JP2011000590A - Filter device - Google Patents

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JP2011000590A
JP2011000590A JP2010193971A JP2010193971A JP2011000590A JP 2011000590 A JP2011000590 A JP 2011000590A JP 2010193971 A JP2010193971 A JP 2010193971A JP 2010193971 A JP2010193971 A JP 2010193971A JP 2011000590 A JP2011000590 A JP 2011000590A
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spiral
exhaust gas
flow path
filter device
filter
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Yoshitaka Saito
藤 義 貴 斉
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Taisei Giken Co Ltd
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Taisei Giken Co Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a filter device capable of removing fine particles contained in an exhaust gas, the particles having larger particle size to smaller particle size, in proportion to a speed of the exhaust gas.SOLUTION: The filter device includes: a casing 2 having an inlet 6 and an outlet 8; a diaphragm 3 arranged in the casing 2 so as to have a plurality of spiral parts to form a spiral flow path 11; and a filter member 4 arranged on at least one surface of the diaphragm 3, wherein the flow path width (A) of the spiral part 3a located on the outermost side of the spiral flow path 11 is made wider than the flow path width (B) of the spiral part 3b located on the inner side than the outermost side of the spiral flow path 11, and the fine particles contained in the exhaust gas are made to have a larger linear speed on the spiral part located on the inner side than on the spiral part located on the outer side of the spiral flow path.

Description

本発明は、たとえば、半導体製造プロセスや液晶製造プロセスに配置され、排気ガスに含まれる反応生成物等の微粒子を除去したり、液体に含まれるミストを回収するためのフィルター装置に関する。   The present invention relates to a filter device that is disposed in, for example, a semiconductor manufacturing process or a liquid crystal manufacturing process, and removes fine particles such as reaction products contained in exhaust gas or collects mist contained in a liquid.

半導体製造プロセスには、イオン注入法、アルミ等の金属エッチング法、CVD法を含む各種の方式が採用されているが、いずれの方式を採用した半導体製造プロセスにおいても、フッ化水素酸、シランガス、テトラエトキシシラン、アンモニア等の有害ガスや反応生成物等の夾雑物、その他ミストやダストといった微粒子が混在する排気ガスを発生する。排気ガス中に混在する微粒子の量は、特に、CVD法の半導体製造プロセスでは多いことが分かっている。   Various methods including an ion implantation method, a metal etching method such as aluminum, and a CVD method are employed in the semiconductor manufacturing process, but in any semiconductor manufacturing process employing any method, hydrofluoric acid, silane gas, Exhaust gas containing harmful gases such as tetraethoxysilane and ammonia, impurities such as reaction products, and other fine particles such as mist and dust is generated. It has been found that the amount of fine particles mixed in the exhaust gas is particularly large in a CVD semiconductor manufacturing process.

そのため、半導体製造プロセスには、排気ガス中に混在する微粒子を除去するための除害設備が配置されている。
従来の除害設備は、排気ガスに含まれる微粒子をイオン交換樹脂やゼオライトといった吸着材に吸着させたり、水スクラバーにより水に吸着させたり、バーナーによる燃焼で分解したりすることで除去している。
Therefore, a detoxification facility for removing fine particles mixed in the exhaust gas is arranged in the semiconductor manufacturing process.
Conventional abatement equipment removes fine particles contained in exhaust gas by adsorbing them on an adsorbent such as ion exchange resin or zeolite, adsorbing them in water with a water scrubber, or decomposing them by combustion with a burner. .

排気ガス中の微粒子を除去する場合、吸着材による除害設備では、吸着される微粒子により吸着材の単位面積当りの圧力損失が大きくなっしまうという問題があり、水スクラバーによる除害設備では、吸着液が微粒子によりヘドロ状となるのでヘドロ処理が必要となるという問題があり、燃焼による除害設備では、バーナーのノズルが詰まったり燃焼室が汚れるという問題がある。   When removing particulates in the exhaust gas, there is a problem that the pressure loss per unit area of the adsorbent increases due to the adsorbed particulates in the abatement equipment using the adsorbent. Since the liquid becomes sludge due to fine particles, there is a problem that a sludge treatment is necessary, and in the abatement equipment by combustion, there is a problem that the nozzle of the burner is clogged or the combustion chamber becomes dirty.

