JP2011243137A - Reliability prediction input data generation device and reliability prediction input data generation program and recording medium - Google Patents

Abstract

PROBLEM TO BE SOLVED: To achieve a reliability setting support system in which a workload of an equipment designer is small by automatically setting input data for reliability prediction as input data of the reliability prediction model of electronic equipment from a use component list of the electronic equipment.SOLUTION: A reliability prediction input data generation device 110 comprises: a stress value table storage part 13 for storing a stress value table in which stress conditions are set by using components to be used for prescribed electronic equipment as objects; and an input data generation part 13 for inputting a use component list 11 including the information of the type of components to be used for the electronic equipment, and for generating input data 62 for reliability prediction as input data of the reliability prediction model of the electronic equipment, the input data 62 for reliability prediction being associated with the type and stress conditions by using the components to be used for the electronic equipment as objects based on the use component list 11 and the stress value table.

Description

  The present invention relates to a reliability prediction input data generation device and a reliability prediction input data generation program for generating input data to be input to a reliability prediction model.

  In the reliability design of an electronic device, the reliability of the electronic device is quantified and analyzed by calculating a reliability prediction value (failure rate) using a reliability prediction model typified by MIL-HDBK-217F. In this reliability analysis, the reliability prediction model type (for example, a resistance model, a capacitor model, etc.) for each component of the electronic device, and stress conditions applied to the component (for example, temperature stress in the usage environment, (Applied voltage stress depending on the circuit configuration) is set, calculation is performed using a reliability prediction model, and a reliability prediction value (failure rate) is derived (for example, Patent Document 1).

FIG. 8 is a block diagram showing a conventional reliability analysis method.
In FIG.
(1) The used parts list 60 describes the component parts and the used quantity of the target device.
(2) The reliability prediction input data 62 describes component information (component type, used quantity, stress setting value) constituting the device.
(3) The reliability prediction model 63 calculates a reliability prediction value.
(4) The reliability prediction value 64 is a value (failure rate) derived by the reliability prediction model 63.

  In the conventional reliability analysis, the device designer 61 creates the reliability prediction input data 62 by referring to the used parts list 60. The reliability prediction model 63 derives the reliability prediction value 64 of the electronic device from the used quantity and the stress setting value using a prediction model that matches the component type based on the description information of the reliability prediction input data 62. As the reliability prediction model 63, calculation software is commercially available, and if the reliability prediction input data 62 exists, the calculation itself can be easily performed.

JP 2006-277370 A

  In general, an electronic device is composed of an extremely large number of electronic components, for example, thousands. In the conventional reliability analysis, since the device designer 61 has to prepare the input data 62 for predicting reliability as described above, there is a problem that a burden associated with input work is very large.

  SUMMARY OF THE INVENTION An object of the present invention is to realize a reliability design support system with less work burden on a device designer by automatically generating input data for predicting reliability from a used parts list or a circuit diagram.

The input data generation device for reliability prediction according to the present invention includes:
A stress information storage unit that stores stress information in which stress conditions are set for a part used in a predetermined electronic device;
A used component list including information on the type of component used in the electronic device is input, and the reliability prediction model of the electronic device is based on the input used component list and the stress information in the stress information storage unit. And a generation unit that generates reliability prediction input data in which a type and a stress condition are associated with each other for the components used in the electronic device. It is characterized by that.

  According to the present invention, it is possible to provide a reliability design support system with less work burden on the device designer.

1 is a configuration diagram of a reliability prediction input data generation device 110 according to Embodiment 1. FIG. FIG. 6 is a diagram illustrating an operation of the reliability prediction input data generation device 110 according to the first embodiment. The block diagram of the input data generation apparatus 120 for reliability prediction in Embodiment 2. FIG. The figure which shows operation | movement of the input data generation apparatus 120 for reliability prediction in Embodiment 2. FIG. FIG. 6 is a configuration diagram of a reliability prediction input data generation device 130 in a third embodiment. FIG. 10 is a diagram illustrating an appearance of a reliability prediction input data generation device 110 according to a fourth embodiment. The figure which shows the hardware constitutions of the input data generation apparatus 110 for reliability prediction in Embodiment 4. FIG. The figure which shows a prior art.

