JP2011220704A - Measuring method for laser diode - Google Patents

Abstract

PROBLEM TO BE SOLVED: To automatically measure a large number of laser diodes individually against multiple temperature ranges.SOLUTION: Eight work-piece receiver holders are provided at 45 degrees pitch in the peripheral line vicinity of a round index table whose each rotation angle is 45 degrees, and the holders are alternately for high temperature and medium temperature measurement. A feed section of the work-piece is a particular location of the holders, and a test section is the sixth location counted in the rotation direction from the feed section. Firstly, a first work-piece is provided to the holder located at the feed section and turned twice at 45 degrees, and a second work-piece is provided to the holder located at the feed section, and when the measurement for the first work-piece finishes at the test section at high temperature or medium temperature it transfers to a holder at temperature different from that of the measured and front adjoining one in the rotation direction. Measurement is performed once again at the test section at different temperature, and when measurement finishes, the first work-piece is picked up and received at the location front adjoining to the test section in rotation direction and stored. This work is repeated as many times as the number of work-pieces.

Description

  The present invention relates to a method for measuring a laser diode, and more particularly to a method for measuring a laser diode for measuring the relationship between the current and optical and electrical characteristics of a laser diode in a temperature range of 2 to 3 and checking the characteristics.

  Conventionally, a laser diode has a difference in the amount of current with respect to a constant amount of light depending on the temperature of the surrounding area, and a higher temperature requires more current. Conversely, light is emitted with a small current at low temperatures. When viewed for each workpiece, the light varies depending on the temperature, resulting in a scattered state.

  In order to measure the above-mentioned state and check the quality of the product, a temperature test has been carried out. Conventionally, the work is set by hand on a tray-shaped jig, each temperature is set, and one is set. The measurement is performed one by one, which is very inefficient, takes time, and places a heavy burden on the operator.

  The applicant has investigated prior technical documents regarding the present invention, but has not found anything that is related to the present invention and seems to be similar.

  The problem to be solved by the present invention is that there has conventionally not been a method for automatically measuring a plurality of laser diodes one by one in a plurality of temperature ranges.

  In order to solve the above-described problems, the laser diode measuring method according to the present invention has a circular shape and eight workpieces at a 45 ° pitch in the vicinity of the outer peripheral edge of the index table that is 45 ° at one rotation angle. A receiving holder is provided, and every other holder is for high temperature measurement and medium temperature measurement, and a specific position of the above holders is used as a workpiece supply unit, and counted from the supply unit in the rotation direction. The sixth position (270 degree position) is used as the measurement unit. First, the first workpiece is supplied to the holder located in the supply unit, rotated twice at 45 degrees, and the holder located in the supply unit at that time. When the first workpiece is measured at the high temperature or medium temperature in the measuring section, it is transferred to the holder at a temperature different from the measured one that is next to the rotation direction. When the measurement at the different temperature is completed again at the measurement unit, the first workpiece is picked up at a position adjacent to the measurement unit by one in the rotation direction and stored as inspected by the number of workpieces. It is characterized by repetition, and a 45-degree rotation time is 4 seconds.

  In addition, the laser diode measuring method according to the present invention is provided with nine workpiece receiving holders at a pitch of 40 degrees in the vicinity of the outer periphery of the index table having a circular shape and a rotation angle of 40 degrees. Three each for high temperature measurement, normal temperature measurement, and low temperature measurement are provided every two, and a specific position in the holder is set as a workpiece supply unit, and the seventh is counted from the supply unit in the rotation direction. The position (280 degrees) is taken as the measurement part. First, the first work is supplied to the holder located in the supply part and rotated three times at 40 degrees. At that time, the second work is placed in the holder located in the supply part. When the first workpiece is measured at the high temperature, normal temperature, or low temperature, the first workpiece is transferred to a holder at a temperature different from the measured value. , When the measurement at the second temperature is completed in the measurement unit, the first work is further transferred to the next adjacent holder in the rotation direction, and when the third measurement is completed, It is characterized by repeating the work of picking up at the position next to the measurement unit one turn in the rotation direction and storing it as inspected as many times as the number of workpieces, and the rotation time of 40 degrees per time is 7.5 seconds. It is characterized by.

