JP2011181315A - Switch, method for manufacturing the same, and relay - Google Patents

Switch, method for manufacturing the same, and relay Download PDF

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JP2011181315A
JP2011181315A JP2010043899A JP2010043899A JP2011181315A JP 2011181315 A JP2011181315 A JP 2011181315A JP 2010043899 A JP2010043899 A JP 2010043899A JP 2010043899 A JP2010043899 A JP 2010043899A JP 2011181315 A JP2011181315 A JP 2011181315A
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contact
substrate
conductive layer
contacts
movable
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JP5187327B2 (en
Inventor
Takahiro Masuda
貴弘 増田
Naoki Yoshitake
直毅 吉武
Kenichi Hinuma
健一 日沼
Junya Yamamoto
淳也 山本
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Omron Corp
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Omron Corp
Omron Tateisi Electronics Co
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Priority to JP2010043899A priority Critical patent/JP5187327B2/en
Priority to EP11151193A priority patent/EP2365498A1/en
Priority to KR1020110007598A priority patent/KR101272359B1/en
Priority to CN2011100380647A priority patent/CN102194614A/en
Priority to US13/029,898 priority patent/US20110209970A1/en
Publication of JP2011181315A publication Critical patent/JP2011181315A/en
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Publication of JP5187327B2 publication Critical patent/JP5187327B2/en
Priority to US13/961,279 priority patent/US20140034465A1/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00Contacts
    • H01H1/0036Switches making use of microelectromechanical systems [MEMS]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00Contacts
    • H01H1/02Contacts characterised by the material thereof
    • H01H1/021Composite material
    • H01H1/023Composite material having a noble metal as the basic material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00Contacts
    • H01H1/06Contacts characterised by the shape or structure of the contact-making surface, e.g. grooved
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H59/00Electrostatic relays; Electro-adhesion relays
    • H01H59/0009Electrostatic relays; Electro-adhesion relays making use of micromechanics
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00Contacts
    • H01H1/0036Switches making use of microelectromechanical systems [MEMS]
    • H01H2001/0052Special contact materials used for MEMS
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00Contacts
    • H01H1/0036Switches making use of microelectromechanical systems [MEMS]
    • H01H2001/0078Switches making use of microelectromechanical systems [MEMS] with parallel movement of the movable contact relative to the substrate

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Composite Materials (AREA)
  • Materials Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Contacts (AREA)
  • Manufacture Of Switches (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a switch and a relay, including a contact with a smooth contacting surface. <P>SOLUTION: A side surface of a fixed contact 33 faces a side surface of a movable contact 34. The fixed contact 33 has an insulating layer 43 and a base layer 44 stacked on a fixed contact substrate 41, and a conductive layer 45 formed thereon through electrolytic plating. The side surface of the conductive layer 45 that faces the movable contact 34 becomes a fixed contact 46 (contacting surface). The movable contact 34 has an insulating layer 53 and a base layer 54 stacked on a movable contact substrate 51, and a movable contact 56 formed thereon through electrolytic plating. A side surface of a conductive layer 55 that faces the fixed contact 33 becomes the movable contact 56 (contacting surface). The fixed contact 46 and the movable contact 56 have surfaces that contact the side surfaces of a mold portion, when the conductive layers 45 and 55 are to be grown through electrolytic plating. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

本発明はスイッチ及びその製造方法並びにリレーに関する。具体的には、金属接点を用いたスイッチとその製造方法に関し、さらに当該スイッチの構造を用いたリレーに関する。   The present invention relates to a switch, a manufacturing method thereof, and a relay. Specifically, the present invention relates to a switch using a metal contact and a manufacturing method thereof, and further relates to a relay using the structure of the switch.

金属接点を接離するMEMSスイッチとしては、例えば特許文献1に開示されたものがある。このスイッチ11においては、図1に示すように、基板12aの上面に絶縁層13aを形成し、その上にAlやCuなどからなる導電層14aを形成し、さらに導電層14aの上面から端面にかけてAuなどのメッキ層15aを成長させることによって可動接点部17を形成している。同様に、基板12bの上面に絶縁層13bを形成し、その上にAlやCuなどからなる導電層14bを形成し、さらに導電層14bの上面から端面にかけてAuなどのメッキ層15bを成長させることによって固定接点部18を形成している。そして、可動接点部17を矢印方向に移動させ、メッキ層15aの突出領域である可動接点16aとメッキ層15bの突出領域である固定接点16bを接触又は離間させることにより、可動接点部17と固定接点部18の間でスイッチング動作を行わせている。   An example of a MEMS switch that contacts and separates metal contacts is disclosed in Patent Document 1. In this switch 11, as shown in FIG. 1, an insulating layer 13a is formed on the upper surface of a substrate 12a, a conductive layer 14a made of Al, Cu, or the like is formed on the insulating layer 13a, and further from the upper surface to the end surface of the conductive layer 14a. The movable contact portion 17 is formed by growing a plated layer 15a of Au or the like. Similarly, an insulating layer 13b is formed on the upper surface of the substrate 12b, a conductive layer 14b made of Al, Cu, or the like is formed thereon, and a plated layer 15b such as Au is grown from the upper surface to the end surface of the conductive layer 14b. Thus, the fixed contact portion 18 is formed. Then, the movable contact portion 17 is moved in the direction of the arrow, and the movable contact portion 17 is fixed to the movable contact portion 17 by contacting or separating the movable contact 16a that is the protruding region of the plating layer 15a and the fixed contact 16b that is the protruding region of the plating layer 15b. Switching operation is performed between the contact portions 18.

また、静電リレーとしては、例えば特許文献2に開示されたものがある。この静電リレー21では、図2に示すように、可動櫛歯状電極22aと固定櫛歯状電極23aに電圧を加えることによってレバー24aを弾性的に撓ませ、同時に可動櫛歯状電極22bと固定櫛歯状電極23bにも電圧を加えることによってレバー24bを弾性的に撓ませ、レバー24aの先端に形成された可動接点25aとレバー24bの先端に形成された可動接点25bを接触させて可動接点25a、25b間を閉じる。また、各櫛歯状電極22aと23a及び可動櫛歯状電極22bと23bの間の印加電圧を解除することによって可動接点25a、25b間を開離させている。この静電リレー21では、レバー24a、24bの先端部に蒸着、スパッタリング等で金属膜を成膜することにより可動接点25a、25bを作製している。   Moreover, as an electrostatic relay, there exist some which were disclosed by patent document 2, for example. In this electrostatic relay 21, as shown in FIG. 2, by applying a voltage to the movable comb electrode 22a and the fixed comb electrode 23a, the lever 24a is elastically bent, and at the same time, the movable comb electrode 22b and The lever 24b is elastically bent by applying a voltage to the fixed comb-like electrode 23b, and the movable contact 25a formed at the tip of the lever 24a and the movable contact 25b formed at the tip of the lever 24b are brought into contact with each other to move. The contact 25a, 25b is closed. Further, the movable contacts 25a and 25b are separated from each other by releasing the applied voltage between the comb-shaped electrodes 22a and 23a and the movable comb-shaped electrodes 22b and 23b. In the electrostatic relay 21, the movable contacts 25a and 25b are formed by depositing a metal film by vapor deposition, sputtering or the like on the end portions of the levers 24a and 24b.

