JP2012112832A - Analyzer - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an analyzer which can be used even in an establishment having no high voltage power supply facility.SOLUTION: An analyzer 1 comprises: a plurality of units 81 for being supplied a current and materializing a predetermined function; a power supply unit 202 for supplying the current to the plurality of units 81; setting means for setting either one of a first mode in which the power supply unit 202 executes first current supply control for supplying a current of first total amount to the plurality of units 81 in a predetermined period, or a second mode in which the power supply unit 202 executes second current supply control for supplying a current of second total amount smaller than the first total amount to the plurality of units in the predetermined period, according to the height of the voltage of a power supply facility provided in an installation establishment; and current supply controlling means 203 for executing the current supply control in the mode set by the setting means.

Description

  The present invention relates to an analyzer for analyzing a sample using a reagent housed in a reagent container such as a blood coagulation analyzer or an immune analyzer.

  In general, the analyzer includes various units that receive a current and realize predetermined functions. As such a unit, the analyzer described in Patent Document 1 below includes a reagent storage for cooling the reagent, and the analyzer described in Patent Document 2 described below sets the mixture of the specimen and the reagent to a predetermined temperature. It has a thermostatic chamber for heating.

JP 2009-8611 A JP 2010-2236 A

  The analyzer requires a large amount of power to operate a plurality of units. For example, in the case of an analyzer equipped with a unit having a temperature control function such as the above-described reagent storage or thermostat, the difference between the actual temperature of the unit and the target temperature is particularly large at the time of startup, so this difference is reduced. There are things that require a lot of power to do. In order to install such an analyzer in a facility that can supply only a small amount of power (for example, a facility having a power supply facility of 100 V, 1500 W), it is necessary to perform a construction that can supply a large amount of power. As such a construction, for example, a construction for increasing the voltage of the power supply equipment (for example, a construction for making the power supply equipment of AC 200V) becomes necessary.

  An object of the present invention is to provide an analyzer that can be used in a facility that does not have a high-voltage power supply facility without performing construction for introducing a facility that can handle the high voltage.

(1) The analyzer according to the first aspect of the present invention is:
A plurality of units that receive a current and realize a predetermined function;
A power supply for supplying current to the plurality of units;
A first mode in which the power supply unit executes a first current supply control in which a first total amount of current is supplied to the plurality of units in a predetermined period; and the power source unit is more than the first total amount in the predetermined period. According to the voltage level of the power supply equipment provided in the installation facility, any mode of the second mode for executing the second current supply control for supplying the second unit with a small second total amount of current is performed. Setting means for setting,
Current supply control means for executing current supply control in the mode set by the setting means.

  According to the analyzer of the first aspect of the present invention, the current supply control mode for the plurality of units is set to the second mode, so that the power supply unit is set to the predetermined period compared to the case of setting to the first mode. The total amount of current supplied to the plurality of units can be reduced. Therefore, when the facility where the analyzer is installed does not have a high-voltage power supply facility, it is required to operate the plurality of units by setting the current supply control mode for the plurality of units to the second mode. It is possible to prevent the current from exceeding the current capacity of the power supply facility and the margin (margin) of the current capacity of the power supply facility relative to the current from being reduced. It can be used appropriately. Moreover, even if the analyzer is installed in a facility that does not have a high-voltage power supply facility, it can be used appropriately, so that it is not necessary to perform a construction for increasing the power supply voltage, and the materials used for the construction can be saved.

  Note that the setting means for setting the current supply control mode for the plurality of units matches the voltage of the power supply equipment of the installation facility (for example, AC 100V or AC 200V), for example, through an artificial operation such as an operation by a service person. The mode may be set, or the voltage may be automatically detected and set when the analyzer is connected to the power supply facility.

(2) It is preferable that the plurality of units include a temperature adjustment unit that cools or heats at least one of the specimen and the reagent.
Usually, the temperature control unit requires a large amount of power. Therefore, when an analyzer is installed in a facility that does not have a high-voltage power supply facility, the current required to operate the temperature control unit becomes very large. In the present invention, even if the facility does not have a high-voltage power supply facility by setting the second mode in which the total amount of current in a predetermined period is smaller as the current supply control mode for a plurality of units including the temperature control unit. The electric current which flows into a some unit can be suppressed, and the said analyzer can be used appropriately.

(3) It is preferable that the first current supply control and the second current supply control are executed at least until the temperature adjustment unit reaches a target temperature.
When the temperature adjustment unit is started from a stopped state, the difference between the actual temperature of the temperature adjustment unit and the target temperature becomes large, so that more electric power is required to bring the actual temperature closer to the target temperature. Therefore, when the analyzer is installed in a facility that does not have a high-voltage power supply facility, the current flowing through the temperature adjustment unit is obtained by executing the second current supply control at least until the temperature adjustment unit reaches the target temperature. It can be suppressed appropriately. Conversely, when the analyzer is installed in a facility having a high-voltage power supply facility, the temperature adjustment unit can be reached to the target temperature in a shorter time by executing the first current supply control.

(4) The analyzer according to the first aspect of the present invention may further include partial power-off means for ending current supply to other units while continuing to supply current to the temperature control unit. preferable.
According to this configuration, the current supply to the temperature control unit can be continuously performed even when the analyzer is shut down (the current supply to other units other than the temperature control unit is terminated). Therefore, it is possible to prevent the difference between the actual temperature of the temperature control unit and the target temperature from increasing, and to reduce the current supplied to the temperature control unit the next time the analyzer is started, The start-up time of the analyzer until the temperature of the temperature control unit reaches the target temperature can be shortened.

(5) The amount of current supplied to a predetermined unit among the plurality of units in the second current supply control in the predetermined period is supplied to the predetermined unit in the predetermined period in the first current supply control. It is preferable that the amount of current is smaller.

