JP2011232612A - Inspection system - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an inspection system which inspects efficiently and in detail whether a voltage is normally applied from a plurality of terminals or not.SOLUTION: The inspection system 20 comprises a control part 50 and an inspection jig 52. The control part 50 includes an attachment part 31, a first potential generation circuit 63, a second potential generation circuit 65 and a CPU (an example of detector) 61. The inspection jig 52 includes a input/output part 59, a third potential generation circuit 70 and a fourth potential generation circuit 71. The third potential generation circuit 70 outputs a ground potential to a terminal 58 when an SR terminal 55 and a terminal 57 are connected. The fourth potential generation circuit 71 outputs a bias potential of zener diode D2 to the terminal 58 when the SR terminal 55 and the terminal 57 are not connected. A second potential generation circuit 64 applies a second potential to a DEV terminal 56 when the ground potential and the bias potential are not applied to the DEV terminal 56.

Description

  The present invention relates to an inspection system, and more particularly to a technique for inspecting an apparatus main body excluding an image forming unit from an image forming apparatus.

  Conventionally, an image forming apparatus has been used. Some image forming apparatuses form an image forming apparatus by separately manufacturing an image forming unit for forming an image and an apparatus main body, and detachably mounting the image forming unit on a mounting portion of the apparatus main body. . In such an image forming apparatus, a plurality of terminals for supplying power (applying a potential) to the image forming unit may be formed in the mounting portion of the apparatus main body. 2. Description of the Related Art Conventionally, a technique for determining whether or not potential application from a plurality of terminals provided in a mounting unit to the image forming unit is normally performed before mounting the image forming unit in the mounting unit is known. (For example, patent document 1). In this technique, an inspection jig is mounted on the mounting portion instead of the image forming unit, and the potential of the terminal of the mounting portion in this state is detected. And based on the detected electric potential, it is test | inspected whether the electric potential application from each terminal is made normally.

JP 2008-089680 A

  In the technique of Patent Document 1, in order to efficiently determine whether or not voltage application from a plurality of terminals is normally performed, for example, a transistor element is prepared in an inspection jig, and one terminal is connected to the gate of the transistor element. The other terminal is connected to one main electrode of the transistor element while being connected to the electrode. In addition, when the other main electrode of the transistor element is connected to the ground potential, and voltage is normally applied from both terminals, a current flows between the other terminal and the ground potential via the transistor element. Set it. By detecting whether or not a current flows through the transistor element by using a change in the potential of the other terminal or the like, it is possible to efficiently check whether or not voltage application from both terminals is normally performed.

  However, in the technique of Patent Document 1, when the potential application from one of the terminals is not performed normally, or when the potential application from both terminals is not performed normally, current does not flow through the transistor element. The state of can not be distinguished. Even when a plurality of terminals are determined efficiently, it is necessary to inspect whether or not potential application from each terminal is normally performed.

  The present invention has been completed based on the above circumstances, and provides a technique for efficiently and inspecting whether or not voltage application from a plurality of terminals is normally performed. Objective.

The present invention relates to an inspection system configured by connecting an inspection jig to an apparatus main body obtained by removing an image forming unit from an image forming apparatus.
In the first invention, the apparatus main body includes a mounting portion, a first potential generation circuit, a second potential generation circuit, and a detection portion. The mounting unit is detachably mounted with the image forming unit and includes a first terminal and a second terminal. The first potential generation circuit applies a first voltage to the first terminal. The detection unit detects the potential of the second terminal. The inspection jig includes an input / output unit, a third potential generation circuit, and a fourth potential generation circuit. The input / output unit includes a third terminal connected to the first terminal and a fourth terminal connected to the second terminal. The third potential generation circuit outputs the first output potential to the fourth terminal when the first potential is applied to the third terminal. The fourth potential generation circuit outputs the second output potential to the fourth terminal when the first potential is not applied to the third terminal. Here, “the first potential is not applied to the third terminal” not only means that the first potential is not applied to the third terminal due to poor contact between the first terminal and the third terminal, but also to the first terminal in the first place. This includes the case where the first potential is not applied. The second potential generation circuit applies the second potential to the second terminal when the first output potential and the second output potential are not applied to the second terminal, and the second potential is equal to the first output potential and the second output potential. A potential different from the second output potential is set.

In this invention, by detecting the potential of the second terminal using the detection unit, it is possible to simultaneously check whether or not the voltage application from the first terminal and the second terminal is normally performed, and a plurality of terminals It is possible to efficiently determine whether or not voltage application from is normally performed.
The present invention further includes a third potential generating circuit, wherein the first terminal and the third potential are normally connected, and the second terminal and the fourth potential are normally connected. One potential is applied, and the first output potential is applied to the second terminal via the fourth terminal. In addition, a fourth potential generation circuit is provided, and the first terminal is not normally connected to the third potential, the second terminal is normally connected to the fourth potential, and the first potential is applied to the third terminal. The second output potential is applied to the second terminal via the fourth terminal without being applied. A second potential generation circuit is provided, and the second potential is applied to the second terminal in a third state where the second terminal and the fourth potential are not normally connected. Therefore, the first state, the second state, and the third state can be discriminated by detecting the potential of the second terminal, and whether or not the voltage application from the plurality of terminals is normally performed is inspected in detail. be able to.

  A second potential generation circuit according to a second aspect of the invention includes a first constant voltage element that maintains a potential difference between the potential of the first terminal and the potential of the second terminal at the first potential difference. Further, the inspection jig of the second invention includes a fifth potential generation circuit. The inspection jig of the second invention includes a fifth potential generation circuit, and the fifth potential generation circuit applies the first potential to the third terminal and does not apply the first output potential to the second terminal. In this case, the third output potential is output to the second terminal via the first constant voltage element. When the first output potential and the second output potential are not applied to the second terminal, the second potential generation circuit is configured when the first output potential, the second output potential, and the third output potential are not applied to the second terminal. The second potential is applied to the second terminal, and the third output potential is set to a potential different from any of the first output potential, the second output potential, and the second potential.

  In the present invention, a fifth potential generation circuit is provided, and in the fourth state in which the first terminal and the third terminal are normally connected among the third states in which the second terminal and the fourth potential are not normally connected, A third output potential is applied to the second terminal via the constant voltage element. In the fifth state in which the first terminal and the third terminal are not normally connected, the second potential is still applied to the second terminal. Therefore, the first state, the second state, the fourth state, and the fifth state can be distinguished by detecting the potential of the second terminal, and whether or not the voltage application from the plurality of terminals is normally performed. Can be inspected in detail.

The apparatus main body of the third invention includes a determination unit. The first output potential, the second output potential, and the second potential, which are different from each other, are set so as to increase in this order, and the determination unit sets the potential between the first output potential and the second output potential. And a second threshold potential set to a potential between the second output potential and the second potential. The determination unit of the second invention makes the following determination using the first threshold potential and the second threshold potential.
(1) When the detection potential detected by the detection unit is lower than the first threshold potential, the first terminal and the third terminal are connected, and the second terminal and the fourth terminal are connected. Is determined.
(2) When the detection potential is equal to or higher than the first threshold potential and lower than the second threshold potential, the first terminal and the third terminal are not connected and the second terminal and the fourth terminal are connected. It is determined that
(3) When the detected potential is equal to or higher than the second threshold potential, it is determined that the second terminal and the fourth terminal are not connected.
Note that “high” and “low” here indicate a magnitude relationship between absolute values and do not necessarily match the magnitude relationship between potentials. That is, according to the present invention, the “high” potential is greater than the “low” potential on the positive potential side, and the “low” potential is greater than the “high” potential on the negative potential side.
In the present invention, since the determination unit has the first threshold potential and the second threshold potential, the first state, the second state, and the third state can be reliably determined from the detected potential of the second terminal. Can do.

  In the inspection system according to the fourth aspect of the invention, the third potential generation circuit performs switching in which the control electrode is connected to the third terminal, one main electrode is connected to the fourth terminal, and the other main electrode is connected to the reference potential. It is comprised using an element. The fourth potential generation circuit has one main electrode connected to the fourth terminal, the other main electrode connected to the reference potential, and generates a third potential at the fourth terminal that is higher than the reference potential by the second potential difference. A possible second constant voltage element is used. The first potential is set to a potential that turns on the switching element. According to this inspection system, it is possible to inspect whether or not voltage application from a plurality of terminals is normally performed.

