JP2010234234A - Partial thin film forming method - Google Patents

Partial thin film forming method Download PDF

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JP2010234234A
JP2010234234A JP2009084052A JP2009084052A JP2010234234A JP 2010234234 A JP2010234234 A JP 2010234234A JP 2009084052 A JP2009084052 A JP 2009084052A JP 2009084052 A JP2009084052 A JP 2009084052A JP 2010234234 A JP2010234234 A JP 2010234234A
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JP5281457B2 (en
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Tomoya Hidaka
友也 肥高
Mikiya Shimada
幹也 島田
Yoshitaka Fujita
佳孝 藤田
Toshiaki Takahashi
敏明 高橋
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Nippon Soda Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a method of partially forming a thin film such as an organic monomolecular film on a base material easily without lowering quality. <P>SOLUTION: The method of partially forming the thin film on the base material includes: (A) a process of applying a water-soluble compound to a region other than a thin film forming region on the base material or masking it with a water-containing member; (B) a process of bringing a solution for forming the thin film into contact with the base material and forming the thin film on the base material after the process (A); and (C) a process of removing the water-soluble compound or the water-containing member after the process (B). <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

本発明は、基材上に部分的に薄膜を形成する方法に関するものであり、特に、有機薄膜、とりわけ、有機単分子膜を基材上に部分的に形成する方法に関する。   The present invention relates to a method of partially forming a thin film on a substrate, and more particularly to a method of partially forming an organic thin film, particularly an organic monomolecular film, on a substrate.

ガラス、金属、プラスチックス、セラミックス等からなる基板の表面を目的に応じて改質するために、例えば、炭化水素系又はフッ素系等のシランカップリング剤を基板表面にコーティングすることが行われている。
炭化水素系又はフッ素系等のシランカップリング剤などの有機金属化合物は、加水分解縮重合して膜を形成する。こうして形成された膜を有機薄膜という。その場合、膜厚がちょうど1分子に相当するだけの薄い膜となって分子が整列したときに有機単分子膜という。
有機薄膜、とりわけ、有機単分子膜を基材上の必要部分にのみ形成する場合、有機単分子膜を形成する領域以外をマスクすることにより行う方法が知られている。例えば、特許文献1には、コンタクトレンズ面に部分的に単分子膜を形成するために、単分子膜を形成する面以外の領域をマスクすることが記載されている。
また、特許文献2には、有機電界発光素子の製造において、有機薄膜形成用塗布液をスプレー塗布する時に有機薄膜非形成領域の全面または一部にマスクを用いてパターニングを行なうことが行われているが、マスクの素材としては、ステンレス、ニッケル等の金属や、PET(ポリエチレンテレフタラート)、ポリイミド等の樹脂が用いられている。
しかしながら、従来、有機薄膜、とりわけ、有機単分子膜を基材表面に部分的に形成する場合に、簡易に行えて、しかも膜の品質が低下しないマスク方法は知られていなかった。
In order to modify the surface of a substrate made of glass, metal, plastics, ceramics, etc. according to the purpose, for example, a coating of a silane coupling agent such as hydrocarbon or fluorine is performed on the substrate surface. Yes.
An organometallic compound such as a hydrocarbon-based or fluorine-based silane coupling agent forms a film by hydrolytic condensation polymerization. The film thus formed is called an organic thin film. In that case, the organic monomolecular film is said to be a thin film whose film thickness is just equivalent to one molecule and the molecules are aligned.
In the case where an organic thin film, particularly an organic monomolecular film is formed only on a necessary portion on a substrate, a method is known which is performed by masking the region other than the region where the organic monomolecular film is formed. For example, Patent Document 1 describes masking a region other than a surface on which a monomolecular film is formed in order to partially form a monomolecular film on a contact lens surface.
In addition, in Patent Document 2, in the manufacture of an organic electroluminescent element, patterning is performed using a mask on the entire surface or part of an organic thin film non-formation region when spraying a coating liquid for forming an organic thin film. However, as the mask material, metals such as stainless steel and nickel, and resins such as PET (polyethylene terephthalate) and polyimide are used.
However, conventionally, there has been no known masking method that can be easily performed and the quality of the film does not deteriorate when an organic thin film, particularly, an organic monomolecular film is partially formed on the surface of a substrate.

特開2005−84105号公報JP-A-2005-84105 特開2008−243421号公報JP 2008-243421 A

本発明の課題は、有機単分子膜などの薄膜を簡便に、かつ品質を低下させることなく基材上に部分的に形成する方法を提供することにある。   An object of the present invention is to provide a method for partially forming a thin film such as an organic monomolecular film on a substrate simply and without reducing the quality.

本発明者らは、マスク材として水溶性樹脂あるいは含水部材を使用することにより、有機薄膜などの薄膜を簡便に、かつ品質を低下させることなく基材表面に部分的に形成することができることを見出し、本発明を完成するに至った。   By using a water-soluble resin or water-containing member as a mask material, the present inventors can easily form a thin film such as an organic thin film partially on the surface of the substrate without deteriorating the quality. The headline and the present invention were completed.

すなわち本発明は、
(1)(A)基材上の薄膜形成領域以外の領域に、水溶性化合物を塗布するか又は含水部材でマスクする工程、
(B)(A)の工程後、薄膜形成用溶液を基材と接触させて基材上に薄膜を形成する工程、及び
(C)(B)の工程後、水溶性化合物又は含水部材を除去する工程
を有することを特徴とする基材上に薄膜を部分的に形成する方法、
(2)薄膜が有機薄膜であることを特徴とする上記(1)記載の基材上に薄膜を部分的に形成する方法、
(3)有機薄膜が単分子膜であることを特徴とする上記(2)に記載の基材上に薄膜を部分的に形成する方法、
(4)薄膜形成用溶液が、少なくとも1以上の加水分解性基を有する金属系界面活性剤、及び該金属系界面活性剤と相互作用し得る化合物を含有する有機溶媒溶液であることを特徴とする上記(1)記載の基材上に薄膜を部分的に形成する方法、
(5)少なくとも1以上の加水分解性基を有する金属系界面活性剤が、式(I)
MXm−n (I)
〔式中、Rは、置換基を有していてもよい炭素数1〜30の炭化水素基、置換基を有していてもよい炭素数1〜30のハロゲン化炭化水素基、連結基を含む炭素数1〜30の炭化水素基、又は連結基を含む炭素数1〜30のハロゲン化炭化水素基を表し、Mは、ケイ素原子、ゲルマニウム原子、スズ原子、チタン原子、及びジルコニウム原子からなる群から選ばれる少なくとも1種の金属原子を表し、Xは、水酸基又は加水分解性基を表し、mはMの原子価を表す。nは、1から(m−1)のいずれかの正整数を表し、nが2以上の場合、Rは、同一でも相異なっていてもよい。(m−n)が2以上の場合、Xは同一であっても、相異なっていてもよいが、Xのうち、少なくとも一個は加水分解性基である。〕で表される化合物であることを特徴とする上記(1)に記載の基材上に薄膜を部分的に形成する方法に関する。
That is, the present invention
(1) (A) A step of applying a water-soluble compound to a region other than the thin film forming region on the substrate or masking with a water-containing member,
(B) After the step (A), the step of bringing the thin film-forming solution into contact with the substrate to form a thin film on the substrate, and (C) After the step (B), the water-soluble compound or the water-containing member is removed. A method of partially forming a thin film on a substrate, characterized by comprising the step of:
(2) The method for partially forming a thin film on the substrate according to (1), wherein the thin film is an organic thin film,
(3) The method of partially forming a thin film on the substrate according to (2), wherein the organic thin film is a monomolecular film,
(4) The thin film forming solution is an organic solvent solution containing a metal surfactant having at least one hydrolyzable group and a compound capable of interacting with the metal surfactant. A method of partially forming a thin film on the substrate according to (1) above,
(5) A metal surfactant having at least one hydrolyzable group is represented by the formula (I)
R 1 n MX mn (I)
[Wherein, R 1 represents a hydrocarbon group having 1 to 30 carbon atoms which may have a substituent, a halogenated hydrocarbon group having 1 to 30 carbon atoms which may have a substituent, or a linking group. Represents a hydrocarbon group having 1 to 30 carbon atoms or a halogenated hydrocarbon group having 1 to 30 carbon atoms including a linking group, and M represents a silicon atom, a germanium atom, a tin atom, a titanium atom, and a zirconium atom. Represents at least one metal atom selected from the group consisting of X, X represents a hydroxyl group or a hydrolyzable group, and m represents the valence of M. n represents any positive integer from 1 to (m−1), and when n is 2 or more, R 1 may be the same or different. When (mn) is 2 or more, X may be the same or different, but at least one of X is a hydrolyzable group. And a method for partially forming a thin film on a substrate according to the above (1).

マスク材として水溶性化合物あるいは含水部材を使用することにより、有機薄膜などの薄膜、とりわけ、有機単分子膜を簡便に、かつ膜の品質を低下させることなく、基材表面に部分的に形成することができる。
特に、水溶性高分子化合物を使用すると、薄膜作製後、マスク材を水洗することにより容易に除去することが可能であるため、簡易な手法として優れている。
By using a water-soluble compound or a water-containing member as a mask material, a thin film such as an organic thin film, especially an organic monomolecular film, is easily formed on the surface of the substrate in a simple manner and without reducing the quality of the film. be able to.
In particular, the use of a water-soluble polymer compound is excellent as a simple method because it can be easily removed by washing the mask material with water after the thin film is produced.

(薄膜)
本発明において、薄膜とは、基材上に作製できる、通常1μm以下の膜厚を有する無機又は有機の膜を意味し、好ましくは、有機薄膜である。
無機薄膜は、金属酸化物などの膜を意味し、例えば、金属酸化物としては酸化ジルコニウム、酸化チタニウム、酸化アルミニウム、酸化錫、酸化インジウム、酸化インジウム錫、酸化タンタル、酸化亜鉛、酸化ハフニウム、酸化セリウム、酸化ニオブ、酸化イットリウムなどが挙げられる。
有機薄膜は、金属系界面活性剤など有機化合物を原料とする膜である。金属系界面活性剤の場合には、加水分解縮重合したものが膜となる。
金属系界面活性剤としては、少なくとも1以上の加水分解性基を有する金属系界面活性剤が好ましく、1以上の加水分解性基を有する金属系界面活性剤としては、式(I)
MXm−n (I)
〔式中、Rは、置換基を有していてもよい炭素数1〜30の炭化水素基、置換基を有していてもよい炭素数1〜30のハロゲン化炭化水素基、連結基を含む炭素数1〜30の炭化水素基、又は連結基を含む炭素数1〜30のハロゲン化炭化水素基を表し、Mは、ケイ素原子、ゲルマニウム原子、スズ原子、チタン原子、及びジルコニウム原子からなる群から選ばれる少なくとも1種の金属原子を表し、Xは、水酸基又は加水分解性基を表し、mはMの原子価を表す。nは、1から(m−1)のいずれかの正整数を表し、nが2以上の場合、Rは、同一でも相異なっていてもよい。(m−n)が2以上の場合、Xは同一であっても、相異なっていてもよいが、Xのうち、少なくとも一個は加水分解性基である。〕で表される化合が好ましい。
前記置換基を有していてもよい炭素数1〜30の炭化水素基の炭化水素基としては、メチル基、エチル基、n−プロピル基、イソプロピル基、n−ブチル基、イソブチル基、sec−ブチル基、t−ブチル基、n−ペンチル基、イソペンチル基、ネオペンチル基、t−ペンチル基、n−へキシル基、イソへキシル基、n−ヘプチル基、n−オクチル基、n−デシル基等の炭素数1〜30のアルキル基;炭素数1〜30のアルケニル基;フェニル基、ナフチル基等のアリール基;等が挙げられる。
(Thin film)
In the present invention, the thin film means an inorganic or organic film having a film thickness of usually 1 μm or less, which can be produced on a substrate, and is preferably an organic thin film.
An inorganic thin film means a film such as a metal oxide. Examples of the metal oxide include zirconium oxide, titanium oxide, aluminum oxide, tin oxide, indium oxide, indium tin oxide, tantalum oxide, zinc oxide, hafnium oxide, and oxide. Examples include cerium, niobium oxide, and yttrium oxide.
The organic thin film is a film made of an organic compound such as a metal surfactant. In the case of a metal surfactant, a hydrolytic polycondensation product becomes a film.
As the metal surfactant, a metal surfactant having at least one or more hydrolyzable groups is preferable, and as the metal surfactant having one or more hydrolyzable groups, the formula (I)
R 1 n MX mn (I)
[Wherein, R 1 represents a hydrocarbon group having 1 to 30 carbon atoms which may have a substituent, a halogenated hydrocarbon group having 1 to 30 carbon atoms which may have a substituent, or a linking group. Represents a hydrocarbon group having 1 to 30 carbon atoms or a halogenated hydrocarbon group having 1 to 30 carbon atoms including a linking group, and M represents a silicon atom, a germanium atom, a tin atom, a titanium atom, and a zirconium atom. Represents at least one metal atom selected from the group consisting of X, X represents a hydroxyl group or a hydrolyzable group, and m represents the valence of M. n represents any positive integer from 1 to (m−1), and when n is 2 or more, R 1 may be the same or different. When (mn) is 2 or more, X may be the same or different, but at least one of X is a hydrolyzable group. ] The compound represented by this is preferable.
Examples of the hydrocarbon group having 1 to 30 carbon atoms which may have a substituent include a methyl group, an ethyl group, an n-propyl group, an isopropyl group, an n-butyl group, an isobutyl group, sec- Butyl group, t-butyl group, n-pentyl group, isopentyl group, neopentyl group, t-pentyl group, n-hexyl group, isohexyl group, n-heptyl group, n-octyl group, n-decyl group, etc. An alkyl group having 1 to 30 carbon atoms; an alkenyl group having 1 to 30 carbon atoms; an aryl group such as a phenyl group or a naphthyl group;

前記置換基を有していてもよい炭素数1〜30のハロゲン化炭化水素基のハロゲン化炭化水素基としては、炭素数1〜30のハロゲン化アルキル基、炭素数1〜30のハロゲン化アルケニル基、ハロゲン化アリール基等が挙げられる。ハロゲン原子としては、フッ素原子、塩素原子、臭素原子等が挙げられ、フッ素原子が好ましい。具体的には、上記例示した炭化水素基中の水素原子の1個以上がフッ素原子、塩素原子又は臭素原子等のハロゲン原子に置換された基が挙げられる。   Examples of the halogenated hydrocarbon group of the halogenated hydrocarbon group having 1 to 30 carbon atoms which may have the substituent include a halogenated alkyl group having 1 to 30 carbon atoms and an alkenyl halide having 1 to 30 carbon atoms. Group, halogenated aryl group and the like. As a halogen atom, a fluorine atom, a chlorine atom, a bromine atom, etc. are mentioned, A fluorine atom is preferable. Specific examples include groups in which one or more of the hydrogen atoms in the hydrocarbon groups exemplified above are substituted with a halogen atom such as a fluorine atom, a chlorine atom or a bromine atom.

これらの中でも、前記炭素数1〜30のハロゲン化炭化水素基としては、炭素数1〜30のアルキル基中の水素原子の2個以上がハロゲン原子に置換された基が好ましく、炭素数1〜30のアルキル基中の水素原子の2個以上がフッ素原子に置換されたフッ素化アルキル基がより好ましい。また、フッ素化アルキル基が分岐構造を有する場合には、分岐部分は炭素数1〜4、好ましくは炭素数1〜2の短鎖であるのが好ましい。   Among these, the halogenated hydrocarbon group having 1 to 30 carbon atoms is preferably a group in which two or more hydrogen atoms in the alkyl group having 1 to 30 carbon atoms are substituted with halogen atoms. More preferred is a fluorinated alkyl group in which two or more of the hydrogen atoms in 30 alkyl groups are substituted with fluorine atoms. In addition, when the fluorinated alkyl group has a branched structure, the branched portion is preferably a short chain having 1 to 4 carbon atoms, preferably 1 to 2 carbon atoms.

フッ素化アルキル基としては、末端炭素原子にフッ素原子が1個以上結合した基が好ましく、末端炭素原子にフッ素原子が3個結合したCF基部分を有する基がより好ましく、末端が、フッ素原子が置換しない炭化水素基で内部の炭素鎖にフッ素原子が置換した炭素鎖であっても構わない。末端部分に、アルキル基の全ての水素原子がフッ素原子に置換されたペルフルオロアルキル部分を有し、かつ後述する金属原子Mとの間に、−(CH−(式中、hは1〜6の整数を表し、好ましくは2〜4の整数である。)で表されるアルキレン基を有する基が特に好ましい。 The fluorinated alkyl group is preferably a group in which one or more fluorine atoms are bonded to the terminal carbon atom, more preferably a group having a CF 3 group part in which three fluorine atoms are bonded to the terminal carbon atom, and the terminal is a fluorine atom. May be a carbon chain in which a fluorine atom is substituted for an internal carbon chain with a hydrocarbon group that is not substituted. The terminal portion has a perfluoroalkyl portion in which all the hydrogen atoms of the alkyl group are substituted with fluorine atoms, and-(CH 2 ) h- (wherein h is 1) with the metal atom M described later. Represents an integer of ˜6, preferably an integer of 2 to 4.), and particularly preferred is a group having an alkylene group.

