JP2011154476A - Inspection system, inspection device, and inspection data collection device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an inspection system, an inspection device and an inspection data collection device which do not hinder workability of construction. <P>SOLUTION: In the inspection system 1 including a plurality of inspection devices 10 and an inspection data collection device 20, each inspection device 10 includes a timer 14 which starts in implementing measurement by a sensor 11, creates first inspection data by adding timer data indicating an elapsed time from a measurement implementation point to measurement data by the sensor 11 and sends it to the inspection data collection device 20. The inspection data collection device 20 creates and holds second inspection data in which timer data in the first inspection data is replaced by inspection time information by using a built-in timepiece mechanism 23. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention mainly relates to an inspection system, an inspection apparatus, and an inspection data collection apparatus suitable for inspecting the construction quality in facility construction of buildings such as condominiums and buildings.

  2. Description of the Related Art Conventionally, devices called multi-pen recorders (see Patent Document 1 below) and multi-point measurement recording devices have been used as devices for simultaneously measuring data at a plurality of locations and recording the measured data. In these apparatuses, for example, a plurality of thermocouples for measuring temperature can be connected, and data at a plurality of locations can be simultaneously measured and recorded on recording paper. In such a device, power supply is generally obtained from a commercial power source, and a power cord is required. In addition, the device becomes large and measures and records measurement data in a limited space. Not suitable for. Therefore, an apparatus as disclosed in Patent Document 2 has also been proposed.

  The apparatus disclosed in Patent Document 2 uses a battery as a power supply, converts measurement data of a plurality of analog sensors into digital signals, stores the digital signals in a storage device such as a semiconductor memory, and the measurement data stored in the storage device Can be loaded into a personal computer at a later date. It also has a built-in calendar clock and integrates the measurement time into the measurement data.

  However, when using the above-mentioned device as an inspection device for inspecting the construction quality in the construction of buildings such as condominiums, buildings, etc., the sensor lead wires are congested on the floor. This hinders the progress of other construction work.

JP-A-6-167357 JP-A-8-159871

  The present invention has been made in view of the above-described problems, and an object thereof is to provide an inspection system, an inspection apparatus, and an inspection data collection apparatus that do not hinder the workability of construction.

  In the following description, “inspection apparatus” is a concept including what are called “test apparatus”, “measurement apparatus”, “measurement apparatus”, and the like, and similarly, “inspection data collection apparatus” It is a concept including what are called “test data collection device”, “measurement data collection device”, “measurement data collection device”, and the like.

  In order to achieve the above object, according to a first aspect of the present invention, there is provided an inspection system comprising a plurality of inspection devices and a single inspection data collection device connected to the plurality of inspection devices, Each of the plurality of inspection devices includes a sensor, a timer that is started when measurement is performed by the sensor, a data processing unit that obtains measurement data by digitizing an analog measurement output from the sensor, and an inspection set in the inspection device Inspection apparatus side data combining means for combining type information, timer data output from the timer, and measurement data from the data processing unit, and a first inspection combined by the inspection apparatus side data combining means An inspection apparatus-side data storage means for storing only one piece of data, and a first output interface for retrieving the stored first inspection data. Data configured to continue to update timer data in the data based on the output of the timer, and the inspection data collection device collects the first inspection data from the first output interface of each of the plurality of inspection devices Based on the capturing means, the clock mechanism, the timer data in the collected first test data, and the date / time information from the clock mechanism, the test time information corresponding to the first test data is calculated. And a collection device-side data combining means for combining the inspection type information in the first inspection data, the calculated inspection time information, and the measurement data in the first inspection data, and the collection device The second test data synthesized by the side data synthesizing means is sequentially obtained, the collecting device side data storage means for storing a plurality of the second test data, and the plurality of second test data stored therein Removal Inspection system comprising a, a second output interface for, is provided.

