JP2012059882A - Substrate holder, substrate bonding apparatus, method for manufacturing multilayer semiconductor device, and multilayer semiconductor device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To shorten a time required for a substrate aligning process.SOLUTION: There is provided a substrate holder including: a holder body of which the mounting surface a substrate is mounted thereon; and a connection member comprising a pair of terminals provided in the holder body and a connection line for electrically connecting the pair of terminals together, wherein when the holder body is disposed at a predetermined position, the pair of terminals come into contact with external terminals to form an electrically closed circuit. The substrate holder also includes an electrostatic attraction part which is provided in the holder body separately from the connection member and electrostatically attracts the substrate to the mounting surface by power supply from outside.

Description

  The present invention relates to a substrate holder, a substrate bonding apparatus, a stacked semiconductor device manufacturing method, and a stacked semiconductor device.

In order to increase the mounting density of semiconductor devices, a stacked semiconductor device in which a plurality of substrates on which electronic circuits are formed is stacked has been attracting attention. When laminating a plurality of substrates, the substrates are aligned by a substrate alignment apparatus as disclosed in Patent Document 1. In the substrate alignment apparatus, the substrate is held by the substrate holder.
Patent Document 1 Japanese Patent Application Laid-Open No. 2009-245963

  However, when the substrate holder that holds the substrate is placed on the stage, if the substrate holder is largely deviated from a predetermined position, it is difficult to align the subsequent substrates. In extreme cases, the substrates may not be aligned with each other. There is.

  In order to solve the above problems, in the first aspect of the present invention, a holder main body for placing the substrate on the placement surface, a pair of terminals provided on the holder main body, and the pair of terminals electrically A substrate holder having a connection line for connecting to the connection member, and when the holder main body is arranged at a predetermined position, a pair of terminals contact an external terminal to form an electrical closed circuit Provided.

  In the second aspect of the present invention, a pair of holder main bodies holding the substrate sandwiched between the mounting surfaces facing each other, and the pair of holder main bodies, the pair of holder main bodies serving as the mounting surface A pair of terminals that are electrically connected to each other and both ends of the electrically connected connection wires when the holder body is held between the holders, and the holder body is disposed at a predetermined position. A pair of terminals in contact with an external terminal to form an electrical closed circuit, and the pair of terminals are arranged so as to be exposed on one of the pair of holder bodies, or A substrate holder is provided that is exposed and arranged on both of the pair of holder bodies.

  In the third aspect of the present invention, there is provided a substrate bonding apparatus for stacking and bonding a plurality of substrates using the substrate holder.

  According to a fourth aspect of the present invention, there is provided a laminated semiconductor device manufacturing method for manufacturing a laminated semiconductor device by laminating a plurality of substrates by the substrate bonding apparatus.

  According to a fifth aspect of the present invention, there is provided a stacked semiconductor device manufactured by the above-described stacked semiconductor device manufacturing method.

  It should be noted that the above summary of the invention does not enumerate all the necessary features of the present invention. In addition, a sub-combination of these feature groups can also be an invention.

It is a top view which shows typically the whole structure of the board | substrate bonding apparatus 100 which is one Embodiment. It is a front view which shows the structure of the stage apparatus 140 roughly. 4 is a plan view schematically showing an example of a lower substrate holder 125. FIG. 4 is a cross-sectional view schematically showing a correspondence relationship between a connection member and an electrostatic attraction portion in a lower substrate holder 125 and a power feeding circuit in a second table 142. FIG. It is sectional drawing which shows other embodiment of a connection member roughly. It is sectional drawing which shows other embodiment of a connection member roughly. It is sectional drawing which shows embodiment of FIG. 6 which formed the closed circuit with the connection member. It is sectional drawing which shows other embodiment of a connection member roughly. It is a flowchart which shows the outline of the manufacturing method of a laminated semiconductor device.

  Hereinafter, the present invention will be described through embodiments of the invention, but the following embodiments do not limit the invention according to the claims. In addition, not all the combinations of features described in the embodiments are essential for the solving means of the invention.

  FIG. 1 is a plan view schematically showing the overall structure of the substrate bonding apparatus 100. The substrate bonding apparatus 100 includes a housing 102, a room temperature unit 104, a high temperature unit 106, and substrate cassettes 112, 114, and 116. The normal temperature part 104 and the high temperature part 106 are provided in the common housing 102.

  The substrate cassettes 112, 114, and 116 are detachably attached to the housing 102 outside the housing 102. The substrate cassettes 112, 114, and 116 accommodate the first substrate 122 and the second substrate 123 that are bonded in the substrate bonding apparatus 100. A plurality of first substrates 122 and second substrates 123 are collectively loaded into the substrate bonding apparatus 100 by the substrate cassettes 112, 114, and 116. Further, the first substrate 122 and the second substrate 123 bonded in the substrate bonding apparatus 100 are collected in a lump.

