP2011091972A JP2011091972A JP2012223842A JP 2012223842 A JP2012223842 A JP 2012223842A JP 2011091972 A JP2011091972 A JP 2011091972A JP 2011091972 A JP2011091972 A JP 2011091972A JP 2012223842 A JP2012223842 A JP 2012223842A
Authority
JP
Japan
Prior art keywords
nano
energy
micro
less
protrusion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2011091972A
Other languages
Japanese (ja)
Other versions
JP5924515B2 (en
Inventor
Shunichiro Tanaka
俊一郎 田中
Masaki Chiba
雅樹 千葉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tohoku University NUC
Original Assignee
Tohoku University NUC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tohoku University NUC filed Critical Tohoku University NUC
Priority to JP2011091972A priority Critical patent/JP5924515B2/en
Publication of JP2012223842A publication Critical patent/JP2012223842A/en
Application granted granted Critical
Publication of JP5924515B2 publication Critical patent/JP5924515B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/30Hydrogen technology
    • Y02E60/50Fuel cells

Landscapes

  • Catalysts (AREA)
  • Cold Cathode And The Manufacture (AREA)
  • Inert Electrodes (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a new nano/micro projection body that is expected to be applied to a catalyst and various electronic purposes, and to provide a method for producing the projection body.SOLUTION: The nano/micro projection body is formed and grown, on a plate made of a noble metal having threshold energy of Ar ion sputtering of 25 eV or less and having activation energy of surface diffusion of 1.6 eV or less, by irradiating the plate with a high energy beam in low vacuum to induce surface diffusion of sputtered metal atoms in a direction toward the energy source. The method for producing a nano/micro projection body comprises irradiating a plate made of a noble metal having threshold energy of Ar ion sputtering of 25 eV or less and activation energy of surface diffusion of 1.6 eV or less, with a high energy beam in low vacuum to induce surface diffusion of metal atoms in a direction toward the energy source, and thereby integrating a plurality of small projection bodies to form a large projection body.

Description

本発明は、低真空下でArイオンビームなどの高エネルギービームを照射して原子の励起反応で形成される新規なナノ・マイクロ突起体及びその製造方法に関する。 The present invention relates to a novel nano / micro projection formed by an excitation reaction of an atom by irradiating a high energy beam such as an Ar ion beam under a low vacuum and a method for manufacturing the same.

発明者らは2005年以来、金属板にArイオンビームを照射すると、ナノ・マイクロ突起体(以下、突起体ともいう)が形成されることを明らかにしてきた。Cu板ではCu、CuO、CuOからなる突起体が形成され(特許文献1)、Zn板ではZnOからなる突起体が形成され、Cu−Zn合金板ではα及びβCu−Znからなる突起体が形成される。図1には、Cu2Oからなる突起体の例を示す。 Since 2005, the inventors have clarified that when a metal plate is irradiated with an Ar ion beam, nano / micro protrusions (hereinafter also referred to as protrusions) are formed. A protrusion made of Cu, CuO, Cu 2 O is formed on the Cu plate (Patent Document 1), a protrusion made of ZnO is formed on the Zn plate, and a protrusion made of α and βCu—Zn on the Cu—Zn alloy plate. Is formed. FIG. 1 shows an example of a protrusion made of Cu 2 O.

突起体の形状、Aspect Ratio、先鋭度、最大高さなどは下地材料の種類と照射条件によって異なり、それに応じた突起体特性と応用が考えられる。Arイオン照射による突起体の成長機構は、スパッタされた原子の表面拡散によりイオン源方向にボトムアップ型で成長するので(図2)、速度論的取り扱いが可能である。図2に示すように、小さい針状のロッドを核としてスパッタされた原子が表面拡散によって移動しつつ、真空中の残留酸素を補足しながら突起体は成長する。また、照射するArイオンの加速電圧と照射時間により突起体の元素濃度が変化することなどが分った。   The shape, Aspect Ratio, sharpness, maximum height, etc. of the protrusions vary depending on the type of the base material and the irradiation conditions, and the protrusion characteristics and applications can be considered accordingly. The protrusion growth mechanism by Ar ion irradiation grows bottom-up in the direction of the ion source due to surface diffusion of the sputtered atoms (FIG. 2), and can be handled kinetically. As shown in FIG. 2, the atoms sputtered with a small needle-like rod as a nucleus move by surface diffusion, and the protrusion grows while capturing residual oxygen in the vacuum. Further, it has been found that the element concentration of the protrusion changes depending on the acceleration voltage and irradiation time of Ar ions to be irradiated.

