JP2011137722A - Device and method for measurement of error rate - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a device and method for measurement of an error rate, capable of simply setting parameter values necessary in performing a bit error rate of a tested device or waveform measurement and display. <P>SOLUTION: When tracking setting of any one measurement unit of an error rate measurement unit 11 or a waveform measurement unit 13 by prescribed operation from an operation input unit 16 is switched on, a control unit 18 inquires the parameter values of the other measurement unit to output them to the measurement unit of a side set in tracking-on. The measurement unit of the side set in tracking-on reflects inquired parameter values to the measurement unit in which tracking setting is in an on state so as to achieve synchronization of the parameter values. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to an error rate measurement apparatus that performs bit error rate measurement and waveform measurement / display of a signal under measurement input via a device under test, and more particularly to parameter values set during bit error rate measurement or waveform measurement. The present invention relates to an error rate measuring apparatus and method for improving operability by synchronizing set parameter values.

  In recent years, various digital wireless communication apparatuses are required to have a larger capacity transmission capability as the number of users increases and multimedia communication spreads. As an index for evaluating the quality of digital signals in these digital wireless communication apparatuses, a bit error rate (Bit Error Rate) defined as a comparison between the number of received code errors and the total number of received data. )It has been known.

  In addition, a test signal including fixed data is sent to the device under test (Device Under Test), such as a photoelectric conversion component to be tested, and the signal under measurement input via the device under test and a reference signal as a reference For example, an error rate measuring device as disclosed in Patent Document 1 below is known as a device that detects the error rate of a signal under measurement by comparing the above with bit by bit.

  FIG. 5 is a schematic configuration diagram of an error rate measuring apparatus disclosed in Patent Document 1 below. As shown in the figure, the bit error measuring apparatus 100 includes a data storage unit 101 configured by a memory such as a RAM, a comparison data storage unit 102, a position information storage unit 103, and a signal transmission unit 104 configured by an integrated circuit or the like. , A signal reception unit 105, a synchronization detection unit 106, a comparison unit 107, a display control unit 108, a display device 109 such as a CRT or a liquid crystal display, and an operation unit 110 such as a keyboard. In bit error measuring apparatus 100 that measures error bits by comparing data with known data to be received from measurement object 200, comparison data storage unit 101 having a plurality of blocks, received input data, and known data And a ratio of bit strings including one or more detection bits detected under a predetermined detection condition The comparison unit 102 that sequentially stores data in a plurality of blocks according to detection, and each bit string obtained from the comparison data stored in each of the plurality of blocks is based on a position according to a predetermined arrangement condition And a display control unit 104 that displays them side by side on the display device 103.

JP 2007-274474 A

  By the way, when an error rate of a device under test is measured using a conventional error rate measurement device including the error rate measurement device of Patent Document 1 described above, if an abnormality in the measurement result is found, a signal waveform of an oscilloscope or the like The waveform is measured and displayed using a waveform measuring instrument, and the waveform of the signal under measurement input from the device under test is measured and displayed to investigate the cause.

  As described above, when measuring the device under test using the error rate measuring device and the waveform measuring device, since the same signal under test input through the device under test is measured, The device parameter values must also be the same. However, since each function is provided independently in the conventional device, it is necessary to set the same parameter value for each device and check whether the parameter value is the same each time measurement is performed. Therefore, the setting work is complicated.

  In addition, there are cases where the user measures the error rate of the device under test with the error rate measuring device as described above, and then performs waveform measurement / display of the signal with the waveform measuring device as described above. Development of a new apparatus having a function and a waveform measuring function in a waveform measuring instrument is desired.

  Therefore, the present invention has been made in view of the above problems, and includes an error rate measurement function and a waveform measurement function, and performs setting work in synchronization with a parameter value related to error rate measurement and a parameter value related to waveform measurement. It is an object of the present invention to provide an error rate measuring apparatus and method that can be simplified.