特表2006−526267号公報JP-T-2006-526267 特開平9−251834号公報Japanese Patent Laid-Open No. 9-251834

特許文献1のスイッチ11では、導電層14aの端面に形成された可動接点16aの表面と導電層14bの端面に形成された固定接点16bの表面とを接離させる構造となっている。従って、可動接点16aと固定接点16bは、そのメッキ層の成長方向と垂直な面(メッキ表面)で互いに接触することになる。   The switch 11 of Patent Document 1 has a structure in which the surface of the movable contact 16a formed on the end surface of the conductive layer 14a and the surface of the fixed contact 16b formed on the end surface of the conductive layer 14b are contacted and separated. Therefore, the movable contact 16a and the fixed contact 16b come into contact with each other on a plane (plating surface) perpendicular to the growth direction of the plating layer.

また、特許文献2の静電リレー21でも、レバー24a、24bの端面に形成された可動接点25a、25bの表面どうしを接離させる構造となっている。従って、この静電リレー21でも、可動接点25a、25bは、その蒸着膜等の成長方法と垂直な面で互いに接触する。   The electrostatic relay 21 of Patent Document 2 also has a structure in which the surfaces of the movable contacts 25a and 25b formed on the end surfaces of the levers 24a and 24b are brought into contact with and separated from each other. Therefore, also in this electrostatic relay 21, the movable contacts 25a and 25b are in contact with each other on a plane perpendicular to the growth method of the deposited film or the like.

しかし、これらの接点の成長方向と垂直な面(接点の表面)はミクロに見るとかなり粗く、不規則で微細な凹凸を有している。そのため、微細に見ると接点どうしの接触面積が小さくなり接点が閉じているときの接触抵抗が大きい。さらに、対向する接点の表面どうしの平行度を得にくいため、余計に接点どうしの接触抵抗が大きくなりやすい。   However, the plane perpendicular to the growth direction of these contacts (contact surface) is considerably rough when viewed microscopically, and has irregular and fine irregularities. Therefore, when viewed finely, the contact area between the contacts is small, and the contact resistance when the contacts are closed is large. Furthermore, since it is difficult to obtain parallelism between the surfaces of the opposing contacts, the contact resistance between the contacts tends to be excessive.

また、メッキ処理を行うとき、スイッチ11における導電層の端面や静電リレー21におけるレバーの端面では電界強度が高いので接点の成長速度が大きく、接点間のギャップ距離を制御するのが難しい。そのため、接点間距離の狭小化が困難であった。   Further, when plating is performed, the electric field strength is high on the end face of the conductive layer in the switch 11 and the end face of the lever in the electrostatic relay 21, so that the contact growth rate is high, and it is difficult to control the gap distance between the contacts. For this reason, it has been difficult to reduce the distance between the contacts.

このような不具合を解消するためには、接点の表面を研磨等によって平滑化する方法が知られているが、接点の研磨工程が増加するので、スイッチやリレーのコストアップの要因となる。   In order to solve such a problem, a method of smoothing the surface of the contact by polishing or the like is known. However, since the contact polishing process increases, it causes an increase in cost of the switch and the relay.

本発明は、このような技術的課題に鑑みてなされたものであって、その目的とするところは研磨等を行うことなく接点の接触面を平滑に形成することのできるスイッチとその製造方法並びに当該スイッチの構造を用いたリレーを提供することにある。   The present invention has been made in view of such technical problems, and the object of the present invention is a switch capable of smoothly forming a contact surface of a contact without polishing or the like, a method for manufacturing the same, and the like. An object of the present invention is to provide a relay using the structure of the switch.

本発明に係るスイッチは、互いに接触又は離間する複数の接点を備えたスイッチにおいて、前記接点を形成するための導電層の成膜時における成長方向に平行な面を、前記接点どうしの接触面としたことを特徴としている。   The switch according to the present invention is a switch having a plurality of contacts that are in contact with or away from each other, and a surface parallel to the growth direction when the conductive layer for forming the contact is formed is defined as a contact surface between the contacts. It is characterized by that.

本発明にあっては、接点どうしの接触面が導電層の成長方向に平行な面となっているので、接点の研磨等を行わずとも、接点の接触面を平滑に形成することができる。よって、接点どうしが接触するときの接触抵抗が小さくなる。また、両接点の接触面が平滑になることで、接点どうしが均一に接触するようになり、接点接触部の破壊が起こりにくくなる。その結果、スイッチの開閉寿命が増し、接点間距離の狭小化が可能になる。   In the present invention, since the contact surfaces of the contacts are parallel to the growth direction of the conductive layer, the contact surfaces of the contacts can be formed smoothly without polishing the contacts. Therefore, the contact resistance when the contacts come into contact with each other is reduced. In addition, since the contact surfaces of both contacts are smooth, the contacts come into uniform contact with each other, and the contact contact portion is less likely to break. As a result, the open / close life of the switch is increased, and the distance between the contacts can be reduced.

本発明に係るスイッチのある実施態様は、前記接点の接触面は、前記導電層を成長させる際に前記導電層の形成領域を定めるためのモールド部に接していた面であることを特徴としている。かかる実施態様によれば、モールド部の面を利用して接点の接触面を形成することができるので、接点の接触面を平滑に形成することができる。   An embodiment of the switch according to the present invention is characterized in that the contact surface of the contact is a surface that is in contact with a mold portion for defining a formation region of the conductive layer when the conductive layer is grown. . According to such an embodiment, the contact surface of the contact can be formed using the surface of the mold part, so that the contact surface of the contact can be formed smoothly.

本発明に係るスイッチの製造方法は、互いに接触又は離間する複数の接点を備えたスイッチの製造方法であって、基板の上方に所定パターンのモールド部を形成する工程と、前記基板の上方において前記モールド部の形成されている領域を除く複数領域に導電層を前記基板の厚み方向で成長させる工程と、前記モールド部を除去し、前記導電層の前記モールド部側面に接していた面を前記接点どうしの接触面とする工程と、前記導電層が形成された複数領域に合わせて前記基板を複数に分割する工程とを備えたことを特徴としている。   A method of manufacturing a switch according to the present invention is a method of manufacturing a switch having a plurality of contacts that are in contact with or separated from each other, the step of forming a mold part having a predetermined pattern above a substrate, A step of growing a conductive layer in a thickness direction of the substrate in a plurality of regions excluding a region where a mold portion is formed; and removing the mold portion and contacting a surface of the conductive layer that is in contact with the side surface of the mold portion And a step of dividing the substrate into a plurality of regions in accordance with a plurality of regions where the conductive layers are formed.

本発明のスイッチの製造方法によれば、導電層を形成する際にモールド部の側面によって接点の接触面を成形することができるので、接点の研磨等を行わずとも、接点の接触面を平滑に形成することができる。よって、接点どうしが接触するときの接触抵抗が小さくなる。また、両接点の接触面が平滑になることで、接点どうしの接触位置が分散され、接点接触部の破壊が起こりにくくなる。その結果、スイッチの開閉寿命が増し、接点間距離の狭小化が可能になる。   According to the switch manufacturing method of the present invention, when the conductive layer is formed, the contact surface of the contact can be formed by the side surface of the mold part, so that the contact surface of the contact can be smoothed without polishing the contact. Can be formed. Therefore, the contact resistance when the contacts come into contact with each other is reduced. Further, since the contact surfaces of both the contacts are smoothed, the contact positions of the contacts are dispersed, and the contact contact portion is not easily broken. As a result, the open / close life of the switch is increased, and the distance between the contacts can be reduced.

