JP2011007714A - Semiconductor inspection measuring device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a semiconductor inspection measuring device for inspecting or measuring a semiconductor at a temperature set beforehand in the state where external light is blocked, and also repairing it as the need arises.SOLUTION: A semiconductor element 43 is arranged on a loading part 13 in the loaded state on a DUT substrate 42, and bonded to the lower side of a measuring chamber 12. On the other hand, a shield chamber 15 having a manipulator 40 arranged inside is lowered to the measuring chamber 12 from the upper side. In the state where external light is blocked by the shield chamber 15, a probe needle 41 of the manipulator 40 arranged in the shield chamber 15 is brought into contact with the semiconductor element 43 to apply a voltage or a current thereto, and the voltage or the current is taken out by the probe needle 41, and laser beam machining is performed as the need arises. A portion being inspected or measured is observed by a microscope 17 arranged on the upside.

Description

  The present invention relates to a semiconductor inspection and measurement apparatus, and more particularly to a semiconductor inspection and measurement apparatus that performs inspection or measurement by bringing a probe needle into contact with a semiconductor by a manipulator disposed in a shield chamber.

  A semiconductor element is a semiconductor bare chip formed by forming a fine circuit on a surface of a silicon semiconductor wafer by performing predetermined patterning using a photolithographic technique. The semiconductor bare chip is cut to a predetermined size. I am trying to manufacture. In such a semiconductor device, when the operation of an electronic circuit becomes unstable as the degree of integration increases, a signal is applied to the inside of the device, or the signal is taken out and analyzed to stabilize the design and development product. There is a need. In addition, a semiconductor inspection / measurement probe apparatus is used for the purpose of conducting the analysis by peeling the protective film of the element or cutting the pattern with the energy of laser light and conducting the current with a probe needle for the purpose of analysis.

  For example, Japanese Patent Application Laid-Open No. 2004-333271 proposes a mechanism that moves and adjusts a probe needle disposed in a vacuum chamber from the outside in the X-axis direction, the Y-axis direction, and the Z-axis direction. The present application particularly relates to the improvement of a prober for analyzing a semiconductor element, and proposes a shield chamber configuration, a partition manipulator configuration, and various interlock configurations.

  With this type of prober, when measuring a semiconductor element in a vacuum or in the atmosphere, particularly when trying to measure the semiconductor element in the atmosphere at a low temperature, moisture in the atmosphere is condensed on the surface of the semiconductor element. Further, when light is irradiated to the semiconductor element from the outside, the carrier moves in the semiconductor element, which hinders accurate measurement.

  In particular, in order to prevent a decrease in measurement accuracy due to noise or light from the outside, it is necessary to provide a shield chamber and operate the manipulator from the outside to efficiently bring the probe needle into contact with the measurement unit for energization. In general, a shield box is used to make a structure in which laser light does not leak to the outside when processing a film or wiring of a semiconductor element using laser light energy in applications other than blocking external noise or shielding light. . Also, in order to prevent electric shock when a high voltage is applied to the semiconductor element by the probe needle during measurement, the probe can be operated without touching the measurement line, and the laser transmitter is removed when the shield part of the shield chamber is removed. In addition, a signal must be sent to a measuring instrument or the like to shut off the laser transmitter power supply or stop the output voltage of the measuring instrument. For this reason, when the light shielding function of the shield chamber as described above is impaired, an interlock mechanism that responds quickly is required. There is also a need for an apparatus for analyzing a semiconductor element having a shield chamber provided with such an interlock mechanism.

  As an operation method of a manipulator used for a vacuum chamber or a prober shield chamber, there is a method using a vacuum bellows. In this system, a shaft is passed through a vacuum bellows, and the shaft is operated from the outside by a three-axis drive mechanism. In addition, there is a system in which a linear introduction terminal or a rotation introduction terminal is arranged on the partition wall surface of the shield chamber, and each axis of the manipulator is pulled by a wire and moved by a movable axis. The moving method of the vacuum bellows is disadvantageous in that the vacuum bellows cannot be moved linearly in the three-axis directions, and the moving amount cannot be increased or high-precision alignment cannot be performed. On the other hand, the wire pulling manipulator has a drawback that the attachment / detachment operation is poor, the movement amount of each axis is small, and the manipulator is large to increase the movement amount, and the accuracy of the movement resolution is not improved.

  Further, when measuring light from the outside when measuring a semiconductor element in the atmosphere, there is a drawback that the operability of the manipulator is deteriorated. In addition, the use of the microscope objective lens is restricted by the light shielding structure. Further, when the light is shielded, the detection method based on the interlock circuit conduction causes malfunction of the interlock circuit due to the contact failure of the lid opening / closing circuit. Further, the interlock by the light curtain has a problem that the sensor of the light curtain works in front of the manipulator operation unit, and the manipulator cannot be operated.

JP 2004-333271 A

  The subject of this invention is providing the semiconductor test | inspection measuring device which can operate an internal probe in a triaxial direction with the manipulator provided along the outer surface of a shield chamber.

  Another problem of the present invention is that the operation unit is arranged on the front side of the manipulator, and the light shielding panel is arranged on the front surface so that the light does not enter from the outside and can be easily shielded. An object of the present invention is to provide a semiconductor inspection / measurement apparatus capable of preventing dew condensation of a semiconductor without allowing external moisture to enter by continuously putting dry air into the substrate.

