JP2012000131A - Data collection device, corpuscular beam treatment apparatus, and data collection method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To speed up the collection or operational processing of the beam data from a multichannel type monitor.SOLUTION: This data collection device includes a multiplexer 13 for selecting one of a plurality of the channel data based on the analogue signals from a multichannel type sensor device 22, an A/D converter 14 for converting the channel data selected by the multiplexer 13 to A/D conversion data, a channel selection circuit 16 for controlling the multiplexer 13 and the A/D converter 14, and a data collecting operational circuit 17 for operating the state of charged corpuscular beam 1 on the basis of a plurality of the A/D conversion data. The channel selection circuit 16 has a channel setting register 18 for storing the data of the selection channel outputted to the data collecting operational circuit 17 of a plurality of the detection channels of the multichannel type sensor device 22 to successively output the A/D conversion data of the selection channel to the data collecting operational circuit 17 on the basis of the data of the selection channel.

Description

  The present invention relates to a particle beam therapy system used for medical and research purposes, and more particularly to a particle beam beam data collection method in a scanning particle beam therapy system such as spot scanning and raster scanning.

  In general, a particle beam therapy system is connected to a beam generator for generating a charged particle beam, an accelerator for accelerating the generated charged particle beam, and a charge emitted after being accelerated to energy set by the accelerator. A beam transport system that transports a particle beam, and a particle beam irradiation device that is installed downstream of the beam transport system and that irradiates a target with a charged particle beam. The particle beam irradiation device is large, so that the charged particle beam is scattered and expanded by a scatterer, and the expanded charged particle beam is matched to the shape of the irradiation target to form an irradiation field, and to match the shape of the irradiation target There are scanning irradiation methods (spot scanning, raster scanning, etc.) in which an irradiation field is formed by scanning a thin pencil beam.

  In the broad irradiation method, an irradiation field that matches the shape of the affected area is formed using a collimator or a bolus. An irradiation field that matches the shape of the affected area is formed to prevent unnecessary irradiation of normal tissue. This is the most widely used irradiation method. However, it is necessary to manufacture a bolus for each patient or to deform the collimator according to the affected area.

  On the other hand, the scanning irradiation method is a highly flexible irradiation method in which a collimator and a bolus are unnecessary. However, since these components that prevent irradiation of normal tissues other than the affected part are not used, higher beam irradiation position accuracy than that of the broad irradiation method is required.

  Patent Document 1 compares the set current value of the scanning electromagnet during irradiation and the beam position data detected by the beam position monitor with the set current value and beam position data of the conversion table stored in the storage device. It is described that an abnormality determination device that determines whether the beam position is normal or abnormal is provided, and that the accelerator control device stops emission of the charged particle beam when the abnormality determination device determines that the beam position is abnormal.

Japanese Patent Laying-Open No. 2005-296162 (stage 0046 to stage 0049)

  In the invention disclosed in Patent Document 1, the abnormality determination device determines whether the beam position being irradiated is normal or abnormal using the beam position data detected by the beam position monitor during irradiation of the charged particle beam, If it is determined that the accelerator control device stops emitting the charged particle beam, but it takes a long time to collect and process the beam position data detected by the beam position monitor, The movement of the irradiation position of the beam must be controlled in accordance with the time for collecting and processing the beam position data. If the time for collecting and processing the beam position data becomes longer, there arises a problem that the irradiation time becomes longer accordingly.

  In the broad irradiation method, a flatness monitor is used to measure the flatness of a charged particle beam. This flatness monitor collects data of about 30 channels, for example. The broad irradiation method does not scan the charged particle beam according to the shape of the affected part unlike the scanning irradiation method, and the irradiation field is shaped by one irradiation, so the data collection and data processing speed is slow. It was a thing. However, in the scanning irradiation method, a thin pencil-shaped beam is scanned to form an irradiation field, so that a multi-channel type monitor is used. When the same data collection device as the conventional flatness monitor used in the broad irradiation method, that is, when the conventional beam data collection and calculation processing method is applied to the scanning irradiation method, the beam position data collection and data processing as described above are performed. The problem is that the time becomes longer and the irradiation time becomes longer accordingly. Therefore, it is required to speed up the collection and calculation processing of beam data from a multi-channel type monitor used for the scanning irradiation method.

  The present invention has been made to solve the above-described problems, and an object of the present invention is to speed up the collection and calculation processing of beam data from a multichannel monitor used in the scanning irradiation method.

  A multiplexer that selects one of a plurality of channel data based on an analog signal from a multi-channel sensor device that detects the passage position of the charged particle beam by a plurality of detection channels, and the channel data selected by the multiplexer as a digital signal An AD converter for converting to AD conversion data, a channel selection circuit for controlling the multiplexer and the AD converter, and a state of the charged particle beam are calculated based on a plurality of AD conversion data input through the channel selection circuit. A data collection arithmetic circuit is provided. The channel selection circuit has a channel setting register for storing information on a selection channel output to the data collection arithmetic circuit among a plurality of detection channels of the multi-channel type sensor device, and AD conversion of the selection channel based on the information on the selection channel Data is sequentially output to the data collection arithmetic circuit.

  Since the data collection device according to the present invention is controlled by the channel selection circuit to generate AD conversion data of a selected channel selected from among a plurality of detection channels of the multi-channel type sensor device, the data collection device used in the scanning irradiation method Collection of beam data from a channel type monitor and calculation processing can be speeded up.

It is a schematic block diagram of the particle beam therapy apparatus of this invention. It is a block diagram which shows the particle beam irradiation apparatus of FIG. It is a figure which shows the structure of the data collection device in Embodiment 1 of this invention. It is a figure which shows the structure of the channel setting register | resistor of FIG. It is a figure which shows the structure of the data collection device in Embodiment 2 of this invention. It is a figure which shows the structure of the scan control register of FIG. It is a figure which shows the scan pattern by the scan control register of FIG. FIG. 6 is a diagram showing another configuration of the scan control register of FIG. 5. It is a figure which shows the structure of the data collection device in Embodiment 3 of this invention. It is a figure explaining the switch opening / closing operation | movement of a multiplexer by TB setting circuit of FIG. It is a figure which shows the structure of the data collection device in Embodiment 4 of this invention. It is a figure which shows the structure of the data collection device in Embodiment 5 of this invention. It is a figure which shows the ADC data structure in the dual port memory of FIG. It is a figure which shows the pointer structure in the dual port memory of FIG. It is a figure which shows the connection of the sensor terminal and sensor input terminal in Embodiment 6 of this invention.