Embodiment 1 FIG.
FIG. 1 is a diagram for explaining a reliability design support system 1010 (reliability analysis method) in the first embodiment. The reliability design support system 1010 includes a reliability prediction input data generation device 110. The reliability design support system 1010 is characterized in that the reliability prediction input data generation apparatus 110 inputs the used component list 11 and refers to a stress value table 13a (stress information) described later to input reliability prediction input data. 62 is automatically generated. The reliability design support system 1010 may be realized by a single computer or a plurality of computers (a computer that is the reliability prediction input data generation device 110 and a computer that executes the reliability prediction model 63). It may be realized with.

  In FIG. 1, the used part list 11 describes the component parts, the used quantity, the usage, and the like of the target device. Details of the used parts list 11 will be described later in the explanation of the operation.

  The reliability prediction input data generation device 110 includes an input data generation unit 12 (generation unit) and a stress value table storage unit 13 (stress information storage unit) that stores a stress value table 13a. The input data generation unit 12 generates reliability prediction input data 62 from the used component list 11. The stress value table 13a describes the stress setting according to the component type and application. Details of the stress value table 13a will be described later in the operation description.

  The flow of the reliability prediction input data 62, the reliability prediction model 63, and the reliability prediction value 64 is the same as that of the prior art described in FIG. Therefore, description of the process in which the reliability prediction model 63 calculates the reliability prediction value 64 from the reliability prediction input data 62 is omitted.

  FIG. 2 is a diagram illustrating an operation of the reliability prediction input data generation device 110 (input data generation unit 12). Next, the operation of the input data generation unit 12 will be described with reference to FIG.

(Stress value table 13a)
In many cases, the stress setting of an electronic device is uniquely determined depending on a case where an upper limit is determined as a design standard of a manufacturer or a component application in the electronic device. Therefore, the stress setting common to the device manufacturer and device application is determined in advance and stored in the stress value table 13a. In the example of the stress value table 13a in FIG. 2, the type, application, and stress setting (stress condition) of the parts used in the electronic device that is the reliability prediction target are associated with each other.

  In the reliability design support system 1010, first, the used component list 11 is input to the input data generation unit 12. In the example of the used component list 11 in FIG. 2, the used component list 11 includes information on types, quantities, and uses of components used in the electronic device to be predicted. As for the quantity, it can be seen from the used parts list 11 in FIG. 2 that the metal coating resistance of “use: pull-up” is “quantity = 2” (when attention is paid to the part numbers R001 and R002).

  As shown in FIG. 2, the input data generation unit 12 refers to the information (component type and application) described in the used component list 11 and the information (application and stress setting) described in the stress value table 13a. Then, the reliability prediction input data 62 in which the component type, the quantity, and the stress setting are described is generated. The quantity is extracted as described above. The reliability prediction value 64 can be obtained by inputting the reliability prediction input data 62 to the reliability prediction model 63.

  As illustrated in FIG. 2, the used component list 11 includes information such as a component number (a number indicating a mounting position on the board), a component type, a component model name, a manufacturer, and an application. In the stress value table 13a, the component type, application, and stress setting (stress parameters set in the reliability prediction model) are described. The input data generation unit 12 associates the used component list 11 with the stress value table 13a using the component type and application, extracts information (component type, stress setting, and used quantity) necessary for reliability prediction, and predicts reliability. Input data 62 is generated.

  As described above, the reliability prediction input data generation apparatus 110 automatically generates the reliability prediction input data 62 using the used component list 11 as an input. For this reason, it is not necessary for the device designer to create the reliability prediction input data 62, and the workload of the reliability analysis can be reduced.

Embodiment 2. FIG.
Next, a reliability design support system 1020 according to the second embodiment will be described with reference to FIGS. In the reliability design support system 1020, the configuration of the input data generation device for reliability prediction is different from that of the first embodiment. In the first embodiment, the reliability prediction input data 62 is automatically generated from the used component list 11. The reliability prediction input data generation apparatus 120 according to the second embodiment is configured to extract component usage information from a circuit diagram (electronic circuit diagram) and generate reliability prediction input data 62.

  That is, in the first embodiment, the used component list 11 includes the type and the use, but in the second embodiment, the used component list 60 (the use undescribed used component list) does not include the use. Instead, the circuit diagram 31 (circuit diagram information), which is electronic data, is input, and the component usage is extracted from the circuit diagram 31 with reference to a preset usage extraction rule.