前記置換基を有していてもよい炭素数1〜30の炭化水素基又は置換基を有していてもよい炭素数1〜30のハロゲン化炭化水素基の置換基としては、カルボキシル基;アミド基;イミド基;エステル基;メトキシ基、エトキシ基等のアルコキシ基;または水酸基等が挙げられる。これらの置換基の数は0〜3であることが好ましい。   Examples of the substituent of the hydrocarbon group having 1 to 30 carbon atoms which may have a substituent or the halogenated hydrocarbon group having 1 to 30 carbon atoms which may have a substituent include a carboxyl group; an amide Groups; imide groups; ester groups; alkoxy groups such as methoxy groups and ethoxy groups; or hydroxyl groups. The number of these substituents is preferably 0-3.

連結基を含む炭素数1〜30の炭化水素基の炭化水素基としては、具体的には、前記置換基を有していてもよい炭素数1〜30の炭化水素基の炭化水素基として挙げたものと同様のものが挙げられる。   Specific examples of the hydrocarbon group having 1 to 30 carbon atoms including the linking group include the hydrocarbon group having 1 to 30 carbon atoms which may have the substituent. The same thing is mentioned.

また、連結基を含む炭素数1〜30のハロゲン化炭化水素基のハロゲン化炭化水素基としては、具体的には、前記置換基を有していてもよい炭素数1〜30のハロゲン化炭化水素基のハロゲン化炭化水素基として挙げたものと同様のものが挙げられる。   In addition, as the halogenated hydrocarbon group of the halogenated hydrocarbon group having 1 to 30 carbon atoms including the linking group, specifically, the halogenated carbon atom having 1 to 30 carbon atoms which may have the substituent. The thing similar to what was mentioned as a halogenated hydrocarbon group of a hydrogen group is mentioned.

前記連結基は、炭化水素基若しくはハロゲン化炭化水素基の炭素−炭素結合間、又は炭化水素基の炭素と後述する金属原子Mとの間に存在するのが好ましい。   The linking group is preferably present between carbon-carbon bonds of a hydrocarbon group or a halogenated hydrocarbon group, or between carbon of the hydrocarbon group and a metal atom M described later.

連結基の具体例としては、−O−、−S−、−SO−、−CO−、−C(=O)O−、−C(=O)NR51−(式中、R51は、水素原子;メチル基、エチル基、n−プロピル基、イソプロピル基等のアルキル基;を表す。)、−N(R)CON(R’)−等が挙げられる。 Specific examples of the linking group include —O—, —S—, —SO 2 —, —CO—, —C (═O) O—, —C (═O) NR 51 — (wherein R 51 represents , A hydrogen atom; an alkyl group such as a methyl group, an ethyl group, an n-propyl group, and an isopropyl group;), —N (R) CON (R ′) — and the like.

これらの中でも、Rとしては、撥水性、耐久性の観点から、炭素数1〜30のアルキル基、炭素数1〜30のフッ素化アルキル基、又は連結基を含むフッ素化アルキル基であるのが好ましい。 Among these, R 1 is an alkyl group having 1 to 30 carbon atoms, a fluorinated alkyl group having 1 to 30 carbon atoms, or a fluorinated alkyl group containing a linking group from the viewpoint of water repellency and durability. Is preferred.

Mは、ケイ素原子、ゲルマニウム原子、スズ原子、チタン原子、及びジルコニウム原子からなる群から選ばれる1種の原子を表す。これらの中でも、原料の入手容易性、反応性等の観点からケイ素原子が特に好ましい。   M represents one kind of atom selected from the group consisting of a silicon atom, a germanium atom, a tin atom, a titanium atom, and a zirconium atom. Among these, a silicon atom is particularly preferable from the viewpoints of availability of raw materials and reactivity.

Xは、水酸基又は加水分解性基を表し、加水分解性基としては、水と反応して分解する基であれば特に制約されない。具体的には、置換基を有していてもよい炭素数1〜6のアルコキシ基;置換基を有していてもよい炭化水素オキシ基(ただし、アルコキシ基を除く);置換基を有していてもよいアシルオキシ基;フッ素原子、塩素原子、臭素原子、ヨウ素原子等のハロゲン原子;イソシアネート基;シアノ基;アミノ基;またはアミド基等を例示することができる。   X represents a hydroxyl group or a hydrolyzable group, and the hydrolyzable group is not particularly limited as long as it is a group that reacts with water and decomposes. Specifically, the C1-C6 alkoxy group which may have a substituent; The hydrocarbon oxy group (however, except an alkoxy group) which may have a substituent; And an acyloxy group which may be present; halogen atoms such as fluorine atom, chlorine atom, bromine atom and iodine atom; isocyanate group; cyano group; amino group; or amide group.

炭素数1〜6のアルコキシ基としては、メトキシ基、エトキシ基、n−プロポキシ基、イソプロポキシ基、n−ブトキシ基、sec−ブトキシ基、t−ブトキシ基、n−ペンチルオキシ基、n−へキシルオキシ基等が挙げられる。   Examples of the alkoxy group having 1 to 6 carbon atoms include methoxy group, ethoxy group, n-propoxy group, isopropoxy group, n-butoxy group, sec-butoxy group, t-butoxy group, n-pentyloxy group, and n-to. A xyloxy group etc. are mentioned.

アシルオキシ基としては、アセトキシ基、プロピオニルオキシ基、プロパノイルオキシ基、n−プロピルカルボニルオキシ基、イソプロピルカルボニルオキシ基、n−ブチルカルボニルオキシ基、プロパノイルオキシ基、脂環式炭化水素オキシ基;シクロプロピルオキシ基、シクロプロピルメチルオキシ、シクロヘキシル基、ノルボニルオキシ基等、アルケニルオキシ基;アリルオキシ基等、アルキニルオキシ基;プロパルギルオキシ基等、アラルキルオキシ基;プロパルギルオキシ基等、アラルキルオキシ基;ビニルオキシ基、ベンジルオキシ基、フェネチルオキシ基等、芳香族炭化水素オキシ基;フェノキシ基、ナフチルオキシ基等、ベンゾイルオキシ基等が挙げられる。   As the acyloxy group, an acetoxy group, propionyloxy group, propanoyloxy group, n-propylcarbonyloxy group, isopropylcarbonyloxy group, n-butylcarbonyloxy group, propanoyloxy group, alicyclic hydrocarbonoxy group; cyclo Propyloxy group, cyclopropylmethyloxy, cyclohexyl group, norbornyloxy group, etc., alkenyloxy group; allyloxy group, etc., alkynyloxy group; propargyloxy group, etc., aralkyloxy group; propargyloxy group, etc., aralkyloxy group; , Benzyloxy group, phenethyloxy group, etc., aromatic hydrocarbon oxy group; phenoxy group, naphthyloxy group, benzoyloxy group, etc.

炭化水素オキシ基の炭化水素としては、炭素数1〜30のアルケニル基、フェニル基、ナフチル基などのアリール基などが挙げられる。
X中の「置換基を有しても良い」の置換基としては、カルボキシル基、アミド基、イミド基、エステル基、水酸基等が挙げられる。
Xとしては、特に、水酸基、ハロゲン原子、炭素数1〜6のアルコキシ基、アシルオキシ基、又はイソシアネート基が好ましく、炭素数1〜4のアルコキシ基又はアシルオキシ基がより好ましい。
Examples of the hydrocarbon of the hydrocarbon oxy group include aryl groups such as an alkenyl group having 1 to 30 carbon atoms, a phenyl group, and a naphthyl group.
Examples of the substituent “may have a substituent” in X include a carboxyl group, an amide group, an imide group, an ester group, and a hydroxyl group.
X is particularly preferably a hydroxyl group, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, an acyloxy group, or an isocyanate group, and more preferably an alkoxy group having 1 to 4 carbon atoms or an acyloxy group.

mは、金属原子Mの原子価を表す。   m represents the valence of the metal atom M.

nは、1から(m−1)のいずれかの正整数を表す。高密度の有機薄膜を製造する上では、nは1であるのが好ましい。nが2以上のとき、Rは同一であっても相異なっていてもよい。また、(m−n)が2以上のとき、Xは同一であっても相異なっていてもよいが、Xのうち少なくとも一個は加水分解性基であることが好ましい。 n represents any positive integer from 1 to (m−1). In producing a high-density organic thin film, n is preferably 1. When n is 2 or more, R 1 may be the same or different. Moreover, when (mn) is 2 or more, X may be the same or different, but at least one of X is preferably a hydrolyzable group.

式(I)で表される化合物の具体例としては、下記に示すものが挙げられる。なお、以下においては、金属原子Mがケイ素原子である化合物を代表例として示しているが、本発明はこれらに限定されるものではない。また、加水分解性基についても、例示した官能基に限定されず他の加水分解性基が結合したものであってもよい。   Specific examples of the compound represented by the formula (I) include those shown below. In the following, compounds in which the metal atom M is a silicon atom are shown as representative examples, but the present invention is not limited to these. Also, the hydrolyzable group is not limited to the exemplified functional groups, and may be one in which another hydrolyzable group is bonded.

CH(CHSi(OCH、CH(CHSi(OCH、CH(CHSi(OCH、CH(CH11Si(OCH、CH(CH13Si(OCH、CH(CH15Si(OCH、CH(CH17Si(OCH、CH(CH19Si(OCH、CH(CH21Si(OCH、CH(CH17Si(OCHCH、CH(CH17SiCl、CH(CHSi(OCHCH、CH(CHSiCl、CH(CHSi(CH)(OCHCH、CH(CHSi(CH)(OCH、CH(CHSi(CH(OCHCH)、CH(CHSi(CH(OCH)、CHCHO(CH15Si(OCH、CFCHO(CH15Si(OCH、CH(CHSi(CH(CH15Si(OCH、CH(CHSi(CH(CHSi(OCH、CHCOO(CH15Si(OCH、CF(CF(CHSi(OCH、CF(CF−(CH=CH)−Si(OCH、CHCHO(CH15Si(OC、CH(CHSi(CH(CH15Si(OC、CH(CHSi(CH(CHSi(OC、CF(CHSi(CH(CHSi(OC、CHCOO(CH15Si(OC、CFCOO(CH15Si(OC、CFCOO(CH15Si(OCH、CF(CF(CHSi(OC、CF(CF(CHSi(OC、CF(CF(CHSi(OC、CF(CF(CH=CH)Si(OC、CF(CF(CHSi(OCH、CF(CF(CHSi(OCH、CF(CF(CHSi(CH)(OC、CF(CF(CHSi(CH)(OCH、CF(CF(CHSi(CH(OC)、CF(CF(CHSi(CH(OCH)、CF(CHSiCl、CF(CF(CHSiCl、CF(CF(CHSiCl、CF(CF(CHSiCl、CF(CF(CHSiCl、CF(CF(CHSiCl、CF(CF(CHSiCl、CF(CFO(CF(CHSiCl、CF(CFO(CF(CHSiCl、CF(CF(CHO(CHSiCl、CF(CFCONH(CHSiCl、CF(CFCONH(CHSiCl、CF(CFO[CF(CF)CF(CF)O]CF(CF)CONH(CHSiCl、CF(CF(CHSi(CH)Cl、CF(CF(CHSi(CH)Cl、CF(CHSi(CH)Cl、CF(CF(CHSi(CH)Cl、CF(CF(CHSi(CH)Cl、CF(CF(CHSi(CH)Cl、CF(CF(CF(CHSi(CH)Cl、CF(CF(CF(CHSi(CH)Cl、CF(CF(CHO(CHSi(CH)Cl、CF(CFCONH(CHSi(CH)Cl、CF(CFCONH(CHSi(CH)Cl、CF(CFO[CF(CF)CF(CF)O]CF(CF)CONH(CHSi(CH)Cl、CH(CHSiCl、CH(CF(CHSiCl、CH(CF(CHSi(CH)Cl、CH(CF(CHSi(OCH、CH(CF(CHSi(NCO)、CH(CF(CHSiCl、CH(CF(CHSi(OCH、CH(CF(CHSi(NCO)、CH(CF(CHSiCl、CH(CF(CHSi(OCH、CH(CF(CHSi(NCO)、CHCH(CF(CHSiCl、CHCH(CF(CHSi(OCH、CHCH(CF(CHSi(NCO)、CHCH(CF(CHSiCl、CHCH(CF(CH
Si(OCH、CHCH(CF(CHSi(NCO)、CHCH(CF10(CHSiCl、CH(CF4O(CF(CHSiCl、CH(CF(CHO(CHSiCl、CH(CF(CHO(CHSiCl、CH(CF(CHO(CHSiCl、CHCH(CF(CHO(CHSiCl、CH(CFCONH(CHSiCl、CH(CFCONH(CHSiCl、CH(CFO[CF(CF)CF(CF)O]CF(CF)CONH(CHSiCl、CHCHO(CH15Si(OCH)(OH)、CFCHO(CH15Si(OCH(OH)、CH(CHSi(CH(CH15Si(OCH)(OH)、CH(CHSi(CH(CHSi(OCH)(OH)、CHCOO(CH15Si(OCH)(OH)、CF(CF(CHSi(OCH)(OH)、CF(CF(CH=CH)Si(OCH)(OH)、CHCHO(CH15Si(OC)(OH)、CH(CHSi(CH(CH15Si(OC)(OH)、CH(CHSi(CH(CHSi(OC)(OH)、CF(CHSi(CH(CHSi(OC)(OH)、CHCOO(CH15Si(OC)(OH)、CFCOO(CH15Si(OC)(OH)、CFCOO(CH15Si(OCH)(OH)、CF(CF(CHSi(OC)(OH)、CF(CF(CHSi(OC)(OH)、CF(CF(CHSi(OC)(OH)、CF(CF(CH=CH)Si(OC)(OH)、CF(CF(CHSi(OCH)(OH)、CF(CF(CHSi(OCH)(OH)、CF(CF(CHSi(CH)(OH)、CF(CF(CHSi(CH)(OH)、CHCHO(CH15Si(OCH(OH)、CFCHO(CH15Si(OCH(OH)、CH(CHSi(CH(CH15Si(OCH(OH)、CH(CHSi(CH(CHSi(OCH(OH)、CHCOO(CH15Si(OCH(OH)、CF(CF(CHSi(OCH(OH)、CHCHO(CH15Si(OC(OH)、CF(CF(CH=CH)Si(OCH(OH)、CH(CHSi(CH(CH15Si(OC(OH)、CH(CHSi(CH(CHSi(OC(OH)、CF(CHSi(CH(CHSi(OC(OH)、CHCOO(CH15Si(OC(OH)、CFCOO(CH15Si(OC(OH)、CFCOO(CH15Si(OCH(OH)、CF(CF(CHSi(OC(OH)、CF(CF(CHSi(OC(OH)、CF(CF(CHSi(OC(OH)、CF(CF(CH=CH)Si(OC(OH)、CF(CF(CHSi(OCH(OH)、CF(CF(CHSi(OCH(OH)、CF(CF(CHSi(CH)(OC)(OH)、CF(CF(CHSi(CH)(OCH)(OH)、CF(CHSi(OCH)(OH)、CF(CF(CHSi(OCH)(OH)、CF(CF(CHSi(OCH)(OH)、CF(CF(CHSi(OCH)(OH)、CF(CF(CHSi(OCH)(OH)、CF(CF(CHSi(OCH)(OH)、CF(CF(CHSi(OCH)(OH)、CF(CFO(CF(CHSi(OCH)(OH)、CF(CFO(CF(CHSi(OCH)(OH)、CF(CF(CHO(CHSi(OCH)(OH)、CF(CFCONH(CHSi(OCH)(OH)、CF(CFCONH(CHSi(OCH)(OH)、CF(CFO[CF(CF)CF(CF)O]CF(CF)CONH(CHSi(OCH)(OH)、CF(CHSi(OCH(OH)、CF(CF(CHSi(OCH(OH)、CF(CF(CHSi(OCH(OH)、CF(CF(CHSi(OCH