In order to achieve the above object, an error rate measuring apparatus according to claim 1 includes an error rate measuring unit 11 for measuring a bit error rate of a signal under measurement input via the device under test 20, and the device under measurement. An error rate measuring apparatus 1 having a waveform measuring unit 13 for measuring and displaying a waveform of a signal,
Sets parameter values for each setting item necessary for driving the error rate measurement unit or the waveform measurement unit, and turns on / off tracking for tracking one of the set parameter values An operation input unit 16 for setting;
When any one of the error rate measuring unit and the waveform measuring unit is set to tracking ON in the operation input unit, the parameter value of the other measuring unit is inquired, and the inquired parameter value is tracked ON. A control unit 18 for outputting to the set measurement unit;
When the parameter value of the waveform measurement unit inquired by the control unit is input when the error rate measurement unit is set to tracking ON, the parameter value of the waveform measurement unit is reflected and synchronized with the parameter value of the error rate measurement unit. An error rate measurement control unit 12 to be changed to
A waveform measurement control unit for reflecting the parameter value of the error rate measurement unit queried by the control unit so as to be synchronized with the parameter value of the waveform measurement unit when the waveform measurement unit is set to tracking ON;
It is provided with.

  The error rate measuring apparatus according to claim 2, wherein the parameter value includes at least a data rate and a clock rate necessary for measuring the bit error rate. .

  The error rate measurement device according to claim 3 is the error rate measurement device according to claim 1 or 2, wherein when any one of the measurement units is turned on, the parameter value of the one measurement unit is thereafter set. Each time is changed, it is reflected in the other measurement unit, and both parameter values are synchronized.

5. The error rate measuring method according to claim 4, wherein an error rate measuring step for measuring a bit error rate of a signal under measurement input via the device under test 20 and a waveform measurement for measuring and displaying the waveform of the signal under measurement. An error rate measurement method comprising steps,
Set the parameter value for each setting item required when driving the error rate measurement step or the waveform measurement step, and turn ON / OFF tracking for tracking one of the set parameter values Operation input step to set,
When either the error rate measurement step or the waveform measurement step is set to tracking ON in the operation input step, the parameter value of the other measurement step is inquired, and the inquired parameter value is tracked ON. A control step for outputting to the set measurement step;
When the error rate measurement step is set to tracking ON, if the parameter value of the waveform measurement step inquired by the control step is input, the parameter value of the waveform measurement step is reflected and synchronized with the parameter value of the error rate measurement step. An error rate measurement control step to be changed to,
A waveform measurement control step for reflecting the parameter value of the error rate measurement step inquired by the control step to be synchronized with the parameter value of the waveform measurement step when the waveform measurement step is set to tracking ON;
It is characterized by including.

  According to the error rate measuring apparatus of the present invention, when performing bit error rate measurement and waveform measurement / display of a device under test, it is possible to save both time and effort for setting both parameter values, and to improve the efficiency of measurement processing work. it can.

  In addition, when the tracking setting of either the error rate measurement unit or the waveform measurement unit is turned ON, the parameter value changed when the parameter value of one measurement unit is changed thereafter is changed to the parameter of the other measurement unit. Since the values can be reflected and synchronized, even if the parameter value is changed, there is no need to change the setting or check each time, and usability is improved.

It is a schematic block diagram which shows the apparatus structure of the error rate measuring apparatus which concerns on this invention. (A)-(c) It is explanatory drawing which shows the example of a display structure of the setting item screen in the apparatus. It is a processing sequence figure showing processing operation at the time of tracking setup in the device. It is a processing sequence figure showing processing operation at the time of parameter value change of the device. It is a schematic block diagram which shows the apparatus structure of the conventional error rate measuring apparatus.

  Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the accompanying drawings. It should be noted that the present invention is not limited by this embodiment, and all other forms, examples, operation techniques, etc. that can be implemented by those skilled in the art based on this form are included in the scope of the present invention. .

[Device configuration]
First, the system configuration of the error rate measuring apparatus according to the present invention will be described with reference to FIGS.

  As shown in FIG. 1, the error rate measuring apparatus 1 of this example is an apparatus for measuring the error rate of the device under test 20 and measuring and displaying a signal waveform. A control unit 12, a waveform measurement unit 13, a waveform measurement control unit 14, a signal division unit 15, an operation input unit 16, a display unit 17, and a control unit 18 are provided.

  The error rate measuring unit 11 functions as a pulse pattern generator (PPG) that transmits a test signal having a predetermined pulse pattern to the device under test 20, and the transmitted test signal via the device under test 20. It has a function of an error detector (ED) that receives and measures the error rate. The error rate measurement unit 11 performs processing related to error rate measurement based on the parameter value set by the operation input unit 16 under the control of the error rate measurement control unit 12, and sends the obtained measurement result to the error rate measurement control unit 12. Output.