本出願人は、半導体製造プロセスに配置された除害設備の上流側に前処理装置として配置することで、半導体製造プロセスの排気ガス中に多量の微粒子が含まれている場合でも、除害設備のメンテナンスを容易に行うことができるフィルター装置を開発した(例えば特許文献1参照)。   The present applicant arranges the pretreatment device upstream of the abatement equipment arranged in the semiconductor manufacturing process, so that even if a large amount of fine particles are contained in the exhaust gas of the semiconductor manufacturing process, the abatement equipment Has been developed (for example, see Patent Document 1).

上記フィルター装置は、入口と出口を有するケーシングと、複数の渦巻部を有し連続した渦巻状流路を形成するようにケーシング内に配置された隔壁と、隔壁の少なくとも一面に配置されたフィルター部材とを有し、ケーシング内に導入される排気ガスを渦巻状流路に沿って進行させる際に、排気ガスに含まれる微粒子を渦巻状流路に配置したフィルター部材により除去し、微粒子を除去した排気ガスを出口から除害設備に送り込むようにしている。
特開2001−149723号公報(第3頁、図3)
The filter device includes a casing having an inlet and an outlet, a partition wall disposed in the casing so as to form a continuous spiral channel having a plurality of spiral portions, and a filter member disposed on at least one surface of the partition wall When the exhaust gas introduced into the casing travels along the spiral flow path, the fine particles contained in the exhaust gas are removed by the filter member disposed in the spiral flow path, and the fine particles are removed. Exhaust gas is sent from the outlet to the abatement equipment.
JP 2001-149723 A (page 3, FIG. 3)

上記フィルター装置は、渦巻状流路の渦巻部の流路幅が外端から内端まで同じ寸幅に設定されているので、渦巻状流路を流れる排気ガスは、その線速度が渦巻状流路の外側で早く内側で遅くなり、排気ガス中に含まれる微粒子を排気ガスの速度と比例して粒子径が大きい粒子から粒子径の小さい粒子まで除去することができない。   In the above filter device, the flow path width of the spiral portion of the spiral flow path is set to the same dimension from the outer end to the inner end, so that the exhaust gas flowing through the spiral flow path has a linear velocity of the spiral flow. The particle is contained in the exhaust gas from the particle having a large particle size to the particle having a small particle size in proportion to the exhaust gas velocity.

本発明は、上記した点を考慮してなされたもので、渦巻状流路を流れる排気ガスの線速度を外側渦巻部で遅く内側渦巻部で早くすることで、排気ガス中に含まれる微粒子を排気ガスの速度と比例して粒子径が大きい粒子から粒子径の小さい粒子まで除去することができるフィルター装置を提供することを目的とする。   The present invention has been made in consideration of the above-mentioned points, and by reducing the linear velocity of the exhaust gas flowing through the spiral flow path at the outer spiral portion and at the inner spiral portion, the particulates contained in the exhaust gas are reduced. It is an object of the present invention to provide a filter device capable of removing particles having a large particle size from particles having a small particle size in proportion to the exhaust gas velocity.

本発明のフィルター装置は、入口と出口を有するケーシングと、複数の渦巻部を有し連続した渦巻状流路を形成するようにケーシング内に配置された隔壁と、隔壁の少なくとも一面に配置されたフィルター部材とを有し、種々の大きさの微粒子を含む排気ガスが前記入口から導入されるフィルター装置において、前記渦巻状流路の外端側に位置する渦巻部の流路幅をこれより内側に位置する渦巻部の流路幅より広くし、排気ガス中に含まれる微粒子が前記渦巻状流路の外側に位置する渦巻部におけるよりもより内側に位置する渦巻部においてより大きい線速度を有するようにしたことを特徴とする。   The filter device of the present invention has a casing having an inlet and an outlet, a partition wall disposed in the casing so as to form a continuous spiral channel having a plurality of spiral portions, and disposed on at least one surface of the partition wall. And a filter device in which exhaust gas containing fine particles of various sizes is introduced from the inlet, the flow path width of the spiral portion located on the outer end side of the spiral flow path is inside the filter device And the fine particles contained in the exhaust gas have a larger linear velocity in the spiral portion located inside than the spiral portion located outside the spiral flow passage. It is characterized by doing so.