Embodiment 1 FIG.
FIG. 1 is a schematic configuration diagram of a particle beam therapy system according to the present invention. The particle beam therapy system 51 includes a beam generation device 52, a beam transport system 59, and particle beam irradiation devices 58a and 58b. The beam generator 52 includes an ion source (not shown), a pre-accelerator 53, and a synchrotron 54. The particle beam irradiation device 58b is installed in a rotating gantry (not shown). The particle beam irradiation device 58a is installed in a treatment room having no rotating gantry. The role of the beam transport system 59 is in communication between the synchrotron 54 and the particle beam irradiation devices 58a and 58b. A part of the beam transport system 59 is installed in a rotating gantry (not shown), and the part has a plurality of deflection electromagnets 55a, 55b, and 55c.

  A charged particle beam, which is a particle beam such as a proton beam generated by an ion source, is accelerated by the pre-stage accelerator 53 and is incident on the synchrotron 54. The charged particle beam is accelerated to a predetermined energy. The charged particle beam emitted from the synchrotron 54 is transported to the particle beam irradiation devices 58a and 58b through the beam transport system 59. The particle beam irradiation devices 58a and 58b irradiate the irradiation target 9 (see FIG. 2) of the subject with the charged particle beam.

  FIG. 2 is a block diagram showing the particle beam irradiation apparatus of the present invention. The charged particle beam 1 generated by the beam generation device 52 and accelerated to a predetermined energy is guided to the particle beam irradiation device 58 via the beam transport system 59. The particle beam irradiation device 58 includes an X-direction scanning electromagnet 2 and a Y-direction scanning electromagnet 3 that scan the charged particle beam 1 in the X direction and the Y direction that are perpendicular to the charged particle beam 1, a dose monitor 5, and dose data. A converter 6, a multi-channel sensor device 22, a data collection device 24, a scanning electromagnet power source 7, and an irradiation control device 8 that controls the irradiation system of the particle beam irradiation device 58 are provided. The traveling direction of the charged particle beam 1 is the Z direction.

  The X direction scanning electromagnet 2 is a scanning electromagnet that scans the charged particle beam 1 in the X direction, and the Y direction scanning electromagnet 3 is a scanning electromagnet that scans the charged particle beam 1 in the Y direction. The multi-channel type sensor device 22 detects a beam peak position (passing position), beam intensity, beam flatness, etc. in a beam through which the charged particle beam 1 scanned by the X direction scanning electromagnet 2 and the Y direction scanning electromagnet 3 passes. The dose monitor 5 detects the dose of the charged particle beam 1. The irradiation control device 8 controls the irradiation position of the charged particle beam 1 on the irradiation object 9 based on the treatment plan data created by the treatment planning device (not shown), is measured by the dose monitor 5, and is measured by the dose data converter 6. When the dose converted into digital data reaches the target dose, the charged particle beam 1 is stopped. The scanning electromagnet power source 7 changes the set current of the X direction scanning electromagnet 2 and the Y direction scanning electromagnet 3 based on the control input (command) to the X direction scanning electromagnet 2 and Y direction scanning electromagnet 3 output from the irradiation control device 8. Let

  FIG. 3 is a diagram showing the configuration of the data collection device according to Embodiment 1 of the present invention. The data collection device 24 is arranged with the same number of sensor input terminals 11 that can connect all channels of the multi-channel type sensor device 22 and the sensor input terminals 11, and converts the current signals obtained from the sensor input terminals 11 into voltage signals. A current-voltage converter (IV converter) 12 that performs time division multiplexing of a voltage signal output from the current-voltage converter 12, and a voltage signal that is time-division multiplexed by the multiplexer 13 is sequentially converted into a digital signal. AD converter 14 that performs AD conversion processing for conversion into a channel, a channel selection circuit 16 that controls the multiplexer 13 and the AD converter 14, and sensor original data at a sensor detection level obtained by converting the data converted into a digital signal by the AD converter 14 And the state of the charged particle beam 1 from the sensor original data, that is, the beam intensity, Beam flatness, a data collection operation circuit 17 for calculating a beam diameter, and the beam peak position and the like, having a data memory 25.

The multi-channel type sensor device 22 has a meshed sensor portion and has a large number of detection channels (channels in the X direction and the Y direction). These many channels output current signals as analog signals. The analog signal of Xch (X channel) of the multi-channel type sensor device 22 is connected to the sensor input terminals 11xa to 11xm of the data acquisition device 24, and the analog signal of Ych (Y channel) is supplied from the sensor input terminal 11ya of the data acquisition device 24. 11yn. The current signal input from the sensor input terminal 11 of the data collection device 24 is converted into a voltage signal proportional to the current signal level by the current-voltage converter 12 corresponding to a minute current level.

  The channel selection circuit 16 is a timing control interface circuit 15 for extracting an AD-converted digital signal, and a channel for preselecting a digital signal necessary for data collection and calculation when time-division-multiplexing the voltage signal. A setting register 18 is included. The data collection arithmetic circuit 17 has a DSP (arithmetic unit) 20 and a CPU (controller) 21 and irradiates the result of calculating the beam intensity, beam flatness, beam diameter, beam peak position, etc. of the charged particle beam 1. Transmit to the control device 8.

  The sensor input terminal 11 and the current-voltage converter 12 are arranged as close as possible to minimize loss and noise disturbance. The multichannel signal of the sensor device converted into a voltage signal by the current-voltage converter 12 is time-division multiplexed by the multiplexer 13. This time division multiplexing is a state in which voltage signals are arranged in series at the output of the multiplexer 13 by controlling the opening and closing of the analog switch built in the multiplexer 13 and sequentially switching the input voltage signals connected in parallel. Is to do. This voltage signal is AD converted into a digital signal by the AD converter 14. Then, the interface circuit 15 of the channel selection circuit 16 sequentially performs timing control, and reads the AD signal converted from the AD converter 14. The operation of reading the digital signal that has been AD converted from the series of time division multiplexing is controlled by the channel selection circuit 16.

  FIG. 4 is a diagram showing the configuration of the channel setting register. The example of FIG. 4 is an example in which 32ch data is used for each of Xch and Ych in order to calculate the beam peak position. FIG. 4 shows addresses and their contents. Address 1 stores the channel number (CH number) transmitted by the channel selection circuit 16, and address 2 stores the channel number during AD conversion. Addresses 3 to 34 store the channel numbers of the 32 channels selected from the Xch of the data collection device 24, and addresses 35 to 66 store the channel numbers of the 32 channels selected from the Ych of the data collection device 24. Is done.

  Next, the operation of the data collection device 24 will be described using the spot scanning irradiation method as an example. In the spot scanning irradiation type irradiation apparatus, the number of spots that irradiate the irradiation object 9 reaches 1 million. Plan data such as a target position (target passage position) and beam size in the multi-channel sensor device 22 created for each patient and corresponding to each spot in the treatment plan is sent from the irradiation control device 8 to the data collection arithmetic circuit 17. It is stored in the data memory 25 by the CPU 21 (all planned spot data storage procedure). The CPU 21 refers to the plan data for the first spot in the data memory 25, and sets the channel number of the multi-channel sensor device 22 such that the target position in the multi-channel sensor device 22 for the first spot is substantially in the center as Xch. And channel numbers (selected channel setting data) of 32 channels of Ych are written in the channel setting register 18 (register selection procedure).