  Still another object of the present invention is to provide a semiconductor inspection / measurement apparatus that enables use of a microscope having a light shielding structure and having a plurality of objective lenses.

  Still another object of the present invention is to provide a semiconductor inspection and measurement apparatus that detects the flow of compressed air with a flow meter and thereby can perform an interlock operation reliably. Conventionally, as such an interlock mechanism, each joint is electrically connected or a safety light curtain is used. However, a far superior system is provided.

  Still another invention of the present application is a semiconductor inspection / measurement in which a semiconductor element mounted on a DUT (Device under test) substrate can be subjected to an internal analysis of the semiconductor element under a temperature stress from a low temperature to a high temperature. Is to provide a device. Conventionally, a DUT substrate is housed in a thermo chamber and temperature control is performed, and the structure cannot be observed with a microscope and a probe operation can be performed with a manipulator.

  The above-described problems and other problems of the present invention will be made clear by the technical idea of the present invention described below and the embodiments thereof.

The main invention of the present application is a semiconductor inspection and measurement apparatus that performs inspection or measurement by bringing a probe needle into contact with a semiconductor by a manipulator disposed in a shield chamber.
The manipulator is disposed along the inside of the side surface of the shield chamber, and the manipulator includes an X-axis adjustment mechanism, a Y-axis adjustment mechanism, and a Z-axis adjustment mechanism.
The X-axis adjustment mechanism has an X-axis moving table provided with an adjustment screw for moving the probe needle in a direction toward the inspection measurement position of the shield chamber;
The Y-axis adjustment mechanism is provided on the X-axis moving table, and moves the probe needle in a lateral direction perpendicular to the direction toward the inspection / measurement position of the shield chamber; and the Y-axis moving table A pivot link mechanism for moving the
The Z-axis adjusting mechanism is provided on the Y-axis moving table, and has a Z-axis moving table that moves in the height direction of the shield chamber, and a universal joint that moves the Z-axis moving table in the height direction. ,
The operation portion of the X-axis adjustment mechanism, the operation portion of the Y-axis adjustment mechanism, and the operation portion of the Z-axis adjustment mechanism are projected outward at a right angle to an operation surface parallel to the outer surface of the shield chamber. The present invention relates to a semiconductor inspection / measurement apparatus.

  Here, the shield chamber is composed of a flat polygonal housing, a plurality of manipulators are arranged in the shield chamber, and the probe needles of the respective manipulators are directed to the inspection and measurement positions of the shield chamber. The manipulator may be disposed inside a side plate that forms each side of the polygon, and an operation surface of the manipulator may be an outer surface of the side plate that forms each side of the polygon. Further, the tip of the probe needle of the manipulator may be in contact with a semiconductor element mounted on a mounting portion disposed below the shield chamber through the bottom opening of the shield chamber.

  The Y-axis adjustment mechanism rotates the rotation link by a triangular rotation link that is rotatably supported on the XY plane by a frame of the manipulator, and an operator of the Y-axis adjustment mechanism. An adjusting screw to be moved and a pressing roller attached to the tip of the triangular rotation link, and the pressing roller moves by pushing a Y-axis moving table provided on the X-axis moving table in the lateral direction. In addition, the movement in the X-axis direction may be absorbed by the rolling of the pressing roller. The Z-axis adjusting mechanism includes a pair of bevel gears that are provided on the Y-axis moving table and convert the rotation direction to a right angle, and a feed screw that is rotated by the driven-side bevel gear to move the Z-axis moving table. , A universal joint that drives the drive-side bevel gear by an operator of the Z-axis adjusting mechanism, and an expansion / contraction mechanism, and the universal joint absorbs movement in the Y-axis direction, and the expansion / contraction mechanism moves in the X-axis direction. It may absorb movement. The side plate of the shield chamber in which the manipulator is disposed also serves as a shield plate that covers the operation surface of the manipulator, and the shield plate includes an operation unit of the X-axis adjustment mechanism and an operation unit of the Y-axis adjustment mechanism. Insertion holes are provided through which the operation parts of the Z-axis adjustment mechanism are inserted, respectively, and the operation parts of the X-axis adjustment mechanism, the Y-axis adjustment mechanism, and the Z-axis adjustment mechanism are inserted through the insertion holes. The operation surface of the manipulator may be covered from the outside while being inserted through the hole, and the gap between the adjacent side plate of the shield chamber and the manipulator may be closed.

  Further, the shield chamber is configured by combining a plurality of side plates, and each side plate is provided with a gas passage. When the side plates are correctly assembled, the gas passages are communicated with each other. One end of the gas passage may be connected to a gas pressure source, the other end of the gas passage may be connected to a flow meter having a float, and the float of the flow meter may be detected by a sensor. A lid is detachably or closably attached so as to close the upper opening of the shield chamber, and an auxiliary lid is attached to an opening for observation with a microscope at a substantially central portion of the lid, and the side plate of the shield chamber An air passage communicating with an air passage provided in the lid may be provided in the lid, and an open end of the air passage of the lid may be closed by the auxiliary lid.