  Furthermore, the laser diode measuring method according to the present invention is provided with 10 workpiece receiving holders at a 36 ° pitch in the vicinity of the outer peripheral edge of the index table having a circular shape and a rotation angle of 108 °. One is an unused empty holder, and the remaining nine holders are provided for every three for high temperature measurement, room temperature measurement, and low temperature measurement, and a specific position among the above holders is used as a work supply unit, The position of 144 degrees in the rotation direction from the supply section is used as a measurement section. First, the first work is supplied to the supply section and rotated by 108 degrees. At that time, the second work is supplied to the holder located in the supply section. When the first workpiece is measured at the high temperature, normal temperature or low temperature in the measuring section, it is transferred to the holder next to the rotation direction, and the second temperature is again measured. When the first measurement is completed, the first workpiece is further transferred to a holder at a different temperature, which is adjacent to the rear in the rotation direction. When the third measurement is completed, the position of 108 degrees in the rotation direction is obtained from the measurement unit. The operation of picking up and storing as inspected is repeated for the number of workpieces, and the rotation time of one 108 degrees is 7.5 seconds.

  The laser diode measuring method according to the present invention is configured as described above. Therefore, by sequentially rotating the index table at a preset rotation angle, a single workpiece characteristic is automatically measured numerically in a temperature range of 2 to 3, It is very efficient, the measurement work is smooth, and the burden and time on the worker are greatly reduced.

It is a figure which shows the holder positional relationship of the index table of a 1st Example. It is a figure which shows a cycle. It is a figure which shows the holder positional relationship of the index table of 2nd Example. It is a figure which shows a cycle. It is a figure which shows the holder positional relationship of the index table of a 3rd Example. It is a figure which shows a cycle.

  This is realized by the configuration shown in the drawing and described in the embodiment.

  Next, a first embodiment of the present invention will be described with reference to FIGS. 1 and 2, reference numeral 1 denotes a circular index table. In the vicinity of the outer peripheral edge of the index table 1, eight holders 2, 2a, 2b, 2c, 3, 3a, 3b, 3c are provided. The index table 1 rotates clockwise at a rotation angle of 45 degrees, and its cycle time is 4 seconds. Here, the cycle time, i.e., the rotation time, is a time from when the rotation starts once to stop until the next rotation starts, and includes the measurement time.

  In FIG. 2, the numbers at the top of each figure indicate the elapsed time (seconds), and the position of the holder 2 shown in FIG. 1 is the target workpiece in the initial state (elapsed time 0). (Laser diode) supply section. The holders 2, 2a... 3, 3a... In this index table 1 are intended for high temperature (85.degree. C.) and medium temperature (50.degree. C.). In this embodiment, 2, 2a. 3a is the medium temperature. Further, although this temperature control uses an element of the Bertier effect (thermoelectromotive force), it can be replaced by a heater or the like. Then, the position of the sixth holder 2c shown in FIG. 1 is a measuring section for measuring the relationship between current and wavelength (IL / λ), and the position of 3c is finally the work from the index table 1. It is a storage part that is taken out and stored in a jig.

  First, the first workpieces (laser diodes) are picked up from a tray jig accommodated in a large number of rows by means such as a collet chuck or a vacuum chuck and supplied to the supply unit. After this supply, when the index table 1 is rotated for one cycle, that is, 45 degrees, the holder 3c is positioned in the supply unit. Here, a new (second) workpiece is not supplied to the holder 3c. Furthermore, the index table 1 is further rotated by 45 degrees. Accordingly, the holder 2c is positioned in the supply unit. At this time, the second workpiece is supplied to the holder 2c located in the supply unit.

  When the above operations are sequentially performed and rotated 6 times (after 24 seconds), the holder 2 to which the first workpiece is supplied is positioned at the measurement unit, and first, measurement at a high temperature is performed. After the measurement at this high temperature, the index table 1 further rotates 45 degrees and sends the first workpiece to the position of the storage unit. Here, the first workpiece is prepared for the next measurement at the middle temperature, It is transferred to the holder 3 adjacent to the previous one in the rotational direction by the chuck device described above. At this point, all of the four workpieces have been supplied to the holders 2, 2a,.