The charged particle beam 1 is irradiated, and current data detected by the multi-channel sensor device 22 is input to the current-voltage converter 12. The channel selection circuit 16 outputs to the multiplexer 13 a signal sigb for opening the analog switch of the multiplexer 13 corresponding to the channel (selected channel) designated by the address 2 (channel number during AD conversion) of the channel setting register 18 ( Multiplexer control procedure). Next, a predetermined time is awaited by the internal timer of the channel selection circuit 16 or the voltage of the capacitor, and a conversion start command siga is sent to the AD converter 14 (AD conversion start procedure). The AD conversion start varies depending on the converter, but the channel selection circuit 16 outputs in accordance with the characteristics of the AD converter employed. For example, the conversion start command siga outputs a conversion start signal (changes the level of a certain terminal, etc.), gives a clock signal (conversion starts at the rising edge of the clock signal), sets a conversion bit in a register, and the like. The predetermined time is the time elapsed for the sample hold of the AD converter 14. The AD conversion data generation procedure for generating AD conversion data includes a multiplexer control procedure and an AD conversion start procedure.

  When the channel selection circuit 16 detects the completion of AD conversion (a method of detecting completion timing will be described later), the channel selection circuit 16 immediately reads out the AD signal converted from the AD converter 14 by the interface circuit 15. Then, processing corresponding to the data format of the data collection arithmetic circuit 17 is performed from the output (parallel output, serial output) format of the AD converter 14, and the sensor original data subjected to the format conversion is transmitted to the data collection arithmetic circuit 17 (data transmission procedure) ). When the AD converter 14 is a parallel output, a signal serving as an output trigger is output to the AD converter 14, and ADC data (AD conversion data) is extracted from the AD converter 14. When the AD converter 14 is a serial output, a signal serving as an output trigger and a clock for data output are output, and ADC data is extracted from the AD converter 14.

  The data collection calculation circuit 17 performs an averaging calculation for averaging the ADC data sent from the channel selection circuit 16 by the DSP 20 for each channel until the dose of the charged particle beam 1 for the first spot reaches the target dose. . Until the dose of the charged particle beam 1 for the first spot reaches the target dose and the control for the next spot is started, the channel selection circuit 16 applies each channel of addresses 3 to 66 stored in the channel setting register 18. On the other hand, the multiplexer control procedure, AD conversion start procedure, and data transmission procedure are repeated.

  Here, a description will be given in detail of the multiplexer control procedure using the channel setting register 18 and the AD conversion start procedure. In the multiplexer control procedure and the AD conversion start procedure, the channel designated first is the channel stored in the address 3. When the register selection procedure is executed, the X0 channel number (see FIG. 4) stored at address 3 is transferred to address 2 (channel number during AD conversion). The channel selection circuit 16 outputs a signal sigb corresponding to the channel specified by address 2 (channel number during AD conversion) (multiplexer control procedure), and sends a conversion start command siga to the AD converter 14 (AD conversion). Start procedure). When the completion of AD conversion is detected, the channel selection circuit 16 transmits the sensor original data to the data collection arithmetic circuit 17 (data transmission procedure), and sets the channel number during AD conversion of address 2 to address 1 (data transmission channel number). Forward to. Then, the channel number of X1 stored at address 4 is transferred to address 2 (channel number during AD conversion). A multiplexer control procedure and an AD conversion start procedure are executed so as to obtain the ADC data of the changed channel. The channel selection circuit 16 performs the multiplexer control procedure, AD conversion start procedure, data transmission for each channel of the addresses 3 to 66 stored in the channel setting register 18 until the above operation is started for the next spot. Repeat the procedure.

  When the dose of the charged particle beam 1 with respect to the first spot reaches the target dose, a dose expiration signal sigd is output from the dose data converter 6. The data collection calculation circuit 17 receives the dose expiration signal sigd, stops the averaging calculation for each channel in the DSP 20, and determines the beam peak position (passing position), beam intensity, beam diameter, Xch and Ych current intensity profile data. The beam flatness and the like are calculated by the DSP 20 (calculation procedure), and the calculated result data is transmitted to the irradiation control device 8 (calculation result transmission procedure).

  When the irradiation control device 8 receives the result data from the data collection calculation circuit 17, the next spot command (next data collection command) for performing data processing on the next (second) spot to the CPU 21 of the data collection calculation circuit 17 (Next spot transfer procedure (next data transfer procedure)). When the CPU 21 receives the next spot command, the CPU 21 refers to the plan data for the next (second) spot in the data memory 25, and sets the target position in the multi-channel type sensor device 22 for the next (second) spot to substantially the center. The channel number of the multi-channel type sensor device 22 as described above is written in the channel setting register 18 as the channel numbers of 32ch each of Xch and Ych. That is, the register selection procedure for the next (second) spot is executed. Thereafter, the multiplexer control procedure, AD conversion start procedure, data transmission procedure, calculation procedure, and calculation result transmission procedure for the next (second) spot are executed, and the processing up to the last spot is repeated. The operations of the multiplexer control procedure, the AD conversion start procedure, and the data transmission procedure are executed by the synchronous circuit (H / W, hardware) that constitutes the channel selection circuit 16, and therefore waiting time and interrupts between the respective processes. Does not occur. Since the channel selection circuit 16 cannot access the channel setting register 18 while the CPU 21 is writing new selection channel setting data in the channel setting register 18, the channel selection circuit 16 performs the multiplexer control procedure for the next channel. Processing cannot be performed and it is interrupted.

  A method for detecting the AD conversion completion timing will be described. The timing at which the AD conversion is completed is, for example, measuring the time with a timer or monitoring the status in the AD converter 14 (for example, a certain flag is set when the conversion is completed). Also, the AD converter 14 informs the channel selection circuit 16 (the state of a certain terminal changes), or a clock for reading out ADC data is supplied to the AD converter 14, and from what number it is valid data. The AD conversion completion timing is detected by determining the timing.

  As described above, the data collection device 24 of the first embodiment includes the channel selection circuit 16 and the data collection arithmetic circuit 17, and the channel selection circuit 16 controls the multiplexer 13 and the AD converter 14 in the processing time of each channel. Since it is performed efficiently so as not to cause waiting time and interruption, the scanning irradiation method is compared with the case where the same data collection device as the conventional flatness monitor used in the conventional broad irradiation method is applied to the scanning irradiation method. It is possible to speed up the collection and calculation of beam data from the multi-channel type monitor used.