  In addition, a measurement chamber is disposed below the shield chamber in which the manipulator is disposed, and a mounting portion of a semiconductor element for performing inspection or measurement is disposed below the measurement chamber, and the measurement chamber is disposed on an outer peripheral side thereof. A heating and / or cooling unit is provided, and the central part is a space, and the tip of the probe needle of the manipulator may be brought into contact with a predetermined part of the semiconductor element through the space. Further, the shield chamber and the mounting portion are movable up and down with respect to the measurement chamber, the mounting portion is lifted so as to close a central space of the measurement chamber from below, and the shield chamber is used for the measurement. The semiconductor device may be inspected or measured by lowering the shield chamber so as to close the central space of the chamber from above. In addition, a microscope may be disposed above the shield chamber, and the vicinity of the position where the tip of the probe needle of the manipulator of the semiconductor contacts may be observed. In addition, an opening may be provided in the lid of the shield chamber, an objective lens of the microscope may be inserted into the opening, and an auxiliary lid may be provided so as to close a gap between the openings.

  A preferred embodiment of the present invention uses a partition manipulator, operates the probe needle in the shield chamber, aligns the tip of the probe needle with the semiconductor element, etc., controls the environmental temperature of the semiconductor element, and dew condensation at low temperatures A microscope equipped with a plurality of objective lenses that can be changed with each other in a state in which light and noise from the outside are blocked, and an energy processing laser, and an interlock function for high-voltage measurement measurements The present invention relates to a semiconductor inspection and measurement apparatus.

  The manipulator axis operation part is arranged on a single operation surface. Even if each axis of the manipulator operation part fixed position moves, it is always constant, and the tip of the probe needle is the X axis. It is possible to move in the direction, the Y-axis direction, and the Z-axis direction. The light shielding plate attached to the operation surface of the manipulator is fixed to the side plate of the shield chamber from the front surface of the manipulator with a magnet, and the entire panel including the upper lid is installed so that compressed air can pass through the operation panel. Therefore, a path through which compressed air flows is constructed, a flow meter is installed at the final stage, the float is lifted by the flowed air, and the floating float is detected by a detection means such as a photocoupler. Thus, an interlock mechanism is configured to determine whether the shield chamber is in a good light-shielding state and to control the operation of the laser light source and the high-voltage power source in conjunction with the result. Further, the shield chamber can change and change the objective lens of the microscope in a state where the light is shielded, so that the magnification can be changed and the processing lens can be switched.

  A main invention of the present application is a semiconductor inspection / measurement apparatus that performs inspection or measurement by bringing a probe needle into contact with a semiconductor by a manipulator disposed in a shield chamber, and the manipulator is disposed along the inner side of the shield chamber. The manipulator includes an X-axis adjustment mechanism, a Y-axis adjustment mechanism, and a Z-axis adjustment mechanism. The X-axis adjustment mechanism is an X-axis moving table provided with an adjustment screw that moves the probe needle in a direction toward the inspection measurement position of the shield chamber. And a Y-axis adjusting mechanism provided on the X-axis moving table, for moving the probe needle in a lateral direction perpendicular to the direction toward the inspection and measurement position of the shield chamber, and the Y-axis moving table The Z-axis adjustment mechanism is provided on the Y-axis moving base and moves in the height direction of the shield chamber. A movable table and a universal joint that moves the Z-axis movable table in the height direction, and the operation unit of the X-axis adjustment mechanism, the operation unit of the Y-axis adjustment mechanism, and the operation unit of the Z-axis adjustment mechanism are shielded It is arranged so as to protrude outward at a right angle to the operation surface parallel to the outer surface of the chamber.

  Therefore, according to such a semiconductor inspection and measurement apparatus, the manipulator probe needle is moved and adjusted in the direction toward the center of the shield chamber by operating the operation portion of the X-axis adjustment mechanism protruding outward at a right angle on the operation surface. it can. Further, when the operation portion of the Y-axis adjustment mechanism protruding outward on the operation surface is operated, the probe needle can be moved in the lateral direction by the Y-axis adjustment mechanism. Further, when the operation portion of the Z-axis adjustment mechanism that protrudes outward at a right angle to the operation surface is operated, the probe needle of the manipulator can be moved and adjusted in the height direction. Accordingly, a semiconductor inspection / measurement apparatus is provided that can move and adjust the probe needle of the manipulator in the X-axis direction, the Y-axis direction, and the Z-axis direction by a three-axis operation unit on the operation surface parallel to the side surface of the shield chamber. become able to.

1 is a side view of an entire semiconductor inspection and measurement apparatus according to an embodiment of the present invention. It is a front view which shows especially the connection of a measurement chamber and a refrigerator of the semiconductor test | inspection measuring device. It is a principal part top view of the test | inspection measuring device which shows the structure of a shield chamber. It is the principal part side view. It is the principal part front view. It is a top view of the shield chamber mounted on the raising / lowering base. It is a principal part longitudinal cross-sectional view which shows arrangement | positioning with a shield chamber, a measurement chamber, and a mounting part. It is a principal part enlarged plan view which shows attachment of the manipulator in a shield chamber. It is a perspective view of the internal structure of the manipulator which incorporates an X-axis movement mechanism, a Y-axis movement mechanism, and a Z-axis movement mechanism. It is a top view of the manipulator. It is a side view of the manipulator. It is a front view of a manipulator. It is a perspective view which shows attachment of the front side light-shielding plate of a manipulator. It is a disassembled perspective view of a shield chamber. It is a side view which shows arrangement | positioning of the air path for the interlock of the side surface of a shield chamber. It is the same top view. It is a side view which shows arrangement | positioning of the air path provided in the cover body.