(6) More specifically, the current supply control means controls the amount of current supplied to the predetermined unit according to the ratio of the length of the current supply period in the predetermined period, and the second current supply control The ratio is preferably smaller than the ratio in the first current supply control.
Thus, the current supplied to the predetermined unit is appropriately controlled by changing the ratio of the current supply period in the predetermined period between the first current supply control and the second current supply control. can do.

(7) The period in which the power supply unit supplies current to the plurality of units simultaneously in the second current supply control is a period in which the power supply unit supplies current to the plurality of units simultaneously in the first current supply control. Is preferably shortened.
Thereby, the total amount of current to the plurality of units by the second current supply control can be easily made smaller than the total amount of current to the plurality of units by the second current supply control.

(8) Further, in the second current supply control, the current supply control means may execute control in which a period during which the power source supplies current to a plurality of units partially overlaps and control that does not overlap. preferable.
According to this configuration, the current supply control means executes the control in which the period during which the power supply unit supplies the current to the plurality of units in the second current supply control is partially overlapped, so that the current supply within the current capacity allowed by the power supply facility. Thus, a current as large as possible can be supplied to a plurality of units, and a smaller current can be supplied to a plurality of units by executing control that does not overlap the period.

(9) Preferably, the plurality of units are the same type of unit, and the second current supply control is control in which the power supply unit alternately supplies current to the plurality of units.

(10) The plurality of units may be different types of units.

(11) The first mode is a mode that requires AC 200V power supply equipment, and the second mode is a mode that requires AC 100V power equipment but does not require AC 200V power equipment. Preferably there is.

(12) The predetermined unit of the plurality of units realizes the predetermined function by repeating the start of supply of current and the stop of supply of current, and the predetermined period is determined in the second current supply control. From the start of the current supply to the predetermined unit until the next start of the current supply in the repetition of the current supply start and the current supply stop for realizing the predetermined function in the predetermined unit A period is preferred.

(13) The analyzer according to the second aspect of the present invention is:
A plurality of units that receive a current and realize a predetermined function;
A power supply for supplying current to the plurality of units;
A first mode in which the power supply unit executes a first current supply control in which a first total amount of current is supplied to the plurality of units in a predetermined period; and the power source unit is more than the first total amount in the predetermined period. Setting means for setting any one of a second mode for executing a second current supply control for supplying a small second total amount of current to the plurality of units;
Current supply control means for executing current supply control in the mode set by the setting means at the time of startup.

  According to the present invention, it is possible to use an analyzer even in a facility that does not have a high-voltage power supply facility.

It is a perspective view which shows the whole structure of the sample analyzer which concerns on embodiment of this invention. It is a top view which shows schematic structure of the measuring apparatus of the sample analyzer shown by FIG. It is a block diagram which shows the structure of the measuring apparatus of the sample analyzer shown by FIG. It is sectional drawing which shows typically the reagent storage shown by FIG. It is a block diagram which shows the electric current supply system with respect to a cooler. It is a flowchart which shows operation | movement of a sample analyzer. It is a wave form diagram which shows an electric current supply timing. 6 is a table showing a relationship between a temperature difference between a target temperature and a current temperature and a duty ratio. It is a figure which shows a 100V mode setting screen. It is a wave form diagram which shows the electric current supply timing in 2nd Embodiment. It is a block diagram which shows the electric current supply system of the sample analyzer which concerns on 3rd Embodiment. It is a flowchart which shows operation | movement of a sample analyzer. It is a wave form diagram which shows an electric current supply timing. It is a figure which shows a shutdown screen.

  Hereinafter, embodiments of a sample analyzer according to the present invention will be described in detail with reference to the accompanying drawings. FIG. 1 is a perspective view showing an overall configuration of a sample analyzer 1 according to an embodiment of the present invention, and FIG. 2 is a plan view showing a schematic configuration of the measuring apparatus.

  The sample analyzer 1 of the present embodiment is a device for optically measuring and analyzing the amount and activity level of a specific substance related to the coagulation / fibrinolysis function of blood. Use. In the sample analyzer 1 of the present embodiment, the sample is optically measured using a coagulation time method, a synthetic substrate method, and an immunoturbidimetric method. The coagulation time method used in this embodiment is a measurement method that detects the process of coagulation of a specimen as a change in transmitted light. Measurement items include PT (prothrombin time), APTT (activated partial thromboplastin time), Fbg (fibrinogen amount), and the like. In addition, measurement items of the synthetic substrate method include ATIII and the like, and measurement items of the immunoturbidimetric method include D dimer, FDP and the like.

  As shown in FIGS. 1 and 2, the sample analyzer 1 includes a measuring device 2 and a control device 4 electrically connected to the measuring device 2. The measuring device 2 includes a measuring mechanism unit 5 and a transport mechanism unit 6 disposed on the front side of the measuring mechanism unit 5. As shown in FIG. 2, the transport mechanism unit 6 displays a sample rack 14 in which a plurality of sample containers (test tubes) 13 containing samples are held in order to supply a sample to the measurement mechanism unit 5. A transport path 6a between the middle right rack set area 6b and the left rack accommodating area 6c is transported in the left-right direction, and the sample container 13 is positioned at predetermined sample suction positions 15a and 15b during the transport. is doing. In addition, the transport mechanism unit 6 includes a sample barcode reader 16 for reading a barcode attached to the sample container 13.

  The measurement mechanism unit 5 is configured to be able to acquire optical information regarding the sample by performing optical measurement on the sample supplied from the transport mechanism unit 6. In the present embodiment, optical measurement is performed on the sample dispensed from the sample container 13 held in the sample rack 14 of the transport mechanism unit 6 into the cuvette of the measurement mechanism unit 5.