  In general, in the data collection device used in the conventional broad irradiation method, the multiplexer 13 and the AD converter 14 are controlled for each channel by one CPU in selecting a channel necessary for data collection and calculation. It was carried out at every switch. When the number of channels of the multi-channel sensor device increases, the control load of the CPU increases, which causes a problem that the processing speed of the data collection device cannot be sufficiently increased. However, the data collection device 24 of the first embodiment includes the channel selection circuit 16 and the data collection arithmetic circuit 17, and the channel selection circuit 16 controls the multiplexer 13 and the AD converter 14, so that the multi-channel type sensor device 22. Even if the number of channels increases, it is possible to suppress an increase in the control load of the data collection arithmetic circuit 17 and to sufficiently increase the processing speed of the data collection device 24.

In the scanning irradiation method, the state of the charged particle beam 1 differs depending on the state and size of the irradiation target (affected part) 9, and it is necessary to change the target dose of each spot, that is, the change time between the spots. For example, the change time may be about several hundred ms, or it may be about 100 μs. The data collection device 24 according to the first embodiment uses the data of the multi-channel type sensor device 22 corresponding to each spot and uses less channels, for example, Xch and Ych each 3
Since the data collection arithmetic circuit 17 calculates the ADC data for two channels (64 channels in total), the state of the charged particle beam 1 for each spot can be calculated at high speed. Even when there are a plurality of ADC data for each channel, the data collection arithmetic circuit 17 performs an arithmetic operation on the DSP 20 to average the ADC data for each channel every time AD conversion data is sent. When the target dose is reached, the state of the charged particle beam 1 is calculated using the averaged data for each channel (64 channels) used at that time, so the state of the charged particle beam 1 is calculated at high speed. can do.

Although the next spot transition procedure has been described in the example in which the irradiation control device 8 transmits the next spot command to the CPU 20 of the data collection calculation circuit 17 when the result data is received from the data collection calculation circuit 17, the irradiation control device 8 When the dose expiration signal sigd is received from the dose data converter 6, the next spot command may be transmitted to the CPU 20 even before the result data from the data collection arithmetic circuit 17 is received. In this case, even when the DSP 20 of the data collection calculation circuit 17 is calculating, the CPU 21 writes the channel number data corresponding to the next spot in the channel setting register 18 (register selection procedure), so that the channel selection circuit 16 collects the data. The ADC data corresponding to the next spot is input to the data collection arithmetic circuit 17 (the ADC data is stored in a memory not shown) without waiting for the arithmetic circuit 17 to finish the operation, that is, without delay. Therefore, it is possible to further shorten the time for obtaining the calculation result of the beam data.
Collection and calculation processing can be speeded up.

  As described above, according to the data collection device 24 of the first embodiment, from the plurality of channel data based on the analog signal from the multi-channel type sensor device 22 that detects the passing position of the charged particle beam 1 by the plurality of detection channels. A multiplexer 13 that selects one, an AD converter 14 that converts the channel data selected by the multiplexer 13 into AD conversion data that is a digital signal, a channel selection circuit 16 that controls the multiplexer 13 and the AD converter 14, A data collection operation circuit 17 that calculates the state of the charged particle beam 1 based on a plurality of AD conversion data input via the channel selection circuit 16 is provided. The channel selection circuit 16 includes a plurality of multi-channel sensor devices 22. A selection channel to be output to the data collection arithmetic circuit 17 among the detection channels. A channel setting register 18 for storing the channel information, and AD conversion data of the selected channel is sequentially output to the data collection arithmetic circuit 17 based on the selected channel information. It is possible to control to generate AD conversion data of a selected channel selected from among the detection channels, and it is possible to speed up the collection and calculation processing of beam data from a multi-channel type monitor used in the scanning irradiation method.

  In the data collection method of the first embodiment, channel data based on an analog signal from a multi-channel type sensor device 22 that detects the passage position of the charged particle beam 1 by a plurality of detection channels is converted into a digital signal by the AD converter 14. An AD conversion data generation procedure for generating AD conversion data, a data transmission procedure for transmitting the AD conversion data generated in the AD conversion data generation procedure to the data collection arithmetic circuit 17, and a plurality of ADs transmitted by the data transmission procedure A selection channel selected from a plurality of detection channels of the multi-channel type sensor device 22 in the AD conversion data generation procedure, including a calculation procedure for calculating the state of the charged particle beam 1 by the data collection calculation circuit 17 based on the conversion data. Generate AD conversion data for the selected channel based on the information of The channel selection circuit can be controlled to generate AD conversion data of a selected channel selected from a plurality of detection channels of the multi-channel type sensor device, and the beam data from the multi-channel type monitor used in the scanning irradiation method can be controlled. Collection and calculation processing can be speeded up.

The particle beam therapy system according to the first embodiment generates a charged particle beam 1, a beam generator 52 that accelerates the charged particle beam 1 with an accelerator 54, and a beam that transports the charged particle beam 1 accelerated by the accelerator 54. The system includes a transport system 59 and a particle beam irradiation device 58 that irradiates the irradiation target 9 with the charged particle beam 1 transported by the beam transport system 59. The particle beam irradiation device 58 includes the charged particle beam 1 that irradiates the irradiation target 9. And a data collecting device 24 for calculating and collecting the state of the charged particle beam 1 scanned by the scanning electromagnets 2 and 3. The data collection device 24 selects a multiplexer 13 that selects one of a plurality of channel data based on analog signals from a multi-channel sensor device 22 that detects the passage position of the charged particle beam 1 by a plurality of detection channels, and the multiplexer 13. The AD converter 14 that converts the channel data selected in step 1 into AD conversion data that is a digital signal, the channel selection circuit 16 that controls the multiplexer 13 and the AD converter 14, and a plurality of inputs that are input via the channel selection circuit 16. The data collection calculation circuit 17 that calculates the state of the charged particle beam 1 based on the AD conversion data of the multi-channel sensor device 22 is provided. The channel selection circuit 16 outputs the data to the data collection calculation circuit 17 among the plurality of detection channels of the multi-channel sensor device 22. Channel that stores information on the selected channel Since it has a setting register 18 and sequentially outputs AD conversion data of the selected channel to the data collection arithmetic circuit 17 based on the information of the selected channel, it is possible to collect beam data from a multi-channel type monitor used in the scanning irradiation method. The arithmetic processing can be speeded up and the treatment time can be shortened.

Embodiment 2. FIG.
FIG. 5 is a diagram showing the configuration of the data collection device according to Embodiment 2 of the present invention. It differs from the data collection device 24 (24a) of the first embodiment in that the channel selection circuit 16 (16b) has a scan control register 19. The multiplexer control procedure, AD conversion start procedure, and data transmission procedure can be repeated (scanned) between the start point and end point set in the scan control register 19. This will be described below.

