JP2011118069A - Microscope illumination device and microscope - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To improve versatility of illumination of a microscope. <P>SOLUTION: A light projection tube unit 101 is releasably attached to a microscope body and allows a vertical illumination module 103, a total reflection illumination module 104, and a spot illumination module 105 to be attached to and detached from an incident section 101A. When illumination light from the illumination module attached to the incident section 101A enters, spreading luminous flux thereof, the illumination light which passes through lenses 271 through 274 and exits from a projection section 101C forms an image on the image-side focal plane of the objective lens of the microscope. When the illumination light from the illumination module enters as parallel luminous flux, the illumination light which passes through the lenses 271 through 274 and exits from the projection section 101C enters the image-side focal plane of the objective lens of the microscope as parallel luminous flux. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to an illumination device for a microscope and a microscope.

  Conventionally, as a microscope illumination, a laser beam is focused within a predetermined range on the image side focal plane (rear focal plane, pupil plane) of the objective lens, and a parallel light beam by the laser beam is totally reflected at the interface between the cover glass and the specimen. Total reflection illumination (TIRF (Total Internal Reflection Fluorescence) illumination) that irradiates a very thin area of the specimen near the cover glass with the evanescent light generated by the irradiation (see, for example, Patent Document 1).

  Conventionally, as illumination of a microscope, laser light is made into a parallel light beam and incident on an objective lens, and the laser light is condensed on a specimen to irradiate light on a very narrow range of the specimen (hereinafter referred to as spot illumination). Is used).

JP 2007-108224 A

  By the way, in recent years, demands for illumination of microscopes have been diversified due to diversification of observation methods for specimens such as cells. For example, there is a desire to use total reflection illumination and spot illumination at the same time. More specifically, for example, illuminate only a very thin area of cells near the cover glass with total reflection illumination, search for the portion to be excited while looking at the observation image with little background light, and use the fluorescent reagent to find the portion to be excited. It is desired that the dyed portion can be irradiated with light having a wavelength different from that of the total reflection illumination by spot illumination.

  The present invention has been made in view of such a situation, and is for improving the versatility of illumination of a microscope.

  The illumination device for a microscope according to the first aspect of the present invention is a unit that can be attached to and detached from a microscope, and can attach and detach different types of illumination modules, and light from the attached illumination modules enters the first. Of the light incident from the first incident portion and the light incident on the image side focal plane of the objective lens of the microscope, and the light incident as a parallel light flux is formed on the objective light. A unit including an optical system that enters the image-side focal plane of the lens as a parallel light beam, and an emission unit that emits light that has passed through the optical system to the outside.

  In the microscope illumination device according to the first aspect of the present invention, when light from the illumination module mounted on the unit is incident on the optical system of the unit while spreading the light beam, an image is formed on the image side focal plane of the objective lens. When the light enters the optical system of the unit as a parallel light beam, it enters the image side focal plane of the objective lens as a parallel light beam.

  The microscope according to the second aspect of the present invention is a detachable unit in which different types of illumination modules can be attached and detached, and an incident part into which light from the attached illumination module is incident, and the incident part Of the light incident from the light, the light incident on the image side focal plane of the objective lens of the microscope is imaged while the light flux spreads, and the light incident as a parallel light flux is incident on the image side focal plane of the objective lens as a parallel light flux A microscope illuminating device including a unit including an optical system that causes the light to pass through and an emission unit that emits light that has passed through the optical system to the outside.

  In the microscope according to the second aspect of the present invention, when the light from the illumination module mounted on the unit is incident on the optical system of the unit while the light beam spreads, it is imaged on the image side focal plane of the objective lens and parallel. When entering the optical system of the unit as a light beam, it enters the image side focal plane of the objective lens as a parallel light beam.

  According to the first or second aspect of the present invention, the versatility of illumination of the microscope is improved.

It is a perspective view which shows one Embodiment of the microscope to which this invention is applied. It is a left view which shows one Embodiment of the microscope to which this invention is applied. It is a top view (A arrow line view) which shows one Embodiment of the microscope to which this invention is applied. It is a figure which shows the structure of the optical system of the microscope to which this invention is applied. It is a figure for demonstrating the combination of an illumination module. It is a perspective view of a microscope in the case of using an epi-illumination module and two total reflection illumination modules in combination. It is a left view of a microscope in the case of using an epi-illumination module and two total reflection illumination modules in combination. It is a top view (A arrow view) of a microscope in the case of using it in combination with an epi-illumination module and two total reflection illumination modules. It is a figure which shows the structure of the optical system of a microscope in the case of using it in combination with an epi-illumination module and two total reflection illumination modules. It is a perspective view of a microscope in the case of using only an epi-illumination module. It is a left view of a microscope in the case of using only an epi-illumination module. It is a top view (A arrow view) of a microscope in the case of using only an epi-illumination module. It is a figure which shows the structure of the optical system of the microscope in the case of using only an epi-illumination module.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  1 to 3 are diagrams schematically showing an embodiment of a microscope to which the present invention is applied. FIG. 1 is a perspective view of the microscope 11, FIG. 2 is a left side view of the microscope 11, and FIG. 3 is a top view (A arrow view) of the microscope 11.

  Hereinafter, in the microscope 11, the side on which the binocular tube 31 is provided (the right side in FIGS. 1 and 2, the upper side in FIG. 3) is referred to as the front side or the near side, and the opposite side (the left side in FIGS. 1 and 2). The lower side of FIG. 3 is referred to as a rear side or a back side. Hereinafter, the left-right direction of the microscope 11 is referred to as an x-axis direction, the front-rear direction is referred to as a y-axis direction, and the up-down direction is referred to as a z-axis direction.