本発明に係るスイッチの製造方法のある実施態様は、対向する前記接点どうしを形成するための前記モールド部の両側面を互いに平行に形成することを特徴としている。かかる実施態様によれば、接点どうしの接触面を互いに平行にすることができる。   An embodiment of the method for manufacturing a switch according to the present invention is characterized in that both side surfaces of the mold part for forming the opposing contacts are formed in parallel to each other. According to this embodiment, the contact surfaces of the contacts can be made parallel to each other.

本発明に係るスイッチの製造方法においては、前記導電層は電解メッキ又は無電解メッキによって基板の上方に成長させることもでき、また蒸着やスパッタリング等の堆積法によって基板の上方に成長させてもよい。堆積法の場合には、モールド部の上に堆積した導電層の材料は、モールド部を除去する工程でモールド部とともに除去することができる。   In the method for manufacturing a switch according to the present invention, the conductive layer may be grown above the substrate by electrolytic plating or electroless plating, or may be grown above the substrate by a deposition method such as vapor deposition or sputtering. . In the case of the deposition method, the material of the conductive layer deposited on the mold part can be removed together with the mold part in the process of removing the mold part.

本発明に係るリレーは、本発明に係るスイッチと、前記接点の一部を前記接点どうしの接触面と垂直な方向へ移動させて接点どうしを接触又は離間させるためのアクチュエータとを備えたことを特徴としている。本発明のリレーにあっては、接点どうしの接触面を平滑に形成することができるので、接点どうしが接触するときの接触抵抗が小さくなる。また、両接点の接触面が平滑になることで、接点どうしが均一に接触するようになり、接点接触部の破壊が起こりにくくなる。その結果、リレーの寿命が増す。   The relay according to the present invention includes the switch according to the present invention and an actuator for moving a part of the contact in a direction perpendicular to a contact surface between the contacts to contact or separate the contacts. It is a feature. In the relay of the present invention, the contact surface between the contacts can be formed smoothly, so that the contact resistance when the contacts come into contact with each other is reduced. In addition, since the contact surfaces of both contacts are smooth, the contacts come into uniform contact with each other, and the contact contact portion is less likely to break. As a result, the life of the relay is increased.

なお、本発明における前記課題を解決するための手段は、以上説明した構成要素を適宜組み合せた特徴を有するものであり、本発明はかかる構成要素の組合せによる多くのバリエーションを可能とするものである。   The means for solving the above-described problems in the present invention has a feature in which the above-described constituent elements are appropriately combined, and the present invention enables many variations by combining such constituent elements. .

図1は、特許文献1に開示されたスイッチの拡大断面図である。FIG. 1 is an enlarged cross-sectional view of a switch disclosed in Patent Document 1. In FIG. 図2は、特許文献2に開示された静電リレーの斜視図である。FIG. 2 is a perspective view of the electrostatic relay disclosed in Patent Document 2. As shown in FIG. 図3は、本発明の実施形態1によるスイッチの構造を示す断面図である。FIG. 3 is a cross-sectional view showing the structure of the switch according to Embodiment 1 of the present invention. 図4(a)〜(d)は、実施形態1のスイッチの製造方法を説明する概略断面図である。4A to 4D are schematic cross-sectional views illustrating a method for manufacturing the switch of the first embodiment. 図5(a)〜(d)は、実施形態1のスイッチの別な製造方法を説明する概略断面図である。5A to 5D are schematic cross-sectional views illustrating another method for manufacturing the switch according to the first embodiment. 図6は、本発明の実施形態2による静電リレーを示す平面図である。FIG. 6 is a plan view showing an electrostatic relay according to Embodiment 2 of the present invention. 図7は、図6のA部を拡大して示す斜視図である。FIG. 7 is an enlarged perspective view showing a portion A of FIG. 図8は、図6のB−B線に沿った概略断面図である。FIG. 8 is a schematic cross-sectional view along the line BB in FIG.

以下、添付図面を参照しながら本発明の好適な実施形態を説明する。但し、本発明は以下の実施形態に限定されるものでなく、本発明の要旨を逸脱しない範囲において種々設計変更することができる。   Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings. However, the present invention is not limited to the following embodiments, and various design changes can be made without departing from the gist of the present invention.

[第1の実施形態]
(構造)
図3は、本発明の実施形態1によるスイッチの構造を示す断面図である。このスイッチ31は、固定接点部33と可動接点部34を備えている。固定接点部33はベース基板32の上面に絶縁膜42を介して固定され、可動接点部34は駆動機構又はアクチュエータによってベース基板32の上面と平行な方向(白抜き矢印で示す方向)に移動する。例えば、本発明のスイッチは、特許文献1に開示されているような構造のMEMSスイッチにも用いることができる。
[First Embodiment]
(Construction)
FIG. 3 is a cross-sectional view showing the structure of the switch according to Embodiment 1 of the present invention. The switch 31 includes a fixed contact portion 33 and a movable contact portion 34. The fixed contact portion 33 is fixed to the upper surface of the base substrate 32 via an insulating film 42, and the movable contact portion 34 is moved in a direction parallel to the upper surface of the base substrate 32 (direction indicated by a white arrow) by a driving mechanism or an actuator. . For example, the switch of the present invention can also be used for a MEMS switch having a structure as disclosed in Patent Document 1.

固定接点部33は、固定接点基板41の上面に絶縁層43と下地層44を成膜し、その上に導電層45を形成したものである。また、可動接点部34は可動接点基板51の上面に絶縁層53と下地層54を成膜し、その上に導電層55を形成したものである。導電層45、55は、電解メッキや無電解メッキ、蒸着、スパッタリング等によって導電材料を厚み方向(図3の矢印方向)に成長させることによって形成されており、それぞれの対向側面が固定接点46(電気的接触面)と可動接点56(電気的接触面)になっている。導電層45、55の材料としては、Pt、Au、Pd、Ir、Ru、Rh、Re、Ta、Pt合金、Au合金などを用いることができる。この固定接点46と可動接点56は、互いに平行に、かつ、平滑に形成されている。したがって、可動接点部34を平行移動させて固定接点46と可動接点56を接触させて両接点46、56を閉じたとき、両接点46、56はほぼ全面において面接触する。   The fixed contact portion 33 is obtained by forming an insulating layer 43 and a base layer 44 on the upper surface of the fixed contact substrate 41 and forming a conductive layer 45 thereon. The movable contact portion 34 is obtained by forming an insulating layer 53 and a base layer 54 on the upper surface of the movable contact substrate 51 and forming a conductive layer 55 thereon. The conductive layers 45 and 55 are formed by growing a conductive material in the thickness direction (the arrow direction in FIG. 3) by electrolytic plating, electroless plating, vapor deposition, sputtering, or the like. Electrical contact surface) and movable contact 56 (electric contact surface). As a material of the conductive layers 45 and 55, Pt, Au, Pd, Ir, Ru, Rh, Re, Ta, Pt alloy, Au alloy, or the like can be used. The fixed contact 46 and the movable contact 56 are formed in parallel and smoothly with each other. Therefore, when the movable contact portion 34 is translated to bring the fixed contact 46 and the movable contact 56 into contact with each other and the both contacts 46 and 56 are closed, the both contacts 46 and 56 are almost in surface contact with each other.