これらナノ・マイクロ突起体の応用範囲を拡大するためには、従来と異なる新規な突起体が求められている。   In order to expand the application range of these nano / micro protrusions, new protrusions different from the conventional ones are required.

特開2008−94686号公報JP 2008-94686 A

本発明は、触媒や各種の電子的用途への応用が期待できる新規なナノ・マイクロ突起体及びその製造方法を提供することを課題とする。   It is an object of the present invention to provide a novel nano / micro protrusion and a method for producing the same, which can be expected to be applied to catalysts and various electronic applications.

上記の課題を解決するためになされた本発明のナノ・マイクロ突起体は、Arイオンスパッタリングの閾値エネルギーが25eV以下で、表面拡散の活性化エネルギーが1.6eV以下の貴金属からなる板に、低真空下で高エネルギービームを照射して、スパッタされた金属原子のエネルギー源方向への表面拡散により形成・成長されたことを特徴とするものである。   The nano / micro protrusions of the present invention made to solve the above-mentioned problems are low in a plate made of a noble metal having a threshold energy of Ar ion sputtering of 25 eV or less and an activation energy of surface diffusion of 1.6 eV or less. It is characterized by being formed and grown by surface diffusion of sputtered metal atoms in the direction of the energy source by irradiation with a high energy beam under vacuum.

上記した発明において、ナノ・マイクロ突起体は、複数の小突起体が合体されてなる大突起体であることを特徴とするものであり、貴金属は、Au、Ag、Pd、Ptのうちの何れか1種であることを特徴とする。   In the above-described invention, the nano / micro protrusion is a large protrusion formed by combining a plurality of small protrusions, and the noble metal is any one of Au, Ag, Pd, and Pt. Or 1 type.

また、本発明のナノ・マイクロ突起体の製造方法は、Arイオンスパッタリングの閾値エネルギーが25eV以下で、表面拡散の活性化エネルギーが1.6eV以下の貴金属からなる板に、低真空下で高エネルギービームを照射して、金属原子のエネルギー源方向への表面拡散により複数の小突起体が合体されてなる大突起体を形成することを特徴とするものである。   In addition, the method for producing a nano / micro protrusion according to the present invention is applied to a plate made of a noble metal having a threshold energy of Ar ion sputtering of 25 eV or less and an activation energy of surface diffusion of 1.6 eV or less. A large projection is formed by merging a plurality of small projections by surface diffusion in the energy source direction of metal atoms by irradiation with a beam.

本発明のナノ・マイクロ突起体は、スパッタリングの閾値エネルギーが小さくかつ表面拡散の活性化エネルギーの小さい貴金属板に高エネルギービームを照射して形成される。よって、スパッタリングして飛ばした多数の原子を移動のバリアを低くして容易に表面拡散させるので、ナノ・マイクロ突起体を大きい成長速度でもって成長させることができる。その結果形成されたナノ・マイクロ突起体は、針状の先端鋭利な小突起体が多数合体して形成された大突起体であるので、活性点が多く触媒に好適である。また、活性点が多く、電子エミッターとして大電流を出力することができる。Au、Ag、Pd、Ptである貴金属は、表面に酸化物が形成されにくく、突起体の形成が酸化物によって邪魔されないため、α―Ti、Nb等と比べてナノ・マイクロ突起体が形成されやすいものと考えられる。   The nano / micro protrusion of the present invention is formed by irradiating a noble metal plate having a low sputtering threshold energy and a small surface diffusion activation energy with a high energy beam. Therefore, a large number of atoms sputtered and scattered can be easily diffused on the surface by lowering the barrier of movement, so that nano / micro protrusions can be grown at a high growth rate. The nano / micro projections formed as a result are large projections formed by combining a large number of needle-like sharp projections, and thus have many active sites and are suitable for the catalyst. In addition, there are many active points, and a large current can be output as an electron emitter. Noble metals such as Au, Ag, Pd, and Pt are difficult to form oxides on the surface, and the formation of protrusions is not disturbed by oxides. Therefore, nano / micro protrusions are formed compared to α-Ti, Nb, etc. It is considered easy.