  The error rate measurement control unit 12 includes an error rate measurement side tracking setting unit 12a and an error rate measurement side parameter value changing unit 12b, and functions as application software for driving and controlling the error rate measurement unit 11. .

  When the tracking ON signal is input from the control unit 18, the error rate measurement side tracking setting unit 12 a switches the tracking setting to ON in order to track the parameter value of the waveform measuring unit 13. Further, when the tracking setting is turned ON, the error rate measurement side tracking setting unit 12a outputs an inquiry signal for inquiring the parameter value of the waveform measuring unit 13 as a reference to the control unit 18.

  The error rate measurement-side parameter value changing means 12b compares the parameter value of the waveform measurement unit 13 serving as a reference input from the control unit 18 with the parameter value of the error rate measurement unit 11, and is different from the parameter value of the waveform measurement unit 13. If there is an item, the parameter value of the corresponding item is changed to reflect the parameter value of the waveform measurement unit 13. Further, when the parameter value is changed in the operation input unit 16, the error rate measurement-side parameter value changing unit 12 b outputs a parameter value change signal indicating that the parameter value has been changed to the control unit 18.

  The waveform measurement unit 13 converts, for example, an analog measurement waveform such as a sampling oscilloscope into a digital signal and imports it into the memory as waveform data, and a waveform obtained by discretely sampling an event in which the voltage or current value changes with time. A function of reproducing and displaying a waveform image on the display screen based on the data is provided. The waveform measurement unit 13 performs processing related to waveform measurement based on the parameter value set by the operation input unit 16 under the control of the waveform measurement control unit 14, and outputs the obtained waveform data to the waveform measurement control unit 14. Yes.

  The waveform measurement control unit 14 includes a waveform measurement side tracking setting unit 14a and a waveform measurement side parameter value changing unit 14b, and functions as application software for driving and controlling the waveform measurement unit 13.

  When a tracking ON signal is input from the control unit 18, the waveform measurement side tracking setting unit 14a switches the tracking setting to ON in order to track the parameter value of the error rate measuring unit 11. Further, when the tracking setting is turned ON, the waveform measurement side tracking setting unit 14a outputs an inquiry signal for inquiring the parameter value of the error rate measurement unit 11 as a reference to the control unit 18.

  The waveform measurement-side parameter value changing unit 14b compares the parameter value of the error rate measuring unit 11 serving as a reference inquired by the control unit 18 with the parameter value of the waveform measuring unit 13, and compares the parameter value of the error rate measuring unit 11 with the parameter value. If there is a different item, the parameter value of the corresponding item is changed to reflect the parameter value of the error rate measurement unit 11. Further, when the parameter value is changed in the operation input unit 16, the waveform measurement side parameter value changing unit 14 b outputs a parameter value change signal indicating that the parameter value has been changed to the control unit 18.

  The signal dividing unit 15 includes a divider that divides a signal under measurement input via the device under test 20 into a predetermined path. When the signal division unit 15 performs measurement by the error rate measurement unit 11 and the waveform measurement unit 13 under the control of the control unit 18, the signal division unit 15 detects the signal under measurement from the device under test 20 and detects the error rate of the error rate measurement unit 11. It is divided into two paths to the measuring instrument and the waveform measuring unit 13. When measuring the device under test 20 using only the error rate measuring unit 11, the signal dividing unit 15 outputs only the measured signal to the error rate measuring unit 11 without dividing the signal under measurement, and uses only the waveform measuring unit 13. When measuring the device under test 20, the signal under measurement is output only to the waveform measuring unit 13 without being divided.

  The operation input unit 16 includes a touch panel including a touch sensor for detecting a contact position by a contact operation on an input surface corresponding to the display screen of the display unit 17. The operation input unit 16 touches the position of a specific item on the setting item screen displayed on the display unit 17 with a finger, a stylus, or the like, and the position detected by the touch sensor on the screen and the position of the item. And outputs an item selection signal for executing a function assigned to each item to the control unit 18.

  The display unit 17 is composed of a display device such as a liquid crystal display or a CRT. Based on the display control of the control unit 18, the setting item screen related to the error rate measuring unit 11 and the setting item screen related to the waveform measuring unit 13 are displayed and the error rate is measured. Display contents related to driving of the error rate measuring apparatus 1 and various controls such as display of measurement results obtained by the unit 11 and the waveform measuring unit 13 are displayed.