また、導電層45と導電層55の対向部分はそれぞれ固定接点基板41と可動接点基板51の端面から突出しており、固定接点基板41と可動接点基板51の対向面はいずれも下面側ほど引っ込むように傾斜している。したがって、可動接点部34を動かして可動接点56を固定接点46に接触させるとき、固定接点基板41と可動接点基板51が接触して可動接点56と固定接点46の接触を妨げることがない。   The opposing portions of the conductive layer 45 and the conductive layer 55 protrude from the end surfaces of the fixed contact substrate 41 and the movable contact substrate 51, respectively, and the opposing surfaces of the fixed contact substrate 41 and the movable contact substrate 51 are both retracted toward the lower surface side. It is inclined to. Therefore, when the movable contact portion 34 is moved to bring the movable contact 56 into contact with the fixed contact 46, the fixed contact substrate 41 and the movable contact substrate 51 do not interfere with the contact between the movable contact 56 and the fixed contact 46.

(製造方法1)
スイッチ31は、MEMS(Micro Electrical-Mechanical Systems)技術を用いて製作される。図4(a)〜(d)に示す製造方法は、電解メッキによって導電層45、55を作製するものである。図4(a)は、Siからなる基板A1にSiO等の絶縁層A3とメッキ下地層A4を成膜し、さらにメッキ下地層A4の上にモールド部A2を形成したものを示している。メッキ下地層A4は、メッキ電極となるものであり、例えば下層Cr/上層Auからなる2層構造となっていて絶縁層A3と導電層A5との密着性(剥離強度)を高める働きを有している。モールド部A2は、メッキ液に耐性があり、かつ、その後のモールド部除去工程において導電層A5を浸食することなく選択的にエッチング除去される材料を用いる。例えば、メッキ下地層A4の上面に塗布したフォトレジストを露光用マスクを通して露光しエッチングすることによりパターニングしてモールド部A2を形成すればよい。あるいは、メッキ下地層A4の上面に酸化膜(SiO)、窒化膜(SiN)、アルミナ膜(Al)、導電層45及び55と異種の金属膜を成膜した後、フォトリソグラフィ技術を用いて、これらの膜をパターニングしたものをモールド部A2としてもよい。こうしてモールド部A2は導電層45、55を形成しようとする領域以外の領域に形成され、導電層45、55を形成しようとする領域の間でパターニングされたモールド部A2の両側面は、互いに平行で、かつ、平滑となっている。なお、図4(a)には示していないが、基板A1の下面全面はSiO等の絶縁膜42を介してSi基板やガラス基板などからなるベース基板32の上面に固定されている。
(Manufacturing method 1)
The switch 31 is manufactured using MEMS (Micro Electrical-Mechanical Systems) technology. In the manufacturing method shown in FIGS. 4A to 4D, the conductive layers 45 and 55 are produced by electrolytic plating. FIG. 4A shows an insulating layer A3 such as SiO 2 and a plating base layer A4 formed on a substrate A1 made of Si and a mold portion A2 formed on the plating base layer A4. The plating base layer A4 serves as a plating electrode. For example, the plating base layer A4 has a two-layer structure composed of lower layer Cr / upper layer Au, and has a function of improving adhesion (peeling strength) between the insulating layer A3 and the conductive layer A5. ing. The mold part A2 uses a material that is resistant to the plating solution and that is selectively etched away without eroding the conductive layer A5 in the subsequent mold part removal step. For example, the mold part A2 may be formed by patterning by exposing and etching a photoresist applied to the upper surface of the plating base layer A4 through an exposure mask. Alternatively, after forming an oxide film (SiO 2 ), a nitride film (SiN), an alumina film (Al 2 O 3 ), a metal film different from the conductive layers 45 and 55 on the upper surface of the plating base layer A4, a photolithography technique A pattern obtained by patterning these films using, may be used as the mold part A2. Thus, the mold part A2 is formed in a region other than the region where the conductive layers 45 and 55 are to be formed, and both side surfaces of the mold part A2 patterned between the regions where the conductive layers 45 and 55 are to be formed are parallel to each other. And it is smooth. Although not shown in FIG. 4A, the entire lower surface of the substrate A1 is fixed to the upper surface of the base substrate 32 made of an Si substrate, a glass substrate or the like via an insulating film 42 such as SiO 2 .

ついで、この基板A1をメッキ浴に浸漬し、メッキ下地層A4をメッキ電極として電解メッキを行うと、図4(b)に示すように、メッキ下地層A4の表面にはPtなどのメッキ金属粒子が次第に析出し、導電層A5が基板A1の厚み方向に成長する。モールド部A2により覆われている領域にはメッキ金属粒子は析出しない。なお、電解メッキに代えて無電解メッキ(化学メッキ)を行ってもよい。   Next, when this substrate A1 is immersed in a plating bath and electrolytic plating is performed using the plating base layer A4 as a plating electrode, plating metal particles such as Pt are formed on the surface of the plating base layer A4 as shown in FIG. Gradually deposit, and the conductive layer A5 grows in the thickness direction of the substrate A1. Plated metal particles do not precipitate in the region covered with the mold part A2. Note that electroless plating (chemical plating) may be performed instead of electrolytic plating.

メッキ浴から取り出した基板A1を水洗した後、モールド部A2をエッチングにより除去すると、図4(c)に示すように、導電層45、55を形成しようとする領域間でモールド部A2のあったところに空洞A6が生じる。空洞A6で分離された一方の導電層A5は導電層55となり、空洞A6に面する側面が可動接点56となる。また、空洞A6で分離された他方の導電層A5は導電層45となり、空洞A6に面する側面が固定接点46になる。   After the substrate A1 taken out from the plating bath was washed with water and the mold part A2 was removed by etching, there was a mold part A2 between the regions where the conductive layers 45 and 55 were to be formed, as shown in FIG. There is a cavity A6. One conductive layer A5 separated by the cavity A6 becomes the conductive layer 55, and the side surface facing the cavity A6 becomes the movable contact 56. The other conductive layer A5 separated by the cavity A6 becomes the conductive layer 45, and the side surface facing the cavity A6 becomes the fixed contact 46.

ついで、図4(d)に示すように、空洞A6からエッチング液を浸入させて順次メッキ下地層A4及び絶縁層A3を2つに分割する。さらに、基板A1を下面側からエッチングして、あるいは空洞A6側からエッチングして2つに分割し、それぞれ一方を下地層54、絶縁層53及び可動接点基板51とし、他方を下地層44、絶縁層43及び固定接点基板41とする。   Next, as shown in FIG. 4D, an etching solution is introduced from the cavity A6 to sequentially divide the plating base layer A4 and the insulating layer A3 into two. Further, the substrate A1 is etched from the lower surface side or etched from the cavity A6 side and divided into two parts, one of which is the base layer 54, the insulating layer 53, and the movable contact substrate 51, and the other is the base layer 44, insulating. A layer 43 and a fixed contact substrate 41 are provided.

こうして一方のブロックは、固定接点基板41、絶縁層43、下地層44及び導電層45が積層した固定接点部33となる。この固定接点部33は絶縁膜42を介してベース基板32の上面に固定されている。また、他方のブロックは、可動接点基板51、絶縁層53、下地層54及び導電層55が積層した可動接点部34となる。この可動接点部34は、最後に下面の絶縁膜をエッチング除去するこによりベース基板32から分離され、スイッチ31(MEMSスイッチ)が製作される。   Thus, one block becomes the fixed contact portion 33 in which the fixed contact substrate 41, the insulating layer 43, the base layer 44, and the conductive layer 45 are laminated. The fixed contact portion 33 is fixed to the upper surface of the base substrate 32 through an insulating film 42. The other block is the movable contact portion 34 in which the movable contact substrate 51, the insulating layer 53, the base layer 54, and the conductive layer 55 are laminated. The movable contact portion 34 is finally separated from the base substrate 32 by etching away the insulating film on the lower surface, and the switch 31 (MEMS switch) is manufactured.