  When the first workpiece is transferred to the medium temperature measuring holder 3 and the index table 1 is further rotated by 45 degrees, the empty holder 2 is positioned in the supply section. Will be supplied. At this time, the holder 2c to which the second workpiece is supplied is positioned in the measurement unit, and measurement is performed at a high temperature. When this operation is sequentially performed, at the 13th rotation (52 seconds), the holder 3 to which the first workpiece is supplied is positioned in the measurement unit, and this time, measurement at an intermediate temperature is performed. When the measurement at the intermediate temperature is completed, the holder 3 is shifted to the position of the storage portion, and is picked up by the chuck device from the index table 1 at that position and stored in the jig tray.

  When the first workpiece is picked up and stored, the eighth workpiece is supplied to the holder 2a adjacent to the front of the holder 3. This operation is sequentially repeated, and finally the last workpiece becomes the 16th, and 45 rotations of 45 degrees are completed in 176 seconds until the storage of the last workpiece. That is, supply, high temperature measurement, transfer, medium temperature measurement, and storage operations can be continuously performed for 16 workpieces in less than 3 minutes.

  Next, a second embodiment of the present invention will be described with reference to FIGS. 1a shows an index table used as the second embodiment, and nine holders 4, 4a, 4b, 5, 5a, 5b, 6, 6a, 6b are divided by 40 degrees from the center near the outer periphery of the index table. The index table 1a rotates clockwise at a rotation angle of 40 degrees, and its cycle time is 7.5 seconds.

  In FIG. 4, the numbers at the top of each figure indicate the elapsed time (seconds), and in the initial state (elapsed time 0), the position of the holder 4 shown in FIG. 3 is the target workpiece. (Laser diode) supply section. The holders 4, 4a, 5, 5, 5a, 6, 6a, etc. in the index table 1a are set at a low temperature (about −10 ° C.), a normal temperature (about 25 ° C.), and a high temperature (about 80 ° C. to 90 ° C.). In this second embodiment, the holders 4, 4a,... Are at a low temperature, 5, 5a, are at room temperature, and 6, 6a, are at a high temperature. This temperature control is the same as in the first embodiment, and the position of the seventh holder 5b from the supply section shown in FIG. 3 is the same as the measurement section in the first embodiment, and is adjacent to the front of the holder 5b. The position 6b finally becomes a storage portion for taking out the work from the index table 1a and storing it in a jig.

  First, the first workpiece (laser diode) is picked up from the tray jig by the same means as described above and supplied to the holder 4 located in the supply unit. After that, when the holder 4b corresponding to the same low temperature as the holder 4 is positioned in this supply section, the second workpiece is supplied thereto by rotating it for 3 cycles with a rotation angle of 40 degrees. When the holder 4a is further rotated for 3 cycles and the holder 4a is positioned in the supply unit, the third workpiece is supplied to the holder 4a. When the holder 4a is further rotated for one cycle, the holder 4 to which the first workpiece is supplied is measured. Where the low temperature measurement is made.

  When the low temperature measurement of the first workpiece supplied to the holder 4 is completed, it is further rotated by one cycle, and when the holder 4 comes to the position adjacent to the front of the measuring section, the first workpiece is moved from the holder 4 to the next. In preparation for the measurement at room temperature, it is transferred to the holder 5 adjacent to the front by a chuck device. Furthermore, when the holder 4 is rotated again for one cycle and positioned in the supply unit again, the fourth workpiece is supplied thereto.

  With this operation, when the sixth workpiece is supplied to the holder 4a, the first workpiece supplied to the holder 5 is positioned in the measurement unit, and this time measurement is performed at normal temperature. When the measurement of the first workpiece at normal temperature is completed and further rotated for one cycle, the fourth workpiece supplied to the holder 4 is positioned in the measuring section, and the fourth workpiece is at a low temperature. Is measured. At this point, the first workpiece is transferred to the holder 6 adjacent to the front in preparation for the next measurement at a high temperature.

  When such a cycle is repeated and the holder 6 is positioned in the measuring section, the first workpiece is measured at the final high temperature. After this measurement, when rotating for one cycle, the holder 6 is positioned in the storage portion, and the first workpiece is picked up from the holder 6 by the chuck device and stored in the jig. The ninth work is supplied to the holder 4a adjacent to the front of the holder 6 at the time of storage, and all nine holders are instantaneously used.