また、本発明のナノ・マイクロ突起体の製造方法は、上記したような特徴を有するナノ・マイクロ突起体を効果的に製造することができる。   Moreover, the method for producing a nano / micro protrusion of the present invention can effectively produce a nano / micro protrusion having the above-described characteristics.

従来のCuOからなる突起体のSEM写真である。Is a SEM photograph of projections made of conventional Cu 2 O. 自己組織化による突起体の成長を説明する概念図である。It is a conceptual diagram explaining the growth of the protrusion by self-organization. イオンの入射エネルギーに対する金属との相互作用の状態を説明する模式図である。It is a schematic diagram explaining the state of interaction with the metal with respect to the incident energy of ion. イオンの入射エネルギーと金属のスパッタ率との関係を示すグラフである。It is a graph which shows the relationship between the incident energy of ion, and the sputtering rate of a metal. 各種金属の表面拡散係数の温度依存性を示すグラフである。It is a graph which shows the temperature dependence of the surface diffusion coefficient of various metals. Arイオンビームの加速電圧9kV、照射角度30°、照射時間10分のAg板に生成された突起体のSEM写真である。It is a SEM photograph of the protrusion produced | generated on the Ag board | plate with the acceleration voltage of 9 kV of Ar ion beam, irradiation angle of 30 degrees, and irradiation time of 10 minutes. 照射時間20分のAg板に生成された突起体のSEM写真である。It is a SEM photograph of the protrusion produced | generated to the Ag plate for 20 minutes of irradiation time. 照射時間30分のAg板に生成された突起体のSEM写真である。It is a SEM photograph of the protrusion produced | generated on the Ag board | plate for 30 minutes of irradiation time. 照射時間40分のAg板に生成された突起体のSEM写真である。It is a SEM photograph of the protrusion produced | generated on the Ag plate for 40 minutes of irradiation time. 照射時間60分のAg板に生成された突起体のSEM写真である。It is a SEM photograph of the protrusion produced | generated to the Ag plate for 60 minutes of irradiation time. 照射時間80分のAg板に生成された突起体のSEM写真である。It is a SEM photograph of the projections generated on the Ag plate with an irradiation time of 80 minutes. 照射時間90分のAg板に生成された突起体のSEM写真である。It is a SEM photograph of the projections generated on the Ag plate with an irradiation time of 90 minutes. 照射時間20分における突起体を拡大して示すSEM写真である。It is a SEM photograph which expands and shows a projection object in irradiation time 20 minutes. 金属の表面拡散の活性化エネルギーとスパッタリングの閾値エネルギーと突起体の形成の有無を示す散布図である。It is a scatter diagram which shows the activation energy of surface diffusion of a metal, the threshold energy of sputtering, and the presence or absence of formation of a protrusion.

以下に、本発明の実施の形態を詳細に説明する。   Hereinafter, embodiments of the present invention will be described in detail.

初めに、金属板の表面にナノ・マイクロ突起体を形成する方法について説明する。   First, a method for forming nano / micro protrusions on the surface of a metal plate will be described.

本発明においては、金属板の表面に低真空下でArイオンビームを照射して、ナノ・マイクロ突起体を形成する。金属板として、鋳造材、熱間鍛造材、熱間圧延材、冷間圧延材を用いることができる。金属板は希塩酸等で酸洗して表面を活性化させておくことも有効である。   In the present invention, the surface of the metal plate is irradiated with an Ar ion beam under a low vacuum to form nano / micro projections. As the metal plate, a cast material, a hot forged material, a hot rolled material, or a cold rolled material can be used. It is also effective to activate the surface of the metal plate by pickling with diluted hydrochloric acid or the like.

次に、金属板に真空下でArイオンビームを照射して励起した原子の表面拡散で突起を成長させる。本発明におけるナノ・マイクロ突起体の形成機構は、自己組織化ではなくスパッタにより励起された原子の表面拡散によるものである。真空度は10−2〜10−5Pa程度のいわゆる低真空とする。10−2Paより真空度が低いとArイオンの照射によって金属原子をスパッタリングさせるのが困難になるからであり、10−5Paより真空度が高いとArイオンビームの照射が困難となるからである。 Next, protrusions are grown by surface diffusion of atoms excited by irradiating a metal plate with an Ar ion beam under vacuum. The formation mechanism of the nano / micro protrusions in the present invention is based on the surface diffusion of atoms excited by sputtering rather than self-organization. The degree of vacuum is a so-called low vacuum of about 10 −2 to 10 −5 Pa. If the degree of vacuum is lower than 10 −2 Pa, it will be difficult to sputter metal atoms by irradiation with Ar ions, and if the degree of vacuum is higher than 10 −5 Pa, irradiation of Ar ion beams will be difficult. is there.

