JP2012136756A5 - - Google Patents

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JP2012136756A5
JP2012136756A5 JP2010291234A JP2010291234A JP2012136756A5 JP 2012136756 A5 JP2012136756 A5 JP 2012136756A5 JP 2010291234 A JP2010291234 A JP 2010291234A JP 2010291234 A JP2010291234 A JP 2010291234A JP 2012136756 A5 JP2012136756 A5 JP 2012136756A5
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target
reactive gas
targets
sputtering method
gas
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JP2012136756A (en
JP5661452B2 (en
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上述した課題を解決するために、本発明の1つの側面は、互いに材料が異なるターゲットが取り付けられた2つのターゲットホルダーが配された真空容器内において、前記真空容器内に不活性ガス及び反応性ガス導入された状態において前記2つのターゲットを同時にスパッタリングすることで基板に前記2つのターゲットの材料の混合物を含有する膜を成膜する際に、前記2つのターゲットの各々への前記反応性ガスの供給量が異なることを特徴とする。
また、本発明の他の側面は、真空容器内に不活性ガス及び反応性ガスを導入し、アルミニウムターゲット及びチタンターゲットを同時にスパッタリングすることで基板にアルミニウムおよびチタンの混合物を含有する膜を成膜する際に、前記チタンターゲットへの前記反応性ガスの供給量が前記アルミニウムターゲットへの前記反応性ガスの供給量よりも多いことを特徴とする。
In order to solve the above-described problems, one aspect of the present invention is that, in a vacuum vessel in which two target holders to which targets of different materials are attached are arranged , an inert gas and a reactive property are contained in the vacuum vessel . When a film containing a mixture of materials of the two targets is formed on a substrate by simultaneously sputtering the two targets in a state where a gas is introduced, the reaction to each of the two targets It is characterized in that the supply amount of the characteristic gas is different.
In another aspect of the present invention, an inert gas and a reactive gas are introduced into a vacuum vessel, and a film containing a mixture of aluminum and titanium is formed on a substrate by simultaneously sputtering an aluminum target and a titanium target. In this case, the supply amount of the reactive gas to the titanium target is larger than the supply amount of the reactive gas to the aluminum target.

Claims (9)

互いに材料が異なるターゲットが取り付けられた2つのターゲットホルダーが配された真空容器内において、前記真空容器内に不活性ガス及び反応性ガス導入された状態において前記2つのターゲットを同時にスパッタリングすることで基板に前記2つのターゲットの材料の混合物を含有する膜を成膜する際に、前記2つのターゲットの各々への前記反応性ガスの供給量が異なることを特徴とするスパッタリング方法。 In a vacuum vessel in which two target holders to which targets of different materials are attached are arranged, the two targets are simultaneously sputtered in a state where an inert gas and a reactive gas are introduced into the vacuum vessel. Thus, when the film containing the mixture of the materials of the two targets is formed on the substrate, the supply amount of the reactive gas to each of the two targets is different. 前記スパッタリングにおいて、前記2つの各ターゲットの各々への前記反応性ガスの供給量が異なることによって、前記2つのターゲットのうちの一方がポイズンモードとなり、前記2つのターゲットのうちの他方がメタルモードとなっていることを特徴とする請求項1に記載のスパッタリング方法。 In the sputtering, by supplying the amount of the reactive gas into each of the two respective targets are different, one of the two targets become poison mode, and the other metal mode of said two targets The sputtering method according to claim 1, wherein: 記ポイズンモードとするターゲット近傍にのみ前記反応性ガスを導入することを特徴とする請求項に記載のスパッタリング方法。 Sputtering method according to claim 2, wherein the introduction of the reactive gas only target the vicinity of the front Kipo Izunmodo. 前記不活性ガスを前記メタルモードとするターゲット近傍に導入することを特徴とする請求項2または3のいずれか1項に記載のスパッタリング方法。 4. The sputtering method according to claim 2 , wherein the inert gas is introduced in the vicinity of the target to be the metal mode. 5. 真空容器内に不活性ガス及び反応性ガスを導入し、アルミニウムターゲット及びチタンターゲットを同時にスパッタリングすることで基板にアルミニウムおよびチタンの混合物を含有する膜を成膜する際に、前記チタンターゲットへの前記反応性ガスの供給量が前記アルミニウムターゲットへの前記反応性ガスの供給量よりも多いことを特徴とするスパッタリング方法。 When forming a film containing a mixture of aluminum and titanium on a substrate by introducing an inert gas and a reactive gas into a vacuum vessel and simultaneously sputtering an aluminum target and a titanium target , the titanium target is added to the titanium target. A sputtering method, wherein a supply amount of the reactive gas is larger than a supply amount of the reactive gas to the aluminum target. 前記スパッタリング中は、前記チタンターゲットがポイズンモードとなり、前記アルミニウムターゲットがメタルモードとなっていることを特徴とする請求項5に記載のスパッタリング方法。 During the sputtering, the titanium target becomes poison mode sputtering method of claim 5, wherein the aluminum target is characterized in that has a metal mode. 前記チタンターゲット近傍にのみ前記反応性ガスを導入することを特徴とする請求項5または6に記載のスパッタリング方法。   The sputtering method according to claim 5, wherein the reactive gas is introduced only in the vicinity of the titanium target. 前記不活性ガスを前記アルミニウムターゲット近傍に導入することを特徴とする請求項5乃至7のいずれか1項に記載のスパッタリング方法。   The sputtering method according to claim 5, wherein the inert gas is introduced in the vicinity of the aluminum target. 前記反応性ガスは窒素ガスであることを特徴とする請求項5乃至8のいずれか1項に記載のスパッタリング方法。   The sputtering method according to claim 5, wherein the reactive gas is nitrogen gas.
JP2010291234A 2010-12-27 2010-12-27 Sputtering method Active JP5661452B2 (en)

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JP2012136756A JP2012136756A (en) 2012-07-19
JP2012136756A5 true JP2012136756A5 (en) 2014-01-09
JP5661452B2 JP5661452B2 (en) 2015-01-28

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KR102081748B1 (en) * 2012-08-09 2020-02-26 가부시키가이샤 아루박 Film formation method and film formation device
US9929310B2 (en) 2013-03-14 2018-03-27 Applied Materials, Inc. Oxygen controlled PVD aluminum nitride buffer for gallium nitride-based optoelectronic and electronic devices
TWI815945B (en) * 2018-08-10 2023-09-21 美商應用材料股份有限公司 Multicathode deposition system
JP2022525617A (en) 2019-03-22 2022-05-18 アプライド マテリアルズ インコーポレイテッド Methods and equipment for depositing multi-layer devices with superconducting membranes
CN113614275B (en) * 2019-03-22 2023-03-31 应用材料公司 Method and apparatus for depositing metal nitrides
JP7277609B2 (en) * 2019-04-22 2023-05-19 アプライド マテリアルズ インコーポレイテッド gas flow system

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JP4740575B2 (en) * 2004-11-01 2011-08-03 株式会社ユーテック Opposing target type sputtering apparatus and opposing target type sputtering method
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