  In the microscope 11, a container 13 containing a specimen 12 (FIG. 3) to be observed is placed on a stage 26, and the specimen 12 is passed through an objective lens 28 (FIG. 2) disposed below the stage 26. Is a kind of so-called inverted microscope.

  Further, the microscope 11 can perform up to four types of illumination such as transmitted illumination, epi-illumination, total reflection illumination, and spot illumination.

  Specifically, a transmission illumination light source 22 is provided at the upper end of the column 21 a at the rear end of the microscope body 21. The transmitted illumination light emitted from the transmitted illumination light source 22 is irradiated downward along the optical axis L1 by the transmitted illumination device 23 extending from the transmitted illumination light source 22 toward the front side. A condenser lens 25 mounted on a condenser turret 24 supported by a support arm 21b is disposed on the optical axis L1, and transmitted illumination light is transmitted to the specimen 12 on the stage 26 via the condenser lens 25. Irradiated.

  The support arm 21b can be moved up and down along the column 21a, and the positions of the condenser turret 24 and the condenser lens 25 in the direction of the optical axis L1 can be adjusted. In addition to the condenser lens 25, for example, the condenser turret 24 can be mounted with an observation cassette (not shown) in which a ring diaphragm or the like is set. The condenser turret 24 is rotated on the optical axis L1. The optical component to be arranged can be switched.

  A module epi-illumination device 34 is attached to the back of the microscope body 21 so as to penetrate the block 21d and the adjustment member 21c. As will be described later, the module epi-illumination device 34 is configured by freely combining three types of illumination modules, ie, the epi-illumination module 103, the total reflection illumination module 104, and the spot illumination module 105. The combination of the illumination light used for observing the specimen 12 can be freely selected from the three types of illumination light of the spot illumination light.

  In FIG. 1 to FIG. 3, an example in which the module epi-illumination device 34 includes the light projection tube unit 101, the optical path switching unit 102, the epi-illumination illumination module 103, the total reflection illumination module 104, and the spot illumination module 105. Show.

  The light projection tube unit 101 is a unit for emitting illumination light from each illumination module from the emission unit 101 </ b> C and introducing it into the main body of the microscope 11. The light projection tube unit 101 is mounted on an epi-illumination device mounting portion (not shown) behind the block 21d so as to penetrate the block 21d and the adjustment member 21c of the microscope body 21. A cap 106 a is attached to the left side surface of the light projecting tube unit 101. The cap 106a is removed when the mirror 272 (FIG. 4) is replaced, and is attached after the mirror 272 is replaced.

  The optical path switching unit 102 is a unit for switching the optical path of the illumination light emitted from the illumination module mounted on the optical path switching unit 102 and switching the illumination light introduced into the light projecting tube unit 101. The optical path switching unit 102 is attached to the incident portion 101 </ b> B on the rear surface of the light projecting tube unit 101. A cap 106 b is attached to the right side surface of the optical path switching unit 102. The cap 106b is removed when the mirror 261 (FIG. 4) is replaced, and is attached after the mirror 261 is replaced.

  The epi-illumination module 103 converts epi-illumination light emitted from an epi-illumination light source 121 provided at the right end into an optical system within the light projection tube unit 101 or within the light projection tube unit 101 and the optical path switching unit 102. This is a module unit that forms an image on the image-side focal plane (rear focal plane, pupil plane) of the objective lens 28 via an optical system. 1 to 3, the epi-illumination module 103 is mounted on the incident portion 101A on the right side surface of the light projecting tube unit 101 so that the longitudinal direction is perpendicular to the mounting surface.

  The total reflection illumination module 104 converts laser light (hereinafter referred to as total reflection illumination light) introduced from a laser table 201 (FIG. 4) connected via the optical fiber 36 to an optical element in the light projection tube unit 101. This is a module unit that forms an image on the image side focal plane of the objective lens 28 via the optical system in the system or the light projection tube unit 101 and the optical path switching unit 102. 1 to 3, the total reflection illumination module 104 is mounted on the incident portion 102A on the rear surface of the optical path switching unit 102 so that the longitudinal direction is perpendicular to the mounting surface.

  Near the rear end of the left side of the total reflection illumination module 104, an electric drive unit 131 incorporating a motor (not shown) is provided so as to protrude. As will be described later with reference to FIG. 4, this motor is used to electrically adjust the irradiation position of the total reflection illumination light in the x-axis direction. A micrometer screw 132 is provided near the rear end on the upper side of the total reflection illumination module 104. The micrometer screw 132 is used to manually adjust the irradiation position of the total reflection illumination light in the y-axis direction, as will be described later with reference to FIG. Further, a light collection position adjustment lever 133 that can be moved in the front-rear direction is provided in the vicinity of the upper center of the total reflection illumination module 104. The condensing position adjustment lever 133 is used to adjust the condensing position (imaging position) of the total reflection illumination light in the optical axis direction, as will be described later with reference to FIG.

  The spot illumination module 105 is configured to convert laser light (hereinafter referred to as spot illumination light) introduced from a laser stage 202 (FIG. 4) connected via an optical fiber 37 into an optical system in the light projection tube unit 101. Alternatively, it is a module unit that introduces parallel light into the image-side focal plane of the objective lens 28 through the optical system in the light projecting tube unit 101 and the optical path switching unit 102 and collects it on the specimen surface. 1 to 3, the spot illumination module 105 is mounted on the incident portion 102B on the left side surface of the optical path switching unit 102 so that the longitudinal direction is perpendicular to the mounting surface.