(OH)、CF(CF(CHSi(OCH(OH)、CF(CF(CHSi(OCH(OH)、CF(CF(CHSi(OCH(OH)、CF(CFO(CF(CHSi(OCH(OH)、CF(CFO(CF(CHSi(OCH(OH)、CF(CF(CHO(CHSi(OCH(OH)、CF(CFCONH(CHSi(OCH(OH)、CF(CFCONH(CHSi(OCH(OH)、CF(CFO[CF(CF)CF(CF)O]CF(CF)CONH(CHSi(OCH(OH)、CH(CHSi(OCH)(OH)、CH(CF(CHSi(OCH)(OH)、CH(CF(CHSi(OCH)(OH)、CH(CF(CHSi(NCO)(OH)、CH(CF(CHSi(OCH)(OH)、CH(CF(CHSi(NCO)(OH)、CH(CF(CHSi(OCH)(OH)、CH(CF(CHSi(NCO)(OH)、CHCH(CF(CHSi(OCH)(OH)、CHCH(CF(CH)2Si(OCH)(OH)、CHCH(CF(CHSi(NCO)(OH)、CHCH(CF(CHSi(OCH)(OH)、CHCH(CF(CHSi(NCO)(OH)、CHCH(CF10(CHSi(OCH)(OH)、CH(CFO(CF(CHSi(OCH)(OH)、CH(CF(CHO(CHSi(OCH)(OH)、CH(CF(CHO(CHSi(OCH)(OH)、CH(CF(CHO(CHSi(OCH)(OH)、CHCH(CF(CHO(CHSi(OCH)(OH)、CH(CFCONH(CHSi(OCH)(OH)、CH(CFCONH(CHSi(OCH)(OH)、CH(CFO[CF(CF)CF(CF)O]CF(CF)CONH(CHSi(OCH)(OH)、CF(CF(CHSi(CH)(OCH)(OH)、CF(CF(CHSi(CH)(OCH)(OH)、CF(CHSi(CH)(OCH)(OH)、CF(CF(CHSi(CH)(OCH)(OH)、CF(CF(CHSi(CH)(OCH)(OH)、CF(CF(CHSi(CH)(OCH)(OH)、CF(CF(CF(CHSi(CH)(OCH)(OH)、CF(CF(CF(CHSi(CH)(OCH)(OH)、CF(CF(CHO(CHSi(CH)(OCH)(OH)、CF(CFCONH(CHSi(CH)(OCH)(OH)、CF(CFCONH(CHSi(CH)(OCH)(OH)、CF(CFO[CF(CF)CF(CF)O]CF(CF)CONH(CHSi(CH)(OCH)(OH)、CH(CHSi(OCH(OH)、CH(CF(CHSi(OCH(OH)、CH(CF(CHSi(CH)(OCH)(OH)、CH(CF(CHSi(OCH(OH)、CH(CF(CHSi(NCO)(OH)、CH(CF(CHSi(OCH(OH)、CH(CF(CHSi(NCO)(OH)、CH(CF(CHSi(OCH(OH)、CH(CF(CHSi(NCO)(OH)、CHCH(CF(CHSi(OCH(OH)、CHCH(CF(CHSi(OCH(OH)、CHCH(CF(CHSi(NCO)(OH)、CHCH(CF(CHSi(OCH(OH)、CHCH(CF(CHSi(NCO)(OH)、CHCH(CF10(CHSi(OCH(OH)、CH(CF4O(CF(CHSi(OCH(OH)、CH(CF(CHO(CHSi(OCH(OH)、CH(CF(CHO(CHSi(OCH(OH)、CH(CF(CHO(CHSi(OCH(OH)、CHCH(CF(CHO(CHSi(OCH(OH)、CH(CFCONH(CHSi(OCH(OH)、CH(CFCONH(CHSi(OCH(OH)、CH(CFO[CF(CF)CF(CF)O]CF(CF)CONH(CHSi(OCH(OH)、CHCHO(CH15Si(OH)、CFCHO(CH15

Si(OH)、CH(CHSi(CH(CH15Si(OH)、CH(CHSi(CH(CHSi(OH)、CHCOO(CH15Si(OH)、CF(CF(CHSi(OH)、CF(CF(CH=CH)Si(OH)、CHCHO(CH15Si(OH)、CH(CHSi(CH(CH15Si(OH)、CH(CHSi(CH(CHSi(OH)、CF(CHSi(CH(CHSi(OH)、CHCOO(CH15Si(OH)、CFCOO(CH15Si(OH)、CFCOO(CH15Si(OH)、CF(CF(CHSi(OH)、CF(CF(CHSi(OH)、CF(CF(CHSi(OH)、CF(CF(CH=CH)Si(OH)、CF(CF(CHSi(OH)、CF(CF(CHSi(OH)、CF(CF(CHSi(CH(OH)、CF(CHSi(OH)、CF(CF(CHSi(OH)、CF(CF(CHSi(OH)、CF(CF(CHSi(OH)、CF(CF(CHSi(OH)、CF(CF(CHSi(OH)、CF(CF(CHSi(OH)、CF(CFO(CF(CHSi(OH)、CF(CFO(CF(CHSi(OH)、CF(CF(CHO(CHSi(OH)、CF(CFCONH(CHSi(OH)、CF(CFCONH(CHSi(OH)、CF(CFO[CF(CF)CF(CF)O]CF(CF)CONH(CHSi(OH)、CH(CHSi(OH)、CH(CF(CHSi(OH)、CH(CF(CHSi(OH)、CH(CF(CHSi(OH)、CH(CF(CHSi(OH)、CH(CF(CHSi(OH)、CH(CF(CHSi(OH)、CH(CF(CHSi(OH)、CHCH(CF(CHSi(OH)、CHCH(CF(CHSi(OH)、CHCH(CF(CHSi(OH)、CHCH(CF(CHSi(OH)、CHCH(CF(CHSi(OH)、CHCH(CF10(CHSi(OH)、CH(CF40(CF(CHSi(OH)、CH(CF(CHO(CHSi(OH)、CH(CF(CHO(CHSi(OH)、CH(CF(CHO(CHSi(OH)、CHCH(CF(CHO(CHSi(OH)、CH(CFCONH(CHSi(OH)、CH(CFCONH(CHSi(OH)、CH(CFO[CF(CF)CF(CF)O]CF(CF)CONH(CHSi(OH)、CF(CF(CHSi(CH)(OH)、CF(CF(CHSi(CH)(OH)、CF(CHSi(CH)(OH)、CF(CF(CHSi(CH)(OH)、CF(CF(CHSi(CH)(OH)、CF(CF(CHSi(CH)(OH)、CF(CF(CF(CHSi(CH)(OH)、CF(CF(CF(CHSi(CH)(OH)、CF(CF(CHO(CHSi(CH)(OH)、CF(CFCONH(CHSi(CH)(OH)、CF(CFCONH(CHSi(CH)(OH)、CF(CFO[CF(CF)CF(CF)O]CF(CF)CONH(CHSi(CH)(OH)、CH(CF(CHSi(CH)(OH)、等が挙げられるが、これらに限定されるものではない。
また、これらの化合物は1種単独で、あるいは2種以上を組み合わせて用いることができる。
CH 3 (CH 2 ) 5 Si (OCH 3 ) 3 , CH 3 (CH 2 ) 7 Si (OCH 3 ) 3 , CH 3 (CH 2 ) 9 Si (OCH 3 ) 3 , CH 3 (CH 2 ) 11 Si (OCH 3 ) 3 , CH 3 (CH 2 ) 13 Si (OCH 3 ) 3 , CH 3 (CH 2 ) 15 Si (OCH 3 ) 3 , CH 3 (CH 2 ) 17 Si (OCH 3 ) 3 , CH 3 (CH 2 ) 19 Si (OCH 3 ) 3 , CH 3 (CH 2 ) 21 Si (OCH 3 ) 3 , CH 3 (CH 2 ) 17 Si (OCH 2 CH 3 ) 3 , CH 3 (CH 2 ) 17 SiCl 3 , CH 3 (CH 2 ) 9 Si (OCH 2 CH 3 ) 3 , CH 3 (CH 2 ) 9 SiCl 3 , CH 3 (CH 2 ) 9 Si (CH 3 ) (OCH 2 CH 3 ) 2 , CH 3 ( H 2) 9 Si (CH 3 ) (OCH 3) 2, CH 3 (CH 2) 9 Si (CH 3) 2 (OCH 2 CH 3), CH 3 (CH 2) 9 Si (CH 3) 2 (OCH 3), CH 3 CH 2 O (CH 2) 15 Si (OCH 3) 3, CF 3 CH 2 O (CH 2) 15 Si (OCH 3) 3, CH 3 (CH 2) 2 Si (CH 3) 2 (CH 2) 15 Si (OCH 3) 3, CH 3 (CH 2) 6 Si (CH 3) 2 (CH 2) 9 Si (OCH 3) 3, CH 3 COO (CH 2) 15 Si (OCH 3) 3 , CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OCH 3 ) 3 , CF 3 (CF 2 ) 7 — (CH═CH) 3 —Si (OCH 3 ) 3 , CH 3 CH 2 O (CH 2 ) 15 Si (OC 2 H 5 ) 3 , CH 3 (CH 2 ) 2 Si (CH 3 ) 2 (CH 2 ) 15 Si (OC 2 H 5 ) 3 , CH 3 (CH 2 ) 6 Si (CH 3 ) 2 (CH 2 ) 9 Si (OC 2 H 5) 3, CF 3 (CH 2) 6 Si (CH 3) 2 (CH 2) 9 Si (OC 2 H 5) 3, CH 3 COO (CH 2) 15 Si (OC 2 H 5) 3, CF 3 COO (CH 2 ) 15 Si (OC 2 H 5 ) 3 , CF 3 COO (CH 2 ) 15 Si (OCH 3 ) 3 , CF 3 (CF 2 ) 9 (CH 2 ) 2 Si (OC 2 H 5 ) 3 , CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (OC 2 H 5 ) 3 , CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OC 2 H 5 ) 3 , CF 3 (CF 2 ) 7 (CH═CH) 3 Si (OC 2 H 5 ) 3 , CF 3 (CF 2 ) 9 (CH 2 ) 2 Si (OCH 3 ) 3 , CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OCH 3 ) 3 , CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (CH 3 ) (OC 2 H 5 ) 2 , CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (CH 3 ) (OCH 3 ) 2 , CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (CH 3 ) 2 (OC 2 H 5 ), CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (CH 3 ) 2 (OCH 3 ), CF 3 (CH 2 ) 2 SiCl 3 , CF 3 (CF 2 ) 3 (CH 2 ) 2 SiCl 3 , CF 3 (CF 2 ) 5 (CH 2 ) 2 SiCl 3 , CF 3 (CF 2 ) 7 (CH 2 ) 2 SiCl 3 , CF 3 (CF 2 ) 3 (CH 2 ) ) 3 SiCl 3, CF 3 ( CF 2) (CH 2) 3 SiCl 3, CF 3 (CF 2) 7 (CH 2) 3 SiCl 3, CF 3 (CF 2) 4 O (CF 2) 2 (CH 2) 2 SiCl 3, CF 3 (CF 2) 4 O (CF 2 ) 2 (CH 2 ) 3 SiCl 3 , CF 3 (CF 2 ) 7 (CH 2 ) 2 O (CH 2 ) 3 SiCl 3 , CF 3 (CF 2 ) 7 CONH (CH 2 ) 2 SiCl 3 , CF 3 (CF 2 ) 7 CONH (CH 2 ) 3 SiCl 3 , CF 3 (CF 2 ) 3 O [CF (CF 3 ) CF (CF 3 ) O] 2 CF (CF 3 ) CONH (CH 2 ) 3 SiCl 3 , CF 3 (CF 2 ) 3 (CH 2 ) 2 Si (CH 3 ) Cl 2 , CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (CH 3 ) Cl 2 , CF 3 (CH 2 ) 2 Si (CH ) Cl 2, CF 3 (CF 2) 3 (CH 2) 3 Si (CH 3) Cl 2, CF 3 (CF 2) 5 (CH 2) 3 Si (CH 3) Cl 2, CF 3 (CF 2) 7 (CH 2 ) 3 Si (CH 3 ) Cl 2 , CF 3 (CF 2 ) 4 (CF 2 ) 2 (CH 2 ) 2 Si (CH 3 ) Cl 2 , CF 3 (CF 2 ) 4 (CF 2 ) 2 (CH 2 ) 3 Si (CH 3 ) Cl 2 , CF 3 (CF 2 ) 4 (CH 2 ) 2 O (CH 2 ) 3 Si (CH 3 ) Cl 2 , CF 3 (CF 2 ) 7 CONH (CH 2 ) 2 Si (CH 3 ) Cl 2 , CF 3 (CF 2 ) 7 CONH (CH 2 ) 3 Si (CH 3 ) Cl 2 , CF 3 (CF 2 ) 3 O [CF (CF 3 ) CF (CF 3 ) O] 2 CF (CF 3 ) CONH (CH 2) Si (CH 3) Cl 2, CH 3 (CH 2) 7 SiCl 3, CH 3 (CF 2) 7 (CH 2) 2 SiCl 3, CH 3 (CF 2) 7 (CH 2) 2 Si (CH 3) Cl 2 , CH 3 (CF 2 ) 7 (CH 2 ) 2 Si (OCH 3 ) 3 , CH 3 (CF 2 ) 7 (CH 2 ) 2 Si (NCO) 3 , CH 3 (CF 2 ) 8 (CH 2 ) 2 SiCl 3 , CH 3 (CF 2 ) 8 (CH 2 ) 2 Si (OCH 3 ) 3 , CH 3 (CF 2 ) 8 (CH 2 ) 2 Si (NCO) 3 , CH 3 (CF 2 ) 9 ( CH 2 ) 2 SiCl 3 , CH 3 (CF 2 ) 9 (CH 2 ) 2 Si (OCH 3 ) 3 , CH 3 (CF 2 ) 9 (CH 2 ) 2 Si (NCO) 3 , CH 3 CH 2 (CF 2 ) 6 (CH 2 ) 2 Si Cl 3 , CH 3 CH 2 (CF 2 ) 6 (CH 2 ) 2 Si (OCH 3 ) 3 , CH 3 CH 2 (CF 2 ) 6 (CH 2 ) 2 Si (NCO) 3 , CH 3 CH 2 (CF 2 ) 8 (CH 2 ) 2 SiCl 3 , CH 3 CH 2 (CF 2 ) 8 (CH 2 )
2 Si (OCH 3 ) 3 , CH 3 CH 2 (CF 2 ) 8 (CH 2 ) 2 Si (NCO) 3 , CH 3 CH 2 (CF 2 ) 10 (CH 2 ) 2 SiCl 3 , CH 3 (CF 2 ) 4O (CF 2 ) 2 (CH 2 ) 2 SiCl 3 , CH 3 (CF 2 ) 7 (CH 2 ) 2 O (CH 2 ) 3 SiCl 3 , CH 3 (CF 2 ) 8 (CH 2 ) 2 O ( CH 2 ) 3 SiCl 3 , CH 3 (CF 2 ) 9 (CH 2 ) 2 O (CH 2 ) 3 SiCl 3 , CH 3 CH 2 (CF 2 ) 6 (CH 2 ) 2 O (CH 2 ) 3 SiCl 3 , CH 3 (CF 2 ) 6 CONH (CH 2 ) 3 SiCl 3 , CH 3 (CF 2 ) 8 CONH (CH 2 ) 3 SiCl 3 , CH 3 (CF 2 ) 3 O [CF (CF 3 ) CF (CF 3) O] CF (CF 3) CONH (CH 2) 3 SiCl 3, CH 3 CH 2 O (CH 2) 15 Si (OCH 3) (OH) 2, CF 3 CH 2 O (CH 2) 15 Si (OCH 3) 1 (OH) 2 , CH 3 (CH 2 ) 2 Si (CH 3 ) 2 (CH 2 ) 15 Si (OCH 3 ) (OH) 2 , CH 3 (CH 2 ) 6 Si (CH 3 ) 2 (CH 2 ) 9 Si (OCH 3 ) (OH) 2 , CH 3 COO (CH 2 ) 15 Si (OCH 3 ) (OH) 2 , CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OCH 3 ) (OH) 2 , CF 3 (CF 2 ) 7 (CH═CH) 3 Si (OCH 3 ) (OH) 2 , CH 3 CH 2 O (CH 2 ) 15 Si (OC 2 H 5 ) (OH) 2 , CH 3 (CH 2 ) 2 Si (CH 3 ) 2 ( CH 2) 15 Si (OC 2 H 5) (OH) 2, CH 3 (CH 2) 6 Si (CH 3) 2 (CH 2) 9 Si (OC 2 H 5) (OH) 2, CF 3 (CH 2 ) 6 Si (CH 3 ) 2 (CH 2 ) 9 Si (OC 2 H 5 ) (OH) 2 , CH 3 COO (CH 2 ) 15 Si (OC 2 H 5 ) (OH) 2 , CF 3 COO ( CH 2 ) 15 Si (OC 2 H 5 ) (OH) 2 , CF 3 COO (CH 2 ) 15 Si (OCH 3 ) (OH) 2 , CF 3 (CF 2 ) 9 (CH 2 ) 2 Si (OC 2 ) H 5) (OH) 2, CF 3 (CF 2) 7 (CH 2) 2 Si (OC 2 H 5) (OH) 2, CF 3 (CF 2) 5 (CH 2) 2 Si (OC 2 H 5 ) (OH) 2 , CF 3 (CF 2 ) 7 (CH═CH) 3 Si (OC 2 H 5 ) (OH) 2 , CF 3 (CF 2 ) 9 (CH 2 ) 2 Si (OCH 3 ) (OH) 2 , CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OCH 3 ) ) (OH) 2 , CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (CH 3 ) (OH) 2 , CF 3 (CF 2 ) 9 (CH 2 ) 2 Si (CH 3 ) (OH) 2 , CH 3 CH 2 O (CH 2 ) 15 Si (OCH 3) 2 (OH), CF 3 CH 2 O (CH 2) 15 Si (OCH 3) 2 (OH), CH 3 (CH 2) 2 Si (CH 3) 2 (CH 2) 15 Si (OCH 3) 2 (OH), CH 3 (CH 2) 6 Si (CH 3) 2 (CH 2) 9 Si (OCH 3) 2 (OH), CH 3 COO ( CH 2) 15 Si (OCH 3 ) 2 (OH), CF 3 (CF 2) 5 (CH 2) 2 Si (OCH 3) 2 (OH), CH 3 CH 2 O (CH 2) 15 Si (OC 2 H 5) 2 (OH), CF 3 (CF 2) 7 (CH = CH) 3 Si (OCH 3 ) 2 (OH), CH 3 (CH 2 ) 2 Si (CH 3 ) 2 (CH 2 ) 15 Si (OC 2 H 5 ) 2 (OH), CH 3 (CH 2 ) 6 Si (CH 3 ) 2 (CH 2 ) 9 Si (OC 2 H 5 ) 2 (OH), CF 3 (CH 2 ) 6 Si (CH 3 ) 2 (CH 2 ) 9 Si (OC 2 H 5 ) 2 (OH), CH 3 COO (CH 2 ) 15 Si (OC 2 H 5 ) 2 (OH), CF 3 COO (CH 2 ) 15 Si (OC 2 H 5 ) 2 (OH), CF 3 COO ( CH 2) 15 Si (OCH 3 ) 2 (OH), CF 3 (CF 2 ) 9 (CH 2 ) 2 Si (OC 2 H 5 ) 2 (OH), CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (OC 2 H 5 ) 2 (OH), CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OC 2 H 5 ) 2 (OH), CF 3 (CF 2 ) 7 (CH═CH) 3 Si (OC 2 H 5 ) 2 (OH), CF 3 (CF 2 ) 9 (CH 2 ) 2 Si (OCH 3 ) 2 (OH), CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OCH 3 ) 2 (OH), CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (CH 3 ) (OC 2 H 5 ) (OH), CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (CH 3 ) (OCH 3 ) (OH), CF 3 (CH 2 ) 2 Si ( OCH 3) (OH) 2, CF 3 (CF 2) 3 (CH 2) 2 Si (OC 3) (OH) 2, CF 3 (CF 2) 5 (CH 2) 2 Si (OCH 3) (OH) 2, CF 3 (CF 2) 7 (CH 2) 2 Si (OCH 3) (OH) 2 CF 3 (CF 2 ) 3 (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CF 3 (CF 2 ) 5 (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CF 3 (CF 2 ) 7 (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CF 3 (CF 2 ) 4 O (CF 2 ) 2 (CH 2 ) 2 Si (OCH 3 ) (OH) 2 , CF 3 (CF 2) ) 4 O (CF 2 ) 2 (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CF 3 (CF 2 ) 7 (CH 2 ) 2 O (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CF 3 (CF 2) 7 CONH (CH 2) 2 Si (OCH ) (OH) 2, CF 3 (CF 2) 7 CONH (CH 2) 3 Si (OCH 3) (OH) 2, CF 3 (CF 2) 3 O [CF (CF 3) CF (CF 3) O] 2 CF (CF 3 ) CONH (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CF 3 (CH 2 ) 2 Si (OCH 3 ) 2 (OH), CF 3 (CF 2 ) 3 (CH 2 ) 2 Si (OCH 3 ) 2 (OH), CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OCH 3 ) 2 (OH), CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (OCH 3 )
2
(OH), CF 3 (CF 2 ) 3 (CH 2 ) 3 Si (OCH 3 ) 2 (OH), CF 3 (CF 2 ) 5 (CH 2 ) 3 Si (OCH 3 ) 2 (OH), CF 3 (CF 2 ) 7 (CH 2 ) 3 Si (OCH 3 ) 2 (OH), CF 3 (CF 2 ) 4 O (CF 2 ) 2 (CH 2 ) 2 Si (OCH 3 ) 2 (OH), CF 3 (CF 2 ) 4 O (CF 2 ) 2 (CH 2 ) 3 Si (OCH 3 ) 2 (OH), CF 3 (CF 2 ) 7 (CH 2 ) 2 O (CH 2 ) 3 Si (OCH 3 ) 2 (OH), CF 3 (CF 2) 7 CONH (CH 2) 2 Si (OCH 3) 2 (OH), CF 3 (CF 2) 7 CONH (CH 2) 3 Si (OCH 3) 2 (OH), CF 3 (CF 2 ) 3 O [CF (CF 3 ) CF (CF 3) O] 2 CF (CF 3) CONH (CH 2) 3 Si (OCH 3) 2 (OH), CH 3 (CH 2) 7 Si (OCH 3) (OH) 2, CH 3 (CF 2) 7 (CH 2 ) 2 Si (OCH 3 ) (OH) 2 , CH 3 (CF 2 ) 7 (CH 2 ) 2 Si (OCH 3 ) (OH) 2 , CH 3 (CF 2 ) 7 (CH 2 ) 2 Si (NCO) (OH) 2 , CH 3 (CF 2 ) 8 (CH 2 ) 2 Si (OCH 3 ) (OH) 2 , CH 3 (CF 2 ) 8 (CH 2 ) 2 Si (NCO) (OH) 2 , CH 3 (CF 2 ) 9 (CH 2 ) 2 Si (OCH 3 ) (OH) 2 , CH 3 (CF 2 ) 9 (CH 2 ) 2 Si (NCO) (OH) 2 , CH 3 CH 2 (CF 2 ) 6 (CH 2 ) 2 Si (OCH 3 ) (OH) 2 , CH 3 CH 2 (CF 2 ) 6 (CH 2) 2Si (OCH 3) (OH) 2, CH 3 CH 2 (CF 2) 6 (CH 2) 2 Si (NCO) (OH) 2, CH 3 CH 2 (CF 2 ) 8 (CH 2 ) 2 Si (OCH 3 ) (OH) 2 , CH 3 CH 2 (CF 2 ) 8 (CH 2 ) 2 Si (NCO) (OH) 2 , CH 3 CH 2 (CF 2) 10 (CH 2) 2 Si (OCH 3) (OH) 2, CH 3 (CF 2) 4 O (CF 2) 2 (CH 2) 2 Si (OCH 3) (OH) 2, CH 3 (CF 2 ) 7 (CH 2 ) 2 O (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CH 3 (CF 2 ) 8 (CH 2 ) 2 O (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CH 3 (CF 2 ) 9 (CH 2 ) 2 O (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CH 3 CH 2 (CF 2 ) 6 (CH 2 ) 2 O (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CH 3 (CF 2 ) 6 CONH (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CH 3 (CF 2 ) 8 CONH (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CH 3 (CF 2 ) 3 O [CF ( CF 3 ) CF (CF 3 ) O] 2 CF (CF 3 ) CONH (CH 2 ) 3 Si (OCH 3 ) (OH) 2 , CF 3 (CF 2 ) 3 (CH 2 ) 2 Si (CH 3 ) ( OCH 3) (OH), CF 3 (CF 2) 5 (CH 2) 2 Si (CH 3) (OCH 3) (OH), CF 3 (CH 2) 2 Si (CH 3) (OCH 3) (OH ), CF 3 (CF 2) 3 (CH 2) 3 Si CH 3) (OCH 3) ( OH), CF 3 (CF 2) 5 (CH 2) 3 Si (CH 3) (OCH 3) (OH), CF 3 (CF 2) 7 (CH 2) 3 Si ( CH 3 ) (OCH 3 ) (OH), CF 3 (CF 2 ) 4 (CF 2 ) 2 (CH 2 ) 2 Si (CH 3 ) (OCH 3 ) (OH), CF 3 (CF 2 ) 4 (CF 2) 2 (CH 2) 3 Si (CH 3) (OCH 3) (OH), CF 3 (CF 2) 4 (CH 2) 2 O (CH 2) 3 Si (CH 3) (OCH 3) (OH ), CF 3 (CF 2 ) 7 CONH (CH 2 ) 2 Si (CH 3 ) (OCH 3 ) (OH), CF 3 (CF 2 ) 7 CONH (CH 2 ) 3 Si (CH 3 ) (OCH 3 ) (OH), CF 3 (CF 2 ) 3 O [CF (CF 3 ) C F (CF 3 ) O] 2 CF (CF 3 ) CONH (CH 2 ) 3 Si (CH 3 ) (OCH 3 ) (OH), CH 3 (CH 2 ) 7 Si (OCH 3 ) 2 (OH), CH 3 (CF 2 ) 7 (CH 2 ) 2 Si (OCH 3 ) 2 (OH), CH 3 (CF 2 ) 7 (CH 2 ) 2 Si (CH 3 ) (OCH 3 ) (OH), CH 3 (CF 2) 7 (CH 2) 2 Si (OCH 3) 2 (OH), CH 3 (CF 2) 7 (CH 2) 2 Si (NCO) 2 (OH), CH 3 (CF 2) 8 (CH 2) 2 Si (OCH 3 ) 2 (OH), CH 3 (CF 2 ) 8 (CH 2 ) 2 Si (NCO) 2 (OH), CH 3 (CF 2 ) 9 (CH 2 ) 2 Si (OCH 3 ) 2 (OH), CH 3 (CF 2) 9 (CH 2) 2 Si ( CO) 2 (OH), CH 3 CH 2 (CF 2) 6 (CH 2) 2 Si (OCH 3) 2 (OH), CH 3 CH 2 (CF 2) 6 (CH 2) 2 Si (OCH 3) 2 (OH), CH 3 CH 2 (CF 2 ) 6 (CH 2 ) 2 Si (NCO) 2 (OH), CH 3 CH 2 (CF 2 ) 8 (CH 2 ) 2 Si (OCH 3 ) 2 (OH ), CH 3 CH 2 (CF 2 ) 8 (CH 2 ) 2 Si (NCO) 2 (OH), CH 3 CH 2 (CF 2 ) 10 (CH 2 ) 2 Si (OCH 3 ) 2 (OH), CH 3 (CF 2) 4O (CF 2) 2 (CH 2) 2 Si (OCH 3) 2 (OH), CH 3 (CF 2) 7 (CH 2) 2 O (CH 2) 3 Si (OCH 3) 2 (OH), CH 3 (CF 2) 8 (CH 2) O (CH 2) 3 Si ( OCH 3) 2 (OH), CH 3 (CF 2) 9 (CH 2) 2 O (CH 2) 3 Si (OCH 3) 2 (OH), CH 3 CH 2 (CF 2 ) 6 (CH 2 ) 2 O (CH 2 ) 3 Si (OCH 3 ) 2 (OH), CH 3 (CF 2 ) 6 CONH (CH 2 ) 3 Si (OCH 3 ) 2 (OH), CH 3 ( CF 2) 8 CONH (CH 2 ) 3 Si (OCH 3) 2 (OH), CH 3 (CF 2) 3 O [CF (CF 3) CF (CF 3) O] 2 CF (CF 3) CONH (CH 2 ) 3 Si (OCH 3 ) 2 (OH), CH 3 CH 2 O (CH 2 ) 15 Si (OH) 3 , CF 3 CH 2 O (CH 2 ) 15