さらに、Arイオンビームの照射角度を、板面に対して10〜90°とし、加速電圧は、2−20kV(keV)とするのが望ましい。照射角度が10°未満では、効率よくArイオンビームのエネルギーを供給するのが難しいからであり、90°を超えて照射を行う必要がないからである。また、加速電圧(照射エネルギー)を2−20kV(2−20keV)としたのは、高エネルギービームであるArイオンビームを照射する場合には、点欠陥などの照射欠陥や注入イオンが導入されにくい20kV以下の低電圧とするのが望ましく、一方2kV未満では電圧が弱すぎてスパッタリングが起きにくいからである。また、照射時間は10〜100分が望ましく、Arイオンビームの電流は、0.5〜1.5mAが望ましい。なお、望ましくは加速電圧を5kV以上とするのが、高いスパッタリングが得られて望ましい。 Further, it is desirable that the irradiation angle of the Ar ion beam is 10 to 90 ° with respect to the plate surface, and the acceleration voltage is 2 to 20 kV (keV). This is because if the irradiation angle is less than 10 °, it is difficult to efficiently supply the energy of the Ar ion beam, and it is not necessary to perform irradiation beyond 90 °. The acceleration voltage (irradiation energy) is set to 2-20 kV (2-20 keV). Irradiation defects such as point defects and implanted ions are not easily introduced when an Ar ion beam which is a high energy beam is irradiated. A low voltage of 20 kV or less is desirable. On the other hand, if it is less than 2 kV, the voltage is too weak to cause sputtering. The irradiation time is preferably 10 to 100 minutes, and the Ar ion beam current is preferably 0.5 to 1.5 mA. Note that it is desirable that the acceleration voltage is 5 kV or more because high sputtering is obtained.

なお、本発明において照射せしめられるビームは、Arイオンビームに限定されるものではなく、ナノ・マイクロ突起体を成長させうる高エネルギービームであればよく、Arイオンビームのほかに電子線、レーザービーム、X線、γ線、中性子線、粒子ビーム等を用いることができる。   The beam irradiated in the present invention is not limited to the Ar ion beam, but may be any high energy beam capable of growing the nano / micro protrusions. In addition to the Ar ion beam, an electron beam or a laser beam may be used. X-ray, γ-ray, neutron beam, particle beam, etc. can be used.

図3には、イオンの入射エネルギーに対する金属との相互作用の変化を模式的に示す。(c)図に示すように、イオンの入射エネルギーが10keV〜数MeVと大きい領域では照射イオンが金属内に注入される現象(イオン注入)が生ずる。入射エネルギーが数100eV〜数10keVの中間領域では金属原子を飛び出させるスパッタリング現象が起こり、数eV〜数100eVの小さい領域では照射イオンは金属内部に深く潜り込むことはできず、金属表面に単に付着・結合するだけである。 FIG. 3 schematically shows a change in interaction with a metal with respect to incident energy of ions. (c) As shown in the figure, in a region where the incident energy of ions is as large as 10 keV to several MeV, a phenomenon (ion implantation) in which irradiated ions are implanted into the metal occurs. In the intermediate region where the incident energy is several hundred eV to several tens keV, a sputtering phenomenon that causes metal atoms to jump out occurs. Just join.

本発明においてスパッタリング率は、以下のyamamuraの式、〔数1〕によって計算される。Yamamuraの式によりスパッタ源となるArイオンなどによる各種金属のスパッタ率を計算することができる。この式から計算される各金属のスパッタ率は高エネルギービームによる低次元構造体創成における材料選択に重要な指針を与えるものであり、構造体の形状制御や組成制御に大きく寄与するものである。   In the present invention, the sputtering rate is calculated by the following yamamura equation: [Equation 1]. The sputtering rate of various metals due to Ar ions as a sputtering source can be calculated by the Yamamura equation. The sputtering rate of each metal calculated from this equation gives an important guideline for material selection in creating a low-dimensional structure using a high-energy beam, and greatly contributes to shape control and composition control of the structure.