  The room temperature unit 104 includes a pre-aligner 126, a stage device 140, a substrate holder rack 128, a substrate removal unit 130, and a pair of transfer units 132 and 134, which are arranged inside the housing 102. The temperature inside the room temperature unit 104 is controlled so that the temperature is substantially the same as the room temperature of the environment where the substrate bonding apparatus 100 is installed. The room temperature unit 104 transports the first substrate 122 and the second substrate 123 in the atmosphere.

  Since the pre-aligner 126 is highly accurate, the position of each first substrate 122 or the second substrate 123 is temporarily aligned so that the position of the first substrate 122 or the second substrate 123 is within the narrow adjustment range of the stage device 140. To do. In this case, the pre-aligner 126 positions the first substrate 122 and the like by observing the outer shape of the first substrate 122 and the like. Thereby, the stage apparatus 140 can position the position of the 1st board | substrate 122 and the 2nd board | substrate 123 reliably.

  The substrate holder rack 128 accommodates and waits for a plurality of upper substrate holders 124 and a plurality of lower substrate holders 125. The substrate holder rack 128 has an alignment function. When the upper substrate holder 124 or the lower substrate holder 125 is placed on the stage device 140 by the transport unit 134, the substrate holder rack 128 is oriented in the direction of the upper substrate holder 124 or the lower substrate holder 125 so that a large positional deviation does not occur. Can be adjusted in advance.

  The stage device 140 aligns the positions of the electrodes to be bonded on the first substrate 122 and the second substrate 123 to be bonded and superimposes them. A heat insulating wall 145 and a shutter 146 are provided surrounding the stage device 140. The space surrounded by the heat insulating wall 145 and the shutter 146 is communicated with an air conditioner or the like, and the temperature is controlled, so that the alignment accuracy in the stage device 140 is maintained.

  The stage device 140 includes a first table 141, a second table 142, and a control unit 148. The first table 141 is fixed to the lower surface of the top plate of the stage device 140. The lower surface of the first table 141 holds the upper substrate holder 124 by vacuum suction. The adsorption method may be electrostatic adsorption. The upper substrate holder 124 holds the first substrate 122 by electrostatic adsorption.

  The second table 142 is disposed on the bottom plate of the stage device 140 so as to be movable in the XYZ directions so as to face the first table 141. The second table 142 has a tilt function. The upper surface of the second table 142 holds the lower substrate holder 125 by vacuum suction. The lower substrate holder 125 holds the second substrate 123 by electrostatic adsorption.

  The control unit 148 controls the movement of the second table 142. The control unit 148 moves the second table 142 to align the position of the second substrate 123 with respect to the first substrate 122 held on the first table 141. The controller 148 can raise the second table 142 so that the first substrate 122 and the second substrate 123 overlap each other. Thereafter, the first substrate 122 and the second substrate 123 sandwiched between the upper substrate holder 124 and the lower substrate holder 125 are temporarily fixed by a positioning mechanism. A combination of the upper substrate holder 124 and the lower substrate holder 125 and the first substrate 122 and the second substrate 123 sandwiched between them may be referred to as a “holder pair”.

  The substrate removing unit 130 takes out the first substrate 122 and the second substrate 123 that are sandwiched and bonded between the upper substrate holder 124 and the lower substrate holder 125 that are carried out from the high temperature unit 106. The bonded first substrate 122 and second substrate 123 may be referred to as a “laminated substrate”. The laminated substrate taken out from the upper substrate holder 124 and the lower substrate holder 125 is returned to and stored in one of the substrate cassettes 112, 114, 116 by the transfer units 134, 132 and the second table 142. The upper substrate holder 124 and the lower substrate holder 125, from which the laminated substrate has been taken out, are returned to the substrate holder rack 128 and stand by. The substrate removing unit 130 is disposed above the substrate holder rack 128.

  The first substrate 122 and the second substrate 123 to be loaded into the substrate bonding apparatus 100 are a single silicon wafer, compound semiconductor wafer, glass substrate, etc., in which elements, circuits, terminals, etc. are formed. It may be. Further, the loaded first substrate 122 and second substrate 123 may be laminated substrates that are already formed by laminating a plurality of wafers.

  Of the pair of transfer units 132 and 134, the transfer unit 132 disposed on the side closer to the substrate cassettes 112, 114, and 116 is between the substrate cassettes 112, 114, 116, the pre-aligner 126, and the stage apparatus 140. The second substrate 123 is transported. On the other hand, the transfer unit 134 arranged on the side far from the substrate cassettes 112, 114, 116 is between the stage device 140, the substrate holder rack 128, the substrate removal unit 130, and the air lock 220, the first substrate 122, the second substrate. 123, the upper substrate holder 124 and the lower substrate holder 125 are conveyed.