Si (OH) 3 , CH 3 (CH 2 ) 2 Si (CH 3 ) 2 (CH 2 ) 15 Si (OH) 3 , CH 3 (CH 2 ) 6 Si (CH 3 ) 2 (CH 2 ) 9 Si ( OH) 3 , CH 3 COO (CH 2 ) 15 Si (OH) 3 , CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OH) 3 , CF 3 (CF 2 ) 7 (CH═CH) 3 Si (OH) 3 , CH 3 CH 2 O (CH 2 ) 15 Si (OH) 3 , CH 3 (CH 2 ) 2 Si (CH 3 ) 2 (CH 2 ) 15 Si (OH) 3 , CH 3 (CH 2 ) 6 Si (CH 3 ) 2 (CH 2 ) 9 Si (OH) 3 , CF 3 (CH 2 ) 6 Si (CH 3 ) 2 (CH 2 ) 9 Si (OH) 3 , CH 3 COO (CH 2 ) 15 Si (OH) 3, CF 3 COO (CH 2) 5 Si (OH) 3, CF 3 COO (CH 2) 15 Si (OH) 3, CF 3 (CF 2) 9 (CH 2) 2 Si (OH) 3, CF 3 (CF 2) 7 (CH 2) 2 Si (OH) 3 , CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OH) 3 , CF 3 (CF 2 ) 7 (CH═CH) 3 Si (OH) 3 , CF 3 (CF 2 ) 9 (CH 2 ) 2 Si (OH) 3 , CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OH) 3 , CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (CH 3 ) 2 (OH ), CF 3 (CH 2 ) 2 Si (OH) 3 , CF 3 (CF 2 ) 3 (CH 2 ) 2 Si (OH) 3 , CF 3 (CF 2 ) 5 (CH 2 ) 2 Si (OH) 3 , CF 3 (CF 2 ) 7 (CH 2 ) 2 Si (OH) 3 , CF 3 (CF 2 ) 3 (CH 2 ) 3 Si (OH) 3 , CF 3 (CF 2 ) 5 (CH 2 ) 3 Si (OH) 3 , CF 3 (CF 2 ) 7 (CH 2 ) 3 Si (OH) ) 3 , CF 3 (CF 2 ) 4 O (CF 2 ) 2 (CH 2 ) 2 Si (OH) 3 , CF 3 (CF 2 ) 4 O (CF 2 ) 2 (CH 2 ) 3 Si (OH) 3 , CF 3 (CF 2) 7 (CH 2) 2 O (CH 2) 3 Si (OH) 3, CF 3 (CF 2) 7 CONH (CH 2) 2 Si (OH) 3, CF 3 (CF 2) 7 CONH (CH 2 ) 3 Si (OH) 3 , CF 3 (CF 2 ) 3 O [CF (CF 3 ) CF (CF 3 ) O] 2 CF (CF 3 ) CONH (CH 2 ) 3 Si (OH) 3, CH 3 (CH 2) 7 Si (OH) 3, CH 3 (CF ) 7 (CH 2) 2 Si (OH) 3, CH 3 (CF 2) 7 (CH 2) 2 Si (OH) 3, CH 3 (CF 2) 7 (CH 2) 2 Si (OH) 3, CH 3 (CF 2 ) 8 (CH 2 ) 2 Si (OH) 3 , CH 3 (CF 2 ) 8 (CH 2 ) 2 Si (OH) 3 , CH 3 (CF 2 ) 9 (CH 2 ) 2 Si (OH) ) 3 , CH 3 (CF 2 ) 9 (CH 2 ) 2 Si (OH) 3 , CH 3 CH 2 (CF 2 ) 6 (CH 2 ) 2 Si (OH) 3 , CH 3 CH 2 (CF 2 ) 6 (CH 2) 2 Si (OH ) 3, CH 3 CH 2 (CF 2) 6 (CH 2) 2 Si (OH) 3, CH 3 CH 2 (CF 2) 8 (CH 2) 2 Si (OH) 3 , CH 3 CH 2 (CF 2 ) 8 (CH 2) 2 Si (OH) , CH 3 CH 2 (CF 2 ) 10 (CH 2) 2 Si (OH) 3, CH 3 (CF 2) 40 (CF 2) 2 (CH 2) 2 Si (OH) 3, CH 3 (CF 2) 7 (CH 2 ) 2 O (CH 2 ) 3 Si (OH) 3 , CH 3 (CF 2 ) 8 (CH 2 ) 2 O (CH 2 ) 3 Si (OH) 3 , CH 3 (CF 2 ) 9 ( CH 2) 2 O (CH 2 ) 3 Si (OH) 3, CH 3 CH 2 (CF 2) 6 (CH 2) 2 O (CH 2) 3 Si (OH) 3, CH 3 (CF 2) 6 CONH (CH 2 ) 3 Si (OH) 3 , CH 3 (CF 2 ) 8 CONH (CH 2 ) 3 Si (OH) 3 , CH 3 (CF 2 ) 3 O [CF (CF 3 ) CF (CF 3 ) O ] 2 CF (CF 3) CONH (CH 2) 3 Si (OH) , CF 3 (CF 2) 3 (CH 2) 2 Si (CH 3) (OH) 2, CF 3 (CF 2) 5 (CH 2) 2 Si (CH 3) (OH) 2, CF 3 (CH 2 ) 2 Si (CH 3 ) (OH) 2 , CF 3 (CF 2 ) 3 (CH 2 ) 3 Si (CH 3 ) (OH) 2 , CF 3 (CF 2 ) 5 (CH 2 ) 3 Si (CH 3 ) ) (OH) 2 , CF 3 (CF 2 ) 7 (CH 2 ) 3 Si (CH 3 ) (OH) 2 , CF 3 (CF 2 ) 4 (CF 2 ) 2 (CH 2 ) 2 Si (CH 3 ) (OH) 2 , CF 3 (CF 2 ) 4 (CF 2 ) 2 (CH 2 ) 3 Si (CH 3 ) (OH) 2 , CF 3 (CF 2 ) 4 (CH 2 ) 2 O (CH 2 ) 3 Si (CH 3) (OH) 2, CF 3 (CF 2) 7 CONH (CH 2) Si (CH 3) (OH) 2, CF 3 (CF 2) 7 CONH (CH 2) 3 Si (CH 3) (OH) 2, CF 3 (CF 2) 3 O [CF (CF 3) CF (CF 3) O] 2 CF (CF 3) CONH (CH 2) 3 Si (CH 3) (OH) 2, CH 3 (CF 2) 7 (CH 2) 2 Si (CH 3) (OH), cited etc However, it is not limited to these.
Moreover, these compounds can be used individually by 1 type or in combination of 2 or more types.