  By repeating this operation, the final work is finally the fifteenth work, and the storage of the final fifteenth work is completed in 495 seconds with 66 rotations of 40 degrees. That is, supply, measurement at low temperature, transfer, measurement at room temperature, transfer, measurement at high temperature, and storage are automatically performed continuously for 15 workpieces in just over 8 minutes. I can finish it.

  Next, a third embodiment of the present invention will be described with reference to FIGS. In the figure, reference numeral 1b denotes a circular index table. Nine holders 7, 7a, 7b in which an index table 1b is divided by 36 degrees from the center and one unused empty holder is provided in the vicinity of the outer peripheral edge. , 8, 8a, 8b, 9, 9a, 9b, the index table 1b is rotated at a rotation angle of 108 degrees, which is three times the division angle in the clockwise direction, and the cycle time is 7.5 seconds.

  In FIG. 6, the number at the top of each figure indicates the elapsed time (seconds), and the position of the holder 7 shown in FIG. 5 is the position of the target workpiece in the initial state (elapsed time 0). (Laser diode) supply section. The holders 7, 7 b, 7 a, 8, 8 b, 8 a, 9, 9 b, 9 a in this index table 1 b are placed in two counterclockwise directions at low temperatures (about −40 ° C.), normal temperatures (about 25 ° C.), In this third embodiment, 7, 7b and 7a are low temperatures, 8, 8b and 8a are normal temperatures, and 9, 9b and 9a are high temperatures. This temperature control is the same as in the first embodiment and the second embodiment. The position at 144 degrees in the rotation direction from the supply section is the measurement section, and the position at 108 degrees from the measurement section is the workpiece from the index table 1b. It is a storage part that is taken out and stored in a jig. The supply unit is adjacent to the rear in the direction of rotation of the empty holder (there is no need to show the presence of the holder).

  First, the first workpiece (laser diode) is picked up from the tray jig by the same means as described above, and is supplied to the holder 7 for low temperature located in the supply unit. Thereafter, when the index table 1b is rotated by one cycle at a rotation angle of 108 degrees, the holder 7b for low temperature is also positioned in the supply section, so the second work is supplied to the holder 7b, and further, one cycle. When rotated, a holder 7a for low temperature is also positioned in the supply section, and the third work is supplied here. That is, in this example, every rotation of one cycle, the holder of the target temperature is positioned in the supply unit, and workpieces can be supplied one after another.

  Then, when the index table 1b is rotated for eight cycles (60 seconds) in a state where three workpieces are supplied, the holder 7 to which the first workpiece is supplied is positioned in the measurement unit, where the temperature is low. Is measured. After this measurement, when rotating for one cycle, the holder 7b to which the second workpiece is supplied is positioned in the measuring section, and the second workpiece is measured at a low temperature. At this time, the holder 7 to which the first workpiece is supplied is in the storage portion position. Here, the first workpiece is placed in the holder 8b that is adjacent to the rear in preparation for the next measurement at room temperature. Transferred by the chuck device.

  Further, when the rotation is performed for one cycle, the holder 7a to which the third workpiece is supplied is positioned in the measurement unit, and low temperature measurement is performed. At this time, the second workpiece is transferred to the next adjacent holder 8a in preparation for the next normal temperature measurement, and the holder 7 is positioned in the supply section in an empty state, so the fourth workpiece is supplied here. When one cycle is rotated from here, an empty holder is positioned in the measurement unit, and the third workpiece is transferred to the next holder 8 in preparation for measurement at room temperature. At this time, the fifth workpiece is supplied to the holder 7b located in the supply unit.

  Then, when 15 cycles (112.5 seconds) are reached, the holder 8b to which the first workpiece is supplied is positioned in the measurement section, and this time measurement is performed at room temperature. After this measurement, when rotating for one cycle, the holder 8a to which the second workpiece is supplied is positioned in the measuring section and measurement is performed at room temperature. At this time, the holder to which the first workpiece is supplied 8b is in the storage portion position, and this first work is transferred to the holder 9b which is adjacent to the rear in preparation for the next high temperature measurement.

  After this transfer, the holder 9b to which the first workpiece is supplied is positioned in the measurement section with six cycles of rotation, and measurement is performed at a high temperature. When rotating for one cycle after measurement at this high temperature, the holder 9b to which the first workpiece is supplied becomes the storage portion position, where the first workpiece is picked up by the chuck device and stored in the tray jig. It will be.