  According to a second aspect of the present invention, there is provided an inspection system comprising a plurality of inspection devices and one inspection data collection device connected to the plurality of inspection devices, each of the plurality of inspection devices. Includes a sensor, a first timer that is started when measurement is performed by the sensor, data processing means for digitizing an analog measurement output from the sensor to obtain measurement data, and inspection type information set in the inspection apparatus , Data synthesizing means for synthesizing timer data output from the first timer and measurement data from the data processing unit, and storing only one first inspection data synthesized by the data synthesizing means And a first output interface for retrieving the stored first test data, and timer data in the stored first test data is stored. The Data acquisition means configured to continue updating based on an output of one timer, wherein the inspection data collection device collects the first inspection data from a first output interface of each of the plurality of inspection devices; A data storage device side data storage for successively obtaining second test data, second test data including test type information, timer data and measurement data in the first test data and storing a plurality of the second test data Means and a second output interface for retrieving the stored plurality of second test data, and the timer data in the stored second test data is stored in the second timer. An inspection system is provided that is configured to continue to update based on the output.

  According to the present invention, it is possible to simultaneously inspect a plurality of places without impairing workability at a work site.

  Since the timer data of the inspection device is updated until the inspection data collection device reads the data, the inspection data collection device may be read at any time.

  Accordingly, since the inspection data collection device can be used as a data collection device for inspection devices at a plurality of other inspection locations (rooms), a single inspection data collection device is required at a construction site such as a condominium. be able to.

  In such a case, although not shown, by adding means for inputting the inspection location (for example, room number) to the inspection data collection device, the location of the inspection data can be specified.

It is a figure showing the schematic structure of the inspection system by the present invention. It is a block diagram which shows the internal electrical structure of one Embodiment of the test | inspection system shown by FIG. (A) and (b) are the contents of data stored in the data storage unit of the inspection apparatus shown in FIG. 2 and the data stored in the data storage unit of the inspection data collection apparatus shown in FIG. FIG. It is a flowchart for demonstrating operation | movement of the test | inspection apparatus shown by FIG. It is a flowchart for demonstrating operation | movement of the test | inspection data collection apparatus shown by FIG. It is a figure which shows the example which applied the test | inspection system by this invention to the watertight test | inspection of the drain pipe of a dwelling unit. (A) And (b) is a figure which shows the external appearance of a test | inspection apparatus and the test | inspection data collection apparatus which are respectively applied to the test | inspection system shown by FIG. It is a block diagram which shows the internal electrical structure of other embodiment of the test | inspection system shown by FIG. (A) and (b) are the contents of data stored in the data storage unit of the inspection apparatus shown in FIG. 8, and the data stored in the data storage unit of the inspection data collection apparatus shown in FIG. FIG.

  Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. FIG. 1 is a diagram showing a schematic configuration of an inspection system according to the present invention. As shown in FIG. 1, the inspection system 1 according to the present invention includes a plurality of inspection apparatuses 10 and one inspection data collection apparatus 20 connected to the inspection apparatuses. A personal computer (PC) 90 can take in information from the inspection data collection device 20.

  FIG. 2 is a block diagram showing an internal electrical configuration of an embodiment of the inspection system 1 shown in FIG. 3A is a diagram showing the contents of data stored in the data storage unit 16 of the inspection apparatus 10 shown in FIG. 2, and FIG. 3B is an inspection data collection shown in FIG. 4 is a diagram showing the contents of data stored in a data storage unit 26 of the device 20. FIG.

  As shown in FIG. 2, each inspection apparatus 10 includes a sensor 11, a data processing unit 12, a data synthesis unit 13, a timer 14, an ID unit 15, a data storage unit 16, an output interface (output I / F) 17, and A battery 18 is provided. The sensor 11 measures temperature and outputs an analog measurement value. The ID unit 15 holds inspection type information set in the inspection apparatus 10. The battery 18 provides electric power for driving the inspection apparatus 10.

  The data processing unit 12 performs processing for obtaining measurement data by digitizing the analog measurement output from the sensor 11 and starts the timer 14 simultaneously with the measurement. The data synthesis unit 13 obtains test data by synthesizing the test type information from the ID unit 15, the timer data output from the timer 14, and the measurement data from the data processing unit 12. A process of storing only one piece of data in the data storage unit 16 is performed.

  Thus, the data storage unit 16 stores only one piece of inspection data including inspection type information a, timer data b, and measurement data c as shown in FIG. Further, the data synthesis unit 13 continuously performs a process of continuously updating the timer data in the stored inspection data based on the output of the timer 14. The output I / F 17 is an interface provided for taking out one piece of inspection data (FIG. 3A) stored in the data storage unit 16.