有機薄膜は、単分子膜であっても2層以上の多層膜であってもよいが、単分子膜が好適である。単分子膜の場合には、有機基の鎖長にほぼ等しい厚さになる。
有機薄膜は、化学吸着膜であるのが好ましく、前記基板が結晶性を有さず、かつ、化学吸着膜が結晶性を有することがより好ましい。この場合、結晶性とは、多結晶であっても単結晶であっても構わない。化学吸着膜としては、金属−酸素結合を介して共有結合した有機薄膜を例示することができる。
本発明の有機薄膜形成方法により形成される有機薄膜は、自己集合膜であるのが好ましい。ここで自己集合膜とは、外部からの強制力なしに秩序だった構造を形成してなる膜を意味する。
The organic thin film may be a monomolecular film or a multilayer film of two or more layers, but a monomolecular film is preferable. In the case of a monomolecular film, the thickness is approximately equal to the chain length of the organic group.
The organic thin film is preferably a chemical adsorption film, more preferably the substrate does not have crystallinity, and the chemical adsorption film has crystallinity. In this case, the crystallinity may be polycrystalline or single crystal. An example of the chemisorbed film is an organic thin film covalently bonded through a metal-oxygen bond.
The organic thin film formed by the organic thin film forming method of the present invention is preferably a self-assembled film. Here, the self-assembled film means a film formed with an ordered structure without external forcing.

(水溶性化合物)
本発明において、水溶性化合物とは、基材上に塗布することができ、かつ薄膜作製後除去することのできる、水溶性の無機化合物又は高分子化合物を意味し、好ましくは高分子化合物である。
水溶性の無機化合物としては、例えば、硫酸バリウム、炭酸バリウム、リン酸カルシウム、炭酸カルシウム、炭酸マグネシウム、水酸化マグネシウム、リン酸アルミニウム、水酸化アルミニウム等の1種又は2種以上が挙げられる。
水溶性の高分子化合物としては、ポリ(メタ)アクリル酸、ポリ(メタ)アクリル酸アンモニウム塩、ポリ(メタ)アクリル酸ナトリウム塩、ポリ(メタ)アクリルアミド、ポリビニルアルコール、ポリビニルピロリドン、ポリエチレングリコール、アルギン酸ナトリウム、寒天、多糖類(メチルセルロース、エチルセルロース、ヒドロキシエチルセルロース、ヒドロキシプロプルセルロース、カルボキシメチルセルロースナトリウム等のセルロース系誘導体や澱粉等)、タンパク質(ゼラチン、膠等)等の1種又は2種以上が挙げられる。
(Water-soluble compounds)
In the present invention, the water-soluble compound means a water-soluble inorganic compound or polymer compound that can be applied on a substrate and can be removed after the production of a thin film, preferably a polymer compound. .
Examples of the water-soluble inorganic compound include one or more of barium sulfate, barium carbonate, calcium phosphate, calcium carbonate, magnesium carbonate, magnesium hydroxide, aluminum phosphate, aluminum hydroxide, and the like.
Examples of water-soluble polymer compounds include poly (meth) acrylic acid, poly (meth) acrylic acid ammonium salt, poly (meth) acrylic acid sodium salt, poly (meth) acrylamide, polyvinyl alcohol, polyvinyl pyrrolidone, polyethylene glycol, and alginic acid. 1 type or 2 types or more, such as sodium, agar, polysaccharides (cellulose derivatives and starches such as methylcellulose, ethylcellulose, hydroxyethylcellulose, hydroxypropylcellulose, sodium carboxymethylcellulose), proteins (gelatin, glue, etc.) .

(含水部材)
本発明において、含水部材としては、基材を部分的にマスクすることのできる部材であって、仮接着、挟着などの手段により基材に一時的に固定できるものであれば特に制限はない。そのような含水部材としては、紙、ゲル、布などからなる吸水性シートを任意の形状にして使用することができる。
(Water-containing material)
In the present invention, the water-containing member is not particularly limited as long as it is a member capable of partially masking the base material and can be temporarily fixed to the base material by means such as temporary adhesion and clamping. . As such a water-containing member, a water absorbent sheet made of paper, gel, cloth or the like can be used in any shape.

(基材上に薄膜を部分的に形成する方法)
本発明は、以下の工程を有する。
工程(A):
基材上の薄膜形成領域以外の領域に、水溶性化合物を塗布するか又は含水部材でマスクする工程、
工程(B):
(A)の工程後、薄膜形成用溶液を基材と接触させて基材上に薄膜を形成する工程、及び
工程(C)
(B)の工程後、水溶性化合物又は含水部材を除去する工程
(Method for partially forming a thin film on a substrate)
The present invention includes the following steps.
Step (A):
A step of applying a water-soluble compound to a region other than the thin film forming region on the substrate or masking with a water-containing member,
Step (B):
After the step (A), the step of bringing the thin film forming solution into contact with the substrate to form a thin film on the substrate, and the step (C)
The process of removing a water-soluble compound or a water-containing member after the process of (B)

以下に、各工程について説明する。
工程(A)
本発明において用いる基材は、特に制限されない。基材としては、有機薄膜形成用溶液中の有機薄膜を形成する分子と相互作用し得る官能基を表面に有する基材でなくてもよいが、有機薄膜形成用溶液中の有機薄膜を形成する分子と相互作用し得る官能基を表面に有する基材であることが好ましく、活性水素を表面に有する基材であることが特に好ましい。活性水素を表面に有する基材を用いると、基材表面の活性水素と、工程(B)中の有機薄膜形成用溶液中の分子とが、化学的な相互作用により基材表面に容易に化学吸着膜を形成することができる。ここで、有機薄膜形成用溶液中の有機薄膜を形成する分子と相互作用し得る官能基を表面に有する基材とは、有機薄膜形成用溶液中の有機薄膜を形成する分子と、化学結合し得る官能基を表面に有する基材を意味する。
Below, each process is demonstrated.
Step (A)
The substrate used in the present invention is not particularly limited. The substrate may not be a substrate having a functional group on the surface that can interact with the molecules forming the organic thin film in the organic thin film forming solution, but the organic thin film in the organic thin film forming solution is formed. A substrate having a functional group capable of interacting with a molecule on the surface is preferable, and a substrate having an active hydrogen on the surface is particularly preferable. When a substrate having active hydrogen on the surface is used, the active hydrogen on the surface of the substrate and the molecules in the organic thin film forming solution in the step (B) are easily chemistry on the surface of the substrate by chemical interaction. An adsorption film can be formed. Here, the base material having a functional group capable of interacting with a molecule forming the organic thin film in the organic thin film forming solution is chemically bonded to the molecule forming the organic thin film in the organic thin film forming solution. The base material which has the functional group to obtain on the surface is meant.

ここで活性水素とは、プロトンとして解離しやすいものをいい、活性水素を含む官能基としては、水酸基(−OH)、カルボキシル基(−COOH)、ホルミル基(−CHO)、イミノ基(=NH)、アミノ基(−NH)、チオール基(−SH)等が挙げられ、なかでも、水酸基が好ましい。 Here, active hydrogen refers to those that are easily dissociated as protons, and functional groups containing active hydrogen include hydroxyl groups (—OH), carboxyl groups (—COOH), formyl groups (—CHO), and imino groups (═NH). ), An amino group (—NH 2 ), a thiol group (—SH), etc., among which a hydroxyl group is preferable.

基材表面に水酸基を有する基材として、具体的には、アルミニウム、銅、ステンレス、ニッケル等の金属;ガラス;シリコンウェハー;セラミックス;プラスチック;ダイヤモンド等の鉱物;紙;天然繊維、合成繊維等の繊維;皮革;その他親水性の物質;等からなる基材が挙げられる。なかでも、金属、ガラス、シリコンウェハー、セラミックス、紙、繊維、プラスチック及び鉱物からなる基材が好ましい。   Specifically, as a base material having a hydroxyl group on the surface of the base material, metals such as aluminum, copper, stainless steel and nickel; glass; silicon wafers; ceramics; plastics; minerals such as diamond; paper; Examples of the base material include fibers, leather, other hydrophilic substances, and the like. Especially, the base material which consists of a metal, glass, a silicon wafer, ceramics, paper, a fiber, a plastics, and a mineral is preferable.

プラスチック、ダイヤモンド、合成繊維のように表面に水酸基を持たない材質からなる基材には、予め基材表面を酸素含有のプラズマ雰囲気中で(例えば100Wで20分)処理したり、コロナ処理して親水性基を導入することができる。ポリアミド樹脂又はポリウレタン樹脂等からなる基材は、表面にイミノ基が存在しており、このイミノ基の活性水素と金属系界面活性剤のアルコキシシリル基等とが脱アルコール反応し、シロキサン結合(−SiO−)を形成するので特に表面処理を必要としない。   For a substrate made of a material that does not have a hydroxyl group on its surface such as plastic, diamond, or synthetic fiber, the substrate surface is previously treated in an oxygen-containing plasma atmosphere (for example, 100 W for 20 minutes) or corona treated. A hydrophilic group can be introduced. A substrate made of a polyamide resin or a polyurethane resin has an imino group on the surface, and the active hydrogen of this imino group and the alkoxysilyl group of the metal surfactant undergo a dealcoholization reaction, resulting in a siloxane bond (- Since SiO-) is formed, no surface treatment is required.

また、表面に活性水素を持たない基材を用いる場合、この基材の表面に、予めSiCl、SiHCl、SiHCl、Cl−(SiClO)−SiCl(式中、bは自然数)及びSi(OR)から選ばれる少なくとも一つの化合物を接触させた後、加水分解により脱塩化水素や脱アルコールさせることにより、表面に活性水素を有するシリカ下地層を形成しておくこともできる。 In the case of using a substrate that has no active hydrogen on the surface, the surface of the substrate, previously SiCl 4, SiHCl 3, SiH 2 Cl 2, Cl- (SiCl 2 O) b -SiCl 3 ( wherein, b Is a natural number) and after contacting at least one compound selected from Si (OR) 3 , a silica underlayer having active hydrogen on the surface is formed by dehydrochlorination or dealcoholization by hydrolysis. You can also.

基材上の薄膜形成領域以外の領域に水溶性化合物を塗布するには、特に制限はなく、水溶性化合物の溶液を刷毛塗り法、インクジェット塗布法、スプレー法、浸漬法などにより塗布することができる。
水溶性化合物の溶液は、基材上に塗布することができる溶液であればよく、通常、水、エタノールなどの親水性溶媒に水溶性化合物を0.1〜10質量%含有するものが使用される。
また、基材上の薄膜形成領域以外の領域を含水部材でマスクするには、含水部材の底面に仮接着剤を塗って仮接着したり、テープ、その他の挟着用具を用いて挟着するなどにより一時的に固定する。
薄膜を部分的に形成する基材としては、具体的には、切断用刃の刃先、金型、針、メタルマスク、カラーフィルター用ガラス、MEMS用シリコンウェハ等が挙げられる。
There are no particular restrictions on the application of the water-soluble compound to the region other than the thin film forming region on the substrate, and a solution of the water-soluble compound may be applied by a brush coating method, an inkjet coating method, a spray method, a dipping method, or the like. it can.
The solution of the water-soluble compound may be any solution that can be applied on the substrate, and usually a solution containing 0.1 to 10% by mass of the water-soluble compound in a hydrophilic solvent such as water or ethanol is used. The
In addition, in order to mask the region other than the thin film forming region on the base material with the water-containing member, a temporary adhesive is applied to the bottom surface of the water-containing member and temporarily bonded, or the tape is sandwiched using a tape or other pinching tool. Temporarily fix by such as.
Specific examples of the substrate on which the thin film is partially formed include cutting edge of cutting blade, mold, needle, metal mask, glass for color filter, silicon wafer for MEMS, and the like.

工程(B)
工程(A)により部分的にマスクされた基材に薄膜を形成する。薄膜は、マスクされた領域に形成させてもかまわない。
薄膜を基材上に形成させる方法としては、真空蒸着法、液相成長法、化学気相成長法、ラングミュア法、スパッタリング法、ディップ法(浸漬法)、スプレーコート、スピンコート、ローラーコート、刷毛塗り、スクリーン印刷等が挙げられる。有機単分子膜を作製する場合はディップ法が好ましく、ディップ法の場合には、基材を有機薄膜形成用溶液に浸漬する時間は基材の種類等にも左右され、一概にはいえないが、数秒〜24時間とすることができ、数秒〜10時間が好ましい。
Process (B)
A thin film is formed on the substrate partially masked by the step (A). The thin film may be formed in the masked region.
Methods for forming a thin film on a substrate include vacuum deposition, liquid phase growth, chemical vapor deposition, Langmuir, sputtering, dipping (dipping), spray coating, spin coating, roller coating, brush Examples thereof include coating and screen printing. When producing an organic monomolecular film, the dip method is preferred. In the case of the dip method, the time for immersing the substrate in the organic thin film forming solution depends on the type of the substrate, etc. , A few seconds to 24 hours, preferably a few seconds to 10 hours.

有機薄膜の原料として、金属系界面活性剤、特に少なくとも1以上の加水分解性基を有する金属系界面活性剤を使用するときは、該金属系界面活性剤及び該金属系界面活性剤と相互作用し得る化合物を含有する有機薄膜形成用溶液に、ディップ法を用いて前記基材を接触させることが好ましい。これにより、不純物がより少ないより緻密な有機薄膜をより迅速に形成することができる。   When a metal surfactant, particularly a metal surfactant having at least one hydrolyzable group, is used as a raw material for the organic thin film, it interacts with the metal surfactant and the metal surfactant. It is preferable that the base material is brought into contact with a solution for forming an organic thin film containing a curable compound by a dipping method. Thereby, a denser organic thin film with fewer impurities can be formed more quickly.

金属系界面活性剤と相互作用し得る化合物は、金属系界面活性剤の金属部分又は加水分解性基部分と配位結合や水素結合等を介して相互作用をすることにより、加水分解性基又は水酸基を活性化させ、加水分解を促進させると共に、縮合を促進させる作用を有する触媒である。具体的には、金属酸化物、金属アルコキシド類、金属アルコキシド類の部分加水分解生成物、シラノール縮合触媒、酸触媒等が上げられ、金属アルコキシド類、金属アルコキシド類の部分加水分解生成物が好ましい。   The compound capable of interacting with the metal-based surfactant can be converted into a hydrolyzable group or a hydrolyzable group by interacting with a metal part or hydrolyzable group part of the metal-based surfactant via a coordinate bond or hydrogen bond. The catalyst activates a hydroxyl group, promotes hydrolysis, and promotes condensation. Specifically, metal oxides, metal alkoxides, partial hydrolysis products of metal alkoxides, silanol condensation catalysts, acid catalysts, and the like can be raised, and metal alkoxides and partial hydrolysis products of metal alkoxides are preferred.

金属酸化物としては、特に限定されないが、チタン、ジルコニウム、アルミニウム、ケイ素、ゲルマニウム、インジウム、スズ、タンタル、亜鉛、タングステン、鉛からなる群から選ばれる1種の金属からなる酸化物を好ましく例示することができる。   Although it does not specifically limit as a metal oxide, The oxide which consists of 1 type of metals chosen from the group which consists of titanium, zirconium, aluminum, silicon, germanium, indium, tin, tantalum, zinc, tungsten, and lead is illustrated preferably. be able to.

金属酸化物は、ゾル、ゲル、固体状等の何れの状態のものも使用することができる。ゲル、ゾルの製造方法は、特に限定されず、例えばシリカゾルを例にとると、珪酸ナトリウム溶液を陽イオン交換する方法、シリコンアルコキシドを加水分解する方法等を例示することができる。特に、有機溶媒中に安定に分散しているゾルが好ましく、さらに、ゾルの粒子径が10〜100nmの範囲、さらに好ましくは、10〜20nmの範囲であるものが好ましい。ゾルの形状は特に限定されず、球状、細長い形状等、いずれのものも用いることができる。   The metal oxide can be used in any state such as sol, gel, and solid. The method for producing the gel or sol is not particularly limited. For example, when silica sol is taken as an example, a method of cation exchange of a sodium silicate solution, a method of hydrolyzing silicon alkoxide, and the like can be exemplified. In particular, a sol that is stably dispersed in an organic solvent is preferable, and a sol having a particle size in the range of 10 to 100 nm, more preferably in the range of 10 to 20 nm is preferable. The shape of the sol is not particularly limited, and any shape such as a spherical shape or an elongated shape can be used.

具体的には、メタノールシリカゾル、IPA−ST、IPA−ST−UP、IPA−ST−ZL、NPC−ST−30、DMAC−ST、MEK−ST、MIBK−ST、XBA−ST、PMA−ST(以上、いずれも日産化学工業(株)社製オルガノシリカゾルの商品名を表す。)等を例示することができる。   Specifically, methanol silica sol, IPA-ST, IPA-ST-UP, IPA-ST-ZL, NPC-ST-30, DMAC-ST, MEK-ST, MIBK-ST, XBA-ST, PMA-ST ( As mentioned above, all represent the trade name of the organosilica sol by Nissan Chemical Industries Ltd.) etc.

シラノール縮合触媒としては、カルボン酸金属塩、カルボン酸エステル金属塩、カルボン酸金属塩ポリマー、カルボン酸金属塩キレート、チタン酸エステル及びチタン酸エステルキレート等を例示することができる。   Examples of the silanol condensation catalyst include carboxylic acid metal salts, carboxylic acid ester metal salts, carboxylic acid metal salt polymers, carboxylic acid metal salt chelates, titanate esters, and titanate ester chelates.