  The transport unit 134 is also responsible for loading and unloading the upper substrate holder 124 and the lower substrate holder 125 with respect to the substrate holder rack 128. When holding the first substrate 122 on the first table 141, the transport unit 134 first takes out one upper substrate holder 124 from the substrate holder rack 128 and places it on the second table 142. The second table 142 moves to the side closer to the substrate cassettes 112, 114, and 116. The transport unit 132 takes out the pre-aligned first substrate 122 from the pre-aligner 126 and places it on the upper substrate holder 124 on the second table 142 for electrostatic adsorption.

  The second table 142 moves again to the side far from the substrate cassettes 112, 114, 116. The transport unit 134 receives the upper substrate holder 124 that electrostatically attracts the first substrate 122 from the second table 142, turns it over, and brings it closer to the first table 141. The first table 141 holds the upper substrate holder 124 by vacuum suction.

  The transport unit 134 places the lower substrate holder 125 on the second table 142. The transport unit 132 places and holds the second substrate 123 thereon. Thus, the surface of the second substrate 123 held by the second table 142 on which the circuits and the like are formed is opposed to the surface of the first substrate 122 held by the first table 141 and formed with the circuits. Placed in.

  The high temperature unit 106 includes a heat insulating wall 108, an air lock 220, a transfer unit 230, a plurality of pressure chambers 240, and a cooling chamber 250. The heat insulating wall 108 surrounds the high temperature part 106 and blocks heat radiation to the outside of the high temperature part 106. Thereby, the influence which the heat of the high temperature part 106 has on the normal temperature part 104 is suppressed. The inside of the high temperature part 106 is maintained in a constant vacuum state. Thereby, contamination and oxidation of the substrate carried into the high temperature part 106 can be suppressed.

  The transfer unit 230 transfers the first substrate 122, the second substrate 123, the upper substrate holder 124, and the lower substrate holder 125 between the pressurizing chamber 240, the cooling chamber 250, and the air lock 220.

  The air lock 220 connects the normal temperature part 104 and the high temperature part 106. The air lock 220 includes shutters 222 and 224 that open and close alternately on the normal temperature part 104 side and the high temperature part 106 side.

  When a holder pair including the first substrate 122, the second substrate 123, the upper substrate holder 124, and the lower substrate holder 125 is carried into the high temperature unit 106 from the normal temperature unit 104, first, the shutter 222 on the normal temperature unit 104 side is opened. Then, the conveyance unit 134 carries the holder pair into the air lock 220. Next, the shutter 222 on the room temperature section 104 side is closed, and the inside of the air lock 220 is evacuated. When the degree of vacuum inside the air lock 220 becomes the degree of vacuum on the high temperature part 106 side, the shutter 224 on the high temperature part 106 side is opened.

  Subsequently, the transport unit 230 unloads the holder pair from the air lock 220 and inserts the holder pair into one of the pressurizing chambers 240. The pressurizing chamber 240 heats and pressurizes the holder pair to bond the first substrate 122 and the second substrate 123 together. Thereafter, the transfer unit 230 carries out the holder pair from the pressurizing chamber 240 and charges the cooling chamber 250 to cool it. The pressurizing chamber 240 may bond the first substrate 122 and the second substrate 123 only by pressurizing the holder pair.

  When carrying out a holder pair from the high temperature part 106 to the normal temperature part 104, a series of operation | movement in the case of carrying in from the normal temperature part 104 to the high temperature part 106 is performed in reverse order. By a series of these operations, the holder pair can be carried into or out of the high temperature unit 106 without leaking the internal atmosphere of the high temperature unit 106 to the normal temperature unit 104 side.

  In many areas in the substrate bonding apparatus 100, the upper substrate holder 124 holds the first substrate 122, or the lower substrate holder 125 holds the second substrate 123 and the transfer units 134, 230 and the first substrate 122. 2 is conveyed by the table 142. When the upper substrate holder 124 that holds the first substrate 122 or the lower substrate holder 125 that holds the second substrate 123 is transferred, the transfer units 134 and 230 are configured so that the upper substrate holder 124 or the lower substrate is transferred by vacuum suction or electrostatic suction. The holder 125 is sucked and held.

  FIG. 2 schematically shows the structure of the stage apparatus 140. The stage device 140 includes a first microscope 344, a second microscope 342, an interferometer 370, a first fixed mirror 374, in addition to the first table 141, the second table 142, and the control unit 148 inside the main body 310. And a second fixed mirror 376.

  The main body 310 includes a top plate 312 and a bottom plate 316 that are parallel to each other and a plurality of support columns 314 that couple the top plate 312 and the bottom plate 316. The top plate 312, the support column 314, and the bottom plate 316 are each formed of a highly rigid material and do not deform even when a reaction force relating to the operation of the internal mechanism is applied. When incorporated in the substrate bonding apparatus 100, the space between the columns 314 is sealed with a heat insulating wall 145.