(製造方法2)
また、このスイッチ31は、図5(a)〜(d)に示すような工程で作製することもできる。この製造方法は、蒸着やスパッタリング等によって導電層45、55を作製するものである。図5(a)は、図4(a)に相当する工程であるが、絶縁層A3の上にはメッキ下地層A4でなく、絶縁層A3と導電層A5との密着強度(剥離強度)を高めるための密着層A7(例えば、下層Cr/上層Auからなる2層構造)を形成している。また、図5(b)の工程では、蒸着やスパッタリング等によって密着層A7の上にPtなどの金属材料を堆積させている。蒸着やスパッタリング等の堆積法によれば、図5(b)のようにモールド部A2の上にも導電層A5が堆積するが、モールド部A2の高さが十分にあれば、モールド部A2をエッチングに除去することにより、同時にモールド部A2の上の導電層A5も除去される(リフトオフ法)。
(Manufacturing method 2)
In addition, the switch 31 can be manufactured by a process as shown in FIGS. In this manufacturing method, the conductive layers 45 and 55 are formed by vapor deposition, sputtering, or the like. FIG. 5A is a process corresponding to FIG. 4A, but the adhesion strength (peeling strength) between the insulating layer A3 and the conductive layer A5, not the plating base layer A4, is provided on the insulating layer A3. An adhesion layer A7 (for example, a two-layer structure composed of lower layer Cr / upper layer Au) is formed to increase the thickness. In the step of FIG. 5B, a metal material such as Pt is deposited on the adhesion layer A7 by vapor deposition, sputtering, or the like. According to a deposition method such as vapor deposition or sputtering, the conductive layer A5 is deposited on the mold part A2 as shown in FIG. 5B, but if the mold part A2 has a sufficient height, the mold part A2 is By removing by etching, the conductive layer A5 on the mold part A2 is also removed at the same time (lift-off method).

図5(c)のようにモールド部A2が除去された後に空洞A6ができて、導電層A5が導電層55と導電層45に分離される点は、図4(c)の工程と同じである。また、図5(d)のように空洞A6からエッチング液を浸入させて順次密着層A7及び絶縁層A3を2つに分割し、さらに基板A1を2つに分割し、それぞれ一方を下地層54、絶縁層53及び可動接点基板51とし、他方を下地層44、絶縁層43及び固定接点基板41とする点も、図4(d)の工程と同じである。   The point that the cavity A6 is formed after the mold part A2 is removed as shown in FIG. 5C and the conductive layer A5 is separated into the conductive layer 55 and the conductive layer 45 is the same as the process of FIG. is there. Further, as shown in FIG. 5D, an etching solution is introduced from the cavity A6 to sequentially divide the adhesion layer A7 and the insulating layer A3 into two, and further divide the substrate A1 into two, one of which is a base layer 54. The insulating layer 53 and the movable contact substrate 51 are used, and the other is the base layer 44, the insulating layer 43, and the fixed contact substrate 41, which is the same as the process of FIG.

(作用効果)
本発明のスイッチ31にあっては、固定接点46の接触面と可動接点56の接触面が導電層A5の成長方向と平行であるので、研磨等を行わずとも、モールド部の側面で接触面を平滑に成形することができる。また、両接点46、56の接触面の平行度も向上する。よって、両接点46、56どうしが接触しているときの接触抵抗が小さくなる。
(Function and effect)
In the switch 31 of the present invention, the contact surface of the fixed contact 46 and the contact surface of the movable contact 56 are parallel to the growth direction of the conductive layer A5. Can be formed smoothly. Moreover, the parallelism of the contact surfaces of both contacts 46 and 56 is also improved. Therefore, the contact resistance when both the contacts 46 and 56 are in contact with each other is reduced.

また、両接点46、56間のギャップ距離の精度を高めてバラツキを小さくできるので、接点間のギャップ距離を狭小化でき、アクチュエータによる可動接点56の移動距離を小さくできる。さらに、固定接点46と可動接点56の表面が平滑になるので、接点どうしの接触位置が分散され、接点接触部の破壊が起こりにくく、スイッチ31の開閉寿命が長くなる。   Moreover, since the accuracy of the gap distance between both the contacts 46 and 56 can be increased and the variation can be reduced, the gap distance between the contacts can be reduced, and the moving distance of the movable contact 56 by the actuator can be reduced. Furthermore, since the surfaces of the fixed contact 46 and the movable contact 56 are smoothed, the contact positions between the contacts are dispersed, the contact contact portion is not easily broken, and the open / close life of the switch 31 is extended.

[第2の実施形態]
つぎに、本発明の実施形態2による高周波用の静電リレー31Aの構造を説明する。図6は、静電リレー31Aの構造を示す平面図である。図7は、図6のA部を拡大して示す斜視図である。図8は、図6のB−B線に沿った概略断面図である。
[Second Embodiment]
Next, the structure of a high-frequency electrostatic relay 31A according to Embodiment 2 of the present invention will be described. FIG. 6 is a plan view showing the structure of the electrostatic relay 31A. FIG. 7 is an enlarged perspective view showing a portion A of FIG. FIG. 8 is a schematic cross-sectional view along the line BB in FIG.

この静電リレー31Aは、Si基板やガラス基板等からなるベース基板32の上面に固定接点部33、可動接点部34、固定電極部35、可動接点部34を支持する可動電極部36、弾性バネ37、弾性バネ37を支持する支持部38を設けたものである。   The electrostatic relay 31A includes a fixed contact portion 33, a movable contact portion 34, a fixed electrode portion 35, a movable electrode portion 36 that supports the movable contact portion 34, and an elastic spring on the upper surface of a base substrate 32 made of a Si substrate, a glass substrate, or the like. 37, a support portion 38 for supporting the elastic spring 37 is provided.

図8に示すように、固定接点部33は、Siからなる固定接点基板41の下面を絶縁膜42(SiO)によってベース基板32の上面に固定されている。固定接点基板41の上面には酸化膜(SiO)や窒化膜(SiN)等からなる絶縁層43が形成され、その上面に下層Cr/上層Auからなる下地層44が形成されており、下地層44の上にPtなどの導電層45a、45bが形成されている。 As shown in FIG. 8, in the fixed contact portion 33, the lower surface of the fixed contact substrate 41 made of Si is fixed to the upper surface of the base substrate 32 by an insulating film 42 (SiO 2 ). An insulating layer 43 made of an oxide film (SiO 2 ), a nitride film (SiN) or the like is formed on the upper surface of the fixed contact substrate 41, and an underlayer 44 made of lower layer Cr / upper layer Au is formed on the upper surface. Conductive layers 45 a and 45 b such as Pt are formed on the ground layer 44.