1 Overall Configuration of Semiconductor Inspection and Measurement Device FIG. 1 shows the overall configuration of a semiconductor inspection and measurement device according to an embodiment of the present invention. This device includes a gantry 10 and a support frame on the gantry 10. 11 is attached. A measurement chamber 12 is attached to the front side of the gantry 10 so as to protrude forward, and a mounting portion 13 for mounting a semiconductor element or the like to be measured is attached to the lower side thereof by a Z-axis rail 14 so as to be movable up and down. Yes. On the other hand, a shield chamber 15 is arranged above the measurement chamber 12. The shield chamber 15 is mounted on the lift base 16 and is movable in the Z-axis direction. A plurality of manipulators 40 are arranged in the shield chamber 15 as will be described later.

  A microscope 17 is disposed above the shield chamber 15 and is attached to the front side of the support frame 11 via a moving arm 18 and a lifting base 19. As shown in FIG. 3, the elevating base 19 is moved up and down by a Z-axis rail 20 mounted upright on the support frame 11 so that the elevating base 19 can be moved up and down. .

  Next, the measurement chamber 12 will be described with reference to FIG. The measurement chamber 12 is for adjusting the atmospheric temperature at the time of measurement of the semiconductor element mounted on the mounting unit 13, and is connected to the refrigerator 22 via the supply pipe 23 and the return pipe 24. A communication pipe 25 is connected between the supply pipe 23 and the return pipe 24. An air intake branch pipe 26 is connected to the return pipe 24. Air operation valves 29 and 30 are connected to the communication pipe 25 and the return pipe 24, respectively. An air operation valve 31 is connected to the air intake branch pipe 26, and a pressure regulator 32 is connected to the air operation valve 31.

  Next, the outline of the measurement operation by the shield chamber 15 located above the measurement chamber 12 will be described with reference to FIGS. As shown in FIG. 3, a total of 6 or 8 manipulators 40 are arranged in the shield chamber 15, three or four on one side. The manipulator 40 has a probe needle 41 protruding at a portion opposite to the operation portion. The probe needle 41 is connected to a DUT (Device under) on a mounting portion 13 disposed below the measurement chamber 12. test) A predetermined portion of the semiconductor element 43 mounted on the substrate 42 is brought into contact with the substrate 42. At this time, the microscope 17 arranged at the top is used for magnification and observation. Note that a pair of objective lenses 117 and 118 are attached to the lower end side of the microscope 17, and these lenses 117 and 118 can be arbitrarily replaced so that observation can be performed at an appropriate magnification. The microscope 17 is moved up and down by a lift base 46 provided on the support frame 11.

  Next, the relationship between the shield chamber 15 in which the manipulator 40 is housed and the measurement chamber 12 will be described in more detail with reference to FIGS. The measurement chamber 12 arranged below the shield chamber 15 sucks air by causing an air blowing part 51 that blows air toward the central part on the outer peripheral side and an air flow from the central part to the outer peripheral side. An air suction part 52 is provided on the upper part. A ring-shaped rectifying plate 53 is provided between the air blowing portion 51 and the air suction portion 52. By this rectifying plate 53, the air blown from the air blowing portion 51 goes to the central portion of the measurement chamber 12, and then flows downward through a circular opening at the center of the rectifying plate 53 and is arranged on the lower side. An air flow 54 sucked by the air suction holes 52 is formed.

  A semiconductor element 43 is mounted on the upper surface of the mounting portion 13 disposed below the measurement chamber 12 by a DUT substrate 42. The downward air flow 54 is blown to the semiconductor element 43 on the DUT substrate 42. The probe needles 41 on the tip side of the six or eight manipulators 40 arranged in the shield chamber 15 come into contact with the semiconductor element 43 on the DUT substrate 42, and in this state, the probe needle 41 contacts the semiconductor element 43. A voltage is applied or a current is applied, or a voltage value or a current value is measured.

  Next, the overall operation of the semiconductor inspection and measurement apparatus having the above configuration will be described. The DUT substrate 42 on which the semiconductor element 43 is mounted is placed on the mounting portion 13, and the mounting portion 13 is moved upward with respect to the measurement chamber 12 to close the bottom opening of the measurement chamber 12. Further, the shield chamber 15 is lowered to close the upper opening of the measurement chamber 12.

  Next, the temperature atmosphere in the measurement chamber 12 is set. That is, air is supplied into the measurement chamber 12 by the supply pipe 23 and the roots pump 28, and the air is discharged from the measurement chamber 12 through the return pipe 24. And when raising the temperature in the measurement chamber 12, the temperature of the air supplied by the heater 27 is raised. On the other hand, when the temperature in the measurement chamber 12 is lowered, the temperature of the air is lowered by the cool air supplied through the supply pipe 23 by the refrigerator 22. By such an operation, the temperature of the air in the measurement chamber 12 is set to an appropriate value.