The apparatus main body of 5th invention is equipped with the determination part. In addition, the first output potential, the second output potential, the third output potential, and the second potential, which are different from each other, are set so as to increase in this order, and the determination unit determines whether the first output potential and the second output potential are the same. A first threshold potential set to a potential between them, a third threshold potential set to a potential between the second output potential and the third output potential, and a potential between the third output potential and the second potential. Has a fourth threshold potential. The determination unit of the fifth invention makes the following determination using the first threshold potential, the second threshold potential, and the third threshold potential.
(1) When the detected potential detected is lower than the first threshold potential, it is determined that the first terminal and the third terminal are connected and the second terminal and the fourth terminal are connected. .
(2) When the detection potential is equal to or higher than the first threshold potential and lower than the third threshold potential, the first terminal and the third terminal are not connected, and the second terminal and the fourth terminal are connected. It is determined that
(3) When the detected potential is equal to or higher than the third threshold potential and lower than the fourth threshold potential, the first terminal and the third terminal are connected, and the second terminal and the fourth terminal are connected. Judge that it is not.
(4) When the detected potential is equal to or higher than the fourth threshold potential, it is determined that the first terminal and the third terminal are not connected and the second terminal and the fourth terminal are not connected.
Note that “high” and “low” here indicate a magnitude relationship between absolute values and do not necessarily match the magnitude relationship between potentials. That is, according to the present invention, the “high” potential is greater than the “low” potential on the positive potential side, and the “low” potential is greater than the “high” potential on the negative potential side.
In the present invention, since the determination unit has the first threshold potential, the second threshold potential, and the third threshold potential, the first state, the second state, and the fourth state are determined from the detected potential of the second terminal. The fifth state can be reliably determined.

  In the inspection system according to the sixth aspect of the invention, the third potential generation circuit performs switching in which the control electrode is connected to the third terminal, one main electrode is connected to the fourth terminal, and the other main electrode is connected to the reference potential. It is comprised using an element. The fourth potential generation circuit has one main electrode connected to the fourth terminal, the other main electrode connected to the reference potential, and generates a third potential at the fourth terminal that is higher than the reference potential by the second potential difference. A possible second constant voltage element is used. Further, the first constant voltage element has one main electrode connected to the first terminal, the other main electrode connected to the second terminal, and the potential of the second terminal is set to a first potential difference from the potential of the first terminal. A constant voltage element capable of generating a low potential is used. The fifth potential generation circuit can generate a fourth potential that is higher by the third potential difference than the reference potential at the third terminal, with one main electrode connected to the third terminal and the other main electrode connected to the reference potential. The third constant voltage element is used. The first potential and the fourth potential are set to potentials that turn on the switching element, and the third output potential is a fifth potential that is lower than the fourth potential by the first potential difference. According to this inspection system, it is possible to inspect whether or not voltage application from a plurality of terminals is normally performed.

  A second potential generation circuit according to a seventh aspect includes an adjustment element capable of adjusting the second potential. The second potential is used to determine the connection state of each terminal of the mounting portion when configuring the inspection system, and is used to operate the image forming unit when configuring the image forming apparatus. As described above, if the target to which the second potential is applied is different, the required potential may be different. Further, even in the same inspection jig or image forming unit, the required potential may differ depending on the environment in which the apparatus main body is arranged. In the present invention, by including the adjusting element capable of adjusting the second potential, a potential suitable for each case can be applied.

An eighth invention relates to another type of inspection system configured by connecting an inspection jig to an apparatus main body obtained by removing an image forming unit from an image forming apparatus.
An apparatus main body according to an eighth aspect includes a mounting portion, a first potential generation circuit, a second potential generation circuit, a first control portion, a second control portion, a first detection portion, and a second detection portion. The mounting unit is detachably mounted with the image forming unit and includes a first terminal and a second terminal. The first potential generation circuit has a first electrode and a second electrode. The first electrode is connected to the first terminal and the second terminal. The second electrode is connected to a reference potential. The first potential generation circuit generates a first potential higher than a reference potential at the first electrode. The second potential generation circuit has a third electrode and a fourth electrode. The third electrode is connected to the first terminal and the second terminal. The fourth electrode is connected to the reference potential. The second potential generation circuit generates a second potential lower than the reference potential on the third electrode. The first control unit controls the first potential generation circuit to apply the first potential to the first terminal and the second terminal. The second control unit controls the second potential generation circuit to apply the second potential to the first terminal and the second terminal. The first detection unit detects the potential of the first terminal. The second detection unit detects the potential of the second terminal.

  An inspection jig according to an eighth aspect includes an input / output unit, a first rectifier element, and a second rectifier element. The input / output unit includes a third terminal connected to the first terminal and a fourth terminal connected to the second terminal. The first rectifying element is connected between the third terminal and the reference potential, and prohibits a current from flowing from the third terminal to the reference potential. The second rectifier element is connected between the fourth terminal and the reference potential, and inhibits current from flowing from the reference potential to the fourth terminal.

In this invention, a 1st terminal can be test | inspected using a 1st test | inspection part, and a 2nd terminal can be test | inspected using a 2nd test | inspection part. For example, whether or not voltage application from each terminal is normally performed even when terminals are mutually related, such as a closed circuit configured using a plurality of terminals, and individual inspection is difficult. It can be inspected efficiently.
In the present invention, the first rectifying element that prohibits the current from flowing from the third terminal to the reference potential and the second rectifying element that prohibits the current from flowing from the reference potential to the fourth terminal are connected. When the first control unit applies the first potential, no current flows between the first terminal and the reference potential regardless of whether the first terminal and the third terminal are connected. On the other hand, when the second terminal and the fourth terminal are connected, a current flows between the second terminal and the reference potential, and the second detection potential is lowered to the reference potential. Therefore, by detecting the potential of the second terminal, it is determined whether or not the second terminal and the fourth terminal are connected regardless of whether or not the first terminal and the third terminal are connected. Can be determined. In addition, when the second control unit applies the second potential, no current flows between the second terminal and the reference potential regardless of whether or not the second terminal and the fourth terminal are connected. On the other hand, when the first terminal and the third terminal are connected, a current flows between the first terminal and the reference potential, and the first detection potential rises to the reference potential. Therefore, by detecting the potential of the first terminal, it is determined whether or not the first terminal and the third terminal are connected regardless of whether or not the second terminal and the fourth terminal are connected. Can be determined. Accordingly, it is possible to inspect whether or not voltage application from a plurality of terminals to the image forming unit is performed normally.

An apparatus body according to a ninth aspect includes a first determination unit and a second determination unit. The first determination unit has a first threshold potential set to a potential between the reference potential and the second potential. The second determination unit has a second threshold potential set to a potential between the first potential and the reference potential.
The first determination unit performs the following determination using the first threshold potential.
(1) When the second control unit applies the second potential, it is determined that the first terminal and the third terminal are connected when the first detection potential is equal to or higher than the first threshold potential.
(2) When the second control unit applies the second potential, it is determined that the first terminal and the third terminal are not connected when the first detection potential is lower than the first threshold potential.
The second determination unit performs the following determination using the second threshold potential.
(3) When the first control unit applies the first potential, it is determined that the second terminal and the fourth terminal are not connected when the second detection potential is equal to or higher than the second threshold potential.
(4) When the first control unit applies the first potential and the second detection potential is lower than the second threshold potential, it is determined that the second terminal and the fourth terminal are connected.

  In this invention, since the 1st determination part has the 1st threshold potential, it can test | inspect reliably the connection state of a 1st terminal and a 3rd terminal. In addition, since the second determination unit has the second threshold potential, the connection state between the second terminal and the fourth terminal can be reliably inspected.

A tenth aspect of the invention relates to another type of inspection system configured by connecting an inspection jig to an apparatus main body obtained by removing an image forming unit from an image forming apparatus.
An apparatus main body according to a tenth aspect includes a mounting portion, a first potential generation circuit, a second potential generation circuit, a first control portion, a second control portion, a first detection portion, and a second detection portion. The mounting unit is detachably mounted with the image forming unit and includes a first terminal and a second terminal. The first potential generation circuit has a first electrode and a second electrode. The first electrode is connected to the first terminal. The second electrode is connected to the second terminal and a reference potential. The first potential generation circuit generates a first potential higher than a reference potential at the first electrode. The second potential generation circuit has a third electrode and a fourth electrode. The third electrode is connected to the first terminal and the second terminal. The fourth electrode is connected to the reference potential. The second potential generation circuit generates a second potential lower than the reference potential on the third electrode. The first control unit controls the first potential generation circuit to apply the first potential to the first terminal. The second control unit controls the second potential generation circuit to apply the second potential to the first terminal and the second terminal. The first detection unit detects the potential of the first terminal. The second detection unit detects the potential of the second terminal.

  An inspection jig according to a tenth invention includes an input / output unit and a first rectifying element. The input / output unit includes a third terminal connected to the first terminal and a fourth terminal connected to the second terminal. The first rectifying element is connected between the third terminal and the reference potential, and inhibits current from flowing from the reference potential to the third terminal. The fourth terminal is connected to the reference potential.