  FIG. 6 is a diagram showing a configuration of the scan control register, and FIG. 7 is a diagram showing a scan pattern by the scan control register. The scan control register 19 is set with channel information (start point channel and end point channel information) of the start point and end point of Xch and Ych, respectively. Specifically, an address corresponding to the channel number stored in the channel setting register 18 is stored in the scan control register 19. In the example shown in FIG. 5, the Xch start point (scan start point X) stores the address 3 of the channel setting register 18, that is, the channel number of X0 (see FIG. 4). Similarly, the end point of Xch (scan end point X) stores the address 34 of the channel setting register 18, that is, the channel number of X31. The start point of Ych (scan start point Y) stores the address 35 of the channel setting register 18, that is, the channel number of Y0. The end point of Ych (scan end point Y) stores the address 66 of the channel setting register 18, that is, the channel number of Y31. In the example of FIG. 6, all the channels stored in the channel setting register 18 are scanned.

  The horizontal axis in FIG. 7 is the scan order, and the vertical axis is the channel. As indicated by an arrow (scan pattern) 42, the channel section 41 set in the scan control register 19 is repeatedly performed with the channel sections 41a, 41b, 41c, and 41d. When the four channel sections 41a, 41b, 41c, and 41d are scanned, data is collected four times for each channel in the scan section.

  The operation will be described. In the all planned spot data storage procedure, the number of channels for collecting data corresponding to each spot (for example, 16 channels for each of Xch and Ych) is also stored in the data memory 25. In the register selection procedure, the CPU 21 refers to the data memory 25 and obtains information on the scan start point X, the scan end point X, the scan start point Y, and the scan end point Y based on the number of channels for collecting data for the first spot and the target position. Write to the scan control register 19. When the channel selection circuit 16 (16b) receives a scan start instruction from the data collection arithmetic circuit 17, the channel selection circuit 16 (16b) automatically incorporates the multiplexer 13 until all the channel numbers set in the channel setting register 18 are time-division multiplexed. A scan operation is performed to sequentially open and close the analog switches. The channel selection circuit 16 (16b) receives a scan start instruction, reads the information set as the scan start point X of the scan control register 19, and performs a multiplexer control procedure corresponding to the channel of the corresponding channel setting register 18, AD conversion Start procedure and data transmission procedure. A multiplexer control procedure, an AD conversion start procedure, and a data transmission procedure corresponding to the channel of the channel setting register 18 based on the information indicated by the scan end point X are performed, and the operation from the scan start point Y to the scan end point Y is also the same. To do.

  The data collection device 24b according to the second embodiment collects beam data from a multi-channel monitor and performs arithmetic processing with the number of channels limited from the number of channels set in the channel setting register 18 of the channel selection circuit 16b. The beam data is processed by the minimum necessary number, and the time for collecting and calculating the beam data can be shortened as compared with the channel selection circuit 16a of the first embodiment.

  Further, the channel selection circuit 16b may continue the scan operation until a scan stop instruction is received from the data collection arithmetic circuit 17. In this case, data can be repeatedly collected in the case of maintenance work, and the number of data to be averaged in the data collection arithmetic circuit 17 can be easily changed. Therefore, maintenance work can be performed efficiently.

  Further, a scanning direction may be added to the scan control register 19. FIG. 8 is a diagram showing another configuration of the scan control register. Scan control X and scan control Y are added to the scan control register shown in FIG. In the scan control X and the scan control Y, information indicating the scan direction is set. 00 indicates scanning in order from the start point to the end point, 01 indicates scanning in order from the end point to the start point, and 10 indicates alternately between the start point and the end point on the start point side and the end point side. By adding the scanning direction, it is possible to easily determine the necessity of adjustment due to the difference in the scanning direction in the maintenance work, and the maintenance work can be performed efficiently. In addition, adjacent channel leakage of the multi-channel type sensor device 22 and reproducibility verification of measurement results can be performed. Note that the scanning direction may be changed for each spot.

Embodiment 3 FIG.
FIG. 9 is a diagram showing the configuration of the data collection device according to Embodiment 3 of the present invention. The data collection device 24 (24b) of the second embodiment is an analog switch in which the channel selection circuit 16 (16c) has a TB setting circuit (timebase setting circuit) 31 and the multiplexer 13 (13b) has a discharging function. It differs in having 26. Compared with the data collection device 24 (24a) of the first embodiment and the data collection device 24 (24b) of the second embodiment, the time until the stability of the voltage signal input to the AD converter 14 is obtained for each channel. The time until the AD conversion process of the AD converter 14 is completed can be optimized. This will be described below.

  The multiplexer 13 b has the same number of analog switches as the sensor input terminal 11. In FIG. 9, the analog switch 26 has analog switches 26xa to 26xm corresponding to Xch, and there are analog switches 26ya to 26xn corresponding to Ych. The analog switch 26 has a terminal connected to the current-voltage converter 12 and a terminal connected to GND (ground level). The operation of the TB setting circuit 31 and the multiplexer 13b will be described with reference to FIG.

FIG. 10 is a diagram for explaining the switch opening / closing operation of the multiplexer by the TB setting circuit.
The transition of the opening / closing operation by the TB setting circuit 31 in the analog switches SW (1), SW (2) to SW (N) built in the multiplexer 13 is shown. The analog switch SW (1) is the analog switch 26xa, the analog switch SW (2) is the next analog switch 26xb (not shown), and the analog switch SW (N) is the last analog switch 26yn. S1 to S5 shown in FIG. 10 are timings of the plurality of analog switches SW. FIG. 10 shows a range in which there are two repetition periods (27a, 27b) from states S1 to S5.

  The TB setting circuit 31 is a circuit that changes the six states and outputs a control signal for each state. The state machine of the TB setting circuit 31 counts time with a timer, for example, and changes the state when a predetermined time is reached. The TB setting circuit 31 outputs a control signal when transitioning to the next state. Here, SW (1) (where the analog switch is abbreviated as appropriate) and SW (2) are taken as an example, and among the voltage signals from the current-voltage converter 12, channels 1 to 3 are sequentially time-division multiplexed. However, the subsequent operations up to SW (N) are the same.

  Timing S1 (repetition period 27a): SW (1) is switched to the voltage signal input side. The other SW (2) and SW (3) maintain the switch open state.

  Timing S2 (repetition period 27a): Indicates a timing at which an AD conversion instruction is issued to the AD converter 14 by the interface circuit 15 of the channel selection circuit 16. SW (1) is switched to the voltage signal input side until the time until the voltage signal rises and the voltage sufficiently stabilizes, and the time until the AD conversion processing of the AD converter 14 is completed.

  Timing S3 (repetition period 27a): A digital signal obtained by AD conversion is taken out from the AD converter 14 by the interface circuit 15.

  Timing S4 (repetition period 27a): Until the operation of timing S3 is completed, a little guard time is provided, and SW (1) is switched to the GND side. As a result, the voltage remaining due to the capacitive component between the multiplexer 13 and the AD converter 14 is discharged. Then, when the next SW (2) is switched to the voltage signal input side, the event that the voltage signal becomes unstable is removed.

  Timing S5 (repetition period 27a): SW (1) is opened.