In the state as described above, the probe needle 41 is moved in the X-axis direction, the Y-axis direction, and the Z-axis direction by the manipulator 40 in the shield chamber 15, whereby the probe needle 41 is moved to a predetermined position of the semiconductor element 43. Touch the tip of. Then, a voltage is applied to the semiconductor element 43 by the probe needle 41 to pass a current, or a voltage or current at a predetermined position of the semiconductor element 43 is detected. At this time, the microscope 17 optically observes. Further, a laser beam from a YAG laser generation source (not shown) is irradiated to a predetermined portion of the semiconductor element 43, whereby local energy processing of the semiconductor element 43 is performed to correct a wiring error such as a bridge.
2 Probe Needle Movement Mechanism Next, a structure for adjusting the position of the manipulator 40 disposed in the shield chamber 15 will be described with reference to FIGS. The manipulator 40 includes a base 62 on the bottom side and an X-axis rail 63 on the base 62. On the X-axis rail 63, an X-axis moving table 64 is arranged in the X-axis direction, that is, the direction in which the probe needle 41 extends. A feed screw 65 for moving the X-axis moving table 64 is connected to the X-axis moving table 64.

  Next, a Y-axis moving table 66 is mounted on the X-axis moving table 64 so as to be movable in the Y-axis direction. The Y-axis moving table 66 is moved in the horizontal direction, that is, the Y-axis direction by the rotation link 67. The rotation link 67 is rotatably supported on the frame of the manipulator by a pin 68 and is connected to the feed screw 69 so that the rotation link 67 is rotated by the feed screw 69. A pressing roller 70 is attached to the tip of the rotation link 67, and this pressing roller 70 is elastically pressure-bonded to the side surface of the projecting piece 71 of the Y-axis moving table 66 by a spring (not shown).

  Next, the Z axis moving mechanism will be described. A bearing 72 is mounted on the Y-axis moving table 66, and the drive shaft 73 is rotatably supported by the bearing 72. The drive shaft 73 includes a pair of universal joints 74 and 75. Between the universal joints 74 and 75, the drive shaft 73 is composed of a rod 76 and a sleeve 77, and a long hole 78 extending in the longitudinal direction on the outer peripheral surface of the sleeve 77 protrudes on the outer peripheral surface of the rod 76. Is engaged.

  A bevel gear 81 is fixed to the tip of the drive shaft 73. The bevel gear 81 meshes with a bevel gear 82 whose rotation axis coincides with the Z axis. The bevel gear 82 includes a feed screw 83, and the feed screw 83 moves the Z-axis moving table 84 along the Z-axis rail 85 in the height direction, that is, the Z-axis direction. On the Z-axis moving base 84, the base end portion of the probe needle 41 is attached to the Z-axis moving base 84 with the base end side being held by the holding portion 58. A magnet chuck 86 is fixed to the bottom of the manipulator 40 and below the base 62. The manipulator 40 is fixed on the lift base 16 by a magnet chuck 86.

  An upright base 90 is attached to the front side of the base 62 of the manipulator 40, and an X-axis operation knob 91, a Y-axis operation knob 92, and a Z-axis operation knob are projected on the upright base 90 so as to protrude to the front side. 93 and a magnet chuck operation shaft 94 project from each other. Here, the X-axis operation knob 91, the Y-axis operation knob 92, and the Z-axis operation knob 93 are each composed of a micrometer head having a precision screw therein. Further, as shown in FIGS. 10 and 11, a magnet chuck operating shaft 94 is provided with a rotatable operating portion 96 via a pin 95 as shown in FIGS. 10 and 11. 96 is bent at a right angle before being operated.

  The X-axis operation knob 91 is connected to an X-axis feed screw 65. The Y-axis operation knob 92 is connected to the Y-axis feed screw 69. The Z-axis operation knob 93 is connected to the universal joint 75.

  On the front side of the upright base 90 of the manipulator 40, as shown in FIG. 13, a side plate 100 also serving as a light shielding plate is mounted. The side plate 100 is formed with four openings 101, 102, 103, and 104, respectively. These openings 101, 102, 103, and 104 are the X-axis operation knob 91, the Y-axis operation knob 92, the Z-axis operation knob 93, and the magnet. Each chuck operating shaft 94 is inserted, and in this state, the chuck operating shaft 94 is attached to the upright base 90 on the front side of the manipulator 40 so as to overlap. Then, both side ends of the side plate 100 overlap with the mounting plates 105 that are located on both sides of the side plate 100 and constitute the side plate of the shield chamber 15, whereby the manipulator of the shield chamber 15 is formed by the light shielding plate made of the side plate 100. The opening at the mounting position of 40 is completely shielded from light.

  Next, the movement operation of the probe needle 41 by such a manipulator will be described. When the X-axis operation knob 91 protruding to the front side of the side plate 100 is rotated, the X-axis moving table 64 is moved in the X-axis direction by the feed screw 65. Accordingly, the probe needle 41 is moved and adjusted in the X-axis direction, that is, in the left and right directions in FIGS. 10 and 11 via the Y-axis moving table 66 and the Z-axis moving table 84 placed thereon.