In this invention, a 1st terminal can be test | inspected using a 1st test | inspection part, and a 2nd terminal can be test | inspected using a 2nd test | inspection part. For example, whether or not voltage application from each terminal is normally performed even when terminals are mutually related, such as a closed circuit configured using a plurality of terminals, and individual inspection is difficult. It can be inspected efficiently.
In the present invention, the first rectifying element that prohibits the current from flowing from the reference potential to the third terminal is connected. When the first control unit applies the first potential, the first terminal is connected to the third terminal regardless of whether the second terminal is connected to the fourth terminal or not. A current flows between the first terminal and the third terminal, and the first detection potential decreases to the reference potential. Therefore, by detecting the potential of the first terminal, it is determined whether or not the first terminal and the third terminal are connected regardless of whether or not the second terminal and the fourth terminal are connected. Can be determined. Further, when the second control unit applies the second potential, no current flows between the first terminal and the reference potential regardless of whether the first terminal and the third terminal are connected. On the other hand, when the second terminal and the fourth terminal are connected, a current flows between the second terminal and the reference potential, and the second detection potential rises to the reference potential. Therefore, by detecting the potential of the second terminal, it is determined whether or not the second terminal and the fourth terminal are connected regardless of whether or not the first terminal and the third terminal are connected. Can be determined. Accordingly, it is possible to inspect whether or not voltage application from a plurality of terminals to the image forming unit is performed normally.

An apparatus main body according to an eleventh aspect includes a first determination unit and a second determination unit. The first determination unit has a first threshold potential set to a potential between the first potential and the reference potential. The second determination unit has a second threshold potential set to a potential between the reference potential and the second potential.
The first determination unit performs the following determination using the first threshold potential.
(1) When the first control unit applies the first potential, it is determined that the first terminal and the third terminal are not connected when the first detection potential is equal to or higher than the first threshold potential.
(2) When the first control unit applies the first potential, it is determined that the first terminal and the third terminal are connected when the first detection potential is lower than the first threshold potential.
The second determination unit performs the following determination using the second threshold potential.
(3) When the second control unit applies the second potential, it is determined that the second terminal and the fourth terminal are connected when the second detection potential is equal to or higher than the second threshold potential.
(4) When the second control unit applies the second potential, it determines that the second terminal and the fourth terminal are not connected if the second detection potential is lower than the second threshold potential.

  In this invention, since the 1st determination part has the 1st threshold potential, it can test | inspect reliably the connection state of a 1st terminal and a 3rd terminal. In addition, since the second determination unit has the second threshold potential, the connection state between the second terminal and the fourth terminal can be reliably inspected.

  ADVANTAGE OF THE INVENTION According to this invention, it can test | inspect efficiently and in detail whether the voltage application from a some terminal is made normally.

Side sectional view of the printer 10 Circuit diagram of inspection system 20 Judgment table of inspection system 20 Circuit diagram of inspection system 120 Judgment table of inspection system 120 Circuit diagram of inspection system 220 Judgment table of inspection system 220 Circuit diagram of conventional inspection system 320 Determination table of conventional inspection system 320 Circuit diagram of inspection system 420 Circuit diagram of inspection system 520 Circuit diagram of inspection system 620 Circuit diagram of inspection system 720

<Embodiment 1>
Embodiment 1 of the present invention will be described with reference to FIGS. 1 to 3.
1. Overall Configuration of Printer FIG. 1 is a side sectional view showing a schematic configuration of a printer 10 (an example of an image forming apparatus) according to the present embodiment. In the following description, the left side in FIG. The printer 10 is an LED color printer that forms a color image with four colorants (black K, yellow Y, magenta M, and cyan C). Hereinafter, when distinguishing each component for each color, It is assumed that K (black), Y (yellow), M (magenta), and C (cyan) meaning each color are added to the end of the reference numerals of the component parts. Further, the printer 10 is not limited to an LED color printer, and may be a laser color printer, a facsimile machine, a so-called multifunction machine having a printer function and a reading function (scanner function), or the like.

  The printer 10 includes a main casing 3, and a supply tray 7 on which sheets 5 serving as recording media are stacked is provided at the bottom of the main casing 3. An upper cover 3A is provided on the upper surface of the main casing 3 so as to be openable and closable around the rear end.

  A paper feed roller 9 is provided above the front end of the supply tray 7, and the uppermost sheet 5 stacked in the supply tray 7 is sent out to the registration roller 11 as the paper feed roller 9 rotates. The registration roller 11 performs the skew correction of the paper 5 and then conveys the paper 5 onto the belt unit 15 of the image forming unit 13.

The image forming unit 13 includes a belt unit 15, an exposure unit 17, a process unit 19, a fixing unit 21, and the like.
The belt unit 15 includes a pair of front and rear belt support rollers 23 and a belt 25. When the rear belt support roller 23 is driven to rotate, the belt 25 circulates in a clockwise direction on the paper surface, and the paper 5 on the upper surface of the belt 25 is conveyed backward. Further, on the inner side of the belt 25, transfer rollers 29 are provided at positions opposed to respective photosensitive drums 27 of the process unit 19, which will be described later, with the belt 25 interposed therebetween.

  The exposure unit 17 includes four LED units 17 corresponding to the respective colors. Each LED unit 17 has an LED head 18 at its lower end, and its upper end is supported on the lower surface of the upper cover 3A. The LED head 18 has a plurality of light emitting units made of LEDs arranged in the left-right direction. Each light emitting unit is controlled to emit light based on the image data to be formed, whereby the light emitted from each light emitting unit is irradiated onto the surface of the photosensitive drum 27, and the surface is exposed.

  The process unit 19 includes four process cartridges (an example of an image forming unit: hereinafter, simply referred to as “cartridge”) 33 corresponding to the four colors, and a mounting unit 31 to which each cartridge 33 is mounted. . The cartridge 33 includes a monochrome cartridge 33K and color cartridges 33Y, 33M, and 33C.

  The monochrome cartridge 33K includes a photosensitive drum 27, a high-resistance photosensitive drum 27, a charger 37, a drum cleaning roller 34, and a paper dust removing cleaning roller 35, the surface of which is covered with a positively charged photosensitive layer. A developing cartridge 40K is provided at the top.

  A high roller potential DCLNA is applied to the drum cleaning roller 34, and the toner remaining on the photosensitive drum 27 is collected by the application of the roller potential DCLNA. The roller potential DCLNA includes a roller potential DCLNA (+) that is a positive potential and a roller potential DCLNA (−) that is a negative potential.

  The paper dust removal cleaning roller 35 is made of a conductive metal, and removes paper dust on the drum cleaning roller 34 by applying a shaft potential CLNB that is higher than the roller potential DCLNA. That is, the paper dust removal cleaning roller 35 removes the paper dust mixed in the main body casing 3 using the shaft potential CLNB.

  Normally, the toner is charged positively and the paper dust is negatively charged. Therefore, the toner and the paper dust are individually removed from the photosensitive drum 27 using the difference in the polarity of charging. During printing, a negative potential, for example, a roller potential DCLNA (−) of −400 V is applied to the drum cleaning roller 34 to collect only the toner from the photosensitive drum 27 onto the drum cleaning roller 34. During printing, a positive potential, for example, a roller potential DCLNA (+) of 600V is applied to the drum cleaning roller 34, and a shaft potential DCLNB of 700V is applied to the paper dust removal cleaning roller 35. At this time, the paper dust is collected by the paper dust removing cleaning roller 35 via the drum cleaning roller 34. The toner is reattached on the photosensitive drum 27 and then collected by the cleaning device 28 via the belt 25.

  The monochrome cartridge 33K has an SR terminal that receives the charging potential SR, a DEV terminal that receives the developing bias DEV, a roller potential DCLNA (+), a DCLNA terminal that receives DCLNA (−), and a DCLNB terminal that receives the shaft potential DCLNB.

  The color cartridges 33Y, 33M, and 33C include a photosensitive drum 27, a charger 37, and a drum cleaning roller 34 in the lower part thereof, and development cartridges 40Y, 40M, and 40C in the upper part thereof. On the other hand, the color cartridges 33Y, 33M, and 33C do not include the paper dust removal cleaning roller 35. The color cartridges 33Y, 33M, and 33C each have an SR terminal, a DEV terminal, and a DCLNA terminal.

  The developing cartridge 40 is detachably attached to the cartridge frame 32 of the cartridge 33. Then, the developing cartridge 40 is replaced by opening the upper cover 3A. The cartridge 33 is detachably attached to the attachment portion 31. Then, the cartridge 33 is exchanged by opening the upper cover 3A, or a paper jam removal process (jam process) is performed with the cartridge 33 removed.