また、図6及び図7に示すように、固定接点基板41はベース基板32の上面端部において幅方向(X方向)に延びており、中央部には可動接点部34側へ向けて突出した張出部41aが形成され、両端にそれぞれパッド支持部41b、41bが形成されている。導電層45a、45bは固定接点基板41の上面に沿って配線されており、導電層45a、45bの一方端部は張出部41aの上面で互いに平行に配置され、張出部41aの端面から突出した部分の先端面は同一平面内に位置していてそれぞれ固定接点46a、46b(電気的接触面)となっている。また、導電層45a、45bの他方端部には、前記パッド支持部41b、41bの上面において金属パッド部47a、47bが形成されている。   As shown in FIGS. 6 and 7, the fixed contact substrate 41 extends in the width direction (X direction) at the upper surface end portion of the base substrate 32, and protrudes toward the movable contact portion 34 side at the center portion. An overhang portion 41a is formed, and pad support portions 41b and 41b are formed at both ends, respectively. The conductive layers 45a and 45b are wired along the upper surface of the fixed contact board 41, and one end portions of the conductive layers 45a and 45b are arranged in parallel with each other on the upper surface of the overhang portion 41a, and from the end surface of the overhang portion 41a. The protruding end surfaces are located in the same plane and are fixed contacts 46a and 46b (electrical contact surfaces), respectively. Metal pad portions 47a and 47b are formed on the upper surfaces of the pad support portions 41b and 41b at the other end portions of the conductive layers 45a and 45b.

可動接点部34は張出部41aに対向する位置に設けられている。可動接点部34は、図8に示すように、Siからなる可動接点基板51の上面に酸化膜(SiO)や窒化膜(SiN)等からなる絶縁層53が形成され、その上面に下層Cr/上層Auからなる下地層54が形成されており、下地層54の上にPtなどの導電層55が形成されている。導電層45a、45bと対向する導電層55の端面は、可動接点基板51の前面から突出し、しかも固定接点46a、46bと平行に形成されており、当該端面が可動接点56(電気的接触面)となっている。可動接点56は、固定接点46aの外側の縁から固定接点46bの外側の縁までの距離にほぼ等しい幅を有している。 The movable contact portion 34 is provided at a position facing the overhanging portion 41a. As shown in FIG. 8, in the movable contact portion 34, an insulating layer 53 made of an oxide film (SiO 2 ), a nitride film (SiN) or the like is formed on the upper surface of a movable contact substrate 51 made of Si, and a lower layer Cr is formed on the upper surface. / A base layer 54 made of an upper layer Au is formed, and a conductive layer 55 such as Pt is formed on the base layer 54. The end surface of the conductive layer 55 facing the conductive layers 45a and 45b protrudes from the front surface of the movable contact substrate 51 and is formed in parallel with the fixed contacts 46a and 46b, and the end surface is a movable contact 56 (electrical contact surface). It has become. The movable contact 56 has a width substantially equal to the distance from the outer edge of the fixed contact 46a to the outer edge of the fixed contact 46b.

また、可動接点基板51は、可動電極部36から突出した支持梁57によって片持ち状に支持されている。可動接点基板51及び支持梁57の下面はベース基板32の上面から浮いており、可動電極部36とともにベース基板32の長さ方向(Y方向)と平行に移動できる。   In addition, the movable contact substrate 51 is supported in a cantilever manner by a support beam 57 protruding from the movable electrode portion 36. The lower surfaces of the movable contact substrate 51 and the support beam 57 float from the upper surface of the base substrate 32 and can move in parallel with the length direction (Y direction) of the base substrate 32 together with the movable electrode portion 36.

この静電リレー31Aにおいては、固定接点部33の金属パッド部47a、47bに主回路(図示せず)が接続され、可動接点56を固定接点46a、46bに接触させることによって主回路を閉じることができ、可動接点56を固定接点46a、46bから離間させることにより主回路を開くことができる。また、張出部41aと可動接点基板51の対向面はそれぞれ下方へ行くほど後退するように傾斜しており、また固定接点46a、46bが張出部41aより突出するとともに可動接点56も可動接点基板51から突出しているので、接点間を閉じる際に張出部41aと可動接点基板51が接触して可動接点56と固定接点46a、46bとが接触不良を起こすのを防いでいる。   In the electrostatic relay 31A, a main circuit (not shown) is connected to the metal pad portions 47a and 47b of the fixed contact portion 33, and the main circuit is closed by bringing the movable contact 56 into contact with the fixed contacts 46a and 46b. The main circuit can be opened by separating the movable contact 56 from the fixed contacts 46a and 46b. The opposing surfaces of the overhanging portion 41a and the movable contact substrate 51 are inclined so as to recede toward the lower side, the fixed contacts 46a and 46b protrude from the overhanging portion 41a, and the movable contact 56 is also a movable contact. Since it protrudes from the board | substrate 51, when projecting between contacts, the overhang | projection part 41a and the movable contact board | substrate 51 contact, and it prevents that the movable contact 56 and fixed contact 46a, 46b raise | generate a contact failure.

可動接点部34を動かすためのアクチュエータは、固定電極部35、可動電極部36、弾性バネ37及び支持部38によって構成されている。   An actuator for moving the movable contact portion 34 includes a fixed electrode portion 35, a movable electrode portion 36, an elastic spring 37, and a support portion 38.

図6に示すように、ベース基板32の上面には複数本の固定電極部35が互いに平行に配置されている。固定電極部35は、平面視においては、矩形状のパッド部66の両面からY方向へ向けてそれぞれ枝状をした枝状電極部67が延出されている。枝状電極部67は、それぞれ左右対称となるように枝部68が突出しており、枝部68はY方向において一定ピッチで並んでいる。   As shown in FIG. 6, a plurality of fixed electrode portions 35 are arranged on the upper surface of the base substrate 32 in parallel with each other. The fixed electrode portion 35 has branch-like electrode portions 67 extending in a branch shape from both surfaces of the rectangular pad portion 66 in the Y direction in plan view. The branch electrode portions 67 protrude from the branch electrode portions 67 so as to be bilaterally symmetric, and the branch portions 68 are arranged at a constant pitch in the Y direction.

図8に示すように、固定電極部35においては、固定電極基板61の下面が絶縁膜62によってベース基板32の上面に固定されている。また、パッド部66においては、固定電極基板61の上面にCu、Al等によって固定電極63が形成されており、固定電極63の上に電極パッド層65が設けられている。   As shown in FIG. 8, in the fixed electrode portion 35, the lower surface of the fixed electrode substrate 61 is fixed to the upper surface of the base substrate 32 by the insulating film 62. In the pad portion 66, a fixed electrode 63 is formed of Cu, Al or the like on the upper surface of the fixed electrode substrate 61, and an electrode pad layer 65 is provided on the fixed electrode 63.

図6に示すように、可動電極部36は、各固定電極部35を囲むように形成されている。可動電極部36には、各固定電極部35を両側から挟むようにして櫛歯状電極部74が形成されている(固定電極部35間においては、一対の櫛歯状電極部74によって枝状となっている)。櫛歯状電極部74は、各固定電極部35を中心として左右対称となっており、各櫛歯状電極部74からは枝部68間の空隙部へ向けて櫛歯部75が延出している。しかも、各櫛歯部75は、その櫛歯部75と隣接して可動接点部34に近い側に位置する枝部68との距離が、当該櫛歯部75と隣接して可動接点部34から遠い側に位置する枝部68との距離よりも短くなっている。   As shown in FIG. 6, the movable electrode portion 36 is formed so as to surround each fixed electrode portion 35. Comb-like electrode portions 74 are formed in the movable electrode portion 36 so as to sandwich each fixed electrode portion 35 from both sides (a pair of comb-like electrode portions 74 form a branch shape between the fixed electrode portions 35). ing). The comb-like electrode portions 74 are symmetric with respect to each fixed electrode portion 35, and the comb-tooth portions 75 extend from each comb-like electrode portion 74 toward the gap between the branch portions 68. Yes. In addition, each comb tooth 75 has a distance from the branch 68 positioned adjacent to the comb tooth 75 and closer to the movable contact 34 so that the comb tooth 75 is adjacent to the comb tooth 75 from the movable contact 34. It is shorter than the distance to the branch portion 68 located on the far side.