  Next, when the Y-axis operation knob 92 protruding from the side plate 100 to the front side is rotated, the rotation link 67 is rotated around the pin 68 by the feed screw 69. Therefore, the pressing roller 70 attached to the tip of the rotation link 67 pushes the protrusion 71 of the Y-axis moving table 66 or moves away from the protruding piece, and the pressing roller 70 and the Y-axis moving table. 66 are connected to each other by an elastic spring, so that the Y-axis moving table 66 is moved in the lateral direction. Accordingly, the lateral movement of the Y-axis moving table is transmitted to the probe needle 41 via the Z-axis moving table 84, and the probe needle 41 is moved in the Y-axis direction. The movement of the X-axis moving table 64 in the X-axis direction is absorbed by the pressing roller 70 of the rotation link 67 rolling on the protruding piece 71 on the side surface of the Y-axis moving table 66.

  Next, when the Z-axis operation knob 93 protruding to the front side of the side plate 100 is rotated, the bevel gear 81 is rotated via the universal joints 74 and 75 and the drive shaft 73. Accordingly, the bevel gear 82 meshing with the bevel gear 81 is driven, and the feed screw 83 moves the Z-axis moving base 84 in the height direction and in the Z-axis direction. Accordingly, the probe needle 41 is moved in the height direction. When the pin 79 of the rod 76 between the universal joints 74 and 75 moves in the long hole 78 of the sleeve 77, the drive shaft 73 expands and contracts to absorb the amount of movement in the X-axis direction. The pair of universal joints 74 and 75 absorb the movement of the Y-axis moving table 66 in the Y-axis direction.

By the operation as described above, the probe needle 41 is moved in the X-axis direction, the Y-axis direction, and the Z-axis direction while being protruded from the distal end portion of the manipulator 40. FIG. 8 shows a state in which the probe needles 41 of the manipulator 40 arranged along the mounting plate 105 constituting the side plate in the shield chamber 65 are arranged so as to face the center of the measurement chamber 12. The semiconductor element 43 mounted on the DUT substrate 42 is located at a position on the tip side where the probe needle 41 substantially intersects, and this position can be observed with the microscope 17 from above.
3 Interlock Mechanism This semiconductor inspection / measurement device prevents the carrier from moving in the semiconductor element 43 by light entering from the outside, or shields the probe needle 41 so that a high voltage can be applied, and improves safety. Therefore, an interlock mechanism is provided. The interlock mechanism allows an air flow to flow and detects it by the float 125 of the flow meter 124.

  As shown in FIG. 14, the shield chamber 15 is a housing assembled by a side plate disposed on the elevating base 16. The side plates 100, which also serve as light shielding plates, are overlapped at predetermined positions of the side plates, thereby shielding the mounting position of the manipulator 40. Moreover, such a shield chamber 15 is closed by a lid body 110 disposed on the upper portion thereof. The lid 110 includes a side wall 111 on the outer side, and the side wall 111 overlaps the outside of the side plate. Therefore, the upper opening of the shield chamber 15 is closed by the lid 110.

  The lid body 110 is formed with a concave portion 112 at a substantially central portion thereof, and a horizontally elongated opening 113 is formed at the bottom portion of the concave portion 112. An auxiliary lid 114 is attached to cover the horizontally long opening 113 so as to be freely opened and closed. A pair of openings 115 and 116 are formed in the auxiliary lid 114, and the pair of objective lenses 117 and 118 of the microscope 17 are inserted into these openings 115 and 116, respectively. The pair of objective lenses 117 and 118 of the microscope 17 are movable in the arrangement direction of the objective lenses 117 and 118, and either one of the objective lenses 117 and 118 is selected so as to coincide with the optical axis, and is desired. It is supposed to be a magnification of. Regardless of which objective lens 117, 118 is selected at this time, the auxiliary lid 114 has an extra length with respect to the horizontally long opening 13 so as to always close the horizontally long opening 113.

  Next, the interlock mechanism will be described. As shown in FIG. 15, air passages 121 and 122 are respectively formed in the side plate 100 serving also as a light shielding plate covering the side plate of the shield chamber 15 and the mounting position of the manipulator 40. When the side plate 105 is correctly assembled, the air passages 121 and 122 are communicated with each other through a small hole at the connection position. One end side of the air passages 121 and 122 is connected to the air pressure source, and the other end side is connected to the flow meter 124 via the tube 123. A float 125 is accommodated in the flow meter 124 in a floating state, and the position of the float 125 is detected by a photosensor 126. An air passage 127 extending in the longitudinal direction is branched and formed in one of the air passages 121 and 122.

  The vertical air passage 127 communicates with the air passage 129 of the communication block 128 attached to the upper edge on the outer side of the side plate of the shield chamber 15. The air passage 129 of the communication block 128 is communicated with the air passage 130 of the lid 110. The air passage 130 extends into the recess 112 of the lid 110, and the air passage 130 has an open end 131 at the tip. The open end 131 is closed by an auxiliary lid 114 having openings 115 and 116 into which the objective lenses 117 and 118 are inserted.