  The developing cartridge 40 includes a toner storage chamber 42 that stores toner of each color, which is a developer (coloring agent), in an upper portion inside the box-shaped main body casing 3, and a supply roller 41, a developing roller 43, and the like below. ing.

  The toner discharged from the toner storage chamber 42 is supplied to the developing roller 43 by the rotation of the supply roller 41, and is positively frictionally charged between the supply roller 41 and the developing roller 43. Further, the toner supplied onto the developing roller 43 is sufficiently charged with the application of the developing bias DEV, and is carried on the developing roller 43 as a thin layer having a constant thickness.

  At the time of image formation, the photosensitive drum 27 is rotationally driven, and accordingly, the surface of the photosensitive drum 27 is uniformly positively charged by applying the charging potential SR from the charger 37. The positively charged portion is exposed by high-speed scanning of light from the LED head 18, and an electrostatic latent image corresponding to an image to be formed on the paper 5 is formed on the surface of the photosensitive drum 27.

  Next, when the developing roller 43 is rotated and the positively charged toner carried on the developing roller 43 comes into contact with the photosensitive drum 27 so as to face the surface of the photosensitive drum 27, the static charge is formed. The electric latent image is supplied. As a result, the electrostatic latent image on the photosensitive drum 27 is visualized, and the surface of the photosensitive drum 27 carries a toner image with toner attached only to the exposed portion.

  Thereafter, the toner image carried on the surface of each photosensitive drum 27 is transferred to the transfer roller while the sheet 5 conveyed by the belt 25 passes through each transfer position between the photosensitive drum 27 and the transfer roller 29. The images are sequentially transferred onto the paper 5 by the negative transfer potential applied to the paper 29. The sheet 5 having the toner image transferred thereon is then conveyed to the fixing unit 21.

  The fixing unit 21 includes a heating roller 49 having a heat source and a pressure roller 51 that presses the paper 5 toward the heating roller 49, and heat-fixes the toner image transferred onto the paper 5 on the paper surface. The sheet 5 thermally fixed by the fixing unit 21 is conveyed upward and discharged onto a discharge tray 53 provided on the upper surface of the main body casing 3.

  As shown in FIG. 1, the monochrome cartridge 33K is disposed at the uppermost stream in the flow of image formation on the paper 5, and each of the color cartridges 33Y, 33M, 33C is located downstream from the monochrome cartridge 33K (the rear side shown in FIG. 1). ). With this configuration, the paper dust removing cleaning roller 35, which is a configuration for removing paper dust, is provided on the upstream side to remove the paper dust on the upstream side, and the configuration on the downstream side is omitted for cost reduction and the like. A powder removal measure is suitably taken.

  The mounting portion 31 to which the cartridge 33 is mounted is provided with mounting portions 31K, 31Y, 31M, and 31C corresponding to the cartridges 33, respectively. Inside the mounting portion 31K, terminals (an example of the first terminal and the second terminal) are provided at positions where the terminals of the monochrome cartridge 33K abut (terminals 55 and 56 in FIG. 2 and terminal 455 in FIG. 10). 456). Similarly, terminals are provided inside the mounting portions 31Y, 31M, and 31C at positions where they abut against the terminals of the color cartridges 33Y, 33M, and 33C (the terminals 55 and 56 in FIG. 2 and the terminal 456 in FIG. 10). reference).

  When inspecting each terminal of the mounting portion 31, the inspection jig 52 (see FIGS. 2 and 10) is mounted (connected) to the mounting portion 31 to which the cartridge 33 is not mounted. The printer 10 to which the cartridge 33 is not mounted corresponds to the apparatus main body of the present invention, and the printer 10 to which the inspection jig 52 is mounted corresponds to the inspection system 20 (see FIGS. 2 and 10) of the present invention. The inspection jig 52 includes an SR terminal, a DEV terminal, a DCLNA terminal, a DCLNB terminal, and the like (see the terminals 57 and 58 in FIG. 2 and the terminals 457 and 458 in FIG. 10). In the printer 10, each wiring connected from the main body side to the mounting unit 31 branches in the mounting unit 31 and is connected to corresponding terminals provided in the mounting units 31 </ b> K, 31 </ b> Y, 31 </ b> M, and 31 </ b> C. Each terminal of the inspection jig 52 is connected to at least one terminal connected to the same wiring among the terminals provided in the mounting portions 31K, 31Y, 31M, and 31C.

2. Configuration of Inspection System Next, the inspection system 20 will be described with reference to FIG. In the printer 10, it is necessary to inspect each terminal of the mounting portion 31 prior to use. When inspecting each terminal of the mounting portion 31, the inspection system 20 of FIG. 2 is configured. The inspection system 20 is configured by mounting an inspection jig 52 on a control unit (an example of an apparatus main body) 50 to which a cartridge 33 is not mounted.

3. Configuration of Control Unit The control unit 50 is provided in the main casing 3 and controls the printer 10. The control unit 50 includes a mounting unit 31, a CPU (an example of a detection unit and a determination unit) 61, a ROM 62, and a high potential control circuit 65. The high potential control circuit 65 applies a plurality of high loads applied to each electrical load provided in the printer 10, such as the transfer roller 29, the drum cleaning roller 34, the paper dust removal cleaning roller 35, the charger 37, and the developing roller 43. Generate a potential. FIG. 2 shows a high potential control circuit 65 that generates a charging potential SR to be applied to the charger 37 and a developing bias DEV to be applied to the developing roller 43 among a plurality of high potentials. A mounting portion 31 including an example terminal 55 and a DEV terminal 56 (second terminal example) 56 is shown.

The high potential control circuit 65 includes a first potential generation circuit 63 and a second potential generation circuit 64.
The first potential generation circuit 63 includes a resistor R1 and a power source Y1. The resistor R1 and the power source Y1 are connected in series between the SR terminal 55 and the ground potential (an example of a reference potential). The power source Y1 has a high potential side connected to the resistor R1, and a low potential side connected to the resistor R1. The first potential generation circuit 63 applies the first potential V1 to the SR terminal 55 by the voltage of the power supply Y1.

  The second potential generation circuit 64 includes a Zener diode (an example of a first constant voltage element) D1, a variable resistor (an example of an adjustment element) RK, a resistor R2, and a resistor R3. The cathode electrode K of the Zener diode D1 is connected to the SR terminal 55, and the anode electrode A of the Zener diode D1 is connected to the DEV terminal 56. The Zener diode D1 maintains the potential difference between the DEV terminal 56 and the SR terminal 55 at the first potential difference ΔV1. The variable resistor RK is connected between the DEV terminal 56 and the ground potential. The resistors R2 and R3 are connected in series between the DEV terminal 56 and the ground potential. The second potential generation circuit 63 uses the voltage applied to the DEV terminal 56 (the first potential V1 in this embodiment), and the second potential V2 that is lower than the voltage applied to the DEV terminal 56 by the first potential difference ΔV1. Is applied to the SR terminal 55.

  In the second potential generation circuit 64, the second potential V2 can be changed by changing the resistance value of the variable resistor RK. The second potential V2 is used to determine the connection state of each terminal of the mounting portion 31 when configuring the inspection system 20 shown in FIG. On the other hand, when the cartridge 33 is mounted, it is used for operating the cartridge 33. As described above, when the second potential is commonly used in the inspection system 20 and the cartridge 33, the potential required for the second potential may differ depending on the application. In the printer 10, the potential required for the second potential may change depending on the environment (temperature, humidity, etc.) used. In the present embodiment, by changing the second potential V2 using the second potential generation circuit 64, the second potential V2 suitable for the application and environment can be set.

  The CPU 61 includes an A / D terminal, and the A / D terminal is connected to an intermediate point MN between the resistors R2 and R3. The CPU 61 detects the potential at the intermediate point MN using the A / D terminal. Further, the CPU 61 has a PWM terminal and is connected to the variable resistor RK. The CPU 61 changes the resistance value of the variable resistor RK using the PWM terminal.

4). Configuration of Inspection Jig The inspection jig 52 has substantially the same shape as the cartridge 33 and is detachably mounted on the mounting portion 31 of the control unit 50.
The inspection jig 52 includes an input / output unit 59, a third potential generation circuit 70, and a fourth potential generation circuit 71. The input / output unit 59 is provided with a terminal at a position where it abuts on each terminal of the mounting unit 31. FIG. 2 shows a terminal (an example of a third terminal) 57 corresponding to the SR terminal 55 and a terminal (an example of a fourth terminal) 58 corresponding to the DEV terminal 56. These terminals 57 and 58 are connected to corresponding terminals 55 and 56 when the inspection jig 52 is mounted on the mounting portion 31 of the control unit 50.

