JP2012056955A5 - - Google Patents

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JP2012056955A5
JP2012056955A5 JP2011239702A JP2011239702A JP2012056955A5 JP 2012056955 A5 JP2012056955 A5 JP 2012056955A5 JP 2011239702 A JP2011239702 A JP 2011239702A JP 2011239702 A JP2011239702 A JP 2011239702A JP 2012056955 A5 JP2012056955 A5 JP 2012056955A5
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group
carbon
less
formula
exception
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JP2011239702A
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JP5461503B2 (en
JP2012056955A (en
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(式中、R1はアダマンタン骨格を有する炭素数20以下の脂肪族環式基(但し、カルボニル基を有する基を除く。)であり、nは0または1〜5の整数を表し、R2は水素原子又は炭素数20以下の低級アルキル基を表す。)で示されることを特徴とする。
(In the formula, R 1 having 20 or less of an aliphatic cyclic group with a carbon having an adamantane skeleton (However, an exception to a group having a carbonyl group.), N represents an integer of 0 or 1 to 5, R 2 is characterized in that it is represented by.) represents a hydrogen atom, or of 20 or less lower alkyl group having a carbon.

Claims (1)

下記一般式(2)
Figure 2012056955
(式中、R1はアダマンタン骨格を有する炭素数20以下の脂肪族環式基(但し、カルボニル基を有する基を除く。)であり、nは0または1〜5の整数を表し、R2は水素原子又は炭素数20以下の低級アルキル基を表す。)
で示される化合物。
The following general formula (2)
Figure 2012056955
(In the formula, R 1 having 20 or less of an aliphatic cyclic group with a carbon having an adamantane skeleton (However, an exception to a group having a carbonyl group.), N represents an integer of 0 or 1 to 5, R 2 represents a hydrogen atom, or of 20 or less lower alkyl group having a carbon.)
A compound represented by
JP2011239702A 2004-02-20 2011-10-31 New compounds Active JP5461503B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011239702A JP5461503B2 (en) 2004-02-20 2011-10-31 New compounds

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
JP2004045522 2004-02-20
JP2004045522 2004-02-20
JP2004134585 2004-04-28
JP2004134585 2004-04-28
JP2004179475 2004-06-17
JP2004179475 2004-06-17
JP2004252474 2004-08-31
JP2004252474 2004-08-31
JP2011239702A JP5461503B2 (en) 2004-02-20 2011-10-31 New compounds

Related Parent Applications (1)

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JP2004316960A Division JP2006096965A (en) 2004-02-20 2004-10-29 Polymer compound, photoresist composition containing such polymer compound, and method for forming resist pattern

Publications (3)

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JP2012056955A JP2012056955A (en) 2012-03-22
JP2012056955A5 true JP2012056955A5 (en) 2012-05-10
JP5461503B2 JP5461503B2 (en) 2014-04-02

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Family Applications (4)

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JP2011111662A Active JP5588396B2 (en) 2004-02-20 2011-05-18 POLYMER COMPOUND, PHOTORESIST COMPOSITION CONTAINING THE POLYMER COMPOUND, AND METHOD FOR FORMING RESIST PATTERN
JP2011111663A Active JP5461472B2 (en) 2004-02-20 2011-05-18 POLYMER COMPOUND, PHOTORESIST COMPOSITION CONTAINING THE POLYMER COMPOUND, AND METHOD FOR FORMING RESIST PATTERN
JP2011111661A Active JP5778985B2 (en) 2004-02-20 2011-05-18 POLYMER COMPOUND, PHOTORESIST COMPOSITION CONTAINING THE POLYMER COMPOUND, AND METHOD FOR FORMING RESIST PATTERN
JP2011239702A Active JP5461503B2 (en) 2004-02-20 2011-10-31 New compounds

Family Applications Before (3)

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JP2011111662A Active JP5588396B2 (en) 2004-02-20 2011-05-18 POLYMER COMPOUND, PHOTORESIST COMPOSITION CONTAINING THE POLYMER COMPOUND, AND METHOD FOR FORMING RESIST PATTERN
JP2011111663A Active JP5461472B2 (en) 2004-02-20 2011-05-18 POLYMER COMPOUND, PHOTORESIST COMPOSITION CONTAINING THE POLYMER COMPOUND, AND METHOD FOR FORMING RESIST PATTERN
JP2011111661A Active JP5778985B2 (en) 2004-02-20 2011-05-18 POLYMER COMPOUND, PHOTORESIST COMPOSITION CONTAINING THE POLYMER COMPOUND, AND METHOD FOR FORMING RESIST PATTERN

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5856991B2 (en) * 2012-05-21 2016-02-10 富士フイルム株式会社 Chemically amplified resist composition, negative chemically amplified resist composition, resist film using the same, resist-coated mask blanks, photomask manufacturing method and pattern forming method, and electronic device manufacturing method
JP2014156530A (en) * 2013-02-15 2014-08-28 Dic Corp Fluorine-based surfactant and positive resist composition

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001318465A (en) * 2000-05-11 2001-11-16 Fuji Photo Film Co Ltd Positive type photoresist composition
JP2002139838A (en) * 2000-10-31 2002-05-17 Fuji Photo Film Co Ltd Positive type resist composition
TWI266146B (en) * 2001-03-31 2006-11-11 Samyang Ems Co Ltd Resist composition for column spacer of liquid crystal display element
JP2002351079A (en) * 2001-05-24 2002-12-04 Fuji Photo Film Co Ltd Positive type resist composition
KR20020090489A (en) * 2001-05-28 2002-12-05 금호석유화학 주식회사 Polymer for resist and formulation material using the same
JP4083399B2 (en) * 2001-07-24 2008-04-30 セントラル硝子株式会社 Fluorine-containing polymerizable monomer and polymer compound using the same
JP4522628B2 (en) * 2001-11-28 2010-08-11 信越化学工業株式会社 New ester compounds
JP4030313B2 (en) * 2002-01-18 2008-01-09 三菱レイヨン株式会社 Method for producing adamantane derivative
JP2004220009A (en) * 2002-12-28 2004-08-05 Jsr Corp Radiation sensitive resin composition
JP2005017729A (en) * 2003-06-26 2005-01-20 Fuji Photo Film Co Ltd Positive resist composition
JP4258645B2 (en) * 2003-10-23 2009-04-30 信越化学工業株式会社 Polymer compound, resist material, and pattern forming method
JP2005189712A (en) * 2003-12-26 2005-07-14 Fuji Photo Film Co Ltd Positive resist composition and pattern forming method using the same
JP4525912B2 (en) * 2004-01-30 2010-08-18 信越化学工業株式会社 Polymer compound, resist material, and pattern forming method
JP4651283B2 (en) * 2004-02-04 2011-03-16 ダイセル化学工業株式会社 Unsaturated carboxylic acid hemiacetal ester, polymer compound, and resin composition for photoresist
JP2005234449A (en) * 2004-02-23 2005-09-02 Fuji Photo Film Co Ltd Positive resist composition and pattern forming method using the same
JP4866237B2 (en) * 2004-05-18 2012-02-01 出光興産株式会社 Adamantane derivative, method for producing the same, and photosensitive material for photoresist

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