JP2012122989A - 共振周波数シフトを用いた静電容量方式タッチスクリーンパネルの電気的特性検査装置 - Google Patents
共振周波数シフトを用いた静電容量方式タッチスクリーンパネルの電気的特性検査装置 Download PDFInfo
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- JP2012122989A JP2012122989A JP2011178843A JP2011178843A JP2012122989A JP 2012122989 A JP2012122989 A JP 2012122989A JP 2011178843 A JP2011178843 A JP 2011178843A JP 2011178843 A JP2011178843 A JP 2011178843A JP 2012122989 A JP2012122989 A JP 2012122989A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2829—Testing of circuits in sensor or actuator systems
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0412—Digitisers structurally integrated in a display
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
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- Electromagnetism (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
【課題】共振周波数の変化によりCTSPのITO抵抗Rpと静電容量Cpを同時に測定するように機能する、共振周波数シフトを用いた静電容量方式タッチスクリーンパネルの電気的特性検査装置を提供する。
【解決手段】本発明の共振周波数シフトを用いた静電容量方式タッチスクリーンパネルの電気的特性検査装置は、回路に電圧または電流を供給する電源部と、CTSPのITO電極の抵抗Rpおよび電極間の静電容量Cpを直列に配置したCTSP部と、前記電源部に接続され、電気的共振を起こすLC共振回路を含む共振部と、前記共振部に接続され、前記共振部の共振周波数を変化させる共振周波数変更部と、前記CTSP部と共振周波数変更部との間で動作し、前記CTSP部と前記共振周波数変更部とを接続する作動部とを含んでなり、前記作動部の動作によって前記CTSP部と前記共振部とを接続した状態で、共振周波数の変化により前記CTSP部の抵抗Rpと静電容量Cpを同時に測定することを特徴とする。
【選択図】図2
Description
200 共振部
300 共振周波数変更部
400 作動部
500 CTSP部
Claims (4)
- 共振回路を用いた静電容量方式タッチスクリーンパネルの検査装置において、
回路に電圧または電流を供給する電源部と、
CTSPのITO電極の抵抗Rpおよび電極間の静電容量Cpを直列に接続したCTSP部と、
前記電源部に接続され、電気的共振を起こすLC共振回路を含む共振部と、
前記共振部に接続され、前記共振部の共振周波数を変化させる共振周波数変更部と、
前記CTSP部と共振周波数変更部との間で動作し、前記CTSP部と前記共振周波数変更部とを接続する作動部とを含んでなり、
前記作動部の動作によって前記CTSP部と前記共振部とを接続した状態で、共振周波数の変化により前記CTSP部の抵抗Rpと静電容量Cpを同時に測定することを特徴とする、共振周波数シフトを用いた静電容量方式タッチスクリーンパネルの電気的特性検査装置。 - 前記共振周波数の変化は、前記CTSP部の抵抗Rpに任意に変更可能な抵抗rを直列に接続してrの変化に応じて生じることを特徴とする、請求項1に記載の共振周波数シフトを用いた静電容量方式タッチスクリーンパネルの電気的特性検査装置。
- 前記共振周波数変更部は、スイッチがターンオンされるように作動して前記共振部に別途のキャパシタをさらに並列接続し、前記共振周波数を変化させて前記CTSP部の静電容量Cpを測定することを特徴とする、請求項1に記載の共振周波数シフトを用いた静電容量方式タッチスクリーンパネルの電気的特性検査装置。
- 前記CTSP部の抵抗Rpを固定し、共振周波数の変化による前記CTSP部の静電容量Cpを測定することを特徴とする、請求項3に記載の共振周波数シフトを用いた静電容量方式タッチスクリーンパネルの電気的特性検査装置。
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KR1020100123216A KR101150624B1 (ko) | 2010-12-06 | 2010-12-06 | 공진주파수 변이를 이용한 정전용량방식 터치스크린패널의 전기적 특성 검사장치 |
KR10-2010-0123216 | 2010-12-06 |
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JP2012122989A true JP2012122989A (ja) | 2012-06-28 |
JP5321990B2 JP5321990B2 (ja) | 2013-10-23 |
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JP (1) | JP5321990B2 (ja) |
KR (1) | KR101150624B1 (ja) |
CN (1) | CN102539950B (ja) |
TW (1) | TWI432744B (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014186022A (ja) * | 2013-02-22 | 2014-10-02 | Mitsubishi Electric Corp | 太陽電池パネルの診断方法 |
CN104678186A (zh) * | 2015-02-12 | 2015-06-03 | 深圳市精智达技术有限公司 | 电容式触摸屏传感器的测量系统 |
WO2016067709A1 (ja) * | 2014-10-29 | 2016-05-06 | 日本電産リード株式会社 | 基板検査装置、及び基板検査方法 |
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CN104459400B (zh) | 2014-12-08 | 2018-07-17 | 深圳市华星光电技术有限公司 | 用于自容式触摸屏的检测电路和检测方法 |
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JPS63247671A (ja) * | 1987-04-02 | 1988-10-14 | Tohoku Electric Power Co Inc | 電力系統の対地静電容量の測定方法 |
JP2002131347A (ja) * | 2000-10-24 | 2002-05-09 | Nippon Telegraph & Telephone East Corp | 接地抵抗測定装置及び接地抵抗測定方法 |
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KR100971220B1 (ko) * | 2009-08-17 | 2010-07-20 | 주식회사 에프티랩 | Lc공진주파수 변이를 이용한 정전용량방식 터치스크린패널의 검사방법 |
CN101846712B (zh) * | 2010-04-01 | 2012-08-29 | 苏州崴展电子科技有限公司 | 电容式触摸屏ito电气特性检测方法及检测系统 |
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JPS62222328A (ja) * | 1986-01-15 | 1987-09-30 | テクトロニツクス・インコ−ポレイテツド | タッチパネル装置 |
JPS63247671A (ja) * | 1987-04-02 | 1988-10-14 | Tohoku Electric Power Co Inc | 電力系統の対地静電容量の測定方法 |
JP2002131347A (ja) * | 2000-10-24 | 2002-05-09 | Nippon Telegraph & Telephone East Corp | 接地抵抗測定装置及び接地抵抗測定方法 |
Cited By (6)
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JP2014186022A (ja) * | 2013-02-22 | 2014-10-02 | Mitsubishi Electric Corp | 太陽電池パネルの診断方法 |
WO2016067709A1 (ja) * | 2014-10-29 | 2016-05-06 | 日本電産リード株式会社 | 基板検査装置、及び基板検査方法 |
JPWO2016067709A1 (ja) * | 2014-10-29 | 2017-10-05 | 日本電産リード株式会社 | 基板検査装置、及び基板検査方法 |
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CN104678186B (zh) * | 2015-02-12 | 2017-12-22 | 深圳精智达技术股份有限公司 | 电容式触摸屏传感器的测量系统 |
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CN102539950A (zh) | 2012-07-04 |
JP5321990B2 (ja) | 2013-10-23 |
KR101150624B1 (ko) | 2012-05-30 |
CN102539950B (zh) | 2015-07-29 |
TW201224470A (en) | 2012-06-16 |
TWI432744B (zh) | 2014-04-01 |
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