  The second table 142 is disposed in the elevating unit 360 so as to face the first table 141. The elevating unit 360 is placed on the bottom plate 316 and moved in the X direction while being guided by a guide rail 352 fixed to the bottom plate, and the Y stage moves on the X stage 354 in the Y direction. It is placed on the stage 356. Therefore, the second table 142 can also move in the X, Y, and Z directions under the control of the control unit 148. The movement distance in the Z direction can be detected by a displacement sensor 372. Data detected by the displacement sensor 372 is fed back to the control unit 148.

  The elevating unit 360 elevates and lowers the second table 142 in the Z direction in response to an instruction from the control unit 148. As an example of the drive type of the raising / lowering part 360, the drive by a VCM (voice coil motor), the drive by a cylinder and a piston, etc. are mentioned. The second table 142 may have a coarse / fine movement separation drive mechanism. The second table 142 has a function of rotating about the X, Y, and Z axes as rotation axes.

  The first microscope 344 is disposed on the second table 142 and can move with respect to the first table 141 together with the second table 142. The first microscope 344 has an autofocus sensor. The first microscope 344 observes an index provided on the surface of the first substrate 122 held on the first table 141, and measures its position and distance. The position / distance data measured by the first microscope 344 is transmitted to the control unit 148.

  The second microscope 342 is fixed to the lower surface of the top plate 312 with a known interval with respect to the first table 141. The second microscope 342 has an autofocus sensor. The second microscope 342 observes an index provided on the surface of the second substrate 123 held by the second table 142 and measures its position and distance. The position / distance data measured by the second microscope 342 is transmitted to the control unit 148. The control unit 148 controls the second table 142 based on the received data.

  The interferometer 370 irradiates light to the first fixed mirror 374 and the second fixed mirror 376 fixed to the first table 141 and the second table 142, respectively, and reflects from the first fixed mirror 374 and the second fixed mirror 376. The relative position of the second table 142 with respect to the first table 141 can be detected by the interference of the light. Interferometer 370 feeds back the detected data to control unit 148.

  Since the control unit 148 stores the positions of the interferometer 370, the displacement sensor 372, the first microscope 344, and the second microscope 342 in the first table 141 and the second table 142, the interferometer 370, the displacement sensor 372, the first Based on the data transmitted by the first microscope 344 and the second microscope 342, the first substrate 122 held on the first table 141 via the upper substrate holder 124 and the second table 142 via the lower substrate holder 125. The relative position with respect to the held second substrate 123 can be calculated. The control unit 148 can precisely control the second table 142 based on the calculated result, align the first substrate 122 and the second substrate 123, and superimpose them.

  FIG. 3 is a plan view schematically showing an example of the lower substrate holder 125. The lower substrate holder 125 includes a holder main body 400, an electrostatic adsorption unit 401, and a connection member 410. FIG. 4 is a cross-sectional view schematically showing a correspondence relationship between the electrostatic chuck 401 and the connection member 410 in the lower substrate holder 125 and the power feeding circuit in the second table 142.

  The outer shape of the holder main body 400 has a disk shape whose diameter is slightly larger than that of the second substrate 123. The holder body 400 is made of a highly rigid material such as ceramic or metal. Examples of the material of the holder main body 400 include SiC and AlN. The upper surface of the holder body 400 is a mounting surface that holds the second substrate 123. The mounting surface has high flatness and adsorbs the second substrate 123.

  Connection member 410 includes a connection line 412, a terminal 414, and a terminal 416. The terminals 414 and 416 are exposed to the outside from the back surface of the holder body 400. The connection line 412, the terminal 414, and the terminal 416 are formed of an electrically conductive material and are electrically connected to each other. As shown in FIG. 4, when the lower substrate holder 125 is disposed at a predetermined position of the second table 142, the terminal 414 and the terminal 416 are respectively connected to the external power supply terminal 434 and the power supply provided on the second table 142. An electrical closed circuit is formed in contact with the terminal 436. This circuit further includes a power supply 472, an ammeter 474, and a resistor 476.

  A power supply 472 supplies power to the circuit. Resistor 476 prevents circuit destruction due to an unexpected short circuit. The ammeter 474 measures the current flowing through the circuit and detects whether the lower substrate holder 125 is disposed at a predetermined position of the second table 142. When the current value measured by the ammeter 474 exceeds a predetermined threshold value, it can be considered that the closed circuit is formed, and therefore it is determined that the lower substrate holder 125 is disposed at a predetermined position. Is done. On the other hand, when the current value measured by the ammeter 474 is zero, the lower substrate holder 125 is not mounted on the second table 142 or is mounted but from the position where it should be mounted. It is either out of place.

  Here, the above two states can be distinguished by detecting whether or not the lower substrate holder 125 is placed on the second table. For example, when a load sensor is provided in the transport unit 134 and the output of the load sensor is lowered after being lowered, it is considered that the load is placed on the second table 142 after holding the lower substrate holder 125. Therefore, when the current value of the ammeter 474 does not exceed the threshold value even though the output of the load sensor increases and then decreases, the lower substrate holder 125 is mounted on the second table 142. It can be determined that the position is shifted from the position to be made.