上記した式において、α*、Kは経験値、QはFitting parameter、Sn(ε)はLindhardの規格化された核阻止能、Se(ε)はLindhardの規格化された電子阻止能、Usは昇華エネルギー(表面結合エネルギー)、Ethはスパッタの閾値エネルギー、Eは高エネルギービームの入射エネルギー[eV]である。   In the above formula, α *, K are empirical values, Q is a fitting parameter, Sn (ε) is Lindhard's standardized nuclear stopping power, Se (ε) is Lindhard's standardized electronic stopping power, Us is Sublimation energy (surface binding energy), Eth is the threshold energy of sputtering, and E is the incident energy [eV] of the high energy beam.

図4にArイオンビームを各種の金属表面に照射したときの、yamamuraの式から計算したスパッタ率を示す。Arイオンビーム照射による低次元構造体の創成には、Arイオンビームによる基板金属のスパッタ効果と原子の表面拡散を促す意味での運動エネルギーの授受が非常に大きな役割を担っている。他の金属に対して比較的スパッタ率が大きいAu、Agはスパッタリングに必要なエネルギーの閾値が低く、表面構造が変化しやすいと考えられ、低次元構造体創成の為の基板材料となりうる可能性が高い。また、その電気的、化学的特性からナノ材料としての応用分野も広いと考えられる。   FIG. 4 shows the sputtering rate calculated from the yamamura equation when various metal surfaces are irradiated with an Ar ion beam. In the creation of a low-dimensional structure by irradiation with an Ar ion beam, the transfer of kinetic energy in the sense of promoting the sputtering effect of the substrate metal by the Ar ion beam and the surface diffusion of atoms plays a very important role. Au and Ag, which have a relatively high sputtering rate compared to other metals, have a low threshold of energy required for sputtering, and the surface structure is likely to change, and may be a substrate material for creating low-dimensional structures. Is expensive. In addition, due to its electrical and chemical characteristics, it is considered that the field of application as nanomaterials is wide.

本発明に用いる金属は、Arイオンスパッタリングの閾値エネルギーが25eV以下であると効果的に原子をスパッタできる。スパッタリングの閾値エネルギーが25eVを超えると、より高い入射エネルギーが必要となるからである。   The metal used in the present invention can effectively sputter atoms when the threshold energy of Ar ion sputtering is 25 eV or less. This is because when the threshold energy of sputtering exceeds 25 eV, higher incident energy is required.

また、本発明において用いる金属は、表面拡散の活性化エネルギーが1.6eV以下のものとする。活性化エネルギーが1.6eVを超える金属では、Arイオンビーム照射で金属の表面拡散が起こりにくくなってナノ・マイクロ突起体の成長が困難になるからである。   The metal used in the present invention has a surface diffusion activation energy of 1.6 eV or less. This is because, when the activation energy exceeds 1.6 eV, the surface diffusion of the metal is difficult to occur by Ar ion beam irradiation, and it becomes difficult to grow the nano / micro protrusions.

通常、金属の体拡散係数Dvolは、以下の〔数2〕式で表される。   Usually, the metal body diffusion coefficient Dvol is expressed by the following [Equation 2].

Dvol=D0exp(-Evol /kT)
ここで、D0は振動数因子、Evolは体拡散の活性化エネルギー、kはボルツマン定数、Tは絶対温度である。
Dvol = D0exp (-Evol / kT)
Here, D0 is a frequency factor, Evol is an activation energy for body diffusion, k is a Boltzmann constant, and T is an absolute temperature.

そして、金属の表面拡散係数Dsurfaceは以下の〔数3〕式で表される。   The surface diffusion coefficient Dsurface of the metal is expressed by the following [Equation 3].

Dsurface=D0exp(-Evol / 2kT)=D0exp(-Esurface /kT)
ここで、Esurfaceは表面拡散の活性化エネルギーであり、Esurface=Evol/2である。
Dsurface = D0exp (-Evol / 2kT) = D0exp (-Esurface / kT)
Here, Esurface is the activation energy of surface diffusion, and Esurface = Evol / 2.