  FIG. 3 is a diagram illustrating a configuration of the reliability prediction input data generation device 120 according to the second embodiment. As shown in FIG. 3, the reliability prediction input data generation device 120 further includes a component usage verification unit 32 and a usage extraction rule storage unit 33 that stores a usage extraction rule 33 a. The input data generation unit 12 and the component usage verification unit 32 constitute a generation unit. Other configurations are the same as those of the first embodiment.

(Part usage verification unit 32)
The component usage verification unit 32 extracts component usage information from the circuit diagram 31 and generates a reliability prediction component list 34. Here, the “circuit diagram 31” is an electronic circuit diagram (circuit diagram information) of the electronic device to be predicted. In the circuit diagram 31, an attribute including the type of each component used in the electronic device and a connection relationship (wiring information) between the components are defined. The component attributes include, for example, the type of a resistor or a capacitor, characteristics such as a resistance value, and a component number. The circuit diagram 31 will be described later with reference to FIG.

(Usage extraction rule 33a)
The usage extraction rule 33a describes a rule for extracting a component usage from the wiring information of the circuit diagram 31. The usage extraction rule 33a will be described later with reference to FIG. The component usage verification unit 32 extracts the usage because the usage is not described in the used component list 60 as described above.

  FIG. 4 is a diagram illustrating an operation of the reliability prediction input data generation device 120 (component application verification unit 32). The operation will be described with reference to FIG.

  As shown in FIG. 4, usage information is not described in the used component list 60. That is, the used component list 60 does not have an item “use” as compared to the used component list 11 of FIG. Therefore, the component usage verification unit 32 extracts the usage of the component from the wiring information of the circuit diagram 31 and adds it to the reliability prediction component list 34. The “use” of the part used in the electronic device can be determined from the wiring information of each part. For example, when one terminal of a certain resistor component is connected to a signal and the other terminal is connected to a power supply, the use of the resistor can be determined to be for pull-up. Such a determination rule is defined in advance and set in the use extraction rule 33a.

(Use extraction process)
The use extraction process will be described below. First, wiring information of the circuit diagram 31 (for example, a signal connection information file of the circuit diagram CAD) is input to the component application verification unit 32. The component usage verification unit 32 extracts the terminal connection state of each component from the wiring information of the circuit diagram 31 and compares it with the usage extraction rule 33a to derive the usage of each component. From the derived component usage and information (part number, component type) of the used component list 60, a reliability prediction component list 34 in which the component number, component type, and usage are described is generated. Similar to the used component list 11 of the first embodiment, the reliability prediction component list 34 includes information on types, uses, and quantities regarding the components. By inputting the reliability prediction component list 34 to the input data generation unit 12, the confidence input data generation unit 12 generates the reliability prediction input data 62.

  Since the component usage is not described in the used component list 60, the usage is extracted from the circuit diagram 31. Specifically, the usage is extracted as follows. The component usage verification unit 32 identifies the component usage for each component constituting the device using the circuit diagram 31, the used component list 60, and the usage extraction rule 33a. For example, the resistor “R001” in the circuit diagram 31 in FIG. 4 is a connection form in which one terminal is connected to a signal and the other terminal is connected to a power source. Further, it can be seen from the used parts list 60 that “R001” is a metal film resistance. The component usage collation unit 32 collates this information with the usage extraction rule 33a, and searches for a component that matches the component type and the connection form. In this example, no. Since the rule of 2 is applicable, the use of the resistor R001 can be specified as pull-up. In this way, the component usage collation unit 32 identifies “uses” of all the components that make up the device, and generates a reliability prediction component list 34 that describes the component number, component type, and usage information.

  As described above, the reliability prediction input data generation apparatus 120 according to the second embodiment determines the component usage of the circuit diagram 31 when the usage information is not described in the used component list 60, and predicts the reliability. Parts list 34 and reliability prediction input data 62 are automatically generated. For this reason, it is not necessary for the device designer to create the reliability prediction input data 62, and the workload of the reliability analysis can be reduced.

Embodiment 3 FIG.
In the second embodiment, the component application verification unit 32 and the input data generation unit 12 are separated from each other, and after the reliability prediction component list 34 is generated from the circuit diagram 31 and the used component list 60. In this configuration, the reliability prediction input data 62 is generated. On the other hand, the third embodiment is configured to integrate the component usage verification unit 32 and the input data generation unit 12 and directly generate the reliability prediction input data 62 from the circuit diagram 31 and the used component list 60.