  The measurement mechanism unit 5 includes first and second reagent tables 21 and 22, a cuvette table 23, a heating table 24, first and second sample dispensing units 25 and 26, and first to third reagent dispensing units 27 to 29, first to third catcher units 30 to 32, a cuvette transporter 34, a diluent transporter 35, pipette cleaners 36a to 36e, a detection unit 37, and the like.

  The first and second reagent tables 21 and 22, the cuvette table 23, and the heating table 24 are circular tables, and each of them is independently rotated both clockwise and counterclockwise by a driving unit such as a stepping motor. Is done. The first and second reagent tables 21 and 22 are arranged in the reagent storage (reagent cold storage unit) 40 and hold reagent containers containing reagents on the first and second reagent tables 21 and 22. The first reagent container rack 310 and the second reagent container rack 320 are set. The reagent store 40 includes a cooler 80 (see FIG. 3) for cooling the stored reagent. The heating table 24 includes a holding hole 24a for holding the cuvette and a heating heater 73 (see FIG. 3) for heating the cuvette held in the holding hole 24a.

  The first sample dispensing unit 25 includes an arm 25b that is horizontally rotated and moved up and down by a drive unit such as a stepping motor, and a dispensing unit 25c provided at the tip of the arm 25b. A pipette is attached to the dispensing unit 25c, and a sample or the like is aspirated and discharged using this pipette. Then, the first sample dispensing unit 25 sucks the sample from the sample container 13 positioned at the sample suction position 15a by the transport mechanism 6, and the cuvette holding hole positioned at the sample discharge position 19a in the front portion of the cuvette table 23. The sample is discharged into the cuvette set at 55.

  The second sample dispensing unit 26 and the first to third reagent dispensing units 27 to 29 also have the same configuration as the first sample dispensing unit 25. That is, in these units 26 and 27 to 29, the arm part is horizontally rotated and vertically moved up and down by a driving part such as a stepping motor, and a sample and a reagent are aspirated and discharged by a pipette attached to the dispensing part.

  The second sample dispensing unit 26 is configured to suck a predetermined sample by the sample stored in the cuvette set in the cuvette holding hole 55 positioned at the sample suction position 19b in the front part of the cuvette table 23 or by the transport mechanism unit 6. The sample in the sample container 13 positioned at the position 15 b is aspirated, and the sample is discharged to the cuvette set in the cuvette transporter 34. The second specimen dispensing unit 26 can also inhale the diluent set in the diluent transporter 35. The pipettes of the first and second sample dispensing units 25 and 26 are inserted into the holes of the pipette cleaners 36a and 36b after the dispensing operation is completed, and are washed with the cleaning liquid.

  The first to third catcher units 30 to 32 are driven by a driving unit such as a stepping motor and have a function of moving the cuvette in a gripped state. The cuvette transporter 34 and the diluent transporter 35 are moved in the left-right direction on the rails 34a and 35a by a drive unit such as a stepping motor. The cuvette transporter 34 and the diluent transporter 35 are each formed with a holding hole for holding the cuvette and the diluent container.

  The cuvette transporter 34 is driven rightward on the rail 34a at a predetermined timing when a sample is discharged from the second sample dispensing unit 26 to the held cuvette. Subsequently, the first catcher unit 30 grips the cuvette containing the sample set in the cuvette transporter 34 and sets it in the cuvette holding hole 24 a of the heating table 24.

  The second catcher unit 31 holds the cuvette containing the specimen set in the holding hole 24a of the heating table 24 and moves it to the position just above the pipette washer 36c. The reagent aspirated from a predetermined reagent container arranged in the first reagent table 21 or the second reagent table 22 by the first reagent dispensing unit 27 is discharged to the cuvette. Then, the second catcher unit 31 stirs the cuvette from which the reagent has been discharged and sets it again in the cuvette holding hole 24 a of the heating table 24.

  The third catcher unit 32 grips the cuvette held in the cuvette holding hole 24a of the heating table 24 and positions it in the region directly above the pipette cleaner 36d or 36e. The reagent aspirated from the reagent containers arranged in the first and second reagent tables 21 and 22 by the second reagent dispensing unit 28 or the third reagent dispensing unit 29 is discharged to the cuvette. Then, the third catcher unit 32 sets the cuvette from which the reagent has been discharged in the detection unit 37.

  In the detection unit 37, a plurality of (20 in the illustrated example) holding holes 37a for accommodating the cuvettes are formed on the upper surface, and a detection unit (not shown) is disposed on the back side of the lower surface. When the cuvette is set in the holding hole 37a of the detection unit 37 by the third catcher unit 32, the detection unit detects optical information reflecting the component included in the measurement sample in the cuvette.

  FIG. 3 is a block diagram showing the configuration of the measurement device 2 of the sample analyzer 1. The first and second reagent tables 21 and 22, the cuvette table 23, the heating table 24, the first and second sample dispensing units 25 and 26, the first to third reagent dispensing units 27 to 29, the first -The third catcher units 30-32, the cuvette transport device 34, the diluent transport device 35, and the drive units 97, 98, 141-145 for driving the detection unit 37, respectively, and the coolers in the reagent storage 40 80, the heating heater 73 of the heating table 24, and the like are electrically connected to the control unit 501 of the measuring apparatus 2, and the operation of the control unit 501 is controlled. The detection unit 37 is configured to be able to transmit the acquired optical information to the control unit 501. The control unit 501 includes a CPU, a ROM, a RAM, a communication interface, and the like, and exhibits a predetermined function by reading a computer program or the like stored in the ROM into the RAM and executing it by the CPU. The communication interface of the control unit 501 is connected to the control device 4 (see FIG. 1), and transmits optical information of the specimen to the control device 4 and receives signals from the control unit 4a of the control device 4. It has the function of

  As shown in FIG. 1, the control device 4 includes a personal computer 401 (PC) or the like, and includes a control unit 4a, a display unit 4b, and a keyboard 4c for inputting information. The control unit 4a is communicably connected to the control unit 501 (see FIG. 3) of the measurement mechanism unit 5, transmits an operation start signal of the measurement mechanism unit 5, and the sample obtained by the measurement mechanism unit 5 It has a function to analyze optical information. The control unit 4a includes a storage unit 4d, and stores information on the operation mode (100V mode and 200V mode) of the measuring device 2 set in a setting window 210 of FIG. The display unit 4b is provided for displaying the analysis results obtained by the control unit 4a.