具体的には、酢酸第一スズ、ジブチルスズジラウレート、ジブチルスズジオクテート、ジブチルスズジアセテート、ジオクチルスズジラウレート、ジオクチルスズジオクテート、ジオクチルスズジアセテート、ジオクタン酸第一スズ、ナフテン酸鉛、ナフテン酸コバルト、2−エチルヘキセン酸鉄、ジオクチルスズビスオクチリチオグリコール酸エステル塩、ジオクチルスズマレイン酸エステル塩、ジブチルスズマレイン酸塩ポリマー、ジメチルスズメルカプトプロピオン酸塩ポリマー、ジブチルスズビスアセチルアセテート、ジオクチルスズビスアセチルラウレート、チタンテトラエトキサイド、チタンテトラブトキサイド、チタンテトライソプロポキサイド、チタンビス(アセチルアセトニル)ジプロポキサイド等を例示することができる。   Specifically, stannous acetate, dibutyltin dilaurate, dibutyltin dioctate, dibutyltin diacetate, dioctyltin dilaurate, dioctyltin dioctate, dioctyltin diacetate, stannous dioctanoate, lead naphthenate, cobalt naphthenate , Iron 2-ethylhexenoate, dioctyltin bisoctylthioglycolate, dioctyltin maleate, dibutyltin maleate polymer, dimethyltin mercaptopropionate polymer, dibutyltin bisacetylacetate, dioctyltin bisacetyllaurate , Titanium tetraethoxide, titanium tetrabutoxide, titanium tetraisopropoxide, titanium bis (acetylacetonyl) dipropoxide, etc. .

酸触媒としては、塩酸、硝酸、ホウ酸、ホウフッ化水素酸等の鉱酸、酢酸、ギ酸、シュウ酸、炭酸、トリフルオロ酢酸、p−トルエンスルホン酸、メタンスルホン酸等の有機酸等を例示することができ、さらには、光照射によって酸を発生する光酸発生剤、具体的には、ジフェニルヨードニウムヘキサフルオロホスフェート、トリフェニルホスホニウムヘキサフルオロホスフェート等を例示することができる。   Examples of the acid catalyst include mineral acids such as hydrochloric acid, nitric acid, boric acid, and borohydrofluoric acid, and organic acids such as acetic acid, formic acid, oxalic acid, carbonic acid, trifluoroacetic acid, p-toluenesulfonic acid, and methanesulfonic acid. Furthermore, a photoacid generator that generates an acid by light irradiation, specifically, diphenyliodonium hexafluorophosphate, triphenylphosphonium hexafluorophosphate, and the like can be exemplified.

金属アルコキシド類としては、特に限定されないが、透明性に優れる有機薄膜を得ることができること等の理由から、チタン、ジルコニウム、アルミニウム、ケイ素、ゲルマニウム、インジウム、スズ、タンタル、亜鉛、タングステン及び鉛からなる群から選ばれる少なくとも1種の金属のアルコキシド類が好ましい。   Although it does not specifically limit as metal alkoxides, it consists of titanium, zirconium, aluminum, silicon, germanium, indium, tin, tantalum, zinc, tungsten, and lead because an organic thin film excellent in transparency can be obtained. Preference is given to alkoxides of at least one metal selected from the group.

金属アルコキシド類のアルコキシ基の炭素数は特に限定されないが、含有酸化物濃度、有機物の脱離容易性、入手容易性等から、炭素数1〜4のものが好ましい。   The number of carbon atoms of the alkoxy group of the metal alkoxides is not particularly limited, but those having 1 to 4 carbon atoms are preferable from the viewpoint of the concentration of the contained oxide, the ease of detachment of organic substances, the availability, and the like.

本発明に用いる金属アルコキシド類の具体例としては、Si(OCH、Si(OC、Si(OC−i)、Si(OC−t)等のケイ素アルコキシド;Ti(OCH、Ti(OC、Ti(OC−i)、Ti(OC等のチタンアルコキシド;Ti[OSi(CH、Ti[OSi(C等のテトラキストリアルキルシロキシチタン;Zr(OCH、Zr(OC、Zr(OC、Zr(OC等のジルコニウムアルコキシド;Al(OCH、Al(OC、Al(OC−i)、Al(OC等のアルミニウムアルコキシド;Ge(OC等のゲルマニウムアルコキシド;In(OCH、In(OC、In(OC−i)、In(OC等のインジウムアルコキシド;Sn(OCH、Sn(OC、Sn(OC−i)、Sn(OC等のスズアルコキシド;Ta(OCH、Ta(OC、Ta(OC−i)、Ta(OC等のタンタルアルコキシド;W(OCH、W(OC、W(OC−i)、W(OC等のタングステンアルコキシド;Zn(OC等の亜鉛アルコキシド;Pb(OC等の鉛アルコキシド;等が挙げられる。これらの金属アルコキシド類は1種単独で、あるいは2種以上を組み合わせて用いることができる。 Specific examples of metal alkoxides used in the present invention include Si (OCH 3 ) 4 , Si (OC 2 H 5 ) 4 , Si (OC 3 H 7 -i) 4 , Si (OC 4 H 9 -t) 4. Silicon alkoxides such as Ti (OCH 3 ) 4 , Ti (OC 2 H 5 ) 4 , Ti (OC 3 H 7 -i) 4 , Ti (OC 4 H 9 ) 4 and other titanium alkoxides; Ti [OSi (CH 3 ) 3 ] 4 , tetrakistrialkylsiloxytitanium such as Ti [OSi (C 2 H 5 ) 3 ] 4 ; Zr (OCH 3 ) 4 , Zr (OC 2 H 5 ) 4 , Zr (OC 3 H 7 ) 4 Zr (OC 4 H 9 ) 4 , zirconium alkoxides; Al (OCH 3 ) 3 , Al (OC 2 H 5 ) 3 , Al (OC 3 H 7 -i) 3 , Al (OC 4 H 9 ) 3, etc. Aluminum Al Coxide; Germanium alkoxide such as Ge (OC 2 H 5 ) 4 ; In (OCH 3 ) 3 , In (OC 2 H 5 ) 3 , In (OC 3 H 7 -i) 3 , In (OC 4 H 9 ) 3 Indium alkoxides such as Sn (OCH 3 ) 4 , Sn (OC 2 H 5 ) 4 , Sn (OC 3 H 7 -i) 4 , Sn (OC 4 H 9 ) 4 etc. Tin alkoxides; Ta (OCH 3 ) 5 , tantalum alkoxides such as Ta (OC 2 H 5 ) 5 , Ta (OC 3 H 7 -i) 5 , Ta (OC 4 H 9 ) 5 ; W (OCH 3 ) 6 , W (OC 2 H 5 ) 6 , W (OC 3 H 7 -i) 6 , tungsten alkoxides such as W (OC 4 H 9 ) 6 ; zinc alkoxides such as Zn (OC 2 H 5 ) 2 ; lead alkoxides such as Pb (OC 4 H 9 ) 4 ; Etc. It is. These metal alkoxides can be used alone or in combination of two or more.

また本発明においては、金属アルコキシド類として、2種以上の金属アルコキシド類の反応により得られる複合アルコキシド、1種もしくは2種以上の金属アルコキシド類と、1種もしくは2種以上の金属塩との反応により得られる複合アルコキシド、及びこれらの組み合わせを用いることもできる。   In the present invention, as a metal alkoxide, a reaction of a composite alkoxide obtained by reaction of two or more metal alkoxides, one or more metal alkoxides, and one or two or more metal salts. It is also possible to use a composite alkoxide obtained by the above and a combination thereof.

2種以上の金属アルコキシド類の反応により得られる複合アルコキシドとしては、アルカリ金属又はアルカリ土類金属のアルコキシドと、遷移金属のアルコキシドとの反応により得られる複合アルコキシドや、第3B族元素の組合せにより錯塩の形で得られる複合アルコキシド等を例示することができる。   The composite alkoxide obtained by the reaction of two or more kinds of metal alkoxides includes a complex alkoxide obtained by the reaction of an alkali metal or alkaline earth metal alkoxide and a transition metal alkoxide, or a complex salt by a combination of Group 3B elements. The compound alkoxide obtained by the form of this can be illustrated.

その具体例としては、BaTi(OR)、SrTi(OR)、BaZr(OR)、SrZr(OR)、LiNb(OR)、LiTa(OR)、及び、これらの組合せ、LiVO(OR)、MgAl(OR)、(RO)SiOAl(OR’)、(RO)SiOTi(OR’)、(RO)SiOZr(OR’)、(RO)SiOB(OR’)、(RO)SiONb(OR’)、(RO)SiOTa(OR’)等のケイ素アルコキシドと、前記金属アルコキシド類との反応物及びその縮重合物等が挙げられる。ここで、R及びR’はアルキル基等を表す。 Specific examples, BaTi (OR) 6, SrTi (OR) 6, BaZr (OR) 6, SrZr (OR) 6, LiNb (OR) 6, LiTa (OR) 6 , and, combinations thereof, LiVO ( OR) 4 , MgAl 2 (OR) 8 , (RO) 3 SiOAl (OR ′) 2 , (RO) 3 SiOTi (OR ′) 3 , (RO) 3 SiOZr (OR ′) 3 , (RO) 3 SiOB ( OR ′) 2 , (RO) 3 SiONb (OR ′) 4 , (RO) 3 SiOTa (OR ′) 4, etc., and reaction products of the above metal alkoxides and polycondensates thereof. Here, R and R ′ represent an alkyl group or the like.

1種もしくは2種以上の金属アルコキシド類と1種もしくは2種以上の金属塩との反応により得られる複合アルコキシドとしては、金属塩と金属アルコキシド類との反応により得られる化合物を例示することができる。   Examples of the composite alkoxide obtained by reaction of one or more metal alkoxides with one or more metal salts include compounds obtained by reaction of metal salts with metal alkoxides. .

金属塩としては、塩化物、硝酸塩、硫酸塩、酢酸塩、ギ酸塩、シュウ酸塩等を、金属アルコキシド類としては、上述した金属アルコキシド類と同様のものをそれぞれ例示することができる。
金属アルコキシド類の部分加水分解生成物は、金属アルコキシド類を完全に加水分解する前に得られるものであって、オリゴマーの状態で存在する。
Examples of the metal salt include chlorides, nitrates, sulfates, acetates, formates, oxalates, and the like, and examples of the metal alkoxides include those similar to the metal alkoxides described above.
The partial hydrolysis product of the metal alkoxide is obtained before the metal alkoxide is completely hydrolyzed, and exists in an oligomer state.

有機薄膜形成用溶液に用いる有機溶媒としては、炭化水素系溶媒、フッ化炭素系溶媒、及びシリコーン系溶媒が好ましく、炭化水素系溶媒がより好ましい。なかでも、沸点が100〜250℃のものが特に好ましい。   As the organic solvent used for the organic thin film forming solution, a hydrocarbon solvent, a fluorocarbon solvent, and a silicone solvent are preferable, and a hydrocarbon solvent is more preferable. Especially, a thing with a boiling point of 100-250 degreeC is especially preferable.

具体的には、n−ヘキサン、シクロヘキサン、ベンゼン、トルエン、キシレン、石油ナフサ、ソルベントナフサ、石油エーテル、石油ベンジン、イソパラフィン、ノルマルパラフィン、デカリン、工業ガソリン、灯油、リグロイン等の炭化水素系溶媒;CBrClCF、CClFCFCCl、CClFCFCHFCl、CFCFCHCl、CFCBrFCBrF、CClFCClFCFCCl、Cl(CFCFCl)Cl、Cl(CFCFCl)CFCCl、Cl(CFCFCl)Cl等フロン系溶媒、フロリナート(3M社製品)、アフルード(旭ガラス社製品)等のフッ化炭素系溶媒;ジメチルシリコーン、フェニルシリコーン、アルキル変性シリコーン、ポリエーテルシリコーン等のシリコーン系溶媒;が挙げられる。これらの溶媒は1種単独で、あるいは2種以上を組み合わせて用いることができる。 Specifically, hydrocarbon solvents such as n-hexane, cyclohexane, benzene, toluene, xylene, petroleum naphtha, solvent naphtha, petroleum ether, petroleum benzine, isoparaffin, normal paraffin, decalin, industrial gasoline, kerosene, ligroin; CBr; 2 ClCF 3, CClF 2 CF 2 CCl 3, CClF 2 CF 2 CHFCl, CF 3 CF 2 CHCl 2, CF 3 CBrFCBrF 2, CClF 2 CClFCF 2 CCl 3, Cl (CF 2 CFCl) 2 Cl, Cl (CF 2 CFCl ) Fluorocarbon solvents such as 2 CF 2 CCl 3 , Cl (CF 2 CFCl) 3 Cl and other fluorocarbon solvents, Fluorinert (product of 3M), Afludo (product of Asahi Glass); dimethyl silicone, phenyl silicone, alkyl modified Silicor And silicone solvents such as polyether silicone. These solvents can be used alone or in combination of two or more.

有機薄膜形成用溶液に基材を接触させる工程は、一度に長い時間行ってもよいし、複数回に分けて短時間で行ってもよい。また、有機薄膜の形成を促進するために超音波を用いることもできる。   The step of bringing the substrate into contact with the solution for forming an organic thin film may be performed for a long time at once, or may be performed in a short time by dividing it into a plurality of times. In addition, ultrasonic waves can be used to promote the formation of the organic thin film.

有機薄膜形成用溶液に基材を接触させる際の有機薄膜形成用溶液の温度は、該溶液が安定性を保てる範囲であれば特に制限されないが、通常、室温から溶液の調製に用いた溶媒の還流温度までの範囲である。有機薄膜形成用溶液を接触に好適な温度とするには、該有機薄膜形成用溶液を加熱してもよいし、基材そのものを加熱してもよいし、その両方を加熱してもよい。接触後、基板を乾燥する。   The temperature of the organic thin film forming solution when the substrate is brought into contact with the organic thin film forming solution is not particularly limited as long as the solution can maintain stability, but usually the temperature of the solvent used for preparing the solution from room temperature is not limited. The range is up to the reflux temperature. In order to bring the organic thin film forming solution to a temperature suitable for contact, the organic thin film forming solution may be heated, the substrate itself may be heated, or both of them may be heated. After contact, the substrate is dried.

有機薄膜形成用溶液中の金属系界面活性剤の含有量は、特に制限されないが、より緻密な単分子膜を製造する観点からは、有機薄膜形成用溶液に対し0.1〜30重量%の範囲であることが好ましい。   The content of the metal surfactant in the organic thin film forming solution is not particularly limited, but from the viewpoint of producing a denser monomolecular film, it is 0.1 to 30% by weight with respect to the organic thin film forming solution. A range is preferable.

また、金属系界面活性剤と相互作用し得る化合物の使用量は、形成する単分子の有機薄膜の物性に悪影響を与えない量であれば特に制限されないが、金属系界面活性剤1モルに対して酸化物換算モル数で、0.001〜1モルであることが好ましく、0.001〜0.2モルであることがより好ましい。   The amount of the compound that can interact with the metal-based surfactant is not particularly limited as long as it does not adversely affect the physical properties of the monomolecular organic thin film to be formed, but with respect to 1 mol of the metal-based surfactant. In terms of the number of moles in terms of oxide, it is preferably 0.001 to 1 mole, and more preferably 0.001 to 0.2 mole.

有機薄膜形成用溶液の調製方法は特に制限されない。有機薄膜形成用溶液は、例えば、少なくとも1以上の加水分解性基を有する金属系界面活性剤、該金属系界面活性剤と相互作用し得る化合物、及び有機溶媒を含む混合物を攪拌するなどして調製することができる。   The method for preparing the organic thin film forming solution is not particularly limited. The organic thin film forming solution is prepared by, for example, stirring a mixture containing a metal surfactant having at least one hydrolyzable group, a compound capable of interacting with the metal surfactant, and an organic solvent. Can be prepared.

撹拌温度は特に制限されないが、例えば−100℃〜+100℃であってもよく、−20℃〜+50℃であることが好ましい。また、撹拌時間も特に制限されないが、数分から数時間行うことができる。   Although stirring temperature is not specifically limited, For example, -100 degreeC-+100 degreeC may be sufficient, and it is preferable that it is -20 degreeC-+50 degreeC. Further, the stirring time is not particularly limited, but it can be performed for several minutes to several hours.

調製した有機薄膜形成用溶液中に、金属酸化物等を含む析出物が生じる場合があるが、これらの析出物等の不純物は、不純物のより少ない緻密な単分子の有機薄膜を得るためには、基材に接触させる前に、それらの不純物を除去又は低減しておくことが好ましい。析出物は、濾過、デカント等の操作で簡便に除去又は低減することができる。   In the prepared solution for forming an organic thin film, precipitates containing metal oxides and the like may be generated. In order to obtain a dense monomolecular organic thin film with less impurities, these precipitates and the like are impurities. It is preferable to remove or reduce these impurities before contacting the substrate. Precipitates can be easily removed or reduced by operations such as filtration and decanting.