  By repeating this operation, in the third embodiment, the last workpiece becomes the fifteenth piece, and until the last 15th workpiece is stored, the rotation is completed at 487.5 seconds of 108 revolutions and 65 revolutions. Compared with, it is possible to shorten the 7.5 second working time of one cycle.

  In the second embodiment and the third embodiment, the time for one cycle is made longer than that in the first embodiment because the measurement at a low temperature is incorporated, and the temperature of the Beltier effect element is increased. This is because the time required for the change is anticipated.

  Each embodiment according to the present invention is configured as described above. In this embodiment, the laser diode whose state changes depending on the temperature is the object of measurement, but the method of the present application can be applied to the characteristic measurement of various electronic components whose characteristics change in a plurality of temperature ranges other than the laser diode. it can.

1, 1a, 1b Index table 2, 2a, 2b, 2c High temperature holder 3, 3a, 3b, 3c Medium temperature holder 4, 4a, 4b Low temperature holder 5, 5a, 5b Normal temperature holder 6, 6a, 6b High temperature holder Holder 7, 7a, 7b Low temperature holder 8, 8a, 8b Room temperature holder 9, 9a, 9b High temperature holder

Claims (6)

  Equipped with eight workpiece receiving holders at a 45 ° pitch near the outer periphery of the index table, which is circular and has a rotation angle of 45 °, and the holders are for high temperature measurement and medium temperature measurement. A specific position in the holder described above is used as a workpiece supply unit, and a sixth position (270-degree position) counted from the supply unit in the rotation direction is used as a measurement unit. The first work is supplied to the holder and rotated twice at 45 degrees. At that time, the second work is continuously supplied to the holder located in the supply unit. When the measurement at the high temperature or medium temperature is completed in the measurement unit, it is transferred to a holder at a temperature different from the measured value that is next to the rotation direction, and when the measurement at the measurement unit is completed again, the first measurement is completed. Work is measured Method of measuring the laser diode picked up at a position where the one Maetonari rotationally from parts, and repeating the task of accommodating the inspected for the number of work.   The method for measuring a laser diode according to claim 1, wherein a 45-degree rotation time is 4 seconds.   Nine workpiece holders are provided in the vicinity of the outer periphery of the index table with a circular shape and a single rotation angle of 40 degrees, with a 40-degree pitch, and two holders for high temperature measurement, room temperature measurement, and low temperature. Three each for measurement are provided, and a specific position in the holder is used as a workpiece supply unit, and the seventh position (280 degrees) counted from the supply unit in the rotation direction is used as a measurement unit. The first work is supplied to the holder located in the section and rotated three times at 40 degrees. At that time, the second work is continuously supplied to the holder located in the feed section. When the workpiece is measured at high temperature, normal temperature or low temperature at the measuring part, it is transferred to the holder at the temperature different from the measured one next to the rotation direction, and the measurement part again measures at the second temperature. When is finished The first workpiece is transferred to a holder at a different temperature, which is next to the front in the rotation direction, and when the third measurement is completed, the first workpiece is picked up at the next position in the rotation direction from the measurement unit. The method of measuring a laser diode, characterized in that the operation of storing as inspected is repeated by the number of workpieces.   4. The laser diode measuring method according to claim 3, wherein a rotation time of 40 degrees per time is 7.5 seconds.   It is round and has 10 workpiece receiving holders at a pitch of 36 degrees near the outer periphery of the index table with a single rotation angle of 108 degrees, one of which is an unused empty holder and the remaining 9 holders Has three each for high temperature measurement, room temperature measurement, and low temperature measurement, and a specific position of the holder is used as a workpiece supply unit, and a position of 144 degrees is measured from the supply unit in the rotation direction. First, the first workpiece is supplied to the supply unit and rotated by 108 degrees, and the operation of supplying the second workpiece to the holder located in the supply unit at that time is sequentially continued. When the measurement at the high temperature, normal temperature or low temperature is completed in the measuring section, it is transferred to the holder next to the rotation direction, and when the measurement at the second temperature is completed again, the first workpiece is rotated further. When the third measurement is completed, the work is picked up at a position of 108 degrees in the rotation direction from the measurement unit and stored as inspected. A method of measuring a laser diode, characterized in that it is repeated only.   6. The laser diode measuring method according to claim 5, wherein a rotation time of one 108 degrees is 7.5 seconds.

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