  Timing S1 (repetition period 27b): SW (1) is opened and then SW (2) is switched to the voltage signal input side. At this time, a short protection time is provided in order to prevent the output side of SW (2) from being short-circuited to the GND of SW (1).

  Timing S2 (repetition period 27b): indicates the timing at which the interface circuit 15 issues an AD conversion instruction to the AD converter 14. SW (2) is switched to the voltage signal input side until the time until the voltage signal rises and the voltage sufficiently stabilizes and the time until the AD conversion processing of the AD converter 14 is completed.

  Thereafter, similarly, at the timings S3 to S5, the analog switch SW (2) is controlled by the TB setting circuit 31.

The data collection device 24c according to the third embodiment optimizes the time until the stability of the voltage signal input to the AD converter 14 for each channel and the time until the AD conversion processing of the AD converter 14 is completed. can do. If the input range of each channel is known to be significantly different in advance, the stabilization time of each channel is different, so for channels that stabilize quickly, set each timing to be shorter and stabilize slightly later By setting each timing to a timing at which accuracy can be ensured for the channel, the time for measuring all the target channels can be shortened. Therefore, compared with the data collection device 24 (24a) of the first embodiment and the data collection device 24 (24b) of the second embodiment, the timing of the analog switch can be individually adjusted, and the multi-channel type used in the scanning irradiation method It is possible to speed up the collection and calculation processing of beam data from the monitor.

  In order to set each timing so that the time is shortened for a channel that stabilizes early, and to set a timing that can ensure accuracy for a channel that stabilizes a little later, for example, data in the channel setting register 18 Is added to the timing change information. The TB setting circuit 31 changes each timing based on this timing change information.

  Further, since the multiplexer 13 (13b) has the analog switch 26 having a discharge function, the remaining voltage between the AD converter 14 and the multiplexer 13 (13b) is discharged, so that current-voltage conversion caused by the remaining voltage remaining. The influence on the vessel 12 can be eliminated.

  By using the multiplexer 13 (13b) having the TB setting circuit 31 and the analog switch 26 having a discharging function, the input stability of the AD converter 14 is increased (the stabilization time is shortened), and when moving between channels, The current / voltage converter 12 can be protected at the same time.

Embodiment 4 FIG.
FIG. 11 is a diagram showing the configuration of the data collection device according to Embodiment 4 of the present invention. In the present embodiment, analog signals for each channel of the multi-channel type sensor device 22 shown in the second embodiment are combined into a group of a plurality of adjacent channels so that all the channels have a plurality of groups G ( 1) to G (n). The data collection device 24d according to the fourth embodiment is different from the data collection device 24b according to the second embodiment in that each group has an AD conversion unit 29 (29a to 29n), a selection control circuit 32 is added, and the AD conversion unit 29 has a channel selection circuit 16 (16d) with a built-in control setting register 36, and an input buffer memory 28 in the data collection arithmetic circuit 17 (17b).

  Each AD conversion unit 29 (29a to 29n) independent for each group includes a current-voltage converter 12, a multiplexer 13, an AD converter 14, and a channel selection circuit 16d. The AD conversion processing by the AD conversion units 29 (29a to 29n) of each group is configured to proceed simultaneously in parallel. The selection control circuit 32 bundles and manages the channel selection circuits 16d that are independent of each group. Specifically, the channel selection circuit 16d sets the data collection method of the AD conversion units 29 of each group at the time of maintenance work. In the group of all divided channels, time division multiplexing with different patterns can be set for each group while AD conversion processing by each group proceeds in parallel. Further, the data collection arithmetic circuit 17 (17b) takes in the digital signal output from the AD converter 14 processed simultaneously and in parallel from the groups G (1) to G (n) into the input buffer memory 28 in parallel. The operation will be described below.

  The selection control circuit 32 shown in FIG. 11 individually controls all of the channel selection circuits 16 provided independently in each group divided into a plurality of groups G (1) to G (n). The control setting register 36 sets information for changing data set in the channel setting register 18 and the scan control register 19. The data set in the control setting register 36 includes settings for normal treatment and settings used for maintenance work. For example, the control setting register 36 is configured with multiple bits so as to set collection of even channels only, collection of odd channels only, execution of a single channel repetition loop, execution of an all channel scan repetition loop, and the like.

  In the case of normal treatment, the control setting register 36 is set for normal treatment. Depending on the spot, data across multiple groups may be collected. In case of straddling a plurality of groups, the channel setting register 18 and the scan control register 19 are respectively set in the corresponding plurality of groups. The operation in the case of normal treatment is the same as in the first and second embodiments. Since the data collection device 24d of the fourth embodiment can simultaneously obtain data signals of the number of group divisions, it can be obtained from a multi-channel type monitor used in the scanning irradiation method as compared with the first and second embodiments. Beam data collection and computation processing can be speeded up.

  Next, the case of maintenance work will be described. The selection supervision circuit 32, for example, performs group A (AD) conversion processing by each group simultaneously, while the group G (1) is only an even channel, the group G (2) is only an odd channel, and the group G (3) is a single channel. One channel repetitive loop and group G (4) are controlled to perform all channel scan operation, and all groups G (1) to G (n) are controlled to perform the same scan operation and loop operation. Specifically, the selection supervising circuit 32 acquires a group setting command instructing how to collect data for each group from the CPU 21 of the data collection arithmetic circuit 17b. Upon receiving the trigger signal from the data collection arithmetic circuit 17b, the selection supervision circuit 32 performs a setting corresponding to the control setting register 36 of each group based on the contents of the group setting command. The channel selection circuit 16d of each group controls the multiplexer 13 and the AD converter 14 based on the information set in the control setting register 36.

  Since the data collection device 24d according to the fourth embodiment can change the method of data collection for each group, it is possible to perform adjacent channel leakage of the multi-channel type sensor device 22, verification of reproducibility of measurement results, and the like for each group. Therefore, maintenance work can be performed efficiently.

Embodiment 5 FIG.
FIG. 12 is a diagram showing the configuration of the data collection device according to the fifth embodiment of the present invention. The data collection device 24 (24d) of the fourth embodiment is different from the data collection device 24 (24d) in that the data collection calculation circuit 17b is changed to the data collection calculation circuit 17a and an input buffer circuit 33 is provided. The input buffer circuit 33 includes an input memory 37, a control circuit 34, and a dual port memory 35. The data collection arithmetic circuit 17a acquires from the input buffer circuit 33 digital signals output from the AD converters 14 that have been simultaneously processed in parallel from the groups G (1) to G (n).

  FIG. 13 is a diagram showing an ADC data configuration in the dual port memory, and FIG. 14 is a diagram showing a pointer configuration in the dual port memory. In the dual port memory 35, an address determined for each group number (G number) and output channel number (output CH number) is designated, and ADC output data is stored in the address. Further, as shown in FIG. 14, the dual port memory 35 has a pointer area for storing pointer information at an address other than an area for storing ADC output data. The pointer information is an updated (latest) output channel number at the end of each group (1 to N).