有機薄膜形成用溶液は、所定の範囲内の水分含量になるように調整され、かつ保持された溶液であることが好ましい。具体的には、有機薄膜形成用溶液中の水分含量が、30ppm以上であることが好ましく、30ppmから有機溶媒への飽和水分量の範囲、より具体的には、30〜1000ppmの範囲内であることがさらに好ましく、50〜800ppmの範囲内であることがさらにより好ましい。水分含量が30ppm以上であると、より迅速に有機薄膜の形成を行うことができ、また、水分含量が1000ppm以下であれば、金属系界面活性剤等がより十分な活性を発揮することができる。
なお、ここで示す水分含量は、有機溶媒溶液の一部を採取してカールフィッシャー法で測定した値を示し、その方法原理を用いた装置で測定した値であれば、測定装置については特に限定されない。なお、有機溶媒溶液が均一である場合には、均一な溶液を一部採取して測定し、有機溶媒層と水分層が2層となっている場合には、有機溶媒層より一部採取して測定し、有機溶媒中に水分層が分散し分離不可能な状態な場合には、その分散液をそのまま採取して測定した値を示す。
The organic thin film forming solution is preferably a solution that has been adjusted and maintained so as to have a moisture content within a predetermined range. Specifically, the water content in the organic thin film forming solution is preferably 30 ppm or more, and is in the range of the saturated water content from 30 ppm to the organic solvent, more specifically in the range of 30 to 1000 ppm. Is more preferable, and it is still more preferable that it exists in the range of 50-800 ppm. When the water content is 30 ppm or more, the organic thin film can be formed more rapidly, and when the water content is 1000 ppm or less, the metal surfactant and the like can exhibit more sufficient activity. .
The moisture content shown here is a value obtained by collecting a part of the organic solvent solution and measured by the Karl Fischer method, and the measurement device is particularly limited as long as it is a value measured by a device using the method principle. Not. When the organic solvent solution is uniform, a part of the uniform solution is sampled and measured. When the organic solvent layer and the moisture layer are two layers, a part of the organic solvent solution is sampled from the organic solvent layer. In the case where the water layer is dispersed in the organic solvent and cannot be separated, the measured value is obtained by collecting the dispersion as it is.

有機薄膜形成用溶液を所定の範囲内の水分含量に調製する方法は特に制限されないが、
(1)金属系界面活性剤、及び金属系界面活性剤と相互作用し得る化合物を含む有機薄膜形成用溶液に水を添加する方法、
(2)金属系界面活性剤と水を含む有機溶媒溶液に、金属系界面活性剤と相互作用し得る化合物を添加する方法、等を例示することができる。
なお、急激な反応を抑えるためには、(1)の方法において添加する水、(2)の方法において添加する金属系界面活性剤と相互作用し得る化合物は、有機溶媒等で希釈して用いることが好ましい。
The method for preparing the organic thin film forming solution to a moisture content within a predetermined range is not particularly limited,
(1) A method of adding water to a solution for forming an organic thin film containing a metal-based surfactant and a compound capable of interacting with the metal-based surfactant,
(2) A method of adding a compound capable of interacting with a metal surfactant to an organic solvent solution containing a metal surfactant and water can be exemplified.
In order to suppress a rapid reaction, the water added in the method (1) and the compound capable of interacting with the metal surfactant added in the method (2) are diluted with an organic solvent. It is preferable.

工程(C)
基材上に塗布された水溶性化合物は、水に浸漬するなどして水洗することにより除去される。水に浸漬する際には、必要に応じて揺動又は振動させてもよい。水溶性化合物を塗布した流域の上に薄膜が形成されていても、水溶性化合物は容易に除去することができる。水洗後乾燥する。
また、基材上に固定された含水部材は、引き剥がしたり、挟着用具を外すことにより除去することができる。
Process (C)
The water-soluble compound applied on the base material is removed by rinsing with water, for example. When immersed in water, it may be swung or vibrated as necessary. Even if a thin film is formed on the basin where the water-soluble compound is applied, the water-soluble compound can be easily removed. Wash with water and dry.
Moreover, the water-containing member fixed on the base material can be removed by peeling off or removing the pinching tool.

以下、実施例により本発明をより具体的に説明するが、本発明の技術的範囲はこれらの例示に限定されるものではない。   EXAMPLES Hereinafter, although an Example demonstrates this invention more concretely, the technical scope of this invention is not limited to these illustrations.

[1.薄膜形成溶液の調製]
調製例1−1
1)〔有機薄膜形成用補助剤の調製〕
200mLの四つ口フラスコに、室温でオクタデシルトリメトキシシラン(Gelest社製:純度95%)16.1g(43.0mmol)を仕込み、テトラブトキシチタン(日本曹達製)5.7g(16.4mmol)を加え、トルエン:76.5gを加えて希釈した。
この溶液に25℃で蒸留水1.7gを加え、室温で24時間反応させて有機薄膜形成用補助剤を得た。
[希釈前の有機薄膜形成溶液の調製]
500mLの四つ口フラスコに、室温でオクタデシルトリメトキシシラン(Gelest社製:純度95%)78.9g(200mmol)を仕込み、前記有機薄膜形成用補助剤A:0.16gを加え、トルエン:167.4gを加えて希釈した。
この溶液に蒸留水3.7gを加え、60℃で24時間反応させて希釈前の有機薄膜形成溶液を得た。
[有機薄膜形成溶液Aの調製]
2000mLの四つ口フラスコに、室温でオクタデシルトリメトキシシラン(Gelest社製:純度95%)6.45g(16.4mmol)を仕込み、前記有機薄膜形成用補助剤:2.5gを加え、トルエン:991gを加えて希釈し、有機薄膜形成溶液Aを得た。
[1. Preparation of thin film forming solution]
Preparation Example 1-1
1) [Preparation of adjuvant for forming organic thin film]
In a 200 mL four-necked flask, 16.1 g (43.0 mmol) of octadecyltrimethoxysilane (manufactured by Gelest: purity 95%) is charged at room temperature, and 5.7 g (16.4 mmol) of tetrabutoxy titanium (manufactured by Nippon Soda) And 76.5 g of toluene was added for dilution.
To this solution, 1.7 g of distilled water was added at 25 ° C. and reacted at room temperature for 24 hours to obtain an organic thin film forming auxiliary agent.
[Preparation of organic thin film forming solution before dilution]
Into a 500 mL four-necked flask, 78.9 g (200 mmol) of octadecyltrimethoxysilane (manufactured by Gelest: purity 95%) is charged at room temperature, and 0.16 g of the organic thin film forming aid A is added, and toluene: 167 .4 g was added for dilution.
To this solution, 3.7 g of distilled water was added and reacted at 60 ° C. for 24 hours to obtain an organic thin film forming solution before dilution.
[Preparation of Organic Thin Film Forming Solution A]
To a 2000 mL four-necked flask, 6.45 g (16.4 mmol) of octadecyltrimethoxysilane (manufactured by Gelest: purity 95%) is charged at room temperature, the above-mentioned auxiliary agent for forming an organic thin film: 2.5 g is added, and toluene: 991 g was added and diluted to obtain an organic thin film forming solution A.

調製例1−2
1000mLの四つ口フラスコに、室温で前記希釈前の有機薄膜形成溶液:10gを仕込み、トルエン:490gを加え希釈し、有機薄膜形成溶液Bを得た。
Preparation Example 1-2
An organic thin film forming solution B was obtained by adding 10 g of the organic thin film forming solution before dilution: 10 g to a 1000 mL four-necked flask at room temperature and adding toluene: 490 g.

調製例1−3
1)オリゴマー溶液合成
100mLの四つ口フラスコに、室温でノナフロロヘキシルトリメトキシシラン(Gelest社製:純度95%)8.1g(21mmol)を仕込み、THF 41.2gを加えて希釈した。その溶液に純水 0.54g(42mmol)と0.1N塩酸 0.20g(0.02mmol)を加え攪拌して、室温で2日間反応させてオリゴマー溶液を得た。このオリゴマー溶液をGPC分析した結果、単量体:14.3%、2量体:51.6%、3量体:28.1%、4量体以上:5.9%(相対面積比)であった。
2)有機薄膜形成溶液の調製
500mLの四つ口フラスコに、室温でHFE−7300(住友スリーエム社製):480gを仕込み、前記オリゴマー溶液20gを加え撹拌し、有機薄膜形成溶液Cを得た。
Preparation Example 1-3
1) Synthesis of oligomer solution In a 100 mL four-necked flask, 8.1 g (21 mmol) of nonafluorohexyltrimethoxysilane (manufactured by Gelest: purity 95%) was charged at room temperature, and 41.2 g of THF was added for dilution. To this solution, 0.54 g (42 mmol) of pure water and 0.20 g (0.02 mmol) of 0.1N hydrochloric acid were added and stirred, and reacted at room temperature for 2 days to obtain an oligomer solution. As a result of GPC analysis of this oligomer solution, monomer: 14.3%, dimer: 51.6%, trimer: 28.1%, tetramer or higher: 5.9% (relative area ratio) Met.
2) Preparation of organic thin film forming solution HFE-7300 (manufactured by Sumitomo 3M): 480 g was charged into a 500 mL four-necked flask at room temperature, and 20 g of the oligomer solution was added and stirred to obtain an organic thin film forming solution C.

[2.水溶性樹脂溶液の調製]
調製例2−1
200mLの四つ口フラスコに、室温で蒸留水95gを仕込み、ポリビニルアルコール(PVA−105:クラレ製)5gを加えて、70℃で1時間撹拌して溶解し、5%水溶性樹脂溶液Aを調製した。
調製例2−2
200mLの四つ口フラスコに、室温で蒸留水95gを仕込み、ポリビニルアルコール(PVA−205:クラレ製)5gを加えて、70℃で1時間撹拌して溶解し、5%水溶性樹脂溶液Bを調製した。
調製例2−3
200mLの四つ口フラスコに、室温で蒸留水99gを仕込み、ポリビニルアルコール(PVA−205:クラレ製)5gを加えて、70℃で1時間撹拌して溶解し、1%水溶性樹脂溶液Cを調製した。
調製例2−4
200mLの四つ口フラスコに、室温で蒸留水99gを仕込み、ポリ(エチレン)オキシド(粘度平均分子量(Mv)=約200,000、アルドリッチ製)1gを加えて、70℃で1時間攪拌して溶解し、1%水溶性樹脂溶液Dを調製した。
[2. Preparation of water-soluble resin solution]
Preparation Example 2-1
A 200 mL four-necked flask is charged with 95 g of distilled water at room temperature, 5 g of polyvinyl alcohol (PVA-105: manufactured by Kuraray) is added, and the mixture is stirred and dissolved at 70 ° C. for 1 hour to obtain a 5% water-soluble resin solution A. Prepared.
Preparation Example 2-2
A 200 mL four-necked flask is charged with 95 g of distilled water at room temperature, 5 g of polyvinyl alcohol (PVA-205: manufactured by Kuraray) is added, and the mixture is stirred and dissolved at 70 ° C. for 1 hour to obtain a 5% water-soluble resin solution B. Prepared.
Preparation Example 2-3
In a 200 mL four-necked flask, 99 g of distilled water is charged at room temperature, 5 g of polyvinyl alcohol (PVA-205: manufactured by Kuraray) is added, and the mixture is stirred and dissolved at 70 ° C. for 1 hour to obtain 1% water-soluble resin solution C. Prepared.
Preparation Example 2-4
In a 200 mL four-necked flask, 99 g of distilled water was charged at room temperature, 1 g of poly (ethylene) oxide (viscosity average molecular weight (Mv) = about 200,000, manufactured by Aldrich) was added, and the mixture was stirred at 70 ° C. for 1 hour. After dissolution, a 1% water-soluble resin solution D was prepared.

[3.有機薄膜部分形成]
(1)シリコン基板への応用例
実施例1
前洗浄として純水及びアルコールで超音波洗浄を行い、更にUVオゾン処理をしたシリコン基板の半分に、前記水溶性樹脂溶液Aを刷毛塗りして乾燥し、水溶性樹脂膜を形成した。
この基板を、水分を300ppmに調整した有機薄膜形成溶液Aに3分間浸漬し、その後引き上げて有機溶媒で洗浄後、乾燥した。その後基板全面を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つシリコン基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:108°・テトラデカン:39°、有機薄膜の未形成部分は水:55°・テトラデカン:7°であった。
上記接触角の測定は、試料の表面にマイクロシリンジから水、又は、テトラデカンを5μL滴下した後、60秒後に、接触角測定器(360S型:エルマ社製)を用いて行った。以後の実施例も同様である。
[3. Organic thin film partial formation]
(1) Application example to silicon substrate Example 1
As a pre-cleaning, ultrasonic cleaning was performed with pure water and alcohol, and the water-soluble resin solution A was brushed on a half of a silicon substrate that had been subjected to UV ozone treatment and dried to form a water-soluble resin film.
This substrate was dipped in an organic thin film forming solution A adjusted to 300 ppm in water for 3 minutes, then pulled up, washed with an organic solvent, and then dried. Thereafter, the entire surface of the substrate was washed with distilled water, and the water-soluble resin film was removed and dried to prepare a silicon substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed part and the unformed part of the organic thin film was measured with water and tetradecane, the formed part of the organic thin film was water: 108 °, tetradecane: 39 °, and the unformed part of the organic thin film was water: 55 °. Tetradecane: 7 °.
The contact angle was measured using a contact angle measuring device (360S type: manufactured by Elma) 60 seconds after dropping 5 μL of water or tetradecane from the microsyringe onto the surface of the sample. The same applies to the following embodiments.

実施例2
前洗浄として純水及びアルコールで超音波洗浄を行い、更にUVオゾン処理をしたシリコン基板の半分に、前記水溶性樹脂溶液Bを刷毛塗りして乾燥し、水溶性樹脂膜を形成した。
この基板を、有機薄膜形成溶液Bに3分間浸漬し、その後引き上げて有機溶媒で洗浄後、乾燥した。その後基板全面を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つシリコン基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:109°・テトラデカン:39°、有機薄膜の未形成部分は水:55°・テトラデカン:7°であった。
Example 2
Ultrasonic cleaning with pure water and alcohol was performed as pre-cleaning, and the water-soluble resin solution B was brushed on a half of a silicon substrate that had been subjected to UV ozone treatment and dried to form a water-soluble resin film.
This substrate was immersed in the organic thin film forming solution B for 3 minutes, then pulled up, washed with an organic solvent, and then dried. Thereafter, the entire surface of the substrate was washed with distilled water, and the water-soluble resin film was removed and dried to prepare a silicon substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed portion and the unformed portion of the organic thin film was measured with water and tetradecane, the formed portion of the organic thin film was water: 109 °, tetradecane: 39 °, and the unformed portion of the organic thin film was water: 55 °. Tetradecane: 7 °.

実施例3
前洗浄として純水及びアルコールで超音波洗浄を行い、更にUVオゾン処理をしたシリコン基板の半分に、前記水溶性樹脂溶液Cを刷毛塗りして乾燥し、水溶性樹脂膜を形成した。
この基板を、有機薄膜形成溶液Bに3分間浸漬し、その後引き上げて有機溶媒で洗浄後、乾燥した。その後基板全面を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つシリコン基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:108°・テトラデカン:38°、有機薄膜の未形成部分は水:59°・テトラデカン:6°であった。
Example 3
Ultrasonic cleaning with pure water and alcohol was performed as pre-cleaning, and the water-soluble resin solution C was brushed on a half of a silicon substrate that had been subjected to UV ozone treatment and dried to form a water-soluble resin film.
This substrate was immersed in the organic thin film forming solution B for 3 minutes, then pulled up, washed with an organic solvent, and then dried. Thereafter, the entire surface of the substrate was washed with distilled water, and the water-soluble resin film was removed and dried to prepare a silicon substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed portion and the unformed portion of the organic thin film was measured with water and tetradecane, the formed portion of the organic thin film was water: 108 °, tetradecane: 38 °, and the unformed portion of the organic thin film was water: 59 °. Tetradecane: 6 °.

実施例4
前洗浄として純水及びアルコールで超音波洗浄を行い、更にUVオゾン処理をしたシリコン基板の半分に、前記水溶性樹脂溶液Cを刷毛塗りして乾燥し、水溶性樹脂膜を形成した。
この基板を、有機薄膜形成溶液Bに3分間浸漬し、その後引き上げて有機溶媒で洗浄後、エアーブローで洗浄液を除去した。その後基板全面を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つシリコン基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:110°・テトラデカン:38°、有機薄膜の未形成部分は水:35°・テトラデカン:5°であった。
Example 4
Ultrasonic cleaning with pure water and alcohol was performed as pre-cleaning, and the water-soluble resin solution C was brushed on a half of a silicon substrate that had been subjected to UV ozone treatment and dried to form a water-soluble resin film.
This substrate was immersed in the organic thin film forming solution B for 3 minutes, then lifted and washed with an organic solvent, and then the cleaning solution was removed by air blow. Thereafter, the entire surface of the substrate was washed with distilled water, and the water-soluble resin film was removed and dried to prepare a silicon substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed part and the unformed part of the organic thin film was measured with water and tetradecane, the formed part of the organic thin film was water: 110 °, tetradecane: 38 °, and the unformed part of the organic thin film was water: 35 °. Tetradecane: 5 °.