  The third potential generation circuit 70 includes a resistor R4 and a transistor element (an example of a switching element) S1. The resistor R4 is connected between the terminal 57 and the base B (an example of a control electrode) of the transistor element S1. A collector C (an example of a main electrode) of the transistor element S 1 is connected to the terminal 58. The emitter E (another example of the main electrode) of the transistor element S1 is connected to the ground potential. The transistor element S1 applies a ground potential (an example of a first output potential) to the terminal 58 when an on-potential is applied to the base B via the resistor R4.

  The fourth potential generation circuit 71 includes a Zener diode (an example of a second constant voltage element) D2. The cathode electrode K of the Zener diode D2 is connected to the terminal 58, and the anode electrode A of the Zener diode D2 is connected to the ground potential. The Zener diode D2 has a third potential (an example of a second output potential) that is higher than the ground potential by the second potential difference ΔV2 using the second potential V2 when the second potential V2 is applied to the terminal 58 from the DEV terminal 56. ) V3 is generated, and the third potential V3 is applied to the DEV terminal 56 via the terminal 58.

  In the present embodiment, the first potential V1, the second potential V2, the third potential V3, and the ground potential are all set to different potentials, and the first potential V1 is set to an on potential that turns on the transistor element S1. Is set. The first potential V1, the second potential V2, the third potential V3, and the ground potential are set to have a relationship of (first potential V1> second potential V2> third potential V3> ground potential). In the present embodiment, the second potential V2, the third potential V3, and the ground potential may be simultaneously applied to the DEV terminal 56. In that case, the potential of the DEV terminal 56 is set to a lower potential. That is, the second potential V2 is applied to the DEV terminal 56 when the third potential V3 and the ground potential are not applied to the DEV terminal 56. The third potential V3 is applied to the DEV terminal 56 when the ground potential is not applied to the DEV terminal 56 (that is, when the first potential V1 is not applied to the base B of the transistor element S1).

5). Inspection System Determination Method The CPU 61 detects the potential V0 of the intermediate point MN when the inspection jig 52 is mounted on the mounting portion 31 of the control unit 50. The ROM 62 stores a first threshold potential F1 and a second threshold potential F2 in advance. The first threshold potential F1 is set to a potential between the third potential V3 and the ground potential. The second threshold potential F2 is set to a potential between the second potential V2 and the third potential V3. The CPU 61 inspects the SR terminal 55 and the DEV terminal 56 of the mounting unit 31 by comparing the detection potential V0 with the threshold potentials F1 and F2.

(Detection potential V0 <threshold potential F1)
In this case, the CPU 61 detects that the ground potential is applied. That is, it is detected that the first potential V <b> 1 is applied from the SR terminal 55 to the terminal 57, whereby the ground potential applied to the terminal 58 is applied to the DEV terminal 56. As a result, the CPU 61 determines that the SR terminal 55 and the terminal 57 are connected and the DEV terminal 56 and the terminal 58 are connected (first state) (SR terminals in FIG. 3: Close, DEV). Terminal: Close).

(Threshold potential F1 <detection potential V0 <threshold potential F2)
In this case, the CPU 61 detects that the third potential is applied. Since the ground potential is not input, it is detected that the first potential V1 is not applied from the SR terminal 55 to the terminal 57. Further, since the third potential V3 is generated, it is detected that the second potential V2 is applied from the DEV terminal 56 to the terminal 58. As a result, the CPU 61 determines that the SR terminal 55 and the terminal 57 are not connected and that the DEV terminal 56 and the terminal 58 are connected (second state) (SR terminal: Open, FIG. 3). DEV terminal: Close). Note that “not connected” means both a state where the terminals are not physically connected to each other and a state where the first potential V1 is not applied to the SR terminal due to a disconnection or the like. To do.

(Threshold potential F2 <detection potential V0)
In this case, the CPU 61 detects that the second potential is applied. As a result, the CPU 61 determines that the DEV terminal 56 and the terminal 58 are not connected (third state) (DEV terminal: Open in FIG. 3).

6). Effect of Inspection System In the inspection using the inspection system 20 of the present embodiment, the SR terminal 55 and the DEV terminal 56 can be distinguished into three states: a first state, a second state, and a third state. According to the conventional inspection system 320 shown in FIG. 8, as shown in FIG. 9, the SR terminal 55 and the DEV terminal 56 are in two states: a first state and another state (that is, a second state + a third state). Could only be determined. By using the inspection system 20 of the present embodiment, the SR terminal 55 and the DEV terminal 56 can be inspected in detail as compared with the conventional inspection system 320, and voltage application from these terminals is normally performed. It can be inspected in detail.

<Embodiment 2>
A second embodiment of the present invention will be described with reference to FIGS. The inspection system 120 according to the present embodiment differs from the inspection system 20 of the first embodiment in that the inspection jig 152 further includes a fifth potential generation circuit 72.

1. Configuration of Inspection Jig The fifth potential generation circuit 72 includes a Zener diode (an example of a third constant voltage element) D3. The cathode electrode K of the Zener diode D3 is connected to the terminal 57, and the anode electrode A of the Zener diode D3 is connected to the ground potential. When the first potential V1 is applied to the terminal 57 from the SR terminal 55, the Zener diode D3 generates the fourth potential V4 that is higher than the ground potential by the third potential difference ΔV3 using the first potential V1. The fourth potential V4 is applied to the SR terminal via The Zener diode D1 of the second potential generation circuit 64 has a fifth potential (an example of a third output potential) V5 that is lower than the fourth potential V4 by the first potential difference ΔV1 when the fourth potential V4 is applied to the SR terminal. Is generated.

  In this embodiment, the first potential V1, the second potential V2, the fifth potential V5, the third potential V3, and the ground potential are all set to different potentials, and the fourth potential V4 It is set to the on potential to turn on. The first potential V1, the second potential V2, the fifth potential V5, the third potential V3, and the ground potential are (first potential V1> second potential V2> fifth potential V5> third potential V3> ground potential). The relationship is set. In the present embodiment, the second potential V2 and the third potential V3 may be applied to the DEV terminal 56 at the same time. In the present embodiment, the second potential V <b> 2 is applied to the DEV terminal 56 when the third potential V <b> 3 is not applied to the DEV terminal 56. In the present embodiment, the fifth potential V5 and the ground potential may be simultaneously applied to the DEV terminal 56. In the present embodiment, the fifth potential V5 is applied to the DEV terminal 56 when the ground potential is not applied to the DEV terminal 56 (that is, when the DEV terminal 56 and the terminal 58 are not connected).

2. Inspection System Determination Method The CPU 61 detects the potential V0 of the intermediate point MN when the inspection jig 152 is mounted on the mounting portion 31 of the control unit 50. The ROM 62 stores in advance a first threshold potential F1, a third threshold potential F3, and a fourth threshold potential F4. The first threshold potential F1 is set to a potential between the third potential V3 and the ground potential. The third threshold potential F3 is set to a potential between the fifth potential V5 and the third potential V3. The fourth threshold potential F3 is set to a potential between the second potential V2 and the fifth potential V5. The CPU 61 inspects the SR terminal 55 and the DEV terminal 56 of the mounting unit 31 by comparing the detection potential V0 with the threshold potentials F1, F2, and F3.

(Detection potential V0 <threshold potential F1)
In this case, the CPU 61 detects that the ground potential is applied. That is, it is detected that the first potential V <b> 1 is applied from the SR terminal 55 to the terminal 57, whereby the ground potential applied to the terminal 58 is applied to the DEV terminal 56. As a result, the CPU 61 determines that the SR terminal 55 and the terminal 57 are connected and that the DEV terminal 56 and the terminal 58 are connected (first state) (SR terminals in FIG. 5: Close, DEV). Terminal: Close).

(Threshold potential F1 <detection potential V0 <threshold potential F3)
In this case, the CPU 61 detects that the third potential is applied. Since the ground potential is not input, it is detected that the first potential V1 is not applied from the SR terminal 55 to the terminal 57. Further, since the third potential V3 is generated, it is detected that the second potential V2 is applied from the DEV terminal 56 to the terminal 58. As a result, the CPU 61 determines that the SR terminal 55 and the terminal 57 are not connected and that the DEV terminal 56 and the terminal 58 are connected (second state) (SR terminal: Open, FIG. 5). DEV terminal: Close).

(Threshold potential F3 <detection potential V0 <threshold potential F4)
In this case, the CPU 61 detects that the fifth potential is being applied. That is, since the ground potential and the third potential are not input, it is detected that the DEV terminal 56 and the terminal 58 are not connected. Further, since the fifth potential is generated, it is detected that the first potential V1 is applied from the SR terminal 55 to the terminal 57. As a result, the CPU 61 determines that the SR terminal 55 and the terminal 57 are connected and the DEV terminal 56 and the terminal 58 are not connected (fourth state) (SR terminals in FIG. 5: Close, DEV). Terminal: Open).