また、本発明のフィルター装置は、隔壁の内側空間に円筒状フィルターを配置することで、全体構造をコンパクトにすることができる。   Moreover, the filter apparatus of this invention can make a whole structure compact by arrange | positioning a cylindrical filter in the inner space of a partition.

本発明のフィルター装置は、渦巻状流路を流れる排気ガスは外側渦巻部の線速度が遅く内側渦巻部の線速度が早いので、排気ガス中に含まれる粒子径が大きい粒子を渦巻状流路の外側部分で捕捉し、粒子径が小さい粒子を渦巻状流路の内側部分で捕捉することにより排気ガス中に含まれる微粒子を排気ガスの速度と比例して粒子径が大きい粒子から粒子径の小さい粒子まで除去することができる。   In the filter device of the present invention, since the exhaust gas flowing through the spiral flow path has a low linear velocity of the outer spiral part and a high linear velocity of the inner spiral part, particles having a large particle diameter contained in the exhaust gas are removed from the spiral flow path. By capturing particles with a small particle size at the inner part of the spiral flow path, particles contained in the exhaust gas are collected from particles having a large particle size in proportion to the exhaust gas velocity. Even small particles can be removed.

本発明の好ましい実施の形態のフィルター装置の縦断面図である。It is a longitudinal cross-sectional view of the filter apparatus of preferable embodiment of this invention. 図1の線A−Aに沿った断面図である。It is sectional drawing along line AA of FIG. 本発明によるフィルター装置の他の実施の形態を示す図である。It is a figure which shows other embodiment of the filter apparatus by this invention.

以下、本発明のフィルター装置を図面に基づいて詳細に説明する。
本発明のフィルター装置1は、図1および図2に示すように、円筒状ケーシング2と、円筒状ケーシング2の内部に配置された渦巻状隔壁3と、円筒状ケーシング2および隔壁3の内面に配置されたフィルター部材4と、隔壁3の中央部に配置された円筒状フィルター5とを有する。
Hereinafter, a filter device of the present invention will be described in detail with reference to the drawings.
As shown in FIGS. 1 and 2, the filter device 1 of the present invention includes a cylindrical casing 2, a spiral partition 3 disposed inside the cylindrical casing 2, and an inner surface of the cylindrical casing 2 and the partition 3. It has the filter member 4 arrange | positioned and the cylindrical filter 5 arrange | positioned in the center part of the partition 3. FIG.

上記円筒状ケーシング2は、図1に示すように、入口6を側壁7aの上部に設けた上端開口の円筒状ケーシング本体7と、中央部に出口8を有し円筒状ケーシング本体7の開口端に固着される蓋体9を有する。蓋体9の下面に出口8に対応して円筒状フィルター5が固定手段10により取り付けられている。   As shown in FIG. 1, the cylindrical casing 2 has a cylindrical casing body 7 having an upper end opening with an inlet 6 provided on the upper side of a side wall 7a, and an opening end of the cylindrical casing body 7 having an outlet 8 in the center. The lid 9 is fixed to the head. A cylindrical filter 5 is attached to the lower surface of the lid 9 by a fixing means 10 corresponding to the outlet 8.