  When it is determined that the position of the lower substrate holder 125 is shifted, the transport unit 134 returns the lower substrate holder 125 to the substrate holder rack 128 and aligns the lower substrate holder 125 again, and then the second table 142. Put it back on. Then, the current value is measured again by the ammeter 474. As described above, when the positional deviation of the lower substrate holder 125 placed on the second table 142 is eliminated, the subsequent alignment of the first substrate 122 and the second substrate 123 can proceed smoothly, and the alignment time is shortened. it can.

  The electrostatic chuck 401 is provided inside the holder body 400 separately from the connection member 410. The electrostatic adsorption unit 401 electrostatically adsorbs the second substrate 123 to the holder main body 400. The electrostatic chuck 401 is a bipolar electrostatic chuck. That is, the electrostatic adsorption unit 401 includes two electrostatic adsorption electrodes 402 and 406. The electrostatic chucking electrodes 402 and 406 have electrostatic power receiving terminals 404 and 408 that are exposed from the back surface of the holder main body 400 and can be contacted from the outside. As shown in FIG. 4, the electrostatic adsorption electrodes 402 and 406 are in contact with the electrostatic power supply terminal 426 and the electrostatic power supply terminal 428 provided on the second table 142 through the electrostatic power receiving terminals 404 and 408, respectively. The second substrate 123 can be electrostatically attracted to the mounting surface by supplying power from the electrostatic attraction power source 462. Further, the electrostatic adsorption may be a monopolar method.

  The power supply terminal 434, the power supply terminal 436, the electrostatic power supply terminal 426, and the electrostatic power supply terminal 428 are installed on the second table 142 so as to be vertically expandable and contractable by springs 482, 484, 486, and 488, respectively. When the lower substrate holder 125 is not placed on the second table 142, the power supply terminal 434, the power supply terminal 436, the electrostatic power supply terminal 426, and the tip of the electrostatic power supply terminal 428 are springs 482, 484, 486, 488. To stretch upward. When the lower substrate holder 125 is placed on the second table 142, the power supply terminal 434, the power supply terminal 436, the electrostatic power supply terminal 426, and the electrostatic power supply terminal 428 are the terminal 414 provided on the holder main body 400, and the terminal, respectively. 416, abuts against the electrostatic power receiving terminal 404 and the electrostatic power receiving terminal 408 and is pushed downward. In this case, the power supply terminal 434, the power supply terminal 436, the electrostatic power supply terminal 426, and the electrostatic power supply terminal 428 are respectively connected to the terminal 414, the terminal 416, the electrostatic power reception terminal 404, and the electrostatic power supply terminal 428 by the elastic force of the springs 482, 484, 486, and 488. It is in a state of being pressed against the electrostatic power receiving terminal 408, and can be reliably electrically connected to the terminal 414, the terminal 416, the electrostatic power receiving terminal 404, and the electrostatic power receiving terminal 408, and stable power supply can be achieved. Examples of the spring include a coil spring.

  As shown in FIGS. 3 and 4, the exposed area exposed to the outside of the terminal 414 and the terminal 416 of the connecting member 410 is smaller than the exposed area of the electrostatic power receiving terminals 404 and 408 of the electrostatic attraction unit 401. Therefore, when the lower substrate holder 125 is disposed on the second table 142 and the terminal 414 and the terminal 416 having a small exposed area are in contact with the power supply terminal 434 and the power supply terminal 436 with high accuracy, respectively, a closed circuit is formed. The electrostatic power receiving terminals 404 and 408 having a large exposed area can also contact the electrostatic power feeding terminal 426 and the electrostatic power feeding terminal 428, respectively. Therefore, the switch 464 can be controlled using the current value detected by the ammeter 474 as a control parameter. For example, when the current value detected by the ammeter 474 exceeds the threshold value, the lower substrate holder 125 is installed at a predetermined position on the second table 142, so that the switch 464 is turned on to supply electrostatic adsorption power. You can do it.

  As illustrated in FIG. 3, the terminal 414 and the terminal 416 of the connection member 410 may be disposed adjacent to the electrostatic power receiving terminal 404 and the electrostatic power receiving terminal 408 of the electrostatic attraction unit 401. With this arrangement, the layout design of the wirings and the like of both power supply circuits provided on the second table 142 is facilitated.

  FIG. 5 is a cross-sectional view schematically showing another embodiment of the connection member 410. In order to make it easy to see, the electrostatic attraction portion is omitted in FIG. In this embodiment, the connection line 412 has a monitor portion 512 formed of a material having lower durability than other portions.