  FIG. 4 is a cross-sectional view schematically showing the reagent storage 40 shown in FIG. The reagent store 40 is provided for refrigerated storage of a reagent container 300 containing a reagent to be added to the specimen in the cuvette at a low temperature (for example, about 10 ° C.) and for transporting it in the rotation direction. The reagent is prevented from being altered by being stored at a low temperature. In addition, in the reagent storage 40, a circular first reagent table 21 and an annular second reagent table 22 arranged concentrically outside the first reagent table 21 in the radial direction are provided. Yes. On the first reagent table 21 and the second reagent table 22, reagent container racks 310 and 320 holding the reagent containers 300 are detachably mounted, respectively. The first reagent table 21 and the second reagent table 22 are rotatably supported at a position spaced upward from the bottom surface of the reagent storage 40 by a rotation support unit 38 and the like, and a first drive unit including a stepping motor and the like. 97 and the second drive unit 98 are rotated by the power transmitted through the belt transmission mechanism 99.

  The reagent storage 40 closes the bottomed cylindrical main body 65 provided with the bottom wall 63 and the peripheral wall 64 rising from the outer periphery of the bottom wall 63, and the upper opening of the main body 65, and serves as the upper wall of the reagent storage 40. A functioning lid portion 66 is provided, and a sealed space surrounded by the main body portion 65 and the lid portion 66 is a cooling chamber, and the reagent container 300 is disposed in the cooling chamber.

  In addition, a plurality of reagent suction holes (not shown) are formed in the lid 66 of the reagent store 40, and the first and second sample dispensing units 25 and 26 shown in FIG. And pipettes of the first to third reagent dispensing units 27 to 29 (reagent suction unit) are inserted, and the reagent in the reagent container 300 stored in the reagent container 40 is sucked from the upper opening of the reagent container 300. It is comprised so that.

  As shown in FIG. 4, the peripheral wall 64 of the main body 65 of the reagent storage 40 is formed in an inner and outer two-layer structure, and the inner layer 75 is made of a material such as a synthetic resin having a low thermal conductivity such as a synthetic resin. Is formed by. Further, the outer layer 76 is a heat insulating layer having a lower thermal conductivity. The bottom wall 63 of the main body 65 is also formed in an inner and outer two-layer structure, and the outer peripheral portion 77 of the inner layer is formed of a material such as a synthetic resin so as to continue from the inner layer 75 of the peripheral wall 64. A central portion of the inner layer 63 is a heat transfer layer 78 formed of a material having high thermal conductivity such as aluminum. The outer layer 79 of the bottom wall 63 is a heat insulating layer. Moreover, the cover part 66 is formed with materials, such as a synthetic resin with low heat conductivity.

  As shown in FIG. 4, the heat transfer layer 78 provided on the bottom wall 63 of the main body 65 has a part of its lower surface exposed downward, and a cooler 80 is provided on the exposed surface. Yes. In the present embodiment, the two coolers 80 are arranged at symmetrical positions around the central axis O of the reagent storage 40 (the rotation center of the first and second reagent tables 21 and 22). The cooler 80 of the present embodiment uses a Peltier element 81, and a heat sink 82 is provided on the lower surface (exhaust heat side) of the Peltier element 81, and a heat radiating fan 83 is disposed on the lower surface of the heat sink 82. Is provided. The cooler 80 directly cools the heat transfer layer 78 of the main body 65 having high thermal conductivity, so that the air in the reagent storage 40 is cooled by using the heat transfer layer 78 itself as a cooling medium. It is configured. The cooler 80 is not limited to the one using the Peltier element 81, and may be configured to cool the heat transfer layer 78 by air cooling or water cooling, for example.

  An intake duct 85 that can take in air outside the sample analyzer 1 is formed below the reagent storage 40, and a heat sink 82 is disposed in the intake duct 85. Further, an exhaust duct 86 capable of discharging air to the outside of the sample analyzer 1 is formed below the intake duct 85, and a heat radiating fan 83 is connected to the exhaust duct 86. The outside air is taken into the heat sink 82 from the intake duct 85 by driving the heat radiating fan 83, and heat exchange is performed by the heat sink 82, and then hot air is discharged to the exhaust duct 86. The intake port of the intake duct 85 and the exhaust port of the exhaust duct 86 are opened on the back surface and the side surface of the sample analyzer 1, and in particular, hot air exhausted from the exhaust duct 86 causes the sample analyzer 1 to flow. Care is taken not to hit the user directly.

  In the reagent store 40, a flow fan 88 driven by a motor or the like is provided between the first reagent table 21 and the second reagent table 22 and the bottom wall 63 (inner bottom surface) of the reagent store 40. In the present embodiment, the two flow fans 88 are respectively arranged at positions corresponding to the upper side of the cooler 80. Therefore, the two flow fans 88 are also arranged symmetrically about the central axis O of the reagent storage 40.

  The air flow generated by the flow fan 88 circulates in the reagent container 40 as indicated by an arrow in FIG. 4 to cool the reagent container 300 to a desired temperature, for example, 10 ° C. In particular, the flow fan 88 is configured to blow down the air sucked from above, and the air flow generated by the flow fan 88 is directly cooled by the cooler 80 in the heat transfer layer 78. Directly sprayed against. As a result, the air flow can be efficiently cooled.