上記渦巻状隔壁3は、図2に示すように、3つの渦巻部3a,3b,3cを有する。渦巻状隔壁3の高さは、筒状ケーシング本体7の高さにほぼ一致している。渦巻状隔壁3は、円筒状ケーシング2の内部に配置された時、円筒状ケーシング2の内部に外方から内方に連続して延びる渦巻状流路11を形成する。渦巻状隔壁3の面を凹凸面にしたり、渦巻状隔壁3に邪魔板を設けることが好ましい。   As shown in FIG. 2, the spiral partition 3 has three spiral portions 3a, 3b, and 3c. The height of the spiral partition 3 substantially matches the height of the cylindrical casing body 7. When the spiral partition wall 3 is arranged inside the cylindrical casing 2, it forms a spiral channel 11 that continuously extends from the outside to the inside inside the cylindrical casing 2. It is preferable that the surface of the spiral partition wall 3 is an uneven surface or a baffle plate is provided on the spiral partition wall 3.

上記渦巻状流路11のうちの円筒状ケーシング2の内壁2aと最外側に位置する渦巻部3aとの間に形成される渦巻状流路11aは、その流路幅Aを渦巻部3aとそれより内側に位置する渦巻部3bとの間に形成される流路11bの流路幅Bより広く設定されている。同様に、上記渦巻状流路11のうちの渦巻部3aと渦巻部3bとの間に形成される流路11bの流路幅Bは、渦巻部3bとそれより内側に位置する渦巻部3cとの間に形成される流路11cの流路幅Cより広く設定されている。すなわち、渦巻状流路11は、排気ガスの進行方向に外方から内方に流路幅を順次狭くしている。   Of the spiral flow channel 11, the spiral flow channel 11a formed between the inner wall 2a of the cylindrical casing 2 and the spiral portion 3a located on the outermost side has a flow width A and the spiral portion 3a. It is set wider than the channel width B of the channel 11b formed between the spiral part 3b located on the inner side. Similarly, the channel width B of the channel 11b formed between the spiral part 3a and the spiral part 3b in the spiral channel 11 is the spiral part 3b and the spiral part 3c located inside the spiral part 3b. Is set wider than the channel width C of the channel 11c formed between the two. That is, the spiral flow passage 11 has a flow passage width that narrows sequentially from the outside to the inside in the direction of travel of exhaust gas.

上記実施の形態では、渦巻状流路11を形成する渦巻状隔壁3は3つの渦巻部により形成されているが、渦巻部の数は必要に応じて増減できる。渦巻部の数が6つ以上の場合には、最内流路を含む複数の流路の流路幅は同じ幅とすることもできる。   In the above embodiment, the spiral partition 3 forming the spiral channel 11 is formed by three spiral portions, but the number of spiral portions can be increased or decreased as necessary. When the number of spiral parts is six or more, the flow path widths of the plurality of flow paths including the innermost flow path can be the same.

上記フィルター部材4は、耐熱性や耐薬品性に優れた繊維素材から形成された薄板状成形品であり、渦巻状隔壁3の内面に沿って渦巻状流路11の方向に配置されている。フィルター部材4は渦巻状隔壁3の両面に配置することもできる。 上記フィルター部材4は、マグネットファイバーで成形することで、粉体や液体あるいは液体のミストの回収に有効である。   The filter member 4 is a thin plate-shaped molded product formed of a fiber material having excellent heat resistance and chemical resistance, and is disposed in the direction of the spiral flow path 11 along the inner surface of the spiral partition 3. The filter member 4 can also be disposed on both sides of the spiral partition 3. The said filter member 4 is effective in collection | recovery of powder, liquid, or liquid mist by shape | molding with a magnet fiber.

上記円筒状フィルター5は、上記フィルター部材4と同様に、耐熱性や耐薬品性に優れた繊維素材から形成されている。円筒状フィルター5は、隔壁3の中央部に配置される。円筒状フィルター5は、フィルター部材4では十分に除去できない特に粒径が細かい微粒子を除去する。円筒状フィルター5は、繊維素材と金属素材とを混合したもので形成することもできし、金属素材のみで形成してもよい。   Similar to the filter member 4, the cylindrical filter 5 is formed of a fiber material having excellent heat resistance and chemical resistance. The cylindrical filter 5 is disposed at the center of the partition wall 3. The cylindrical filter 5 removes fine particles having a particularly small particle diameter that cannot be sufficiently removed by the filter member 4. The cylindrical filter 5 can be formed of a mixture of a fiber material and a metal material, or may be formed of only a metal material.