  Here, a display example and an input operation example of the setting item screen related to the error rate measuring unit 11 and the setting item screen related to the waveform measuring unit 13 displayed on the display screen of the display unit 17 will be described with reference to FIG. The illustrated setting item screen is a display example in a device configuration including one error rate measuring unit 11 and one waveform measuring unit 13, and only the minimum necessary setting items for driving the error rate measuring device 1 are shown. Is displayed, and a screen configuration in which setting items desired by the user are arbitrarily added in accordance with the specifications, configuration contents, usage environment, and the like of the apparatus can be used.

  As shown in FIG. 2A, the setting item screen in the error rate measuring apparatus 1 of this example is “Date Clock Rate” mainly used in the error rate measuring unit 11 and “Pattern Length” mainly used in the waveform measuring unit 13. The parameter value input items and the selection items by the operation input unit 16 are respectively displayed.

More specifically, as a parameter value input item by the operation input unit 16, a “Date Clock” field for inputting a data rate, which is the number of bits transmitted (processed) per unit time, is input to the “Date Clock Rate” field. The “Clock Rate” item for inputting the clock rate, which is the operating frequency, has the “Length” item in the “Pattern Length” column, and a default value based on the standard is set in advance. It can be set.
The selection items from the operation input unit 16 include “Tracking” for selecting ON / OFF setting of tracking, and when there are a plurality of reference targets (for example, two error rate measurement units 11 and a waveform measurement unit). “Master” for selecting the target to the other three measuring units in the case of a device configuration having two 13), and for automatically measuring the clock rate internally as an auxiliary function for inputting the clock rate There is "Acquire Clock Rate".

In the illustrated screen configuration example, the parameter values of “Date Rate” and “Clock Rate” are set to ON / OFF “Tracking” on the “Date Clock Rate” side as shown in FIG. When the tracking setting is set to ON and the tracking setting of one measurement unit is turned ON, the parameter values of the other measurement unit are compared with each other as a reference, and the parameter values of different items are changed. In the example shown in the figure, “Tracking” is set to ON.
In addition, the parameter value of “Length” is set by tracking by setting “Tracking” on the “Pattern Length” side to ON / OFF as shown in FIG. In this case, the parameter values of the other measurement unit are compared with each other as a reference, and the parameter values of different items are changed. In the example shown in the figure, “Tracking” is set to ON.
This is because the parameter values of “Date Rate” and “Clock Rate” are indispensable setting items, but the parameter value of “Length” does not become an indispensable setting item depending on the measurement content desired by the user. Depending on the setting, it is configured as another selection item so that tracking ON / OFF setting is possible.

  The control unit 18 is configured by a microcomputer such as a CPU, a ROM, or a RAM, for example. The control unit 18 controls the signal division of the signal division unit 15, and displays setting item screens and measurement results regarding the parameter values of the error rate measurement unit 11 and the waveform measurement unit 13. In addition to various display controls during display and control related to processing operations in accordance with item selection signals from the operation input unit 16, drive control of each unit constituting the error rate measuring apparatus 1 is performed.

  Further, when the control unit 18 inputs an item selection signal indicating that the tracking setting item on the setting item screen displayed on the display unit 17 has been selected from the operation input unit 16, the error rate measurement unit 11 and the waveform measurement unit 13. It is determined which of the setting item screens has the tracking setting turned ON, and a tracking ON signal is output to the selected measurement unit.

Further, when the control unit 18 receives the inquiry signal from the error rate measurement control unit 12, the control unit 18 tracks the parameter value of the waveform measurement unit 13 and reflects it in the parameter value of the error rate measurement unit 11. The value inquiry and the inquired parameter value are output to the error rate measurement control unit 12.
Similarly, when an inquiry signal is input from the waveform measurement control unit 14, the control unit 18 tracks the parameter value of the error rate measurement unit 11 and reflects it in the parameter value of the waveform measurement unit 13. The parameter value inquiry and the inquired parameter value are output to the waveform measurement control unit 14.

  In addition, when the parameter value change signal is input from either the error rate measurement control unit 12 or the waveform measurement control unit 14, the control unit 18 outputs a measurement control unit (for example, a waveform measurement control unit) on the side that outputs this signal. 14), the inquired parameter value is output to the other measurement control unit (for example, the error rate measurement control unit 12).