  Next, the operation will be described. The input buffer circuit 33 outputs the digital signal output from the AD converter 14 simultaneously processed in parallel from each group G (1) to G (n) via the interface circuit 15 of each group G (1) to G (n). Are input to the input memory 37 in parallel. The input memory 37 of the input buffer circuit 33 is individually determined as to which group of signals to be connected, so that the digital signals of the groups G (1) to G (n) are not mistaken. ing. The input memory 37 has flag information (flag bits) indicating that data has been transferred to the dual port memory 35 for each group. For example, in a 16-bit memory, a group can be assigned to each 16-bit bit of one address, and flag information of 16 groups can be stored. In addition, a header indicating a channel number is added to the ADC output data transmitted by each AD conversion unit 29. The dual port memory 35 has one port each on the input side and output side.

  The control circuit 34 reads the data stored in the input memory 37 and transfers the ADC output data (data not including the header) to the address of the corresponding group in the dual port memory 35 corresponding to the channel number indicated in the header. To do. The control circuit 34 writes flag information corresponding to the group for which transfer has been completed. The control circuit 34 sets the flag information to 1 when the ADC output data transmitted from the AD conversion unit 29 is stored in the input memory 37, and sets the flag information to 0 when the transfer is completed. In addition, a prohibition circuit is provided in order to prevent overwriting the corresponding address in which 1 is stored in the flag information. For example, each bit is input via an AND gate, and when ADC data is sent to an address where overwriting is prohibited, a busy signal is sent to the control circuit 34. In response to the busy signal, the control circuit 34 sends a processing stop signal for stopping the data processing of the AD conversion units 29 of the group corresponding to the selection control circuit 32. Upon receiving the processing stop signal, the selection control circuit 32 sends a stop command for stopping the processing to the channel selection circuit 16d of the AD conversion unit 29 of the corresponding group. Receiving the stop command, the channel selection circuit 16d stops the process until receiving the re-start command.

  When the control circuit 34 transfers the ADC data of the group that has issued the stop command to the dual port memory 35 and then sets the flag information to 0, the busy signal is released from the inhibition circuit. In response to the release of the busy signal, the control circuit 34 sends a restart command signal for resuming the data processing of the AD conversion units 29 of the group corresponding to the selection supervision circuit 32. Upon receiving the re-turn command signal, the selection supervision circuit 32 sends a re-turn command for resuming processing to the channel selection circuit 16d of the AD conversion unit 29 of the corresponding group. The channel selection circuit 16d that has received the re-start command restarts the process.

  Next, the operation of the data collection arithmetic circuit 17 will be described. When the data collection arithmetic circuit 17 reads the ADC data from the dual port memory 35, the group number (G number) and the output channel number (output CH number) are determined for each read address. It becomes possible to grasp the combination. The data collection arithmetic circuit 17 can obtain analog signal information for each channel of the multi-channel type sensor device 22 by referring to a predetermined address (memory map) of the dual port memory 35. Since the input buffer circuit 33 sequentially updates the dual port memory 35, the data collection arithmetic circuit 17 may access the dual port memory 35 at its own determined timing.

  Therefore, the data collection device 24e according to the fifth embodiment can improve the efficiency of data collection by the input buffer circuit 33 provided with the dual port memory 35 that does not collide with the input memory 37. Compared with the data collection device 24d of the fourth embodiment, beam data collection and calculation processing from a multi-channel monitor used in the scanning irradiation method can be accelerated.

  Further, when updating the dual port memory 35, the input buffer circuit 33 writes pointer information indicating which channel number was last updated in each group number in the pointer area. By referring to the pointer information, the data collection arithmetic circuit 17 can obtain information on which channel number is the latest data at a certain time.

Embodiment 6 FIG.
When calculating the beam position, beam center of gravity, etc., of the charged particle beam 1 irradiated by the particle beam irradiation device 58, continuous channel information is required simultaneously in the analog signal for each channel output from the multi-channel sensor device 22. It becomes. In the fourth and fifth embodiments, all the channels are divided into a plurality of groups G (1) to G (n) so as to form one group with a plurality of adjacent channels. When one group is composed of a plurality of channels, information on continuous channels may straddle the plurality of groups, and some data may be delayed. In this case, the arithmetic processing must be stopped (time is required for waiting for data), and the processing time becomes long. In order to solve this problem, adjacent channels are always allocated to different groups so that all channels are divided into a plurality of groups G (1) to G (n). By doing this, AD conversion processing can be performed simultaneously and in parallel on the number of adjacent channels equal to the total number of groups without stopping the arithmetic processing.

  FIG. 15 is a diagram illustrating connection between a sensor terminal and a sensor input terminal according to Embodiment 6 of the present invention. FIG. 15 is a connection example in the case where the number of sensor terminals 40 output from the multi-channel type sensor device 22 is nine and three adjacent channels are required at the same time to calculate the beam position, the beam center of gravity, and the like. . As shown in FIG. 15, by allocating adjacent one-dimensional (Xch or Ych) adjacent channels to different groups, all the necessary adjacent channels can be subjected to AD conversion processing in parallel. Calculation results such as the beam center of gravity can be obtained in a short time.

  For example, a description will be given of a case where Xch and Ych respectively use 32ch data for calculating the spot state (beam intensity, beam flatness, beam diameter, beam peak position, etc.) of the charged particle beam 1. The data collection device 24 of the fourth embodiment or the fifth embodiment uses two for Xch and Ych. Since Xch and Ych each collect 32ch data, they are divided into 32 groups and the sensor terminal 40 and the sensor input terminal 11 are connected as shown in FIG. By doing in this way, it is possible to perform AD conversion processing on all of 32ch simultaneously and in parallel for each of Xch and Ych. Therefore, the spot state can be obtained by one AD conversion processing time and calculation processing time.

  The data collection device 24 (24f) according to the sixth embodiment is faster than the data collection device 24d according to the fourth embodiment to collect beam data from a multi-channel type monitor used in the scanning irradiation method and to perform arithmetic processing. can do. Further, the data collection device 24 (24f) of the sixth embodiment performs beam data collection and calculation processing from a multi-channel type monitor used for the scanning irradiation method, as compared with the data collection device 24e of the fifth embodiment. The speed can be increased.

  Note that the contents of Embodiments 1 to 6 can be applied in combination as long as there is no contradiction. Further, although the spot scanning irradiation method has been described, the present invention can also be applied to a raster scanning irradiation method in which a charged particle beam is scanned like a single stroke without stopping. It can also be applied to an intermediate irradiation method (a method that moves the beam for each spot without stopping the beam, a hybrid scanning irradiation method) that attempts to take advantage of both the spot scanning irradiation method and the raster scanning irradiation method. .