また、排気ガスの温度が高い場合への対応として、排気ガスを冷却するために、冷却用ジャケット12を円筒状ケーシング2の外面を囲むように配置することもできる。冷却用ジャケット12は、フィルター装置1を冷却する目的の冷媒を保持あるいは循環できる手段である。冷媒としては特に制限されないが水を用いるのが通常である。   Further, as a countermeasure to the case where the temperature of the exhaust gas is high, the cooling jacket 12 can be disposed so as to surround the outer surface of the cylindrical casing 2 in order to cool the exhaust gas. The cooling jacket 12 is a means that can hold or circulate a target refrigerant for cooling the filter device 1. The refrigerant is not particularly limited, but water is usually used.

つぎに作用を説明する。
本発明のフィルタ装置1は、図示しない半導体製造プロセスの除害設備の上流側に配置され、半導体製造プロセスの処理装置から排出される被処理ガスである排気ガス中の反応生成物等の夾雑物、その他ミストやダストを含む微粒子を除去するために用いられる。
Next, the operation will be described.
The filter device 1 of the present invention is disposed on the upstream side of an abatement facility for a semiconductor manufacturing process (not shown) and is a contaminant such as a reaction product in exhaust gas that is a gas to be processed discharged from a processing device for the semiconductor manufacturing process. It is used to remove other fine particles including mist and dust.

半導体製造プロセスから排出される排気ガスは、図示しない配管を通してフィルタ装置1の入口6から円筒状ケーシング2の内部に配置された渦巻状流路11に導入される。渦巻状流路11は最外側流路11aの流路幅Aがこれに隣接する内側流路11bの流路幅Bより広く設定されているので、渦巻状流路11を進行する排気ガスは最外側流路11aの線速度がこれより内側の内側流路11bの線速度より遅くなる。したがって、排気ガスに含まれる微粒子のうちの粒子径が大きい粒子が、排気ガスの速度と比例した遠心力の作用により、円筒状ケーシング2の内面に配置されたフィルター部材4に衝突する。円筒状ケーシング2の内面のフィルター部材4に衝突した微粒子は、フィルター部材4に付着するか重力の作用で落下し円筒状ケーシング2に捕集される。   Exhaust gas discharged from the semiconductor manufacturing process is introduced from the inlet 6 of the filter device 1 into the spiral flow path 11 disposed in the cylindrical casing 2 through a pipe (not shown). In the spiral channel 11, the channel width A of the outermost channel 11a is set wider than the channel width B of the inner channel 11b adjacent to the spiral channel 11, so that the exhaust gas traveling through the spiral channel 11 is the outermost channel. The linear velocity of the outer channel 11a is slower than the linear velocity of the inner channel 11b inside. Therefore, particles having a large particle size among the fine particles contained in the exhaust gas collide with the filter member 4 disposed on the inner surface of the cylindrical casing 2 by the action of a centrifugal force proportional to the speed of the exhaust gas. The fine particles colliding with the filter member 4 on the inner surface of the cylindrical casing 2 adhere to the filter member 4 or fall due to the action of gravity and are collected in the cylindrical casing 2.

渦巻状流路11の最外側流路11aを通過した排気ガスは、排気ガスの内側流路11bの線速度がこれより内側の内側流路11cの線速度より遅いので、同様に、粒子径が大きい粒子が被処理ガスの速度と比例した遠心力の作用により渦巻状隔壁3の内面に配置されたフィルター部材4に衝突し、フィルター部材4に衝突した微粒子は、フィルター部材に付着するか落下して円筒状ケーシング2に捕集される。   Similarly, since the exhaust gas that has passed through the outermost flow channel 11a of the spiral flow channel 11 has a linear velocity of the inner flow channel 11b of the exhaust gas that is slower than the linear velocity of the inner flow channel 11c inside, the particle diameter is the same. Large particles collide with the filter member 4 disposed on the inner surface of the spiral partition 3 by the action of centrifugal force proportional to the speed of the gas to be treated, and the fine particles colliding with the filter member 4 adhere to the filter member or fall. And collected in the cylindrical casing 2.