(Threshold potential F4 <detection potential V0)
In this case, the CPU 61 detects that the second potential is applied. As a result, the CPU 61 determines that the SR terminal 55 and the terminal 57 are not connected and the DEV terminal 56 and the terminal 58 are not connected (fifth state) (SR terminal in FIG. 5: Open, DEV terminal: Open).

3. Effect of Inspection System In the inspection using the inspection system 120 of the present embodiment, the SR terminal 55 and the DEV terminal 56 can be distinguished into four states of a first state, a second state, a fourth state, and a fifth state. . By using the inspection system 120 of the present embodiment, it is possible to inspect the SR terminal 55 and the DEV terminal 56 in detail as compared with the conventional inspection system 320, and whether the voltage application from these terminals is normally performed. It can be inspected in detail.

<Embodiment 3>
In the second embodiment, the inspection system 120 of the control unit 50 that applies a positive potential from the DEV terminal 55 and the SR terminal 56 is shown, but the present invention is a control unit 250 that applies a negative potential from the DEV terminal 55 and the SR terminal 56. It is also applicable to. 6 and 7 show a third embodiment of the present invention, which is a modification of the second embodiment. The inspection system 220 according to the present embodiment is different from the inspection system 120 according to the second embodiment in that the Zener diodes D1, D2, D3 and the power source Y1 are arranged in the opposite directions as compared with the inspection system 120. Besides, the specification and connection of the transistor element S1 are different, and the inspection system 220 includes a protective power source YH and a protective resistor RH so that the potential input to the CPU 61 does not become negative.

  In the present embodiment, the first potential V1, the second potential V2, the fifth potential V5, the third potential V3, and the ground potential are (first potential V1 <second potential V2 <fifth potential V5 <third potential V3 <ground. Potential)). In the present embodiment, the second potential V2 and the third potential V3 may be applied to the DEV terminal 56 at the same time. In that case, the potential of the DEV terminal 56 is set to a higher potential. Note that the determination method also reverses the magnitude relation of the potential, and a duplicate description is omitted. Even in the inspection using the inspection system 220 of the present embodiment, the SR terminal 55 and the DEV terminal 56 can be distinguished into four states of the first state, the second state, the fourth state, and the fifth state. It is possible to inspect whether or not the voltage application from the DEV terminal 56 is normally performed.

<Embodiment 4>
A fourth embodiment of the present invention will be described with reference to FIG. In the inspection system 420 according to the present embodiment, the high potential control circuit 465 included in the control unit 450 includes the roller potentials DCLNA (+) and DCLNA (−) applied to the drum cleaning roller 34 and the paper dust removal cleaning roller 35. This is an inspection system for inspecting a high potential control circuit 65 that generates a shaft potential DCLNB to be applied. The inspection system 420 according to the present embodiment includes a control unit 450 and an inspection jig 452.

1. Configuration of Control Unit The control unit 450 includes a mounting unit 431, a CPU (an example of a control unit, a detection unit, and a determination unit) 461, a ROM 462, and a high potential control circuit 465. The mounting portion 431 includes a DCLNB terminal 455 for outputting the shaft potential DCLNB and a DCLNA terminal 456 for outputting the roller potentials DCLNA (+) and DCLNA (−). The CPU 461 controls the high potential control circuit 465 according to a predetermined program P stored in the ROM 462. The high potential control circuit 465 includes a shaft potential generation circuit 66 that generates the shaft potential DCLNB, a roller negative potential generation circuit 67 that generates the roller potential DCLNA (−), and a roller positive potential generation that generates the roller potential DCLNA (+). The circuit 68 includes a first FB (feedback) circuit 73 and a second FB circuit 74.

Each of the potential generation circuits 66, 67, and 68 includes a power source Y (Y2 to Y4), a transformer T (T1 to T3), a transistor element S (S2 to S4), a diode D (D4 to D6), and a resistor R (R6, R8, R10) and capacitor C (C2-C4).
The shaft potential generation circuit 66 includes a first terminal 91 and a second terminal 92. The first terminal 91 is connected to the DCLNB terminal 455. The second terminal 92 is connected to the DCLNA terminal 456 and is connected to the ground potential via the roller negative potential generation circuit 67 and the roller positive potential generation circuit 68. The shaft potential generation circuit 66 is connected to the PWM1 terminal of the CPU 461, and generates a shaft potential DCLNB higher than the second terminal 92 at the first terminal 91 under the control of the CPU 461.

  The roller negative potential generation circuit 67 includes a third terminal 93 and a fourth terminal 94. The third terminal 93 is connected to the DCLNA terminal 456 and is connected to the DCLNB terminal 455 through the shaft potential generation circuit 66. The second terminal 92 is connected to the ground potential via the roller positive potential generation circuit 68. The roller negative potential generation circuit 67 is connected to the PWM2 terminal of the CPU 461, and generates a roller potential DCLNA (−) that is lower than the fourth terminal 94 at the third terminal 93 under the control of the CPU 461.

  The roller positive potential generation circuit 68 includes a fifth terminal 95 and a sixth terminal 96. The fifth terminal 95 is connected to the DCLNA terminal 456 via the roller negative potential generation circuit 67 and is connected to the DCLNB terminal 455 via the shaft potential generation circuit 66 and the roller negative potential generation circuit 67. The sixth terminal 96 is connected to the ground potential. The roller positive potential generation circuit 68 is connected to the PWM3 terminal of the CPU 461, and generates a roller potential DCLNA (+) higher than the sixth terminal 96 at the fifth terminal 95 under the control of the CPU 461.

  The first FB circuit 73 includes capacitors C5 and C6 and a diode D7. The first FB circuit 73 is connected to the DCLNA terminal 456 via the shaft potential generation circuit 66, and inputs the potential of the DCLNB terminal 455 to the A / D1 port of the CPU 461. The second FB circuit 74 includes a power source Y5 and resistors R11 to R13. The second FB circuit 74 is connected to the DCLNB terminal 456, and inputs it to the A / D2 port of the CPU 461 with the potential of the DCLNA terminal 456 adapted to the CPU 461.

2. Configuration of Inspection Jig Inspection jig 452 includes an input / output unit 459, a diode D8, and a diode D9. In the input / output unit 459, a terminal 457 corresponding to the DCLNB terminal 455 and a terminal 458 corresponding to the DCLNA terminal 456 are shown. The cathode electrode K of the diode D8 is connected to the terminal 457, and the anode electrode A of the diode D8 is connected to the ground potential. That is, at the terminal 457, current is prevented from flowing from the terminal 457 toward the ground potential. The anode electrode A of the diode D9 is connected to the terminal 458, and the cathode electrode K of the diode D9 is connected to the ground potential. That is, at the terminal 458, current is prevented from flowing from the ground potential toward the terminal 458.

3. Judgment method and effect of inspection system (inspection of DCLNB terminal)
The CPU 461 operates the roller negative potential generation circuit 67, stops the shaft potential generation circuit 66 and the roller positive potential generation circuit 68, and detects the potential VB of the DCLNB terminal 455 at this time. In this case, when the DCLNB terminal 455 and the terminal 457 are connected, a current flows through the resistor R10, the ground potential, the diode D8, and the resistor 6. The ROM 462 stores a threshold potential F11 in advance. The threshold potential F11 is set to a value corresponding to the potential between the ground potential and the roller potential DCLNA (−). The CPU 461 compares the detection potential VB with the threshold potential F11. When the detection potential VB is equal to or higher than the threshold potential F11, the CPU 461 determines that the DCLNB terminal 455 and the terminal 457 are connected, and the detection potential VB is the threshold value. When the potential is lower than the potential F11, it is determined that the DCLNB terminal 455 and the terminal 457 are not connected.

  When the roller negative potential generating circuit 67 is operated, the roller potential DCLNA (−) is applied to the DCLNA terminal 456 as well as the DCLNB terminal 455. In this embodiment, a diode D9 is connected between the terminal 458 to which the DCLNA terminal 456 is connected and the ground potential, and regardless of whether the DCLNA terminal 456 and the terminal 458 are connected or not, No current flows between ground potentials. Therefore, the connection state of the DCLNB terminal 455 and the terminal 457 can be determined regardless of whether the DCLNA terminal 456 and the terminal 458 are connected.