  In the above configuration, when performing inspection and measurement of the semiconductor element 43 on the DUT substrate 42, the shield chamber 15 is closed by the lid 110, and the objective lenses 117 and 118 of the microscope 17 are inserted into the recess 112. At this time, the objective lenses 117 and 118 are inserted into the openings 115 and 116 of the auxiliary lid 114. In this state, the auxiliary lid 114 closes the horizontally long opening 113 of the concave portion 112 of the lid body 110. Further, the side plate 100 of the shield chamber 15 in which the manipulator 40 is disposed on the inside forms an outer casing of the shield chamber together with the side plate of the shield chamber 15. In such a state, as shown in FIGS. 15 and 16, the air passages 121 and 122 formed in the side plate of the shield chamber 15 and the side plate 100 communicate with each other. The vertical air passage 127 is communicated with the air passage 129 of the communication block 128 and the air passage 130 of the lid 110, and the open end 131 on the front end side of the air passage 130 is blocked by the auxiliary lid 114. Become. Therefore, the portion on the front end side of the air passage 127 extending in the vertical direction is closed by the auxiliary lid 114 covering the open end 131.

  Therefore, when compressed air is flowed from the air pressure source through the air passages 122 and 121, the float 125 of the flowmeter 124 is lifted by the compressed air, and the floated float 125 is detected by the photosensor 126. On the other hand, if the air passage is not formed correctly or the open end 131 of the air passage 130 on the lid 110 side is not blocked by the auxiliary lid 114, the air leaks and the float 125 of the flow meter 124 falls, and the photo sensor 126 It will not be detected.

  The state in which the photo sensor 126 detects the float 125 indicates that the shield chamber 15 has been correctly assembled. In other words, when the shield chamber 15 is correctly assembled in a shielded state, when the compressed air is allowed to flow through the air passages 121 and 122, the float 125 of the flow meter 124 rises, and this is detected by the photosensor 126 to improve safety. Can be confirmed.

  Thus, even if a high voltage is applied by the probe needle 41 of the manipulator 40 in a state where the shield chamber 15 is properly shielded, there is no danger of electric shock or the like. Further, when the measurement is performed in a state where the shield chamber 15 is completely shielded, external light does not enter the measurement chamber 12 from the outside through the shield chamber 15 and the carrier in the semiconductor element 43 does not move. Therefore, safe and correct inspection measurement is possible. Moreover, the danger at the time of repairing the semiconductor element 43 by fine energy processing by irradiating a YAG laser (not shown) is also avoided.

  Although an example in which a flow sensor having a float 125 is used as the flow meter 124 is shown, a flow meter that detects a flow rate by electrical means can be used instead of such a configuration. That is, an electric flow meter that changes the signal output according to the flow rate passing through the inside may be used to detect whether or not air is leaking with such a flow meter.

  Although the present invention has been described above with reference to the illustrated embodiments, the present invention is not limited to the above-described embodiments, and various modifications can be made within the scope of the technical idea of the present invention.

  In the present invention, a semiconductor element 43 is mounted on a DUT substrate 42, and a predetermined part of the semiconductor element 43 is brought into contact with the probe needle 41 of the manipulator 40 while a voltage is applied and a current is passed to perform inspection and measurement. Alternatively, the voltage and current can be detected through the probe needle 41 to check the operation of the semiconductor element 43, and a predetermined part of the semiconductor element 43 is irradiated with laser light and subjected to local energy processing to provide a semiconductor. The present invention can be used for a semiconductor inspection / measurement apparatus that repairs the element 43.

DESCRIPTION OF SYMBOLS 10 Base 11 Support frame 12 Measurement chamber 13 Mounting part 14 Z-axis rail 15 Shield chamber 16 Lifting base 17 Microscope 18 Moving arm 19 Lifting base 20 Z-axis rail 22 Refrigerator 23 Supply pipe 24 Return pipe 25 Communication pipe 26 Air intake branch pipe DESCRIPTION OF SYMBOLS 27 Heater 28 Roots pump 29-31 Air operation valve 32 Pressure regulator 40 Manipulator 41 Probe needle 42 DUT board 43 Semiconductor element 46 Lifting base 51 Air blowing part 52 Air suction part 53 Current plate 54 Air flow 58 Holding part 62 Base 63 X-axis rail 64 X-axis moving table 65 Feed screw 66 Y-axis moving table 67 Rotating link 68 Pin 69 Feed screw 70 Press roller 71 Projection piece 72 Bearing 73 Drive shaft 74, 75 Universal joint 76 Rod 77 Sleeve 78 Long hole 79 Pin 81, 82 Bevel gear 83 Feed screw 84 Z-axis moving table 85 Z-axis rail 86 Magnet chuck 90 Upright base 91 X-axis operation knob 92 Y-axis operation knob 93 Z-axis operation knob 94 Magnet chuck operation shaft 95 Pin 96 Operation unit 100 Side plate (shading plate)
101-104 opening 105 mounting plate 110 lid body 111 side wall 112 recess 113 laterally long opening 114 auxiliary lid 115, 116 opening 117, 118 objective lens 121, 122 air passage 123 tube 124 flow meter 125 float 126 photosensor 127 air passage (vertical direction) )
128 Communication block 129, 130 Air passage 131 Open end

Claims (12)