  On the other hand, as shown in FIG. 2, the test data collection device 20 includes a data capture unit 21, a time calculation unit 22, a calendar unit 23, a data synthesis unit 24, a test site setting unit 25, a data storage unit 26, and an output interface. (Output I / F) 27, battery 28, calendar setting unit 29, display 30, battery 31, time setting unit 32, radio clock receiving unit 33, and GPS (Global Positioning System) receiving unit 34. However, only one of the radio clock receiver 33 and the GPS receiver 34 may be provided.

  The radio clock receiver 33 receives standard radio waves, while the GPS receiver 34 receives radio waves from GPS satellites. The time setting unit 32 receives any of the received information and sets the current time. The calendar unit 23 acquires current date information from the setting operation in the calendar setting unit 29, receives time information from the time setting unit 32, and holds the current date information. The battery 28 supplies power to the calendar unit 23. Thus, the radio clock receiver 33 or the GPS receiver 34, the time setting unit 32, the calendar unit 23, the calendar setting unit 29, and the battery 28 constitute a clock mechanism that provides date and time information.

  The data capturing unit 21 performs a process of capturing and collecting inspection data (FIG. 3A) from the output I / F 17 of each inspection apparatus 10. The time calculation unit 22 calculates the inspection time corresponding to the inspection data based on the timer data in the acquired inspection data (FIG. 3A) and the date / time information from the calendar unit 23. This calculation is performed using the fact that the timer data indicates the elapsed time from the time when the measurement by the sensor 11 is performed.

  The data synthesizing unit 24 performs a new process by synthesizing the examination type information and measurement data in the taken examination data (FIG. 3A) and the examination time information from the time calculation unit 22. That is, second inspection data is obtained. Further, in addition to the examination type information, the examination time information, and the measurement data, the data synthesis unit 24 includes the examination part information set and held in the examination part setting unit 25 in the second examination data. Also good.

  Thus, the data synthesizing unit 24 obtains second test data including test type information a, test site information d, test time information e, and measurement data c as shown in FIG. Store in the storage unit 26. As the data synthesizing unit 24 sequentially performs the above-described processing, the data storage unit 26 stores a plurality of inspection data shown in FIG. The output I / F 27 is an interface provided for taking out a plurality of inspection data (FIG. 3B) stored in the data storage unit 26.

  The inspection data collection device 20 is also provided with a display 30 for displaying information and a battery 31 for driving the device 20.

  FIG. 4 is a flowchart for explaining the operation of the inspection apparatus 10 shown in FIG. First, it waits until an inspection start switch provided in the inspection apparatus 10 is pressed (step S1). Next, it is determined whether or not a data transmission flag that is a flag indicating that the previously acquired inspection data has already been transmitted is set (step S2). If the data transmission flag is not set, the process returns to step S1.

  On the other hand, when the data transmission flag is set, the flag is reset, the data processing unit 12 is activated, the measurement by the sensor 11 is started (step S3), and the timer 14 is started simultaneously (step S4). . Next, it is determined whether or not the measured value is acceptable based on a predetermined standard (step S5), and in the case of NG, the process returns to step S1. On the other hand, in the case of OK, the inspection data shown in FIG. 3A is stored in the memory, that is, the data storage unit 16 as described above (step S6). Next, the end lamp provided in the inspection apparatus 10 is turned on (step S7).

  Even after the inspection data is stored in the memory, the timer data in the inspection data (FIG. 3A) is updated until a data transmission request is received from the outside (inspection data collection device 20, predetermined switch, etc.). Continue (steps S8 and S9). When there is a data transmission request, inspection data is transmitted to the inspection data collection device 20 (step S10), a data transmission flag is set (step S11), and the next inspection can be started.

  FIG. 5 is a flowchart for explaining the operation of the inspection data collection device 20 shown in FIG. First, the inspection data (FIG. 3A) including the inspection type, timer data, and measurement data is acquired from the inspection apparatus 10 by the data acquisition unit 21 (step S21). Next, the time calculation unit 22 calculates the inspection time corresponding to the inspection data from the timer data in the acquired inspection data with reference to the date and time information from the calendar unit 23, and sends it to the data synthesis unit 24. (Step S22).