(Inspection of DCLNA terminal)
The CPU 461 operates the roller positive potential generation circuit 68 and stops the shaft potential generation circuit 66 and the roller negative potential generation circuit 67, and detects the potential VA of the DCLNA terminal 456 at this time. In this case, when the DCLNA terminal 456 and the terminal 458 are connected, a current flows through the resistor R10, the ground potential, and the diode D9. The ROM 462 stores a threshold potential F12 in advance. The threshold potential F12 is set to a potential between the roller potential DCLNA (+) and the ground potential. The CPU 461 compares the detection potential VA with the threshold potential F12. When the detection potential VA is equal to or higher than the threshold potential F11, the CPU 461 determines that the DCLNB terminal 455 and the terminal 457 are not connected, and the detection potential VB is the threshold value. When the potential is lower than the potential F11, it is determined that the DCLNB terminal 455 and the terminal 457 are connected.

  When the roller negative potential generation circuit 67 is operated, the roller potential DCLNA (+) is applied to the DCLNB terminal 455 as well as the DCLNA terminal 456. In the present embodiment, a diode D8 is connected between the terminal 457 to which the DCLNB terminal 455 is connected and the ground potential, and regardless of whether the DCLNB terminal 455 and the terminal 457 are connected to the DCLNB terminal 455, No current flows between ground potentials. Accordingly, whether or not the DCLNA terminal 456 and the terminal 458 are connected can be determined regardless of whether or not the DCLNB terminal 455 and the terminal 457 are connected.

<Embodiment 5>
Embodiment 5 of the present invention will be described with reference to FIG. The inspection system 520 according to the present embodiment is different from the inspection system 420 of the fourth embodiment in that the inspection jig 552 includes a diode D10.

1. Configuration of Inspection Jig The inspection jig 552 includes an input / output unit 459 and a diode D10. The anode electrode A of the diode D10 is connected to the terminal 457, and the cathode electrode K of the diode D8 is connected to the ground potential. That is, at the terminal 457, current is prevented from flowing from the ground potential toward the terminal 257. Note that the terminal 458 is connected to a ground potential.

2. Judgment method and effect of inspection system (inspection of DCLNA terminal)
The CPU 461 operates the roller negative potential generation circuit 67 and stops the shaft potential generation circuit 66 and the roller positive potential generation circuit 68, and detects the potential VA of the DCLNA terminal 456 at this time. In this case, when the DCLNA terminal 456 and the terminal 458 are connected, a current flows through the resistor R10, the ground potential, and the diode D9. The CPU 461 compares the detection potential VB with the threshold potential F11. When the detection potential VA is equal to or higher than the threshold potential F11, the CPU 461 determines that the DCLNB terminal 455 and the terminal 457 are not connected, and the detection potential VA is the threshold value. When the potential is lower than the potential F11, it is determined that the DCLNB terminal 455 and the terminal 457 are connected.

  When the roller negative potential generation circuit 67 is operated, the roller potential DCLNA (−) is applied to the DCLNB terminal 455 as well as the DCLNA terminal 456. In this embodiment, a diode D10 is connected between the terminal 457 to which the DCLNB terminal 455 is connected and the ground potential, and the DCLNB terminal 455 and the DCLNB terminal 455 are connected regardless of whether the DCLNB terminal 455 and the terminal 457 are connected. No current flows between ground potentials. Therefore, the connection state of the DCLNA terminal 456 and the terminal 458 can be determined regardless of whether the DCLNB terminal 455 and the terminal 457 are connected.

(Inspection of DCLNB terminal)
The CPU 461 operates the shaft potential generation circuit 66 and stops the roller negative potential generation circuit 67 and the roller positive potential generation circuit 68, and detects the potential VB of the DCLNB terminal 455 at this time. In this case, when the DCLNB terminal 455 and the terminal 457 are connected, current flows through the resistor R8, the resistor R10, the ground potential, and the diode D8, or through the ground potential, the DCLNB terminal 256, the terminal 258, and the diode D8. Current flows. The ROM 262 stores a threshold potential F13 in advance. The threshold potential F13 is set to a potential between the shaft potential DCLNB and the ground potential. The CPU 461 compares the detection potential VB with the threshold potential F13. When the detection potential VB is equal to or higher than the threshold potential F13, the CPU 461 determines that the DCLNB terminal 455 and the terminal 457 are connected, and the detection potential VB is the threshold value. When the potential is lower than the potential F13, it is determined that the DCLNB terminal 455 and the terminal 457 are not connected.

  When the shaft potential generation circuit 66 is operated and the shaft potential DCLNB is applied to the DCLNB terminal 455, the DCLNB terminal 455 and the terminal 457 are connected regardless of whether or not the DCLNA terminal 456 and the terminal 458 are connected. Only when the current flows. Accordingly, whether or not the DCLNA terminal 455 and the terminal 457 are connected can be determined regardless of whether or not the DCLNA terminal 456 and the terminal 458 are connected.

<Embodiment 6>
Embodiment 6 of the present invention will be described with reference to FIG. The inspection system 620 according to the present embodiment is different from the inspection system 220 of the fifth embodiment in that the inspection jig 652 includes a diode D11.

1. Configuration of Inspection Jig Diode D11 is connected between diode D8 and ground potential, and between terminal 458 and ground potential. The cathode electrode K of the diode D11 is connected to the cathode electrode K of the diode D8 and to the terminal 458, and the anode electrode A of the diode D11 is connected to the ground potential. In other words, at the terminal 457, current is prevented from flowing in either direction between the ground potential and the terminal 457. In the terminal 458, current is prevented from flowing from the terminal 458 toward the ground potential.

2. Judgment method and effect of inspection system (inspection of DCLNA terminal)
This is the same as that of the fifth embodiment, and a duplicate description is omitted.
(Inspection of DCLNB terminal)
The CPU 461 operates the shaft potential generation circuit 66 and stops the roller negative potential generation circuit 67 and the roller positive potential generation circuit 68, and detects the potential VB of the DCLNB terminal 455 at this time. In this case, when the DCLNB terminal 455 and the terminal 457 are connected, a current flows through the ground potential, the DCLNB terminal 256, the terminal 258, and the diode D8. The threshold potential F13 is set to a potential between the shaft potential DCLNB and the ground potential. The CPU 461 compares the detection potential VB with the threshold potential F13, and when the detection potential VB is equal to or higher than the threshold potential F13, the DCLNB terminal 455 and the terminal 457 are connected, and the DCLNA terminal 456 and the terminal 458 are connected. When the detection potential VB is lower than the threshold potential F13, it is determined that at least one of the DCLNB terminal 455 and the terminal 457 or the DCLNA terminal 456 and the terminal 458 is not connected. .

  When the shaft potential generation circuit 66 is operated and the shaft potential DCLNB is applied to the DCLNB terminal 455, the DCLNA terminal 456 and the terminal 458 are connected, and current is supplied only when the DCLNB terminal 455 and the terminal 457 are connected. Flowing. Therefore, it can be determined that the DCLNA terminal 456 and the terminal 458 are connected and the DCLNA terminal 455 and the terminal 457 are connected. Further, by using together with the inspection result of the DCLNA terminal, it is possible to determine which of the DCLNB terminal 455 and the terminal 457 or the DCLNA terminal 456 and the terminal 458 is not connected.

<Embodiment 7>
Embodiment 7 of the present invention will be described with reference to FIG. The inspection system 720 according to this embodiment is obtained by replacing the diode D11 of the inspection jig 652 of Embodiment 6 with a Zener diode D12. The Zener diode D12 operates in the same manner as the diode D11 by being disposed in the opposite direction to the diode D11. In other words. The inspection system 720 according to the present embodiment is substantially the same as the inspection system 620 according to the sixth embodiment, and has substantially the same effect as the inspection system 620 according to the sixth embodiment.

<Other embodiments>
The present invention is not limited to the embodiments described above with reference to the drawings. In addition, the technical elements described in the present specification or the drawings exhibit technical usefulness alone or in various combinations, and are not limited to the combinations described in the claims at the time of filing. In addition, the technology exemplified in this specification or the drawings can achieve a plurality of objects at the same time, and has technical usefulness by achieving one of the objects.