可動電極部36はSiの可動電極基板71からなり、可動電極基板71の下面はベース基板32の上面から浮いている。また、可動電極部36の可動接点側端面の中央には支持梁57が突設されていて支持梁57の先端に可動接点部34が保持されている。   The movable electrode portion 36 is composed of a Si movable electrode substrate 71, and the lower surface of the movable electrode substrate 71 is lifted from the upper surface of the base substrate 32. Further, a support beam 57 projects from the center of the movable contact side end face of the movable electrode portion 36, and the movable contact portion 34 is held at the tip of the support beam 57.

支持部38はSiからなり、ベース基板32の他方端部においてX方向に長く延びている。支持部38の下面は絶縁膜39によってベース基板32の上面に固定されている。支持部38の両端部と可動電極部36(可動電極基板71)とは、Siによって左右対称に形成された一対の弾性バネ37によってつながっており、可動電極部36は弾性バネ37を介して支持部38によって水平に支持されている。また、可動電極部36は弾性バネ37を弾性変形させることによってY方向に移動可能となっている。   The support portion 38 is made of Si and extends long in the X direction at the other end portion of the base substrate 32. The lower surface of the support portion 38 is fixed to the upper surface of the base substrate 32 by an insulating film 39. Both end portions of the support portion 38 and the movable electrode portion 36 (movable electrode substrate 71) are connected by a pair of elastic springs 37 formed symmetrically by Si, and the movable electrode portion 36 is supported via the elastic springs 37. It is supported horizontally by the portion 38. The movable electrode portion 36 is movable in the Y direction by elastically deforming the elastic spring 37.

上記のような構造を有する静電リレー31Aにあっては、固定電極部35と可動電極部36の間に直流電圧源が接続され、制御回路等によって直流電圧がオン、オフされる。固定電極部35では、直流電圧源の一方端子は電極パッド層65に接続される。直流電圧源の他方端子は支持部38に接続される。支持部38及び弾性バネ37は導電性を有しており、支持部38、弾性バネ37及び可動電極基板71は電気的に導通しているので、支持部38に印加した電圧は可動電極基板71に加わることになる。   In the electrostatic relay 31A having the above structure, a DC voltage source is connected between the fixed electrode portion 35 and the movable electrode portion 36, and the DC voltage is turned on and off by a control circuit or the like. In the fixed electrode portion 35, one terminal of the DC voltage source is connected to the electrode pad layer 65. The other terminal of the DC voltage source is connected to the support portion 38. Since the support portion 38 and the elastic spring 37 have conductivity, and the support portion 38, the elastic spring 37, and the movable electrode substrate 71 are electrically connected, the voltage applied to the support portion 38 is the movable electrode substrate 71. Will join.

直流電圧源によって固定電極部35と可動電極部36の間に直流電圧が印加されると、枝状電極部67の枝部68と櫛歯状電極部74の櫛歯部75との間に静電引力が発生する。しかし、固定電極部35及び可動電極部36の構造が、各固定電極部35の中心線に関して対称に形成されているので、可動電極部36に働くX方向の静電引力はバランスし、可動電極部36はX方向には移動しない。一方、各櫛歯部75と隣接して可動接点部34に近い側に位置する枝部68との距離が、当該櫛歯部75と隣接して可動接点部34から遠い側に位置する枝部68との距離よりも短くなっているので、各櫛歯部75が可動接点部側へ吸引され、弾性バネ37を撓ませながら可動電極部36がY方向に移動する。この結果、可動接点部34が固定接点部33側へ移動し、可動接点56が固定接点46a、46bに接触して固定接点46aと固定接点46bの間(主回路)を電気的に閉じる。   When a DC voltage is applied between the fixed electrode portion 35 and the movable electrode portion 36 by a DC voltage source, the static electricity is generated between the branch portion 68 of the branch electrode portion 67 and the comb tooth portion 75 of the comb tooth electrode portion 74. Electric attraction is generated. However, since the structures of the fixed electrode portion 35 and the movable electrode portion 36 are formed symmetrically with respect to the center line of each fixed electrode portion 35, the electrostatic attractive force in the X direction acting on the movable electrode portion 36 is balanced, and the movable electrode The part 36 does not move in the X direction. On the other hand, the distance between each comb tooth portion 75 and the branch portion 68 located on the side close to the movable contact portion 34 is the branch portion located on the side far from the movable contact portion 34 adjacent to the comb tooth portion 75. Since each comb tooth 75 is attracted to the movable contact portion side and the elastic spring 37 is bent, the movable electrode portion 36 moves in the Y direction. As a result, the movable contact portion 34 moves to the fixed contact portion 33 side, the movable contact 56 contacts the fixed contacts 46a and 46b, and the space between the fixed contact 46a and the fixed contact 46b (main circuit) is electrically closed.

また、固定電極部35と可動電極部36の間に印加していた直流電圧を解除すると、枝部68と櫛歯部75の間の静電引力が消失するので、弾性バネ37の弾性復帰力によって可動電極部36がY方向で後退し、可動接点56が固定接点46a、46bから離間して固定接点46aと固定接点46bの間(主回路)が開かれる。   Further, when the DC voltage applied between the fixed electrode part 35 and the movable electrode part 36 is released, the electrostatic attractive force between the branch part 68 and the comb tooth part 75 disappears. As a result, the movable electrode part 36 moves backward in the Y direction, the movable contact 56 is separated from the fixed contacts 46a and 46b, and the space between the fixed contact 46a and the fixed contact 46b (main circuit) is opened.

このような静電リレー31Aは、つぎのような工程で作製される。まず、表面全体を絶縁膜で覆われたベース基板32(Siウエハ、SOIウエハなど)の上面にSi基板(導電性を有する別なSiウエハ)を接合し、当該Si基板の上面に金属材料を蒸着させて電極膜を成膜する。ついで、この電極膜をフォトリソグラフィ技術によりパターニングし、電極膜によりパッド部66において固定電極基板61の上面に固定電極63を形成する。   Such an electrostatic relay 31A is manufactured by the following process. First, a Si substrate (another Si wafer having conductivity) is bonded to the upper surface of a base substrate 32 (Si wafer, SOI wafer, etc.) whose entire surface is covered with an insulating film, and a metal material is bonded to the upper surface of the Si substrate. An electrode film is formed by vapor deposition. Next, this electrode film is patterned by a photolithography technique, and a fixed electrode 63 is formed on the upper surface of the fixed electrode substrate 61 in the pad portion 66 by the electrode film.