  Next, examination site information is input from the examination site setting unit 25 to the data synthesis unit 24 (step S23). Finally, the data synthesis unit 24 stores the second examination data (FIG. 3B) including examination type information, examination site information, examination time information, and measurement data in the data storage unit 26 (step S24). ). The inspection data stored in the data storage unit 26 of the inspection data collection device 20 can be output to the personal computer (PC) 90 via the output I / F 27.

  In the embodiment described with reference to FIGS. 2 to 5, it is not necessary to provide a clock mechanism on the side of each inspection device 10. Therefore, a simple and cheaper inspection device can be provided, and each inspection device can be provided. There is no need to set the clock. Further, since only one piece of inspection data is stored in each inspection device 10, the inspection data collection device 20 can carry out the specification of the inspection site for the inspection data without making a mistake. Since the radio wave clock receiving unit 33 or the GPS receiving unit 34 is provided in the inspection data collection device 20, it is not necessary to set the current time for the inspection data collection device 20, and the accuracy of the inspection time information in the inspection data is improved. To do. In addition, falsification of the inspection time information can be prevented.

  FIG. 6 is a diagram showing an example in which the inspection system according to the present invention is applied to a watertight inspection of a drain pipe of a dwelling unit. 7A shows an appearance of the inspection apparatus 10 applied to the inspection system shown in FIG. 6, and FIG. 7B shows an inspection data collection apparatus applied to the inspection system shown in FIG. FIG. In FIG. 6, the code | symbol 10 shows the water level fall detection apparatus as an inspection apparatus, and the three water level fall detection apparatuses 10 are used in this example. Reference numeral 40 denotes a drainage stack. Reference numerals 41, 42, and 43 denote drainage horizontal support pipes corresponding to a toilet drain pipe, a unit bath drain pipe, and a kitchen drain pipe, respectively. Reference numerals 41a, 42a, and 43a denote start-up portions corresponding to a toilet drain pipe, a unit bath drain pipe, and a kitchen drain pipe, respectively. Reference numeral 44 indicates a water stop balloon, and reference numeral 45 indicates water.

  7A, reference numeral 10a is a power switch, reference numeral 10b is an inspection start switch, reference numeral 10c is an OK lamp, reference numeral 10d is an NG lamp, reference numeral 10e is a water level sensor, and reference numeral 10f is Output interfaces (output I / F) are shown respectively. 7B, reference numeral 20a is a power switch, reference numeral 20b is a menu selection switch, reference numeral 20c is a data reading switch, reference numeral 20d is a keyboard, reference numeral 20e is a liquid crystal display element, reference numeral 20f Indicates an output interface (output I / F). 6 and FIG. 7, the inspection device (water level lowering detection device) 10 and the inspection data collection device 20 have a toilet drain pipe, a unit bath drain pipe, according to the internal configuration and operation described with reference to FIGS. , And check for poor construction of each drainage pipe, such as kitchen drainage pipe, by lowering the water level.

  FIG. 8 is a block diagram showing an internal electrical configuration of another embodiment of the inspection system shown in FIG. 9A shows the contents of data stored in the data storage unit 16 of the inspection apparatus 10 shown in FIG. 8, and FIG. 9B shows the contents of the inspection data collection apparatus 50 shown in FIG. The contents of data stored in the data storage unit 26 are shown. The inspection apparatus 10 shown in FIG. 8 has the same configuration as the inspection apparatus 10 described with reference to FIGS. 2 to 5 and performs the same operation. As a result, the inspection data (FIG. 9A) stored in the data storage unit 16 of the inspection apparatus 10 shown in FIG. 8 is also the inspection data stored in the data storage unit 16 of the inspection apparatus 10 shown in FIG. (FIG. 3A) is the same.

  On the other hand, in the test data collection device 50 shown in FIG. 8, the time calculation unit 22, the calendar unit 23, the battery 28, the calendar setting unit 29, and the time setting unit are compared with the test data collection device 20 shown in FIG. 32, the radio clock receiver 33, and the GPS receiver 34 are deleted. That is, the inspection data collection device 50 shown in FIG. 8 does not include a clock mechanism. In place of such a clock mechanism, the inspection data collection device 50 includes a timer 51.