実施例5
前洗浄として純水及びアルコールで超音波洗浄を行ったシリコン基板の下半分に、前記水溶性樹脂溶液Cを刷毛塗りして乾燥し、シリコン基板の半分に水溶性樹脂膜を形成した。この基板をUVオゾン処理後、有機薄膜形成溶液Bに3分間浸漬し、その後引き上げて有機溶媒で洗浄後、乾燥した。その後基板全面を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つシリコン基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:95°・テトラデカン:35°、有機薄膜の未形成部分は水:37°・テトラデカン:6°であった。
Example 5
The water-soluble resin solution C was brushed on the lower half of the silicon substrate that had been ultrasonically cleaned with pure water and alcohol as pre-cleaning, and dried to form a water-soluble resin film on the half of the silicon substrate. This substrate was subjected to UV ozone treatment, immersed in an organic thin film forming solution B for 3 minutes, then pulled up, washed with an organic solvent, and dried. Thereafter, the entire surface of the substrate was washed with distilled water, and the water-soluble resin film was removed and dried to prepare a silicon substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed part and the unformed part of the organic thin film was measured with water and tetradecane, the formed part of the organic thin film was water: 95 °, tetradecane: 35 °, and the unformed part of the organic thin film was water: 37 °. Tetradecane: 6 °.

実施例6
前洗浄として純水およびアルコールで超音波洗浄を行い、さらにUVオゾン処理したシリコン基板の半分に、前記水溶性樹脂溶液Dを刷毛塗りして乾燥し、水溶性樹脂膜を形成した。
この基板を、有機薄膜形成溶液Bに3分間浸漬し、その後引き上げて有機溶媒で洗浄後、乾燥した。その後基板全体を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つシリコン基板を作製した。
この有機薄膜の形成部分と未形成部分を、水およびテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:100°・テトラデカン:37°、有機薄膜の未形成部分は水:28°・テトラデカン:11°であった。
Example 6
Ultrasonic cleaning with pure water and alcohol was performed as pre-cleaning, and the water-soluble resin solution D was brushed on a half of a silicon substrate that had been subjected to UV ozone treatment and dried to form a water-soluble resin film.
This substrate was immersed in the organic thin film forming solution B for 3 minutes, then pulled up, washed with an organic solvent, and then dried. Thereafter, the entire substrate was washed with distilled water, and the water-soluble resin film was removed and dried to produce a silicon substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed portion and the unformed portion of the organic thin film was measured with water and tetradecane, the formed portion of the organic thin film was water: 100 °, tetradecane: 37 °, and the unformed portion of the organic thin film was water: 28 °. Tetradecane: 11 °.

実施例7
前洗浄として純水及びアルコールで超音波洗浄を行い、更にUVオゾン処理をしたシリコン基板の半分に、前記水溶性樹脂溶液Cを刷毛塗りして乾燥し、水溶性樹脂膜を形成した。
この基板を、有機薄膜形成溶液Cに3分間浸漬し、その後引き上げて有機溶媒で洗浄後、乾燥した。その後基板全面を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つシリコン基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:96°・テトラデカン:65°、有機薄膜の未形成部分は水:37°・テトラデカン:6°であった。
Example 7
Ultrasonic cleaning with pure water and alcohol was performed as pre-cleaning, and the water-soluble resin solution C was brushed on a half of a silicon substrate that had been subjected to UV ozone treatment and dried to form a water-soluble resin film.
This substrate was immersed in the organic thin film forming solution C for 3 minutes, then pulled up, washed with an organic solvent, and then dried. Thereafter, the entire surface of the substrate was washed with distilled water, and the water-soluble resin film was removed and dried to prepare a silicon substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed portion and the unformed portion of the organic thin film was measured with water and tetradecane, the formed portion of the organic thin film was water: 96 °, tetradecane: 65 °, and the unformed portion of the organic thin film was water: 37 °. Tetradecane: 6 °.

実施例8
前洗浄として純水及びアルコールで超音波洗浄を行い、更にUVオゾン処理をしたシリコン基板の半分に、前記水溶性樹脂溶液Cを刷毛塗りして乾燥し、水溶性樹脂膜を形成した。
この基板を、市販フッ素系薄膜形成溶液Novec EGC−1720(3M製)に3分間浸漬し、その後引き上げて有機溶媒で洗浄後、乾燥した。その後基板全面を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つシリコン基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:109°・テトラデカン:64°、有機薄膜の未形成部分は水:38°・テトラデカン:8°であった。
Example 8
Ultrasonic cleaning with pure water and alcohol was performed as pre-cleaning, and the water-soluble resin solution C was brushed on a half of a silicon substrate that had been subjected to UV ozone treatment and dried to form a water-soluble resin film.
This substrate was immersed in a commercially available fluorine-based thin film forming solution Novec EGC-1720 (manufactured by 3M) for 3 minutes, then pulled up, washed with an organic solvent, and then dried. Thereafter, the entire surface of the substrate was washed with distilled water, and the water-soluble resin film was removed and dried to prepare a silicon substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed portion and the unformed portion of the organic thin film was measured with water and tetradecane, the formed portion of the organic thin film was water: 109 °, tetradecane: 64 °, and the unformed portion of the organic thin film was water: 38 °. Tetradecane: 8 °.

実施例9
前洗浄として純水及びアルコールで超音波洗浄を行い、更にUVオゾン処理をしたシリコン基板の半分に、前記水溶性樹脂溶液Cを刷毛塗りして乾燥し、水溶性樹脂膜を形成した。
この基板とFAS−9をテフロン(登録商標)製容器に入れ、密閉条件で150℃に加熱、2時間放置し、その後常温まで冷却して取り出して基板全面を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つシリコン基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:105°・テトラデカン:65°、有機薄膜の未形成部分は水:37°・テトラデカン:7°であった。
Example 9
Ultrasonic cleaning with pure water and alcohol was performed as pre-cleaning, and the water-soluble resin solution C was brushed on a half of a silicon substrate that had been subjected to UV ozone treatment and dried to form a water-soluble resin film.
This substrate and FAS-9 are put in a Teflon (registered trademark) container, heated to 150 ° C. in a sealed condition, left for 2 hours, then cooled to room temperature and taken out, and the entire surface of the substrate is washed with distilled water to obtain a water-soluble resin. The film was removed and dried to prepare a silicon substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed part and the unformed part of the organic thin film was measured with water and tetradecane, the formed part of the organic thin film was water: 105 °, tetradecane: 65 °, and the unformed part of the organic thin film was water: 37 °. Tetradecane: 7 °.

(2)SUS304基板への応用例
実施例10
SUS304基板(鏡面仕上げ)の前洗浄として、純水及びアルコールで超音波洗浄を行い、更に55−60℃に加温した8wt%KOH水溶液に10分間浸漬して引き上げ後、蒸留水で基板をかけ洗いし,エアーブローで基板表面の水滴を除去した。
その基板の半分に、前記水溶性樹脂溶液Cを刷毛塗りして、水溶性樹脂膜を形成した。この基板を有機薄膜形成溶液Bに30分間浸漬し、その後引き上げて有機溶媒で洗浄後、エアーブローで基板表面の溶媒を除去した。次いで基板全面を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つSUS304基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:98°・テトラデカン:24°、有機薄膜の未形成部分は水:62°・テトラデカン:7°であった。
(2) Application example to SUS304 substrate Example 10
As a pre-cleaning of SUS304 substrate (mirror finish), ultrasonic cleaning with pure water and alcohol was performed, and after dipping for 10 minutes in an 8 wt% KOH aqueous solution heated to 55-60 ° C, the substrate was applied with distilled water. After washing, water droplets on the substrate surface were removed by air blow.
The water-soluble resin solution C was brushed on half of the substrate to form a water-soluble resin film. This substrate was immersed in the organic thin film forming solution B for 30 minutes, then pulled up, washed with an organic solvent, and then the solvent on the substrate surface was removed by air blowing. Next, the entire surface of the substrate was washed with distilled water, and the water-soluble resin film was removed and dried to prepare a SUS304 substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed part and the unformed part of the organic thin film was measured with water and tetradecane, the formed part of the organic thin film was water: 98 °, tetradecane: 24 °, and the unformed part of the organic thin film was water: 62 °. Tetradecane: 7 °.

実施例11
前洗浄として純水及びアルコールで超音波洗浄を行い、更にUVオゾン処理をしたSUS304基板(鏡面仕上げ)の半分に、前記水溶性樹脂溶液Cを刷毛塗りして乾燥し、水溶性樹脂膜を形成した。
この基板を、有機薄膜形成溶液Bに30分間浸漬し、その後引き上げて有機溶媒で洗浄後、乾燥した。その後基板全面を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つSUS304基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:108°・テトラデカン:34°、有機薄膜の未形成部分は水:65°・テトラデカン:8°であった。
Example 11
Ultrasonic cleaning is performed with pure water and alcohol as pre-cleaning, and then the water-soluble resin solution C is brushed and dried on half of a SUS304 substrate (mirror finish) that has been subjected to UV ozone treatment to form a water-soluble resin film. did.
This substrate was immersed in the organic thin film forming solution B for 30 minutes, then pulled up, washed with an organic solvent, and then dried. Thereafter, the entire surface of the substrate was washed with distilled water, and the water-soluble resin film was removed and dried to prepare a SUS304 substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed portion and the unformed portion of the organic thin film was measured with water and tetradecane, the formed portion of the organic thin film was water: 108 °, tetradecane: 34 °, and the unformed portion of the organic thin film was water: 65 °. Tetradecane: 8 °.

実施例12
SUS304基板(鏡面仕上げ)の前洗浄として、純水及びアルコールで超音波洗浄を行い、更に55−60℃に加温した8wt%KOH水溶液に10分間浸漬して引き上げ後、蒸留水で基板をかけ洗いし,エアーブローで基板表面の水滴を除去した。
その基板の半分に、蒸留水を含浸したクリーンルーム用ワイパー(クリーンルーム用不織布:クラレ社製)を貼り付け、有機薄膜形成溶液Bに30分間浸漬した。その後引き上げてクリーンルーム用ワイパーを取り除き、有機溶媒で洗浄後、エアーブローで基板表面の溶媒を除去し、有機薄膜の形成部分と未形成部分を持つSUS304基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:100°・テトラデカン:26°、有機薄膜の未形成部分は水:77°・テトラデカン:8°であった。
Example 12
As a pre-cleaning of SUS304 substrate (mirror finish), ultrasonic cleaning with pure water and alcohol was performed, and after dipping for 10 minutes in an 8 wt% KOH aqueous solution heated to 55-60 ° C, the substrate was applied with distilled water. After washing, water droplets on the substrate surface were removed by air blow.
A clean room wiper impregnated with distilled water (nonwoven fabric for clean room: manufactured by Kuraray Co., Ltd.) was attached to half of the substrate and immersed in the organic thin film forming solution B for 30 minutes. The substrate was then lifted to remove the clean room wiper, washed with an organic solvent, and then the solvent on the substrate surface was removed by air blowing to produce a SUS304 substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed part and the unformed part of the organic thin film was measured with water and tetradecane, the formed part of the organic thin film was water: 100 °, tetradecane: 26 °, and the unformed part of the organic thin film was water: 77 °. Tetradecane: 8 °.

(3)ニッケル基板への応用例
実施例13
前洗浄として純水及びアルコールで超音波洗浄を行い、更にUVオゾン処理をしたニッケル基板の半分に、前記水溶性樹脂溶液Cを刷毛塗りして乾燥し、水溶性樹脂膜を形成した。
この基板を、有機薄膜形成溶液Bに30分間浸漬し、その後引き上げて有機溶媒で洗浄後、乾燥した。その後基板全面を蒸留水で洗浄し、水溶性樹脂膜を除去し乾燥して、有機薄膜の形成部分と未形成部分を持つニッケル基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:98°、有機薄膜の未形成部分は水:59°であった。
(3) Application example to nickel substrate Example 13
Ultrasonic cleaning was performed with pure water and alcohol as pre-cleaning, and the water-soluble resin solution C was brushed on a half of a nickel substrate that had been subjected to UV ozone treatment and dried to form a water-soluble resin film.
This substrate was immersed in the organic thin film forming solution B for 30 minutes, then pulled up, washed with an organic solvent, and then dried. Thereafter, the entire surface of the substrate was washed with distilled water, and the water-soluble resin film was removed and dried to prepare a nickel substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed part and the unformed part of the organic thin film was measured with water and tetradecane, the formed part of the organic thin film was water: 98 °, and the unformed part of the organic thin film was water: 59 °.

実施例14
前洗浄として純水及びアルコールで超音波洗浄を行い、更にUVオゾン処理をしたニッケル基板の半分に、蒸留水を含浸したクラレワイプを貼り付け、有機薄膜形成溶液Bに30分間浸漬した。その後引き上げてクラレワイプを取り除き、有機溶媒で洗浄後、エアーブローで基板表面の溶媒を除去し、有機薄膜の形成部分と未形成部分を持つニッケル基板を作製した。
この有機薄膜の形成部分と未形成部分を、水及びテトラデカンで接触角を測定したところ、有機薄膜の形成部分は水:108°・テトラデカン:36°、有機薄膜の未形成部分は水:60°・テトラデカン:13°であった。
Example 14
As pre-cleaning, ultrasonic cleaning was performed with pure water and alcohol, and a Kuraray wipe impregnated with distilled water was attached to half of a nickel substrate that had been subjected to UV ozone treatment, and immersed in the organic thin film forming solution B for 30 minutes. Then, the Kuraray wipe was removed by lifting, and after washing with an organic solvent, the solvent on the substrate surface was removed by air blowing to produce a nickel substrate having an organic thin film formed portion and an unformed portion.
When the contact angle of the formed part and the unformed part of the organic thin film was measured with water and tetradecane, the formed part of the organic thin film was water: 108 °, tetradecane: 36 °, and the unformed part of the organic thin film was water: 60 °. Tetradecane: 13 °.

Claims (5)

(A)基材上の薄膜形成領域以外の領域に、水溶性化合物を塗布するか又は含水部材でマスクする工程、
(B)(A)の工程後、薄膜形成用溶液を基材と接触させて基材上に薄膜を形成する工程、及び
(C)(B)の工程後、水溶性化合物又は含水部材を除去する工程
を有することを特徴とする基材上に薄膜を部分的に形成する方法。
(A) A step of applying a water-soluble compound to a region other than the thin film forming region on the substrate or masking with a water-containing member,
(B) After the step (A), the step of bringing the thin film-forming solution into contact with the substrate to form a thin film on the substrate, and (C) After the step (B), the water-soluble compound or the water-containing member is removed. A method of partially forming a thin film on a substrate, comprising the step of:
薄膜が有機薄膜であることを特徴とする請求項1記載の基材上に薄膜を部分的に形成する方法。 2. The method of partially forming a thin film on a substrate according to claim 1, wherein the thin film is an organic thin film. 有機薄膜が、単分子膜であることを特徴とする請求項2に記載の基材上に薄膜を部分的に形成する方法。 3. The method of partially forming a thin film on a substrate according to claim 2, wherein the organic thin film is a monomolecular film. 薄膜形成用溶液が、少なくとも1以上の加水分解性基を有する金属系界面活性剤、及び該金属系界面活性剤と相互作用し得る化合物を含有する有機溶媒溶液であることを特徴とする請求項1記載の基材上に薄膜を部分的に形成する方法。 The thin film forming solution is an organic solvent solution containing a metal surfactant having at least one hydrolyzable group and a compound capable of interacting with the metal surfactant. A method for partially forming a thin film on a substrate according to 1. 少なくとも1以上の加水分解性基を有する金属系界面活性剤が、式(I)
MXm−n (I)
〔式中、Rは、置換基を有していてもよい炭素数1〜30の炭化水素基、置換基を有していてもよい炭素数1〜30のハロゲン化炭化水素基、連結基を含む炭素数1〜30の炭化水素基、又は連結基を含む炭素数1〜30のハロゲン化炭化水素基を表し、Mは、ケイ素原子、ゲルマニウム原子、スズ原子、チタン原子、及びジルコニウム原子からなる群から選ばれる少なくとも1種の金属原子を表し、Xは、水酸基又は加水分解性基を表し、mはMの原子価を表す。nは、1から(m−1)のいずれかの正整数を表し、nが2以上の場合、Rは、同一でも相異なっていてもよい。(m−n)が2以上の場合、Xは同一であっても、相異なっていてもよいが、Xのうち、少なくとも一個は加水分解性基である。〕で表される化合物であることを特徴とする請求項1に記載の基材上に薄膜を部分的に形成する方法。
The metal-based surfactant having at least one hydrolyzable group is represented by the formula (I)
R 1 n MX mn (I)
[Wherein, R 1 represents a hydrocarbon group having 1 to 30 carbon atoms which may have a substituent, a halogenated hydrocarbon group having 1 to 30 carbon atoms which may have a substituent, or a linking group. Represents a hydrocarbon group having 1 to 30 carbon atoms or a halogenated hydrocarbon group having 1 to 30 carbon atoms including a linking group, and M represents a silicon atom, a germanium atom, a tin atom, a titanium atom, and a zirconium atom. Represents at least one metal atom selected from the group consisting of X, X represents a hydroxyl group or a hydrolyzable group, and m represents the valence of M. n represents any positive integer from 1 to (m−1), and when n is 2 or more, R 1 may be the same or different. When (mn) is 2 or more, X may be the same or different, but at least one of X is a hydrolyzable group. A method for partially forming a thin film on a substrate according to claim 1, wherein the compound is a compound represented by the formula:
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