表1に各種金属のEsurfaceとEthの値を掲げる。貴金属の中でもAg、Auは、Esurfaceが1.0eV以下、Ethが15eV以下であって、酸化されにくく本発明に好適な金属である。   Table 1 lists the Esurface and Eth values for various metals. Among precious metals, Ag and Au are metals that have an Esurface of 1.0 eV or less and an Eth of 15 eV or less and are not easily oxidized and are suitable for the present invention.

図14に、金属の表面拡散における活性化エネルギーEsurfaceとスパッタリングの閾値エネルギーの散布図を示す。Arイオンビームを9kV、照射角度30°、20分照射したときのナノ・マイクロ突起体の形成の有無を併せて示した。活性化エネルギーEsurfaceが1.6eV以下、閾値エネルギーが25eV以下の領域において、ナノ・マイクロ突起体の形成が認められた。特に、表面に酸化物の形成されにくいAu、Ag、Pd、Ptである貴金属においては、Ni、α−Ti、Nbに比べてナノ・マイクロ突起体が形成されやすい傾向が認められた。   FIG. 14 is a scatter diagram of the activation energy Esurface in the surface diffusion of metal and the threshold energy of sputtering. The presence / absence of formation of nano / micro protrusions when irradiated with an Ar ion beam at 9 kV, an irradiation angle of 30 ° for 20 minutes is also shown. In the region where the activation energy Esurface is 1.6 eV or less and the threshold energy is 25 eV or less, formation of nano / micro protrusions was observed. In particular, in the noble metals such as Au, Ag, Pd, and Pt in which oxides are not easily formed on the surface, it was recognized that nano / micro protrusions tend to be formed more easily than Ni, α-Ti, and Nb.

冷間圧延したAg板から矩形の試料を切り出して基板を作成した。この基板の表面を洗浄したのちに直ちに真空室に装入して、真空度10−3Paに保持するとともに、Arイオンビームを照射角度30°、加速電圧9kV、電流0.5mAの条件下で、10〜90分照射した。照射後に照射面のナノ・マイクロ突起の形状を走査電子顕微鏡にて観察した。 A rectangular sample was cut out from the cold-rolled Ag plate to prepare a substrate. After cleaning the surface of this substrate, it was immediately inserted into a vacuum chamber and maintained at a vacuum degree of 10 −3 Pa, and an Ar ion beam was irradiated at an irradiation angle of 30 °, an acceleration voltage of 9 kV, and a current of 0.5 mA. For 10 to 90 minutes. After irradiation, the shape of the nano / micro protrusions on the irradiated surface was observed with a scanning electron microscope.

図6−12には、照射時間10−90分のAg板の表面の走査電子顕微鏡写真を示す。10分照射で表面に隆起が現れた。その後20分〜90分と照射時間が長くなるにつれて多数のナノ・マイクロ突起体が成長していくことが認められた。   FIG. 6-12 shows a scanning electron micrograph of the surface of the Ag plate with an irradiation time of 10 to 90 minutes. A bump appeared on the surface after 10 minutes of irradiation. Thereafter, it was observed that a large number of nano / micro protrusions grew as the irradiation time increased from 20 minutes to 90 minutes.

図13には、20分照射材のナノ・マイクロ突起体についての拡大写真を示すが、多数の小さいナノ・マイクロ突起体が一つに合体されて、大きなナノ・マイクロ突起体を構成しているのが認められる。すなわち、一つの大きなナノ・マイクロ突起体は多数の先端鋭利な活性点を有する。   FIG. 13 shows an enlarged photograph of the nano / micro protrusions of the 20-minute irradiation material. A large number of small nano / micro protrusions are combined into one to form a large nano / micro protrusion. Is allowed. That is, one large nano / micro protrusion has a large number of sharp active sites.

Au、Pd、Ptについても同様にArイオンビームを照射したが、ナノ・マイクロ突起体が形成されるのを確認した。   Au, Pd, and Pt were similarly irradiated with an Ar ion beam, and it was confirmed that nano / micro protrusions were formed.

本発明のナノ・マイクロ突起体は、先端鋭利な多数の活性点を有するので、エタノールや水からのH生成、排ガス浄化の触媒、燃料電池電極の用途のほか、その特異な形態に基づき、光学材料、電子放出材料、半導体材料、電気接点材料等の多岐に渡る用途が期待される。 Since the nano / micro protrusions of the present invention have a large number of sharp active sites, based on their unique forms, besides the use of H 2 production from ethanol and water, exhaust gas purification catalysts, fuel cell electrodes, A wide variety of applications such as optical materials, electron emission materials, semiconductor materials, and electrical contact materials are expected.