  FIG. 5 is a diagram illustrating a configuration of the reliability design support system 1030 according to the third embodiment. The reliability design support system 1030 includes a reliability prediction input data generation device 130. In the reliability prediction input data generation device 130, the component usage verification unit 32 and the input data generation unit 12 of the reliability prediction input data generation device 120 are integrated as a component usage verification / input data generation unit 51 (generation unit). It is a configuration.

  In FIG. 5, a component usage collation / input data generation unit 51 receives the circuit diagram 31 and the used component list 60 as input, and generates reliability prediction input data 62 based on the usage extraction rule 33a and the stress value table 13a. . The operation is the same as that of the reliability prediction input data generation device 120.

  The component application verification / input data generation unit 51 generates the reliability prediction input data 62 from the circuit diagram 31 and the used component list 60 by executing the processing shown in FIGS. The reliability prediction value 64 can be obtained by inputting the reliability prediction input data 62 to the reliability prediction model 63.

Embodiment 4 FIG.
In the fourth embodiment, a hardware configuration of a reliability prediction input data generation apparatus 110 that is a computer will be described.
FIG. 6 is a diagram illustrating an example of the appearance of the reliability prediction input data generation device 110 that is a computer. Since the reliability prediction input data generation devices 120 and 130 of the second and third embodiments are also computers having the same appearance and hardware configuration as the reliability prediction input data generation device 110, the reliability prediction input data The description of the reliability prediction input data generation device 110 is applied to the generation devices 120 and 130 as they are.

  In FIG. 6, the reliability prediction input data generation device 110 includes a system unit 830, a display device 813 having a CRT (Cathode / Ray / Tube) or LCD (liquid crystal) display screen, a keyboard 814 (Key / Board: K / B), hardware resources such as a mouse 815, an FDD 817 (Flexible Disk Drive), a compact disk device 818 (CDD: Compact Disk Drive), a printer 819, and the like, which are connected by cables and signal lines. The system unit 30 is connected to the network via the network.

FIG. 7 is a diagram illustrating hardware resources of the reliability prediction input data generation apparatus 110.
The reliability prediction input data generation device 110 includes a CPU 810 (Central Processing Unit) that executes a program. The CPU 810 is connected to a ROM (Read Only Memory) 811, a RAM (Random Access Memory) 812, a display device 813, a keyboard 814, a mouse 815, a communication board 816, an FDD 817, a CDD 818, a printer device 819, and a magnetic disk device 820 via a bus 825. And control these hardware devices. Instead of the magnetic disk device 820, a storage device such as an optical disk device or a flash memory may be used.

  The RAM 812 is an example of a volatile memory. Storage media such as the ROM 811, the FDD 817, the CDD 818, and the magnetic disk device 820 are examples of nonvolatile memories. These are examples of a “storage device” or a storage unit, a storage unit, and a buffer. The communication board 816, the keyboard 814, the FDD 817, and the like are examples of an input unit and an input device. The communication board 816, the display device 813, the printer device 819, and the like are examples of an output unit and an output device.

  The communication board 816 is connected to a network (such as a LAN). The communication board 816 may be connected not only to the LAN but also to a WAN (wide area network) such as the Internet or ISDN.

  The magnetic disk device 820 stores an operating system 821 (OS), a window system 822, a program group 823, and a file group 824. The programs in the program group 823 are executed by the CPU 810, the operating system 821, and the window system 822.

  The program group 823 stores programs that execute the functions described as “˜units” in the description of the above embodiments. The program is read and executed by the CPU 810.

  In the file group 824, the information described as the stress value table and the use extraction rule in the description of the above embodiment, “determination result”, “calculation result”, “extraction result”, “ Information described as “generation results of” and “processing results of”, data, signal values, variable values, parameters, and the like are stored as items of “˜file” and “˜database” (DB). . The “˜file” and “˜database” are stored in a recording medium such as a disk or a memory. Information, data, signal values, variable values, and parameters stored in a storage medium such as a disk or memory are read out to the main memory or cache memory by the CPU 810 via a read / write circuit, and extracted, searched, referenced, compared, and calculated. Used for CPU operations such as calculation, processing, output, printing, and display. Information, data, signal values, variable values, and parameters are temporarily stored in the main memory, cache memory, and buffer memory during the CPU operations of extraction, search, reference, comparison, operation, calculation, processing, output, printing, and display. Is remembered.