  A condensing position adjusting dial 141 is provided at the left end of the spot illumination module 105. The condensing position adjustment dial 141 is used to adjust the condensing position (imaging position) of the spot illumination light in the optical axis direction, as will be described later with reference to FIG. Micrometer screws 142 and 143 are provided on the near side and the upper side near the left end of the spot illumination module 105. The micrometer screws 142 and 143 are used to adjust the irradiation position of the spot illumination light in the x-axis direction and the y-axis direction, as will be described later with reference to FIG.

  Hereinafter, the epi-illumination module 103, the total reflection illumination module 104, and the spot illumination module 105 are simply referred to as illumination modules when it is not necessary to distinguish them individually.

  The field stop unit 35 is inserted into the block 21d of the microscope body 21 from the left side surface, and the field stop 273 (FIG. 4) is set on the optical axis of the module incident illumination device 34. Then, by rotating the lever 51 of the field stop unit 35, the field stop 273 of the module epi-illumination device 34 can be adjusted.

  And the illumination light inject | emitted from the injection | emission part 101C of the floodlight unit 101 of the module epi-illumination device 34 injects into the filter block turret 29, is reflected in the direction of the objective lens 28 with which the revolver 27 was mounted | worn, and is objective. The sample 12 on the stage 26 is irradiated through the lens 28.

  Observation light from the specimen (for example, light transmitted through the specimen, fluorescence emitted from the specimen, reflected light from the specimen, etc.) is filtered by the objective lens 28 and the filter block (for example, the filter block turret 29). 4 enters the binocular tube 31 connected to the microscope body 21 via the lens barrel base 30 and the camera 33 attached to the port 32 through the filter blocks 281a and 281b) of FIG. The user can observe an image of the observation light through the binocular tube 31 or take a picture with the camera 33.

  One end of the stage 26 is supported by the lens barrel base 30 and can be moved in the x-axis direction and the y-axis direction by a drive mechanism (not shown) to adjust the observation position of the specimen 12 on the stage 26. be able to. The revolver 27 can be moved in the z-axis direction along the optical axis L1 by the adjusting member 21c of the microscope body 21, and the position of the objective lens 28 in the optical axis L1 direction (the direction of arrow A7 in FIG. 4). The focus of the objective lens 28 can be adjusted. In addition to the objective lens 28, the revolver 27 can be mounted with a plurality of types of objective lenses (not shown), and the revolver 27 is rotated to switch the objective lens disposed on the optical axis L1, thereby changing the plurality of types. Observation using this objective lens can be performed. The filter block turret 29 can be mounted with various filter blocks, and is configured to be rotatable about a rotation axis parallel to the optical axis L1, and is rotated about the rotation axis so as to rotate the optical axis. A filter block arranged on L1 can be switched.

  FIG. 4 shows an example of the configuration of the optical system of the microscope 11 shown in FIGS. In FIG. 4, the portion of the container 13 for containing the specimen 12 is shown in more detail than FIGS. 1 to 3. That is, in FIG. 4, the specimen 12 is immersed in the solution 312 in the glass bottom dish 311 and protected by the cover glass 313. Further, oil 314 is filled in a portion of the objective lens 28 that is in contact with the cover glass 313.

  First, the optical path until the specimen 12 is irradiated with the epi-illumination light will be described.

  The epi-illumination light emitted from the epi-illumination light source 121 of the epi-illumination module 103 is collected by the condenser lens 231 and imaged on the aperture stop surface of the aperture stop 233 by the lens 232. The epi-illumination light imaged on the aperture stop surface enters the light projecting tube unit 101 from the incident portion 101A while the light beam spreads.

  The incident illumination light incident on the light projecting tube unit 101 passes through the lens 271 provided so as to face the incident portion 101A, becomes a parallel light beam, and enters the mirror 272. The mirror 272 can be replaced with various mirrors such as a half mirror, a dichroic mirror, a full mirror, and a beam splitter. Hereinafter, a case where the mirror 272 is configured by a dichroic mirror will be described.

  The epi-illumination light incident on the mirror 272 is provided so as to face the incident part 101B with the mirror 272 interposed therebetween, and to face the emission part 101C, and in the direction of the lens 274 for introducing light into the filter block turret 29. Reflected. Then, the epi-illumination light passes through the field stop 273 for limiting the field of view on the sample surface, passes through the lens 274, and is emitted from the emitting unit 101C while being collected by the lens 274, and enters the filter block turret 29. Incident.

  The incident illumination light incident on the filter block turret 29 is transmitted only by a predetermined wavelength component by the wavelength selection filter 291 of the filter block 281 a, reflected by the dichroic mirror 292 toward the objective lens 28, and incident on the objective lens 28. . At this time, the epi-illumination light is condensed (imaged) in the vicinity of the image side focal plane of the objective lens 28, becomes a parallel light beam by the objective lens 28, and is irradiated onto the sample 12.

  Next, the optical path until the sample 12 is irradiated with the total reflection illumination light will be described.

  The laser table 201 includes laser light sources 211a and 211b that emit laser beams having different wavelength ranges. Laser light emitted from the laser light source 211a (hereinafter referred to as laser light A) is reflected in the direction of the dichroic mirror 213b by the mirror 213a and is reflected in the direction of the dimming unit 214 by the dichroic mirror 213b. Laser light emitted from the laser light source 211b (hereinafter referred to as laser light B) passes through the dichroic mirror 213b and enters the dimming unit 214.

  The dimming unit 214 is a filter having a variable wavelength range to transmit, and transmits only the set wavelength component of the incident laser light, and blocks other wavelength components. The laser light that has passed through the dimming unit 214 is condensed by the condenser lens 216, introduced into the optical fiber 36, and introduced into the total reflection illumination module 104 through the optical fiber 36.