The cooler 80 and the flow fan 88 are not limited to two and may be three or more. In this case, by arranging the plurality of coolers 80 and the flow fans 88 around the central axis O at equal intervals, the air cooled in the reagent storage 40 can be circulated evenly and uniformly.
In addition, since the heat transfer layer 78 is provided only on the bottom wall 63 of the reagent store 40 and the peripheral wall 64 is formed of a material having low thermal conductivity, it is possible to prevent the reagent store 40 from being overcooled, Generation of condensation on the peripheral wall 64 can be prevented.

[Current supply control of sample analyzer]
The sample analyzer 1 of the present embodiment includes a 200 V mode (first mode) used in a facility (hereinafter, also referred to as “200 V power source facility”) having a 200 V AC commercial power source, and a 100 V AC commercial power source. Is configured to be operable in two operation modes, ie, a 100 V mode (second mode) used in a facility (hereinafter also referred to as “100 V power supply facility”). In the present embodiment, the current supply control for the cooler 80 (Peltier element 81), which consumes particularly large power during startup, is differentiated between the 200V mode and the 100V mode. Hereinafter, this point will be described in detail.

  In general, when the same power is consumed in both the 200V power supply facility and the 100V power supply facility, the 100V power supply facility theoretically requires double the current of the 200V power supply facility. On the other hand, in the 200V power supply facility, for example, a breaker with a rated voltage of 250V and a rated current of 15A is provided, and in the 100V power supply facility, for example, a breaker with a rated voltage of 125V and a rated current of 20A is provided. Does not double the current capacity of the 200V power supply. Therefore, when a current is supplied to the sample analyzer 1 in the 100V power supply facility in the same manner as the 200V power supply facility, the margin of the current capacity of the power supply facility (the rated current of the breaker) with respect to the total amount of current supplied to the cooler 80 and the like The (margin) will decrease, and the possibility of the breaker falling will increase.

  Therefore, in this embodiment, when the sample analyzer 1 is used with a 100V power supply facility, the power supply facility for the total amount is reduced by reducing the total amount of current supplied to the plurality of Peltier elements 81, in particular. The current capacity margin is sufficiently secured.

  FIG. 5 is a block diagram showing a current supply system for the cooler. The power of the primary AC power supply 201 is supplied to the Peltier element 81 of the reagent storage 40 via the secondary power supply unit 202 and the drive board 203. The power supply unit 202 rectifies and smoothes the AC voltage from the AC power source 201 to convert it to a DC voltage, further converts this DC voltage into a high-frequency AC voltage by switching, transforms this AC voltage with a high-frequency transformer, It has the function of rectifying and smoothing again to output a desired DC voltage. The power supply unit 202 converts an AC voltage of 200V and 100V into a DC voltage such as 5V, 12V, 24V, for example.

The drive substrate 203 includes a switching element 204 and a control circuit 205. Two switching elements 204 are provided corresponding to two Peltier elements (first and second Peltier elements) 81. The control circuit 205 performs on / off control (pulse control) of the switching element 204 at a predetermined operation cycle (for example, 210 ms).
The detection value of the thermistor (temperature detector) 206 that detects the temperature in the reagent storage 40 is input to the control circuit 205. The control circuit 205 compares the actual temperature detected by the thermistor 206 with the target temperature (for example, 10 ° C.) of the reagent storage 40, and proportionally controls the Peltier element 81 so that the difference between the two gradually decreases.

  Specifically, when the difference between the actual temperature in the reagent container 40 and the target temperature is large, the control circuit 205 performs switching so as to increase the amount of current supplied to the Peltier element 81 within a predetermined period. The element 204 is controlled, and when the difference between the actual temperature and the target temperature is small, the switching element 204 is controlled so as to reduce the amount of current supplied to the Peltier element 81 within a predetermined period. In the present embodiment, the amount of current supplied to the Peltier element 81 is controlled by changing the ratio of the ON time in the operation cycle of the switching element 204, that is, the duty ratio.

  7A and 7B are waveform diagrams showing current supply timings to the Peltier element 81. FIG. 7A shows the case of the 200V mode, and FIG. 7B shows the case of the 100V mode. From this figure, it is understood that the duty ratio changes until the temperature of the reagent storage 40 reaches the target temperature after the sample analyzer 1 is started.

  As shown in FIG. 7A, in the 200 V mode, current is supplied to the two Peltier elements 81 with the same cycle and the same duty ratio (first current supply control). Immediately after the start, the difference between the actual temperature in the reagent storage 40 and the target temperature is large, so that current is supplied at a duty ratio of 100%. However, as the difference decreases with time, the duty gradually increases. The ratio is also getting smaller. When the actual temperature in the reagent container 40 reaches the target temperature (for example, within ± 2 ° C.), current is supplied to the Peltier element 81 with the smallest duty ratio (10%) to maintain the state. Therefore, the peak value (total amount) of the current supplied to the two Peltier elements 81 is the sum (doubled) of the current values supplied to the respective Peltier elements 81.

  In the example of FIG. 7A, the current supply with the duty ratios of 100%, 80%, 60%, 30%, and 20% is executed for one cycle, but this is a change in the duty ratio. In actuality, supply of current at each duty ratio is executed in one or a plurality of cycles based on a temperature condition (see FIG. 8) described later.