Claims (4)

Arイオンスパッタリングの閾値エネルギーが25eV以下で、表面拡散の活性化エネルギーが1.6eV以下の貴金属からなる板に、低真空下で高エネルギービームを照射して、スパッタされた金属原子のエネルギー源方向への表面拡散により形成・成長されたことを特徴とするナノ・マイクロ突起体。   An energy source direction of sputtered metal atoms by irradiating a plate made of a noble metal having a threshold energy of Ar ion sputtering of 25 eV or less and an activation energy of surface diffusion of 1.6 eV or less under a low vacuum. Nano- and micro-projections formed and grown by surface diffusion into the surface. 前記ナノ・マイクロ突起体は、複数の小突起体が合体されてなる大突起体であることを特徴とするナノ・マイクロ突起体。   The nano / micro protrusion, wherein the nano / micro protrusion is a large protrusion formed by combining a plurality of small protrusions. 貴金属は、Au、Ag、Pd、Ptのうちの何れか1種であることを特徴とする請求項1に記載のナノ・マイクロ突起体。   2. The nano / micro protrusion according to claim 1, wherein the noble metal is any one of Au, Ag, Pd, and Pt. Arイオンスパッタリングの閾値エネルギーが25eV以下で、表面拡散の活性化エネルギーが1.6eV以下の貴金属からなる板に、低真空下で高エネルギービームを照射して、金属原子のエネルギー源方向への表面拡散により複数の小突起体が合体されてなる大突起体を形成することを特徴とするナノ・マイクロ突起体の製造方法。   A plate made of a noble metal having a threshold energy of Ar ion sputtering of 25 eV or less and an activation energy of surface diffusion of 1.6 eV or less is irradiated with a high energy beam under a low vacuum, and the surface of the metal atoms in the direction of the energy source A method for producing a nano / micro protrusion, wherein a large protrusion is formed by combining a plurality of small protrusions by diffusion.
JP2011091972A 2011-04-18 2011-04-18 Manufacturing method of nano / micro protrusions Active JP5924515B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011091972A JP5924515B2 (en) 2011-04-18 2011-04-18 Manufacturing method of nano / micro protrusions

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011091972A JP5924515B2 (en) 2011-04-18 2011-04-18 Manufacturing method of nano / micro protrusions

Publications (2)

Publication Number Publication Date
JP2012223842A true JP2012223842A (en) 2012-11-15
JP5924515B2 JP5924515B2 (en) 2016-05-25

Family

ID=47274604

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011091972A Active JP5924515B2 (en) 2011-04-18 2011-04-18 Manufacturing method of nano / micro protrusions

Country Status (1)

Country Link
JP (1) JP5924515B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013173112A (en) * 2012-02-27 2013-09-05 Tohoku Univ Exhaust gas cleaning catalyst
JP2014042977A (en) * 2012-08-29 2014-03-13 Tohoku Univ Nano-micro protrusion
DE102013219975A1 (en) 2012-10-09 2014-04-10 Fuji Electric Co., Ltd Gate drive circuit with an error detection circuit for a semiconductor switching device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107326209B (en) * 2017-07-05 2018-11-27 北京科技大学 The preparation method of noble metal and magnesium-yttrium-transition metal nano wire and mesh nanometer material

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005262373A (en) * 2004-03-18 2005-09-29 Nagoya Kogyo Univ Micro-nano projection structure, and its manufacturing method
JP2008094686A (en) * 2006-10-16 2008-04-24 Tohoku Univ Micro/nano structure, and its manufacturing method
JP2011056638A (en) * 2009-09-14 2011-03-24 Tohoku Univ Micronano-projection structure and method for producing the same

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005262373A (en) * 2004-03-18 2005-09-29 Nagoya Kogyo Univ Micro-nano projection structure, and its manufacturing method
JP2008094686A (en) * 2006-10-16 2008-04-24 Tohoku Univ Micro/nano structure, and its manufacturing method
JP2011056638A (en) * 2009-09-14 2011-03-24 Tohoku Univ Micronano-projection structure and method for producing the same