  In addition, shutters 212a and 212b are provided in front of the laser light sources 211a and 211b, respectively, and the laser beams emitted from the respective laser light sources can be individually blocked. In addition, a shutter 215 is provided between the light control unit 214 and the condensing lens 216 so that the laser light introduced into the total reflection illumination module 104 can be blocked. A control unit (not shown) controls the shutters 212a and 212b, the dimming unit 214, and the shutter 215, thereby selecting and dimming the laser light to be introduced into the total reflection illumination module 104.

  Laser light (total reflection illumination light) introduced from the laser table 201 to the total reflection illumination module 104 via the optical fiber 36 is imaged by the lens 241 and the lens 242, and then the light beam spreads from the incident portion 102A to the optical path. The light enters the switching unit 102 and enters the mirror 261. The mirror 261 can be replaced with various mirrors such as a half mirror, a dichroic mirror, a full mirror, and a beam splitter. Hereinafter, a case where the mirror 261 is configured by a dichroic mirror will be described.

  The total reflection illumination light incident on the mirror 261 is transmitted through the mirror 261, transmitted through the lens 262 provided so as to face the incident portion 102A across the mirror 261, becomes a parallel light beam, and is projected from the incident portion 101B. The light enters the tube unit 101.

  The totally reflected illumination light that has entered the light projecting tube unit 101 passes through the mirror 272, passes through the field stop 273, passes through the lens 274, is emitted from the emission unit 101C, and enters the filter block turret 29.

  The totally reflected illumination light incident on the filter block turret 29 is reflected in the direction of the objective lens 28 by the dichroic mirror 292 of the filter block 281 a and enters the objective lens 28. When performing total reflection illumination, the wavelength selection filter 291 is usually not provided in the filter block 281a.

  At this time, the condensing position (imaging position) of the total reflected illumination light by the lens 262 and the lens 274 is moved by moving the lens 241 in the direction of the arrow A2 (optical axis direction) using the condensing position adjusting lever 133. Can be adjusted. That is, the total reflection illumination module 104 has a focus adjustment mechanism that can adjust the condensing position of the total reflection illumination light in the optical axis direction. Then, by this focusing adjustment mechanism, the condensing position of the total reflection illumination light is adjusted to the image side focal plane of the objective lens 28, so that the total reflection illumination light transmitted through the objective lens 28 becomes a parallel light beam and is irradiated onto the sample 12. Is done. Note that the focus adjustment mechanism can accurately match the condensing position of the total reflection illumination light to a different image-side focal plane for each objective lens.

  Further, the x-axis of the total reflection illumination light incident on the objective lens 28 is adjusted by adjusting the position of the exit of the optical fiber 36 in a direction perpendicular to the arrow A1 by a motor built in the electric drive unit 131. The position of the direction can be adjusted. Further, by adjusting the position of the exit of the optical fiber 36 in the direction of arrow A1 with the micrometer screw 132, the position of the total reflection illumination light incident on the objective lens 28 in the y-axis direction can be adjusted. That is, the total reflection illumination module 104 has a shift amount adjustment mechanism that can move the condensing position of the total reflection illumination light to an arbitrary position in the image side focal plane of the objective lens 28.

  When the condensing position of the total reflection illumination light in the image side focal plane of the objective lens 28 changes, the incident angle of the total reflection illumination light to the specimen 12 changes. Then, the total reflection illumination light is condensed within a predetermined range of the image side focal plane of the objective lens 28 (a range satisfying the condition of total reflection at the interface between the cover glass 313 and the specimen 12), and the parallel light flux by the total reflection illumination light is collected. By irradiating the specimen 12 with light, the evanescent light irradiates a very thin area of the specimen 12 near the cover glass 313.

  Next, an optical path until the specimen 12 is irradiated with the spot illumination light will be described.

  The laser table 202 includes laser light sources 221a and 221b that emit laser beams having different wavelength ranges. Laser light emitted from the laser light source 221a (hereinafter referred to as laser light C) is reflected in the direction of the dichroic mirror 223b by the mirror 223a and is reflected in the direction of the dimming unit 224 by the dichroic mirror 223b. Laser light emitted from the laser light source 221b (hereinafter referred to as laser light D) passes through the dichroic mirror 223b and enters the dimming unit 224.

  The dimming unit 224 is a filter having a variable wavelength range to transmit, and transmits only the set wavelength component of the incident laser light, and blocks other wavelength components. The laser light that has passed through the light control unit 224 is condensed by the condenser lens 226, introduced into the optical fiber 37, and introduced into the spot illumination module 105 through the optical fiber 37.

  In addition, shutters 222a and 222b are provided in front of the laser light sources 221a and 221b, respectively, and the laser beams emitted from the respective laser light sources can be individually blocked. In addition, a shutter 225 is provided between the light control unit 224 and the condenser lens 226 so that the laser light introduced into the spot illumination module 105 can be blocked. A control unit (not shown) controls the shutters 222a and 222b, the dimming unit 224, and the shutter 225 to select and dimm the laser light to be introduced into the spot illumination module 105.

  Laser light (spot illumination light) introduced from the laser stage 202 to the spot illumination module 105 via the optical fiber 37 passes through the lens 251 and becomes a parallel light flux, and enters the optical path switching unit 102 from the incident portion 102B.

  The spot illumination light incident on the optical path switching unit 102 is reflected by the mirror 261 in the direction of the lens 262, passes through the lens 262, and enters the light projecting tube unit 101 from the incident portion 101 </ b> B.