渦巻状流路11の内側流路11bを通過した排気ガスは、遠心力の作用により渦巻状隔壁3の内面に配置されたフィルター部材4に衝突し、フィルター部材4に衝突した微粒子は、フィルター部材に付着するか落下して円筒状ケーシング2に捕集される。   The exhaust gas that has passed through the inner flow path 11b of the spiral flow path 11 collides with the filter member 4 disposed on the inner surface of the spiral partition wall 3 by the action of centrifugal force, and the fine particles that have collided with the filter member 4 are filtered out. It adheres to or falls and is collected in the cylindrical casing 2.

このように、排気ガスに含まれる微粒子は、渦巻状流路11に沿って半径方向内側に走行する際に、排気ガスの速度と比例して粒子径が大きい粒子から粒子径の小さい粒子まで除去される。渦巻状流路11において除去されなかつた粒径が細かい微粒子は、隔壁3の中央部に配置された円筒状フィルター5により除去される。
そして、フィルター装置1において微粒子を除去した排気ガスは、フィルター装置1の出口8から図示しない配管を通して除害設備に導かれる。
In this way, the fine particles contained in the exhaust gas are removed from particles having a large particle size to particles having a small particle size in proportion to the speed of the exhaust gas when traveling inward in the radial direction along the spiral flow path 11. Is done. Fine particles having a small particle diameter that have not been removed in the spiral flow path 11 are removed by the cylindrical filter 5 disposed in the center of the partition wall 3.
The exhaust gas from which the fine particles have been removed in the filter device 1 is guided from the outlet 8 of the filter device 1 to a detoxification facility through a pipe (not shown).

図3は本発明の他の実施の形態を示す。図3に示すフィルター装置20は、図1に示すフィルター装置1と比較すると、隔壁3の高さが円筒状ケーシング21より低く、円筒状フィルター5の上方に空間22を形成し、この空間22にステンレス網で形成したドーナツ状エレメント23を配置した点のみで相違している。円筒状フィルター5を通過した排気ガスは、ドーナツ状エレメント23に直接衝突した後、蓋体9の下面に取り付けられた邪魔板24と円筒状ケーシング21との間隙を通過して出口8に導かれる。これにより、排気ガスに含まれる微粒子はより効果的に除去される。   FIG. 3 shows another embodiment of the present invention. Compared with the filter device 1 shown in FIG. 1, the filter device 20 shown in FIG. 3 has a partition wall 3 lower in height than the cylindrical casing 21 and forms a space 22 above the cylindrical filter 5. The only difference is that a donut-shaped element 23 formed of a stainless steel mesh is disposed. The exhaust gas that has passed through the cylindrical filter 5 directly collides with the donut-shaped element 23, and then passes through a gap between the baffle plate 24 attached to the lower surface of the lid 9 and the cylindrical casing 21 and is guided to the outlet 8. . Thereby, the fine particles contained in the exhaust gas are more effectively removed.

なお、上記実施の形態では、フィルター装置1で排気ガスに含まれる微粒子を除去することについて説明したが、液体を回収するためや液体に含まれるミストを回収するために利用することもできる。   In addition, although the said embodiment demonstrated removing the microparticles | fine-particles contained in exhaust gas with the filter apparatus 1, it can utilize in order to collect | recover liquids and collect | recover mist contained in liquids.

本発明のフィルタ装置は、半導体製造プロセスなどの排気ガスのラインに組み込むことで、除害設備の負荷を軽減できるとともに、除害設備の掃除回数や設備寿命を大幅に改善できる。   By incorporating the filter device of the present invention into an exhaust gas line such as a semiconductor manufacturing process, the load on the abatement equipment can be reduced, and the number of cleanings of the abatement equipment and the equipment life can be greatly improved.