  In the description of the embodiment described above, data and signal values are stored in the memory of the RAM 812, the flexible disk of the FDD 817, the compact disk of the CDD 818, the magnetic disk of the magnetic disk device 820, other optical disks, mini disks, DVDs (Digital). -It records on recording media, such as Versatile and Disk. Data and signals are transmitted on-line via the bus 825, signal lines, cables, and other transmission media.

  In the above description of the embodiment, what has been described as “to part” may be “to means”, “to circuit”, and “to device”, and “to step” and “to”. “Procedure” and “˜Process” may be used. That is, what has been described as “˜unit” may be realized by firmware stored in the ROM 811. Alternatively, it may be implemented only by software, or only by hardware such as elements, devices, substrates, and wirings, by a combination of software and hardware, or by a combination of firmware. Firmware and software are stored as programs in a recording medium such as a magnetic disk, a flexible disk, an optical disk, a compact disk, a mini disk, and a DVD. The program is read by the CPU 810 and executed by the CPU 810. That is, the program causes the computer to function as the “˜unit” described above. Or a program makes a computer perform the procedure and method of "to part" described above.

  In the above embodiment, the reliability prediction input data generation device has been described. However, the operation of the reliability prediction input data generation device is performed in accordance with the reliability prediction input data generation method or the reliability prediction input data generation. It can also be grasped as a recording medium on which a program or a reliability prediction input data generation program is recorded.

  1010, 1020, 1030 Reliability design support system, 110, 120, 130 Reliability prediction input data generation device, 11 Used component list, 12 Input data generation unit, 13 Stress value table storage unit, 13a Stress value table, 31 circuit Figure, 32 Component usage verification unit, 33 Usage extraction rule storage unit, 33a Usage extraction rule, 34 Reliability prediction component list, 51 Component usage verification / input data generation unit, 60 Used component list, 61 Device designer, 62 Trust Degree prediction input data, 63 reliability prediction model, 64 reliability prediction value.

Claims (6)

A stress information storage unit that stores stress information in which stress conditions are set for a part used in a predetermined electronic device;
A used component list including information on the type of component used in the electronic device is input, and the reliability prediction model of the electronic device is based on the input used component list and the stress information in the stress information storage unit. And a generation unit that generates reliability prediction input data in which a type and a stress condition are associated with each other for the components used in the electronic device. A reliability prediction input data generation apparatus characterized by the above. The stress information storage unit
Storing the stress information in which the type, application, and stress condition of the component used in the electronic device are associated;
The generator is
Input the used parts list including information on the type, quantity and usage of parts used in the electronic device, and based on the input used parts list and the stress information in the stress information storage unit, 2. The reliability prediction input data generation apparatus according to claim 1, wherein the reliability prediction input data in which a stress condition and a quantity are associated with each other is generated. The input data generating device for predicting reliability further includes:
Circuit diagram information indicating an electronic circuit diagram of the electronic device, wherein the attribute including the type of each component used in the electronic device and the connection relationship between the components are defined from the circuit diagram information. A use extraction rule storage unit for storing a use extraction rule for extracting a use;
The generator is
The application extraction includes the information on the type and quantity of the parts used in the electronic device, and the application unusable used component list not including the application information, and the circuit diagram information of the electronic device, and the application extraction By extracting the usage of the component from the circuit diagram information by referring to the usage extraction rule of the rule storage unit, the extracted usage, the input usage-unused used component list, the stress information of the stress information storage unit, The reliability prediction input data generation device according to claim 1, wherein the reliability prediction input data is generated based on the data. The usage extraction rule storage unit is
Storing the use extraction rule in which the type of component, the connection form, and the use are associated;
The generator is
4. The reliability prediction input data generation according to claim 3, wherein the use of the component is extracted from the connection relation between the components in the circuit diagram information by using the connection form of the use extraction rule as a key. apparatus. Computer
A stress information storage unit for storing stress information in which stress conditions are set for a part used in a predetermined electronic device;
A used component list including information on the type of component used in the electronic device is input, and the reliability prediction model of the electronic device is based on the input used component list and the stress information in the stress information storage unit. A generation unit that generates reliability prediction input data in which a type and a stress condition are associated with each other for a component used in the electronic device,
An input data generation program for predicting reliability, which is characterized by functioning as:   A computer-readable recording medium on which the reliability prediction input data generation program according to claim 5 is recorded.

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