  The spot illumination light incident on the light projecting tube unit 101 is transmitted through the mirror 272 and then imaged on the field stop surface of the field stop 273 by the lens 251 and the lens 262. The spot illumination light imaged on the field stop surface is converted into a parallel light beam by the lens 274, is emitted from the emission unit 101 </ b> C, and enters the filter block turret 29.

  The spot illumination light incident on the filter block turret 29 is reflected by the dichroic mirror 292 in the direction of the objective lens 28, passes through the objective lens 28, is condensed near the specimen 12, and the light is irradiated to a very narrow range of the specimen 12. Is done. When spot illumination is performed, the wavelength selection filter 291 is usually not provided in the filter block 281a.

  At this time, the position of the exit of the optical fiber 37 is moved in the direction of the arrow A4 (optical axis direction) by the condensing position adjustment dial 141, and the distance between the exit of the optical fiber 37 and the lens 251 is adjusted. Thus, the condensing position (image forming position) of the spot illumination light can be adjusted in the optical axis direction. That is, the spot illumination module 105 has a focus adjustment mechanism that can adjust the condensing position of the spot illumination light in the optical axis direction. And by this focus adjustment mechanism, the area which irradiates the sample 12 with spot illumination light can be adjusted.

  Further, the position of the exit of the optical fiber 37 is adjusted by the micrometer screws 142 and 143 in the direction of the arrow A3 and in the direction perpendicular to the arrow A3 (direction perpendicular to the paper surface), whereby the objective lens 28 is adjusted. The position of the spot illumination light incident on the x-axis direction and the y-axis direction can be adjusted. That is, the spot illumination module 105 has a shift amount adjustment mechanism that can move the condensing position of the spot illumination light to an arbitrary position in a plane orthogonal to the optical axis. With this shift amount adjusting mechanism, the position at which the specimen 12 is irradiated with the spot illumination light can be adjusted.

  Then, the observation light from the specimen 12 by epi-illumination light, total reflection illumination light, or spot illumination light (for example, fluorescence emitted from the specimen 12, reflected light from the specimen 12, etc.) is collected by the objective lens 28 and is dichroic. Only the wavelength component necessary for observation is transmitted by the mirror 292, and the unnecessary wavelength component is reflected. Then, light having a predetermined wavelength out of the observation light transmitted through the dichroic mirror 292 passes through the wavelength selection filter 293 and enters the imaging lens 301 in the microscope body 21. The observation light transmitted through the imaging lens 301 is separated into two light beams by the beam splitter 302, and one of them is imaged on the image plane IM of the camera 33. On the other hand, the other is transmitted through the lens 303, reflected by the mirror 304 in the direction of the lens 305, transmitted through the lens 305 and the lens 306, reflected by the mirror 307 in the direction of the eyepiece lens 308, and transmitted through the eyepiece lens 308. An image by light is observed by an observer.

  Although not described in the present embodiment, as a laser safety measure, when performing observation using laser light, the optical path to the binocular tube 31 is blocked so that direct observation cannot be performed with the eye, and the camera optical path It has an interlock function that can only be used.

  The mirror 261 can be moved in the direction indicated by the arrow A5, and can be inserted and removed between the incident portion 102A and the lens 262. Then, by removing the mirror 261 from the optical path of the total reflection illumination light, the total reflection illumination light is irradiated to the sample 12 without being attenuated by the mirror 261, and the spot illumination light is not irradiated to the sample 12. For example, when the mirror 261 is a full mirror, the spot illumination light is irradiated to the sample 12 without being attenuated by the mirror 261, and the total reflection illumination light is not irradiated to the sample 12.

  Further, the mirror 272 can be moved in the direction indicated by the arrow A6, and can be inserted / removed between the incident portion 101B and the lens 274. Then, by removing the mirror 272 from the optical paths of the total reflection illumination light and the spot illumination light, the total reflection illumination light and the spot illumination light are irradiated to the sample 12 without being attenuated by the mirror 272, and the incident illumination light is used. Is not irradiated on the specimen 12. Further, for example, by making the mirror 272 a full mirror, the incident illumination light is irradiated to the sample 12 without being attenuated by the mirror 272, and the sample 12 is not irradiated with the total reflection illumination light and the spot illumination light. .

  As described above, the mirror 261 and the mirror 272 arbitrarily select one or more illumination lights to irradiate the sample 12 from the total reflection illumination light, spot illumination light, and epi-illumination light without operating the laser table 201. can do.

  Further, by changing the transmittance and the reflectance of the mirror 261, the ratio of the intensity of the total reflection illumination light and the spot illumination light irradiated on the specimen 12 can be adjusted. Furthermore, by changing the transmittance and reflectance of the mirror 272, the ratio of the intensity of the total reflection illumination light, spot illumination light and epi-illumination light irradiated on the specimen 12 can be adjusted.

  That is, one or more of the total reflection illumination light, spot illumination light, and epi-illumination light can be arbitrarily selected, and the sample 12 can be irradiated alone or in any combination. Moreover, the ratio of the intensity of each illumination light can be adjusted.

  In addition, the lens 274 shares the lens for condensing the epi-illumination light and the total reflection illumination light on the image side focal plane of the objective lens 28 and the lens for making the spot illumination light incident on the objective lens 28 into a parallel luminous flux. The number of parts can be reduced, and the module epi-illumination device 34 can be downsized.

  Furthermore, as described above, in the module epi-illumination device 34, it is possible to freely combine and use three types of illumination modules, the epi-illumination illumination module 103, the total reflection illumination module 104, and the spot illumination module 105.