10: printer 20: inspection system 31: mounting unit 40: developing cartridge 50: control unit 52: inspection jig 59: input / output unit 65: high potential control circuit 66: shaft potential generation circuit 67: roller negative potential generation circuit 68 : Roller positive potential generation circuit DCLNA: Roller potential DCLNB: Shaft potential DEV: Development bias SR: Charging potential

Claims (11)

An inspection system configured by connecting an inspection jig to an apparatus main body excluding an image forming unit from an image forming apparatus,
The apparatus main body is
The image forming unit is detachably mounted, and a mounting portion having a first terminal and a second terminal;
A first potential generating circuit for applying a first potential to the first terminal;
A second potential generation circuit;
A detection unit for detecting the potential of the second terminal,
The inspection jig is
An input / output unit including a third terminal connected to the first terminal and a fourth terminal connected to the second terminal;
A third potential generating circuit for outputting a first output potential to the fourth terminal when the first potential is applied to the third terminal;
A fourth potential generation circuit that outputs a second output potential to the fourth terminal when the first potential is not applied to the third terminal;
The second potential generation circuit applies a second potential to the second terminal when the first output potential and the second output potential are not applied to the second terminal;
The inspection system, wherein the second potential is set to a potential different from the first output potential and the second output potential. The inspection system according to claim 1,
The second potential generation circuit includes a first constant voltage element that maintains a potential difference between the potential of the first terminal and the potential of the second terminal at the first potential difference,
The inspection jig is connected to the second terminal via the first constant voltage element when the first potential is applied to the third terminal and the first output potential is not applied to the second terminal. A fifth potential generation circuit for outputting the third output potential;
The second potential generation circuit applies a second potential to the second terminal when the first output potential, the second output potential, and the third output potential are not applied to the second terminal;
The inspection system in which the third output potential is set to a potential different from the first output potential, the second output potential, and the second potential. The inspection system according to claim 1,
The apparatus main body includes a determination unit,
The first output potential, the second output potential, and the second potential are set to increase in this order,
The determination unit includes a first threshold potential set to a potential between the first output potential and the second output potential, and a second threshold set to a potential between the second output potential and the second potential. Has a threshold potential,
When the detection potential detected by the detection unit is lower than the first threshold potential, the first terminal and the third terminal are connected, and the second terminal and the fourth terminal are connected. It is determined that
When the detection potential is equal to or higher than the first threshold potential and lower than the second threshold potential, the first terminal and the third terminal are not connected, and the second terminal and the fourth terminal are not connected. Determine that the connection is
An inspection system that determines that the second terminal and the fourth terminal are not connected when the detection potential is equal to or higher than the second threshold potential. The inspection system according to claim 3,
The third potential generation circuit is a switching element in which a control electrode is connected to the third terminal, one main electrode is connected to the fourth terminal, and the other main electrode is connected to a reference potential.
In the fourth potential generation circuit, one main electrode is connected to the fourth terminal, the other main electrode is connected to the reference potential, and the fourth terminal has a third potential higher than the reference potential by a second potential difference. A second constant voltage element capable of generating a potential;
The inspection system in which the first potential is set to a potential for turning on the switching element. The inspection system according to claim 2,
The apparatus main body includes a determination unit,
The first output potential, the second output potential, the third output potential, and the second potential are set to increase in this order,
The determination unit includes a first threshold potential set to a potential between the first output potential and the second output potential, and a first threshold potential set to a potential between the second output potential and the third output potential. A third threshold potential and a fourth threshold potential set to a potential between the third output potential and the second potential;
When the detected detection potential is lower than the first threshold potential, the detection unit is connected between the first terminal and the third terminal, and between the second terminal and the fourth terminal. It is determined that it is connected,
When the detection potential is equal to or higher than the first threshold potential and lower than the third threshold potential, the first terminal and the third terminal are not connected, and the second terminal and the fourth terminal Determine that the connection is
When the detection potential is equal to or higher than the third threshold potential and lower than the fourth threshold potential, the first terminal and the third terminal are connected, and the second terminal and the fourth terminal are connected. Is determined not to be connected,
When the detection potential is equal to or higher than the fourth threshold potential, the first terminal and the third terminal are not connected, and the second terminal and the fourth terminal are not connected. Inspection system to judge. The inspection system according to claim 5,
The third potential generation circuit is a switching element in which a control electrode is connected to the third terminal, one main electrode is connected to the fourth terminal, and the other main electrode is connected to a reference potential.
In the fourth potential generation circuit, one main electrode is connected to the fourth terminal, the other main electrode is connected to the reference potential, and the fourth terminal has a third potential higher than the reference potential by a second potential difference. A second constant voltage element capable of generating a potential;
In the first constant voltage element, one main electrode is connected to the first terminal, the other main electrode is connected to the second terminal, and the potential of the second terminal is set higher than the potential of the first terminal. A potential lower by the first potential difference can be generated;
In the fifth potential generation circuit, one main electrode is connected to the third terminal, the other main electrode is connected to the reference potential, and the third terminal is higher than the reference potential by a third potential difference. A third constant voltage element capable of generating a potential;
The first potential and the fourth potential are set to potentials that turn on the switching element,
The inspection system, wherein the third output potential is a fifth potential that is lower than the fourth potential by the first potential difference. The inspection system according to any one of claims 1 to 6,
The second potential generation circuit includes an adjustment element capable of adjusting the second potential. An inspection system configured by connecting an inspection jig to an apparatus main body excluding an image forming unit from an image forming apparatus,
The apparatus main body is
The image forming unit is detachably mounted, and a mounting portion having a first terminal and a second terminal;
A first electrode and a second electrode; the first electrode is connected to the first terminal and the second terminal; the second electrode is connected to a reference potential; and A first potential generation circuit for generating a first potential higher than a reference potential;
A third electrode and a fourth electrode; the third electrode is connected to the first terminal and the second terminal; the fourth electrode is connected to the reference potential; and A second potential generation circuit for generating a second potential lower than the reference potential;
A first controller that controls the first potential generation circuit to apply the first potential to the first terminal and the second terminal;
A second controller that controls the second potential generation circuit to apply the second potential to the first terminal and the second terminal;
A first detection unit for detecting a potential of the first terminal;
A second detection unit for detecting the potential of the second terminal,
The inspection jig is
An input / output unit including a third terminal connected to the first terminal and a fourth terminal connected to the second terminal;
A first rectifier element connected between the third terminal and the reference potential and prohibiting a current from flowing from the third terminal to the reference potential;
An inspection system comprising: a second rectifying element that is connected between the fourth terminal and the reference potential and prohibits a current from flowing from the reference potential to the fourth terminal. The inspection system according to claim 8,
The apparatus main body includes a first determination unit and a second determination unit,
The first determination unit has a first threshold potential set to a potential between the reference potential and the second potential;
The second determination unit has a second threshold potential set to a potential between the first potential and the reference potential,
The first determination unit is arranged between the first terminal and the third terminal when the second control unit applies the second potential and the first detection potential is equal to or higher than the first threshold potential. Is determined to be connected, and when the first detection potential is lower than the first threshold potential, it is determined that the first terminal and the third terminal are not connected,
The second determination unit is arranged between the second terminal and the fourth terminal when the first control unit applies the first potential and the second detection potential is equal to or higher than the second threshold potential. The inspection system that determines that is not connected and determines that the second terminal and the fourth terminal are connected when the second detection potential is lower than the second threshold potential. An inspection system configured by connecting an inspection jig to an apparatus main body excluding an image forming unit from an image forming apparatus,
The apparatus main body is
The image forming unit is detachably mounted, and a mounting portion having a first terminal and a second terminal;
The first electrode is connected to the first terminal, the second electrode is connected to the second terminal and a reference potential, and the first electrode is connected to the first electrode. A first potential generation circuit for generating a first potential higher than a reference potential;
A third electrode and a fourth electrode; the third electrode is connected to the first terminal and the second terminal; the fourth electrode is connected to the reference potential; and A second potential generation circuit for generating a second potential lower than the reference potential;
A first controller that controls the first potential generation circuit to apply the first potential to the first terminal;
A second controller that controls the second potential generation circuit to apply the second potential to the first terminal and the second terminal;
A first detection unit for detecting a potential of the first terminal;
A second detection unit for detecting the potential of the second terminal,
The inspection jig is
An input / output unit including a third terminal connected to the first terminal and a fourth terminal connected to the second terminal;
A first rectifier element connected between the third terminal and the reference potential and prohibiting a current from flowing from the reference potential to the third terminal;
The inspection system in which the fourth terminal is connected to the reference potential. The inspection system according to claim 10,
The apparatus main body includes a first determination unit and a second determination unit,
The first determination unit has a first threshold potential set to a potential between the first potential and the reference potential;
The second determination unit has a second threshold potential set to a potential between the reference potential and the second potential;
The first determination unit is arranged between the first terminal and the third terminal when the first detection potential is equal to or higher than the first threshold potential when the first control unit applies the first potential. Is determined to be connected, and when the first detection potential is lower than the first threshold potential, it is determined that the first terminal and the third terminal are connected,
The second determination unit is arranged between the second terminal and the fourth terminal when the second control unit applies the second potential and the second detection potential is equal to or higher than the second threshold potential. The inspection system determines that the second terminal and the fourth terminal are not connected when the second detection potential is lower than the second threshold potential.

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