  The data composition unit 24 in the examination data collection device 50 of FIG. 8 sets the examination part in the examination data (FIG. 9A) including the examination type information a, timer data b, and measurement data c from the examination apparatus 10. By adding the examination part information from the unit 25, examination data including examination type information a, examination part information d, timer data f, and measurement data c as shown in FIG. Store in the storage unit 26. However, the timer data f is continuously updated by the data synthesizer 24 based on the clock signal from the timer 51.

  That is, the inspection data collection device 50 in FIG. 8 leaves the conversion from the timer data to the inspection time information to the personal computer (PC) 90 at the subsequent stage. The PC 90 replaces the timer data with the inspection time information using a built-in clock mechanism.

  According to the configuration shown in FIGS. 8 and 9, neither the inspection apparatus 10 nor the inspection data collection apparatus 50 need to be provided with a clock mechanism, and therefore does not require a clock setting operation, and a simple and less expensive inspection system is provided. Will be provided. Also, the inspection data collection device can be configured more simply.

1 Inspection system 10 Inspection device (water level drop detection device)
10a Power switch 10b Inspection start switch 10c OK lamp 10d NG lamp 10e Water level sensor unit 10f Output interface (output I / F)
DESCRIPTION OF SYMBOLS 11 Sensor 12 Data processing part 13 Data composition part 14 Timer 15 ID part 16 Data storage part 17 Output interface (output I / F)
18 Battery 20 Inspection Data Collection Device 20a Power Switch 20b Menu Selection Switch 20c Data Reading Switch 20d Keyboard 20e Liquid Crystal Display Element 20f Output Interface (Output I / F)
DESCRIPTION OF SYMBOLS 21 Data acquisition part 22 Time calculating part 23 Calendar part 24 Data synthetic | combination part 25 Examination site | part setting part 26 Data storage part 27 Output interface (output I / F)
28 Battery 29 Calendar Setting Unit 30 Display 31 Battery 32 Time Setting Unit 33 Radio Clock Receiver 34 GPS (Global Positioning System) Receiver 40 Drainage Stand 41-43 Drainage Side Branch 41a-43a Start-up Unit 44 Water 50 Inspection data collection device 51 Timer 90 Personal computer (PC)

Claims (11)