  As shown in FIG. 7B, in the 100 V mode, current is supplied to the two Peltier elements 81 with the time being shifted from each other by half of the operation period. Further, the maximum duty ratio is 50% (second current supply control). Therefore, a current is alternately supplied to the two Peltier elements 81, and no current is supplied simultaneously. Therefore, the peak value (total amount) of current supplied to the two Peltier elements 81 is the amount of current supplied to each Peltier element 81. Therefore, when operating in the 100V mode, it is possible to secure a margin of the current capacity of the power supply facility with respect to the total amount of current without excessively increasing the current required for the AC power supply 201 on the primary side. It has become. However, since the duty ratio is 50% at the maximum in the 100V mode, the required time T2 until the inside of the reagent container 40 reaches the target temperature is longer than the required time T1 in the 200V mode.

  FIG. 8 is a table showing the relationship between the difference between the actual temperature of the reagent storage and the target temperature and the duty ratio. In the example shown in FIG. 8, in the 200V mode, the duty ratio is set to 100% when the difference Δt between the actual temperature and the target temperature is 10 ° C. or more, and the duty is reduced every time the difference Δt decreases from 10 ° C. to 2 ° C. The ratio is decreasing by 20%. On the other hand, in the 100V mode, the maximum duty ratio is 50% when the difference Δt is 10 ° C. or more, but the duty ratio is maintained at 50% even when the difference Δt is 10 ° C. to 6 ° C. When the difference Δt becomes 6 ° C. or less, the same duty ratio as that in the 200 V mode is set.

  Which of the 200 V mode and the 100 V mode is used can be set from a setting screen displayed on the display unit 4 b by starting the control device 4. For example, as shown in FIG. 9, a 100V mode setting window 210 is displayed on the display unit 4b, the 100V mode is selected in this setting window (check box 211 is checked), and the button 209 is clicked to perform control. Information that the 100 V mode is set is stored in the storage unit 4 d of the device 4. On the other hand, by clicking the button 209 without selecting the 100V mode, information indicating that the 200V mode is set is stored in the storage unit 4d of the control device 4. Information about the operation mode stored in the storage unit 4d of the control device 4 is transmitted to the control unit 501 (see FIG. 5) of the measurement device 2, and the control unit 501 operates on the control circuit 205 of the driver board 203. Each operation mode is executed by the control circuit 205 by sending a mode command. The operation mode is set by, for example, providing a dip switch for selecting an operation mode on the control board or driver board 203 constituting the control unit 501 of the measuring apparatus 2 so that the dip switch can be dip while the sample analyzer 1 is shut down or activated. You may carry out by operating a switch. In the present embodiment, when the sample analyzer 1 is installed in a facility, the service person activates only the control device 4 and displays the setting window 210 on the display unit 4b. In this setting window, the sample analyzer The operation mode 1 is preset to 100V mode or 200V mode. The activation of only the control device 4 can be performed in a facility equipped with a 200V power supply facility or a facility equipped with a 100V power supply facility.

FIG. 6 is a flowchart showing the operation of the sample analyzer 1 (particularly the measuring device 2). Hereinafter, the operation of the sample analyzer 1 will be described with reference to FIG.
First, when the control unit 501 of the measuring device 2 is activated (powered on), the control unit 501 inquires of the control unit 4a of the control device 4 whether the operation mode is the 100V mode or the 200V mode. Thereafter, the control unit 4a transmits the operation mode stored in the storage unit 4d to the control unit 501. Then, the control unit 501 of the measuring apparatus 2 receives the operation mode transmitted from the control unit 4a, and determines in step S1 which operation mode is set between the 100V mode and the 200V mode. When it is determined that the 200V mode is set, the control unit 501 advances the process to step S2, and when it is determined that the 100V mode is set, the process advances to step S4.

In step S <b> 2, the control unit 501 sends an operation command in the 200V mode to the control circuit 205 of the drive board 203. Thereby, the control circuit 205 controls the switching element 204 by the first current supply control shown in FIG. 7A and supplies a current to the Peltier element 81.
In step S3, the control unit 501 completes all initial operations such as initialization of the measuring apparatus 2, for example, origin return operation of various drive units, when the temperature in the reagent storage 40 reaches the target temperature. To determine whether or not the starting operation of the measuring apparatus 2 has been completed. If the control unit 501 determines that the start-up operation has been completed, the control unit 501 advances the process to step S6 and sets the measuring apparatus 2 to a standby state.

On the other hand, in step S4, the control unit 501 sends an operation command in the 100V mode to the control circuit 205 of the drive substrate 203. Accordingly, the control circuit 205 controls the switching element 204 by the second current supply control shown in FIG. 7B and supplies a current to the Peltier element 81.
In step S5, the control unit 501 determines whether the start-up operation of the measuring device 2 is completed when the temperature in the reagent storage 40 reaches the target temperature and the initialization of the measuring device 2 is completed. To do. If the control unit 501 determines that the start-up operation has been completed, the control unit 501 advances the process to step S6, and sets the measurement apparatus 2 to the standby state.

In step S7, the control unit 501 determines whether or not a measurement start instruction is received from the control device 4. If the measurement start instruction is received, the control unit 501 starts measuring the sample in step S8.
When the measurement of the sample is completed, in step S9, the control unit 501 determines whether or not a shutdown instruction has been received from the control device 4, and when the shutdown instruction is received, the shutdown unit shown in FIG. A screen 610 is displayed, and the process proceeds to step S10.

  In step S10, control unit 501 determines whether or not there is a shutdown instruction in the refrigerator mode. Here, when the refrigerator mode is selected on the shutdown screen 610 (when the check box 611 is checked) and the shutdown button 612 is clicked, it is determined that there is an instruction to shut down in the refrigerator mode, and the shutdown is performed. If the shutdown button 612 is clicked in a state where the refrigerator mode is not selected on the screen 610 (a state where the check box 611 is not checked), it is determined that there is no shutdown instruction in the refrigerator mode. This refrigerator mode is a mode in which only the cooling of the reagent container 40 (the reagent is kept cold) is continuously performed even after the measuring apparatus 2 is shut down. By executing such a refrigerator mode, the temperature in the reagent container 40 is maintained at a low temperature even after the sample analyzer 1 is shut down, so that the reagent is prevented from being deteriorated, and the reagent is used to prevent the deterioration. There is no need to move the battery to another cold storage or the like. In addition, when the sample analyzer 1 is started again, the temperature in the reagent storage 40 has already reached the target temperature, so that the start operation of the sample analyzer 1 can be performed quickly. .