  Specifically, as shown in FIG. 5, the incident portion 101 </ b> A of the floodlight tube unit 101 includes any one of three types of illumination modules, an epi-illumination illumination module 103, a total reflection illumination module 104, and a spot illumination module 105. Can also be removed. The light path switching unit 102 can be attached to the incident portion 101B of the light projecting tube unit 101. Furthermore, any of the three types of illumination modules can be attached to and detached from the incident portions 102A and 102B of the optical path switching unit 102, respectively.

  Moreover, even if each illumination module is attached to the incident portion 101A of the light projecting tube unit 101 and any of the incident portions 102A and 102B of the optical path switching unit 102, the illumination light emitted from each module is almost equal. It is designed to be emitted from the emission part 101C of the light projecting tube unit 101 after passing through the optical path under the same conditions.

  Specifically, the optical path length between the lens 271 and the lens 274 of the light projecting tube unit 101 and the lens 262 of the optical path switching unit 102 when the optical path switching unit 102 is mounted on the incident portion 101B of the light projecting tube unit 101. And the lens 274 of the light projection tube unit 101 are designed to have the same optical path length. Further, the lens 271 of the light projecting tube unit 101 and the lens 262 of the optical path switching unit 102 are lenses having substantially the same performance.

  Further, when the epi-illumination module 103 is mounted on the incident portion 101A of the light projection tube unit 101, the optical path length between the epi-illumination light source 121 and the lens 271 of the light projection tube unit 101, the optical path switching unit 102 is the light projection tube. An optical path length between the epi-illumination light source 121 and the lens 262 of the optical path switching unit 102 when the epi-illumination module 103 is mounted on the incident part 101B of the unit 101 and the incident part 102A of the optical path switching unit 102; The epi-illumination light source 121 and the lens 262 of the optical path switching unit 102 when the optical path switching unit 102 is attached to the incident portion 101B of the light projection tube unit 101 and the epi-illumination module 103 is attached to the incident portion 102B of the optical path switching unit 102. Are designed to have the same optical path length.

  As a result, even if the incident illumination module 103 is attached to any of the incident portions 101A of the light projecting tube unit 101 and the incident portions 102A and 102B of the optical path switching unit 102, the incident light is emitted from the incident illumination light source 121. The epi-illumination light passes through a lens having the same performance and the same optical path length, and is emitted from the emission portion 101C of the light projection tube unit 101. Therefore, except for the influence of the mirror 261 and the mirror 272, the incident illumination light in substantially the same state is emitted from the emission portion 101C of the light projection tube unit 101 regardless of the incident portion where the incident illumination module 103 is mounted. Is possible.

  Similarly, the optical path length and the optical path switching unit between the lens 242 of the total reflection illumination module 104 and the lens 271 of the projection tube unit 101 when the total reflection illumination module 104 is attached to the incident portion 101A of the projection tube unit 101. The lens 242 of the total reflection illumination module 104 and the lens 262 of the optical path switching unit 102 when the 102 is mounted on the incident portion 101B of the floodlight tube unit 101 and the total reflection illumination module 104 is mounted on the incident portion 102A of the optical path switching unit 102. The total reflection illumination module when the optical path switching unit 102 is mounted on the incident portion 101B of the light projection tube unit 101 and the total reflection illumination module 104 is mounted on the incident portion 102B of the optical path switching unit 102. 104 lens 242 and lens 262 of the optical path switching unit 102; Optical path length between is designed to be the same.

Therefore, except for the influence of the mirror 261 and the mirror 272, the total reflection illumination light in the almost same state is emitted from the emission portion 101C of the light projecting tube unit 101 regardless of the incident portion where the total reflection illumination module 104 is mounted. It becomes possible to do.

  Similarly, the optical path length between the lens 251 of the spot illumination module 105 and the lens 271 of the projection tube unit 101 when the spot illumination module 105 is mounted on the incident portion 101A of the projection tube unit 101, and an optical path switching unit. 102 is attached to the incident portion 101B of the light projecting tube unit 101, and the lens 251 of the spot illumination module 105 and the lens 262 of the optical path switching unit 102 when the spot illumination module 105 is attached to the incident portion 102A of the optical path switching unit 102. The optical path length between them, and the lens 251 of the spot illumination module 105 when the optical path switching unit 102 is attached to the incident portion 101B of the light projection tube unit 101 and the spot illumination module 105 is attached to the incident portion 102B of the optical path switching unit 102. And optical path switching unit 10 Optical path length between the lenses 262 are designed to be the same.

Therefore, except for the influence of the mirror 261 and the mirror 272, the spot illumination light in substantially the same state is emitted from the emission portion 101C of the light projecting tube unit 101 regardless of the incident portion where the spot illumination module 105 is mounted. Is possible.

  As described above, in the module epi-illumination device 34, the three types of illumination modules of the epi-illumination module 103, the total reflection illumination module 104, and the spot illumination module 105 can be freely combined and used. it can.

  In the module epi-illumination device 34, not only different types of illumination modules are used in combination, but also two or more of the same type of illumination modules can be used in combination.

  6 to 9 show examples of the configuration of the microscope 11 when the epi-illumination module 103 and the two total reflection illumination modules 104 are used in combination. 6 is a perspective view of the microscope 11, FIG. 7 is a left side view of the microscope 11, FIG. 8 is a top view of the microscope 11 (A arrow view), and FIG. 9 is a configuration diagram of the optical system of the microscope 11.