An inspection system comprising a plurality of inspection devices and one inspection data collection device connected to the plurality of inspection devices,
Each of the plurality of inspection devices is
A sensor,
A timer that starts when measurement is performed by the sensor;
Data processing means for digitizing analog measurement output from the sensor to obtain measurement data;
Inspection apparatus-side data combining means for combining inspection type information set in the inspection apparatus, timer data output from the timer, and measurement data from the data processing unit;
Inspection apparatus side data storage means for storing only one first inspection data synthesized by the inspection apparatus side data synthesis means;
A first output interface for retrieving the stored first test data;
And the timer data in the stored first examination data is continuously updated based on the output of the timer,
The inspection data collection device
Data capturing means for collecting the first inspection data from a first output interface of each of the plurality of inspection apparatuses;
A clock mechanism,
Based on the timer data in the collected first inspection data and the date and time information from the clock mechanism, the inspection time information corresponding to the first inspection data is calculated, and the first inspection data Collection device side data synthesis means for synthesizing the examination type information inside, the computed examination time information, and the measurement data in the first examination data;
Collection device side data storage means for sequentially obtaining second inspection data synthesized by the collection device side data synthesis means and storing a plurality of the second inspection data;
A second output interface for retrieving the stored plurality of second test data;
An inspection system comprising:   The examination data collection device further comprises examination part setting means for setting examination part information, and the collection apparatus side data synthesis means adds the examination type information, the examination time information, and the measurement data. The inspection system according to claim 1, further comprising the inspection part information included in the second inspection data.   The inspection system according to claim 1, wherein the timepiece mechanism includes a radio wave clock receiving means for receiving a standard radio wave.   The inspection system according to claim 1, wherein the timepiece mechanism includes GPS receiving means for receiving GPS radio waves. An inspection device connected to the inspection data collection device,
A sensor,
A timer that starts when measurement is performed by the sensor;
Data processing means for digitizing analog measurement output from the sensor to obtain measurement data;
Data combining means for combining the inspection type information set in the inspection apparatus, the timer data output from the timer, and the measurement data from the data processing unit;
Data storage means for storing only one inspection data synthesized by the data synthesis means;
An output interface for retrieving the stored single test data;
An inspection apparatus configured to continue updating timer data in the stored inspection data based on the output of the timer. Each of the sensor, a timer that is started when the measurement is performed by the sensor, a data processing unit that obtains measurement data by digitizing an analog measurement output from the sensor, examination type information, timer data output from the timer, and Inspection apparatus side data combining means for combining measurement data from the data processing unit, inspection apparatus side data storage means for storing only one first inspection data combined by the inspection apparatus side data combining means, A first output interface for retrieving the stored first test data, and continuously updating the timer data in the stored first test data based on the output of the timer An inspection data collection device connected to a plurality of configured inspection devices,
Data capturing means for collecting the first inspection data from a first output interface of each of the plurality of inspection apparatuses;
A clock mechanism,
Based on the timer data in the collected first inspection data and the date and time information from the clock mechanism, the inspection time information corresponding to the first inspection data is calculated, and the first inspection data Collection device side data synthesis means for synthesizing the examination type information inside, the computed examination time information, and the measurement data in the first examination data;
Collection device side data storage means for sequentially obtaining second inspection data synthesized by the collection device side data synthesis means and storing a plurality of the second inspection data;
A second output interface for retrieving the stored plurality of second test data;
An inspection data collection device comprising:   Further, an examination part setting means for setting examination part information is provided, and the collection device side data synthesizing means further includes the examination part information in addition to the examination type information, the examination time information, and the measurement data. The inspection data collection device according to claim 6, which is included in the second inspection data.   The inspection data collection device according to claim 6, wherein the timepiece mechanism includes a radio wave clock receiving means for receiving a standard radio wave.   The test data collection device according to claim 6, wherein the timepiece mechanism includes GPS receiving means for receiving GPS radio waves. An inspection system comprising a plurality of inspection devices and one inspection data collection device connected to the plurality of inspection devices,
Each of the plurality of inspection devices is
A sensor,
A first timer that is started when measurement is performed by the sensor;
Data processing means for digitizing analog measurement output from the sensor to obtain measurement data;
Data combining means for combining the inspection type information set in the inspection apparatus, the timer data output from the first timer, and the measurement data from the data processing unit;
Inspection apparatus side data storage means for storing only one first inspection data synthesized by the data synthesis means;
A first output interface for retrieving the stored first test data;
And is configured to continue updating the timer data in the stored first test data based on the output of the first timer,
The inspection data collection device
Data capturing means for collecting the first inspection data from a first output interface of each of the plurality of inspection apparatuses;
A second timer,
Collection device side data storage means for sequentially obtaining second test data including test type information, timer data and measurement data in the first test data and storing a plurality of the second test data;
A second output interface for retrieving the stored plurality of second test data;
An inspection system configured to continue to update timer data in the stored second inspection data based on the output of the second timer. Each sensor, a first timer that is started when measurement is performed by the sensor, data processing means for digitizing an analog measurement output from the sensor to obtain measurement data, test type information, and output from the first timer Data synthesizing means for synthesizing the timer data to be measured and the measurement data from the data processing unit, inspection apparatus side data storage means for storing only one first inspection data synthesized by the data synthesizing means, A first output interface for retrieving one stored first test data, and updating timer data in the stored first test data based on the output of the first timer An inspection data collection device connected to a plurality of inspection devices configured to continue,
Data capturing means for collecting the first inspection data from a first output interface of each of the plurality of inspection apparatuses;
A second timer,
Collection device side data storage means for sequentially obtaining second test data including test type information, timer data and measurement data in the first test data and storing a plurality of the second test data;
A second output interface for retrieving the stored plurality of second test data;
And a test data collection device configured to continue updating the timer data in the stored second test data based on the output of the second timer.

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