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
JPN6015006749; Shogo Oda, et al.: '"Preferred Orientation of Cu2O Nano-/Micro-Protrusions Grown by Ar Ion Irradiation"' Materials Science Forum Vols.638-642, 2010, pp 1784-1789 *
JPN6015006751; Hiroyuki TANAKA, et al.: '"Growth of Cu-oxide Protrusion by Ar Ion Irradiation"' Materials Science Forum vols.558-559, 2007, pp 1359-1362 *
JPN6015037287; 山村 泰道 他3名: '"イオンスパッタリング"' 真空 第26巻 第2号, 1983, 第69頁-第87頁 *
JPN6015037289; 池田 格 他1名: '"追跡子拡散法による銀の自己表面拡散係数の測定"' 日本金属学会誌 第30巻, 1966, 第694頁-第700頁 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013173112A (en) * 2012-02-27 2013-09-05 Tohoku Univ Exhaust gas cleaning catalyst
JP2014042977A (en) * 2012-08-29 2014-03-13 Tohoku Univ Nano-micro protrusion
DE102013219975A1 (en) 2012-10-09 2014-04-10 Fuji Electric Co., Ltd Gate drive circuit with an error detection circuit for a semiconductor switching device

Also Published As

Publication number Publication date
JP5924515B2 (en) 2016-05-25

Similar Documents

Publication Publication Date Title
JP5924515B2 (en) Manufacturing method of nano / micro protrusions
JPWO2005019109A1 (en) Manufacturing method of manganese oxide nanostructure and oxygen reduction electrode using the manganese oxide nanostructure
US7553513B2 (en) Electrochemical electrode using nickel-containing nanostructured material having dendritic structure as active layer, and method for producing the same
CN104894595B (en) A kind of amorphous metal oxide hydrogen-precipitating electrode of high catalytic activity and preparation method thereof
US11028490B2 (en) Subnanometer catalytic clusters for water splitting, method for splitting water using subnanometer catalyst clusters
US7566438B2 (en) Method for manufacturing nanostructured manganese oxide having dendritic structure, and oxygen reduction electrode comprising nanostructured transition metal oxide having dendritic structure
JP5548923B2 (en) Electrode for water splitting, method for producing electrode for water splitting, and water splitting method
JP2008207152A (en) Porous metal body with reaction efficiency enhanced and its production method
US7666385B2 (en) Nanostructured zinc oxide photocatalyst for visible light and manufacturing method of the same
Rosen et al. Microwave heating of nanocrystals for rapid, low-aggregation intermetallic phase transformations
JP4734573B2 (en) Manufacturing method of micro / nanostructure and micro / nanostructure
JP2009255013A (en) Photocatalyst
KR20210038106A (en) Manufacturing method for metal foam
Huang et al. Recent Progress in the Application of Ion Beam Technology in the Modification and Fabrication of Nanostructured Energy Materials
JP2014145105A (en) Nanopillar and formation method thereof, and bonding material, battery, carbon dioxide recovery/storage device and module for power conversion apparatus using nanopillar
JP2011056638A (en) Micronano-projection structure and method for producing the same
KR102471909B1 (en) Water splitting catalyst
Ting et al. In situ manipulation of E-beam irradiation-induced nanopore formation on molybdenum oxide nanowires
JP5028620B2 (en) Nanoprotrusion structure and manufacturing method thereof
Bervian et al. Application of Taguchi method to study morphological evolution of TiO2 nanotubes obtained via anodization process
Wang et al. Synthesis of Cu xO (x= 1, 2)/amorphous compounds by dealloying and spontaneous oxidation method
JP5527664B2 (en) Manufacturing method of fuel cell
JP2017128458A (en) Oxynitride fine particle, photocatalyst for water decomposition, photocatalyst electrode for generating hydrogen and oxygen, photocatalyst module for generating hydrogen and oxygen and manufacturing method of oxynitride fine particle
Sreekantan et al. Post-annealing treatment for Cu-TiO2 nanotubes and their use in photocatalytic methyl orange degradation and Pb (II) heavy metal ions removal
JP6131437B2 (en) Manufacturing method of nano / micro protrusions

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20140324

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20140401

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20150317

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150427

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20151006

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20151228

A911 Transfer to examiner for re-examination before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20160108

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20160308

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160309

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20160405

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20160406

R150 Certificate of patent or registration of utility model

Ref document number: 5924515

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250