In a semiconductor inspection and measurement apparatus that performs inspection or measurement by bringing a probe needle into contact with a semiconductor by a manipulator arranged in a shield chamber,
The manipulator is disposed along the inside of the side surface of the shield chamber, and the manipulator includes an X-axis adjustment mechanism, a Y-axis adjustment mechanism, and a Z-axis adjustment mechanism.
The X-axis adjustment mechanism has an X-axis moving table provided with an adjustment screw for moving the probe needle in a direction toward the inspection measurement position of the shield chamber;
The Y-axis adjustment mechanism is provided on the X-axis moving table, and moves the probe needle in a lateral direction perpendicular to the direction toward the inspection / measurement position of the shield chamber; and the Y-axis moving table A pivot link mechanism for moving the
The Z-axis adjusting mechanism is provided on the Y-axis moving table, and has a Z-axis moving table that moves in the height direction of the shield chamber, and a universal joint that moves the Z-axis moving table in the height direction. ,
The operation portion of the X-axis adjustment mechanism, the operation portion of the Y-axis adjustment mechanism, and the operation portion of the Z-axis adjustment mechanism are projected outward at a right angle to an operation surface parallel to the outer surface of the shield chamber. A semiconductor inspection and measurement apparatus characterized by being arranged in   The shield chamber is composed of a flat polygonal housing, a plurality of manipulators are arranged in the shield chamber, and the manipulators are arranged such that the probe needles of the respective manipulators are directed to the inspection and measurement positions of the shield chamber. 2. The semiconductor inspection according to claim 1, wherein the semiconductor inspection device is arranged inside a side plate constituting each side of the polygon, and an operation surface of the manipulator is an outer surface of the side plate constituting each side of the polygon. measuring device.   The tip of the probe needle of the manipulator is in contact with a semiconductor element mounted on a mounting portion disposed on the lower side of the shield chamber through a bottom opening of the shield chamber. Semiconductor inspection and measurement equipment.   The Y-axis adjusting mechanism includes a triangular rotating link that is rotatably supported on an XY plane by a frame of the manipulator, and an adjustment that rotates the rotating link by an operator of the Y-axis adjusting mechanism. A screw and a pressing roller attached to the tip of the triangular rotating link, and the pressing roller moves the Y-axis moving table provided on the X-axis moving table by pushing it in the lateral direction. The semiconductor inspection and measurement apparatus according to claim 1, wherein movement in the X-axis direction is absorbed by rolling of the pressing roller.   The Z-axis adjusting mechanism includes a pair of bevel gears that are provided on the Y-axis moving base and convert the rotation direction to a right angle, a feed screw that is rotated by a driven-side bevel gear and moves the Z-axis moving base, A universal joint that drives a drive-side bevel gear by an operator of a Z-axis adjustment mechanism, and an expansion / contraction mechanism; the universal joint absorbs movement in the Y-axis direction; and the expansion / contraction mechanism moves in the X-axis direction. The semiconductor inspection and measurement apparatus according to claim 1, wherein   The side plate of the shield chamber in which the manipulator is arranged also serves as a shield plate that covers the operation surface of the manipulator, and the shield plate includes an operation portion of the X-axis adjustment mechanism, an operation portion of the Y-axis adjustment mechanism, and a Z Insertion holes are provided through which the operation parts of the axis adjustment mechanism are inserted, respectively, and the operation parts of the X-axis adjustment mechanism, the operation part of the Y-axis adjustment mechanism, and the operation part of the Z-axis adjustment mechanism are respectively inserted into the insertion holes. 3. The semiconductor inspection and measurement apparatus according to claim 2, wherein the operation surface of the manipulator is covered from the outside in a state where the manipulator is inserted, and a gap between an adjacent side plate of the shield chamber and the manipulator is closed.   The shield chamber is configured by combining a plurality of side plates, and each side plate is provided with a gas passage. When the side plates are properly assembled, the gas passages are communicated with each other and communicate with each other. The one end of the gas passage is connected to a gas pressure source, the other end of the gas passage is connected to a flow meter having a float, and the float of the flow meter is detected by a sensor. The semiconductor inspection and measurement apparatus described.   A lid is detachably or closably attached so as to close the upper opening of the shield chamber, and an auxiliary lid is attached to an opening for observation with a microscope at a substantially central portion of the lid, and is attached to a side plate of the shield chamber. The air passage communicating with the provided air passage is provided in the lid, and the open end of the air passage of the lid is closed by the auxiliary lid. Semiconductor inspection and measurement equipment.   A measurement chamber is disposed below the shield chamber in which the manipulator is disposed, and a mounting portion of a semiconductor element for performing inspection or measurement is disposed below the measurement chamber. 2. The semiconductor inspection according to claim 1, further comprising a cooling unit and having a space at a center portion, and a tip portion of a probe needle of the manipulator is brought into contact with a predetermined portion of the semiconductor element through the space. measuring device.   The shield chamber and the mounting portion are movable up and down with respect to the measurement chamber, the mounting portion is lifted so as to close the central space of the measurement chamber from below, and the shield chamber becomes the measurement chamber. The semiconductor inspection and measurement apparatus according to claim 9, wherein the semiconductor chamber is inspected or measured by lowering the shield chamber so as to close the central space from above.   11. The semiconductor inspection and measurement apparatus according to claim 9, wherein a microscope is disposed above the shield chamber and observes the vicinity of a position where a tip end of a probe needle of the manipulator of the semiconductor contacts.   12. The opening according to claim 11, wherein an opening is provided in the lid of the shield chamber, an objective lens of the microscope is inserted into the opening, and an auxiliary lid is provided so as to close a gap between the openings. Semiconductor inspection and measurement equipment.

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