  In step S10, when the control unit 501 determines that there is a shutdown instruction in the refrigerator mode, in step S11, the cooler 80 and the flow fan 88 in the reagent storage 40 are operated to maintain the reagent cooling function. The power to other functions (devices) is turned off while the process is being performed, and the process is terminated. If the control unit 501 determines that there is no shutdown instruction in the refrigerator mode, in step S12, the control unit 501 turns off the power to all the functions (devices) of the sample analyzer 1, and ends the process. Here, the control unit 501 constitutes a partial power-off means for ending current supply to other units while continuing current supply to the cooler 80.

  As described above, in the sample analyzer 1 of the present embodiment, the current supply control mode for the plurality of Peltier elements 81 is the first mode in which the total amount of current in the predetermined period is large, and the first mode in which the total amount is small. 2 modes. When the sample analyzer 1 is installed in a facility equipped with a 100 V power supply facility, the current supply control mode is set to the second mode, whereby a predetermined period (operation cycle) is set for the plurality of Peltier elements 81. Since the total amount of current supplied to the power supply can be suppressed, it is possible to prevent the total amount from exceeding the current capacity of the 100V power supply facility or reducing the current capacity margin with respect to the total amount. can do. Therefore, the sample analyzer 1 can be used appropriately even in a facility equipped with a 100 V power supply facility.

  Further, since the sample analyzer 1 can be installed even in a facility equipped with a 100V power supply facility, it is not necessary to perform a construction for changing the power supply of the facility to 200V. If a 200 V power supply facility is provided in the facility for installing the sample analyzer 1, the supply current to the electrical equipment that operates with the same power source including the sample analyzer 1 is generally reduced, and there is no fear of the breaker falling. For this reason, there is a high possibility that the power consumption is increased by using a large number of electric devices, but such an inconvenience does not occur in the present embodiment.

FIG. 10 is a waveform diagram showing the current supply timing in the second embodiment of the present invention. FIG. 10A shows a 200 V mode similar to that in the first embodiment, and FIG. Indicates 100V mode.
In the 100V mode described in the first embodiment, as shown in FIG. 7B, current is not supplied to two Peltier elements (first and second Peltier elements) 81 at the same time. Each Peltier element 81 was supplied with a current with a maximum duty ratio of 50% with the time shifted by half the operating period. On the other hand, in the 100V mode of the second embodiment, as shown in FIG. 10B, the timing is shifted by two half of the operation period in the two Peltier elements 81, but the maximum is 60%. Current is supplied at a duty ratio of. Therefore, the time during which current is supplied to the two Peltier elements 81 partially overlap, and the peak value of the current during this overlapping time is the sum of the currents supplied to each Peltier element 81, that is, This is equivalent to the 200 V mode shown in 10 (a). However, this overlap time is a very short time of about 10% in duty ratio, and the amount of current required in the power supply equipment on the primary side exceeds the current capacity of the power supply equipment (breaker rated current) on average. Therefore, a sufficient margin for the current capacity is ensured. In the case of the 100V mode of the present embodiment, the time T3 for the temperature in the reagent storage 40 to reach the target temperature is slightly shorter than that of the 100V mode of the first embodiment.

FIG. 11 is a block diagram showing a current supply system of a sample analyzer according to the third embodiment of the present invention.
In the present embodiment, in addition to the cooler 80, a heating device, for example, the heater 73 of the heating table 24 is also the target of current supply control. In the present embodiment, the power of the primary side AC power supply 201 is supplied to the heating table 24 via the second power supply unit 212 and the second drive board 213. Similarly to the first power supply unit 202 (same as the power supply unit 202 in the first embodiment), the second power supply unit 212 rectifies and smoothes the AC voltage from the AC power supply 201 and converts it into a DC voltage. This DC voltage is converted into a high-frequency AC voltage by switching, and after the AC voltage is transformed by a high-frequency transformer, the DC voltage is rectified and smoothed again to output a desired DC voltage.

  The second drive substrate 213 includes a switching element 214 and a control circuit 215, and one switching element 204 is provided corresponding to the heater 73 of the heating table 24. The control circuit 215 performs on / off control of the switching 204 at a predetermined operation cycle. The heating table 24 is provided with a thermistor 24, which detects the temperature of the heating table 24 and inputs the detected value to the control circuit 215. The control circuit 215 controls the heating table 24 to reach a predetermined target temperature based on the temperature detected by the thermistor 24.

  FIG. 12 is a waveform diagram showing current supply timing, and particularly shows only the 100 V mode. The current supply control to the Peltier element 81 is the same as that of the first embodiment. On the other hand, the switching element 214 is controlled by the control circuit 215 so that a current is supplied to the heater 73 when no current is supplied to any of the two Peltier elements 81. That is, the control circuit 215 acquires information related to the operation timing of the switching element 204 from the control circuit 205 of the first drive substrate 203 for the Peltier element 81, and uses the time during which the Peltier element 81 is not operating to the heater 73. The switching element 214 is controlled so as to supply current.

  By such control, the peak value of the current supplied to each Peltier element 81 and the heater 73 becomes the maximum current value for each Peltier element 81 and the heater 73. Therefore, when operating in the 100V mode, the current required for the primary-side AC power supply 201 does not become excessive, and a sufficient margin of the current capacity of the power supply facility for the current can be secured. It has become.