この後、電極膜の上からSi基板の上面に絶縁層、下地層及び導電層を積層する。ついで、導電層をパターニングして固定接点部33の導電層45a、45b、可動接点部34の導電層55及び固定電極部35の電極パッド層65を形成する。また、導電層45a、45b及び導電層55の下面の下地層と絶縁層を残してエッチング除去し、残った下地層によって下地層44、54を形成し、残った絶縁層によって絶縁層43、53を形成する。   Thereafter, an insulating layer, a base layer and a conductive layer are stacked on the upper surface of the Si substrate from above the electrode film. Next, the conductive layer is patterned to form the conductive layers 45a and 45b of the fixed contact portion 33, the conductive layer 55 of the movable contact portion 34, and the electrode pad layer 65 of the fixed electrode portion 35. The conductive layers 45a and 45b and the conductive layer 55 are etched away leaving the underlying layer and the insulating layer, the underlying layers 44 and 54 are formed by the remaining underlying layer, and the insulating layers 43 and 53 are formed by the remaining insulating layer. Form.

なお、上記とは異なる手順により、固定電極63、導電層45a、45b及び導電層55を同時に形成してもよい。   Note that the fixed electrode 63, the conductive layers 45a and 45b, and the conductive layer 55 may be formed simultaneously by a procedure different from the above.

この後、導電層45a、導電層55、固定電極63などの上にフォトレジストを塗布してレジストマスクを形成し、このレジストマスクを通してSi基板をエッチングし、各領域に残ったSi基板により固定接点部33の固定接点基板41、可動接点部34の可動接点基板51、固定電極部35の固定電極基板61、可動電極部36の可動電極基板71、弾性バネ37、支持部38を作製する。   Thereafter, a photoresist is applied on the conductive layer 45a, the conductive layer 55, the fixed electrode 63, etc. to form a resist mask, the Si substrate is etched through the resist mask, and the fixed contact is made by the Si substrate remaining in each region. The fixed contact substrate 41 of the portion 33, the movable contact substrate 51 of the movable contact portion 34, the fixed electrode substrate 61 of the fixed electrode portion 35, the movable electrode substrate 71 of the movable electrode portion 36, the elastic spring 37, and the support portion 38 are produced.

最後に、Si基板から露出している領域の絶縁膜と可動接点部34及び可動電極部36の下面の絶縁膜をエッチングによって除去し、個々の静電リレー31Aにカッティングする。   Finally, the insulating film in the region exposed from the Si substrate and the insulating film on the lower surface of the movable contact portion 34 and the movable electrode portion 36 are removed by etching, and the individual electrostatic relays 31A are cut.

可動接点部34と固定電極部35はこのような静電リレー31Aの製造工程において、図4又は図5に示したような工程と同様な工程で作製されるので、固定接点部33の固定接点46a、46bと可動接点部34の可動接点56は、導電層の成長方向と平行な側面となり、研磨などを行うことなく、平滑性と平行性の良好な接点を得ることができる。よって、この静電リレー31Aにおいても、実施形態1のスイッチ31と同様な作用効果を得ることができる。   In the manufacturing process of the electrostatic relay 31A, the movable contact portion 34 and the fixed electrode portion 35 are manufactured in the same process as the process shown in FIG. 4 or FIG. The movable contacts 56a and 46b and the movable contact 56 of the movable contact portion 34 are side surfaces parallel to the growth direction of the conductive layer, and a contact having good smoothness and parallelism can be obtained without polishing. Therefore, also in this electrostatic relay 31A, the same effect as the switch 31 of Embodiment 1 can be obtained.

31 スイッチ
31A 静電リレー
32 ベース基板
33 固定接点部
34 可動接点部
35 固定電極部
36 可動電極部
37 弾性バネ
38 支持部
39 絶縁膜
41 固定接点基板
45、45a、45b 導電層
46、46a、46b 固定接点
51 可動接点基板
55 導電層
56 可動接点
63 固定電極
67 枝状電極部
68 枝部
74 櫛歯状電極部
75 櫛歯部
31 switch 31A electrostatic relay 32 base substrate 33 fixed contact portion 34 movable contact portion 35 fixed electrode portion 36 movable electrode portion 37 elastic spring 38 support portion 39 insulating film 41 fixed contact substrate 45, 45a, 45b conductive layers 46, 46a, 46b Fixed contact 51 Movable contact substrate 55 Conductive layer 56 Movable contact 63 Fixed electrode 67 Branch electrode part 68 Branch part 74 Comb electrode part 75 Comb tooth part

Claims (8)

互いに接触又は離間する複数の接点を備えたスイッチにおいて、
前記接点を形成するための導電層の成膜時における成長方向に平行な面を、前記接点どうしの接触面としたことを特徴とするスイッチ。
In a switch having a plurality of contacts that contact or separate from each other,
A switch characterized in that a surface parallel to a growth direction at the time of forming a conductive layer for forming the contact is used as a contact surface between the contacts.
前記接点の接触面は、前記導電層を成長させる際に前記導電層の形成領域を定めるためのモールド部に接していた面であることを特徴とする、請求項1に記載のスイッチ。   2. The switch according to claim 1, wherein the contact surface of the contact is a surface that is in contact with a mold portion for defining a formation region of the conductive layer when the conductive layer is grown. 互いに接触又は離間する複数の接点を備えたスイッチの製造方法であって、
基板の上方に所定パターンのモールド部を形成する工程と、
前記基板の上方において前記モールド部の形成されている領域を除く複数領域に導電層を前記基板の厚み方向で成長させる工程と、
前記モールド部を除去し、前記導電層の前記モールド部側面に接していた面を前記接点どうしの接触面とする工程と、
前記導電層が形成された複数領域に合わせて前記基板を複数に分割する工程と、
を備えたことを特徴とするスイッチの製造方法。
A method of manufacturing a switch having a plurality of contacts that contact or separate from each other,
Forming a mold part of a predetermined pattern above the substrate;
Growing a conductive layer in the thickness direction of the substrate in a plurality of regions excluding the region where the mold part is formed above the substrate;
Removing the mold part and setting the surface of the conductive layer in contact with the side surface of the mold part as a contact surface between the contacts;
Dividing the substrate into a plurality of regions in accordance with a plurality of regions where the conductive layer is formed;
A method for manufacturing a switch, comprising:
対向する前記接点どうしを形成するための前記モールド部の両側面を互いに平行に形成することを特徴とする、請求項3に記載のスイッチの製造方法。   4. The method of manufacturing a switch according to claim 3, wherein both side surfaces of the mold part for forming the opposing contacts are formed in parallel to each other. 前記導電層を電解メッキ又は無電解メッキによって前記基板の上方に成長させることを特徴とする、請求項3に記載のスイッチの製造方法。   4. The method of manufacturing a switch according to claim 3, wherein the conductive layer is grown above the substrate by electrolytic plating or electroless plating. 前記導電層を蒸着やスパッタリング等の堆積法によって前記基板の上方に成長させることを特徴とする、請求項3に記載のスイッチの製造方法。   The method for manufacturing a switch according to claim 3, wherein the conductive layer is grown above the substrate by a deposition method such as vapor deposition or sputtering. 前記モールド部の上に堆積した前記導電層の材料を、前記モールド部を除去する工程で、前記モールド部とともに除去することを特徴とする、請求項6に記載のスイッチの製造方法。   The method for manufacturing a switch according to claim 6, wherein the material of the conductive layer deposited on the mold part is removed together with the mold part in the step of removing the mold part. 請求項1に記載したスイッチと、前記接点の一部を前記接点どうしの接触面と垂直な方向へ移動させて接点どうしを接触又は離間させるためのアクチュエータとを備えたことを特徴とするリレー。   A relay comprising: the switch according to claim 1; and an actuator for moving a part of the contact in a direction perpendicular to a contact surface between the contacts to contact or separate the contacts.
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