  The monitor unit 512 may be a part that is mechanically weaker than other parts of the connection line 412. For example, as shown in FIG. 5, the monitor unit 512 is a thin part having a smaller cross-sectional area than the other part of the connection line 412, and when the holder body 400 receives an impact and the monitor unit 512 is disconnected, Since the current detected by the ammeter 474 decreases, the lower substrate holder 125 can be maintained or replaced using the detection result as a guide. Note that the monitor unit 512 may be formed of a material that easily deteriorates as compared with other portions of the connection line 412. For example, if the monitor unit 512 is disconnected due to deterioration, the current detected by the ammeter 474 decreases, and the lower substrate holder 125 can be maintained or replaced using the detection result as a guide. The monitor unit 512 may be formed of a material whose resistance value changes with deterioration, and the maintenance or replacement time may be determined by measuring the change in the resistance value.

  The connection member 410 is provided in a cassette 520 that can be attached to and detached from the holder main body 400. After the maintenance, the lower substrate holder 125 is used again when the cassette 520 including the disconnected connection member 410 is replaced with a new one.

  FIG. 6 is a cross-sectional view schematically showing another embodiment of the connecting member. FIG. 7 is a cross-sectional view showing the embodiment of FIG. 6 in which a closed circuit is formed by a connecting member. In this embodiment, the connection members are the connection wire 412, the terminal 414, the terminal 416, and the connection electrode 614, the connection electrode 616, the spring 624, and the spring 626 that are disposed on the upper substrate holder 124, respectively. Connection terminal 634 and connection terminal 636.

  In the embodiment of FIG. 6, the connection line 412, the terminal 414, and the terminal 416 are provided on the holder body of the upper substrate holder 124. Further, the terminals 414 and 416 are exposed on the mounting surface of the upper substrate holder 124 on which the first substrate 122 is mounted.

  The connection terminal 634 and the connection terminal 636 are fitted into and fixed to holes that vertically penetrate the lower substrate holder 125. The connection terminal 634 and the connection terminal 636 are exposed at the bottom surface of the lower substrate holder 125. When the lower substrate holder 125 is disposed at a predetermined position of the second table 142, the connection terminal 634 and the connection terminal 636 come into contact with the external power supply terminal 434 and the power supply terminal 436 provided on the second table 142, respectively. be able to.

  The connection electrode 614 and the connection electrode 616 are installed on top of the connection terminal 634 and the connection terminal 636 so as to be vertically expandable and contractible via springs 624 and 626, respectively. The connection electrode 614 and the connection electrode 616 are pushed up by the spring 624 and the spring 626 and extended upward unless pressed from above. Examples of the spring 624 and the spring 626 include a coil spring. The connection electrode 614, the connection electrode 616, the spring 624, the spring 626, the connection terminal 634, and the connection terminal 636 are formed from a conductive material.

  The upper substrate holder 124 placed on the first table 141 and the lower substrate holder 125 placed on the second table 142 hold the first substrate 122 and the second substrate 123 on the mounting surfaces facing each other, When the first substrate 122 and the second substrate 123 are held while being aligned and overlapped, as shown in FIG. 7, a connection line 412, a terminal 414, a terminal 416, a connection electrode 614, a connection electrode 616, the spring 624, the spring 626, the connection terminal 634, and the connection terminal 636 are electrically connected to each other. Note that the connection terminals 634 and the connection terminals 636 at both ends are external power supply terminals 434 provided on the second table 142 when the lower substrate holder 125 is disposed at a predetermined position on the second table 142, respectively. And an electric closed circuit in contact with the power supply terminal 436.

  As shown in FIG. 7, when the first substrate 122 and the second substrate 123 are overlaid, the connection electrode 614 and the connection electrode 616 abut on the terminal 414 and the terminal 416 provided on the upper substrate holder 124, respectively. And pushed down. In this case, the connection electrode 614 and the connection electrode 616 are pressed against the terminal 414 and the terminal 416 by the elastic force of the spring, respectively, and can be reliably electrically connected to the terminal 414 and the terminal 416. Note that in this case, the power supply terminal 434 and the power supply terminal 436 are pressed against the connection terminal 634 and the connection terminal 636 by the elastic force of the spring, respectively, and can be reliably electrically connected to the connection terminal 634 and the connection terminal 636. Stable power supply. The ammeter 474 can detect whether or not the upper substrate holder 124 and the lower substrate holder 125 are arranged at predetermined positions by measuring the current value.

  In the embodiment of FIG. 7, a monitor unit such as the monitor unit 512 of FIG. 5 may be provided on the connection terminal 634 or the connection terminal 636. The electrical closed circuit shown in FIG. 7 may be reversed upside down. That is, the power supply terminal 434, the power supply terminal 436, the power supply 472, the ammeter 474, the resistor 476, the spring 482, and the spring 484 may be provided on the first table 141, and the connection electrode 614, the connection electrode 616, the spring 624, The spring 626, the connection terminal 634, and the connection terminal 636 may be provided on the upper substrate holder 124, and the connection line 412, the terminal 414, and the terminal 416 may be provided on the lower substrate holder 125. In this case, the upper substrate holder 124 is disposed at a predetermined position on the first table 141, and the first substrate 122 and the second substrate 123 held by the upper substrate holder 124 and the lower substrate holder 125 are aligned. When superimposed, an electrical closed circuit is formed, and the current can be measured by an ammeter 474.