[Processing operation]
Next, a series of processing operations relating to the measurement of the device under test 20 in the error rate measuring apparatus 1 described above will be described with reference to FIGS. Here, after the error rate of the device under test 20 is measured by the error rate measurement unit 11, the waveform measurement unit 13 performs waveform measurement / display, and tracking is set from the item setting screen of the waveform measurement unit 13. A processing operation example (FIG. 3) and a processing operation example (FIG. 4) when the parameter value of the error rate measurement unit 11 is changed after tracking setting will be described. In addition, as a display configuration of the setting item screen used when setting the parameter value, the display example shown in FIG. 2 is used.

(Processing when tracking is set)
First, a processing operation at the time of tracking setting will be described with reference to FIG. The user inputs parameter values in the error rate measuring apparatus 1 from the operation input unit 16, and sets parameter values in various setting items of the error rate measuring unit 11 (ST1). Next, the error rate measurement control unit 12 controls the error rate measurement unit 11 based on the set parameter value, and measures the error rate of the device under test 20 (ST2).

  When the measurement of the error rate is completed in ST2, the operation input unit 16 is then subjected to a predetermined operation, and “Date” in the setting item screen for the waveform measurement unit 13 displayed on the display unit 17 as shown in FIG. “Tracking” on the “Clock Rate” side is set to ON (ST3). When the waveform measurement unit 13 is turned on in the tracking setting, the waveform measurement control unit 14 outputs an inquiry signal to the control unit 18 (ST4). Then, the control unit 18 inquires of the error rate measuring unit 11 about the parameter value based on the inputted inquiry signal (ST5), and outputs the inquired parameter value to the waveform measuring unit 13 (ST6).

  The waveform measuring unit 13 compares the parameter value of the error rate measuring unit 11 output from the control unit 18 with its own parameter value. If there is a different item, the waveform measuring unit 13 is based on the parameter value of the error rate measuring unit 11. The parameter value of the corresponding item is changed (ST7). Thereby, the parameter value of the tracked error rate measuring unit 11 is reflected and synchronized with the parameter value of the waveform measuring unit 13.

(Processing when changing parameter values)
Next, the processing operation when changing the parameter value will be described with reference to FIG. The user operates the operation input unit 16 in a predetermined manner to change the parameter value of the error rate measurement unit 11 (ST11). When the parameter value of the error rate measurement unit 11 is changed, a parameter value change signal is output from the error rate measurement unit 11 to the control unit 18 (ST12). Then, the control unit 18 inquires of the error rate measuring unit 11 about the parameter value based on the input parameter value change signal (ST13), and outputs the inquired parameter value to the waveform measuring unit 13 (ST14).

The waveform measuring unit 13 compares the parameter value of the error rate measuring unit 11 output from the control unit 18 with its own parameter value. If there is a different item, the waveform measuring unit 13 is based on the parameter value of the error rate measuring unit 11. The parameter value of the corresponding item is changed (ST15).
Thereafter, when either one of the parameter values of the error rate measuring unit 11 or the waveform measuring unit 13 is changed, the parameter values of both the error rate measuring unit 11 and the waveform measuring unit 13 are changed by performing the above processing. Synchronized.

  As described above, the error rate measuring apparatus 1 described above includes the error rate measuring unit 11 that measures the error rate of the signal under measurement received via the device under test 20 and the waveform that performs waveform measurement / display of the signal under measurement. When the tracking setting of any one of the error rate measuring unit 11 and the waveform measuring unit 13 is turned ON by a predetermined operation from the operation input unit 16, the control unit 18 controls the other measuring unit. Inquires about the parameter value and outputs it to the measurement unit on the tracking-on side. The measuring unit on which tracking ON is set reflects the inquired parameter value in the measuring unit whose tracking setting is ON to synchronize the parameter value. Thereby, when the device under test 20 is measured by both the error rate measuring unit 11 and the waveform measuring unit 13, it is possible to save the trouble of setting both parameter values and to improve the efficiency of the measurement processing work.

  Further, when the tracking setting is turned on, even if the parameter value of either the error rate measuring unit 11 or the waveform measuring unit 13 is changed thereafter, the parameter of the changed measuring unit is changed. Since the value can be synchronized with the parameter value of the other measurement unit, usability can be improved.