DESCRIPTION OF SYMBOLS 1 ... Charged particle beam, 2 ... X direction scanning electromagnet, 3 ... Y direction scanning electromagnet, 8 ... Irradiation control apparatus, 9 ... Irradiation object, 13, 13a, 13b ... Multiplexer, 14 ... AD converter, 16, 16a, 16b 16c, 16d ... channel selection circuit, 17, 17a, 17b ... data collection arithmetic circuit, 18 ... channel setting register, 19 ... scan control register, 21 ... CPU, 22 ... multi-channel type sensor device, 24, 24a, 24b, 24c, 24d, 24e, 24f ... data collection device, 25 ... data memory, 26, 26xa, 26xm, 26ya, 26yn ... analog switch, 28 ... input buffer memory, 29, 29a, 29b, 29c, 29n ... AD conversion unit, 31 ... TB setting circuit, 32 ... selection control circuit, 33 ... input buffer circuit, 34 ... control Path 35 ... dual port memory 36 ... control setting register 37 ... input memory 51 ... particle beam therapy device 52 ... beam generator 54 ... synchrotron 58, 58a, 58b ... particle beam irradiation device 59 ... Beam transport system.

Claims (15)

A data acquisition device that calculates and collects the state of a charged particle beam accelerated by an accelerator and scanned by a scanning electromagnet,
A multiplexer that selects one of a plurality of channel data based on an analog signal from a multi-channel type sensor device that detects a passing position of the charged particle beam by a plurality of detection channels, and the channel data selected by the multiplexer An AD converter for converting to AD conversion data which is a digital signal, a channel selection circuit for controlling the multiplexer and the AD converter, and the plurality of AD conversion data input via the channel selection circuit It has a data collection operation circuit that calculates the state of the charged particle beam,
The channel selection circuit has a channel setting register that stores information on a selection channel to be output to the data collection arithmetic circuit among the plurality of detection channels of the multi-channel type sensor device, and based on the information on the selection channel A data collection apparatus characterized by sequentially outputting the AD conversion data of the selected channel to the data collection arithmetic circuit. A data memory for storing plan data having a plurality of target passage positions of the charged particle beam;
In response to a next data collection command from an irradiation control device that controls irradiation of the charged particle beam, the next selection channel is determined based on the next target passage position in the plan data, and is set in the channel setting register. The data collection device according to claim 1, further comprising a controller.   The channel selection circuit controls the multiplexer and the AD converter corresponding to the selected channel until the information on the selected channel in the channel setting register is newly rewritten, and converts the AD conversion data of the selected channel. 3. The data collecting apparatus according to claim 1, wherein the data collecting operation circuit sequentially repeats outputting to the data collecting arithmetic circuit.   The channel selection circuit has a scan control register for setting a start point channel and an end point channel for collecting the AD conversion data for the selected channel, and the AD conversion of a channel corresponding to the end point channel from the start point channel 4. The data collection apparatus according to claim 1, wherein data is sequentially output to the data collection arithmetic circuit. The multiplexer has a plurality of analog switches, and switches the analog switches to select one of the channel data,
5. The data collection device according to claim 1, wherein the channel selection circuit includes a time base setting circuit that controls timing for opening and closing the analog switch. The analog switch has an input terminal to which the channel data is input, an output terminal connected to the AD converter, and a GND terminal connected to a ground level.
6. The data collection apparatus according to claim 5, wherein the time base setting circuit connects the output terminal to the GND terminal when the AD converter finishes generating the AD conversion data. Dividing the plurality of detection channels of the multi-channel type sensor device into a plurality of groups;
A plurality of AD conversion units to which the analog signals in the group are input;
The AD conversion unit includes the multiplexer and the channel selection circuit,
7. The data according to claim 1, wherein the data collection arithmetic circuit includes an input buffer memory that independently stores the AD conversion data output from each of the AD conversion units. 8. Collection device. Dividing the plurality of detection channels of the multi-channel type sensor device into a plurality of groups;
A plurality of AD conversion units to which the analog signals in the group are input;
The AD conversion unit includes the multiplexer and the channel selection circuit,
7. The input conversion circuit according to claim 1, further comprising: an input buffer circuit that independently stores the AD conversion data output from each of the AD conversion units and outputs the AD conversion data to the data collection arithmetic circuit. The data collection device according to any one of the above.   The input buffer circuit includes: an input memory that independently stores the AD conversion data output from each of the AD conversion units; a dual port memory that outputs the AD conversion data to the data collection arithmetic circuit; and the input memory The data collection device according to claim 8, further comprising a control circuit that transfers the AD conversion data from the computer to the dual port memory. The input memory has a memory area in which flag information indicating that the AD conversion data of the group has been transferred to the dual port memory is stored in the dual port memory for each group,
The input buffer circuit writes data in a memory area in which the AD conversion data is stored when the AD conversion data stored in the input memory is not transferred to the dual port memory based on the flag information. The data collection device according to claim 9, further comprising a prohibition circuit that prohibits   11. The data collection device according to claim 9, wherein the dual port memory has a memory area for storing the latest channel information in which the AD conversion data is stored for each group. The channel selection circuit has a control setting register for changing data set in the channel setting register of the AD conversion unit,
A selection control circuit for setting the data in the control setting register;
12. The data collection device according to claim 7, wherein the channel selection circuit controls the multiplexer and the AD converter based on information set in the control setting register. The plurality of detection channels of the multi-channel type sensor device are divided into an X channel for detecting the X direction and a Y channel for detecting the Y direction.
13. The detection channel adjacent in the X channel is connected to the different AD conversion units, and the detection channel adjacent in the Y channel is connected to the different AD conversion units. The data collection device according to claim 1. A beam generator for generating a charged particle beam and accelerating the charged particle beam with an accelerator, a beam transport system for transporting the charged particle beam accelerated by the accelerator, and a charged particle beam transported by the beam transport system A particle beam irradiation device for irradiating an irradiation target,
The particle beam irradiation apparatus includes a scanning electromagnet that scans a charged particle beam that irradiates the irradiation target, and a data collection apparatus that calculates and collects the state of the charged particle beam scanned by the scanning electromagnet,
14. The particle beam therapy apparatus according to claim 1, wherein the data collection apparatus is the data collection apparatus according to any one of claims 1 to 13. A data collection method for calculating and collecting the state of a charged particle beam accelerated by an accelerator and scanned by a scanning electromagnet,
AD conversion data generation procedure for generating AD conversion data by converting channel data based on an analog signal from a multi-channel type sensor device that detects a passage position of the charged particle beam by a plurality of detection channels into a digital signal by an AD converter When,
A data transmission procedure for transmitting the AD conversion data generated in the AD conversion data generation procedure to a data collection arithmetic circuit;
A calculation procedure for calculating a state of the charged particle beam by a data collection calculation circuit based on the plurality of AD conversion data transmitted by the data transmission procedure,
In the AD conversion data generation procedure, the AD conversion data of the selected channel is generated based on information of a selected channel selected from the plurality of detection channels of the multi-channel sensor device. Method.

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