  Note that a range in which the terminal 414 and the connection electrode 614 can be in contact with each other, and a range in which the terminal 416 and the connection electrode 616 can be in contact with each other is preferably wider than a range in which the connection terminal 634 and the power supply terminal 434 can be in contact with each other. . For example, the area where the terminals 414 and 416 are exposed is preferably larger than the area where the connection terminals 634 and 636 are exposed. Thereby, even if the upper board | substrate holder 124 and the lower board | substrate holder 125 align with respect to the 1st board | substrate 122 and 2nd board | substrate 123 which each hold | maintained, the mutual electrical connection can be ensured. .

  FIG. 8 is a sectional view schematically showing another embodiment of the connecting member. In this embodiment, the connection member includes a connection line 812 disposed on the upper substrate holder 124, a connection electrode 616 disposed on the lower substrate holder 125, a spring 626, and a connection terminal 636. In the embodiment shown in FIGS. 6 and 7, both ends of a connection member connected to an external terminal are constituted by a connection terminal 634 and a connection terminal 636, provided on the same lower substrate holder 125, and the back surface of the lower substrate holder 125. Is exposed from. On the other hand, in the embodiment of FIG. 8, both ends of the connection member connected to the external terminal are formed from the connection line 812 and the connection terminal 636 arranged on the upper substrate holder 124 and the lower substrate holder 125, respectively. That is, both ends of the connecting member are arranged so as to be exposed one by one on both the upper substrate holder 124 and the lower substrate holder 125.

  The connection electrode 616, the spring 626, and the connection terminal 636 may be the same as those shown in FIG. The connection line 812 is fixed by being fitted into a hole that vertically penetrates the upper substrate holder 124. Both ends of the connection line 812 are exposed on the substrate placement surface and the back surface of the upper substrate holder 124, respectively. Connection line 812 is formed of an electrically conductive material.

  The terminal 806 is provided in a recess provided in the first table 141. The terminal 806 is provided to be vertically extendable from the concave portion via a spring 816. When the upper substrate holder 124 is not held on the first table 141, the terminal 806 extends downward. When the upper substrate holder 124 is placed at a predetermined position on the first table 141, the terminal 806 contacts the upper end surface of the connection line 812 and is pushed upward by the connection line 812. In this case, the lower end of the terminal 806 is pressed against the connection line 812 by the elastic force of the spring 816 and can be reliably electrically connected to the connection line 812. Stable power supply is possible.

  As in the embodiment of FIG. 7, when the lower substrate holder 125 is disposed at a predetermined position on the second table 142, the power supply terminal 436 is reliably electrically connected to the connection terminal 636 and stable. Power can be supplied. When the first substrate 122 and the second substrate 123 held by the upper substrate holder 124 and the lower substrate holder 125 are aligned and overlapped, the connection electrode 616 is caused by the elastic force of the spring 626. The lower end of the connection line 812 can be reliably connected. In this case, the connection members provided on the upper substrate holder 124 and the lower substrate holder 125 are electrically connected together with a power source 872, an ammeter 874 and a resistor 876 provided outside the upper substrate holder 124 and the lower substrate holder 125. Form a closed circuit. The ammeter 874 can detect whether or not the upper substrate holder 124 and the lower substrate holder 125 are arranged at predetermined positions by measuring the current of the closed circuit. In the embodiment of FIG. 8, the connection line 812 may be provided with a monitor unit such as the monitor unit 512 of FIG.

  In the above-described embodiment, an example of position detection when the upper substrate holder 124 and the lower substrate holder 125 are respectively placed on the first table 141 and the second table 142 in the stage device 140 has been described. Alternatively, by providing a power source, an ammeter, etc. provided in the second table 142 in the pressurizing chamber 240, the cooling chamber 250, the air lock 220, etc., the position when the upper substrate holder 124 or the lower substrate holder 125 is installed, respectively. It can also be confirmed.

  FIG. 9 is a flowchart showing an outline of a method for manufacturing a laminated semiconductor device. As shown in FIG. 9, the laminated semiconductor device is a base material for the laminated semiconductor device, Step S110 for designing the function / performance of the laminated semiconductor device, Step S120 for producing a mask (reticle) based on the design step. It is manufactured through step S130 for manufacturing a substrate, substrate processing step S140 including lithography using a mask pattern, device assembly step S150 including a substrate bonding step using the above-described substrate bonding apparatus, inspection step S160, and the like. The The device assembly step S150 includes processing processes such as a dicing process, a bonding process, and a package process following the substrate bonding process.