1 フィルター装置
2 ケーシング
3 渦巻状隔壁
4 フィルター部材
11 渦巻状流路
A 流路幅
B 流路幅
C 流路幅
DESCRIPTION OF SYMBOLS 1 Filter apparatus 2 Casing 3 Spiral partition 4 Filter member 11 Spiral flow path A Channel width B Channel width C Channel width

Claims (5)

入口と出口を有するケーシングと、複数の渦巻部を有し連続した渦巻状流路を形成するようにケーシング内に配置された隔壁と、隔壁の少なくとも一面に配置されたフィルター部材とを有し、種々の大きさの微粒子を含む排気ガスが前記入口から導入されるフィルター装置において、前記渦巻状流路の外端側に位置する渦巻部の流路幅をこれより内側に位置する渦巻部の流路幅より広くし、排気ガス中に含まれる微粒子が前記渦巻状流路の外側に位置する渦巻部におけるよりもより内側に位置する渦巻部においてより大きい線速度を有するようにしたことを特徴とするフィルター装置。   A casing having an inlet and an outlet; a partition wall disposed in the casing so as to form a continuous spiral channel having a plurality of spiral portions; and a filter member disposed on at least one surface of the partition wall; In the filter device in which exhaust gas containing fine particles of various sizes is introduced from the inlet, the flow width of the spiral portion located on the outer end side of the spiral flow passage is set to the flow of the spiral portion located inside the spiral portion. It is wider than the passage width, and fine particles contained in the exhaust gas have a larger linear velocity in the spiral portion located inside than the spiral portion located outside the spiral flow path. Filter device to do. 渦巻状流路は、渦巻部の流路幅が外側から内側に順次狭くなっていることを特徴とする請求項1に記載のフィルター装置。   2. The filter device according to claim 1, wherein the spiral flow path has a flow path width of the spiral portion that is gradually reduced from the outside to the inside. 隔壁の内側に形成される空間に円筒状フィルターを配置したことを特徴とする請求項1または2に記載のフィルター装置。   The filter device according to claim 1, wherein a cylindrical filter is disposed in a space formed inside the partition wall. 蓋体の下面に邪魔板を取り付けるとともに、円筒状フィルターの上方空間にドーナツ状エレメントを配置したことを特徴とする請求項1ないし3のいずれか1項に記載のフィルター装置。   The filter device according to any one of claims 1 to 3, wherein a baffle plate is attached to the lower surface of the lid, and a donut-shaped element is disposed in an upper space of the cylindrical filter. ケーシングの外面に冷却水ジャケットを配置したことを特徴とする請求項1ないし4のいずれか1項に記載のフィルター装置。   The filter device according to any one of claims 1 to 4, wherein a cooling water jacket is disposed on an outer surface of the casing.
JP2010193971A 2010-08-31 2010-08-31 Filter device Pending JP2011000590A (en)

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Publication number Priority date Publication date Assignee Title
RU2496553C1 (en) * 2012-10-09 2013-10-27 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Кубанский государственный аграрный университет" Flow-through separator for separation of dispersed particles from gas
JP2015044158A (en) * 2013-08-28 2015-03-12 株式会社Ihi Gas-liquid separation device and water injection type gas compression system
CN108187441A (en) * 2018-01-22 2018-06-22 储成立 A kind of spirally inlet air formula waste gas purification apparatus for being convenient for changing filter core

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JPS57145521U (en) * 1981-03-05 1982-09-13
JPH10300007A (en) * 1997-04-21 1998-11-13 Ebara Boiler Kk Steam separator
JP2001149723A (en) * 1999-11-26 2001-06-05 Toyobo Co Ltd Filter unit and filter
JP2002013845A (en) * 2000-06-30 2002-01-18 Mitsubishi Electric Corp Oil separator, and freezing cycle, and its oil separation method

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2496553C1 (en) * 2012-10-09 2013-10-27 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Кубанский государственный аграрный университет" Flow-through separator for separation of dispersed particles from gas
JP2015044158A (en) * 2013-08-28 2015-03-12 株式会社Ihi Gas-liquid separation device and water injection type gas compression system
CN108187441A (en) * 2018-01-22 2018-06-22 储成立 A kind of spirally inlet air formula waste gas purification apparatus for being convenient for changing filter core

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