  In the initial stage of the starting operation, since current is continuously supplied to the two Peltier elements 81, no current is supplied to the heater 73, and the current supply time to the Peltier element 81 is 30% duty ratio. The current is also supplied to the heater 73 when the following occurs. Thus, even when the current supply to the Peltier element 81 is prioritized and the current is supplied to the heater 73 with a delay, the heating by the heater 73 is shorter than the cooling of the reagent storage 40 by the Peltier element 81. Therefore, there is almost no adverse effect on the starting operation of the measuring device 2.

  In the third embodiment, the current supply control to the Peltier element 81 and the heater 73 is performed. However, the present invention is not limited thereto, and the current supply as described above is also applied to motors such as a reagent table and a dispensing unit. Control may be performed. However, since the operation of the motor has a great influence on the analysis operation in the sample analyzer, it is desirable to prioritize the operation of the motor over the Peltier element 81 and the heater 73 at least during the analysis operation.

FIG. 13 is a flowchart showing the operation of the sample analyzer including current supply control for the Peltier element 81 and the heater 73 (and motor). In FIG. 13, processes other than steps S102 and S104 are the same as the processes other than steps S2 and S4 in FIG. 6 of the first embodiment.
Further, in step S102 of FIG. 13, in order to perform current supply control in the 200V mode, current is simultaneously supplied to the Peltier element 81 and the heater 73 (and the motor) to perform a starting operation. In step S104, since the current supply control is performed in the 100V mode, the operation timing of the Peltier element 81 and the heater 73 (or motor) is shifted to perform the start-up operation of the apparatus.

The present invention is not limited to the above-described embodiment, and can be appropriately changed within the scope of the invention described in the claims.
For example, in the above-described embodiment, the current supply control mode for a plurality of units such as the Peltier element 81 and the heater 73 is set through an artificial operation by a service person or the like in accordance with the voltage of the power supply equipment of the installation facility. However, when the sample analyzer 1 is connected to the power supply facility, the control unit 501 of the measuring device 2 may automatically set the voltage.
The current supply control in the first and second modes may be executed when the power consumption in the unit such as the Peltier element 81 is increased, that is, until the start-up operation of the analyzer is completed.

DESCRIPTION OF SYMBOLS 1 Sample analyzer 2 Measuring apparatus 4 Control apparatus 4a Control part 24 Heating table 40 Reagent storage 73 Heater 80 Cooler 81 Peltier element 201 AC power supply 202 Power supply unit (power supply part)
205 Control circuit (current supply control means)
212 Power supply unit (power supply unit)
215 Control circuit (current supply control means)
501 Control unit

Claims (13)

A plurality of units that receive a current and realize a predetermined function;
A power supply for supplying current to the plurality of units;
A first mode in which the power supply unit executes a first current supply control in which a first total amount of current is supplied to the plurality of units in a predetermined period; and the power source unit is more than the first total amount in the predetermined period. According to the voltage level of the power supply equipment provided in the installation facility, any mode of the second mode for executing the second current supply control for supplying the second unit with a small second total amount of current is performed. Setting means for setting,
An analysis apparatus comprising: current supply control means for executing current supply control in a mode set by the setting means.   The analyzer according to claim 1, wherein the plurality of units include a temperature adjustment unit that cools or heats at least one of the specimen and the reagent.   The analyzer according to claim 2, wherein the first current supply control and the second current supply control are executed until at least the temperature adjustment unit reaches a target temperature.   The analyzer according to claim 2 or 3, further comprising a partial power-off means for ending current supply to other units while continuing current supply to the temperature control unit.   The amount of current supplied to the predetermined unit among the plurality of units in the second current supply control in the predetermined period is the current supplied to the predetermined unit in the predetermined period in the first current supply control. The analyzer according to any one of claims 1 to 4, which is smaller than the amount.   The current supply control means controls the amount of current supplied to the predetermined unit by the ratio of the length of the current supply period in the predetermined period, and the magnitude of the ratio in the second current supply control is: The analyzer according to claim 5, wherein the analyzer is smaller than the ratio in the first current supply control.   The period in which the power supply unit supplies current to the plurality of units simultaneously in the second current supply control is shorter than the period in which the power supply unit supplies current to the plurality of units simultaneously in the first current supply control. Item 7. The analyzer according to Item 5 or 6.   The current supply control means performs control in which the period during which the power supply unit supplies current to a plurality of units partially overlaps and control in which the periods do not overlap in the second current supply control. 8. The analyzer according to any one of 7 above.   The plurality of units are the same type of unit, and the second current supply control is control in which the power supply unit alternately supplies current to the plurality of units. The analyzer according to item.   The analyzer according to claim 1, wherein the plurality of units are units of different types.   The first mode is a mode that requires AC 200V power supply equipment, and the second mode is a mode that requires AC 100V power equipment but does not require AC 200V power equipment. The analyzer of any one of 1-10. The predetermined unit of the plurality of units realizes the predetermined function by repeating the start of supply of current and the stop of supply of current,
In the second current supply control, the predetermined period includes a current supplied to the predetermined unit in a repetition of a current supply start and a current supply stop for causing the predetermined unit to realize the predetermined function. The analyzer according to any one of claims 1 to 11, which is a period from the start of supply of the current to the start of supply of the next current. A plurality of units that receive a current and realize a predetermined function;
A power supply for supplying current to the plurality of units;
A first mode in which the power supply unit executes a first current supply control in which a first total amount of current is supplied to the plurality of units in a predetermined period; and the power source unit is more than the first total amount in the predetermined period. Setting means for setting any one of a second mode for executing a second current supply control for supplying a small second total amount of current to the plurality of units;
An analysis apparatus comprising: current supply control means for executing current supply control in a mode set by the setting means at startup.

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