  As mentioned above, although this invention was demonstrated using embodiment, the technical scope of this invention is not limited to the range as described in the said embodiment. It will be apparent to those skilled in the art that various modifications or improvements can be added to the above-described embodiment. It is apparent from the scope of the claims that the embodiments added with such changes or improvements can be included in the technical scope of the present invention.

  The order of execution of each process such as operations, procedures, steps, and stages in the apparatus, system, program, and method shown in the claims, the description, and the drawings is particularly “before” or “prior to”. It should be noted that the output can be realized in any order unless the output of the previous process is used in the subsequent process. Regarding the operation flow in the claims, the description, and the drawings, even if it is described using “first”, “next”, etc. for convenience, it means that it is essential to carry out in this order. It is not a thing.

  DESCRIPTION OF SYMBOLS 100 Substrate bonding apparatus, 102 Case, 104 Normal temperature part, 106 High temperature part, 108 Heat insulation wall, 112 Substrate cassette, 114 Substrate cassette, 116 Substrate cassette, 122 First substrate, 123 Second substrate, 124 Upper substrate holder, 125 Lower substrate holder, 126 Pre-aligner, 128 Substrate holder rack, 130 Substrate removal unit, 132 Transport unit, 134 Transport unit, 140 Stage device, 141 First table, 142 Second table, 145 Heat insulation wall, 146 Shutter, 148 Control unit, 220 Airlock, 222 Shutter, 224 Shutter, 230 Conveying Unit, 240 Pressurizing Chamber, 250 Cooling Chamber, 310 Main Body, 312 Top Plate, 314 Column, 316 Bottom Plate, 342 Second Microscope, 344 First Microscope, 352 Guide Rail, 354 X 356 Y stage, 360 elevating part, 370 interferometer, 372 displacement sensor, 374 first fixed mirror, 376 second fixed mirror, 400 holder body, 401 electrostatic chucking part, 402 electrostatic chucking electrode, 404 electrostatic power reception Terminal, 406 Electrostatic adsorption electrode, 408 Electrostatic receiving terminal, 410 Connection member, 412 Connection line, 414 terminal, 416 terminal, 426 Electrostatic power supply terminal, 428 Electrostatic power supply terminal, 434 Power supply terminal, 436 Power supply terminal, 462 Static Electroadsorption power supply, 464 switch, 472 power supply, 474 ammeter, 476 resistance, 482 spring, 484 spring, 486 spring, 488 spring, 512 monitor unit, 520 cassette, 614 connection electrode, 616 connection electrode, 624 spring, 626 spring, 634 connection terminal, 636 connection terminal, 806 terminal, 812 connection line, 816 spring, 872 power supply, 874 ammeter, 876 resistance

Claims (9)

A holder main body for mounting the substrate on the mounting surface;
A pair of terminals provided on the holder main body, and a connection line for electrically connecting the pair of terminals; and when the holder main body is arranged at a predetermined position, the pair of terminals A substrate holder comprising a connection member that contacts an external terminal to form an electrical closed circuit.   2. The substrate holder according to claim 1, further comprising an electrostatic attraction portion that is provided on the holder main body separately from the connection member and electrostatically attracts the substrate to the placement surface by supplying electric power from the outside. The electrostatic adsorption part has a terminal exposed from the holder body and contacted from the outside,
The substrate holder according to claim 2, wherein an exposed area of the terminal of the connection member is smaller than an exposed area of the terminal of the electrostatic attraction portion. The electrostatic adsorption part has a terminal exposed from the holder body and contacted from the outside,
4. The substrate holder according to claim 2, wherein the terminal of the connection member is disposed adjacent to the terminal of the electrostatic attraction unit.   The substrate holder according to claim 4, wherein the connection line has a monitor portion formed of a material having lower durability than other portions. A pair of holder bodies for holding the substrate between the mounting surfaces facing each other;
When each of the pair of holder main bodies is held between the pair of holder main bodies sandwiching the substrate between the mounting surfaces, a connection line that is electrically connected to each other, and the electrically connected A pair of terminals disposed at both ends of the connecting wire, wherein when the pair of holder main bodies are disposed at predetermined positions, the pair of terminals contact an external terminal to form an electrical closed circuit; A connecting member to be formed,
The pair of terminals are disposed so as to be exposed on either one of the pair of holder bodies, or are exposed on both sides of the pair of holder bodies.   A substrate bonding apparatus for stacking and bonding a plurality of substrates using the substrate holder according to claim 1.   A laminated semiconductor device manufacturing method for manufacturing a laminated semiconductor device by stacking a plurality of substrates by the substrate bonding apparatus according to claim 7.   A stacked semiconductor device manufactured by the stacked semiconductor device manufacturing method according to claim 8.

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