  In FIG. 6 to FIG. 9, in order to distinguish the two total reflection illumination modules 104, the one mounted on the floodlight tube unit 101 is referred to as a total reflection illumination module 104a and is mounted on the optical path switching unit 102. One that is present is referred to as a total reflection illumination module 104b. 6 to 9, “a” is added to the end of the sign of each part of the total reflection illumination module 104a, and “b” is attached to the end of the sign of each part of the total reflection illumination module 104b. Further, in FIGS. 6 to 9, in order to distinguish between the two optical fibers 36, the one connected to the total reflection illumination module 104a is referred to as an optical fiber 36a, and the one connected to the total reflection illumination module 104b. This is referred to as an optical fiber 36b.

  In the module epi-illumination device 34 of FIGS. 6 to 9, the mounting directions of the light projection tube unit 101 and the optical path switching unit 102 are different from those of the module epi-illumination device 34 of FIGS. 1 to 4. That is, in the module epi-illuminator 34 shown in FIGS. 6 to 9, the projection tube unit 101 is mounted on the microscope body 21 such that the incident portion 101A is on the left, the optical path switching unit 102 is on the right. It is attached to the incident portion 101B of the light projecting tube unit 101 so as to come. Further, the total reflection illumination module 104a is attached to the incident portion 101A of the floodlight tube unit 101, the total reflection illumination module 104b is attached to the incidence portion 102A of the optical path switching unit 102, and the incident illumination module 103 is connected to the optical path switching unit. 102 is attached to the incident portion 102B.

  The epi-illumination light emitted from the epi-illumination light source 121 of the epi-illumination module 103 is collected by the condenser lens 231 and imaged by the lens 232 on the aperture stop surface of the aperture stop 233. The epi-illumination light imaged on the aperture stop surface enters the optical path switching unit 102 from the incident portion 102B while the light beam spreads. The incident illumination light incident on the optical path switching unit 102 passes through the mirror 261, becomes a parallel light beam by the lens 262, and enters the light projecting tube unit 101 from the incident portion 101B. The incident illumination light incident on the light projecting tube unit 101 passes through the mirror 272, passes through the field stop 273, passes through the lens 274, and is emitted from the emission unit 101 </ b> C while being collected by the lens 274, and the filter block turret 29 is incident.

  Further, the total reflection illumination light (hereinafter referred to as total reflection illumination light A) introduced into the total reflection illumination module 104a from a laser stand (not shown) via the optical fiber 36a is imaged by the lens 241a and the lens 242a. After that, the light beam enters the light projecting tube unit 101 from the incident portion 101A while spreading. The total reflection illumination light A incident on the light projecting tube unit 101 passes through the lens 271, is reflected in the direction of the lens 274 by the mirror 272, passes through the field stop 273, passes through the lens 274, and is condensed by the lens 274. While being emitted, the light is emitted from the emission unit 101 </ b> C and enters the filter block turret 29.

  Further, the total reflection illumination light (hereinafter referred to as total reflection illumination light B) introduced from the laser stand (not shown) into the total reflection illumination module 104b via the optical fiber 36b is imaged by the lens 241b and the lens 242b. Then, the light beam enters the optical path switching unit 102 from the incident portion 102A while spreading. The total reflection illumination light B incident on the optical path switching unit 102 is reflected in the direction of the lens 262 by the mirror 261, passes through the lens 262, and enters the light projection tube unit 101 from the incident portion 101B. The total reflection illumination light B incident on the light projecting tube unit 101 passes through the mirror 272 and the field stop 273, is collected by the lens 274, is emitted from the emission unit 101C, and enters the filter block turret 29.

  In this way, by using the two total reflection illumination modules 104 in combination, the image forming position can be finely adjusted for each total reflection illumination module 104, so the wavelength of the laser light (total reflection illumination light) can be adjusted. It is possible to easily prevent the influence of chromatic aberration that occurs when switching.

  In the module epi-illumination device 34, for example, the three total reflection illumination modules 104 can be used in combination, or two or more spot illumination modules 105 can be used in combination.

  When only one illumination module is used, it is not necessary to attach the optical path switching unit 102 to the light projecting tube unit 101.

  10 to 13 show examples of the configuration of the microscope 11 when only one epi-illumination module 103 is used. 10 is a perspective view of the microscope 11, FIG. 11 is a left side view of the microscope 11, FIG. 12 is a top view of the microscope 11, and a configuration diagram of an optical system of the microscope 11. FIG.

  In the module epi-illumination device 34 of FIGS. 10 to 13, the epi-illumination module 103 is attached to the incident part 101A of the light projection tube unit 101, and the cap 106c is attached to the incident part 101B. Note that the optical path of the epi-illumination light emitted from the epi-illumination module 103 is the same as that in FIGS. 1 to 4, and the description thereof will be omitted because it will be repeated.

  As described above, in the module epi-illumination device 34 of the microscope 11, since the illumination modules can be freely selected and combined and used, an appropriate illumination device can be flexibly and flexibly according to the budget and the purpose of use of the microscope 11. Easy to build. For example, as shown in FIGS. 10 to 13, first, a system including only the light projection tube unit 101 and the epi-illumination illumination module 103 is constructed, and when the total reflection illumination or spot illumination becomes necessary, the optical path switching unit 102 is used. The total reflection illumination module 104 and the spot illumination module 105 can be added. Therefore, it is not necessary to purchase illumination that is not planned to be used or to purchase a microscope equipped with the illumination when the illumination that is not possessed becomes necessary.

  Moreover, in the module epi-illumination device 34, the direction in which the light projection tube unit 101 and the optical path switching unit 102 are attached can be changed, and the position where each illumination module is attached can be freely selected. It is possible to construct a layout suitable for the use environment.

  Note that the types of laser light used are not limited to the four types described above. For example, an illumination module for irradiating confocal light may be added.