  By the way, although the touch panel was adopted as the configuration of the operation input unit 16 in the above-described embodiment and the user performed an input operation with a finger or a stylus, the present invention is not limited to this. Tracking ON / OFF setting based on an external trigger from an external input device, such as operating a hard key such as a designated operation key or numeric keypad, or operating a soft key displayed on the display unit 17 with a pointing device such as a mouse. It can also be configured to input / change parameter values.

  Moreover, although the parameter value inquiry method by the control unit 18 has been described as the configuration in which the parameter value inquiry is triggered by the input of the parameter value change signal from the parameter value change side, the present invention is not limited to this. No, the control unit 18 inquires each part of the error rate measurement control unit 12 and the waveform measurement control unit 14 for the parameter value at a predetermined cycle, and outputs the inquired parameter value to the other measurement control unit to be changed. It is also possible to change only the parameter values. In this case, the control unit 18 inquires and outputs parameter values to each unit at a predetermined period until the measurement of the device under test 20 is completed after the inquiry signal is input or until the tracking setting is turned off. Should be done.

DESCRIPTION OF SYMBOLS 1 ... Error rate measurement apparatus 11 ... Error rate measurement part 12 ... Error rate measurement control part (12a ... Error rate measurement side tracking setting means, 12b ... Error rate measurement side parameter value change means)
13 ... Waveform measurement unit 14 ... Waveform measurement control unit (14a ... Waveform measurement side tracking setting means, 14b ... Waveform measurement side parameter value changing means)
DESCRIPTION OF SYMBOLS 15 ... Signal division part 16 ... Operation input part 17 ... Display part 18 ... Control part 20 ... Device under test

Claims (4)

An error rate measuring unit (11) for measuring a bit error rate of a signal under measurement input via the device under test (20), and a waveform measuring unit (13) for measuring and displaying the waveform of the signal under measurement An error rate measuring device (1) having:
Sets parameter values for each setting item necessary for driving the error rate measurement unit or the waveform measurement unit, and turns on / off tracking for tracking one of the set parameter values An operation input unit (16) for setting;
When any one of the error rate measuring unit and the waveform measuring unit is set to tracking ON in the operation input unit, the parameter value of the other measuring unit is inquired, and the inquired parameter value is tracked ON. A control unit (18) for outputting to the set measurement unit;
When the parameter value of the waveform measurement unit inquired by the control unit is input when the error rate measurement unit is set to tracking ON, the parameter value of the waveform measurement unit is reflected and synchronized with the parameter value of the error rate measurement unit. An error rate measurement control unit (12) to be changed to
A waveform measurement control unit (14) for reflecting the parameter value of the error rate measurement unit queried by the control unit so as to be synchronized with the parameter value of the waveform measurement unit when the waveform measurement unit is set to tracking ON;
An error rate measuring apparatus comprising: 2. The error rate measuring apparatus according to claim 1, wherein the parameter value includes at least a data rate and a clock rate necessary for measuring a bit error rate. When the tracking setting is turned on for any one of the measurement units, each time the parameter value of one measurement unit is changed, it is reflected in the other measurement unit, and both parameter values are synchronized. The error rate measuring apparatus according to claim 1 or 2. An error rate measurement method comprising: an error rate measurement step for measuring a bit error rate of a signal under measurement input via a device under test (20); and a waveform measurement step for measuring and displaying a waveform of the signal under measurement. There,
Set the parameter value for each setting item required when driving the error rate measurement step or the waveform measurement step, and turn ON / OFF tracking for tracking one of the set parameter values Operation input step to set,
When either the error rate measurement step or the waveform measurement step is set to tracking ON in the operation input step, the parameter value of the other measurement step is inquired, and the inquired parameter value is tracked ON. A control step for outputting to the set measurement step;
When the error rate measurement step is set to tracking ON, if the parameter value of the waveform measurement step inquired by the control step is input, the parameter value of the waveform measurement step is reflected and synchronized with the parameter value of the error rate measurement step. An error rate measurement control step to be changed to,
A waveform measurement control step for reflecting the parameter value of the error rate measurement step inquired by the control step to be synchronized with the parameter value of the waveform measurement step when the waveform measurement step is set to tracking ON;
An error rate measurement method comprising:

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