  In the above description, the example in which the incident position of the total reflection illumination light on the objective lens 28 is adjusted by adjusting the position of the exit of the optical fiber 36 has been described. However, for example, an optical element such as a galvanometer mirror is used. The incident position on the objective lens 28 may be controlled at high speed by swinging the optical axis using.

  Furthermore, in the above description, an example in which different laser stands are used for the total reflection illumination module 104 and the spot illumination module 105 has been shown, but one laser stand is shared, and the laser light to be introduced is distributed, You may make it introduce into each illumination module.

  Further, the configurations of the light projecting tube unit 101 and the optical path switching unit 102 are not limited to the above-described example. For example, the projector unit 101 and the optical path switching unit 102 are configured by one unit, three or more units, and the lens 262. It is also possible to provide the light emitting tube unit 101.

  Furthermore, when it is not necessary to mount a plurality of illumination modules at a time, for example, the projection tube unit 101 is not provided with a mirror 272, but is provided with a lens 271 on the same optical axis as the lens 274. Without changing the direction of the illumination light from the illumination module, it may be emitted as it is from the emission unit 101C.

  The light for total reflection illumination may be, for example, light obtained by condensing light from a lamp light source.

  The embodiment of the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the gist of the present invention.

  11 microscope, 12 specimens, 21 microscope body, 26 stage, 28 objective lens, 34 module epi-illuminator, 36, 37 optical fiber, 101 projector tube unit, 101A, 101B incident section, 101C exit section, 102 optical path switching unit, 102A, 102B incident part, 103 epi-illumination module, 104 total reflection illumination module, 105 spot illumination module, 121 epi-illumination light source, 201, 202 laser stand, 231 condensing lens, 232 lens, 233 aperture stop, 241 lens, 242 , 251 lens, 261 mirror, 262 lens, 271 lens, 272 mirror, 273 field stop, 274 lens, 313 cover glass

Claims (8)

A unit that can be attached to and detached from a microscope.
Different types of illumination modules can be attached and detached, and a first incident part on which light from the mounted illumination modules is incident;
Of the light incident from the first incident portion, the light that is incident while the light beam spreads is imaged on the image side focal plane of the objective lens of the microscope, and the light that is incident as a parallel light beam is focused on the image side focal point of the objective lens. An optical system that enters the surface as a parallel light beam;
An illuminating device for a microscope, comprising: a unit comprising: an emission unit that emits light that has passed through the optical system to the outside. The unit is
The illumination module of a different type can be attached and detached, and further includes a second incident part on which light from the installed illumination module is incident,
The optical system is
A first lens facing the first incident portion;
A second lens facing the second incident portion;
A third lens having an optical axis coinciding with the first lens and facing the emitting portion;
The first lens and the third lens can be inserted / removed, and the second lens is transmitted while being inserted between the first lens and the third lens. First light path changing means for changing the direction of light and making it incident on the third lens;
The illumination device for a microscope according to claim 1, wherein an optical path length between the first lens and the third lens and an optical path length between the second lens and the third lens coincide with each other. . The unit is
The illumination module of a different type can be attached and detached, and further includes a third incident part on which light from the installed illumination module is incident,
The optical system is
The optical path between the first incident part and the first lens can be inserted into and removed from the optical path between the first incident part and the first lens. The illumination device for a microscope according to claim 2, further comprising: a second optical path changing unit that changes the direction of light incident from the incident unit of 3 and makes the light incident on the first lens. The unit is
A first unit that includes the second incident portion, the second lens, the first optical path changing means, and the third lens, and is detachable from the microscope;
A first unit that includes the first incident unit, the third incident unit, the second optical path changing unit, and the first lens, and is detachably attached to the first unit. The illumination device for a microscope according to claim 3. The unit is
The illumination module of a different type can be attached and detached, and further includes a second incident part on which light from the installed illumination module is incident,
The optical system is
A first lens facing the first incident portion;
A second lens having an optical axis coinciding with the first lens and facing the emitting portion;
The second incident part is detachable between the first incident part and the first lens, and is inserted between the first incident part and the first lens. The microscope illumination device according to claim 1, further comprising: an optical path changing unit that changes a direction of light incident from the light source and makes the light incident on the first lens. The unit is
The illumination module of a different type can be attached and detached, and further includes a second incident part on which light from the installed illumination module is incident,
The optical system is
A first lens facing the first incident portion;
A second lens facing the second incident part and the emission part;
The first lens can be inserted / removed between the second incident part and the second lens, and inserted between the second incident part and the second lens. The microscope illumination apparatus according to claim 1, further comprising: an optical path changing unit that changes the direction of transmitted light and makes the light incident on the second lens. The different types of illumination modules include a first illumination module that focuses light from a light source on an image-side focal plane of the objective lens through the optical system, and light from the light source through the optical system. A second illumination module capable of forming an image on the image-side focal plane of the lens and adjusting the image-forming position in the optical axis direction and the direction perpendicular to the optical axis, and the light from the light source in parallel through the optical system A light beam is incident on the image-side focal plane of the objective lens, is condensed on the sample surface via the objective lens, and a third focusing position can be adjusted in the optical axis direction and the direction perpendicular to the optical axis. The microscope illumination apparatus according to claim 1, comprising at least two of the illumination modules. A detachable unit,
Different types of illumination modules can be attached and detached, and an incident part into which light from the installed illumination modules is incident,
Of the light incident from the incident portion, the light incident while the light beam spreads is imaged on the image side focal plane of the objective lens of the microscope, and the light incident as a parallel light beam is parallel to the image side focal plane of the objective lens. An optical system that is incident as a light beam;
A microscope comprising: a microscope illumination device including a unit comprising: an emission unit that emits light that has passed through the optical system to the outside.

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